Fundamentals of

Vacuum Technology
00.200.02
Kat.-Nr. 199 90
 Preface

Oerlikon Leybold Vacuum, a member of the globally active

industrial Oerlikon Group of companies has developed into
the world market leader in the area of vacuum technology.
In this leading position, we recognize that our customers
around the world count on Oerlikon Leybold Vacuum to
deliver technical superiority and maximum value for all our
products and services. Today, Oerlikon Leybold Vacuum is
strengthening that well-deserved reputation by offering a
wide array of vacuum pumps and aftermarket services to
meet your needs.

This brochure is meant to provide an easy to read overview

covering the entire range of vacuum technology and is inde-
pendent of the current Oerlikon Leybold Vacuum product
portfolio. The presented product diagrams and data are pro-
vided to help promote a more comprehensive understanding
of vacuum technology and are not offered as an implied war-
ranty. Content has been enhanced through the addition of
new topic areas with an emphasis on physical principles
affecting vacuum technology.

To us, partnership-like customer relationships are a funda-

mental component of our corporate culture as well as the
continued investments we are making in research and
development for our next generation of innovative vacuum
technology products. In the course of our over 150 year-long
corporate history, Oerlikon Leybold Vacuum developed a
comprehensive understanding of process and application
know-how in the field of vacuum technology. Jointly with our
partner customers, we plan to continue our efforts to open up
further markets, implement new ideas and develop pioneer-
ing products.

Cologne, June 2007

1
Fundamentals of Vacuum Technology

2
 Preface

Fundamentals
of Vacuum
Technology
revised and compiled by
Dr. Walter Umrath
with contributions from

Dr. Hermann Adam , Alfred Bolz, Hermann Boy,

Heinz Dohmen, Karl Gogol, Dr. Wolfgang Jorisch,
Walter Mnning, Dr. Hans-Jrgen Mundinger,
Hans-Dieter Otten, Willi Scheer, Helmut Seiger,
Dr. Wolfgang Schwarz, Klaus Stepputat, Dieter Urban,
Heinz-Josef Wirtzfeld, Heinz-Joachim Zenker

3
4
 Table of Contents
1. Vacuum physics Quantities, their symbols, 2.2 Choice of pumping process . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
units of measure and definitions . . . . . . . . . . . . . . . . . . . . . . .9 2.2.1 Survey of the most usual pumping processes . . . . . . . . . . . . . .60
1.1 Basic terms and concepts in vacuum technology . . . . . . . . . . . .9 2.2.2 Pumping of gases (dry processes) . . . . . . . . . . . . . . . . . . . . . .62
1.2 Atmospheric air . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 2.2.3 Pumping of gases and vapors (wet processes) . . . . . . . . . . . . .62
1.3 Gas laws and models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 2.2.4 Drying processes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64
1.3.1 Continuum theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 2.2.5 Production of an oil-free (hydrocarbon-free) vacuum . . . . . . . .65
1.3.2 Kinetic gas theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 2.2.6 Ultrahigh vacuum working Techniques . . . . . . . . . . . . . . . . . . .65
1.4 The pressure ranges in vacuum technology and 2.3 Evacuation of a vacuum chamber and determination of
their characterization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 pump sizes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .66
1.5 Types of flow and conductance . . . . . . . . . . . . . . . . . . . . . . . . .15 2.3.1 Evacuation of a vacuum chamber
1.5.1 Types of flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 (without additional sources of gas or vapor) . . . . . . . . . . . . . . .66
1.5.2 Calculating conductance values . . . . . . . . . . . . . . . . . . . . . . . .16 2.3.1.1 Evacuation of a chamber in the rough vacuum region . . . . . . .67
1.5.3 Conductance for piping and openings . . . . . . . . . . . . . . . . . . . .16 2.3.1.2 Evacuation of a chamber in the high vacuum region . . . . . . . .68
1.5.4 Conductance values for other elements . . . . . . . . . . . . . . . . . .18 2.3.1.3 Evacuation of a chamber in the medium vacuum region . . . . .68
2.3.2 Determination of a suitable backing pump . . . . . . . . . . . . . . . . .69
2. Vacuum Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19 2.3.3 Determination of pump-down time from nomograms . . . . . . . .70
2.1 Vacuum pumps: A survey . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19 2.3.4 Evacuation of a chamber where gases and
2.1.1 Oscillation displacement vacuum pumps . . . . . . . . . . . . . . . . . .20 vapors are evolved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
2.1.1.1 Diaphragm pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 2.3.5 Selection of pumps for drying processes . . . . . . . . . . . . . . . . . .71
2.1.2 Liquid sealed rotary displacement pumps . . . . . . . . . . . . . . . . .20 2.3.6 Flanges and their seals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
2.1.2.1 Liquid ring pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 2.3.7 Choice of suitable valves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73
2.1.2.2 Oil sealed rotary displacement pumps . . . . . . . . . . . . . . . . . . . .21 2.3.8 Gas locks and seal-off fittings . . . . . . . . . . . . . . . . . . . . . . . . . .75
2.1.2.2.1 Rotary vane pumps
(TRIVAC A, TRIVAC B, TRIVAC E, SOGEVAC) . . . . . . . . . . . .21 3. Vacuum measurement, monitoring, control
2.1.2.2.2 Rotary plunger pumps (E Pumps) . . . . . . . . . . . . . . . . . . . . . . .23 and regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76
2.1.2.2.3 Trochoid pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 3.1 Fundamentals of low-pressure measurement . . . . . . . . . . . . . .76
2.1.2.2.4 The gas ballast . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 3.2 Vacuum gauges with pressure reading that is independent
2.1.3 Dry compressing rotary displacement pumps . . . . . . . . . . . . . .27 of the type of gas . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
2.1.3.1 Roots pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27 3.2.1 Bourdon vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
2.1.3.2 Claw pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .31 3.2.2 Diaphragm vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
2.1.3.2.1 Claw pumps with internal compression for the 3.2.2.1 Capsule vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
semiconductor industry (DRYVAC Series) . . . . . . . . . . . . . . .33 3.2.2.2 DIAVAC diaphragm vacuum gauge . . . . . . . . . . . . . . . . . . . . . .78
2.1.3.2.2 Claw pump without internal compression for chemistry 3.2.2.3 Precision diaphragm vacuum gauges . . . . . . . . . . . . . . . . . . . .78
applications (ALLex) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35 3.2.2.4 Capacitance diaphragm gauges . . . . . . . . . . . . . . . . . . . . . . . .78
2.1.4 Accessories for oil-sealed rotary displacement pumps . . . . . . .38 3.2.3 Liquid-filled (mercury) vacuum gauges . . . . . . . . . . . . . . . . . . .79
2.1.5 Condensers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38 3.2.3.1 U-tube vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79
2.1.6 Fluid-entrainment pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40 3.2.3.2 Compression vacuum gauges (according to McLeod) . . . . . . .79
2.1.6.1 (Oil) Diffusion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41 3.3 Vacuum gauges with gas-dependent pressure reading . . . . . . .81
2.1.6.2 Oil vapor ejector pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43 3.3.1 Spinning rotor gauge (SRG) (VISCOVAC) . . . . . . . . . . . . . . . . .81
2.1.6.3 Pump fluids . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44 3.3.2 Thermal conductivity vacuum gauges . . . . . . . . . . . . . . . . . . . .82
2.1.6.4 Pump fluid backstreaming and its suppression 3.3.3 Ionization vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . .83
(Vapor barriers, baffles) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44 3.3.3.1 Cold-cathode ionization vacuum gauges
2.1.6.5 Water jet pumps and steam ejectors . . . . . . . . . . . . . . . . . . . . .45 (Penning vacuum gauges) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .83
2.1.7 Turbomolecular pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46 3.3.3.2 Hot-cathode ionization vacuum gauges . . . . . . . . . . . . . . . . . . .84
2.1.8 Sorption pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50 3.4 Adjustment and calibration; DKD, PTB national standards . . . .86
2.1.8.1 Adsorption pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50 3.4.1 Examples of fundamental pressure measurement methods
2.1.8.2 Sublimation pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51 (as standard methods for calibrating vacuum gauges . . . . . . . .87
2.1.8.3 Sputter-ion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51 3.5 Pressure monitoring,control and regulation in
2.1.8.4 Non evaporable getter pumps (NEG pumps) . . . . . . . . . . . . . .53 vacuum systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88
2.1.9 Cryopumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54 3.5.1 Fundamentals of pressure monitoring and control . . . . . . . . . .88
2.1.9.1 Types of cryopump . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54 3.5.2 Automatic protection, monitoring and control
2.1.9.2 The cold head and its operating principle . . . . . . . . . . . . . . . . .55 of vacuum systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .89
2.1.9.3 The refrigerator cryopump . . . . . . . . . . . . . . . . . . . . . . . . . . . . .56 3.5.3 Pressure regulation and control in rough and medium
2.1.9.4 Bonding of gases to cold surfaces . . . . . . . . . . . . . . . . . . . . . . .56 vacuum systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .90
2.1.9.5 Pumping speed and position of the cryopanels . . . . . . . . . . . . .57 3.5.4 Pressure regulation in high and ultrahigh vacuum systems . . .92
2.1.9.6 Characteristic quantities of a cryopump . . . . . . . . . . . . . . . . . . .57 3.5.5 Examples of applications with diaphragm controllers . . . . . . . .93

