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AUST/EEE 4174 Microwave Engineering lab

Experiment No: 11
Name of the Experiment: Introduction and calibration of Vector Network Analyzer

(a)Objective:

1) Necessity of transmission line theory in Microwave and millimeter wave devices

2) Challenges of Measurement in microwave frequency.
3) Introduction to Scattering Parameter and its usefulness
4) Introduction to Vector Network Analyzer
5) Understanding Error Model of a 2-port Network.
6) Calibration method and SOLT calibration

(b)Theory

2.1 Lumped element model and Distributed element model (Transmission line Model):

The lumped element model simplifies electrical network by considering the electrical network as combination of resistors,
capacitors, and inductors, etc. joined by perfectly conducting wires. The model also assumes the energy transfer from source

EE
to load is instant.
𝑐
Practically energy transfer is not instant, but EM field propagate in the circuit at propagation velocity (𝑣𝑝 = ). The
√𝜀𝑟
wavelength, λ, is defined as a function of the propagation speed (Vp or c) and the sine wave generator frequency (f0) in Equation
𝑣𝑝
𝜆=
/E 𝑓0

When the frequency (f0) is low, the wavelength is large, and the length of the cable is negligible compared to the size of the
wavelength. As a result, the measured voltage and current are independent of the location on the cable. As the energy transfer
ST

in the network is instant the voltage in point ‘a’ and point ‘b’ is the same (there is no voltage drop or phase change). This
situation is illustrated in Fig 1(a), and the circuit is referred to as being a lumped element circuit or lumped.
AU

Fig 1(a): Circuit response at low frequency Fig 1(b): Circuit response at high frequency
When the frequency (f0) of the source increases, the wavelength is reduced. Thus, as frequency increases, the wavelength
eventually becomes similar in size or even smaller than the length of the cable. In a scenario where the wavelength of the signal
is similar or smaller in size to the length of the cable, the measured voltage and current will depend on the position, as shown
in Fig 1(b) Thus, measuring the voltage with a voltage probe is invalid because the result will be dependent on the probe’s
position. In this scenario, the circuit must be treated as a distributed element circuit rather than as a lumped circuit.
Analysis of a distributed circuit is more complex and involves the use of transmission line theory. In transmission line theory,
electrical power traveling along the line can be considered as a voltage (E-field) and current (H-field) traveling and relation is
imposed by the electrical properties of the line. the cable itself will behave such that it is characterized by an inherent impedance
that does not change as long as the properties of the line or cable do not change. This impedance is called the characteristic
impedance (Z).
As the electrical power hits the termination (Rload), the voltage to current relationship is now imposed by the impedance of the
load. Under the condition where the load impedance is equal to the characteristic impedance, the power is fully absorbed. If
the load impedance is different from the characteristic impedance, the ratio of voltage and current will change at the point
where the transmission medium occurs. As a result, the load will not absorb all the power, resulting in a portion of the power

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traveling back towards the source. They are known as incident and reflected wave. The ratio of them is known as reflection
coefficient:
𝑉 + (𝜔0 ) 𝑍𝐿 − 𝑍0
Γ(𝜔0 ) = =
𝑉 − (𝜔0 ) 𝑍𝐿 + 𝑍0
At each point along transmission line, there are two waves traveling. They are a) forward wave moving towards load b) reflected
wave moving generator/signal source keeping a variable phase relationship between them. So, there are some points where
both waves are in phase & in some they are in antiphase. Corresponding voltages in those points will be Vmax and Vmin
respectively. Ratio of Vmax & Vmin is called VSWR
2.2 Scattering parameter/ S- parameter:
The S-parameters describe the magnitude and phase relationship between incident and reflected waves. S-parameters have long
been the chosen method for this because they are relatively easy to derive at high frequencies. S-parameters have many
advantages over H, Y or Z-parameters. They relate to familiar measurements such as gain, loss, and reflection coefficient. They
are defined in terms of voltage traveling waves, which are relatively easy to measure. S-parameters don’t require connection
of undesirable loads to the device under test. The measured S-parameters of multiple devices can be cascaded to predict overall
system performance. If desired, H, Y, or Z-parameters can be derived from S-parameters. And very important for RF design,
S-parameters are easily imported and used for circuit simulations in electronic-design automation (EDA) tools. S-parameters
are the shared language between simulation and measurement.

