Icp Ms Calibration

Vol. 21 — N°1 06 p.
115>144
97
A Compilation of New and Published Ma j o r

and Trace Element Data for NIST SRM 610
and NIST SRM 612 Glass Ref e rence Ma t e r i a l s
Nicholas J.G. Pe a rc e (1), William T. Pe r k i n s (1), John A. We s tg a t e (2), Michael P. G o rt o n (3),

Simon E. J ac ks o n (4), Clive R. N e a l (5) and Simon P. C h e n e r y (6)
(1) Institute of Earth Studies, University of Wales, Aberystwyth, SY23 3DB, Wales, U.K.
(2) Physical Sciences Division, Scarborough College, University of Toronto, 1265 Military Trail, Scarborough, Ontario, M1C 1A4, Canada
(3) Department of Geology, Earth Sciences Centre, 22 Russel Street, University of Toronto, Toronto, Ontario, M5S 3B1, Canada
(4) Department of Earth Sciences, Memorial University of Newfoundland, St Johns, Newfoundland, A1B 3X5, Canada
(5) Department of Civil Engineering and Geological Sciences, University of Notre Dame, IN 46556, USA.
(6) British Geological Survey, Kingsley Dunham Centre, Key wo rth, Nottingham, NG12 5GG, U.K.
M i c roanalytical trace element techniques (such as Les techniques de micro - a n a l yses d’éléments en
ion probe or laser ablation ICP-MS) are hampere d t race (par sonde ionique ou ICP-MS avec ablation
by a lack of well characterized, homogeneous laser) sont génées par l’absence de standard s
s t a n d a rds. Two silicate glass ref e rence materials homogènes et bien caractérisés. Deux ve r res silica-
p roduced by National Institute of Standards and tés de ré f é rence, les ve r res NIST SRM 610 et NIST
Technology (NIST), NIST SRM 610 and NIST SRM SRM 612, ont été démontrés homogènes et contien-
612, have been shown to be homogeneous and are nent jusqu’à soixante et un élements en trace à des
s p i ked with up to sixty one trace elements at c o n c e n t rations nominales de 500 g g-1 ou 50 g
nominal concentrations of 500 µg g-1 and 50 µg g-1 g -1 re s p e ct i ve m e n t. Ces ve r res (qui sont fournis sous
re s p e ct i ve l y. These samples (supplied as 3 mm forme de galette de 3 mm d’épaisseur) sont équiva-
wafers) are equivalent to NIST SRM 611 and NIST lents aux standards NIST SRM 611 et NIST SRM 613
SRM 613 re s p e ct i vely (which are supplied as 1 mm (qui eux sont fournis sous forme de galettes de 1
wafers) and are becoming more widely used as mm d’épaisseur) et sont de plus en plus utilisés
potential microanalytical ref e rence materials. NIST comme étalon de ré f é rence en micro - a n a l ys e .
h oweve r, only certifies up to eight elements in these Néanmoins, NIST ne certifie que jusqu’à huit
glasses. Here we have compiled concentration data é l éments dans ces ve r res. Nous avons donc compilé
f rom approximately sixty published wo r ks for both les données publiées dans environ soixante art i c l e s
glasses, and have produced new analyses from our sur ces deux ve r res et donnons aussi les ré s u l t a t s
l a b o ratories. Compilations are presented for the des analyses faites dans nos labora t o i re s .
matrix composition of these glasses and for fifty Sont compilées les données sur les éléments compo-
eight trace elements. The trace element data sant la matrice de ces verres ainsi que sur cinquant e -
includes all available new and published data, and huit élements en trace. La compilation pour les élém e n t s
summaries present the overall average and stand a rd en trace, qui regroupe toutes les données dispon i b l e s
d eviation, the range, median, geometric mean and déjà publiées ou faites ré c e m m e n t, donne en sy n-
a preferred average (which excludes all data outsid e thèse la valeur moyenne et la déviation standard
± one standard deviation of the ove rall ave rag e ) . associée (±), ainsi que la gamme de dispersion, la
For the elements which have been certified, there is médiane, la moyenne géométrique et la va l e u r
a good ag reement between the compiled ave rag e s m oyenne recommandée (calculée en excluant les
and the NIST data. This compilation is designed to données à plus d’un sigma de la moyenne général e ) .
provide useful new working values for these referenc e Pour les élements déjà certifiés par NIST, on
materials. re m a rque le bon ac c o rd entre leurs valeurs re c o m-
mandées et nos moyennes ainsi compilées. Cette
compilation fournit donc un ensemble de données
à utiliser comme base de travail pour ces matériaux
de ré f é re n c e .
1 1 5 R e c e i ved 21 May 9 6 — Ac cept ed 17 Dec 96

Trace element microanalytical techniques suff e r of an internal standard in the material being analysed
from a lack of homogeneous, well characterized trace for calibration as (analyte/internal standard) against a
element ref e rence materials (see for example Hinton ref e rence material. An ideal internal standard wo u l d
1990, Perkins and Pe a rce 1995 and Pe a rce et al. be th e min o r i so to pe of a ma j or e leme nt i n the
19 9 6) . T he N a t i on a l I ns ti tu t e o f St an d ard s an d sample, which can be determined easily by elect ro n
Technology (NIST) produces a series of silicate glasses probe micro-analysis. The calibration then only needs
available as 3 mm wafers (including NIST SRM 610 to be scaled for the diff e rences in internal standard
and NIST SRM 612) which have been spiked with up c o n c e n t ration between the sample and the ref e re n c e
to sixty one separate trace elements. NIST SRM 610 material (see Perkins and Pe a rce 1995 for furt h e r
contains trace elements at a nominal 500 µg g - 1 details). An ac c u rate knowledge of the matrix com-
concentration and NIST SRM 612 is at a nominal 50 position of the NIST glasses is thus also important.
µg g - 1. The same materials are available as 1 mm
wafers as NIST SRM 611 (500 µg g-1) and NIST SRM Here we have compiled available published com-
613 (50 µg g-1). In this compilation we include data positional data for the NIST SRM 610 and 612 glasses,
for NIST SRM 611 with NIST SRM 610, and data for and include new analytical data for both their major
NIST SRM 613 with NIST SRM 612, making no distinction and trace element compositions, determined by a
b e t w e en th es e waf ers . NI ST ce rt ifi e s o n ly ei g ht variety of analytical methods in five separate laboratories.
e l ements in these glasses (Fe, Mn, Ni, Rb, Sr, Pb, Th We have excluded from our compilation publications
and U in NIST SRM 610 and Fe, Ni, Rb, Sr, Ag, Pb, Th which only present isotope ratio measurements. We are
and U in NIST SRM 612) for an entire wafer, not for a only awa re of one previous compilation for these
fragment thereof. Information values are given for nine glasses (Gladney et al. 1987) which included data
further elements in NIST SRM 610 and eighteen further f rom approximately twe n ty five sources, as well as
elements in NIST SRM 612. In the certificate issued in some isotope ratio determinations.
January 1992, NIST states that “no element has been
proven heterogeneous outside [5 percent] for the SRM Analytical techniques
wafer used in its entire ty. Howeve r, spatial inhomo- and new data: this study
g e n e i ty does exist within each wafer”, although no
indication of which elements, or to what ex t e n t, is Matrix composition
given. Hinton et al. (1995), however, have shown, in an
ion microprobe study, that the NIST SRM 610 is homo- In LA-ICP-MS analysis, normalisation of the response
geneous to ± 1% re l a t i ve, and that these ref e re n c e for an analyte to a minor isotope of a major element
materials are suitable for use as microanalysis stand a rd s . internal standard is normal practice (e.g. analyte/43Ca,
It is not the intention of this contribution to prove the a n a l y t e / 29Si, see Perkins and Pe a rce 1995) with the
h o m o g e n e i ty of these glasses. Whilst studies have major element determined by an external method
been undert a ken in one of our laboratories in an (such as electron probe or from mineral stoichiometry).
attempt to demonstrate the homogeneity of the NIST The results are then scaled for differences in the major
glasses, problems arise due to element fract i o n a t i o n element internal standard concentrations between the
from the glasses during laser ablation inductively coupled standard and the unknown. If the NIST values for the
plasma- mass spect rometry (LA- I C P-MS ) and mi nor major elements are used for internal standard i s a t i o n ,
changes in instrumental response mean that this can- p a rticularly using NIST SRM 610, a significant erro r
not be shown by LA- I C P-MS (see Jeffries et al. 19 9 6 , ( a round 3%) will be introduced. Ac c u rate know l e d g e
Jeffries 1996). of the matrix composition is thus important.
The NIST SRM 610 and NIST SRM 612 glass wafers The matrix composition of the major elements in
are, however, becoming more widely used as ref e re nce NIST SRM 610 and NIST SRM 612 were determined by
materials in microanalytical techniques which re q u i re wavelength dispersive spect rometry methods on a
homogeneous trace element standards. These tech- Cam eca SX-50 mic ro p ro be in the D ep artment of
niques include ion-probe analysis (see for exa m p l e Geology, University of Toronto. Small fragments of glass
Hinton 1990 and Hinton et al. 1995) and more recently, we re mounted in resin blocks and polished prior to
LA- I C P-MS, (see for example Jac kson et al. 19 9 2 , analyses. Concentrations were produced using the “PAP”
We s tgate et al. 1994, Perkins and Pe a rce 1995 and p ro c e d u re for qu an tita ti v e a na l ys i s, w hi ch gi ve s
Pearce et al. 1996). LA-ICP-MS requires the knowledge combined corrections for absorption and atomic number
1 1 6
eff e cts (Pouchou and Pichoir 1985). Calibration wa s as follows: Na - NaBe-phosphate; Mg - periclase; Al -
ac h i eved for various elements as follows: Si, Al, Na, corundum; Si - quartz; K - K-feldspar; Ca - wollastonite;
K - obsidian standard, University of Alberta; Fe, Mg - Ti - ilmenite; Mn - MnTiO3; Fe - fayalite; V - PbV-chloride.
py r op e; Ca , Mn - b u stam it e; Ti - syn t he tic TiAl - It appears that Na may have been lost from this analy-
pyroxene glass; Cl - tugtupite. A defocussed beam was sis whilst the other major elements compare favourably
used (15 µm) accelerated to 15 kV with a 6 nA current, with the Toronto data.
and elements we re analysed in the following ord e r
simultaneously: Spectrometer 1 (TAP) - Na, Si, Mg, Al; Data for the matrix compositions of NIST SRM 610
S p e ct rometer 2 (LiF) - Fe, Mn; Spectrometer 3 (PET) - K, and NIST SRM 612 are presented in Tables 1 and 2
Ti, Cl, Ca. For both NIST SRM 610 and NIST SRM 612 re s p e ct i ve l y.
a tota l o f tw e n t y ana ly ses we re made fr om fo ur
s e p a rate chips of glass. Detection limits are about Trace elements
0.03% m/m oxide (3 sigma). The matrix composition,
when scaled to 100%, compares ex t remely well with N ew t ra ce e l eme nt d at a fo r u p to fif ty e igh t
the nominal composition used for the matrix by NIST elements from this study are presented in Table 3 for
(i.e. 72% SiO 2, 2% Al2 O3, 12% CaO and 12% Na2O). NIST SRM 610 and in Table 4 for NIST SRM 612. Data
Absolute values are lower tha n t he NIST “matrix ” f rom five laboratories have been incorporated into
composition due to the dilution effect of adding some t h e s e t a b l e s a n d i n c l ud e a n a l y s e s b y s o l u ti o n
sixty one elements at about 500 µg g -1. nebulisation ICP-MS (wi th a va r i e ty of d issolution
methods being employed), ICP-AES, A AS, EPMA (for
N I ST SRM 610 was also analy sed for its matrix some elements in NIST SRM 610 ) and INA A. The
composition by electron probe at Memorial University. a nal y ti ca l m et hod s use d i n e ach lab ora tory a re
The elect ron micro p robe used was a Cameca SX 5 0 . d e s c r i b e d b e l ow . E PM A c o n d i t i o n s h a v e be e n
A n a l yses we re perfor med using energy dispersive described in the previous section.
detection for the major constituents (Na, Al, Si, Ca) plus
K and Mg and wavelength dispersive detection for the Solution ICP-MS and AAS analyses, Aberystwyth:
other minor constituents (Ti, Mn, Fe, V). A ZAF corre ct i o n Discs of both NIST SRM 610 and NIST SRM 612 were
procedure was employed. Calibration standards were broken into small fragments. Four 0.3 g (approximately)
Table 1.
Compilation of new and published analyses for the matrix of NIST SRM 610. Analyses in % m/m oxide. The
ove rall ave rage exc ludes the low Na 2O data from Memorial EPMA. The “matrix scaled” column normalizes
the SiO 2, Al 2O 3, Na 2O and CaO content to 10 0 %
N I ST, To ronto EPMA , Memorial EPMA , (A) O ve ra l l O ve ra l l N I ST

nominal this study, this study, ave rag e ave rag e ave rag e , n o m i n a l
matrix ave rag e ave rag e scaled matrix
(n=20) ( n = 19 )
SiO2 72 69.895 ± 0.214 70.400 ± 0.400 69.63 ± 0.27 69.975 ± 0.391 72.276 72 SiO2
TiO2 0.070 ± 0.025 0.076 ± 0.012 0.08 ± 0.01 0.075 ± 0.005 TiO 2
Al2O3 2 1.936 ± 0.027 1.960 ± 0.090 2.22 ± 0.01 2.039 ± 0.157 2.106 2 Al 2O3
FeO 0.059 ± 0.023 0.039 ± 0.024 0.07 ± 0.02 0.056 ± 0.016 FeO
MnO 0.053 ± 0.025 0.060 ± 0.031 0.05 ± 0.03 0.054 ± 0.005 MnO
MgO 0.067 ± 0.012 0.057 ± 0.006 0.07 ± 0.01 0.065 ± 0.007 MgO
CaO 12 11.370 ± 0.083 11.270 ± 0.140 11.71 ± 0.03 11.450 ± 0.231 11.827 12 CaO
Na2O 14 13.833 ± 0.090 8.200 ± 0.300 12.87 ± 0.08 13.352 ± 0.681 13.791 14 Na 2O
K2O 0.061 ± 0.019 0.057 ± 0.026 0.06 ± 0.01 0.059 ± 0.002 K 2O
Cl 0.047 ± 0.016 0.047 ± 0.000 Cl
P2O5 0.12 ± 0.02 0.120 ± 0.000 P 2O5
Total 100 97.389 92.119 96.88 ± 0.13 97.292 100.000 100 Total
± one standard dev i a t i o n .
(A) Hollocher and Ruiz (19 9 5 ) .
1 1 7
Table 2.
Compilation of new and published analyses for the matrix of NIST SRM 612. Analyses in % m/m oxide. The
“matrix scaled” column normalizes the SiO 2 , Al2 O 3, Na2 O and CaO content to 10 0 %
To ronto EPMA (A) (B) (C) (D) (E) (E) O ve ra l l O ve ra l l N I ST

this study, ave rag e ave rag e ave rag e act i va t i o n s u p e r p ro b e ave rag e ave rag e , n o m i n a l
ave rag e ( n = 10 ) a n a l ys i s 73 3 scaled matrix
(n=20)
SiO2 72.29±0.22 71.5 72.17±0.35 72.90±1.40 70.65 71.90±0.96 71.79 72

TiO2 0.02±0.02 0.01±0.01 0.01±0.00
A l 2O 3 2.01±0.04 2.15 2.32±0.01 2.10±0.04 1.96 2.11±0.16 2.10 2
FeO 0.01±0.02 0.027 0.02±0.01 0.02±0.00
MnO 0.01±0.02 0.01±0.02 0.01±0.00
MgO 0.00±0.00 0.00
CaO 11.77±0.11 11.4 12.09±0.50 12.10±0.20 12.30±1.00 11.93±0.22 11.91 12
N a 2O 14.18±0.10 13 13.16±0.07 14.20±0.20 14.40±0.80 13.98±0.56 13.96 14
K 2O 0.01±0.01 0.02 0.01±0.01 0.01±0.00
Cl 0.02±0.02 0.02
P 2O 5 0.01±0.01 0.01
Total 100.319 98.117 99.8 100.009 100.000 100
(A) Jac kson et al. ( 1992), (B) Hollocher and Ruiz (1995), (C) Kanda et al. ( 1980), (D) Ku l eff et al. 1984, (E) Pe n ev et al. 19 8 5 .
splits from each glass we re weighed ac c u rately into elements in the original glass (see Tables 3 and 4).
50 ml PTFE beakers and taken into solution using a R e l a t i ve standard deviations (RSDs) we re genera l l y
repeated open, hot HF/HClO 4 a t t ack. After a final small ac ross the separate determinations, giving a
eva p o ration of 2 ml HClO 4, samples we re tre a t e d good indication of the re p ro d u c i b i l i ty of ICP-MS for this
with 5 ml of HNO 3 and made up to 100 ml solution type of analysis (typically, RSD < 3% for Z > 30). For low
in 10% m/m HNO3 . All acids used we re AristaR® o r Z elements, RSDs we re gre a t e r, a result of the lowe r
P r i m a r ® G rade. Two blanks we re also treated with sensitivity of ICP-MS at low Z.
the same volumes of acid and subtracted from the
final analyses. Cu and Zn in NIST SRM 612 and NIST SRM 610
we r e als o de te rmin e d a t Ab er y st wyt h by a to mi c
Fully quantitative analyses we re performed using a absorption, whilst the concentrations of K in NIST SRM
VG Elemental ICP-MS PlasmaQuad II+ with modified 612 and Li and K in NIST SRM 610 were determined
( 1992 ) h igh sens itivi ty interf ace. Ca libra ti on wa s by flame emission using a Perkin-Elmer 2380 spectro-
a c h i eved u sing multi-element syn the tic standard s p h o t o m e t e r. Calibration was performed using mixe d
m ade from Aldrich 1 mg ml - 1 Ato mic Abs orption element standards.
single element solutions. With the exception of the REE,
c a l i b ration samples contained ten to fifteen elem e n t s Th e o ve ral l re p ro d u c i b i l i t y o f re su lt s f or mo st
held in dilute acid at concentrations appropriate to elements (excluding Nb, Ta, Zr and Hf) from the four
the abundance of trace elements in natural ro c ks. The s e p a ra t e d e te r m i n a t i o n s i s i n di c a t i v e o f a
REE calibration sample used in this study was made to homogeneous glass at the 0.3 g scale of sampling.
h ave equal concentrations of all REE, ref l e cting the
ex p e cted concentration in the NIST glasses, and to Solution ICP-MS analyses, Notre Dame: A VG
minimise any eff e ct from poly-atomic oxide spect ra l Instruments PlasmaQuad II+ STE ICP-MS was used to
overlap during analys i s . a n a l yse a sample of NIST SRM 610 and NIST SRM
612. The sample (20 mg) was digested in 40 drops of
Each of the four separate digestions for each glass H F a n d 2 5 dr op s of c on c e n tr a t ed H N O 3 ( b o t h
w as analysed five times. These we re corre cted for p re p a red by double distillation) left on a hotplate in
sample weight and instrument drift, and the means of PT FE o ver ni gh t and s ub se que nt l y e v a p o rat ed t o
the five runs for each digestion were then averaged to dryness. After cooling, a further 15 drops of HNO 3
give the concentration (with standard deviation) of fifty we re added prior to a final eva p o ration to dryness.
1 1 8
Table 3.
N ew analytical data (µg g - 1) from this study for NIST SRM 610
I C P-M S AAS E PMA I C P-M S I C P-M S I C P-A E S I C P-MS sinter, E PMA I N AA

