Dac 8775
Dac 8775
Dac 8775
DAC8775
SLVSBY7 FEBRUARY 2017
REFOUT DVDD_EN DVDD ALARM REFIN AVDD PVDD_X VNEG_IN_X LP_X LN_X VPOS_IN_X
Internal CHANNEL - A
Amp PVSS_X
Reference Buck/Boost Converters
AGND_X
DVDD User IRANGE
LDO Calibration
Register X DAC IAmp Current
SPI Shift Register Input
LDAC IOUT_X
IENABLE Source
SCLK
Control Logic
HART_IN_x
SDIN Alarm DAC Input
Register VENABLE CCOMP_X
RESET
CLR VAmp VOUT_X
Watchdog Slew Rate
SYNC Timer VSENSEN_x
Control
SDO Feedback VSENSEP_X
CHANNEL - B
Power On CHANNEL - C
Reset
CHANNEL - D
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DAC8775
SLVSBY7 FEBRUARY 2017 www.ti.com
Table of Contents
1 Features .................................................................. 1 8.4 Device Functional Modes........................................ 43
2 Applications ........................................................... 1 8.5 Register Maps ........................................................ 47
3 Description ............................................................. 1 9 Application and Implementation ........................ 60
4 Revision History..................................................... 2 9.1 Application Information............................................ 60
9.2 Typical Application ................................................. 63
5 Device Comparison Table..................................... 3
6 Pin Configuration and Functions ......................... 3 10 Power Supply Recommendations ..................... 67
7 Specifications......................................................... 6 11 Layout................................................................... 69
11.1 Layout Guidelines ................................................. 69
7.1 Absolute Maximum Ratings ...................................... 6
11.2 Layout Example .................................................... 70
7.2 ESD Ratings.............................................................. 6
7.3 Recommended Operating Conditions....................... 6 12 Device and Documentation Support ................. 72
7.4 Thermal Information .................................................. 7 12.1 Documentation Support ....................................... 72
7.5 Electrical Characteristics........................................... 7 12.2 Receiving Notification of Documentation Updates 72
7.6 Timing Requirements: Write and Readback Mode . 13 12.3 Community Resources.......................................... 72
7.7 Typical Characteristics ............................................ 15 12.4 Trademarks ........................................................... 72
12.5 Electrostatic Discharge Caution ............................ 72
8 Detailed Description ............................................ 34
12.6 Glossary ................................................................ 72
8.1 Overview ................................................................. 34
8.2 Functional Block Diagram ....................................... 34 13 Mechanical, Packaging, and Orderable
8.3 Feature Description................................................. 34
Information ........................................................... 73
4 Revision History
DATE REVISION NOTES
February 2017 * Initial release.
DIFFERENTIAL
PRODUCT RESOLUTION
NONLINEARITY (LSB)
DAC8775 16 1
RWF Package
72-Pin VQFN
Top View
DCDC_AGND_CD
DAC_AGND_CD
VSENSEN_C
VSENSEN_D
VSENSEP_C
VSENSEP_D
VNEG_IN_D
VNEG_IN_C
VNEG_IN_D
HARTIN_C
CCOMP_C
HARTIN_D
CCOMP_D
DVDD_EN
ALARM
RESET
DVDD
PBKG
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
PVDD_D 1 54 IOUT_D
LP_D 2 53 VPOS_IN_D
PVSS_D 3 52 VOUT_D
LN_D 4 51 VNEG_IN_C
PVDD_C 5 50 IOUT_C
LP_C 6 49 VPOS_IN_C
PVSS_C 7 48 VOUT_C
LN_C 8 47 REFOUT
PVSS_B 11 44 AVDD
LP_B 12 43 VOUT_B
PVDD_B 13 42 VPOS_IN_B
LN_A 14 41 IOUT_B
PVSS_A 15 40 VNEG_IN_B
LP_A 16 39 VOUT_A
PVDD_A 17 38 VPOS_IN_A
PBKG 18 37 IOUT_A
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
VNEG_IN_A
VNEG_IN_B
SCLK
SDIN
LDAC
SDO
SYNC
CLR
HARTIN_B
CCOMP_B
HARTIN_A
CCOMP_A
VSENSEP_B
VSENSEN_B
VSENSEP_A
VSENSEN_A
DAC_AGND_AB
VNEG_IN_A
Not to scale
Pin Functions
PIN
DESCRIPTION
NAME NO.
PVDD_D 1 Buck-Boost Converter power switch supply D
LP_D 2 External Inductor terminal - positive D
PVSS_D 3 Ground for Buck-Boost converter switches D
LN_D 4 External Inductor terminal - negative D
PVDD_C 5 Buck-Boost Converter power switch supply C
LP_C 6 External Inductor terminal - positive C
PVSS_C 7 Ground for Buck-Boost converter switches C
LN_C 8 External Inductor terminal - negative C
DCDC_AGND_AB 9 Analog GND Buck-Boost converter Channels A and B
LN_B 10 External Inductor terminal - negative B
PVSS_B 11 Ground for Buck-Boost converter switches B
LP_B 12 External Inductor terminal - positive B
PVDD_B 13 Buck-Boost Converter power switch supply B
LN_A 14 External Inductor terminal - negative A
PVSS_A 15 Ground for Buck-Boost converter switches A
LP_A 16 External Inductor terminal - positive A
PVDD_A 17 Buck-Boost Converter power switch supply A
PBKG 18 Chip substrate, connect to 0 V
VNEG_IN_A 19 Negative power supply for VOUT_A and IOUT_A
VNEG_IN_B 20 Negative power supply for VOUT_B and IOUT_A
Serial clock input of serial peripheral interface (SPI). Data can be transferred at rates up to 25 MHz.
SCLK 21
Schmitt-Trigger logic input.
Serial data input. Data are clocked into the 24-bit input shift register on the falling edge of the serial clock
SDIN 22
input. Schmitt-Trigger logic input.
Load DAC latch control input. A logic low on this pin loads the input shift register data into the DAC
LDAC 23
register and updates the DAC output.
SDO 24 Serial data output. Data are valid on the falling edge of SCLK.
SPI bus chip select input (active low). Data bits are not clocked into the serial shift register unless SYNC
SYNC 25
is low. When SYNC is high, SDO is in high-impedance status.
Level Triggered clear pin (Active High). Clears all DAC channel to zero code or mid code (see DAC clear
CLR 26
section)
HARTIN_B 27 Input pin for HART modulation. for IOUT_B
External compensation capacitor connection pin for VOUT_B . Addition of the external capacitor improves
CCOMP_B 28 the stability with high capacitive loads at the VOUT_B pin by reducing the bandwidth of the output
amplifier at the expense of increased settling time.
HARTIN_A 29 Input pin for HART modulation. for IOUT_A
External compensation capacitor connection pin for VOUT_A . Addition of the external capacitor improves
CCOMP_A 30 the stability with high capacitive loads at the VOUT_A pin by reducing the bandwidth of the output
amplifier at the expense of increased settling time.
VSENSEP_B 31 Sense output pin for the positive voltage output (channel B) load connection.