EE
/E
ST

Fig 2: Signal Path in an ideal two port network

For a two-port network shown in Fig. 2 a1 and a2 are the incident wave in port 1 and port 2, b1 and b2 are reflected/ transmitted
wave in port 1 and port 2 respectively. Because the system is linear mathematically it can be written as:

𝑏1 = 𝑆11 𝑎1 + 𝑆12 𝑎2
AU

𝑏2 = 𝑆21 𝑎1 + 𝑆22 𝑎2

when the characteristic impedance (Z0) is equal to 50 Ohms, and if a 50 Ohm termination is present at port 2 (in fig 3 𝑎2 is
reduced to zero) resulting in equations for S11 and S21. This principle can be applied in the reverse direction as well. By setting
𝑎1 to zero, equations for S22 and S12 can be obtained.

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Fig 3: Definition of S parameter from forward and reverse transmission

Defining incident wave as 𝑎1 = 𝑉1+ and 𝑎2 = 𝑉2+ and reflected/transmitted waves as 𝑏1 = 𝑉1− and 𝑏2 = 𝑉2−

So for forward transmission the s parameters are

𝑊𝑎𝑣𝑒 𝑟𝑒𝑓𝑙𝑒𝑐𝑡𝑒𝑑 𝑓𝑟𝑜𝑚 𝑝𝑜𝑟𝑡 1 𝑉1− 𝑏1
𝑆11 = = += |
𝑊𝑎𝑣𝑒 𝐼𝑛𝑐𝑖𝑑𝑛𝑒𝑡 𝑎𝑡 𝑝𝑜𝑟𝑡 1 𝑉1 𝑎1 𝑎
2 =0

𝑊𝑎𝑣𝑒 𝑡𝑟𝑎𝑛𝑠𝑚𝑖𝑡𝑡𝑒𝑑 𝑡𝑜 𝑝𝑜𝑟𝑡 2 𝑉2− 𝑏2

𝑆21 = = += |
𝑊𝑎𝑣𝑒 𝐼𝑛𝑐𝑖𝑑𝑛𝑒𝑡 𝑎𝑡 𝑝𝑜𝑟𝑡 1 𝑉1 𝑎1 𝑎
2 =0

And for reverse transmission the s parameters

𝑊𝑎𝑣𝑒 𝑟𝑒𝑓𝑙𝑒𝑐𝑡𝑒𝑑 𝑓𝑟𝑜𝑚 𝑝𝑜𝑟𝑡 2 𝑉1− 𝑏2
𝑆22 = = += |
𝐼𝑛𝑐𝑖𝑑𝑛𝑒𝑡 𝑤𝑎𝑣𝑒 𝑎𝑡 𝑝𝑜𝑟𝑡 2 𝑉2 𝑎2 𝑎
1 =0

𝑟𝑒𝑓𝑙𝑒𝑐𝑡𝑒𝑑 𝑤𝑎𝑣𝑒 𝑓𝑟𝑜𝑚 𝑝𝑜𝑟𝑡 2 𝑉1− 𝑏1

EE
𝑆12 = = = |
𝐼𝑛𝑐𝑖𝑑𝑛𝑒𝑡 𝑤𝑎𝑣𝑒 𝑎𝑡 𝑝𝑜𝑟𝑡 2 𝑉2+ 𝑎2 𝑎
1 =0

An N-port device has N2 S-parameters. So, a two-port device has four S-parameters. The numbering convention for S-
parameters is that the first number following the “S” is the port where the signal emerges, and the second number is the port
where the signal is applied. So, S21 is a measure of the signal coming out port 2 relative to the RF stimulus entering port 1.
/E
When the numbers are the same (e.g., S11), it indicates a reflection measurement, as the input and output ports are the same.
The incident terms (a1, a2) and output terms (b1, b2) represent voltage traveling waves. So for 1 port network the scattering
𝑆 𝑆12
matrix is [𝑆11 ] similarly for 2 port network the matrix is [ 11 ] and so on.
𝑆21 𝑆22
ST

2.3 Vector Network Analyzer:

Network Analyzer is an instrument used to measure impedance. At lower frequencies impedance can be measured with a sine
wave generator, a volt meter, a current meter. The ratio of voltage and current will give out the impedance of the network. At
higher frequency, the voltage and current vary with position due to the standing wave produced by the interaction of transmitted
AU

and reflected wave (explained in the previous section). Thus, impedance measurement at higher frequencies is done with
measurement of incident and reflected waves. In fact, the VNA is able to measure the amplitude and phase differences between
incident and reflected waves, using one of the waves as a reference.