A b e r ys t w y t h A b e r ys t w y t h To ro n t o N o t re Dame Me m o r i a l Me m o r i a l Me m o r i a l Me m o r i a l To ro n t o
Ag 212.3 ± 3.2 Ag
As 303 ± 3 As
Au 15.6 ± 4.1 22.6 ± 0.3 Au
B B
Ba 411.2 ± 3.2 473.33 ± 4.33 448 ± 6 424 ± 14 382 ± 12 Ba
Be 481.4 ± 12.9 540.67 ± 7.9 452 ± 12 421 ± 13 Be
Bi 379.1 ± 7.7 113.7 ± 2.31 387 ± 10 Bi
Cd 264.7 ± 1.3 Cd
Ce 430.3 ± 2.0 452.1 ± 1.77 462 ± 6 450 ± 15 428 ± 7 463 ± 10 Ce
Cl 470 ± 160 Cl
Co 422.2 ± 9.1 436.17 ± 9.46 418 ± 18 444 ± 2 Co
Cr 381.1 ± 15.6 461.77 ± 11.7 406 ± 18 343 ± 6 Cr
Cs 320.3 ± 4.0 458.33 ± 5.3 369 ± 7 395 ± 1 Cs
Cu 350.2 ± 12.0 420 ± 5.6 462.7 ± 2.26 460 ± 12 431 ± 15 Cu
Dy 439.0 ± 1.6 409.6 ± 6.86 448 ± 24 429 ± 9 Dy
Er 439.2 ± 2.2 404.07 ± 8.67 463 ± 24 436 ± 10 Er
Eu 442.7 ± 3.1 433.27 ± 3.02 460 ± 16 439 ± 12 458 ± 1 Eu
Fe 461.0 ± 34.4 455 ± 177 517 ± 19 299 ± 187 Fe
Ga 436.5 ± 15.6 501.3 ± 6.98 395 ± 13 Ga
Gd 425.2 ± 2.5 430.53 ± 3.64 433 ± 28 447.5 ± 11.5 Gd
Ge 391.3 ± 9.9 Ge
Hf 312.7 ± 20.4 405 ± 7.35 440 ± 19 416 ± 9 406 ± 3 Hf
Ho 460.3 ± 3.1 439.1 ± 8.15 460 ± 25 439 ± 11 Ho
In 461.2 ± 18.5 In
K 456.2 ± 4.98 503 ± 157 442 ± 6 472 ± 222 K
La 432.5 ± 1.4 443.87 ± 0.52 438 ± 4 453 ± 11 421 ± 6 452 ± 3 La
Li 536.3 ± 12.5 495.7 ± 4.1 457.2 ± 6.92 453 ± 17 Li
Lu 439.7 ± 2.5 440.57 ± 6.94 440 ± 19 416 ± 7 469 ± 0.5 Lu
Mg 488.0 ± 12.4 511 ± 92 421 ± 13 436 ± 48 Mg
Mn 440.8 ± 7.4 409 ± 193 392 ± 20 464 ± 242 Mn
Mo 407.5 ± 3.1 276 ± 10 398 ± 3 319 ± 11 Mo
Nb 248.5 ± 81.3 432.17 ± 12.4 225 ± 45 305 ± 219 Nb
Nd 426.1 ± 1.5 435.17 ± 3.06 435 ± 5 424 ± 10 Nd
Ni 445.7 ± 15.4 495.47 ± 5.29 341 ± 15 Ni
P 304.9 ± 54.0 380 ± 9 P
Pb 389.0 ± 7.0 301.4 ± 2.94 419 ± 1.2 381 ± 11 Pb
Pr 462.9 ± 2.9 422.8 ± 2.67 460 ± 9 441 ± 10 Pr
Rb 423.8 ± 6.6 501.97 ± 0.71 450 ± 6 400 ± 30 Rb
Re Re
Sb 340.4 ± 18.6 Sb
Sc 445.4 ± 14.1 449.07 ± 13.8 444 ± 20 486 ± 13 442 ± 1 Sc
Se Se
Sm 449.4 ± 2.0 449.33 ± 4.81 458 ± 18 433 ± 12 475 ± 0.5 Sm
Sn 309.4 ± 43.6 Sn
Sr 491.9 ± 14.7 514.93 ± 4.93 512 ± 9 459 ± 17 Sr
Ta 293.1 ± 120.0 340.13 ± 7.13 134 ± 23 304 ± 22 525 ± 1 Ta
Tb 454.8 ± 3.2 461.77 ± 5.78 457 ± 24 414 ± 12 455 ± 2 Tb
Th 527.6 ± 2.5 403.63 ± 2.22 454 ± 14 472 ± 20 396 ± 6 458 ± 2 Th
Ti 437.3 ± 20.2 421 ± 150 524.43 ± 4.56 442 ± 9 458 ± 74 Ti
Tl 61.2 ± 2.1 60.5 ± 0.8 Tl
Tm 422.6 ± 2.3 407.9 ± 8.11 454 ± 20 426 ± 10 Tm
U 513.3 ± 0.9 432.27 ± 5.6 464 ± 15 U
V 448.6 ± 18.5 369 ± 7.84 434 ± 17 435 ± 17 372 ± 141 V
W W
Y 469.6 ± 8.8 531.47 ± 2.75 438 ± 2 480 ± 11 423.9 ± 2.3 Y
Yb 450.6 ± 2.1 435.83 ± 8.49 459 ± 22 434 ± 10 496 ± 2 Yb
Zn 411.3 ± 8.2 413 ± 3.1 494.27 ± 4.88 477 ± 10 398 ± 11 Zn
Zr 381.3 ± 14.6 482.37 ± 5.48 449 ± 4 435 ± 9 431.7 ± 1.3 Zr
1 1 9
Table 4.
N ew analytical data (µg g - 1 ) from this study for NIST SRM 612
I C P-M S AAS I C P-M S I C P-M S I C P-A E S I C P-MS sinter, I C P-MS, Rb and Sr I N AA

A b e r ys t w y t h A b e r ys t w y t h N o t re Dame Me m o r i a l Me m o r i a l Me m o r i a l intl. std., BGS To ro n t o
Ag 18.91 ± 0.78 22.57 ± 0.38 21.11 ± 1.54 Ag

As 48.14 ± 1.6 31 ± 1 As
Au 4.05 ± 0.81 5.1 ± 0.1 Au
B B
Ba 33.6 ± 2.67 38.05 ± 0.73 38 ± 1 32.87 ± 0.11 37.2 ± 0.5 Ba
Be 39.84 ± 1.68 34.3 ± 0.8 37.60 ± 3.96 Be
Bi 31.45 ± 0.12 Bi
Cd 27.63 ± 1.09 28.92 ± 1.76 Cd
Ce 33.89 ± 0.17 38.1 ± 0.9 37.9 ± 0.5 37.82 ± 1.98 Ce
Co 39.81 ± 2.27 34.9 ± 0.6 37.82 ± 4.40 37.3 ± 0.1 Co
Cr 37.94 ± 1.56 38.64 ± 0.91 30.1 ± 0.5 19.24 ± 3.41 Cr
Cs 35.08 ± 0.64 40.51 ± 1.13 42.8 ± 0.3 Cs
Cu 30.76 ± 1.63 37.33 ± 1.77 37.8 ± 1.1 52.01 ± 6.82 Cu
Dy 35.02 ± 0.21 34.99 ± .0.82 31.1 ± 0.5 35.7 ± 0.5 36.72 ± 0.77 Dy
Er 35.05 ± 0.25 38.15 ± 0.6 37.7 ± 0.4 38.37 ± 1.21 Er
Eu 32.68 ± 0.23 33.14 ± 0.46 35.03 ± 0.2 35.95 ± 1.21 35.6 ± 0.1 Eu
Fe 115 ± 10 Fe
Ga 36.74 ± 1.57 36.88 ± 1.08 33.5 ± 1.7 38.04 ± 2.97 Ga
Gd 36.03 ± 0.23 36.31 ± 0.99 37.82 ± 1.12 38.26 ± 1.65 Gd
Ge 32.77 ± 0.61 Ge
Hf 26.43 ± 0.98 36.99 ± 0.67 35.9 ± 0.6 35 ± 0.1 Hf
Ho 38.9 ± 0.31 38.7 ± 0.19 37.3 ± 0.5 38.59 ± 1.21 Ho
In 37.21 ± 0.63 18.44 ± 0.22 43.43 ± 1.87 In
K 66.52 ± 2.01 K
La 33.45 ± 0.35 34.02 ± 0.64 36.9 ± 0.6 34.3 ± 0.7 34.63 ± 2.09 34.3 ± 0.2 La
Li 40.27 ± 1.95 40.24 ± 1.21 41.67 ± 1.76 Li
Lu 39.5 ± 0.25 36.51 ± 0.5 35.19 ± 0.1 36.72 ± 0.99 40 ± 0.1 Lu
Mg 85.09 ± 4.37 75.21 ± 14.51 Mg
Mn 37.37 ± 1.19 36.8 ± 1.7 39.03 ± 6.16 Mn
Mo 38.61 ± 1.24 39.68 ± 0.92 34 ± 3 Mo
Nb 37.18 ± 0.39 Nb
Nd 33.52 ± 0.48 34.73 ± 0.52 35.2 ± 0.3 36.17 ± 1.21 Nd
Ni 42.32 ± 1.53 29.2 ± 0.5 43.43 ± 5.61 Ni
P 71.21 ± 21.7 39.1 ± 0.6 P
Pb 36.96 ± 7.98 41.67 ± 4.40 Pb
Pr 35.9 ± 0.2 37.01 ± 0.73 37.62 ± 0.19 37.82 ± 1.43 Pr
Rb 31.02 ± 0.14 31.29 ± 0.69 33 ± 5 Rb
Re 10.43 ± 0.67 Re
S S
Sb 32.27 ± 0.91 38.91 ± 0.4 Sb
Sc 37.88 ± 0.47 48 ± 13 40.8 ± 0.7 Sc
Sm 35.62 ± 0.18 37.01 ± 0.49 36.4 ± 0.4 37.49 ± 1.32 38.5 ± 0.1 Sm
Sn 36.21 ± 1.83 38.81 ± 2.20 Sn
Sr 73.56 ± 1.26 72.96 ± 0.46 73.9 ± 0.5 Sr
Ta 40.51 ± 0.65 42 ± 0.5 Ta
Tb 38.46 ± 0.24 34 ± 0.81 35.44 ± 0 37.16 ± 1.21 38.3 ± 0.1 Tb
Th 37.08 ± 0.33 36.6 ± 0.62 36.83 ± 1.76 38.1 ± 0.3 Th
Ti 51.35 ± 6.65 45.7 ± 1.8 38.2 ± 0.2 Ti
Tl 14.69 ± 0.26 15.02 ± 0.51 15.28 ± 0.66 Tl
Tm 39.15 ± 0.29 37.29 ± 0.63 36.2 ± 0.4 36.72 ± 1.43 Tm
U 35.39 ± 0.22 37.38 ± 1.43 35 ± 0.5 U
V 41.44 ± 6.49 36.16 ± 0.57 36.6 ± 0.5 46.29 ± 7.59 V
W 26.5 W
Y 38.96 ± 0.77 31.45 ± 0.73 40.4 ± 0.5 35.2 ± 0.5 41.67 ± 3.08 Y
Yb 37.43 ± 0.38 37.5 ± 0.98 37.1 ± 0.3 40.02 ± 0.99 42.4 ± 0.5 Yb
Zn 38.81 ± 3.2 35.48 ± 2.36 39.83 ± 1.05 35 ± 0.8 44.31 ± 4.18 Zn
Zr 34.84 ± 1.31 35.23 ± 0.03 37.4 ± 0.3 33.81 ± 0.04 Zr
± one standard deviation.
1 2 0
The residue was taken up in 10 ml of 2% v/v HNO3 flux of only 2.5 x 1011 neutrons cm -2 s -1. Counting of
before analysis. Internal standards of Hg, Sn and Cd the ra d i o act i ve species generated was perf o r m e d
we re added to the solutions for calibration during using a 20% efficient coaxial intrinsic Ge detector at
a n a l y sis . Cal i br at io n w a s ag a in st m u lt i- el e me n t 7, 10, 12, 17 and 38 days. Corrections for fission pro-
standards (ranging in concentration from 1-100 ng g-1 d u cts and for spect ral interf e rences we re perf o r m e d .
in solution t o ensure bra c keting of the unknow n ) The technique is fully described in Stix and Gort o n
p re p a red by SPEX Industries, New Jer sey, USA. A (1992). Of elements normally reported by this method,
procedural blank was subtracted. the abnormal concentrations of many trace elements
gave rise to certain problems with the analysis of these
S o lu ti o n IC P- M S a na ly s es , M e m or i a l : Tw o glasses. Chromium suffers from a Lu interf e rence, U
d i ge s t io n a n d c o r r es p o n d i n g d a ta a c q u i s i t i o n p roduces fission pro d u cts which have serious con-
p rotocols we re employed for routine ICP-MS analys i s sequences for Mo, Ba and La, and Ba suffers also from
at Mem or ial . Th ese w e re a n a ci d d i ge stio n and a Tb interference.
Na2O 2 sinter digestion procedure and are described
fully by Jenne r et al. ( 1990) a nd Longerich et al. A comment on Nb, Ta, Zr and Hf: Nb and Ta
( 1990) re s p e ct i ve l y. Calibration standards for ICP-M S g i ve ex t remely high RSDs in data from Aberys t w y t h
a n a l y se s we r e s y n t he t i c m ul t i- e l em e nt s ol u ti o ns and Memorial, due to an inability to retain these
p re p a red from high purity re agents (“Plasma Gra d e ” elements in solution in t he absence of F - ions (c f.
re a g en t s , SPE X I nd u stri e s, Me tu che n , N. J ., USA ) . Aldrich atomic absorption standards for these elements
Analytical methods are also described by Jac kson e t being supplied in dilute HF ) or the addition of a
al. (1992). The ICP-MS used was a Sciex (now Perkin complexing agent (Ingamells and Pitard 1986). In NIST
E l m e r- S c i ex) ELAN model 250. The A A used was a SRM 610 the highest concentration of Nb recorded in
Perkin Elmer 2380. Aberystwyth was 327.3 µg g-1 , and Ta 403.8 µg g-1; in
NIST SRM 612 the highest Nb concentration was 23.3
Solution ICP-MS analyses, BGS: A disc of NIST µg g-1 and Ta 16.4 µg g-1 . These data are re p o rt e d ,
SRM 613 (equivalent to NIST SRM 612) was bro ke n therefore, as our minimum values for these elements in
into small pieces and fragments placed in an ag a t e the NIST glasses, but no other significance is plac e d
m i c ro-mill. The micro-mill was mechanically shake n upon these values. High RSDs in the Memorial data
until the glass had been reduced to a fine powd e r. (305 ± 209 µg g -1 for Nb and 304 ± 22 µg g-1 for
Two aliquots of 0.1g of glass were weighed into PTFE Ta i n N I ST SRM 610 ) al so i ndi cat e l os s of these
test tubes to which 1 ml HF, 0.8 ml HNO3 and 0.4 ml elements from solution. In the case of NIST SRM 612,
HClO4 were added. This was heated overnight to dry- the Memorial data (from Jackson 1992) of 38.9 µg g-1
ness, and then re d i s s o l ved in 10 ml of 25% HNO3, for Nb and 39.3 µg g-1 for Ta are the average of the
b ef o re being made up to 100 ml in a plastic volumetric t w o (a lmos t i den tica l) maxi mum va lues fro m t he
f la s k . A l l a ci ds u s e d w e r e o f A r i s ta R ® g ra d e . analyses performed.
Immediately prior to analysis each solution was further
diluted by a factor of two. Duplicate analyses we re Jenner et al. (1990) and Fedorowich et al. (1993,
p e rformed on both solutions using a VG Instruments see below), who both employ the same digestion
PlasmaQuad II+ ICP-MS. Calibration was ac h i eve d methods, are unlikely to re m ove all the F- ions fro m
using SPEX multi-element standards 1 and 2 at 10 0 their samples due to the relatively low boiling point of
ng g-1 in 1% HNO3 . No internal standard was added H N O 3 (Johnson and Ma x well 19 81). This pro b a b l y
due to the presence of so many elements in the solu- explains their ability to retain Nb and Ta in solution,
tions, and results we re finally normalised to the NIST but has implications for the longevity of any instrumental
certified concentrations of Rb and Sr to produce quan- glassware (Thompson and Walsh 1983). Similarly, the
titative data. ICP-MS data from Notre Dame in this study, which also
used an HF/HNO3 digestion, would retain Nb and Ta
I N A A, To ro n t o : Instrumental neutron act i va t i o n in solut ion. All solution methods for Ta re p o r t low
analyses (INAA) were performed on the NIST SRM 612 c o n c e n t rations when compared to solid sa mp ling
an d 610 gl as s es at t he Depart men t of Ge ol og y, methods, due to loss from solution of Ta.
U n i ve r s i ty of Toronto. Approximately 0.25 g of sample
was weighed and sealed into plastic sachets prior to In addition, the Aberystwyth solution Hf data are
irradiation in a SLOWPOKEII reactor with a low neutron l ow compared to other re p o rted values. This may be
1 2 1
the result of hydrolysis and precipitation of Hf during i n cl ude s da ta f ro m th i r ty n ine p u bl i ca ti o ns. The
storage of solutions prior to analysis. a b b reviations used to identify contributing techniques
a re listed in Table 5. New and published data are
LA-ICP-MS for Nb, Ta, Zr and Hf, Aberystwyth: Due presented for NIST SRM 612 in Table 7, which includes
to problems retaining Nb and Ta in solution, a laser ab- a n a l yses from forty nine publications. Both tables are
lation ICP-MS technique was used to determine the a r ranged element by element in increasing order of
c o n c e n t rations of these elements in the NIST glasses. re p o rted concentration and giving an indication of
Silicate glasses with a composition similar to the NIST metho d. NIST c ertif ies on ly ei ght elements in t he
glasses have recently been produced by P and H glasses SRM 610 and SRM 612, and these data are
D evelopments of Glossop, Derbys h i re, U.K and are included in Tables 6 and 7, and presented separately
described by Hamilton and Hopkins (1995). These glasses in Tabl es 8 a nd 9 r e s p e ct i ve l y, a lo ng wi th NI ST
have been prepared at 0, 75 and 150 µg g-1 for forty four information values for some other elements. Many of
trace elements (including Zr, Nb and Ta, but unfortunately t he e l e m e n t s a d d e d t o t h e s e g la s s e s h a v e no
not Hf) and these glasses, with a blank, were used to c o n c e n t rat ion information ot her than the nominal
e re ct calibrations for LA- I C P-MS analysis of the NIST c o n c e n t ration (50 or 500 µg g -1). Of the published
glasses. The analytical methodology is described fully by da ta, t h ree mai n so ur ce s o f i nf or ma ti o n ca n b e
Perkins and Pearce (1995), although a UV laser operating identified: (i) large studies of a wide range of elements
at 266 nm was used in place of an IR laser operating at by techniques with multi-element capabilities; (ii) studies
1064 nm. No cer tificat ion exists for the P a nd H of one or two elements requiring or testing novel or non-
Developments glasses, and thus the laser ablation data Text continues on page 13 6
produced for Zr, Nb and Ta in NIST SRM 612 by this
method must be regarded with some caution. NIST SRM Table 5.
610, with concentrations of these elements some 3 times Analytical method abbreviations used
higher than the 150 µg g-1 standard, was not analysed by in the trace element compilation tables (Tables 6 and 7)
this method. The results for NIST SRM 612 give Zr 36.82 ± Code Me t h o d
1.50 µg g-1, Nb 45.44 ± 1.58 µg g-1 and Ta 48.39 ± 0.87 AAS Atomic absorption spectroscopy
µg g-1. These data are not included in the compilation tables. CPAA Charged particle activation analysis
DNAA Delayed neutron activation analysis
Summary of published data for EPMA E l e ct ron probe micro a n a l ys i s
NIST SRM 610 and NIST SRM 612 GDMS Glow discharge mass spect ro m e t r y
GFAAS Graphite furnace atomic absorption spectroscopy
Matrix composition HeAA Helium activation analysis
HIAA Heavy ion activation analysis
NIST give nominal compositions of both the NIST SRM ICP-AES Inductively coupled plasma atomic emission spectroscopy
610 and NIST SRM 612 glass matrices as 72% SiO2, 12% ICP-MS I n d u ct i vely coupled plasma mass spect ro m e t r y
CaO, 14% Na2O, and 2% Al2O3. ID-SSMS Isotope dilution spark source mass spect ro m e t r y
IDMS Isotope dilution mass spectrometry
Jackson et al. (1992) and Hollocher and Ruiz (1995) INAA Instrumental neutron activation analysis
have produced the only complete information relating to IPAA Instrumental photon activation analysis
the matrix composition of either NIST glass ref e re n c e LA-ICP-MS Laser ablation ICP-MS
material that the present authors have been able to find. LA-SSMS Laser ablation spark source mass spect ro m e t r y
Jackson et al. (1992) used a closed bomb (HF/H3BO3 ) LP-MS Laser probe mass spect ro m e t r y
digestion of a 0.1 g aliquot of a powdered glass bead MS Mass spect ro m e t r y, unspecified
prior to analysis by atomic absorption. These data are NAA Neutron activation analysis
summarized in Table 1 and Table 2. Other authors (Kanda NMP Nuclear micro p ro b e
et al. 1980, Kuleff et al. 1984 and Penev et al. 1985) NTM Nuclear track methods
present several partial analyses of NIST SRM 612. PIXE Proton induced X-ray emission
POL Po l a ro g ra p h y
Trace elements RAD R a d i o g ra p h y
SIMS Secondary ion mass spect ro m e t r y
A compilation of all published and new trace element SXRF Synchotron X-ray fluorescence
data for NIST SRM 610 is presented in Table 6, which TCGS Thermal neutron capture gamma ray spectrometry
1 2 2
Table 6.
Compilation of published and new concentration data (µg g - 1 ) for NIST SRM 610. s = standard dev i -
ation. T.S. indicates data from this study, NIST data from the NIST certificate. Those publications marke d
* are not included in calculations of ave rages, range and median
E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

