File 00172
File 00172
File 00172
MPC5200/D
Rev. 2, 5/2004
MPC5200 Hardware
Specifications
2 Features .......................................1 change. For the latest data on the MPC5200, visit
3 Electrical and Thermal www.mobilegt.com and proceed to the MPC5200
Characteristics..............................5 Product Summary Page.
4 Package Description ..................60
5 System Design Information ........69 1 Overview
6 Ordering Information ..................74
The MPC5200 integrates a high performance MPC603e series G2_LE core with a
7 Document Revision History ........75
rich set of peripheral functions focused on communications and systems
integration. The G2_LE core design is based on the PowerPC® core architecture.
MPC5200 incorporates an innovative BestComm I/O subsystem, which isolates
routine maintenance of peripheral functions from the embedded G2_LE core. The
MPC5200 contains a SDRAM/DDR Memory Controller, a flexible External Bus
Interface, PCI Controller, USB, ATA, Ethernet, six Programmable Serial Controllers
(PSC), I2C, SPI, CAN, J1850, Timers, and GPIOs.
2 Features
Key features are shown below.
• MPC603e series G2_LE core
— Superscalar architecture
— 760 MIPS at 400 MHz (-40 to +85 oC)
— 16 k Instruction cache, 16 k Data cache
— Double precision FPU
— Instruction and Data MMU
— Standard and Critical interrupt capability
• SDRAM / DDR Memory Interface
— up to 132-MHz operation
— SDRAM and DDR SDRAM support
— 256-MByte addressing range per CS, two CS available
— 32-bit data bus
— Built-in initialization and refresh
• Flexible multi-function External Bus Interface
— Supports interfacing to ROM/Flash/SRAM memories or other memory
mapped devices
4
SDRAM / DDR
Features
SRAM 16K
ATA Host Controller
BestComm DMA
Go to: www.freescale.com
CommBus
2x
2x
6x
2x
SPI
I2C
USB
PSC
J1850
MSCAN
Ethernet
MOTOROLA
Freescale Semiconductor, Inc.
Electrical and Thermal Characteristics
VDD_MEM_IO
Supply voltage - System APLL SYS_PLL_AVDD –0.3 2.1 V D1.3
Supply voltage - G2_LE APLL CORE_PLL_AVDD –0.3 2.1 V D1.4
Input voltage (VDD_IO) Vin –0.3 VDD_IO + 0.3 V D1.5
Input voltage (VDD_MEM_IO) Vin –0.3 VDD_MEM_IO V D1.6
+ 0.3
Input voltage overshoot Vinos – 1.0 V D1.7
Input voltage undershoot Vinus – 1.0 V D1.8
Storage temperature range Tstg –55 150 oC D1.9
1 Absolute maximum ratings are stress ratings only, and functional operation at the maximums is not guaranteed. Stresses
beyond those listed may affect device reliability or cause permanent damage.
Supply voltage - G2_LE core and periph- VDD_CORE 1.42 1.58 V D2.1
eral logic
Supply voltage - standard I/O buffers VDD_IO 3.0 3.6 V D2.2
Supply voltage - memory I/O buffers VDD_MEM_IOSDR 3.0 3.6 V D2.3
(SDR)
Supply voltage - memory I/O buffers VDD_MEM_IODDR 2.42 2.63 V D2.4
(DDR)
Supply voltage - System APLL SYS_PLL_AVDD 1.42 1.58 V D2.5
Supply voltage - G2_LE APLL CORE_PLL_AVDD 1.42 1.58 V D2.6
Input voltage - standard I/O buffers Vin 0 VDD_IO V D2.7
Input voltage - memory I/O buffers (SDR) VinSDR 0 VDD_MEM_IOSDR V D2.8
resistor VDD_IO
Vin = VDD_IO
Output high voltage IOH is driver dependent 2 VOH 2.4 — V D3.19
VDD_IO, VDD_IO_MEMSDR
1 Leakage current is measured with output drivers disabled and pull-up/pull-downs inactive.
2 See Table 4 for the typical drive capability of a specific signal pin based on the type of output driver associated with that
pin as listed in Table 51.
3 All injection current is transferred to VDD_IO/VDD_IO_MEM. An external load is required to dissipate this current to main-
tain the power supply within the specified voltage range.
Total injection current for all digital input-only and all digital input/output pins must not exceed 10 mA. Exceeding this limit
can cause disruption of normal operation.
