INA821 35 - V Offset, 7-nV/ HZ Noise, Low-Power, Precision Instrumentation Amplifier
INA821 35 - V Offset, 7-nV/ HZ Noise, Low-Power, Precision Instrumentation Amplifier
INA821 35 - V Offset, 7-nV/ HZ Noise, Low-Power, Precision Instrumentation Amplifier
INA821
SBOS893D – AUGUST 2018 – REVISED JUNE 2020
24.7 k ± 20
Amplifiers (%)
RG OUT
24.7 k +
15
RG
±
Over- REF 10
+IN Voltage + 10 k 10 k
Protection
5
-VS
49.4 k: 0
G 1 VO G V IN V IN VREF
RG -0.4 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 0.4
Input Stage Offset Voltage Drift (PV/qC) D002
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
INA821
SBOS893D – AUGUST 2018 – REVISED JUNE 2020 www.ti.com
Table of Contents
1 Features .................................................................. 1 8.4 Device Functional Modes........................................ 26
2 Applications ........................................................... 1 9 Application and Implementation ........................ 26
3 Description ............................................................. 1 9.1 Application Information............................................ 26
4 Revision History..................................................... 2 9.2 Typical Application .................................................. 29
9.3 Other Application Examples.................................... 31
5 Device Comparison Table..................................... 3
6 Pin Configuration and Functions ......................... 4 10 Power Supply Recommendations ..................... 32
7 Specifications......................................................... 5 11 Layout................................................................... 32
11.1 Layout Guidelines ................................................. 32
7.1 Absolute Maximum Ratings ...................................... 5
11.2 Layout Example .................................................... 33
7.2 ESD Ratings ............................................................ 5
7.3 Recommended Operating Conditions....................... 5 12 Device and Documentation Support ................. 34
7.4 Thermal Information .................................................. 5 12.1 Device Support .................................................... 34
7.5 Electrical Characteristics........................................... 6 12.2 Documentation Support ........................................ 34
7.6 Typical Characteristics: Table of Graphs .................. 8 12.3 Receiving Notification of Documentation Updates 34
7.7 Typical Characteristics ............................................ 10 12.4 Support Resources ............................................... 34
12.5 Trademarks ........................................................... 34
8 Detailed Description ............................................ 19
12.6 Electrostatic Discharge Caution ............................ 34
8.1 Overview ................................................................. 19
12.7 Glossary ................................................................ 34
8.2 Functional Block Diagram ....................................... 19
8.3 Feature Description................................................. 20 13 Mechanical, Packaging, and Orderable
Information ........................................................... 34
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
• Added DRG (WSON) package and associated content to data sheet .................................................................................. 1
• Changed DGK (VSSOP) package from advanced information (preview) to production data (active) ................................... 1
• Changed Figure 9, Typical Distribution of Input Offset Current, to show correct image ...................................................... 11
• Changed Figure 27, Typical Distribution of Gain Error, G = 1, to show improved data....................................................... 14
• Added 8-pin DGK (VSSOP) advanced information package and associated content to data sheet ..................................... 1
• Changed Applications bullets ................................................................................................................................................. 1
±IN 1 8 +VS
±IN 1 8 +VS
RG 2 7 OUT
RG 2 7 OUT
RG 3 6 REF Thermal
Pad
RG 3 6 REF
+IN 4 5 ±VS
+IN 4 5 ±VS
Not to scale
Not to scale
Pin Functions
PIN
I/O DESCRIPTION
NAME NO.
–IN 1 I Negative (inverting) input
+IN 4 O Positive (noninverting) input
OUT 7 — Output
RG 2, 3 I Gain setting pin. Place a gain resistor between pin 2 and pin 3.
REF 6 — Reference input. This pin must be driven by a low impedance source.
–VS 5 — Negative supply
+VS 8 — Positive supply
Thermal pad — — Thermal pad internally connected to –VS. Connect externally to –VS or leave floating.