VSENSEN_B 32 Sense output pin for the negative voltage output (channel B) load connection.
VSENSEP_A 33 Sense output pin for the positive voltage output (channel A) load connection.
VSENSEN_A 34 Sense output pin for the negative voltage output (channel A) load connection.
DAC_AGND_AB 35 Analog GND DAC Channels A and B
VNEG_IN_A 36 Negative power supply for VOUT_A and IOUT_A
IOUT_A 37 Current Output Pin (Channel A)
VPOS_IN_A 38 Positive power supply for VOUT_A and IOUT_A
VOUT_A 39 Voltage Output Pin (Channel A)
VNEG_IN_B 40 Negative power supply for VOUT_B and IOUT_B
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN MAX UNIT
PVDD_x/AVDD to PBKG -0.3 40
PVSS_x/REFGND/DCDC_AGND_x/DAC_AGND_x
-0.3 0.3
to PBKG
VPOS_IN_x to VNEG_IN_x -0.3 40
VPOS_IN_x to PBKG -0.3 33
Input voltage VNEG_IN_x to PBKG -20 0.3 V
VSENSEN_x to PBKG VNEG_IN_x VPOS_IN_x
VSENSEP_x to PBKG VNEG_IN_x VPOS_IN_x
DVDD to PBKG -0.3 6
REFOUT/REFIN to PBKG -0.3 6
Digital input voltage to PBKG -0.3 DVDD+0.3
VOUT_x to PBKG VNEG_IN_x VPOS_IN_x
Output voltage IOUT_x to PBKG VNEG_IN_x VPOS_IN_x V
SDO, ALARM to PBKG -0.3 DVDD+0.3
Input current Current into any digital input pin -10 10 mA
Power dissipation (TJmax TA)/JA W
Operating junction temperature, TJ -40 150
Junction temperature range, TJmax 150 C
Storage temperature, Tstg -65 150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) The minimum headroom spec for voltage output stage and the compliance voltage for current output stage should be met. When Buck-
Boost converter is enabled VPOS_IN_x/VNEG_IN_x are generated internally to meet headroom and compliance specs. When Buck-
Boost converter is disabled VPOS_IN_x, AVDD, and PVDD must be tied together.
6 Submit Documentation Feedback Copyright 2017, Texas Instruments Incorporated
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(1) For current output all ranges except 24 mA, low code of 256d and a high code of 65535d are used, for 24 mA range low code of 0d
and a high code of 65535d. For voltage output, low code of 256d and a high code of 65535d are used
Copyright 2017, Texas Instruments Incorporated Submit Documentation Feedback 7
Product Folder Links: DAC8775
DAC8775
SLVSBY7 FEBRUARY 2017 www.ti.com
(2) No load, DVDD supply ramps up before VPOS_IN_x,and VNEG_IN_x, ramp rate of VPOS_IN_x,and VNEG_IN_x limited to 18 V/msec
(3) DAC code at 0d, this error includes offset error of the DAC since the DAC is linear between 0d to 65535d
Copyright 2017, Texas Instruments Incorporated Submit Documentation Feedback 9
Product Folder Links: DAC8775
DAC8775
SLVSBY7 FEBRUARY 2017 www.ti.com
(4) Vout disabled, no load, ramp rate of VPOS_IN_x,and VNEG_IN_x limited to 18 V/msec
(5) 680 nF is required at IOUT pin for 50 mH pure inductor load.
t1
SCLK 1 2 24
t6
t4 t3 t2 t5
SYNC
t8 t19
t7
SDIN MSB LSB
LDAC = 0
t16 t12
VOUT_x
t10 t9
LDAC
t17 t11
VOUT_x
t13 t19 t19
CLR
t14
VOUT_x
t18
RESET
VOUT_x
SCLK 1 2 24 1 2 24
SYNC
Read Command NOP Command
SDIN MSB LSB MSB LSB
Readback Data
SDO GARBAGE MSB LSB
t15
8 1.0
3.5 mA to 23.5 mA 4 mA to 20 mA
3.5 mA to 23.5 mA 4 mA to 20 mA 0.8
6 0 mA to 24 mA 0 mA to 20 mA
0 mA to 24 mA 0 mA to 20 mA 0.6 24 mA
4 24 mA
0.4
2
0.2
0 0.0
-0.2
-2
-0.4
-4
-0.6
-6
-0.8
-8 -1.0
0 8192 16384 24576 32768 40960 49152 57344 65536 0 8192 16384 24576 32768 40960 49152 57344 65536
DAC Code DAC Code
C002 C001
Figure 3. IOUT Linearity Error vs Digital Input Code Figure 4. IOUT Differential Linearity Error vs Digital Input
Code
20 8.0
3.5 mA to 23.5 mA 4 mA to 20 mA
15 6.0 0 mA to 24 mA 0 mA to 20 mA
24 mA
10 4.0
INL Error (LSB)
TUE (m%FSR)
5 2.0
0 0.0
-5 -2.0
-15 0 mA to 24 mA 0 mA to 20 mA -6.0
24 mA
-20 -8.0
0 8192 16384 24576 32768 40960 49152 57344 65536 40 25 10 5 20 35 50 65 80 95 110 125
DAC Code Temperature (oC)
C003 C007
Figure 5. IOUT Total Unadjusted Error vs Digital Input Code Figure 6. IOUT Linearity Error vs Temperature
1.0 50.0
0.8 40.0
0.6 30.0
0.4 20.0
DNL Error (LSB)
TUE (m%FSR )
0.2 10.0
0.0 0.0
-0.2 -10.0
-0.4 -20.0
3.5 mA to 23.5 mA 4 mA to 20 mA
-0.6 3.5 mA to 23.5 mA 4 mA to 20 mA -30.0
0 mA to 24 mA 0 mA to 20 mA
0 mA to 24 mA 0 mA to 20 mA
-0.8 -40.0 24 mA
24 mA
-1.0 -50.0
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C007 C007
Figure 7. IOUT Differential Linearity Error vs Temperature Figure 8. IOUT Total Unadjusted Error vs Temperature
50 50
40 40
30 30
Offset Error (m%FSR)
10 10
0 0
10 10
20 20
3.5 mA to 23.5 mA 4 mA to 20 mA 3.5 mA to 23.5 mA 4 mA to 20 mA
30 30
0 mA to 24 mA 0 mA to 20 mA 0 mA to 24 mA 0 mA to 20 mA
40 40
24 mA 24 mA
50 50
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C007 C007
Figure 9. IOUT Offset Error vs Temperature Figure 10. IOUT Gain Error vs Temperature
5.0 50
4.0 40
3.0 30
Full Scale Error (m%FSR)
Zero Code Error (A)
2.0 20
1.0 10
0.0 0
-1.0 10
-2.0 20