P IO = P IOint + ∑ N × C × VDD_IO × f
2
where N is the number of output pins switching in a group M, C is the capacitance per pin, VDD_IO is the
IO voltage swing, f is the switching frequency and PIOint is the power consumed by the unloaded IO stage.
The total power consumption of the MPC5200 processor
must not exceed the value, which would cause the maximum junction temperature to be exceeded.
SYS_XTAL/XLB/PCI/IPG/CORE (MHz)
SpecID
Mode 33/66/33/33/264 33/132/66/132/396 Unit Notes
Typ Typ
Operational 727.5 1080 mW 1 2
, D5.1
Nap — 225 mW 1 4
, D5.3
Freescale Semiconductor, Inc...
Sleep — 225 mW 1 5
, D5.4
4
Junction to Board RθJB 14 °C/W D6.5
5
Junction to Case RθJC 8 °C/W D6.6
Junction to Package Top Natural Convection ΨJT 2 °C/W 6
D6.7
1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
2 Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3 Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is mea-
sured on the top surface of the board near the package.
5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
6 Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is
written as Psi-JT.
The junction to ambient thermal resistance is an industry standard value, which provides a quick and easy
estimation of thermal performance. Unfortunately, there are two values in common usage: the value
determined on a single layer board, and the value obtained on a board with two planes. For packages such
as the PBGA, these values can be different by a factor of two. Which value is correct depends on the power
dissipated by other components on the board. The value obtained on a single layer board is appropriate for
the tightly packed printed circuit board. The value obtained on the board with the internal planes is usually
appropriate if the board has low power dissipation and the components are well separated.
Historically, the thermal resistance has frequently been expressed as the sum of a junction to case thermal
resistance and a case to ambient thermal resistance:
R θJC is device related and cannot be influenced by the user. The user controls the thermal environment to
change the case to ambient thermal resistance, R θCA. For instance, the user can change the air flow
around the device, add a heat sink, change the mounting arrangement on printed circuit board, or change
the thermal dissipation on the printed circuit board surrounding the device. This description is most useful
for ceramic packages with heat sinks where some 90% of the heat flow is through the case to the heat sink
to ambient. For most packages, a better model is required.
Freescale Semiconductor, Inc...
A more accurate thermal model can be constructed from the junction to board thermal resistance and the
junction to case thermal resistance1-3. The junction to case covers the situation where a heat sink will be
used or where a substantial amount of heat is dissipated from the top of the package. The junction to
board thermal resistance describes the thermal performance when most of the heat is conducted to the
printed circuit board. This model can be used for either hand estimations or for a computational fluid
dynamics (CFD) thermal model.
To determine the junction temperature of the device in the application after prototypes are available, the
Thermal Characterization Parameter (ΨJT) can be used to determine the junction temperature with a
measurement of the temperature at the top center of the package case using the following equation:
TJ = TT +(Ψ JT × PD ) Eqn. 3
where:
TT = thermocouple temperature on top of package (ºC)
Ψ JT = thermal characterization parameter (ºC/W)
PD = power dissipation in package (W)
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T
thermocouple epoxied to the top center of the package case. The thermocouple should be positioned, so
that the thermocouple junction rests on the package. A small amount of epoxy is placed over the
thermocouple junction and over approximately one mm of wire extending from the junction. The
thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling
effects of the thermocouple wire.
1 The SYS_XTAL frequency and PLL Configuration bits must be chosen such that the resulting system frequency, CPU
(core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or minimum operating frequen-
cies.
2 This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL.
Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating fre-
quency.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification
also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
1 The SYSCLK frequency and G2_LE PLL Configuration bits must be chosen such that the resulting system frequencies,
CPU (core) frequency, and G2_LE PLL (VCO) frequency do not exceed their respective maximum or minimum oper-
ating frequencies.
2 This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different types
of jitter can exist on the input to core_sysclk, systemic and true random jitter. True random jitter is rejected, but the PLL.
Systemic jitter will be passed into and through the PLL to the internal clock circuitry, directly reducing the operating fre-
quency.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
the PLL lock after a stable Vdd and core_sysclk are reached during the power-on reset sequence. This specification
also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
• Ethernet
t CYCLE
t DUTY t DUTY t RISE t FALL
CV IH
SYSCLK VM VM VM
CV IL
3.3.3 Resets
The MPC5200 has three reset pins:
• PORESET - Power on Reset
• HRESET - Hard Reset
• SRESET - Software Reset
These signals are asynchronous I/O signals and can be asserted at any time. The input side uses a
Schmitt trigger and requires the same input characteristics as other MPC5200 inputs, as specified in the
DC Electrical Specifications section. Table 14 specifies the pulse widths of the Reset inputs.