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN MAX UNIT
Supply voltage –20 20 V
Voltage –40 40
Signal input pins V
REF pin –20 20
Signal output pins (–Vs) – 0.5 (+Vs) + 0.5 V
Output short-circuit (2) Continuous
Operating Temperature, TA –50 150
Junction Temperature, TJ 175 °C
Storage Temperature, Tstg –65 150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Short-circuit to VS / 2.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
BIAS CURRENT
VCM = VS / 2 0.15 0.5
IB Input bias current nA
TA = –40°C to +125°C 2
VCM = VS / 2 0.15 0.5
IOS Input offset current nA
TA = –40°C to +125°C 2
NOISE VOLTAGE
(6) The values specified for G > 1 do not include the effects of the external gain-setting resistor, RG.
15 30
25
10 20
Amplifiers (%)
Amplifiers (%)
15
5 10
0 0
-30 -25 -20 -15 -10 -5 0 5 10 15 20 25 30 -0.4 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 0.4
Input Stage Offset Voltage (PV) D001
Input Stage Offset Voltage Drift (PV/qC) D002
N = 2667 Mean = 3.1 µV Std. Dev. = 8.1 µV N = 81 Mean = -0.03 µV/°C Std. Dev. = 0.09 µV/°C
14
12
10
Amplifiers (%)
Amplifiers (%)
10
6
5
4
0 0
-200 -100 0 100 200 -5 -4 -3 -2 -1 0 1 2 3 4 5
Input Stage Offset Voltage (PV) D003
Output Offset Voltage Drift (PV/qC) D004
N = 2667 Mean = 7.7 µV Std. Dev. = 50.7 µV N = 81 Mean = –1.09 µV/°C Std. Dev. = 0.94 µV/°C
75 400
Input-Referred Offset Voltage (PV)
300
50
200
25 100
0 0
-25 -100
-200
-50
Mean -300 Mean
-75 +3V -400 +3V
-3V -3V
-100 -500
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
Temperature (qC) D005
Temperature (qC) D006
81 units 81 units
Figure 5. Input Stage Offset Voltage vs Temperature Figure 6. Output Stage Offset Voltage vs Temperature
15 15
Amplifiers (%)
Amplifiers (%)
10 10
5 5
0 0
-300 -200 -100 0 100 200 300 -200 -150 -100 -50 0 50 100 150 200
Input Bias Current (pA) D007
Input Bias Current (pA) D008
N = 292 Mean = 45 pA Std. Dev. = 62 pA N = 292 Mean = 34 pA Std. Dev. = 52 pA
TA = 25°C TA = 90°C
Figure 7. Typical Distribution of Input Bias Current, Figure 8. Typical Distribution of Input Bias Current,
TA = 25°C TA = 90°C
25 1
Avg
0.8 3V
20 0.6 3V
Input Bias Current (nA)
0.4
Amplifiers (%)
15 0.2
0
10 -0.2
-0.4
5 -0.6
-0.8
0 -1
-300 -200 -100 0 100 200 300 -50 -30 -10 10 30 50 70 90 110 130 150
Input Offset Current (pA) D050
Temperature (qC) D009
N = 94 Mean = –38.82 pA Std. Dev. = 47.24 pA N = 294 G=1
Figure 9. Typical Distribution of Input Offset Current Figure 10. Input Bias Current vs Temperature
0.5 25
0.4
0.3 20
Input Offset Current (nA)
0.2
Amplifiers (%)
0.1 15
0
-0.1 10
-0.2
-0.3 Avg 5
-0.4 3V
3V
-0.5 0
-50 -30 -10 10 30 50 70 90 110 130 150 -20 -16 -12 -8 -4 0 4 8 12 16 20
Temperature (qC) D010
Common-Mode Rejection Ratio (PV/V) D011
N = 294 G=1 N = 294 Mean = 4.87 µV/V Std. Dev. = 4.14 µV/V
G=1
Figure 11. Input Offset Current vs Temperature Figure 12. Typical CMRR Distribution, G = 1
15 100
10
Unit 1
75 Unit 2
5 Unit 3
Unit 4
Unit 5
0 50
-2 -1.5 -1 -0.5 0 0.5 1 1.5 2 -50 -25 0 25 50 75 100 125 150
