Ieee Std. 522

IEEE Std 522™-2004
(Revision of
IEEE Standards IEEE Std 522-1992)
522 TM
IEEE Guide for Testing Turn Insulation

of Form-Wound Stator Coils for
Alternating-Current Electric Machines
IEEE Power Engineering Society

Sponsored by the
Electric Machinery Committee
9 August 2004
Print: SH95212
3 Park Avenue, New York, NY 10016-5997, USA PDF: SS95212
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Recognized as an IEEE Std 522™-2004(R2009)
American National Standard (ANSI) (Revision of
IEEE Std 522-1992)

Sponsor
Electric Machinery Committee
of the
IEEE Power Engineering Society
Approved 12 May 2004

American National Standard Institute
Reaffirmed 11 September 2009

Approved 9 February 2004
IEEE-SA Standards Board
Abstract: Suggestions are made for testing the dielectric strength of the insulation separating the
various turns from each other within multiturn form-wound coils to determine their acceptability.
Typical ratings of machines employing such coils normally lie within the range of 200 kW to 100 MW
(270 hp to 135 000 hp). The test levels described do not evaluate the ability of the turn insulation to
withstand abnormal voltage surges, only surges associated with normal operation. The suggestions
apply to: (1) individual stator coils after manufacture; (2) coils in completely wound stators; (3) coils
and windings for rewinds of used machinery; and (4) windings of machines in service to determine
their suitability for further service (preventive-maintenance testing). Coil service conditions, test
devices, and test sequence are discussed.
Keywords: ac machines, impulses, surges, testing turn insulation, transients
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iii
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Introduction
(This introduction is not part of IEEE Std 522-2004, IEEE Guide for Testing Turn Insulation of Form-Wound Stator
Coils for Alternating-Current Electric Machines.)
Many alternating-current, rotating electric machines are designed to have multiturn form-wound stator coils.
In these cases, the winding has two separate but interrelated insulating barriers:
— One between the various turns (turn insulation), and
— One between the turns and ground (ground insulation).
Failure of either of these barriers will prematurely terminate the service life of the machine. A test level for
the ground insulation of twice-rated voltage plus 1 kV has been in existence for many years. This guide sug-
gests methods and test levels for the turn insulation.
Experience has shown that turn insulation failures can be precipitated by abnormal steep-front surges caused
by factors such as lightning strokes, faulty breaker closures, or the malfunction of various types of switching
devices. However, turn insulation failures can also be caused by surges during normal breaker operations
when the circuit conditions are such that the rise time of the surge at the machine terminals is less than a few
microseconds. A measure of protection from such surges may be provided by installation of devices such as
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surge capacitors at the machine terminals and surge arrestors, or by designing the coils with suitable turn
insulation capability. When used for this purpose, capacitor ratings are usually chosen to extend the rise time
of voltage surges to 5 μs or longer.
The bibliography (Annex C) contains references that discuss the general surge environment and surge
strength of electric machines.
Notice to users
Errata
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errata periodically.
Interpretations
Current interpretations can be accessed at the following URL: http://standards.ieee.org/reading/ieee/interp/

index.html.
Patents
Attention is called to the possibility that implementation of this standard may require use of subject matter
covered by patent rights. By publication of this standard, no position is taken with respect to the existence or
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conducting inquiries into the legal validity or scope of those patents that are brought to its attention.
Copyright © 2004 IEEE. All rights reserved. iii

Participants
At the time this standard was completed, the working group had the following membership:
Chuck Wilson, Chair
Darrell Howell, Secretary
Dana Arndt Nirmal Ghai Glenn Mottershead
Saber Azizi Bal Gupta Beant Nindra
Ray Bartnikas Guy Halldorson Jim Oliver
Kevin Becker Gary Heuston Lori Rux
Stefano Bomben Jeff Hudson Howard Sedding
Sudhakar Cherukupalli Patricia Irwin Greg Stone
Douglas Conley Aleksandra Jeremic Meredith Stranges
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Jim Dymond Tom Kluk* James Timperley
Mark Fenger Lou Little Ernesto Wiedenbrug
Shawn Filliben Bill McDermid Joe Williams
Paul Gaberson Hal Miller John Wilson
George Gao Karim Younsi
*We all wish to express our sorrow that Tom Kluk passed away before this standard was published. His
input to this document was very valuable and much appreciated by everyone on the working group.
The following members of the individual balloting committee voted on this standard. Balloters may have
voted for approval, disapproval, or abstention.
Karl Berger Trilok Garg William McDermid
Thomas Bishop Nirmal Ghai Donald McLaren
Weijen Chen Brian Gott Nigel McQuin
Tommy Cooper Randall Groves James Michalec
Guru Dutt Dhingra Bal Gupta Krste Najdenkoski
Roger Daugherty Paul Hamer Nils Nilsson
Alvaro Portillo
Byron Davenport Edward Horgan Jr.
Johannes Rickmann
Gary Donner David Jackson Manoj Shah
James Dymond Kevin Loving Gregory Stone
Amir El-Sheikh Jesus Martinez Meredith Stranges
Gary Engmann Walter Martiny Ernesto Wiedenbrug
Jorge Fernandez-Daher Thomas McCaffrey Chuck Wilson
iv Copyright © 2004 IEEE. All rights reserved.