Max Pulse
Name Description Min Pulse Width Reference Clock SpecID
Width
Freescale Semiconductor, Inc...
NOTE:
As long as VDD is not stable the HRESET output is not stable.
NOTE:
Make sure that the PORESET does not carry any glitches. The MPC5200
has no filter to prevent them from getting into the chip.
SYS_XTAL
PORESET
HRESET
Freescale Semiconductor, Inc...
RST_CFG_WRD
sample sample sample sample sample sample
sample sample sample sample sample sample
LOCK
NOTE:
Beware of changing the values on the pins of the reset configuration word
after the deassertion of PORESET. This may cause problems because it
may change the internal clock ratios and so extend the PLL locking
process.
IRQ0 cint
Encoder core_cint
8
8 GPIOs GPIO Std core_int
int
8
Freescale Semiconductor, Inc...
IRQ2 PIs
Main Interrupt
IRQ3 Controller
Notes:
1. PIs = Programmable Inputs
2. Grouper and Encoder functions imply programmability in software
Due to synchronization, prioritization, and mapping of external interrupt sources, the propagation of
external interrupts to the core processor is delayed by several IP_CLK clock cycles. The following table
specifies the interrupt latencies in IP_CLK cycles. The IP_CLK frequency is programmable in the Clock
Distribution Module (see Note Table 16).
Interrupt Type Pin Name Clock Cycles Reference Clock Core Interrupt SpecID
Interrupt Requests IRQ0 10 IP_CLK critical (cint) A4.1
IRQ0 10 IP_CLK normal (int) A4.2
IRQ1 10 IP_CLK normal (int) A4.3
IRQ2 10 IP_CLK normal (int) A4.5
IRQ3 10 IP_CLK normal (int) A4.6
Interrupt Type Pin Name Clock Cycles Reference Clock Core Interrupt SpecID
Since all external interrupt signals are synchronized into the internal processor bus clock domain, each of
these signals has to exceed a minimum pulse width of more than one IP_CLK cycle.
Name Min Pulse Width Max Pulse Width Reference Clock SpecID
All external interrupts (IRQs, GPIOs) > 1 clock cycle — IP_CLK A4.22
Notes:
1) The frequency of the IP_CLK depends on the register settings in Clock Distribution Module. See the MPC5200 User
Manual [1] for further information.
2) If the same interrupt occurs a second time while its interrupt service routine has not cleared the former one, the second
interrupt will not be recognized at all.
Besides synchronization, prioritization, and mapping the latency of an external interrupt to the start of its
associated interrupt service routine also depends on the following conditions: To get a minimum interrupt
service response time, it is recommended to enable the instruction cache and set up the maximum core
clock, XL bus, and IP bus frequencies (depending on board design and programming). In addition, it is
advisable to execute an interrupt handler, which has been implemented in assembly code.
3.3.5 SDRAM
MEM_CLK
DMhold DQM hold after rising edge of MEM_CLK tmem_clk*0.25-0.7 — ns A5.5
datasetup MDQ setup to rising edge of MEM_CLK — 0.3 ns A5.6
datahold MDQ hold after rising edge of MEM_CLK 0.2 — ns A5.7
MEM_CLK
tvalid
thold
Control Signals Active NOP READ NOP NOP NOP NOP NOP
DMvalid DMhold
datasetup datahold
MDQ (Data)
tvalid thold
tvalid thold
NOTE: Control Signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
MEM_CLK
DMhold DQM hold after rising edge of Mem_clk tmem_clk*0.25-0.7 — ns A5.12
datavalid MDQ valid after rising edge of — tmem_clk*0.75+0.4 ns A5.13
MEM_CLK
datahold MDQ hold after rising edge of tmem_clk*0.75-0.7 — ns A5.14
MEM_CLK
MEM_CLK
tvalid
thold
Control Signals Active NOP WRITE NOP NOP NOP NOP NOP
DMvalid DMhold
datavalid datahold
MDQ (Data)
tvalid thold
NOTE: Control Signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
MEM_CLK
MEM_CLK
tvalid thold
Control Signals Active NOP READ NOP NOP NOP NOP NOP
MDQ (Data)
tvalid thold
tvalid
thold
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
MEM_CLK
MEM_CLK
MDQ (Data)
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
3.3.6 PCI
The PCI interface on the MPC5200 is designed to PCI Version 2.2 and supports 33-MHz and 66-MHz PCI
operations. See the PCI Local Bus Specification [4]; the component section specifies the electrical and
timing parameters for PCI components with the intent that components connect directly together whether
on the planar or an expansion board, without any external buffers or other “glue logic.” Parameters apply at
the package pins, not at expansion board edge connectors.
