ACS772

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

FEATURES AND BENEFITS DESCRIPTION

• AEC-Q100 Grade 1 qualified The Allegro™ ACS772 family of current sensor ICs provide
• Typical of 2.5 μs output response time economical and precise solutions for AC or DC current sensing,
• 5 V supply operation ideal for motor control, load detection and management, power
• Ultra-low power loss: 100 μΩ internal conductor resistance supply and DC-to-DC converter control, and inverter control.
• Reinforced galvanic isolation allows use in economical, The 2.5 µs response time enables overcurrent fault detection
high-side current sensing in high-voltage systems in safety-critical applications.
• 4800 Vrms dielectric strength certified under UL60950-1
The device consists of a precision, low-offset linear Hall
• Industry-leading noise performance with greatly
circuit with a copper conduction path located near the die.
improved bandwidth through proprietary amplifier and
Applied current flowing through this copper conduction path
filter design techniques
generates a magnetic field which the Hall IC converts into a
• Integrated shield greatly reduces capacitive coupling
proportional voltage. Device accuracy is optimized through the
from current conductor to die due to high dV/dt signals,
close proximity of the magnetic signal to the Hall transducer.
and prevents offset drift in high-side, high-voltage
A precise, proportional output voltage is provided by the
applications
low-offset, chopper-stabilized BiCMOS Hall IC, which is
• Greatly improved total output error through digitally
programmed for accuracy at the factory. Proprietary digital
programmed and compensated gain and offset over the
temperature compensation technology greatly improves the
full operating temperature range
IC accuracy and temperature stability.
• Small package size, with easy mounting capability
• Monolithic Hall IC for high reliability High-level immunity to current conductor dV/dt and stray
• Output voltage proportional to AC or DC currents electric fields is offered by Allegro proprietary integrated shield
• Factory-trimmed for accuracy technology for low output voltage ripple and low offset drift
• Extremely stable output offset voltage in high-side, high-voltage applications.

CB Certificate Number: Continued on the next page…

US-29755-UL

PACKAGE: 5-pin package (suffix CB)

PFF PSF PSS SMT

Leadform Leadform Leadform Leadform
Not to scale

5V
1
VCC 5
Application 1: the ACS772 outputs an analog CBYP IP–
signal, VOUT , that varies linearly with the 0.1 µF ACS772
bidirectional AC or DC primary sensed cur- 2
rent, IP , within the range specified. RF and GND IP
CF are for optimal noise management, with CF
values that depend on the application. 4
3 IP+
VOUT VIOUT
RF

Typical Application

ACS772-DS, Rev. 17 September 14, 2021

MCO-0000363
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

DESCRIPTION (continued)
The output of the device increases when an increasing current flows allows the ACS772 family of sensor ICs to be used in applications
through the primary copper conduction path (from terminal 4 to terminal requiring electrical isolation without the use of opto-isolators or
5), which is the path used for current sampling. The internal resistance other costly isolation techniques.
of this conductive path is 100 μΩ typical, providing low power loss.
The device is fully calibrated prior to shipment from the factory.
The thickness of the copper conductor allows survival of the device The ACS772 family is lead (Pb) free. All leads are plated with 100%
at high overcurrent conditions. The terminals of the conductive path matte tin, and there is no Pb inside the package. The heavy gauge
are electrically isolated from the signal leads (pins 1 through 3). This leadframe is made of oxygen-free copper.

2
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

SELECTION GUIDE
Package Primary Sampled Sensitivity
Sens (Typ.) Nominal TA [3]
Part Number [1] Current , IP Packing [4]
Terminals Signal Pins (°C)
(A) (mV/A) [2]
ACS772LCB-050U-PFF-T Formed Formed 50 80
ACS772LCB-050B-PFF-T Formed Formed
ACS772LCB-050B-PSF-T Straight Formed
±50 40
ACS772LCB-050B-PSS-T Straight Straight
–40 to 150
ACS772LCB-050B-SMT-T Formed Formed
ACS772LCB-100U-PFF-T Formed Formed 100 40
ACS772LCB-100B-PFF-T Formed Formed
±100 20
ACS772LCB-100B-SMT-T Formed Formed
ACS772KCB-150U-PFF-T Formed Formed
150 26.66
ACS772KCB-150U-SMT-T Formed Formed
–40 to 125
ACS772KCB-150B-PFF-T Formed Formed 34 pieces
±150 13.33
ACS772KCB-150B-SMT-T Formed Formed per tube
ACS772ECB-200U-PFF-T Formed Formed 200 20
ACS772ECB-200B-PFF-T Formed Formed
±200 10
ACS772ECB-200B-SMT-T Formed Formed
ACS772ECB-250U-PFF-T Formed Formed
250 16
ACS772ECB-250U-PSF-T Straight Formed
–40 to 85
ACS772ECB-250B-PFF-T Formed Formed
±250 8
ACS772ECB-250B-PSF-T Straight Formed
ACS772ECB-300B-PFF-T Formed Formed ±300 6.66
ACS772ECB-400U-PSF-T Straight Formed 400 10
ACS772ECB-400B-PFF-T Formed Formed ±400 5
[1] Additionalleadform and sensitivity options available for qualified volumes.
[2] Measured at V
CC = 5 V.
[3] All ACS772 devices are production tested and guaranteed to T = 150°C, provided the Maximum Junction Temperature, T
A J(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[4] Contact Allegro for additional packing options.