The primary use of a VNA is to determine the S-parameters of numerous passive components, including cables, filters,
switches, diplexers, duplexers, triplexers, couplers, bridges, transformers, power splitters, combiners, circulators, isolators,
attenuators, antennas, and many more. In addition, VNAs can also characterize active devices such as transistors and amplifiers
using S-parameters, as long as they are operating in their linear mode of operation.

2.4 Architecture of a 2-port Vector Network Analyzer:

The fundamental principle of a vector network analyzer is to measure the amplitude and phase of both incident and reflected
waves at the various ports of the DUT. The general design of a VNA is to stimulate an RF network at a given port with a
stepped or swept continuous wave (CW) signal and to measure the travelling waves, not only at the stimulus port but at all the
ports of the network terminated with specific load impedances, typically 50 Ohms or 75 Ohms. A typical but simplified VNA
architecture is illustrated in Fig 4.

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Terminator
(typically

Directional
Element

Coupled line

Port 1 Port 2

Fig 4: Simplified VNA block diagram

A typical VNA have one or more signal source (SRC) with controllable frequency. The test port contains some signal separation
hardware (e.g. directional coupler) to split out the incident and reflected travelling waves. The test set can contain switches to

EE
route the signal source to the different test ports and terminates other ports with specific load impedances. The ‘ref’ port
typically measure the incident wave from the coupled line and the test port measure the reflected signal.
/E
ST
AU

Fig 5: Anritsu MS43122A-20 Vector Network Analyzer

2.5 VNA Errors and Calibration:

In the VNA measurement there are three types of errors: random, systematic and drift. Random errors vary with time and are
thus unpredictable and cannot be removed by calibration. Typical random errors include those caused by instrument noise, and
the repeatability of switches, cables, and connectors. In contrast, systematic errors occur in a reproducible manner. They are
caused by imperfections in the VNA, can be characterized, and thus can be removed mathematically through calibration. Drift
occurs after a calibration has been performed because of changes in VNA performance arising from variations in ambient
temperature.

A VNA is only as useful as the accuracy with which it makes measurements, and this requires the instrument to be calibrated.
The calibration process employs a technique called vector error correction. Vector-error correction is the process of
characterizing systematic error terms by measuring known calibration standards, and then removing the effects of these errors
from subsequent measurements mathematically. The process of removing these errors requires the errors and measured
quantities to be measured vectorically (Magnitude and Phase).

Each network analyzer can be separated into an error network (or linear error model) and an ideal network analyzer. The
parameters of the error network are considered ‘error terms’ and can be directly interpreted as raw system data. Correcting

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system errors is the primary goal of calibration, and any remaining errors are expressed by the effective system data and depend
on the accuracy of the error terms and the repeatability of the measurement process.

The calibration process determines the error terms, requires a test system consisting of a VNA, cables and a calibration
standard. These calibration standards are one-port and two-port networks that have known characteristics. It is impossible to
manufacture a calibration standard that has ideal properties, so the deviations of the standards are sent to the VNA as
‘characteristic data’. This data is provided as data files to the VNA software. After calibration, the analyzer mathematically
computes the error terms using the values it measured during the calibration process along with the characteristic data of the
standards. It is then possible to correct the raw measured values in later measurements and calculate systematic error free S-
parameters for the device under test.

2.6 Error Model:

Fig 6 show simplified error model of the Error network. There are three class of systematic error in an Error network. Signal
leakage, Signal reflection and Frequency response. The errors relating to signal leakage are directivity and crosstalk. Errors
related to signal reflections are source and load match. The errors related to frequency response of the receivers are reflection
and transmission tracking. The full two-port error model includes all six of these terms for the forward direction and the same
six (with different data) in the reverse direction, for a total of twelve error terms. This is why two-port calibration (3 receiver
VNA architecture) is referred as twelve term error correction.

EE
/E
ST

Error Network
AU

Frequency
Signal leakage Signal reflection
response

1. Directivity 1.Source Match 1.Reflection Tracking

2. Crosstalk 2.Load match 2.Transmission
Tracking

Fig 6: Classic Two-Port 12 term Error Model of VNA

The interface between the error network and the device under test is called the reference plane. When using coaxial calibration
standards, the reference plane is the mating plane of the outer conductor, an example of which is shown in Fig 7.

