Elmore Delay, Logical Effort
Elmore Delay, Logical Effort
Elmore Delay, Logical Effort
Modern Interconnect
5 metal layers
Ti/Al - Cu/Ti/TiN
Polysilicon dielectric
(result *0.69)
Shared Paths:
R44 = R1+R3+R4
Rii = R1+R3+Ri
Ri4 = R1+R3
Ri2 = R1
© Rabaey, ch4Wire.ppt
The Distributed RC-line
Diffusion
Equation
© Rabaey, ch4Wire.ppt
Deriving the Diffusion Eq
Step-response of RC wire as
a function of time and space
2.5
x= L/10
2
x = L/4
voltage (V)
1.5
x = L/2
1
x= L
0.5
0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
time (nsec)
© Rabaey, ch4Wire.ppt
RC-Models
© Rabaey, ch4Wire.ppt
Driving an RC-line
Rs (r w,cw,L)
Vout
V
in
© Rabaey, ch4Wire.ppt
Designing Fast CMOS Gates
A B C D
A CL Distributed RC model
B C3 (Elmore delay)
C C2 tpHL = 0.69 Reqn(C1+2C2+3C3+4CL)
D C1
Propagation delay deteriorates
rapidly as a function of fan-in –
quadratically in the worst case.
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EE141 Integrated Circuits2nd
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tp as a Function of Fan-In
1250
quadratic
1000
Gates with a
750
fan-in
tp (psec)
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EE141 Integrated Circuits2nd
Combinational Circuits
tp as a Function of Fan-In and Fan-Out
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EE141 Integrated Circuits2nd
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Fast Complex Gates:
Design Technique 1
Transistor sizing
as long as fan-out capacitance dominates
Progressive sizing
Distributed RC line
InN MN CL
M1 > M2 > M3 > … > MN
(the fet closest to the
In3 M3 C3 output is the smallest)
charged 01
In3 1 M3 CL In1 M3 CLcharged
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EE141 Integrated Circuits2nd
Combinational Circuits
Fast Complex Gates:
Design Technique 3
Alternative logic structures
F = ABCDEFGH
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EE141 Integrated Circuits2nd
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Fast Complex Gates:
Design Technique 4
Isolating fan-in from fan-out using buffer
insertion
CL CL
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Logical Effort
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Normalized Space
Parasitic Term P
D 4 6
OUT = D + A • (B + C)
A 2
D 1
B 2C 2
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EE141 Integrated Circuits2nd
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Logical Effort
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EE141 Integrated Circuits2nd
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Logical Effort of Gates
2
=
p
3;
4/
5 1
=
p=
g
Normalized Delay
D:
4 AN 1;
g =
:
tN
e r
ert
pu
3 v
in
In Effort
2-
Delay
2
1
Intrinsic
Delay
1 2 3 4 5
Fanout f
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EE141 Integrated Circuits2nd
Combinational Circuits
tp as a Function of Fan-Out
All gates
tpNOR2 tpNAND2 have the
same drive
tpINV current.
tp (psec)
Slope is a
function of
“driving
strength”
2 4 6 8 10 12 14 16
eff. fan-out
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EE141 Integrated Circuits2nd
Combinational Circuits
Buffer Example
In Out
1 2 N CL
N
Delay pi g i f i (in units of tinv)
i 1
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EE141 Integrated Circuits2nd
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Delay in a Logic Gate
Gate delay:
d=h+p
effort delay intrinsic delay
Effort delay:
h=gf
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EE141 Integrated Circuits2nd
Combinational Circuits
Add Branching Effort
Branching effort:
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EE141 Integrated Circuits2nd
Combinational Circuits
Multistage Networks
N
Delay pi g i f i
i 1
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EE141 Integrated Circuits2nd
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Optimum Effort per Stage
Dˆ gi f i pi NH 1/ N P
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EE141 Integrated Circuits2nd
Combinational Circuits
Optimal Number of Stages
For a given load,
and given input capacitance of the first gate
Find optimal number of stages and optimal sizing
D NH 1/ N Npinv
D
N
H 1/ N ln H 1/ N H 1/ N pinv 0
1/ Nˆ
Substitute ‘best stage effort’ hH
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EE141 Integrated Circuits2nd
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Example: Optimize Path
1 b c
a
5
g=1 g = 5/3 g = 5/3 g=1
f=a f = b/a f = c/b f = 5/c
Effective fanout, F = 5
G=
H=
h=
a=
b=
c=
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EE141 Integrated Circuits2nd
Combinational Circuits
Example: Optimize Path
1 b c
a
5
g=1 g = 5/3 g = 5/3 g=1
f=a f = b/a f = c/b f = 5/c
Effective fanout, F = 5
G = 25/9
H = 125/9 = 13.9
h = 1.93
a = 1.93
b = ha/g2 = 2.23
c = hb/g3 = 5g4/f = 2.59
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EE141 Integrated Circuits2nd
Combinational Circuits
Example – 8-input AND
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Method of Logical Effort
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EE141 Integrated Circuits2nd
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Summary
Sutherland,
Sproull
Harris
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EE141 Integrated Circuits2nd
Combinational Circuits