Silicon N-Channel Power MOS FET Array: Application
Silicon N-Channel Power MOS FET Array: Application
Silicon N-Channel Power MOS FET Array: Application
Features
Low on-resistance R DS(on) 0.38 , VGS = 10 V, I D = 1 A R DS(on) 0.53 , VGS = 4 V, I D = 1 A Capable of 4 V gate drive Low drive current High speed switching High density mounting Suitable for motor driver, solenoid driver and lamp driver
4AK18
Outline
SP-10
3 D 4 G 2G
5 D 6 G
7 D 8 G
9 D
12 34 56 78 9 10
1S
S 10
Unit V V A A A W W C C
4AK18
Electrical Characteristics (Ta = 25C) (1 Unit)
Item Drain to source breakdown voltage Gate to source breakdown voltage Gate to source leak current Symbol V(BR)DSS V(BR)GSS I GSS Min 60 20 1.0 Forward transfer admittance Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Body to drain diode forward voltage Body to drain diode reverse recovery time Note: 1. Pulse Test |yfs| Ciss Coss Crss t d(on) tr t d(off) tf VDF t rr 1.2 Typ 0.25 0.40 2.0 240 115 35 4 15 80 40 1.0 70 Max 10 100 2.0 0.38 0.53 Unit V V A A V S pF pF pF ns ns ns ns V ns I F = 2 A, VGS = 0 I F = 2 A, VGS = 0 dIF/dt = 50 A/s Test conditions I D = 10 mA, VGS = 0 I G = 100 A, VDS = 0 VGS = 16 V, VDS = 0 VDS = 50 V, VGS = 0 I D = 1 mA, VDS = 10 V ID = 1 A VGS = 10 V*1 ID = 1 A VGS = 4 V*1 ID = 1 A VDS = 10 V*1 VDS = 10 V VGS = 0 f = 1 MHz ID = 1 A VGS = 10 V RL = 30
Zero gate voltage drain current I DSS Gate to source cutoff voltage Static drain to source on state resistance VGS(off) RDS(on)
4AK18
Maximum Channel Dissipation Curve 6 Channel Dissipation Pch (W) 5 4 3 2 1 30 Channel Dissipation Pch (W) Condition : Channel Dissipation of each die is identical 4 Device Operation 3 Device Operation 2 Device Operation 1 Device Operation Maximum Channel Dissipation Curve Condition : Channel Dissipation of each die is identical 4 Device Operation 3 Device Operation 2 Device Operation 1 Device Operation
20
10
150
150
10 s
ar ea
3
3V
) ot s s sh 0 m (1 10 1 n s tio ) m ra C 10 pe 5 O =2 C D (T C PW
3 1.0 0.3
DS
(o
n)
2.5 V VGS = 2 V
Ta = 25C 0.1
0
0.3 1.0 3 10 30 100 Drain to Source Voltage VDS (V)
4AK18
Typical Transfer Characteristics 5
VDS = 10 V Pulse Test 75C TC= 25C Drain to Source Saturation Voltage VDS (on) (V) 25C
Drain to Source Saturation Voltage vs. Gate to Source Voltage 2.0 1.6
5A Pulse Test
4
Drain Current ID (A)
1.2
0.8
2A
0.4
ID = 1 A
2 1.0 0.5
10 V VGS = 4 V
0.8
ID = 2 A
0.6
VGS = 4 V
1A
0.4
5A
0.2
VGS = 10 V
1 A, 2 A
20
0 40
160
4AK18
Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance yfs (S) 10 5 Reverse Recovery Time trr (ns) VDS = 10 V 25C Pulse Test TC = 25C 500 di/dt = 50 A/s, Ta = 25C VGS = 0 Pulse Test Body to Drain Diode Reverse Recovery Time
200 100 50
20 10 5 0.2
0.1
20
Typical Capacitance vs. Drain to Source Voltage 1000 300 Capacitance C (pF) 100 30 10 3 1 0 10 20 30 40 50 Drain to Source Voltage VDS (V) Ciss Coss Drain to Source Voltage VDS (V) VGS = 0 f = 1 MHz
Crss
10
4AK18
Reverse Drain Current vs. Source to Drain Voltage Switching Characteristics 100 Reverse Drain Current IDR (A) td (off) 50 Switching Time t (ns) tf 20 tr 10 5 td (on) 2 1 0.05 VGS = 10 V VDD = 30 V PW = 2s, duty < 1 %
5 4 Pulse Test
10 V 15 V
2 5V 1 VGS = 0, 5 V
0.8 0.4 1.2 2.0 1.6 Source to Drain Voltage VSD (V)
4AK18
Package Dimensions As of January, 2001
Unit: mm
26.5 0.3 4.0 0.2 10.0 0.3 2.5
1.82
2.54
1.4
0.55 0.1
10.5 0.5
1.5 0.2
0.55 0.06
+0.1
10
SP-10 2.9 g
4AK18
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachis or any third partys patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third partys rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachis sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachis sales office for any questions regarding this document or Hitachi semiconductor products.
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