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Fig 7: Location of the reference plane in a Type-N connector

2.7 Calibration standard and SOLT Calibration:

There are many different types of VNA calibration methods like SOLT, SSLT, SSST, LRL, ALRM and so on. For our purpose,
we will use the most common calibration technique called SOLT (Short, Open Load, Through). SOLT calibration technique
use four standards (short, open, load and through) to acquire all 12 term which is required for full two port calibration (see
appendix for detail). The characteristics data of the SOLT standard can be seen in figure 8 with the actual cal kit and the data
sheet of the kit.

EE
/E
ST
AU

Fig 8: Calibration kit, characteristic data in ShockLine Software and data sheet of TOSLKF50A-20 coaxial
calibration kit from Anritsu

Short: A coaxial short (Fig 9) can be constructed that has near ideal characteristics, with a total reflection of magnitude 1. The
reflection coefficient of the short is dependent only on its length offset, which represents the length between the reference plane
and the short. The loss occurring over this length can generally be ignored. Modeling the short in a VNA requires that only its
electrical length be entered into the instrument, but in some cases the model can be extended using the polynomial coefficients
L0 to L3 to account for parasitic inductance.
𝐿 = 𝐿0 + 𝐿1 𝑓 + 𝐿2 𝑓 2 + 𝐿3 𝑓 3

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Fig 9: Internal construction and equivalent circuit diagram of the short standard

Open: A coaxial open standard (Fig 10) is constructed using a closed design to avoid effects caused by entry of stray
electromagnetic energy. At the open end of the inner conductor, a frequency-dependent fringing capacitance is formed. Even
if an open standard could physically be constructed with a length of 0, fringing capacitances would result in a negative
imaginary part for S11at higher frequencies.
𝐶 = 𝐶0 + 𝐶1 𝑓 + 𝐶2 𝑓 2 + 𝐶3 𝑓 3

EE
Fig 10: Internal construction and equivalent circuit diagram of the open standard

Match/ Load: A match is a precision broadband impedance that has a value corresponding to the system impedance (50 Ohm
in this case). An implementation in which the inner conductor terminates into a resistively-coated substrate is shown in Fig 11.
/E
ST
AU

Fig 11: Internal construction and equivalent circuit diagram of the load standard

Through: A through (Fig 12) is a two-port standard that allows direct connection of two test ports with low loss. The
characteristic quantities of a through are insertion loss and electrical insertion length. the through is assumed to be ideally
matched. If connectors of the same type but of a different gender are used, the two test ports can be directly connected to
produce a through connection. This special case of a through has an electrical insertion length of 0 mm. Through standard is
modeled as a transmission line length with some frequency dependent loss. A root-f frequency dependence of that loss is
assumed. If 0 is entered for f0 (the reference frequency), the loss is assumed to be constant with frequency.

Fig 12: Thru standard

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(c)Experimental Procedure:
1. Connect both the wire to Test Port 1 and Test port 2 (see Fig 5).
2. Turn on the power supply.
3. Click to open “ShockLine” software. ShockLine is a software made by Anritsu which can be used as the interface of
the MS46122A-20 Vector Network Analyzer.

EE
/E
Fig 13: Anritsu ShockLine software interface

4. The default interface should look like Fig 13.

5. Click ‘Preset’. This will change all the setting of the VNA to its default setting. In the status bar (bottom of the screen)
ST

the Start Stop frequency of the VNA, frequency, IF bandwidth, Measurement status can be seen at a glance. As the
VNA is in default status the calibration is void. (can be seen as “UNCORR” in the status bar)
6. To change the start and stop frequency of the sweep, click frequency on the right side of the screen or Click
‘Main>Frequency’ from the main menu.
AU

Fig 14: Start and Stop frequency selection

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7. Enter the Start and Stop frequency in the dialog box (Fig 14), also enter the ‘number of points’. By increasing the
number of points the resolution of the measurement can be increased but it will also slow down the sweeping speed.
8. To start calibration, click ‘calibrate’ from the main menu. In the calibration menu click Calibrate>Manual Cal> 2 Port
Cal (Fig 15). In ‘Two Port Cal’ menu port 1, port 2 is calibrated one at a time using the Open, Short, Load standard.
Then Thru calibration is done.