Ag Be
Sheibley 1975 INAA 180 80 ICP-AES, Memorial (T.S.) ICP-AES 421 13
ICP-MS, Aberystwyth (T.S.) ICP-MS 212.3 3.2 Lass et al. 1982 HIAA 450 50
Rogers et al. 1987 NMP 229 13 Colin et al. 1987 HIA A 450 50
Bingham and Slater 1976 LPMS 231 Hollocher and Ruiz 1995 ICP-MS 451 13
McGinley and Schwe i ke rt 1976 CPAA 246 7 ICP-MS, Memorial (T.S.) ICP-MS 452 12
NIST * NIST 254 10 Freidli et al. 1987 HIAA 480 60
Benjamin et al. 1988 NMP 257 16 ICP-MS, Aberystwyth (T.S.) ICP-MS 481.4 12.9
Bonham and Quattlebaum 1988 LA-SSMS 261 108
Friedli et al. 1988b HIA A 495 60
Rogers et al. 1987 NMP 267 26
ICP-MS, Notre Dame (T.S.) ICP-MS 540.67 7.9
Raith et al. 1994 * LA-ICP-MS 276.2 4.3
Bi
Milton and Hutton 1993* GDMS 585.3 31.9
As
Woolum et al. 1976 RAD 216
INAA, Toronto (T.S.) INAA 303 3
Carpenter and Pilione 1986 NTM 260 30
Bergholz et al. 1974 MS 305 20
Benjamin et al. 1988 NMP 316.5 9.9
McGinley and Schweikert 1976 CPAA 317 7
Benjamin et al. 1988 NMP 375 15
ICP-MS, Aberystwyth (T.S.) ICP-MS 379.1 7.7
Grey 1990 AAS 406 2 ICP-MS, Memorial (T.S.) ICP-MS 387 10
Au Bergholz et al. 1974 MS 405 18
ICP-MS, Aberystwyth (T.S.) ICP-MS 15.63 4.11 Hollocher and Ruiz 1995 ICP-MS 430 55
Bonham and Quattlebaum 1988 LA-SSMS 19 6.4 Raith et al. 1994 * LA-ICP-MS 495.8 8.72
Sheibley 1975 INAA 20 2 Cd
INAA, Toronto (T.S.) INAA 22.6 0.3 Bergholz et al. 1974 MS 187 21
Benjamin et al. 1988 NMP 23 6.8 Benjamin et al. 1988 NMP 255 19
NIST * NIST 25 Rogers et al. 1987 NMP 256 16
McGinley and Schwe i ke rt 1976 CPAA 28 6 Rogers et al. 1987 NMP 262 31
Rogers et al. 1987 NMP 31 9 ICP-MS, Aberystwyth (T.S.) ICP-MS 264.7 1.3
B McGinley and Schweikert 1976 CPAA 393 8
Bingham and Slater 1976 LPMS 141 Raith et al. 1994 * LA-ICP-MS 413.7 30.5
Raith et al. 1994 * LA-ICP-MS 342.4 12.7 Ce
Gladney et al. 1976 TCGS 348 20 McGinley and Schweikert 1976 CPAA 384 9
Owens et al. 1982 ICP-AES 348 13 ICP-MS sinter, Memorial (T.S.) ICP-MS 428 7
Rio et al. 1995 NMP 350 49 ICP-MS, Aberystwyth (T.S.) ICP-MS 430.3 2.0
NIST * NIST 351
Hollocher and Ruiz 1995 ICP-MS 431 13
L u ka s z ew 1990 SSMS 439
Gladney et al. 1976 TCGS 358 15
ICP-AES, Memorial (T.S.) ICP-AES 450 15
Freidli et al. 1988a HIAA 360 60
ICP-MS, Memorial (T.S.) ICP-MS 462 6
INA A, Toronto (T.S.) INAA 463 10
Zachmann 1985 ICP-AES 368 12
Ba
Raith et al. 1994 * LA-ICP-MS 486.6 24
ICP-MS sinter, Memorial (T.S.) ICP-MS 382 12
Michael 1988 EPMA 526
Hollocher and Ruiz 1995 ICP-MS 420 26 Cl
ICP-AES, Memorial (T.S.) ICP-AES 424 14 Webster 1992 EPMA 470 100
ICP-MS, Memorial (T.S.) ICP-MS 448 6 EPMA, Toronto (T.S.) EPMA 470 160
ICP-MS, Notre Dame (T.S.) ICP-MS 473.33 4.33 Co
Raith et al. 1994 * LA-ICP-MS 507.9 22 Sheibley 1975 INAA 135 14
Rogers et al. 1987 NMP 957 93 Bingham and Slater 1976 LPMS 253 25.7
Benjamin et al. 1988 NMP 1160 130 Bonham and Quattlebaum 1988 LA-SSMS 369 87
1 2 3
Table 6 (continued).
Compilation of published and new concentration data (µg g - 1) for NIST SRM 610. s = standard dev i -

C o (c ont. ) Dy
Milton and Hutton 1993* GDMS 370.6 Lukaszew 1990 SSMS 343
Bergholz et al. 1974 MS 375 12 Rogers et al. 1987 NMP 407 24
Raith et al. 1994 * LA-ICP-MS 389.3 11.4 ICP-MS, Notre Dame (T.S.) ICP-MS 409.6 6.86
NIST * NIST 390 ICP-MS sinter, Memorial (T.S.) ICP-MS 429 9
Horn et al. 1994 LA-ICP-MS 391.1 11.1 ICP-MS, Aberystwyth (T.S.) ICP-MS 439.0 1.6
Heidel 1971 EPMA 391.4 22.9 ICP-MS, Memorial (T.S.) ICP-MS 448 24
Hollocher and Ruiz 1995 ICP-MS 394 2 Benjamin et al. 1988 NMP 466 26
Bendicho and de Loos Vollerbrecht 1990a GFAAS 399 11 Raith et al. 1994 * LA-ICP-MS 474.8 20.3
Rogers et al. 1987 NMP 407 12 Er
Benjamin et al. 1988 NMP 413 16 Lukaszew 1990 SSMS 360
ICP-AES, Memorial (T.S.) ICP-AES 418 18 ICP-MS, Notre Dame (T.S.) ICP-MS 404.07 8.67
ICP-MS, Aberystwyth (T.S.) ICP-MS 422.2 9.1 McGinley and Schweikert 1976 CPAA 407 7
ICP-MS, Notre Dame (T.S.) ICP-MS 436.17 9.46 Hollocher and Ruiz 1995 ICP-MS 407 16
INAA, Toronto (T.S.) INAA 444 2 ICP-MS sinter, Memorial (T.S.) ICP-MS 436 10
Cr ICP-MS, Aberystwyth (T.S.) ICP-MS 439.2 2.2
ICP-AES, Memorial (T.S.) ICP-AES 343 6 ICP-MS, Memorial (T.S.) ICP-MS 463 24
Bergholz et al. 1974 MS 371 15 Raith et al. 1994 * LA-ICP-MS 515.7 33.7
ICP-MS, Aberystwyth (T.S.) ICP-MS 381.1 15.6 Benjamin et al. 1988 NMP 519 29
Raith et al. 1994 * LA-ICP-MS 385.7 12.5 Rogers et al. 1987 NMP 526 35
Hollocher and Ruiz 1995 ICP-MS 394 9 Eu
ICP-MS, Memorial (T.S.) ICP-MS 406 18 Lukaszew 1990 SSMS 357
Heidel 1971 EPMA 417.5 60.6 Hollocher and Ruiz 1995 ICP-MS 420 11
ICP-MS, Notre Dame (T.S.) ICP-MS 461.77 11.68 ICP-MS, Notre Dame (T.S.) ICP-MS 433.27 3.02
Rogers et al. 1987 NMP 476 11 ICP-MS sinter, Memorial (T.S.) ICP-MS 439 12
Cs INAA, Toronto (T.S.) INAA 458 1
Bergholz et al. 1974 MS 259 21 ICP-MS, Memorial (T.S.) ICP-MS 460 16
ICP-MS, Aberystwyth (T.S.) ICP-MS 320.3 4 Raith et al. 1994 * LA-ICP-MS 466.2 17.1
ICP-MS, Memorial (T.S.) ICP-MS 369 7 Rogers et al. 1987 NMP 731 46
INAA, Toronto (T.S.) INAA 395 1 Fe
ICP-MS, Notre Dame (T.S.) ICP-MS 458.33 5.3 Milton and Hutton 1993* GDMS 216.5 4.7
Benjamin et al. 1988 NMP 840 150 Bingham and Slater 1976 LPMS 260
Cu EPMA, Memorial (T.S.) EPMA 299 187
Bingham and Slater 1976 LPMS 343 Bonham and Quattlebaum 1988 LA-SSMS 432 65
ICP-MS, Aberystwyth (T.S.) ICP-MS 350.2 12 Bendicho and de Loos Vollerbrecht 1990a GFAAS 433 22
Heidel 1971 EPMA 385 95 McGinley and Schweikert 1976 CPAA 440 23
Rogers et al. 1987 NMP 413 25 Raith et al. 1994 * LA-ICP-MS 446.6 58.5
Hollocher and Ruiz 1995 ICP-MS 417 2 EPMA, Toronto (T.S.) EPMA 455 155
AAS, Aberystwyth (T.S.) AAS 420 5.6 NIST * NIST 458 9
Bendicho and de Loos Vollerbrecht 1990a GFAAS 428 6 Maienthal 1973 POL 460 10
ICP-AES, Memorial (T.S.) ICP-AES 431 15 ICP-MS, Aberystwyth (T.S.) ICP-MS 461 34.4
Benjamin et al. 1988 NMP 436 14 Rogers et al. 1987 NMP 486 10
Raith et al. 1994 * LA-ICP-MS 441.1 20.8 Benjamin et al. 1988 NMP 490 18
NIST * NIST 444 4 ICP-AES, Memorial (T.S.) ICP-AES 517 19
Rogers et al. 1987 NMP 450 9 Ga
ICP-MS, Memorial (T.S.) ICP-MS 460 12 ICP-AES, Memorial (T.S.) ICP-AES 395 13
ICP-MS, Notre Dame (T.S.) ICP-MS 462.7 2.26 Raith et al. 1994 * LA-ICP-MS 419.6 20
Bonham and Quattlebaum 1988 LA-SSMS 486 60 McGinley and Schweikert 1976 CPAA 423 17
Milton and Hutton 1993* GDMS 641.7 23.1 Joyce and Schweikert 1984 PIXE 431
1 2 4
Compilation of published and new concentration data (µg g- 1 ) for NIST SRM 610. s = standard dev i -

Ga (con t. ) In (cont . )
Rogers et al. 1987 NMP 436 13 Hollocher and Ruiz 1995 ICP-MS 454 18
ICP-MS, Aberystwyth (T.S.) ICP-MS 436.5 15.6 ICP-MS, Aberystwyth (T.S.) ICP-MS 461.2 18.5
Horn et al. 1994 LA-ICP-MS 445.5 10.2 Raith et al. 1994 * LA-ICP-MS 490.2 15.1
Rogers et al. 1987 NMP 461 9 K
Bergholz et al. 1974 MS 481 10 Milton and Hutton 1993* GDMS 420.6
ICP-MS, Notre Dame (T.S.) ICP-MS 501.3 6.98 ICP-AES, Memorial (T.S.) ICP-AES 442 6
Gd AAS, Aberystwyth (T.S.) AAS 456.2 4.98
Lukaszew 1990 SSMS 331 NIST * NIST 461
McGinley and Schweikert 1976 CPAA 376 6 Raith et al. 1994 * LA -ICP-MS 468.9 26.4
Hollocher and Ruiz 1995 ICP-MS 407 17 EPMA, Memorial (T.S.) EPMA 472 222
ICP-MS, Aberystwyth (T.S.) ICP-MS 425.2 2.5 EPMA, Toronto (T.S.) EPMA 503 157
ICP-MS, Notre Dame (T.S.) ICP-MS 430.53 3.64 Bingham and Slater 1976 LPMS 557 53.8
ICP-MS, Memorial (T.S.) ICP-MS 433 28 Benjamin et al. 1988 NMP 1600 1100
ICP-MS sinter, Memorial (T.S.) ICP-MS 447.5 11.5 La
Raith et al. 1994 * LA-ICP-MS 477 10.1 L u ka s z ew 1990 SSMS 386
Rogers et al. 1987 NMP 529 21 Hollocher and Ruiz 1995 ICP-MS 396 16
Benjamin et al. 1988 NMP 556 26 ICP-MS sinter, Memorial (T.S.) ICP-MS 421 6
Ge ICP-MS, Aberystwyth (T.S.) ICP-MS 432.5 1.4
ICP-MS, Aberystwyth (T.S.) ICP-MS 391.3 9.9 ICP-MS, Memorial (T.S.) ICP-MS 438 4
Benjamin et al. 1988 NMP 417 12 ICP-MS, Notre Dame (T.S.) ICP-MS 443.87 0.52
Rogers et al. 1987 NMP 426 8 INAA, Toronto (T.S.) INAA 452 3
Rogers et al. 1987 NMP 436 11 ICP-AES, Memorial (T.S.) ICP-AES 453 11
Bergholz et al. 1974 MS 496 10 Michael 1988 EPMA 514
Hf Bergholz et al. 1974 MS 638 24
Hollocher and Ruiz 1995 ICP-MS 374 13 Rogers et al. 1987 NMP 794 60
ICP-MS, Notre Dame (T.S.) ICP-MS 405 7.35 Li
INAA, Toronto (T.S.) INA A 406 3 Lass et al. 1982 HIAA 354 27
ICP-MS sinter, Memorial (T.S.) ICP-MS 416 9 Freidli et al. 1987 HIAA 360 20
McGinley and Schwe i ke rt 1976 CPAA 420 17 Raith et al. 1994* LA-ICP-MS 370.9 14.3
ICP-MS, Memorial (T.S.) ICP-MS 440 19 ICP-MS, Memorial (T.S.) ICP-MS 453 17
Benjamin et al. 1988 NMP 463 20 ICP-MS, Notre Dame (T.S.) ICP-MS 457.2 6.92
Rogers et al. 1987 NMP 477 22 Friedli et al. 1988b HIAA 480 80
Rogers et al. 1987 NMP 477 55 AAS, Aberystwyth (T.S.) AAS 495.7 4.1
Ho Freidli et al. 1988a HIAA 500 50
Lukaszew 1990 SSMS 358 Rio et al. 1995 NMP 500 18
Hollocher and Ruiz 1995 ICP-MS 413 13 Rio et al. 1995 NMP 506 19
ICP-MS sinter, Memorial (T.S.) ICP-MS 439 11 ICP-MS, Aberystwyth (T.S.) ICP-MS 536.3 12.5
ICP-MS, Notre Dame (T.S.) ICP-MS 439.1 8.15 Lu
ICP-MS, Memorial (T.S.) ICP-MS 460 25 McGinley and Schweikert 1976 CPAA 332 60
ICP-MS, Aberystwyth (T.S.) ICP-MS 460.3 3.1 L u ka s z ew 1990 SSMS 389
Benjamin et al. 1988 NMP 485 24 Hollocher and Ruiz 1995 ICP-MS 390 10
Raith et al. 1994 * LA-ICP-MS 492.2 13.8 ICP-MS sinter, Memorial (T.S.) ICP-MS 416 7
Rogers et al. 1987 NMP 511 21 ICP-MS, Aberystwyth (T.S.) ICP-MS 439.7 2.5
In ICP-MS, Memorial (T.S.) ICP-MS 440 19
Bergholz et al. 1974 MS 319 11 ICP-MS, Notre Dame (T.S.) ICP-MS 440.57 6.94
McGinley and Schwe i ke rt 1976 CPAA 385 23 Rogers et al. 1987 NMP 452 67
Rogers et al. 1987 NMP 425 25 INAA, Toronto (T.S.) INAA 469 0.5
1 2 5
ation. T.S. indicates data from t his study, NIST data from the NIST certificate. Those publications marke d

