Semiconductor Physics
Semiconductor Physics
Semiconductor Physics
Physics
Introduction
Valence Cell
Covalent bonds
Si
Si Si Si
Si
Conduction band
KE of
Ec Electron
= E - Ec
Ec
E
Ef Fermi energy level
Electron
energy
Ev
KE of Hole
=
Valence band
Ev - E
Distance
Carrier Concentration in Intrinsic Semiconductor
dn Z ( E ) dE F ( E )
top of the band
n z ( E ) F ( E )dE................(1)
Ec
3 1
4
Z ( E )dE 3 (2me ) 2 E 2 dE
h
3 1
4
Z ( E )dE 3 (2me ) 2 ( E Ec ) 2 dE
h
Probability of an Electron occupying an energy state E
is given by
1
F (E)
E Ef
1 exp( )
kT
For all possible temperatures E E F kT
1
F (E)
E Ef
exp( )
kT
E EF EF E
F ( E ) exp ( ) exp( )
kT kT
Substitute Z(E) and F(E) values in Equation (1)
n z ( E ) F ( E )dE
Ec
3 1
4 E E
n 3 (2me ) 2 ( E Ec ) 2 exp( F )dE
Ec
h kT
3
4 1
n 3 (2me ) ( E Ec ) 2 exp( E F E )dE
2
h Ec kT
3 1
4 E E
n 3 (2me ) 2 exp( F ) ( E Ec ) 2 exp( )dE.....(2)
h kT Ec kT
To solve equation 2, let us put
E Ec x
E Ec x
dE dx
3 1
4 E E
2
n 3 (2me ) exp( F
) ( E Ec ) exp(
2
)dE
h kT 0 kT
3 1
4 E E x
n 3 (2me ) 2 exp( F ) ( x) 2 exp ( c )dx
h kT 0 kT
3 1
4 E E x
2
n 3 (2me ) exp( F c
) ( x ) exp (
2
)dx.....(3)
h kT 0
kT
1
1 3
x 2
we know that ( x ) exp(
2
) dE ( kT ) 2
0
kT 2
1
3 3
4 2 E E 2
n 3 ( 2me ) exp( F c
) {(kT ) 2
}
h kT 2
2me kT 32 E F Ec
n2 ( 2
) exp( )
h kT
dp Z ( E )dE {1 F ( E )}
Ev
p z ( E ){1 F ( E )}dE................(1)
bottom of the band
3 1
4
Z ( E ) dE 3 ( 2mh ) E dE 2 2
h
Since Ev is the energy of the top of the valence
band
3 1
4 2
Z ( E )dE 3 (2m ) ( Ev E ) dE
h
2
h
Probability of an Electron occupying an energy state
E is given by
1
1 F (E) 1 { }
E Ef
1 exp( )
kT
E E f 1
1 F ( E ) 1 {1 exp( )}
kT
neglect higher order terms in above exp ansion
for higher T values
E Ef
1 F ( E ) exp( )
kT
Substitute Z(E) and 1 - F(E) values in Equation (1)
Ev
p z ( E ){1 F ( E )}dE
bottom of the band
Ev 3 1
4 E EF
2
p 3
(2m ) ( Ev E ) exp(
h
2
)dE
h kT
3 Ev 1
4 EF E
p 3 (2m ) exp( 2
h ) ( Ev E ) exp( )dE....( 2)
2
h kT kT
To solve equation 2, let us put
Ev E x
E Ev x
dE dx
3 Ev 1
4 EF E
2
p 3 (2m ) exp(
h ) ( Ev E ) exp( )dE 2
h kT kT
3 0 1
4 EF Ev x
2
p 3 (2m ) exp(
h ) ( x) exp( 2
)( dx)
h kT kT
3 1
4 Ev E F x
2
p 3 (2m ) exp(
h ) ( x) exp( )dx2
h kT 0
kT
1
3 3
4 2Ev E F 2
p 3 ( 2m ) exp(
h )(kT ) 2
h kT 2
3
2m kT Ev E F
p 2( h
2
) exp( 2
)
h kT
Ec
Ec
E
mh* me*
Ef
Electron
energy
Ev
Valence band
Temperature
2 EF 3 mh Ev E c
log( ) ( )
kT 2 me kT
3kT mh 32 E v Ec
EF log( ) ( )
4 me 2
In intrinsic semiconductor we know that me mh
Ev Ec
EF ( )
2
Si
Si P Si
Si Impure atom
(Donor)
The Intrinsic Semiconductors doped with pentavalent
impurities are called N-type Semiconductors.