When the IEEE-SA Standards Board approved this standard on 9 February 2004, it had the following
membership:
Don Wright, Chair
Chuck Adams Mark S. Halpin Paul Nikolich
H. Stephen Berger Raymond Hapeman T. W. Olsen
Mark D. Bowman Richard J. Holleman Ronald C. Petersen
Joseph A. Bruder Richard H. Hulett Gary S. Robinson
Bob Davis Lowell G. Johnson
Frank Stone
Roberto de Boisson Joseph L. Koepfinger*
Hermann Koch Malcolm V. Thaden
Julian Forster*
Judith Gorman Thomas J. McGean Doug Topping
Arnold M. Greenspan Daleep C. Mohla Joe D. Watson
*Member Emeritus
Also included are the following nonvoting IEEE-SA Standards Board liaisons:
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Satish K. Aggarwal, NRC Representative
Richard DeBlasio, DOE Representative
Alan Cookson, NIST Representative
Don Messina
IEEE Standards Project Editor
Copyright © 2004 IEEE. All rights reserved. v

Contents
1. Overview.............................................................................................................................................. 1
1.1 Scope............................................................................................................................................ 1
1.2 Purpose......................................................................................................................................... 1
2. References............................................................................................................................................ 1
3. Service conditions................................................................................................................................ 2
3.1 Operating stress............................................................................................................................ 2

3.2 Transient stress............................................................................................................................. 2
3.3 Withstand requirements ............................................................................................................... 2
4. Suggested test devices.......................................................................................................................... 3
4.1 Test requirements......................................................................................................................... 3

4.2 Suitable devices ........................................................................................................................... 3
4.2.1 Conduction-type devices.................................................................................................. 3
4.2.2 Induction-type devices ..................................................................................................... 3
5. Test procedure...................................................................................................................................... 3
5.1 Test sequences ............................................................................................................................. 3

5.2 Test conditions ............................................................................................................................. 4
5.3 Voltage levels............................................................................................................................... 4
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6. Surge test levels for new coils ............................................................................................................. 4
6.1 General......................................................................................................................................... 4
6.2 Standard (3.5 p.u.) withstand envelope........................................................................................ 5
6.3 Alternate withstand envelope....................................................................................................... 6
6.4 Definition of surge envelopes ...................................................................................................... 6
6.5 Abnormal surges .......................................................................................................................... 6
6.6 Precautions................................................................................................................................... 6
6.7 Reduction in test levels for uncured coils .................................................................................... 7
7. Maintenance tests or tests after installation of machines..................................................................... 7
7.1 Test voltage level ......................................................................................................................... 7

7.2 Conduction-type devices.............................................................................................................. 7
7.3 Induction-type devices ................................................................................................................. 7
7.4 Insufficient coupling .................................................................................................................... 7
7.5 Other methods/further details ...................................................................................................... 7
Annex A (informative) Test procedures and methods..................................................................................... 8
Annex B (informative) Sample test form....................................................................................................... 13
Annex C (informative) Bibliography............................................................................................................. 15
vi Copyright © 2004 IEEE. All rights reserved.

1. Overview
1.1 Scope
This guide makes suggestions for testing the dielectric strength of the insulation separating the various turns
from each other within multiturn form-wound coils to determine the acceptability of the coils. Typical rat-
ings of machines employing such coils normally lie within the range of 200 kW to 100 MW (270 to 135 000
hp). Test voltage levels described herein do not evaluate the ability of the turn insulation to withstand
abnormal voltage surges, as contrasted to surges associated with normal operation. The repetitive voltage
surges (spikes) associated with adjustable frequency drives (AFD) are also not addressed here. This guide
applies to
a) Individual stator coils after manufacture.
b) Coils in completely wound stators of original manufacture.
c) Coils and windings for rewinds of used machinery.
d) Windings of machines in service to determine their suitability for further service (preventive-
maintenance testing).
1.2 Purpose
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The purpose of this guide is to
a) Define surge/impulse testing as applied to the windings of an electric machine.
b) Review the service conditions that affect voltage levels in a coil.
c) Recommend devices suitable for measuring surges, with precautions to avoid erroneous results.
d) Describe various points where surge testing may be performed.
e) Present suggested surge test levels for various types of electric machines.
2. References
ASTM D1711-02, Standard Terminology Relating to Electrical Insulation.1
1
ASTM publications are available from the American Society for Testing and Materials, 100 Barr Harbor Drive, West Conshohocken,
PA 19428-2959, USA (http://www.astm.org/).
Copyright © 2004 IEEE. All rights reserved. 1