0 mA to 24 mA 3.5 mA to 23.5 mA 4 mA to 20 mA
-3.0 30
0 mA to 24 mA 0 mA to 20 mA
-4.0 0 mA to 20 mA 40
24 mA
-5.0 50
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C007 C007
Figure 11. IOUT Zero Code Error vs Temperature Figure 12. IOUT Full Scale Error vs Temperature
30 50
24 40
Negative Full Scale Error (m%FSR)
18 30
Bipolar Zero Error (m%FSR)
12 20
6 10
0 0
6 10
12 20
24 mA
18 30
24 mA
24 40
30 50
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C007 C007
Figure 13. IOUT Bipolar Zero Error vs Temperature Figure 14. IOUT Negative Full Scale Error vs Temperature
8.0 1.0
0.8
6.0
0.6
4.0
0.4
0.2
0.0 0.0
-0.2
-2.0
-0.4
-4.0
3.5 mA to 23.5 mA 4 mA to 20 mA -0.6
3.5 mA to 23.5 mA 4 mA to 20 mA
-6.0
0 mA to 24 mA 0 mA to 20 mA -0.8
0 mA to 24 mA 0 mA to 20 mA
-8.0 -1.0
12 14 16 18 20 22 24 26 28 30 32 12 14 16 18 20 22 24 26 28 30 32
VPOS (V) VPOS (V)
C015 C015
Figure 15. IOUT Linearity Error vs Power Supplies Figure 16. IOUT Differential Linearity Error vs Power
Supplies
8.0 1.0
0.8
6.0
0.6
4.0
0.4
DNL Error (LSB)
2.0
INL Error (LSB)
0.2
0.0 0.0
-0.2
-2.0
-0.4
-4.0
24 mA -0.6
-6.0 24 mA
-0.8
-8.0 -1.0
12 12.5 13 13.5 14 14.5 15 15.5 16 16.5 17 17.5 18 12 12.5 13 13.5 14 14.5 15 15.5 16 16.5 17 17.5 18
VPOS (V) VPOS (V)
C015 C015
Figure 17. IOUT Linearity Error vs Power Supplies Figure 18. IOUT Differential Linearity Error vs Power
Supplies
50.0 50.0
40.0 40.0
30.0 30.0
20.0 20.0
TUE (m%FSR)
TUE (m%FSR)
10.0 10.0
0.0 0.0
-10.0 -10.0
-20.0 -20.0
-50.0 -50.0
12 14 16 18 20 22 24 26 28 30 32 12 12.5 13 13.5 14 14.5 15 15.5 16 16.5 17 17.5 18
VPOS (V) VPOS (V)
C015 C015
|VPOS_IN_x| = |VNEG_IN_x|
Figure 19. IOUT Total Unadjusted Error vs Power Supplies Figure 20. IOUT Total Unadjusted Error vs Power Supplies
30 2.5
2.0
20
1.5
VPOS/ VNEG IDD (mA)
0 0.0
-0.5
10
-1.0
IDD-VPOS IDD-VPOS
-1.5
20
IDD-VNEG -2.0 IDD-VNEG
30 -2.5
0 8192 16384 24576 32768 40960 49152 57344 65536 40 25 10 5 20 35 50 65 80 95 110 125
DAC Code Temperature (oC)
C001 C001
Figure 21. IOUT Power Supply Current vs Digital Input Code Figure 22. IOUT Power Supply Current vs Temperature
2.5
2.0
1.5
VPOS/ VNEG IDD (mA)
1.0
0.5
0.0
-0.5
-1.0
IDD-VPOS
-1.5
-2.0 IDD-VNEG
-2.5
12 13 14 15 16 17 18
VPOS (V)
C001
0 mA to 24 mA (5 mA/div)
SYNC (5 V/div)
small signal settling (0.1 %FSR/div)
-24 mA to +24 mA (10 mA/div)
SYNC (5 V/div)
C001 C001
Figure 24. IOUT Full-Scale Settling Time, Rising Edge Figure 25. IOUT Full-Scale Settling Time, Rising Edge
SYNC (5 V/div)
24 mA to 0 mA (5 mA/div)
SYNC (5 V/div)
small signal settling (0.1 %FSR/div)
C001 C001
Figure 26. IOUT Full-Scale Settling Time, Falling Edge Figure 27. IOUT Full-Scale Settling Time, Falling Edge
C005 C005
Figure 28. IOUT Glitch Impulse, Rising Edge, 1LSB Step Figure 29. IOUT Glitch Impulse, Falling Edge, 1LSB Step
IOUT (8 A/div)
SYNC (5 V/div)
AVDD (5 V/div)
C005 C004
0-24 mA Range
Figure 30. IOUT Power-On Glitch Figure 31. IOUT Enable Glitch
2500
IOUT = 12 mA
1500 IOUT = 0 mA
1000
500
0
Time (1 s/div) 10 100 1000 10000 100000 1000000
Frequency (Hz)
C001 C001
Figure 32. IOUT Noise, 0.1 Hz to 10 Hz Figure 33. IOUT Noise Density vs Frequency
IOUT (3 A/div)
SCLK (5 V/div)
Time (4 s/div)
C004
8 1.0
3.5 mA to 23.5 mA 4 mA to 20 mA 0.8
6
0 mA to 24 mA 0 mA to 20 mA 0.6
4 24 mA
0.4
2
0.2
0 0.0
-0.2
-2
-0.4
-4
-0.6 3.5 mA to 23.5 mA 4 mA to 20 mA
-6 0 mA to 24 mA 0 mA to 20 mA
-0.8
24 mA
-8 -1.0
0 8192 16384 24576 32768 40960 49152 57344 65536 0 8192 16384 24576 32768 40960 49152 57344 65536
DAC Code DAC Code
C002 C001
Figure 35. IOUT Linearity Error vs Digital Input Code Figure 36. IOUT Differential Linearity Error vs Digital Input
Code
20
15 3.5 mA to 23.5 mA 4 mA to 20 mA
0 mA to 24 mA 0 mA to 20 mA
10
24 mA
TUE (m%FSR)
-5
-10
-15
-20
0 8192 16384 24576 32768 40960 49152 57344 65536
DAC Code
C003
C001 C001
Figure 38. IOUT Full-Scale Settling Time, Rising Edge Figure 39. IOUT Full-Scale Settling Time, Rising Edge
VNEG (5 V/div)
VPOS (5 V/div)
24 mA to 0 mA (8 mA/div)
VPOS (2 V/div)
C001 C001
Figure 40. IOUT Full-Scale Settling Time, Falling Edge Figure 41. IOUT Full-Scale Settling Time, Falling Edge
2500
VPOS (20 mV/div)
IOUT (4 A/div)
2000 IOUT = 24 mA
Noise PSD (nV/ sqrt-Hz)
IOUT = 12 mA
1500 IOUT = 0 mA
1000
500
0
10 100 1000 10000 100000 1000000 Time (1 s/div)
Frequency (Hz)
C001 C001
Figure 42. IOUT Noise Density vs Frequency Figure 43. IOUT Ripple
8 1.0
0.8
6
0.6
4
0.4
2
0.2
0 0.0
-0.2
-2
-0.4
-4
10 V 5 V -0.6 10 V 5 V
-6 0 V to 10 V 0 V to 5 V 0 V to 10 V 0 V to 5 V
-0.8
-8 -1.0
0 8192 16384 24576 32768 40960 49152 57344 65536 0 8192 16384 24576 32768 40960 49152 57344 65536
DAC Code DAC Code
C002 C001
Figure 44. VOUT Linearity Error vs Digital Input Code Figure 45. VOUT Differential Linearity Error vs Digital Input
Code
20 8.0
15 6.0
10 4.0
INL Error (LSB)
TUE (m%FSR)
5 2.0
0 0.0
-5 -2.0
-10 -4.0 10 V 5 V
