2SK3569

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2SK3569
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (-MOSVI)

2SK3569
Switching Regulator Applications
Low drain-source ON resistance: RDS (ON) = 0.54 (typ.) High forward transfer admittance: |Yfs| = 8.5S (typ.) Low leakage current: IDSS = 100 A (VDS = 600 V) Enhancement-mode: Vth = 2.0~4.0 V (VDS = 10 V, ID = 1 mA) Unit: mm

Maximum Ratings (Ta = 25C)


Characteristics Drain-source voltage Drain-gate voltage (RGS = 20 k) Gate-source voltage DC Drain current (Note 1) Symbol VDSS VDGR VGSS ID IDP PD EAS IAR EAR Tch Tstg Rating 600 600 30 10 40 45 363 10 4.5 150 -55~150 A W mJ A mJ C C
1: Gate 2: Drain 3: Source

Unit V V V

Pulse (t = 1 ms) (Note 1)

Drain power dissipation (Tc = 25C) Single pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range

JEDEC JEITA TOSHIBA

SC-67 2-10U1B

Weight : 1.7 g (typ.)

Thermal Characteristics
Characteristics Thermal resistance, channel to case Thermal resistance, channel to ambient Symbol Rth (ch-c) Rth (ch-a) Max 2.78 62.5 Unit 2 C/W C/W

Note 1: Please use devices on conditions that the channel temperature is below 150C. Note 2: VDD = 90 V, Tch = 25C(initial), L = 6.36 mH, IAR = 10 A, RG = 25 Note 3: Repetitive rating: Pulse width limited by maximum channel temperature This transistor is an electrostatic sensitive device. Please handle with caution.
3 1

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2SK3569
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Gate-source breakdown voltage Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge Gate-source charge Gate-drain charge tf toff Qg Qgs Qgd VDD 400 V, VGS = 10 V, ID = 10 A Duty < 1%, tw = 10 s = Symbol IGSS V (BR) GSS IDSS V (BR) DSS Vth RDS (ON) Yfs Ciss Crss Coss tr ton 10 V VGS 0V 50 ID = 5 A VOUT VDS = 25 V, VGS = 0 V, f = 1 MHz Test Condition VGS = 25 V, VDS = 0 V IG = 10 A, VDS = 0 V VDS = 600 V, VGS = 0 V ID = 10 mA, VGS = 0 V VDS = 10 V, ID = 1 mA VGS = 10 V, ID = 5 A VDS = 10 V, ID = 5 A Min 30 600 2.0 0.7 Typ. 0.54 8.5 1500 15 180 22 50 36 180 42 23 19 Max 10 100 4.0 0.75 pF Unit A V A V V S


ns

RL = 40 VDD 200 V


nC

Source-Drain Ratings and Characteristics (Ta = 25C)


Characteristics Continuous drain reverse current (Note 1) Pulse drain reverse current Forward voltage (diode) Reverse recovery time Reverse recovery charge (Note 1) Symbol IDR IDRP VDSF trr Qrr Test Condition IDR = 10 A, VGS = 0 V IDR = 10 A, VGS = 0 V, dIDR/dt = 100 A/s Min Typ. 1300 16 Max 10 40 1.7 Unit A A V ns C

Marking

K3569

TYPE

Lot Number

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2SK3569

ID VDS
10 COMMON SOURCE Tc = 25C PULSE TEST 10,8 6 5.3 20 10 5.1 5 4.8 6 4.6 4 4.4 2 4.2

ID VDS
8 6 16 5.5 5.25 12 5 8 4.75 4.5 VGS = 4 V 0 0 COMMON SOURCE Tc = 25C PULSE TEST

(A)

ID

DRAIN CURRENT

DRAIN CURRENT

ID
4

VGS = 4V 0 0 2 4 6 8 10 10 20 30

(A)

40

50

DRAIN-SOURCE VOLTAGE

VDS

(V)

DRAIN-SOURCE VOLTAGE

VDS

(V)

ID VGS (V)
20 COMMON SOURCE 10

VDS VGS
COMMON SOURCE Tc = 25 8 PULSE TEST

(A)

16

VDS = 20 V PULSE TEST

ID

DRAIN CURRENT

12

DRAIN-SOURCE VOLTAGE

VDS

ID = 10 A

8 Tc = 55C 4 100 25 0 0 2 4 6 8 10

5 2.5

0 0

12

16

20

GATE-SOURCE VOLTAGE

VGS

(V)