IEEE
Std 522-2004 IEEE GUIDE FOR TESTING TURN INSULATION OF FORM-WOUND
ASTM D3426-97 (2004), Standard Test Method for Dielectric Breakdown Voltage and Dielectric Strength
of Solid Electrical Insulating Materials Using Impulse Waves.
IEEE Std 4™-1995, IEEE Standard Techniques for High-Voltage Testing.2, 3
IEEE Std 43™-2000, IEEE Recommended Practice for Testing Insulation Resistance of Rotating Machinery.
IEEE Std 56™-1977 (Reaff 1991), IEEE Guide for Insulation Maintenance of Large Alternating-Current
Rotating Machinery 10 000 kVA and Larger.
IEEE P62.2/-D23, Draft Guide for Diagnostic Field Testing of Electric Power Apparatus—Electrical
Machinery.4
IEEE Std 432™-1992 (Reaff 1998), IEEE Guide for Insulation Maintenance for Rotating Electric Machinery
(5 hp to Less Than 10 000 hp).
IEEE Std 434™-1973 (Reaff 1991), IEEE Guide for Functional Evaluation of Insulation Systems for Large
High-Voltage Machines.
IEEE Std 492™-1999, IEEE Guide for Operation and Maintenance of Hydro-Generators.
IEEE Std 510™-1983 (Reaff 1992), IEEE Recommended Practice for Safety in High-Voltage and High-
Power Testing.
3. Service conditions
3.1 Operating stress
The maximum operating (line frequency) voltage difference between turns in a coil depends upon the volt-
age between coil terminals and on the internal construction of the coil.
3.2 Transient stress
A second, and less predictable, voltage difference between turns can be caused by voltage transients. Addi-
tional information on the nature of such transients and the associated turn voltage distribution may be found
in a number of articles cited in the bibliography in Annex C. Steep-front voltage waves due to arcing in the
associated circuit can be damaging to turn insulation since a substantial portion of the wave can appear
across the turn insulation of the coil(s) near the line terminals.
3.3 Withstand requirements
The voltage difference that turn insulation must withstand, therefore, covers a broad range from less than
100 V in normal operation to as much as several thousand volts under transient conditions. At the lower end
of this range all that is needed is physical separation, whereas at the other, insulation having considerable
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dielectric strength is needed.
2
The IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc.
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IEEE publications are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ 08854,
USA (http://standards.ieee.org/).
4
This IEEE standards project was not approved by the IEEE-SA Standards Board at the time this publication went to press. For infor-
mation about obtaining a draft, contact the IEEE.
2 Copyright © 2004 IEEE. All rights reserved.

