FAN7389 3-Phase Half-Bridge Gate-Drive IC: Features Description
FAN7389 3-Phase Half-Bridge Gate-Drive IC: Features Description
FAN7389 3-Phase Half-Bridge Gate-Drive IC: Features Description
January 2013
FAN7389
3-Phase Half-Bridge Gate-Drive IC
Features Description
Floating Channel for Bootstrap Operation to +600 V The FAN7389 is a monolithic three-phase half-bridge
gate-drive IC designed for high-voltage, high-speed
Typically 350 mA/650 mA Sourcing/Sinking Current
driving MOSFETs and IGBTs operating up to +600 V.
Driving Capability for All Channels
Extended Allowable Negative VS Swing to -9.8 V for Fairchild’s high-voltage process and common-mode
Signal Propagation at VDD=VBS=15 V noise canceling technique provide stable operation of
high-side drivers under high-dv/dt noise circumstances.
Output In-Phase with Input Signal
An advanced level-shift circuit allows high-side gate
Over-Current Shutdown Turns off All Six Drivers driver operation up to VS = -9.8 V (typical) for VBS =15 V.
Matched Propagation Delay for All Channels The protection functions include under-voltage lockout
3.3 V and 5.0 V Input Logic Compatible and inverter over-current trip with an automatic fault-
clear function.
Adjustable Fault-Clear Timing
Over-current protection that terminates all six outputs
Built-in Advanced Input Filter can be derived from an external current-sense resistor.
Built-in Shoot-Through Prevention Logic An open-drain fault signal is provided to indicate that an
over-current or under-voltage shutdown has occurred.
Built-in Soft Turn-Off Function
The UVLO circuits prevent malfunction when VDD and
Common-Mode dv/dt Noise Canceling Circuit VBS are lower than the specified threshold voltage.
Built-in UVLO Functions for All Channels Output drivers typically source and sink 350 mA and
650 mA, respectively; which is suitable for three-phase
Applications half-bridge applications in motor drive systems.
Ordering Information
Operating Packing
Part Number Package
Temperature Method
FAN7389MX1(1) 28-Lead, Small Outline Integrated Circuit Wide Body (SOIC) -40 to +125°C Tape & Reel
Note:
1. These devices passed wave soldering test by JESD22A-111.
Pin Definitions
Pin Name Description
1 VDD Logic and low-side gate driver power supply voltage
2 HIN1 Logic Input 1 for high-side gate 1 driver
3 HIN2 Logic Input 2 for high-side gate 2 driver
4 HIN3 Logic Input 3 for high-side gate 3 driver
5 LIN1 Logic Input 1 for low-side gate 1 driver
6 LIN2 Logic Input 2 for low-side gate 2 driver
7 LIN3 Logic Input 3 for low-side gate 3 driver
8 FO Fault output with open drain (indicates over-current and low-side under-voltage)
9 CS Analog input for over-current shutdown
10 EN Logic input for shutdown functionality
11 RCIN An external RC network input used to define the fault-clear delay
12 VSS Logic ground
13 COM Low-side driver return
14 LO3 Low-side gate driver 3 output
15 LO2 Low-side gate driver 2 output
16 LO1 Low-side gate driver 1 output
17, 21, 25 NC No connect
18 VS3 High-side driver 3 floating supply offset voltage
19 HO3 High-side driver 3 gate driver output
20 VB3 High-side driver 3 floating supply
22 VS2 High-side driver 2 floating supply offset voltage
23 HO2 High-side driver 2 gate driver output
24 VB2 High-side driver 2 floating supply
26 VS1 High-side driver 1 floating supply offset voltage
27 HO1 High-side driver 1 gate driver output
28 VB1 High-side driver 1 floating supply
650 650
600 600
550 550
tON [ns]
tOFF [ns]
500 500
450 450
100 80
90 70
80 60
70 50
tF [ns]
tR [ns]
60 40
50 30
40 20
High-Side High-Side
30 Low-Side 10
Low-Side
20 0
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 6. Turn-On Rise Time vs. Temperature Figure 7. Turn-Off Fall Time vs. Temperature
600 2.0
1.8
550
tFLTCLR [ms]
1.6
tEN [ns]
500
1.4
450
1.2
400 1.0
