Micro Atxmega PDF
Micro Atxmega PDF
Micro Atxmega PDF
ATxmega128A4U / ATxmega64A4U /
ATxmega32A4U / ATxmega16A4U
Features
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
1. Ordering Information
Ordering code Flash (bytes) EEPROM (bytes) SRAM (bytes) Speed (MHz) Power supply Package (1)(2)(3) Temp.
ATxmega128A4U-AU 128K + 8K 2K 8K
(4)
ATxmega128A4U-AUR 128K + 8K 2K 8K
ATxmega64A4U-AU 64K + 4K 2K 4K
(4)
ATxmega64A4U-AUR 64K + 4K 2K 4K
44A
ATxmega32A4U-AU 32K + 4K 1K 4K
ATxmega32A4U-AUR(4) 32K + 4K 1K 4K
ATxmega16A4U-AU 16K + 4K 1K 2K
(4)
ATxmega16A4U-AUR 16K + 4K 1K 2K
ATxmega128A4U-MH 128K + 8K 2K 8K
(4)
ATxmega128A4U-MHR 128K + 8K 2K 8K
PW
ATxmega64A4U-MH 64K + 4K 2K 4K
ATxmega64A4U-MHR(4) 64K + 4K 2K 4K
32 1.6 - 3.6V -40°C - 85°C
ATxmega32A4U-MH 32K + 4K 1K 4K
ATxmega32A4U-MHR(4) 32K + 4K 1K 4K
44M1
ATxmega16A4U-MH 16K + 4K 1K 2K
ATxmega16A4U-MHR(4) 16K + 4K 1K 2K
ATxmega128A4U-CU 128K + 8K 2K 8K
(4)
ATxmega128A4U-CUR 128K + 8K 2K 8K
ATxmega64A4U-CU 64K + 4K 2K 4K
(4)
ATxmega64A4U-CUR 64K + 4K 2K 4K
49C2
ATxmega32A4U-CU 32K + 4K 1K 4K
ATxmega32A4U-CUR(4) 32K + 4K 1K 4K
ATxmega16A4U-CU 16K + 4K 1K 2K
(4)
ATxmega16A4U-CUR 16K + 4K 1K 2K
ATxmega128A4U-AN 128K + 8K 2K 8K
ATxmega128A4U-ANR(4) 128K + 8K 2K 8K
ATxmega64A4U-AN 64K + 4K 2K 4K
ATxmega64A4U-ANR(4) 64K + 4K 2K 4K
44A
ATxmega32A4U-AN 32K + 4K 1K 4K
ATxmega32A4U-ANR(4) 32K + 4K 1K 4K
ATxmega16A4U-AN 16K + 4K 1K 2K
ATxmega16A4U-ANR(4) 16K + 4K 1K 2K
32 1.6 - 3.6V 0°C - 105°C
ATxmega128A4U-M7 128K + 8K 2K 8K
ATxmega128A4U-M7R(4) 128K + 8K 2K 8K
PW
ATxmega64A4U-M7 64K + 4K 2K 4K
ATxmega64A4U-M7R(4) 64K + 4K 2K 4K
ATxmega32A4U-M7 32K + 4K 1K 4K
ATxmega32A4U-M7R(4) 32K + 4K 1K 4K
44M1
ATxmega16A4U-M7 16K + 4K 1K 2K
ATxmega16A4U-M7R(4) 16K + 4K 1K 2K
Notes: 1. This device can also be supplied in wafer form. Please contact your local Atmel sales office for detailed ordering information.
2. Pb-free packaging, complies to the European Directive for Restriction of Hazardous Substances (RoHS directive). Also Halide free and fully Green.
3. For packaging information, see “Instruction Set Summary” on page 63.
4. Tape and Reel
Package Type
44A 44-Lead, 10 x 10mm body size, 1.0mm body thickness, 0.8mm lead pitch, thin profile plastic quad flat package (TQFP)
44M1 44-Pad, 7x7x1mm body, lead pitch 0.50mm, 5.20mm exposed pad, thermally enhanced plastic very thin quad no lead package (VQFN)
PW 44-Pad, 7x7x1mm body, lead pitch 0.50mm, 5.20mm exposed pad, thermally enhanced plastic very thin quad no lead package (VQFN)
49C2 49-Ball (7 x 7 Array), 0.65mm Pitch, 5.0 x 5.0 x 1.0mm, very thin, fine-pitch ball grid array package (VFBGA)
Typical Applications
Industrial control Climate control Low power battery applications
RESET/PDI
Digital function General Purpose I /O
Analog function / Oscillators
AVCC
GND
PA4
PA3
PA2
PA1
PA0
PR1
PR0
PDI
44
43
42
41
40
39
38
37
36
35
34
Port R
XOSC TOSC
PC0 10 24 PD4
USART0:1
USART0:1
USART0
IRCOM
TC0:1
TC0:1
USB
TC0
TWI
TWI
SPI
SPI
PC1 11 23 PD3
Port C Port D Port E
12
13
14
15
16
17
18
19
20
21
22
PC2
PC3
PC4
PC5
PC6
PC7
GND
PD0
PD1
PD2
VCC
Note: 1. For full details on pinout and pin functions refer to “Pinout and Pin Functions” on page 55.
A A
B B
C C
D D
E E
F F
G G
1 2 3 4 5 6 7
RESET/
B PA4 PA1 PA0 GND PE2 VCC
PDI_CLK
XTAL2/
TOSC2
Oscillator
Circuits/
Clock Real Time Watchdog
PORT R (2) Generation Counter Oscillator
RESET/
AREFA Prog/Debug PDI_CLK
BUS Matrix PDI
Controller
PDI_DATA
Int. Refs.
AES
Tempref
OCD
AREFB DES
CPU Interrupt
Controller
PB[0..7] PORT B (8) CRC
Flash EEPROM
IRCOM
DATA BUS
USARTD0:1
USARTE0
TCC0:1
TCD0:1
TWIC
TCE0
TWIE
SPIC
SPID
USB
TOSC1 (optional)
TOSC2
(optional)
6.1 Features
z 8/16-bit, high-performance Atmel AVR RISC CPU
z 142 instructions
z Hardware multiplier
z 32x8-bit registers directly connected to the ALU
z Stack in RAM
z Stack pointer accessible in I/O memory space
z Direct addressing of up to 16MB of program memory and 16MB of data memory
z True 16/24-bit access to 16/24-bit I/O registers
z Efficient support for 8-, 16-, and 32-bit arithmetic
z Configuration change protection of system-critical features
6.2 Overview
All Atmel AVR XMEGA devices use the 8/16-bit AVR CPU. The main function of the CPU is to execute the code and
perform all calculations. The CPU is able to access memories, perform calculations, control peripherals, and execute
the program in the flash memory. Interrupt handling is described in a separate section, refer to “Interrupts and
Programmable Multilevel Interrupt Controller” on page 29.
The arithmetic logic unit (ALU) supports arithmetic and logic operations between registers or between a constant and
a register. Single-register operations can also be executed in the ALU. After an arithmetic operation, the status
register is updated to reflect information about the result of the operation.
The ALU is directly connected to the fast-access register file. The 32 x 8-bit general purpose working registers all
have single clock cycle access time allowing single-cycle arithmetic logic unit (ALU) operation between registers or
between a register and an immediate. Six of the 32 registers can be used as three 16-bit address pointers for program
and data space addressing, enabling efficient address calculations.
The memory spaces are linear. The data memory space and the program memory space are two different memory
spaces.
The data memory space is divided into I/O registers, SRAM, and external RAM. In addition, the EEPROM can be
memory mapped in the data memory.
All I/O status and control registers reside in the lowest 4KB addresses of the data memory. This is referred to as the
I/O memory space. The lowest 64 addresses can be accessed directly, or as the data space locations from 0x00 to
0x3F. The rest is the extended I/O memory space, ranging from 0x0040 to 0x0FFF. I/O registers here must be
accessed as data space locations using load (LD/LDS/LDD) and store (ST/STS/STD) instructions.
The SRAM holds data. Code execution from SRAM is not supported. It can easily be accessed through the five
different addressing modes supported in the AVR architecture. The first SRAM address is 0x2000.
Data addresses 0x1000 to 0x1FFF are reserved for memory mapping of EEPROM.
The program memory is divided in two sections, the application program section and the boot program section. Both
sections have dedicated lock bits for write and read/write protection. The SPM instruction that is used for self-
programming of the application flash memory must reside in the boot program section. The application section
contains an application table section with separate lock bits for write and read/write protection. The application table
section can be used for safe storing of nonvolatile data in the program memory.
7.1 Features
z Flash program memory
z One linear address space
z In-system programmable
z Self-programming and boot loader support
z Application section for application code
z Application table section for application code or data storage
z Boot section for application code or boot loader code
z Separate read/write protection lock bits for all sections
z Built in fast CRC check of a selectable flash program memory section
z Data memory
z One linear address space
z Single-cycle access from CPU
z SRAM
z EEPROM
z Byte and page accessible
z Optional memory mapping for direct load and store
z I/O memory
z Configuration and status registers for all peripherals and modules
z 16 bit-accessible general purpose registers for global variables or flags
z Bus arbitration
z Deterministic priority handling between CPU, DMA controller, and other bus masters
z Separate buses for SRAM, EEPROM and I/O memory
z Simultaneous bus access for CPU and DMA controller
z Production signature row memory for factory programmed data
z ID for each microcontroller device type
z Serial number for each device
z Calibration bytes for factory calibrated peripherals
z User signature row
z One flash page in size
z Can be read and written from software
z Content is kept after chip erase
7.2 Overview
The Atmel AVR architecture has two main memory spaces, the program memory and the data memory. Executable
code can reside only in the program memory, while data can be stored in the program memory and the data memory.
The data memory includes the internal SRAM, and EEPROM for nonvolatile data storage. All memory spaces are
linear and require no memory bank switching. Nonvolatile memory (NVM) spaces can be locked for further write and
read/write operations. This prevents unrestricted access to the application software.
A separate memory section contains the fuse bytes. These are used for configuring important system functions, and
can only be written by an external programmer.
The available memory size configurations are shown in “Ordering Information” on page 2. In addition, each device has
a Flash memory signature row for calibration data, device identification, serial number etc.
Word Address
0 0 0 0 Application Section
(128K/64K/32K/16K)
...
Table 7-2. Device ID bytes for Atmel AVR XMEGA A4U devices.
ATxmega16A4U 41 94 1E
ATxmega32A4U 41 95 1E
ATxmega64A4U 46 96 1E
ATxmega128A4U 46 97 1E
0 0 0
I/O Registers (4K) I/O Registers (4K) I/O Registers (4K)
FFF FFF FFF
0
I/O Registers (4K)
FFF
1000
EEPROM (2K)
17FF
RESERVED
2000
Internal SRAM (8K)
3FFF
7.6 EEPROM
All devices have EEPROM for nonvolatile data storage. It is either addressable in a separate data space (default) or
memory mapped and accessed in normal data space. The EEPROM supports both byte and page access. Memory
mapped EEPROM allows highly efficient EEPROM reading and EEPROM buffer loading. When doing this, EEPROM
is accessible using load and store instructions. Memory mapped EEPROM will always start at hexadecimal address
0x1000.
Devices PC size Flash size Page Size FWORD FPAGE Application Boot
No of No of
bits bytes words Size Size
pages pages
Table 7-4 shows EEPROM memory organization for the Atmel AVR XMEGA A4U devices. EEEPROM write and
erase operations can be performed one page or one byte at a time, while reading the EEPROM is done one byte at a
time. For EEPROM access the NVM address register (ADDR[m:n]) is used for addressing. The most significant bits in
the address (E2PAGE) give the page number and the least significant address bits (E2BYTE) give the byte in the
page.
Size bytes
8.1 Features
z Allows high speed data transfers with minimal CPU intervention
z from data memory to data memory
z from data memory to peripheral
z from peripheral to data memory
z from peripheral to peripheral
z Four DMA channels with separate
z transfer triggers
z interrupt vectors
z addressing modes
z Programmable channel priority
z From 1 byte to 16MB of data in a single transaction
z Up to 64KB block transfers with repeat
z 1, 2, 4, or 8 byte burst transfers
z Multiple addressing modes
z Static
z Incremental
z Decremental
z Optional reload of source and destination addresses at the end of each
z Burst
z Block
z Transaction
z Optional interrupt on end of transaction
z Optional connection to CRC generator for CRC on DMA data
8.2 Overview
The four-channel direct memory access (DMA) controller can transfer data between memories and peripherals, and
thus offload these tasks from the CPU. It enables high data transfer rates with minimum CPU intervention, and frees
up CPU time. The four DMA channels enable up to four independent and parallel transfers.
The DMA controller can move data between SRAM and peripherals, between SRAM locations and directly between
peripheral registers. With access to all peripherals, the DMA controller can handle automatic transfer of data to/from
communication modules. The DMA controller can also read from memory mapped EEPROM.
Data transfers are done in continuous bursts of 1, 2, 4, or 8 bytes. They build block transfers of configurable size from
1 byte to 64KB. A repeat counter can be used to repeat each block transfer for single transactions up to 16MB. Source
and destination addressing can be static, incremental or decremental. Automatic reload of source and/or destination
addresses can be done after each burst or block transfer, or when a transaction is complete. Application software,
peripherals, and events can trigger DMA transfers.
The four DMA channels have individual configuration and control settings. This include source, destination, transfer
triggers, and transaction sizes. They have individual interrupt settings. Interrupt requests can be generated when a
transaction is complete or when the DMA controller detects an error on a DMA channel.
To allow for continuous transfers, two channels can be interlinked so that the second takes over the transfer when the
first is finished, and vice versa.
9.1 Features
z System for direct peripheral-to-peripheral communication and signaling
z Peripherals can directly send, receive, and react to peripheral events
z CPU and DMA controller independent operation
z 100% predictable signal timing
z Short and guaranteed response time
z Eight event channels for up to eight different and parallel signal routing configurations
z Events can be sent and/or used by most peripherals, clock system, and software
z Additional functions include
z Quadrature decoders
z Digital filtering of I/O pin state
z Works in active mode and idle sleep mode
9.2 Overview
The event system enables direct peripheral-to-peripheral communication and signaling. It allows a change in one
peripheral’s state to automatically trigger actions in other peripherals. It is designed to provide a predictable system
for short and predictable response times between peripherals. It allows for autonomous peripheral control and
interaction without the use of interrupts, CPU, or DMA controller resources, and is thus a powerful tool for reducing the
complexity, size and execution time of application code. It also allows for synchronized timing of actions in several
peripheral modules.
A change in a peripheral’s state is referred to as an event, and usually corresponds to the peripheral’s interrupt
conditions. Events can be directly passed to other peripherals using a dedicated routing network called the event
routing network. How events are routed and used by the peripherals is configured in software.
Figure 9-1 on page 20 shows a basic diagram of all connected peripherals. The event system can directly connect
together analog and digital converters, analog comparators, I/O port pins, the real-time counter, timer/counters, IR
communication module (IRCOM), and USB interface. It can also be used to trigger DMA transactions (DMA
controller). Events can also be generated from software and the peripheral clock.
Real Time
Event Counter
AC System
Controller Timer /
Counters
DAC
USB
The event routing network consists of eight software-configurable multiplexers that control how events are routed and
used. These are called event channels, and allow for up to eight parallel event routing configurations. The maximum
routing latency is two peripheral clock cycles. The event system works in both active mode and idle sleep mode.
10.1 Features
z Fast start-up time
z Safe run-time clock switching
z Internal oscillators:
z 32MHz run-time calibrated and tuneable oscillator
z 2MHz run-time calibrated oscillator
z 32.768kHz calibrated oscillator
z 32kHz ultra low power (ULP) oscillator with 1kHz output
z External clock options
z 0.4MHz - 16MHz crystal oscillator
z 32.768kHz crystal oscillator
z External clock
z PLL with 20MHz - 128MHz output frequency
z Internal and external clock options and 1x to 31x multiplication
z Lock detector
z Clock prescalers with 1x to 2048x division
z Fast peripheral clocks running at two and four times the CPU clock
z Automatic run-time calibration of internal oscillators
z External oscillator and PLL lock failure detection with optional non-maskable interrupt
10.2 Overview
Atmel AVR XMEGA A4U devices have a flexible clock system supporting a large number of clock sources. It
incorporates both accurate internal oscillators and external crystal oscillator and resonator support. A high-frequency
phase locked loop (PLL) and clock prescalers can be used to generate a wide range of clock frequencies. A
calibration feature (DFLL) is available, and can be used for automatic run-time calibration of the internal oscillators to
remove frequency drift over voltage and temperature. An oscillator failure monitor can be enabled to issue a non-
maskable interrupt and switch to the internal oscillator if the external oscillator or PLL fails.
When a reset occurs, all clock sources except the 32kHz ultra low power oscillator are disabled. After reset, the
device will always start up running from the 2MHz internal oscillator. During normal operation, the system clock
source and prescalers can be changed from software at any time.
Figure 10-1 on page 22 presents the principal clock system in the XMEGA A4U family of devices. Not all of the clocks
need to be active at a given time. The clocks for the CPU and peripherals can be stopped using sleep modes and
power reduction registers, as described in “Power Management and Sleep Modes” on page 24.
clkPER
clkPER2 clkCPU
clkPER4
USB
clkUSB
System Clock Prescalers
Brown-out Watchdog
Prescaler
Detector Timer
clkSYS
clkRTC
System Clock Multiplexer
RTCSRC (SCLKSEL) USBSRC
DIV32
DIV32
DIV32
PLL
PLLSRC
DIV4
XOSCSEL
TOSC2
XTAL1
XTAL2
11.1 Features
z Power management for adjusting power consumption and functions
z Five sleep modes
z Idle
z Power down
z Power save
z Standby
z Extended standby
z Power reduction register to disable clock and turn off unused peripherals in active and idle modes
11.2 Overview
Various sleep modes and clock gating are provided in order to tailor power consumption to application requirements.