Lu (cont. ) Nd
Rogers et al. 1987 NMP 476 17 Lukaszew 1990 SSMS 364
Benjamin et al. 1988 NMP 497 19 McGinley and Schwe i ke rt 1976 CPAA 384 7
Raith et al. 1994 * LA-ICP-MS 522.6 38.5 Hollocher and Ruiz 1995 ICP-MS 406 13
Mg
EPMA, Memorial (T.S.) EPMA 436 48
Michael 1988 EPMA 505
ICP-MS, Aberystwyth (T.S.) ICP-MS 488 12.4
EPMA, Toronto (T.S.) EPMA 511 92
Mn Ni
Bingham and Slater 1976 LPMS 216 Bingham and Slater 1976 LPMS 316
Bergholz et al. 1974 MS 391 7 ICP-AES, Memorial (T.S.) ICP-AES 341 15
ICP-AES, Memorial (T.S.) ICP-AES 392 20 Bendicho and de Loos Vollerbrecht 1990a GFAAS 410 22
EPMA, Toronto (T.S.) EPMA 409 193 Milton and Hutton 1993* GDMS 418.6 23.8
ICP-MS, Aberystwyth (T.S.) ICP-MS 440.8 7.4 Bergholz et al. 1974 MS 431 10
Bonham and Quattlebaum 1988 LA-SSMS 446 60 Rogers et al. 1987 NMP 435 10
Milton and Hutton 1993* GDMS 449.5 17.6 Benjamin et al. 1988 NMP 441 14
Benjamin et al. 1988 NMP 454 22 Bonham and Quattlebaum 1988 LA-SSMS 443 125
EPMA, Memorial (T.S.) EPMA 464 242
Maienthal 1973 POL 450 7
NIST * NIST 458.7 4
Bendicho and de Loos Vollerbrecht 1990a GFAAS 481 27
NIST * NIST 485 10
Heidel 1971 EPMA 603.8 200
Heidel 1971 EPMA 495 36.7
P
Mo
ICP-MS, Aberystwyth (T.S.) ICP-MS 304.9 54
ICP-MS, Notre Dame (T.S.) ICP-MS 276 10.01
McGinley and Schweikert 1976 CPAA 294 12 Pb
Bergholz et al. 1974 MS 307 19 ICP-MS, Notre Dame (T.S.) ICP-MS 301.4 2.94
ICP-AES, Memorial (T.S.) ICP-AES 319 11 ICP-AES, Memorial (T.S.) ICP-AES 381 11
Benjamin et al. 1988 NMP 381 14 ICP-MS, Aberystwyth (T.S.) ICP-MS 389 7
ICP-MS, Memorial (T.S.) ICP-MS 398 3 Bergholz et al. 1974 MS 392 11
ICP-MS, Aberystwyth (T.S.) ICP-MS 407.5 3.1 Rogers et al. 1987 NMP 405 13
Rogers et al. 1987 NMP 411 11 Rogers et al. 1987 NMP 406 16
Rogers et al. 1987 NMP 414 17 Bonham and Quattlebaum 1988 LA-SSMS 409 102
Hollocher and Ruiz 1995 ICP-MS 427 7 Grey 1990 AAS 411 16
ICP-MS, Memorial (T.S.) ICP-MS 419 1.2
Nb
Belshaw et al. 1994 SIMS 422 2
Barnes et al. 1973 IDMS 425.58 0.4
NIST * NIST 426 1
Broekman and Raaphorst 1983 IDMS 426 4
ICP-MS, Notre Dame (T.S.) ICP-MS 432.17 12.43 Broekman and Raaphorst 1983 IDMS 427 1
Rogers et al. 1987 NMP 441 11 Vargas et al. 1987 HeAA 429 41
Horn et al. 1994 LA-ICP-MS 456.3 12.3 McGinley and Schwe i ke rt 1976 CPAA 430 100
Rogers et al. 1987 NMP 458 16 Bingham and Slater 1976 LPMS 448
Raith et al. 1994 * LA-ICP-MS 474.6 18.7 Milton and Hutton 1993* GDMS 860.9 15.1
1 2 6

Pr Sm
Bergholz et al. 1974 MS 318 14 Hollocher and Ruiz 1995 ICP-MS 417 14
Lukaszew 1990 SSMS 392 ICP-MS sinter, Memorial (T.S.) ICP-MS 433 12
McGinley and Schweikert 1976 CPAA 400 6 ICP-MS, Notre Dame (T.S.) ICP-MS 449.33 4.81
ICP-MS, Notre Dame (T.S.) ICP-MS 422.8 2.67 ICP-MS, Aberystwyth (T.S.) ICP-MS 449.4 2.0
ICP-MS sinter, Memorial (T.S.) ICP-MS 441 10 ICP-MS, Memorial (T.S.) ICP-MS 458 18
ICP-MS, Memorial (T.S.) ICP-MS 460 9 L u ka s z ew 1990 SSMS 472
ICP-MS, Aberystwyth (T.S.) ICP-MS 462.9 2.9 INA A, Toronto (T.S.) INAA 475 0.5
Raith et al. 1994 * LA-ICP-MS 467.3 22.3 Raith et al. 1994 * LA-ICP-MS 527.2 23.7
Benjamin et al. 1988 NMP 505 64 Benjamin et al. 1988 NMP 610 33
Rb Sn
Milton and Hutton 1993* GDMS 318.2 35.4 ICP-MS, Aberystwyth (T.S.) ICP-MS 309.4 43.6
INAA, Toronto (T.S.) INAA 400 30 McGinley and Schwe i ke rt 1976 CPAA 376 7
NIST * NIST 425.7 0.8
Moore et al. 1973 IDMS 425.7 0.7
Sr
Bingham and Slater 1976 LPMS 430
Re
Horn et al. 1994 LA-ICP-MS 460.4 17.2
NIST * NIST 515.5 0.5
Sb
Moore et al. 1973 IDMS 515.5 0.3
Raith et al. 1994 * LA-ICP-MS 518 17.3
Ta
ICP-MS, Aberystwyth (T.S.) ICP-MS 293.1 120
Sc
Rogers et al. .1987 NMP 315 97
Hollocher and Ruiz 1995 ICP-MS 420 2 ICP-MS, Notre Dame (T.S.) ICP-MS 340.13 7.13
Raith et al. 1994 * LA-ICP-MS 423.4 18.6 Rogers et al. 1987 NMP 435 24
Benjamin et al. 1988 NMP 442 180 Horn et al. 1994 LA-ICP-MS 440.7 15.8
INAA, Toronto (T.S.) INAA 442 1 Benjamin et al. 1988 NMP 491 22
Horn et al. 1994 LA-ICP-MS 445.3 18.5 Raith et al. 1994 * LA-ICP-MS 520.9 27
ICP-MS, Aberystwyth (T.S.) ICP-MS 445.4 14.1 INA A, Toronto (T.S.) INAA 525 1
ICP-MS, Notre Dame (T.S.) ICP-MS 449.07 13.85 Tb
ICP-AES, Memorial (T.S.) ICP-AES 486 13 McGinley and Schweikert 1976 CPA A 328 12
Se L u ka s z ew 1990 SSMS 344
Benjamin et al. 1988 NMP 108 4.5 Hollocher and Ruiz 1995 ICP-MS 414 11
Rogers et al. 1987 NMP 110 6 ICP-MS sinter, Memorial (T.S.) ICP-MS 414 12
Rogers et al. 1987 NMP 114 7 ICP-MS, Abery stwyth (T.S.) ICP-MS 454.8 3.2
1 2 7
ation. T.S. indicates data from this study, NIST data from the NIST certificate. Those public ations marke d

Tb (cont. ) Tl (cont. )
INA A, Toronto (T.S.) INAA 455 2 Benjamin et al. 1988 NMP 67.2 6.3
ICP-MS, Notre Dame (T.S.) ICP-MS 461.77 5.78 Tm
Raith et al. 1994 * LA-ICP-MS 506.1 29.3 L u ka s z ew 1990 SSMS 366
Benjamin et al. 1988 NMP 521 29 Hollocher and Ruiz 1995 ICP-MS 400 9
Rogers et al. 1987 NMP 585 24 ICP-MS, Notre Dame (T.S.) ICP-MS 407.9 8.11
Th McGinley and Schwe i ke rt 1976 CPAA 410 9
Bingham and Slater 1976 LPMS 249 ICP-MS, Aberystwyth (T.S.) ICP-MS 422.6 2.3
ICP-MS sinter, Memorial (T.S.) ICP-MS 396 6 ICP-MS sinter, Memorial (T.S.) ICP-MS 426 10
ICP-MS, Notre Dame (T.S.) ICP-MS 403.63 2.22 ICP-MS, Memorial (T.S.) ICP-MS 454 20
Raith et al. 1994 * LA-ICP-MS 431.8 36.2 Benjamin et al. 1988 NMP 479 21
Benjamin et al. 1988 NMP 446 18 Raith et al. 1994 * LA-ICP-MS 490.5 22.1
Bonham and Quattlebaum 1988 LA-SSMS 455 110 U
Barnes et al. 1973 IDMS 455.4 1.6 Bergholz et al. 1974 MS 413 18
NIST * NIST 457.2 1.2 Benjamin et al. 1988 NMP 413 15
Barnes et al. 1973 IDMS 457.23 0.52 Rogers et al. 1987 NMP 423 18
INAA, Toronto (T.S.) INAA 458 2 Bingham and Slater 1976 LPMS 425
Bergholz et al. 1974 MS 469 7 Gladney et al. 1984 TCGS 431 40
ICP-AES, Memorial (T.S.) ICP-AES 472 20 ICP-MS, Notre Dame (T.S.) ICP-MS 432.27 5.6
ICP-MS, Aberystwyth (T.S.) ICP-MS 527.6 2.5 Rogers et al. 1987 NMP 451 17
Rogers et al. 1987 NMP 539 18 Carpenter 1972 NTM 461.3 1.7
Ti Barnes et al. 1973 IDMS 461.3 1
Milton and Hutton 1993* GDMS 41.7 1.7 NIST * NIST 461.5 1.1
Bingham and Slater 1976 LPMS 257 Carpenter 1972 NTM 461.5 1.1
Bergholz et al. 1974 MS 361 18 Barnes et al. 1973 IDMS 461.5 0.4
Bonham and Quattlebaum 1988 LA-SSMS 408 71 Carpenter 1972 NTM 462.8 13.8
EPMA, Toronto (T.S.) EPMA 421 150 ICP-MS, Memorial (T.S.) ICP-MS 464 15
Benjamin et al. 1988 NMP 423 46 Conrad et al. 1982 DNAA 470 90
Maienthal 1973 POL 434 10 Conrad et al. 1982 DNAA 471 28
NIST * NIST 437 Bonham and Quattlebaum 1988 LA-SSMS 490 132
ICP-MS, Aberystwyth (T.S.) ICP-MS 437.3 20.2 ICP-MS, Aberystwyth (T.S.) ICP-MS 513.3 0.9
Rogers et al. 1987 NMP 441 30 V
Hollocher and Ruiz 1995 ICP-MS 442 4 Bergholz et al. 1974 MS 206 10
ICP-AES, Memorial (T.S.) ICP-AES 442 9 Raith et al. 1994 * LA-ICP-MS 342.5 19
EPMA, Memorial (T.S.) EPMA 458 74 ICP-MS, Notre Dame (T.S.) ICP-MS 369 7.84
Heidel 1971 EPMA 517.5 48.4 EPMA, Memorial (T.S.) EPMA 372 141
Tl ICP-MS, Memorial (T.S.) ICP-MS 434 17
Milton and Hutton 1993* GDMS 33.6 2.1 ICP-AES, Memorial (T.S.) ICP-AES 435 17
Bergholz et al. 1974 MS 52 35 Horn et al. 1994 LA-ICP-MS 435.1 8.1
Raith et al. 1994 * LA-ICP-MS 58.84 3.81 ICP-MS, Aberystwyth (T.S.) ICP-MS 448.6 18.5
Bonham and Quattlebaum 1988 LA-SSMS 59 21 Rogers et al. 1987 NMP 477 18
McGinley and Schweikert 1976 CPAA 60 10 Benjamin et al. 1988 NMP 482 30
ICP-MS, Memorial (T.S.) ICP-MS 60.5 0.8 Heidel 1971 EPMA 486.3 53.1
ICP-MS, Aberystwyth (T.S.) ICP-MS 61.19 2.06 Joyce and Schweikert 1984 PIXE 494.2 54.1
NIST * NIST 61.8 2.5 W
Barnes et al. 1973 IDMS 61.8 1 McGinley and Schwe i ke rt 1976 CPAA 366 30
1 2 8
W (cont . ) Zn
Rogers et al. 1987 NMP 451 19 ICP-AES, Memorial (T.S.) ICP-AES 398 11
Raith et al. 1994 * LA-ICP-MS 528.1 16.7 AAS, Aberystwyth (T.S.) AAS 413 3.1
Y Hollocher and Ruiz 1995 ICP-MS 428 3
McGinley and Schweikert 1976 CPAA 271 7 Raith et al. 1994 * LA-ICP-MS 428.7 8.4
ICP-MS sinter, Memorial (T.S.) ICP-MS 423.9 2.3 NIST * NIST 433
Horn et al. 1994 LA-ICP-MS 434.4 38.1
Milton and Hutton 1993* GDMS 3171 166.9
Zr
Yb
Hollocher and Ruiz 1995 ICP-MS 400 10 Raith et al. 1994 * LA-ICP-MS 392.4 10.7
ICP-AES, Memorial (T.S.) ICP-AES 434 10 Benjamin et al. 1988 NMP 408 14
ICP-MS, Notre Dame (T.S.) ICP-MS 435.83 8.49 ICP-MS sinter, Memorial (T.S.) ICP-MS 431.7 1.3
Lukaszew 1990 SSMS 443 Rogers et al. 1987 NMP 433 15
ICP-MS, Aberystwyth (T.S.) ICP-MS 450.6 2.1 ICP-AES, Memorial (T.S.) ICP-AES 435 9
Raith et al. 1994 * LA-ICP-MS 467.9 11.9 Hollocher and Ruiz 1995 ICP-MS 444 11
INAA, Toronto (T.S.) INAA 496 2 ICP-MS, Memorial (T.S.) ICP-MS 449 4
Benjamin et al. 1988 NMP 512 27 Horn et al. 1994 LA-ICP-MS 450.5 15.9
Rogers et al. 1987 NMP 574 29 ICP-MS, Notre Dame (T.S.) ICP-MS 482.37 5.48
Table 7.

Ag As (cont. )
Bonham and Quattlebaum 1988 LA-SSMS 1 ICP-MS, Notre Dame (T.S.) ICP-MS 48.14 1.6
ICP-MS, Aberystwyth (T.S.) ICP-MS 18.91 0.78 Kuleff et al. 1984 INAA 58.1 7.3
Headridge and Riddington 1984 GFAAS 19.5 0.87
ICP-MS, BGS (T.S.) ICP-MS 21.11 1.54 Au
Fedorowich et al. 1993 ICP-MS 21.4 0.5 ICP-MS, Aberystwyth (T.S.) ICP-MS 4.05 0.81
NIST * NIST 22 0.3 NIST * NIST 5
ICP-MS, Notre Dame (T.S.) ICP-MS 22.57 0.38 Sheibley 1973 INAA 5 1
McGinley and Schweikert 1976a CPAA 28 5 Kuleff et al. 1984 INAA 5 0.2
Sheibley 1973 INA A 31 7 INA A, Toronto (T.S.) INAA 5.1 0.1
As Kim and Born 1973 INAA 5.27 0.11
Grey 1990 AAS 25.2 1.7 McGinley and Schweikert 1976a CPAA 6 3
INAA, Toronto (T.S.) INA A 31 1 B
Fedorowich et al. 1993 ICP-MS 33.9 0.6 Denoyer et al. 1991 LA-ICP-MS 25.8 1.9
Kanda et al. 1980 IPAA 35.6 0.3 Rio et al. 1995 AAS 26 5
McGinley and Schweikert 1976a CPAA 38 9 Zachmann 1985 ICP-AES 27.8 2.9
1 2 9

