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    2.57 Nano-to-Macro Transport Processes Fall 2004

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    captainhass
    1. The document discusses various topics related to wave propagation and interfaces, including reflection, refraction, the Fresnel equations, Brewster's angle, total internal reflection, and tunneling. 2. Transfer matrix and resultant wave methods are introduced for calculating reflection and transmission in multilayer structures by combining multiple reflections and transmissions. 3. Interference effects can cause the reflectivity of a thin film to vary periodically with its thickness. 4. Tunneling can occur when the incident angle exceeds the critical angle, allowing some transmission into an attached medium if the second medium is thin.

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    2.57 Nano-to-Macro Transport Processes Fall 2004

    Uploaded by

    captainhass
    148 views9 pages
    1. The document discusses various topics related to wave propagation and interfaces, including reflection, refraction, the Fresnel equations, Brewster's angle, total internal reflection, and tunneling. 2. Transfer matrix and resultant wave methods are introduced for calculating reflection and transmission in multilayer structures by combining multiple reflections and transmissions. 3. Interference effects can cause the reflectivity of a thin film to vary periodically with its thickness. 4. Tunneling can occur when the incident angle exceeds the critical angle, allowing some transmission into an attached medium if the second medium is thin.

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    Lecture 13

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    1. The document discusses various topics related to wave propagation and interfaces, including reflection, refraction, the Fresnel equations, Brewster's angle, total internal reflection, and tunneling. 2. Transfer matrix and resultant wave methods are introduced for calculating reflection and transmission in multilayer structures by combining multiple reflections and transmissions. 3. Interference effects can cause the reflectivity of a thin film to vary periodically with its thickness. 4. Tunneling can occur when the incident angle exceeds the critical angle, allowing some transmission into an attached medium if the second medium is thin.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    148 views9 pages

    2.57 Nano-to-Macro Transport Processes Fall 2004

    Uploaded by

    captainhass
    1. The document discusses various topics related to wave propagation and interfaces, including reflection, refraction, the Fresnel equations, Brewster's angle, total internal reflection, and tunneling. 2. Transfer matrix and resultant wave methods are introduced for calculating reflection and transmission in multilayer structures by combining multiple reflections and transmissions. 3. Interference effects can cause the reflectivity of a thin film to vary periodically with its thickness. 4. Tunneling can occur when the incident angle exceeds the critical angle, allowing some transmission into an attached medium if the second medium is thin.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 9

    2.57 Nano-to-Macro Transport Processes Fall 2004 Lecture 13 Review of previous lectures 1.

    Energy transport between two points Q1->2 1 Q2->1 x 2. Plane waves & their interface reflection We are interested in the wave energy at points 1 and 2 on two sides of the interface. Transmission wave
    Reflection wave
    Incoming wave 1 2 Energy barrier u 2

    x 3. Oblique incidence of an electromagnetic wave onto an interface Ei Hi k n1 n2 t


    i

    kr x r Er x Et kt

    z Assuming flat interface, we have i = r . In last lecture, we have derived

    2.57 Fall 2004 Lecture 13

    E // r n 2 cos i + n1 cos t E 2n1 cos i , = t // = // t = E // i n 2 cos i + n1 cos t , E // i n 2 cos i + n1 cos t which are known as the Fresnel coefficients of reflection and transmission. For normal incidence ( i = 0 ), similarity exists between case 2 and case 3 (see the following table). r// =

    Electron propagation across a barrier k k2 r= r = 1 i k1 + k 2 2k1 t= k1 + k 2

    B k k R = J r / J i = = 1 2 A k1 + k2
    * J t Re k2 2 T= = t * J i Re k1

    Normal incidence onto an interface E n2 + n1 r// = // r = E // i n2 + n1 2n1 t // = n 2 + n1 S S 2 R// = r , z = r = r// Si , z Si


    T// = St , z Si , z n cos t = Re 2 n1 cos i t//
    2

    ( ) ( )

    Discussions 1) Critical & total internal reflection A) n1<n2 The Snell law is applied, n1 sin i = n2 sin t .

    n1<n2 x n2

    Note: The Snell law indicates the momentum conservation, or wavevector k x1 = k x2 on the interface. B) n1>n2 Because the maximum angle of the refracted wave is t=90o, there exists an angle of incidence above which no real solution for t exists. This critical angle happens when, according to the Snell law, n n1 sin c = n2 sin 90 o or sin c = 2 n1 Above this angle, the reflectivity equals one, i.e., all the incident energy is reflected (T=0, R=1).

    2.57 Fall 2004 Lecture 13

    For an electromagnetic wave incident above the critical angle, the Snell law gives,
    n sin i sin t
    = 1 > 1, n2
    and thus,
    n sin i cos t = 1 sin t = i 1 1 = ai . n2
    2 2

    In the wave function of the transmitted wave, the imaginary cos t leads to an exponential decay wave

    n x sin t + n2 z cos t E// t exp i t 2 co

    n x sin t n2 z a = E// t exp i t 2 co co , which is similar to the encountered evanescent wave. Two applications: a) Optical fiber An optical fiber has a core region and a cladding layer. The refractive index in the core region is higher than in the cladding layer. If light is launched into the fiber at an angle larger than the critical angle, the light will be bounced inside the core only without leakage, thus traveling a long distance along the fiber if the absorption coefficient of the core is small. However, the light can still escape the fiber core if we bend it.
    Leakage by bending

    b) Semiconductor laser In a semiconductor laser, light is emitted through electron-hole recombination inside the quantum well. The emitted light spreads over the core region and is confined by cladding layers that have a low refractive index than the core.