GATE-SOURCE VOLTAGE

VGS

(V)

Yfs ID FORWARD TRANSFER ADMITTANCE Yfs (S)


100 10

RDS (ON) ID DRAIN-SOURCE ON RESISTANCE RDS (ON) ()


COMMON SOURCE Tc = 25C PULSE TEST

10

Tc = 55C 25 100

VGS = 10 V15V

1 COMMON SOURCE VDS = 20 V 0.1 0.1 PULSE TEST 1 10 100

0.1 0.1

10

100

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DRAIN CURRENT

ID

(A)

DRAIN CURRENT

ID

(A)

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2SK3569

RDS (ON) Tc
2.5 100

IDR VDS IDR


COMMON SOURCE Tc = 25C PULSE TEST 10

DRAIN-SOURCE ON RESISTANCE RDS (ON) ( )

COMMON SOURCE PULSE TEST 2.0 ID = 12A 1.5 6 1.0 VGS = 10 V 0.5 3

DRAIN REVERSE CURRENT (A)

1 10 5 3 1 0.1 0 0.2 0.4 0.6 VGS = 0, 1 V 0.8 1.0 1.2

0 80

40

40

80

120

160

CASE TEMPERATURE

Tc

(C)

DRAIN-SOURCE VOLTAGE

VDS

(V)

CAPACITANCE VDS
10000 Ciss 5

Vth Tc

GATE THRESHOLD VOLTAGE Vth (V)

(pF)

1000 Coss 100

CAPACITANCE

2 COMMON SOURCE 1 VDS = 10 V ID = 1 mA PULSE TEST 0 80 40 0 40 80 120 160

Crss 10 COMMON SOURCE VGS = 0 V f = 1 MHz Tc = 25C 1 0.1 1 10 100

DRAIN-SOURCE VOLTAGE

VDS

(V)

CASE TEMPERATURE

Tc

(C)

PD Tc (V)
80 500

DYNAMIC INPUT / OUTPUT CHARACTERISTICS (V) GATE-SOURCE VOLTAGE VGS


20

DRAIN POWER DISSIPATION PD (W)

VDS

400

60

VDS VDD = 100 V

16

DRAIN-SOURCE VOLTAGE

300 200 200 VGS 400 COMMON SOURCE 100 ID = 3 A Tc = 25C PULSE TEST 0 0 10 20 30 40 50

12

40

20

0 0

40

80

120

160

200

0 60

CASE TEMPERATURE www.DataSheet4U.com

Tc

(C)

TOTAL GATE CHARGE

Qg

(nC)

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2SK3569

rth tw NORMALIZED TRANSIENT THERMAL IMPEDANCE rth (t)/Rth (ch-c)


10

Duty=0.5 0.2

0.1

0.1 0.05 0.02 PDM t

0.01 0.01 SINGLE PULSE

T Duty = t/T Rth (ch-c) = 2.78C/W 10 100 1 10

0.001 10

100

PULSE WIDTH

tw

(s)

SAFE OPERATING AREA


100 ID max (PULSED) * 100 s * 400 500

EAS Tch

(A)

10

ID max (CONTINUOUS) *

AVALANCHE ENERGY EAS (mJ)

300

DRAIN CURRENT

ID

1 ms * DC OPERATION Tc = 25C

200

100

0.1

SINGLE NONREPETITIVE PULSE Tc=25 CURVES LINEARLY MUST WITH BE DERATED IN

0 25

50

75

100

125

150

CHANNEL TEMPERATURE (INITIAL) Tch (C)


VDSS max 100 1000

INCREASE

0.01 1

TEMPERATURE.

10

15 V 15 V

BVDSS IAR VDD VDS

DRAIN-SOURCE VOLTAGE

VDS

(V)

TEST CIRCUIT RG = 25 VDD = 90 V, L = 6.36mH

WAVE FORM AS = 1 B VDSS L I2 B 2 VDSS VDD

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2SK3569

RESTRICTIONS ON PRODUCT USE


The information contained herein is subject to change without notice.

030619EAA

The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others. TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the Handling Guide for Semiconductor Devices, or TOSHIBA Semiconductor Reliability Handbook etc.. The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (Unintended Usage). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customers own risk. TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations.

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