B (cont. ) Ce (cont. )
Gladney et al. 1984 DNAA 31 3 Bonham and Quattlebaum 1988 LA-SSMS 33
NIST * NIST 32 ICP-MS, Aberystwyth (T.S.) ICP-MS 33.89 0.17
Carpenter 1972 NTM 32.39 1.04 Pearce et al. 1996 ICP-MS 33.9
Rio et al. 1995 NMP 33 6 Denoyer et al. 1991 LA-ICP-MS 35.4 1.7
Bonham and Quattlebaum 1988 LA-SSMS 35 Sheibley 1973 INAA 37 2
McGinley and Schweikert 1975 CPAA 38 5 Hollocher and Ruiz 1995 ICP-MS 37 3
Rio et al. 1995 NMP 39 6 ICP-MS, BGS (T.S.) ICP-MS 37.82 1.98
Owens et al. 1982 ICP-AES 40 4 J ac kson et al. 1992 ICP-MS 37.9 2
Milton and Hutton 1993* GDMS 40 ICP-MS sinter, Memorial (T.S.) ICP-MS 37.9 0.5
Freidli et al. 1988a HIA A 43 20 ICP-AES, Memorial (T.S.) ICP-AES 38.1 0.9
Ba Fedorowich et al. 1993 ICP-MS 38.3 0.8
ICP-MS sinter, Memorial (T.S.) ICP-MS 32.87 0.11 NIST * NIST 39
ICP-MS, Aberystwyth (T.S.) ICP-MS 33.6 2.67 Chen et al. 1993 SXRF 39
Hollocher and Ruiz 1995 ICP-MS 36 4 Raith et al. 1994* LA-ICP-MS 39.54 0.55
Kuleff et al. 1984 INAA 36.5 5.2 Sutton et al. 1993 SXRF 40
INAA, Toronto (T.S.) INA A 37.2 0.5 Kanda et al. 1980 IPAA 40.6 0.2
ICP-AES, Memorial (T.S.) ICP-AES 38 1 Haney 1977 IDSSMS 41.2
ICP-MS, Notre Dame (T.S.) ICP-MS 38.05 0.73 McGinley and Schwe i ke rt 1976a CPAA 43 2
J ac kson et al. 1992 ICP-MS 38.9 0.7 Kuleff et al. 1984 INAA 45.3 1.5
Fedorowich et al. 1993 ICP-MS 39.5 1.6 Chenery and Cook 1993 LA-ICP-MS 48.2
NIST * NIST 41 Co
Haney 1977 IDSSMS 41.5 Bendicho and de Loos Vollerbregt 1990b GFAAS 2 0.4
Imbert and Telouk 1993 * LA-ICP-MS 50.6 8 Hollocher and Ruiz 1995 ICP-MS 32.8 0.4
Be Fedorowich et al. 1993 ICP-MS 32.9 0.9
Lass et al. 1982 HIAA 31 7 Kanda et al. 1980 IPAA 33.3 1
ICP-AES, Memorial (T.S.) ICP-AES 34.3 0.8 Denoyer et al. 1991 LA-ICP-MS 33.8 1.1
Hollocher and Ruiz 1995 ICP-MS 35.3 0.3 Raith et al. 1994* LA-ICP-MS 34.26 0.36
Fedorowich et al. 1993 ICP-MS 37.1 0.4 Kuleff et al. 1984 INAA 34.3 2.9
ICP-MS, BGS (T.S.) ICP-MS 37.6 3.96 ICP-AES, Memorial (T.S.) ICP-AES 34.9 0.6
J ac kson et al. 1992 ICP-MS 39 5.6 Kobayashi 1986 NAA 35 1.9
ICP-MS, Aberystwyth (T.S.) ICP-MS 39.84 1.68 NIST * NIST 35.5 1.2
Colin et al. 1987 HIAA 41 5 Bendicho and de Loos Vollerbregt 1990a GFAAS 36.1 0.9
Freidli et al. 1988b HIA A 48 7 Kim and Born 1973 INAA 37.1 2.3
Freidli et al. 1987 HIAA 50 4 INAA, Toronto (T.S.) INAA 37.3 0.1
Bi Kim and Born 1973 INAA 37.47 4.1
Woolum et al. 1976 RAD 13 ICP-MS, BGS (T.S.) ICP-MS 37.82 4.4
Carpenter and Pilione 1986 NTM 21 4 ICP-MS, Aberystwyth (T.S.) ICP-MS 39.81 2.27
ICP-MS, Aberystwyth (T.S.) ICP-MS 31.45 0.12 Milton and Hutton 1993* GDMS 43
J ac kson et al. 1992 ICP-MS 33 1.4 Imbert and Telouk 1993 * LA-ICP-MS 44.8 9.3
Fedorowich et al. 1993 ICP-MS 33.9 0.4 Bonham and Quattlebaum 1988 LA-SSMS 84
Raith et al. 1994* LA-ICP-MS 62.33 1.42 Cr
Cd ICP-MS, BGS (T.S.) ICP-MS 19.24 3.41
ICP-MS, Aberystwyth (T.S.) ICP-MS 27.63 1.09 ICP-AES, Memorial (T.S.) ICP-AES 30.1 0.5
Fedorowich et al. 1993 ICP-MS 28.4 1.1 Hollocher and Ruiz 1995 ICP-MS 31.2 0.2
ICP-MS, BGS (T.S.) ICP-MS 28.92 1.76 Fedorowich et al. 1993 ICP-MS 34.9 1.7
McGinley and Schweikert 1976a CPAA 40 5 ICP-MS, Aberystwyth (T.S.) ICP-MS 37.94 1.56
Ce Kobayashi 1986 NAA 38 4
Imbert and Telouk 1993 * LA-ICP-MS 32 6 ICP-MS, Notre Dame (T.S.) ICP-MS 38.64 0.91
1 3 0
Cr (c ont. ) Er (con t. )
Raith et al. 1994* LA-ICP-MS 47.63 0.69 Bonham and Quattlebaum 1988 LA-SSMS 35
Bonham and Quattlebaum 1988 LA-SSMS 63 ICP-MS, Aberystwyth (T.S.) ICP-MS 35.05 0.25
Kuleff et al. 1984 INA A 65.9 3.7 Hollocher and Ruiz 1995 ICP-MS 36 3
Kim and Born 1973 INAA 155 8 ICP-MS sinter, Memorial (T.S.) ICP-MS 37.7 0.4
Cs J ac kson et al. 1992 ICP-MS 37.9 1.2
ICP-MS, Aberystwyth (T.S.) ICP-MS 35.08 0.64 ICP-MS, Notre Dame (T.S.) ICP-MS 38.15 0.6
ICP-MS, Notre Dame (T.S.) ICP-MS 40.51 1.13 ICP-MS, BGS (T.S.) ICP-MS 38.37 1.21
Kim and Born 1973 INAA 41.1 6.6 Fedorowich et al. 1993 ICP-MS 38.4 0.9
J ac kson et al. 1992 ICP-MS 41.8 1.2 Pearce et al. 1996 ICP-MS 38.7
Hollocher and Ruiz 1995 ICP-MS 42 4 Raith et al. 1994* LA-ICP-MS 38.8 0.23
Fedorowich et al. 1993 ICP-MS 42.3 1.4 NIST * NIST 39
INAA, Toronto (T.S.) INA A 42.8 0.3 Chen et al. 1993 SXRF 39
McGinley and Schweikert 1976a CPAA 43 4 McGinley and Schweikert 1976a CPA A 43 1
Kuleff et al. 1984 INAA 43 2 Chenery and Cook 1993 LA-ICP-MS 44.6
Kanda et al. 1980 IPAA 44.8 1.2 Eu
Cu Sutton et al. 1993 SXRF 31
Bonham and Quattlebaum 1988 LA-SSMS 6 ICP-MS, Aberystwyth (T.S.) ICP-MS 32.68 0.23
ICP-MS, Aberystwyth (T.S.) ICP-MS 30.76 1.63 Kim and Born 1973 INAA 32.86 2.19
Milton and Hutton 1993* GDMS 32 ICP-MS, Notre Dame (T.S.) ICP-MS 33.14 0.46
Hollocher and Ruiz 1995 ICP-MS 33.5 0.4 Denoyer et al. 1991 LA-ICP-MS 33.4 1.4
Raith et al. 1994* LA-ICP-MS 35.2 1.02 Hollocher and Ruiz 1995 ICP-MS 34 3
Kuleff et al. 1984 INA A 37 4 J ac kson et al. 1992 ICP-MS 34.4 1
AAS, Aberystwyth (T.S.) AAS 37.33 1.77 Pearce et al. 1996 ICP-MS 34.9
NIST * NIST 37.7 0.9 ICP-MS sinter, Memorial (T.S.) ICP-MS 35.03 0.2
ICP-AES, Memorial (T.S.) ICP-AES 37.8 1.1 Kuleff et al. 1984 INAA 35.3 1.2
Bendicho and de Loos Vollerbregt 1990b GFAAS 38.1 0.8 Fedorowich et al. 1993 ICP-MS 35.4 0.4
Fedorowich et al. 1993 ICP-MS 39.5 1.7 INAA, Toronto (T.S.) INAA 35.6 0.1
Bendicho and de Loos Vollerbregt 1990a GFAAS 39.7 1 ICP-MS, BGS (T.S.) ICP-MS 35.95 1.21
Imbert and Telouk 1993 * LA-ICP-MS 44.8 9.4 NIST * NIST 36
ICP-MS, BGS (T.S.) ICP-MS 52.01 6.82 Chen et al. 1993 SXRF 36
Dy Raith et al. 1994* LA-ICP-MS 36.28 0.17
ICP-AES, Memorial (T.S.) ICP-AES 31.1 0.5 McGinley and Schweikert 1976a CPAA 37 4
ICP-MS, Notre Dame (T.S.) ICP-MS 34.99 0.82 Chenery and Cook 1993 LA-ICP-MS 43.6
NIST * NIST 35 Bonham and Quattlebaum 1988 LA-SSMS 53
J ac kson et al. 1992 ICP-MS 35 1 Fe
Chen et al. 1993 SXRF 35 Bendicho and de Loos Vollerbregt 1990a GFAAS 37.7 9
ICP-MS, Aberystwyth (T.S.) ICP-MS 35.02 0.21 McGinley and Schweikert 1976a CPAA 48
Raith et al. 1994* LA-ICP-MS 35.23 0.18 NIST * NIST 51 2
ICP-MS sinter, Memorial (T.S.) ICP-MS 35.7 0.5 Maienthal 1973 POL 51.3 7
Bonham and Quattlebaum 1988 LA-SSMS 36 Bendicho and de Loos Vollerbregt 1990b GFAAS 53 1
Hollocher and Ruiz 1995 ICP-MS 36 3 Milton and Hutton 1993* GDMS 55
Fedorowich et al. 1993 ICP-MS 36.4 0.8 Kuleff et al. 1984 INAA 60 3
ICP-MS, BGS (T.S.) ICP-MS 36.72 0.77 Haney 1977 IDSSMS 88 0.8
Pearce et al. 1996 ICP-MS 36.8 ICP-AES, Memorial (T.S.) ICP-AES 115 10
Kuleff et al. 1984 INA A 37 4 Ga
Sutton et al. 1993 SXRF 37 Bonham and Quattlebaum 1988 LA-SSMS 33
Chenery and Cook 1993 LA-ICP-MS 41.7 ICP-AES, Memorial (T.S.) ICP-AES 33.5 1.7
Er Hollocher and Ruiz 1995 ICP-MS 34 2
Sutton et al. 1993 SXRF 32 ICP-MS, Abery stwyth (T.S.) ICP-MS 36.74 1.57
1 3 1

Ga (cont . ) In
ICP-MS, BGS (T.S.) ICP-MS 38.04 2.97 ICP-MS, Aberystwyth (T.S.) ICP-MS 37.21 0.63
Fedorowich et al. 1993 ICP-MS 38.3 1.2 Hollocher and Ruiz 1995 ICP-MS 41 2
McGinley and Schweikert 1976a CPAA 44 10 ICP-MS, BGS (T.S.) ICP-MS 43.43 1.87
Joyce and Schwe i ke rt 1984 PIXE 44.9 11 Bonham and Quattlebaum 1988 LA-SSMS 44
Gd McGinley and Schwe i ke rt 1976a CPAA 49 4
Sutton et al. 1993 SXRF 30 K
J ac kson et al. 1992 ICP-MS 35.4 3 Bonham and Quattlebaum 1988 LA-SSMS 59
Gladney et al. 1985 TCGS 36 4 NIST * NIST 64
Hollocher and Ruiz 1995 ICP-MS 36 3 Haney 1977 IDSSMS 66
Chen et al. 1993 SXRF 36 AAS, Aberystwyth (T.S.) AAS 66.52 2.01
ICP-MS, Aberystwyth (T.S.) ICP-MS 36.03 0.23 La
Denoyer et al. 1991 LA-ICP-MS 37 2 ICP-MS, Aberystwyth (T.S.) ICP-MS 33.45 0.35
Pearce et al. 1996 ICP-MS 37 Pearce et al. 1996 ICP-MS 33.6
ICP-MS sinter, Memorial (T.S.) ICP-MS 37.82 1.12
McGinley and Schweikert 1976a CPAA 38 5
INAA, Toronto (T.S.) INAA 34.3 0.2
ICP-MS, BGS (T.S.) ICP-MS 38.26 1.65
Fedorowich et al. 1993 ICP-MS 38.5 0.8
Sheibley 1973 INAA 35 15
Raith et al. 1994* LA-ICP-MS 38.93 0.11
Imbert and Telouk 1993 * LA-ICP-MS 35 6
NIST * NIST 39
J ac kson et al. 1992 ICP-MS 35.7 1.2
Bonham and Quattlebaum 1988 LA-SSMS 61
Ge
NIST * NIST 36
ICP-AES, Memorial (T.S.) ICP-AES 36.9 0.6
Sutton et al. 1993 SXRF 38
Hf
McGinley and Schwe i ke rt 1976a CPAA 39 5
Kuleff et al. 1984 INAA 40.2 1.2
Chen et al. 1993 SXRF 41
Kuleff et al. 1984 INA A 32.2 1.6
Chenery and Cook 1993 LA-ICP-MS 41.2
Li
INAA, Toronto (T.S.) INAA 35 0.1
McGinley and Schwe i ke rt 1975 CPAA 38 4
J ac kson et al. 1992 ICP-MS 37.6 1
Kim and Born 1973 INAA 52.29 3.11
Ho ICP-MS, BGS (T.S.) ICP-MS 41.67 1.76
Bonham and Quattlebaum 1988 LA-SSMS 30 Freidli et al. 1988b HIAA 42 11
Hollocher and Ruiz 1995 ICP-MS 36 3 Freidli et al. 1987 HIAA 42 3
Raith et al. 1994* LA-ICP-MS 36.93 0.34 Freidli et al. 1988a HIA A 43 6
Sutton et al. 1993 SXRF 37 Lass et al. 1982 HIAA 44 8
J ac kson et al. 1992 ICP-MS 37.3 1.2 Rio et al. 1995 NMP 48 10
ICP-MS sinter, Memorial (T.S.) ICP-MS 37.3 0.5 Bonham and Quattlebaum 1988 LA-SSMS 61
Fedorowich et al. 1993 ICP-MS 37.6 0.7 Lu
ICP-MS, BGS (T.S.) ICP-MS 38.59 1.21 Bonham and Quattlebaum 1988 LA-SSMS 29
ICP-MS, Aberystwyth (T.S.) ICP-MS 38.9 0.31 ICP-MS sinter, Memorial (T.S.) ICP-MS 35.19 0.1
Pearce et al. 1996 ICP-MS 39.4 ICP-MS, Notre Dame (T.S.) ICP-MS 36.51 0.5
McGinley and Schweikert 1976a CPAA 46 2 ICP-MS, BGS (T.S.) ICP-MS 36.72 0.99
1 3 2

Lu (cont. ) Nd (c ont. )
Kuleff et al. 1984 INA A 36.8 0.2 ICP-MS, Notre Dame (T.S.) ICP-MS 34.73 0.52
Raith et al. 1994* LA-ICP-MS 36.85 0.24 Pearce et al. 1996 ICP-MS 34.9
J ac kson et al. 1992 ICP-MS 37.2 1.8 Hollocher and Ruiz 1995 ICP-MS 35 4
Fedorowich et al. 1993 ICP-MS 37.5 0.5 ICP-MS sinter, Memorial (T.S.) ICP-MS 35.2 0.3
ICP-MS, Aberystwyth (T.S.) ICP-MS 39.5 0.25 NIST * NIST 36
Sutton et al. 1993 SXRF 40 Chen et al. 1993 SXRF 36
INAA, Toronto (T.S.) INAA 40 0.1 Raith et al. 1994* LA-ICP-MS 36.16 0.18
Pearce et al. 1996 ICP-MS 40.4 ICP-MS, BGS (T.S.) ICP-MS 36.17 1.21
McGinley and Schweikert 1976a CPAA 45 4 Fedorowich et al. 1993 ICP-MS 37.3 0.7
Mg Chenery and Cook 1993 LA-ICP-MS 41.1
Bonham and Quattlebaum 1988 LA-SSMS 36 Bonham and Quattlebaum 1988 LA-SSMS 65
Fedorowich et al. 1993 ICP-MS 70.9 1.1 Ni
ICP-MS, BGS (T.S.) ICP-MS 75.21 14.51 Bonham and Quattlebaum 1988 LA-SSMS 15
ICP-MS, Aberystwyth (T.S.) ICP-MS 85.09 4.37 ICP-AES, Memorial (T.S.) ICP-AES 29.2 0.5
J ac kson et al. 1992 ICP-MS 120 60 Milton and Hutton 1993* GDMS 32
Kanda et al. 1980 IPAA 341 16 Bendicho and de Loos Vollerbregt 1990a GFAAS 37.6 2
Mn Fedorowich et al. 1993 ICP-MS 37.8 1.9
Bonham and Quattlebaum 1988 LA-SSMS 22 Raith et al. 1994* LA-ICP-MS 37.89 0.38
ICP-AES, Memorial (T.S.) ICP-AES 36.8 1.7 Bendicho and de Loos Vollerbregt 1990b GFAAS 38.6 0.4
ICP-MS, Aberystwyth (T.S.) ICP-MS 37.37 1.19 NIST * NIST 38.8 0.2
Kuleff et al. 1984 INAA 38.2 1.1 Kanda et al. 1980 IPAA 40.1 1.1
Bendicho and de Loos Vollerbregt 1990a GFAAS 38.3 1.5 ICP-MS, Abery stwyth (T.S.) ICP-MS 42.32 1.53
Bendicho and de Loos Vollerbregt 1990b GFAAS 38.8 0.5 ICP-MS, BGS (T.S.) ICP-MS 43.43 5.61
Kanda et al. 1980 IPAA 39 2.6 P
ICP-MS, BGS (T.S.) ICP-MS 39.03 6.16 ICP-AES, Memorial (T.S.) ICP-AES 39.1 0.6
NIST * NIST 39.6 0.8 ICP-MS, Aberystwyth (T.S.) ICP-MS 71.21 21.7
Raith et al. 1994* LA-ICP-MS 39.78 0.27 Pb
Fedorowich et al. 1993 ICP-MS 39.9 0.8 McGinley and Schweikert 1976a CPAA 33 5
Imbert and Telouk 1993 * LA-ICP-MS 46 6 Imbert and Telouk 1993 * LA-ICP-MS 35 5
Mo Headridge and Riddington 1984 GFAAS 36.33 1.25
J ac kson et al. 1992 ICP-MS 33.8 2.9 J ac kson et al. 1992 ICP-MS 36.6 3.6
ICP-MS, Memorial (T.S.) ICP-MS 34 3 ICP-MS, Aberystwyth (T.S.) ICP-MS 36.96 7.98
Fedorowich et al. 1993 ICP-MS 36.3 2.1 Fisher 1986 IDMS 38.37 0.13
Hollocher and Ruiz 1995 ICP-MS 36.9 0.4 Gulson 1977 IDMS 38.56 0.09
ICP-MS, Aberystwyth (T.S.) ICP-MS 38.61 1.24 Barnes et al. 1973 IDMS 38.56 0.07
ICP-MS, Notre Dame (T.S.) ICP-MS 39.68 0.92 NIST * NIST 38.57 0.2
McGinley and Schwe i ke rt 1976a CPAA 40 5 Barnes et al. 1973 IDMS 38.57 0.09
Bonham and Quattlebaum 1988 LA-SSMS 43 Vargas et al. 1987 HeAA 38.7 3.9
Nb Broekman and van Raaphorst 1983 IDMS 38.83 0.09
Bonham and Quattlebaum 1988 LA-SSMS 35 Bonham and Quattlebaum 1988 LA-SSMS 39
Raith et al. 1994* LA-ICP-MS 36.57 0.23 Haney 1977 IDSSMS 39.5
ICP-MS, Notre Dame (T.S.) ICP-MS 37.18 0.39 Grey 1990 AAS 41 2.3
Kanda et al. 1980 IPA A 38.1 1 ICP-MS, BGS (T.S.) ICP-MS 41.67 4.4
J ac kson et al. 1992 ICP-MS 38.9 0.7 Denoyer et al. 1991 LA-ICP-MS 42.8 1.1
Fedorowich et al. 1993 ICP-MS 44.5 1.5 Milton and Hutton 1993* GDMS 45
Nd Fedorowich et al. 1993 ICP-MS 57.9 1.8
Sutton et al. 1993 SXRF 31 Raith et al. 1994* LA-ICP-MS 73.99 2.68
Denoyer et al. 1991 LA-ICP-MS 33.3 1.5 Pr
ICP-MS, Aberystwyth (T.S.) ICP-MS 33.52 0.48 Sutton et al. 1993 SXRF 33
Jackson et al. 1992 ICP-MS 34.6 2.4 Pearce et al. 1996 ICP-MS 34.7
1 3 3

