Models: Model 8104 Omnia 4 Model 8105 Omnia 5 Model 8106 Omnia 6

OPERATION AND SERVICE MANUAL
MODEL 8104 OMNIA 4

MODEL 8105 OMNIA 5
MODEL 8106 OMNIA 6
Electrical Safety Compliance Analyzer
AC/DC HIPOT WITH INSULATION RESISTANCE TESTER, GROUND BOND,

CONTINUITY TESTER AND RS-232 INTERFACE
8105 INCLUDES RUN TEST

8106 INCLUDES RUN TEST AND LINE LEAKAGE TEST
SERIAL NUMBER
Models © Associated Research, Inc. 2006

13860 West Laurel Drive
8104/8105/8106 Lake Forest, Illinois, 60045-4546
U.S.A.
Item 38550 Ver 1.14 Printed December 15, 2006

DECLARATION OF CONFORMITY
Manufacturer: Associated Research, Inc.
Address: 13860 W. Laurel Dr.

Lake Forest, IL 60045 USA
Product Name: OMNIA® Electrical Safety Compliance

Analyzer
Model Number: 8104/8105/8106
Conforms to the following Standards:
Safety: EN 61010-1:2001
EN 61010-031:2002
EMC: EN 61326:1997 + A1:1998

(EN 55022:1998/A1:2000 Class A,
EN 61000-3-2:2000,
EN 61000-3-3:1995/A1:2001,
EN 61000-4-2:1995, EN 61000-4-3:1996,
EN 61000-4-4:1995, EN 61000-4-5:1995,
EN 61000-4-6:1996, EN 61000-4-8:1993,
EN 61000-4-11:1994)
Supplementary Information
The product herewith complies with the requirements of the Low

Voltage Directive 73/23/EEC as amended by 93/68/EEC and the EMC
Directive 89/336/EEC as amended by 92/31/EEC.
The CE marking has been affixed on the device according to article

10 of the EMC Directive 8/336/EEC.
The technical file and other documentation are on file with

Associated Research, Inc.
______________________________
Joseph Guerriero
Vice President / General Manager
Associated Research, Inc.

Lake Forest, Illinois USA
October 11, 2004
TABLE OF CONTENTS
1. Introduction............................................................................................................... 1
1.1. Warranty Policies .......................................................................................... 1
1.2. Safety Symbols.............................................................................................. 2
1.2.1. Product Marking Symbols .................................................................... 2
1.2.2. Caution and Warning Symbols.............................................................. 2
1.3. Glossary of Terms ......................................................................................... 3
1.4. Safety............................................................................................................ 4
1.4.1. Service and Maintenance ...................................................................... 4
1.4.2. Test Station.......................................................................................... 5
1.4.3. Test Operator ....................................................................................... 6
1.4.4. Instrument Connections ........................................................................ 6
1.4.5. Device Under Test................................................................................ 7
1.4.6. Key Safety Points to Remember............................................................ 7
1.5. Introduction to Product Safety Testing.......................................................... 8
1.5.1. The Importance of Safety Testing ......................................................... 8
1.6. The Different Types of Safety Tests .............................................................. 8
1.6.1. Principles and Uses of Dielectric Withstand Testing .............................. 8
1.6.2. Insulation Resistance Test................................................................... 11
1.6.3. Ground Bond Test.............................................................................. 11
1.6.4. Run Test............................................................................................. 12
1.6.5. Line Leakage Test .............................................................................. 12
1.7. Key Features and Benefits ........................................................................... 14
2. Getting Started ........................................................................................................ 17
2.1. Unpacking and Inspection ........................................................................... 17
2.1.1. Packaging........................................................................................... 17
2.1.2. Contents of Carton ............................................................................. 17
2.1.3. Returning the Instrument for Service or Calibration ............................ 17
2.2. Installation .................................................................................................. 18
2.2.1. Work Area ......................................................................................... 18
2.2.2. Power Requirements........................................................................... 18
2.2.3. Basic Connections .............................................................................. 19
2.2.4. Environmental Conditions................................................................... 19
3. Specifications and Controls..................................................................................... 20
3.1. Specifications .............................................................................................. 20
3.2. Instrument Controls .................................................................................... 29
3.2.1. Front Panel Controls........................................................................... 29
3.2.2. Rear Panel Controls............................................................................ 31
3.2.3. Additional Rear Panel Controls Models 8105 and 8106....................... 33
3.3. Quickstart ................................................................................................... 35
i
4. Programming Instructions ...................................................................................... 38
4.1. Setup System Menu .................................................................................... 38
4.1.1. Time and Date.................................................................................... 39
4.1.2. Calibration Alert ................................................................................. 40
4.1.3. Hardware ........................................................................................... 42
4.1.4. Security.............................................................................................. 45
4.1.5. Power-On Screen ............................................................................... 47
4.1.6. Print Format ....................................................................................... 48
4.2. Setup Tests Menu ....................................................................................... 48
4.2.1. Add .................................................................................................... 49
4.2.2. Edit .................................................................................................... 49
4.2.3. Delete................................................................................................. 49
4.2.4. Prompt ............................................................................................... 50
4.2.5. File..................................................................................................... 50
4.2.6. Fail Stop............................................................................................. 51
4.3. Setting Up a Test ........................................................................................ 53
4.4. Test Parameters........................................................................................... 57
4.4.1. Description of Test Parameters ........................................................... 58
4.4.2. AC Withstand..................................................................................... 61
4.4.3. DC Withstand..................................................................................... 61
4.4.4. Insulation Resistance .......................................................................... 63
4.4.5. Continuity .......................................................................................... 64
4.4.6. AC Ground Bond ............................................................................... 64
4.4.7. Continuity .......................................................................................... 65
4.4.8. Run Test (Models 8105 and 8106)...................................................... 67
4.4.9. Line Leakage (Model 8106)................................................................ 69
4.4.10. Default Parameters ........................................................................... 76
5. Operating Instructions ............................................................................................ 78
5.1. Instrument Connections............................................................................... 78
5.1.1. Adapter Box Connections................................................................... 78
5.1.2. Scanner Connections .......................................................................... 79
5.2. Perform Tests Menu.................................................................................... 80
5.2.1. Load File ............................................................................................ 81
5.2.2. Single Step ......................................................................................... 81
5.2.3. Fail Stop............................................................................................. 82
5.2.4. Results ............................................................................................... 82
5.3. Perform Tests Metering............................................................................... 83
5.4. Performing a Test........................................................................................ 85
5.5. Displayed Messages .................................................................................... 86
5.5.1. Test Status Messages (all Models) ...................................................... 86
5.5.2. Test Status Messages (Models 8105 and 8106)................................... 88
6. Instrument Verification........................................................................................... 91
ii
6.1. Verification Initialization ............................................................................. 91
6.2. Verification Menu ....................................................................................... 91
6.2.1. Continuity Verification ....................................................................... 92
6.2.2. Ground Bond Verification .................................................................. 93
6.2.3. AC Hipot Verification ........................................................................ 94
6.2.4. DC Hipot Verification ........................................................................ 95
6.2.5. IR Verification.................................................................................... 96
7. Remote Control ....................................................................................................... 97
7.1. Signal Outputs on Remote I/O..................................................................... 97
7.2. Signal Inputs of Remote I/O and Memory ................................................... 98
8. Bus Remote Interface GPIB / RS-232................................................................... 100
8.1. A Brief History of IEEE-488..................................................................... 100
8.2. GPIB Messages......................................................................................... 100
8.3. Functions .................................................................................................. 100
8.4. Signals and Lines....................................................................................... 100
8.5. GPIB Connector ....................................................................................... 101
8.6. GPIB Address ........................................................................................... 102
8.7. Interface Functions.................................................................................... 102
8.8. RS-232 Interface....................................................................................... 103
8.9. Omnia, GPIB / RS-232 Interface Command List ....................................... 103
8.9.1. Test Execution Commands ............................................................... 104
8.9.2. File Editing Commands..................................................................... 104
8.9.3. Test Parameter Editing Commands and Companion Queries ............. 108
8.9.4. System Parameter Editing Commands and Companion Queries......... 111
8.9.5. Query Commands............................................................................. 112
8.9.6. IEEE 488.2 Common Commands ..................................................... 115
8.9.7. Status Reporting............................................................................... 117
8.9.8. GPIB Service Request ...................................................................... 118
8.10. Example of Communicating Over the GPIB Bus...................................... 118
8.11. Non Volatile Memory.............................................................................. 119
9. Options................................................................................................................... 120
10. Calibration Procedure ......................................................................................... 144
10.1. Warranty Requirements ........................................................................... 144
10.2. Calibration Initialization .......................................................................... 145
10.3. Selecting Specific Calibration points ........................................................ 145
10.4. Calibration points .................................................................................... 145
10.4.1. Calibration of AC Hipot Voltage .................................................... 146
10.4.2. Calibration of DC Hipot Voltage .................................................... 146
10.4.3. Calibration of IR DC Voltage ......................................................... 146
iii
10.4.4. Calibration of AC 40mA Range ...................................................... 147
10.4.5. Calibration of AC 3.5mA Range ..................................................... 147
10.4.6. Calibration of DC 20mA Range ...................................................... 148
10.4.7. Calibration of DC 3.5mA Range ..................................................... 148
10.4.8. Calibration of DC 350.0µA Range .................................................. 148
10.4.9. Calibration of IR 999.99M Range ................................................... 149
10.4.10. Calibration of IR 999.9M Range ................................................... 149
10.4.11. Calibration of IR 50000M Range .................................................. 149
10.4.12. Calibration of GND Bond Voltage................................................ 150
10.4.13. Calibration of GND Current.......................................................... 150
10.4.14. Calibration of AC Real 200W, 40mA............................................ 151
10.4.15. Calibration of AC Real 20W, 40mA.............................................. 151
10.4.16. Calibration of AC Real 20W, 3.5mA............................................. 151
10.4.17. Calibration of AC Real 2W, 3.5mA............................................... 152
10.4.18. Calibration of Continuity............................................................... 152
10.4.19. Calibration of Run Test Voltage.................................................... 152
10.4.20. Calibration of Run Test Current .................................................... 153
10.4.21. Calibration of Run Test Power...................................................... 153
10.4.22. Calibration of Run Test Leakage................................................... 154
10.4.23. Calibration of LLT MD V-Offset .................................................. 154
10.4.24. Calibration of LLT MD Volts x 1 ................................................. 155
10.4.25. Calibration of LLT MD Volts x 4 ................................................. 155
10.4.26. Calibration of LLT MD Volts x 16................................................ 155
10.4.27. Calibration of LLT MD Volts x 64................................................ 156
10.4.28. Calibration of LLT MD Volts x 256.............................................. 156
10.4.29. Calibration of LLT MD: UL 544NP measuring device .................. 156
10.4.30. Calibration of LLT MD: UL 544P measuring device ..................... 157
10.4.31. Calibration of LLT MD: ICE601-1 measuring device.................... 157
10.4.32. Calibration of LLT MD: UL1563 measuring device ...................... 158
10.4.33. Calibration of LLT MD: IEC60990 FIG4 measuring device .......... 158
10.4.34. Calibration of the External measuring device................................. 158
10.4.35. Calibration of LLT MD: IEC 60990 FIG5 measuring device ......... 159
10.4.36. Calibration of LLT MD: IEC 60990 FIG3 measuring device ......... 159
11. Replacement Parts List........................................................................................ 160
12. Schematic Index................................................................................................... 162
Index is located at the back of the manual.
iv
1. Introduction
1.1. Warranty Policies
Associated Research, Inc., certifies that the instrument listed in this manual meets or exceeds
published manufacturing specifications. This instrument was calibrated using standards that are
traceable to the National Institute of Standards and Technology (NIST).
Your new instrument is warranted to be free from defects in workmanship and material for a
period of (1) year from date of shipment. You must complete the on-line registration at
www.asresearch.com/register or call 1-800-858-TEST ext. 210 to register over the phone
5-Year Program
AR recommends that your instrument be calibrated on a twelve-month cycle. Instruments
purchased and used in North America only, may have their warranty extended in one year
increments to a maximum of (5) years provided they are returned to AR at least annually for
calibration and inspection. The annual calibration and inspection must be performed annually
every year following receipt of instrument. Any instrument not calibrated and inspected
annually will not be eligible for extended warranty status. This extended warranty is non-
transferable and is offered only to the original purchaser. A return material authorization
(RMA) must be obtained from AR before returning this instrument for warranty service. Please
contact our Customer Support Center at 1-800-858-TEST (8378) to obtain an RMA number.
It is important that the instrument is packed in its original container for safe transport. If the
original container in not available please contact our customer support center for proper
instructions on packaging. Damages sustained as a result of improper packaging will not be
honored. Transportation costs for the return of the instrument for warranty service must be
prepaid by the customer. AR will assume the return freight costs when returning the instrument
to the customer. The return method will be at the discretion of Associated Research.
3-Year Program
A 3-Year warranty is also available for instruments purchased and used in North America. All
costs for this warranty are paid with the initial purchase and include warranty coverage, annual
calibration and standard ground return freight for three years. However, unlike our 5-year
program annual calibration and inspection by Associated Research is not required.
Except as provided herein, Associated Research makes no warranties to the purchaser of this
instrument and all other warranties, express or implied (including, without limitation,
merchantability or fitness for a particular purpose) are hereby excluded, disclaimed and waived.
Any non-authorized modifications, tampering or physical damage will void your warranty.
Elimination of any connections in the earth grounding system or bypassing any safety systems
will void this warranty. This warranty does not cover batteries or accessories not of Associated
Research manufacture. Parts used must be parts that are recommended by AR as an acceptable
specified part. Use of non-authorized parts in the repair of this instrument will void the
warranty.
1
1.2. Safety Symbols
1.2.1. Product Marking Symbols
Product will be marked with this symbol when it is necessary to refer to the operation
and service manual in order to prevent injury or equipment damage.
Product will be marked with this symbol when hazardous voltages may be present.
Product will be marked with this symbol at connections that require earth grounding.
1.2.2. Caution and Warning Symbols
Calls attention to a procedure, practice, or condition that could possibly cause

WARNING
bodily injury or death.
CAUTION Calls attention to a procedure, practice, or condition that could possibly

cause damage to equipment or permanent loss of data
2
1.3. Glossary of Terms
(As used in this manual)
Alternating Current, AC: Current that reverses direction on a regular basis, commonly in the U.S.A. 60
per second, in other countries 50 times per second.
Breakdown: The failure of insulation to effectively prevent the flow of current sometimes evidenced by
arcing. If voltage is gradually raised, breakdown will begin suddenly at a certain voltage level. Current flow is
not directly proportional to voltage. Once breakdown current has flown, especially for a period of time, the next
gradual application of voltage will often show breakdown beginning at a lower voltage than initially.
Conductive: Having a volume resistivity of no more than 103 ohm-cm or a surface resistivity of no more
than 105 ohms per square.
Conductor: A solid or liquid material which has the ability to let current pass through it, and which has a
volume resistivity of no more than 103 ohm-cm.
Current: The movement of electrons through a conductor. Current is measured in amperes, milliamperes,
microamperes, nanoamperes, or picoamperes. Symbol = I
Dielectric: An insulating material that is positioned between two conductive materials in such a way that a
charge or voltage may appear across the two conductive materials.
Direct Current, DC: Current that flows in one direction only. The source of direct current is said to be
polarized and has one terminal that is always at a higher potential than the other.
Hipot Tester: Common term for dielectric-withstand test equipment.
Hypot®: Registered trademark of Associated Research, Inc., for its dielectric-withstand test equipment.
Insulation: Gas, liquid or solid material which has a volume resistivity of at least 1012 ohm-cm and is used
for the purpose of resisting current flow between conductors.
Insulation Resistance Tester: An instrument or a function of an instrument capable of measuring

resistance's in excess of 200 megohms. Usually employs a higher voltage power supply than used in ohmmeters
measuring up to 200 megohms.
Leakage: AC or DC current flow through insulation and over its surfaces, and AC current flow through a
capacitance. Current flow is directly proportional to voltage. The insulation and/or capacitance are thought of
as a constant impedance, unless breakdown occurs.
Resistance: That property of a substance that impedes current and results in the dissipation of power, in the
form of heat. The practical unit of resistance is the ohm. Symbol = R
Trip Point: A minimum or maximum parameter set point that will cause an indication of unacceptable
performance during a run test.
Voltage: Electrical pressure, the force which causes current through an electrical conductor.
Symbol = V
3
1.4. Safety
This product and its related documentation must be reviewed for familiarization with safety
markings and instructions before operation.
This product is a Safety Class I instrument (provided with a protective earth terminal).
Before applying power verify that the instrument is set to the correct line voltage (110 or 220)
and the correct fuse is installed.
A Hipot produces voltages and currents that can cause harmful or fatal
WARNING electric shock. To prevent accidental injury or death, these safety procedures
must be strictly observed when handling and using the test instrument.
1.4.1. Service and Maintenance
User Service
To prevent electric shock do not remove the instrument cover. There are no user serviceable
parts inside. Routine maintenance or cleaning of internal parts is not necessary. Avoid the use
of cleaning agents or chemicals on the instrument, some chemicals may damage plastic parts or
lettering. Any external cleaning should be done with a clean dry or slightly damp cloth.
Schematics, when provided, are for reference only. Any replacement cables and high voltage
components should be acquired directly from Associated Research, Inc. Refer servicing to an
Associated Research, Inc. authorized service center.
(PHONE: 1 (847) 367-4077

ASSOCIATED RESEARCH, INC. 1 (800) 858-TEST (8378)
13860 WEST LAUREL DRIVE FAX: 1 (847) 367-4080
LAKE FOREST, IL 60045-4546 U.S.A. E-MAIL : [email protected]
www.asresearch.com
Service Interval
The instrument, its power cord, test leads, and accessories must be returned at least once a year
to an Associated Research authorized service center for calibration and inspection of safety
related components. Associated Research will not be held liable for injuries suffered if the
instrument is not properly maintained and safety checked annually.
User Modifications
Unauthorized user modifications will void your warranty. Associated Research will not be
responsible for any injuries sustained due to unauthorized equipment modifications or use of
parts not specified by Associated Research. Instruments returned to Associated Research with
unsafe modifications will be returned to their original operating condition at the customers
expense.
4
1.4.2. Test Station
Location
Select an area away from the main stream of activity which employees do not walk through in
performing their normal duties. If this is not practical because of production line flow, then the
area should be roped off and marked for HIGH VOLTAGE TESTING. No employees other
than the test operators should be allowed inside.
If benches are placed back-to-back, be especially careful about the use of the bench opposite the
test station. Signs should be posted: "DANGER - HIGH VOLTAGE TEST IN
PROGRESS - UNAUTHORIZED PERSONNEL KEEP AWAY."
Work Area
Perform the tests on a non-conducting table or workbench, if possible. If you cannot avoid
using a conductive surface, be certain that it is connected to a good earth ground and the high
voltage connection is insulated from the grounded surface.
There should not be any metal in the work area between the operator and the location where
products being tested will be positioned. Any other metal in the work area should be connected
to a good ground, never left "floating".
Position the tester so the operator does not have to reach over the product under test to activate
or adjust the tester. If the product or component being tested is small, it may be possible to
construct guards or an enclosure around the device to be tested. Construct the guards of a non-
conducting material such as clear acrylic, so that the item being tested is within the guards or
enclosure during the test. If possible, the guards or enclosure should also contain safety
switches that will not allow the tester to operate unless the guards are in place or the enclosure
closed.
Keep the area clean and uncluttered. All test equipment and test leads not necessary for the test
should be removed from the test bench and put away. It should be apparent to both the
operator and to any observers, the product that is being tested and the product that is waiting to
be tested, or has already been tested.
Do not perform Hipot tests in a combustible atmosphere or in any area where combustible
materials are present.
Power
Dielectric Voltage-Withstand Test Equipment must be connected to a good ground. Be certain
that the power wiring to the test bench is properly polarized and that the proper low resistance
bonding to ground is in place.
Power to the test station should be arranged so that it can be shut off by one prominently
marked switch located at the entrance to the test area. In case of an emergency, anyone can cut
off the power before entering the test area to offer assistance.
5
1.4.3. Test Operator
Qualifications
This instrument generates voltages and currents that can cause harmful or fatal electric shock
and must only be operated by a skilled worker trained in its use.
The operator should understand the electrical fundamentals of voltage, current, and resistance.
They should recognize that the test instrument is a variable high-voltage power supply with the
return circuit directly connected to earth ground, therefore, current from the high-voltage
output will flow through any available ground path.
Rules
Operators should be thoroughly trained to follow all of the aforementioned rules, in addition to
any other applicable safety rules and procedures. Defeating any safety system should be
considered a serious offense with severe penalties such as removal from the Hipot testing job.
Allowing unauthorized personnel in the area during a test should also be dealt with as a serious
offense.
Dress
Operators should not wear jewelry that could accidentally complete a circuit.
Medical Restrictions
Personnel with heart ailments or devices such as pacemakers should be informed that the
voltages and currents generated by the instrument are very dangerous. If contacted it may
cause heart-related problems that a person of good health may not experience. Please have the
test operator consult their physician for recommendations.
1.4.4. Instrument Connections
WARNING Never perform a hipot test on energized circuitry or equipment.
The instrument is equipped with a safety ground connection, be sure that this is
connected to a good earth ground.
Always connect the return lead first, regardless of whether the item under test is a sample of
insulating material, a component tested with the high voltage test lead, or a cord-connected
device with a two or three prong plug. The return lead should be connected first for any type of
hipot testing.
Plug in the high voltage test lead only when it is being used. Handle its clip only by the
insulator---never touch the clip directly. Be certain that the operator has control over any
remote test switches connected to the Hipot. Double check the return and high voltage
connections from the Hipot and the Line, Neutral, Ground and Case connections from the Line
Leakage tester to be certain that they are proper and secure.
6
1.4.5. Device Under Test
Never touch the Device Under Test (DUT) or anything connected to it while
WARNING
high voltage is being applied by the hipot.
When testing with DC, always discharge the capacitance of the item under test and anything the
high voltage may have contacted--such as test fixtures--before handling it or disconnecting the
test leads.
HOT STICK probes can be used to discharge any capacitance in the device under test as a
further safety precaution. A hot stick is a non-conducting rod about two feet long with a metal
probe at the end that is connected to a wire. To discharge the device under test, two hot sticks
are required. First, connect both probe wires to a good earth ground. Then touch one probe tip
to the same place that the return lead was connected. While holding the first probe in place,
touch the second probe tip to the same place where the high voltage lead was connected.
1.4.6. Key Safety Points to Remember
• Keep unqualified and unauthorized personnel away from the test area.
• Arrange the test station in a safe and orderly manner.
• Never touch the product or connections during a test.
• In case of any problem, turn off the high voltage first.
• Properly discharge any item tested with DC before touching connections.
7
1.5. Introduction to Product Safety Testing
1.5.1. The Importance of Safety Testing

Product Safety Tests are specified during the design and development stages of a product as
well as in the production of the products to insure that it meets basic safety requirements.
These tests are designed to verify the safety of the electrical products in that they do not
jeopardize the safety of the people, domestic animals, and property of anyone who may come in
contact with these products. In an era of soaring liability costs, original manufacturers of
electrical and electronic products must make sure every item is as safe as possible. All products
must be designed and built to prevent electric shock, even when users abuse the equipment or
by-pass built in safety features.
To meet recognized safety standards, one common test is the "dielectric voltage-withstand test".
Safety agencies which require compliance safety testing at both the initial product design stage
and for routine production line testing include: Underwriters Laboratories, Inc. (UL), the
Canadian Standards Association (CSA), the International Electrotechnical Commission (IEC),
the British Standards Institution (BSI), the Association of German Electrical Engineers (VDE)
and (TÜV), the Japanese Standards Association (JSI). These same agencies may also require
that an insulation resistance test and high current ground bond test be performed.
1.6. The Different Types of Safety Tests
1.6.1. Dielectric Withstand Test

The principle behind a dielectric voltage - withstand test is simple. If a product will function
when exposed to extremely adverse conditions, it can be assumed that the product will function
in normal operating circumstances.
Common Applications of the Dielectric Withstand Test:
• Design (performance) testing: Determining design adequacy to meet service conditions.
• Production Line testing: Detecting defects in material or workmanship during processing.
• Acceptance testing: Proving minimum insulation requirements of purchased parts.
• Repair Service testing: Determine reliability and safety of equipment repairs.
The specific technique used to apply the dielectric voltage - withstand test to each product is
different. During a dielectric voltage - withstand test, an electrical device is exposed to a
voltage significantly higher than it normally encounters, for a specified duration of time.
During the test, all current flow from the high voltage output to the return is measured. If,
during the time the component is tested, the current flow remains within specified limits, the
device is assumed safe under normal conditions. The basic product design and use of the
insulating material will protect the user against electrical shock.
The equipment used for this test, a dielectric-withstand tester, is often called a "hipot" (for high
8
potential tester). The "rule of thumb" for testing is to subject the product to twice its normal
operating voltage, plus 1,000 volts.
However, specific products may be tested at much higher voltages than 2X operating voltages +
1,000 volts. For example, a product designed to operate in the range between 100 to 240 volts
can be tested between 1,000 to 4,000 volts or higher. Most "double insulated" products are
tested at voltages much higher than the "rule of thumb".
Testing during development and prototype stages is more stringent than production run tests
because the basic design of the product is being evaluated. Design tests usually are performed
on only a few samples of the product. Production tests are performed on every item as it comes
off the production line.
The hipot tester must also maintain an output voltage between 100% and 120% of specification.
The output voltage of the hipot must have a sinusoidal waveform with a frequency between 40
to 70 Hz and has a peak waveform value that is not less than 1.3 and not more than 1.5 times
the root-mean-square value.
Types of Failures only detectable with a Hipot test
• Weak Insulating Materials
• Pinholes in Insulation
• Inadequate Spacing of Components
• Pinched Insulation
Dielectric Withstand Test; AC verses DC

Please check with the Compliance Agency you are working with to see which of the two types
of voltages you are authorized to use. In some cases, a Compliance Agency will allow either
AC or DC testing to be done. However, in other cases the Compliance Agency only allows for
an AC test. If you are unsure which specification you must comply with please contact our
CUSTOMER SUPPORT GROUP at 1-800-858-TEST (8378).
Many safety agency specifications allow either AC or DC voltages to be used during the hipot
test. When this is the case, the manufacturer must make the decision on which type of voltage
to utilize. In order to do this it is important to understand the advantages and the disadvantages
of both AC and DC testing.
AC testing characteristics
Most items that are hipot tested have some amount of distributed capacitance. An AC voltage
cannot charge this capacitance so it continually reads the reactive current that flows when AC is
applied to a capacitive load.
9
AC testing advantages
AC testing is generally much more accepted by safety agencies than DC testing. The main
reason for this is that most items being hipot tested will operate on AC voltages. AC hipot
testing offers the advantage of stressing the insulation alternately in both polarities, which more
closely simulates stresses the product will see in real use.
Since AC testing cannot charge a capacitive load the current reading remains consistent from
initial application of the voltage to the end of the test. Therefore, there is no need to gradually
bring up the voltage since there is no stabilization required to monitor the current reading. This
means that unless the product is sensitive to a sudden application of voltage the operator can
immediately apply full voltage and read current without any wait time.
Another advantage of AC testing is that since AC voltage cannot charge a load there is no need
to discharge the item under test after the test.
AC testing disadvantages
One disadvantage of AC testing surfaces when testing capacitive products. Again, since AC
cannot charge the item under test, reactive current is constantly flowing. In many cases, the
reactive component of the current can be much greater than the real component due to actual
leakage. This can make it very difficult to detect products that have excessively high leakage
current.
Another disadvantage of AC testing is that the hipot has to have the capability of supplying
reactive and leakage current continuously. This may require a current output that is actually
much higher than is really required to monitor leakage current and in most cases is usually much
higher than would be needed with DC testing. This can present increased safety risks as
operators are exposed to higher currents.
DC testing characteristics
During DC hipot testing the item under test is charged. The same test item capacitance that
causes reactive current in AC testing results in initial charging current which exponentially
drops to zero in DC testing.
DC testing advantages
Once the item under test is fully charged, the only current flowing is true leakage current. This
allows a DC hipot tester to clearly display only the true leakage of the product under test.
Another advantage to DC testing is that the charging current only needs to be applied
momentarily. This means that the output power requirements of the DC hipot tester can
typically be much less than what would be required in an AC tester to test the same product.
DC testing disadvantages
Unless the item being tested has virtually no capacitance, it is necessary to raise the voltage
gradually from zero to the full test voltage. The more capacitive the item the more slowly the
voltage must be raised. This is important since most DC hipots have failure shut off circuitry
10
which will indicate failure almost immediately if the total current reaches the leakage threshold
during the initial charging of the product under test.
Since a DC hipot does charge the item under test, it becomes necessary to discharge the item
after the test.
DC testing unlike AC testing only charges the insulation in one polarity. This becomes a
concern when testing products that will actually be used at AC voltages. This is an important
reason that some safety agencies do not accept DC testing as an alternative to AC.
When performing AC hipot tests the product under test is actually tested with peak voltages
that the hipot meter does not display. This is not the case with DC testing since a sinewave is
not generated when testing with direct current. In order to compensate for this most safety
agencies require that the equivalent DC test be performed at higher voltages than the AC test.
The multiplying factor is somewhat inconsistent between agencies which can cause confusion
concerning exactly what equivalent DC test voltage is appropriate.
1.6.2. Insulation Resistance Test

Some "dielectric analyzers today come with a built in insulation resistance tester. Typically, the
IR function provides test voltages from 500 to 1,000 volts DC and resistance ranges from
kilohms to gigaohms. This function allows manufacturers to comply with special compliance
regulations. BABT, TÜV and VDE are agencies that may under certain conditions, require an
IR test on the product before a Hipot test is performed. This typically is not a production line
test but a performance design test.
The insulation resistance test is very similar to the hipot test. Instead of the go/no go indication
that you get with a hipot test the IR test gives you an insulation value usually in Megohms.
Typically, the higher the insulation resistance value the better the condition of the insulation.
The connections to perform the IR test are the same as the hipot test. The measured value
represents the equivalent resistance of all the insulation which exists between the two points and
any component resistance which might also be connected between the two points.
Although the IR test can be a predictor of insulation condition it does not replace the need to
perform a dielectric withstand test.
1.6.3. Ground Bond Test

The Ground Bonding test determines whether the safety ground circuit of the product under
test can adequately handle fault current if the product should ever become defective. A low
impedance ground system is critical in ensuring that in case of a product failure, a circuit
breaker on the input line will act quickly to protect the user from any serious electrical shock.
International compliance agencies such as CSA, IEC, TÜV, VDE, BABT and others, have
requirements calling out this test. This test should not be confused with low current continuity
tests that are also commonly called out in some safety agency specifications. A low current test
merely indicates that there is a safety ground connection. It does not completely test the
11
integrity of that connection.
Compliance agency requirements vary on how different products are to be tested. Most
specifications call for test currents of between 10 and 40 amps. Test voltages at these currents
are typically required to be less than 12 volts. Maximum allowable resistance readings of the
safety ground circuit are normally between 100 and 200 milliohms.
If you are testing a product that is terminated in a three-prong plug, you are required to perform
a continuity or ground bond test on the ground conductor to the chassis or dead metal of the
product.
1.6.4. Run Test