ACS 772 L CB - 050 B - PFF - T

Lead (Pb) Free

Lead Form

Output Directionality:
B – Bidirectional (positive and negative current)
U – Unidirectional (only positive current)

Current Sensing Range (A)

Package Designator

Operating Temperature Range

3 Digit Part Number

Allegro Current Sensor

3
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ABSOLUTE MAXIMUM RATINGS

Characteristic Symbol Notes Rating Unit
Supply Voltage VCC 6.5 V
Reverse Supply Voltage VRCC –0.5 V
Output Voltage VIOUT 6.5 V
Reverse Output Voltage VRIOUT –0.5 V
Output Source Current IOUT(Source) VIOUT to GND 3 mA
Output Sink Current IOUT(Sink) Minimum pull-up resistor of 500 Ω from VCC to VIOUT 10 mA
Maximum Continuous Current ICMAX TA = 25°C 250 A
Operating Ambient Temperature [1] TA Range E, K, and L –40 to 150 °C
Maximum Junction Temperature TJ(max) 165 °C
Storage Temperature Tstg –65 to 165 °C

[1] All ACS772devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Thermal
Application section of this datasheet for more information.

ESD RATINGS
Characteristic Symbol Test Conditions Value Unit
Human Body Model VHBM Per JEDEC JS-001 ±6 kV
Charged Device Model VCDM Per JEDEC JS-002 ±1 kV

ISOLATION CHARACTERISTICS
Characteristic Symbol Notes Rating Unit
Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5 1.2 µs
Dielectric Surge Strength Test Voltage VSURGE 8000 V
(rise) / 50 µs (width)
Agency type-tested for 60 seconds per UL standard 60950-1, 2nd
Dielectric Strength Test Voltage [2] VISO 4800 VRMS
Edition. Tested at 3000 VRMS for 1 second in production.
1358 VPK or VDC
Working Voltage for Basic Isolation VWVBI For basic (single) isolation per UL standard 60950-1, 2nd Edition
960 VRMS
For reinforced (double) isolation per UL standard 60950-1, 2nd 672 VPK or VDC
Working Voltage for Reinforced Isolation VWFRI
Edition 475 VRMS
Distance Through Insulation DIT Minimum internal distance through insulation 0.47 mm
Comparative Tracking Index CTI Material Group II 400 to 599 V
[2] Allegro does not conduct 60-second testing. It is done only during the UL certification process.

TYPICAL OVERCURRENT CAPABILITIES [4][5]

Characteristic Symbol Notes Rating Unit
TA = 25°C; current is on for 1 second and off for 99 seconds, 100 pulses applied 1200 A
Overcurrent IPOC TA = 85°C; current is on for 1 second and off for 99 seconds, 100 pulses applied 900 A
TA = 150°C; current is on for 1 second and off for 99 seconds, 100 pulses applied 600 A
[4] Testwas done with Allegro evaluation board. The maximum allowed current is limited by TJ(max) only.
[5] For more overcurrent profiles, please see FAQ on the Allegro website, www.allegromicro.com.

4
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

IP+

VCC
To all subcircuits
C BYPASS

Programming Charge Pump Pulse Undervoltage

Control Generator Detection

Temperature EEPROM and

Sensor Control Logic

Active Temperature
Sensitivity Control Offset Control Output Clamps
Compensation
Dynamic Offset
Cancellation

VIOUT
Signal Recovery
CL

IP– GND

Functional Block Diagram

THERMAL CHARACTERISTICS: May require derating at maximum conditions

Characteristic Symbol Test Conditions [3] Value Unit
Mounted on the Allegro evaluation board with 2800 mm2
(1400 mm2 on component side and 1400 mm2 on opposite
side) of 4 oz. copper connected to the primary leadframe
Package Thermal Resistance RθJA and with thermal vias connecting the copper layers. 7 °C/W
Performance is based on current flowing through the
primary leadframe and includes the power consumed by
the PCB.
[3] Additional thermal information available on the Allegro website.

Terminal List Table

5 IP–
VCC 1 Number Name Description
GND 2
1 VCC Device power supply terminal
VIOUT 3
4 IP+ 2 GND Signal ground terminal
3 VIOUT Analog output signal
Pinout Diagram 4 IP+ Terminal for current being sampled
5 IP– Terminal for current being sampled

5
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

COMMON OPERATING CHARACTERISTICS: Valid at TA = –40°C to 150°C, CBYP = 0.1 µF, and VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. Max. Unit
ELECTRICAL CHARACTERISTICS
Supply Voltage VCC 4.5 5 5.5 V
Supply Current ICC VCC = 5 V, no load on output – 10 15 mA
Power-On Delay tPOD TA = 25°C – 64 – µs

Undervoltage Lockout (UVLO) VUVLOH VCC rising at 1 V/ms and device functions enabled – 4 – V
Threshold [1] VUVLOL VCC falling at 1 V/ms and device functions enabled – 3.5 – V
UVLO Hysteresis VHYS(UVLO) 250 – – mV
Time measured from falling VCC < VUVLOH to UVLO
tUVLOE – 64 – µs
UVLO Enable/Disable Delay enabled
Time [1] Time measured from rising VCC > VUVLOH to UVLO
tUVLOD – 7 – µs
disabled
VPORH VCC rising at 1 V/ms – 2.9 – V
Power-On Reset Voltage
VPORL VCC falling at 1 V/ms – 2.5 – V
POR Hysteresis VHYS(POR) 250 – – mV
Rise Time tr TA = 25°C, CL = 0.47 nF – 2.4 – µs
Propagation Delay Time tPROP TA = 25°C, CL = 0.47 nF – 1.2 – µs
Response Time tRESPONSE TA = 25°C, CL = 0.47 nF – 2.5 – µs
Output Slew Rate SR TA = 25°C, CL = 0.47 nF – 0.67 – V/µs
Internal Bandwidth BWi Small signal –3 dB, CL = 0.47 nF – 200 – kHz
DC Output Impedance ROUT TA = 25°C – 3.3 – Ω
Output Load Resistance RLOAD(MIN) VIOUT to GND, VIOUT to VCC 4.7 – – kΩ
Output Load Capacitance CLOAD(MAX) VIOUT to GND – 1 10 nF
Primary Conductor Resistance RPRIMARY TA = 25°C – 100 – µΩ
VSAT(HIGH) TA = 25°C, RL(PULLDWN) = 10 kΩ to GND VCC – 0.2 – – V
Output Saturation Voltage
VSAT(LOW) TA = 25°C, RL(PULLUP) = 10 kΩ to VCC – – 200 mV
ERROR COMPONENTS
QVO Ratiometry Error [2] RatERRQVO VCC = 4.75 to 5.25 V – ±0.15 – %
Sens Ratiometry Error [2] RatERRSens VCC = 4.75 to 5.25 V – ±0.3 – %
Input referenced noise density; TA = 25°C, CL = 1 nF – 0.15 – mA  / √¯(Hz)
Noise IN
Input referenced noise at 200 kHz; TA = 25°C, CL = 1 nF – 85 – mARMS
Nonlinearity [2] ELIN Up to 200 A –0.9 ±0.5 0.9 %
Symmetry [2] ESYM Over half-scale IP –0.8 ±0.4 0.8 %