Common-Mode Rejection Ratio (PV/V) D012
Temperature (qC) D013
N = 294 Mean = 0.51 µV/V Std. Dev. = 0.42 µV/V N=5 G=1
G = 10
8 16
6 12
150
4 8
2 4
125 0 0
-2 -4
Unit 1 -4 -8
100 Unit 2
Unit 3 -6 -12
Unit 4 -8 Input Current -16
Unit 5 Output Voltage
75 -10 -20
-50 -25 0 25 50 75 100 125 150 -50 -40 -30 -20 -10 0 10 20 30 40 50
Temperature (qC) D014
Input Voltage (V) D015
N=5 G = 10 VS = ±18 V
Figure 15. CMRR vs Temperature, G = 10 Figure 16. Input Current vs Input Overvoltage
160 140
Common-Mode Rejection Ratio (dB)
140 120
120
100
100
80
80
60
60
40
40 G=1 G=1
G = 10 G = 10
20 G = 100 20 G = 100
G = 1000 G = 1000
0 0
10 100 1k 10k 100k 1M 10M 10 100 1k 10k 100k 1M
Frequency (Hz) D016
Frequency (Hz) D017
Figure 19. Positive PSRR vs Frequency (RTI) Figure 20. Negative PSRR vs Frequency (RTI)
80 1000
G=1
60 G = 10
G = 100
100
Gain (dB)
20
-20
G=1
10
G = 10
-40 G = 100
G = 1000
-60
10 100 1k 10k 100k 1M 10M 100m 1 10 100 1k 10k 100k
Frequency (Hz) D020
Frequency (Hz) D021
Figure 21. Gain vs Frequency Figure 22. Voltage Noise Spectral Density vs Frequency
(RTI)
1k
Current Noise Spectral
100
10
100m 1 10 100 1k 10k Time (1 s/div)
Frequency (Hz) D022
D023
G=1
Figure 23. Current Noise Spectral Density vs Frequency Figure 24. 0.1-Hz to 10-Hz RTI Voltage Noise, G = 1
(RTI)
Figure 25. 0.1-Hz to 10-Hz RTI Voltage Noise, G = 1000 Figure 26. 0.1-Hz to 10-Hz RTI Current Noise
30 20
18
25
16
14
20
Amplifiers (%)
Amplifiers (%)
12
15 10
8
10
6
4
5
2
0 0
-250 -200 -150 -100 -50 0 50 100 150 200 250 -900 -600 -300 0 300 600 900
Gain Error (ppm) D026
Input Stage Offset Voltage (PV) D027
N = 5412 Mean = 30 ppm Std. Dev. = 55 ppm N = 293 Mean = 152 ppm Std. Dev. = 291 ppm
G=1 G = 10
Figure 27. Typical Distribution of Gain Error, G = 1 Figure 28. Typical Distribution of Gain Error, G = 10
0.5 100
45qC
25qC 80
0.3 125qC
Input Bias Current (nA)
60
Gain Error (ppm)
0.1 40
20
-0.1
0
-0.3
-20
-0.5 -40
-15 -12 -9 -6 -3 0 3 6 9 12 15 -50 -30 -10 10 30 50 70 90 110 130 150
Common-Mode Voltage (V) D028
Temperature (qC) D029
VS = ±15 V Average of 294 units G=1
Figure 29. Input Bias Current vs Common-Mode Voltage Figure 30. Gain Error vs Temperature, G = 1
500
250 0.66
IQ (mA)
0 0.6
-250 0.54
-500
0.48
-750
0.42
-1000
0.36 VS = r 15 V
-1250 VS = r 2.25 V
-1500 0.3
-50 -25 0 25 50 75 100 125 150 -50 -30 -10 10 30 50 70 90 110 130 150
Temperature (qC) D030
Temperature (qC) D031
Average of 294 units G = 10
Figure 31. Gain Error vs Temperature, G = 10 Figure 32. Supply Current vs Temperature
1 10
8
0.8
6
0.6 4
0.4 2
Nonlinearity (ppm)
Nonlinearity (ppm)
0.2 0
-2
0
-4
-0.2 -6
-0.4 -8
-10
-0.6
-12
-0.8 -14
-1 -16
-10 -8 -6 -4 -2 0 2 4 6 8 10 -10 -8 -6 -4 -2 0 2 4 6 8 10
Output Voltage (V) D032
Output Voltage (V) D033
G=1 G = 10
75 75
50 50
25 25
0
0
-25
-50 -25
-75 -50
-15 -14.6 -14.2 -13.8 -13.4 -13 -12.6 -12.2 12 12.4 12.8 13.2 13.6 14 14.4 14.8
Input Common-Mode Voltage (V) D034
Input Common-Mode Voltage (V) D035