All manufacturers of a product that runs on line power normally need to run the DUT (Device
Under Test) after final safety testing so that they can verify the functionality of their products.
In addition to running the DUT to test its basic functionality many customers also require some
basic test data to be recorded while the DUT is powered up. A Run Test System allows the
product to be powered up immediately after the safety tests are completed with a single
connection to the DUT. Measurements that are commonly made while the DUT is running can
include Amperage, Voltage, Watts and Power Factor.
1.6.5. Line Leakage Test

The Line Leakage test is one of many product safety tests that are normally specified for
electrical products by safety testing agencies such as Underwriters Laboratories (UL) and the
International Electrotechnical Committee (IEC). The line leakage specifications vary as well as
the method in which the measurements are taken depending upon the application or function of
a product and the standard to which the product is being tested.
Current Leakage or Line Leakage tests are general terms that actually describe three different
types of tests. These tests are Earth Leakage Current, Enclosure Leakage Current, and Applied
Part Leakage Current. The main differences in these tests are in the placement of the probe for
the measuring device. The Earth Leakage Current is the leakage current that flows through the
ground conductor in the line cord back to earth. The Enclosure Leakage Current is the current
that flows from any enclosure part through a person back to ground if it were contacted by a
person. The Applied Part Leakage Current or Patient Lead Leakage Current is any leakage that
flows from an applied part, between applied parts or into an applied part. The Applied Part
Leakage Current test is required only for medical equipment. All of these tests are used to
determine if products can be safely operated or handled without posing a shock hazard to the
user.
Line Leakage Testers provide the capability of meeting the line leakage test specified in the
following standards; UL 544, IEC 950, UL 1950, IEC 601-1, UL 2601, UL 1563, UL 3101,
IEC 1010 and others. The Line Leakage test, is a test which measures the leakage current of a
product, through a circuit that is designed to simulate the impedance of the human body. The
simulation circuit is called the Measuring Device (MD). The instrument has five different MD
circuits, selectable through the menu, which are representative circuits designed to simulate the
impedance of the human body under different conditions. The impedance of the human body
12
will vary depending upon point of contact, the surface area of the contact and the path the
current flows. For these reasons, the specifications of the Measuring Devices are different
depending upon the type of test being performed as well as the maximum allowable leakage
current. Leakage current measurements are performed on products under normal conditions
and single fault conditions as well as reversed polarity. This simulates possible problems, which
could occur if the product under test is faulted or misused while the product is operating under
high line conditions (110% of the highest input voltage rating of the product).
Line Leakage tests are normally specified as “Type Tests”or “Design Tests”which are
performed during the development of the product. This helps verify that the design is safe but it
does not guarantee the safety of the products being produced on the production line. The only
way to be sure you are shipping safe products is to test each product at the end of the
production line. The user may perform a Leakage Current test along with other common safety
test such as Dielectric Withstand, Insulation Resistance, and Ground Bond on the production
line with a single connection to the device under test.
IF YOU SHOULD HAVE ANY QUESTIONS RELATING TO THE OPERATION OF

YOUR INSTRUMENT CALL 1-800-858-TEST(8378) IN THE U.S.A.
13
1.7. Key Features and Benefits: OMNIA
§ A complete all-in-one system OMNIA combines all of the most common electrical
with up to 6 functions in a safety tests required by safety agencies (AC Hipot, DC
single 19 inch rack mount Hipot, IR test, Ground Bond/Continuity, Line Leakage
cabinet and Functional Run Test) into a single instrument which
takes up less rack space and enables a single DUT
connection. OMNIA is also available in 4-in-1 and 5-
in-1 versions for those who do not need to perform all
of the above mentioned tests.
§ The first safety testing This provides the operator with complete test setup and
instrument with an enhanced results in an easy-to-use interface. This eliminates the
graphic LCD display. need to decipher cryptic abbreviations. The graphic
display makes testing safer, easier and more reliable
than ever before.
§ Built-in calibration alert This feature automatically alerts the user when the
instrument is due for re-calibration. This eliminates the
need for manual tracking of calibration dates.
§ PLC remote inputs & outputs This allows the instruments to be remotely monitored
and set up completely through simple PLC control.
Recall up to 10 different setups is possible through
these remotes.
§ Exclusive SmartGFI function The SmartGFI (patent pending) provides maximum
operator protection to the user. If the circuit detects
excessive leakage to ground it shuts down the high
voltage in less than 1 millisecond. SmartGFI is
automatically activated if the DUT is not grounded.
The operator does not need to make the decision
whether to activate the SmartGFI.
§ Optional printer port This option allows direct connection of OMNIA to a
printer. The user can select between several different
print modes and all printouts are date stamped. This is
a real benefit for those requiring hard copies of test
data.
§ Built-in Security settings This allows the instrument to be setup to allow for
different levels of access to the instruments setup
programs. Users can setup up passwords for restricting
access to certain parts of the menu.
14
§ Storage of up to 50 setups A real benefit for manufacturers that test different
with 30 steps per setup products. Each setup can store up to 30 steps, which
can be configured to perform any of the safety tests.
Each setup can be stored and named any combination of
alphanumeric characters so it can be easily identified for
recall.
§ Exclusive prompt and hold OMNIA allows users to setup prompts in the test cycle
function so that the test can be paused. During the pause, a
user-configured message is displayed instructing the test
operator on the action they need to perform before
continuing with the test. This is a very convenient
feature for applications where test leads need to be
moved or when DUT switches need to be activated as
part of the test cycle.
§ Up to 40mA of current is This makes these instruments true hipot testers with
available in AC Hipot mode enough output current to test even highly capacitive
and 20 mA in DC Hipot mode loads while allowing them to be versatile enough to
with resolutions of 1 monitor leakage current of items with very low leakage
microamps in AC and 0.1 measurement requirements.
microamp in DC
§ Exclusive CHARGE LO and The RAMP HI feature allows the user to set a higher
RAMP HI testing features trip rate during the ramp to allow for quick charging of
allow for more effective DC the product without nuisance tripping thereby increasing
Hipot testing throughput when testing with DC. The CHARGE LO
provides the user with the capability to ensure that the
device under test is connected correctly.
§ Line and Load regulation Maintains the output voltage to within 1% of setting
even if the load or the line voltage varies. This ensures
that the test results remain consistent and within safety
agency requirements.
§ Built-in Real Current OMNIA allows for simultaneous monitoring of Real
measurement and Total current in AC Hipot mode. This allows the
user to monitor total and real current on a single screen.
§ Digitally controlled arc Allows the operator to select whether low-level arcs
detection system should be detected and provides the operator with the
ability to digitally select and program multiple
sensitivity levels.
15
§ Dual function Ground Bond The user can select whether to perform a high current
and Ground Continuity ground bond test or a low current continuity test. The
functions ground continuity test can be run as an independent test
or it can be performed simultaneously with the hipot
test. In addition, both tests can be run through the
optional built-in scanner.
§ Four wire measurement The four-wire measurement technique eliminates test
(Kelvin Method) and lead resistance when using the standard test leads. The
milliohm offset capability in milliohm-offset function allows the use of longer test
the Ground Bond mode leads and test fixtures without compromising test
results.
§ Up to 40 amps of current Meets the new testing requirements for 20 amp branch
available for testing the circuits as specified under UL 60950-1 requiring 2 X
integrity of the ground circuit the branch circuit current rating for 2 minutes.
§ Measures both Peak and Meets the Touch Current and Protective Conductor
RMS leakage current in the Current testing requirements as specified by IEC 60990
Line Leakage test mode
§ 7 Measuring Devices Multiple Measuring Devices to simulate different body
impedance models as specified by various product
safety standards for performing Line Leakage or Touch
Current tests, making the Omnia 8106 the most
versatile tester on the market.
§ Neutral-V Safety circuit to monitor the Neutral of the DUT input
receptacle. Does not allow a test to be conducted if
voltage is present on the neutral conductor. Reducing
the potential shock hazard to the operator since the
leakage measurements are referenced to the neutral side
of the line.
16
2. Getting Started
Introduction
This section contains information for the unpacking, inspection, preparation for use and storage
of your Associated Research, Inc., product.
2.1. Unpacking and Inspection
2.1.1. Packaging
Your instrument was shipped in a custom foam insulated container that complies with ASTM
D4169-92a Assurance Level II Distribution Cycle 13 Performance Test Sequence
If the shipping carton is damaged, inspect the contents for visible damage such as dents,
scratches or broken display. If the instrument is damaged, notify the carrier and Associated
Research's customer support department. Please save the shipping carton and packing material
for the carriers inspection. Our customer support department will assist you in the repair or
replacement of your instrument. Please do not return your product without first notifying us
and receiving an RMA (return material authorization) number. To receive an RMA number,
please contact our customer support department at (1-800-858-8378).
• Please retain all of the original packaging materials.
2.1.2. Contents of the Carton

Inside the carton should be the following:
Description AR Part Number
Omnia Instrument 8104 or 8105 or 8106
High Voltage Cable 04040A-08
High Current Output Cable 38489
High Current Return Cable 38490
Return Cable (Qty. 2) 02100A-13 (8105 and 8106)
High Current Test Lead CBLHC40-10TL (8105 and 8106)
Fuse 38503, 10A Slow-Blow 250VAC
RS232 Cable 37863
Line Cord* 33189 Standard
Line Cord 38071 (8105, 8106)
Adapter Box* 38482 Standard (8104)
Adapter Box* 38578 (8105 and 8106))
Bracket Rack Mount 3U (Qty 2) 38788
Handle Rack Mount 3U (Qty 2) 38787
Screw M4 x 12mm FHMS (Qty 4) 38549 For Rack Mount Handle
*The Adapter Box and Line Cord listed are American. Other combinations of Line Cord and
Adapter Box are available upon request.
17
2.1.3. Returning the Instrument
When it is necessary to return the instrument for servicing or calibration, repackage the
instrument in its original container, please include all accessories and test leads. Indicate the
nature of the problem or type of service needed. Also, please mark the container "FRAGILE"
to insure proper handling. Upon receipt, your instrument will be issued an AR service number.
Please refer to this number in all correspondence.
If you do not have the original packaging materials, please follow these guidelines:
• Wrap the instrument in a bubble pack or similar foam. Enclose the same information as
above.
• Use a strong double-wall container that is made for shipping instrumentation. 350 lb. test
material is adequate.
• Use a layer of shock-absorbing material 70 to 100 mm (3 to 4 inch) thick around all sides of
the instrument. Protect the control panel with cardboard.
• Seal the container securely.
• Mark the container "FRAGILE" to insure proper handling.
• Please refer in all correspondence to your AR service number.
2.2. Installation
2.2.1. Work Area

Locate a suitable testing area and be sure you have read all safety instructions
WARNING for the operation of the instrument and suggestions on the test area set-up in
the Safety section. Make sure the work area you choose has a three-prong
grounded outlet. Be sure the outlet has been tested for proper wiring before connecting the
instrument to it.
2.2.2. Power Requirements

This instrument requires a power source of either 115 volts AC ± 10%, 50/60 Hz single phase
or 230 volts AC ±10%, 50/60 Hz single phase. Please check the rear panel to be sure the
proper switch setting is selected for your line voltage requirements before turning your
instrument on. For operation at 115 and 230 Volts AC use a 10 A, 250VAC slow-blow fuse.
Do not switch the line voltage selector switch located on the rear panel while
CAUTION the instrument is on or operating. This may cause internal damage and
represents a safety risk to the operator.
18
2.2.3. Basic Connections
Power Cable
Before connecting power to this instrument, the protective ground (Earth)
WARNING terminals of this instrument must be connected to the protective conductor of
the line (mains) power cord. The main plug shall only be inserted in a socket
outlet (receptacle) provided with a protective ground (earth) contact. This protective ground
(earth) must not be defeated by the use of an extension cord without a protective conductor
(grounding).
The instrument is shipped with a three-wire power cable. When the cable is connected to an
appropriate AC power source, the cable will connect the chassis to earth ground. The type of
power cable shipped with each instrument depends on the country of destination.
The output power supplies of this instrument are referenced directly to earth
CAUTION ground. Any conductor that completes a path between the high voltage and
earth ground will form a completed circuit.
Return Connection
When the instrument Return is grounded, any internal and external stray leakage will be
monitored due to currents that flow from High Voltage to earth ground (such as from HV to
the chassis of the instrument). This current is inherent and will cause errors when trying to
monitor very low leakage currents in the micoamp range.
2.2.4. Environmental Conditions

This equipment is intended for indoor use only. The equipment has been evaluated according to
Installation Category II and Pollution Degree 2 as specified in IEC 664.
This instrument may be operated in environments with the following limits:

Temperature… … … … .32° - 104° F (0° - 40° C)
Relative humidity … … .0 - 80%
Altitude … … … … … … 6,560 feet (2,000 meters)
Storage and Shipping Environment

This instrument may be stored or shipped in environments with the following limits:
Temperature.................-40° - 167° F (-40° - 75°C)
Altitude................… .....50,000 feet (15,240 meters)
The instrument should also be protected against temperature extremes that may cause
condensation within the instrument.
19
3. Specifications and Controls
3.1. Omnia Functional Specifications
INPUT
Voltage 115 / 230V selectable, ± 10 % variation
Frequency 50/60 Hz ± 5%
Fuse 115 VAC, 230VAC –10A Slow-Blo 250VAC
DIELECTRIC WITHSTAND TEST MODE
Output Rating 5KV @ 40mA AC
5KV @ 20 mA DC
Voltage Setting Range: 0–5000V AC
0–5000V DC
Resolution: 1 V
Accuracy: ± (2% of setting + 5 volts)
Voltage Display Range: 0.00 –5.00KV Full Scale
Resolution: 0.01 KV
Accuracy: ± (2% of reading + 10 V)
Ramp-HI DC >20 mA peak maximum, ON/OFF Selectable
Charge-LO DC Range: 0.0 –350.0 µA DC or Auto set
HI and LO-Limit
AC Total Range: 0.000 –9.999mA
Resolution: 0.001mA
Range: 10.00 –40.00mA
Resolution: 0.01mA
Accuracy: ± (2% of setting + 2 counts)
AC Real Range: 0.000 –9.999mA
Resolution: 0.001mA
Range: 10.00 –40.00mA
Resolution: 0.01mA
Accuracy: ± (3% of setting + 50 µA)
DC Range: 0.0 –999.9µA
Resolution: 0.1µA
Range: 1000 –20000µA
Resolution: 1µA
Arc Detection Range: 1 – 9
Ground Continuity Current : DC 0.1 A ± 0.01A, fixed
Max. ground resistance : 1 Ω ± 0.1Ω, fixed
Ground Fault GFI Trip Current: 450 µA max (AC or DC)
Interrupt HV Shut Down Speed: < 1mS
20
DIELECTRIC WITHSTAND TEST MODE (cont.)
Current Display Auto Range
AC Total Range 1: 0.000 mA –3.500 mA
Resolution: 0.001 mA
Range 2 3.00 mA –40.00 mA
Resolution: 0.01 mA
Accuracy: ± (2% of reading + 2 counts) All Ranges
AC Real Range 1: 0.000 mA –9.999 mA
Range 2: 10.00 mA –40.00 mA
Resolution: 0.01 mA
Accuracy: ± (3% of reading + 50µA) All Ranges
PF > 0.1
V > 250VAC
DC Range 1: 0.0 µA –350.0 µA
Resolution: 0.1 µA
Range 2 0.300 mA –3.500 mA
Range 3 3.00 mA – 20.00 mA
Resolution: 0.01 mA
Accuracy: ± (2% of reading + 2 counts) All Ranges
DC Output Ripple ≤ 4% Ripple RMS at 5 KV DC @ 20mA, Resistive Load
Discharge Time ≤ 200 ms
Maximum Capacitive 1uF < 1KV 0.08uF < 4KV
Load 0.75uF < 2KV 0.04uF < 5KV
DC Mode 0.5uF < 3KV
AC Output Waveform Sine Wave, Crest Factor = 1.3 –1.5
Output Frequency Range: 60 or 50 Hz, User Selection
Accuracy: ± 0.1 %
Output Regulation ± (1 % of output + 5 V)
from no load to full load and over input voltage range.
Dwell Timer Range: AC 0.4 –999.9 sec (0 = Continuous)
Range: DC 0.3 –999.9 sec (0 = Continuous)
Resolution: 0.1 sec
Accuracy: ± (0.1% + 0.05 sec)
Ramp Timer Range: Ramp-Up: AC 0.1 –999.9 sec
DC 0.4 –999.9 sec
Ramp-Down: AC 0.0 –999.9 sec
DC 0.0 , 1.0 –999.9 sec
Resolution: 0.1 sec
Accuracy: ± (0.1% + 0.05 sec)
21
INSULATION RESISTANCE TEST MODE
Voltage Setting Range: 50 –1000 VDC
Resolution: 1 V
Charging Current Maximum >20mA peak
Voltage Display Range: 0 –1000 V
Resolution: 1 V
Accuracy: ± (2% of reading + 2 counts)
Resistance Display Range: 0.05MΩ –50000 MΩ (4 Digit, Auto Ranging)
Resolution: 50 –499 VDC 500 –1000VDC
MΩ MΩ MΩ
0.001 0.050 –1.999 0.050 –9.999
0.01 2.00 –19.99 10.00 –99.99
0.1 20.0 –199.9 100.0 –999.9
1 200 –50000 1000 –50000
Accuracy: 50 –499V
0.05M –999.9M, ± (7% of reading +2 counts)
500 –1000V
0.05M –999.9M, ± (2% of reading +2 counts)
1000M –9999M ± (5% of reading +2 counts)
10000M –50000M, ± (15% of reading +2 counts)
Charge-LO Range: 0.000 –3.500µA or Auto Set
HI and LO–Limit Range: 0.05M –99.99MΩ
Resolution: 0.01M
Range: 100.0M –999.9M
Resolution: 0.1M
Range: 1000M –50000M
Resolution: 1M
(HI –Limit: 0 = OFF)
Accuracy: Same as Resistance Display Accuracy
Ramp Timer Range: Ramp-Up: 0.1 –999.9 sec
Ramp-Down: 0.0, 1.0–999.9 sec
Resolution: 0.1 sec
Accuracy: ± (0.1% + 0.05 sec)
Delay Timer Range: 1.0 –999.9 sec (0 = Continuous)
Resolution: 0.1 sec
Accuracy: ± (0.1% + 0.05 sec)
Ground Fault GFI Trip Current: 450 µA max (AC or DC)
Interrupt HV Shut Down Speed: < 1mS
22
GROUND BOND TEST MODE
Output Voltage Range: 3.00 –8.00 VAC
(Open Circuit Limit) Resolution: 0.01 V
Accuracy: ± (2 % of setting + 0.03V) O.C. Condition
Output Frequency Range: 60 or 50 Hz, user selectable
Accuracy: ± 0.1%
Output Current Range: 1.00 –40.00 A
Resolution: 0.01 A
Accuracy: ± (2 % of setting + 0.02 A)
Output Regulation Accuracy: ± (1% of output + 0.02A)
Within maximum load limits, and over input voltage range.
Maximum Loading 1.00 –10.00A, 0 –600mΩ
10.01 –30.00A, 0 –200mΩ
30.01 –40.00A, 0 –150mΩ
Current Display Range: 0.00 –40.00 A
Resolution: 0.01 A
Accuracy: ± (3 % of setting + 0.03 A)
HI and LO-Limits Range: 0 –150 mΩ for 30.01 –40.00 Amps
0 –200 mΩ for 10.01 –30.00 Amps
0 –600 mΩ for 1.00 –10.00 Amps
Resolution: 1 mΩ
Accuracy: Same as Ohmmeter Display
Ohmmeter Display Range: 0 –150 mΩ for 30.01 –40.00 Amps
0 –200 mΩ for 10.01 –30.00 Amps
0 –600 mΩ for 6.00 –10.00 Amps
Resolution: 1 mΩ
Accuracy: ± (2% of reading + 2 mΩ)
Range: 0 –600 mΩ for 1.00 –5.99 Amps
Resolution: 1 mΩ
Accuracy: ± (3% of reading + 3 mΩ)
Dwell Timer Range: 0.5 –999.9 sec (0 = Continuous)
Resolution: 0.1 sec
Accuracy: ± (0.1% + 0.05 sec)
Milliohm Offset Range: 0 –200mΩ
Resolution: 1 mΩ
Accuracy: ± (2 % of setting + 2 mΩ)
23
CONTINUITY TEST MODE
Output Current DC 0.1A ± 0.01A Total Resistance*:0.00 –12.0Ω
DC 0.01A ± 0.001A Total Resistance*:12.1 –120Ω
DC 0.001A ± 0.0001A Total Resistance*:121 –1200Ω
DC 0.0001A ± 0.00001A Total Resistance*:1201 –10000Ω
Resistance Display Range 1: 0.00 –10.00 Ω
Resolution: 0.01 Ω
Accuracy: ± (1 % of reading + 0.03 Ω)
Range 2: 10.1 –100.0 Ω
Resolution: 0.1 Ω
Range 3: 101 –1000 Ω
Resolution: 1 Ω
Accuracy: ± (1 % of reading + 3 Ω)
Range 4: 1001 –10000 Ω
Resolution: 1 Ω
HI and LO-Limits Range 1: 0.00 –10.00 Ω
Range 2: 10.1 –100.0 Ω
Resolution: 0.1 Ω
Range 3: 101 –1000 Ω
Resolution: 1 Ω
Range 4: 1001 –10000 Ω
Resolution: 1 Ω
(Max Limit: 0 = OFF)
Dwell Timer Range: 0.0, 0.3 –999.9 sec (0 = Continuous)
Resolution: 0.1 sec
Accuracy: ± (0.1% + 0.05 sec)
Milliohm Offset Range: 0.00 –10.00Ω
24
GENERAL SPECIFICATIONS
PLC Remote Control Input: Test, Reset, Interlock, Recall File 1 through 10
Output: Pass, Fail, Test-in-Process
Safety Built-in Smart GFI circuit
Memory 50 memories, 30 step/memory
Interface Standard RS-232, Optional Printer Port with Date and Time Stamp
or GPIB.
Security Programmable password lockout capability to avoid unauthorized
access to test set-up program.
Graphic Display 320 X 240 Monographic LCD
LCD Contrast Setting Range: 1 –9; 1 is lightest character, 9 is darkest character.
Alarm Volume Setting Range: 0 –9; 0 = OFF, 1 is softest volume, 9 is loudest volume.
Calibration Adjustments are made through the front panel. Automatic
Calibration alert function to signal operator when calibration is due.
Mechanical Bench or rack mount with tilt up front feet.
Dimensions 3U (W x H x D) (430 X 133 X 500 mm) (16.93”x 5.24”x 19.69”)
Weight 8104, 26.00kgs (57.32lbs)
8105 and 8106, 29.00kgs (63.93lbs)
OPTIONS
Scanning Matrix 8 channel high voltage and high current switching matrix.
25
RUN TEST MODE (OMNIA 5, OMNIA 6)
DUT POWER
Voltage 0 –277 VAC Single Phase Unbalanced
(One Hot or Line conductor and One Neutral)
Current 15AAC max continuous
Voltage Display Range: 0.0 –277.0 VAC Full Scale
Resolution: 0.1 V
Accuracy: ± (1.5% of reading +0.2V), 30.0 –277.0VAC
Short Circuit Protection 23 AAC, Response Time < 3s
DELAY and DWELL TIMER SETTINGS
Delay time setting Range: 0.2 –999.9 seconds
Resolution: 0.1 second
Accuracy: ± (0.1% + 0.05 sec)
Dwell time setting Range: 0.1 –999.9 seconds (0 = Continuous)
Accuracy: ± (0.1% + 0.05 sec)
TRIP POINT SETTINGS
Voltage: Range: 0.0 –277.0 VAC
Volt-Hi Resolution: 0.1 V
Volt-LO Accuracy: ± (1.5% of setting + 0.2 V), 30.0 –277VAC
Current: Range: 0.0 –15.00 AAC
Amp-HI Resolution: 0.01 A
Amp-LO Accuracy: ± (2.0% of setting + 0.02A)
Watts: Range: 0 –4200 W
Power-HI Resolution: 1 W
Power-LO Accuracy: ± (5.0% of setting + 3W)
Power Factor: Range: 0.000 –1.000
PF-HI Resolution: 0.001
PF-LO Accuracy: ± (8% of setting + 2 Counts)
Leakage Current: Range: 0.00 –10.00 mA (0 = OFF)
Leak-HI Resolution: 0.01 mA
Leak-LO Accuracy: ± (2% of setting + 0.02mA)
Leakage current measuring resistor MD=2KΩ ± 1%
METERING
Voltmeter Range: 0.0 –277.0 VAC
Resolution: 0.1 V
Accuracy: ± (1.5% of reading + 0.2 V), 30.0 –277VAC
Ammeter Range: 0.0 –15.00 AAC
Resolution: 0.01 A
Accuracy: ± (2.0% of reading + 0.02A)
Wattmeter Range: 0 –4200 W
Resolution: 1 W
26
RUN TEST MODE (OMNIA 5, OMNIA 6)
Accuracy: ± (5% of reading + 3 W)
Power Factor Range: 0.000 –1.000
Resolution: 0.001
Accuracy: ± (8% of reading + 2 Counts)
Leakage Current Range: 0.00 –10.00 mA
Resolution: 0.01 mA
Accuracy: ± (2% of reading + 0.02 mA)
Leakage current measuring resistor MD = 2KΩ ± 1%
Timer display Range: 0.0 –999.9 seconds
Accuracy: ± (0.1% of reading + 0.05 seconds)
27
LINE LEAKAGE TEST MODE (OMNIA 6 Only)
DUT POWER
Voltage 0 –277 VAC
Current 15AAC max continuous
Voltage Display Range: 0.0 –277.0 VAC Full Scale
Resolution: 0.1 V
Accuracy: ± (1.5% of reading +0.2V), 30.0 –277.0VAC
Short Circuit Protection 23 AAC, Response Time <3s
LEAKAGE CURRENT
Current Display Range 1: 0.0 µA –999.9 µA
RMS or PEAK Resolution: 0.1 µA/step
Range 2: 1000 µA –6000 µA
Resolution: 1 µA/step
Accuracy RMS DC to 100 kHz ± (1.5% of reading + 3 counts)
>100k to 1 MHz ± 5% of reading, (10.0 µA –6000 µA)
Accuracy PEAK DC to 1 MH z ± (10% of reading + 2uA)
Measuring Device A UL544 Non Patient
B UL544 Patient
C UL2601-1, UL60601-1, IEC601-1
IEC60601-1 EN60601-1
D UL1563
E UL1950, UL3101, UL61010, IEC950,
IEC1010, IEC 60950, IEC61010, IEC60335-1,
IEC60990 Fig4-U2
H IEC60990 Fig5-U3
I IEC60990 Fig3-U1
MD A –D and H - I Accuracy: Resistance ± 1% Capacitance ± 5%
components
MD E components Accuracy: Resistance ± 0.1% Capacitance ± 1%
MD Voltage Limit Maximum 30V peak or 30VDC
HI-Limit: Range: 0 –6000 µA
Resolution 0.1µA
Accuracy: Same as Leakage Current Display Accuracy
LO-Limit: Range: 0 –6000 µA
Resolution 0.1µA
Accuracy: Same as Leakage Current Display Accuracy
Delay Timer: Range: 0, 1.0 –999.9 sec (0 = Continuous)
Resolution: 0.1 sec/step
Accuracy: ± (0.1% + 0.05 sec)
28
3.2. Instrument Controls
3.2.1. Front Panel Controls
1 2 3 4 5 6
ASSOCIATED
RESEARCH, INC.
7 8 9 10 11 12 13 14 15 16
1. GRAPHIC LCD: 320 X 240 Monographic LCD.
2. SOFT KEYS: Multifunction parameter selection keys. Keys used to select screens and
change parameters.
3. NUMERIC DATA ENTRY: Keys used to enter numeric data.
4. HIGH VOLTAGE ON INDICATOR: This indicator flashes to warn the operator that
high voltage is present at the high voltage terminal.
5. SCANNER STATUS LED’s: LED’s that indicate the status of the 8 H.V. and 8 G-Bond
channels on the internal scanner.
6. HIGH VOLTAGE OUTPUT JACK: Connector used to attach the High Voltage test
lead, adapter box high voltage lead, or test fixture high voltage lead to the instrument. The
connector is recessed for safety when not being used.
7. POWER SWITCH: Rocker style power switch with international ON ( | ) and OFF (0)
markings.
8. RESET BUTTON: Momentary contact switch used to reset the instrument. If a failure
condition occurs during a test, you will need to reset the system to shut off the alarm and
signal the system that you are aware of a failure condition. The reset button must be
pressed before you can proceed to the next test or change any of the set-up parameters.
This switch also serves as an abort signal to stop any test in progress controlled by the
Omnia.
29
1 2 3 4 5 6
ASSOCIATED
RESEARCH, INC.
7 8 9 10 11 12 13 14 15 16
9. TEST BUTTON: Momentary contact switch used to start tests. Press the green button to
activate the test that is set up in the test buffer shown on the display.
10. EXIT KEY: Key used to escape from parameter editing and returning to prior screens.
11. UP, DOWN, LEFT, AND RIGHT, ARROW KEYS: Keys used to scroll the highlighted
area or cursor, up and down, left and right. When more than 5 steps are programmed in a
test file, the left and right arrow keys will page through the screens of steps. The screens
where the paging function is available are as follows: Setup Tests, Perform Tests, Results
Summary, and Results
12. ENTER KEY: Key used to finalize parameter entries. The ENTER key may also be used
to scroll the highlighted area to different parameters in the parameter-setting screens.
13. SENSE+ JACK: Connector used to attach the positive Kelvin sense lead to the instrument.
14. CURRENT OUTPUT JACK: Connector used to attach the high current output lead,
adapter box high current lead or test fixture high current lead to the instrument. This
connection provides the output current for the ground bond and continuity.
15. RETURN OUTPUT JACK: Connector used to attach the Return test lead, or test fixture
return lead to the instrument. This connection provides the return current path for the high
voltage, ground bond and continuity current.
16. SENSE- JACK: Connector used to attach the negative Kelvin sense lead to the instrument.
30
3.2.2. Rear Panel Controls
12 3 4 5 6 7 8 9 10 11
12 13 14 15 16
1. HIGH VOLTAGE OUTPUT JACK: Connector used to attach the High Voltage test
lead, adapter box high voltage lead, or test fixture high voltage lead to the instrument. The
connector is recessed for safety when not being used.
2. CALIBRATION BUTTON: To put the instrument into the calibration mode, push this
button and turn on the power switch simultaneously.
3. SENSE+ JACK: Connector used to attach the positive Kelvin sense lead to the instrument.
4. SENSE- JACK: Connector used to attach the negative Kelvin sense lead to the instrument.
5. FUSE RECEPTACLE: To change the fuse, unplug the power (mains) cord and turn the
fuse receptacle counter-clockwise. The fuse compartment will be exposed. Please replace
the fuse with one of the proper rating.
6. SCANNER OUTPUTS: For connection of up to 2 External Scanning Matrixes.
7. CHASSIS GROUND (EARTH) TERMINAL: This terminal should be connected to a

good earth ground before operation.
8. REMOTE SIGNAL OUTPUT: 9-Pin D sub-miniature female connector for monitoring