5
Table of Contents
4. Analysis of gas at low pressures using 5.5.1 Halogen leak detectors (HLD 4000, D-Tek) . . . . . . . . . . . . . .116
mass spectrometry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95 5.5.2 Leak detectors with mass spectrometers (MS) . . . . . . . . . . . .116
4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95 5.5.2.1 The operating principle for a MSLD . . . . . . . . . . . . . . . . . . . . .117
4.2 A historical review . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95 5.5.2.2 Detection limit, background, gas storage in oil
4.3 The quadrupole mass spectrometer (TRANSPECTOR) . . . . . .96 (gas ballast), floating zero-point suppression . . . . . . . . . . . . .117
4.3.1 Design of the sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96 5.5.2.3 Calibrating leak detectors; test leaks . . . . . . . . . . . . . . . . . . . .118
4.3.1.1 The normal (open) ion source . . . . . . . . . . . . . . . . . . . . . . . . . .96 5.5.2.4 Leak detectors with quadrupole
4.3.1.2 The quadrupole separation system . . . . . . . . . . . . . . . . . . . . . .97 mass spectrometer (ECOTEC II) . . . . . . . . . . . . . . . . . . . . . . .119
4.3.1.3 The measurement system (detector) . . . . . . . . . . . . . . . . . . . . .98 5.5.2.5 Helium leak detectors with 180 sector mass spectrometer
4.4 Gas admission and pressure adaptation . . . . . . . . . . . . . . . . . .99 (UL 200, UL 500) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119
4.4.1 Metering valve . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99 5.5.2.6 Direct-flow and counter-flow leak detectors . . . . . . . . . . . . . . .120
4.4.2 Pressure converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99 5.5.2.7 Partial flow operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .120
4.4.3 Closed ion source (CIS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99 5.5.2.8 Connection to vacuum systems . . . . . . . . . . . . . . . . . . . . . . . .121
4.4.4 Aggressive gas monitor (AGM) . . . . . . . . . . . . . . . . . . . . . . . . .99 5.5.2.9 Time constants . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .121
4.5 Descriptive values in mass spectrometry (specifications) . . . .101 5.6 Limit values / Specifications for the leak detector . . . . . . . . . .122
4.5.1 Line width (resolution) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101 5.7 Leak detection techniques using helium leak detectors . . . . .122
4.5.2 Mass range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101 5.7.1 Spray technique (local leak test) . . . . . . . . . . . . . . . . . . . . . . .122
4.5.3 Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101 5.7.2 Sniffer technology (local leak testing using the
4.5.4 Smallest detectable partial pressure . . . . . . . . . . . . . . . . . . . .101 positive pressure method) . . . . . . . . . . . . . . . . . . . . . . . . . . . .123
4.5.5 Smallest detectable partial pressure ratio (concentration) . . . .101 5.7.3 Vacuum envelope test (integral leak test) . . . . . . . . . . . . . . . .123
4.5.6 Linearity range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102 5.7.3.1 Envelope test test specimen pressurized with helium . . . . .123
4.5.7 Information on surfaces and amenability to bake-out . . . . . . .102 a) Envelope test with concentration measurement and
4.6 Evaluating spectra . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102 subsequent leak rate calculation . . . . . . . . . . . . . . . . . . . .123
4.6.1 Ionization and fundamental problems in gas analysis . . . . . . .102 b) Direct measurement of the leak rate with the leak
4.6.2 Partial pressure measurement . . . . . . . . . . . . . . . . . . . . . . . . .106 detector (rigid envelope) . . . . . . . . . . . . . . . . . . . . . . . . . . .123
4.6.3 Qualitative gas analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .106 5.7.3.2 Envelope test with test specimen evacuated . . . . . . . . . . . . . .123
4.6.4 Quantitative gas analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . .107 a) Envelope = plastic tent . . . . . . . . . . . . . . . . . . . . . . . . . . .123
4.7 Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .108 b) Rigid envelope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .123
4.7.1 Standard SQX software (DOS) for stand-alone operation 5.7.4 Bombing test, Storage under pressure . . . . . . . . . . . . . . . .123
(1 MS plus, 1 PC, RS 232) . . . . . . . . . . . . . . . . . . . . . . . . . . .108 5.8 Industrial leak testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .124
4.7.2 Multiplex/DOS software MQX
(1 to 8 MS plus 1 PC, RS 485) . . . . . . . . . . . . . . . . . . . . . . . .108 6 Thin film controllers and control units with quartz
4.7.3 Process-oriented software oscillators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125
Transpector-Ware for Windows . . . . . . . . . . . . . . . . . . . . . . . .108 6.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125
4.7.4 Development software TranspectorView . . . . . . . . . . . . . . . . .109 6.2 Basic principles of coating thickness measurement
4.8 Partial pressure regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . .109 with quartz oscillators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125
4.9 Maintenance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .109 6.3 The shape of quartz oscillator crystals . . . . . . . . . . . . . . . . . .126
6.4 Period measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127
5 Leaks and their detection . . . . . . . . . . . . . . . . . . . . . . . . . . .110 6.5 The Z match technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127
5.1 Types of leaks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110 6.6 The active oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127
5.2 Leak rate, leak size, mass flow . . . . . . . . . . . . . . . . . . . . . . . .110 6.7 The mode-lock oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . .128
5.2.1 The standard helium leak rate . . . . . . . . . . . . . . . . . . . . . . . . .112 6.8 Auto Z match technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .129
5.2.2 Conversion equations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112 6.9 Coating thickness regulation . . . . . . . . . . . . . . . . . . . . . . . . . .130
5.3 Terms and definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112 6.10 INFICON instrument variants . . . . . . . . . . . . . . . . . . . . . . . . . .131
5.4 Leak detection methods without a leak detector unit . . . . . . . .113
5.4.1 Pressure rise test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113 7 Application of vacuum technology for
5.4.2 Pressure drop test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114 coating techniques . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133
5.4.3 Leak test using vacuum gauges which are sensitive 7.1 Vacuum coating technique . . . . . . . . . . . . . . . . . . . . . . . . . . . .133
to the type of gas . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114 7.2 Coating sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133
5.4.4 Bubble immersion test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115 7.2.1 Thermal evaporators (boats, wires etc.) . . . . . . . . . . . . . . . . .133
5.4.5 Foam-spray test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115 7.2.2 Electron beam evaporators (electron guns) . . . . . . . . . . . . . . .134
5.4.6 Vacuum box check bubble . . . . . . . . . . . . . . . . . . . . . . . . . . . .115 7.2.3 Cathode sputtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .134
5.4.7 Krypton 85 test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115 7.2.4 Chemical vapor deposition . . . . . . . . . . . . . . . . . . . . . . . . . . . .134
5.4.8 High-frequency vacuum test . . . . . . . . . . . . . . . . . . . . . . . . . .115 7.3 Vacuum coating technology/coating systems . . . . . . . . . . . . .135
5.4.9 Testing with chemical reactions and dye penetration . . . . . . .115 7.3.1 Coating of parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .135
5.5 Leak detectors and how they work . . . . . . . . . . . . . . . . . . . . .116 7.3.2 Web coating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .135