EE
Fig 15: Calibration Sub menu

9. To calibrate port 1, click ‘Port 1 Reflective Devices’.

/E
10. In the Refl. Device(s) sub-menu click ‘port 1 Connector’
11. Set all the parameter according to the Fig 16. Select “TOSLKF50A” as the Cal kit for test port 1 and test port 2. Click
Ok.
ST
AU

Fig 16: Calibration process

12. Now connect the Open standard at the end of the cable and click ‘open’ in the ‘refl. Device(s)’ menu. After the
calibration, there will a small check mark on the side of open menu.
13. Then disconnect the open standard and connect the short standard. Click ‘short’. After the calibration, there will a
small check mark on the side of Short menu.
14. Then disconnect the short standard and connect the Load standard. Click ‘Load’. After the calibration, there will a
small check mark on the side of Load menu.
15. If all three standards are calibrated successfully the menu will look like Fig 17.
16. Now for port 2 calibration, repeat steps 12-14 for port 2.

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17. For thru calibration connect thru standard in-between port 1 and in port 2. Click thru in ‘two port cal’ Menu. After the
calibration, there will be a check mark on side of the thru menu.
18. If all is done right after the Thru calibration there will be a dialog box saying “Please click “done” button to complete
the calibration”. Click ok.
19. Click Done in the ‘Two port cal’ Menu (fig 17)

Fig 17:Menu after complete two port calibration

EE
20. If the calibration is done the Status bar will show “CORR” as the Measuring State.
Calibration
complete
/E
Fig 18: Software interface after Calibration
ST

21. Verify all the calibration during or after the calibration by connecting the short, open and load to port 1 and 2 ,view
the impedance in smith chart format and compart with fig 19.
AU

Z=0 Z=∞
Short circuit Open circuit

Z=1
Impedance matched

Fig 19: Ideal Position for Open, Load and short circuit in Smith Chart
22. To view the measurement in smith chart format, connect load/short/open in port 1 or 2 then click Display>Trace
Format> Smith (R+jX) >Impedance.

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(d)Report:
1. What type of connector does the VNA and cable use? Why?
2. Why it is absolutely essential to calibrate a VNA before using it for measurement?

(e)Appendix:

Detail 12 term Error Model

EE
Fig 20: Simplified 12 Term error model diagram

 Directivity (ed1 and ed2) describes the finite directivity of the bridges or directional couplers in the system. Partially
includes some internal mismatch mechanisms that contribute to effective directivity.
/E
 Source match (ep1S and ep2S) describes the return loss of a driving port.
 Load match (ep1L and ep2L) describes the return loss of a terminating port.
 Reflection tracking (et11 and et22) describes the frequency response of a reflect measurement including loss
behaviors due to the couplers, transmission lines, converters, and other components.
ST

 Transmission tracking (et12 and et21) is the same as above but for the transmission paths. The tracking terms are not
entirely independent and this fact is used in some of the calibration algorithms.
 Isolation (ex12 and ex21) takes into account certain types of internal (non-DUT dependent) leakages that may be
present in hardware. It is largely present for legacy reasons and is rarely used in practice since this type of leakage is
typically very small in modern VNAs.
AU

2 Port SOLT Calibration [3]:

Calibration procedure consists in measuring 7 different reference standards (2 Opens, 2 Shorts, 2 matches and a Thru) with
known reflection and/or transmission values from a TOSM calibration kit. In this paper reference standards are considered to
have ideal values as follows
0 1
Γ𝑂𝑃𝐸𝑁 = 1, Γ𝑆𝐻𝑂𝑅𝑇 = −1, Γ𝑀𝐴𝑇𝐶𝐻 = 0, 𝑆𝑇𝐻𝑅𝑈 = [ ]
1 0

e00 : Directivity (F)

e11 : Port-1 Source Match (F)
e10e01 : Reflection Tracking (F)
e10e32 : Transmission Tracking (F)
e30 : Leakage (Crosstalk)(F)
e22 : Port-2 Load Match (F)

Fig. 21: Forward 12-term error model flow chart

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e'33: Directivity (R)

e’11: Port-1 Load Match (R)
e’23e’32: Reflection Tracking (R)
e’23e’01: Transmission Tracking (R)
e’03: Leakage (Crosstalk) (R)
e’22: Port-2 Source Match (R)