PASS, FAIL, and PROCESSING output relay signals.
9. BUS INTERFACE: Standard connector for interconnection to the RS-232 Bus interface.
Optional IEEE 488 interface may be substituted for the RS-232.
31
12 3 4 5 6 7 8 9 10 11
12 13 14 15 16
10. REMOTE SIGNAL INPUT: 9-Pin D subminiature male connector, for remote control of
test, reset, and interlock functions, as well as remote program file selection.
11. THERMAL COOLING FANS: Thermally switched cooling fans.
12. CURRENT OUTPUT JACK: Connector used to attach the high current output lead,
adapter box high current lead or test fixture high current lead to the instrument. This
connection provides the output current for the ground bond and continuity.
13. RETURN OUTPUT JACK: Connector used to attach the Return test lead, or test fixture
return lead to the instrument. This connection provides the return current path for the high
voltage, ground bond and continuity current.
14. INPUT POWER RECEPTACLE: Standard IEC 320 connector for connection to a
standard NEMA style line power (mains) cord.
15. INPUT POWER SWITCH: Line voltage selection is set by the position of the switch. In
the up position it is set for 110-120 volt operation, in the down position it is set for 220-240
volt operation.
16. SCANNER OUTPUTS: Optional scanner matrix that provides 8 HV/Continuity/Return

connections and 8 Ground Bond connections. Please refer to the Options section of this
manual for additional connection information.
32
3.2.3. Additional Rear Panel Controls Models 8105 and 8106
1 2 3 4 5 6 7 8
1. DUT POWER INPUT CONNECTOR: This connector provides the Line and Neutral input
power connections on pin 1 and 2 respectively. An external single phase unbalanced AC
power supply with a single Hot or Line conductor should be connected here, to supply power
to the DUT while performing the leakage test. This input is rated for 0-277 volts 50/60 Hz.
2. L: This output terminal is where the LINE power connection from the adapter box is
plugged into the run test or line leakage test. Line power is supplied to the DUT during the
run test or line leakage test through this terminal and High Voltage is supplied to the DUT
through this terminal during the Dielectric Withstand or Insulation Resistance. This terminal
and the “N”Terminal are shorted together when Dielectric Withstand or Insulation
Resistance are being performed.
3. N: This output terminal is where the NEUTRAL power connection from the adapter box is
plugged into the run test or line leakage test. Line power is supplied to the DUT during the
run test or line leakage test through this terminal and High Voltage is supplied to the DUT
through this terminal during the Dielectric Withstand or Insulation Resistance. This terminal
and the “L”Terminal are shorted together when Dielectric Withstand or Insulation
Resistance are being performed.
4. CASE: This terminal is connected to the DUT case or dead metal and provides the return
for the Ground Bond, Dielectric Withstand, and Insulation Resistance tests. During a Run
test or Line Leakage test, this terminal is isolated from the test circuits.
5. GND: This terminal is where the Ground or Earth terminal from the adapter box is
connected.
33
1 2 3 4 5 6 7 8
6. PROBE HI: This terminal is an input to one side of the MD(measuring device) and will be
enabled during a line leakage test when ever Probe-HI has been selected at setup. This
terminal is provided for performing Enclosure leakage or Applied Part leakage tests. When
run tests and line leakage tests are not being performed, this terminal is isolated from the run
test and line leakage test circuits. This connector is disabled in 8105.
7. PROBE LO: This terminal is an input to one side of the MD(measuring device) and will be
enabled during a line leakage test when ever Probe-LO has been selected at setup. This
terminal is provided for performing Applied Part leakage tests and is always used in
conjunction with the Probe-HI terminal. When run tests and line leakage tests are not being
performed, this terminal is isolated from the run test and line leakage test circuits. This
connector is disabled in 8105.
8. EXTERNAL MEASURING DEVICE: This compartment contains an external

Measuring Device PCB. This device will enable during a line leakage test when the
“External”is selected from the Meas. Device soft key. The external measuring device
allows the operator to test to a standard that calls for a custom measuring device or easily
change the measuring device if the standard requirements change. The instrument is
provided with a 1k ohm resistor on the measuring device PCB. The PCB can easily be
reconfigured for a simple resistive component or a complex two-pole measuring device.
This board should always remain installed in both the 8105 and 8106 even though the
external measuring device is not used in any 8105 operation.
34
3.3. Quickstart
This quick start guide assumes the operator has some familiarity with automated Electrical
Safety testing.
Locate a suitable testing area and be sure you have read all safety instructions
WARNING for the operation of the instrument and suggestions on the test area set-up in
the Safety section. Locate a three prong grounded outlet. Be sure the outlet has been tested
for proper wiring before connecting the instrument to it.
Check to be sure that the correct input line voltage has been selected on the
CAUTION rear panel, either 115 volts AC or 230 volts AC. Connect the power-input
plug into its socket on the rear panel of the instrument. Connect the male end
of the plug to the outlet receptacle. Please be sure that the safety ground on the power line
cord is not defeated and that you are connecting to a grounded power source.
Turn on the POWER switch located on the lower left-hand side of the front panel. The Omnia
Information screen will appear with a message at the bottom indicating Press TEST to
Verification. You now have the option to press the TEST button and activate the Verification
Menu (Refer to the section 6. Instrument Verification). The option to activate the
Verification expires approximately 4 seconds after power-up. If you do not press the Test
button with in the 4-second window, the message at the bottom of the screen will change to
PRESS ANY KEY TO CONTINUE. This screen will remain on until any key is pressed. The
initialization screen will appear as follows:
If any of the parameters at the Power-On Screens have been altered from their original settings,
the sequence of initialization screens may not follow suite with what was described in the
previous paragraph. Please refer to the section 4.1 Setup System Menu for a description of
the Power-On Screen parameters.
35
After pressing any key, the Main Menus screen will be displayed. The Main Menu screen will
appear as follows:
Main Menu
Setup System
Setup Tests
Perform Tests
At the Main Menu screen, press the “Perform Tests”soft key. The Perform Tests screen will
now be displayed. The Perform Test screen will appear as follows:
Perform Tests
01 ACW Settings
Load File
1200V 10.00mA
1.0s 2.00mA
Single Step OFF
Fail Stop OFF
Results
File Name:NEW FILE
Move up Move down To initiate this

test, press the
Page up Page down TEST button.
The Omnia comes pre-loaded with one default test file which consists of a single step AC
withstand test loaded with the default parameters. The left side of the display shows the pre-
loaded program step and the parameters stored with in it. If this test is unacceptable for your
DUT then refer to the section 4.3 Setting Up a Test, for instructions on how to program tests
into the instrument.
If these test file parameters are acceptable then connect an appropriate set of test leads to the
device under test (DUT) or test fixture. Connect the return lead (Black) to the DUT or test
fixture followed by the high voltage output lead (Red). Make sure the safety ground of this
instrument is connected to a known good ground.
Refer to section 4.1.3 Hardware, Smart GFI, for an explanation of DUT grounding
configurations.
DO NOT TOUCH THE DEVICE UNDER TEST ONCE THE TEST HAS
WARNING
BEEN STARTED.
36
Remote Interlock
Omnia is equipped with a featured referred to as “Remote Interlock”. Remote Interlock is a
feature that utilizes a set of closed contacts to enable the instruments output. In other words, if
the Interlock contacts open, the output of the instrument will be disabled. Remote Interlock
could also be referred to as a remote system lockout, utilizing “Fail When Open”logic. If the
Interlock contacts are open and the Test button is pushed, a pop-up message will be displayed
on the screen for two seconds. The message will appear as follows:
Interlock is
Open
P l e a s e c h e c k t h e R e m o t e I n t e r l o c k
c o n n e c t i o n .
If the Interlock contacts are opened during a test, the pop-up message will be displayed and the
test will abort. The hardware and has been configured to provide the interlock connections on
pins 4 and 5 of the Remote Interface, Signal Input port. The instrument can still be used
without the external interlock device as long as the Interlock Connector (38075 provided with
unit) is plugged into the Remote Interface, Signal Input port. If there is nothing connected to
the Remote Interface, Signal Input port to provide a connection to the interlock, the instrument
will not perform tests.
Please check your connections to be sure they are making good contact. Clear the area of any
debris that may create a hazardous situation and ask any unnecessary personnel to leave the
area. To initiate the test, press the GREEN test button on the front panel. This is a momentary
button and does not need to be held in the pressed position during the test. The instrument will
then initiate the test presently loaded from the selected default file.
If the DUT passes the step, you will hear a short audible beep. If a failure occurs during a step,
you will hear a long audible alarm and the red failure indicator will light up. If the fail stop is set
to OFF then the next step in the sequence will begin (which in the case of the default file can not
happen because there is only one step). If a failure occurs during any step of the test sequence,
a continuous alarm will sound and the red indicator light in the Reset button will illuminate at
the end of the last step.
To stop the alarm you must press the illuminated RED button marked “RESET.” This will
silence the alarm, clear the red fail light, and reset the instrument for the next test. The RESET
button may also be used to quickly ABORT a test and cut off the power to the DUT.
When a test is being performed, a red lightning bolt indicator located in the lower right side of
the front panel will illuminate and flash until the test is finished. If the DUT passed the entire
test sequence, you will hear a brief beep indicating the DUT passed and that the tests are
complete.
37
4. Programming Instructions
4.1. Setup System Menu
From the Main Menu screen, press the “Setup System”soft key.
Main Menu
Setup System
Setup Tests
Perform Tests
The Setup System Menu will now be displayed. From the Setup System screen, six different
Hardware and Software controls may be accessed; Time and Date, Calibration Alert, Hardware,
Security, Power On Screens, and Print Format (Print Format will only be displayed if the printer
card option has been installed). Pressing the EXIT key at any time will return you to the Main
Menu. The Setup System screen will appear as follows:
Setup System
Time and Date
Calibration Alert
Hardware
Security
Power–On Screens
Print Format
38
4.1.1. Time and Date
From the System Setup screen, press the “Time and Date”soft key. The Time and Date setting
screen will now be displayed. From the Time and Date setting screen, four different parameters
may be accessed, Set Date, Set Time, Date Format and Time Format. The Time and Date
Setting screen will appear as follows:
Time and Date

Set Date 0 1/27/2001
Set Time 16:20: 45
Date Format m m/dd/yyyy
Time Format 24 hour
Set Date
From the Time and Date setting screen, highlight the Set Date parameter by using the up and
down arrow keys. The up and down arrow keys will toggle the highlighted area of the screen
between the Set Date and Set Time.
Within the Set Date parameter are three separate fields, month, day, and year. Using the left
and right arrow keys select the field within the date, you want to edit. Using the numeric
keypad enter the new number. Once you begin typing a new number, the parameter will blank
and the cursor will begin blinking. This indicates that the parameter is being edited. Once a
parameter is edited, it is necessary to complete the edit either by pressing the ENTER key to
accept the new number or the EXIT key to escape from the edit and return to the original
number.
Set Time
From the Time and Date setting screen, highlight the Set Time parameter by using the up or
between the Set Date and Set Time.
Within the Set Time parameter are three separate fields, hours, minutes, and seconds. The time
must be set using 24-hour Military time. Using the left and right arrow keys to select the field
within the time parameter you want to edit. Using the numeric keypad enter the new number.
Once you begin typing a new number, the parameter will blank and the cursor will begin
blinking. This indicates that the parameter is being edited. Once a parameter is edited, it is
necessary to complete the edit either by pressing the ENTER key to accept the new number or
the EXIT key to escape from the edit and return to the original number.
39
Date Format
From the Time and Date setting Screen, press the “Date Format”soft key. As the soft key is
pressed, the displayed date will toggle between two different date formats, yyyy/mm/dd or
mm/dd/yyyy.
Time Format
From the Time and Date setting Screen, press the “Time Format”soft key. As the soft key is
pressed, the time format will toggle between 12 hour and 24 hour modes. Although the time
format may be set to either 12 or 24-hour modes, the time must still be set using 24-hour
Military time.
4.1.2. Calibration Alert

Calibration Alert is a feature that will allow the instrument to give an advanced alert that the
calibration for the instrument is coming due. From the System Setup screen, press the
“Calibration Alert”soft key. The Cal. Alert setting screen will now be displayed. From the Cal.
Alert setting screen, three different parameters may be accessed, Cal Due, Alert Date, Cal.
Alert. The Cal. Alert setting screen also displays the date of the last performed calibration. The
Cal. Alert setting screen will appear as follows:
Cal. Alert
Cal. Date 01/01/2001
Cal. Due 01 /01/2002
Alert Date 01/01/2001
Cal. Alert OFF
Calibration Due Date

It is recommended that calibration should be performed at least once a year. It is recommended
that the Calibration Due date not bet set greater than one year from the Cal. Date displayed.
From the Cal. Alert setting screen, highlight the Cal. Due parameter by using the up or down
arrow keys. The up and down arrow keys will toggle the highlighted area of the screen between
the Cal Due and Alert Date.
Using the left and right arrow keys and the numeric keypad enter the Calibration Due date.
Press the ENTER key to finish.
Alert Date
The Alert date is like an alarm clock that will warn you in advance of the actual calibration due
date. After a calibration is performed, the Alert Date is automatically set 11 months after the
40
calibration date. For example, if the calibration is performed on 12/15/2001 the Alert Date will
automatically be set to 11/15/2002. Although this date is automatically written into the Alert
Date location, it may be manually overwritten to any advanced date desired.
At the Cal. Alert setting screen, highlight the Alert Date parameter by using the up or down
arrow keys. The up and down arrow keys will toggle the highlighted area of the screen between
the Cal Due and Alert Date.
Within the Alert Date parameter are three separate fields, month, day, and year. Using the left
and right arrow keys select the field within the date, you want to edit. Using the numeric
keypad enter the new number. Once you begin typing a new number, the parameter will blank
and the cursor will begin blinking. This indicates that the parameter is being edited. Once a
parameter is edited, it is necessary to complete the edit either by pressing the ENTER key to
accept the new number or the EXIT key to escape from the edit and return to the original
number.
The Calibration Alert Warning screen appears as follows:
Cal. Alert
Model Omnia 4, seri al number 1234567 is
due for Calibration o n 9/21/2000.
Please contact Asso ci ated Research Inc.
to arrange for cali br ation.
Associated Research I nc. Show this

13860 W. Laurel Dri ve screen again?
Lake Forest, IL 600 45-4545
U.S.A Yes
Phone: 1-847-367-40 77 Password

Toll Free 1-800-858 -8378
XXXXXXXXXX
Fax: 1-847-367-4080
email: info@asresea rc h.com
Web: www.asresearch .com
OK
At the Calibration Alert Warning screen there are three options, “Show this screen again?”,
Password and OK. “Show this screen again?”is asking if you would like to continue seeing the
Calibration Alert Warning screen every time you power up the instrument. You may turn this
screen “OFF”by toggling to the word “No”using the soft key next to this parameter. If the
instrument is password protected you will need to enter the password in order to turn off the
“Show this screen again”parameter. Selecting the “Show this screen again”parameter “OFF”
will disable the Calibration Alert function. Pressing the OK soft key will exit the Calibration
Alert Warning screen and go to the standard introduction screen.
Calibration Alert On/Off

From the Cal. Alert setting screen, you may turn the Calibration Alert function ON and OFF by
pressing the “Cal. Alert”soft key. If the “Show this screen again?”function has been turned
“OFF”at the Calibration Alert Warning screen, this parameter will automatically be set to
“OFF”. Turning this parameter “ON”will activate the Cal Alert function and when the date
41
matches the Alert Date, the instrument will display the Calibration Alert warning screen upon
power up.
4.1.3. Hardware
From the System Setup screen, press the “Hardware”soft key. The Hardware setting screen
will now be displayed. From the Hardware setting screen, five different parameters may be
accessed: Alarm Volume, LCD Contrast, GPIB Address, Smart GFI, and PLC Remote. The
Hardware setting screen will appear as follows:
Hardware
Alarm Volume 5
LCD Contrast 6
GPIB Address 22
Smart GFI OFF
PLC Remote OFF
DUT-HV Setup O N
Alarm Volume
From the Hardware setting screen, highlight the Alarm Volume parameter by using the up or
between the Alarm Volume, LCD Contrast and GPIB Address.
Use the numeric keypad to set the Volume of the alarm in the instrument. Enter a number
between 0 and 9, 0 being the volume is off and 9 being the loudest setting. After the number is
entered, a momentary alarm chirp will occur to indicate the volume of the new setting.
LCD Contrast
From the Hardware setting screen, highlight the LCD Contrast parameter by using the up or
Using the up and down arrow keys and the numeric keypad set the Contrast of the display.
Enter a number between 0 and 9, 0 being the lightest color of displayed characters and 9 being
the darkest color of displayed characters. After the number is entered, the display will
automatically adjust to the new display setting.
GPIB Address
From the Hardware setting screen, highlight the GPIB Address parameter by using the up or
42
Use the numeric keypad to select the GPIB Address number between 0 and 30. Finish by
pressing the ENTER key.
Smart GFI (Ground Fault Interrupt)

The High Voltage power supply of the instrument is internally referenced to earth ground. The
leakage current measuring circuits monitor only currents that flow through the Return lead.
Therefore, the possibility exists for current to flow directly from the High Voltage output to
earth ground that typically would not be monitored.
GFI is a circuit that monitors the current between the High Voltage output and earth ground.
The GFI's main purpose is to protect the operator from prolonged exposure to High Voltage in
the case of an accidental contact with the High Voltage lead and earth ground. If the operator
accidentally touches the High Voltage lead and earth ground, the High Voltage will be shut off
immediately and the test aborted. If the GFI threshold is exceeded, the display will indicate a
GFI Fail.
Smart GFI allows the user to automatically configure the instruments return configuration.
When the Return lead is earth grounded, the GFI circuit is disabled and the instrument operates
in a grounded return mode of operation. Grounded Return allows the user to perform tests on
devices that have their chassis earth grounded by the test fixture or test environment. The
standard configuration of Omnia is a floating return connection that is not directly connected to
Earth ground. The standard configuration allows monitoring of very low level leakage current
without internal or external stray earth ground leakage currents being measured and thereby
causing errors in the reading. Grounding the return will create some amount of leakage current
that is proportional to the High Voltage output and can cause small amounts of error depending
on the test voltage and physical environment.
From the Hardware setting screen, you may turn the GFI ON and OFF by pressing the “Smart
GFI”soft key. Selecting the Smart GFI = “OFF”, will only disable the ground current failure
detectors. It does not disable the capability to externally earth ground the return lead.
PLC Remote
From the Hardware setting screen, you may turn the PLC remote ON and OFF by pressing the
“PLC Remote”soft key. Refer to the section 7. Connection of Remote I/O for details.
If you attempt to start a test from the front panel Test button and the PLC remote function is
turned “ON”, a pop-up message will be displayed. The pop-up message will appear as follows:
PLC remote
Control is ON
F r o n t p a n e l T E S T b u t t o n i s
d i s a b l e d .
43
DUT-HV Setup (8105 and 8106)
The DUT-HV selection activates an additional parameter in the AC Withstand, DC Withstand
and IR Tests parameter screens. The additional parameter is called “DUT Output”and its
function is to control the high voltage relay at the DUT output.
When the DUT Output parameter is selected ON during an AC Withstand, DC Withstand, or IR

test, high voltage will be present at the DUT outputs as well as the front and rear panel HV
connectors. When the DUT Output parameter is selected OFF, no high voltage will be present
at the DUT connectors, only the front and rear panel HV connectors will have high voltage.
From the Hardware setting screen, you may turn the DUT-HV parameter selection ON and
OFF by pressing the “DUT-HV Setup”soft key. Selecting the DUT-HV = “OFF”, will prevent
the parameter from appearing on the AC Withstand, DC Withstand, and IR test parameter-
setting screens.
Please refer to section 4.4 Test Parameters for additional parameter information and screen
appearance.
44
4.1.4. Security
From the System Setup screen, press the “Security”soft key. One of two possible Security
screens will be displayed. The Security screens appear as follows:
Security Security
Create Password
Security OFF Password XXXXXXXXXX
File Recall OFF
Initially, the instrument will not have a password enabled and the Security setting screen will
appear (screen on the left, refer to the above illustrations). You may create a password from
this screen so that all security functions will require a password to access. From the Security
settings screen, three different parameters may be accessed, Create Password, Security and File
Recall.
If a password has already been created then the Security password screen (screen on the right)
will appear and typing in the correct password will be required to access the Security setting
screen. From the password protected Security settings screen, three different parameters may
be accessed, Change Password, Security and File Recall. The Security setting screen that will
appear after a password has been created and entered correctly, will appear as follows:
Security
Change Password
Security OFF
File Recall OFF
45
Create Password
From the initial Security setting screen, you may create a password by pressing the “Create
Password”soft key. Press the “Create Password”soft key, the Password setting screen will
now be displayed. The Password setting screen will appear as follows:
Password
New Password
XXXXXXXXXX
Confirm Password
XXXXXXXXXX
You may now type in the new password using the numeric keypad, press the Enter key to
accept the new password or press the exit key to escape. After you type in your new password,
you will be required to confirm your new password by typing it again into the “Confirm
Password”field. Press the Enter key to confirm the new password or press the EXIT key to
escape.
Change Password
From the Security setting screen, you may change the security password by pressing the
“Change Password”soft key. Once you press the “Change Password”soft key the Password
setting screen will appear.
Security
From the Security setting screen, you may turn the Security function ON and OFF by pressing
the “Security”soft key. Selecting security “ON”restricts access to parameter settings. The
level of security is determined by the File Recall function.
Whenever security is selected “ON”, Single Step and Fail Stop soft keys will be disabled at the
Perform Test screen.
Whenever security is enabled, you may only start at Test file at Test step 1.
File Recall
File Recall is a sub-function of the security setting. In order for the File Recall function to
work, the Security must first be turned “ON”. From the Security setting screen, you may turn
the File Recall function ON and OFF by pressing the “File Recall”soft key. Selecting the File
Recall “ON”will allow the user to access all available test files but still restricts access to file
editing capability. Selecting the file recall “OFF”will allow the user to only run the currently
loaded test file.
46
Disabling the password
To disable the password simply change the password to “0”. After the password is reset to “0”
all security functions may be access without the use of a password.
Forgotten Password
If you have forgotten your password you may access all security functions by typing in the
number “8000”into the password field. The old password can not be recovered. A new
password should be entered or enter “0”to disable the password.
4.1.5. Power-On Screen

The Power-On screen allows you to select the screen(s) that will be displayed when the
instrument is first powered up. From the System Setup screen, press the “Power-On Screens”
soft key. The Power-On screen will now be displayed. The Power-On screen will appear as
follows:
Power –On
Verification OFF
Omnia Info P a u s e
Main Menu ON
From the Power-On screen, three different parameters may be accessed, Verification, Omnia
Info and Main Menu.
Verification
Setting this to ON will allow you to run instrument verification from the Omnia Information
screen. Toggling this to OFF will disable the ability to run Instrument Verification. Setting this
to OFF will also disable the words “Press TEST to Verification”from appearing on the Omnia
Information screen.
Omnia Info
The Omnia Information screen is the very first screen to appear when the instrument is powered
up. You have the option to PAUSE the instrument at this screen after power up or
CONTINUE through to the next screen after the Information screen is displayed for four
seconds. The option to PAUSE or CONTINUE may be selected by pressing the Omnia Info
soft key. When PAUSE is selected the words “Press any key to continue“will appear at the
bottom of the Omnia Information screen.
47
Main Menu
When the Main Menu parameter is ON, the first display to appear after the Omnia Information
screen is the Main Menu. When the Main Menu parameter is OFF the first display to appear
after the Omnia Information screen is the Perform Test screen.
Configure Omnia to go Directly to the Perform Test screen

Set the Verification selection to OFF, set Omnia Info to CONTINUE, and set the Main Menu
selection to OFF. Now when the instrument is powered on it will go directly to the Perform
Test screen.
4.1.6. Print Format

Refer to section 8 Options for Print Format functions.
4.2. Setup Tests Menu

From the Main Menu screen, press the soft key “Setup Tests”.
Main Menu
Setup System
Setup Tests
Perform Tests
The Setup Tests Menu will now be displayed. From the Setup Tests screen, six different
software controls may be accessed: Add, Edit, Delete, Prompt, File, and Fail Stop. The Setup
Tests screen will appear as follows:
Setup Tests
01 Add
Edit
Delete
Prompt
File
Fail S top OFF
Move up Move down Press ENTER to

Page up Page down Perform Tes ts.
The Setup Tests screen is the central starting point for programming tests into the instrument.
From this screen, test parameters are entered and edited, and the order of the test steps are
48
arranged and then stored to test files. The Omnia is capable of performing a 30 step sequential
test from a single test file.
The Setup Tests screen is separated into two main sections. The left half of the screen lists the
steps and the parameters contained within each step. The right half of the screen contains the
soft key menu. When more than 5 steps are programmed in a test file, the left and right arrow
keys will page through the screens of steps. Individual steps may be scrolled to using the up
and down arrow keys.
4.2.1. Add
From the Setup Tests screen, press the “Add”soft key. The Setup Tests, Test selection screen
will now be displayed. From the this screen you may select what type of test you wish to add to
a test sequence, AC Withstand, DC Withstand, Insulation Resistance and Continuity. The Test
selection screen will appear as follows:
Setup Tests
01
AC Withstand
DC Withstand
Insulation
Resistance
Continuity
File Name:NEW FILE
Select a test type.
For a detailed description of how to set up a test sequence, please refer to section 4.3 Setting
Up a Test.
For a detailed description of the screens and parameters that are associated with Test selection
softkeys on this screen please refer to section 4.4 Test Parameters.
4.2.2. Edit
From the Setup Tests screen, use the up, down arrow keys, and scroll the highlighted area to
the step you wish to edit. Press the “Edit”soft key. The Parameter-setting screen, for the type
of test that is in that location will now be displayed. The parameters for the test may now be
edited.
For a detailed description of the screens and parameters that are associated with the Edit
softkey on this screen please refer to section 4.4 Test Parameters.
4.2.3. Delete
From the Setup Tests screen, use the up, down arrow keys, and scroll the highlighted area to
the step you wish to delete. Pressing the “Delete”soft key will remove the step.
49
4.2.4. Prompt
The prompt function allows you to insert a short line of text in a step. The prompt will appear
on the screen before the step is initiated and remain on the screen until the TEST button is
pressed. After the TEST button is pressed, the Prompt will clear and the step will initialize.
Use the up, down arrow keys to scroll the highlighted area to the step where you would like to
insert the text prompt and press the “Prompt”soft key. The Prompt screen will now be
displayed. The Prompt screen will appear as follows:
Prompt
PLEASE TURN ON THE POW ER SWITCH
OF THE DUT.
A B C DEFGHI
J K L MNOPQR
S T U VWXYZ
. - _ ~ Space
Select
Use arrow keys and alp habetic chart to

Create message. Use fr ont panel keys for
numeric entry.
To enter a text prompt, use the arrow keys to scroll the highlighted area to the character (or
enter a number from the numeric keypad) you wish to use and then press the “Select”soft key.
At the text prompt edit, the letter or symbol will be inserted at the point where the cursor is
flashing. The cursor will then increment to the next position and wait for an additional
character insertion. If you make a mistake or want to change the character, press the backspace
key in the numeric keypad. The cursor will decrement and erase the character. The maximum
number of characters that may be used in a prompt is 32. When you have finished editing the
prompt press the ENTER key. After a prompt is inserted in a step, a “P”will appear within the
step parameters below the step number.
4.2.5. File
From the Setup Tests screen, press the “File”soft key. The File Setup screen will now be
displayed. From the File Setup screen, five different file-handling controls may be accessed:
New File, Save, Save As, Delete, and Load. The File Setup screen will appear as follows:
File Setup
New File
FILES
S ave
1 ARITEST1
Save As
Delete
Load
50
New File
From the File Setup screen, press the “New File”soft key. The Create File screen will now be
displayed. For a detailed description of creating a new file, refer to the section 4.3 Setting Up
a Test. The Create File screen will appear as follows:
Create File
File Name:
NEW FI LE
A B C DEFGHI
J K L MNOPQR
S T U VWXYZ
. - _ ~ Space
Select
Use arrow keys and alp habetic chart to

Create file name. Use front panel keys
for numeric entry.
Save
To save a file with its current name press the “Save”soft key from the File Setup screen.
Save As
To save an edited file without overwriting the original or to give a file a new name, press the
“Save As”soft key from the File Setup screen. The Create File screen will now be displayed.
For a detailed description of creating a new file, refer to the section 4.3 Setting Up a Test.
Delete
To delete a file, use the up, down arrow keys and scroll the highlighted area to the file you wish
to delete and press the “Delete”soft key. A warning will appear on the screen asking if you
want to delete the file. Press the ENTER key to complete the deletion or press the EXIT key to
escape.
Load
To load a test file, use the up, down arrow keys and scroll the highlighted area to the file you
wish to load and press the “Load”soft key.
4.2.6. Fail Stop

Fail Stop is a function that will stop a sequence of tests at the step if a failure occurs. If this
function is turned off, the sequence of tests will continue to the end of the sequence regardless
of whether or not a failure has occurred. If the Fail stop is off and a failure occurs during the
test sequence, the RESET button will light and a short alarm will sound but the sequence will
continue to the end. At the end of the test sequence, the RESET button will light and alarm will
sound indicating failure during the sequence. Pressing the RESET button will silence the alarm
and reset the instrument. Turn the Fail Stop function ON and OFF by pressing the “Fail Stop”
soft key. Fail stop is a parameter that is stored within the test file but may also be turned ON
and OFF temporarily from the Perform Tests screen. If security is enabled you may not turn
Fail Stop ON and OFF using the “Fail Stop”soft key. Fail Stop automatically defaults to the
setting stored in the file when security is activated.
51
Fail Stop with Run and Line Leakage tests
Associated Research recommends performing a Hipot test, with the Fail Stop “ON”, prior to
performing a Run Test or Line Leakage test. Performing a Hipot test first can detect if a DUT
is shorted line to ground before applying line power to it.
52
4.3. Setting Up a Test (Refer to FIG.1).
Upon power up, Omnia will initialize with the test file that was last used before power down.
New instruments come loaded with one default file, this is the file that the instrument will “Boot
Up”with until it is changed.
1. From the Setup Tests screen, press the “File”soft key, The File Setup screen will now be
displayed.
2. From the File Setup screen, press the soft key “New File”. The Create File screen will now
be displayed.
3. The Create File screen is separated into three main sections, Alphabet and Symbols, File
Name edit, and soft key menu.
4. From the Create File screen, you must give your new test file a name. The file name can be a
maximum of ten characters in length and may use any combination of the character set plus
numbers. To name your file, use the arrow keys to scroll the highlighted area to the character
(or enter a number from the numeric keypad) you wish to use and then press the “Select”soft
key. At the File Name edit, the letter or symbol will be inserted at the point where the cursor
is flashing. The cursor will then increment to the next position and wait for an additional
character insertion. If you make a mistake or want to change the character, press the
backspace key in the numeric keypad. The cursor will decrement and erase the character.
When you have finished editing the file name press the ENTER key.
5. From the Setup Tests screen, press the “Add”soft key. The Setup Test, Tests Selection
screen will now be displayed. From this screen you may choose what type of test to perform,
AC Withstand, DC Withstand, Insulation Resistance, or Continuity.
6. From the Setup Test, Test Selection screen, press the soft key next to the type of test you
wish to add to the test sequence (for the example in FIG.1 AC Withstand will be selected).
The Parameter-setting screen for the type of test you have chosen will now be displayed.
7. From Parameter-setting screen, you may set your own custom set of parameters for the test
or choose the defaults from the soft key menu. All of the individual parameters for the test
may be accessed using the up and down arrow keys, and the ENTER key. As the arrow keys
are pressed, the highlighted area will scroll to the different parameters. The ENTER key may
also be used to scroll to the different parameters. At the bottom of the screen is the Scanner
Setup parameter, for a detailed explanation of how this feature works, refer to the Scanner
Connections section.
8. Scroll to a parameter you wish to edit. The parameter that is highlighted may now be edited.
(Refer to Section 4.3. of this manual for complete parameter entry instructions.) Enter a new
number via the numeric keypad. Once you begin typing a new number, the parameter will
blank and the cursor will begin blinking. This indicates that the parameter is being edited.
Once a parameter is edited, it is necessary to complete the edit either by pressing the ENTER
key to accept the new number or the EXIT key to escape from the edit and return to the
original number.
9. Press the EXIT key to “Add”this test to the sequence of tests. The Setup Tests screen will
now be displayed which will include the parameters for the test you have just added.
53
FIG.1
Setup Tests Setup Tests

01ACW Settings 01 AC Withstand
Add
1200V 10.00mA
1.0s 0.00mA
Edit DC Withstand
Delete
Press the Add key. Insulation
Resistance
Section 4.3, Step 5

Prompt Continuity
File
File Name:DEFAULT Fail Stop OFF File Name:NEW FILE
Move up Move down Press ENTER to Select a test type.