6
 Table of Contents
7.3.3 Optical coatings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .136 Tab XI Nominal internal diameters (DN) and internal diameters
7.3.4 Glass coating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .137 of tubes, pipes and apertures with circular cross-section
7.3.5 Systems for producing data storage disks . . . . . . . . . . . . . . . .137 (according to PNEUROP). . . . . . . . . . . . . . . . . . . . . . . . . . . . .151
Tab XII Important data for common solvents . . . . . . . . . . . . . . . . . . . .151
8 Instructions for vacuum equipment operation . . . . . . . . . .139 Tab XIII Saturation pressure and density of water . . . . . . . . . . . . . . . .152
8.1 Causes of faults where the desired ultimate pressure is Tab XIV Hazard classificationof fluids . . . . . . . . . . . . . . . . . . . . . . . . . .153
not achieved or is achieved too slowly . . . . . . . . . . . . . . . . . .139 Tab XV Chemical resistance of commonly used elastomer
8.2 Contamination of vacuum vessels and eliminating gaskets and sealing materials . . . . . . . . . . . . . . . . . . . . . . . . .155
contamination . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .139 Tab XVI Symbols used invacuum technology . . . . . . . . . . . . . . . . . . . .157
8.3 General operating information for vacuum pumps . . . . . . . . . .139 Tab XVII Temperature comparison and conversion table . . . . . . . . . . . .160
8.3.1 Oil-sealed rotary vacuum pumps Fig. 9.1 Variation of mean free path (cm) with pressure
(Rotary vane pumps and rotary piston pumps) . . . . . . . . . . . .140 for various gases . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .160
8.3.1.1 Oil consumption, oil contamination, oil change . . . . . . . . . . . .140 Fig. 9.2 Diagram of kinetics of gases for air at 20C . . . . . . . . . . . . . .160
8.3.1.2 Selection of the pump oil when handling aggressive vapors . .140 Fig. 9.3 Decrease in air pressure and change in temperature
8.3.1.3 Measures when pumping various chemical substances . . . . .141 as a function of altitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .161
8.3.1.4 Operating defects while pumping with gas ballast Fig. 9.4 Change in gas composition of the atmosphere as a
Potential sources of error where the required ultimate function of altitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .161
pressure is not achieved . . . . . . . . . . . . . . . . . . . . . . . . . . . . .142 Fig. 9.5 Conductance values for piping of commonly used
8.3.2 Roots pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .142 nominal internal diameters with circular cross-
8.3.2.1 General operating instructions, section for molecular flow . . . . . . . . . . . . . . . . . . . . . . . . . . . .161
installation and commissioning . . . . . . . . . . . . . . . . . . . . . . . .142 Fig. 9.6 Conductance values for piping of commonly used
8.3.2.2 Oil change, maintenance work . . . . . . . . . . . . . . . . . . . . . . . . .142 nominal internal diameters with circular cross-
8.3.2.3 Actions in case of operational disturbances . . . . . . . . . . . . . .143 section for molecular flow . . . . . . . . . . . . . . . . . . . . . . . . . . . .161
8.3.3 Turbomolecular pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .143 Fig. 9.7 Nomogram for determination of pump-down time tp
8.3.3.1 General operating instructions . . . . . . . . . . . . . . . . . . . . . . . . .143 of a vessel in the rough vacuum pressure range . . . . . . . . . .162
8.3.3.2 Maintenance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .143 Fig. 9.8 Nomogram for determination of the conductance of
8.3.4 Diffusion and vapor-jet vacuum pumps . . . . . . . . . . . . . . . . . .144 tubes with a circular cross-section for air at 20C
8.3.4.1 Changing the pump fluid and cleaning the pump . . . . . . . . . .144 in the region of molecular flow . . . . . . . . . . . . . . . . . . . . . . . . .163
8.3.4.2 Operating errors with diffusion and vapor-jet pumps . . . . . . .144 Fig. 9.9 Nomogram for determination of conductance of
8.3.5 Adsorption pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .144 tubes in the entire pressure range . . . . . . . . . . . . . . . . . . . . . .164
8.3.5.1 Reduction of adsorption capacity . . . . . . . . . . . . . . . . . . . . . . .144 Fig. 9.10 Determination of pump-down time in the medium vacuum
8.3.5.2 Changing the molecular sieve . . . . . . . . . . . . . . . . . . . . . . . . .144 range taking into account the evolution of gas
8.3.6 Titanium sublimation pumps . . . . . . . . . . . . . . . . . . . . . . . . . .145 from the walls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .165
8.3.7 Sputter-ion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .145 Fig.9.11 Saturation vapor pressure of various substances . . . . . . . . . .166
8.4 Information on working with vacuum gauges . . . . . . . . . . . . . .145 Fig. 9.12 Saturation vapor pressure of pump fluids for oil and
8.4.1 Information on installing vacuum sensors . . . . . . . . . . . . . . . .145 mercury fluid entrainment pumps . . . . . . . . . . . . . . . . . . . . . . .166
8.4.2 Contamination at the measurement system and its removal . .146 Fig. 9.13 Saturation vapor pressure of major metals used in
8.4.3 The influence of magnetic and electrical fields . . . . . . . . . . . .146 vacuum technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .166
8.4.4 Connectors, power pack, measurement systems . . . . . . . . . .146 Fig. 9.14 Vapor pressure of nonmetallic sealing materials
(the vapor pressure curve for fluoro rubber lies between
9. Tables, formulas, nomograms, diagrams and symbols . . .147 the curves for silicone rubber and Teflon). . . . . . . . . . . . . . . . .167
Tab I Permissible pressure units including the torr and its Fig. 9.15 Saturation vapor pressure ps of various substances
conversion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .147 relevant for cryogenic technology in a
Tab II Conversion of pressure units . . . . . . . . . . . . . . . . . . . . . . . . . .147 temperaturerange of T = 2 80 K. . . . . . . . . . . . . . . . . . . . . .167
Tab III Mean free path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .147 Fig. 9.16 Common working ranges of vacuum pumps . . . . . . . . . . . . . .167
Tab IV Compilation of important formulas pertaining to the Fig. 9.16a Measurement ranges of common vacuum gauges . . . . . . . .168
kinetic theory of gases . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .148 Fig. 9.17 Specific volume of saturated water vapor . . . . . . . . . . . . . . . .169
Tab V Important values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .148 Fig. 9.18 Breakdown voltage between electrodes for air
Tab VI Conversion of pumping speed (volume flow rate) units . . . . . .149 (Paschen curve) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .169
Tab VII Conversion of throughput Fig 9.19 Phase diagram of water . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .170
(a,b) QpV units; leak rate units . . . . . . . . . . . . . . . . . . . . . . . . . . . . .149
Tab VIII Composition of atmospheric air . . . . . . . . . . . . . . . . . . . . . . . .150 10. The statutory units used in vacuum technology . . . . . . . .171
Tab IX Pressure ranges used in vacuum technology and their 10.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .171
characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150 10.2 Alphabetical list of variables, symbols and units frequently
Tab X Outgassing rate of materials . . . . . . . . . . . . . . . . . . . . . . . . . .150 used in vacuum technology and its applications . . . . . . . . . . .171
10.3 Remarks on alphabetical list in Section 10.2 . . . . . . . . . . . . . .175