The MPC5200 is always the source of the PCI CLK. The clock waveform must be delivered to each
33-MHz or 66-MHz PCI component in the system. Figure 9 shows the clock waveform and required
measurement points for 3.3 V signaling environments. Table 22 summarizes the clock specifications.
Tcyc
T high T low
0.6Vcc
0.5Vcc
Freescale Semiconductor, Inc...
66 MHz 33 MHz
Sym Description Units Notes SpecID
Min Max Min Max
66 MHz 33 MHz
Sym Description Units Notes SpecID
Min Max Min Max
66 MHz 33 MHz
Sym Description Units Notes SpecID
Min Max Min Max
PCI CLK
2
3
1
OUTPUT
SIGNALS
1 PCI CLK to Signal hold
2 PCI CLK to Signal valid
3 PCI CLK to Signal Hi Z
Figure 10 Output Signals Timing
PCI_CLK
t or t
RD WR
CS[x]
R/W
DATA (rd)
Freescale Semiconductor, Inc...
Note: 1. The t RD /t WR is wait states as programmed for corresponding access and chip select.
2. OE is active during Read only, t OE is the Output Enable to Output Delay time
3. Read data has nominal setup/hold requirements around the CS negation.
RW
ACK Input
3.3.8 ATA
The MPC5200 ATA Controller is completely software programmable. It can be programmed to operate with
ATA protocols using their respective timing, as described in the ANSI ATA-4 specification. The ATA
interface is completely asynchronous in nature. Signal relationships are based on specific fixed timing in
terms of timing units (nano seconds).
ATA data setup and hold times, with respect to Read/Write strobes, are software programmable inside the
ATA Controller. Data setup and hold times are implemented using counters. The counters count the
number of ATA clock cycles needed to meet the ANSI ATA-4 timing specifications. For details, see the
ANSI ATA-4 specification [5] and how to program an ATA Controller and ATA drive for different ATA
protocols and their respective timing. See the MPC5200 User Manual [1].
The MPC5200 ATA Host Controller design makes data available coincidentally with the active edge of the
WRITE strobe in PIO and Multiword DMA modes.
• Write data is latched by the drive at the inactive edge of the WRITE strobe. This gives ample
setup-time beyond that required by the ATA-4 specification.
Freescale Semiconductor, Inc...
• Data is held unchanged until the next active edge of the WRITE strobe. This gives ample hold-time
beyond that required by the ATA-4 specification.
All ATA transfers are programmed in terms of system clock cycles (IP bus clocks) in the ATA Host
Controller timing registers. This puts constraints on the ATA protocols and their respective timing modes in
which the ATA Controller can communicate with the drive.
Faster ATA modes (i.e., UDMA 0, 1, 2) are supported when the system is running at a sufficient frequency
to provide adequate data transfer rates. Adequate data transfer rates are a function of the following:
• The MPC5200 operating frequency (IP bus clock frequency)
• Internal MPC5200 bus latencies
• Other system load dependent variables
The ATA clock is the same frequency as the IP bus clock in MPC5200. See the MPC5200 User Manual [1].
NOTE:
All output timing numbers are specified for nominal 50 pF loads.
Min/Ma
Mode 0 Mode 1 Mode 2 Mode 3 Mode 4
PIO Timing Parameter x SpecID
(ns) (ns) (ns) (ns) (ns)
(ns)
Min/Ma
Mode 0 Mode 1 Mode 2 Mode 3 Mode 4
PIO Timing Parameter x SpecID
(ns) (ns) (ns) (ns) (ns)
(ns)
CS[0]/CS[3]/DA[2:0]
t2 t9 t8
Freescale Semiconductor, Inc...
t1 t0
DIOR/DIOW
t3 t4
WDATA
t5 t6
RDATA
tA tB
IORDY
Multiword DMA Timing Parameters Min/Max Mode 0(ns) Mode 1(ns) Mode 2(ns) SpecID
Multiword DMA Timing Parameters Min/Max Mode 0(ns) Mode 1(ns) Mode 2(ns) SpecID
t0
Freescale Semiconductor, Inc...