This enables the Atmel AVR XMEGA microcontroller to stop unused modules to save power.
All sleep modes are available and can be entered from active mode. In active mode, the CPU is executing application
code. When the device enters sleep mode, program execution is stopped and interrupts or a reset is used to wake the
device again. The application code decides which sleep mode to enter and when. Interrupts from enabled peripherals
and all enabled reset sources can restore the microcontroller from sleep to active mode.
In addition, power reduction registers provide a method to stop the clock to individual peripherals from software. When
this is done, the current state of the peripheral is frozen, and there is no power consumption from that peripheral. This
reduces the power consumption in active mode and idle sleep modes and enables much more fine-tuned power
management than sleep modes alone.
12.1 Features
z Reset the microcontroller and set it to initial state when a reset source goes active
z Multiple reset sources that cover different situations
z Power-on reset
z External reset
z Watchdog reset
z Brownout reset
z PDI reset
z Software reset
z Asynchronous operation
z No running system clock in the device is required for reset
z Reset status register for reading the reset source from the application code
12.2 Overview
The reset system issues a microcontroller reset and sets the device to its initial state. This is for situations where
operation should not start or continue, such as when the microcontroller operates below its power supply rating. If a
reset source goes active, the device enters and is kept in reset until all reset sources have released their reset. The
I/O pins are immediately tri-stated. The program counter is set to the reset vector location, and all I/O registers are set
to their initial values. The SRAM content is kept. However, if the device accesses the SRAM when a reset occurs, the
content of the accessed location can not be guaranteed.
After reset is released from all reset sources, the default oscillator is started and calibrated before the device starts
running from the reset vector address. By default, this is the lowest program memory address, 0, but it is possible to
move the reset vector to the lowest address in the boot section.
The reset functionality is asynchronous, and so no running system clock is required to reset the device. The software
reset feature makes it possible to issue a controlled system reset from the user software.
The reset status register has individual status flags for each reset source. It is cleared at power-on reset, and shows
which sources have issued a reset since the last power-on.
13.1 Features
z Issues a device reset if the timer is not reset before its timeout period
z Asynchronous operation from dedicated oscillator
z 1kHz output of the 32kHz ultra low power oscillator
z 11 selectable timeout periods, from 8ms to 8s
z Two operation modes:
z Normal mode
z Window mode
z Configuration lock to prevent unwanted changes
13.2 Overview
The watchdog timer (WDT) is a system function for monitoring correct program operation. It makes it possible to
recover from error situations such as runaway or deadlocked code. The WDT is a timer, configured to a predefined
timeout period, and is constantly running when enabled. If the WDT is not reset within the timeout period, it will issue
a microcontroller reset. The WDT is reset by executing the WDR (watchdog timer reset) instruction from the
application code.
The window mode makes it possible to define a time slot or window inside the total timeout period during which WDT
must be reset. If the WDT is reset outside this window, either too early or too late, a system reset will be issued.
Compared to the normal mode, this can also catch situations where a code error causes constant WDR execution.
The WDT will run in active mode and all sleep modes, if enabled. It is asynchronous, runs from a CPU-independent
clock source, and will continue to operate to issue a system reset even if the main clocks fail.
The configuration change protection mechanism ensures that the WDT settings cannot be changed by accident. For
increased safety, a fuse for locking the WDT settings is also available.
14.1 Features
z Short and predictable interrupt response time
z Separate interrupt configuration and vector address for each interrupt
z Programmable multilevel interrupt controller
z Interrupt prioritizing according to level and vector address
z Three selectable interrupt levels for all interrupts: low, medium and high
z Selectable, round-robin priority scheme within low-level interrupts
z Non-maskable interrupts for critical functions
z Interrupt vectors optionally placed in the application section or the boot loader section
14.2 Overview
Interrupts signal a change of state in peripherals, and this can be used to alter program execution. Peripherals can
have one or more interrupts, and all are individually enabled and configured. When an interrupt is enabled and
configured, it will generate an interrupt request when the interrupt condition is present. The programmable multilevel
interrupt controller (PMIC) controls the handling and prioritizing of interrupt requests. When an interrupt request is
acknowledged by the PMIC, the program counter is set to point to the interrupt vector, and the interrupt handler can
be executed.
All peripherals can select between three different priority levels for their interrupts: low, medium, and high. Interrupts
are prioritized according to their level and their interrupt vector address. Medium-level interrupts will interrupt low-level
interrupt handlers. High-level interrupts will interrupt both medium- and low-level interrupt handlers. Within each level,
the interrupt priority is decided from the interrupt vector address, where the lowest interrupt vector address has the
highest interrupt priority. Low-level interrupts have an optional round-robin scheduling scheme to ensure that all
interrupts are serviced within a certain amount of time.
Non-maskable interrupts (NMI) are also supported, and can be used for system critical functions.
Program address
(base address) Source Interrupt description
0x000 RESET
15.1 Features
z 34 general purpose input and output pins with individual configuration
z Output driver with configurable driver and pull settings:
z Totem-pole
z Wired-AND
z Wired-OR
z Bus-keeper
z Inverted I/O
z Input with synchronous and/or asynchronous sensing with interrupts and events
z Sense both edges
z Sense rising edges
z Sense falling edges
z Sense low level
z Optional pull-up and pull-down resistor on input and Wired-OR/AND configurations
z Optional slew rate control
z Asynchronous pin change sensing that can wake the device from all sleep modes
z Two port interrupts with pin masking per I/O port
z Efficient and safe access to port pins
z Hardware read-modify-write through dedicated toggle/clear/set registers
z Configuration of multiple pins in a single operation
z Mapping of port registers into bit-accessible I/O memory space
z Peripheral clocks output on port pin
z Real-time counter clock output to port pin
z Event channels can be output on port pin
z Remapping of digital peripheral pin functions
z Selectable USART, SPI, and timer/counter input/output pin locations
15.2 Overview
One port consists of up to eight port pins: pin 0 to 7. Each port pin can be configured as input or output with
configurable driver and pull settings. They also implement synchronous and asynchronous input sensing with
interrupts and events for selectable pin change conditions. Asynchronous pin-change sensing means that a pin
change can wake the device from all sleep modes, included the modes where no clocks are running.
All functions are individual and configurable per pin, but several pins can be configured in a single operation. The pins
have hardware read-modify-write (RMW) functionality for safe and correct change of drive value and/or pull resistor
configuration. The direction of one port pin can be changed without unintentionally changing the direction of any other
pin.
The port pin configuration also controls input and output selection of other device functions. It is possible to have both
the peripheral clock and the real-time clock output to a port pin, and available for external use. The same applies to
events from the event system that can be used to synchronize and control external functions. Other digital
peripherals, such as USART, SPI, and timer/counters, can be remapped to selectable pin locations in order to
optimize pin-out versus application needs.
The notation of the ports are PORTA, PORTB, PORTC, PORTD, PORTE, and PORTR.
DIRn
OUTn Pn
INn
15.3.2 Pull-down
DIRn
OUTn Pn
INn
15.3.3 Pull-up
DIRn
OUTn Pn
INn
15.3.4 Bus-keeper
The bus-keeper’s weak output produces the same logical level as the last output level. It acts as a pull-up if the last
level was ‘1’, and pull-down if the last level was ‘0’.
DIRn
OUTn Pn
INn
15.3.5 Others
OUTn
Pn
INn
INn
Pn
OUTn
EDGE
Interrupt
DETECT IREQ
Control
Synchronous sensing
Pn Synchronizer
INn
EDGE
D Q D Q
DETECT Event
INVERTED I/O R R
When a pin is configured with inverted I/O, the pin value is inverted before the input sensing.
16.1 Features
z Five 16-bit timer/counters
z Three timer/counters of type 0
z Two timer/counters of type 1
z Split-mode enabling two 8-bit timer/counter from each timer/counter type 0
z 32-bit timer/counter support by cascading two timer/counters
z Up to four compare or capture (CC) channels
z Four CC channels for timer/counters of type 0
z Two CC channels for timer/counters of type 1
z Double buffered timer period setting
z Double buffered capture or compare channels
z Waveform generation:
z Frequency generation
z Single-slope pulse width modulation
z Dual-slope pulse width modulation
z Input capture:
z Input capture with noise cancelling
z Frequency capture
z Pulse width capture
z 32-bit input capture
z Timer overflow and error interrupts/events
z One compare match or input capture interrupt/event per CC channel
z Can be used with event system for:
z Quadrature decoding
z Count and direction control
z Capture
z Can be used with DMA and to trigger DMA transactions
z High-resolution extension
z Increases frequency and waveform resolution by 4x (2-bit) or 8x (3-bit)
z Advanced waveform extension:
z Low- and high-side output with programmable dead-time insertion (DTI)
z Event controlled fault protection for safe disabling of drivers
16.2 Overview
Atmel AVR XMEGA devices have a set of five flexible 16-bit Timer/Counters (TC). Their capabilities include accurate
program execution timing, frequency and waveform generation, and input capture with time and frequency
measurement of digital signals. Two timer/counters can be cascaded to create a 32-bit timer/counter with optional 32-
bit capture.
A timer/counter consists of a base counter and a set of compare or capture (CC) channels. The base counter can be
used to count clock cycles or events. It has direction control and period setting that can be used for timing. The CC
channels can be used together with the base counter to do compare match control, frequency generation, and pulse
width waveform modulation, as well as various input capture operations. A timer/counter can be configured for either
capture or compare functions, but cannot perform both at the same time.
A timer/counter can be clocked and timed from the peripheral clock with optional prescaling or from the event system.
The event system can also be used for direction control and capture trigger or to synchronize operations.
Timer/Counter
Base Counter Prescaler clkPER
Timer Period
Control Logic
Counter Event
System
clkPER4
Compare/Capture Channel D
Compare/Capture Channel C
AWeX
Compare/Capture Channel B
Hi-Res
PORT
Pattern
Compare/Capture Channel A Dead-Time Generation
Capture Insertion Fault
Comparator
Control Protection
Waveform
Buffer
Generation
PORTC and PORTD each has one Timer/Counter 0 and one Timer/Counter1. PORTE has one Timer/Conter0.
Notation of these are TCC0 (Time/Counter C0), TCC1, TCD0, TCD1 and TCE0, respectively.
17.1 Features
z Six eight-bit timer/counters
z Three Low-byte timer/counter
z Three High-byte timer/counter
z Up to eight compare channels in each Timer/Counter 2
z Four compare channels for the low-byte timer/counter
z Four compare channels for the high-byte timer/counter
z Waveform generation
z Single slope pulse width modulation
z Timer underflow interrupts/events
z One compare match interrupt/event per compare channel for the low-byte timer/counter
z Can be used with the event system for count control
z Can be used to trigger DMA transactions
17.2 Overview
There are four Timer/Counter 2. These are realized when a Timer/Counter 0 is set in split mode. It is then a system of
two eight-bit timer/counters, each with four compare channels. This results in eight configurable pulse width
modulation (PWM) channels with individually controlled duty cycles, and is intended for applications that require a
high number of PWM channels.
The two eight-bit timer/counters in this system are referred to as the low-byte timer/counter and high-byte
timer/counter, respectively. The difference between them is that only the low-byte timer/counter can be used to
generate compare match interrupts, events and DMA triggers. The two eight-bit timer/counters have a shared clock
source and separate period and compare settings. They can be clocked and timed from the peripheral clock, with
optional prescaling, or from the event system. The counters are always counting down.
PORTC, and PORTD each has one Timer/Counter 2.
Notation of these are TCC2 (Time/Counter C2) and TCD2, respectively.
18.1 Features
z Waveform output with complementary output from each compare channel
z Four dead-time insertion (DTI) units
z 8-bit resolution
z Separate high and low side dead-time setting
z Double buffered dead time
z Optionally halts timer during dead-time insertion
z Pattern generation unit creating synchronised bit pattern across the port pins
z Double buffered pattern generation
z Optional distribution of one compare channel output across the port pins
z Event controlled fault protection for instant and predictable fault triggering
18.2 Overview
The advanced waveform extension (AWeX) provides extra functions to the timer/counter in waveform generation
(WG) modes. It is primarily intended for use with different types of motor control and other power control applications.
It enables low- and high side output with dead-time insertion and fault protection for disabling and shutting down
external drivers. It can also generate a synchronized bit pattern across the port pins.
Each of the waveform generator outputs from the timer/counter 0 are split into a complimentary pair of outputs when
any AWeX features are enabled. These output pairs go through a dead-time insertion (DTI) unit that generates the
non-inverted low side (LS) and inverted high side (HS) of the WG output with dead-time insertion between LS and HS
switching. The DTI output will override the normal port value according to the port override setting.
The pattern generation unit can be used to generate a synchronized bit pattern on the port it is connected to. In
addition, the WG output from compare channel A can be distributed to and override all the port pins. When the pattern
generator unit is enabled, the DTI unit is bypassed.
The fault protection unit is connected to the event system, enabling any event to trigger a fault condition that will
disable the AWeX output. The event system ensures predictable and instant fault reaction, and gives flexibility in the
selection of fault triggers.
The AWeX is available for TCC0. The notation of this is AWEXC.
19.1 Features
z Increases waveform generator resolution up to 8x (three bits)
z Supports frequency, single-slope PWM, and dual-slope PWM generation
z Supports the AWeX when this is used for the same timer/counter
19.2 Overview
The high-resolution (hi-res) extension can be used to increase the resolution of the waveform generation output from
a timer/counter by four or eight. It can be used for a timer/counter doing frequency, single-slope PWM, or dual-slope
PWM generation. It can also be used with the AWeX if this is used for the same timer/counter.
The hi-res extension uses the peripheral 4x clock (ClkPER4). The system clock prescalers must be configured so the
peripheral 4x clock frequency is four times higher than the peripheral and CPU clock frequency when the hi-res
extension is enabled.
There are three hi-res extensions that each can be enabled for each timer/counters pair on PORTC, PORTD and
PORTE. The notation of these are HIRESC, HIRESD and HIRESE, respectively.
20.1 Features
z 16-bit resolution
z Selectable clock source
z 32.768kHz external crystal
z External clock
z 32.768kHz internal oscillator
z 32kHz internal ULP oscillator
z Programmable 10-bit clock prescaling
z One compare register
z One period register
z Clear counter on period overflow
z Optional interrupt/event on overflow and compare match
20.2 Overview
The 16-bit real-time counter (RTC) is a counter that typically runs continuously, including in low-power sleep modes,
to keep track of time. It can wake up the device from sleep modes and/or interrupt the device at regular intervals.
The reference clock is typically the 1.024kHz output from a high-accuracy crystal of 32.768kHz, and this is the
configuration most optimized for low power consumption. The faster 32.768kHz output can be selected if the RTC
needs a resolution higher than 1ms. The RTC can also be clocked from an external clock signal, the 32.768kHz
internal oscillator or the 32kHz internal ULP oscillator.
The RTC includes a 10-bit programmable prescaler that can scale down the reference clock before it reaches the
counter. A wide range of resolutions and time-out periods can be configured. With a 32.768kHz clock source, the
maximum resolution is 30.5µs, and time-out periods can range up to 2000 seconds. With a resolution of 1s, the
maximum timeout period is more than18 hours (65536 seconds). The RTC can give a compare interrupt and/or event
when the counter equals the compare register value, and an overflow interrupt and/or event when it equals the period
register value.
External Clock
TOSC1
32.768kHz Crystal Osc
TOSC2
DIV32
RTCSRC PER
TOP/
clkRTC =
Overflow
10-bit
CNT
prescaler
”match”/
=
Compare
COMP
21.1 Features
z One USB 2.0 full speed (12Mbps) and low speed (1.5Mbps) device compliant interface
z Integrated on-chip USB transceiver, no external components needed
z 16 endpoint addresses with full endpoint flexibility for up to 31 endpoints
z One input endpoint per endpoint address
z One output endpoint per endpoint address
z Endpoint address transfer type selectable to
z Control transfers
z Interrupt transfers
z Bulk transfers
z Isochronous transfers
z Configurable data payload size per endpoint, up to 1023 bytes
z Endpoint configuration and data buffers located in internal SRAM
z Configurable location for endpoint configuration data
z Configurable location for each endpoint's data buffer
z Built-in direct memory access (DMA) to internal SRAM for:
z Endpoint configurations
z Reading and writing endpoint data
z Ping-pong operation for higher throughput and double buffered operation
z Input and output endpoint data buffers used in a single direction
z CPU/DMA controller can update data buffer during transfer
z Multipacket transfer for reduced interrupt load and software intervention
z Data payload exceeding maximum packet size is transferred in one continuous transfer
z No interrupts or software interaction on packet transaction level
z Transaction complete FIFO for workflow management when using multiple endpoints
z Tracks all completed transactions in a first-come, first-served work queue
z Clock selection independent of system clock source and selection
z Minimum 1.5MHz CPU clock required for low speed USB operation
z Minimum 12MHz CPU clock required for full speed operation
z Connection to event system
z On chip debug possibilities during USB transactions
21.2 Overview
The USB module is a USB 2.0 full speed (12Mbps) and low speed (1.5Mbps) device compliant interface.
The USB supports 16 endpoint addresses. All endpoint addresses have one input and one output endpoint, for a total
of 31 configurable endpoints and one control endpoint. Each endpoint address is fully configurable and can be
configured for any of the four transfer types; control, interrupt, bulk, or isochronous. The data payload size is also
selectable, and it supports data payloads up to 1023 bytes.