IEEE
STATOR COILS FOR ALTERNATING-CURRENT ELECTRIC MACHINES Std 522-2004
4. Suggested test devices
4.1 Test requirements
In order to test the turn insulation of a form-wound coil, a voltage must be applied across the individual
leads. Form-wound, multiturn coils have a low series impedance at power frequencies, particularly prior to
insertion into the stator core. Further, the impedance between turns of a form-wound coil is capacitive or
inductive, depending upon frequency. However, the impedance between leads is predominately inductive
and is directly proportional to the frequency of the voltage applied across the leads. Following Ohm’s law,
applying a voltage of sufficient magnitude, at normal power frequencies, across the leads of a form-wound
coil yields a high current between the leads. From a testing point of view, this is very undesirable. Therefore,
to apply a voltage of reasonable magnitude across the leads, and hence across the turn insulation, without
excessive current, a test voltage that has a frequency several orders of magnitude above power frequency is
required (examples are given in A.1.2).
4.2 Suitable devices
A suitable testing device should provide voltage control, accurate indication of voltage level, and a means of
detecting turn insulation failure. A single-stage Marx generator with a storage oscilloscope is an example of
such a device. A schematic diagram of the generator is given in Figure A.5. Both conduction and induction-
type testing devices have been developed and applied satisfactorily. In either type, a steep-front voltage
wave is applied to the coil under test. In each cycle, a capacitor is charged to an appropriate voltage, then
discharged by means of a suitable switch (such as a spark gap, thyratron, or a solid-state device) into a cir-
cuit that includes the coil. Voltage and current then oscillate at the natural frequency of the circuit.
4.2.1 Conduction-type devices
In conduction-type devices, the test voltage is applied directly to the coil leads. Failure detection is by visual
inspection of the wave shape of either test voltage or current on an oscilloscope. Coils may be tested singly,
or two nominally identical coils may be tested simultaneously, thereby facilitating comparison of the wave
shape. In testing a single coil, the wave shape at a sufficiently low voltage should be recorded and used to
compare with wave shapes at higher voltages. A significant difference in the wave shape indicates probable
insulation failure.
4.2.2 Induction-type devices
In induction-type devices, the test voltage is induced in the coil under test, which constitutes the secondary
of a transformer, the primary of which is excited by a steep-front wave from the capacitor. Failure is indi-
cated by asymmetry of either current in the test coil or voltage at its terminals. See Figure A.3.
NOTE—This test equipment is not generally available—this paragraph is included for informational purposes.5
5. Test procedure
5.1 Test sequences
Coils may be tested at one or more of the following steps of manufacture:

a) Prior to insertion into the stator core. This is appropriate when the coils are to be installed at a loca-
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tion remote from the coil manufacturing plant. If the impedance of the coils in air is too low, they
may be assembled into a simulated core for testing purposes. Each coil in the winding should be
tested.
5
Notes in text, tables, and figures are given for information only and do not contain requirements needed to implement the standard.

IEEE
b) After coil installation, wedging and bracing, but before any connections are made. Each coil in the
winding should be tested.
c) After series connections are made, but before insulating them and before making the connections
between phase groups. Each coil in the winding should be tested.
d) After connecting into phase groups, but before connecting phase groups to one another (before or
after insulating the series connections). This test compares phase groups, not individual coils.
e) After all connections are made and insulated. All maintenance tests are normally made under such
conditions.
If the test voltage is applied at the machine terminals, the electrical impulse voltage level should be
carefully selected in order to avoid overstressing ground insulation. In this case, the test may dis-
close only existing short circuits and not incipient weaknesses of the turn insulation.
Caution is advised in testing a complete phase winding from the machine terminals. A complete
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phase winding consists of several series coils. Hence, the change in the voltage impulse shape
caused by the failure of the insulation between a turn-pair in a single coil in the complete phase
winding is often very small. Consequently, the failure of the turn insulation during the impulse test
of a complete winding may go undetected.
Otherwise, the test voltage can be induced into the stator coils by means of a surge-inducing coil
(Annex A). The test method given in Annex A will stress incipient weaknesses and may cause these
areas to fail.
Extra fully processed or uncured coils (if specified in the agreement between the manufacturer and the user)
that are not used in winding the machine may be tested to destruction to determine the turn-to-turn break-
down capability of the electrical insulation system design.
5.2 Test conditions
The ambient conditions should be acceptable for insulation testing. Prior to turn-to-turn testing of fully
cured coils, the insulation resistance should be measured in accordance with IEEE Std 43-2000.6 The insula-
tion surface should be clean and dry. The coil temperature should be at least a few degrees above the dew
point, as a minimum, to avoid condensation on the insulation. The turn-to-turn testing should not proceed
until the insulation resistance tests have been conducted successfully. Other tests, such as measurement of
dissipation factor, may also be used to determine if the insulation is suitable for turn-to-turn testing.
5.3 Voltage levels
For un-impregnated or uncured coils, use voltage levels for the insulation resistance test that will not harm
the insulation, but will indicate if it is suitable for testing. It may not be possible to successfully test uncured
resin rich coils because of the nature of the uncured insulation. Agreement should be reached between the
manufacturer and the user regarding the testing of such uncured coils.
6. Surge test levels for new coils
6.1 General
The minimum turn-to-turn test voltage should be no less than 350 V peak, which is the minimum sparking
voltage for a uniform field in air (Paschen’s Law—see Dakin and Berg [B8] and Khalifa [B28]7), though in
actual practice tests are usually performed at levels far exceeding this value. Beyond this, no generally
accepted approach to the selection of turn-to-turn test voltage has evolved. Manufacturers have used coil and
6
Information on references can be found in Clause 2.
7
The numbers in brackets correspond to those of the bibliography in Annex C.