7
Table of Contents
10.4 Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .176
10.4.1 Basic SI units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .176
10.4.2 Derived coherent SI units with special names andsymbols . .177
10.4.3 Atomic units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .177
10.4.4 Derived noncoherent SI units with special names
and symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .177

11. National and international standards and

recommendations particularly relevant
to vacuum technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .178
11.1 National and international standards and
recommendations of special relevance to
vacuum technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .178

12. References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .182

13. Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .194

8
 Vacuum physics
1. Quantities, their symbols, units of measure Ultimate pressure pend
The lowest pressure which can be achieved in a vacuum vessel. The
and definitions socalled ultimate pressure pend depends not only on the pumps suction
speed but also upon the vapor pressure pd for the lubricants, sealants and
(cf. DIN 28 400, Part 1, 1990, DIN 1314 and DIN 28 402) propellants used in the pump. If a container is evacuated simply with an
oil-sealed rotary (positive displacement) vacuum pump, then the ultimate
1.1 Basic terms and concepts in vacuum tech- pressure which can be attained will be determined primarily by the vapor
nology pressure of the pump oil being used and, depending on the cleanliness of
the vessel, also on the vapors released from the vessel walls and, of
Pressure p (mbar) course, on the leak tightness of the vacuum vessel itself.
of fluids (gases and liquids). (Quantity: pressure; symbol: p; unit of mea-
sure: millibar; abbreviation: mbar.) Pressure is defined in DIN Standard
Ambient pressure pamb
1314 as the quotient of standardized force applied to a surface and the
or (absolute) atmospheric pressure
extent of this surface (force referenced to the surface area). Even though
the Torr is no longer used as a unit for measuring pressure (see Section Overpressure pe or gauge pressure
10), it is nonetheless useful in the interest of transparency to mention this (Index symbol from excess)
pressure unit: 1 Torr is that gas pressure which is able to raise a column of
mercury by 1 mm at 0 C. (Standard atmospheric pressure is 760 Torr or pe = pabs pamb
760 mm Hg.) Pressure p can be more closely defined by way of subscripts: Here positive values for pe will indicate overpressure or gauge pressure;
negative values will characterize a vacuum.
Absolute pressure pabs
Absolute pressure is always specified in vacuum technology so that the Working pressure pW
abs index can normally be omitted. During evacuation the gases and/or vapors are removed from a vessel.
Gases are understood to be matter in a gaseous state which will not, how-
Total pressure pt ever, condense at working or operating temperature. Vapor is also matter in
The total pressure in a vessel is the sum of the partial pressures for all the a gaseous state but it may be liquefied at prevailing temperatures by
gases and vapors within the vessel. increasing pressure. Finally, saturated vapor is matter which at the prevail-
ing temperature is gas in equilibrium with the liquid phase of the same sub-
Partial pressure pi stance. A strict differentiation between gases and vapors will be made in the
The partial pressure of a certain gas or vapor is the pressure which that gas comments which follow only where necessary for complete understanding.
or vapor would exert if it alone were present in the vessel.
Particle number density n (cm-3)
Important note: Particularly in rough vacuum technology, partial pressure in
According to the kinetic gas theory the number n of the gas molecules, ref-
a mix of gas and vapor is often understood to be the sum of the partial
erenced to the volume, is dependent on pressure p and thermodynamic
pressures for all the non-condensable components present in the mix in
temperature T as expressed in the following:
case of the partial ultimate pressure at a rotary vane pump, for example.
p=nkT (1.1)
Saturation vapor pressure ps n = particle number density
The pressure of the saturated vapor is referred to as saturation vapor pres- k = Boltzmanns constant
sure ps. ps will be a function of temperature for any given substance.
At a certain temperature, therefore, the pressure exerted by a gas depends
only on the particle number density and not on the nature of the gas. The
Vapor pressure pd
nature of a gaseous particle is characterized, among other factors, by its
Partial pressure of those vapors which can be liquefied at the temperature
mass mT.
of liquid nitrogen (LN2).

