Defect Characterization Using Time-of-Flight Diffraction
Defect Characterization Using Time-of-Flight Diffraction
Defect Characterization Using Time-of-Flight Diffraction
Time-of-Flight Diffraction
SAJU T ABRAHAM
Quality Assurance Division
Indira Gandhi Centre for Atomic Research
TOFD Principle
• The interaction of the ultrasound waves with the discontinuity will
results in the following processes: Specular reflection from the
faces of the crack obeying laws of optical reflection, Traverse
along the discontinuity surface as Rayleigh waves and radiating
when reaching the crack tips, Scattering from the faces of the
discontinuities, Mode conversion, Diffraction from the crack tips
p
1/ 2
G p ( , ) exp( ik p R)
R
1 2
G p ( , ) exp( i / 4) sin
D 2
Gp (θ, β) is the diffraction coefficient, R is the distance from the
crack edge to the point of observation, λp is the wave length of
the compression waves, kp = 2π/λ is the wave vector, β is the
angel of incidence and θ is the angel of the diffracted wave with
respect to the crack.
Diffraction amplitude
The diffracted energy from the crack tip is distributed over a
wide range of angles. Therefore the TOFD technique is less
dependent on defect orientation. In TOFD measurement, the
angular distribution of the diffracted signals must be known in
order to best position sources and detectors. Ogilvy and
Temple have calculated the diffraction pattern for compression
and shear waves incident on a semi-infinite crack at any angle.
This mathematical model is based on the following assumptions:
1. The incident ultrasonic waves are infinite plane waves
2. The crack is a semi-infinite plane
3. Crack faces are non-interacting and smooth.
Zero points in the diffracted
pattern
• It can be shown that for the transmitter and receiver pair
placed symmetrically across the crack, the amplitude falls to
zero at angle 38˚.
• This is because the diffracted amplitude contains two terms
ψ1 and ψ2 of opposite sign which cancel out at this point.
• Similar zero points are predicted for asymmetrical
arrangements.
• The finite width of ultrasonic beam, in practical case, means
that the zero point may be observed as a minimum rather
than a true zero.
• All these predictions are made on the assumption that the
ultrasound incident on the crack tip is a continuous plane
wave.
• This will not make any serious problems with the pulsed
ultrasound since it can be Fourier treated.
Phase of the diffracted waves
• The phase of the diffracted signal is independent of
frequency and can be calculated from the diffraction
coefficient G (θ, β).
1. Lateral wave
2. Diffracted echo from the top of the defect
3. Diffracted echo from the bottom of the defect
4. Back wall reflection
Calculations
• Lateral wave:
2S
C
2
• Top diffracted echo: S2 d2
C
2
• Bottom diffracted echo: S 2 (d a) 2
C
2
• Back wall reflection: S2 H2
C
• Defect depth from the 1
surface: C 2 t1 4S 2
2
2
1
• Defect extent: C 2 t 2 4S 2 d
2
2
Advantages & Limitations
• TOFD is not affected by • TOFD cannot characterize the
the orientation of the signals from different
defect. defects/discontinuities
• Size, shape and orientation
are accurately determined. • Due to the presence of lateral
wave, subsurface defects in a
• Probability of detection thin specimen are not easy to
(POD) is much higher and identify.
false call rate (FCR) is very
less • It requires access to both the
• It is a high-speed sides of a discontinuity.
technique.
• Because of the small signals
• TOFD technique can reveal and high gains required, image
the presence of subsurface processing system and pre-
and open surface cracks. amplifier are usually required.
• Efficient for thick-wall
inspection.
Some Experimental Images
B-Scan of vertical notch
Lateral wave
Top Diffracted
Bottom
Diffracted
Back wall
Echo
Mode
converted
part
A-Scan of vertical notch
Bottom
Diffracted
Back wall
Echo
Mode
converted
part
A scan views of tilted notch
Here we
can
calculate
the
orientation
B-Scan views of SDH
1. 4mm SDH
2. 3mm SDH
3. 2mm SDH
4. 1mm SDH
Mode
converted
part
A-scan view of 4mm SDH
• It can clearly
distinguish the top
and bottom
diffracted
echoes.
Lateral wave
Diffracted
echoes.
Back wall
reflection
A-scan view of 1mm SDH
• The signal
appearing is the
sum of the top
and bottom
diffracted waves
• It is not possible
to differentiate
these two.
• Use signal
processing
algorithms.
D-Scan of Lack of Penetration
Specimen: SS
Thk: 25 mm
Lateral wave Weld: Double V
D-Scan of Slag
Specimen: SS
Lateral wave Thk: 25 mm
Weld: Double V
Aim of the study