[1] UVLO feature is only available on part numbers programmed to work at VCC = 5 V.
[2] See the Nonlinearity Characteristic Definitions section.

6
Allegro MicroSystems
955 Perimeter Road
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www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X050U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 – 50 A
80 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 20.4 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 3.4 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.7 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 120 250 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

7
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X050B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –50 – 50 A
40 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 20.4 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 3.4 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.7 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 210 250 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

8
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X100U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 – 100 A
40 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 20.4 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 3.4 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.7 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 280 400 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

9
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X100B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –100 – 100 A
20 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 20.4 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 3.4 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.7 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

10
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X150U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 – 150 A
26.66 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 20.4 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 3.4 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.7 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 280 400 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

11
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X150B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –150 – 150 A
13.33 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 7.2 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 1.2 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.7 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.8 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 280 400 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

12
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X200U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 – 200 A
20 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 7.2 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 1.2 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.5 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.7 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.5 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±6 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 160 400 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.9 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.7 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

13
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X200B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –200 – 200 A
10 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 5.1 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 0.85 – mVRMS
Full scale of IP, TA = 25°C –1 ±0.5 1 %
Sensitivity Error ESens Full scale of IP, TA = 25°C to 150°C –1.25 ±0.7 1.25 %
Full scale of IP, TA = –40°C to 25°C –3.5 ±1.5 3.5 %
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 380 400 mA
ETOT(HT) Full scale of IP, TA = 25°C to 150°C –1.5 ±0.7 1.5 %
Total Output Error
ETOT(LT) Full scale of IP, TA = –40°C to 25°C –3.5 ±1.5 3.5 %
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

14
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X250U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 – 250 A
16 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 5.1 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 0.85 – mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
–1.25 ±0.8 1.25 %
Sensitivity Error ESens TA = 25°C to 150°C
IP = 200 A, not tested at full scale IP;
–3.5 ±1.7 3.5 %
TA = –40°C to 25°C
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 200 400 mA
IP = 200 A, not tested at full scale IP;
ETOT(HT) –1.5 ±0.9 1.5 %
TA = 25°C to 150°C
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT) –3.5 ±1.7 3.5 %
TA = –40°C to 25°C
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

15
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X250B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –250 – 250 A
8×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 5.1 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 0.85 – mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
–1.25 ±0.8 1.25 %
Sensitivity Error ESens TA = 25°C to 150°C
IP = 200 A, not tested at full scale IP;
–3.5 ±1.7 3.5 %
TA = –40°C to 25°C
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA
IP = 200 A, not tested at full scale IP;
ETOT(HT) –1.5 ±0.9 1.5 %
TA = 25°C to 150°C
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT) –3.5 ±1.7 3.5 %
TA = –40°C to 25°C
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

16
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X300B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –300 – 300 A
6.66 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 5.1 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 0.85 – mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
–1.25 ±0.8 1.25 %
Sensitivity Error ESens TA = 25°C to 150°C
IP = 200 A, not tested at full scale IP;
–3.5 ±1.7 3.5 %
TA = –40°C to 25°C
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA
IP = 200 A, not tested at full scale IP;
ETOT(HT) –1.5 ±0.9 1.5 %
TA = 25°C to 150°C
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT) –3.5 ±1.7 3.5 %
TA = –40°C to 25°C
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

17
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X400U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR 0 – 400 A
10 ×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC /10 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 5.1 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 0.85 – mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.5 1 %
IP = 200 A, not tested at full scale IP;
–1.25 ±0.7 1.25 %
Sensitivity Error ESens TA = 25°C to 150°C
IP = 200 A, not tested at full scale IP;
–3.5 ±1.5 3.5 %
TA = –40°C to 25°C
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 245 400 mA
IP = 200 A, not tested at full scale IP;
ETOT(HT) –1.5 ±0.8 1.5 %
TA = 25°C to 150°C
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT) –3.5 ±2.7 3.5 %
TA = –40°C to 25°C
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values. Typical values may be revaluated once the specific part number is released to production.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

18
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

X400B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC = 5 V, unless otherwise specified
Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit
NOMINAL PERFORMANCE
Current Sensing Range IPR –400 – 400 A
5×
Sensitivity Sens IPR(min) < IP < IPR(max) – – mV/A
VCC / 5
Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 – V
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF – 5.1 – mVp-p
Noise VN
TA = 25°C, CL = 1 nF – 0.85 – mVRMS
IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %
IP = 200 A, not tested at full scale IP;
–1.25 ±0.8 1.25 %
Sensitivity Error ESens TA = 25°C to 150°C
IP = 200 A, not tested at full scale IP;
–3.5 ±1.7 3.5 %
TA = –40°C to 25°C
VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV
Electrical Offset Error VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV
VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV
Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA
IP = 200 A, not tested at full scale IP;
ETOT(HT) –1.5 ±0.9 1.5 %
TA = 25°C to 150°C
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT) –3.5 ±1.7 3.5 %
TA = –40°C to 25°C
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %
Sensitivity Error Including Lifetime
ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %
ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %
Total Output Error Including Lifetime
ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %
EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV
Electric Offset Error Including Lifetime
EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