No dedicated memory is allocated for or included in the USB module. Internal SRAM is used to keep the configuration
for each endpoint address and the data buffer for each endpoint. The memory locations used for endpoint
configurations and data buffers are fully configurable. The amount of memory allocated is fully dynamic, according to
the number of endpoints in use and the configuration of these. The USB module has built-in direct memory access
(DMA), and will read/write data from/to the SRAM when a USB transaction takes place.
To maximize throughput, an endpoint address can be configured for ping-pong operation. When done, the input and
output endpoints are both used in the same direction. The CPU or DMA controller can then read/write one data buffer
while the USB module writes/reads the others, and vice versa. This gives double buffered communication.
22.1 Features
z Two Identical two-wire interface peripherals
z Bidirectional, two-wire communication interface
z Phillips I2C compatible
z System Management Bus (SMBus) compatible
z Bus master and slave operation supported
z Slave operation
z Single bus master operation
z Bus master in multi-master bus environment
z Multi-master arbitration
z Flexible slave address match functions
z 7-bit and general call address recognition in hardware
z 10-bit addressing supported
z Address mask register for dual address match or address range masking
z Optional software address recognition for unlimited number of addresses
z Slave can operate in all sleep modes, including power-down
z Slave address match can wake device from all sleep modes
z 100kHz and 400kHz bus frequency support
z Slew-rate limited output drivers
z Input filter for bus noise and spike suppression
z Support arbitration between start/repeated start and data bit (SMBus)
z Slave arbitration allows support for address resolve protocol (ARP) (SMBus)
22.2 Overview
The two-wire interface (TWI) is a bidirectional, two-wire communication interface. It is I2C and System Management
Bus (SMBus) compatible. The only external hardware needed to implement the bus is one pull-up resistor on each
bus line.
A device connected to the bus must act as a master or a slave. The master initiates a data transaction by addressing
a slave on the bus and telling whether it wants to transmit or receive data. One bus can have many slaves and one or
several masters that can take control of the bus. An arbitration process handles priority if more than one master tries
to transmit data at the same time. Mechanisms for resolving bus contention are inherent in the protocol.
The TWI module supports master and slave functionality. The master and slave functionality are separated from each
other, and can be enabled and configured separately. The master module supports multi-master bus operation and
arbitration. It contains the baud rate generator. Both 100kHz and 400kHz bus frequency is supported. Quick
command and smart mode can be enabled to auto-trigger operations and reduce software complexity.
The slave module implements 7-bit address match and general address call recognition in hardware. 10-bit
addressing is also supported. A dedicated address mask register can act as a second address match register or as a
register for address range masking. The slave continues to operate in all sleep modes, including power-down mode.
This enables the slave to wake up the device from all sleep modes on TWI address match. It is possible to disable the
address matching to let this be handled in software instead.
The TWI module will detect START and STOP conditions, bus collisions, and bus errors. Arbitration lost, errors,
collision, and clock hold on the bus are also detected and indicated in separate status flags available in both master
and slave modes.
It is possible to disable the TWI drivers in the device, and enable a four-wire digital interface for connecting to an
external TWI bus driver. This can be used for applications where the device operates from a different VCC voltage than
used by the TWI bus.
23.1 Features
z Two Identical SPI peripherals
z Full-duplex, three-wire synchronous data transfer
z Master or slave operation
z Lsb first or msb first data transfer
z Eight programmable bit rates
z Interrupt flag at the end of transmission
z Write collision flag to indicate data collision
z Wake up from idle sleep mode
z Double speed master mode
23.2 Overview
The Serial Peripheral Interface (SPI) is a high-speed synchronous data transfer interface using three or four pins. It
allows fast communication between an Atmel AVR XMEGA device and peripheral devices or between several
microcontrollers. The SPI supports full-duplex communication.
A device connected to the bus must act as a master or slave. The master initiates and controls all data transactions.
PORTC and PORTD each has one SPI. Notation of these peripherals are SPIC and SPID.
24.1 Features
z Five identical USART peripherals
z Full-duplex operation
z Asynchronous or synchronous operation
z Synchronous clock rates up to 1/2 of the device clock frequency
z Asynchronous clock rates up to 1/8 of the device clock frequency
z Supports serial frames with 5, 6, 7, 8, or 9 data bits and 1 or 2 stop bits
z Fractional baud rate generator
z Can generate desired baud rate from any system clock frequency
z No need for external oscillator with certain frequencies
z Built-in error detection and correction schemes
z Odd or even parity generation and parity check
z Data overrun and framing error detection
z Noise filtering includes false start bit detection and digital low-pass filter
z Separate interrupts for
z Transmit complete
z Transmit data register empty
z Receive complete
z Multiprocessor communication mode
z Addressing scheme to address a specific devices on a multidevice bus
z Enable unaddressed devices to automatically ignore all frames
z Master SPI mode
z Double buffered operation
z Operation up to 1/2 of the peripheral clock frequency
z IRCOM module for IrDA compliant pulse modulation/demodulation
24.2 Overview
The universal synchronous and asynchronous serial receiver and transmitter (USART) is a fast and flexible serial
communication module. The USART supports full-duplex communication and asynchronous and synchronous
operation. The USART can be configured to operate in SPI master mode and used for SPI communication.
Communication is frame based, and the frame format can be customized to support a wide range of standards. The
USART is buffered in both directions, enabling continued data transmission without any delay between frames.
Separate interrupts for receive and transmit complete enable fully interrupt driven communication. Frame error and
buffer overflow are detected in hardware and indicated with separate status flags. Even or odd parity generation and
parity check can also be enabled.
The clock generator includes a fractional baud rate generator that is able to generate a wide range of USART baud
rates from any system clock frequencies. This removes the need to use an external crystal oscillator with a specific
frequency to achieve a required baud rate. It also supports external clock input in synchronous slave operation.
When the USART is set in master SPI mode, all USART-specific logic is disabled, leaving the transmit and receive
buffers, shift registers, and baud rate generator enabled. Pin control and interrupt generation are identical in both
modes. The registers are used in both modes, but their functionality differs for some control settings.
An IRCOM module can be enabled for one USART to support IrDA 1.4 physical compliant pulse modulation and
demodulation for baud rates up to 115.2Kbps.
PORTC and PORTD each has two USARTs. PORTE has one USART. Notation of these peripherals are USARTC0,
USARTC1, USARTD0, USARTD1 and USARTE0, respectively.
25.1 Features
z Pulse modulation/demodulation for infrared communication
z IrDA compatible for baud rates up to 115.2Kbps
z Selectable pulse modulation scheme
z 3/16 of the baud rate period
z Fixed pulse period, 8-bit programmable
z Pulse modulation disabled
z Built-in filtering
z Can be connected to and used by any USART
25.2 Overview
Atmel AVR XMEGA devices contain an infrared communication module (IRCOM) that is IrDA compatible for baud
rates up to 115.2Kbps. It can be connected to any USART to enable infrared pulse encoding/decoding for that
USART.
26.1 Features
z Data Encryption Standard (DES) CPU instruction
z Advanced Encryption Standard (AES) crypto module
z DES Instruction
z Encryption and decryption
z DES supported
z Encryption/decryption in 16 CPU clock cycles per 8-byte block
z AES crypto module
z Encryption and decryption
z Supports 128-bit keys
z Supports XOR data load mode to the state memory
z Encryption/decryption in 375 clock cycles per 16-byte block
26.2 Overview
The Advanced Encryption Standard (AES) and Data Encryption Standard (DES) are two commonly used standards
for cryptography. These are supported through an AES peripheral module and a DES CPU instruction, and the
communication interfaces and the CPU can use these for fast, encrypted communication and secure data storage.
DES is supported by an instruction in the AVR CPU. The 8-byte key and 8-byte data blocks must be loaded into the
register file, and then the DES instruction must be executed 16 times to encrypt/decrypt the data block.
The AES crypto module encrypts and decrypts 128-bit data blocks with the use of a 128-bit key. The key and data
must be loaded into the key and state memory in the module before encryption/decryption is started. It takes 375
peripheral clock cycles before the encryption/decryption is done. The encrypted/encrypted data can then be read out,
and an optional interrupt can be generated. The AES crypto module also has DMA support with transfer triggers when
encryption/decryption is done and optional auto-start of encryption/decryption when the state memory is fully loaded.
27.1 Features
z Cyclic redundancy check (CRC) generation and checking for
z Communication data
z Program or data in flash memory
z Data in SRAM and I/O memory space
z Integrated with flash memory, DMA controller and CPU
z Continuous CRC on data going through a DMA channel
z Automatic CRC of the complete or a selectable range of the flash memory
z CPU can load data to the CRC generator through the I/O interface
z CRC polynomial software selectable to
z CRC-16 (CRC-CCITT)
z CRC-32 (IEEE 802.3)
z Zero remainder detection
27.2 Overview
A cyclic redundancy check (CRC) is an error detection technique test algorithm used to find accidental errors in data,
and it is commonly used to determine the correctness of a data transmission, and data present in the data and
program memories. A CRC takes a data stream or a block of data as input and generates a 16- or 32-bit output that
can be appended to the data and used as a checksum. When the same data are later received or read, the device or
application repeats the calculation. If the new CRC result does not match the one calculated earlier, the block contains
a data error. The application will then detect this and may take a corrective action, such as requesting the data to be
sent again or simply not using the incorrect data.
Typically, an n-bit CRC applied to a data block of arbitrary length will detect any single error burst not longer than n
bits (any single alteration that spans no more than n bits of the data), and will detect the fraction 1-2-n of all longer
error bursts. The CRC module in Atmel AVR XMEGA devices supports two commonly used CRC polynomials; CRC-
16 (CRC-CCITT) and CRC-32 (IEEE 802.3).
z CRC-16:
Polynomial: x16+x12+x5+1
z CRC-32:
Polynomial: x32+x26+x23+x22+x16+x12+x11+x10+x8+x7+x5+x4+x2+x+1
28.1 Features
z One Analog to Digital Converter (ADC)
z 12-bit resolution
z Up to two million samples per second
z Two inputs can be sampled simultaneously using ADC and 1x gain stage
z Four inputs can be sampled within 1.5µs
z Down to 2.5µs conversion time with 8-bit resolution
z Down to 3.5µs conversion time with 12-bit resolution
z Differential and single-ended input
z Up to 12 single-ended inputs
z 12x4 differential inputs without gain
z 8x4 differential inputs with gain
z Built-in differential gain stage
z 1/2x, 1x, 2x, 4x, 8x, 16x, 32x, and 64x gain options
z Single, continuous and scan conversion options
z Four internal inputs
z Internal temperature sensor
z DAC output
z AVCC voltage divided by 10
z 1.1V bandgap voltage
z Four conversion channels with individual input control and result registers
z Enable four parallel configurations and results
z Internal and external reference options
z Compare function for accurate monitoring of user defined thresholds
z Optional event triggered conversion for accurate timing
z Optional DMA transfer of conversion results
z Optional interrupt/event on compare result
28.2 Overview
The ADC converts analog signals to digital values. The ADC has 12-bit resolution and is capable of converting up to
two million samples per second (msps). The input selection is flexible, and both single-ended and differential
measurements can be done. For differential measurements, an optional gain stage is available to increase the
dynamic range. In addition, several internal signal inputs are available. The ADC can provide both signed and
unsigned results.
This is a pipelined ADC that consists of several consecutive stages. The pipelined design allows a high sample rate at
a low system clock frequency. It also means that a new input can be sampled and a new ADC conversion started
while other ADC conversions are still ongoing. This removes dependencies between sample rate and propagation
delay.
The ADC has four conversion channels (0-3) with individual input selection, result registers, and conversion start
control. The ADC can then keep and use four parallel configurations and results, and this will ease use for
applications with high data throughput or for multiple modules using the ADC independently. It is possible to use DMA
to move ADC results directly to memory or peripherals when conversions are done.
Both internal and external reference voltages can be used. An integrated temperature sensor is available for use with
the ADC. The output from the DAC, AVCC/10 and the bandgap voltage can also be measured by the ADC.
The ADC has a compare function for accurate monitoring of user defined thresholds with minimum software
intervention required.
ADC0 Compare
•
••
ADC11
Internal
signals VINP <
ADC0
••
CH0 Result >
• Threshold
ADC7 CH1 Result (Int Req)
ADC4
½x - 64x
•
•• CH2 Result
ADC7
CH3 Result
Int. signals Internal VINN
signals
ADC0
•
•• Internal 1.00V Reference
ADC3 Voltage
Internal AVCC/1.6V
Int. signals
Internal AVCC/2
AREFA
AREFB
Two inputs can be sampled simultaneously as both the ADC and the gain stage include sample and hold circuits, and
the gain stage has 1x gain setting. Four inputs can be sampled within 1.5µs without any intervention by the
application.
The ADC may be configured for 8- or 12-bit result, reducing the minimum conversion time (propagation delay) from
3.5µs for 12-bit to 2.5µs for 8-bit result.
ADC conversion results are provided left- or right adjusted with optional ‘1’ or ‘0’ padding. This eases calculation when
the result is represented as a signed integer (signed 16-bit number).
PORTA has one ADC. Notation of this peripheral is ADCA.
29.1 Features
z One Digital to Analog Converter (DAC)
z 12-bit resolution
z Two independent, continuous-drive output channels
z Up to one million samples per second conversion rate per DAC channel
z Built-in calibration that removes:
z Offset error
z Gain error
z Multiple conversion trigger sources
z On new available data
z Events from the event system
z High drive capabilities and support for
z Resistive loads
z Capacitive loads
z Combined resistive and capacitive loads
z Internal and external reference options
z DAC output available as input to analog comparator and ADC
z Low-power mode, with reduced drive strength
z Optional DMA transfer of data
29.2 Overview
The digital-to-analog converter (DAC) converts digital values to voltages. The DAC has two channels, each with 12-bit
resolution, and is capable of converting up to one million samples per second (msps) on each channel. The built-in
calibration system can remove offset and gain error when loaded with calibration values from software.
DMA req
(Data Empty) D
12 A
CH0DATA T DAC0 Output
Driver
A
Int. To
driver AC/ADC
Trigger Select Enable
AVCC Reference
Internal 1.00V selection
CTRLB CTRLA
AREFA Internal Output
AREFB enable
Trigger Select Enable
D
12 A
CH1DATA T DAC1 Output
Driver
DMA req A
(Data Empty)
30.1 Features
z Two Analog Comparators (ACs)
z Selectable propagation delay versus current consumption
z Selectable hysteresis
z No
z Small
z Large
z Analog comparator output available on pin
z Flexible input selection
z All pins on the port
z Output from the DAC
z Bandgap reference voltage
z A 64-level programmable voltage scaler of the internal AVCC voltage
z Interrupt and event generation on:
z Rising edge
z Falling edge
z Toggle
z Window function interrupt and event generation on:
z Signal above window
z Signal inside window
z Signal below window
z Constant current source with configurable output pin selection
30.2 Overview
The analog comparator (AC) compares the voltage levels on two inputs and gives a digital output based on this
comparison. The analog comparator may be configured to generate interrupt requests and/or events upon several
different combinations of input change.
Two important properties of the analog comparator’s dynamic behavior are: hysteresis and propagation delay. Both of
these parameters may be adjusted in order to achieve the optimal operation for each application.
The input selection includes analog port pins, several internal signals, and a 64-level programmable voltage scaler.
The analog comparator output state can also be output on a pin for use by external devices.
A constant current source can be enabled and output on a selectable pin. This can be used to replace, for example,
external resistors used to charge capacitors in capacitive touch sensing applications.
The analog comparators are always grouped in pairs on each port. These are called analog comparator 0 (AC0) and
analog comparator 1 (AC1). They have identical behavior, but separate control registers. Used as pair, they can be
set in window mode to compare a signal to a voltage range instead of a voltage level.
PORTA has one AC pair. Notation is ACA.
Pin Input
AC0OUT
Pin Input
Hysteresis
DAC Enable
Interrupt Interrupts
Interrupt Sensititivity
Voltage Mode Control
Scaler
ACnMUXCTRL ACnCTRL WINCTRL &
Window Events
Function
Enable
Bandgap
Hysteresis
Pin Input
AC1OUT
Pin Input
The window function is realized by connecting the external inputs of the two analog comparators in a pair as shown in
Figure 30-2.
+
AC0
Upper limit of window -
Interrupts
Interrupt
Input signal sensitivity
Events
control
+
AC1
Lower limit of window
-
31.1 Features
z Programming
z External programming through PDI interface
z Minimal protocol overhead for fast operation
z Built-in error detection and handling for reliable operation
z Boot loader support for programming through any communication interface
z Debugging
z Nonintrusive, real-time, on-chip debug system
z No software or hardware resources required from device except pin connection
z Program flow control
z Go, Stop, Reset, Step Into, Step Over, Step Out, Run-to-Cursor
z Unlimited number of user program breakpoints
z Unlimited number of user data breakpoints, break on:
z Data location read, write, or both read and write
z Data location content equal or not equal to a value
z Data location content is greater or smaller than a value
z Data location content is within or outside a range
z No limitation on device clock frequency
z Program and Debug Interface (PDI)
z Two-pin interface for external programming and debugging
z Uses the Reset pin and a dedicated pin
z No I/O pins required during programming or debugging
31.2 Overview
The Program and Debug Interface (PDI) is an Atmel proprietary interface for external programming and on-chip
debugging of a device.
The PDI supports fast programming of nonvolatile memory (NVM) spaces; flash, EEPOM, fuses, lock bits, and the
user signature row.
Debug is supported through an on-chip debug system that offers nonintrusive, real-time debug. It does not require any
software or hardware resources except for the device pin connection. Using the Atmel tool chain, it offers complete
program flow control and support for an unlimited number of program and complex data breakpoints. Application
debug can be done from a C or other high-level language source code level, as well as from an assembler and
disassembler level.
