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Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
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 KA2803B — Earth Leakage Detector
January 2014

KA2803B
Earth Leakage Detector

Features Description
 Low Power Consumption: 5 mW, 100 V/200 V The KA2803B is designed for use in earth leakage
 Built-In Voltage Regulator circuit interrupters, for operation directly off the AC line
in breakers. The input of the differential amplifier is
 High-Gain Differential Amplifier connected to the secondary coil of ZCT (Zero Current
 0.4 mA Output Current Pulse to Trigger SCRs Transformer). The amplified output of differential
amplifier is integrated at external capacitor to gain
 Low External Part Count adequate time delay specified in KSC4613. The level
 DIP & SOP Packages, High Packing Density comparator generates a high level when earth leakage
current is greater than the fixed level.
 High Noise Immunity, Large Surge Margin
 Super Temperature Characteristic of
Input Sensitivity
 Wide Operating Temperature Range:
TA = -25°C to +80°C
 Operation from 12 V to 20 V Input
8-DIP
Functions
 Differential Amplifier
 Level Comparator
 Latch Circuit
8-SOP

Ordering Information

Part Number Operating Temperature Range Package Packing Method

KA2803B -25 to +80°C 8-Lead, Dual Inline Package (DIP) Tube

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8
 KA2803B — Earth Leakage Detector
Block Diagram

Figure 1. Block Diagram

Application Circuit

Figure 2. Full-Wave Application Circuit Figure 3. Half-Wave Application Circuit

Application Information
(Refer to full-wave application circuit in Figure 2) used to protect the earth leakage detector IC
(KA2803B). The range of RP is from several hundred
Figure 2 shows the KA2803B connected in a typical
Ω to several kΩ.
leakage current detector system. The power is applied
to the VCC terminal (Pin 8) directly from the power line. Capacitor C1 is for the noise canceller and a standard
The resistor RS and capacitor CS are chosen so that Pin value of C1 is 0.047 µF. Capacitor C2 is also a noise
8 voltage is at least 12 V. The value of CS is canceller capacitance, but it is not usually used.
recommended above 1 µF.
When high noise is present, a 0.047 µF capacitor may
If the leakage current is at the load, it is detected by the be connected between Pins 6 and 7. The amplified
zero current transformer (ZCT). The output voltage signal finally appears at the Pin 7 with pulse signal
signal of ZCT is amplified by the differential amplifier of through the internal latch circuit of the KA2803B. This
the KA2803B internal circuit and appears as a half-cycle signal drives the gate of the external SCR, which
sine wave signal referred to input signal at the output of energizes the trip coil, which opens the circuit breaker.
the amplifier. The amplifier closed-loop gain is fixed The trip time of the breaker is determined by capacitor
about 1000 times with internal feedback resistor to C3 and the mechanism breaker. This capacitor should
compensate for zero current transformer (ZCT) be selected under 1µF to satisfy the required trip time.
variations. The resistor RL should be selected so that The full-wave bridge supplies power to the KA2803B
the breaker satisfies the required sensing current. The during both the positive and negative half cycles of the
protection resistor RP is not usually used when high line voltage. This allows the hot and neutral lines to be
current is injected at the breaker; this resistor should be interchanged.

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 2
 KA2803B — Earth Leakage Detector
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.

Symbol Parameter Min. Max. Unit

VCC Supply Voltage 20 V
ICC Supply Current 8 mA
PD Power Dissipation 300 mW
TL Lead Temperature, Soldering 10 Seconds 260 °C
TA Operation Temperature Range -25 +80 °C
TSTG Storage Temperature Range -65 +150 °C

Electrical Characteristics
TA = -25°C to +80°C unless otherwise specified.

Test
Symbol Parameter Conditions Min. Typ. Max. Units
Circuit

VCC=12V TA= -25°C 580

ICC Supply Current 1 VR=OPEN TA= +25°C Figure 4 300 400 530 µA
VI=2 V
TA= +80°C 480
VCC=16 V,
Figure 5 14 16 18 mV
VT Trip Voltage VR=2 V~2.02 V, VI=2
(ms)
Note 1 12.5 14.2 17.0
Differential Amplifier Current VCC=16 V, VR~VI=30 mV,
Figure 7 -12 20 -30
Current 1 VOD=1.2 V
IO(D) µA
Differential Amplifier Current VCC=16 V, VOD=0.8 V,VR,
Figure 8 17 27 37
Current 2 VI Short=VP

VSC=1.4 V, TA= -25°C 200 400 800

IO Output Current VOS=0.8 V, TA= +25°C Figure 9 200 400 800 µA
VCC=16.0 V
TA= +80°C 100 300 600
VSCON Latch-On Voltage VCC=16 V Figure 10 0.7 1.0 1.4 V
ISCON Latch Input Current VCC=16 V Figure 11 -13 -7 -1 µA
IOSL Output Low Current VCC=12 V, VOSL=0.2 V Figure 12 200 800 1400 µA
VIDC Differential Input Clamp Voltage VCC=16 V, IIDC=100 mA Figure 13 0.4 1.2 2.0 V
VSM Maximum Current Voltage ISM=7 mA Figure 14 20 24 28 V
IS2 Supply Current 2 VCC=12.0 V, VOSL=0.6 V Figure 15 200 400 900 µA
VOS=12.0 V
VSOFF Latch-Off Supply Voltage VSC=1.8 V Figure 16 7 8 9 V
IIDC=100.0 mA
VCC=16 V, VR-VI=0.3 V,
tON Response Time Figure 17 2 3 4 ms
1 V<VX<5 V
Note:
1. Guaranteed by design, not tested in production.