Gas density (kg m-3, g cm-3)

Standard pressure pn The product of the particle number density n and the particle mass mT is
Standard pressure pn is defined in DIN 1343 as a pressure of the gas density :
pn = 1013.25 mbar. = n mT (1.2)
The ideal gas law
The relationship between the mass mT of a gas molecule and the molar
mass M of this gas is as follows:

M = NA mT (1.3)

9
Vacuum physics
Avogadros number (or constant) NA indicates how many gas particles will The main task of vacuum technology is to reduce the particle number den-
be contained in a mole of gas. In addition to this, it is the proportionality sity n inside a given volume V. At constant temperature this is always
factor between the gas constant R and Boltzmanns constant k: equivalent to reducing the gas pressure p. Explicit attention must at this
point be drawn to the fact that a reduction in pressure (maintaining the
R = NA k (1.4)
volume) can be achieved not only by reducing the particle number density
Derivable directly from the above equations (1.1) to (1.4) is the correlation n but also (in accordance with Equation 1.5) by reducing temperature T at
between the pressure p and the gas density of an ideal gas. constant gas density. This important phenomenon will always have to be
taken into account where the temperature is not uniform throughout
p= RT (1.5) volume V.
M
The following important terms and concepts are often used in vacuum
In practice we will often consider a certain enclosed volume V in which the technology:
gas is present at a certain pressure p. If m is the mass of the gas present
within that volume, then Volume V (l, m3, cm3)
m The term volume is used to designate
= (1.6) a) the purely geometric, usually predetermined, volumetric content of a
V
vacuum chamber or a complete vacuum system including all the piping
The ideal gas law then follows directly from equation (1.5): and connecting spaces (this volume can be calculated);
b) the pressure-dependent volume of a gas or vapor which, for example, is
m moved by a pump or absorbed by an adsorption agent.
p V = R T = R T (1.7)
M
Volumetric flow (flow volume) qv
Here the quotient m / M is the number of moles present in volume V.
(l/s, m3/h, cm3/s )
The simpler form applies for m / M = 1, i.e. for 1 mole: The term flow volume designates the volume of the gas which flows
through a piping element within a unit of time, at the pressure and tempera-
pV=RT (1.7a)
ture prevailing at the particular moment. Here one must realize that,
The following numerical example is intended to illustrate the correlation although volumetric flow may be identical, the number of molecules moved
between the mass of the gas and pressure for gases with differing molar may differ, depending on the pressure and temperature.
masses, drawing here on the numerical values in Table IV (Chapter 9).
Contained in a 10-liter volume, at 20 C, will be Pumping speed S (l/s, m3/h, cm3/s )
a) 1g of helium The pumping speed is the volumetric flow through the pumps intake port.
b) 1g of nitrogen
dV
When using the equation (1.7) there results then at V = 10 l , m = 1 g, S = (1.8a)
dt
1g 83.14 mbar  mol 1 K 1 293 K
p= = If S remains constant during the pumping process, then one can use the
10  K 4 g mol 1
difference quotient instead of the differential quotient:
= 609 mbar
V
R = 83.14 mbar l mol1 K1, T = 293 K (20 C) S = (1.8b)
t
1g 83.14 mbar  mol 1 K 1 293 K
p= = (A conversion table for the various units of measure used in conjunction
10  K 28 g mol 1 with pumping speed is provided in Section 9, Table VI).
= 87 mbar
In case a) where M = 4 g mole-1 (monatomic gas): Quantity of gas (pV value), (mbar l)
The quantity of a gas can be indicated by way of its mass or its weight in
In case b), with M = 28 g mole-1 (diatomic gas): the units of measure normally used for mass or weight. In practice, howev-
The result, though appearing to be paradoxical, is that a certain mass of a er, the product of p V is often more interesting in vacuum technology than
light gas exerts a greater pressure than the same mass of a heavier gas. If the mass or weight of a quantity of gas. The value embraces an energy
dimension and is specified in millibar liters (mbar l) (Equation 1.7).
one takes into account, however, that at the same gas density (see
Where the nature of the gas and its temperature are known, it is possible to
Equation 1.2) more particles of a lighter gas (large n, small m) will be pre-
use Equation 1.7b to calculate the mass m for the quantity of gas on the
sent than for the heavier gas (small n, large m), the results become more
basis of the product of p V:
understandable since only the particle number density n is determinant for
the pressure level, assuming equal temperature (see Equation 1.1). p V = m R T (1.7)
M

10
 Vacuum physics
p V M
m= (1.7b) qpV = p S (1.10a)
R T
where S is the pumping speed of the pump at intake pressure of p.
Although it is not absolutely correct, reference is often made in practice to
(The throughput of a pump is often indicated with Q, as well.)
the quantity of gas p V for a certain gas. This specification is incomplete;
the temperature of the gas T, usually room temperature (293 K), is normally The concept of pump throughput is of major significance in practice and
implicitly assumed to be known. should not be confused with the pumping speed! The pump throughput is
the quantity of gas moved by the pump over a unit of time, expressed in
Example: The mass of 100 mbar l of nitrogen (N2) at room temperature
mbar l/s; the pumping speed is the transportation capacity which the
(approx. 300 K) is:
pump makes available within a specific unit of time, measured in m3/h
or l/s.
100 mbar  28 g mol 1
m= =
83 mbar  mol 1 K 1 300 K The throughput value is important in determining the size of the backing
pump in relationship to the size of a high vacuum pump with which it is con-
2800
= g = 0.113 g nected in series in order to ensure that the backing pump will be able to
300 83 take off the gas moved by the high vacuum pump (see Section 2.32).

Analogous to this, at T = 300 K: Conductance C (l s1)

The pV flow through any desired piping element, i.e. pipe or hose, valves,
1 mbar l O2 = 1.28 10-3 g O2
nozzles, openings in a wall between two vessels, etc., is indicated with
70 mbar l Ar = 1.31 10-1 g Ar
qpV = C(p1 p2) = p C (1.11)
The quantity of gas flowing through a piping element during a unit of time
Here p = (p1 p2) is the differential between the pressures at the inlet and
in accordance with the two concepts for gas quantity described above can
outlet ends of the piping element. The proportionality factor C is designated
be indicated in either of two ways, these being:
as the conductance value or simply conductance. It is affected by the
geometry of the piping element and can even be calculated for some sim-
Mass flow qm (kg/h, g/s), pler configurations (see Section 1.5).
this is the quantity of a gas which flows through a piping element, referenced to
time In the high and ultrahigh vacuum ranges, C is a constant which is indepen-
dent of pressure; in the rough and medium-high regimes it is, by contrast,
m dependent on pressure. As a consequence, the calculation of C for the pip-
qm = or as
t ing elements must be carried out separately for the individual pressure
ranges (see Section 1.5 for more detailed information).
pV flow qpV (mbar l s1).
pV flow is the product of the pressure and volume of a quantity of gas flow- From the definition of the volumetric flow it is also possible to state that:
ing through a piping element, divided by time, i.e.: The conductance value C is the flow volume through a piping element. The
equation (1.11) could be thought of as Ohms law for vacuum technology,
pV d (p V) in which qpV corresponds to current, p the voltage and C the electrical
qpV = =
t dt conductance value. Analogous to Ohms law in the science of electricity, the
resistance to flow
pV flow is a measure of the mass flow of the gas; the temperature to be
indicated here. 1
R =
C
Pump throughput qpV
has been introduced as the reciprocal value to the conductance value. The
The pumping capacity (throughput) for a pump is equal either to the mass
equation (1.11) can then be re-written as:
flow through the pump intake port:
1
m qpV = p (1.12)
qm = (1.9) R
t
The following applies directly for connection in series:
or to the pV flow through the pumps intake port:
R = R1 + R2 + R3 . . . (1.13)
pV
qpV =
t When connected in parallel, the following applies:

1 1 1 1
It is normally specified in mbar l s1. Here p is the pressure on the intake ------ = + + + (1.13a)
side of the pump. If p and V are constant at the intake side of the pump, the R R1 R2 R3
throughput of this pump can be expressed with the simple equation