Page up Page down Perform Tests.
Press the File key. Press the AC Withstand.

Section 4.3, Step 1 Section 4.3, Step 6
File Setup AC Withstand

New File Voltage xxxxV Frequency 60Hz
HI-Limit T xx.xxmA
FILES
Save LO-Limit T xx.xxmA Arc Detect OFF
1 ARITEST1
Ramp UP xxx.xs
Save As Dwell Time xxx.xs Continuity OFF
Ramp Down xxx.xs
Delete Arc Sense xx Scanner Channel
Output Select
HI-Limit R xx.xxmA
Load LO-Limit R xx.xxmA
Range:
Voltage Defaults
0-5000
Scanner 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8
Setup L L H H H H L L H H L L O O O O
Press the New file key.

Press EXIT
Section 4.3, Step 2
Section 4.3, Step 9
Create File Setup Tests

01 ACW Settings Add
1200V 10.00mA
1.0s 0.00mA
File Name: 02 Edit
NEW FILE
Delete
Prompt
A B C DEFGHI
J K L MNOPQR File
S T U VWXYZ
. - _ ~ Space File Name:NEW FILE Fail Stop OFF
Select
Use arrow keys and alphabetic chart to Move up Move down Press ENTER to
Create file name. Use front panel keys Page up Page down Perform Tests.
for numeric entry.
Press the File key.

Press ENTER. Section 4.3, Step 10
Section 4.3, Step 4
Setup Tests File Setup

01 New File
Add
FILES
Edit Save
1 ARITEST1
2 NEW FILE
Delete Save As
Prompt Delete
File Load
File Name:NEW FILE Fail Stop OFF
Move up Move down Press ENTER to

Page up Page down Perform Tests.
Pressing the Save key stores the File with the

name you created
54
10. At this point, you may add more tests to the sequence, insert tests, insert prompts, perform
the test sequence, or store the sequence to the file name you created.
Adding More tests to the Sequence

To add more tests to the sequence simply repeat steps 5-10 of this section.
Performing a Test from the Setup Tests screen

To perform the test you have just created press the ENTER key. The Perform Tests screen will
now be displayed along with a pop-up message that appears as follows:
Warning, file
changes have
not been saved
P r e s s E n t e r t o s a v e f i l e .
P r e s s E x i t t o c o n t i n u e .
Pressing the Enter key will store the file with the file name you gave it and go to the Perform
Test screen. You may now perform a test (Refer to section 5.2 on Performing Tests).
Pressing the Exit key will return you to the Main Menu and not save the file. Even though the
file has not been saved, the file will be retained in RAM until another file is loaded or created, or
until the instrument is powered down.
Saving the Test File

From the Setup Tests screen, press the “File”soft key. The File Setup screen will now be
displayed.
From the File Setup screen, press the “Save”soft key. The file will save to the name you
created and the Setup Tests screen will now be displayed with the new file loaded.
The instrument is now ready to perform tests with the new file. You may now press the
ENTER key to go to the Perform Tests screen or press the EXIT key to return to the Main
Menu.
Inserting Tests
From the Setup Tests screen, scroll the highlighted area to the step in the sequence where you
would like to insert a test.
Press the “Add”soft key. The highlighted area will blank and the test that was originally at this
step in the sequence, as well as all of following steps, will increment. Simultaneously, Setup
Test, Tests Selection screen will now be displayed.
55
You may now select the type of test you wish to insert from the soft key menu.
Inserting a Text Prompt

Refer to section 4.2.4 Prompt for a detailed description of inserting text prompts.
56
4.4. Test Parameters
From the Setup Tests screen, press the “Add”soft key. The Setup Test, Tests Selection screen
will now be displayed. From this screen, you may choose what type of test to perform, AC
Withstand, DC Withstand, Insulation Resistance, or Continuity. If you have model 8105, you
will also have the Run Test selection. If you have model 8106, you will have Line leakage and
Run Test selections. The Setup Test, Tests Selection screen will appear as follows:
Setup Tests
01
AC Withstand
DC Withstand
Insulation
Resistance
Continuity
Line Leakage
File Name:NEW FILE Run Test
Select a test type.
Test Parameter Notes

• Once you begin typing a new number, the parameter will blank and the cursor will begin
blinking. This indicates that the parameter is being edited. Once a parameter is edited, it is
necessary to complete the edit either by pressing the ENTER key to accept the new number
or the EXIT key to escape from the edit and return to the original number. The one exception
to this rule is the scanner parameter. The scanner parameter will not blank when being edited.
• When the ENTER key is pressed to accept a parameter change the highlighted area of the
display will automatically move to the next parameter.
• The lower left corner of the Test parameter-setting screen displays the “Range”of the
parameter that is highlighted. Use this as a guide when setting your parameters.
• All softkey functions in the parameter menus toggle between two conditions and no data entry
is required i.e. The frequency softkey toggles between 50Hz and 60Hz.
• Pressing the “Default”soft key will set all of the test parameters to the preset default
parameters. Once the default soft key is pressed, it is necessary to complete the edit either by
pressing the ENTER key to accept the parameter overwrite or the EXIT key to escape from
the edit and return to the original values. Refer to section 4.4.7 for the preset default
parameters.
• When multiple screens of steps are programmed into a file, you may use the left and right
arrow keys to scroll through pages of screens.
57
4.4.1. Description of Test Parameters
Voltage: The Voltage that is applied to the High Voltage and Return terminals or the Current
and Return terminals during a test.
Current: The Current that is applied between the Current and Return lead during a ground
bond test.
Current-HI: The maximum allowable current-flow through the DUT that when exceeded
triggers a failure.
Current-LO: The minimum allowable current-flow through the DUT that when not exceeded
triggers a failure.
Voltage-HI: The maximum voltage allowable at the DUT Power Input Terminal that when
exceeded triggers a failure. This trip limit is not affected by the delay time in Run or LLT
mode.
Voltage-LO: The minimum voltage allowable at the DUT Power Input Terminal that when not
exceeded triggers a failure. This trip limit is not affected by the delay time in Run or LLT mode.
Leakage-HI: The maximum leakage current allowable through the measuring device that when
exceeded triggers a failure.
Leakage-LO: The minimum leakage current allowable through the measuring device that when
not exceeded triggers a failure.
Power-HI: The maximum allowable power consumption by the DUT that when exceeded
triggers a failure.
Power-LO: The minimum allowable power consumption by the DUT that when not exceeded
triggers a failure.
PF-HI: The maximum allowable Power Factor that when exceeded triggers a failure.
PF-HI: The minimum allowable Power Factor that when not exceeded triggers a failure.
HI-Limit: A maximum threshold set point that when exceeded triggers a failure. A “T”or an
“R”designator is shown in AC withstand parameters and means, “T”total current or “R”real
current.
58
LO-Limit: A minimum threshold set point that when not exceeded triggers a failure. A “T”or
an “R”designator is shown in AC withstand parameters and means, “T”total current or “R”
real current.
Ramp Up: A length of time that is allowed for the test voltage to climb from 0 to the voltage
set point.
Dwell Time: A length of time that is allowed for all programmed parameters set to be applied.
Delay Time: A length of time needed to ensure the DUT has reached proper operating
conditions, during which the HI and LO limit detectors are disabled. The over current judgment
is activated at the end of the Delay Time. The instrument will not indicate that an over current
limit has been exceeded until the Delay Time period has expired.
Ramp Down: A length of time that is allowed for the test voltage to decay from set point to 0.
Arc Sense: During hipot testing some low current arcing may be allowable. Arc sense is a
maximum allowable threshold for arcing.
Arc Detect: If the Arc Fail mode is set to “ON”, the program will indicate an arc failure when
the arc current is exceeds the setting. Arc Detect may be selected “ON or “OFF”using a
softkey.
Ramp-HI: Ramp-HI will allow current higher than the normal HI-Limit current setting of the
DC Withstand Voltage test, during the Ramp-Up time period, to avoid false failure due to
charging current. Ramp-HI may be selected “ON or “OFF”using a softkey.
Charge–LO: The Charge-LO function is used to check if the cables are connected properly at
the beginning of a test. This function is only available in DC Withstand and Insulation
resistance testing. A description of how to set up this parameter is given in the 4.4.3. DC
Withstand and 4.4.4. Insulation Resistance parameter sections of this manual.
Offset: This function allows the instrument to compensate for lead and test fixture resistance
during a ground bond or continuity test. A description of how to set up this parameter is given
in the 4.4.5.Continuity and 4.4.6. Ground Bond parameter sections of this manual.
Frequency: This parameter is available in AC tests only and is selectable using a softkey
between 50 and 60Hz.
Continuity in ACW and DCW: This function checks for a connection between the current
and return lead. This is a basic DC continuity check and will not disclose a continuity value.
Continuity may be selected “ON or “OFF”using a softkey in the ACW and DCW parameters.
59
Scanner Setup: (This parameter will only be seen on units equipped with a scanner). This
multiple parameter allows for set up of the scanner channels. The individual scanner channel
parameters may be accessed using the arrow keys and the state of the scanner channel may be
selected using a softkey labeled “Scanner Channel Output Select”. The three different
selectable scanner states are L (scanner channel set to the return point), H (scanner set to the
high voltage point) and O (OFF).
Defaults: Pressing this softkey will default all of the test parameters to the predetermined
default values (refer to section 4.4.7 default parameters). Once the default soft key is pressed,
it is necessary to complete the edit either by pressing the ENTER key to accept the parameter
overwrite or the EXIT key to escape from the edit and return to the original values.
DUT Output (8105 and 8106): This function enables or disables high voltage at the DUT
outputs during an AC Withstand, DC Withstand, or IR test. DUT Output parameter will only
be present if the DUT-HV Setup is selected ON at the Hardware screen. The DUT Output
parameter will appear on the AC Withstand, DC Withstand, or IR test parameter screens as
follows:
AC Withstand
Voltage xxxxV Frequency 60Hz
HI-Limit T xx.xxmA
LO-Limit T xx.xxmA Arc Detect OFF
Ramp UP xxx.xs
Dwell Time xxx.xs Continuity OFF

Ramp Down xxx.xs
Arc Sense xx Scanner Channel
DUT Output ON Output Select
HI-Limit R xx.xxmA
LO-Limit R xx.xxmA DUT Output ON
Range:
Voltage Defaults
0-5000
Scanner 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8
60
4.4.2. AC Withstand
From the Setup Tests, Tests Selection screen, press the “AC Withstand”soft key. The AC
Withstand parameter-setting screen will now be displayed. The AC Withstand parameter-
setting screen will appear as follows:
AC Withstand
Voltage xxxxV Frequency 60Hz
HI-Limit T xx.xxmA
LO-Limit T xx.xxmA Arc Detect OFF
Ramp UP xxx.xs
Ramp Down xxx.xs
Arc Sense xx Scanner Channel
Output Select
HI-Limit R xx.xxmA
LO-Limit R xx.xxmA
Range:
Voltage Defaults
0-5000
Sca nn er 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8
From the AC Withstand setting screen the following parameters may be controlled: Voltage,
HI-Limit T, LO-Limit T, Ramp Up, Dwell Time, Ramp Down, Arc Sense, HI-Limit R, LO-
Limit R, Frequency, Arc Detect (ON/OFF), Continuity selection (DC continuity or OFF),
Scanner Channel Output Select, and Defaults.
An additional parameter exclusive for 8105 and 8106 is DUT Output (DUT Output parameter
will only be present if the DUT-HV Setup is selected ON at the Hardware screen).
4.4.3. DC Withstand
From the Setup Tests, Tests Selection screen, press the “DC Withstand”soft key. The DC
Withstand parameter-setting screen will now be displayed. The DC Withstand parameter-
setting screen will appear as follows:
DC Withstand
Voltage xxxxV Ramp-HI OFF
HI-Limit xx.xxmA
LO-Limit xx.xxmA Arc Detect OFF
Ramp UP xxx.xs

Ramp Down xxx.xs
Charge LO xxx.xuA Scanner Channel
Output Select
Arc Sense xx
Press TEST For

Automatic Charge-LO
Setting.
RAN G E: Defaults
HI- L imit Total
0.0 0 – 20.00mA
Sca n ner 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8
Set u p L L H H H H L L H H L L O O O O
From the DC Withstand setting screen the following parameters may be controlled: Voltage,
HI-Limit, LO- Limit, Ramp Up, Dwell Time, Ramp Down, Charge-LO, Arc Sense, Ramp-HI,
Arc Detect (ON/OFF), Continuity (DC continuity or OFF), Scanner Channel Output Select,
and Defaults.
61
Charge–LO
The Charge-LO function is used to check if the cables are connected properly at the beginning
of a test. A capacitive DUT will draw charging current on the DC Withstand Voltage test when
the Output is activated. If the charging current is lower than the setting, the test cables may not
be connected properly. The instrument can set the Charge-LO parameter manually or
automatically. To manually set the Charge-LO current, use the up and down arrow keys or the
ENTER key and scroll the highlighted area to the Charge-LO current parameter. Enter the new
Charge-LO current via the numeric keypad and then press the ENTER key to accept the new
parameter or press the EXIT key to escape from the edit. To automatically set the Charge-LO
current, use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Charge-LO current parameter. Set the voltage and ramp times to the values that will be
used on the DUT and connect the test cables or test fixture between the instrument and DUT.
Press the test button.
WARNING Please be aware that the program will activate high voltage on the output
connector while the Test button is pressed.
The program will read the charging current of DUT and set the Charge-LO current at
approximately one half (1/2) of the reading. The highlighted parameter field will briefly show
the word “READING”and then the display the new value. The new value is automatically
updated in the field and does not allow an escape to the original value or require that the
ENTER key be used to accept the new parameter.
Ramp-HI
The Ramp-HI function is active during the Ramp period only. Ramp-HI will allow current
higher than the normal HI-Limit current setting of the DC Withstand Voltage test to avoid false
failure due to charging current.
62
4.4.4. Insulation Resistance
From the Setup Tests, Tests Selection screen, press the “Insulation Resistance”soft key. The
Insulation Resistance parameter-setting screen will now be displayed. The Insulation Resistance
parameter-setting screen will appear as follows:
IR Test
Vol ta ge xxxxV
HI- Li mit xxxxMΩ
LO- Li mit xxxxMΩ
Ramp UP xxx.xs
Del ay Time xxx.xs
Ramp Down xxx.xs
Cha rg e-LO xxx.xuA Scanner Channel
Output Select
Press TEST For

Autom at ic Charge-L O
set ti ng.
RAN GE: Defaul ts

HI- Limit
1 – 9999MΩ
Sca nn er 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8
Set up L L H H H H L L H H L L O O O O
From the Insulation Resistance parameter-setting screen the following parameters may be
controlled: Voltage, HI-Limit, LO- Limit, Ramp Up, Delay Time, Ramp Down, Charge-LO,
Scanner Channel Output Select, and Defaults.
Charge–LO
The Charge-LO function is used to check if the cables are connected properly at the beginning
of a test. A capacitive DUT will draw charging current on the DC Withstand Voltage test when
the Output is activated. If the charging current is lower than the setting, the test cables may not
be connected properly. The instrument can set the Charge-LO parameter manually or
automatically. To manually set the Charge-LO current, use the up and down arrow keys or the
ENTER key and scroll the highlighted area to the Charge-LO current parameter. Enter the new
Charge-LO current via the numeric keypad and then press the ENTER key to accept the new
parameter or press the EXIT key to escape from the edit. To automatically set the Charge-LO
current, use the up and down arrow keys or the ENTER key and scroll the highlighted area to
the Charge-LO current parameter. Make sure that the voltage and ramp times are set to the
values that will be used on the DUT and connect the test cables or test fixture between the
instrument and DUT. Press the test button.
WARNING Please be aware that the program will activate high voltage on the output
connector while the Test button is pressed.
The program will read the charging current of DUT and set the Charge-LO current at
approximately one half (1/2) of the reading. The highlighted parameter field will briefly show
the word “READING”and then the display the new value. The new value is automatically
updated in the field and does not allow an escape to the original value or that the ENTER key
be used to accept the new parameter.
63
4.4.5. Continuity
Continuity test is generally used to test the ground conductor of a line cord. If the resistance
exceeds Hi-Limit trip point or drops below the LO-Limit trip point the Omnia will signal a
continuity failure. When testing products with two prong plugs, do not activate the continuity
circuit.
When the Ground Bond test is selected on the Omnia, the High Current will be applied through
the Current lead and flow back through the Return lead. The resistance is measured and
compared to the HI and LO-Limit trip points stored in memory.
From the Setup Tests, Tests Selection screen, press the “Continuity”soft key. The Continuity
Selection screen will now be displayed. The Continuity Selection screen will appear as follows:
Setup Tests
01
AC Ground Bond
DC Continuity
File Name:NEW FILE
Select a test type.
From the Continuity Selection screen, you may select either an AC Ground Bond test or a DC
Continuity test.
4.4.6. AC Ground Bond

From the Continuity Selection screen, press the “AC Ground Bond”soft key. The Ground
Bond parameter-setting screen will now be displayed. The Ground Bond parameter-setting
screen will appear as follows:
Ground Bond
Current xx.xA Frequency 60Hz
Voltage xxxxV
Hi-Limit xxxmΩ
Lo-Limit xxxmΩ
Dwell Time xxx.xs

Offset xxxmΩ
Scanner x
Channel
Press TEST For

Automatic Offset
Setting.
RANGE: Defaults
Current
0 – 30.0A
From the Ground Bond parameter-setting screen, the following parameters may be controlled:
Current, Voltage, HI-Limit, LO- Limit, Dwell Time, Offset, Scanner Channel, Defaults.
64
Offset
This function allows the instrument to compensate for lead and test fixture resistance during a
ground bond or continuity test. Using the up and down arrow keys or the ENTER key, scroll
the highlighted area to the Offset parameter. You may now manually or automatically set an
Offset value.
To manually set an Offset value enter a milliohm value via the numeric keypad and then press
the ENTER key to accept the new value or press the EXIT key to escape from the edit.
To automatically set an Offset value, set the output voltage, current, and frequency to the
values that will be used on the DUT and connect the test cables, test fixture, or scanner channel
with fixturing to the instrument. Next, short circuit the ends of the test cables and press the
“TEST”button. The highlighted parameter field will briefly show the word “READING”and
then the display the new value. The new value is automatically updated in the field and does not
allow an escape to the original value or require that the ENTER key be used to accept the new
parameter.
4.4.7. DC Continuity
From the Continuity Selection screen, press the “DC Continuity”soft key The Continuity
parameter-setting screen will now be displayed. The Continuity parameter-setting screen will
appear as follows:
Continuity
Hi- Li mit xx.xxΩ
Lo- Li mit xx.xxΩ
Dwe ll Time xxx.xs
Off se t xx.xxΩ
Sca nn er
Cha nn el x
Press TEST For

Autom at ic Offset
Set ti ng.
RANGE: Defaul ts
Hi-Limit
0 – 10.00Ω
From the Continuity parameter-setting screen, the following parameters may be controlled: HI-
Limit, LO- Limit, Dwell Time, Offset, Scanner Channel, Defaults.
Offset
This function allows the instrument to compensate for lead and test fixture resistance during a
ground bond test. Using the up and down arrow keys or the ENTER key, scroll the highlighted
area to the Offset parameter. You may now manually or automatically set an Offset value.
To manually set an Offset value enter a milliohm value via the numeric keypad and then press
the ENTER key to accept the new value or press the EXIT key to escape from the edit.
65
To automatically set an Offset value, set the output voltage, current, and frequency to the
values that will be used on the DUT and connect the test cables, test fixture, or scanner channel
with fixturing to the instrument. Next, short circuit the ends of the test cables and press the
“TEST”button. The highlighted parameter field will briefly show the word “READING”and
then the display the new value. The new value is automatically updated in the field and does not
allow an escape to the original value or require that the ENTER key be used to accept the new
parameter.
66
4.4.8. Run Test (Models 8105 and 8106)
From the Setup Tests, Tests Selection screen, press the “Run Test”soft key. The Run Test
parameter-setting screen will now be displayed. The Run test parameter-setting screen will
appear as follows:
Run Test
Voltage-HI xxxxV Power-HI xxxxW
Voltage-LO xxxxV Power-LO xxxxW
Current-HI xxx.xA PF-HI x.xxx
Current-LO xxx.xA PF-LO x.xxx
Dwell Time xxx.xs

Delay Time xxx.xs
Leakage-HI xxx.xuA
Leakage-LO xxx.xuA
RANGE: Defaults
Volt-HI
0 – 277V
From the Run Test parameter-setting screen, the following parameters may be controlled:
Voltage-HI, Voltage-LO, Current-HI, Current-LO, Dwell Time, Delay Time, Leakage-HI,
Leakage-LO, Power-HI, Power-LO, PF-HI and PF-LO.
Delay Time
A length of time needed to ensure the DUT has reached proper operating conditions, during
which the Current- HI and Current- LO limit detectors are disabled. The over current judgment
The Delay time has no effect on the Voltage-HI and Voltage-LO detectors.
PF (Power factor)
Power Factor = W/VA where W =Watts (Real Power) and VA =Volts x Amps (apparent
power). It is important to note that the closer the power factor is to "1" the more resistive the
DUT is. The closer the power factor is to 0 the more reactive (inductive or capacitive) the
DUT is.
67
Leakage (Leakage-HI and Leakage-LO)
Leakage in the Run Test mode refers to the amount of current, which flows from the enclosure
(case) of the DUT, to the neutral side of the line input. The Leakage-HI trip limit is used to
program the maximum allowable earth leakage current of the DUT before failure. The
Leakage-LO trip limit is used to program the minimum allowable earth leakage current of the
DUT before failure. The Leak HI trip limit also controls the earth leakage configuration as
shown in FIG.1.
FIG.1 DUT power

receptacle
DUT Line
S2
Ground
power V
input
Position 1 Position 2
S1 Neutral
MD
2KΩ
Chassis
Figure 1 Ground
When the Leakage-HI trip limit is set to 0.000mA, S2 is placed in position 2 which disables the
Leakage-HI trip limit and connects the chassis of the Omnia to the ground of the DUT output.
Whenever the Leakage-HI trip limit is set to anything but 0.000mA, S2 is in the open position
1, and leakage current will be monitored between the DUT output ground and the DUT input
neutral and the Leakage-HI trip limit is enabled.
68
4.4.9. Line Leakage (Model 8106)
From the Setup Tests, Tests Selection screen, press the “Line Leakage”soft key. The Line
Leakage parameter-setting screen will now be displayed. The Line Leakage parameter-setting
Line Leakage
HI-Limit xx xxuA Reverse ON
RMS
LO-Limit xx xxuA Neutral Closed
Volt- HI xx x.xV Ground Closed
Volt-LO xxx.xV Measuring UL 544

Device
Ground
Delay Time xxx.xs Probe to Line
RANGE: Defaults
HI-Limit
0 – 6000uA
From the Line Leakage parameter-setting screen, the following parameters may be controlled:
Leakage-HI, Leakage-LO, RMS/Peak, Voltage-HI, Voltage-LO, Delay Time, Reverse, Neutral,
Ground, Measuring Device, and probe.
69
Line Configuration Soft keys
The LINE configuration is determined by the relays S1, S2 and S3 (refer to Figure 2) and is set
using the corresponding Line Configuration Soft keys. S1 relay is represented as NEUTRAL
and is controlled by the Neutral soft key. S2 relay is represented as REVERSE and is
controlled by the Reverse soft key. S3 relay is represented as GROUND and is controlled by
the Ground soft key. Pressing the relays corresponding soft key will toggle it between its two
available states
DUT power
A receptacle
DUT B
V SH Probe HI
power
input S2 A B
S1
S3 MD
A B
Figure 2 Probe LO
SL
Line Configuration Setting

When the Neutral or Ground relays are set to the CLOSED position they are in a normal
operating condition. When the Neutral or Ground relays are set to the OPEN position they are
in a fault condition that represents a fault in the line input wiring.
When the REVERSE relay is set to ON, the relay is in position B (refer to Figure 2) and the
Line and Neutral conductors are reversed at the DUT power outputs. The power output is
represented as the power receptacle in Figure 2.
The three relays may be configured into eight different combinations of Line conditions. The
different combinations are represented in the table below (refer to Figure 2).
Line Neutral Reverse Ground

Configuration
Relay/ Fault Soft key Relay Fault Relay/ Fault
Soft key Soft key
1 Open Yes OFF A No Open Yes
2 Open Yes ON B Yes Open Yes
3 Open Yes OFF A No Closed No
4 Open Yes ON B Yes Closed No
5 Closed No OFF A No Open Yes
6 Closed No ON B Yes Open Yes
7 Closed No OFF A No Closed No
8 Closed No ON B Yes Closed No
70
Probe Configuration
The Probe configuration is controlled by the relays SH and SL shown in Figure 2 and are set by
the Probe soft key. These two relays configure the current measuring device into three possible
positions. Repeatedly pressing the Probe soft key allows the selection of the three different
states. The three positions are described in the table below.
Measuring SH SL Display Agency Test Application

Device Position Indication
Ground to Line A A Ground to Earth Leakage
Line
Probe HI to Line B A Probe-HI to Enclosure Leakage or
Line Patient Leakage
Probe-HI to B B Probe-HI to External Applied Part or
Probe-LO Probe-LO Surface to Surface Leakage
Ground to Line, indicates the MD is connected to measure the leakage current in the earth
ground conductor in the line cord back to the system neutral and is referred to as an EARTH
LEAKAGE TEST.
Probe-HI to Line indicates the MD is connected between the PROBE HI terminal on the
instrument, which should be connected to the ENCLOSURE of the DUT and the system
neutral. This is known as an ENCLOSURE LEAKAGE TEST.
Probe-HI to Probe-LO indicates the MD is connected between the PROBE HI and the PROBE
LO terminals on the instrument which allow the operator to connect the MD between applied
parts.
71
Measuring Device
The Measuring Device is an impedance circuit that simulates the human body. The Measuring
device is specified differently for different agencies, applications and specifications. Repeatedly
pressing the Measure Device soft key will allow you to select one of the many measuring
devices listed in the table below. The table below indicates the available measuring devices and
the appropriate agency standard to which it correlates.
Cross Agency Specification Application

Reference
Letter
A UL544 Non patient equipment Medical Equipment.
B UL544 Patient care equipment Medical Equipment.
C UL2601-1, UL60601-1, IEC601-1, Medical Equipment.
IEC60601-1, EN60601-1
D UL1563 Electric Spas,
Equipment Assemblies and
Associated Equipment.
E UL1950, UL3101, UL61010, Laboratory Equipment.
IEC950, IEC1010, IEC60950, Information Technology.
IEC61010, IEC60335-1, Weighted Touch Current,
IEC60990 Fig4-U2 Perception / Reaction.
Frequency The Line Leakage test can be The selection is intended to be

configured to verify the bandwidth of used for meter verification only and
Check
the leakage current “voltmeter”, by has no application for normal
setting the Probe configuration, testing.
Probe-HI to Probe-LO, and selecting
the medical device “Frequency
Check”.
(G) External User configurable User configurable.
H IEC60990 Fig5-U3 Weighted Touch Current, Let-Go.
I IEC60990 Fig3-U1 Unweighted Touch Current.
Circuit Diagrams
The following diagrams show the equivalent circuit of the measuring devices. Leakage current
readings are generated by measuring the voltage drop across these networks and dividing by the
equivalent DC resistance. The voltmeter is placed across the entire network of the measuring
devices A, B and D. The voltmeter is placed across the points indicated by the solid black dots
on measuring device C, E, H, and I. The points are specified by the agencies that require a
particular measuring device to meet their specification.
72
MD =A (UL 544NP) MD = B (UL544P)
0.15µF
1.5KΩ 0.15µF 1KΩ

10.2Ω
MD = C (IEC60601, UL2601) MD = D (UL1563)
10KΩ
1KΩ 0.015µF 500Ω 0.45µF
MD =E (IEC60990 FIG4-U2, IEC60950)
1.5KΩ 0.22µF
10KΩ
500Ω 0.022µF
External Measuring Device (MD=F)