IEEE
machine design parameters such as size and weight of coil, length of turn, arrangement of turns within the
coil, operating volts per turn or per coil, system voltage, interturn and turn-to-ground capacitance, and others
to determine turn-voltage test levels for their products. These procedures have not been described explicitly
in the literature, and it is not feasible to describe them here. Agreement should be reached between the man-
ufacturer and the user as to what testing technique and level should be applied to coils and at what stage(s)
of manufacture the tests should be performed.
6.2 Standard (3.5 p.u.) withstand envelope
Whatever test technique is used, it is suggested that for testing the turn insulation, impulses with a rise time
of 0.1 to 0.2 μs should be used. Tests performed at longer rise times (> 1.2 μs) tend to stress the ground insu-
lation. In general, the coils should have sufficient ground and turn insulation to withstand an electrical surge
with amplitude defined in Figure 1. For purposes of the calculation of rise time of the surge, the rise time of
the front is assumed to be the time interval from 0.1 to 0.9 of the measured surge amplitude. The time to
peak is 1.25 times the rise time. The number of pulses should be no fewer than five. The following equations
define these various voltages and associated rise times.
V 1 = [ ( 2 ⁄ 3 ) ]V L = 1p.u. T r = 0.0 μs (1)
V 2 = 3.5V 1 = 3.5 p.u. T r = 0.1 μs (2)
V 3 = 5V 1 = 5 p.u. T r ≥ 1.2 μs (3)
where
Vn (n = 1, 2, 3) is the momentary surge withstand capability across the coil,

VL is the rated rms line-to-line voltage in kV,
Tr is the rise time in μs,
p.u. is “per unit,” where the initial test voltage is multiplied by the given coefficient.
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Figure 1—Coil electrical impulse withstand envelope

IEEE
6.3 Alternate withstand envelope
If agreed between the manufacturer and the user, the impulse withstand envelope given in Figure 2 (from
“Impulse voltage strength of ac rotating machines,” [B24]) may be used for testing coils in machines that are
not likely to see high-magnitude fast-fronted surges.
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Figure 2—Alternative coil impulse voltage withstand envelope
6.4 Definition of surge envelopes
The envelopes shown in Figure 1 and Figure 2 are NOT the wave shape of the impulse to be applied to test
the insulation. These envelopes illustrate the magnitudes of the surge voltages, which might be impressed
across the main and turn insulation of the machine during normal operation. Therefore, the coil insulation
must withstand these levels. Generally, impulses with rise times 0.1 to 0.2 μs are used for testing the turn
insulation (see 6.2). Impulses with rise times 1.2 μs or longer do not generally stress the turn insulation; they
are used to test the surge capability of ground insulation.
6.5 Abnormal surges
In the event that the machine is likely to be subjected to abnormal voltage surges during its service life and
protective devices are not used (as mentioned in 1.2), turn insulation having a higher-than-normal electric
strength should be used in the coils. In this case, the turn-to-turn test voltage may be appropriately adjusted
upwards.
6.6 Precautions
It should be noted that unimpregnated or uncured coils—i.e., those tested on the bench or that have been
wound in a stator but not VPI’d (vacuum pressure impregnation) or baked—do not have fully cured insula-
tion, and therefore will have a significantly lower surge withstand capability than fully cured coils. Also,
when one coil is tested in a stator with the core and frame grounded, the ground insulation of the remaining
coils in the winding will experience a reduced-level surge with similar frequency in sympathy with the coil
under test (see Stranges, et al. [B54]). The effective voltage of this “sympathetic” surge condition varies
with every coil tested.