Programming and debugging can be done through the PDI physical layer. This is a two-pin interface that uses the
Reset pin for the clock input (PDI_CLK) and one other dedicated pin for data input and output (PDI_DATA). Any
external programmer or on-chip debugger/emulator can be directly connected to this interface.
GND Ground
SYNC Port pin with full synchronous and limited asynchronous interrupt function
ASYNC Port pin with full synchronous and full asynchronous interrupt function
SCLIN Serial Clock In for TWI when external driver interface is enabled
SCLOUT Serial Clock Out for TWI when external driver interface is enabled
SDAIN Serial Data In for TWI when external driver interface is enabled
SDAOUT Serial Data Out for TWI when external driver interface is enabled
PORT A PIN # INTERRUPT ADCA POS/ ADCA NEG ADCA ACA POS ACA NEG ACAOUT REFA
GAINPOS GAINNEG
GND 38
AVCC 39
PORT C PIN # INTERRUPT TCC0 AWEXC TCC1 USART USART SPIC(4) TWIC TWIC CLOCKOUT EVENTOUT
(1)(2)
C0(3) C1 w/ext (5) (6)
driver
GND 8
VCC 9
SYNC/
PC2 12 OC0C OC0BLS RXD0 SDAOUT
ASYNC
Notes: 1. Pin mapping of all TC0 can optionally be moved to high nibble of port
2. If TC0 is configured as TC2 all eight pins can be used for PWM output.
3. Pin mapping of all USART0 can optionally be moved to high nibble of port.
4. Pins MOSI and SCK for all SPI can optionally be swapped.
5. CLKOUT can optionally be moved between port C, D and E and between pin 4 and 7.
6. EVOUT can optionally be moved between port C, D and E and between pin 4 and 7.
PORT D PIN # INTERRUPT TCD0 TCD1 USB USARTD0 USARTD1 SPID CLOCKOUT EVENTOUT
GND 18
VCC 19
GND 30
VCC 31
PDI 34 PDI_DATA
RESET 35 PDI_CLOCK
FMULSU Rd,Rr Fractional Multiply Signed with Unsigned R1:R0 ← Rd x Rr<<1 (SU) Z,C 2
Branch instructions
SBIS A, b Skip if Bit in I/O Register Set If (I/O(A,b) =1) PC ← PC + 2 or 3 None 2/3/4
LDS Rd, k Load Direct from data space Rd ← (k) None 2 (1)(2)
ELPM Rd, Z+ Extended Load Program Memory and Post- Rd ← (RAMPZ:Z), None 3
Increment Z ← Z+1
Notes: 1. Cycle times for Data memory accesses assume internal memory accesses, and are not valid for accesses via the external RAM interface.
2. One extra cycle must be added when accessing Internal SRAM.
35.1 44A
PIN 1 IDENTIFIER
PIN 1
e B
E1 E
D1
D
C 0°~7°
A1 A2 A
L
COMMON DIMENSIONS
(Unit of Measure = mm)
06/02/2014
Marked Pin# 1 I D
SE ATING PLAN E
A1
TOP VIE W
A3
A
K
L
Pin #1 Co rner SIDE VIEW
D2
02/13/2014
TITLE GPC DRAWING NO. REV.
Package Drawing Contact: 44M1, 44-pad, 7 x 7 x 1.0mm body, lead
[email protected] pitch 0.50mm, 5.20mm exposed pad, thermally ZWS 44M1 H
enhanced plastic very thin quad flat no
lead package (VQFN)
E
A1 BALL ID 0.10
A1
TOP VIEW A
A2
SIDE VIEW
E1
e F
D D1
C COMMON DIMENSIONS
(Unit of Measure = mm)
B
SYMBOL MIN NOM MAX NOTE
A
A – – 1.00
1 2 3 4 5 6 7
A1 0.20 – –
A1 BALL CORNER b e 49 - Ø0.35 ±0.05 A2 0.65 – –
D 4.90 5.00 5.10
BOTTOM VIEW D1 3.90 BSC
E 4.90 5.00 5.10
E1 3.90 BSC
b 0.30 0.35 0.40
e 0.65 BSC
3/14/08
TITLE GPC DRAWING NO. REV.
Package Drawing Contact: 49C2, 49-ball (7 x 7 array), 0.65mm pitch,
[email protected] 5.0 x 5.0 x 1.0mm, very thin, fine-pitch CBD 49C2 A
ball grid array package (VFBGA)
36.1 ATxmega16A4U
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
VCC = 1.6V 0 12
VCC = 1.8V 0 12
ClkCPU CPU clock frequency MHz
VCC = 2.7V 0 32
VCC = 3.6V 0 32
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-1 the Frequency vs. VCC curve is linear
between 1.8V < VCC < 2.7V.
32
Table 36-4. Current consumption for Active mode and sleep modes.
VCC = 1.8V 40
32kHz, Ext. Clk
VCC = 3.0V 80
VCC = 1.8V 62
Idle power 1MHz, Ext. Clk µA
VCC = 3.0V 118
consumption (1)
VCC = 1.8V 125 225
2MHz, Ext. Clk
240 350
VCC = 3.0V
32MHz, Ext. Clk 3.8 5.5 mA
ICC T = 25°C 0.1 1.0
RTC from ULP clock, WDT and sampled VCC = 1.8V 1.2
BOD enabled, T = 25°C VCC = 3.0V 1.3
Power-save power RTC from 1.024kHz low power VCC = 1.8V 0.6 2.0
µA
consumption (2) 32.768kHz TOSC, T = 25°C VCC = 3.0V 0.7 2.0
RTC from low power 32.768kHz TOSC, VCC = 1.8V 0.8 3.0
T = 25°C VCC = 3.0V 1.0 3.0
Reset power consumption Current through RESET pin substracted VCC = 3.0V 320 µA
Notes: 1. All Power Reduction Registers set.
2. Maximum limits are based on characterization, and not tested in production.
85
2MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 115
270
32MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 460
3.0
Timer/counter 16 µA
Table 36-6. Device wake-up time from sleep modes with various system clock sources.
Wakeup time
Wakeup request
Clock output
IOH (1)/
I/O pin source/sink current -20 20 mA
IOL (2)
VIH High level input voltage VCC = 2.0 - 2.7V 0.7*VCC VCC+0.3 V
VIL Low level input voltage VCC = 2.0 - 2.7V -0.3 0.3*VCC V
4.0
tr Rise time No load ns
slew rate limitation 7.0
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
ClkADC
Start-up time ADC clock cycles 12 24
cycles
-1.0 mV
Differential AVCC/1.6 10
mV
mode AVCC/2.0 8.0
Gain error
Bandgap ±5.0
ClkADC
Propagation delay ADC conversion rate 1.0
cycles
All gain
INL (1) Integral non-linearity 500ksps ±1.5 ±4 lsb
settings
Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
VCC-
AVCC Analog supply voltage VCC+ 0.3 V
0.3
100 pF
Maximum capacitance load
1000Ω serial resistance 1.0 nF
mode = HS 30
Vhys3 Hysteresis, large mV
mode = LP 60
mode = HS 30
tdelay Propagation delay ns
VCC = 3.0V, T= 85°C mode = LP 130 500
mode = LP 130
INT1V Internal 1.00V reference T= 85°C, after calibration 0.99 1.0 1.01 V
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
25°C 10K
105°C 2K
Flash
25°C 100
105°C 10
25°C 100K
105°C 30K
EEPROM
25°C 100
105°C 10
Page erase 4
Page erase 4
Accuracy -30 30 %
Symbo
l Parameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
Start-up time 25 µs
Re-lock time 25 µs
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
VIH1
VIL1
tCL
tCK
Notes: 1. System Clock Prescalers must be set so that maximum CPU clock frequency for device is not exceeded.
2. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
FRQRANGE=0 <10
XOSCPWR=0
Cycle to cycle jitter FRQRANGE=1, 2, or 3 <1.0 ns
XOSCPWR=1 <1.0
FRQRANGE=0 <6.0
XOSCPWR=0
Long term jitter FRQRANGE=1, 2, or 3 <0.5 ns
XOSCPWR=1 <0.5
FRQRANGE=0 <0.1
XOSCPWR=1 <0.005
FRQRANGE=0 40
XOSCPWR=0 FRQRANGE=1 42
Duty cycle %
FRQRANGE=2 or 3 45
XOSCPWR=1 48
0.4MHz resonator,
2.4k
CL=100pF
XOSCPWR=0,
FRQRANGE=0 1MHz crystal, CL=20pF 8.7k
Parasitic capacitance
CXTAL1 5.4 pF
XTAL1 pin
Parasitic capacitance
CXTAL2 7.1 pF
XTAL2 pin
Parasitic capacitance
CLOAD 3.07 pF
load
Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization.
5.4
CTOSC1 Parasitic capacitance TOSC1 pin pF
Alternate TOSC location 4.0
7.1
CTOSC2 Parasitic capacitance TOSC2 pin pF
Alternate TOSC location 4.0
CL1 CL2
32.768kHz crystal
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
SS
SCK
(CPOL = 0)
tSCKW
SCK
(CPOL = 1)
tSCKW
tMIS tMIH tSCK
MISO
MSB LSB
(Data input)
tMOH tMOH
MOSI
MSB LSB
(Data output)
SS
SCK
(CPOL = 0)
tSSCKW
SCK
(CPOL = 1)
tSSCKW
tSIS tSIH tSSCK
MOSI
MSB LSB
(Data input)
MISO
MSB LSB
(Data output)
tof tHIGH
tLOW tr
SCL
SDA
tBUF
tr Rise time for both SDA and SCL 20+0.1Cb (1)(2) 300 ns
tof Output fall time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 250 ns
II Input current for each I/O Pin 0.1VCC < VI < 0.9VCC -10 10 µA
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
VCC = 1.6V 0 12
VCC = 1.8V 0 12
ClkCPU CPU clock frequency MHz
VCC = 2.7V 0 32
VCC = 3.6V 0 32
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-8 the Frequency vs. VCC curve is linear
between 1.8V < VCC < 2.7V.
32
Table 36-36. Current consumption for Active mode and sleep modes.
VCC = 1.8V 40
32kHz, Ext. Clk
VCC = 3.0V 80
VCC = 1.8V 62
Idle power 1MHz, Ext. Clk µA
VCC = 3.0V 118
consumption(1)
VCC = 1.8V 125 225
2MHz, Ext. Clk
240 350
VCC = 3.0V
32MHz, Ext. Clk 3.8 5.5 mA
Power-save power RTC from 1.024kHz low power VCC = 1.8V 0.6 2.0
µA
consumption(2) 32.768kHz TOSC, T = 25°C VCC = 3.0V 0.7 2.0
85
2MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 115
270
32MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 460
3.0
Timer/counter 16 µA
Table 36-38. Device wake-up time from sleep modes with various system clock sources.
Wakeup time
Wakeup request
Clock output
IOH (1)/
I/O pin source/sink current -20 20 mA
IOL (2)
VIH High level input voltage VCC = 2.0 - 2.7V 0.7*VCC VCC+0.3 V
VIL Low level input voltage VCC = 2.0 - 2.7V -0.3 0.3*VCC V
4.0
tr Rise time No load ns
slew rate limitation 7.0
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
ClkADC
Start-up time ADC clock cycles 12 24
cycles
-1.0 mV
Differential AVCC/1.6 10
mV
mode AVCC/2.0 8.0
Gain error
Bandgap ±5.0
ClkADC
Propagation delay ADC conversion rate 1.0
cycles
All gain
INL (1) Integral non-linearity 500ksps ±1.5 ±4.0 lsb
settings
Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
100 pF
Maximum capacitance load
1000Ω serial resistance 1.0 nF
mode = HS 30
Vhys3 Hysteresis, large mV
mode = LP 60
mode = HS 30
tdelay Propagation delay ns
VCC = 3.0V, T= 85°C mode = LP 130 500
mode = LP 130
INT1V Internal 1.00V reference T= 85°C, after calibration 0.99 1.0 1.01 V
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
25°C 10K
105°C 2K
Flash
25°C 100
105°C 10
25°C 100K
105°C 30K
EEPROM
25°C 100
105°C 10
Page erase 4
Page erase 4
Accuracy -30 30 %
Symbo
l Parameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
Start-up time 25 µs
Re-lock time 25 µs
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
VIH1
VIL1
tCL
tCK
FRQRANGE=0 <10
XOSCPWR=0
Cycle to cycle jitter FRQRANGE=1, 2, or 3 <1 ns
XOSCPWR=1 <1
FRQRANGE=0 <6
XOSCPWR=0
Long term jitter FRQRANGE=1, 2, or 3 <0.5 ns
XOSCPWR=1 <0.5
FRQRANGE=0 <0.1
XOSCPWR=1 <0.005
FRQRANGE=0 40
XOSCPWR=0 FRQRANGE=1 42
Duty cycle %
FRQRANGE=2 or 3 45
XOSCPWR=1 48
0.4MHz resonator,
2.4k
CL=100pF
XOSCPWR=0,
FRQRANGE=0 1MHz crystal, CL=20pF 8.7k
Parasitic
CXTAL1 capacitance XTAL1 5.4 pF
pin
Parasitic
CXTAL2 capacitance XTAL2 7.1 pF
pin
Parasitic
CLOAD 3.07 pF
capacitance load
Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization.
5.4
CTOSC1 Parasitic capacitance TOSC1 pin pF
Alternate TOSC location 4.0
7.1
CTOSC2 Parasitic capacitance TOSC2 pin pF
Alternate TOSC location 4.0
CL1 CL2
32.768kHz crystal
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
SS
SCK
(CPOL = 0)
tSCKW
SCK
(CPOL = 1)
tSCKW
tMIS tMIH tSCK
MISO
MSB LSB
(Data input)
tMOH tMOH
MOSI
MSB LSB
(Data output)
SS
SCK
(CPOL = 0)
tSSCKW
SCK
(CPOL = 1)
tSSCKW
tSIS tSIH tSSCK
MOSI
MSB LSB
(Data input)
MISO
MSB LSB
(Data output)
tof tHIGH
tLOW tr
SCL
SDA
tBUF
tr Rise time for both SDA and SCL 20+0.1Cb (1)(2) 300 ns
tof Output fall time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 250 ns
II Input current for each I/O Pin 0.1VCC < VI < 0.9VCC -10 10 µA
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
VCC = 1.6V 0 12
VCC = 1.8V 0 12
ClkCPU CPU clock frequency MHz
VCC = 2.7V 0 32
VCC = 3.6V 0 32
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-15 the Frequency vs. VCC curve is linear
between 1.8V < VCC < 2.7V.
32
Table 36-68. Current consumption for Active mode and sleep modes.
VCC = 1.8V 52
32kHz, Ext. Clk
VCC = 3.0V 132
VCC = 1.8V 57
Idle power 1MHz, Ext. Clk µA
VCC = 3.0V 110
consumption (1)
VCC = 1.8V 115 225
2MHz, Ext. Clk
216 350
VCC = 3.0V
32MHz, Ext. Clk 3.5 5.5 mA
ICC T = 25°C 0.1 1.0
Power-save power RTC from 1.024kHz low power VCC = 1.8V 0.6 2.0
µA
consumption (2) 32.768kHz TOSC, T = 25°C VCC = 3.0V 0.7 2.0
RTC from low power 32.768kHz TOSC, VCC = 1.8V 0.8 3.0
T = 25°C VCC = 3.0V 1.0 3.0
Reset power consumption Current through RESET pin substracted VCC = 3.0V 140
Notes: 1. All Power Reduction Registers set.
2. Maximum limits are based on characterization, and not tested in production.
85
2MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 120
300
32MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 465
3.0
Timer/counter 16 µA
Table 36-70. Device wake-up time from sleep modes with various system clock sources.
Wakeup time
Wakeup request
Clock output
IOH (1)/
I/O pin source/sink current -20 20 mA
IOL (2)
VIH High level input voltage VCC = 2.0 - 2.7V 0.7*VCC VCC+0.3 V
VIL Low level input voltage VCC = 2.0 - 2.7V -0.3 0.3*VCC V
4.0
tr Rise time No load ns
slew rate limitation 7.0
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
ClkADC
Start-up time ADC clock cycles 12 24
cycles
-1 mV
External reference -1
Differential AVCC/1.6 10
mV
mode AVCC/2.0 8
Gain error
Bandgap ±5
ClkADC
Propagation delay ADC conversion rate 1.0
cycles
All gain
INL (1) Integral non-linearity 500ksps ±1.5 ±4.0 lsb
settings
100 pF
Maximum capacitance load
1000Ω serial resistance 1.0 nF
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
25°C 10K
105°C 2K
Flash
25°C 100
105°C 10
25°C 100K
105°C 30K
EEPROM
25°C 100
105°C 10
Page erase 4
Page erase 4
Accuracy -30 30 %
Symbo
l Parameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
Start-up time 25 µs
Re-lock time 25 µs
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
VIH1
VIL1
tCL
tCK
Notes: 1. System Clock Prescalers must be set so that maximum CPU clock frequency for device is not exceeded.
2. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
FRQRANGE=0 <10
XOSCPWR=0
Cycle to cycle jitter FRQRANGE=1, 2, or 3 <1 ns
XOSCPWR=1 <1
FRQRANGE=0 <6
XOSCPWR=0
Long term jitter FRQRANGE=1, 2, or 3 <0.5 ns
XOSCPWR=1 <0.5
FRQRANGE=0 <0.1
XOSCPWR=1 <0.005
FRQRANGE=0 40
XOSCPWR=0 FRQRANGE=1 42
Duty cycle %
FRQRANGE=2 or 3 45
XOSCPWR=1 48
0.4MHz resonator,
2.4k
CL=100pF
XOSCPWR=0,
FRQRANGE=0 1MHz crystal, CL=20pF 8.7k
Parasitic capacitance
CXTAL1 5.60 pF
XTAL1 pin
Parasitic capacitance
CXTAL2 7.62 pF
XTAL2 pin
Parasitic capacitance
CLOAD 3.23 pF
load
Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization
5.4 pF
CTOSC1 Parasitic capacitance TOSC1 pin
Alternate TOSC location 4.0
7.1 pF
CTOSC2 Parasitic capacitance TOSC2 pin
Alternate TOSC location 4.0
CL1 CL2
32.768kHz crystal
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
SS
SCK
(CPOL = 0)
tSCKW
SCK
(CPOL = 1)
tSCKW
tMIS tMIH tSCK
MISO
MSB LSB
(Data input)
tMOH tMOH
MOSI
MSB LSB
(Data output)
SS
SCK
(CPOL = 0)
tSSCKW
SCK
(CPOL = 1)
tSSCKW
tSIS tSIH tSSCK
MOSI
MSB LSB
(Data input)
MISO
MSB LSB
(Data output)
tof tHIGH
tLOW tr
SCL
SDA
tBUF
tof Output fall time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 300 ns
II Input current for each I/O pin 0.1VCC < VI < 0.9VCC -10 10 µA
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
VCC = 1.6V 0 12
VCC = 1.8V 0 12
ClkCPU CPU clock frequency MHz
VCC = 2.7V 0 32
VCC = 3.6V 0 32
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-22 the Frequency vs. VCC curve is linear
between 1.8V < VCC < 2.7V.
32
VCC = 1.8V 55
32kHz, Ext. Clk
VCC = 3.0V 135
VCC = 1.8V 62
Idle power 1MHz, Ext. Clk µA
VCC = 3.0V 118
consumption (1)
VCC = 1.8V 125 225
2MHz, Ext. Clk
240 350
VCC = 3.0V
32MHz, Ext. Clk 3.8 5.5 mA
Power-save power RTC from 1.024kHz low power VCC = 1.8V 0.6 2.0
µA
consumption (2) 32.768kHz TOSC, T = 25°C VCC = 3.0V 0.7 2.0
85
2MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 115
270
32MHz int. oscillator µA
DFLL enabled with 32.768kHz int. osc. as reference 440
3.0 mA
Timer/counter 16 µA
Table 36-102. Device wake-up time from sleep modes with various system clock sources.
Wakeup time
Wakeup request
Clock output
IOH (1)/
I/O pin source/sink current -20 20 mA
IOL (2)
VIH High level input voltage VCC = 2.0 - 2.7V 0.7*VCC VCC+0.3 V
VIL Low level input voltage VCC = 2.0 - 2.7V -0.3 0.3*VCC V
4.0
tr Rise time No load ns
slew rate limitation 7.0
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
ClkADC
Start-up time ADC clock cycles 12 24
cycles
-1.0 mV
External reference -1
Differential AVCC/1.6 10
mV
mode AVCC/2.0 8.0
Gain error
Bandgap ±5
ClkADC
Propagation delay ADC conversion rate 1.0
cycles
All gain
INL (1) Integral Non-Linearity 500ksps ±1.5 ±4.0 lsb
settings
Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
100 pF
Maximum capacitance load
1000Ω serial resistance 1 nF
mode = HS 30
Vhys3 Hysteresis, large mV
mode = LP 60
mode = HS 30
tdelay Propagation delay ns
VCC = 3.0V, T= 85°C mode = LP 130 500
mode = LP 130
INT1V Internal 1.00V reference T= 85°C, after calibration 0.99 1.0 1.01 V
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
25°C 10K
105°C 2K
Flash
25°C 100
105°C 10
25°C 100K
105°C 30K
EEPROM
25°C 100
105°C 10
Page erase 4
Page erase 4
Accuracy -30 30 %
Symbo
l Parameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
Start-up time 25 µs
Re-lock time 25 µs
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
VIH1
VIL1
tCL
tCK
Notes: 1. System Clock Prescalers must be set so that maximum CPU clock frequency for device is not exceeded.
2. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
FRQRANGE=0 <10
XOSCPWR=0
Cycle to cycle jitter FRQRANGE=1, 2, or 3 <1 ns
XOSCPWR=1 <1
FRQRANGE=0 <6
XOSCPWR=0
Long term jitter FRQRANGE=1, 2, or 3 <0.5 ns
XOSCPWR=1 <0.5
FRQRANGE=0 <0.1
XOSCPWR=1 <0.005
FRQRANGE=0 40
XOSCPWR=0 FRQRANGE=1 42
Duty cycle %
FRQRANGE=2 or 3 45
XOSCPWR=1 48
0.4MHz resonator,
2.4k
CL=100pF
XOSCPWR=0,
FRQRANGE=0 1MHz crystal, CL=20pF 8.7k
Parasitic capacitance
CXTAL1 5.45 pF
XTAL1 pin
Parasitic capacitance
CXTAL2 7.51 pF
XTAL2 pin
Parasitic capacitance
CLOAD 3.16 pF
load
Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization.
5.4
CTOSC1 Parasitic capacitance TOSC1 pin pF
Alternate TOSC location 4.0
7.1
CTOSC2 Parasitic capacitance TOSC2 pin pF
Alternate TOSC location 4.0
CL1 CL2
32.768kHz crystal
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
SS
SCK
(CPOL = 0)
tSCKW
SCK
(CPOL = 1)
tSCKW
tMIS tMIH tSCK
MISO
MSB LSB
(Data input)
tMOH tMOH
MOSI
MSB LSB
(Data output)
SS
SCK
(CPOL = 0)
tSSCKW
SCK
(CPOL = 1)
tSSCKW
tSIS tSIH tSSCK
MOSI
MSB LSB
(Data input)
MISO
MSB LSB
(Data output)
tof tHIGH
tLOW tr
SCL
SDA
tBUF
tr Rise Time for both SDA and SCL 20+0.1Cb (1)(2) 300 ns
tof Output Fall Time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 250 ns
II Input Current for each I/O Pin 0.1VCC < VI < 0.9VCC -10 10 µA
37.1 ATxmega16A4U
600
540 3.3V
480 3.0V
420 2.7V
360
ICC [ µA]
300 2.2V
240 1.8V
180
120
60
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
12
3.3V
10
3.0V
8 2.7V
ICC [mA]
2.2V
4
2 1.8V
0
0 4 8 12 16 20 24 28 32
Frequency [MHz]
270 -40 °C
250
230
25 °C
210
190 85 °C
105 °C
ICC [uA]
170
150
130
110
90
70
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
800
-40 °C
700 25 °C
85 °C
105 °C
600
ICC [uA]
500
400
300
200
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
1600
-40 °C
1400
25 °C
85 °C
1200 105 °C
ICC [uA]
1000
800
600
400
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5900
-40 °C
5400
25 °C
4900 85 °C
105 °C
4400
3900
ICC [uA]
3400
2900
2400
1900
1400
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5650
-40 °C
5425
5200 25 °C
4975 85 °C
4750 105 °C
ICC [uA]
4525
4300
4075
3850
3625
3400
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
VCC [V]
140
3.3V
120 3.0V
100 2.7V
80 2.2V
I CC [µA]
60 1.8V
40
20
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
Frequency [MHz]
4.5
3.3V
4.0
3.0V
3.5
2.7V
3.0
I CC [mA]
2.5
2.0
1.5 2.2V
1.0
1.8V
0.5
0
0 4 8 12 16 20 24 28 32
Frequency [MHz]
35
105 °C
34
33 -40 °C
32 85 °C
25 °C
31
ICC [uA]
30
29
28
27
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
158 105 °C
85 °C
146 25 °C
134 -40 °C
122
110
ICC [uA]
98
86
74
62
50
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
410 -40 °C
385 25 °C
85 °C
360 105 °C
335
310
ICC [uA]
285
260
235
210
185
160
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
2000 -40 °C
25 °C
1800 85 °C
105 °C
1600
1400
ICC [uA]
1200
1000
800
600
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5650
-40 °C
5425
5200 25 °C
4975 85 °C
4750 105 °C
ICC [uA]
4525
4300
4075
3850
3625
3400
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
VCC [V]
3.50
3.6 V
3.00
3.0 V
2.50 2.7 V
2.2 V
1.8 V
2.00 1.6 V
ICC [uA]
1.50
1.00
0.50
0.00
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
3.6
3.2 105 °C
2.8
2.4
ICC [uA]
2.0
1.6
1.2 85 °C
0.8
0.4
25 °C
0.0 - 40 °C
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5.1
105 °C
4.6
4.1
3.6
ICC [µA]
3.1
2.6 85 °C
2.1
1.6 25 °C
-40 °C
1.1
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
0.9
0.8 Normal mode
0.7
0.6
Low-power mode
ICC [µA]
0.5
0.4
0.3
0.2
0.1
0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V CC [V]
12.5
11.5 105 °C
10.5
9.5
85 °C
8.5
25 °C
ICC [uA]
7.5 -40 °C
6.5
5.5
4.5
3.5
2.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
480
16MHz
440 12MHz
400
360
ICC [µA]
320 8MHz
2MHz
280
240 0.454MHz
200
160
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC[V]
37.1.2.1 Pull-up
Figure 37-21. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V.
72
64
56
48
40
I [µA]
32
24
- 40 °C
16 25 °C
85 °C
8
105 °C
0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VPIN [V]
Figure 37-22. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V.
120
105
90
75
I [µA]
60
45
30 -40 °C
25 °C
15 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
VPIN [V]
135
120
105
90
75
I [µA]
60
45
-40 °C
30 25 °C
15 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VPIN [V]
1.8
1.6
1.4
1.2
1.0
VPIN [V]
0.8
-40 °C 25 °C
0.6
0.4
85 °C 105 °C
0.2
0.0
-10 -9 -8 -7 -6 -5 -4 -3 -2 -1 0
IPIN [mA]
3.0
2.7
2.4
2.1
1.8
VPIN [V]
1.5
1.2
- 40 °C
0.9
25 °C 85 °C
0.6
105 °C
0.3
0.0
-32 -28 -24 -20 -16 -12 -8 -4 0
IPIN [mA]
3.3
3.0
2.7
2.4
2.1
VPIN [V]
1.8
-40 °C
1.5
1.2
25 °C
0.9
0.6
85 °C 105 °C
0.3
0.0
-32 -28 -24 -20 -16 -12 -8 -4 0
IPIN [mA]
4.0
3.5 3.6V
3.3V
3.0 3.0V
2.7V
2.5
VPIN [V]
2.3V
2.0
1.8V
1.5
1.0
0.5
-24 -21 -18 -15 -12 -9 -6 -3 0
IPIN [mA]
1.0
0.9 105 °C
85 °C
0.8
0.7
25 °C
0.6
-40 °C
VPIN [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 2 4 6 8 10 12 14 16
IPIN [mA]
0.7
105 °C
0.6 85 °C
25 °C
0.5
-40 °C
0.4
VPIN [V]
0.3
0.2
0.1
0.0
0 2 4 6 8 10 12 14 16 18 20
IPIN [mA]
1.0 105 °C
0.9 85 °C
0.8 25 °C
-40 °C
0.7
0.6
VPIN [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 4 8 12 16 20 24 28 32
IPIN [mA]
1.5
1.8V
1.2
2.3V
2.7V
0.9 3.0V
V PIN [V]
3.3V
3.6V
0.6
0.3
0
0 5 10 15 20 25 30
I PIN [mA]
1.8
VIH
1.6
VIL
1.4
Vthreshold [V]
1.2
1.0
0.8
0.6
0.4
0.2
0.0
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
1.8
-40 °C
1.7
25 °C
1.6 85 °C
105 °C
1.5
1.4
Vthreshold [V]
1.3
1.2
1.1
1.0
0.9
0.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.75
-40 °C
1.60 25 °C
85 °C
1.45 105 °C
1.30
Vthreshold [V]
1.15
1.00
0.85
0.70
0.55
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
0.32
0.29
0.26
0.23
25 °C -40 °C
Vthreshold [V]
0.20
0.17
85 °C
0.14
0.11
105 °C
0.08
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.8
1.7
1.6
Differential Signed
1.5
Single-ended Unsigned
1.4
INL [LSB]
1.3
1.2
1.1
1
0.9
Single-ended Signed
0.8
0.7
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
1.4
1.35
1.3
Differential Mode
1.25
INL [LSB]
1.2
Single-ended Unsigned
1.15
1.1
1.05
Single-ended Signed
1
0.95
0.9
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
2.0
1.5
1.0
INL [LSB]
0.5
-0.5
-1.0
-1.5
-2.0
0 512 1024 1536 2048 2560 3072 3584 4096
0.9
0.88
0.86
Differential Mode
0.84
DNL [LSB]
Single-ended Signed
0.82
0.8
0.78
Single-ended Unsigned
0.76
0.74
0.72
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
0.87
0.86
DNL [LSB]
0.85
Single-ended Signed
0.84
0.83
0.82
0.81
Single-ended Unsigned
0.8
0.79
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
0.8
0.6
0.4
DNL [LSB]
0.2
-0.2
-0.4
-0.6
0 512 1024 1536 2048 2560 3072 3584 4096
ADC Input Code
2 Single-ended Signed
1
Gain Error [mV]
Differential Mode
0
-1
Single-ended Unsigned
-2
-3
-4
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
2.2
1.9
Single-ended Signed
1.6
Gain Error [mV]
1.3
Differential Mode
1
0.7
0.4
Single-ended Unsigned
0.1
-0.2
-0.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
-1
-1.1
-1.2
Offset Error [mV]
-1.3
-1.4
-1.5
Differential Mode
-1.6
-1.7
-1.8
-1.9
-2
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
4
Single-ended signed mode
3
2
Gain Error [mV]
1
Dif f erential mode
0
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
-1
-2
Single-ended unsigned mode
-3
-4
Temperature [ºC]
-0.3
-0.4
-0.5
Offset Error [mV]
-0.6
-0.7
Differential Signed
-0.8
-0.9
-1
-1.1
-1.2
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
1.3
Single-ended Signed
1.15
Single-ended Unsigned
Noise [mV RMS]
0.85
0.7
0.55
Differential Signed
0.4
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
1.3
1.2
Single-ended Signed
1.1
1
Noise [mV RMS]
0.9
0.6
0.5
Differential Signed
0.4
0.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
3.0
2.5
2.0
INL [LSB]
1.5 - 40°C
25°C
1.0 85°C
105°C
0.5
0.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
1.6
1.4
1.2
1.0
DNL[LSB]
- 40°C
0.8
0.6 25ºC
85°C
0.4 105°C
0.2
0.0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
0.185
0.180
0.175
Noise [mV RMS]
0.170
0.165
0.160
0.155
0.150
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [ºC]
18
105 °C
17 85 °C
16 -40° C
25 °C
15
14
13
12
VHYST [mV]
11
10
9
8
7
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
35 105 °C
34 85 °C
33
32
31
VHYST [mV]
25 °C
30
29
28 -40 °C
27
26
25
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
42
105 °C
40 85 °C
38
25 °C
36 -40 °C
34
VHYST [mV]
32
30
28
26
24
22
20
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
77
105 °C
74
71 85 °C
68
65
VHYST [mV]
25 °C
62
59
56 -40 °C
53
50
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
7.4
6.8
ICURRENTSOURCE [µA] 6.2
5.6
5.0
4.4
3.3 V
3.8 3.0 V
2.7 V
3.2
2.2 V
2.6
1.8 V
2.0 1.6 V
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
6.5
6
ICURRENTSOURCE [uA]
5.5
5
-40 °C
4.5 25 °C
4 85 °C
105 °C
3.5
3
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
0.050
0.025
-0.025
INL [LSB]
-0.050
-0.075
-0.100
25°C
-0.125
-0.150
0 10 20 30 40 50 60 70
SCALEFAC
1.004
1.6 V
1.002 1.8 V
2.2 V
1.000 2.7 V
3.0 V
Bandgap Voltage [V]
0.998 3.6 V
0.996
0.994
0.992
0.990
0.988
0.986
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
1.635
1.625
Falling Vcc
1.620
VBOT [V]
1.615
1.610
1.605
1.600
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
3.06
3.05 Rising Vcc
3.04
3.03
3.02
VBOT [V]
Temperature [°C]
130
125
120
115
110
tRST [ns]
105
100
95 105 °C
85 °C
90
85 25 °C
-40 °C
80
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
Figure 37-63. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 1.8V.
72
64
56
48
IRESET [uA]
40
32
24
-40 °C
16 25 °C
8 85 °C
105 °C
0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VRESET [V]
120
105
90
75
IRESET [µA]
60
45
30 -40 °C
25 °C
15 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
VRESET [V]
Figure 37-65. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.3V.