10 V 5 V
-15 -6.0 0 V to 10 V 0 V to 5 V
0 V to 10 V 0 V to 5 V
-20 -8.0
0 8192 16384 24576 32768 40960 49152 57344 65536 40 25 10 5 20 35 50 65 80 95 110 125
DAC Code Temperature (oC)
C003 C007
Figure 46. VOUT Total Unadjusted Error vs Digital Input Figure 47. VOUT Linearity Error vs Temperature
Code
1.0 50.0
0.8 40.0 10 V 5 V
0.6 30.0
0 V to 10 V 0 V to 5 V
0.4 20.0
DNL Error (LSB)
TUE (m%FSR )
0.2 10.0
0.0 0.0
-0.2 -10.0
-0.4 -20.0
-0.6 10 V 5 V -30.0
-0.8 0 V to 10 V 0 V to 5 V -40.0
-1.0 -50.0
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C007 C007
Figure 48. VOUT Differential Linearity Error vs Temperature Figure 49. VOUT Total Unadjusted Error vs Temperature
50 2.0
40 10 V 5 V 1.6
30 1.2
0 V to 10 V 0 V to 5 V
20 0.8
10 0.4
0 0.0
10 -0.4
20 -0.8
30 -1.2 0 V to 10 V
40 -1.6 0 V to 5 V
50 -2.0
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C007 C007
Figure 50. VOUT Gain Error vs Temperature Figure 51. VOUT Zero Code Error vs Temperature
50 30
40 10 V 5 V 24
30 18
Bipolar Zero Error (m%FSR)
0 V to 10 V 0 V to 5 V
Full Scale Error (m%FSR)
20 12
10 6
0 0
10 6
20 12
30 18 10 V
40 24 5 V
50 30
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C007 C007
Figure 52. VOUT Full Scale Error vs Temperature Figure 53. VOUT Bipolar Zero Error vs Temperature
50 25
40 20
Negative Full Scale Error (m%FSR)
30 15
20 10
10 5
VOUT (V)
0 0
10 5
20 10
30 15
10 V 5 V
40 20 SCLM = b'00 SCLM = b'10
SCLM = b'11 SCLM = b'01
50 25
40 25 10 5 20 35 50 65 80 95 110 125 40 32 24 16 8 0 8 16 24 32 40
Temperature (oC) VOUT Load Current (mA)
C007 C001
10-V Range, Full Scale Code for VOUT sourcing & Zero Scale
Code for VOUT Sinking
Figure 54. VOUT Negative Full Scale Error vs Temperature
Figure 55. VOUT Output Voltage vs Load Current
8.0 1.0
0.8
6.0
0.6
4.0
0.4
0.2
0.0 0.0
-0.2
-2.0
-0.4
-4.0
10 V 5 V -0.6 10 V 5 V
-6.0 0 V to 10 V 0 V to 5 V
0 V to 10 V 0 V to 5 V -0.8
-8.0 -1.0
12 12.5 13 13.5 14 14.5 15 15.5 16 16.5 17 17.5 18 12 12.5 13 13.5 14 14.5 15 15.5 16 16.5 17 17.5 18
VPOS (V) VPOS (V)
C015 C015
Figure 56. VOUT Linearity Error vs Power Supplies Figure 57. VOUT Differential Linearity Error vs Power
Supplies
50.0 4
40.0
3
30.0
2
VPOS/ VNEG IDD (mA)
20.0
TUE (m%FSR)
1 IDD-VPOS
10.0
0.0 0
IDD-VNEG
-10.0
1
-20.0
2
-30.0 10 V 5 V
3
-40.0 0 V to 10 V 0 V to 5 V
-50.0 4
12 12.5 13 13.5 14 14.5 15 15.5 16 16.5 17 17.5 18 0 8192 16384 24576 32768 40960 49152 57344 65536
VPOS (V) DAC Code
C015 C001
Figure 58. VOUT Total Unadjusted Error vs Power Supplies Figure 59. VOUT Power Supply Current vs Digital Input
Code
5 5.0
4 4.0
3 3.0
VPOS/ VNEG IDD (mA)
VPOS/ VNEG IDD (mA)
2 2.0
2 -2.0
3 -3.0
4 -4.0
5 -5.0
40 25 10 5 20 35 50 65 80 95 110 125 12 13 14 15 16 17 18
Temperature (oC) VPOS (V)
C001 C001
|VPOS_IN_x| = VNEG_IN_x, 10-V Range, Mid Scale Code |VPOS_IN_x| = VNEG_IN_x, 10-V Range, Mid Scale Code
Figure 60. VOUT Power Supply Current vs Temperature Figure 61. VOUT Power Supply Current vs Power Supplies
Voltages
C001 C001
Figure 62. VOUT Full-Scale Settling Time, Rising Edge Figure 63. VOUT Full-Scale Settling Time, Falling Edge
C005 C005
Figure 64. VOUT Glitch Impulse, Rising Edge, 1LSB Step Figure 65. VOUT Glitch Impulse, Falling Edge, 1LSB Step
SYNC (5 V/div)
AVDD (5 V/div)
VOUT (2 mV/div)
C005 C004
10V Range
Figure 66. VOUT Power-On Glitch Figure 67. VOUT Enable Glitch
1000
900
800
600
500 VOUT = 10 V
400 VOUT = 5 V
200
100
0
Time (1 s/div) 10 100 1000 10000 100000 1000000
Frequency (Hz)
C001 C001
Figure 68. VOUT Noise, 0.1 Hz to 10 Hz Figure 69. VOUT Noise Density vs Frequency
VOUT (2 mV/div)
SCLK (5 V/div)
Time (4 s/div)
C004
8 1.0
10 V 5 V 0.8
6
0 V to 10 V 0 V to 5 V 0.6
4
0.4
2
0.2
0 0.0
-0.2
-2
-0.4
-4
-0.6 10 V 5 V
-6 0 V to 10 V 0 V to 5 V
-0.8
-8 -1.0
0 8192 16384 24576 32768 40960 49152 57344 65536 0 8192 16384 24576 32768 40960 49152 57344 65536
DAC Code DAC Code
C002 C001
Figure 71. VOUT Linearity Error vs Digital Input Code Figure 72. VOUT Differential Linearity Error vs Digital Input
Code
20 3500
15 3000
10 VOUT = 10 V
Noise PSD (nV/ sqrt-Hz)
2500
VOUT = 5 V
TUE (m%FSR)
5
2000 VOUT = 0 V
0
1500
-5
1000
-10
10 V 5 V
-15 500
0 V to 10 V 0 V to 5 V
-20 0
0 8192 16384 24576 32768 40960 49152 57344 65536 10 100 1000 10000 100000 1000000
DAC Code Frequency (Hz)
C003 C001
10-V Range
Figure 73. VOUT Total Unadjusted Error vs Digital Input Figure 74. VOUT Noise Density vs Frequency
Code
Time (1 ms/div)
C001
5.004 5.015
5.002 5.012
5.000 5.009
4.998 5.006
4.996 5.003
4.992 4.997
4.990 4.994
4.988 4.991
4.986 4.988
4.984 4.985
40 25 10 5 20 35 50 65 80 95 110 125 5 4 3 2 1 0 1 2 3 4 5
Temperature (oC) Load Current (mA)
C001 C001
30 Units
Figure 76. Internal Reference Voltage vs Temperature Figure 77. Internal Reference Voltage vs Load Current
5.015 2500
5.012
Reference Output Voltage (V)
5.006
5.000
4.997 1000
4.994