11
Vacuum physics
Leak rate qL (mbar l s1) ---
C
According to the definition formulated above it is easy to understand that Z = ----- (1.16)
the size of a gas leak, i.e. movement through undesired passages or pipe
elements, will also be given in mbar l s1. A leak rate is often measured
or indicated with atmospheric pressure prevailing on the one side of the 8 k T 8 R T
where c= = (1.17)
barrier and a vacuum at the other side (p < 1 mbar). If helium (which may mT M
be used as a tracer gas, for example) is passed through the leak under
exactly these conditions, then one refers to standard helium conditions. 1
and = (1.18)
2 n (2r)2
Outgassing (mbar l)
The term outgassing refers to the liberation of gases and vapors from the Thus the mean free path length for the particle number density n is, in
walls of a vacuum chamber or other components on the inside of a vacuum accordance with equation (1.1), inversely proportional to pressure p. Thus
system. This quantity of gas is also characterized by the product of p V, the following relationship holds, at constant temperature T, for every gas
where V is the volume of the vessel into which the gases are liberated, and
by p, or better p, the increase in pressure resulting from the introduction p = const (1.19)
of gases into this volume. Used to calculate the mean free path length for any arbitrary pressures and
various gases are Table III and Fig. 9.1 in Chapter 9. The equations in gas
Outgassing rate (mbar l s1) kinetics which are most important for vacuum technology are also summa-
This is the outgassing through a period of time, expressed in mbar l s1. rized (Table IV) in chapter 9.

Outgassing rate (mbar l s1 cm2) Impingement rate zA (cm2 s1) and

(referenced to surface area) monolayer formation time (s)
In order to estimate the amount of gas which will have to be extracted, A technique frequently used to characterize the pressure state in the high
knowledge of the size of the interior surface area, its material and the sur- vacuum regime is the calculation of the time required to form a monomole-
face characteristics, their outgassing rate referenced to the surface area cular or monoatomic layer on a gas-free surface, on the assumption that
and their progress through time are important. every molecule will stick to the surface. This monolayer formation time is
closely related with the so-called impingement rate zA. With a gas at rest the
Mean free path of the molecules (cm) and collision rate z (s-1) impingement rate will indicate the number of molecules which collide with
The concept that a gas comprises a large number of distinct particles the surface inside the vacuum vessel per unit of time and surface area:
between which aside from the collisions there are no effective forces,
n c
has led to a number of theoretical considerations which we summarize zA = (1.20)
today under the designation kinetic theory of gases.
4

One of the first and at the same time most beneficial results of this theory
If a is the number of spaces, per unit of surface area, which can accept a
was the calculation of gas pressure p as a function of gas density and the
specific gas, then the monolayer formation time is
mean square of velocity c2 for the individual gas molecules in the mass of
molecules mT: a 4 a
= = (1.21)
__ 1 __ zA n c
1
p = --- c2 = ---- n mT c2 (1.14)
3 3
Collision frequency zv (cm3 s1)
where This is the product of the collision rate z and the half of the particle number
__ kT density n, since the collision of two molecules is to be counted as only one
c2 = 3 ------ (1.15) collision:
mT
zV = n z (1.21a)
The gas molecules fly about and among each other, at every possible 2
velocity, and bombard both the vessel walls and collide (elastically) with
each other. This motion of the gas molecules is described numerically with
the assistance of the kinetic theory of gases. A molecules average number
of collisions over a given period of time, the so-called collision index z, and
the mean path distance which each gas molecule covers between two colli-
sions with other molecules, the so-called mean free path length , are
described as shown below as a function of the mean molecule velocity -c
the molecule diameter 2r and the particle number density molecules n as
a very good approximation:

12
 Vacuum physics
1.2 Atmospheric air Gay-Lussacs Law (Charles Law)

Prior to evacuation, every vacuum system on earth contains air and it will V = V0 (1 + t )
always be surrounded by air during operation. This makes it necessary to
be familiar with the physical and chemical properties of atmospheric air. for p = constant (isobar)
The atmosphere is made up of a number of gases and, near the earths Amontons Law
surface, water vapor as well. The pressure exerted by atmospheric air is
p = p0 (1 + t )
referenced to sea level. Average atmospheric pressure is 1013 mbar
(equivalent to the atmosphere, a unit of measure used earlier). Table VIII
in Chapter 9 shows the composition of the standard atmosphere at relative for V = constant (isochor)
humidity of 50 % and temperature of 20 C. In terms of vacuum technology Daltons Law
the following points should be noted in regard to the composition of the air:
pi = p total
a) The water vapor contained in the air, varying according to the humidity i

level, plays an important part when evacuating a vacuum plant (see

Section 2.2.3). Poissons Law

b) The considerable amount of the inert gas argon should be taken into p V = const
account in evacuation procedures using sorption pumps (see Section (adiabatic)
2.1.8). Avogadros Law
c) In spite of the very low content of helium in the atmosphere, only about m1 m 2
5 ppm (parts per million), this inert gas makes itself particularly obvious : = M1 : M 2
V1 V2
in ultrahigh vacuum systems which are sealed with Viton or which incor-
porate glass or quartz components. Helium is able to permeate these
Ideal gas Law
substances to a measurable extent.
m
The pressure of atmospheric air falls with rising altitude above the earths p V = R T = R T
M
surface (see Fig. 9.3 in Chapter 9). High vacuum prevails at an altitude of
about 100 km and ultrahigh vacuum above 400 km. The composition of the
air also changes with the distance to the surface of the earth (see Fig. 9.4 Also: Equation of state for ideal gases (from the continuum theory)
in Chapter 9). van der Waals Equation
a
(p + ) ( Vm b) = R T
Vm2
1.3 Gas laws and models
a, b = constants (internal pressure, covolumes)
Vm = Molar volume
1.3.1 Continuum theory also: Equation of state for real gases

Model concept: Gas is pourable (fluid) and flows in a way similar to a liq- Clausius-Clapeyron Equation
uid. The continuum theory and the summarization of the gas laws which fol-
dp
lows are based on experience and can explain all the processes in gases L =T ( V Vm, l )
dT m, v
near atmospheric pressure. Only after it became possible using ever better
vacuum pumps to dilute the air to the extent that the mean free path rose
L = Enthalpy of evaporation,
far beyond the dimensions of the vessel were more far-reaching assump-
T = Evaporation temperature,
tions necessary; these culminated in the kinetic gas theory. The kinetic gas
Vm,v, Vm,l = Molar volumes of vapor or liquid
theory applies throughout the entire pressure range; the continuum theory
represents the (historically older) special case in the gas laws where atmos-
pheric conditions prevail.
1.3.2 Kinetic gas theory
Summary of the most important gas laws (continuum theory) With the acceptance of the atomic view of the world accompanied by the
necessity to explain reactions in extremely dilute gases (where the continu-
Boyle-Mariotte Law um theory fails) the kinetic gas theory was developed. Using this it is
possible not only to derive the ideal gas law in another manner but also to
p V = const.
calculate many other quantities involved with the kinetics of gases such
for T = constant (isotherm) as collision rates, mean free path lengths, monolayer formation time, diffu-
sion constants and many other quantities.

13
Vacuum physics
Model concepts and basic assumptions: The mass of the molecules is
1. Atoms/molecules are points.
2. Forces are transmitted from one to another only by collision. mT = M = Mass / mol
NA Molecules / mol
3. The collisions are elastic.
4. Molecular disorder (randomness) prevails. where NA is Avogadros number (previously: Loschmidt number).