Figure 35. Offset Voltage vs Negative Common-Mode Figure 36. Offset Voltage vs Positive Common-Mode
Voltage Voltage
-14.3
Figure 37. Positive Output Voltage Swing vs Output Current Figure 38. Negative Output Voltage Swing vs Output Current
40 20
Vs = r15 V
30 18 Vs = r5 V
20 16
Short-Circuit Current (mA)
10 14
0 12
-10 10
-20 8
-30 6
-40 4
-50 ISC, Source 2
ISC, Sink
-60 0
-50 -30 -10 10 30 50 70 90 110 130 150 100 1k 10k 100k 1M 10M
Temperature (qC) D038
Frequency (Hz) D039
Figure 39. Short-Circuit Current vs Temperature Figure 40. Large-Signal Frequency Response
1 -40 50
G=1 Positive Overshoot
Total Harmonic Distortion + Noise (dB)
Total Harmonic Distortion + Noise (%)
G = 10 45 Negative Overshoot
G = 100 40
35
0.1 -60
Overshoot (%)
30
25
20
0.01 -80
15
10
5
0.001 -100 0
10 100 1k 10k 100k 1 10 100 1000
Frequency (Hz) D040
Capacitive Load (pF) D041
500-kHz measurement bandwidth
1-VRMS output voltage 100-kΩ load
50 50
Output Amplitude (mV)
0 0
-25 -25
-50 -50
-75 -75
-5 -2.5 0 2.5 5 7.5 10 12.5 15 -5 -2.5 0 2.5 5 7.5 10 12.5 15
Time (µs) D042
Time (µs) D043
G=1 RL = 10 kΩ CL = 100 pF G = 10 RL = 10 kΩ CL = 100 pF
50 50
Output Amplitude (mV)
0 0
-25 -25
-50 -50
-75 -75
-5 -2.5 0 2.5 5 7.5 10 12.5 15 -25 0 25 50 75
Time (µs) D044
Time (µs) D045
G = 100 RL = 10 kΩ CL = 100 pF G = 1000 RL = 10 kΩ CL = 100 pF
Output
Input
100
Output Impedence (:)
Amplitude (2 V/div)
10
0.1
Figure 47. Large-Signal Step Response Figure 48. Closed-Loop Output Impedance
100 120
100
80
EMIRR (dB)
EMIRR (dB)
80
60
60
40
40
20 20
0 0
10M 100M 1G 10G 10M 100M 1G 10G
Frequency (Hz) D048
Frequency (Hz) D049
Figure 49. Differential-Mode EMI Rejection Ratio Figure 50. Common-Mode EMI Rejection Ratio
5 5
VREF = 0 V VREF = 0 V
VREF = 2.5 V VREF = 2.5 V
4 4
3 3
2 2
1 1
0 0
0 1 2 3 4 5 6 0 1 2 3 4 5 6
Output Voltage (V) C006 Output Voltage (V) C006
VS = 5 V G=1 VS = 5 V G = 100
Figure 51. Input Common-Mode Voltage vs Output Voltage Figure 52. Input Common-Mode Voltage vs Output Voltage
5 15
4
10
Common-Mode Voltage (V)
Common-Mode Voltage (V)
3
2 5
1 0
0
-5
-1
-2 -10
-3
G=1 -15 G=1
-4
G = 100 G = 100
-5 -20
±6 ±4 ±2 0 2 4 6 ±20 ±10 0 10 20
Output Voltage (V) C006 Output Voltage (V) C006
Figure 53. Input Common-Mode Voltage vs Output Voltage Figure 54. Input Common-Mode Voltage vs Output Voltage
8 Detailed Description
8.1 Overview
The INA821 is a monolithic precision instrumentation amplifier that incorporates a current-feedback input stage
and a four-resistor difference amplifier output stage. The functional block diagram in the next section shows how
the differential input voltage is buffered by Q1 and Q2 and is forced across RG, which causes a signal current to
flow through RG, R1, and R2. The output difference amplifier, A3, removes the common-mode component of the
input signal and refers the output signal to the REF pin. The VBE and voltage drop across R1 and R2 produces
output voltages on A1 and A2 that are approximately 0.8 V lower than the input voltages.