4.991 500
4.988
4.985 0
12 15 18 21 24 27 30 33 36 10 100 1000 10000 100000 1000000
AVDD (V) Frequency (Hz)
C001 C001
Figure 78. Internal Reference Voltage vs Power Supply Figure 79. Internal Reference Noise Density vs Frequency
VREF (5 v/div)
Time (1 s/div)
C001
2500
1500
1000
500
0
10 100 1000 10000 100000 1000000 Time (1 s/div)
Frequency (Hz)
C001 C001
0-24 mA Range, Full Scale Code on all channels 0-24 mA Range, Full Scale Code on all channels
Figure 81. Internal Reference Noise Density vs Frequency Figure 82. Internal Reference Ripple
C001 C001
Figure 83. Buck-Boost Converter Power-On (IOUT Mode) Figure 84. Buck-Boost Converter Power-On (VOUT Mode)
180 4000
80 IOUT = 0 mA 2000
60
1500
40
1000
20
500
0
20 0
10 100 1000 10000 100000 1000000 10 100 1000 10000 100000 1000000
Frequency (Hz) Frequency (Hz)
C001 C001
Figure 85. VPOS Noise Density (IOUT Mode) vs Frequency Figure 86. VPOS Noise Density (VOUT Mode) vs Frequency
450
400
VOUT = 10 V
VNEG Noise PSD (V/ sqrt-Hz)
350 VOUT = 5 V
300 VOUT = 0 V
250
200
150
100
50
0
10 100 1000 10000 100000 1000000
Frequency (Hz)
C001
100 100
PVDD =12V, RL=250 PVDD =12V, RL=1k
90 90
PVDD=24V, RL=250 PVDD=24V, RL=1k
80 80
PVDD =36V, RL=250 PVDD =36V, RL=1k
70
IOUT Efficiency (%)
70
Figure 88. IOUT Efficiency vs Load Current Figure 89. VPOS Efficiency (IOUT Mode) vs Load Current
100 100
PVDD =12V, RL=250 PVDD =12V, RL=1k
90 90
PVDD=24V, RL=250 PVDD=24V, RL=1k
80 PVDD =36V, RL=250 PVDD =36V, RL=1k 80
VPOS DCDC Efficiency (%)
70 70
IOUT Efficiency (%)
60 60
50 50
40 40
0 0
40 25 10 5 20 35 50 65 80 95 110 125 40 25 10 5 20 35 50 65 80 95 110 125
Temperature (oC) Temperature (oC)
C001 C001
Figure 90. IOUT Efficiency vs Temperature Figure 91. VPOS Efficiency (IOUT Mode) vs Temperature
2500 4000
PVDD=12V, RL=250
PVDD=12V, RL=250 PVDD=12V, RL=1k
2250 3600
PVDD=12V, RL=1k
PVDD Power Dissipation (mW)
1000 1600
750 1200
500 800
250 400
0 0
0 2 4 6 8 10 12 14 16 18 20 22 24 40 25 10 5 20 35 50 65 80 95 110 125
IOUT (mA) Temperature (oC)
C001 C001
Figure 92. PVDD Power Loss (IOUT Mode) vs Load Current Figure 93. PVDD Power Loss (IOUT Mode) vs Temperature
50 100
46 90
42 80 PVDD = 12 V
38 70 PVDD = 24 V
Die Temperature (oC)
30 50
26 40
PVDD=12V, RL=250 PVDD=12V, RL=1k
22 30
10 0
0 2 4 6 8 10 12 14 16 18 20 22 24 0 1 2 3 4 5 6 7 8 9 10
IOUT (mA) VOUT Load (mA)
C001 C001
1200 1200
1000 1000
800 800
Full Scale Code on all channels Full Scale Code on all channels
Figure 96. PVDD Power Loss (VOUT Mode) vs Load Current Figure 97. PVDD Power Loss (VOUT Mode) vs Temperature
50 3.60
46 3.40
42 3.20
Forward Sweep
38 3.00
Die Temperature (oC)
Reverse Sweep
I-DVDD (mA)
34 2.80
30 2.60
26 PVDD = 12 V 2.40
22 PVDD = 24 V 2.20
18 PVDD = 36 V 2.00
14 1.80
10 1.60
0 1 2 3 4 5 6 7 8 9 10 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
VOUT Load (mA) Logic Level (V)
C001 C001
Figure 98. Internal Die Temperature (VOUT Mode) vs Load Figure 99. Power Supply Current (DVDD) vs Input Logic
Current Level
8 Detailed Description
8.1 Overview
Each channel of DAC8775 consists of a resistor-string digital-to-analog converter (DAC) followed by buffer
amplifiers. The output of the buffer drives the current output stage and the voltage output amplifier. The resistor-
string section is simply a string of resistors, each of value R, from REFIN to PBKG, as the Functional Block
Diagram illustrates. This type of architecture ensures DAC monotonicity. The 16-bit binary digital code loaded to
the DAC register determines at which node on the string the voltage is tapped off before being fed into the output
amplifier. The current output stage converts the output from the string to current using a precision current source.
The voltage output provides a voltage output to the external load. When the current output stage or the voltage
output stage is disabled, the respective output pin is in Hi-Z state. After power-on, both output stages are
disabled. Each channel of DAC8775 also contains a Buck-Boost converter which can be used to generate the
power supply for the current output stage and voltage output amplifier.
REFIN
Buck-Boost
Converters
VPOS_IN_x
VOUT_x
Voltage Out
VNEG_IN_x
AGND1
VPOS_IN_x
Rsense
Sourcing
PMOS
DAC IOUT
Sinking
NMOS Rload
Iload
Rsense
VNEG_IN_x
Copyright 2016, Texas Instruments Incorporated
The 16 bit data can be written to DAC8775 using address 0x05 (DAC data registers, see Table 5 and Table 6).
For a 0-mA to 20-mA output range:
CODE
IOUT_x = 20 mA. N
2 (1)
For a 0-mA to 24-mA output range:
CODE
IOUT_x = 24 mA. N
2 (2)
For a 3.5-mA to 23.5-mA output range:
CODE
IOUT_x = 20 mA. N + 3.5 mA
2 (3)
For a 4-mA to 20-mA output range:
CODE
IOUT_x = 16 mA. N + 4 mA
2 (4)
For a -24-mA to 24-mA output range:
CODE
IOUT_x = 48 mA. - 24 mA
2N (5)
Where:
CODE is the decimal equivalent of the code loaded to the DAC.