Pr (con t. ) Sm
ICP-MS, Aberystwyth (T.S.) ICP-MS 35.9 0.2 Gladney et al. 1985 TCGS 32.7 3
McGinley and Schweikert 1976a CPAA 36 4 Gladney et al. 1985 TCGS 32.8 3
ICP-MS, Notre Dame (T.S.) ICP-MS 37.01 0.73 Sutton et al. 1993 SXRF 34
Raith et al. 1994* LA-ICP-MS 37.04 0.21 Hollocher and Ruiz 1995 ICP-MS 35 3
J ac kson et al. 1992 ICP-MS 37.4 0.8 ICP-MS, Aberystwyth (T.S.) ICP-MS 35.62 0.18
ICP-MS sinter, Memorial (T.S.) ICP-MS 37.62 0.19 Denoyer et al. 1991 LA-ICP-MS 35.8 1.3
Pearce et al. 1996 ICP-MS 36.5
Rb
NIST * NIST 39
Raith et al. 1994* LA-ICP-MS 39 0.31
Chen et al. 1993 SXRF 39
NIST * NIST 31.4 0.4
Kuleff et al. 1984 INAA 39.6 1.1
Lippolt et al. 1983 IDMS 31.41 0.08
Chenery and Cook 1993 LA-ICP-MS 43.2
Moore et al. 1973 IDMS 31.44 0.31 Bonham and Quattlebaum 1988 LA-SSMS 67
Haney 1977 IDSSMS 31.7 Sn
Kanda et al. 1980 IPAA 32 1.4 Bonham and Quattlebaum 1988 LA-SSMS 16
Hollocher and Ruiz 1995 ICP-MS 32 2 ICP-MS, Aberystwyth (T.S.) ICP-MS 36.21 1.83
INAA, Toronto (T.S.) INA A 33 5 Fedorowich et al. 1993 ICP-MS 36.8 0.4
Bonham and Quattlebaum 1988 LA-SSMS 34 ICP-MS, BGS (T.S.) ICP-MS 38.81 2.2
Kuleff et al. 1984 INAA 36 4 McGinley and Schwe i ke rt 1976a CPAA 40 4
Milton and Hutton 1993* GDMS 39 Sr
Re McGinley and Schwe i ke rt 1976a CPAA 72 6
Hollocher and Ruiz 1995 ICP-MS 5.8 0.5 ICP-MS, Notre Dame (T.S.) ICP-MS 72.96 0.46
ICP-MS, Notre Dame (T.S.) ICP-MS 10.43 0.67 Imbert and Telouk 1993 * LA-ICP-MS 73.2 5
S ICP-MS, Aberystwyth (T.S.) ICP-MS 73.56 1.26
Bonham and Quattlebaum 1988 LA-SSMS 16 ICP-AES, Memorial (T.S.) ICP-AES 73.9 0.5
Sb Denoyer et al. 1991 LA-ICP-MS 74.1 3.3
Kuleff et al. 1984 INAA 32.2 1.6 J ac kson et al. 1992 ICP-MS 75.3 1.1
Haney 1977 IDSSMS 76.3
Kanda et al. 1980 IPAA 77.3 1.3
Lippolt et al. 1983 IDMS 78.31 0.09
Moore et al. 1973 IDMS 78.38 0.25
NIST * NIST 78.4 0.2
Kim and Born 1973 INA A 45.2 6.74
Fedorowich et al. 1993 ICP-MS 79.5 3
Sc
Denoyer 1990 LA-ICP-MS 86.2 3.1
Kuleff et al. 1984 INAA 34 3
Milton and Hutton 1993* GDMS 92
Hollocher and Ruiz 1995 ICP-MS 34.4 0.4
Ta
Kanda et al. 1980 IPAA 38.2 1.2 Kim and Born 1973 INAA 36.33 5.6
Kim and Born 1973 INAA 40.35 0.35 J ac kson et al. 1992 ICP-MS 39.3 0.5
ICP-AES, Memorial (T.S.) ICP-AES 40.8 0.7 ICP-MS, Notre Dame (T.S.) ICP-MS 40.51 0.65
ICP-MS, Memorial (T.S.) ICP-MS 48 13 Fedorowich et al. 1993 ICP-MS 40.7 0.7
Kobayashi 1986 NAA 52 6 INAA, Toronto (T.S.) INAA 42 0.5
1 3 4

Tb Tl (cont . )
Kuleff et al. 1984 INA A 22 2 ICP-MS, BGS (T.S.) ICP-MS 15.28 0.66
Bonham and Quattlebaum 1988 LA-SSMS 31 Barnes et al. 1973 IDMS 15.68 3
Sutton et al. 1993 SXRF 31 NIST * NIST 15.7
ICP-MS, Notre Dame (T.S.) ICP-MS 34 0.81 Fedorowich et al. 1993 ICP-MS 16 0.3
ICP-MS sinter, Memorial (T.S.) ICP-MS 35.44 0 Tm
Hollocher and Ruiz 1995 ICP-MS 36 3 Sutton et al. 1993 SXRF 30
Fedorowich et al. 1993 ICP-MS 36.7 0.9 Bonham and Quattlebaum 1988 LA-SSMS 32
J ac kson et al. 1992 ICP-MS 36.9 0.9 Hollocher and Ruiz 1995 ICP-MS 36 3
Kobayashi 1986 NA A 37 2 ICP-MS sinter, Memorial (T.S.) ICP-MS 36.2 0.4
ICP-MS, BGS (T.S.) ICP-MS 37.16 1.21 ICP-MS, BGS (T.S.) ICP-MS 36.72 1.43
INAA, Toronto (T.S.) INA A 38.3 0.1 ICP-MS, Notre Dame (T.S.) ICP-MS 37.29 0.63
ICP-MS, Aberystwyth (T.S.) ICP-MS 38.46 0.24 J ac kson et al. 1992 ICP-MS 37.3 2.6
Pearce et al. 1996 ICP-MS 39.1 Raith et al. 1994* LA-ICP-MS 38.6 0.19
Pearce et al. 1996 ICP-MS 39
Kim and Born 1973 INA A 52.9 5.62
Th
U
Sheibley 1973 INA A 31 1
Denoyer et al. 1991 LA-ICP-MS 31.8 4.1
Kuleff et al. 1984 INA A 36 2
INA A, Toronto (T.S.) INAA 35 0.5
Virk 1980 NTM 35.74
Conrad et al. 1982 DNAA 36.3 7.2
Denoyer et al. 1991 LA-ICP-MS 36.9 2.1
Carpenter 1972 NTM 36.94 0.83
Fisher 1986 IDMS 37.37 0.064
NIST * NIST 37.79 0.08
NIST * NIST 37.38 0.08
Kim and Born 1973 INAA 38.43 0.42
Raith et al. 1994 LA-ICP-MS 39.62 0.19
Denoyer 1990 LA-ICP-MS 42.1 1.3
Ti
Gulson 1977 IDMS 37.66 0.08
INAA, Toronto (T.S.) INA A 38.2 0.2
Hollocher and Ruiz 1995 ICP-MS 38.6 0.4 Conrad et al. 1982 DNAA 39 4.9
Imbert and Telouk 1993 * LA-ICP-MS 44 6.8 Gladney et al. 1984 TCGS 40 2
ICP-AES, Memorial (T.S.) ICP-AES 45.7 1.8 Denoyer 1990 LA-ICP-MS 44.1 1.8
Maienthal 1973 POL 50 0.3 V
NIST * NIST 50.1 0.8 Bonham and Quattlebaum 1988 LA-SSMS 32
ICP-MS, Aberystwyth (T.S.) ICP-MS 51.35 6.65 Hollocher and Ruiz 1995 ICP-MS 35.1 0.3
Kanda et al. 1980 IPAA 55.2 8.3 ICP-MS, Notre Dame (T.S.) ICP-MS 36.16 0.57
Bonham and Quattlebaum 1988 LA-SSMS 57 ICP-AES, Memorial (T.S.) ICP-AES 36.6 0.5
Tl J ac kson et al. 1992 ICP-MS 37.6 0.3
Bonham and Quattlebaum 1988 LA-SSMS 7 Fedorowich et al. 1993 ICP-MS 38.6 0.5
McGinley and Schweikert 1976a CPAA 14 0.3 ICP-MS, Aberystwyth (T.S.) ICP-MS 41.44 6.49
ICP-MS, Aberystwyth (T.S.) ICP-MS 14.69 0.26 Joyce and Schweikert 1984 PIXE 42 4.2
Jackson et al. 1992 ICP-MS 14.8 0.1 Raith et al. 1994* LA-ICP-MS 45.7 0.29
Milton and Hutton 1993* GDMS 15 1.8 ICP-MS, BGS (T.S.) ICP-MS 46.29 7.59
ICP-MS, Notre Dame (T.S.) ICP-MS 15.02 0.51 Kuleff et al. 1984 INAA 58.6 6
1 3 5

W Yb (cont. )
ICP-MS, Memorial (T.S.) ICP-MS 26.5 INAA, Toronto (T.S.) INAA 42.4 0.5
McGinley and Schweikert 1976a CPAA 39 4 Pearce et al. 1996 ICP-MS 42.7
Fedorowich et al. 1993 ICP-MS 40.1 1.2 Raith et al. 1994* LA-ICP-MS 42.86 0.27
Y Kobayashi 1986 NAA 44 3
Raith et al. 1994* LA-ICP-MS 25.54 0.25 Chenery and Cook 1993 LA-ICP-MS 45.2
ICP-MS, Notre Dame (T.S.) ICP-MS 31.45 0.73 Bonham and Quattlebaum 1988 LA-SSMS 52
ICP-MS sinter, Memorial (T.S.) ICP-MS 35.2 0.5 Kim and Born 1973 INAA 55 5
J ac kson et al. 1992 ICP-MS 36.6 0.6 Zn
ICP-AES, Memorial (T.S.) ICP-AES 35 0.8
AAS, Aberystwyth (T.S.) AAS 35.48 2.36
ICP-AES, Memorial (T.S.) ICP-AES 40.4 0.5
Yb
NIST * NIST 42
Zr
Sutton et al. 1993 SXRF 34
ICP-MS, Aberystwyth (T.S.) ICP-MS 37.43 0.38 J ac kson et al. 1992 ICP-MS 35.2 1
McGinley and Schweikert 1976a CPAA 38 Hollocher and Ruiz 1995 ICP-MS 37.3 0.4
J ac kson et al. 1992 ICP-MS 38.1 2.2 ICP-AES, Memorial (T.S.) ICP-AES 37.4 0.3
Fedorowich et al. 1993 ICP-MS 38.9 0.2 Kanda et al. 1980 IPAA 41.8 1.1
Kuleff et al. 1984 INA A 40 7.15 Bonham and Quattlebaum 1988 LA-SSMS 43
ICP-MS, BGS (T.S.) ICP-MS 40.02 0.99 Fedorowich et al. 1993 ICP-MS 43.5 5.2
Chen et al. 1993 SXRF 42 Raith et al. 1994* LA-ICP-MS 46.31 0.18
standard analytical techniques - many of the analyses metric methods to determine twenty four elements. NIST
f or B i n th e se gla ss e s f all i n to t hi s ca te gor y f or SRM 610 a nd NI ST SR M 612 w e re a n al y s ed b y
example; (iii) data generated as part of a larger study McGinley and Schweikert (1976), who determined up to
of other materials, such as geologic or forensic studies. twenty six elements of Z ≥ 26 using energy dispersive
Whilst we have searched the literature extensively for X- ray counting of ra d i o act i ve species created in the
information on these glasses, data “hidden” in other samples by 20 MeV proton and deuteron bombardment.
s t u di e s m a y h a v e b e en ov e r l o o k e d , a n d o u r
compilation may not be exhaustive. We would welcome Haney (1977), in an extensive study of glasses for
copies of any further information that is not included in use in forensic science produced analyses of fifty seven
the reference list. Only eight publications produce data elements in NIST SRM 612 by isotope dilution mass
for more than fifteen elements in NIST SRM 610, and s p e ct ro m e t r y. Kanda et al. ( 1980) produced analys e s
only nine for NIST SRM 612. Only these larger studies of fifteen elements in NIST SRM 612 by instrumental
a re discussed here, information concerning studies of photon act i vation analysis, and in the same material
fewer elements can be inferred from the reference list Kuleff (1984) determined twenty five trace elements by
or compilation tables. INAA. Rogers et al. (1987) produced data for a total of
f o rty nine elements in NIST SRM 610 using a PIXE
One of the earliest extensive studies on NIST SRM method. Spect ra we re obtained by bombardment of
610 was that of Bergholz (1974) who used mass spectro- the sample with Be or Al ions at differing beam energies,
1 3 6
Table 8.
Summary of composition data (µg g -1) for NIST SRM 610. N = total number of analyses included in calculation of ave rag e ,
range, geometric mean and median (published and this study). Ove rall ave rage = ave rage of all analyses (combining
published data and new data presented in this study)) excluding semi-quantitative analyses and analyses with “circ u l a r
c a l i b rations” (see text). s = standard deviation. Range = maximum and minimum concentrations . Median = median of all
data. Geometric mean = geometric mean of all data. Pref e r red ave rage = ave rage of those analyses within ± 1 standard
deviation of the overall average. n = number of analyses included in preferred average. s P = standard deviation of preferre d
ave rage. NIST = NIST certified values (open) and information values (in brac ke t s )
O ve ra l l Range Geometric P ref e r re d

N ave rag e s Ma x Min Me d i a n mean ave rag e sP n N I ST cl*
Ag 8 235.4 29.0 267 180 238.5 233.7 239.4 18.6 6 (254) 10 Ag

As 7 330.1 35.4 406 303 317 328.6 317.4 12.4 6 As
Au 7 22.7 5.3 31 15.63 22.6 22.2 22.5 3.5 5 (25) Au
B 9 332.4 72.1 368 141 356 321.4 356.4 7.3 8 (351) B
Ba 9 565.1 285.5 1160 382 424 518.3 424.1 29.3 7 Ba
Be 9 469.0 34.9 540.67 421 452 467.9 465.6 19.2 7 Be
Bi 10 326.4 99.7 430 113.7 372.5 307.0 357.7 49.0 7 Bi
Cd 6 269.6 67.1 393 187 259 263.2 259.4 4.7 4 Cd
Ce 12 462.6 57.6 611 384 451.1 459.6 447.8 16.8 9 Ce
Cl 2 470.0 0.0 470 470 470 470.0 470.0 0.0 2 Cl
Co 14 374.8 82.8 444 135 396.5 361.6 405.0 22.9 12 (390) Co
Cr 9 415.0 49.5 485 343 406 412.4 405.2 32.3 6 Cr
Cs 7 429.4 191.3 840 259 369 401.9 360.9 67.5 6 Cs
Cu 13 421.7 42.0 486 343 428 419.7 430.3 23.6 10 (444) 4 Cu
Dy 7 420.2 39.9 466 343 429 418.5 426.5 18.0 5 Dy
Er 9 440.1 54.8 526 360 436 437.2 426.0 23.9 6 Er
Eu 9 479.6 110.1 731 357 442.7 469.9 461.1 52.1 7 Eu
Fe 11 430.3 79.3 517 260 455 422.2 457.1 22.2 8 458 9 Fe
Ga 11 443.8 28.7 501.3 395 436.5 443.0 438.1 11.3 8 Ga
Gd 9 437.2 69.6 556 331 430.53 432.4 419.9 25.2 6 Gd
Ge 5 433.3 38.8 496 391.3 426 431.9 426.3 9.5 3 Ge
Hf 10 419.1 50.3 477 312.7 418 416.1 417.7 28.2 7 Hf
Ho 8 445.7 46.4 511 358 444.9 443.5 449.4 24.6 6 Ho
In 7 423.9 54.7 474 319 449 420.5 441.4 32.0 6 In
K 6 671.7 456.6 1600 442 487.5 591.1 486.0 45.7 5 (461) K
La 12 509.2 138.0 794 386 448 494.6 457.4 72.4 10 La
Li 10 464.2 61.4 536.3 354 487.9 460.2 484.6 21.7 7 Li
Lu 11 431.0 46.9 497 332 440 428.6 434.7 31.0 9 Lu
Mg 5 465.6 37.0 511 421 472 464.4 465.3 26.6 3 Mg
Mn 11 419.2 75.4 495 216 440.8 410.9 433.3 31.8 9 485 10 Mn
Mo 10 363.5 57.7 427 276 389.5 359.1 376.8 45.0 7 Mo
Nb 8 373.7 97.8 458 225 428.1 360.9 419.4 57.6 6 Nb
Nd 10 455.6 79.3 598 364 430.6 449.8 430.8 37.5 7 Nd
Ni 11 437.5 74.9 603.8 316 441 431.7 443.9 24.2 8 458.7 4 Ni
P 2 342.5 53.1 380 304.9 342.5 340.4 342.5 53.1 2 P
Pb 18 409.0 31.6 448 301.4 417 407.7 413.3 15.4 16 426 1 Pb
Pr 9 432.7 57.6 505 318 441 429.1 429.8 30.0 6 Pr
Rb 10 435.0 27.4 501.97 400 429.5 434.3 431.1 11.4 8 425.7 0.8 Rb
Re 4 192.9 192.9 460.4 37 137 124.3 103.7 90.0 3 Re
Sb 6 345.9 60.5 394 233 362.2 340.7 368.5 27.5 5 Sb
Sc 9 432.1 47.1 486 315 444 429.4 441.1 9.6 7 Sc
Se 3 110.7 3.1 114 108 110 110.6 109.0 1.4 2 Se
Sm 9 484.5 69.9 610 417 458 480.4 450.5 20.6 7 Sm
Sn 5 391.3 54.5 458 309.4 404 388.1 396.3 17.8 3 Sn
Sr 11 479.6 44.0 515.5 377 498 477.6 497.4 18.3 9 515.5 0.5 Sr
Ta 11 365.9 125.7 525 134 340.13 342.0 376.6 77.6 7 Ta
Tb 10 443.5 75.9 585 328 454.9 437.6 442.8 22.4 6 Tb
Th 14 448.0 69.1 539 249 456.3 441.8 450.6 27.8 11 457.2 1.2 Th
Ti 13 428.2 66.5 524.43 257 437.3 422.6 434.0 14.7 9 (437) Ti
Tl 9 61.9 5.2 70 52 61.19 61.7 61.2 2.1 6 (61.8) 2.5 Tl
Tm 9 431.4 45.4 517 366 422.6 429.3 420.1 19.2 6 Tm
U 17 453.2 27.3 513.3 413 461.3 452.5 457.1 13.6 11 461.5 1.1 U
V 12 422.1 79.3 494.2 206 435.1 412.9 441.7 42.7 11 V
W 4 425.5 44.6 467 366 434.5 423.7 445.3 25.0 3 W
Y 10 440.2 66.9 531.47 271 448 434.6 449.9 19.3 8 Y
Yb 9 467.2 52.2 574 400 450.6 464.7 461.5 30.6 7 Yb
Zn 12 447.2 30.7 494.27 398 451 446.3 456.3 19.2 8 (433) Zn
Zr 10 435.1 26.6 482.37 381.3 435.5 434.3 439.9 7.8 7 Zr
* 95% con fidence limits or range, which ever is larg e r.
1 3 7
Table 9.
Summary of composition data (µg g - 1) for NIST SRM 612. Column headings as Table 8
O ve ra l l Range Geometric P ref e r re d