Each input is protected by two field-effect transistors (FETs) that provide a low series resistance under normal
signal conditions, and preserve excellent noise performance. When excessive voltage is applied, these
transistors limit input current to approximately 8 mA.
+VS
RB VB RB
IB Cancellation IB Cancellation -VS +VS
40 k
40 k
±
+
±
A1 A2
A3 OUT
+
40 k
REF
40 k
+VS +VS
-VS +VS
Q1 Q2
Super- Super-
-IN +IN
NPN NPN
Overvoltage +VS +VS Overvoltage
Protection Protection
R1 R2
25 k RG 25 k
-VS (External) -VS
RG RG
-VS -VS
Copyright © 2017, Texas Instruments Incorporated
+VS
Overvoltage
-IN + 10 k 10 k
Protection
±
RG
RG
VO G V IN V IN VREF
±
-VS
Copyright © 2017, Texas Instruments Incorporated
V-
Figure 55. Simplified Diagram of the INA821 With Gain and Output Equations
140 120
120 100
100
80
EMIRR (dB)
EMIRR (dB)
80
60
60
40
40
20 20
0 0
10M 100M 1G 10G 10M 100M 1G 10G
Frequency (Hz) D049
Frequency (Hz) D048
Figure 56. Common-Mode EMIRR Testing Figure 57. Differential-Mode EMIRR Testing
5 5
VREF = 0 V VREF = 0 V
VREF = 2.5 V VREF = 2.5 V
Common-Mode Voltage (V)
Common-Mode Voltage (V)
4 4
3 3
2 2
1 1
0 0
0 1 2 3 4 5 6 0 1 2 3 4 5 6
Output Voltage (V) C006 Output Voltage (V) C006
VS = 5 V G=1 VS = 5 V G = 100
Figure 58. Input Common-Mode Voltage vs Output Voltage Figure 59. Input Common-Mode Voltage vs Output Voltage
5 15
4
10
Common-Mode Voltage (V)
Common-Mode Voltage (V)
3
2 5
1 0
0
-5
-1
-2 -10
-3
G=1 -15 G=1
-4
G = 100 G = 100
-5 -20
±6 ±4 ±2 0 2 4 6 ±20 ±10 0 10 20
Output Voltage (V) C006 Output Voltage (V) C006
Figure 60. Input Common-Mode Voltage vs Output Voltage Figure 61. Input Common-Mode Voltage vs Output Voltage
ZD1
+VS
IN Overvoltage
Input Voltage +
Protection
Source ± Input Transistor
-VS
ZD2
-V
During an input overvoltage condition, current flows through the input protection diodes into the power supplies,
as shown in Figure 62. If the power supplies are unable to sink current, then Zener diode clamps (ZD1 and ZD2
in Figure 62) must be placed on the power supplies to provide a current pathway to ground. Figure 63 shows the
input current for input voltages from –40 V to +40 V when the INA821 is powered by ±15-V supplies.
10 20
8 16
6 12
4 8
Output Voltage (V)
Input Current (mA)
2 4
0 0
-2 -4
-4 -8
-6 -12
-8 Input Current -16
Output Voltage
-10 -20
-50 -40 -30 -20 -10 0 10 20 30 40 50
Input Voltage (V) D015
CAUTION
Supply voltages higher than 40 V (±20 V) can permanently damage the device.
Parameters that vary over supply voltage or temperature are shown in the Typical
Characteristics section of this data sheet.
RS+
1k
+VS
RG
VDIFF = VOUT / G 5.49 k INA VOUT = 1 V
REF
RG ±VS
RS±
VCM = 10 V 0.99 k
C1
±15 V
Figure 64. Example Application With G = 10 V/V and a 1-V Output Voltage
Resistor-adjustable devices (such as the INA821) show the lowest gain error in G = 1 because of the inherently
well-matched drift of the internal resistors of the differential amplifier. At gains greater than 1 (for instance, G =
10 V/V or G = 100 V/V), the gain error becomes a significant error source because of the contribution of the
resistor drift of the 24.7-kΩ feedback resistors in conjunction with the external gain resistor. Except for very high
gain applications, the gain drift is by far the largest error contributor compared to other drift errors, such as offset
drift.