DMARQ
(Drive) tL
tC
DMACK
(Host)
tI tD tK tJ
DIOR
DIOW
(Host)
tE
RDATA
(Drive)
tS
tF
WDATA
(Host)
tG tH
(t) 2CYC 240 — 160 — 120 — Typical sustained average two cycle time. A8.25
(t) CYC 114 — 75 — 55 — Cycle time allowing for asymmetry and clock A8.26
variations from STROBE edge to STROBE
edge
(t) 2CYC 235 — 156 — 117 — Two-cycle time allowing for clock variations, A8.27
from rising edge to next rising edge or from fall-
ing edge to next falling edge of STROBE.
(t) DS 15 — 10 — 7 — Data setup time at recipient. A8.28
Freescale Semiconductor, Inc...
1 t UI, t MLI, t LI indicate sender-to-recipient or recipient-to-sender interlocks. That is, one agent (either sender or recipient) is
waiting for the other agent to respond with a signal before proceeding.
• t UI is an unlimited interlock that has no maximum time value.
• t MLI is a limited time-out that has a defined minimum.
• t LI is a limited time-out that has a defined maximum.
2 All timing parameters are measured at the connector of the drive to which the parameter applies. For example, the sender
shall stop generating STROBE edges t RFS after negation of DMARDY. Both STROBE and DMARDY timing measure-
ments are taken at the connector of the sender. Even though the sender stops generating STROBE edges, the receiver
may receive additional STROBE edges due to propagation delays. All timing measurement switching points (low to high
and high to low) are taken at 1.5 V.
DMARQ
(device)
t UI
DMACK
(device)
t ACK t ENV t FS
STOP t ZAD
(host)
t ACK t ENV t FS
HDMARDY
(host)
t ZAD
t ZIORDY
DSTROBE
(device)
t AZ t DVS t DVH
DD(0:15)
t ACK
t 2CYC
t CYC t CYC
t 2CYC
DSTROBE
at device
tDVH tDVS tDVH tDVS tDVH
DD(0:15)
at device
DSTROBE
at host
DD(0:15)
at host
DMARQ
(device)
DMARQ
(host)
t RP
STOP
(host)
t SR
HDMARDY
(host)
t RFS
DSTROBE
(device)
DD[0:15]
(device)
DMARQ
(device)
DMACK
(host)
t LI t LI t MLI t ACK
STOP
(host)
tLI t ACK
HDMARDY
(host)
t SS
t IORDYZ
DSTROBE
(device)
Freescale Semiconductor, Inc...
t ZAH
t DVS
t AZ t DVH
DD[0:15] CRC
t ACK
DA0,DA1,DA2,
CS[0:1]
DMARQ
(device)
t LI t MLI
DMACK
(host)
t RP t ZAH t ACK
STOP
(host)
t AZ
tACK
HDMARDY
(host)
t RFS t LI t MLI
t IORDYZ
DSTROBE
(device) t DVS
t DVH
DD[0:15] CRC
t ACK
DA0,DA1,DA2,
CS[0:1]
DMARQ
(device) tUI
DMACK
(host)
tENV
tACK
STOP
(host)
tLI tUI
tZIORDY
DDMARDY
(host)
tACK
Freescale Semiconductor, Inc...
HSTROBE
(device)
tDVS
tDVH
DD[0:15]
(host)
tACK
DA0,DA1,DA2,
CS[0:1]
t 2CYC
t CYC t CYC
t 2CYC
HSTROBE
(host)
t DVS t DVS
t DVH t DVH t DVH
DD[0:15]
(host)
HSTROBE
(device)
t DS t DS
t DH
t DH t DH
DD[0:15]
(device)
t RP
DMARQ
(device)
DMACK
(host)
STOP
(host)
t SR
DDMARDY
(device)
t RFS
HSTROBE
Freescale Semiconductor, Inc...