Fig 22: Reverse 12-term error model flow chart

Solving measured S-parameters from figures 20 and 21

…..(1)

…..(2)

…..(3)

EE
…..(4)

where
/E
SxxM: Measured, i.e. uncorrected, S-parameters
Sxx: Corrected S-parameters
∆𝑆 = 𝑆11 𝑆22 − 𝑆12 𝑆21
ST

Port 1 Calibration: By performing Open, short and Match calibration to Port 1 the following forward error terms are calculated
from eq. (1)
AU

Port 2 Calibration: By performing Open, short and Match calibration to Port 2 the following reverse error terms are calculated
from eq. (3)

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Isolation Ports Calibration: Conning Load to port 1 and port 2 is optionally made only when very low transmission
parameters must be measured. In most cases this error term is neglected.

Calibration between Ports: By Connecting thru standard in-between port 1 and port 2 and Transmission Tracking error terms
are calculated from (1), (2), (3) and (4) as follows

EE
Calibration Reference
Error to be
corrected
Description
/E
Open e11 Source Match (F)
Port 1 Short e10e01 Reflection Tracking (F)
Match e00 Directivity (F)
Open e’11 Source Match (R)
ST

Port 2 Short e’23e’32 Reflection Tracking (R)

Match e’33 Directivity (R)
Match1 e30 Crosstalk (F)
Isolation of ports
Match2 e’03 Crosstalk (R)
e22 Load Match (F)
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e’11 Load Match (R)

Calibration between Ports Thru
e10e32 Transmission Tracking (F)
e’23e’01 Transmission Tracking (R)
Table: Summery of the 2-port calibration process

Solving equations (1) to (4), corrected S-parameters of the DUT can be expressed as follows

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EE
(f)Reference:

1. Introduction to Network Analyzer Measurements Fundamentals and Background-National Instrument

2.
/E
Vector Network Analyzer (VNA) Calibration: The Basics, Michael Hiebel- Rohde & Schwarz
3. D. C. DeGroot, K. L. Reed and J. A. Jargon, "Equivalent Circuit Models for Coaxial OSLT Standards," 54th ARFTG
Conference Digest, Atlanta, GA, USA, 1999, pp. 1-13. doi: 10.1109/ARFTG.1999.327370
4. Network Analyzer Basics- Agilent
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5. Understanding the Fundamental Principles of Vector Network Analysis-Keysight

6. Understanding VNA Calibration- Anritsu
7. Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers-Application Note
8. Network Analyzer Error Models and Calibration Methods, Doug Rytting

(g) Acknowledgement:
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 Lab manual prepared by: Md. Aminur Rahman

 Reviewed by: Dr. A.K.M. Ehtesanul Islam

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AUST/EEE-4174/Ex-12 Microwave Engineering Lab

Experiment no: 12
Name of the Experiment: Study on Transmission line matching circuit using vector
network analyzer

a) Objective:
1. To understand the theory of impedance matching.
2. To understand the design of impedance matching networks by using
analytical method (transmission line theory)
3. To understand the design of impedance matching networks by using graphical method
(Smith Chart)
b) Equipments:
1. Vector network analyzer
2. ETEK MSA-2003-01 Module

c) Theory:
Impedance matching is very important with radio and microwave transmission lines. Otherwise,

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standing waves lead to increased losses and corresponding transmitter malfunction. A line
terminated in its characteristic impedance has a standing-wave ratio of unity and transmits a given
power without reflection. Also, transmission efficiency is optimum where there is no reflected
power.
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Matching a transmission line has a special meaning, one differing from that used in circuit theory
to indicate equal impedance seen looking both directions from a given terminal pair for maximum
power transfer. In circuit theory, maximum power transfer requires the load impedance to be equal
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to the complex conjugate of the generator. This condition is sometimes referred to as a conjugate
matching. In transmission line problems matching means simply terminating the line in its
characteristic impedance.

Impedance matching or tuning is important for the following reasons:

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1. Maximum power is delivered when the load is matched to the line (assuming the
generator is matched), and power loss in the feed line is minimized.
2. Impedance matching sensitive receiver components (antenna, low-noise amplifier, etc.)
may improve the signal-to-noise ratio of the system.
3. Impedance matching in a power distribution network (such as an antenna array feed
network) may reduce amplitude and phase errors.

