Cired 2019 - 1606
Cired 2019 - 1606
Cired 2019 - 1606
Paper n° 1606
Paper n° 1606
Paper n° 1606
The XLPE and P-laser cable samples both passed the couple to measure the temperature on the conductor. A
overbending test showing an equal behaviour on PD-level first short circuit test was conducted at a short-circuit
and PD-noise level. No irregularities were found in the current of 31.5kA during 2.7s. These values are prescribed
afterwards performed DSC and DMA analysis by ENGIE- by Enexis in specifications and can be seen as the worst-
Laborelec. Compared to the reference samples, both the case scenario occurring in the network, including a
selected XLPE and P-laser samples however showed some significant safety margin. For the second short-circuit test,
dimensional differences after the overbending test: values of 50kA/2.25s were chosen to achieve a short-
• The thickness of the conductor screen became larger for circuit end-temperature of 250 °C within 5 seconds. This
the XLPE sample after the overbending test. At the P- short-circuit temperature for XLPE was retrieved from
laser sample the thickness of the conductor screen standard NEN-HD 620 S2. Both P-laser and XLPE passed
became a bit smaller. the short-circuit tests based on the normative criterion of
• The insulation thickness of the P-Laser sample became a "no breakdown". Both samples also passed the included
bit larger after the overbending test. No significant high-voltage test and met the requirements regarding noise
difference was noted for the XLPE sample. level and PD level regarding the partial discharge
• The thickness of the insulation screen of the P-Laser measurement.
sample after the overbending test became a bit smaller.
No significant difference was noted for XLPE. No irregularities and no differences between P-laser and
XLPE were observed after the 31.5kA/2.7s short-circuit
These dimensional changes were probably caused by the test and successive DSC, DMA, dimension measurements
extreme bending of the test samples vs. unbended and stereomicroscopy analysis. After the 50kA/2.25s
reference samples, the cable clamps used for fixing the test short-circuit test, first it was observed that the insulation of
samples (reference samples never were clamped) or by the both XLPE and P-laser was shrunk with respect to the
high temperature and the thermoplastic character of P- conductor.
laser. In NEN-HD 620 S2 there are no dimension
requirements after carrying out type tests. The measured After the 50kA/2.25s short-circuit test, another difference
thicknesses after the overbending test of the conductor was visually determined between the shrinkage behaviour
screen, insulation and insulation screen of both the XLPE of P-laser with respect to XLPE (see figure 5). In P-laser,
and P-Laser samples however still fulfilled the minimum the conductor screen and the insulation bonded thereto had
"design requirements" of NEN-HD 620 S2. Based on the shrunk back approximately 12mm further than the
above, the measured thicknesses are considered as insulation screen and the insulation bonded thereto.
acceptable and the observed dimensional differences are
considered as insignificant.
SHORT-CIRCUIT TEST
Due to the thermoplastic nature of P-laser, the short-circuit
behaviour was investigated. No short-circuit tests are
defined in standard NEN-HD 620 S2. Therefore, it was
decided to perform a short-circuit test based on IEC 61442
[9] and HD 629-1 [10]. According to these standards for
cable accessories, 2 short-circuit tests were carried out. For
this test, the test set-up in figure 4 was chosen. Cable
pieces of 6 m long were installed in a bend with a diameter Figure 5: Observed shrink behaviour at 50kA/2.25s.
equal to 2 times the minimum permitted bend radius (2 *
0.9 = 1.8 m). The test loop was equipped with a thermo- This difference in "shrinkage shape” is probably caused by
the thermoplastic nature of P-laser and the high end-
temperature of 250 °C achieved during the test. This
temperature is above the "melting point" of P-laser. The
impact of the observed shrinkage shape of P-laser in
practice is however negligible as this phenomenon only
occurs at the end of the cable i.e. where the cable is
terminated in an accessory. In this case, the stress control
in this part is taken over by the accessory and this (peeled)
cable part is located within the stress controlling body of
the accessory at a position where this does not cause risks
regarding partial discharges or a disturbed electrical field.
Figure 4: Test loop for the short-circuit test.
Paper n° 1606
During the dimensional comparison of the cable samples, national and international standards committees for
located at a distance from the cable clamps, no significant medium-voltage cables.
differences were observed between the reference values
and the values after performing the short-circuit test. This Based on the obtained test results, additional calculations
was valid for the conductor screen, the insulation, the
insulation screen, and the outer sheath. All measured on the conductor end-temperatures and occurring forces in
values were within the limits of the design criteria imposed various short-circuit situations have been performed as a
in NEN-HD 620 S2. This is valid for both the XLPE and risk analysis regarding the shrinkage and deformation
the P-Laser cable as well as the samples of the 31.5kA/2.7s behavior of P-laser. These calculations showed that the
and the 50 kA/2.25s short-circuit test. short-circuit force, using the Enexis specification, is
minimum 3.88 times lower than the force that occurred
Regarding the cable samples located beneath and directly during the 50 kA/2.25s short-circuit test. Furthermore, the
next to the cable clamps, both the XLPE and the P-Laser calculations showed that the conductor end temperature
cable appeared strongly distorted after the 50kA/2.25s during the short circuit at the Enexis specification, ranges
short-circuit test (figure 6). For P-laser both the internal
semiconductive screens and the insulation no longer between 53°C and 145°C where at the comparative 50
complied with the values in the design requirements of kA/2.25s short-circuit test an end temperature of 250°C
NEN-HD 620 S2, where this was also the case for the was used. Taken this into account, it can be concluded that,
insulation of the XLPE cable. This may be due to the even assuming the worst-case scenario in the network of
thermoplastic character of P-Laser and the high Enexis, the chance of deformation of the insulation and
temperature of 250 °C at the short-circuit test. This makes semiconductive layers of P-Laser and XLPE is negligible.
the different layers highly deformable in combination with
the high mechanical stress caused by the short-circuit CONCLUSION
forces. In this respect it should also be noted that IEC
60986 recommends that the end-temperature of Under practical conditions, P-laser and XLPE show
thermoplastic insulation materials should be reduced by 10 similar performance. Based on the recyclability of P-laser
°C when the cable is clamped. This was not taken into cable and the results of this comparative research and
account in the tests carried out on P-laser for the purpose
former studies, Enexis has decided to standardize P-laser
of a fair comparison with XLPE. After the 31.5kA/2.7s
short-circuit test, both the XLPE and P-laser samples insulated cable for utilization in its MV-network next to
beneath and directly next to the clamps showed no the already existing standard XLPE-cable.
dimensional changes with respect to the reference values.
REFERENCES
Paper n° 1606