The Omnia 8106 has an access panel on the back of the instrument that can be removed to
access the MD external PCB. The MD external PCB may be configured for a simple resistive
measuring device or a two-pole measuring device similar to MD “E”. The PCB comes
configured with a 1kΩ measuring device.
73
Frequency Check (MD=G)
The Line Leakage test can be configured to verify the bandwidth of the leakage current
“voltmeter”by setting the Probe configuration, Probe-HI to Probe-LO, and selecting the
medical device “Frequency Check”. The selection is intended for meter verification purposes
only and has no application for normal testing. The calculation of the displayed leakage current
will use 1000 Ω for R in the calculation of V/R=I where I is the leakage current displayed and V
is voltage across the measuring device (MD). When an external frequency generator is applied
to the probe inputs, the current display will be equal to Voltage generator/1000. The readings
can then be correlated to verify the voltmeter bandwidth. Since the voltage is being applied
directly across the MD voltmeter amplifier inputs, it is not necessary to actually install a 1KΩ
resistor to the external MD input. It is necessary to have the 0Ω resistors installed in position
R1 and R3 on the external measuring device PCB to operate in this mode. If the external
measuring device has been populated in a different configuration, it will be necessary to create a
temporary short on R1 and R3 to operate in this mode. Another option would be to acquire a
spare external measuring device PCB for the meter verification purpose.
MD=H (IEC60990 FIG5-U3 )
1.5KΩ 0.22µF
10KΩ
20KΩ
500Ω 9100pF
6200pF
MD=I (IEC60990 FIG3-U1)
1.5KΩ 0.22µF
500Ω
74
RMS and Peak current reading
The Line Leakage test can be configured to meter the leakage current in RMS or Peak. The
RMS/Peak configuration is set by the pressing the “>”key while the Leakage-HI or Leakage-
LO parameter is highlighted.
RMS and Peak Definitions

RMS (Root-Mean-Square): To determine RMS value, three mathematical operations are
carried out on the function representing the AC waveform.
1. The square of the waveform function (usually a sine wave) is determined.
2. The function resulting from step (1) is averaged over time.
3. The square root of the function resulting from step (2) is found.
For a sine wave, the RMS value is 0.707 times the peak value.
Peak: Peak (pk) is the maximum value, either positive (pk+) or negative (pk-), that the current
waveform attains.
For a sine wave without a DC component, the peak amplitude is equal to approximately 1.414
times the root-mean-square amplitude.
Delay Time
A length of time needed to ensure the DUT has reached proper operating conditions, during
which the Current- HI and Current- LO limit detectors are disabled. The over current judgment
The Delay time has no effect on the Voltage-HI and Voltage-LO detectors.
75
4.4.10. Default Parameters
In each of the Test Parameter-setting screens there is a “Defaults”soft key. When this key is
pressed the test will load with a set of predetermined Default Parameters. The following table is
a listing of the Default Parameters for each of the different types of tests that are available in the
Omnia. The Default Parameters are as follows:
Default Parameters.
Test Type Parameter Value

ACW Voltage 1240VAC
HI-Limit T 10.00mA
LO-Limit T 0.000mA
Ramp Up 0.1s
Dwell Time 1.0s
Ramp Down 0.0s
Arc Sense 5
HI-Limit R 10.00mA
LO-Limit R 0.000mA
Scanner OOOOOOOOOOOOOOOO
Frequency 60Hz
Arc Detect OFF
Continuity OFF
DCW Voltage 1200VDC
HI-Limit 10000µA
LO-Limit 0.0µA
Ramp Up 0.4s
Dwell Time 1.0s
Ramp Down 1.0s
Charge-LO 0.0µA
Arc Sense 5
Ramp-HI OFF
Arc Detect OFF
Continuity OFF
IR Voltage 500VDC
HI-Limit 0.00MΩ
LO-Limit 0.05MΩ
Ramp Up 0.1s
Delay 1.0s
Ramp Down 0.0s
Charge-LO 0.000µA
76
GND Current 25.00A
Voltage 8.00V
HI-Limit 100mΩ
LO-Limit 0mΩ
Dwell 1.0s
Frequency 60Hz
Offset 0mΩ
Scanner 00
CONT. HI-Limit 10.00Ω
LO-Limit 0.00Ω
Dwell 1.0s
Offset 0.00Ω
Scanner 00
Setup Sys. PLC Remote OFF
Address (GPIB only) 8
Contrast 5
Volume 5
Smart GFI ON
Security Password 0
Security OFF
File Recall OFF
Models 8105 and 8106
Run Test Voltage-HI 100.0V
Voltage-LO 0.0V
Amp-HI 10.00A
Amp-LO 0.00A
Dwell Time 1.0s
Delay Time 0.1s
Leakage-HI 10.00mA
Leakage-LO 0.00mA
Power-HI 1000W
Power-LO 0W
PF-HI 1.000
PF-LO 0.000
Model 8106
LLT Leakage-HI 3000µA
Leakage-LO 0.0µA
Voltage-HI 100.0V
Voltage-LO 0.0V
Delay Time 1.0s
Reverse OFF
Neutral CLOSED
Ground CLOSED
Meas. Device UL544NP
Probe Ground to Line
77
5. Operating Instructions
5.1. Instrument Connections
5.1.1. Adapter Box Connections
The adapter box provides an easy way to connect a DUT to the OMNIA that is terminated in a
two or three-prong line cord. The following diagrams show how to connect the adapter box to
the Omnia 8104, 8105 and 8106 to the device under test.
Adapter Box Connections Model 8104
ASSOCIATED
RESEARCH, INC.
38490
DUT CONT/CURRENT HV
CHASSIS
LINECORD
38482
DUT I.E. AC FAN
The rear output connections may be used for connecting the adapter box as well.
Adapter Box Connections Model 8105 and 8106
LINE LINE EARTH

NEUTRAL NEUTRAL GROUND
DUT CBLHC40-10TL
AC SOURCE CHASSIS
0-277VAC LINECORD
38578
DUT I.E. AC FAN
78
5.1.2. DUT Input Voltage Connections for Models 8105 and 8106
The Power Source to the device under test (DUT) inputs must be an
WARNING unbalanced single-phase supply. This means that there is only one HOT or
LINE conductor and the other conductor of the power source must be at a low
voltage reference potential. The low voltage reference does not need to be
physically earth grounded but should not carry any large voltage potential. The
220 - 240V US style line power IS NOT suitable to connect to the DUT inputs.
This style of power distribution is a balanced type with two HOT or LINE
conductors. Be sure that the hot lead of the power source is connected to pin 1,
L (line) terminal of the DUT input connector and the Reference or low voltage lead is
connected to pin 2, N (neutral) terminal of the DUT input connector. DO NOT connect a line
conductor to the N or Neutral terminal of the DUT inputs. This condition can be very
dangerous to the LINECHEK user.
If voltage is applied to pin 2, N (neutral) terminal of the DUT input and you attempt to execute
a Run Test or Line Leakage test, a warning message will appear in the displayed messages
portion of the screen that says Neutral-V. If you see this message, you will need to correct the
voltage problem before the instrument will allow you to execute Run Tests or Line Leakage
tests.
5.1.3. Scanner Connections

The Scanner provides 8 high voltage channels and 8 ground bond/continuity channels on the
rear panel. The High Voltage channels can be set to a High or Low level giving the capability
to test from one channel to another channel or from any channel to a common Low or Return
point. The channels can be connected in parallel if desired but there is only one leakage current
measurement for all channels. The ground bond/continuity channels can test only from one
channel to the common Return and only one channel may be used for each test.
Instructions for setting the scanner channels are in the section 4.4 Test Parameters of this
manual.
The scanner will provide output to multiple test points and will have the same operation
specifications that apply to the standard instrument with the exception of one Ground
Bond/Continuity channel limitation. Due to the characteristics of general-purpose High Current
relays, some additional contact resistance cannot be prevented. Although this contact resistance
can be offset using the milliohm offset feature of the instrument, there will be some variation of
the contact resistance because the relay must open and close. Each relay closure may represent a
different resistance value. The Ground Bond/Continuity channels will have the following
characteristics:
Ground Bond/Continuity Channel Resistance Deviation

Deviation (Relay Contact) Test Current
6mΩ maximum ≥10A
79
5.2. Perform Tests Menu
From the Main Menu screen, press the soft key “Perform Tests”.
Main Menu
Setup System
Setup Tests
Perform Tests
The Perform Tests Menu will now be displayed. From the Perform Tests screen, four different
software controls may be accessed, Load File, Single Step (ON/OFF), Fail Stop (ON/OFF),
Results. The arrow keys may also be used to scroll the highlighted area to a specific test or
page of tests if the file is larger than 5 steps. The Perform Tests screen will appear as follows:
Perform Tests
1 LLT Settings
Load F ile
120V 500uA
5.0s 100uA
2 ACW Setting s Sin gle Step OFF

5000V 10.0 0mA
20.0s 2.00 mA
3 DCW Setting s
Fail Stop OFF
1000V 500u A
10.0s 100u A
4 IR Setting s
Resu lts
500V 800MΩ
10.0s 200MΩ
5 GND Setting s
25A 150mΩ
1.0s 100mΩ
File Name:New File
Move up Mov e down To initiate this

test, press the
Page up Pag e down TEST button.
The Perform Tests screen is the main operational screen of instrument. From this screen,
individual steps are monitored while the test is being performed. At the end of a sequence of
tests, all of the step results may be recalled via the “Results”soft key on this screen. This
screen may also be used to debug test files with the use of the single step and fail stop functions.
80
5.2.1. Load File
From the Perform Tests screen, press the “Load File”soft key. The Load File screen will now
be displayed. The Load File screen will appear as follows:
Load File
FILES
1 ARITEST1
2 NEW FILE
3 ARITEST3
Load
Using the up and down arrow keys, scroll the highlighted area to the File you would like to load
and press the “Load”soft key. The file you selected will now load and the screen will revert to
the Perform Tests screen.
5.2.2. Single Step

Single step is a function that allows you to run one step at a time from a sequence of tests. At
the Perform Tests screen, use the up and down arrow keys or the ENTER key to scroll the
highlighted area to the step you wish to perform. Press the TEST button and the instrument
will initiate the single step and stop when finished without continuing to the next step. If you
press Test again without first pressing Reset, the next step will initiate, run to completion and
then stop. If a step fails and you wish to continue to the next step do not press Reset, if you
press Reset it will return you to the original starting step. After running a single step test, a
prompt will appear below the test file name telling you to Press TEST button to continue.
The prompt will appear as follows:
Perform Tests
01 DCW
1000V
Settings
500uA
ACW
10.0s 100uA HI-LimitT
02 ACW Settings Voltage
5000V 10.00mA
20.0s 2.00mA
1.20KV File Name:
03 DCW Settings
1000V
10.0s
500uA
100uA Total Current 06 NEW FILE
04 IR Settings
500V 800MΩ 12.01mA
200MΩ
05
10.0s
GND Settings
Real Current
Press TEST button
25A 600mΩ to Continue
1.0s 100mΩ 0.005mA
File Name: Time
06 NEW FILE
Press TEST button

10.0s
to continue.
You may single step through an entire sequence in this way as long as you do not press Reset.
Once Reset is pressed it will return you to the originally selected step.
Turn the Single Step function ON and OFF by pressing the “Single Step”soft key. However, if
Security is enabled, single step may not be turned ON and OFF at the Perform Test screen.
Whatever state single step is in at the time security is enabled, is the state at which it shall
remain.
81
5.2.3. Fail Stop
Fail Stop is a function that will stop a sequence of tests at the step if a failure occurs. If the fail
stop is turned “ON”and a failure occurs (stopping the test), pressing the Test button again will
start the test sequence at the next step. If a step fails and you wish to continue to the next step
do not press Reset, if you press Reset it will return you to the original starting step. If this
function is turned off, the sequence of tests will continue to the end of the sequence regardless
of whether or not a failure has occurred. If the Fail stop is off and a failure occurs during the
test sequence, the RESET button will light and a short alarm will sound but the sequence will
continue to the end. At the end of the test sequence, the RESET button will light and alarm will
sound indicating failure during the sequence. Pressing the RESET button will silence the alarm
and reset the instrument. Turn the Fail Stop function ON and OFF by pressing the “Fail Stop”
soft key. If security is enabled you may not turn Fail Stop ON and OFF using the “Fail Stop”
soft key. Fail Stop automatically defaults to the setting stored in the file when security is
activated.
Fail Stop with Run and Line Leakage tests

5.2.4. Results
At the end of a test sequence or single step test, you may review the measurements of each test
by pressing the “Results”soft key. Results may be accessed from the end of test Summary
screen or from the Perform Tests screen. The end of test Summary screen appears as follows:
Perform Tests
01 ACW Pass
5000V 19.32mA
20.0s
02 ACW Pass
5000V 35.32mA
20.0s
03 DCW Lo-Limit
FAIL
1000V 0.0uA
10.0s
STEP TEST FAILURE
04 IR Pass
500V 468MΩ 3 DCW LO-Limit
10.0s
5 GND HI-Limit
05 GND HI-Limit
25A >600mΩ
1.0s
File Name:ARITEST3
Results
Page up Page down
82
The Results screen will appear as follow:
Results
01 DCW
1200 V
Settings
500uA
DCW
5.0s 100uA Pass
02 ACW Pass
5000V 35.32mA
Voltage
20.0s
1.20KV
Current
0.0uA
Time
5.0s
File Name:ARITEST3
Move up Move down

Page up Page down
Using the up and down arrow keys, scroll the highlighted area to the step results you wish to
review. The left and right arrow keys may be used to page through results if the test contains
more than five steps. When the highlighted area is on the step you are reviewing, the test
settings will be displayed in the highlighted area and the results will appear on the right in the
form of metering screens. The result screens will appear differently for each type of test. The
results screens are based on the Performing Tests metering screens and are identical in
appearance except for the title. Refer to section 5.3 for the meters that will be displayed.
5.3. Perform Tests Metering

Each test performed by the Omnia contains a unique set of parameters and therefore requires
specialized metering for each test. The following table describes what meters will be displayed
for each of the different test types. An example of a metering screen is shown below the tables.
Metering Screens 8104/8105/8106

Test Type Current(T) Current(R) Voltage Time Resistance
AC Withstand X X X X
DC Withstand X X X
IR X X X
Continuity X X
Ground Bond X X X
Additional Metering Screens Models 8105

Test Type Voltage Current Power Time PF Leakage
Run Test X X X X X X
Additional Metering Screens Models 8106

Test Type Voltage Current Time Line Config. Leakage RMS/Peak
Line Leakage X X X X X
83
Perform Tests
01 DC W
10 00V
Settings
500uA
ACW
10 .0s 100uA Ramp Down
02 AC W Settings Voltage
50 00V 10.00mA
20 .0s 2.00mA
1.20KV
03 DC W Settings
10 00V 500uA
10 .0s 100uA Total Current
04 IR Settings
50 0V 800MΩ 0.01mA
10 .0s 200MΩ
Real Current
05 GN D Settings
25 A 150mΩ
1. 0s 100mΩ 0.005mA
Time
File Name:NEW FILE
10.0s
84
5.4. Performing a Test
1. As instructed in section 5.2.1, load a test file into the instrument.
2. Attach the appropriate load or DUT to the instrument (refer to section 5.1 for instrument
connections).
3. Press the TEST button.
4. The instrument will now perform the sequence of tests. The test will always start from step
01 of the test sequence unless the highlighted area of the screen is scrolled to a different step.
The test will always initiate from the highlighted area of the Perform Tests screen. If the Test
is started from any other step than 01, when you push Reset or Test buttons, it will always
return to the originally selected step.
5. If a prompt is embedded within a step, the test will pause at that step and display the prompt
as a pop-up message. An example of a prompt will appear as follows:
CONNECT LEADS
P r e s s t h e T E S T b u t t o n t o
c o n t i n u e t e s t i n g .
6. In order to clear the prompt and continue the test, push the Test button.
7. The highlighted area of the screen remains on the test that is being performed until it is
finished. Simultaneously, on the right half of the screen will be the appropriate metering
display for the type of test that is being performed (Refer to section 5.3.). When the step is
complete the highlighted area will sequence to the next step and the new metering display will
appear (unless there is a prompt embedded within the step). When the highlighted area
moves to the next step, the previous step area will now display the results of the test just
performed.
8. At the end of the test sequence, the right side of the screen will display a flashing PASS if all
the tests have completed successfully or a flashing FAIL if any of the tests did not complete
successfully. If a test fails, the right side of the screen will indicate the step that failed and
which parameter of the step failed.
85
5.5. Displayed Messages
Directly above the Metering screens is the Test status display. This portion of the display is
active during the test and allows you to view the type of test being performed and status of the
test step. At the end of a test, the Test status display will either inform you that the test has
passed or give a direct indication of the kind of failure that occurred during the test. The
following is an example of the Test status display:
Perform
01 DC W Settings
Tests
ACW
ACW
02
10 00V
10 .0s
AC W
500uA
100uA
Settings
Ramp
Voltage
Down Ramp Down
50 00V 10.00mA
20 .0s 2.00mA
1.20KV
03 DC W Settings
10 00V 500uA
10 .0s 100uA Total Current
04 IR Settings
50 0V 800MΩ 0.01mA
10 .0s 200MΩ
Real Current
05 GN D Settings
25 A 150mΩ
1. 0s 100mΩ 0.005mA
Time
File Name:NEW FILE
10.0s
5.5.1. Test Status Messages (all Models)

The following is a complete listing of the messages that appear in the Test status display and an
explanation for each.
Dwell
This message appears on the display while a test is in process, the values update in real time.
Delay
This message appears on the display while a test is in process, the values update in real time.
Ramp Up
This message appears on the display at the beginning of the test, when the output voltage is
ramping up.
Ramp Down
This message appears on the display at the end of the dwell cycle, when the output voltage is
ramping down.
Pass
This message appears on the display when the test process is complete and the DUT passed the
test.
86
Abort
This message appears on the display if the test in process is aborted with the RESET button or
remote Reset control.
HI-Limit
This message appears on the display if the DUT measurement exceeds the HI-Limit setting of
any parameter (except AC withstand).
LO-Limit
This message appears on the display if the DUT measurement drops below the LO-Limit setting
of any parameter (except AC withstand).
HI-Lmt T
This message appears on the display if the DUT leakage current exceeds the HI-Limit setting, of
the Total current parameter in AC withstand.
LO-Lmt T
This message appears on the display if the DUT leakage current drops below the LO-Limit
setting, of the Total current parameter in AC withstand.
HI-Lmt R
This message appears on the display if the DUT leakage current exceeds the HI-Limit setting, of
the Real current parameter in AC withstand.
LO-Lmt R
This message appears on the display if the DUT leakage current drops below the LO-Limit
setting, of the Real current parameter in AC withstand.
CONT-Fail
This message appears on the display if the DUT fails the basic continuity check performed
during an AC/DC Withstand test (if Continuity is selected “ON”).
Arc-Fail
This message appears on the display if the DUT arcing current exceeds the Arc Sense limit and
Arc function is active (Arc Sense = 1… 9) of the AC/DC Withstand test.
Short
This message appears on the display if the DUT current is well beyond the metering range of the
test.
87
Charge-LO
This message appears on the display if the leakage current during Ramp-up falls below the
Charge -LO setting.
Breakdown
This message appears on the display if the DUT current is well beyond the metering range of the
test and the arcing condition beyond the arc sense limit.
GND-Fault
This message appears on the display if the GFI threshold is exceeded during the test.
Out-Error
This message appears on the display, if the instruments output reading does not match the
setting. This message will only be seen if the Exit key is press at the Output Error screen. If
the instrument has an output problem when the TEST button is pressed, the Output Error
Output Error
The Instrument has malfunctioned! The
output re ading does not match the
setting. Press Exit to continue or
contact Associated Research.
Associated Research Inc.

13860 W. Laurel Drive
Lake Forest, IL 60045-4545 Setting =
U.S.A x.xxkv
Reading =
Phone: 1- 847-367-4077 x.xxkv
Toll Free 1-800-858-8378
Fax: 1-84 7-367-4080
email: [email protected] Exit
Web: www. asresearch.com
The RESET button is not active in this situation. Only the Exit soft key will allow you to return
to the Perform Test screen.
OTP-Fail
This message appears on the display if the Power Amplifier has overheated. This is abnormal
condition; please call to the factory for assistance.
5.5.2. Test Status Messages (Models 8105 and 8106)
Volt-HI
This message appears on the display if the DUT/IP voltage exceeds the Volt-HI Trip setting.
Volt-LO
This message appears on the display if the DUT/IP voltage drops below the Volt-LO Trip
setting.
88
Amp-HI
This message appears on the display if the current exceeds the Amp-HI Trip setting
Amp-LO
This message appears on the display if the current drops below the Amp-LO Trip setting.
Line-OC
This message appears on the display if the 20 Amp < 1 s, short circuit protection is tripped.
Power-HI
This message appears on the display if the DUT input wattage exceeds the Power-HI Trip
setting.
Power-LO
This message appears on the display if the DUT input wattage drops below the Power-LO Trip
setting.
PF-HI
This message appears on the display if the Power Factor exceeds the PF-HI Trip setting.
PF-LO
This message appears on the display if the Power Factor drops below the PF-LO Trip setting.
Leak-HI
This message appears on the display if the enclosure to neutral leakage current exceeds the
Leak-HI Trip setting.
Leak-LO
This message appears on the display if the enclosure to neutral leakage current drops below the
Leak-LO Trip setting.
Neutral-V
This message appears on the display if there is voltage present on the Neutral of the DUT input
receptacle.
89
Fatal Error
All of the buttons and keys are not active in this situation. This type of failure permanently locks
the instrument in the “Fatal Error”mode and requires that the instrument be serviced by
Associated Research. The customer should contact Associated Research, Inc to receive further
instruction.
Fatal Error
Int er na l error checking has determined
tha t th ere is a problem with the
har dw ar e or software. Please contact
Ass oc ia ted Research.
Ass oc ia ted Research Inc. Err or 9002

138 60 W . Laurel Drive
Lak e Fo rest, IL 60045-4545
U.S .A
Pho ne : 1-847-367-4077
Tol l Free 1-800-858-8378
Fax : 1- 847-367-4080
ema il : [email protected]
Web : ww w.asresearch.com
The following Fatal Error identification numbers will represent type of the failure that has
occurred:
Error Code 9001 will appear on the display, if the instrument has a recognizable internal
component failure.
Error Code 9002 will appear on the display, if the instrument’s System data or the
Model/Option/Serial Number data are corrupted and do not match the settings.
Error Code 9003 will appear on the display, if the instrument’s Calibration data is corrupted.
90
6. Instrument Verification
Verification is a process by which an instruments fail detectors are proven to be functioning
properly and thereby “Verifying”the functionality of the electrical safety tester and connected
accessories. Verification of failure detect circuitry of the electrical safety tester is required by
safety agencies such as CSA, UL, and TÜV.
6.1. Verification Initialization

Turn on the POWER switch located on the lower left-hand side of the front panel. The
initialization screen will appear with a message at the bottom indicating VERIFICATION
(PRESS TEST). You now have the option to press the TEST button and activate the
Verification Menu (Refer to the section 6. Instrument Verification). The option to activate
the Verification expires approximately 4 seconds after power-up. The Initialization screen will
appear as follows:
6.2. Verification Menu

From the Initialization screen (First start up screen), press the TEST button.
Verification
Continuity
Ground Bond
AC Hipot
DC Hipot
IR
Press Function Key to select mode

Press EXIT to exit from verification.
The Verification Menu will now be displayed. From the Verification menu, five different
Verification processes may be accessed; Continuity, Ground Bond, AC Hipot, DC Hipot, and
IR.
91
6.2.1. Continuity Verification
From the Verification screen, press the “Continuity”soft key. A pop-up message will now be
displayed. The message will appear as follows:
Open DUT connection between

Current and Return. Unplug HV
from the Instrument.
Press TEST to begin verification
Press RESET to return to main menu.
Follow the instructions given in the pop-up message and then press TEST to begin the
verification process. During the Verification process the metering screen for the related process
will be displayed, refer to section 5.3 Perform Tests Metering for the appearance of metering
screens.
At the end of the Verification process, a pop-up message will appear indicating the outcome of
the process. If the instrument passes the Verification (test failure, indicating the fail detectors
are working properly) the RESET button will illuminate, the alarm will sound and the following
pop-up message will appear over the metering screen:
Verification OK
Continuity failure detected.
Press RESET to return to
main menu.
If the instrument fails the Verification (test pass, indicating the fail detectors are not working
properly) the TEST button will illuminate and the following pop-up message will appear over
the metering screen:
Verification
Error
Continuity failure not detected.
Check connections or call
1-800-858-8378 or
1-847-367-4077.
main menu.
92
6.2.2. Ground Bond Verification
From the Verification screen, press the “Ground Bond”soft key. A pop-up message will now
be displayed. The message will appear as follows:
Open DUT connection between

Current and Return. Unplug HV
from the Instrument.
Press TEST to begin verification
Press RESET to return to main menu.
screens.
Verification OK
Ground Bond failure detected.
main menu.
Verification
Error
Ground Bond failure not detected.
1-800-858-8378 or
1-847-367-4077.
main menu.
93
6.2.3. AC Hipot Verification
From the Verification screen, press the “AC Hipot”soft key. A pop-up message will now be
S h or t DUT connection between

H V a nd Re turn.
D o n ot to uch leads during
t e st .
P r es s TES T to begin
v e ri ficat ion.
P r es s RES ET to return to
m a in menu .
screens.
Verification OK
AC Hipot failure detected.
main menu.
Verification
Error
AC Hipot failure not detected.
1-800-858-8378 or
1-847-367-4077.
main menu.
94
6.2.4. DC Hipot Verification
From the Verification screen, press the “DC Hipot”soft key. A pop-up message will now be

H V a nd Re turn.
t e st .
v e ri ficat ion.
m a in menu .
screens.
Verification OK
DC Hipot failure detected.
main menu.
Verification
Error
DC Hipot failure not detected.
1-800-858-8378 or
1-847-367-4077.
main menu.
95
6.2.5. IR Verification
From the Verification screen, press the “IR”soft key. A pop-up message will now be displayed.
The message will appear as follows:

H V a nd Re turn.
t e st .
v e ri ficat ion.
m a in menu .
screens.
Verification OK
IR failure detected.
main menu.
Verification
Error
IR failure not detected.
1-800-858-8378 or
1-847-367-4077.
main menu.
96
7. Remote Control
Two 9-pin “D”type connectors are mounted on the rear panel that provide REMOTE-INPUT-
OUTPUT control and information. These connectors mate with standard 9 pin D-sub-miniature
connector provided by the user. The output mates to a male (plug) connector while the input
mates to a female (receptacle) connector. For best performance, a shielded cable should be
used. To avoid ground loops the shield should not be grounded at both ends of the cable.
Suggested AMP part numbers for interconnecting to the Remote I/O are shown below:
205204-4 PLUG SHELL WITH GROUND INDENTS

205203-3 RECEPTACLE SHELL
745254-7 CRIMP SNAP-IN PIN CONTACT (for plug)
745253-7 CRIMP SNAP-IN SOCKET CONTACT (for receptacle)
745171-1 SHIELDED CABLE CLAMP (for either plug or receptacle)
747784-3 JACKSCREW SET (2)
Remote Interface Rear Panel:
SIGNAL OUTPUT SIGNAL INPUT

RESET
FAIL PASS
TEST
BIT 3 INTERLOCK
5 1 1 5
9 6 6 9
BIT 4 BIT 2
PROCESSING BIT 1
COMMON
7.1. Signal Outputs on Remote I/O

The rear panel connector provides three output signals to remotely monitor PASS, FAIL, and
PROCESSING conditions. The monitoring signals are provided by three normally open internal
relays, that switch on to indicate the current condition of the tester. These are normally open
free contacts and will not provide any voltage or current. The ratings of the contacts are 1A /
125 VAC ( 0.5 ADC ). The signal outputs are provided on the 9-pin female D connector.
Below is a listing that indicates what conditions activate each pin. When a terminal becomes
active the relay closes thereby allowing the external voltage to operate an external device.
Pins 1 and 2 provide the PASS signal.