Three methods for Impedance matching are:

1. Matching with Lumped Elements (L Networks)
2. Stub Tuning
3. The Quarter-Wave Transformer

The equation of reflection coefficient, load impedance and characteristic impedance are written as
Z  Z0
 L (1.1)
Z L  Z0
Return Loss= −20 log |ᴦ| dB (1.2)

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The input impedance of a transmission line terminated in a load is given as [For lossy case, γ=α+jβ;
γ=propagation constant, α=attenuation constant, β=phase constant. For lossless case α=0]

V V0 e   z  V0 e   z )
Z in  Z  l    z Z  l
I V0 e  V0 e   z )
(1.3)
V  (e j  l  e  j  l ) Z L  Z 0 j tan(  l )
 Z 0 0 j  l 
V0 (e  e  j  l ) Z 0  Z L j tan(  l )

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Fig 10-1: input impedance of a transmission line terminated in a load
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where Z0 =The characteristic impedance of transmission line
Z L =The load impedance
l= the distance to load (Length of transmission line between source and load)
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β= the wave number (2π/λ)

Let us consider several special cases from equation (1.3), and discuss about the characteristic of
impedance in table1-1.
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Table1-1
Sl Conditions Mathematical Relation Remarks
No
1. l= λ /4. Z L  Z0 j tan[(2 /  ).(  /4)] We can find out a characteristic: if the input
Z in  Z 0
(Quarter Z0  Z L j tan[(2 /  ).(  /4)] impedance Zin and load impedance Z L are
wave transformer) 2 given, we can design a λ /4 transmission
 Z 0  Z in Z L
line with characteristic Zin Z L to match
Zin and Z L . Thus the λ /4 transmission line
is also called as λ /4 impedance transformer.

2. Z L =0 Zin  jZ0 tan( / 2)   The λ/4 short-circuited terminated

and l= λ /4 transmission line can be seen as an open
(Short circuit. Therefore, we can use a λ/4 short-
circuit condition) circuited terminated transmission line to
substitute the RFC. In implementation, the
higher the characteristic impedance of

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transmission line is, the better the result we

can obtain.

3. ZL   Z  Z j tan[( /2)] The λ/4 open-circuited terminated

Zin  Z0 L 0 transmission line can be considered as a
and l= λ /4 Z0  Z L j tan[( /2)] Z
L 
(Open short circuit. That is, we can use a λ/4 open-
1 circuited terminated transmission line to
circuit condition)  Z0 0
j tan( /2)
substitute the band stop filter

4. Z L =0 Zin   jZ0 tan( l ) A short-circuited terminated transmission

where line can be seen as an inductive device.
Thus, we can use it to substitute a parallel

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( n 1)  (2 n 1) 
l  inductive device. Moreover, the trace will
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n=1, 2……….. move in counter clock-wise on the Smith-
Chart
5. ZL   Zin   jZ0 cot( l ) An open-circuited terminated transmission
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where line can be seen as a capacitance device.
Thus, we can use it to substitute a parallel
(2 n 1)  n
l  capacitance device. Moreover, the trace will
4 2
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move in clock-wise on the Smith-Chart.

n=1, 2………..
6. ZL   Zin   jZ0 A λ/8 open-circuited terminated
and l= λ/8 transmission line can be determined as a
capacitance device. Therefore, we can use it
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to substitute a parallel capacitance device.

Moreover, the value of the capacitance is
determined by the characteristic impedance
of transmission line
7. Z L   and Zin  jZ0 A 3λ/8 open-circuited terminated
l= 3λ/8 transmission line can be considered us an
inductive device. That is, we can use it to
substitute a parallel inductive device,
Moreover, the value of the inductance is
determined by the characteristic impedance
of transmission line.

Stub Matching: This is a method of impedance matching where a small section of short/open
circuited transmission line is connected in shunt with main transmission line. The distance 𝑙𝑠 𝑜𝑟 𝑙𝑜
(position of stub) from the load and length 𝑙𝑠′ 𝑜𝑟 𝑙𝑜′ (length of stub) are so chosen that reflected

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wave produced by shunting impedance of stub is equal and opposite to reflected wave already
existing on the line.