A very much simplified model was developed by Krnig. Located in a cube

are N particles, one-sixth of which are moving toward any given surface of Avogadro constant
the cube. If the edge of the cube is 1 cm long, then it will contain n particles NA = 6.022 1023 mol1
(particle number density); within a unit of time n c t/6 molecules will
reach each wall where the change of pulse per molecule, due to the mT
For 1 mole, =1 and
change of direction through 180 , will be equal to 2 mT c. The sum of M
the pulse changes for all the molecules impinging on the wall will result in a
force effective on this wall or the pressure acting on the wall, per unit of V = Vm = 22.414 l (molar volume);
surface area. Thus from the ideal gas law at standard conditions
n 1 (Tn = 273.15 K and pn = 1013.25 mbar):
c 2 m T c = n c2 m T = p
6 3 m
p V = R T
M
N
where n= For the general gas constant:
V
1013.25 mbar 22.4  mol 1
R= =
1 273.15 K
Derived from this is p V = N mT c2
3
mbar 
= 83.14
mol K
Ideal gas law (derived from the kinetic gas theory)

If one replaces c2 with c2 then a comparison of these two general gas
equations will show:
m 1
p V = R T = N m T c2 or 1.4 The pressure ranges in vacuum technology
M 3
and their characterization
mT R 2 m c2 (See also Table IX in Chapter 9.) It is common in vacuum technology to
pV = N ( ) T = N( T ) subdivide its wide overall pressure range which spans more than 16 pow-
M 3 2
ers of ten into smaller individual regimes. These are generally defined as
follows:
The expression in brackets on the left-hand side is the Boltzmann constant
k; that on the right-hand side a measure of the molecules mean kinetic Rough vacuum (RV) 1000 1 mbar
energy: Medium vacuum (MV) 1 103 mbar
High vacuum (HV) 103 107 mbar
Boltzmann constant
Ultrahigh vacuum (UHV) 107 (1014) mbar
mT R J
k= = 1.38 10 23 This division is, naturally, somewhat arbitrary. Chemists in particular may
M K refer to the spectrum of greatest interest to them, lying between 100 and
1 mbar, as intermediate vacuum. Some engineers may not refer to vacu-
Mean kinetic energy of the molecules um at all but instead speak of low pressure or even negative pressure.
The pressure regimes listed above can, however, be delineated quite satis-
mT c 2 factorily from an observation of the gas-kinetic situation and the nature of
E kin = 2 gas flow. The operating technologies in the various ranges will differ, as
well.
2
thus p V = N k T = N E kin
3

In this form the gas equation provides a gas-kinetic indication of the tem-
perature!

14
 Vacuum physics
1.5 Types of flow and conductance
p qm
Three types of flow are mainly encountered in vacuum technology: viscous mbar %
or continuous flow, molecular flow and at the transition between these two 1
the so-called Knudsen flow. 100

2 75
1.5.1 Types of flow 1000
qm
p
Viscous or continuum flow 50

This will be found almost exclusively in the rough vacuum range. The char-
470
acter of this type of flow is determined by the interaction of the molecules. 25
Consequently internal friction, the viscosity of the flowing substance, is a
major factor. If vortex motion appears in the streaming process, one speaks 0
of turbulent flow. If various layers of the flowing medium slide one over the s

other, then the term laminar flow or layer flux may be applied. venting time (t)

Laminar flow in circular tubes with parabolic velocity distribution is known

1 Gas flow rate qm choked = constant (maximum value)
as Poiseuille flow. This special case is found frequently in vacuum tech- 2 Gas flow not impeded, qm drops to p = 0
nology. Viscous flow will generally be found where the molecules mean free
path is considerably shorter than the diameter of the pipe: d. Fig. 1.1 Schematic representation of venting an evacuated vessel

A characteristic quantity describing the viscous flow state is the dimension- Molecular flow
less Reynolds number Re. Molecular flow prevails in the high and ultrahigh vacuum ranges. In these
Re is the product of the pipe diameter, flow velocity, density and reciprocal regimes the molecules can move freely, without any mutual interference.
value of the viscosity (internal friction) of the gas which is flowing. Flow is Molecular flow is present where the mean free path length for a particle is
turbulent where Re > 2200, laminar where Re < 2200. very much larger than the diameter of the pipe: >> d.

The phenomenon of choked flow may also be observed in the viscous flow
Knudsen flow
situation. It plays a part when venting and evacuating a vacuum vessel and
The transitional range between viscous flow and molecular flow is known as
where there are leaks.
Knudsen flow. It is prevalent in the medium vacuum range: d.
Gas will always flow where there is a difference in pressure
The product of pressure p and pipe diameter d for a particular gas at a cer-
p = (p1 p2) > 0. The intensity of the gas flow, i.e. the quantity of gas
tain temperature can serve as a characterizing quantity for the various
flowing over a period of time, rises with the pressure differential. In the case
types of flow. Using the numerical values provided in Table III, Chapter 9,
of viscous flow, however, this will be the case only until the flow velocity,
the following equivalent relationships exist for air at 20 C:
which also rises, reaches the speed of sound. This is always the case at a
certain pressure differential and this value may be characterized as criti-
cal: Rough vacuum Viscous flow

p d
< p d > 6.0 101 mbar cm
pcrit = p1 1 2 100
p1 crit (1.22)

A further rise in p > pcrit would not result in any further rise in gas flow; Medium vacuum Knudsen flow
any increase is inhibited. For air at 20,C the gas dynamics theory reveals d d
a critical value of <<
100 2
p2
= 0528 . (1.23) 6 101 > p d > 1.3 102 mbar cm
p1 crit
High and ultrahigh vacuum Molecular flow
The chart in Fig. 1.1 represents schematically the venting (or airing) of an d
evacuated container through an opening in the envelope (venting valve), > p d < 1.3 102 mbar cm
2
allowing ambient air at p = 1000 mbar to enter. In accordance with the infor-
mation given above, the resultant critical pressure is In the viscous flow range the preferred speed direction for all the gas mole-
pcrit = 1000 (1 0.528) mbar 470 mbar; i.e. where p > 470 mbar the cules will be identical to the macroscopic direction of flow for the gas. This
flow rate will be choked; where p < 470 mbar the gas flow will decline. alignment is compelled by the fact that the gas particles are densely packed
and will collide with one another far more often than with the boundary
walls of the apparatus. The macroscopic speed of the gas is a