140
120
100
80
IRESET [uA]
60
40 -40 °C
25 °C
20 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VRESET [V]
2.20
-40 °C
2.05 25 °C
85 °C
1.90 105 °C
1.75
Vthreshold [V]
1.60
1.45
1.30
1.15
1.00
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.75
-40 °C
1.60 25 °C
85 °C
1.45
105 °C
1.30
1.15
Vthreshold [V]
1.00
0.85
0.70
0.55
0.40
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
700 -40 °C
600 25 °C
500 85 °C
105 °C
ICC [µA]
400
300
200
100
0
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
650
-40 °C
585
520
25 °C
455
85
° °C
390 105°°C
ICC [µA]
325
260
195
130
65
0
0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
32.8
32.4
32.0
Frequency [kHz]
31.6
31.2
30.8 3.6 V
3.0 V
30.4 2.7 V
2.2 V
30.0 1.8 V
1.6 V
29.6
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
32.875
32.850 3.6 V
3.0 V
32.825 2.2 V
2.7 V
32.800 1.8 V
Frequency [kHz]
1.6 V
32.775
32.750
32.725
32.700
32.675
32.650
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
55
50
Frequency [kHz] 45
40
35
30
25
20
0 26 52 78 104 130 156 182 208 234 260
RC32KCAL[7..0]
2.16
2.14
2.12
2.10
Frequency [MHz]
2.08
2.06
2.04
3.6 V
2.02 3.0 V
2.00 2.7 V
2.2 V
1.98 1.8 V
1.96 1.6 V
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
2.0085
2.0070 3.6 V
2.0055 1.6 V
2.2 V
1.8 V
2.0040
Frequency [MHz]
3.0 V
2.7 V
2.0025
2.0010
1.9995
1.9980
1.9965
1.9950
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
0.31 %
0.29 %
Frequency Step size [%]
0.27 %
0.25 %
0.23 %
0.21 %
-40 °C
0.19 %
25 °C
0.17 % 85 °C
105 °C
0.15 %
0 16 32 48 64 80 96 112 128
CALA
36.0
35.5
35.0
34.5
Frequency [MHz]
34.0
33.5
33.0
3.6 V
32.5 3.0 V
2.7 V
32.0
2.2 V
31.5 1.8 V
1.6 V
31.0
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
32.145 3.6 V
32.120 1.61.6
V V
1.8 V
2.2 V
32.095 2.7 V
3.0 V
32.070
Frequency [MHz]
32.045
32.020
31.995
31.970
31.945
31.920
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
0.38 %
0.30 %
0.26 %
0.22 %
0.18 % 85°C
105°C
25°C
0.14 % - 40°C
0.10 %
0 16 32 48 64 80 96 112 128
CALA
Figure 37-79. 32MHz internal oscillator frequency vs. CALB calibration value.
VCC = 3.0V.
75
- 40°C
70 25°C
65 85°C
105°C
60
Frequency [MHz]
55
50
45
40
35
30
25
0 8 16 24 32 40 48 56 64
CALB
54
53
52
Frequency [MHz]
51
50
3.6 V
49
3.0 V
48 2.7 V
2.2 V
47 1.8 V
1.6 V
46
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
48.25
48.20 3.6 V
1.6 V
48.15 1.8 V
2.7 V
48.10 2.2 V
Frequency [MHz]
48.05 3.0 V
48.00
47.95
47.90
47.85
47.80
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
0.34 %
0.31 %
Frequency Step size [%]
0.28 %
0.25 %
0.22 %
-40 °C
0.19 % 25 °C
85 °C
0.16 % 105 °C
0.13 %
0.10 %
0 16 32 48 64 80 96 112 128
CALA
300
295
290
285
105°C
Holdtime [ns]
280 85°C
275
270 25°C
265
- 40°C
260
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Vcc [V]
34
25 °C
31 105 °C
-40 °C
28 85 °C
25
f MAX [MHz]
22
19
16
13
10
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
600
540 3.3V
480 3.0V
420 2.7V
360
ICC [ µA]
300 2.2V
240 1.8V
180
120
60
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
12
3.3V
10
3.0V
8 2.7V
ICC [mA]
2.2V
4
2 1.8V
0
0 4 8 12 16 20 24 28 32
Frequency [MHz]
270 -40 °C
250
230
25 °C
210
190 85 °C
105 °C
ICC [uA]
170
150
130
110
90
70
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
800
-40 °C
700 25 °C
85 °C
105 °C
600
ICC [uA]
500
400
300
200
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
1600
-40 °C
1400
25 °C
85 °C
1200 105 °C
ICC [uA]
1000
800
600
400
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5900
-40 °C
5400
25 °C
4900 85 °C
105 °C
4400
3900
ICC [uA]
3400
2900
2400
1900
1400
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5650
-40 °C
5425
5200 25 °C
4975 85 °C
4750 105 °C
ICC [uA]
4525
4300
4075
3850
3625
3400
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
VCC [V]
140
3.3V
120 3.0V
100 2.7V
80 2.2V
I CC [µA]
60 1.8V
40
20
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
Frequency [MHz]
4.5
3.3V
4.0
3.0V
3.5
2.7V
3.0
I CC [mA]
2.5
2.0
1.5 2.2V
1.0
1.8V
0.5
0
0 4 8 12 16 20 24 28 32
Frequency [MHz]
35
105 °C
34
33 -40 °C
32 85 °C
25 °C
31
ICC [uA]
30
29
28
27
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
158 105 °C
85 °C
146 25 °C
134 -40 °C
122
110
ICC [uA]
98
86
74
62
50
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
410 -40 °C
385 25 °C
85 °C
360 105 °C
335
310
ICC [uA]
285
260
235
210
185
160
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
2000 -40 °C
25 °C
1800 85 °C
105 °C
1600
1400
ICC [uA]
1200
1000
800
600
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5650
-40 °C
5425
5200 25 °C
4975 85 °C
4750 105 °C
ICC [uA]
4525
4300
4075
3850
3625
3400
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
VCC [V]
3.50
3.6 V
3.00
3.0 V
2.50 2.7 V
2.2 V
1.8 V
2.00 1.6 V
ICC [uA]
1.50
1.00
0.50
0.00
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
3.6
3.2 105 °C
2.8
2.4
ICC [uA]
2.0
1.6
1.2 85 °C
0.8
0.4
25 °C
0.0 - 40 °C
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
5.1
105 °C
4.6
4.1
3.6
ICC [µA]
3.1
2.6 85 °C
2.1
1.6 25 °C
-40 °C
1.1
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
0.9
0.8 Normal mode
0.7
0.6
Low-power mode
ICC [µA]
0.5
0.4
0.3
0.2
0.1
0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V CC [V]
12.5
11.5 105 °C
10.5
9.5
85 °C
8.5
25 °C
ICC [uA]
7.5 -40 °C
6.5
5.5
4.5
3.5
2.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
480
16MHz
440 12MHz
400
360
ICC [µA]
320 8MHz
2MHz
280
240 0.454MHz
200
160
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC[V]
37.2.2.1 Pull-up
Figure 37-105. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V.
72
64
56
48
40
I [µA]
32
24
- 40 °C
16 25 °C
85 °C
8
105 °C
0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VPIN [V]
Figure 37-106. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V.
120
105
90
75
I [µA]
60
45
30 -40 °C
25 °C
15 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
VPIN [V]
135
120
105
90
75
I [µA]
60
45
-40 °C
30 25 °C
15 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VPIN [V]
1.8
1.6
1.4
1.2
1.0
VPIN [V]
0.8
-40 °C 25 °C
0.6
0.4
85 °C 105 °C
0.2
0.0
-10 -9 -8 -7 -6 -5 -4 -3 -2 -1 0
IPIN [mA]
3.0
2.7
2.4
2.1
1.8
VPIN [V]
1.5
1.2
- 40 °C
0.9
25 °C 85 °C
0.6
105 °C
0.3
0.0
-32 -28 -24 -20 -16 -12 -8 -4 0
IPIN [mA]
3.3
3.0
2.7
2.4
2.1
VPIN [V]
1.8
-40 °C
1.5
1.2
25 °C
0.9
0.6
85 °C 105 °C
0.3
0.0
-32 -28 -24 -20 -16 -12 -8 -4 0
IPIN [mA]
4.0
3.5 3.6V
3.3V
3.0 3.0V
2.7V
2.5
VPIN [V]
2.3V
2.0
1.8V
1.5
1.0
0.5
-24 -21 -18 -15 -12 -9 -6 -3 0
IPIN [mA]
1.0
0.9 105 °C
85 °C
0.8
0.7
25 °C
0.6
-40 °C
VPIN [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 2 4 6 8 10 12 14 16
IPIN [mA]
0.7
105 °C
0.6 85 °C
25 °C
0.5
-40 °C
0.4
VPIN [V]
0.3
0.2
0.1
0.0
0 2 4 6 8 10 12 14 16 18 20
IPIN [mA]
1.0 105 °C
0.9 85 °C
0.8 25 °C
-40 °C
0.7
0.6
VPIN [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 4 8 12 16 20 24 28 32
IPIN [mA]
1.5
1.8V
1.2
2.3V
2.7V
0.9 3.0V
V PIN [V]
3.3V
3.6V
0.6
0.3
0
0 5 10 15 20 25 30
I PIN [mA]
1.8
VIH
1.6
VIL
1.4
Vthreshold [V]
1.2
1.0
0.8
0.6
0.4
0.2
0.0
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
1.8
-40 °C
1.7
25 °C
1.6 85 °C
105 °C
1.5
1.4
Vthreshold [V]
1.3
1.2
1.1
1.0
0.9
0.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.75
-40 °C
1.60 25 °C
85 °C
1.45 105 °C
1.30
Vthreshold [V]
1.15
1.00
0.85
0.70
0.55
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
0.32
0.29
0.26
0.23
25 °C -40 °C
Vthreshold [V]
0.20
0.17
85 °C
0.14
0.11
105 °C
0.08
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.8
1.7
1.6
Differential Signed
1.5
Single-ended Unsigned
1.4
INL [LSB]
1.3
1.2
1.1
1
0.9
Single-ended Signed
0.8
0.7
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
1.4
1.35
1.3
Differential Mode
1.25
INL [LSB]
1.2
Single-ended Unsigned
1.15
1.1
1.05
Single-ended Signed
1
0.95
0.9
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
2.0
1.5
1.0
INL [LSB]
0.5
-0.5
-1.0
-1.5
-2.0
0 512 1024 1536 2048 2560 3072 3584 4096
0.9
0.88
0.86
Differential Mode
0.84
DNL [LSB]
Single-ended Signed
0.82
0.8
0.78
Single-ended Unsigned
0.76
0.74
0.72
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
0.87
0.86
DNL [LSB]
0.85
Single-ended Signed
0.84
0.83
0.82
0.81
Single-ended Unsigned
0.8
0.79
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
0.8
0.6
0.4
DNL [LSB]
0.2
-0.2
-0.4
-0.6
0 512 1024 1536 2048 2560 3072 3584 4096
ADC Input Code
2 Single-ended Signed
1
Gain Error [mV]
Differential Mode
0
-1
Single-ended Unsigned
-2
-3
-4
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
2.2
1.9
Single-ended Signed
1.6
Gain Error [mV]
1.3
Differential Mode
1
0.7
0.4
Single-ended Unsigned
0.1
-0.2
-0.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
-1
-1.1
-1.2
Offset Error [mV]
-1.3
-1.4
-1.5
Differential Mode
-1.6
-1.7
-1.8
-1.9
-2
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
4
Single-ended signed mode
3
2
Gain Error [mV]
1
Dif f erential mode
0
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
-1
-2
Single-ended unsigned mode
-3
-4
Temperature [ºC]
-0.3
-0.4
-0.5
Offset Error [mV]
-0.6
-0.7
Differential Signed
-0.8
-0.9
-1
-1.1
-1.2
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
1.3
Single-ended Signed
1.15
Single-ended Unsigned
Noise [mV RMS]
0.85
0.7
0.55
Differential Signed
0.4
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
1.3
1.2
Single-ended Signed
1.1
1
Noise [mV RMS]
0.9
0.6
0.5
Differential Signed
0.4
0.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
3.0
2.5
2.0
INL [LSB]
1.5 - 40°C
25°C
1.0 85°C
105°C
0.5
0.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
1.6
1.4
1.2
1.0
DNL[LSB]
- 40°C
0.8
0.6 25ºC
85°C
0.4 105°C
0.2
0.0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
0.185
0.180
0.175
Noise [mV RMS]
0.170
0.165
0.160
0.155
0.150
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [ºC]
18
105 °C
17 85 °C
16 -40° C
25 °C
15
14
13
12
VHYST [mV]
11
10
9
8
7
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
35 105 °C
34 85 °C
33
32
31
VHYST [mV]
25 °C
30
29
28 -40 °C
27
26
25
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
42
105 °C
40 85 °C
38
25 °C
36 -40 °C
34
VHYST [mV]
32
30
28
26
24
22
20
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
77
105 °C
74
71 85 °C
68
65
VHYST [mV]
25 °C
62
59
56 -40 °C
53
50
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
7.4
6.8
ICURRENTSOURCE [µA] 6.2
5.6
5.0
4.4
3.3 V
3.8 3.0 V
2.7 V
3.2
2.2 V
2.6
1.8 V
2.0 1.6 V
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
6.5
6
ICURRENTSOURCE [uA]
5.5
5
-40 °C
4.5 25 °C
4 85 °C
105 °C
3.5
3
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
0.050
0.025
-0.025
INL [LSB]
-0.050
-0.075
-0.100
25°C
-0.125
-0.150
0 10 20 30 40 50 60 70
SCALEFAC
1.004
1.6 V
1.002 1.8 V
2.2 V
1.000 2.7 V
3.0 V
Bandgap Voltage [V]
0.998 3.6 V
0.996
0.994
0.992
0.990
0.988
0.986
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
1.635
1.625
Falling Vcc
1.620
VBOT [V]
1.615
1.610
1.605
1.600
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
3.06
3.05 Rising Vcc
3.04
3.03
3.02
VBOT [V]
Temperature [°C]
130
125
120
115
110
tRST [ns]
105
100
95 105 °C
85 °C
90
85 25 °C
-40 °C
80
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
Figure 37-147. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 1.8V.
72
64
56
48
IRESET [uA]
40
32
24
-40 °C
16 25 °C
8 85 °C
105 °C
0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VRESET [V]
120
105
90
75
IRESET [µA]
60
45
30 -40 °C
25 °C
15 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
VRESET [V]
Figure 37-149. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.3V.
140
120
100
80
IRESET [uA]
60
40 -40 °C
25 °C
20 85 °C
105 °C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VRESET [V]
2.20
-40 °C
2.05 25 °C
85 °C
1.90 105 °C
1.75
Vthreshold [V]
1.60
1.45
1.30
1.15
1.00
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.75
-40 °C
1.60 25 °C
85 °C
1.45
105 °C
1.30
1.15
Vthreshold [V]
1.00
0.85
0.70
0.55
0.40
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
700 -40 °C
600 25 °C
500 85 °C
105 °C
ICC [µA]
400
300
200
100
0
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
650
-40 °C
585
520
25 °C
455
85
° °C
390 105°°C
ICC [µA]
325
260
195
130
65
0
0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
32.8
32.4
32.0
Frequency [kHz]
31.6
31.2
30.8 3.6 V
3.0 V
30.4 2.7 V
2.2 V
30.0 1.8 V
1.6 V
29.6
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
32.875
32.850 3.6 V
3.0 V
32.825 2.2 V
2.7 V
32.800 1.8 V
Frequency [kHz]
1.6 V
32.775
32.750
32.725
32.700
32.675
32.650
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
55
50
Frequency [kHz] 45
40
35
30
25
20
0 26 52 78 104 130 156 182 208 234 260
RC32KCAL[7..0]
2.16
2.14
2.12
2.10
Frequency [MHz]
2.08
2.06
2.04
3.6 V
2.02 3.0 V
2.00 2.7 V
2.2 V
1.98 1.8 V
1.96 1.6 V
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
2.0085
2.0070 3.6 V
2.0055 1.6 V
2.2 V
1.8 V
2.0040
Frequency [MHz]
3.0 V
2.7 V
2.0025
2.0010
1.9995
1.9980
1.9965
1.9950
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
0.31 %
0.29 %
Frequency Step size [%]
0.27 %
0.25 %
0.23 %
0.21 %
-40 °C
0.19 %
25 °C
0.17 % 85 °C
105 °C
0.15 %
0 16 32 48 64 80 96 112 128
CALA
36.0
35.5
35.0
34.5
Frequency [MHz]
34.0
33.5
33.0
3.6 V
32.5 3.0 V
2.7 V
32.0
2.2 V
31.5 1.8 V
1.6 V
31.0
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
32.145 3.6 V
32.120 1.61.6
V V
1.8 V
2.2 V
32.095 2.7 V
3.0 V
32.070
Frequency [MHz]
32.045
32.020
31.995
31.970
31.945
31.920
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
0.38 %
0.30 %
0.26 %
0.22 %
0.18 % 85°C
105°C
25°C
0.14 % - 40°C
0.10 %
0 16 32 48 64 80 96 112 128
CALA
Figure 37-163. 32MHz internal oscillator frequency vs. CALB calibration value.
VCC = 3.0V.
