2SK3569
2SK3569
2SK3569
com
2SK3569
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (-MOSVI)
2SK3569
Switching Regulator Applications
Low drain-source ON resistance: RDS (ON) = 0.54 (typ.) High forward transfer admittance: |Yfs| = 8.5S (typ.) Low leakage current: IDSS = 100 A (VDS = 600 V) Enhancement-mode: Vth = 2.0~4.0 V (VDS = 10 V, ID = 1 mA) Unit: mm
Unit V V V
Drain power dissipation (Tc = 25C) Single pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range
SC-67 2-10U1B
Thermal Characteristics
Characteristics Thermal resistance, channel to case Thermal resistance, channel to ambient Symbol Rth (ch-c) Rth (ch-a) Max 2.78 62.5 Unit 2 C/W C/W
Note 1: Please use devices on conditions that the channel temperature is below 150C. Note 2: VDD = 90 V, Tch = 25C(initial), L = 6.36 mH, IAR = 10 A, RG = 25 Note 3: Repetitive rating: Pulse width limited by maximum channel temperature This transistor is an electrostatic sensitive device. Please handle with caution.
3 1
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2SK3569
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Gate-source breakdown voltage Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge Gate-source charge Gate-drain charge tf toff Qg Qgs Qgd VDD 400 V, VGS = 10 V, ID = 10 A Duty < 1%, tw = 10 s = Symbol IGSS V (BR) GSS IDSS V (BR) DSS Vth RDS (ON) Yfs Ciss Crss Coss tr ton 10 V VGS 0V 50 ID = 5 A VOUT VDS = 25 V, VGS = 0 V, f = 1 MHz Test Condition VGS = 25 V, VDS = 0 V IG = 10 A, VDS = 0 V VDS = 600 V, VGS = 0 V ID = 10 mA, VGS = 0 V VDS = 10 V, ID = 1 mA VGS = 10 V, ID = 5 A VDS = 10 V, ID = 5 A Min 30 600 2.0 0.7 Typ. 0.54 8.5 1500 15 180 22 50 36 180 42 23 19 Max 10 100 4.0 0.75 pF Unit A V A V V S
ns
RL = 40 VDD 200 V
nC
Marking
K3569
TYPE
Lot Number
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2SK3569
ID VDS
10 COMMON SOURCE Tc = 25C PULSE TEST 10,8 6 5.3 20 10 5.1 5 4.8 6 4.6 4 4.4 2 4.2
ID VDS
8 6 16 5.5 5.25 12 5 8 4.75 4.5 VGS = 4 V 0 0 COMMON SOURCE Tc = 25C PULSE TEST
(A)
ID
DRAIN CURRENT
DRAIN CURRENT
ID
4
VGS = 4V 0 0 2 4 6 8 10 10 20 30
(A)
40
50
DRAIN-SOURCE VOLTAGE
VDS
(V)
DRAIN-SOURCE VOLTAGE
VDS
(V)
ID VGS (V)
20 COMMON SOURCE 10
VDS VGS
COMMON SOURCE Tc = 25 8 PULSE TEST
(A)
16
ID
DRAIN CURRENT
12
DRAIN-SOURCE VOLTAGE
VDS
ID = 10 A
8 Tc = 55C 4 100 25 0 0 2 4 6 8 10
5 2.5
0 0
12
16
20
GATE-SOURCE VOLTAGE
VGS
(V)
GATE-SOURCE VOLTAGE
VGS
(V)
10
Tc = 55C 25 100
VGS = 10 V15V
0.1 0.1
10
100
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DRAIN CURRENT
ID
(A)
DRAIN CURRENT
ID
(A)
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2SK3569
RDS (ON) Tc
2.5 100
COMMON SOURCE PULSE TEST 2.0 ID = 12A 1.5 6 1.0 VGS = 10 V 0.5 3
0 80
40
40
80
120
160
CASE TEMPERATURE
Tc
(C)
DRAIN-SOURCE VOLTAGE
VDS
(V)
CAPACITANCE VDS
10000 Ciss 5
Vth Tc
(pF)
CAPACITANCE
DRAIN-SOURCE VOLTAGE
VDS
(V)
CASE TEMPERATURE
Tc
(C)
PD Tc (V)
80 500
VDS
400
60
16
DRAIN-SOURCE VOLTAGE
300 200 200 VGS 400 COMMON SOURCE 100 ID = 3 A Tc = 25C PULSE TEST 0 0 10 20 30 40 50
12
40
20
0 0
40
80
120
160
200
0 60
Tc
(C)
Qg
(nC)
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2SK3569
Duty=0.5 0.2
0.1
0.001 10
100
PULSE WIDTH
tw
(s)
EAS Tch
(A)
10
ID max (CONTINUOUS) *
300
DRAIN CURRENT
ID
1 ms * DC OPERATION Tc = 25C
200
100
0.1
0 25
50
75
100
125
150
INCREASE
0.01 1
TEMPERATURE.
10
15 V 15 V
DRAIN-SOURCE VOLTAGE
VDS
(V)
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2SK3569
030619EAA
The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others. TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the Handling Guide for Semiconductor Devices, or TOSHIBA Semiconductor Reliability Handbook etc.. The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (Unintended Usage). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customers own risk. TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations.
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