Equation related to Single stub match:

 B 1 B
l0  tan 1 ( S )  tan 1 ( )
For an open-circuited stub 2 Y0 2 Y0 (1.4)
 Y 1 Y (1.5)
ls  tan 1 ( 0 )  tan 1 ( 0 )
For a short-circuited stub 2 BS 2 B

Here, BS = Stub Susceptence

B = Susceptence
Y = Admittance

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Fig 10-2: Single-stub tuning circuits
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d) Procedure:
Case 1: Measurement of λ/4 impedance transformer matching network
1. Refer to the circuit diagram of λ/4 impedance transformer in Fig 10-3or Figure MSA 1-1
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of ETEK MSA-2003-01 module.

2. Let the load impedance ZL =150 Ω to be matched to Zin =50 Ω. Calculate Z0, λ.
3. Next from the Marker function of the Network Analyzer, mark the frequencies at 2350
MHz, 2400 MHz and 2450 MHz, respectively. Then measure the input return loss (S11) in
Smith Chart and S-parameter plot. Finally, record the measured results in graph of table
10-2 and table 10-3 respectively.

Fig 10-3: λ/4 impedance-transformer

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Case 2: Measurement of single and balanced short stubs matching network

1. Refer to the circuit diagram of single-port short stub in Fig 10-4 or Figure MSA1-2 of
ETEK MSA-2003-01 module.
2. Let the load impedance ZL =150 Ω to be matched to Zin =50 Ω. Calculate 𝑙𝑠 and 𝑙𝑠′
(distance and stub length).
3. Next, from the Marker function of the Network Analyzer, mark the frequencies at 2350
MHz, 2400 MHz and 2450 MHz, respectively. Then measure the input return loss (S 11)
in Smith Chart and S-parameter plot. Finally, record the measured results in graph of table
10-2 and table 10-3 respectively.

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Fig 10-4: Diagram of matching network for single-port short stub.

Case 3: Measurement of single, balanced and radio open stubs matching network
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1. Refer to the circuit diagram of single-port short stub in Fig 10-5 or Figure MSA1-2 of
ETEK MSA-2003-01 module.
4. Let the load impedance ZL =150 Ω to be matched to Zin =50 Ω. Calculate 𝑙𝑜 and 𝑙𝑜′
(distance and stub length).
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2. Next, from the Marker function of the Network Analyzer, mark the frequencies at 2350
MHz, 2400 MHz and 2450 MHz, respectively. Then measure the input return loss (S11)
in Smith Chart and S-parameter plot. Finally, record the measured results in graph of table
10-2 and table 10-3 2 respectively.

l2 Z0 Z
150
L Ω
Z0

Fig 10-5: Diagram of matching network for single-port open stub

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AUST/EEE-4174/Ex-12 Microwave Engineering Lab

Case 4: Measurement of λ /8 and 3 λ /8 open stabs matching network

1. Refer to the circuit diagram of λ/8 open stub in Fig 10-6 or Figure MSA-7 of ETEK
MSA-2003-01 module.
2. Let the load impedance ZL =150 Ω to be matched to Zin =50 Ω. Calculate Z0, λ.
3. Next, from the Marker function of the Network Analyzer, mark the frequencies at 2350
MHz, 2400 MHz and 2450 MHz, respectively. Then measure the input return loss (S11) in
Smith Chart and S-parameter plot. Finally, record the measured results in graph of table
10-2 and table 10-3 2 respectively.

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Fig 10-6: Circuit diagram of single-port open-circuited matching network at λ/8
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Table 10-2: Measured results of input return loss for different cases (Smith Chart format).

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 AUST/EEE-4174/Ex-12 Microwave Engineering Lab

0.9

0.8

0.7

0.6

0.5
Return Loss (dB)

0.4

0.3

0.2

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0.1

0
0 0.5 1 1.5 2 2.5 3

Frequency (GHz)
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Table 10-3: Measured results of input return loss for different cases (Log Mag format)

e) Report:
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1. Discuss and explain different results obtained in the experiment

2. Comment on the effect of varying frequencies in smith chart with marker function of
VNA.

(f)Reference:
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1) Lab manual (Microwave Active Circuit Design of ETEK Technology Co LTD.)

2) Electronics communication- S. Gupta
3) Microwave Engineering – D. Pozar
4) Microwave Devices and Circuits -SAMUEL Y. LIAO

(g) Acknowledgement:
 Lab manual prepared by: Md. Rasheduzzaman Al-Amin
 Reviewed by: Dr. A.K.M. Ehtesanul Islam

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