Pins 3 and 4 provide the FAIL signal.
Pins 5 and 6 provide the PROCESSING signal.
The following describes how the relays operate for each test condition.
PROCESSING - The relay contact closes the connection between pin (5) and pin (6) while the
instrument is performing a test. The connection is opened at the end of the test.
97
PASS - The relay contact closes the connection between pin (1) and pin (2) after detecting that
the item under test passed all tests. The connection is opened when the next test is initiated or
the reset function is activated.
FAIL - The relay contact closes the connection between pin (3) and pin (4) after detecting that
the item under test failed. The connection will open when the next test is initiated or the reset
function activated.
7.2. Signal Inputs of Remote I/O and Programmed Test Files

The Omnia remote connector enables remote operation of the TEST, RESET, and REMOTE
INTERLOCK functions, and allows the operator to select one of 10 pre-programmed test files.
When the PLC Remote mode is on, the Omnia will respond to simple switch or relay contacts
closures. A normally open momentary switch can be wired across pins 3 and 5 to allow remote
operation of the TEST function. A minimum pulse width or contact closure of 20mS is
required to guarantee a test start. A normally open momentary switch can be wired across pins
2 and 5 to allow remote operation of the RESET function. A minimum pulse width or contact
closure of 50mS is required to guarantee that a running test will abort. When the PLC remote
function is (ON) the TEST switch on the front panel will be disabled to prevent a test from
being activated through this switch. For safety, the front panel RESET switch remains active
even when a remote reset switch is connected so that high voltage can be shut down from either
location.
The Remote File Select function gives the user the capability to quickly change parameters and
initiate a test remotely. Ten pre-programmed test files can be accessed by connecting pins
1,6,8, and 9 to the common pin 7, in different combinations. The memory select bits should be
set simultaneously and remain set for a minimum of 20ms to guarantee that the correct memory
will be selected. However, the memory select bits may be set in sequential manner, provided
that the time delay between each bit is less than 4ms. When the desired bit pattern has been
established it should remain set for a minimum of 20ms to guarantee that the correct memory
will be selected. The Remote File Select Truth Table (binary) shows the different
combinations of momentary switch (relay) closures, and which memory programs that will be
selected as the result. It may be necessary to "OR" the momentary switches (relay contacts) to
prevent incorrect program selection due to timing errors.
REMOTE FILE SELECT TRUTH TABLE

BIT 4 BIT 3 BIT 2 BIT 1 FILE #
0 0 0 1 01
0 0 1 0 02
0 0 1 1 03
0 1 0 0 04
0 1 0 1 05
0 1 1 0 06
0 1 1 1 07
1 0 0 0 08
1 0 0 1 09
1 0 1 0 10
1= Momentary Contact closure between BIT and COMMON
0= No Contact closure between BIT and COMMON
98
Activating file program functions through the remote connector selects the
WARNING
file and starts the test that is pre-programmed into that file.
CAUTION Do not connect voltage or current to the signal inputs. Applying voltage to
the signal input could result in damage to the control circuitry.
Remote Interlock
Omnia is equipped with a featured referred to as “Remote Interlock”. Remote Interlock is a
feature that utilizes a set of closed contacts to enable the instruments output. In other words, if
the Interlock contacts open, the output of the instrument will be disabled. Remote Interlock
could also be referred to as a remote system lockout, utilizing “Fail When Open”logic. If the
Interlock contacts are open and the Test button is pushed, a pop-up message will be displayed
on the screen for two seconds. The message will appear as follows:
Interlock is
Open
P l e a s e c h e c k t h e R e m o t e I n t e r l o c k
c o n n e c t i o n .
If the Interlock contacts are opened during a test, the pop-up message will be displayed and the
test will abort. The hardware and has been configured to provide the interlock connections on
pins 4 and 5 of the Remote Interface, Signal Input port. The instrument can still be used
without the external interlock device as long as the Interlock Connector (38075 provided with
unit) is plugged into the Remote Interface, Signal Input port. If there is nothing connected to
the Remote Interface, Signal Input port to provide a connection to the interlock, the instrument
will not perform tests.
PLC Remote Pop-up message

If you attempt to start a test from the front panel Test button and the PLC remote function is
turned “ON”, a pop-up message will be displayed. The pop-up message will appear as follows:
PLC remote
Control is ON.
F r o n t p a n e l T E S T b u t t o n i s
d i s a b l e d .
99
8. Bus Remote Interface GPIB / RS-232
This section provides information on the proper use and configuration of bus remote interface.
The RS-232 remote interface is standard on model 800X but the GPIB (IEEE-488) interface
option can be substituted for the RS-232 interface. Please refer to the Option section of this
manual for details on the Omnia options. The RS-232 interface also uses the same command
set as the GPIB interface for setting of test parameters. However there are many functions of
the GPIB 488.2 interface that are not available through RS-232. The IEEE-488 interface
included with Omnia conforms to the requirements of the IEEE-488.2 standard.
8.1. A Brief History of IEEE-488

Hewlett-Packard designed in 1965 the Hewlett-Packard Interface Bus (HP-IB) to connect their
line of programmable instruments to computers. This bus had high transfer rates (nominally 1
Mbytes/s), and thus quickly gained acceptance. Later, it was accepted as the IEEE Standard
488-1975 and has then evolved into ANSI/IEEE Standard 488.1-1987. An enhancement to this
standard was the IEEE standard 728-1982 and evolved into IEEE Std 488.2-1887. The new
standard 488.2 was created and intended to be used with the existing 488.1 standard. The
488.2 standard defines issue related to standard codes, formats, protocols and common
commands
IEEE-488 has expanded over the years and is used with many more types of computers and
instruments than just HP. Because of this, it is usually referred to as the General Purpose
Interface Bus, (GPIB).
8.2. GPIB Messages

There are typically two types of messages that GPIB devices use to communicate with other
interconnected GPIB devices;
Interface messages: Often called commands or command messages and Device dependent
messages often called data or data messages.
Data Messages: Contain information such as programming instructions or measurement

results. Command Messages perform functions such as initializing the bus and addressing and
unaddressing devices.
8.3. Functions
A GPIB device can be a Listener, Talker and/or Controller. A Talker sends data messages to
one or more Listeners, which receive data. A Controller manages the information flow on the
GPIB by sending commands to all devices. The GPIB bus is much like a computer bus except a
computer has circuit cards connected via a backplane and the GPIB has stand-alone devices
connected via a cable.
8.4. Signals and Lines

The GPIB consists of 16 signal lines and 8 ground-return or shield drain lines. The 16 signal
lines are grouped into 8 data lines, 3 handshake lines and 5 interface management lines.
100
Data Lines: The eight data lines, DI01 through DI08 carry data and command messages. The 7-
bit ASCII or ISO code set is used and the eighth bit DI08 is unused.
Handshake Lines: The transfer of message bytes between devices is done via three
asynchronously control lines. Referred to as three-wire interlocked handshake. This guarantees
that message bytes on the data lines are sent and received without transmission error.
NRFD (not ready for data) indicates when a device is ready or not ready to receive a message
byte.
NDAC (not data accepted) indicates when a device has or has not accepted a message byte.
DAV (data valid) tells when the signals on the data lines are stable (valid) and can be accepted
safely by devices.
Interface Management Lines: Five lines are used to manage the flow of information across the
interface.
ATN (attention) ATN is driven true by the controller when it uses the data lines to send
commands, and drivers ATN false when a Talker can send data messages.
IFC (interface clear) IFC is driven by the system controller to initialize the bus and become
CIC.
REN (remote enable) The REN line is driven by the controller that is used to place devices in
remote or local program mode.
SRQ (service request) The SRQ line can be driven by any device to asynchronously request
service from the Controller.
EOI (end or identify) This line has two purposes- the Talker uses this line to mark the end of a
message string, and the Controller uses it to tell devices to identify their response in a parallel
poll.
8.5. GPIB Connector

Connection is usually accomplished with a 24-conductor cable with a plug on one end and a
connector at the other end. Devices may be connected in a linear, star or a combination
configuration.
The standard connector is the Amphenol or Cinch Series 57 Microribbon or AMP CHAMP
type. The GPIB uses negative logic with standard transistor-transistor logic (TTL) levels.
When DAV is true, for example, it is a TTL low level (≤ 0/8 V), and when DAV is false, it is a
TTL high level (≥ 2.0 V).
Restrictions and Limitations on the GPIB

A maximum separation of 4 m between any two devices and an average separation of 2 m over
the entire bus. A maximum total cable length of 20 m.
101
No more than 15 device loads connected to each bus, with no less than two-thirds powered on.
For example 1 GPIB controller and a maximum of 14 GPIB instruments.
Note: A bus extender, which is available from numerous manufacturers, is available to

overcome these limitations.
8.6. GPIB Address

This interface is optional on the Omnia. Each device on the GPIB (IEEE-488) interface must
have a unique address. You can set the address of the Omnia to any value between 0 and 30.
The address is set to 9 when the instrument is shipped from the factory. The address can only
be set from the front panel. The address is stored in non-volatile memory and does not change
when the power has been off or after a remote reset.
8.7. Interface Functions

The capability of a device connected to the bus is specified by its interface functions. These
functions provide the means for a device to receive, process, and send messages over the bus.
The interface functions are listed in the chart below.
GPIB 488.1 INTERFACE FUNCTIONS

Interface Function Subset Description
Source Handshake SH1 Complete Source handshake capability
Acceptor Handshake AH1 Complete Acceptor handshake capability
Talker T6 Talker functions (unaddress if MLA)
Listener L4 Listener functions (unaddress if MTA)
Service Request SR1 Complete Service request capability
Remote Local RL0 No remote/local capability
Parallel Poll PP0 No parallel poll capability
Device Clear DC1 Complete Device clear capability
Device Trigger DT0 No device trigger capability
Controller C0 No controller capability
Electrical Interface E2 Three-state drivers
Controllable Items Test and Reset control.

Setting of test parameters for tests.
Reading of instrument status and test results.
Data Codes ASCII
Delimiter NL (+ EOI)
102
8.8. RS-232 Interface
This interface is standard on Omnia. This interface provides all of the control commands and
parameter setting commands of the GPIB interface with the exception of the 488.2 Common
Command the Status Reporting commands and SRQ capability. All commands can be found in
the command list, section 8.9.1 to 8.9.4 of this manual. The identification command *IDN is
also available through RS-232.
The RS-232 cabling should be configured as follows for a 9 pin serial port interface:
Instrument RS-232 Port PC / Bus Controller

RD 2 2 RD
TD 3 3 TD
SIG 5 5 SIG
GND GND
The COM port should have the following configuration. 9600 baud, 8 data bits, 1 stop bit, no
parity. This interface does not support XON/XOFF protocol or any hardware handshaking.
The controller should be configured to ignore the handshaking lines DTR (pin 4), DSR (pin 6)
CTS (pin 8) and RTS (pin 7). If the port can not be configured through software to ignore the
lines then the handshake lines should be jumpered together in two different sets. Pins 4 and 6
jumpered together and pins 7 and 8 jumpered together at the controller end of the cable.
When sending command over the RS232 bus the instrument will send a response string of 06
hex or 6 decimal, the Acknowledge (ACK) ASCII control code if the transfer was recognized
and completed by the instrument. If there is an error with the command string that is sent, the
instrument will respond with 15 hex or 21 decimal, the Not Acknowledge (NAK) ASCII control
code. The ACK or NAK response allows for software handshaking, to monitor and control data
flow. When requesting data from the instrument, it will automatically send the data back to the
controller input buffer. The controller input buffer will accumulate data being sent from the
instrument including the ACK and NAK response strings, until it has been read by the
controller.
8.9. GPIB / RS-232 Interface Command List

A GPIB read command must be sent after the command strings, to retrieve any data from a
query command (?). The Omnia GPIB bus will not send any data to the controller without
being queried. The RS-232 bus will automatically send any response back to the controller's
input buffer. Each command string should be terminated by the ASCII control code, New Line
<NL>, OAh or the end of line EOL message for GPIB.
The following conventions are used to describe the commands syntax for Omnia. Braces ({
})enclose each parameter for a command string. Triangle brackets (< >) indicate that you must
substitute a value for the enclosed parameter. The Pipe ( | ) is used to separate different
103
parameter options for a command. Do not include any of the above characters when sending
the commands. The command and the value should be separated with a space.
All commands that end with a question mark (?) are query commands and required an IEEE-
488 read command to retrieve the data from the device's output buffer.
8.9.1. Test Execution Commands

The following commands are used to control actual output voltage and current from the
instrument. Please observe all safety precautions.
Command Description
TEST Execute a Test
RESET Abort a test in Process or Reset Failures
SAO Set Auto-Offset
SACG Set Auto-Charge-LO
TEST
Starts the test sequence at the selected step loaded into memory (RAM).
RESET
Stop or abort a test. Also used to reset a latched failure condition.
SAO
Set the offset for the Ground bond test or Continuity test. The cables and any test fixture
should be connected before executing the command. This command will perform an actual test
and all safety precautions should be observed when using this command.
SACG
Set the Charge-LO parameter for the DCW or IR test. The cables and any test fixture should
be connected before executing the command. The test parameters that are set for the step will
be used when performing the auto setting. This command will perform an actual test and all
safety precautions should be observed when using this command.
8.9.2. File Editing Commands

The following commands are used to create or modify Test Setup Files.
Command Description Value

FL <file number> File Load file number = 1-50
FD File Delete Active selected File
FD <file number> File Delete by file number = 1-50
Number
FS File Save Active selected File
104
Command Description Value
FSA {<file number>,<file name>} File Save-as file number = 1-50, file
name = Valid ASCII (1)
maximum 11 characters
FN {<file number>,<file name>} File New file number = 1-50, file
name = Valid ASCII (1)
SS <step number> Step Select step number = 1-30
ADD <test,p1,p2,p3… > Adds all parameters
SAA Step Add ACW test
SAD Step Add DCW test
SAI Step Add IR test
SAG Step Add GND test
SAC Step Add CONT test
SAR Step Add RUN test
SAL Step Add LLT test
SD Step Delete Active selected Step
SD <step number> Step Delete by step number = 1-30
Number
SP <prompt message> Step Prompt Create prompt message = Valid
ASCII (1)
SP Step Prompt Delete
SF {1|0} Step Fail Stop 1=On, 0=Off
(1) "Valid ASCII" is the character set that is available from the front panel LCD user interface.
Consisting of upper case alphabet (A-Z), numbers (0-9) and decimal point (.), asteric (*),
dash (-), underbar (_), tilde (~) and space (SP).
FL <file number>
Load a file from non-volatile memory into random access memory RAM.
FD
Deletes the file loaded into RAM from the non-volatile memory space as well as RAM. A new
file must be loaded before and tests can be run.
FD <file number>
Deletes a file from non-volatile memory indicated by the file number.
FS
Saves the file from RAM to the non-volatile memory space.
FSA {<file number>,<file name>}
Saves the current file from RAM into the non-volatile memory space with the indicated file
number and file name. The original file will not be modified with this operation. If there is a file
already located at the desired number it will be moved to the next higher number and inserted in
105
its place. New files may be added to the bottom of the file list but there must not be any
numbers that do not have a file defined.
FN {<file number>,<file name>}
Creates a new file name at the specified file number. If there is a file already located at the
desired number it will be moved to the next higher number and inserted in its place. New files
can be added to the bottom of the file list but there must not be any numbers that do not have a
file defined.
SS <step number>
Selects the active selected step to load into RAM. The step must first be selected before any
specific parameters can be edited.
ADD <test,p1,p2,p3… >
This command inserts or adds a new step to the test sequence. This command will add or insert
the test at the step location that has been selected. When a test has already been created at a
selected step then the new step will be inserted and the previous step will move down to the
next step and all other step will be renumbered accordingly.
The parameter <test> indicated the test type. The values ACW, DCW, IR, GND, CONT, RUN
or LLT must be used. The parameters <p1,p2> etc. indicate the individual settings for each test.
All parameters must be included with the command and should appear in the same order that is
shown on the actual setting screens. The correct order is shown in the tables below. When the
scanner is installed it should be the last parameter for all test types except GND. For the GND
test type, the scanner settings should be inserted between offset and frequency. The list of
parameters can also be found in the default parameters section of the manual.
The parameter values should use complete text and not use the coded values that are associated
with the individual parameter setting commands. Such as "ON" and "OFF" and any toggle field
that use words or phrases like "OPEN", "CLOSE". The LS? companion command will also list
all parameters in complete text as they appear on the setting screen.
ACW DCW IR
1 Voltage Voltage Voltage
2 HI-Limit T HI-Limit HI-Limit
3 LO-Limit T LO-Limit LO-Limit
4 Ramp Up Ramp Up Ramp Up
5 Dwell Time Dwell Time Delay Time
6 Ramp Down Ramp Down Ramp Down
7 Arc Sense Charge-LO Charge-LO
8 HI-Limit Real Arc Sense
9 LO-Limit Real Ramp-HI (ON/OFF)
10 Frequency Arc Detect (ON/OFF)
11 Arc Detect (ON/OFF) Continuity (ON/OFF)
12 Continuity (ON/OFF) *DUT-OUT (ON/OFF)
13 *DUT-OUT (ON/OFF)
* By default, the DUT-OUT parameter should not be included in the ADD command. Include
this parameter only when the System Hardware setting DUT-HV has been enabled.
106
GND CONT RUN LLT
1 Current HI-Limit Voltage-HI Leakage-HI
2 Voltage LO-Limit Voltage-LO Leakage-LO
3 HI-Limit Dwell Amp-HI Voltage-HI
4 LO-Limit Offset Amp-LO Voltage-LO
5 Dwell Dwell Time Delay Time
6 Offset Delay Time Neutral (OPEN/CLOSED)
7 Frequency Leakage-HI Reverse (ON/OFF)
8 Leakage-LO Ground (OPEN/CLOSED)
9 Power-HI Meas. Device
(UL544NP/UL544P/IEC601UL2601/
UL1563/IEC60990FIG4-U2/
IEC60990FIG5-U3/IEC60990FIG3-U1/
EXTERNAL)
10 Power-LO Probe
(Ground To Line/ Probe-HI to
Line/Probe-HI To Probe-LO)
11 PF-HI Leakage Mode (Peak/RMS)
12 PF-LO
SAA, SAD, SAI, SAG, SAC, SAR, SAL

These commands insert or add a new step to the test sequence. This command will add or
insert the test at the step location that has been selected. When a test has already been created
at a selected step then the new step will be inserted and the previous step will move down to the
next step and all other step will be renumbered accordingly. See the command summary tables
to see the specific test type for each of these commands.
SD
Deletes the active step from the setup file sequence. All step after this step will move up and be
renumbered accordingly.
SD <step number>
Deletes the step indicated by the number from the setup file sequence. All step after this step
will move up and be renumbered accordingly.
SP <prompt message>
Adds or edits a prompt message for the active step.
SP
Removes or deletes the prompt that had been created for the active step.
SF {1|0}
Sets the Fail Stop function OFF or ON for the active setup file loaded into RAM. 1 sets the Fail
Stop = ON, 0 sets the Fail Stop = OFF.
107
8.9.3. Test Parameter Editing Commands and Companion Queries
These commands are used to modify the test parameter within each step. These commands
require a parameter value to be included with the command. The companion query command
will read the parameter. The writing of the parameter requires that the unit not be included with
the value, only the numeric value should be included with the command. Also when the query
commands are used the response will not include the units characters. Many of the commands
will function the same way for multiple test types however the input range may be different and
therefore used a different possible set of values.
Command Name Test Value

Types
EA < value > Edit Arc ACW 1-9
EA? DCW
EAD {1|0} Edit Arc-Detect ACW 1= On, 0=Off
EAD? DCW
ECG < value > Edit Charge-Lo IR 0.0 - 350uA
ECG? DCW 0.000 - 3.5000uA
ECT {1|0} Edit Continuity ACW 1= On, 0=Off
ECT? DCW
EC < value > Edit Current GND 1.00 - 40.00A
EC?
ECH < value > Edit Current-HI RUN 0.00 - 15.00A
ECH?
ECL < value > Edit Current-Lo RUN 0.00 - 15.00A
ECL?
EDE < value > Edit Delay IR 0.0 - 999.9s
EDE? RUN
LLT
EDO {1|0} Edit DUT-Output ACW 1= On, 0=Off
EDO? Voltage DCW
IR
EDOC {1|0} Edit DUT-Output GND 1= On, 0=Off
EDOC? Continuity CONT
EDW < value > Edit Dwell ACW 0.0 - 999.9s
EDW? DCW
GND
CONT
RUN
EF {1|0} Edit Frequency ACW 1=60Hz, 0=50Hz
EF? GND
EG {1|0} Edit Ground LLT 1=Open, 0=Close
EG?
108
Types
EH < value > Edit HI-Limit DCW 0.0 - 20000uA
EH? IR 0.05 - 50000MΩ
GND 0 - 600mΩ
CONT 0.00 - 10.00Ω
EHR < value > Edit HI-Limit-R ACW 0.000 - 10.00mA
EHR?
EHT < value > Edit HI-Limit-T ACW 0.000 - 40.00mA
EHT?
ELH < value > Edit Leakage-HI RUN 0.000 - 10.00mA
ELH? LLT 0.0 - 6000uA
ELL < value > Edit Leakage-LO RUN 0.000 - 10.00mA
ELL? LLT 0.0 - 6000uA
EL < value > Edit LO-Limit DCW 0.0 - 20000uA
EL? IR 0.05 - 50000Ω
GND 0 - 600mΩ
CONT 0.00 - 10.00Ω
ELR < value > Edit LO-Limit-R ACW 0.000 - 10.00mA
ELR?
ELT < value > Edit LO-Limit-T ACW 0.000 - 40.00mA
ELT?
ELM {1|0} Edit Leakage Mode LLT 1=Peak, 0=RMS
ELM?
EM Edit Meas-Device LLT 0=UL544NP
{0|1|2|3|4|5|6|7|8} 1=UL544P
EM? 2=IEC601, UL2601
3=UL1563
4=IEC60990 FIG4-U2
5=External
6=Frequency Check
7=IEC60990 FIG5-U3
8=IEC60990 FIG3-U1
EN {1|0} Edit Neutral LLT 1=Open, 0=Close
EN?
EO < value > Edit Offset GND 0 - 200m
EO? CONT 0.00 - 2.00
EPFH < value > Edit PF-HI RUN 0.000 - 1.000
EPFH?
EPFL < value > Edit PF-LO RUN 0.000 - 1.000
EPFL?
EPOH < value > Edit Power-HI RUN 0 - 4200W
EPOH?
EPOL < value > Edit Power-LO RUN 0 - 4200W
EPOL?
109
Types
EP {0|1|2} Edit Probe LLT 0=Ground to Line
EP? 1=Probe-HI to Line
2=Probe-HI to Probe-LO
ERD <value > Edit Ramp-Down ACW 0.0 - 999.9s
ERD? DCW
IR
ERH {1|0} Edit Ramp-HI DCW 1= On, 0=Off
ERH?
ERU < value> Edit Ramp-Up ACW 0.0 - 999.9s
ERU? DCW
IR
ER {1|0} Edit Reverse LLT 1= On, 0=Off
ER?
ES <scanner Edit Scanner High ACW scanner string = 1-16 element
string> Voltage Muti-port DCW ASCII string consisting of H, L,
ES? IR or O.
H=HV, L=RETURN, O=OPEN
ESN <value> Edit Scanner Low GND value = 0 - 16, 0 = ALL OPEN
ESN? Voltage Single-port CONT
EV <value> Edit Voltage ACW 1 - 5000V
EV? DCW 1 - 5000V
IR 1 - 1000V
GND 3.00 - 8.00V
EVH < value > Edit Voltage-Hi RUN 0.0 - 277.0V
EVH? LLT
EVL < value > Edit Voltage-Lo RUN 0.0 - 277.0V
EVL? LLT
EDOC
EDOC?
This command is used to control the Continuity and Ground Bond tests at the DUT outputs of
the LLT and RUN test interface. It should only be used when Continuity or Ground Bond tests
are routed through the HS-16 external, PC controlled scanner. When the EDOC command is
set to 0 the Continuity or Ground Bond test will be disconnected from the GND and Case
terminals of the DUT-outputs to eliminate possible parallel paths with the scanner outputs.
110
8.9.4. System Parameter Editing Commands and Companion Queries
These commands are used to modify the system parameters for the instrument. These
commands require a parameter value to be included with the command. The companion query
command will read the parameter using the same value that is used for setting the parameter.
Command Name Value

SA < value > Alert Date mm,dd,yy or yy,mm,dd or
SA? dd,mm,yy ; same as SDF setting
SAL < value > Alarm Volume 0-9
SAL?
SC < value > Contrast 1-9
SC?
SCA {1|0} Cal Alert 1= On, 0=Off
SCA?
SCDA < value > Cal Date mm,dd,yy or yy,mm,dd or
SCDA? dd,mm,yy ; same as SDF setting
SCDU < value > Cal Due mm,dd,yy or yy,mm,dd or
SCDU? dd,mm,yy ; same as SDF setting
SD1 < value > Device ID 0 - 9999999
SD1?
SD2 {1|0} Device ID 1= On, 0=Off
SD2?
SDAY {6|5|4|3|2|1|0} Day of the week 0,1,2,3,4,5,6= Sun,M,T,W,T,F,Sat
SDAY?
SDF < value > Date Format 0=yy,mm,dd, 1=mm,dd,yy
SDF? 2=dd,mm,yy
SDH{1|0} DUT-HV 1= On, 0=Off
SDH?
SDT < value > Date mm,dd,yy or yy,mm,dd or
SDT? dd,mm,yy ; same as SDF setting
SF {1|0} Fail Stop 1= On, 0=Off
SF?
SFF {1|0} Form Feed n 1= On, 0=Off
SFF?
SL {1|0} Lock 1= On, 0=Off
SL?
SML {1|0} Memory Lock 1= On, 0=Off
SML?
SMM {1|0} Main Menu page 1= On, 0=Off
SMM?
SOI {1|0} Omnia Info page 1= Pause, 0=Continue
SOI?
111
Command Name Value
SPM {2|1|0} Print Mode 0=AUTO, 1=MANUAL, 2=OFF
SPM?
SPR {1|0} PLC Remote 1= On, 0=Off
SPR?
SPRE {1|0} Print Result 1=FAIL, 0=ALL
SPRE?
SPS {1|0} Print Setting 1= On, 0=Off
SPS?
SR {2|1|0} Results 0=ALL, 1=P/F, 2=LAST
SR?
SSG {1|0} Smart GFI 1= On, 0=Off
SSG?
SSI {1|0} Single Step 1= On, 0=Off
SSI?
STM < value > Time hh,mm (24hr)
STM? hh,mm,AM or hh,mm,PM (12hr)
according to STF setting
STF {1|0} Time Format 0=12hr, 1=24hr
STF?
SV{1|0} Verification page 1= On, 0=Off
SV?
8.9.5. Query Commands

These query commands will retrieve data from the instrument. The GPIB bus application
requires an IEEE-488 read command to be sent after the query command. These commands
include functions for retrieving test data, test results and remote hardware status as well as
setup file information.
Command Name Value

TD? List Testing Data Test In Process
RD <step number>? List Results Data step number = 1-30
RR? Read Remote Reset 1=Open, 0=Closed
RI? Read Remote Interlock 1=Open, 0=Closed
LF? List File Name Active selected file

LF <file number>? List File Name by file number file number = 1-50
LP? List Prompt Active selected Step
LP <step number>? List Prompt by step number step number = 1-30
FT? File Total quantity stored
ST? Step Total quantity in file
LS? List Step Parameters
112
Command Name Value
LS <step number>? List Step Parameters by step number step number = 1-30
TD?
Read the active data being displayed on the LCD display while the test is in process. Will also
read the last data taken when the test sequence has completed. Each parameter is separated by
commas and includes step number, test type, test status, and metering. The syntax for this
command response is {step, test type, status, meter 1, meter 2, meter 3}. ACW test displays 4
meters. Each meter will contain only the value and not the units. In the case of DCW current
where both uA and mA are used on the display, the command response will always indicate the
current in uA for example 2.0mA will respond with 2000 for 2000uA.
RD <step number>?
Read the results for an individual step. The step number is the actual step number that has been
saved within the file, not the order of which the steps were executed. For example if the test
was executed starting from step 3 and ending with step 5 then the first step test results will be
found in location 3 not in location 1. Each parameter is separated by commas and includes step
number, test type, test status, and metering. The syntax for this command response is {step,
test type, status, meter 1,meter 2,meter 3}. ACW test displays 4 meters. Each meter will
contain only the value and not the units. In the case of DCW current where both uA and mA
are used on the display the command response will always indicate the current in uA for
example 2.0mA will respond with 2000 for 2000uA.
RR?
Read the remote Reset input signal. When the remote reset has be activated by closing the
contacts the query will return a value of 1 to indicate the instrument is being Reset.
RI?
Read the remote Interlock input signal. When the remote Interlock has be activated by opening
the contacts the query will return a value of 0 to indicate the instrument is in the Interlock state
and will not be able to generate output voltage or current.
LF?
Lists the file name of the file loaded into active memory (RAM).
LF <file number>?
List the file name of any saved file within the directory structure. The file number is given to
the file when the file is save into non-volatile memory.
LP?
Lists the prompt that is created for the individual step that has been selected within active
memory (RAM).
LP <step number>?
Lists the prompt that has been created for of one of the steps of the file within active memory
(RAM).
113
FT?
Returns the total quantity of files stored in memory.
ST?
Returns the total quantity of step created in the file.
LS?
Lists all the Parameters for the individual step that is currently selected.
The response will be formatted as follows; <step, test, p1, p2, p3… > Where <step> is the step
number, <test> is the test type and <p1,p2> etc., indicates the parameters of the test. Please
refer to the ADD command for a list of parameters for each test type.
LS <step number>?
Lists all the Parameters for the individual step indicated by step number = 1-30.
The response will be formatted as follows; <step, test, p1, p2, p3… > Where <step> is the step
number, <test> is the test type and <p1,p2> etc., indicates the parameters of the test. Please
refer to the ADD command for a list of parameters for each test type.
114
8.9.6. IEEE 488.2 Common Commands
These commands are required by the IEEE-488.2 standard with the exception of *PSC, *PSC?.
Most of these commands are not available over the RS-232 bus except for the *IDN? command
which can be used to retrieve the instrument identification information, and the four status
reporting commands *ESR?, *ESE, *ESE? and *STB?.
Command Name Description

*IDN? Identification Query ARI, Model Number, Serial Number,
Firmware Revision
*RST Reset Command Resets OMNIA
*TST? Self-Test Query 00H=OK
01H=TEST EEPROM ERROR
*CLS Clear Status Command Clear Standard Event Status Register
Clear Service Request Register
*OPC Operation Complete Command When TEST command ok setting
ESR BIT0 =1
*OPC? Operation Complete Query 1 = TEST completed ok
0 = TEST in process
*WAI Wait-to-Continue Command
*PSC {1|0} Power-on Status Clear Command 1 = Power-on clear enable registers
0 = Power-on load previous enable
registers
*PSC? Power-on Status Clear Query
*ESR? Standard Event Status Register Query 0 - 255
*ESE <value> Standard Event Status Enable value = 0 - 255
Command
*ESE? Standard Event Status Enable Query 0 - 255
*STB? Read Status Byte Query Read Status Byte
*SRE <value> Service Request Enable Command value = 0 - 255
*SRE? Service Request Enable Query 0 - 255
*IDN?
Read the instrument identification string. Company =ARI.
*RST
Reset the instrument to original power on configuration. Does not clear Enable register for
Standard Summary Status or Standard Event Registers. Does not clear the output queue. Does
not clear the power-on-status-clear flag.
*TST?
Performs a self test of the instrument data memory. Returns 0 if it is successful or 1 if the test
fails.
115
*CLS
Clears the Status Byte summary register and event registers. Does not clear the Enable
registers.
*OPC
Sets the operation complete bit (bit 0) in the Standard Event register after a command is
completed successfully.
*OPC?
Returns an ASCII "1" after the command is executed.
*WAI
After the command is executed, it prevents the instrument from executing any further query or
commands until the no-operation-pending flag is TRUE.
*PSC {1|0}
Sets the power-on status clear bit. When set to 1 the Standard Event Enable register and Status
Byte Enable registers will be cleared when power is turned ON. 0 setting indicates the Enable
registers will be loaded with Enable register masks from non-volatile memory at power ON.
*PSC?
Queries the power-on status clear setting. Returns 0 or 1.
*ESR?
Queries the Standard Event register. Returns the decimal value of the binary-weighted sum of
bits.
*ESE <value>
Standard Event enable register controls which bits will be logically ORed together to generate
the Event Summary bit 5 (ESB) within the Status Byte.
*ESE?
Queries the Standard Event enable register. Returns the decimal value of the binary-weighted
sum of bits.
*STB?
Read the Status Byte. Returns the decimal value of the binary-weighted sum of bits.
*SRE <value>
Service Request enable register controls which bits from the Status Byte should be use to
generate a service request when the bit value = 1.
*SRE?
Queries the Service Request enable register. Returns the decimal value of binary-weighted sum
of bits.
116
8.9.7. Status Reporting
Status reporting system is configured using two types of registers. An Event Register and a
Summary register. The summary register is known as the Status Byte register and records high-
level summary information acquired by the event registers.
An Event register report defined conditions or messages at each bit. The bits are latched and
remain at an active state until the register is either Read or Cleared. Reading the event register
automatically clears the register and sets all bits to inactive state or 0. When querying an event
register the information is returned as a decimal number representing the binary-weighted sum
of all bits within the register.
The Enable registers bits represent the selection of bits that will be logically-ORed together to
form the summary bit in the status byte. The *CLS command will not clear the enable registers
and if you wish to clear the register you must set it to a value of 0. Like the event register, the
enable register is represented as a decimal number that equals the binary-weighted sum of all
bits.
The enable register will clear to value of 0 at power up unless the *PSC 0 command had been
executed before power-off. The *PSC command tells the device whether or not it should clear
the enable registers at power-on. Using this command will allow SQRs to function immediately
after power-on
Standard Event Register Status Byte Register

Bit Binary Event Register Enable Summary Register Enable
weight Register Register
0 1 Operation Complete ALL PASS
1 2 not used FAIL
2 4 Query Error ABORT
3 8 Device Error TEST IN PROCESS
4 16 Execution Error Message Available (MAV)
5 32 Command Error Event Summary Bit (ESB)
6 64 not used Request Service (RQS) or not used
Master Summary Status (MSS)
7 128 Power On PROMPT
*ESR? *ESE *STB? | SPOLL *SRE