    2.57 Fall 2004 Lecture 13

    Electrode Cladding Layer Core Cladding Layer Electrode

    Quantum Wells

    2) Brewster angle When t + i =

    incident angle B is called the Brewster angle. The corresponding reflectivity is drawn in the following figure. R

    , we have the electric wave r// = 0 , but the magnetic wave r 0 . This

    R
    R//

    3) Complex refractive index For a complex refractive index N = n + i , the intensity of the wave decay as I e x , 4 where = .

    I e x
    x

    For real n1 and complex N2, from n1 sin i = N 2 sin t , we obtain complex t and n sin i = a + bi , cos t = 1 sin 2 t = c + di . sin t = 2 n1 Thus the transmission wave is n x sin t + ( n2 + i 2 )( c + di ) z E// t exp i t 2 co . Let c1 + d1i = ( n2 + i 2 )( c + di ) . Similar to the evanescent wave, the imaginary component

    2.57 Fall 2004 Lecture 13

    of the product leads to a decaying amplitude, while the real part contributes to the phase factor. The energy flow is still JK JJ * K 1 S = Re E H . 2

    Incident wave

    Amplitude contours Refraction wave

    4) Acoustic waves

     n

    Recall the Newtons law JK K F = ma , K JK K  , acceleration is a = d v . Denote u as the displacement, i.e., where the force is F = n dt K K K u = x x 0 . We have K K K d x du . v= = dt dt In mechanics, we define the strain as 1 u u j Sij = i + , 2 x j xi and the stress is

    = cS .
    Note: c is a fourth-order tensor and has 81 components. For phonons, we have two transverse waves and one longitudinal wave. The poynting vector for acoustic waves is 2.57 Fall 2004 Lecture 13 5

    J K K* 1 p = Re v . 2

    ( )

    When the media is isotropic and the incident wave is a transverse wave with displacement polarized in the direction perpendicular to the plane of incidence (called a shear wave or SH wave), only one SH reflected and one SH transmitted wave are excited. At normal incidence, the acoustic reflectivity for a SH wave is Z Z2 Rs = 1 , Z1 + Z 2 in which the acoustic impedance Z (similar to refractive index in optics) is defined as Z= v . SH wave
    2

    When the incident wave is polarized in the direction parallel to the plane of incidence, one longitudinal wave and one transverse wave are excited for both reflection and transmission waves. If the materials are anisotropic, one more transverse is excited for both reflection and transmission waves. Incident wave Polarization Reflection

    Transmission Note: The thermal resistance on the interface is very important for nanomaterials. Acoustic waves (or heat propagation) can be cut off by the interface, just as using a foil to cut off the radiation between two surfaces. 5.3 Wave propagation in thin films First let us consider the following structure. Many reflections and transmissions exist in this case. Summation is required to calculate the total reflection and transmission.

    2.57 Fall 2004 Lecture 13

    Reflection n1

    n2 n3

    Transmission
    To avoid the summation of infinite series, two other methods are utilized: 1) Resultant wave method In this method, the multiple reflection or transmission waves are combined into one in every material. In the following figure, we have four unknowns and four interfacial boundary conditions. The reflectivity and transmissivity can be determined on each interface.

    2) Transfer matrix method The transfer matrix method combines all the waves (both forward and backward ones) in each medium into one wave, and uses a matrix to relate the electric and the magnetic fields between two different points inside a medium. Because the tangential components of the electric and the magnetic fields are continuous across the interface when there is no interface charge and interface current, the transfer matrix method can be easily extended to multilayers. In the following figure, the x-component of the electric field Ex ( z ) and y-component of

    the magnetic field H y ( z ) on the interface are related by 22 matrix A, 22 matrix M1, 2
    1 matrix B. And we obtain Ei 1 = A M 1 BEt . Er

    2.57 Fall 2004 Lecture 13

    Ex (0) (0) = Hy

    E A i Er

    x Ex (0) Ex (d ) (0) = M 1 (d ) Hy Hy BEt

    For multilayers, M is determined by the chain rule as M = M 1M 2 " M n , where n is the number of layers.
    E For a single layer of film, i = A1M 1 BEt yields Er r + r exp [ 2i 2 ] E r = r = 12 23 Ei 1+ r12 r23 exp [ 2i 2 ] , 2 n2 d cos 2 = .

    Thus for a nonabsorbing film, we obtain R= r


    2

    , in which the cosine function indicates periodicity of R. This is just the interference effect. Discussions: (1) Periodic variation in R R

    r 2 + r 2 + 2r12 r23 cos 2 2 = 12 23 2 2 1 + 2r12 r23 cos 2 2 + r12 r23

    Note: In microfabrication, the color of a thin film will change periodically according to the thickness, which is used to estimate the film thickness by eyes.

    2.57 Fall 2004 Lecture 13

    (2) Tunneling Back to the case in which i > cr . We have


    n sin i cos t = 1 sin t = i 1
    1 = ai , n2
    which causes decay in the second medium. If the second medium is very thin, a third medium attached to the second medium will have tunneling effects. The wave will be partly transmitted into the third medium before decaying off and the reflectivity R 1 in this case.
    2 2

    Note: From n1 sin i = n2 sin 2 = n3 sin 3 , in this case i ,3 are real numbers, while 2 is imaginary number.

    d
    i(E)

    Uo

    t(E) d Ut

    n1

    n2

    n3

    Similar phenomena happen to the electron propagation across a barrier. In the right figure, we can see tunneling happens when the barrier is thin. The transmissivity is 4 E (U o E ) = 2 4E(U o E ) + U o sinh 2 2m(U o E )d / =

    or

    16E (U o E )
    2 Uo

    exp 2 2m(U o E )d / = =

    16E(U o E ) 2 k 2 d . e 2 Uo

    2.57 Fall 2004 Lecture 13

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