N ave rag e s Ma x Min Me d i a n mean ave rag e sP n N I ST cl*
Ag 8 20.44 8.91 31 1 31.26 15.46 21.92 3.26 6 22 0.3 Ag

As 7 38.56 11.11 58.1 25.2 35.6 37.29 37.33 6.56 5 As
Au 6 5.07 0.63 6 4.05 5.05 5.04 5.09 0.13 4 (5) Au
B 11 33.73 5.83 43 25.8 33 33.26 34.73 3.21 6 (32) B
Ba 11 37.92 3.42 45 32.87 38 37.78 37.74 1.26 7 (41) Ba
Be 10 39.31 5.88 50 31 38.3 38.94 37.73 2.41 7 Be
Bi 6 28.73 9.86 40 13 32.13 26.96 29.84 5.98 4 Bi
Cd 4 31.24 5.87 40 27.63 28.66 30.87 28.32 0.65 3 Cd
Ce 18 38.75 3.92 48.2 33 38 38.57 38.35 1.64 12 (39) Ce
Co 16 36.23 15.37 84 2 34.95 31.05 35.26 2.44 14 (35.5) 1.2 Co
Cr 10 51.39 39.11 155 19.241 37.97 43.19 39.88 15.17 9 Cr
Cs 11 46.49 16.28 95 35.08 42.3 44.81 41.64 2.59 10 Cs
Cu 10 35.17 11.64 52.007 6 37.57 31.63 36.71 3.07 8 (37.7) 0.9 Cu
Dy 14 36.03 2.22 41.7 31.1 36 35.97 35.97 0.82 12 (35) Dy
Er 13 37.99 3.27 44.6 32 38.15 37.86 37.43 1.50 10 (39) Er
Eu 18 35.51 5.50 53 26 34.97 35.16 34.44 1.59 15 (36) Eu
Fe 7 64.71 27.14 115 37.7 53 60.56 56.33 17.14 6 51 2 Fe
Ga 9 37.71 4.29 44.9 33 36.88 37.50 36.24 2.03 6 Ga
Gd 15 38.09 6.66 61 30 37 37.66 36.95 1.06 13 (39) Gd
Ge 2 34.64 2.64 36.5 32.77 34.64 34.58 34.64 2.64 2 Ge
Hf 11 34.29 9.64 52.29 12 35 32.61 34.77 3.65 9 Hf
Ho 11 37.89 3.71 46 30 37.6 37.72 37.87 1.09 9 Ho
In 6 38.85 10.72 49 18.44 42.22 37.16 42.93 4.32 5 In
K 3 63.84 4.20 66.52 59 66 63.75 66.26 0.37 2 (64) K
La 17 36.95 3.92 48 33 35.75 36.77 35.77 2.15 13 (36) La
Li 12 43.17 6.25 61 37.9 41.83 42.81 41.54 2.87 11 Li
Lu 13 37.60 3.73 45 29 37.2 37.42 37.71 1.95 11 Lu
Mg 6 121.37 110.93 341 36 80.15 93.51 77.44 30.15 5 Mg
Mn 9 36.60 5.55 39.9 22 38.3 36.11 38.43 0.99 8 (39.6) 0.8 Mn
Mo 8 37.79 3.15 43 33.8 37.76 37.67 38.30 1.65 5 Mo
Nb 5 38.74 3.54 44.5 35 38.1 38.61 38.06 0.86 3 Nb
Nd 13 37.52 8.58 65 31 35 36.86 35.24 2.44 12 (36) Nd
Ni 8 35.51 9.33 3.431 15 38.2 33.96 38.44 4.64 7 38.8 0.2 Ni
P 2 55.16 22.71 71.21 39.1 55.16 52.77 55.16 22.71 2 P
Pb 16 39.77 5.34 57.9 33 38.64 39.49 38.96 1.84 14 38.57 0.2 Pb
Pr 10 36.69 1.82 39 33 37.21 36.64 37.16 0.93 7 Pr
Rb 12 32.19 1.48 36 31.02 31.43 32.16 31.63 0.59 10 31.4 0.4 Rb
Re 2 8.12 3.27 10.43 5.8 8.12 7.78 8.12 3.27 2 Re
S 1 16.00 0.00 16 16 16 16.00 16.00 16.00 1 S
Sb 8 37.74 4.46 45.2 32.2 38.46 37.51 38.44 2.26 5 Sb
Sc 9 42.25 7.51 54.6 34 40.35 41.68 41.05 4.09 5 Sc
Sm 17 38.50 7.77 67 32.7 36.8 37.96 36.72 2.63 16 (39) Sm
Sn 5 33.56 9.94 40 16 36.8 31.91 37.96 1.76 4 Sn
Sr 13 76.60 3.74 86.2 72 76.3 76.52 76.15 2.29 11 78.4 0.2 Sr
Ta 6 41.92 5.62 52.7 36.33 40.61 41.64 39.77 2.15 5 Ta
Tb 14 36.14 6.56 52.9 22 36.8 35.58 35.92 2.68 12 Tb
Th 14 36.11 4.41 42.1 23 36.99 35.81 37.23 0.72 11 37.79 0.08 Th
Ti 8 47.68 7.01 57 38.2 47.85 47.22 48.11 3.01 4 (50.1) 0.8 Ti
Tl 8 14.06 2.92 16 7 14.91 13.68 15.07 0.66 7 (15.7) 0.3 Tl
Tm 10 36.24 3.01 39.15 30 37.01 36.12 37.55 1.25 8 Tm
U 20 37.19 3.18 44.1 30 37.37 37.06 37.15 1.23 16 37.38 0.08 U
V 10 40.44 7.54 58.6 32 38.1 39.88 39.22 3.76 8 V
W 3 35.20 7.55 40.1 26.5 39 34.61 39.55 0.78 2 W
Y 11 38.33 3.78 46 31.45 37.9 38.17 38.25 2.14 9 Y
Yb 17 41.20 5.52 55 34 40.02 40.88 39.95 2.86 14 (42) Yb
Zn 8 36.24 10.72 49.4 13 37.15 34.18 37.92 3.86 6 Zn
Zr 9 38.01 3.77 43.5 33.81 37.3 37.85 35.99 1.25 5 Zr
* 95% confidence limits or range , whichever is larg e r.
1 3 8
changes in filter selection producing data of va r y i n g (not volume) of solution. For Nb, Mo, Ta and W, a “sur-
quality at different Z ranges. Lukaszew (1990) used a rogate calibration” (Jenner et al. 1990) was used
spark source mass spectrometric method to determine where the slope of the Nb and Mo calibrations were
the rare earth elements in the NIST SRM 610 glass. determined indire ctly from the Zr calibration, and Ta
and W from the Hf calibration.
Bon ham an d Qua tt le baum ( 1989 ) c oup led a
Nd:YAG laser to a spark source mass spect ro g raph to Fe d o rowich et al. ( 1993) cited a wide range of
a n a l yse a va r i e ty of metals and insulators, including solution nebulisation ICP-MS data for NIST SRM 612 .
both NIST SRM 610 and NIST SRM 612. They state S a m p l es w e r e p re p a r e d f or a n al y s i s a n d t h e i r
clearly that, regarding NIST SRM 610, “the sample was instrument calibrated using a method similar to that of
not homogeneous”, this conclusion being drawn from Jenner et al. (1990).
only four separate analyses and despite their hav i n g
p owd e red (and presumably thoroughly mixed) the Raith et al. ( 1996) used a laser ablation ICP-M S
glass. NIST SRM 612 was also analysed (whether as a technique to determine forty four elements in the NIST
powder or the bulk glass is not stated) and their results SRM 610 and thirty elements in NIST SRM 612. Five
for most elements “fall well within the predicted factor s p e ct ra were acquired from both the NIST glasses, and
of three”. Notable exceptions include Cu and Ag . t h ree spiked glasses produced by P and H Deve l o p -
Many of the data from Bonham and Quattlebaum ments of Glossop U.K. (see above and Hamilton and
d i s ag ree wildly with other published data for the NIST Hopkins 1995). Calibrations we re produced from the
glasses, and most of their data are excluded in the first of Raith et al.’s (1996) acquisitions from each stand a rd ,
calculation of a preferred average by being outside ± 1 using NIST certified or information values and the 75
standard deviation of the overall mean. or 150 µg g-1 concentrations. The remaining four spectra
for each standard were then treated as unknowns. It is
B y the early 1990’s more work had started to not surprising that much of Raith et al.’s data is ve r y
appear on these ref e rence materials, and their po- similar to the NIST information or certified values, and
t e ntial use as microanalytical standards had been whilst these data show the viability of LA-ICP-MS as a
recognised. Hinton (1990), in an ion-microprobe study q u a n t i t a t i ve technique, and demonstrate the linearity
of silicate glasses, cites chemical data for the NBS-610, of LA-ICP-MS calibrations, the calibration is not against
assuming all elements to be present at 500 µg g- 1 external materials thus these data are not included in
unless analyses from elsew h e re we re available (e.g. the averages given in Tables 8 and 9.
Michael (1988) or NIST certified or estimated concen-
trations). Hinton (1990) did not produce any new chemical Most recently, Hollocher and Ruiz (1995) produced
information for NIST SRM 610 and used the actual or a suite of new data for NIST SRM 611 (equivalent to
assumed values in NBS-610 to calibrate the ion micro- NIST SRM 610), NIST SRM 612 and NIST SRM 614 (a
probe instrumentation. In many cases substantial errors nominal 1 µg g-1 ref e rence material). Hollocher and
can occur when the assumed 500 µg g-1 concentrations Ruiz (1995) took only one fragment of glass from each
a re used for calibration, although using compilations sample (weight approximately 150 mg) which wa s
such as the present one, or with new information on crushed b ef o re dissolution of approximately 100 mg in
the NIST glasses, corrections can be made re t ro s p e ct i- H F: H N O 3 in a PTFE bomb, prior to analysis by ICP-MS.
vely to published analyses. Calibration was achieved against synthetic multi element
standards, and for NIST SRM 611 and NIST SRM 612,
J ac k son et al. ( 1992) produced ana lyses of a internal standards from the sample were used, followed
range of elements from duplicate ICP-MS analyses of by normalisation of the data to NIST certified values for
two acid digestions of NIST SRM 612 in a paper dealing Ni, Sr and Pb. It is unclear from the manuscript, how
with laser ablation ICP-MS. These data include many Hollocher and Ruiz (1995) determined their analytical
p e t rologically significant elements (REE, high field e r rors (presumably multiple analyses on the single
s t rength, large ion lithophile elements). Powd e re d solution pre p a red of each sample), or how, hav i n g
samples were analysed using the digestion method of only prepared one solution of each sample, they were
Je nner et a l. ( 199 0), whic h uses a c losed bo mb able to test the statement that “NIST glass SRM’s 611,
H F / H N O 3 a t t ack on 0.1 g sample, f ollowed by a 612 a nd 614 are nominally homogeneous w i t h i n
double eva p o ration with HNO 3. Final solutions we re ex p e c ted analytical uncert a i n ty for ...... minor a n d
prepared in dilute HNO3, made up to a given mass t race elements on the scale of sampling”. H o l l o c h e r
1 3 9
and Rui z (1995) quoted max imum, mini mum a nd All data are summarized in Table 8 (NIST SRM
m e dia n co n ce n trati o n s f rom sev e nt ee n p ubl i ca- 610) and Table 9 (NIST SRM 612) which includes:
t i o n s f o r N I ST S R M 610 a n d f r o m t w e n t y f i v e • the overall average and standard deviation for each
p ublic ations fo r N IST SRM 612 . element,
• the “preferred average” and standard deviation. The
Summary preferred average is the average of all values within
± 1 standard deviation of the overall average. Whilst
In gener al, th e inter- l a b o ratory compa ris on for not widely used in the geostandards litera t u re, the
t h e n ew d at a pr es e n te d h ere is v ery g oo d, p ref e r red ave rage is occasionally re p o rted (see for
a lthou gh in some cases the soluti on ne bulisation e x a m p l e A b b e y e t a l . 19 79 a n d G o v i n d a ra j u
I C P-M S analy ses for some of the l igh t R EE are 1995), and has the adva n t age of re j e cting some
n otab ly lower than data produced in other labo- outlying va l u e s .
ratories (e.g. from Aberystwyth and for some elem e n t s • the range of reported concentrations
f ro m N o t re Da me ). T hi s p h e n o m en o n h a s al s o • the median
b ee n n o t e d i n I C P- M S a n a l y s is b y Ga r be - • the geometric mean (calculated after Sankar Das
S c h ö n b e r g ( 19 93 ) . No n e th el e s s , t he n e w d a t a 19 79 ) .
c o m p a r es v er y fa v o u ra bl y wi t h p u b li sh e d d a t a All ma thematical ca lculations w e re perf o r m e d
p resented elsew h e re , with the exception of some using the spreadsheet package Microsoft Excel ® v5.0.
o f t h e s tu d i e s m e nt i o n e d a b o v e ( e .g . B o n h a m A n a l y ses from R aith et al. ( 1996) and Imbert and
a nd Quat tleb aum 19 8 9 ) . Telouk (1993) we re not used to compute results in
Tables 8 and 9, the former because data were obtained
T h e re are c le a rl y d is c re pa n ci e s i n th e a n a- using a calibration generated from the glasses them-
l y ses of N b and Ta (and to some exte nt Zr and selves and the latter because results were reported as
Hf) , due to problems ret ainin g these el ement s in being semi-quantitative. In addition, the data presen-
s ol u ti o n w i t h o ut H F p re s e n t . T h i s i s e vi d e n t i n ted by Milton and Hutton (1993) has been excluded
b oth t he Aber ystw yth and Me morial I CP-MS ana- from the compilations because of a circular calibration
l y s e s . T h e s e e l e m e n ts a r e u s e f u l p e t r o g e n e t i c s t ra t e g y. Data from the NIST certificate, being a compi-
ind icat ors an d cl ear ly f ur ther d et er mi nation s on lation, is also excluded from the calculations. In most
these elements are nee ded. cases, the data of Bonham and Quattlebaum (1989)
has been excluded by the re j e ction process used to
Several elements prese nt in these glasses calculate the preferred averages, and is clearly distinct
h a v e b ee n d et er min ed on ly a s mal l nu mbe r of from the majority of the data. Otherwise there appears
times. These includ e Mg, P, S, Cl, Ge, Se, Cd, Sn, to be no particular bias between laboratories.
Sb, W and R e. C learly f ur ther determin at ion s of
t hese eleme nts would b e of va l u e . Overall, the NIST SRM 612 glass contains most elements
at concentrations of about 38±12 µg g-1, lower than the
M a j or e le me nt d at a f o r N I ST SR M 610 an d nominal 50 µg g-1 suggested by NIST. NIST SRM 610
N I ST S RM 612 are presented in Table s 1 and 2 contains most elements at about 400±100 µg g - 1 ,
which give an ave rage of all the data . When the again lower than the nominal 500 µg g-1 suggested by
m atrix co mpositio n is normalised back to 10 0 % , N I ST. Studies which have assumed the NIST nominal
i t com pares ex t remel y we ll with the compositi on concentrations may suffer from up to 25% bias.
of the matrix given by NIST, although the absolut e
c o n c e n t rations of the matrix elements are re d uc e d Whilst a large amount of data has been published
by the dilution eff e ct of some sixty elements pres e n t for NIST SRM 612, less is available for NIST SRM 610.
a t no minal 50 µg g - 1 or 500 µg g - 1. This contribution, theref o re, re p resents a substantial
increase in the amount of analytical data available for
Ta bles 6 and 7 present all the av ailable trac e N I ST S RM 610 as we ll a s a ddin g val uable data
e l e m e n t d a t a f o r t h e NI ST S R M 610 an d N I ST t owa rds the fuller characterisation of NIST SRM 612 .
S R M 612 g l a s s e s . F o r N I ST S R M 610 , d a t a i s The summary tables provide ave rages which make
t a k e n fr o m t he f or t y re f e r e nc e s c i t ed . F or N IST these ref e rence materials more useful to the micro -
SRM 612, d ata is taken from the forty nine cited a n alytical community. We will endeavour to maintain
r ef e re n c e s . and update these compilations and would be gra t ef u l
1 4 0
for information concerning sources of published data Carpenter B.S. (1972).
Determination of trace concentrations of boron and
we have overlooked.
uranium in glass by nuclear track technique. Analytical
Chemistry, 44, 600-602.
Ac k n ow l e d g m e n t s
Carpenter B.S. and Pillone L.J. (1986).
The use of delayed nuclear track counting for de-
We are gra t eful to P.J. Potts and two anonymous termining bismuth. In Proceedings of the Seventh
re f e re e s f o r th ei r he l pf u l co m me n ts wh ic h h av e Modern Trends in Activation Analysis. (Copenhagen),
473-478.
i m p roved this contribution.
Chen J.R. , Chao E.C.T. , Back J.M. , Minkin J.A. , Rivers
R ef e re n c e s M.L. , Sutton S.R. , Cygan G.L. , Grossman J.N. and
Reed M.J. (1993)
Rare earth element concentrations in geological and
Abbey S. , Meads R.A. and Belanger P.G. (1979) synthetic samples using synchrotron X-ray fluorescence
Reference samples of rocks - the search for “best values”. analysis. Nuclear Instruments and Methods in Physics
Geostandards Newsletter, 2, 121-133. Research, B75, 576-581.
Barnes L. , Garner E. , Gramlich J. , Moore L. , Murphy Chenery S.P. and Cook J.M. (1993)
T. , Machlan L. , Shields W. , Tatsumoto M. and Knight Determination of rare earth elements in single mineral
R. (1973) grains by laser ablation microprobe inductively coupled
Determination of lead, uranium and thallium in silicate plasma-mass spectrometry - preliminary study. Journal of
glass standard materials by isotope dilution mass spectro- Analytical Atomic Spectrometry, 8, 299-303.
metry. Analytical Chemistry, 45, 880-885.
Colin M. , Freidli C. and Lerch P. (1987)
Barnes S.J. and Gorton M.P. (1984) Trace determination of beryllium by heavy ion activation
Trace element analysis by neutron activation with a low analysis. Journal of Radioanalytical and Nuclear
flux reactor (Slowpoke-II): Results for International Chemistry - Letters, 119, 477-487.
Reference Rocks. Geostandards Newsletter, 8, 17-23.
Conrad C.P. , Rowe M.W. and Gladney E.S. (1982)
Belshaw N.S. , O’Nions R.K. , Martel D. Comparative determination of uranium in silicates by
and Burton K. (1994) delayed neutron activation analysis. Geostandards
High-resolution SIMS analysis of common lead. Chemical Newsletter, 6, 1-4.
Geology, 112, 57-70.
Denoyer E.R. (1990)
Bendicho C. and de Loos Vollerbregt M.T.C. (1990a) Laser sampling ICP-MS of high purity quartz and glasses.
The influence of pyrolysis and matrix modifiers for the Perkin-Elmer Laser Application Report No LAR-5.
analysis of glass materials by graphite furnace atomic
absorption spectrometry using slurry sample extraction. Denoyer E.R. , Fredeen K.J. and Hager J.W. (1991)
Spectrochimica Acta, 45B, 679-693. Laser solid sampling for inductively coupled plasma-mass
spectrometry. Analytical Chemistry, 63, 445A-457A.
Bendicho C. and de Loos Vollerbregt M.T.C. (1990b)
Metal extraction by hydrofluoric acid from slurries of glass Fedorowich J.S. , Richards J.P. , Jain J.C. , Kerrich R. and
materials in graphite furnace atomic absorption spectro- Fan J. (1993)
metry. Spectrochimica Acta, 45B, 695-710. A rapid method for REE and trace element analysis using
laser sampling ICP-MS on direct fusion whole-rock
Benjamin T.M. , Duffy C.J. and Rodgers P.S.Z. (1988) glasses. Chemical Geology, 106, 229-249.
Geochemical utilisation of nuclear microprobes. Nuclear
Instruments and Methods in Physics Research, B30, Fisher L.B. (1986)
454-458. Microwave dissolution of geological material: application
to isotope dilution analysis. Analytical Chemistry, 58,
Bergholz J. , Luck J. , Moller P. and Szacki W. (1974) 261-263.
Funkenquellen - massenspektrometrische analyses des
NBS-SRM 610 (3 mm) standards. Fresenius Zeitschrift für Freidli C. , Diaco Th. and Lerch P. (1987)
Analytische Chemie, 269, 121. Lithium and beryllium trace determination using heavy
ion activation analysis. Journal of Radioanalytical and
Bingham R.A. and Slater P.L. (1976) Nuclear Chemistry - Articles 112, 403-413.
Materials analysis by laser-probe mass spectrometry.
International Journal of Mass Spectrometry and Ion Freidli C. , Colin M. and Lerch P. (1988a)
Physics, 21, 133-144. Studies in heavy ion activation analysis. X. Trace deter-
mination possibilities with 11B ion bombardment. Journal
Bonham R.W. and Quattlebaum J.C. (1989) of Radioanalytical and Nuclear Chemistry - Articles 120,
Coupling of a spark-source mass spectrograph and an 253-265.
Nd:YAG laser. Spectroscopy International, 1, 42-44.
Broekman A. and van Raaphorst J.G. (1983)