*ESE? *SRE?
117
8.9.8. GPIB Service Request
The service request capability is not available with the RS-232 interface. The SRQ line will be
activated only after one or more of the service request functions have been enabled using the
Status Byte Enable Register command *SRE.
The status byte bit assignments are as described in the previous section for status reporting.
When the instrument has requested service, the enabled bit or bits and the RQS bit 6 will be
active or 1. Bit 4, 5, and 7 are not used and will be set to false, or 0 for all status byte reads.
After the serial poll (SPOLL) is executed the RQS bit will be cleared to 0, and the remaining
bits will remain unchanged. The status byte will not change value until the event register is read
and cleared for the corresponding status byte bit.
For example after the All Pass SRQ has been enabled, when the test(s) have finished with pass
indications the instrument will set the hardware SRQ line and output the status byte of 41 hex.
This means that bit 6 and bit 0 are set to a value of 1. After reading the status byte the status
byte value will change to 01 hex.
8.10. Example of Communicating Over the GPIB Bus

To write commands over the IEEE bus you must enter the code that is specific to the software
language you are using. Then follow the example below:
To set the output voltage across the IEEE bus at 1240 volts do the following. First select the
ACW step for example by sending the string for step one ''SS 1" then send the string "EV
1240": This tells the instrument to set the AC voltage at 1240 volts. A string is a list of ASCII
characters, octal or hex bytes or special symbols, enclosed in double quotes.
If the step has already been selected to ACW mode and you wish to set the Ramp Up time of
the ACW test across the IEEE bus at 10 seconds, do the following, send the string "ERU
10.00". This tells the instrument to set the AC Ramp Up time at 10.00 seconds.
To set outputs 1 & 2 of the scanner to High, outputs 3 & 4 to Low and outputs 4-8 to Off type
in the following string, "ES HHLLOOOO", after the ACW Test Function has been selected.
All channels not being specifically set will automatically be set to “O”open.
To read the live testing data, first send the string "TD?" then send the GPIB command to read.
For RS-232 the response will be sent automatically to the controller. The instrument will send a
string of parameters separated by commas for each meter on the display example the data for an
ACW test might be as follows: "01,ACW,Dwell,3.00,1.25,0.00,2.5" this represents an ACW
test at step 1, 3.00KV output voltage, 1.25mA total current, 0.00mA real current and the
elapsed time for Dwell cycle is 2.5 seconds.
118
8.11. Non Volatile Memory
The instrument saves each parameter in non-volatile memory when the file save "FS" command
is used to save the file. The non-volatile memory has a limited write cycle life, therefore for
programmers who wish to send all parameters before executing each test the "FS" command
should not be used. The parameters will be stored in the CPU's Random Access Memory
(RAM) until another memory location is selected. However, settings written to RAM from
GPIB/RS-232 mode will be lost when power is shut down. Parameter changes to RAM are
unlimited and will not effect the life of the internal non-volatile memory chip.
FOR MORE INFORMATION ON IEEE (GPIB) PLEASE CONTACT
The Institute of Electrical and Electronic Engineers, Inc.
345 East 47th Street,
New York, NY 10017
( 1-212-705-7018 (Communications Society of IEEE)
Internet: www.ieee.org
119
9. Options
Introduction
This section contains a list and descriptions of available factory installed options at the time of
this printing. The list of options contains an option code number that can be referenced on the
data plate on the rear panel of the unit.
Option Label
On the rear panel of the instrument, you will find a label that contains the option code.
For example, your options code would appear as follows:

Fitted with option 01 ............................................................. OPT: 01
Fitted with option 01 and 05................................................... OPT: 0105
Omnia Options
Option List
Code Description
01 Internal Scanner
02 Continuous Output 8105, 8106
03 Dual Remote Test Switch
04 3 Remote Memories Send 8105, 8106
05 7 Remote Memories Send 8105, 8106
06 Cold Resistance 8105, 8106
07 Data Storage Card
08 Printer Card
10 GPIB
01 8 Channel Scanner with Continuity

The Scanner option provides 8 High Voltage/Continuity channels and 8 Ground
Bond/Continuity channels on the rear panel. The High Voltage/Continuity channels can be set to
a High (Continuity) or Low level giving the capability to test from one channel to another
channel or from any channel to a common Low or Return point. The channels can be connected
in parallel if desired but there is only one leakage current measurement for all channels. The
ground bond/continuity channels can test only from one channel to the common Return and only
one channel may be used for each test.
specifications that apply to the standard instrument.
The common (G-COM.) connection of the ground bond/continuity outputs should be used
when a ground bond or continuity test requires a different Return point than the high voltage
test points require. The ground bond or continuity test will be performed between the output
120
channel selected and the ground bond common terminal. When an output channel is selected,
the Current output terminal is connected to the output channel, and the Return output terminal
is connected to the G-COM. terminal. The G-COM. terminal is connected to the main Return
output during ground bond or continuity operation, but is disconnected from the main Return
during high voltage operation. The Kelvin connection (voltage sensing) point on the ground
bond/continuity scanner is connected directly to the ground bond/continuity output channels
CH1- CH8 and the G-COM connections at the output terminals. True 4-wire measurement
through the scanner is not possible because of the Kelvin lead termination but the milliohm-
offset feature should be used to reduce measurement errors of the actual DUT.
Although the G-COM connection of the ground bond/continuity outputs provides separation
from the main Return lead output during the high voltage withstand, or insulation resistance
tests, the ground bond/continuity channels can be used to perform ground bond or continuity
tests referenced directly to the main Return lead without using the G-COM terminal for return
separation. However, when using the main Return lead during scanner applications the Return
lead Kelvin connection point is not effective. The Return lead Kelvin connection is terminated
at the alligator clip of the test lead but the G-COM terminal has an internal Kelvin connection
that shorts out the test lead Kelvin connection. Therefore, the resistance of the Return test lead
will be measured during the test and should be offset using the milliohm-offset feature to reduce
measurement errors of the actual DUT.
Descriptions for operating the scanner are contained within the standard operating and setup
procedures. The additional accessories provided come complete with assembly instructions.
Please refer to the instructions when installing the scanner channel connections.
specifications that apply to the standard instrument with the exception of one Ground
Bond/Continuity channel limitation. Due to the characteristics of general-purpose High Current
relays, some additional contact resistance cannot be prevented. Although this contact resistance
can be offset using the milliohm-offset feature of the instrument, there will be some variation of
the contact resistance because the relay must open and close. Each relay closure may represent
a different resistance value. The Ground Bond/Continuity channels will have the following
characteristics:
Ground Bond/Continuity Channel Resistance Deviation

Deviation (Relay Contact) Test Current
6mΩ maximum ≥10A
121
02 Continuous Output (Models 8105 and 8106)
This option allows the user to test a DUT that is sensitive to interruption of the input voltage
between tests.
When this option is installed, a new soft key selection will appear on the Run Test parameter
screen. The new soft key is called “Continuous”and when pressed will toggle between “ON”
and ”OFF”. The new Run Test parameter screen will appear as follows:
Run Test
Volt-HI xxxxV Power-HI xxxxW
Volt-LO xxxxV Power-LO xxxxW
Amp-HI xxx.xA PF-HI x.xxx
Amp-LO xxx.xA PF-LO x.xxx

Dwell Time xxx.xs
Delay Time xxx.xs
Leakage-HI xxx.xuA
Continuous ON
Leakage-LO xxx.xuA
RANGE: Defaults
Volt-HI
0 – 277V
With the Continuous Output option, the DUT will be connected to the power during and
between test steps. The DUT Outputs, Line and Neutral are disconnected from Power source
only after multiple tests are completed, the RESET button is pushed, or a failure occurs.
The Single Step function is used to temporarily override the connection between test steps.
When the Single Step = ON the instrument will pause after each step. With this option,
continuous output voltage will be provided to the DUT during the pause. A warning will flash
on the screen informing you that the “DUT Output is Active”during the pause. If the test
button is not pushed within ten seconds, the DUT Output voltage will automatically shut off.
It is important to note that no programmed trip points are monitored during the pause of Single
Step even though the DUT Output is active. Although the trip points are not monitored during
a pause, the short circuit protection is always enabled.
DO NOT TOUCH THE DEVICE UNDER TEST BECAUSE

WARNING
POWER REMAINS ON.
If the trip point failure occurs, then the output voltage to the DUT will be interrupt immediately.
All other specifications remain the same. Refer to the Specifications section of this manual, for a
complete list of all specifications.
122
03 Dual Remote Test Switches
The Dual Remote Test Switch option allows the user to configure dual palm switches for safe
production line operation.
To activate the option, you must access the Setup System Menu from the Main Menu screen.
This process is described in section 4.1 Setup System Menu in this manual. Once at the Setup
System screen press the Hardware softkey. The Hardware screen will appear as follows:
Hardware
Alarm Volume 5
LCD Contrast 6
GPIB Address 22
Smart GFI OFF
PLC Remote ON
DUT-HV Setup OFF
Dual TEST ON
Using the available softkeys set the PLC Remote to ON and Dual Test to ON.
The rear panel remote interface is reconfigured to allow two test switches instead of the
standard reset and test inputs. The two test switches have to be pressed within 0.5 seconds to
activate the test process. The two test switches must remain closed to continue the test. If
either of the test switches is released, the process will be shut down immediately. The functions
of the Test and Reset switches on the front panel will be disabled if the dual test switches are
enabled. When the Dual Test parameter is turned OFF, the Test and Reset switches on the
front and rear panel behave the same as the standard instrument, and are controlled by the PLC
Remote On/Off selection.
123
04 3 Remote Memories Send (Models 8105 and 8106)
With this option installed, the PLC remote signal output has been reconfigured to provide a 2-
Bit digital control signal that is menu selectable from the Run Test or LLT parameter screen. In
this configuration, the PLC remote signal output may be used to control a compatible device
such as the AC 1000 power supply.
This option is provided with a cable which is designed to interconnect the Omnia PLC output to
the AC 1000 Remote I/O input. This cable, part number 38774, is custom and can only be
purchased from Associated Research.
When using this option with an AC 1000, be sure to power up the Omnia first and then power
up the AC 1000. When powering down the instruments, power down the AC 1000 first and
then power down the Omnia. The Omnia is in an undetermined state without power and may
cause inadvertent memory activation of the AC 1000. If you would like to operate the AC
1000 independently of the Omnia, either disconnect the interface cable or disable the PLC
remote on the AC 1000.
The Remote Memories send signals are provided by two normally open internal relays. These
are normally open free contacts and will not provide any voltage or current. The ratings of the
contacts are 1A / 125 VAC ( 0.5 ADC ).
With this option, a new soft key selection will appear on the Run Test parameter or LLT
parameter screen. In the LLT parameter screen it will be necessary for you to press the “More”
softkey to access the PLC control parameter. The new soft key, called PLC Control will toggle
between M1, M2, and M3 when pressed.
Setting the PLC control selection to M1, M2, and M3 will create different digital states at Bit 0
and Bit 1 of the PLC Remote Signal Output (refer to the PLC Signal Output drawing below).
The different states are described in the truth table below. The “Not used”state is undefined
and cannot be programmed for use.
SIGNAL OUTPUT
FAIL PASS
BIT 1 BIT 0 Test Voltage Setting

5 1 0 0 Not used
0 1 M1
1 0 M2
9 6
1 1 M3
0 = OPEN 1 = CLOSED
BIT 0
BIT 1
124
Because the relay that normally provides the processing signal has been reconfigured for voltage
control, the Fail and Pass signals have been reconfigured to provide Pass, Fail, and Processing
signals. The different states of the Fail and Pass signals are described in the truth table below.
FAIL PASS Condition

0 0 After RESET is pressed
0 1 Pass
1 0 Fail
1 1 Processing
0 = OPEN 1 = CLOSED
For questions related to the standard configuration of the PLC remote, please refer to the
section titled Connection of Remote I/O in the Operations manual.
The following Test Parameter Editing GPIB commands may be used to control the memory
send selection.
Types
EPM n, n=1-3 Edit PLC Memory RUN 1=M1, 2= M2, 3=M3
EPM? Send LLT
The ADD command can also be used. The memory selection should be inserted as the last
parameter and should use full text as indicated on the LCD screen such as M1 or M2.
05 7 Remote Memories Send (Models 8105 and 8106)

This option provides a dedicated signal output connector that is added to the rear panel of the
LLT card. The new signal output connector can be used to control a compatible device such as
an AC 1000 power supply. The output is a 3-bit digital control signal that is menu selectable at
the Run Test or LLT parameter screen.
This option is provided with a cable which is designed to interconnect the Omnia LLT card 9-
pin output to the AC 1000 Remote I/O input. This cable, part number 38772, is a standard 9-
pin female to 9-pin male.
When using this option with an AC 1000, be sure to power up the Omnia first and then power
up the AC 1000. When powering down the instruments, power down the AC 1000 first and
then power down the Omnia. The Omnia is in an undetermined state without power and may
cause inadvertent memory activation of the AC 1000. If you would like to operate the AC
1000 independently of the Omnia, either disconnect the interface cable or disable the PLC
remote on the AC 1000.
125
The Remote Memories send signals are provided by three high voltage, high current Darlington
drivers. These are open collector devices capable of sinking 350mA at voltages as high as 95
VDC.
With this option installed, a new soft key selection will appear on the Run Test or LLT
parameter screen. In the LLT parameter screen it will be necessary for you to press the “More”
softkey to access the PLC control parameter. The new soft key, called PLC Control will toggle
between M1 through M7 when pressed.
Setting the PLC Control selection to M1 through M7 will create different digital states at Bit 0,
Bit 1, and Bit 2 of the PLC Remote Signal Output (refer to the PLC Signal Output drawing
below). The different states are described in the truth table below. The “Not used”state is
undefined and cannot be programmed for use.
OMNIA
BIT 2 BIT 1 BIT 0 Test Voltage
LLT 9-PIN OUTPUT Setting
0 0 0 Not used
5 1
0 0 1 M1
0 1 0 M2
9 6
0 1 1 M3
BIT 0 1 0 0 M4
BIT 1 1 0 1 M5
1 1 0 M6
BIT 2 1 1 1 M7
0 = OPEN 1 = CLOSED
The following Test Parameter Editing GPIB commands may be used to control the memory
send selection.
Types
EPM n, n=1-7 Edit PLC Memory RUN 1=M1, 2= M2, 3=M3, 4=M4,
EPM? Send LLT 5=M5, 6=M6, 7=M7
126
06 Cold Resistance (Models 8105 and 8106)
This option is only available in the 8105 and 8106 and provides the added ability to measure
resistance at the Line and Neutral connectors on the LLT card.
With this option installed, a new soft key selection will appear on the Continuity parameter
screen called “Continuity”. Please refer to the screen below:
Continuity
Hi-Limit xx.xxΩ
Lo-Limit xx.xxΩ
Dwell Time xxx.xs
Offset xx.xxΩ
Scanner
Channel x
Press TEST For Continuity MAINS

Automatic Offset
Setting.
RANGE: Defaults
Hi-Limit
0 – 10.00Ω
The “Continuity”selection is short for continuity connection and refers to which connection
points may be utilized for the continuity measurement. The new continuity parameter has three
toggle selections MAINS, GND, and OFF.
When MAINS is selected, continuity may be measured from the L and N connections of the
LLT card or from the front or rear panel current and return. Do not use the front and rear panel
connections at the same time as the L and N connections as this will affect the continuity
reading.
When GND is selected, continuity may be measured from the LLT card’s GND and Case
connections or from the front or rear panel current and return connections. Do not use the
front or rear panel connections at the same time as GND and CASE connections as this will
affect the continuity reading.
When OFF is selected you may only use the front or rear panel current and return connections
to connect the continuity DUT. Use the OFF selection when using the 8105 or 8106 with an
external scanner, as this will provide isolation between the LLT card and external scanner
connections.
As a safety precaution, Cold Resistance testing is not allowed directly after a RUN or LLT test.
If you setup a Continuity test directly after a Run or LLT test the MAINS parameter will not be
available. If you attempt to insert a Run or LLT test before a Cold Resistance test, the
instrument will give an error beep and not allow the insertion of the test step. Not allowing
Cold Resistance testing directly after a RUN or LLT test prevents any residual DUT voltage
from possibly damaging the instrument.
The following Test Parameter Editing GPIB commands may be used to control the new toggle
parameter.
127
Types
ECR n, n=0-2 Edit Cold Resistance RUN 0= GND, 1= OFF, 2=MAINS
ECR? Connection LLT
The specifications for the 10k continuity remain the same with this option installed.
07 Data Storage Card

This option gives the user capabilities for serial communication, barcode scanning, and saving
test results onto a USB Flash memory drive.
The Data Storage Card has three input/output ports. These ports are shown in Figure 3.
Figure 3.
The USB-A port is used for the connection of the USB Flash memory drive. Note: Please use
the USB Flash memory drive that was supplied with the unit. Proper downloading can
only be guaranteed with the use of this drive. The port labeled “Barcode”is a PS/2-type
connector that is used for the connection of a barcode scanner. The 9-pin D-type subminiature
connector labeled “RS232/RS485”is for the connection of the Omnia to an RS232 or RS485
communication bus. To configure all of the features of the Data Storage Card, use the Data
Card Settings menu as seen below.
To navigate to the Data Card Settings menu, select the Setup System softkey from the Omnia
Main Menu and then select the Data Card Settings softkey in the Setup System menu. A brief
description of the settings follows:
128 Data Card

Results Limit 000000
Time Limit 0days
RS485 Address 5
Results Limit
The Results Limit allows the user to receive an alert message on the display of the Omnia when
the total number of results saved on the Data Storage Card’s internal Flash memory has
exceeded the predefined limit. This value can be set from the default value of “0”(disables the
function) to 100,000. At the conclusion of a test file, if the total results on the internal Flash
memory exceed the Results Limit, the following message will display:
Data Card Alert

T h e n umb er of res u l t s has
e x c e e ded t he R esu l t s Limit.
P r e s s EN TE R to pr o c e ed and
d i s p l ay th is m ess a g e again.
P r e s s EX IT to pro c e e d and
d i s a b le th is m ess a g e .
The message gives two options: Pressing Enter will clear the message and display it again at the
end of the next test file execution. Pressing Exit will clear the message and not display it again
unless the unit is re-booted, or the user deletes all previous results and the total results are
exceeded once more.
Time Limit
The Results Limit allows the user to receive an alert message on the display of the Omnia when
any of the results saved on the Data Storage Card’s internal Flash memory are older than the
predefined setting. The Time Limit can be set to its default value of “0 days”(function is
disabled) to 99 days. When the Time Limit is exceeded the following message will appear on
the Omnia’s display:
129
Data Card Alert
Test results have exceeded
the Time Limit setting.
Press EXIT to continue.
By pressing the EXIT softkey, the message will be cleared and it won’t appear again until the
unit is re-booted or the Time Limit setting is set to a different value.
RS485 Address
This setting specifies the RS485 address of the Data Storage Card if the user intends to use the
unit in an RS485 network. This address can be set from 1-99. For more information on this
interface, see the Serial Port description below.
Test Result
The Test Result setting determines which type of test result is automatically saved to the Data
Storage Card. The possible settings are Pass, Fail, All or None. If the Test Result setting is set
to Pass, the Data Storage Card will only save results that resulted in a Pass. If the Test Result
setting is set to Fail, the Data Storage Card will only save results that resulted in a Fail. Setting
the Test Result setting to All will have the Data Storage Card record all results (pass or fail). If
the Test Result setting is set to None, no test result (pass or fail) will be saved to the Data
Storage Card’s internal memory.
Serial Port
The serial port can be set to RS232, RS485, or OFF.
RS232 Interface
When selecting RS232, the protocol for interfacing and communicating with a PC can be found
in section 8.8 RS232 Interface of this manual.
RS485 Interface
The RS485 interface of the Data Storage Card is designed to function on a two-wire (half-
duplex) RS485 network, i.e. data is received and transmitted differentially on the same pair of
wires. The RS485 cabling should be configured as shown:
Data Card Serial Port PC / Bus Controller

DATA - 6 DATA -
DATA + 8 DATA +
GND 5 GND
130
The wire used to connect the DATA signals from the Data Storage Card to the RS-485
network should be twisted pair.
Before sending a command to the RS485 enabled Data Storage Card, the unit that the
command is intended for needs to be addressed. To send the address, the following format is
used:
X <RS485 Address><line feed>
Note that there should be a character space between “X”and the RS485 address. After
addressing the unit, the command can be sent. The instrument that was last addressed will
receive all subsequent commands sent on the data bus. If the RS485 address specified is “0”,
then all RS485 instruments on the bus will receive the command. The command set used for
RS485 is the same as the command set for RS232. See section 8.8 for the RS232 command
set.
When using the RS485 bus and sending the “0”address, the instruments will not respond with
the Acknowledge (06H or 6 decimal) or Not Acknowledge (15H or 21 decimal) strings after a
command is sent, and will not respond to any Query Commands.
It is also possible to combine the RS485 address and the desired instrument command all in the
same string using the following format:
X <RS485 Address>;<Command><line feed>
Important note: When communicating with the Omnia using the RS485/RS232 port, results are
not saved to the Data Storage Card.
Barcode Input
The Barcode Input setting can be set to SERIAL#, PRODUCT#, SER/PROD, OFF and RUN
FILE. When the setting is SERIAL#, PRODUCT# or SER/PROD the user can scan barcodes
in the Perform Tests screen before the test is started. When the barcode is scanned, one of the
following messages will appear on the display.
S e r i a l N u m b e r :
9 5 2 9 9 9 9
Press TEST to start testing.

Press RESET to cancel.
131
P r o d u c t N u m b e r :
8 1 0 6

S e r i a l N u m b e r :
9 5 2 9 9 9 9
Product Number:
8 1 0 6
After the barcodes are scanned, pressing TEST will initiate the test sequence. Pressing RESET
will abort the TEST sequence.
The Data Storage Card allows for the re-scanning of barcodes if the previously scanned barcode
was incorrect. Re-scanning is available in the SERIAL#, PRODUCT# and SER/PROD modes.
Anytime before a test is initiated, the user can re-scan a barcode. If the user decides to re-scan
barcodes when the Barcode I/P setting is set to SER/PROD, the Data Storage Card will first
replace the data in the Serial Number field, and if the user re-scans another barcode, the Data
Storage Card will replace the data in the Product Number field.
The RUN FILE selection gives the user the ability to automatically load and execute a test file
based on what barcode is scanned from the Perform Tests screen. To completely enable this
feature, the user must name the desired test file for a particular product the exact alpha-numeric
code that is on the product’s barcode label. For example, if Product A has barcode
“123456789”, then the test file that the user would like to run when testing Product A should be
named “123456789”. Upon scanning the barcode, the Omnia will immediately execute the test
associated with that barcode. The test file name is limited to 10 characters. However, if the
user names a test file with the maximum 10 characters, this function will still initiate a test when
a product’s barcode begins with those first 10 characters even if the barcode has more than 10
characters.
When using certain features of barcoding, the Omnia’s response to the TD? and RD x?
commands will differ slightly to an Omnia with the standard RS232 interface. For all types of
tests (ACW, DCW, IR, GND, CONT, LLT, RUN) two fields are added to the end of the
standard response when the Barcode I/P setting is set to SERIAL#, PRODUCT# or
132
SER/PROD. The first field contains the Serial Number information and the second field
includes the Product Number information. Both fields are included regardless of which of these
three modes are selected. The Data Storage Card will simply substitute a “0”for the field if it is
not applicable to the setting. For example, if a user had their Barcode I/P setting set to
SERIAL#, and scanned a Serial Number with the value “123456789”, the TD? response for an
ACW test could be:
01,ACW,Pass,1.24,1.000,0.900,1.0,123456789,0
Note that there is a “0”in the Product Number field because the Barcode I/P setting is
SERIAL#.
When the Barcode I/P setting is RUN FILE or OFF, these fields are not included in the TD?
and RD x? responses.
Operation
The Data Storage Card Results menu can be viewed by pressing the Results softkey while in the
Perform Tests Screen. After doing so the following menu will be shown:
Results
Instrument
Data Card
File Name:NEW FILE
Move up Move down

Page up Page down
Pressing the softkey labeled Instrument will display the detailed results from the previously
executed test file. Pressing the softkey labeled Data Card will display the Data Storage Card
Results menu as shown below:
133
Card Results
01 ACW Pass
1200V 4.12mA Delete Result
5.0s
02 ACW Pass
5000V 1.321mA Delete ALL
20.0s
03 DCW Lo-Limit
1000V 0.0uA Download Results
10.0s
04 IR Pass
500V 468MΩ
10.0s
05 GND HI-Limit
25A >600mΩ
1.0s
Total Results
00000005
Move up Move down
Page up Page down
From this menu, the user can view the stored results, delete results, and download the results to
the external USB Flash memory drive. To navigate through the results use the up, down, left
and right softkeys on the Omnia front panel. The following message will display if the Delete
Result softkey is pressed:
Delete Result?
Press ENTER to delete.

Press EXIT to cancel.
Pressing Enter will verify that the user wants to delete all of the results on the Data Storage
Card, and pressing Exit will cancel deleting the results.
The following message will appear if the Delete ALL softkey is pressed:
Delete ALL
Results?
Press ENTER to delete.

The following menu will appear if the Download Results softkey is pressed:
134
Create File
A B C DEFGHI
J K L MNOPQR Select
S T U VWXYZ
. - _ ~ Space
File Name
N E W F I L E
Use arrow keys and alphabetic chart to

Create file names. Use front panel keys
for numeric entry.
Follow the instructions on the screen in order to create a name for the file you wish to
download. There is a limit of 8 characters for the name of the results file. Press the Enter
softkey when you have finished entering the file name. After pressing Enter, you will see the
following message:
Downloading
Data...
T i m e R e m a i n i n g : 0 0 : 0 0
This message will appear on the screen until the Time Remaining reaches 00:00. For each
download, the Data Storage Card will transfer all results in the internal Flash memory regardless
if some or all of the results have been downloaded before. During each download, the Data
Storage Card will create a .txt file that will contain the information for all of the results. To
view this .txt file, remove the USB Flash memory disk from the Data Storage Card and connect
it to a PC with a USB port.
Contents of Results File

The following is an example entry in the Data Storage Card results file for an arbitrary ACW
test:
00000001,06/14/06,08:26,TEST1,8106,0120013,M01,S01,ACW,Pass,1.24KV,0.004mA,0.000mA,1.0s
The following table gives a description of each field for the above ACW test.
Field Contents Description

00000001 Test Entry in Results File
06/14/06 Date of Test
08:26 Time of Test
TEST1 Test File Name
135
8106 Model Number of Testing Unit
0120013 Serial Number of Testing Unit
M01 Memory Number of Test File
S01 Step Number
ACW Test Type
Pass Test Result
1.24KV Test Voltage
0.004mA DUT Leakage Current (Total)
0.000mA DUT Leakage Current (Real)
1.0s Test Dwell Time
The first ten fields of the test result shown above are included in each test result regardless of
the test type. The remaining entries are specific to each test type. The following table shows, in
order, the information that will be included in each test type’s result entry.
DCW IR CONT GND RUN LLT

DUT
Test Voltage Test Voltage Test Current DUT Voltage DUT Voltage
Resistance
DUT DUT
DUT Test Dwell DUT
Leakage DUT Current Leakage
Resistance Time Resistance
Current Current
Test Dwell Test Delay Test Dwell Test Delay
DUT Power
Time Time Time Time
Test Dwell
Time
DUT
Leakage
Current
DUT Power
Factor
Note: If barcoding is used, the barcoding information will be the final entries in the results file
with Serial Number being first and Product Number being second.
136
Other Displayed Messages
Data Card Alert

T h e d ata c a r d ’s intern a l
m e m o r y is f u l l. To con t i nue
s a v i n g res u l t s t o the c a rd,
p l e a s e del e t e ol d resu l t s or
c h a n g e the c a rd’ s sett i n gs.
P r e s s EXIT t o co ntinue .
The above message occurs when the user attempts to download results from the Data Storage
Card onto the USB Flash memory drive, but there is not enough empty space on the drive to
save the file. To save the results file, the user needs to create some empty space on the USB
Flash memory drive.
Data Card Alert

T h e e xte rna l me mory driv e is
n o t c onn ect e d t o the Dat a
C a r d . To do w nlo ad result s,
p l e a s e c onn e ct the exter nal
m e m o r y d riv e .
P r e s s EX IT t o c ontinue.
The above message occurs when the total results accumulated on the Data Storage Card
exceeds 100,000. The Omnia will not allow any more tests to be run unless the user deletes the
results currently on the Data Storage Card or changes the Test Result setting in the Data Card
Settings menu to NONE. If the Test Result setting is set to NONE, the Data Storage Card will
not record test results.
Data Card Alert

T h e external memory drive is
f u ll, or does not have enough
e m pty space to save this
f i le.
The above message occurs when the user tries to download results from the Data Storage Card
without the USB Flash memory drive connected. To download results, the user needs to have
the Flash memory drive connected to the Data Storage Card.
137
Data Card Alert
T his file name already exists
i n the external memory drive.
P lease use a different file
n ame.
The above message appears when the user attempts to give a name to a results file that already
exists on the Data Storage Card.
Data Card Alert

T h e i n t e r na l m e mor y of the
D a t a C a r d i s n e ari ng
c a p ac i t y . D own l oad a n d delete
o l d r e s u l ts , o r ch an g e the
T e s t R e s u lt se t tin g t o None.
P r e ss E X I T to c ont in u e.
The above message appears when the total results accumulated by the Data Storage Card
exceeds 99,900. This is a warning to the user that the total results are nearing the capacity of
the Data Storage Card (100,000). When the total results on the Data Storage Card exceed
100,000, the Data Storage Card will cease saving results. To avoid this, the user can download
and delete the old test results, or change the Test Result setting in the Data Card Settings menu
to NONE. When the Test Result setting is set to NONE, the Data Storage Card will not record
test results.
Data Card Alert

Cannot download results:
The external memory drive is
write-protected.
The above message appears when the USB Flash memory drive is write-protected. There are
two ways to configure the memory drive as write-protected. One is to set the switch on the
138
side of the memory drive up (towards the drive’s connector). The other is to configure it
through the drive’s properties in Windows.
08 Printer Port Option