N is the bits of resolution; 16.
DAC VOUT_X
R0
120K R1
R2 RFB 120K
17K t 24K 60K
REFIN
S3
R1
VSENSEN_X
42K - Open
S2
The VSENSEP_x pin is provided to enable sensing of the load. Ideally, it is connected to VOUT_x at the
terminals. Additionally, it can also be used to connect remotely to points electrically "nearer" to the load. This
allows the internal output amplifier to ensure that the correct voltage is applied across the load as long as
headroom is available on the power supply. However, if this line is cut, the amplifier loop would be broken.
Therefore, an optional resistor can be used between VOUT_x and VSENSEP_x to prevent this.
The VSENSEN_x pin can be used to sense the remote ground and offset the VOUT pin accordingly. The
VSENSEN_x pin can sense a maximum of 7 V difference from the PBKG pin of the DAC8775.
The 16-bit data can be written to DAC8775 as shown in DAC data registers, see Table 5 and Table 6.
For unipolar output mode:
CODE
VOUT_x = VREFIN.GAIN.
2N (6)
For bipolar output mode:
CODE GAIN.VREFIN
VOUT_x = VREFIN.GAIN.
2N 2 (7)
VNEG_IN_x
x = {A,B,C,D}
Copyright 2016, Texas Instruments Incorporated
These Buck-Boost converters employ a variable switching frequency technique. This technique increases the
converter efficiency at all loads by automatically reducing the switching frequency at light loads and increasing it
at heavy loads. At no load condition, the converter stops switching completely until the load capacitor discharges
by a preset voltage. At this point the converter automatically starts switching and recharges the load capacitor(s).
In addition to saving power at all loads, this technique ensures low switching noise on the converter outputs at
light loads. The minimum load capacitor for these Buck-Boost converters is 10 F. This capacitor must be
connected between the schottky diode(s) and ground (0 V) for each arm of each Buck-Boost converter (A, B, C,
D). The Buck-Boost converter, when enabled, generates ripple on the supply pins (VPOS_IN_x and
VNEG_IN_x). This ripples is typically attenuated by the power supply rejection ratio of the output amplifiers
(IOUT_x or VOUT_x) and appears as noise on the output pin of the amplifiers (IOUT_x and VOUT_x). A larger
load capacitor in combination with additional filter (see Application Information section) reduces the output ripple
at the expense of increasing settling time of the converter output.
The input voltage to the Buck-Boost converters (pin PVDD_x) can vary from +12 V to +36 V. These outputs can
be individually enabled or disabled via the user SPI interface (see Commands in Table 5 and Table 6).
D1
DAC8775 LN_x
Rfilt1
Cload Cfilt1
PVSS_x AGND_x
VPOS_IN_x
D2 Rfilt2
LP_x
Cload Cfilt2
PVSS_x AGND_x
VNEG_IN_x
8.3.7 Power-On-Reset
The DAC8775 contain power on reset circuits which is based on AVDD and DVDD power supplies. After power-
on, the power-on-reset circuit ensures that all registers are at their default values (see Table 5). The current,
voltage output DACs, and the Buck-Boost converters are disabled. The current output pin is in high impedance
state.
The voltage output pin is in a 30k-to-GND state; however, the VSENSEP_x pin is an open circuit. The voltage
output pin impedance may be changed to high-impedance by the POC bit setting.
If enabled, the chip must have an SPI frame with 0x10 as the write address byte written to the device within the
programmed timeout period. Otherwise, the ALARM pin asserts low and the WDT bit (address 0x0B) of the
status register is set to '1'. The WDT bit is set to '0' with a software/hardware reset, or by disabling the watchdog
timer (WEN = '0'), or powering down the device.
When using multiple DAC8775 devices in a daisy-chain configuration, the open-drain ALARM pins of all devices
can be connected together to form a wired-AND network. The watchdog timer can be enabled in any number of
the devices in the chain although enabling it in one device in the chain should be sufficient. The wired-AND
ALARM pin may get pulled low because of the simultaneous presence of different trigger conditions in the
devices in the daisy-chain. The host processor should read the status register of each device to know all the fault
conditions present in the chain.
The HART pin for the selected channel can be enabled by writing logic '1' to the HTEN bit at address 0x04 (see
Table 5 and Table 6).
C B A
DAC8775 DAC8775 DAC8775
SDIN SDO SDIN SDO SDIN SDO
SCLK SCLK SCLK
SYNC SYNC SYNC
LDAC LDAC LDAC
The DAC8775 provides two modes for daisy-chain operation: normal and transparent. The TRN bit in the Reset
config register determines which mode is used. In Normal mode (TRN bit = '0'), the data clocked into the SDIN
pin are transferred into the shift register. The first falling edge of SYNC starts the operating cycle. SCLK is
continuously applied to the SPI Shift Register when SYNC is low. If more than 24 clock pulses are applied, the
data ripple out of the shift register and appear on the SDO line. These data are clocked out on the rising edge of
SCLK and are valid on the falling edge. By connecting the SDO pin of the first device to the SDIN input of the
next device in the chain, a multiple-device interface is constructed. Each device in the system requires 24 clock
pulses. Therefore, the total number of clock cycles must equal 24 N, where N is the total number of DAC8775s
in the chain. When the serial transfer to all devices is complete, SYNC is taken high. This action latches the data
from the SPI Shift registers to the device internal registers synchronously for each device in the daisy-chain, and
prevents any further data from being clocked in. Note that a continuous SCLK source can only be used if SYNC
is held low for the correct number of clock cycles. For gated clock mode, a burst clock containing the exact
number of clock cycles must be used and SYNC must be taken high after the final clock in order to latch the
data.
In Transparent mode (address 0x02h, TRN bit = '1' Table 6), the data clocked into SDIN are routed to the SDO
pin directly; the Shift Register is bypassed. When SCLK is continuously applied with SYNC low, the data clocked
into the SDIN pin appear on the SDO pin almost immediately (with approximately a 12 ns delay); there is no 24
clock delay, as there is in normal operating mode. While in Transparent mode, no data bits are clocked into the
Shift Register, and the device does not receive any new data or commands. Putting the device into transparent
mode eliminates the 24 clock delay from SDIN to SDO caused by the Shift Register, thus greatly speeding up the
data transfer. For example, consider three DAC8775s (C, B, and A) in a daisy-chain configuration (see Figure
11). The data from the SPI controller are transferred first to C, then to B, and finally to A. In normal daisy-chain
operation, a total of 72 clocks are needed to transfer one word to A. However, if C and B are placed into Sleep
mode, the first 24 data bits are directly transferred to A (through C and B); therefore, only 24 clocks are needed.
To wake the device up from transparent mode and return to normal operation, the hardware RESET pin must be
toggled.