75
- 40°C
70 25°C
65 85°C
105°C
60
Frequency [MHz]
55
50
45
40
35
30
25
0 8 16 24 32 40 48 56 64
CALB
54
53
52
Frequency [MHz]
51
50
3.6 V
49
3.0 V
48 2.7 V
2.2 V
47 1.8 V
1.6 V
46
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
48.25
48.20 3.6 V
1.6 V
48.15 1.8 V
2.7 V
48.10 2.2 V
Frequency [MHz]
48.05 3.0 V
48.00
47.95
47.90
47.85
47.80
-40 -25 -10 5 20 35 50 65 80 95 110
Temperature [°C]
0.34 %
0.31 %
Frequency Step size [%]
0.28 %
0.25 %
0.22 %
-40 °C
0.19 % 25 °C
85 °C
0.16 % 105 °C
0.13 %
0.10 %
0 16 32 48 64 80 96 112 128
CALA
300
295
290
285
105°C
Holdtime [ns]
280 85°C
275
270 25°C
265
- 40°C
260
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Vcc [V]
34
25 °C
31 105 °C
-40 °C
28 85 °C
25
f MAX [MHz]
22
19
16
13
10
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
700
3.6V
600
500
3.0V
400 2.7V
ICC [µA]
300 2.2V
1.8V
200 1.6V
100
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
12
3.6V
10
8 3.0V
2.7V
ICC [mA]
4 2.2V
2 1.8V
1.6V
0
0 4 8 12 16 20 24 28 32
Frequency [MHz]
250 - 40°C
230
210 25°C
190 85°C
105°C
170
ICC [µA]
150
130
110
90
70
50
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
680
- 40°C
630 25°C
85°C
580 105°C
530
480
ICC [µA]
430
380
330
280
230
180
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1300
- 40°C
1200 25°C
85°C
1100 105°C
1000
900
ICC [µA]
800
700
600
500
400
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
4.8 - 40°C
25°C
4.4 85°C
105°C
4.0
3.6
3.2
ICC [mA]
2.8
2.4
2.0
1.6
1.2
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
12.0 - 40°C
11.5
25°C
11.0
85°C
10.5 105°C
10.0
ICC [mA]
9.5
9.0
8.5
8.0
7.5
7.0
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
VCC [V]
150
135 3.6 V
120
105 3.0 V
90 2.7 V
ICC [µA]
75 2.2 V
60 1.8 V
1.6 V
45
30
15
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
2.5
2.0
2.2 V
1.5
1.0
1.8 V
0.5 1.6 V
0.0
0 4 8 12 16 20 24 28 32
F [MH ]
Figure 37-178. Idle mode supply current vs. VCC.
fSYS = 32.768kHz internal
fSYSoscillator
32.768kHz. Internal Oscillator
34.75
34.00 105°C
- 40°C
33.25
32.50 85°C
25°C
31.75
ICC [µA]
31.00
30.25
29.50
28.75
28.00
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
153
105°C
141 85°C
25°C
129 - 40°C
117
105
ICC [µA]
93
81
69
57
45
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
400
375 - 40°C
25°C
350 85°C
105°C
325
300
ICC [µA]
275
250
225
200
175
150
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1850
- 40°C
25°C
1700
85°C
105°C
1550
1400
ICC [µA]
1250
1100
950
800
650
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
5.1
4.9 - 40°C
4.7 25°C
85°C
4.5 105°C
4.3
ICC [mA]
4.1
3.9
3.7
3.5
3.3
3.1
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
VCC [V]
2.7
3.6 V
2.4 3.0 V
2.7 V
2.1 2.2 V
1.8 V
1.8 1.6 V
1.5
ICC [µA]
1.2
0.9
0.6
0.3
0.0
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
2.7
105°C
2.4
2.1
1.8
1.5
ICC [µA]
1.2
0.9 85°C
0.6
0.3
25°C
0.0 - 40°C
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
4.10
3.80 105°C
3.50
3.20
2.90
ICC [µA]
2.60
2.30 85°C
2.00
1.70
25°C
1.40 - 40°C
1.10
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
0.9
0.8 Normal mode
0.7
0.6
Low-power mode
ICC [µA]
0.5
0.4
0.3
0.2
0.1
0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V CC [V]
12.5
11.5 105 °C
10.5
9.5
85 °C
8.5
25 °C
ICC [uA]
7.5 -40 °C
6.5
5.5
4.5
3.5
2.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
480
16MHz
440 12MHz
400
360
ICC [µA]
320 8MHz
2MHz
280
240 0.454MHz
200
160
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
37.3.2.1 Pull-up
Figure 37-189. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V.
70
60
50
40
IPIN [uA]
30
20
- 40°C
10 25°C
85°C
105°C
0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VPIN [V]
Figure 37-190. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V.
120
105
90
75
IPIN [µA]
60
45
30
- 40°C
15 25°C
85°C
105°C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
VPIN [V]
135
120
105
90
75
IPIN [µA]
60
45
30 - 40°C
25°C
15 85°C
0 105°C
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VPIN [V]
1.9
1.7
1.5
1.3
VPIN [V]
- 40°C
1.1
25°C
0.9
85°C 105°C
0.7
0.5
-9 -8 -7 -6 -5 -4 -3 -2 -1 0
IPIN [mA]
3.2
2.8
2.4
2.0
VPIN [V]
1.6
- 40°C
1.2
25°C 85°C
0.8
105°C
0.4
0.0
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
IPIN [mA]
3.6
3.2
2.8
2.4
- 40°C
2.0
VPIN [V]
1.6
25°C
1.2
105°C
0.8
85°C
0.4
0.0
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
IPIN [mA]
3.7
3.6 V
3.3 3.3 V
3.0 V
2.9
2.7 V
2.5
VPIN [V]
2.1
1.8 V
1.7 1.6 V
1.3
0.9
0.5
-24 -21 -18 -15 -12 -9 -6 -3 0
IPIN [mA]
1.0
85°C
0.9
0.8
25°C
0.7
105°C
0.6
- 40°C
VPIN [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 2 4 6 8 10 12 14 16 18 20
IPIN [mA]
1.0 105°C
85°C
0.9
25°C
0.8
- 40°C
0.7
0.6
VPIN [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 3 6 9 12 15 18 21 24 27 30
IPIN [mA]
1.0
105°C
0.9 85°C
0.8 25°C
0.7 - 40°C
0.6
VPIN [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 3 6 9 12 15 18 21 24 27 30
IPIN [mA]
1.50
1.6 V 1.8 V
1.35
1.20
1.05
2.7 V
0.90 3.0 V
VPIN [V]
3.3 V
0.75
3.6 V
0.60
0.45
0.30
0.15
0.00
0 3 6 9 12 15 18 21 24 27 30
IPIN [mA]
1.8
VIH
1.6
VIL
1.4
Vthreshold [V]
1.2
1.0
0.8
0.6
0.4
0.2
0.0
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
1.8
-40 °C
1.7
25 °C
1.6 85 °C
105 °C
1.5
1.4
Vthreshold [V]
1.3
1.2
1.1
1.0
0.9
0.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.75
-40 °C
1.60 25 °C
85 °C
1.45 105 °C
1.30
Vthreshold [V]
1.15
1.00
0.85
0.70
0.55
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
0.32
0.29
0.26
0.23
25 °C -40 °C
Vthreshold [V]
0.20
0.17
85 °C
0.14
0.11
105 °C
0.08
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
2.7
2.4
Single-ended unsigned mode
2.1
1.8
INL [LSB]
1.5
1.2
Dif f erential mode
0.9
0.6
1.6
1.4
1.0
INL [LSB]
0.4
Single-ended signed mode
0.2
0.0
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC sample rate [kSps]
2.0
1.5
1.0
0.5
INL [LSB]
0.0
-0.5
-1.0
-1.5
-2.0
0 512 1024 1536 2048 2560 3072 3584 4096
1.1
1.0
Single-ended unsigned mode
0.9
0.8
DNL [LSB]
0.7
0.6
Dif f erential mode
0.5
0.4
Single-ended signed mode
0.3
0.2
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
0.43
0.36
Dif f erential mode
DNL [LSB]
0.33
0.31
0.28
0.26
Single-ended signed mode
0.23
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC sample rate [kSps]
1.0
0.8
0.6
0.4
0.2
DNL [LSB]
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
0 512 1024 1536 2048 2560 3072 3584 4096
12
10
Single-ended signed mode
8
Gain Error [mV]
0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
6
Single-ended signed mode
5
Gain Error [mV]
2
Dif f erential mode
1
0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
-1.0
-1.1
-1.1
-1.2
Offset Error [mV]
-1.2
Dif f erential mode
-1.3
-1.3
-1.4
-1.4
-1.5
-1.5
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
7
Single-ended signed mode
6
5
Gain Error [mV]
3
Single-ended unsigned mode
2
Dif f erential mode
1
0
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [oC]
-0.3
-0.4
-0.5
Dif f erential mode
Offset Error [mV]
-0.6
-0.7
-0.8
-0.9
-1.0
-1.1
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
0.9
0.7
0.6
Noise [mV RMS]
0.4
0.3
Dif f erential mode
0.2
0.1
0.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
0.8
Single-ended signed mode
0.7
0.6
Noise [mV RMS]
0.3
Dif f erential mode
0.2
0.1
0.0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
2.4
2.1
1.8
1.5
DACINL [LSB]
1.2
- 40°C
25°C
0.9 85°C
105°C
0.6
0.3
0.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
1.8
1.6
1.4
1.2
DAC DNL [LSB]
1.0
0.8 - 40°C
0.6 25°C
85°C
0.4 105°C
0.2
0.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Vref [V]
0.178
0.176
0.174
0.172
Noise[mV RMS]
0.170
0.168
0.166
0.164
0.162
0.160
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [oC]
25
24 105°C
23 85°C
22
25°C
21
VHYST [mV]
20
19 - 40°C
18
17
16
15
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
36
105°C
34 85°C
32
30 25°C
VHYST [mV]
28
26 - 40°C
24
22
20
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
47
45 105°C
85°C
43
41 25°C
39
VHYST [mV]
- 40°C
37
35
33
31
29
27
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
76
73 105°C
85°C
70
67
64
VHYST [mV]
61 25°C
58
55 - 40°C
52
49
46
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
7
ICURRENTSOURCE [µA]
5
3.6V
4 3.0V
2.7V
2.2V
3
1.8V
1.6V
2
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
7.2
6.8
6.4
ICURRENTSOURCE [uA]
6.0
5.6
5.2
4.8
4.4 - 40°C
25°C
4.0 85°C
105°C
3.6
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
0.15
0.12
0.09
0.06
0.03
INL [LSB]
0.00
-0.03
-0.06
-0.09
-0.12
-0.15
0 8 16 24 32 40 48 56 64
SCALEFAC
1.004
1.6 V
1.8 V
1.002 2.2 V
2.7 V
3.0 V
Bandgap Voltage [V]
1.000 3.6 V
0.998
0.996
0.994
0.992
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
1.644
1.641
1.638
Rising Vcc
1.635
1.632
VBOT [V]
Falling Vcc
1.629
1.626
1.623
1.620
1.617
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
3.08
3.07
Rising Vcc
3.06
3.05
VBOT [V]
3.04
3.03
Falling Vcc
3.02
3.01
3.00
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
135
130
125
120
115
tRST [ns]
110
105
100
105°C
95 85°C
90 25°C
- 40°C
85
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
80
70
60
50
IRESET [µA]
40
30
- 40°C
20
25°C
10 85°C
105°C
0
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VRESET [V]
Figure 37-232. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.0V.
120
105
90
75
IRESET [µA]
60
45
30 - 40°C
25°C
15
85°C
0 105°C
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
VRESET [V]
150
135
120
105
90
IRESET [µA]
75
60
45
- 40°C
30
25°C
15 85°C
105°C
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VRESET [V]
2.2
- 40°C
2.1 25°C
85°C
1.9 105°C
1.8
VTHRESHOLD [V]
1.6
1.5
1.3
-
1.2
1.0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.75
- 40°C
1.60 25°C
85°C
1.45 105°C
1.30
VTHRESHOLD [V]
1.15
1.00
0.85
0.70
0.55
0.40
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
300
105°C
85°C
250 25°C
- 40°C
200
I CC [µA]
150
100
50
0
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
300
105°C
250
200
85°C
I CC [µA]
25°C
150 - 40°C
100
50
0
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
34.0
33.7
33.4
33.1
Frequency [kHz]
32.8
32.5
32.2
31.9 3.6 V
3.0 V
31.6 2.7 V
2.2 V
31.3 1.8 V
1.6 V
31.0
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
32.85 3.6 V
32.82 3.0 V
2.7 V
32.79 2.2 V
1.8 V
32.76 1.6 V
Frequency [kHz]
32.73
32.70
32.67
32.64
32.61
32.58
32.55
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
53
50
47
44
Frequency [kHz]
41
38
35
32
29
26
23
0 30 60 90 120 150 180 210 240 270
RC32KCAL[7..0]
2.12
2.10
2.08
2.06
Frequency [MHz]
2.04
2.02 3.6 V
2.00 3.0 V
2.7 V
1.98 2.2 V
1.8 V
1.96 1.6 V
1.94
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
2.010 3.6 V
2.008 1.8 V
2.006 2.2 V
2.004 3.0 V
1.6 V
Frequency [MHz]
2.002
2.7 V
2.000
1.998
1.996
1.994
1.992
1.990
1.988
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
0.28 %
0.26 %
0.24 %
Frequency Step size [%]
0.22 %
0.20 %
0.18 % - 40°C
25°C
0.16 % 105°C
85°C
0.14 %
0.12 %
0 16 32 48 64 80 96 112 128
CALA
35.5
35.0
34.5
34.0
Frequency [MHz]
33.5
33.0
32.5 3.6 V
3.0 V
32.0 2.7 V
2.2 V
31.5 1.8 V
1.6 V
31.0
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
32.12
32.08
32.04
Frequency [MHz]
32.00
3.6 V
31.96
31.92
3.0 V
31.88 2.7 V
2.2 V
31.84
1.8 V 1.6 V
31.80
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
0.34 %
0.31 %
0.28 %
Frequency Step size[%]
- 40°C
0.25 %
0.22 %
0.19 %
85°C
0.16 % 105°C
0.13 % 25°C
0.10 %
0 15 30 45 60 75 90 105 120 135
CALA
2.80 %
2.60 %
2.40 %
Frequency Step size [%]
2.20 %
2.00 %
1.80 %
1.60 %
1.40 %
- 40°C
1.20 % 25°C
1.00 % 85°C
105°C
0.80 %
0 8 16 24 32 40 48 56 64
CALB
53.4
52.6
51.8
51.0
Frequency[MHz]
50.2
49.4
48.6 3.6 V
47.8 3.0 V
2.7 V
2.2 V
47.0 1.8 V
46.2 1.6 V
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
48.15 3.6 V
48.10 3.0 V
2.7 V
48.05 2.2 V
1.8 V
48.00 1.6 V
Frequency[MHz]
47.95
47.90
47.85
47.80
47.75
47.70
-45 -30 -15 0 15 30 45 60 75 90 105
Temperature [°C]
0.30 %
0.28 %
0.26 %
Frequency Step size [%]
0.24 %
0.22 %
- 40°C
0.20 %
0.18 %
0.16 % 105°C
25°C
0.14 % 85°C
0.12 %
0.10 %
0 16 32 48 64 80 96 112 128
CALA
300
295
290
285
105°C
Holdtime [ns]
280 85°C
275
270 25°C
265
- 40°C
260
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Vcc [V]
30
-
28
Maximum Frequency [MHz]
26
24
- 40°C 85°C
22
25°C
20
105°C
18
16
14
12
10
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
800
700 3.6V
600
3.0V
500
Icc [µA]
2.7V
400
2.2V
300
1.8V
200 1.6V
100
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
13.5
12.0 3.6V
10.5
9.0 3.0V
Icc [mA]
2.7V
7.5
6.0
4.5
2.2V
3.0
1.8V
1.5
0
0 4 8 12 16 20 24 28 32
Frequency [MHz]
270
240 - 40 °C
210 25 °C
180 85 °C
105 °C
IccVcc [uA]
150
120
90
60
30
0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
800
-40 °C
700 25 °C
85 °C
600 105 °C
500
Icc [uA]
400
300
200
100
0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
1400 -40 °C
25 °C
1225 85 °C
105 °C
1050
875
Icc [uA]
700
525
350
175
0
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
5800
-40 °C
5200
25 °C
85 °C
4600 105 °C
4000
Icc [uA]
3400
2800
2200
1600
1000
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
13.4
12.6
-40 °C
11.8 25 °C
85 °C
11.0 105 °C
Icc [mA]
10.2
9.4
8.6
7.8
7.0
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
VCC [V]
160
3.6 V
140
120 3.0 V
100 2.7 V
Icc [µA]
80 2.2 V
60 1.8 V
1.6 V
40
20
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
5.4
4.8 3.6V
4.2
3.0V
3.6
Icc [mA]
2.7V
3.0
2.4
1.8
2.2V
1.2
0.6 1.8V
0
0 4 8 12 16 20 24 28 32
Frenquecy [MHz]
38
105 °C
37
36
35
-40 °C
34
85 °C
Icc [uA]
33
32 25 °C
31
30
29
28
27
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
160 105 °C
150 85 °C
25 °C
140 -40 °C
130
120
110
Icc[uA]
100
90
80
70
60
50
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
330 105 °C
85 °C
310
25 °C
290 -40 °C
270
250
230
Icc [uA]
210
190
170
150
130
110
90
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
2000
-40 °C
1800 25 °C
85 °C
105 °C
1600
1400
Icc [uA]
1200
1000
800
600
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
5000 -40 °C
25 °C
4750
85 °C
105 °C
4500
4250
Icc [uA]
4000
3750
3500
3250
3000
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Vcc [V]
5.0
3.6 V
4.5
3.0 V
4.0 2.7 V
3.5 2.2 V
1.8 V
3.0 1.6 V
Icc [uA]
2.5
2.0
1.5
1.0
0.5
0.0
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [°C]
5.0
105 °C
4.5
4.0
3.5
3.0
Icc [uA]
2.5
2.0
85 °C
1.5
1.0
0.5
25 °C
0.0 -40 °C
1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
7.3
6.8 105 °C
6.3
5.8
5.3
4.8
Icc [uA]
4.3
3.8
3.3 85 °C
2.8
2.3
1.8
1.3
25 °C
0.8 -40 °C
1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
0.9
0.8 Normal mode
0.7
0.6
Low-power mode
ICC [µA]
0.5
0.4
0.3
0.2
0.1
0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V CC [V]
12.5
11.5 105 °C
10.5
9.5
85 °C
8.5
25 °C
ICC [uA]
7.5 -40 °C
6.5
5.5
4.5
3.5
2.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
480
16MHz
440 12MHz
400
360
ICC [µA]
320 8MHz
2MHz
280
240 0.454MHz
200
160
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC[V]
37.4.2.1 Pull-up
Figure 37-273. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V
72
64
56
48
40
I [uA]
32
24
16
-40 °C
8 25 °C
85 °C
0
105 °C
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7
Vpin [V]
Figure 37-274. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V
120
105
90
75
I [uA]
60
45
30
-40 °C
15 25 °C
85 °C
0 105 °C
0.1 0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8 3.1
Vpin [V]
135
120
105
90
75
I [uA]
60
45
30
-40 °C
15 25 °C
85 °C
0 105 °C
0.1 0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8 3.1 3.4
Vpin [V]
1.9
1.8
1.7
1.6
1.5
1.4
1.3
Vpin [V]
1.2
1.1
1.0
-40 °C 25 °C 85 °C 105 °C
0.9
0.8
0.7
0.6
0.5
-10 -9 -8 -7 -6 -5 -4 -3 -2 -1 0
Ipin [mA]
3.30
2.95
2.60
2.25
Vpin [V]
1.90
1.55
-40 °C 25 °C 85 °C 105 °C
1.20
0.85
0.50