Stable isotope dilution analysis by thermal ionisation
mass spectrometry. Fresenius Zeitschrift für Analytische
Chemie, 315, 30-33.
1 4 1
ref e re n c e s Hannaker P. and Hughes T.C. (1977)
Multi-element trace analysis of geological materials with
solvent extraction and flame atomic absorption spectro-
Freidli C. , Colin M. and Lerch P. (1988b) metry. Analytical Chemistry, 49, 1485-1488.
Studies in heavy ion activation analysis. XI. Trace deter-
mination possibilities with 15N ion bombardment. Journal Headridge J.B. and Riddington I.M. (1984)
of Radioanalytical and Nuclear Chemistry - Articles 122, Determination of silver, lead and bismuth in glasses by
115-128. atomic absorption spectrometry with introduction of solid
samples into furnaces. Analyst, 109, 113-118.
Garbe-Schönberg C.-D. (1993)
Simultaneous determination of thirty seven trace elements Heidel R.H. (1971)
in twenty eight international rock standards by ICP-MS. Precision and detection limits of certain minor and trace
Geostandards Newsletter, 17, 81-98. elements in silicates by electron microprobe analysis.
Analytical Chemistry, 43, 1907-1908.
Gladney E.S. , Jurney E.T. and Curtis D.B. (1976)
Nondestructive determination of boron and cadmium in Hinton R.W. (1990)
environmental materials by thermal neutron prompt Ion microprobe trace element analysis of silicates:
gamma-ray spectrometry. Analytical Chemistry, 48, 2139-2142. Measurement of multi-element glasses. Chemical
Geology, 83, 11-25.
Gladney E.S. , Burns C.E. , Perrin D.R. , Robinson R.D.
and Knab D. (1984) Hinton R.W. , Harte B. and Witt-Eickschen G. (1995)
Quality assurance for environmental analytical chemistry: Ion probe measurements of National Institute of
1982. Los Alamos National Laboratory Report LA-9950-MS. Standards and Technology Standard Reference Material
SRM 610 glass, trace elements. Analyst, 120, 1315-1319.
Gladney E.S. , Curtis D.B. and Perrin D.R. (1984)
Determination of boron in thirty five international geo- Hollocher K. and Ruiz J. (1995)
chemical reference materials by thermal neutron capture Major and trace element determinations on NIST glass
prompt gamma-ray spectrometry. Geostandards standard reference materials 611, 612, 614 and 1834 by
Newsletter, 8, 43-46. inductively coupled plasma-mass spectrometry.
Geostandards Newsletter, 19, 27-34.
Gladney E.S. , Curtis D.B. and Perrin D.R. (1985)
Determination of selected rare earth elements in thirty Horn I. , Foley S.F. , Jackson S.E. and Jenner G.A. (1994)
seven international geochemical reference materials by Experimentally determined partitioning of high field
instrumental thermal neutron capture prompt gamma-ray strength elements and selected transition-elements
spectrometry. Geostandards Newsletter, 9, 25-30. between spinel and basaltic melt. Chemical Geology,
117, 193-218.
Gladney E.S. , O’Malley B.T. , Roelandts I.
and Gills T.E. (1987) Imbert J.L and Telouk P. (1993)
Compilation of elemental concentration data for NBS Application of laser ablation ICP-MS to elemental
clinical, biological, geological and environmental stan- analyses of glasses. Mikrochimica Acta, 110, 151-160.
dard reference materials. National Bureau of Standards
Special Publication 260-111, 547pp. Ingamells C.O. and Pitard F.F. (1986)
Applied Geochemical Analysis. John Wiley (New York),
Govindaraju K. (1995) 733pp.
Update (1984-1995) on two GIT-IWG geochemical
reference samples: albite from Italy, AL-I and iron for- Jackson S.E. , Longerich H.P. , Dunning G.R.
mation sample from Greenland, IF-G. Geostandards and Fryer B.J. (1992)
Newsletter, 19, 55-96. The application of laser ablation microprobe inductively
coupled plasma-mass spectrometry (LAM-ICP-MS) to in
Grey P. (1990) situ trace element determinations in minerals. Canadian
Determination of arsenic and lead in catalysts by atomic Mineralogist, 30, 1049-1064.
absorption spectrometry with electrothermal atomisation.
Analyst, 116, 159-165. Jeffries T.E. (1996)
Investigations of mineral analysis by laser ablation in-
Gulson B.L. (1977) ductively coupled plasma-mass spectrometry.
Isotopic and geochemical studies on crustal effects in the Unpublished Ph.D. thesis, University of Wales, Aberystwyth.
genesis of the Woodlawn Pb-Zn-Cu deposit.
Contributions to Mineralogy and Petrology, 65, 227-242. Jeffries T.E. , Pearce N.J.G. , Perkins W.T
and Raith A. (1996)
Hamilton D.L. and Hopkins T.C. (1995) Chemical fractionation during infrared and ultraviolet
Preparation of glasses for use as chemical standards laser ablation inductively coupled plasma-mass spectro-
involving the coprecipitated gel technique. Analyst, 120, metry - implications for mineral microanalysis. Analytical
1373-1377. Communications, 33, 35-39.
Haney M.A. (1977)

Comparison of window glasses by isotope dilution spark
source mass spectrometry. Journal of Forensic Sciences,
22, 534-544.
1 4 2
ref e re n c e s Michael P.J. (1988)
Partition coefficients for rare earth elements in mafic mine-
rals of high silica rhyolites: the importance of accessory
Jenner G.A. , Longerich H.P. , Jackson S.E. mineral inclusions. Geochimica et Cosmochimica Acta,
and Fryer B.J. (1990) 52, 275-282.
ICP-MS - a powerful tool for high precision trace element
analysis in Earth sciences: Evidence from analysis of Milton D.M.P. and Hutton R.C. (1993)
selected U.S.G.S. reference samples. Chemical Geology, Investigations into the suitability of using a secondary
83, 133-148. cathode to analyse glass using glow discharge mass
spectrometry. Spectrochimica Acta, 48B, 39-52.
Johnson W.M. and Maxwell J.A. (1981)
Rock and Mineral Analysis, John Wiley and Sons (New Moore L.J. , Moody J. , Barnes I. , Gramlich J. , Murphy
York), 489pp. T. , Paulsen P. and Shields W. (1973)
Trace determination of rubidium and strontium in silicate
Joyce J.R. and Schweikert E.A. (1984) glass standard reference materials. Analytical Chemistry,
Low energy proton activation with X-ray counting. Journal 45, 2384-2387.
of Trace and Microprobe Techniques, 2, 53-65.
Owens J.W. , Gladney E.S. and Knab D. (1982)
Kanda Y. , Oikawa T. and Niwaguchi T. (1980) Determination of boron in geological materials by
Multi-element determination of trace elements in glass by inductively coupled plasma-emission spectroscopy.
instrumental photon activation analysis. Analytica Analytica Chimica Acta, 135, 169-172.
Chimica Acta, 121, 157-163.
Pearce N.J.G. , Westgate J.A. and Perkins W.T. (1996)
Kim J.I. and Born H.J. (1973) Developments in the analysis of volcanic glass shards by
Monostandard activation analysis and its applications: laser ablation inductively coupled plasma-mass spectro-
analyses of kale powder and NBS standard glass metry. Quaternary International, 34-36, 213-227.
samples. Journal of Radioanalytical Chemistry, 13, 427.
Penev I. , Kuleff I. and Djingova R. (1985)
Kobayashi K. (1986) Simultaneous activation determination of aluminium,
Determination of trace elements in electronic materials by magnesium and silicon in rocks, glasses and pottery.
NAA. Bunseki Kagu, 35, 734-736. Journal of Radioanalytical and Nuclear Chemistry, 96,
219-232.
Kuleff I. , Djingova R. and Penev I. (1984)
Analysis of ancient and medieval glasses by INAA. Perkins W.T. and Pearce N.J.G. (1995)
Journal of Radioanalytical and Nuclear Chemistry, 83, Laserprobe micro-analysis inductively coupled plasma-
333-343. mass spectrometry. In Potts P.J. , Bowles J.F.W. , Reed S.J.B.
and Cave M.R. (ed) “Microprobe Techniques in the
Lass B.D. , Roche N.G. , Sanni A.O. , Schweikert E.A. Earth Sciences”. Chapman Hall (London), 291-325.
and Ojo J.F. (1982)
Heavy ion activation analysis. Journal of Radioanalytical Pouchou J.L. and Pichoir F. (1985)
Chemistry, 70, 251-272. “PAP” φ (ρΖ) procedure for improved quantitative micro-
analysis. In Armstrong J.T. (ed) Microbeam analysis -
Lippolt H.J. , Schleicher H. and Raczek I. (1983) 1985. San Francisco Press (USA), 104-106.
Rb-Sr systematics of Permian volcanites in the
Schwarzwald (SW Germany): Part I: Space of time Raith A. , Godfrey J. and Hutton R.C. (1996)
between plutonism and late orogenic volcanism. Quantitation methods using laser ablation ICP-MS. Part II:
Contributions to Mineralogy and Petrology, 84, 272-280. Evaluation of new glass standards. Fresenius Journal of
Analytical Chemistry, 354, 163-168.
Longerich H.P. , Jenner G.A. , Fryer B.J. and Jackson S.E. (1990)
Inductively coupled plasma-mass spectrometric analysis Rio S. , Metrich N. , Mosbah M. and Massiot P. (1995)
of geological samples: a critical evaluation based on Lithium, boron and beryllium in volcanic glasses and
case studies. Chemical Geology, 83, 105-118. minerals studied by nuclear microprobe. Nuclear
Instruments and Methods in Physics Research, B100,
Lukaszew R.A. (1990) 141-148.
Determination of REE in a glass matrix by spark source
mass spectrometry. Spectrochimica Acta B. 45, 613-614. Rogers P.S.Z. , Duffy C.J. and Benjamin T.M. (1987)
Accuracy of standardless nuclear microprobe trace
Maienthal E.J. (1973) element analyses. Nuclear Instruments and Methods in
Determination of trace elements in silicate matrices by Physics Research, B22, 133-137.
differential cathode ray polarography. Analytical
Chemistry, 45, 644-648. Sankar Das M. (1979)
Geometric means as probable values for compiled data
McGinley J.R. and Schweikert E.A. (1975) on geochemical samples. Geostandards Newsletter, 2,
Determination of lithium, boron and carbon by quasi- 199-205.
prompt charged particle activation analysis. Analytical
Chemistry, 47, 2403-2407.
McGinley J.R. and Schweikert E.A. (1976)

Multi-element charged particle activation analysis with X-
ray counting. Analytical Chemistry, 48, 429-435.
1 4 3
ref e re n c e s
Sheibley D.W. (1973)

Trace elements in instrumental neutron activation analysis
for pollution monitoring. In Babu S.P. (ed) Trace elements
in fuel. Advances in Chemistry Series, 141. American
Chemical Society, (Washington D.C), 98-117.
Stix J. and Gorton M.P. (1992)

Trace element analysis of ten U.S. Geological Survey rock
standards by neutron activation using a low flux reactor.
Geostandards Newsletter, 16, 21-26.
Sutton S.R. , Rivers M.L. , Bajt S. and Jones K.W. (1993)

Synchotron X-ray fluorescence microprobe analysis with
bending magnets and insertion devices. Nuclear
Instruments and Methods in Physics Research, B75, 553-558.
Thompson M. and Walsh J.N. (1983)

A handbook of inductively coupled plasma spectro-
metry. Blackie (Glasgow), 273pp.
Vargas M.E. , Batchelor J.D. and Schweikert E.A. (1987)

Trace determination of lead by Helium-4 activation
analysis. Journal of Radioanalytical and Nuclear
Chemistry-Letters, 119, 81-86.
Virk H.S. (1980)

Intercalibration of glass dosimiters for neutron fluence
determination. International Journal of Applied
Radiation and Isotopes, 31, 649-651.
Webster J.D. (1992)

Fluid-melt interactions involving Cl-rich granites:
Experimental study from 2 to 8 kbar. Geochimica et
Cosmochimica Acta, 56, 659-678.
Westgate J.A. , Perkins W.T. , Fuge R. , Pearce N.J.G.

and Wintle A.G. (1994)
Trace element analysis of volcanic glass shards by laser
ablation inductively coupled plasma-mass spectrometry:
application to Quaternary tephro-chronological studies.
Applied Geochemistry, 9, 323-336.
Woolum D.S. , Burnett D.S. and August L.S. (1976)

Lead-bismuth radiography. Nuclear Instruments and
Methods, 138, 655-662.
Zachmann D. (1985)
Geochemistry of boron in concentrations and host rocks
of Emsian age in the Rheinische Schiefergebirge, Federal
Republic of Germany. Chemical Geology, 48, 213-229.
1 4 4

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Vol. 21 — N°1 06 p.

A Compilation of New and Published Ma j o r

Nicholas J.G. Pe a rc e (1), William T. Pe r k i n s (1), John A. We s tg a t e (2), Michael P. G o rt o n (3),

1 1 5 R e c e i ved 21 May 9 6 — Ac cept ed 17 Dec 96

N I ST, To ronto EPMA , Memorial EPMA , (A) O ve ra l l O ve ra l l N I ST

± one standard dev i a t i o n .

(A) Hollocher and Ruiz (19 9 5 ) .

To ronto EPMA (A) (B) (C) (D) (E) (E) O ve ra l l O ve ra l l N I ST

SiO2 72.29±0.22 71.5 72.17±0.35 72.90±1.40 70.65 71.90±0.96 71.79 72

± one standard dev i a t i o n .

I C P-M S AAS E PMA I C P-M S I C P-M S I C P-A E S I C P-MS sinter, E PMA I N AA

± one standard dev i a t i o n .

I C P-M S AAS I C P-M S I C P-M S I C P-A E S I C P-MS sinter, I C P-MS, Rb and Sr I N AA

Ag 18.91 ± 0.78 22.57 ± 0.38 21.11 ± 1.54 Ag

± one standard deviation.

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

Au Bergholz et al. 1974 MS 405 18

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

Bonham and Quattlebaum 1988 LA-SSMS 30 Freidli et al. 1988b HIAA 42 11

Hollocher and Ruiz 1995 ICP-MS 36 3 Freidli et al. 1987 HIAA 42 3

Sutton et al. 1993 SXRF 37 Lass et al. 1982 HIAA 44 8

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

Sb Denoyer et al. 1991 LA-ICP-MS 74.1 3.3

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

Kobayashi 1986 NA A 37 2 ICP-MS sinter, Memorial (T.S.) ICP-MS 36.2 0.4

E l e m e n t, authors Me t h o d Conc. s E l e m e n t, authors Me t h o d Conc. s

O ve ra l l Range Geometric P ref e r re d

Ag 8 235.4 29.0 267 180 238.5 233.7 239.4 18.6 6 (254) 10 Ag

* 95% con fidence limits or range, which ever is larg e r.

O ve ra l l Range Geometric P ref e r re d

Ag 8 20.44 8.91 31 1 31.26 15.46 21.92 3.26 6 22 0.3 Ag

* 95% confidence limits or range , whichever is larg e r.

Broekman A. and van Raaphorst J.G. (1983)

Haney M.A. (1977)

McGinley J.R. and Schweikert E.A. (1976)

Sheibley D.W. (1973)

Stix J. and Gorton M.P. (1992)

Sutton S.R. , Rivers M.L. , Bajt S. and Jones K.W. (1993)

Thompson M. and Walsh J.N. (1983)

Vargas M.E. , Batchelor J.D. and Schweikert E.A. (1987)

Virk H.S. (1980)

Webster J.D. (1992)

Westgate J.A. , Perkins W.T. , Fuge R. , Pearce N.J.G.

Woolum D.S. , Burnett D.S. and August L.S. (1976)

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