Select Buck-Boost
Register (x06h)
Config Buck-Boost
Register (x07h)
The DAC8775 decodes the 32-bit input frame data to compute the CRC remainder. If no error exists in the
frame, the CRC remainder is zero. When the remainder is non-zero (that is, the input frame has single- or
multiple-bit errors), the ALARM pin asserts low and the CRE bit of the status register (address 0x0B) is also set
to '1'. Note that the ALARM pin can be asserted low for any of the different conditions as explained in the
ALARM Pin section. The CRE bit is set to '0' with a software or hardware reset, or by disabling the frame error
checking, or by powering down the device. In the case of a CRC error, the specific SPI frame is blocked from
writing to the device.
Frame error checking can be enabled for any number of DAC8775 devices connected in a daisy-chain
configuration. However, it is recommended to enable error checking for none or all devices in the chain. When
connecting the ALARM pins of all combined devices, forming a wired-AND function, the host processor should
read the status register of each device to know all the fault conditions present in the chain. For proper operation,
the host processor must provide the correct number of SCLK cycles in each frame, taking care to identify
whether or not error checking is enabled in each device in the daisy-chain.
Note that, in order to write to (or read from) a per channel address, corresponding Buck-Boost converter and
DAC channel must be selected using commands 0x06 and 0x03.
8.5.2.9 DAC Channel Calibration Enable Register (address = 0x08) [reset = 0x0000]
8.5.2.10 DAC Channel Gain Calibration Register (address = 0x09) [reset = 0x0000]
R/W
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
8.5.2.11 DAC Channel Offset Calibration Register (address = 0x0A) [reset = 0x0000]
7 6 5 4 3 2 1 0
Reserved
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
7 6 5 4 3 2 1 0
Reserved
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TIs customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
10PF 10PF
VNEG_IN_x
VPOS_IN_x
LN_x
LP_x
DAC8775
The buck-boost converters integrated in the DAC8775 each require three external passive components for
operation: a single inductor per channel as well as storage capacitors and switching diodes for each VPOS_IN_x
and VNEG_IN_x channels that are active. If only one output is used, either VPOS_IN_x or VNEG_IN_x, the
inactive output components may be removed and the respective inputs tied to ground. In order to meet the
parametric performance outlined in the Electrical Characteristics section for the voltage output, 500 mV of foot-
room is required on VNEG_IN_x.
The recommended value for the external inductor is 100 H with at least 500 mA peak inductor current.
Reducing the inductor value to as low as 80 H is possible, though this will limit the buck-boost converter
maximum input voltage to output voltage ratio, reduce efficiency, and increase ripple. Reducing the inductor
below 80 H will result in device damage. Peak inductor current should be rated at 500 mA or greater with 20%
inductance tolerance at peak current. If peak inductor current for an inductor is violated the effective inductance
is reduced, which will impact maximum input to output voltage ratio, efficiency, and ripple.
An output, or storage, X7R capacitor with value of 10 F and voltage rating of 50 V is recommended though
other values and dielectric materials may be used without damaging the DAC8775. Reducing capacitor value will
increase buck-boost converter output ripple and reduced voltage rating will reduce effective capacitance at full-
scale buck-boost converter outputs. X7R capacitors are rated for 55C to 125C operation with 15% maximum
capacitance variance over temperature. Designs operating over reduced temperature spans and with loose
efficiency requirements may use different dielectric material. C0G capacitor typically offer tighter capacitance
variance but come in larger packages, but may be beneficial substitutes.
DAC + R3 A2 VOUT_x
A1 +
R6 S3
R4 R5
REFIN VSENSEN_x
S2
R7
R8
S4
When designing for a shared voltage and current output terminal it is important to consider leakage paths that
may corrupt the voltage or current output stages.
When the voltage output is active and the current output is inactive the IOUT_x pin becomes a high-impedance
node and therefore does not significantly load the voltage output in a way that would degrade VOUT_x
performance. When the voltage output is inactive and the current output is active switches S1, S2, and S4 all
become open while switch S3 is controlled by the POC bit in the Reset Config Register for each respective
channel. When the POC bit is set to a 0, the default value, switch S3 is closed when VOUT is disabled. This
creates a leakage path with respect to the current output when the terminals are shared which will create a load-
dependent error. In order to reduce this error the POC bit can be set to a 1 which opens switch S3, effectively
making the VOUT pin high-impedance and reducing the magnitude of leakage current.
9.1.3 Optimizing Current Output Settling time with Auto learn Mode
When the buck-boost converters are active power and heat dissipation of the device are at a minimum, however
settling time of the current output is dominated by the slew rate of the buck-boost converter, which is significantly
slower that the current output signal chain alone. When the buck-boost converters are bypassed settling time of
the current output is minimized while power and heat dissipation are significant.
Auto-learn mode offers an alternative mode which allows the buck-boost converter to learn the size of the load
and choose a clamped output value that does not change over the full range of the selected current output. This
allows a balance between settling time and power dissipation. There are two options for entering auto-learn
mode:
Enable the buck-boost converter in full-tracking mode followed by enabling the current output. Until the DAC
code 0x4000 is passed, settling time will be dominated by the buck-boost converter. After code 0x400 is
surpassed the buck-boost converter detects the load and sets the clamp value appropriately.
Enable the buck-boost converter in clamp-mode with clamp value set to a greater voltage than required by
Copyright 2017, Texas Instruments Incorporated Submit Documentation Feedback 61
Product Folder Links: DAC8775
DAC8775
SLVSBY7 FEBRUARY 2017 www.ti.com
D1 C1 C2
D4
VNEG_IN_x
VPOS_IN_x
LN_x
LP_x
VPOS_IN_x
VSENSEP_x R1
VPOS_IN_x
VNEG_IN_x C3 VPOS_IN_x
CCOMP_x
VPOS_IN_x
VNEG_IN_x D5
VOUT_x R2 FB1
Shared Voltage &
Current Output Terminal
VPOS_IN_x
C4
VNEG_IN_x D6 D7
IOUT_x R3
VNEG_IN_x
VNEG_IN_x
DAC8775
(Single Channel Illustrated for Simplicity)
Figure 129. Simplified Block Diagram of Internal Structures and External Protection
When these internal structures are exposed to industrial transient testing, without the external protection
components, the diode structures will become forward biased and conduct current. If the conducted current is too
large, which is often true for high-voltage industrial transient tests, the structures will become permanently
damaged and impact device functionality.
Both attenuation and diversion strategies are implemented to protect the internal structures as well as the device
itself. Attenuation is realized by capacitor C4 which forms an R/C low-pass filter when interacting with the source
impedance of the transient generator, ferrite bead FB1 also helps attenuate high-frequency current, along with
both AC and DC current limiters realized by series pass elements R1, R2, and R3. Diversion is achieved by
transient voltage suppressor (TVS) diode D7 and clamp-to-rail diodes D5 and D6. The combined effects of both
strategies effectively limit the current flowing into the device and through the internal diode structures such that
the device is not damaged and remains functional.
