Group 8 - ECELXM1L - Lab05

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Experiment no.

5
BJT COMMON EMITTER CONFIGURATION

OBJECTIVE/S:
The activity aims to study the operation and working principle of CE amplifier.

THEORETICAL BACKGROUND:

The bipolar junction transistor (BJT) has three terminals, so can be used in three different
configurations with one terminal common to both input and output signal.

Common emitter configuration is common to both input and output signal. The arrangement is the
same to a PNP transistor. Used in this way the transistor has the advantages of a medium input
impedance, high voltage gain, and high current gain.

MATERIALS REQUIRED:
Power Supply, Digital Multimeter
Resistors ( 1 pc. 40kΩ ½ W, 30kΩ ½ W, 6.8kΩ ½ W, 6.8kΩ ½ W), Transistors (1 pcs NPN 2N222)

PROCEDURE:

1. Connect the circuit that has shown in Figure 9-1


2. Set the supply voltage to 15V

Figure 6.1 Common Emitter Configuration

3. Measure the DC voltages and current that shown in table 9-1 and 9-2.
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4. Compare your result to the calculated value.

Table 9-1. DC Currents


IB IC IE

Measured 0.32 mA 0.86 mA 0.86 mA


Computed 0.375 mA 0.5 mA 0.79 mA
Percent Error (0.32 − 0.375) (0.86 − 0.5) (0.86 − 0.79)
× 100% × 100% × 100%
0.375 0.5 0.79
= −14.67% = 72% = 8.86%

Table 9-2. DC Voltages


VB VC VE VBE VCE
Measured 6V 5.14 V 5.41 V 0.6 V 3.459 V
Computed 𝑉𝐵 = 𝑉𝐵 𝑉𝐶 = 𝑉𝐶 𝑉𝐸 𝑉𝐵𝐸 𝑉𝐸
=6𝑉 = 5.14 𝑉 = 0.79 𝑚𝐴 =6𝑉 = 5.14 𝑉
× 6.8𝑘Ω − 2.908 𝑉 − 2.908 𝑉
= 2.908 𝑉 = 3.4 𝑉 = 2.232 𝑉

Percent Error (6 − 6) (5.14 − 5.14) (5.41 − 2.908) (0.6 − 3.4) (3.459 − 2.232)
6 5.14 2.908 3.4 2.232
× 100% × 100% = 0% × 100% × 100% × 100%
= 0% = 85.86% = −83.53% = 55.05%

Computations of percent error:

𝑀𝑒𝑎𝑠𝑢𝑟𝑒𝑑−𝐶𝑜𝑚𝑝𝑢𝑡𝑒𝑑
Percent Error = ∗ 100
𝐶𝑜𝑛𝑝𝑢𝑡𝑒𝑑

OBSERVATION:

During the experiment, the transistor operated within expected parameters, exhibiting typical
characteristics of a common emitter configuration. The measured values of base current (IB), collector
current (IC), and emitter current (IE) were reasonably close to the computed values, indicating that the
transistor was biased properly. However, there were notable discrepancies between the measured and
computed values of certain voltages, particularly VBE (the voltage across the base-emitter junction) and
VCE (the voltage across the collector-emitter junction). These discrepancies suggest potential inaccuracies
in either the measurement techniques employed or the theoretical assumptions made in the calculations.
Additionally, variations in component tolerances or experimental conditions may have contributed to the
observed differences. Overall, while the transistor exhibited expected behavior, the discrepancies in voltage
measurements highlight the importance of meticulous measurement techniques and thorough
understanding of the underlying principles.

Angeles, M., Nalunat, J. (2023)


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CONCLUSION:
The BJT common emitter configuration experiment offered valuable insights into the operational
characteristics of bipolar junction transistors. It confirmed the expected benefits of this setup, such as
medium input impedance, high voltage gain, and high current gain. While the experiment successfully
demonstrated typical transistor behavior, differences in measured and calculated voltages, especially VBE
and VCE, highlighted the need for precise measurement techniques and a thorough grasp of theoretical
concepts. Possible reasons for discrepancies, like component variations or experimental conditions,
require further exploration to improve experimental procedures and accuracy. This experiment
emphasizes the intricacies of practical electronics testing and the continuous quest for precise
measurement and analysis. dfdsdfsfdgdklhdghjdlfjghdkfhgdsfsdhdkjfghdsfkhshghsdkhfgkdfgdshgdskgd
QUESTIONS:
1. Discuss the effect of the input resistance on the bias circuit
The input resistance of the bias circuit in a Bipolar Junction Transistor (BJT) common
emitter configuration has a significant effect on the transistor's operation. A higher input resistance
can provide better stability in biasing the transistor, reducing the influence of external factors like
temperature variations. It also affects the gain of the transistor circuit, with a higher input resistance
generally resulting in higher voltage gain.
2. Discuss the stability of voltage divider bias
The stability of voltage divider biasing is essential for maintaining the transistor's operating
point despite variations in temperature and transistor parameters. This biasing method relies on
resistors to establish a stable base bias voltage, but variations in resistor values, particularly due
to temperature changes, can lead to shifts in the bias point and affect the transistor's operating
conditions, potentially causing signal distortion. To enhance stability, careful selection of resistor
values and the addition of a bypass capacitor across the emitter resistor can help mitigate these
effects, ensuring consistent performance despite external influences.
3. Discuss voltage divider bias for a pnp transistor
In a common emitter configuration experiment involving a PNP transistor, voltage divider
biasing is employed to establish a stable operating point despite variations in temperature and
transistor parameters. This method utilizes two resistors connected between the positive supply
voltage (Vcc) and the base terminal, with the emitter connected to ground. The voltage across the
base resistor determines the bias voltage for the base-emitter junction. Stability is achieved through
careful selection of resistor values and the potential addition of a bypass capacitor across the
emitter resistor to compensate for variations in transistor parameters. Overall, voltage divider
biasing for a PNP transistor in a common emitter configuration aims to ensure consistent
performance by maintaining a stable operating point.

Angeles, M., Nalunat, J. (2023)

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