Ec
Ec
E Ed
Donor levels
Eg
Electron
energy
Ev
Valence band
Distance
Carrier Concentration in N-type Semiconductor
2mekT 32 E F Ec Ed E F
2( 2
) exp( ) N d exp( )
h kT kT
Taking logarithm and rearranging we get
E F Ec Ed E F 2me kT 32
( )( ) log N d log 2( 2
)
kT kT h
Nd
2 E F ( Ed Ec ) kT log 3
2me kT 2
2( 2
)
h
( Ed Ec ) kT Nd
EF log 3
2 2 2me kT 2
2( 2
)
h
at.,0k
( E d Ec )
EF
2
At 0k Fermi level lies exactly at the middle of the donor level
and the bottom of the Conduction band
Density of electrons in the conduction band
2me kT 32 E F Ec
n 2( 2
) exp( )
h kT
( E Ec ) kT Nd
{ d log 3
} Ec
2 2 2me kT 2
2( )
E F Ec h 2
exp( ) exp{ }
kT kT
1
E F Ec ( E Ec ) (Nd ) 2
Ec
exp( ) exp{ d log 3 1
}
kT 2kT 2me kT 2 2
kT
[ 2( ) ]
h2
1
E F Ec ( E Ec ) (Nd ) 2
exp( ) exp{ d log 3 1
}
kT 2kT 2me kT 2 2
[ 2( 2
) ]
h
1
E F Ec (Nd )2
( E d Ec )
exp( ) 3 1
exp
kT 2me kT 2 2 2kT
[ 2( ) ]
h2
2me kT 32 E F Ec
n 2( 2
) exp( )
h kT
1
2me kT 32 (Nd )2
( E d Ec )
n 2( 2
) { 3 1
exp }
h 2me kT 2 2 2kT
[ 2( 2
) ]
h
1 3
2 m kT ( E d Ec )
n 2( N d ) (
2 e
2
) exp
4
h 2kT
Si In Si
Si
Impure atom
(acceptor)
Conduction band
Ec
Ec
E
Electron Eg
energy Acceptor levels
Ea
Ev
Valence band
temperature
• Even at relatively low temperatures, these
acceptor atoms get ionized taking electrons
from valence band and thus giving rise to holes
in valence band for conduction.
p
eAdx
tp
dp p
eAdx eAdxg eAdx dI
dt p tp
Since the hole current is the sum of the diffusion current and the drift current
dp
I AeD p Ape h E
dx
Where E is the electric field intensity within the volume. when no external
field is applied, under thermal equilibrium condition, the hole density
attains a constant value p0.
dp
under these conditions di 0 and 0
dt
p0
g
tp
this equation indicates that the rate of generation of
holes is equal to therate of loss due to recombination
under equilibriu m conditions .
combain,.eq s ...3,4 & 5.
dp ( p p0 ) 2 p d ( pE )
Dp 2 h
dt tp x dx
Eg
Eg
k k
+
VH + + + P + +
- Y
+ + + + + + + + B
+ ++ + + + + Q + + +
+
X
P – type semiconductor
i
Z
-
_ _ _ _ P_ _
VH
+ Y
_
_ _ _ _
_ _Q_ _ __
B
_
X
N – type semiconductor
i
Magnetic deflecting force
F q (vd B )
Hall eclectic deflecting force
F qEH
When an equilibrium is reached, the magnetic deflecting force on
the charge carriers are balanced by the electric forces due to
electric Field.
q(vd B) qEH
E H ( vd B )
Where v d is drift velocity
The relation between current density and drift velocity is
J
vd
ne
Where n is the number of charge carriers per unit volume.
E H ( vd B )
J
EH ( B)
ne
1
E H ( JB)
ne
E H RH JB
1 EH
RH ( Hall ,.coefficient )
ne JB
If VH be the Hall voltage in equilibrium ,the Hall electric field.
VH
EH
d
Where d is the width of the slab.
E
RH H
JB
1 VH
RH
JB d
If t is the thickness of the sample,
Then its cross section is dt and current density
I
J
dt
VH RH JBd
I
VH RH ( ) B
t
V t
RH H
IB
• Since all the three quantities EH , J and B
are measurable, the Hall coefficient RH and
hence the carrier density can be found out.