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 3
 Test Circuits

Figure 4. Supply Current 1 Figure 5. Trip Voltage

Figure 6. VPN1 for VP Measurement Figure 7. Differential Amplifier Output Current 1

Figure 8. Differential Amplifier Output Current 2 Figure 9. Output Current

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 4
 Test Circuits (Continued)

Figure 10. Latch-On Voltage Figure 11. Latch Input Current

Figure 12. Output Low Current Figure 13. Differential Input Clamp Voltage

Figure 14. Maximum Current Voltage Figure 15. Supply Current 2

Figure 16. Latch-Off Supply Voltage Figure 17. Response Time

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 5
 Typical Performance Characteristics

Figure 18. Supply Current Figure 19. Differential Amplifier Output Current
(VR-VI=30 mV, VOD=1.2 V)

Figure 20. Differential Amplifier Output Current Figure 21.Output Current

(VR, VI=VP, VOD=0.8 V)

Figure 22. Output Low Current Figure 23.VCC Voltage vs. Supply Current 1

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 6
 KA2803B — Earth Leakage Detector
Typical Performance Characteristics (Continued)

Figure 24. Differential Amplifier Output Current 1 Figure 25.Differential Amplifier Output

Figure 26. Latch Input Current Figure 27.Output Low Current

Figure 28. Output Current Figure 29.VCC Voltage vs. Supply Current 2

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 7
 KA2803B — Earth Leakage Detector
Typical Performance Characteristics (Continued)

Figure 30. Differential Input Clamp Voltage Figure 31.Latch-Off Supply Voltage

Figure 32. Latch-On Input Voltage Figure 33.Maximum Supply

Figure 34. Trip and Output Figure 35.Output Response Time

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 8
 KA2803B — Earth Leakage Detector
Physical Dimensions

A [ ]
.400 10.15
.373 9.46

.036 [0.9 TYP]

(.092) [Ø2.337]

PIN #1 (.032) [R0.813]

.250±.005 [6.35±0.13]
PIN #1

B
TOP VIEW TOP VIEW
OPTION 1 OPTION 2

[ ]
.070 1.78
.045 1.14
.310±.010 [7.87±0.25]

.130±.005 [3.3±0.13]
7° TYP .210 MAX
[5.33]
7° TYP

C
.015 MIN
[0.38]
[ ]
.021 0.53
.015 0.37
[ ]
.140 3.55
.125 3.17
.300
[7.62]
.001[.025] C
.100 .430 MAX
[2.54] [10.92]

.060 MAX
NOTES: [1.52]
A. CONFORMS TO JEDEC REGISTRATION MS-001,
VARIATIONS BA
B. CONTROLING DIMENSIONS ARE IN INCHES
-.000[
.010+.005 0.254+0.127
-0.000 ]
REFERENCE DIMENSIONS ARE IN MILLIMETERS
C. DOES NOT INCLUDE MOLD FLASH OR PROTRUSIONS.
MOLD FLASH OR PROTRUSIONS SHALL NOT EXCEED
.010 INCHES OR 0.25MM.
D. DOES NOT INCLUDE DAMBAR PROTRUSIONS.
DAMBAR PROTRUSIONS SHALL NOT EXCEED
.010 INCHES OR 0.25MM.
E. DIMENSIONING AND TOLERANCING
PER ASME Y14.5M-1994.

N08EREVG

Figure 36. 8-Lead, Dual Inline Package (DIP)

Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the
warranty therein, which covers Fairchild products.

Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/.

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 9
 KA2803B — Earth Leakage Detector
Physical Dimensions

0.65
4.90±0.10 A
(0.635)
8 5
B

1.75
6.00±0.20 5.60
3.90±0.10

PIN ONE 1 4
INDICATOR
1.27
1.27
0.25 C B A LAND PATTERN RECOMMENDATION

SEE DETAIL A
0.175±0.75

0.22±0.30
1.75 MAX C

0.10
0.42±0.09 OPTION A - BEVEL EDGE

(0.86) x 45°
R0.10 GAGE PLANE
OPTION B - NO BEVEL EDGE
R0.10 0.36
NOTES: UNLESS OTHERWISE SPECIFIED
8°
0° A) THIS PACKAGE CONFORMS TO JEDEC
MS-012, VARIATION AA.
SEATING PLANE B) ALL DIMENSIONS ARE IN MILLIMETERS.
0.65±0.25 C) DIMENSIONS DO NOT INCLUDE MOLD
FLASH OR BURRS.
(1.04) D) LANDPATTERN STANDARD: SOIC127P600X175-8M.
DETAIL A E) DRAWING FILENAME: M08Arev15
SCALE: 2:1
F) FAIRCHILD SEMICONDUCTOR.

Figure 37. 8-Lead, Small Outline Package (SOP)

Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the
warranty therein, which covers Fairchild products.

Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/.

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 10
 KA2803B — Earth Leakage Detector

© 2000 Fairchild Semiconductor Corporation www.fairchildsemi.com

KA2803B • Rev. 1.0.8 11
 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.

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