19
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-050U-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
10 82
8
81.5
6
4 81

Sens(mV/A)
2
Voe(mV)

80.5
0
80
-2
-4 79.5
-6
79
-8
-10 78.5
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.7 2.5
Avg-3σ
0.6 2 Avg
0.5 1.5 Avg+3σ

0.4 1
Error(%)

0.3
Elin(%)

0.5
0.2 0
0.1 -0.5
0 -1
-0.1 -1.5
-0.2 -2
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

180

160

140

120
Ierrom(mA)

100

80

60
Avg-3σ
40
Avg
20 Avg+3σ
0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

20
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-050B-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
8 40.6

6 40.4

4
40.2

Sens(mV/A)
Voe(mV)

2
40
0
39.8
-2

39.6
-4

-6 39.4
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.8 1.5

0.7
1
0.6
0.5
0.5
Error(%)
Elin(%)

0.4 0

0.3
-0.5
0.2
-1
0.1

0 -1.5
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

180

160

140

120
Ierrom(mA)

100

80

60

40

20

0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

21
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ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-100U-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
10 40.6

8
40.4

6
40.2

Sens(mV/A)
Voe(mV)

4
40
2
39.8
0

-2 39.6

-4 39.4
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.7 2.5
Avg-3σ
0.6 2 Avg
Avg+3σ
1.5
0.5
1
Error(%)

0.4
Elin(%)

0.5
0.3
0
0.2
Avg-3σ -0.5

0.1 Avg -1
Avg+3σ
0 -1.5
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

250

200
Ierrom(mA)

150

100

Avg-3σ
50 Avg
Avg+3σ
0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

22
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ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-100B-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
6 20.5

20.4
4
20.3

2 20.2

Sens(mV/A)
Voe(mV)

20.1
0
20

-2 19.9

19.8
-4
19.7

-6 19.6
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150

Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.8 2.5

2
0.7
1.5
0.6
1
0.5
Error(%)

0.5
Elin(%)

0.4
0
0.3 -0.5
0.2 -1

0.1 -1.5

0 -2
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

300

250

200
Ierrom(mA)

150

100

50

0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

23
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772KCB-150U-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
6 27.2

5 27.1

4 27

3 26.9

Sens(mV/A)
2 26.8
Voe(mV)

1 26.7

0 26.6

-1 26.5

-2 26.4

-3 26.3

-4 26.2
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150

Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.6 2.5

2
0.5
1.5
0.4
1
Error(%)
Elin(%)

0.3 0.5

0
0.2
-0.5
0.1
-1

0 -1.5
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

300

250

200
Ierrom(mA)

150

100

50

0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

24
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772KCB-150B-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
8 13.7

6 13.6

4 13.5

Sens(mV/A)
Voe(mV)

2 13.4

0 13.3

-2 13.2

-4 13.1
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150

Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.7 3
2.5
0.6
2
0.5 1.5
1
Error(%)

0.4
Elin(%)

0.5
0.3 0
-0.5
0.2
-1
0.1
-1.5

0 -2
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

350

300

250
Ierrom(mA)

200

150

100

50

0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

25
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ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-200U-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
8 20.5
20.4
6
20.3
4 20.2
20.1

Sens(mV/A)
Voe(mV)

2
20
0 19.9
19.8
-2 19.7
19.6
-4
19.5
-6 19.4
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.4 3

0.35
2
0.3
1
0.25
Error(%)
Elin(%)

0.2 0

0.15
-1
0.1
-2
0.05

0 -3
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

250

200
Ierrom(mA)

150

100

50

0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

26
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-200B-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
5 10.15
4
10.1
3
2 10.05
1

Sens(mV/A)
10
Voe(mV)

0
-1 9.95
-2
9.9
-3
-4 9.85
-5
-6 9.8
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150

Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature
0.6 2

1.5
0.5
1
0.4
0.5
Error(%)
Elin(%)

0.3 0

-0.5
0.2
-1
0.1
-1.5

0 -2
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

350

300

250
Ierrom(mA)

200

150

100 Avg-3σ
Avg
50
Avg+3σ
0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-250U-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
12 16.25
16.2
10
16.15
8 16.1
16.05

Sens(mV/A)
6
Voe(mV)

16
4 15.95
2 15.9
15.85
0
15.8
-2 15.75

-4 15.7
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150

Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature[1] Total Output Error versus Ambient Temperature
0.5 2
0.45
1.5
0.4
1
0.35
0.3 0.5
Error(%)
Elin(%)

0.25 0
0.2
-0.5
0.15
-1
0.1
0.05 -1.5

0 -2
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

300

250

200
Ierrom(mA)

150

100

50

0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

[1] Nonlinearity versus Ambient Temperature Performance Plot is valid for applied currents less than 200 A.

28
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-250B-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
6 8.15

4 8.1

2 8.05

Sens(mV/A)
Voe(mV)

0 8

-2 7.95

-4 7.9

-6 7.85
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature [1] Total Output Error versus Ambient Temperature
0.6 2

0.5 1.5

1
0.4
Error(%)

0.5
Elin(%)

0.3
0
0.2
-0.5
0.1
-1

0 -1.5
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

350

300

250
Ierrom(mA)

200

150

100

50

0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

[1] Nonlinearity versus Ambient Temperature Performance Plot is valid for applied currents less than 200 A.