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 8. Enable LOW to Output Shutdown Delay Figure 9. Fault-Clear Time vs. Temperature
vs. Temperature
400 50
350 25
MDT [ns]
DT [ns]
300 0
250 -25
DT1
DT2
200 -50
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 10. Dead Time vs. Temperature Figure 11.Dead-Time Matching vs. Temperature
50 -7
40
-8
30
Delay Matching [ns]
20
-9
10
VS [V]
0 -10
-10
-11
-20
-30
MTON -12
-40 MTOFF
-50 -13
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 12. Delay Matching vs. Temperature Figure 13.Allowable Negative VS Voltage
vs. Temperature
400 100
350
80
300
IQBS [μA]
IQDD [μA]
60
250
200
40
150
20
100
50 0
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 14. Quiescent VDD Supply Current Figure 15. Quiescent VBS Supply Current
vs. Temperature vs. Temperature
700 700
600 600
500 500
IPBS [μA]
IPDD [μA]
400 400
300 300
200 200
100 100
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 16. Operating VDD Supply Current Figure 17.Operating VBS Supply Current
vs. Temperature vs. Temperature
9.5 9.5
9.0
9.0
8.5
VDDUV- [V]
VDDUV+ [V]
8.5 8.0
7.5
8.0
7.0
7.5 6.5
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 18. VDD UVLO+ vs. Temperature Figure 19.VDD UVLO- vs. Temperature
9.5 9.0
9.0 8.5
VBSUV+ [V]
VBSUV- [V]
8.5 8.0
8.0 7.5
7.5 7.0
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 20. VBS UVLO+ vs. Temperature Figure 21.VBS UVLO- vs. Temperature
100 100
High-Side High-Side
Low-Side Low-Side
80 80
VOH [mV]
VOL [mV]
60 60
40 40
20 20
0 0
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 22. High-Level Output Voltage vs. Temperature Figure 23.Low-Level Output Voltage vs. Temperature
3.0 3.0
2.5
2.5
VIL [V]
VIH [V]
2.0
2.0
1.5
1.5
1.0
1.0 0.5
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 24. Logic HIGH Input Voltage vs. Temperature Figure 25.Logic LOW Input Voltage vs. Temperature
160 2.0
140
1.5
IIN+ [μA]
IIN- [μA]
120
1.0
100
0.5
80
60 0.0
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Temperature [°C] Temperature [°C]
Figure 26. Logic Input HIGH Bias Current Figure 27.Logic Input LOW Bias Current
vs. Temperature vs. Temperature
100 200
80 180
REN [KΩ]
RIN [KΩ]
60 160
40 140
20 120
0 100
10 12 14 16 18 20 10 12 14 16 18 20
Supply Voltage [V] Supply Voltage [V]
Figure 28. Input Pull-Down Resistance Figure 29.Enable Pin Pull-Down Resistance
vs. Supply Voltage vs. Supply Voltage
400 100
350
80
300
IQBS [μA]
IQDD [μA]
250 60
200 40
150
20
100
50 0
10 12 14 16 18 20 10 12 14 16 18 20
Supply Voltage [V] Supply Voltage [V]
Figure 30. Quiescent VDD Supply Current Figure 31.Quiescent VBS Supply Current
vs. Supply Voltage vs. Supply Voltage
700 700
600 600
500 500
IPDD [μA]
IPBS [μA]
400 400
300 300
200 200
100 100
10 12 14 16 18 20 10 12 14 16 18 20
Supply Voltage [V] Supply Voltage [V]
Figure 32. Operating VDD Supply Current Figure 33.Operating VBS Supply Current
vs. Supply Voltage vs. Supply Voltage
2. Protection Function
2.1 Fault Out ( FO ) and Under-Voltage Lockout
The high- and low-side drivers include under-voltage
lockout (UVLO) protection circuitry that monitors the
supply voltage for VDD and VBS independently. It can be
designed to prevent malfunction when VDD and VBS are
lower than the specified threshold voltage. Also, the
UVLO hysteresis prevents chattering during power-
supply transitions. Moreover, the fault signal ( FO ) goes
to LOW state to operate reliably during power-on
events, when the power supply (VDD) is below the
under-voltage lockout high threshold voltage for the
circuit (during t1 ~ t2). The UVLO circuit is not otherwise
activated; shown Figure 38.
INx tFLTIN
Example B
tINPUT
tOUTPUT
Output duration is
same as input duration
OUTx
Figure 47. 28-Lead Small Outline Integrated Circuit (28-Wide Body SOIC)
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