This option allows the instrument to generate hardcopy printout of the test results. The printout
can be configured to print automatically with each test, or manually by pressing a front panel
key. There is also capability to enter a device ID number to each test, that increments
automatically after each test is performed. The test can be further configured to print only
results from tests that have failed or to print all test results from every test performed.
The Printer Port is a parallel interface and should be compatible with most parallel printers. The
printer port output uses simple ASCII characters and control codes. Simply connect the printer
to the Omnia and configure the printer output using the Setup Systems menu. From the System
Setup screen, press the “Print Format”soft key. The Print Format setting screen will now be
displayed. From the Print Format setting screen, six different parameters may be accessed;
Device ID number, Mode, Test Result, Test Setting, Device ID, and Form Feed. The Print
Format setting screen will appear as follows:
Mode
From the Print Format setting screen, press the “Mode”soft key. As the soft key is pressed, the
mode will change between three available print modes Auto, Manual and OFF.
In the Auto mode, the Omnia will automatically send the test results to the printer at the end of
every complete test. The Enter key may also be used from the end of test summary screen or
the results screen to create additional printouts as needed.
Print Format
Device ID XXXXXXXXXX
Mode Manual
Test Result Fail only
Test Setting OFF
Device ID OFF
Form Feed OFF
In the manual mode, there are three different ways to create a printout. The first method is to
press the Enter key at the end of a test. The second method is to press the Enter key from the
Results screen. The third way is to press the Print Results softkey from the Perform test screen.
In the OFF mode, the printer card and printer menuing are disabled.
Test Result
139
From the Print Format setting screen, press the “Test Result”soft key. As the soft key is
pressed, the display will toggle between the words “All”and “Fail only”. This command selects
which test results will be printed, “All”, selects printing all test results and “Fail only”, selects
printing only failed test results.
Test Setting
From the Print Format setting screen, you may turn the Test Setting print enable ON and OFF
by pressing the “Test Setting”soft key. This command selects printing the test parameters as
well as the test results.
Device ID
The Device ID number is a counter that increments once every time a test is performed. The
number can be set to match the exact serial number or some portion of actual serial number of
the item under test or just used as an identifier or tracking number. From the Print Format
setting screen, use the numeric keypad to select the initial Device ID. Finish by pressing the
ENTER key. This number is not saved as part of the non-volatile system parameters, therefore
each time the power to the instrument is turned off the number will be reset to 1.
Form Feed
From the Print Format setting screen, you may turn the Form Feed ON and OFF by pressing the
“Form Feed”soft key. This command forces a form feed after each complete test sequence.
When the form feed is turned off, the signature line will not appear. When the form feed is
turned off the pages will break whenever the page is determined to be full by the printer.
140
Sample Printer Outputs
The following is a sample print of a two step test with the Print Format settings as follows:
Test Results: All, Test Setting: ON, Device ID: ON, Form Feed: ON
= = = = = = = = = = = = = = = = = = = = = = = = = == = = = = = = = = = = = == == = = = = = = = = =
Model: OMNIA 4 Serial Number: 9991006 Time: 14:23:18 Date: 03/30/01
Device ID: 0123456789 Test File: ARTEST1
= = = = = == = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = =
TEST 01 Setting: ACW
Voltage xxxxV HI-Limit T xx.xxmA LO-Limit T xx.xxmA
Ramp UP xxx.xs Dwell Time xxx.xs Ramp Down xxx.xs
Arc Sense xx HI-Limit R xx.xxmA LO-Limit R xx.xxmA
Frequency 60Hz Arc Detect ON Continuity ON
Scanner HHHLLLHLHL
TEST 01 Result: Pass

Voltage xxxxV Total I xx.xxmA Real I xx.xxmA
Time xxx.xs
- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
TEST 02 Setting: GND
Current xx.xxA Voltage x.xxV HI-Limit xxxmohms
LO-Limit xxxmohms Dwell Time xxx.xs Offset xxxmohms
Scanner-CH 0 Frequency 60Hz
TEST 02 Result: Fail Fail Type: HI-Limit

Current xx.xxA Resistance >600mohms
Time xxx.xs
- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
Tested By:_______________________
141
The following is a sample print of a two-step test with the Print Format settings as follows:
Test Results: Fail Only, Test Setting: OFF, Device ID: OFF, Form Feed: ON
The Test file and results are the same as the first example.
= = = = = = = = = = = = = = = = = = = = = = = = = == = = = = = = = = = = = == == = = = = = = = = =
Test File: ARTEST1
= = = = = == = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = =
TEST 02 Result: Fail Fail Type: HI-Limit
Current xx.xxA Resistance >600mohms
Time xxx.xs
- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
Tested By:_______________________
142
The following is a sample print of a single step test ( performed repeatedly) with the Print
Format settings as follows:
Mode: Auto, Test Results: All, Test Setting: OFF, Device ID: ON, Form Feed: OFF
= = = = = = = = = = = = = = = = = = = = = = = = = == = = = = = = = = = = = == == = = = = = = = = =
= = = = = == = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = =
Time xxx.xs
- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
= = = = = = = = = = = = = = = = = = = = = = = = = == = = = = = = = = = = = == == = = = = = = = = =
= = = = = == = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = =
Time xxx.xs
- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
= = = = = = = = = = = = = = = = = = = = = = = = = == = = = = = = = = = = = == == = = = = = = = = =
= = = = = == = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = =
Time xxx.xs
- - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
The page will break whenever the printer determines the page is full and will not display a
signature line. The device ID will continue to increment every time the test is performed until
the instrument is powered down.
10 GPIB Interface
This option may be substituted for the RS232 interface. This option provides all of the function
control of the RS232 interface with the addition of SRQ functions. All commands can be found
in section 7. Bus Remote Interface GPIB/RS-232 of this manual.
143
10. Calibration Procedure
This instrument has been fully calibrated at the factory in accordance to our published
specifications. It has been calibrated with standards traceable to the National Institute
Standards & Technology (NIST). You will find in this manual a copy of the "Certificate of
Calibration". It is recommended that you have this instrument re-calibrated and a safety check
done at least once per year. AR recommends you use "Calibration Standards" that are NIST
traceable, or traceable to agencies recognized by NIST to keep this instrument within published
specifications.
End user metrology standards or practices may vary. These metrology standards determine the
measurement uncertainty ratio of the calibration standards being used. Calibration adjustments
can only be made in the Calibration mode and calibration checks or verifications can only be
made while operating in Test mode.
10.1. Warranty Requirements

AR offers a standard one-year manufacture’s warranty. This warranty can be extended an
additional four years provided that the instrument is returned each year to Associated Research,
Inc. for it’s annual calibration. In order to be eligible for the extended warranty instruments
must be returned to Associated Research, Inc. for calibration service at least once every twelve
months.
A return material authorization number (RMA) must be obtained from AR before returning this
instrument for calibration. To obtain an RMA number or for information regarding our warranty
please contact our Customer Support Representatives at 800-858-TEST.
Required Calibration Equipment

• 0 - 5 KV AC/DC Metered Voltage Divider.
• 40 mA AC, 20 mA DC Ammeter.
• 0 - 40 mV AC Millivoltmeter.
• 40 AAC Current Shunt.
• 10Ω, 0.25 watt resistor, 250 volt.
• 50MΩ, 0.25 watt resistor, 1000 volt.
• 500MΩ, 0.25 watt resistor, 1000 volt.
• 100KΩ, 175 watt resistor, 5000 volt.
• 1MΩ, 20 watt resistor, 5000 volt.
• Adjustable DC power supply, 0.032 volts to 20 volts.
• Adjustable AC power supply 0-277 volts, 5KVA.
• Low impedance adjustable load 10Ω-30Ω, 4000 watts.
144
10.2. Calibration Initialization
Press and hold the calibration key on the rear panel with a pen, pencil, or small screwdriver
while powering ON the Omnia. The Omnia enters calibration mode after the power on
sequence is complete. The Initial Calibration screen will appear as follows:
Calibration
1 A C H ipo t V olt age ok Co n n ect the
2 D C H ipo t V olt age ok 10 0 K Ω load in
3 I R DC V o l t age o k se r i es with the
4 A C 40.0 0 m A ra n g e 40 m A AC standard
5 A C 3.50 0 m A ra n g e cu r r ent meter.
6 D C 20.0 0 m A ra n g e
7 D C 3.50 0 m A ra n g e
8 D C 350. 0 u A ra n g e
9 I R 999 . 9 M ra n g e
1 0 I R 9.9 9 9 G ra n g e
1 1 I R 50. 0 0 G ra n g e
1 2 G ND Bon d V olt a g e
1 3 G ND Bon d C urr e n t W h e n the load is
1 4 A C Real 2 0 0W, 4 0 mA c o n nected, press
1 5 A C Real 2 0 W,4 0 m A T E S T to start the
1 6 A C Real 2 0 W,3 . 5 mA c a l ibration
1 7 A C Real 2 W ,3. 5 m A p r o cess.
Move up Move down
The Calibration screen is separated into three sections. The left half of the screen lists all of the
calibration points necessary for an accurate calibration of the instrument. The right half of the
screen is split into two smaller screens. The upper right section of the screen displays meter and
load information required to perform the selected calibration. The lower right section of the
screen contains prompts that will help guide you through the calibration process.
10.3. Selecting Specific Calibration points

When the calibration is initialized, the first calibration point is automatically selected. The
calibration is set up so that as each calibration point is completed the highlighted area will
automatically scroll to the next calibration point.
To manually select calibration points, use the up and down arrows to scroll the highlighted area
to the desired calibration point. The load/meter screen and prompt screens will automatically
update for the calibration point selected.
10.4. Calibration points

Each calibration point requires different loads, standards and process. As each point is selected,
the load/meter screen and prompt screens will display the meter, load and process information
required to complete the calibration process for the selected point.
145
10.4.1. Calibration of AC Hipot Voltage
The load/meter screen and prompt screens will contain the following text for this calibration
point:
Upper Right Screen Lower Right Screen Lower Right Screen

Load/Meter Prompt Prompt (Cal. Active)
Connect the standard When the standard voltmeter Enter Standard Voltage
5KVAC kilovolt meter from is connected, press TEST to Reading.
H.V. to Return. start the calibration process.
Press the TEST button to activate the calibration. After the calibration is activated, the lower
right screen will change to the text indicated in the table above (Cal. Active). Read the
measurement from your standard and enter it using the numeric keypad. You may now store
the new calibration number by pressing the ENTER key or escape by pressing the EXIT key or
the RESET button.
10.4.2. Calibration of DC Hipot Voltage

point:

5KVDC kilovolt meter from is connected, press TEST to Reading.
the RESET button.
10.4.3. Calibration of IR DC Voltage

point:

1KVDC kilovolt meter from is connected, press TEST to Reading.
146
the RESET button.
10.4.4. Calibration of AC 40mA Range

point:

Connect the 100KΩ load in When the load is connected, Enter Standard Current
series with the 40mAAC press TEST to start the Reading.
standard current meter. calibration process.
the RESET button.
10.4.5. Calibration of AC 3.5mA Range

point:

series with the 3.5mAAC press TEST to start the Reading.
standard current meter. calibration process.
the RESET button.
147
10.4.6. Calibration of DC 20mA Range
point:

series with the 20mADC press TEST to start the Reading.
standard current meter from calibration process.
H.V. to Return.
the RESET button.
10.4.7. Calibration of DC 3.5mA Range

point:

series with the 3.5mADC press TEST to start the Reading.
H.V. to Return.
the RESET button.
10.4.8. Calibration of DC 350.0µA Range

point:

series with the 350.0µADC press TEST to start the Reading.
H.V. to Return.
148
the RESET button.
10.4.9. Calibration of IR 999.99M Range

point:

Connect the standard 50MΩ When the standard load is Automatic Calibration
load from H.V. to Return. connected, press TEST to Processing.
start the calibration process.
right screen will change to the text indicated in the table above (Cal. Active). This calibration
is automatic and does not require data entry.
10.4.10. Calibration of IR 999.9M Range

point:

Connect the standard 50MΩ When the standard load is Automatic Calibration
load from H.V. to Return. connected, press TEST to Processing.
start the calibration process.
10.4.11. Calibration of IR 50000M Range

point:

Connect the standard When the standard load is Automatic Calibration
500MΩ load from H.V. to connected, press TEST to Processing.
Return. start the calibration process.
149
10.4.12. Calibration of GND Bond Voltage

point:

12VAC voltmeter from is connected, press TEST to Reading.
Current to Return. start the calibration process.
the RESET button.
10.4.13. Calibration of GND Bond Current

point:

Connect the standard When the standard current Enter Standard Current
40AAC current meter from meter is connected, press TEST Reading.
Current to Return. to start the calibration process.
the RESET button.
150
10.4.14. Calibration of AC Real 200W, 40mA
point:

H.V. to Return.
the RESET button.
10.4.15. Calibration of AC Real 20W, 40mA

point:

H.V. to Return.
the RESET button.
10.4.16. Calibration of AC Real 20W, 3.5mA

point:

Connect the 1MΩ load in When the load is connected, Enter Standard Current
H.V. to Return.
151
the RESET button.
10.4.17. Calibration of AC Real 2W, 3.5mA

point:

Connect the 1MΩ load in When the load is connected, Enter Standard Current
H.V. to Return.
the RESET button.
10.4.18. Calibration of DC Continuity 10Ω

point:

Step 1: Short the Current When the leads are shorted, Automatic Calibration
and Return leads together. press TEST to start the Processing.
calibration process.
Step 2: Connect the standard When the load is connected, Automatic Calibration
10Ω load from Current to press TEST to start the Processing.
Return. calibration process.
10.4.19. Calibration of Run Test Voltage

point:
152
Step 1: Disconnect power to With the DUT I/P input open, Automatic Calibration
the DUT I/P input. press TEST to start the Processing.
calibration process.
Step 2: Connect 250VAC Press TEST to start the Enter Standard Voltage
and a standard voltmeter to calibration process. Reading.
the DUT I/P input.
the RESET button.
10.4.20. Calibration of Run Test Current

point:

Set DUT I/P 120-277VAC. When the load is connected, Enter Standard Current
Connect a 15 Amp load at press TEST to start the Reading.
DUT output in series with calibration process.
current meter.
the RESET button.
10.4.21. Calibration of Run Test Power

point:

Set DUT I/P voltage to When the load is connected, Enter Standard Power
225VAC. Connect a 25 ohm press TEST to start the Reading.
load. Connect power meter calibration process.
in series with the DUT.
153
the RESET button.
10.4.22. Calibration of Run Test Leakage

point:

Connect 18 VAC to the When the power supply and Enter Standard Current
DUT I/P input. Connect a meter are connected, press Reading.
standard current meter to the TEST to start the calibration
DUT outputs from L to G. process.
the RESET button.
10.4.23. Calibration of LLT MD V-Offset

point:

Disconnect power to the When the leads are shorted, Automatic Calibration
DUT I/P input. Short press TEST to start the Processing.
Probe-HI and Probe-LO calibration process.
154
10.4.24. Calibration of LLT MD Volts x 1
point:

Connect 8.0VDC and a When the power supply and Enter Standard Voltage
voltmeter to Probe-HI + and meter are connected, press Reading.
Probe-LO -. TEST to start the calibration.
the RESET button.

point:

the RESET button.

point:

155
the RESET button.

point:

the RESET button.

point:

the RESET button.
10.4.29. Calibration of LLT MD: UL 544NP measuring device

point:

Connect 2.2VDC in series When the power supply and Enter Standard Current
with a current meter to meter are connected, press Reading.
Probe-HI + and Probe-LO -. TEST to start the calibration.
156
right screen will change to the text indicated in the table above (Cal. Active). You may now
store the new calibration number by pressing the ENTER key or escape by pressing the EXIT
key or the RESET button.
10.4.30. Calibration of LLT MD: UL 544P measuring device

point:

the RESET button.
10.4.31. Calibration of LLT MD: IEC601-1 measuring device

point:

the RESET button.
157
10.4.32. Calibration of LLT MD: UL1563 measuring device
point:

the RESET button.
10.4.33. Calibration of LLT MD: IEC60990 FIG4 measuring device

point:

the RESET button.
10.4.34. Calibration of the External measuring device

point:

158
the RESET button.
10.4.35. Calibration of LLT MD: IEC 60990 FIG5 measuring device

point:

the RESET button.
10.4.36. Calibration of LLT MD: IEC 60990 FIG3 measuring device

point:

the RESET button.
159
11. Replacement Parts List
Rev: H 10/18/2006 ECO 5221
Part Number Qty. Ref. Designator Description
Supplied Accessories
38788 2 - 3U Rack Mount Bracket
38787 2 - 3U Rack Mount Handle
38549 4 - Screw for Rack Mount Handle
38503 1 - Fuse 10A 250V Slow-Blow 20mm
04040A-08 1 - High Voltage Cable
37863 1 - RS232 Cable
33189 1 - Cable Input Cordset USA
38071 1 -(8105 and 8106) Cable Input Cordset USA 15A
38075 1 - Interlock Connector
38482 1 - Adapter Box (8104)
38578 1 - Adapter Box (8105 and 8106)
02100A-13 2 -(8105 and 8106) Cable Assembly Return
CBLHC40- 1 -(8105 and 8106) Cable Assembly High Current Lead
10TL
38489 1 - Cable Assembly High Current Output
38490 1 - Cable Assembly High Current Return
Panel Components
37781 1 - Fuse Holder 20mm
37478 2 - High Voltage Connector
37555 1 - Power Switch 2P 10A/250V
37571 1 - Earth Connector
37806 1 TEST Test Switch Green Lighted
37807 1 RESET Reset Switch Red Lighted
37854 1 TEST Replacement Bulb 28V
37605 1 RESET Replacement Bulb 33V
38101 1 - Feet Kit w/o Rubber Inserts
38102 4 - Rubber Insert for Feet
38225 1 - Graphic LCD Display
38487 2 - Socket 80 Amp Red
38488 2 - Socket 80 Amp Black
PCB Assemblies
38600 1 ANG7742 Analog Board (8104)
38791 1 ANG7742 Analog Board (8105 and 8106)
38194 1 REA7500 Real Current Board
38195 1 HV7500 High Voltage Control Board
38197 1 KEY7500 Key Board
38198 1 PWR7500 Input Protection Board
37862 1 RS232 RS232 Interface Board
38305 1 CGP-03 GPIB Interface Board
38308 1 MD7500 Measuring Device Board
38311 1 CPR-01 Printer Card
38528 1 AMP7742 Amplifier Board
160
38543 1 CSU7500 Scanner Control Board
38547 1 LLT7742 Run/LLT Board (8105 and 8106)
38551 1 CON7500 Main Control Board
LLT Module (Includes 38547 and all replacement cables)
38548 1 2LLT7742 LLT Kit (8105 and 8106)
Internal Components
37374 1 IC 36 IC 27512 EEPROM
38533 1 T1 Input Transformer
38534 1 T2 High Voltage Output Transformer
38235 1 IC 26 IC 29C020 EEPROM
38245 1 IC 40 IC W78E516B
• For safety tester interconnect cables, refer to INSTRUMENT CONNECTIONS; section 1.3
Specific Integrated System Connections
161
12. Schematic Index
Drawing Number Description Reference Pages
Designator
S08104 Wiring Diagram 8104, 8105, 8106 - 2
S38551 Main Control Board CON7500 4
S38600 Analog Board ANG7742 2
S38194 Real Current Board REA7500 1
S38195 HV Control Board HV7500 1
S38528 Amplifier Board AMP7742 1
S38495 Keypad Board KEY7540 1
S38198 Input Voltage Selection Board PWR7500 1
S38543 Scanner Board CSU7742 2
S38547 Run/LLT Board (8105 and 8106) LLT7742 8
S38308 External Measuring Device Board MD7500 1
S37745 GPIB Interface Board CGP-03 1
S37814 RS-232 Interface Board RS232 1
S38311 Printer Card CPR-01 1
S38801 Data Card USB 2
162
Index
AC Withstand.............................................................. 36, 44, 49, 53, 57, 58, 59, 60, 61, 83, 87
Adapter Box................................................................................17, 29, 30, 31, 32, 33, 78, 160
Arc .............................................................................. 15, 20, 59, 61, 76, 87, 88, 106, 108, 141
Benefits ................................................................................................................................. 14
Breakdown........................................................................................................................ 3, 88
Calibration Alert ...................................................................................................14, 38, 40, 41
Calibration Procedure .......................................................................................................... 144
Charge-LO .................................................................... 20, 22, 59, 61, 62, 63, 76, 88, 104, 106
Connected Steps........... 17, 35, 37, 49, 51, 53, 55, 80, 81, 82, 85, 104, 106, 107, 113, 140, 145
Continuity Test ........................................................................11, 16, 59, 64, 65, 104, 120, 121
Contrast.............................................................................................................. 25, 42, 77, 111
Controls ..........................................................................20, 29, 31, 33, 38, 48, 50, 68, 80, 116
DC Withstand.............................................................. 44, 49, 53, 57, 59, 60, 61, 62, 63, 83, 87
Default Parameters ....................................................................................... 36, 57, 60, 76, 106
Delay........................................ 22, 26, 28, 58, 59, 63, 67, 69, 75, 76, 77, 86, 98, 106, 107, 108
Dielectric Withstand Test....................8, 9, 59, 76, 104, 105, 106, 108, 109, 110, 113, 118, 141
Discharge ...............................................................................................................7, 10, 11, 21
Dwell.............................. 21, 23, 24, 26, 59, 61, 64, 65, 67, 76, 77, 86, 106, 107, 108, 118, 141
Edit Parameters ............ 39, 41, 48, 49, 50, 53, 57, 60, 62, 63, 65, 108, 109, 110, 125, 126, 128
Exit Key .....................................................................................................................46, 55, 88
Fail Stop................................................................ 46, 48, 51, 52, 67, 69, 80, 82, 105, 107, 111
Features........................................................................................................................8, 14, 15
File
Create ...........................................................................................................................51, 53
File Create.....................................................................................................................51, 53
File Recall ...............................................................................................................45, 46, 77
File Setup ..........................................................................................................50, 51, 53, 55
Recall......................................................................................................................45, 46, 77
Setup................................................................................................................. 50, 51, 53, 55
Frequency................... 9, 20, 21, 23, 57, 59, 61, 65, 66, 72, 74, 76, 77, 106, 107, 108, 109, 141
Front Panel Controls.............................................................................................................. 29
Glossary .................................................................................................................................. 3
GPIB.................................... 25, 42, 77, 100, 101, 102, 103, 112, 118, 119, 120, 143, 160, 162
Ground Bond Test ................................................................................................................. 11
HI-Limit ............................... 28, 58, 59, 61, 62, 63, 64, 65, 76, 77, 87, 106, 107, 109, 141, 142
Hypot ...................................................................................................................................... 3
Insulation Resistance Test.................................................................................................. 3, 11
Interlock........................................................................................25, 32, 37, 99, 112, 113, 160
LCD ..............................................................................................14, 25, 29, 42, 105, 113, 160
Leakage
Applied Part ............................................................................................................12, 34, 71
Applied Part Leakage Current .................................................................................12, 34, 71
Earth .......................................................................................................................12, 68, 71
Earth Leakage .........................................................................................................12, 68, 71
Enclosure ........................................................................................................................... 12
Enclosure Leakage Current................................................................................................. 12
Leakage-HI ............................................................................58, 67, 68, 69, 75, 77, 107, 109
Leakage-LO ...........................................................................58, 67, 68, 69, 75, 77, 107, 109
Line........................................................................................6, 12, 13, 14, 33, 69, 72, 74, 83
Line Leakage...................................... 6, 12, 13, 14, 16, 33, 52, 67, 69, 72, 74, 75, 79, 82, 83
Limits .................................................................................................................................... 87
Line Leakage Test ................................................................................................................. 12
Lockout......................................................................................................................25, 37, 99
LO-Limit ............................................20, 23, 24, 28, 59, 61, 64, 76, 77, 87, 106, 107, 109, 141
Measuring Device............... 12, 16, 28, 34, 58, 69, 71, 72, 73, 74, 156, 157, 158, 159, 160, 162
Medical Restrictions ................................................................................................................ 6
Memory........................................................25, 64, 98, 102, 104, 105, 111, 113, 115, 116, 119
Menu........................ 12, 14, 35, 36, 38, 47, 48, 49, 53, 55, 56, 80, 91, 111, 123, 124, 125, 139
Offset ....................................................................................................... 16, 79, 104, 106, 121
Operator........................................................ 5, 6, 10, 14, 15, 16, 18, 25, 29, 34, 35, 43, 71, 98
Options..........................................................................................25, 32, 41, 48, 100, 103, 120
Parameters
System Parameters ....................................................................................................111, 140
Test Parameters................................................ 44, 48, 49, 57, 58, 60, 79, 100, 102, 104, 140
Peak .................................................................................................................................75, 83
PLC............................................................. 14, 25, 42, 43, 77, 98, 99, 112, 123, 124, 125, 126
Power Factor............................................................................................ 12, 26, 27, 58, 67, 89
Printing........................................................................................................... 25, 120, 139, 141
Probe-HI ................................................34, 71, 72, 74, 107, 110, 154, 155, 156, 157, 158, 159
Probe-LO ...............................................34, 71, 72, 74, 107, 110, 154, 155, 156, 157, 158, 159
Programming............................................................................................................38, 48, 100
Quickstart.............................................................................................................................. 35
Ramp-HI ........................................................................................ 20, 59, 61, 62, 76, 106, 110
Ramping ................................................................................................................................ 86
Rear Panel Controls..........................................................................................................31, 33
Receptacle .......................................................................................... 16, 19, 31, 35, 70, 89, 97
Regulation ..................................................................................................................15, 21, 23
Remote.....6, 14, 25, 32, 37, 42, 43, 77, 87, 97, 98, 99, 100, 101, 102, 112, 113, 120, 123, 124,
125, 126, 143
Remote Interlock......................................................................................................37, 99, 112
RMS.................................................................................................................................75, 83
RS-232................................................................... i, 25, 31, 100, 103, 115, 118, 119, 143, 162
Run Test................12, 14, 52, 57, 67, 68, 69, 77, 79, 82, 83, 122, 124, 125, 126, 152, 153, 154
Safety............................................................................................ i, ii, 2, 4, 7, 8, 16, 18, 25, 35
Safety Symbols ........................................................................................................................ 2
Scanner 16, 29, 31, 32, 53, 57, 59, 61, 63, 64, 65, 66, 76, 77, 79, 106, 110, 118, 120, 121, 141,
160, 162
Channel................................................................................................. 61, 63, 64, 65, 66, 79
Control Board .................................................................................................................. 160
Internal............................................................................................................................. 120
Option.............................................................................................................................. 120
Parameter ........................................................................................................................... 57
Schematic......................................................................................................................... 162
Setup.......................................................................................................................53, 59, 79
Schematic ............................................................................................................................ 162
Schematic Index .................................................................................................................. 162
Security .............................................................................14, 25, 38, 45, 46, 47, 51, 77, 81, 82
Service Interval........................................................................................................................ 4
Setup
AC Withstand..................................................................................................................... 61
DC Withstand..................................................................................................................... 61
DUT-HV..................................................................................... 44, 60, 61, 62, 63, 153, 154
File.................................................................................................................... 104, 107, 112
Ground Continuity.........................................................................................................64, 65
Insulation Resistance .......................................................................................................... 63
Line Leakage...................................................................................................................... 69
Run Test ............................................................................................................................ 67
Scanner .................................................................................................................59, 79, 120
Setup DUT-HV............................................................ 44, 60, 61, 62, 63, 110, 122, 153, 154
Setup File .......................................................................................................... 104, 107, 112
Setup Scanner ...............................................................................................................53, 59
Setup System........................................................................................... 35, 38, 77, 123, 139
Setup Test .......................................................... 30, 48, 49, 50, 53, 55, 57, 61, 63, 64, 67, 69
System .................................................................................................... 35, 38, 77, 123, 139
Test.................................................................... 30, 48, 49, 50, 53, 55, 57, 61, 63, 64, 67, 69
Short ....................................................26, 28, 37, 50, 51, 65, 66, 74, 82, 87, 89, 122, 152, 154
Single Step ..............................................................................36, 46, 80, 81, 82, 112, 122, 143
Smart GFI .............................................................................................. 25, 36, 42, 43, 77, 112
Specifications .................................................................................................................20, 122
Test Screen.......................................................................................................................... 139
Test Station ......................................................................................................................... 5, 7
Trip Point ................................................................................................................................ 3
UL...............................................................................................8, 12, 16, 73, 74, 91, 156, 157
Unpacking ............................................................................................................................. 17
Verification.......................................................... 35, 47, 48, 72, 74, 91, 92, 93, 94, 95, 96, 112
AC Hipot ........................................................................................................................... 94
Continuity .......................................................................................................................... 92
DC Hipot ........................................................................................................................... 95
Ground Bond ..................................................................................................................... 93
IR....................................................................................................................................... 96
Warranty ......................................................................................................................1, 4, 144

Models: Model 8104 Omnia 4 Model 8105 Omnia 5 Model 8106 Omnia 6

Uploaded by

Document Informationclick to expand document information

Document Informationclick to expand document information

Copyright:

Available Formats

Models: Model 8104 Omnia 4 Model 8105 Omnia 5 Model 8106 Omnia 6

Uploaded by

Document Information

Original Title

Copyright

Available Formats

Share this document

Share or Embed Document

Sharing Options

Did you find this document useful?

Is this content inappropriate?

Copyright:

Available Formats

Models: Model 8104 Omnia 4 Model 8105 Omnia 5 Model 8106 Omnia 6

Uploaded by

Copyright:

Available Formats

OPERATION AND SERVICE MANUAL

MODEL 8104 OMNIA 4

AC/DC HIPOT WITH INSULATION RESISTANCE TESTER, GROUND BOND,

8105 INCLUDES RUN TEST

Models © Associated Research, Inc. 2006

Item 38550 Ver 1.14 Printed December 15, 2006

Address: 13860 W. Laurel Dr.

Product Name: OMNIA® Electrical Safety Compliance

Model Number: 8104/8105/8106

Conforms to the following Standards:

EMC: EN 61326:1997 + A1:1998

The product herewith complies with the requirements of the Low

The CE marking has been affixed on the device according to article

The technical file and other documentation are on file with

Associated Research, Inc.

1.2.1. Product Marking Symbols

1.2.2. Caution and Warning Symbols

Calls attention to a procedure, practice, or condition that could possibly cause

CAUTION Calls attention to a procedure, practice, or condition that could possibly

Hipot Tester: Common term for dielectric-withstand test equipment.

Insulation Resistance Tester: An instrument or a function of an instrument capable of measuring

1.4.1. Service and Maintenance

(PHONE: 1 (847) 367-4077

1.4.4. Instrument Connections

WARNING Never perform a hipot test on energized circuitry or equipment.

1.4.6. Key Safety Points to Remember

• Arrange the test station in a safe and orderly manner.

• Never touch the product or connections during a test.

• In case of any problem, turn off the high voltage first.

• Properly discharge any item tested with DC before touching connections.

1.5.1. The Importance of Safety Testing

1.6. The Different Types of Safety Tests

1.6.1. Dielectric Withstand Test

Common Applications of the Dielectric Withstand Test:

• Design (performance) testing: Determining design adequacy to meet service conditions.

• Production Line testing: Detecting defects in material or workmanship during processing.

• Acceptance testing: Proving minimum insulation requirements of purchased parts.

• Repair Service testing: Determine reliability and safety of equipment repairs.

Types of Failures only detectable with a Hipot test

• Weak Insulating Materials

• Inadequate Spacing of Components

Dielectric Withstand Test; AC verses DC

1.6.2. Insulation Resistance Test

1.6.3. Ground Bond Test

1.6.4. Run Test

1.6.5. Line Leakage Test

IF YOU SHOULD HAVE ANY QUESTIONS RELATING TO THE OPERATION OF

2.1. Unpacking and Inspection

2.1.2. Contents of the Carton

• Seal the container securely.

• Mark the container "FRAGILE" to insure proper handling.

• Please refer in all correspondence to your AR service number.

2.2.1. Work Area

2.2.2. Power Requirements

2.2.4. Environmental Conditions

This instrument may be operated in environments with the following limits:

Storage and Shipping Environment