DD[0:15]
(host)
DMARQ
(device)
t LI t MLI
DMACK
(host)
t SS t LI t ACK
STOP
(host)
t LI t IORDYZ
DDMARDY
(device)
tACK
HSTROBE
(host)
t DVS t DVH
DD[0:15]
(host) CRC
DA0,DA1,DA2, t ACK
CS[0:1]
DMARQ
(device)
DMACK
(host)
t LI t MLI t ACK
STOP
(host)
t RP
t IORDYZ
DDMARDY
(device)
HSTROBE
(host)
t DVS t DVH
DD[0:15]
CRC
(host)
t ACK
DA0,DA1,DA2,
CS[0:1]
DIOR
ATA_ISOLATION
1 2
3.3.9 Ethernet
AC Test Timing Conditions:
• Output Loading
All Outputs: 25 pF
1 RX_CLK shall have a frequency of 25% of data rate of the received signal. See the IEEE 802.3 Specification [6].
M3
RX_CLK (Input)
M4
RXD[3:0] (inputs)
RX_DV
RX_ER
M1 M2
Figure 26 Ethernet Timing Diagram—MII Rx Signal
1 the TX_CLK frequency shall be 25% of the nominal transmit frequency, e.g., a PHY operating at 100 Mb/s must provide
a TX_CLK frequency of 25 MHz and a PHY operating at 10 Mb/s must provide a TX_CLK frequency of 2.5 MHz. See the
IEEE 802.3 Specification [6].
M6
TX_CLK (Input)
M5 M7
TXD[3:0] (Outputs)
TX_EN
TX_ER
CRS, COL
M8
2 The MDC period must be set to a value of less then or equal to 2.5 MHz (to be compliant with the IEEE MII character-
istic) by programming the FEC MII_SPEED control register. See the MPC5200 User Manual [1].
M12
M13
MDC (Output)
M14
M9
MDIO (Output)
MDIO (Input)
Freescale Semiconductor, Inc...
M10 M11
3.3.10 USB
NOTE:
Output timing was specified at a nominal 50 pF load.
USB_OE
4
3
USB_TXN
1 1
3
4
USB_TXP
Freescale Semiconductor, Inc...
3.3.11 SPI
NOTE:
Output timing was specified at a nominal 50 pF load.
1 11
10
SCK
(CLKPOL=0)
Output 2 2
10
11
SCK
(CLKPOL=1)
Output
8 9
3
SS
Output
5
Freescale Semiconductor, Inc...
MOSI
Output
6 6
MISO
Input
7 7
NOTE:
Output timing was specified at a nominal 50 pF load.
SCK
(CLKPOL=0)
Input 2 2
SCK
(CLKPOL=1)
Input
3 8 9
SS
Input
Freescale Semiconductor, Inc...
6 7
MOSI
Input
4 5
MISO
Output
NOTE:
Output timing was specified at a nominal 50 pF load.
1 10
9
SCK
(CLKPOL=0)
Output 2 2
9
10
SCK
(CLKPOL=1)
Output
7 8
3
SS
Output
Freescale Semiconductor, Inc...
4
MOSI
Output
5
MISO
Input
6
NOTE:
Output timing was specified at a nominal 50 pF load.
SCK
(CLKPOL=0)
Input 2 2
SCK
(CLKPOL=1)
Input
7 8
3
SS
Input
Freescale Semiconductor, Inc...
5 6
MOSI
Input
4
MISO
Output
3.3.12 MSCAN
The CAN functions are available as RX and TX pins at normal IO pads (I2C1+GPTimer or PSC2). There is
no filter for the WakeUp dominant pulse. Any High-to-Low edge can cause WakeUp, if configured.
3.3.13 I2C
81 Start condition setup time (for repeated start con- 20 — IP-Bus A13.15
dition only) Cycle3
1 Programming IFDR with the maximum frequency (IFDR=0x20) results in the minimum output timings listed. The I2C
interface is designed to scale the data transition time, moving it to the middle of the SCL low period. The actual posi-
tion is affected by the prescale and division values programmed in IFDR.
2 Because SCL and SDA are open-drain-type outputs, which the processor can only actively drive low, the time SCL
or SDA takes to reach a high level depends on external signal capacitance and pull-up resistor values
3 Inter Peripheral Clock is defined in the MPC5200 User Manual [1].
NOTE:
Output timing was specified at a nominal 50 pF load.
2 6 5
SCL
3
Freescale Semiconductor, Inc...
1 4 7 8 9
SDA
3.3.14 J1850
See the MPC5200 User Manual [1].
3.3.15 PSC
NOTE:
Output timing was specified at a nominal 50 pF load.
BitClk
(CLKPOL=0) 3
Output 2 2 4
BitClk
(CLKPOL=1)
Output
4
5 3
Frame
(SyncPol = 1) 6
Output
Freescale Semiconductor, Inc...