IEEE
6.7 Reduction in test levels for uncured coils
To avoid overstressing unimpregnated (dry taped) coils, the test voltage may be reduced to some fraction
(generally 60–80%) of the value specified in 6.2 (or 6.3), as agreed between the manufacturer and the user.
To avoid overstressing uncured resin rich coils, the test voltage may be reduced to some fraction (generally
40–60%) of the value specified in 6.2 (or 6.3), as agreed between the manufacturer and the user. The test
value in this case should not exceed the DC hi-potential test value.
7. Maintenance tests or tests after installation of machines
7.1 Test voltage level
Applied voltage for tests made in the field may be approximately 75% of Vn as defined in Clause 6. It is
good practice to obtain approval from the manufacturer of the coils prior to any test program.
7.2 Conduction-type devices
For maintenance testing, it may be desirable to make the test with no disassembly of the machine. In order to
test an installed machine without disassembly, the test must be performed using a conduction-type device as
described in 4.2.1. When performing the test from the switchgear, the length of the feeder cables may have a
significant effect on voltage impressed at the machine terminals as well as the ability to detect an incipient
fault in a fully-configured winding. The most effective method for performing maintenance tests is to con-
nect the test equipment at the machine terminals.
7.3 Induction-type devices
Maintenance tests may also be performed using an induction-type device, as described in 4.2.2, to induce the
test voltage in individual coils of a fully-configured winding. See Figure A.2. Performing this type of test on
induction and cylindrical-rotor machines will require removing the rotor from the stator. For salient-pole
synchronous machines, the degree of disassembly required to perform this test can be minimized by remov-
ing a single field coil and rotating the rotor and testing fixtures.
7.4 Insufficient coupling
The degree of coupling that can be achieved by the surge-inducing coil varies rather widely, and in some
cases it may not be possible to reach the 75% voltage level in the coils being tested. Therefore, the 75% fig-
ure should be considered a general guideline.
7.5 Other methods/further details
Other methods of detecting turn insulation failures and means of minimizing damage due to faults are
included in the bibliography ([B5], [B13], [B18], [B31], [B34], [B48], [B50], [B53], and [B54]).

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7
IEEE
Annex A
(informative)
Test procedures and methods
A.1 Method for applying surge tests to complete windings
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A.1.1 General
The arrangement of the surge-inducing coil and laminated-iron sections in the bore of the machine is shown
in Figure A.1. The voltage waveform is measured with a one-turn search coil placed in the laminated-iron
sections. The search-coil voltage is observed on an oscilloscope through a resistive voltage divider. A con-
sistent pattern for both short-circuited and normal coils is obtained regardless of the electrical position of the
coil in the winding since the search coil is affected only to the extent of the reduction of flux resulting from
a short-circuited coil. A short-circuited coil generally shows a reduction of the peak amplitude of the wave
in the order of 20% when compared to the normal coil. There is also a very slight increase in frequency of
the short-circuited-coil waveform, but this is not always sufficiently great to use as a test criterion. It is
necessary to utilize wire with multiple, fine, insulated strands in the surge-inducing coil to obtain minimum
impedance. One hundred strands of enameled wire, 0.010 in (0.25 mm) diameter, have proven satisfactory
for this purpose. It is suggested that the surge-inducing and search coils be insulated to ground for the maxi-
mum voltage to appear in each coil. It will be necessary to remove the machine rotor, or for salient-pole
machines a pole on the rotor, to provide space for the coils and laminated-iron sections in the bore area. To
assure consistent results, it is good practice to fit the laminated iron sections against the bore with uniform
tightness.
A.1.2 Formulas
The test circuit (Figure A.2) used consists principally of lumped inductance (L) (the surge-inducing coil) and
capacitance (C), with minimum resistance (R). The frequency of oscillation of the surge voltage can, there-
fore be calculated from the formula:
1 ⎛ 1 R -⎞
2
f = ------ ⎜ ------
- – --------⎟ (A.1)
2π ⎝ LC 4L 2⎠
Which, when the second term under the radical is small compared to the first, reduces to:
1
f 0 = ------------------ (A.2)
2π LC
For example:
a) A 200 hp motor tested with a two-turn surge-inducing coil of 20 μH inductance and a 16 μF capaci-
tor will have an oscillation frequency of 8900 Hz.
b) A 69 500 kVA hydrogenerator tested with a two-turn surge-inducing coil of 130 μH inductance and
a 2 μF capacitor will have an oscillation frequency of 9800 Hz.

IEEE
Figure A.1—Surge-inducing coil
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Figure A.2—Suggested arrangement of test equipment
A.2 Suggested test procedure for wound machines
Arrange test equipment as shown in Figure A.2, being certain to connect all grounds including the frame of
the machine being tested. Do not ground the windings to be tested; consider them as being energized during
all testing since it is not possible to surge test one coil in the core without having some impact on the other
coils because of the mutual and cross linking effects.
Expose the leads of one stator coil in the winding by removing the insulation at the connection for calibra-
tion of the voltage wave (a line coil may be used and then it will be necessary to expose only the other lead
of that coil). Place the laminated-iron sections, including the surge-inducing and search coils, in the bore to

