Stf8N80K5, Stfi8N80K5: N-Channel 800 V, 0.8 Typ., 6 A Mdmesh™ K5 Power Mosfet in To-220Fp and I Pakfp Packages
Stf8N80K5, Stfi8N80K5: N-Channel 800 V, 0.8 Typ., 6 A Mdmesh™ K5 Power Mosfet in To-220Fp and I Pakfp Packages
Stf8N80K5, Stfi8N80K5: N-Channel 800 V, 0.8 Typ., 6 A Mdmesh™ K5 Power Mosfet in To-220Fp and I Pakfp Packages
Features
Order codes VDS RDS(on)max. ID PTOT
STF8N80K5
800 V 0.95 Ω 6A 25 W
STFI8N80K5
Description
These very high voltage N-channel Power
MOSFETs are designed using MDmesh™ K5
G(1) technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
S(3)
AM01476v1
STF8N80K5 TO-220FP
8N80K5 Tube
STFI8N80K5 I2PAKFP (TO-281)
Contents
1 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1 Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
5 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
1 Electrical ratings
2 Electrical characteristics
Drain-source breakdown
V(BR)DSS ID = 1 mA, VGS= 0 800 V
voltage
Table 5. Dynamic
Symbol Parameter Test conditions Min. Typ. Max. Unit
The built-in back-to-back Zener diodes have been specifically designed to enhance the ESD
capability of the device. The Zener voltage is appropriate for efficient and cost-effective
intervention to protect the device integrity. These integrated Zener diodes thus eliminate the
need for external components.
10
is
ea )
ar S(
on
10µs
is D
th R
in x
1 n ma
tio y
e ra d b 100µs
p e
O imit
L
1ms
Tj=150°C
0.1 10ms
Tc=25°C
Single pulse
0.01
0.1 1 10 100 VDS(V)
8 8
8V
6 6
4 4
7V
2
2
6V
0 0
0 4 8 12 16 VDS(V) 5 6 7 8 9 10 VGS(V)
8 400 1.0
6 300
0.8
4 200
0.6
2 100
0 0 0.4
0 4 8 12 16 Qg(nC) 0 2 4 6 8 10 12 ID(A)
1000 6
Ciss
100 4
Coss
10 2
Crss
1 0
0.1 1 10 100 VDS(V) 0 200 400 600 VDS(V)
Figure 10. Normalized gate threshold voltage Figure 11. Normalized on-resistance vs.
vs. temperature temperature
VGS(th) AM15639v1 AM15640v1
RDS(on)
(norm) ID=100µA (norm) VGS=10V
VDS=VGS ID=3 A
2.4
1
2
0.8 1.6
1.2
0.6
0.8
0.4 0.4
-50 0 50 100 TJ(°C) -50 0 50 100 TJ(°C)
Figure 12. Drain-source diode forward Figure 13. Normalized VDS vs. temperature
characteristics
AM15641v1 AM15642v1
VSD VDS
(V) (norm)
TJ=-50°C
1.1 ID = 1mA
0.9
1.06
TJ=25°C
0.8
1.02
0.7
0.98
TJ=150°C
0.6
0.94
0.5 0.9
1 2 3 4 5 ISD(A) -50 0 50 100 TJ(°C)
80
60
40
20
0
0 40 80 120 TJ(°C)
3 Test circuits
Figure 15. Switching times test circuit for Figure 16. Gate charge test circuit
resistive load
VDD
12V 47kΩ
1kΩ
100nF
RL 2200 3.3
μF μF
VDD IG=CONST
VD Vi=20V=VGMAX 100Ω D.U.T.
VGS 2200
RG D.U.T. μF 2.7kΩ VG
PW
47kΩ
PW 1kΩ
AM01468v1 AM01469v1
Figure 17. Test circuit for inductive load Figure 18. Unclamped inductive load test circuit
switching and diode recovery times
L
A A A
D
FAST L=100μH VD
G D.U.T. DIODE 2200 3.3
μF μF VDD
S B 3.3 1000
B B μF μF
25 Ω VDD ID
D
RG S
Vi D.U.T.
Pw
AM01470v1 AM01471v1
Figure 19. Unclamped inductive waveform Figure 20. Switching time waveform
V(BR)DSS ton toff
tr tdoff tf
VD tdon
90% 90%
IDM
10%
ID 10% VDS
0
7012510_Rev_K_B
A 4.4 4.6
B 2.5 2.7
D 2.5 2.75
E 0.45 0.7
F 0.75 1
F1 1.15 1.70
F2 1.15 1.70
G 4.95 5.2
G1 2.4 2.7
H 10 10.4
L2 16
L3 28.6 30.6
L4 9.8 10.6
L5 2.9 3.6
L6 15.9 16.4
L7 9 9.3
Dia 3 3.2
UHY$
A 4.40 4.60
B 2.50 2.70
D 2.50 2.75
D1 0.65 0.85
E 0.45 0.70
F 0.75 1.00
F1 1.20
G 4.95 - 5.20
H 10.00 10.40
L1 21.00 23.00
L2 13.20 14.10
L3 10.55 10.85
L4 2.70 3.20
L5 0.85 1.25
L6 7.30 7.50
5 Revision history
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