It is important to also include TVS diodes D1 and D4 at the VPOS_IN_x and VNEG_IN_x nodes in order to
provide a discharge path for the energy that is going to be sent to these nodes through diodes D5, D6, and the
internal diode structures. Without these diodes when current is diverted to these nodes the DC/DC converter
storage capacitors C1 and C2 will charge, slowly increasing the voltage at these nodes.
100H
10F
34N LM5166
SS HYS
0.033F
+12V
100P+ RSET PGOOD
GND
10PF 10PF 0.1PF 10PF
PAD RT
301N
VNEG_IN_x
VPOS_IN_x
LN_x
LP_x
AVDD
PVDD
Field Ground
DVDD
15
0.1PF 0.1PF 0.1PF DVDD_EN VSENSEP_x
(Optional) VPOS_IN_x
VDD VCC1 VCC2 CCOMP_x
GND1 GND2
VNEG_IN_x
HART_IN_x
HART Signal
Digital Controller 22nF FSK 1200-2200Hz
VSENSEN_x
VCC1 VCC2
CS INA OUTA RESET
AVDD
RA RB
AVDD
A2
AVDD AVDD + Q2
Q1 AVSS
+
A1
IOUT
AVDD AVSS
SYNC VOUTA
DIN RSET
SCLK
GND
VOUTB
LDAC
GND VREFIN/VREFOUT
AVDD
+
A3 VOUT
RG1 AVSS
RFB
RG2
Figure 131. Generic Design for Typical PLC Current and Voltage Outputs
Figure 131 illustrates a common generic solution for realizing the desired voltage and current output spans for
industrial automation applications.
The current output circuit is comprised of amplifiers A1 and A2, MOSFETs Q1 and Q2, and the three resistors
RSET, RA, and RB. This two-stage current source enables the ground-referenced DAC output voltage to drive
the high-side amplifier required for the current-source.
0.08% 0.05%
0.07% 0.04% A B
A B
Total Unadjusted Error (FSR)
0.06% 0.03% C D
C D
0.05% 0.02%
0.04% 0.01%
0.03% 0.00%
0.02% -0.01%
0.01% -0.02%
0.00% -0.03%
-0.01% -0.04%
-0.02% -0.05%
0 8192 16384 24576 32768 40960 49152 57344 65536 0 8192 16384 24576 32768 40960 49152 57344 65536
Code Code
C001 C001
Figure 132. 4-mA to 20-mA IOUT TUE vs Code Figure 133. 10-V VOUT TUE vs Code
0.9
0.7
0.6
RL = 0 RL = 249
0.5
RL = 487 RL = 750
RL = 976
0.4
12 15 18 21 24 27 30 33 36
PVDD (V)
C001
VPOS_IN_x
LN_x
LP_x
AVDD
PVDD
DAC8775
PVSS
AGND
Figure 136 illustrates using a single supply from the DAC8775 internal DC/DC and the other supply from an
external source. In this example the VNEG_IN_x supply is the input being supplied by an external supply, or
ground for unipolar output spans. A similar scheme could be used if VPOS_IN_x was supplied by an external
supply and VNEG_IN_x was supplied by the internal DC/DC.
To GND or
External Supply 12V to 36V
100P+
VPOS_IN_x
LN_x
LP_x
AVDD
PVDD
DAC8775
PVSS
AGND
The scheme in Figure 137 should be used if the internal DC/DC is not used at all and external supplies are
selected for VPOS_IN_x and VNEG_IN_x. When using external supplies for VPOS_IN_x it is important that
VPOS_IN_x, PVDD, and AVDD nodes are tied to the same voltage potential with the same ramp-rate.
To GND or
External Supply +12V
VPOS_IN_x
LN_x
LP_x
AVDD
PVDD
DAC8775
PVSS
AGND
11 Layout
Traces for the DC/DC external components should be as low impedance, low inductance, and low capacitance
as possible in order to maintain optimum performance. As such wide traces should be used to minimize
inductance with minimal use of vias as vias will contribute large inductance and capacitance to the trace. For this
reason it is recommended that all DC/DC components placed on the top layer.
The industrial transient protection circuit should be placed as close to the output connectors as possible to
ensure that the return currents from these transients have a controlled path to exit the PCB which does not
impact the analog circuitry.
Split ground planes for the DC/DC, digital, and analog grounds are not required but may be helpful to isolated
ground return currents from cross-talk. If split ground planes are used care should be taken to ensure that signal
traces are only placed above or below the locations where their respective grounds are placed in order to
mitigate unexpected return paths or coupling to the other ground planes. If a single ground plane is used it is
advisable to follow similar practices implementing a star-ground where the respective return currents interact with
one another minimally. The example layout uses a single ground plane, based on measured results, performs
similarly to an identical version with split ground planes.
The perimeter of the board is stitched with vias in order to enhance design performance against environments
which may include radiated emissions. Additional vias are placed in critical areas nearby the design in order to
place ground pours in between nodes to reduce cross-talk between adjacent traces.
Standard best-practices should be applied to the remaining components, including but not limited to, placing
decoupling capacitors close to their respective pins and using wide traces or copper pours where possible,
particularly for power traces where high current may flow.
Channel D DC/DC
Channel A DC/DC
Components
Components
12.4 Trademarks
Microwire, E2E are trademarks of Texas Instruments.
SPI, QSPI are trademarks of Motorola, Inc.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 17-Feb-2017
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
DAC8775IRWFR ACTIVE VQFN RWF 72 2000 Green (RoHS CU NIPDAU Level-3-260C-168 HR -40 to 125 DAC8775
& no Sb/Br)
DAC8775IRWFT ACTIVE VQFN RWF 72 250 Green (RoHS CU NIPDAU Level-3-260C-168 HR -40 to 125 DAC8775
& no Sb/Br)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 17-Feb-2017
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 3-Mar-2017
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 3-Mar-2017
Pack Materials-Page 2
PACKAGE OUTLINE
RWF0072A SCALE 1.400
VQFN - 0.9 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
10.1
B A
9.9
10.1
9.9
0.9 MAX
C
SEATING PLANE
0.05 0.08
0.00
2X 8.5
(0.2) TYP
19 36
68X 0.5
18 37
8.5 0.1 2X
8.5
1 54
0.3
72 55 72X
PIN 1 ID 0.2
(OPTIONAL) 0.5
72X 0.1 C A B
0.3
0.05
4221567/A 07/2014
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
RWF0072A VQFN - 0.9 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
72X (0.6) 72 55
1
54
72X (0.25)
(1.3)
TYP
68X (0.5)
SYMM
(9.8)
( 0.2) TYP
VIA
18 37
19 36
( 8.5)
(9.8)
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
www.ti.com
EXAMPLE STENCIL DESIGN
RWF0072A VQFN - 0.9 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
METAL
TYP
(1.3) TYP
72X (0.6) 72 55
72X (0.25)
1
54
(1.3)
TYP
68X (0.5)
SYMM
(9.8)
18 37
19 36
SYMM ( 1.1)
TYP
(9.8)
EXPOSED PAD
60% PRINTED SOLDER COVERAGE BY AREA
SCALE:10X
4221567/A 07/2014
NOTES: (continued)
5. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
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