Frame
(SyncPol = 0)
Output
7
TxD
Output
8
RxD
Input
Figure 36 Timing Diagram — 8,16, 24, and 32-bit CODEC / I2S Master Mode
Table 42 Timing Specifications — 8,16, 24, and 32-bit CODEC / I2S Slave Mode
NOTE:
Output timing was specified at a nominal 50 pF load.
BitClk
(CLKPOL=0)
Input 2 2
BitClk
(CLKPOL=1)
Input
3
Frame
(SyncPol = 1)
Input
Freescale Semiconductor, Inc...
Frame
(SyncPol = 0)
Input
4
TxD
Output
5
RxD
Input
6
Figure 37 Timing Diagram — 8,16, 24, and 32-bit CODEC / I2S Slave Mode
NOTE:
Output timing was specified at a nominal 50 pF load.
BitClk
(CLKPOL=0) 3 2
Input 4
Sync
(SyncPol = 1)
Output 5
Sdata_out
Output
6 7
Freescale Semiconductor, Inc...
Sdata_in
Input
1 Pulse high time, defined in the IrDA protocol definition 0.125 10000 µs A15.22
2 Pulse low time, defined in the IrDA protocol definition 0.125 10000 µs A15.23
3 Transmitter rising time — 7.9 ns A15.24
4 Transmitter falling time — 7.9 ns A15.25
NOTE:
Output timing was specified at a nominal 50 pF load.
bcfb
IrDA_TX
(SIR / FIR / MIR) 3
1 2
1 SCK cycle time, programable in the PSC CCS register 30.0 — ns A15.26
2 SCK pulse width, 50% SCK cycle time 15.0 — ns A15.27
3 Slave select clock delay, programable in the PSC CCS 30.0 — ns A15.28
register
4 Output Data valid after Slave Select (SS) — 8.9 ns A15.29
5 Output Data valid after SCK — 8.9 ns A15.30
6 Input Data setup time 6.0 — ns A15.31
Freescale Semiconductor, Inc...
1 11
10
SCK
(CLKPOL=0)
Output 2 2
10
11
SCK
(CLKPOL=1)
Output
8 9
3
SS
Output
4 5
MOSI
Output
6 6
MISO
Input
7 7
SCK
(CLKPOL=0)
Input 2 2
SCK
(CLKPOL=1)
Input
3 8 9
SS
Input
4 5
MOSI
Input
6 7
MISO
Output
NOTE:
Output timing was specified at a nominal 50 pF load.
1 10
9
SCK
(CLKPOL=0)
Output 2 2
9
10
SCK
(CLKPOL=1)
Output
7 8
3
SS
Output
4
MOSI
Output
5
MISO
Input
6
NOTE:
Output timing was specified at a nominal 50 pF load.
SCK
(CLKPOL=0)
Input 2 2
SCK
(CLKPOL=1)
Input
7 8
3
SS
Input
5 6
MOSI
Input
4
MISO
Output
tCK
tDV tDH
Output valid
tIH
tIS
Input
valid
2 2
TCK VM VM VM
3 3
VM = Midpoint Voltage
Numbers shown reference Table 50.
TCK
TRST
5
Numbers shown reference Table 50.
TCK
6 7
9
Freescale Semiconductor, Inc...
DATA OUTPUTS
Numbers shown reference Table 50.
TCK
10 11
12
13
TDO
Numbers shown reference Table 50.
4 Package Description
TE-PBGA package.
PIN A1
INDEX D C
4X 0.2
A
272X
0.2 A
E E2 0.35 A
NOTES:
1. DIMENSIONS AND TOLERANCING PER ASME
Y14.5M, 1994.
Freescale Semiconductor, Inc...
2. DIMENSIONS IN MILLIMETERS.
3. DIMENSION IS MEASURED AT THE MAXIMUM
SOLDER BALL DIAMETER PARALLEL TO
PRIMARY DATUM A.
D2 0.2 M A B C 4. PRIMARY DATUM A AND THE SEATING PLANE
ARE DEFINED BY THE SPHERICAL CROWNS OF
B THE SOLDER BALLS.