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
Ipin [mA]
3.5
3.2
2.9
2.6
2.3
Vpin [V]
2.0
-40 °C
1.7
1.4 25 °C
1.1
85 °C 105 °C
0.8
0.5
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
Ipin [mA]
3.65
3.6 V
3.30 3.3 V
2.95 3.0 V
2.60
2.7 V
Vpin [V]
2.25
1.90
1.8 V
1.55 1.6 V
1.20
0.85
0.50
-24 -21 -18 -15 -12 -9 -6 -3 0
Ipin [mA]
1.0
0.9
105 °C 85 °C
0.8 25 °C
0.7
-40 °C
0.6
Vpin [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 2 4 6 8 10 12 14 16 18 20
Ipin [mA]
1.1
105 °C
1.0
85 °C
0.9
25 °C
0.8
-40 °C
0.7
Vpin [V]
0.6
0.5
0.4
0.3
0.2
0.1
0.0
0 3 6 9 12 15 18 21 24 27 30
Ipin [mA]
1.0 105 °C
85 °C
0.9
0.8 25 °C
0.7 -40 °C
0.6
Vpin [V]
0.5
0.4
0.3
0.2
0.1
0.0
0 3 6 9 12 15 18 21 24 27 30
Ipin [mA]
1.50
1.35
1.20
1.8 V
1.05
1.6 V 2.7 V
0.90 3.0 V
3.3 V
Vpin [V]
0.75 3.6 V
0.60
0.45
0.30
0.15
0.00
0 3 6 9 12 15 18 21 24 27 30
Ipin [mA]
1.8
VIH
1.6
VIL
1.4
Vthreshold [V]
1.2
1.0
0.8
0.6
0.4
0.2
0.0
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
1.8 105 °C
85 °C
1.7 25 °C
1.6 -40 °C
1.5
Vthreshold [V]
1.4
1.3
1.2
1.1
1.0
0.9
0.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
1.75
105 °C
1.60 85 °C
25 °C
1.45
-40 °C
1.30
Vthreshold [V]
1.15
1.00
0.85
0.70
0.55
0.40
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
0.41
0.39
0.37
0.35
0.33
-40 °C
Vthreshold [V]
0.31
0.29
25 °C
0.27
0.25
0.23 85 °C
0.21
0.19 105 °C
0.17
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
1.8
1.7
1.6
Differential Signed
1.5
Single-ended Unsigned
1.4
INL [LSB]
1.3
1.2
1.1
1
0.9
Single-ended Signed
0.8
0.7
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
1.4
1.35
1.3
Differential Mode
1.25
INL [LSB]
1.2
Single-ended Unsigned
1.15
1.1
1.05
Single-ended Signed
1
0.95
0.9
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
2.0
1.5
1.0
INL [LSB]
0.5
-0.5
-1.0
-1.5
-2.0
0 512 1024 1536 2048 2560 3072 3584 4096
0.9
0.88
0.86
Differential Mode
0.84
DNL [LSB]
Single-ended Signed
0.82
0.8
0.78
Single-ended Unsigned
0.76
0.74
0.72
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
0.87
0.86
DNL [LSB]
0.85
Single-ended Signed
0.84
0.83
0.82
0.81
Single-ended Unsigned
0.8
0.79
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
0.8
0.6
0.4
DNL [LSB]
0.2
-0.2
-0.4
-0.6
0 512 1024 1536 2048 2560 3072 3584 4096
ADC Input Code
2 Single-ended Signed
1
Gain Error [mV]
Differential Mode
0
-1
Single-ended Unsigned
-2
-3
-4
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
2.2
1.9
Single-ended Signed
1.6
Gain Error [mV]
1.3
Differential Mode
1
0.7
0.4
Single-ended Unsigned
0.1
-0.2
-0.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
-1
-1.1
-1.2
Offset Error [mV]
-1.3
-1.4
-1.5
Differential Mode
-1.6
-1.7
-1.8
-1.9
-2
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
2
Single-ended Signed
1
Gain Error [mV]
Differential Signed
0
-1
Single-ended Unsigned
-2
-3
-4
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85
Temperature [ºC]
-0.3
-0.4
-0.5
Offset Error [mV]
-0.6
-0.7
Differential Signed
-0.8
-0.9
-1
-1.1
-1.2
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
1.3
Single-ended Signed
1.15
Single-ended Unsigned
Noise [mV RMS]
0.85
0.7
0.55
Differential Signed
0.4
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
1.3
1.2
Single-ended Signed
1.1
1
Noise [mV RMS]
0.9
0.6
0.5
Differential Signed
0.4
0.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
1.9
1.8
1.7
1.6
INL [LSB]
1.5
1.4
1.3
1.2 25°C
1.1
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
VREF [V]
0.9
0.85
DNL [LSB]
0.8
0.75
0.7
0.65
25ºC
0.6
1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
0.185
0.180
0.175
Noise [mV RMS]
0.170
0.165
0.160
0.155
0.150
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [ºC]
14
13 105°C
12 85°C
11
10
VHYST [mV]
25°C
9
7 -40°
6
4
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
30
28
105°C
26 85°C
24
25°C
VHYST [mV]
22
20 -40°C
18
16
14
12
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
32
30 105°C
85°C
28
26
25°C
VHYST [mV]
24
22
-40°C
20
18
16
14
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
68
64
105°C
85°C
60
56
25°C
VHYST [mV]
52
48
-40°C
44
40
36
32
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
8
7.5
7
ICURRENTSOURCE [µA]
6.5
6
5.5
5
4.5 3.6V
4 3.0V
3.5
3
2.2V
2.5 1.8V
2
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
6.5
ICURRENTSOURCE [µA]
5.5
4.5
-40°C
4
25°C
3.5 85°C
3
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
CURRCALIBA[3..0]
0.050
0.025
-0.025
INL [LSB]
-0.050
-0.075
-0.100
25°C
-0.125
-0.150
0 10 20 30 40 50 60 70
SCALEFAC
1.0024
1.0020
1.6V
1.0016 1.8V
Bandgap Voltage [V]
1.0012
1.0008
1.0004
1.0000
0.9996 2.7V
3.0V
0.9992
3.6V
0.9988
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
1.596
Rising Vcc
1.593
1.590
1.587
Vbot [V]
1.584
Falling Vcc
1.581
1.578
1.575
1.572
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [°C]
3.03
3.02
Rising Vcc
3.01
3.00
Vbot [V]
2.99
2.98
Falling Vcc
2.97
2.96
2.95
2.94
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Temperature [°C]
135
130
125
120
115
Trst [ns]
110
105
100 105 °C
95 85 °C
90
85
25 °C
-40 °C
80
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
80
72
64
56
48
Ireset [uA]
40
32
24
16
-40 °C
8 25 °C
85 °C
0 105 °C
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
Vreset [V]
Figure 37-316. Reset pin pull-up resistor current vs. reset pin voltage
VCC = 3.0V
135
120
105
90
Ireset [uA]
75
60
45
30
-40 °C
15 25 °C
85 °C
0 105 °C
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
Vreset [V]
150
135
120
105
90
Ireset [uA]
75
60
45
30 -40 °C
15 25 °C
85 °C
0 105 °C
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
Vreset [V]
2.20
-40 °C
2.05 25 °C
85 °C
1.90 105 °C
1.75
Vthreshold [V]
1.60
1.45
1.30
1.15
1.00
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
1.8 105 °C
1.6 85 °C
25 °C
1.4 -40 °C
VTHRESHOLD [V]
1.2
1.0
0.8
0.6
0.4
0.2
0.0
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VCC [V]
700 -40 °C
600 25 °C
500 85 °C
105 °C
ICC [µA]
400
300
200
100
0
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
650
-40 °C
585
520
25 °C
455
85
° °C
390 105°°C
ICC [µA]
325
260
195
130
65
0
0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8
VCC [V]
33.75
33.50
33.25
33.00
32.75
Frequency [kHz]
32.50
32.25
32.00
31.75 3.6 V
31.50 3.3 V
3.0 V
31.25 2.7 V
31.00 1.8 V
30.75
1.6 V
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
32.82
3.6 V
32.79 3.3 V
32.76 3.0 V
32.73 2.7 V
32.70 2.2 V
Frequency [kHz]
32.67
1.8 V
32.64
32.61
32.58
32.55
32.52
32.49
32.46
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
52
3.0 V
49
46
43
Frequency [kHz]
40
37
34
31
28
25
22
0 24 48 72 96 120 144 168 192 216 240 264
RC32KCA L[7..0]
2.16
2.14
2.12
2.10
Frequency [MHz]
2.08
2.06
2.04
3.6 V
2.02
3.3 V
2.00 3.0 V
2.7 V
1.98 2.2 V
1.8 V
1.96
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
2.006
2.004 3.6 V
3.3 V
2.002
3.0 V
2.000
2.7 V
1.998 2.2 V
Frequency [MHz]
1.996 1.8 V
1.994
1.992
1.990
1.988
1.986
1.984
1.982
1.980
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
0.30
0.28
0.26
0.24
Step Size [%]
0.22
0.20
-40 °C
0.18 25 °C
0.16 85 °C
0.14 105 °C
0 10 20 30 40 50 60 70 80 90 100 110 120 130
CALA
36.00
35.55
35.10
34.65
Frequency [MHz]
34.20
33.75
33.30
32.85
3.6 V
32.40 3.3 V
3.0 V
31.95
2.7 V
31.50 2.2 V
1.8 V
31.05
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
32.05
32.02 1.8 V
2.2 V
31.99
2.7 V
31.96 3.0 V
31.93 3.3 V
Frequency [MHz]
31.90
3.6 V
31.87
31.84
31.81
31.78
31.75
31.72
31.69
31.66
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
0.32
0.29
0.26
Step Size [%]
0.23
-40 °C
0.20
0.17 105 °C
85 °C
25 °C
0.14
0 10 20 30 40 50 60 70 80 90 100 110 120 130
CALA
53.9
53.2
52.5
51.8
Frequency [MHz]
51.1
50.4
49.7
49.0
3.6 V
48.3 3.3 V
3.0 V
47.6
2.7 V
46.9 2.2 V
46.2 1.8 V
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
48.3
1.8 V
48.2 2.2 V
2.7 V
48.1
3.0 V
3.3 V
3.6 V
Frequency [MHz]
48.0
47.9
47.8
47.7
47.6
47.5
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C]
0.28
0.26
0.24
Step Size [%]
0.22
0.2
-40 °C
0.18
0.16 105 °C
85 °C
0.14 25 °C
0 10 20 30 40 50 60 70 80 90 100 110 120 130
CALA
300
295
290
285
105°C
Holdtime [ns]
280 85°C
275
270 25°C
265
- 40°C
260
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Vcc [V]
31 -40 °C
25 °C
85 °C
28
105 °C
Frequency max [MHz]
25
22
19
16
13
10
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vcc [V]
38.1 ATxmega16A4U
38.1.1 Rev. E
z ADC may have missing codes in SE unsigned mode at low temp and low Vcc
z CRC fails for Range CRC when end address is the last word address of a flash section
z AWeX fault protection restore is not done correct in Pattern Generation Mode
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
3. AWeX fault protection restore is not done correct in Pattern Generation Mode
When a fault is detected the OUTOVEN register is cleared, and when fault condition is cleared, OUTOVEN
is restored according to the corresponding enabled DTI channels. For Common Waveform Channel Mode
(CWCM), this has no effect as the OUTOVEN is correct after restoring from fault. For Pattern Generation
Mode (PGM), OUTOVEN should instead have been restored according to the DTLSBUF register.
Problem fix/Workaround
For CWCM no workaround is required.
For PGM in latched mode, disable the DTI channels before returning from the fault condition. Then, set cor-
rect OUTOVEN value and enable the DTI channels, before the direction (DIR) register is written to enable
the correct outputs again.
38.1.2 Rev. A - D
Not sampled.
38.2.1 Rev. E
z ADC may have missing codes in SE unsigned mode at low temp and low Vcc
z CRC fails for Range CRC when end address is the last word address of a flash section
z AWeX fault protection restore is not done correct in Pattern Generation Mode
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
3. AWeX fault protection restore is not done correct in Pattern Generation Mode
When a fault is detected the OUTOVEN register is cleared, and when fault condition is cleared, OUTOVEN
is restored according to the corresponding enabled DTI channels. For Common Waveform Channel Mode
(CWCM), this has no effect as the OUTOVEN is correct after restoring from fault. For Pattern Generation
Mode (PGM), OUTOVEN should instead have been restored according to the DTLSBUF register.
Problem fix/Workaround
For CWCM no workaround is required.
For PGM in latched mode, disable the DTI channels before returning from the fault condition. Then, set cor-
rect OUTOVEN value and enable the DTI channels, before the direction (DIR) register is written to enable
the correct outputs again.
38.2.2 Rev. A - D
Not sampled.
38.3.1 Rev. D
z ADC may have missing codes in SE unsigned mode at low temp and low Vcc
z CRC fails for Range CRC when end address is the last word address of a flash section
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
38.3.2 Rev. C
z ADC may have missing codes in SE unsigned mode at low temp and low Vcc
z CRC fails for Range CRC when end address is the last word address of a flash section
z AWeX fault protection restore is not done correct in Pattern Generation Mode
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
Problem fix/Workaround
For CWCM no workaround is required.
For PGM in latched mode, disable the DTI channels before returning from the fault condition. Then, set cor-
rect OUTOVEN value and enable the DTI channels, before the direction (DIR) register is written to enable
the correct outputs again.
38.3.3 Rev. A - B
Not sampled.
38.4.1 rev. A
z ADC may have missing codes in SE unsigned mode at low temp and low Vcc
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. Updated the Application Table Section from 4K/4K/4K/4K to 8K/4K/4K/4K in the Figure 7-1 on page 14
Updated Table 36-4 on page 74, Table 36-36 on page 95, Table 36-68 on page 117 and Table 36-100 on page 139. Added
3.
Icc Power-down power consumption for T=105°C for all functions disabled and for WDT and sampled BOD enabled
Updated Table 36-20 on page 84, Table 36-52 on page 105, Table 36-84 on page 127 and Table 36-116 on page 149.
4.
Updated all tables to include values for T=85°C and T=105°C. Removed T=55°C
Changed Vcc to AVcc in Figure 28-1 on page 50 and in the text in Section 28. “ADC – 12-bit Analog to Digital Converter” on
6.
page 49 andSection 30. “AC – Analog Comparator” on page 53.
7. Changed values for 128A4U in Table 7-3 on page 17. Page size = 128, FWORD = Z(6:0)
Changed unit notation for parameter tSU;DAT to ns in Table 36-32 on page 92, Table 36-64 on page 113, and Table 36-128
8.
on page 157.
2. Updated “Errata” on page 327: added ERRATA “Rev. D” and “Rev. C” for “ATxmega64A4U” on page 329
2. Updated Figure 30-1 on page 54. The positive Mux has two “Input” while the negative Mux has four “Input”
2. Updated PE2 and PE3 pins in “Pinout/Block Diagram” on page 4 to indicate that these can be used as TOSC pins.
5. Added column for TWI using external driver interface in Table 32-3 on page 59.
7. Added application erase time for ATxmega16A4U in Table 36-21 on page 84.
Added ESR parameter to the External 16MHz crystal oscillator and XOSC characteristics:
ATxmega16A4U: Table 36-29 on page 87
11. ATxmega32A4U: Table 36-61 on page 108
ATxmega64A4U: Table 36-93 on page 130
ATxmega128A4U: Table 36-125 on page 152.
13. Added application erase time for ATxmega32A4U in Table 36-53 on page 105.
Updated ATxmega32A4U current consumption in electrical characteristics section, see “Current consumption” on
15.
page 117.
18. Added application erase time for ATxmega128A4U in Table 36-117 on page 149.
3. Updated the Table 36-4 on page 74 with new values for ICC active power consumption.
4. Updated all typical characteristics in “ Active mode supply current” on page 159.
14. Used Atmel new datasheet template that includes Atmel new addresses on the last page.
9. The order of several figures in the chapter “Typical Characteristics” has been changed
10. Several new figures have been added to and some figures have been removed from chapter “Typical Characteristics”
11. Several minor changes/corrections in text and figures have been performed
16. The heading ”I/O Pin Characteristics” on page 164 has been corrected (the text “and Reset” has been removed)
1. Initial revision.
1. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
2. Pinout/Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
3. Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
3.1 Block Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
4. Resources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
4.1 Recommended reading. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
7. Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.3 Flash Program Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
7.4 Fuses and Lock bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
7.5 Data Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
7.6 EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
7.7 I/O Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
7.8 Data Memory and Bus Arbitration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.9 Memory Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.10 Device ID and Revision. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.11 I/O Memory Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.12 Flash and EEPROM Page Size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
9. Event System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
9.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
9.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
24. USART . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
24.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
24.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
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