29
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-400B-PFF-T

Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature
6 5.12
Avg-3σ 5.1
4 Avg-3σ
Avg 5.08
Avg
Avg+3σ 5.06
2 Avg+3σ
5.04

Sens(mV/A)
Voe(mV)

5.02
0
5
-2 4.98
4.96
-4 4.94
4.92
-6 4.9
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Nonlinearity versus Ambient Temperature [1] Total Output Error versus Ambient Temperature
0.8 3
2.5 Avg-3σ
0.7 Avg
2
0.6 Avg+3σ
1.5
0.5 1
Error(%)
Elin(%)

0.4 0.5
0
0.3
-0.5
0.2 Avg-3σ -1
0.1 Avg
-1.5
Avg+3σ
0 -2
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Ta(℃) Ta(℃)

Magnetic Offset Error versus Ambient Temperature

350

300

250
Ierrom(mA)

200

150

100 Avg-3σ
Avg
50
Avg+3σ
0
-50 -25 0 25 50 75 100 125 150
Ta(℃)

[1] Nonlinearity versus Ambient Temperature Performance Plot is valid for applied currents less than 200 A.

30
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC PERFORMANCE DATA

Response Time (tRESPONSE)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF

Propagation Delay (tPROP)

70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

Rise Time (tR)

70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

UVLO Enable Time (tUVLOE)

VCC 5 V to 3 V fall time = 1.5 µs, CL = 1 nF

UVLO Disble Time (tUVLOD)

VCC 3 V to 5 V recovery time = 1.5 µs, CL = 1 nF

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

CHARACTERISTIC DEFINITIONS

Definitions of Accuracy Characteristics

SENSITIVITY (Sens) Due to core saturation, the nonlinearity error will increase when
The change in sensor IC output in response to a 1 A change applied current exceeds 200 A. Refer to the Sensitivity Error vs.
through the primary conductor. The sensitivity is the product Applied Current plots below.
of the magnetic circuit sensitivity (G / A; 1 G = 0.1 mT) and the
SYMMETRY (E SYM)
linear IC amplifier gain (mV/G). The linear IC amplifier gain is
programmed at the factory to optimize the sensitivity (mV/A) for The degree to which the absolute voltage output from the IC var-
the full-scale current of the device. ies in proportion to either a positive or negative half-scale primary
current. The following equation is used to derive symmetry:
SENSITIVITY ERROR (ESens)
The sensitivity error is the percent difference between the mea-
sured sensitivity and the ideal sensitivity. For example, in the case
100 ×
( VIOUT_+half-scale amperes – VIOUT(Q)
VIOUT(Q) – VIOUT_–half-scale amperes )
of VCC = 5 V:
SensMeas(5V) – SensIdeal(5V)
ESens = × 100 (%) RATIOMETRY ERROR
SensIDEAL(5V)
The device features a ratiometric output. This means that the
NOISE (V N) quiescent voltage output, VIOUTQ, and the magnetic sensitivity,
The noise floor is derived from the thermal and shot noise Sens, are proportional to the supply voltage, VCC.The ratiometric
observed in Hall elements. Dividing the noise (mV) by the sensi- change (%) in the quiescent voltage output is defined as:
tivity (mV/A) provides the smallest current that the device is able
to resolve.

NONLINEARITY (E LIN)
RatErrQVO = [ 1–
(VIOUTQ(VCC) / VIOUTQ(5V))
VCC / 5 V ]
× 100%

The ACS772 is designed to provide a linear output in response and the ratiometric change (%) in sensitivity is defined as:

[ ]
to a ramping current. Consider two current levels: I1 and I2. Ide- (Sens(VCC) / Sense(5V))
ally, the sensitivity of a device is the same for both currents, for RatErrSens = 1 – × 100%
VCC / 5 V
a given supply voltage and temperature. Nonlinearity is present
when there is a difference between the sensitivities measured at
I1 and I2. Nonlinearity is calculated separately for the positive ZERO CURRENT OUTPUT VOLTAGE (VIOUT(Q))
(ELINpos ) and negative (ELINneg ) applied currents as follows: The output of the sensor when the primary current is zero. It
nominally remains at 0.5 × VCC for a bidirectional device and 0.1
ELINpos = 100 (%) × {1 –  (SensIPOS2 / SensIPOS1 ) } × VCC for a unidirectional device. For example, in the case of a
bidirectional output device, VCC = 5 V translates into VIOUT(Q) =
ELINneg = 100 (%) × {1 –  (SensINEG2 / SensINEG1 )}
2.5 V. Variation in VIOUT(Q) can be attributed to the resolution of
where: the Allegro linear IC quiescent voltage trim and thermal drift.
SensIx = (VIOUT(Ix) – VIOUT(Q))/ Ix ELECTRICAL OFFSET VOLTAGE (VOE)
and IPOSx and INEGx are positive and negative currents and IPOS2
The deviation of the device output from its ideal quiescent value
= 2 × IPOS1 and INEG2 = 2 × INEG1.
of 0.5 × VCC (bidirectional) or 0.1 × VCC (unidirectional) due to
Then: nonmagnetic causes. To convert this voltage to amperes, divide by
ELIN = max( ELINpos , ELINneg ) the device sensitivity, Sens.

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

MAGNETIC OFFSET ERROR (I ERROM)

VIOUT(IP) – VIOUT(ideal)(IP)
The magnetic offset is due to the residual magnetism (remnant ETOT(IP) = × 100(%)
Sensideal × IP
field) of the core material. The magnetic offset error is highest
when the magnetic circuit has been saturated, usually when the where
device has been subjected to a full-scale or high-current overload
condition. The magnetic offset is largely dependent on the mate- VIOUT(ideal)(IP) = VIOUT(Q) + (SensIDEAL × IP )
rial used as a flux concentrator. The larger magnetic offsets are
observed at the lower operating temperatures.
The Total Output Error incorporates all sources of error and is a
TOTAL OUTPUT ERROR (E TOT) function of IP.
The difference between the current measurement from the sensor At relatively high currents, ETOT will be mostly due to sensitiv-
IC and the actual current (IP), relative to the actual current. This ity error, and at relatively low currents, ETOT will be mostly due
is equivalent to the difference between the ideal output voltage to Offset Voltage (VOE). In fact, as IP approaches zero, ETOT
and the actual output voltage, divided by the ideal sensitivity, approaches infinity due to the offset voltage. This is illustrated
relative to the current flowing through the primary conduction in Figure 3 and Figure 4. Figure 3 shows a distribution of output
path: voltages versus IP at 25°C and across temperature. Figure 4
shows the corresponding ETOT versus IP.

