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Specifications and Available Models

Electron source Electron optics Detectors Magnification Resolution Accelerating voltage Sample stage
Tungsten filament/field Magnetic lenses Secondary electron 20X TO 1000000X Sub-nanometer to Few kV to 30kV 3D motorized stage for
emission electron gun detector nanometer sample manupulation
(SED)/Backscattered
electron detector
(BSED)/Energy dispersive
X-ray spectroscopy
(EDS)/Electron backscatter
diffraction (EBSD)

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Available Models

1. FEI/Thermo Fisher Scientific Quanta SEM Series:


• Specifications:
• Variable-pressure SEM with various detectors (SED, BSED,
EDS).
• High-resolution imaging and elemental analysis capabilities.
• Applications:
• Material science, life sciences, and nanotechnology research.

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2. Zeiss Merlin SEM Series:
• Specifications:
• High-resolution field-emission SEM with various
imaging and analysis modes.
• High-speed imaging and advanced EDS capabilities.
• Applications:
• Materials characterization, semiconductor analysis,
and life sciences.

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3. Hitachi SU5000 SEM:
• Specifications:
• High-resolution SEM with multiple imaging modes
and detectors.
• Variable pressure and large chamber size.
• Applications:
• Nanotechnology, materials science, and biological
research

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4. JEOL JSM-IT500HR SEM:
• Specifications:
• High-resolution SEM with multiple detectors (SED,
BSED, EDS).
• High-speed imaging and advanced analytical
capabilities.
• Applications:
• Materials science, geology, and biological research

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5. FEI/Thermo Fisher Scientific Helios G4 UX DualBeam
SEM/FIB:
• Specifications:
• Combining SEM and Focused Ion Beam (FIB) for sample
preparation and imaging.
• High-resolution imaging, 3D reconstruction, and
nanofabrication capabilities.
• Applications:
• Materials characterization, semiconductor analysis, and
nanofabrication

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