The INA821 offers excellent gain error over temperature for both G > 1 and G = 1 (no external gain resistor).
Table 5 summarizes the major error sources in common INA applications and compares the three cases of G = 1
(no external resistor) and G = 10 (5.49-kΩ external resistor) and G = 100 (499-Ω external resistor). All
calculations are assuming an output voltage of VOUT = 1 V. Thus, the input signal VDIFF (given by VDIFF= VOUT/G)
exhibits smaller and smaller amplitudes with increasing gain G. In this example, VDIFF = 1 mV at G = 1000. All
calculations refer the error to the input for easy comparison and system evaluation. As Table 5 shows, errors
generated by the input stage (such as input offset voltage) are more dominant at higher gain, while the effects of
output stage are suppressed because they are divided by the gain when referring them back to the input. the
gain error and gain drift error are much more significant for gains greater than 1 because of the contribution of
the resistor drift of the 24.7-kΩ feedback resistors in conjunction with the external gain resistor. In most
applications, static errors (absolute accuracy errors) can readily be removed during calibration in production,
while the drift errors are the key factors limiting overall system performance.
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
+VS
Over-
-IN Voltage + 10 k 10 k
Protection
±
RG
24.7 k ±
RG OUT
24.7 k +
RG
± REF
Over-
+IN Voltage + 10 k 10 k RREF
Protection
-VS
V-
80
60
0Ω
40
5Ω
10 Ω
20
15 Ω
20 Ω
0
10 100 1k 10k
Frequency (Hz)
Voltage reference devices are an excellent option for providing a low-impedance voltage source for the reference
pin. However, if a resistor voltage divider generates a reference voltage, buffer the divider by an op amp, as
shown in Figure 67, to avoid CMRR degradation.
5V
+VS
+IN
RG
RG INA821 OUT
REF
RG
±VS
±IN 5V 5V
100 k
OPA191 +
± 1 F
100 k
Microphone,
Hydrophone, TI Device
and So Forth
47 kW 47 kW
Thermocouple TI Device
10 kW
TI Device
15 V
REF5025
R1 = 100 NŸ
VOUT VIN
1 F GND NR 1 F 1 F
15 V
R2 = 4.17 NŸ
±20 mA
-IN +VS
RG
REF
R3 = RG = 10.4 NŸ INA821 OUT VOUT 2.5 V ± 2.3 V
20 Ÿ
RG
+IN -VS
-15 V
where
• VIN is the input voltage (4)
C001
5
5
4
4
Output Voltage (V)
3
3
2
2
1
1
0
-10 -5 0 5 10 0
-20 -10 0 10 20
Input Voltage (V)
Input Current (mA) C001
VOUT VIN
1 F
1 F
1 F
GND NR
4.99
4.99 k
k
+VS
-IN
RG VOUT
100 100 0 V at 0°C
801 INA821 OUT
REF
k 5 V at 200°C
RG 25 mV/°C
-VS
+IN
Pt100 RTD
100
-15 V
105 k 1.18 k
5 0.018
4.5 0.016
4 0.014
Output Voltage (V)
3.5
0.012
Error (ƒC)
3
0.01
2.5
0.008
2
0.006
1.5
1 0.004
0.5 0.002
0 0
0 50 100 150 200 0 50 100 150 200
Temperature (°C) Temperature (°C) C001
Figure 73. Transfer Function of 3-Wire RTD Interface Figure 74. Temperature Error Over Full Temperature
Range
11 Layout
C2
R2
+VS
+IN
RG
R3 INA821 OUT
REF
RG
±VS
-IN
R1
C1
-V
R1
±IN
1 ±IN +VS 8
2 RG OUT 7 OUT
R3
3 RG REF 6
4 +IN -VS 5
Low-impedance
+IN
connection for
reference terminal
R2
GND
C1
REF
-V
Copyright © 2017, Texas Instruments Incorporated
12.5 Trademarks
E2E is a trademark of Texas Instruments.
Bluetooth is a registered trademark of Bluetooth SIG, Inc.
PhotoMOS is a registered trademark of Panasonic Electric Works Europe AG.
All other trademarks are the property of their respective owners.