Figure 1: Sensitivity Error (relative to ideal 5 mV/A) in Figure 2: Sensitivity Error in Percent of
Amps vs. Applied Current Full-Scale Current vs. Applied Current

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

Accuracy Across
Temperature
Increasing
VIOUT (V)
Accuracy at +ETOT
25°C Only

Ideal VIOUT
Accuracy Across
Temperature

Accuracy at
25°C Only Across Temperature

IPR(min) +IP (A) 25°C Only

VIOUT(Q)
–IP (A)
–IP +IP

Full Scale IP
IPR(max)

0A

Accuracy at
25°C Only
Decreasing
Accuracy Across VIOUT (V) –ETOT
Temperature

Figure 3: Output Voltage versus Sensed Current Figure 4: Total Output Error versus Sensed Current

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

Definitions of Dynamic Response Characteristics

POWER-ON DELAY (tPOD)
V
When the supply is ramped to its operating voltage, the device VCC
VCC(typ)
requires a finite time to power its internal components before VIOUT
responding to an input magnetic field. Power-On Delay, tPOD, is 90% VIOUT
defined as the time it takes for the output voltage to settle within
±10% of its steady-state value under an applied magnetic field,
after the power supply has reached its minimum specified operat-
ing voltage, VCC(min), as shown in the chart at right. VCC(min)
tPOD
RISE TIME (tr) t1 t2

The time interval between a) when the sensor reaches 10% of t1= time at which power supply reaches
its full-scale value, and b) when it reaches 90% of its full-scale minimum specified operating voltage
value. t2= time at which output voltage settles
within ±10% of its steady-state value
under an applied magnetic field
PROPAGATION DELAY (tPROP)
The time interval between a) when the sensed current reaches 0
+t
20% of its full-scale value, and b) when the sensor output reaches
20% of its full-scale value. Figure 5: Power-On Delay (tPOD)

RESPONSE TIME (tRESPONSE) (%) Primary Current

The time interval between a) when the applied current reaches
90% of its final value, and b) when the sensor reaches 90% of its 90
VIOUT
output corresponding to the applied current.

Rise Time, tr

20
10
0
Propagation Delay, tPROP t

Figure 6: Rise Time (tr) and Propagation Delay (tPROP)

(%) Primary Current

90
VIOUT

Response Time, tRESPONSE

0
t
Figure 7: Response Time (tRESPONSE)

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

FUNCTIONAL DESCRIPTION

Power-On Reset (POR) and Undervoltage

Lockout (UVLO) Operation
The descriptions in this section assume: temperature = 25°C, no ouput will be pulled near GND [ 6 ] . If VCC exceeds VUVLOL
output load (RL, CL), and no significant magnetic field is present. before the UVLO Enable Counter reaches tUVLOE [ 5′ ] , the output
will continue to be VCC / 2.
Power-Up
At power-up, as VCC ramps up, the output is in a high-impedance Coming Out of UVLO
state. When VCC crosses VPORH (location [1] in Figure 8 and [ 1′ ] While UVLO is enabled [ 6 ] , if VCC exceeds VUVLOH [ 7 ] ,
in Figure 9), the POR Release counter starts counting for tPORR . UVLO will be disabled after tUVLOD , and the output will be
At this point, if VCC exceeds VUVLOH [ 2′ ], the output will go to VCC  /  2 [ 8 ] .
VCC / 2 after tUVLOD [ 3′ ] .
Power-Down
If VCC does not exceed VUVLOH [2], the output will stay in the
high-impedance state until VCC reaches VUVLOH [3] and then will As VCC ramps down below VUVLOL [ 6′, 9 ] , the UVLO Enable
go to VCC / 2 after tUVLOD [ 4 ]. Counter will start counting. If VCC is higher than VPORL when
the counter reaches tUVLOE , the UVLO function will be enabled
VCC drops below VCC(min) = 4.5 V and the output will be pulled near GND [ 10 ] . The output will
enter a high-impedance state as VCC goes below VPORL [ 11 ] . If
If VCC drops below VUVLOL [ 4′, 5 ] , the UVLO Enable Counter
VCC falls below VPORL before the UVLO Enable Counter reaches
starts counting. If VCC is still below VUVLOL when the counter
tUVLOE , the output will transition directly into a high-impedance
reaches tUVLOE , the UVLO function will be enabled and the
state [ 7′ ].

EEPROM Error Checking And Correction

Hamming code methodology is implemented for EEPROM
checking and correction. The device has ECC enabled after
power-up. If an uncorrectable error has occurred, the VOUT pin
will go to high impedance and the device will not respond to
applied magnetic field.