TOP VIEW
MILLIMETERS
DIM MIN MAX
(D1) A 2.05 2.65
A1 0.50 0.70
19X e A2 0.50 0.70
A3 1.05 1.25
b 0.60 0.90
Y
D 27.00 BSC
19X e W
D1 24.13 REF
V
D2 23.30 24.70
U
E 27.00 BSC
T
E1 24.13 REF
R
E2 23.30 24.70
P
e 1.27 BSC
N
M
L
(E1) K
J
A1
4X e /2 H A3
G
F A2
E A
D
C
B SIDE VIEW
A
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
272X b 3
0.3 M A B C
BOTTOM VIEW
0.15 M A
CASE 1135A–01
ISSUE B
DATE 10/15/1997
Figure 49 Mechanical Dimensions and Pinout Assignments for the MPC5200, 272
TE-PBGA
SDRAM
PCI
Local Plus
ATA
Ethernet
TX_ER
IRDA
USB
I2C
PSC
BitClk, RTS
GPIO/TIMER
Clock
Misc
Freescale Semiconductor, Inc...
Test/Configuration
VDD_IO -
VDD_MEM_IO -
VDD_CORE -
VSS_IO/CORE -
SYS_PLL_AVDD -
CORE_PLL_AVDD -
1 All “open drain” outputs of the MPC5200 are actually regular three-state output drivers with the output data tied low
and the output enable controlled. Thus, unlike a true open drain, there is a current path from the external system to the
MPC5200 I/O power rail if the external signal is driven above the MPC5200 I/O power rail voltage.
Freescale Semiconductor, Inc...
3.3V VDD_IO,
VDD_IO_MEM (SDR)
1
1.5V VDD_CORE,
PLL_AVDD
0
Time
Note:
1. VDD_CORE should not exceed VDD_IO, VDD_IO_MEM or PLL_AVDD by more than 0.4 V at any time,
including power-up.
2. It is recommended that VDD_CORE/PLL_AVDD should track VDD_IO/VDD_IO_MEM up to 0.9 V
then separate for completion of ramps.
3. Input voltage must not be greater than the supply voltage (VDD_IO, VDD_IO_MEM, VDD_CORE, or
PLL_AVDD) by more than 0.5 V at any time, including during power-up.
4. Use 1 microsecond or slower rise time for all supplies.
The relationship between VDD_IO_MEM and VDD_IO is non-critical during power-up and power-down
sequences. Both VDD_IO_MEM (2.5 V or 3.3 V) and VDD_IO are specified relative to VDD_CORE.
VDD_CORE/PLL_AVDD and VDD_IO/VDD_IO_MEM should track up to 0.9 V and then separate for the
completion of ramps with VDD_IO/VDD_IO_MEM going to the higher external voltages. One way to
accomplish this is to use a low drop-out voltage regulator.
10 Ω <1Ω
Power AVDD device pin
Supply
source 10 µF 200-400 pF
For more details refer to the Reset and JTAG Timing Specification.
PORRESET
JTAG_TRST
PORRESET PORRESET
1 2 JTAG_TRST
Key 14
Freescale Semiconductor, Inc...
3 4 10Kohm
TMS VDD
9
5 6 12 JTAG_TMS
7 8 10Kohm
TCK VDD
7
9 10
62 VDD JTAG_TCK
11 12
10Kohm
3 TDI
VDD
13 K Key
JTAG_TDI
15 16
CKSTP_OUT TEST_SEL_0
15
TDO JTAG_TDO
1
halted
53 NC
qack
24 NC
10 NC
8 NC
PORRESET PORRESET
HRESET MPC5200
HRESET 10Kohm
VDD
SRESET 10Kohm
VDD
SRESET
JTAG_TRST
Freescale Semiconductor, Inc...
10Kohm
VDD
JTAG_TMS
10Kohm
VDD
JTAG_TCK
10Kohm
VDD
JTAG_TDI
TEST_SEL_0
JTAG_TDO
7 Ordering Information
Rev.
Substantive Change(s)
No.
0.1 First Preliminary release with some TBD’s in spec tables (6/2003)
0.2 Added AC specs for missing modules, power-on sequence, misc other updates (7/2003)
0.3 Added Memory Interface Timing values, misc other updates (8/2003)
Freescale Semiconductor, Inc...
2.0 Added Power Numbers (Section 3.1.5), updated Oscillator and PLL Characteristics (Section
3.2), updated SDRAM AC Characteristics (Section 3.3.5)
JAPAN:
Motorola Japan Ltd.
SPS, Technical Information Center
3-20-1, Minami-Azabu, Minato-ku
Tokyo 106-8573, Japan
81-3-3440-3569
ASIA/PACIFIC:
Motorola Semiconductors H.K. Ltd.
Silicon Harbour Centre
2 Dai King Street
Freescale Semiconductor, Inc...
HOME PAGE:
http://motorola.com/semiconductors
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MPC5200/D
Rev. 2
5/2004
www.datasheetcatalog.com