IEEE
line up with the slots of the stator coil selected for calibration. The laminated-iron sections should be insu-
lated from the core of the machine being tested with a thin insulating material, such as 0.010 in (0.25 mm)
thick adhesive tape, and should be tightly fitted against the machine core. Connect the voltage-divider leads
to the stator coil being used for calibration. Apply a small voltage (1000 V) to the surge-inducing coil and
observe the voltage wave induced in a stator coil (this should be approximately 75% of the volts-per-turn
applied to the surge-inducing coil). When a suitable waveform is established (refer to Figure A.3 for the
expected pattern of the voltage wave), increase the applied voltage to obtain first-peak-amplitude equivalent
to the voltage desired for the test. This should be based on a minimum of 350 volts-per-turn peak with max-
imum voltage of 75% of the coil test voltage specified in Clause 6.
To determine the effect of a short-circuited turn, apply a deliberate short circuit across the exposed leads of
the stator coil and apply the same voltage level used to obtain the desired volts-per-turn stress. This will
establish the criteria for the test of the remaining coils in the winding and the waveforms of the short-cir-
cuited and normal coils should be generally proportional to those shown in Figure A.3. Proceed to test the
winding by moving the laminated-iron sections sequentially so they are positioned over each of the coils in
the machine. Record the oscilloscope settings, the voltage level applied to the surge-inducing coil, and the
amplitude of the first full peak of the voltage wave observed on the oscilloscope, identifying the top-slot
number of each coil as it is tested. Since the waveform observed on an oscilloscope screen for any set of
conditions can generally be determined more accurately by repetitive sweeps, perform at least three capaci-
tor discharges to establish the form. The accuracy of this test in determining the location of a short-circuited
coil can be ascertained by exposing the leads of a stator coil found to be short-circuited, and retesting it with
a deliberate short circuit applied across the leads. There should be no significant change from the waveform
obtained during the previous test.
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Figure A.3—Voltage waveform for short-circuited and normal coils
using induced-voltage test method

IEEE
A.3 Suggested test procedure for coils during winding (if surge comparison
equipment is not available)
The turn-to-turn test can be applied to each coil of a set of new coils, completely assembled in the slots and
with slot wedges in place, by applying the surge directly to the stator coil before insulating the connections.
In this arrangement, the voltage-divider leads are connected in parallel with the surge-generator leads to the
stator coil. The effect of a short-circuited turn under this test condition will be as indicated in Figure A.4.
Calibration of the voltage waveform is performed as previously described and the peak voltage is recorded
by top-coil-slot number with the voltages applied in steps of 0.2, 0.4, 0.6, 0.8, and 1.0 of the peak test volt-
age (reduced per the suggestions in paragraph 6.5 for unimpregnated or uncured coils). For a single shot
surge generator, five impulses should be applied at each level. (The number 5 is suggested to harmonize 522
with IEC 60034-15 [B21]). With the directly applied test technique, a short-circuited stator coil will provide
a flat response (Figure A.4) to the applied voltage and, therefore, the step voltages are of value in approxi-
mating the voltage level where a short circuit may develop in the stator coil. Be aware that when applying a
turn-to-turn surge test to a single coil in a stator core, all the coils in the core will receive some level of surge
voltage to the ground insulation because of the mutual inductance in the slots and the cross linkage on the
end windings. The magnitude of this induced surge to the ground insulation will vary as a function of the rel-
ative position of the floating coils to the coil under test and has been found to vary from 50% of the applied
surge to almost zero. This induced surge in the ground insulation can have detrimental effects as the induced
surges may overstress the ground insulation especially at the corners. This stress may initiate a future failure
site if the surge voltage level is too high when the coils are tested in the unimpregnated or uncured state
Stranges, et al. [B54].
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Figure A.4—Waveforms of short-circuited and normal coils tested directly connected,

in the iron

IEEE
A.4 Further details
For further details concerning this method, such as the design of laminated-iron sections, see Oliver, et al.
[B42].
A.5 Marx Generator circuit
Figure A.5—Schematic circuit for Marx Generator
Circuit parameters are for guidance only. Other appropriate values may be used to produce the required
impulse shape.
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IEEE
Annex B
(informative)
Sample test form

Name ___________________________ Machine S/N _________________ Test No. ______________
Date ________________ Manufacturer ______________________________ Time _______________
Insulation Resistance Test
1 min ____________ 10 min __________ P.I. _______ Passed: Yes ___ No ___
1 min (40 °C) ____________ 10 min (40 °C) _____________ Temp. _____ Rel. Hum. ___________
Test Equipment: _____________________S/N: _______________Cal. Date: _______Cal. Due: ________
Electrical Voltage Impulse Test
Total No. of Coils: ____________Coils Passed: ____________Coils Failed: __________________
Impulse test Impulse test Impulse test

Impedance/ Impedance/ Impedance/
Coil Coil Coil
Resistance Resistance Resistance
Passed Failed Passed Failed Passed Failed
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IEEE
Extra Coil Destructive Test
1. Test Level (kV): _________Test Level (PU*): ________Failure Location: _________________
Comments: ___________________________________________________________________________
*per unit
14 --```,``,,````,`,,,,,,,,,`,````-`-`,,`,,`,`,,`---

IEEE
Annex C
(informative)
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IEEE
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[B22] IEEE 100, The Authoritative Dictionary of IEEE Standards Terms, Seventh Edition.
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Presented at American Power Conference, April 24–26, 1984.