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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

VCC
1 2 3 5 6 7 9 10 11
4 8
5.0
VUVLOH
VUVLOL
VPORH
VPORL
tUVLOE tUVLOE

GND
Time
VOUT Slope =
VCC / 2
2.5
tPORR
tUVLOD tUVLOD

GND
High Impedance High Impedance Time

Figure 8: POR and UVLO Operation: Slow Rise Time Case

VCC
1’ 2’ 4’ 5’ 6’ 7’
3’
5.0
VUVLOH
VUVLOL
VPORH
VPORL < tUVLOE

GND
Time
VOUT
tPORR < tUVLOE
Slope = Slope =
VCC / 2 VCC / 2
2.5
tUVLOD
GND
High Impedance High Impedance Time

Figure 9: POR and UVLO Operation: Fast Rise Time Case

39
Allegro MicroSystems
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

Chopper Stabilization Technique

When using Hall-effect technology, a limiting factor for sourced signal then can pass through a low-pass filter, while the
switchpoint accuracy is the small signal voltage developed across modulated DC offset is suppressed.
the Hall element. This voltage is disproportionally small relative to
In addition to the removal of the thermal and stress related offset,
the offset that can be produced at the output of the Hall sensor IC.
this novel technique also reduces the amount of thermal noise
This makes it difficult to process the signal while maintaining an
in the Hall sensor IC while completely removing the modulated
accurate, reliable output over the specified operating temperature
residue resulting from the chopper operation. The chopper sta-
and voltage ranges.
bilization technique uses a high-frequency sampling clock. For
Chopper stabilization is a unique approach used to minimize demodulation process, a sample-and-hold technique is used. This
Hall offset on the chip. Allegro employs a technique to remove high-frequency operation allows a greater sampling rate, which
key sources of the output drift induced by thermal and mechani- results in higher accuracy and faster signal-processing capability.
cal stresses. This offset reduction technique is based on a signal This approach desensitizes the chip to the effects of thermal and
modulation-demodulation process. The undesired offset signal is mechanical stresses, and produces devices that have extremely
separated from the magnetic field-induced signal in the frequency stable quiescent Hall output voltages and precise recoverabil-
domain, through modulation. The subsequent demodulation acts ity after temperature cycling. This technique is made possible
as a modulation process for the offset, causing the magnetic field- through the use of a BiCMOS process, which allows the use of
induced signal to recover its original spectrum at baseband, while low-offset, low-noise amplifiers in combination with high-density
the DC offset becomes a high-frequency signal. The magnetic- logic integration and sample-and-hold circuits.

Regulator

Clock/Logic

Hall Element

Amp

Anti-Aliasing Tuned
LP Filter Filter

Figure 10: Concept of Chopper Stabilization Technique

40
Allegro MicroSystems
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

APPLICATION INFORMATION
Thermal Rise vs. Primary Current The thermal capacity of the ACS772 should be verified by the
end user in the application’s specific conditions. The maximum
Self-heating due to the flow of current should be considered dur- junction temperature, TJ(MAX) (165℃), should not be exceeded.
ing the design of any current sensing system. The sensor, printed Further information on this application testing is available in
circuit board (PCB), and contacts to the PCB will generate heat the DC and Transient Current Capability application note on the
as current moves through the system. Allegro website.
The thermal response is highly dependent on PCB layout, copper
thickness, cooling techniques, and the profile of the injected current.
ASEK772 Evaluation Board Layout
The current profile includes peak current, current “on-time”, and Thermal data shown in Figure 11 was collected using the
duty cycle. While the data presented in this section was collected ASEK772 Evaluation Board (TED-85-0385-001). This board
with direct current (DC), these numbers may be used to approximate includes 2664 mm2 of 4 oz. copper (0.1388 mm) connected to
thermal response for both AC signals and current pulses. pins 4 and 5 with thermal vias connecting the layers. Top and bot-
tom layers of the PCB are shown below in Figure 13.
The plot in Figure 11 shows the measured rise in steady-state die
temperature of the ACS772 versus continuous current at an ambi-
ent temperature, TA, of 25°C. The thermal offset curves may be
directly applied to other values of TA. Conversely, Figure 12 shows
the maximum continuous current at a given TA. Surges beyond the
maximum current listed in Figure 12 are allowed given the maxi-
mum junction temperature, TJ(MAX) (165℃), is not exceeded.

Figure 11: Self-Heating in the CB Package

Due to Current Flow

Figure 13: Top and Bottom Layers

for ASEK772 Evaluation Board
Gerber files for the ASEK772 evaluation board are available for
download from the Allegro website. See the technical documents
section of the ACS772 device webpage.

Figure 12: Maximum Continuous Current at a Given TA

41
Allegro MicroSystems
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 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

PACKAGE OUTLINE DRAWING

For Reference Only – Not for Tooling Use

(Reference DWG-9111 & DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown

14.0 ±0.2 0.5

4.0 ±0.2 3.5 ±0.2 R1 = 1.0
R2 = 2.05
3.0 ±0.2 R3 = 3.0
1.50 ±0.10 1° ±2°

5 4

Ø 0.5 B

3 4
17.5 ±0.2
21.4
13.00 ±0.10

Branded
Face
4.40 ±0.10
Ø 0.8

1.9 ±0.2 Ø 1.5

2.9 ±0.2
0.51 ±0.10
1 2 3
+0.060 1.91
0.381
–0.030 5° ±5°
10.00 ±0.10 B PCB Layout Reference View
3.5 ±0.2

7.00 ±0.10 XXXXXXX

XXX-XXX

XXXXXXX
A Dambar removal intrusion
XXXX
B Perimeter through-holes recommended
C Branding scale and appearance at supplier discretion 1
C Standard Branding Reference View
Lines 1, 2, 3, 4 = 7 characters.

Line 1: Part Number

Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A

Creepage distance, current terminals to signal pins: 7.25 mm

Clearance distance, current terminals to signal pins: 7.25 mm
Package mass: 4.63 g typical

Figure 14: Package CB, 5-Pin, Leadform PFF

42
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

For Reference Only – Not for Tooling Use

(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown

14.0 ±0.2
4.0 ±0.2
3.0 ±0.2
∅ 0.8

5 4 ∅ 1.5

1.50 ±0.10
1.91

2.75 ±0.10 B PCB Layout Reference View

A

23.50 ±0.5

XXXXXXX
13.00 ±0.10 XXX-XXX

4.40 ±0.10 Branded

Face XXXXXXX
XXXX
1.9 ±0.2
2.9 ±0.2
0.51 ±0.10 1
1 2 3
+0.060
C Standard Branding Reference View
0.381
–0.030 5º±5° Lines 1, 2, 3, 4 = 7 characters.