12.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 22-Oct-2020
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
INA821ID ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-2-260C-1 YEAR -40 to 125 INA821
& no Sb/Br)
INA821IDGKR ACTIVE VSSOP DGK 8 2500 Green (RoHS NIPDAUAG Level-2-260C-1 YEAR -40 to 125 1X4Q
& no Sb/Br)
INA821IDGKT ACTIVE VSSOP DGK 8 250 Green (RoHS NIPDAUAG Level-2-260C-1 YEAR -40 to 125 1X4Q
& no Sb/Br)
INA821IDR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-2-260C-1 YEAR -40 to 125 INA821
& no Sb/Br)
INA821IDRGR ACTIVE SON DRG 8 3000 Green (RoHS NIPDAU Level-2-260C-1 YEAR -40 to 125 INA821
& no Sb/Br)
INA821IDRGT ACTIVE SON DRG 8 250 Green (RoHS NIPDAU Level-2-260C-1 YEAR -40 to 125 INA821
& no Sb/Br)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 22-Oct-2020
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 16-Oct-2020
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 16-Oct-2020
Pack Materials-Page 2
PACKAGE OUTLINE
D0008A SCALE 2.800
SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
SEATING PLANE
.228-.244 TYP
[5.80-6.19]
.004 [0.1] C
A PIN 1 ID AREA
6X .050
[1.27]
8
1
.189-.197 2X
[4.81-5.00] .150
NOTE 3 [3.81]
4X (0 -15 )
4
5
8X .012-.020
B .150-.157 [0.31-0.51]
.069 MAX
[3.81-3.98] .010 [0.25] C A B [1.75]
NOTE 4
.005-.010 TYP
[0.13-0.25]
4X (0 -15 )
SEE DETAIL A
.010
[0.25]
.004-.010
0 -8 [0.11-0.25]
.016-.050
[0.41-1.27] DETAIL A
(.041) TYPICAL
[1.04]
4214825/C 02/2019
NOTES:
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed .006 [0.15] per side.
4. This dimension does not include interlead flash.
5. Reference JEDEC registration MS-012, variation AA.
www.ti.com
EXAMPLE BOARD LAYOUT
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55]
SYMM SEE
DETAILS
1
8
8X (.024)
[0.6] SYMM
(R.002 ) TYP
[0.05]
5
4
6X (.050 )
[1.27]
(.213)
[5.4]
EXPOSED
METAL EXPOSED
METAL
.0028 MAX .0028 MIN
[0.07] [0.07]
ALL AROUND ALL AROUND
4214825/C 02/2019
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55] SYMM
1
8
8X (.024)
[0.6] SYMM
(R.002 ) TYP
5 [0.05]
4
6X (.050 )
[1.27]
(.213)
[5.4]
4214825/C 02/2019
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
DRG0008B SCALE 4.000
WSON - 0.8 mm max height
PLASTIC SMALL OUTLINE - NO LEAD
3.1 B
A
2.9
3.1
PIN 1 INDEX AREA 2.9
0.8
0.7
(DIM A) TYP
EXPOSED 1.45 0.1 OPT 01 SHOWN
THERMAL PAD
4
5
2X
1.5 2.4 0.1
8
1
6X 0.5
0.3
8X
0.2
PIN 1 ID 0.6
8X 0.1 C A B
(OPTIONAL) 0.4
0.08 C
4218886/A 01/2020
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
DRG0008B WSON - 0.8 mm max height
PLASTIC SMALL OUTLINE - NO LEAD
(1.45)
8X (0.7) SYMM
1 8
8X (0.25)
(2.4)
6X (0.5) (0.95)
4
5
(R0.05) TYP
(0.475)
( 0.2) VIA
TYP (2.7)
4218886/A 01/2020
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
www.ti.com
EXAMPLE STENCIL DESIGN
DRG0008B WSON - 0.8 mm max height
PLASTIC SMALL OUTLINE - NO LEAD
SYMM METAL
8X (0.7)
TYP
8X (0.25) 1 8
(0.635)
SYMM
6X (0.5)
4 (1.07)
5
(R0.05) TYP
(1.47)
(2.7)
EXPOSED PAD
82% PRINTED SOLDER COVERAGE BY AREA
SCALE:25X
4218886/A 01/2020
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
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