IEEE
[B31] Krankel, D. and Schuler, R. A., “Method for checking the turn insulation of form-wound coil wind-
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travelling wave voltages,” General Electric Review, Feb./Mar. 1938.

IEEE
Std 522-2004
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travelling wave voltages due to lightning,” Transactions of the AIEE, 1938.
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IEEE Std 522™-2004

IEEE Guide for Testing Turn Insulation

IEEE Power Engineering Society

Copyright The Institute of Electrical and Electronics Engineers, Inc.

Copyright The Institute of Electrical and Electronics Engineers, Inc.

IEEE Guide for Testing Turn Insulation

Approved 12 May 2004

Reaffirmed 11 September 2009

The Institute of Electrical and Electronics Engineers, Inc.

Print: ISBN 0-7381-3979-3 SH95212

Copyright The Institute of Electrical and Electronics Engineers, Inc.

Secretary, IEEE-SA Standards Board

Current interpretations can be accessed at the following URL: http://standards.ieee.org/reading/ieee/interp/

Copyright © 2004 IEEE. All rights reserved. iii

iv Copyright © 2004 IEEE. All rights reserved.

Copyright © 2004 IEEE. All rights reserved. v

3.1 Operating stress............................................................................................................................ 2

4. Suggested test devices.......................................................................................................................... 3

4.1 Test requirements......................................................................................................................... 3

5.1 Test sequences ............................................................................................................................. 3

7. Maintenance tests or tests after installation of machines..................................................................... 7

7.1 Test voltage level ......................................................................................................................... 7

Annex A (informative) Test procedures and methods..................................................................................... 8

Annex B (informative) Sample test form....................................................................................................... 13

Annex C (informative) Bibliography............................................................................................................. 15

vi Copyright © 2004 IEEE. All rights reserved.

ASTM D1711-02, Standard Terminology Relating to Electrical Insulation.1

Copyright © 2004 IEEE. All rights reserved. 1

IEEE Std 4™-1995, IEEE Standard Techniques for High-Voltage Testing.2, 3

3.1 Operating stress

3.2 Transient stress

3.3 Withstand requirements

dielectric strength is needed.

2 Copyright © 2004 IEEE. All rights reserved.

Copyright The Institute of Electrical and Electronics Engineers, Inc.

4. Suggested test devices

4.1 Test requirements

4.2 Suitable devices

4.2.1 Conduction-type devices

4.2.2 Induction-type devices

5.1 Test sequences

Coils may be tested at one or more of the following steps of manufacture:

Copyright © 2004 IEEE. All rights reserved. 3

5.2 Test conditions

5.3 Voltage levels

4 Copyright © 2004 IEEE. All rights reserved.

Copyright The Institute of Electrical and Electronics Engineers, Inc.

6.2 Standard (3.5 p.u.) withstand envelope

V 1 = [ ( 2 ⁄ 3 ) ]V L = 1p.u. T r = 0.0 μs (1)

V 2 = 3.5V 1 = 3.5 p.u. T r = 0.1 μs (2)

V 3 = 5V 1 = 5 p.u. T r ≥ 1.2 μs (3)

Vn (n = 1, 2, 3) is the momentary surge withstand capability across the coil,

Figure 1—Coil electrical impulse withstand envelope

Copyright © 2004 IEEE. All rights reserved. 5

6.3 Alternate withstand envelope

6.4 Definition of surge envelopes

6.5 Abnormal surges

6 Copyright © 2004 IEEE. All rights reserved.

Copyright The Institute of Electrical and Electronics Engineers, Inc.

6.7 Reduction in test levels for uncured coils

Date Manufacturer Time _

Test Equipment: ___________S/N: _Cal. Date: _Cal. Due: ______

Test Equipment: ___________S/N: _Cal. Date: _Cal. Due: ______

Test Equipment: ___________S/N: _Cal. Date: _Cal. Due: ______

Total No. of Coils: Coils Passed: Coils Failed: ______

1. Test Level (kV): _Test Level (PU*): Failure Location: _________

2. Test Level (kV): _Test Level (PU*): Failure Location: _________

3. Test Level (kV): _Test Level (PU*): Failure Location: _________