3.5 ±0.2 Line 1: Part Number

Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
10.00 ±0.10

7.00 ±0.10
A Dambar removal intrusion
B Perimeter through-holes recommended

C Branding scale and appearance at supplier discretion

Figure 15: Package CB, 5-Pin, Leadform PSF

43
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

For Reference Only – Not for Tooling Use

(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown

14.0 ±0.2
∅ 0.8
4.0 ±0.2
3.0 ±0.2 ∅ 1.5

5 4
1.91

1.50 ±0.10 B PCB Layout Reference View

2.75 ±0.10
A
XXXXXXX
23.50 ±0.5 XXX-XXX

13.00 ±0.10 XXXXXXX

XXXX

4.40 ±0.10 Branded 1

Face
C Standard Branding Reference View
1 2 3 Lines 1, 2, 3, 4 = 7 characters.
3.18 ±0.10
11.0 ±0.05 1.9 ±0.2 Line 1: Part Number
+0.060 Line 2: Package Temperature - Amperes
0.51 ±0.10 0.381 Line 3: Lot Number
–0.030
Line 4: Date Code, Logo A

10.00 ±0.10

7.00 ±0.10
A Dambar removal intrusion
B Perimeter through-holes recommended

C Branding scale and appearance at supplier discretion

Figure 16: Package CB, 5-Pin, Leadform PSS

44
Allegro MicroSystems
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

For Reference Only – Not for Tooling Use

(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown

14.0 ±0.2
4.0 ±0.2
3.0 ±0.2
2.4 ±0.5

5 4 6.01
1.50 ±0.10
4.40
2.6 MIN 60°
9.6 ±0.5 0°-8°
16.0
3.3 ±0.5
A

0.56 REF
to pin tip

13.00 ±0.10 33.27

4.40 ±0.10 Branded 0.50 REF

Face to pin tip
1 2 3 3.7 ±0.5
1.9 ±0.2
45° 0°-8° 1.27
9.5 ±0.5
0.51 ±0.10
137.0°
3.8 ±0.5
+0.060 5.03
0.381
–0.030

10.00 ±0.10 PCB Layout Reference View

7.00 ±0.10

XXXXXXX
XXX-XXX

XXXXXXX
XXXX

1
A Dambar removal intrusion
B Standard Branding Reference View
B Branding scale and appearance at supplier discretion
Lines 1, 2, 3, 4 = 7 characters.

Line 1: Part Number

Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A

Figure 17: Package CB, 5-Pin, Leadform SMT

Note: The SMT leadform package variant is considered

Advance Information, and is subject to change without notice.

45
Allegro MicroSystems
955 Perimeter Road
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www.allegromicro.com
 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
ACS772 Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

Revision History
Number Date Description
– December 12, 2017 Initial release
Added Dielectric Surge Strength Test Voltage characteristic (page 3) and EEPROM Error Checking
1 January 30, 2018
and Correction section (page 16)
2 May 14, 2018 Added -050U, -100B, -150U, -200U, -250U, and -250B part options
Added -PSF leadform option; updated Magnetic Offset Error value (page 13) and Characteristic
3 September 24, 2018
Performance Data charts (pages 26 to 28)
Added -300B part option (page 2 and 16); added -PSS leadform option (pages 1, 2, and 39) and
4 November 12, 2018 Applications Information section (page 36); updated Typical Application (page 1), pinout diagram
(page 4), and TOP to TA (pages 2 and 5-15)
5 December 13, 2018 Added UL certificate; updated package outline drawing PCB layouts and branding (pages 37-39)
6 January 7, 2019 Corrected Sensitivity Error values for -200U part option (page 12)
7 January 24, 2019 Added -400B part option (page 2 and 17)
8 March 14, 2019 Updated package branding (pages 38-40) and Temperature ratings (pages 2-3, 6-17)
9 June 27, 2019 Corrected EVB copper thickness (page 37)
10 August 1, 2019 Added -400B Characteristic Performance Data charts (page 28)
Added Maximum Continuous Current to Absolute Maximum Ratings table (page 3),
11 August 28, 2019
ESD ratings table (page 3), and updated thermal data section (page 38)
Added SMT leadform package variant (pages 1, 3, 43) and Isolation Characteristics Pending
12 November 6, 2019
Certification (page 4)
13 December 10, 2019 Added PCB Layout Reference View to SMT leadform package drawings (page 43)
Removed Advance Information status from SMT leadform package variant (pages 1, 3); updated
Working Voltage for Basic Isolation and Working Voltage for Reinforced Isolation (page 4), Rise Time,
14 December 20, 2019
Response Time, Propagation Delay, and Output Slew Rate test conditions, and Output Slew Rate value
(page 6)
Added -150U-SMT and -400U part option (page 3, 17, 19); updated ESD Ratings Test Conditions (page
15 September 30, 2020
4); updated Isolation Characteristics table (page 4); corrected Electrical Offset Error (page 13)
16 January 20, 2021 Added ACS772LCB-050B-PSF-T and -200B-SMT part options to Selection Guide (page 3)
Corrected Nonlinearity Test Conditions (page 6); added footnote [1] (page 28-30); updated
17 September 14, 2021
Nonlinearity Characteristic Definition (page 34-35)

Copyright 2021, Allegro MicroSystems.

Allegro MicroSystems reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit
improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the
information being relied upon is current.
Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of
Allegro’s product can reasonably be expected to cause bodily harm.
The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems assumes no responsibility for its use; nor
for any infringement of patents or other rights of third parties which may result from its use.
Copies of this document are considered uncontrolled documents.

For the latest version of this document, visit our website:

www.allegromicro.com

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www.allegromicro.com