15
Vacuum physics
group velocity and is not identical with the thermal velocity of the gas represents an resistance to flow, the consequence of which is that the
molecules. effective pumping speed Seff is always less than the pumping speed S of
the pump or the pumping system alone. Thus to ensure a certain effective
In the molecular flow range, on the other hand, impact of the particles with
pumping speed at the vacuum vessel it is necessary to select a pump with
the walls predominates. As a result of reflection (but also of desorption fol-
greater pumping speed. The correlation between S and Seff is indicated by
lowing a certain residence period on the container walls) a gas particle can
the following basic equation:
move in any arbitrary direction in a high vacuum; it is no longer possible to
speak of flow in the macroscopic sense. 1 1 1
= + (1.24)
Seff S C
It would make little sense to attempt to determine the vacuum pressure
ranges as a function of the geometric operating situation in each case. The
Here C is the total conductance value for the pipe system, made up of the
limits for the individual pressure regimes (see Table IX in Chapter 9) were
individual values for the various components which are connected in series
selected in such a way that when working with normal-sized laboratory
(valves, baffles, separators, etc.):
equipment the collisions of the gas particles among each other will predom-
inate in the rough vacuum range whereas in the high and ultrahigh vacuum 1 1 1 1 1
= + + + . . . (1.25)
ranges impact of the gas particles on the container walls will predominate. C C1 C2 C3 Cn
In the high and ultrahigh vacuum ranges the properties of the vacuum con-
Equation (1.24) tells us that only in the situation where C = (meaning
tainer wall will be of decisive importance since below 103 mbar there will
that the flow resistance is equal to 0) will S = Seff. A number of helpful
be more gas molecules on the surfaces than in the chamber itself. If one
equations is available to the vacuum technologist for calculating the con-
assumes a monomolecular adsorbed layer on the inside wall of an evacuat-
ductance value C for piping sections. The conductance values for valves,
ed sphere with 1 l volume, then the ratio of the number of
cold traps, separators and vapor barriers will, as a rule, have to be
adsorbed particles to the number of free molecules in the space will be as
determined empirically.
follows:
It should be noted that in general that the conductance in a vacuum com-
at 1 mbar 102
ponent is not a constant value which is independent of prevailing vacuum
at 106 mbar 10+4
levels, but rather depends strongly on the nature of the flow (continuum or
at 1011 mbar 10+9
molecular flow; see below) and thus on pressure. When using conductance
For this reason the monolayer formation time (see Section 1.1) is used to indices in vacuum technology calculations, therefore, it is always necessary
characterize ultrahigh vacuum and to distinguish this regime from the high to pay attention to the fact that only the conductance values applicable to a
vacuum range. The monolayer formation time is only a fraction of a sec- certain pressure regime may be applied in that regime.
ond in the high vacuum range while in the ultrahigh vacuum range it
extends over a period of minutes or hours. Surfaces free of gases can
therefore be achieved (and maintained over longer periods of time) only 1.5.3 Conductance for piping and orifices
under ultrahigh vacuum conditions.
Conductance values will depend not only on the pressure and the nature of
Further physical properties change as pressure changes. For example, the the gas which is flowing, but also on the sectional shape of the conducting
thermal conductivity and the internal friction of gases in the medium vacu- element (e.g. circular or elliptical cross section). Other factors are the
um range are highly sensitive to pressure. In the rough and high vacuum length and whether the element is straight or curved. The result is that vari-
regimes, in contrast, these two properties are virtually independent of pres- ous equations are required to take into account practical situations. Each of
sure. these equations is valid only for a particular pressure range. This is always
Thus, not only will the pumps needed to achieve these pressures in the to be considered in calculations.
various vacuum ranges differ, but also different vacuum gauges will be a) Conductance for a straight pipe, which is not too short, of length l, with
required. A clear arrangement of pumps and measurement instruments for a circular cross section of diameter d for the laminar, Knudsen and mol-
the individual pressure ranges is shown in Figures 9.16 and 9.16a in ecular flow ranges, valid for air at 20 C (Knudsen equation):
Chapter 9.
d4 d 3 1 + 192 d p
C = 135 p +12.1 /s
l l 1 + 237 d p
(1.26)
1.5.2 Calculating conductance values where
The effective pumping speed required to evacuate a vessel or to carry out p1 + p2
p=
a process inside a vacuum system will correspond to the inlet speed of a 2
particular pump (or the pump system) only if the pump is joined directly to
the vessel or system. Practically speaking, this is possible only in rare situ- d = Pipe inside diameter in cm
ations. It is almost always necessary to include an intermediate piping sys- l = Pipe length in cm (l 10 d)
tem comprising valves, separators, cold traps and the like. All this p1 = Pressure at start of pipe (along the direction of flow) in mbar
p2 = Pressure at end of pipe (along the direction of flow) in mbar

16
 Vacuum physics
If one rewrites the second term in (1.26) in the following form for 0.528 (1.29)

d 3 A 
C = 12.1 f (d p ) Cvisc = 76.6 0.712 1 0.288
l
(1.26a) 1 s

with
for 0.528 (1.29a)
1 + 203 d p + 2.78 10 3 d 2 p 2
f (d p ) = (1.27) A 
1 + 237 d p C visc = 20
1 s

it is possible to derive the two important limits from the course of the func-
tion f (d p): and for 0,03 (1.29b)

Cvisc = 20 A
Limit for laminar flow s
(d p > 6 101 mbar cm):
= 0.528 is the critical pressure situation for air
d4
C = 135 p / s (1.28a) p
l
2
p1 crit
Limit for molecular flow
(d p < 102 mbar cm) :
Flow is choked at < 0.528; gas flow is thus constant. In the case of mole-
d3 cular flow (high vacuum) the following will apply for air:
C = 12.1  /s (1.28b)
l Cmol = 11,6 A l s-1 (A in cm2) (1.30)
Given in addition in Figure 1.3 are the pumping speeds S*visc and S*mol
In the molecular flow region the conductance value is independent of refer-enced to the area A of the opening and as a function of = p2/p1.
pressure! The equations given apply to air at 20 C. The molar masses for the flowing
The complete Knudsen equation (1.26) will have to be used in the transi- gas are taken into consideration in the general equations, not shown here.
tional area 102 < d p < 6 101 mbar cm. Conductance values for
straight pipes of standard nominal diameters are shown in Figure 9.5 (lami-
nar flow) and Figure 9.6 (molecular flow) in Chapter 9. Additional nomo-
grams for conductance determination will also be found in Chapter 9 l s1 cm2
(Figures 9.8 and 9.9).

b) Conductance value C for an orifice A

(A in cm2): For continuum flow (viscous flow) the following equations
(after Prandtl) apply to air at 20 C where p2/p1 = :

Fig. 1.2 Flow of a gas through an opening (A) at high pressures (viscous flow) Fig. 1.3 Conductance values relative to the area, C*visc, C*mol, and pumping speed S*visc and
S*mol for an orifice A, depending on the pressure relationship p2/p1 for air at 20 C.

17
 Vacuum physics
Gas (20 C) Molecular flow Laminar flow

Air 1.00 1.00

Oxygen 0.947 0.91 Axial length

Neon 1.013 1.05

The technical data in the Leybold catalog states the conductance values for
Helium 2.64 0.92 vapor barriers, cold traps, adsorption traps and valves for the molecular
Hydrogen 3.77 2.07 flow range. At higher pressures, e.g. in the Knudsen and laminar flow
ranges, valves will have about the same conductance values as pipes of
Carbon dioxide 0.808 1.26 corresponding nominal diameters and axial lengths. In regard to right-angle
Water vapor 1.263 1.73 valves the conductance calculation for an elbow must be applied.

Table 1.1 Conversion factors (see text) In the case of dust filters which are used to protect gas ballast pumps and
roots pumps, the percentage restriction value for the various pressure lev-
When working with other gases it will be necessary to multiply the conduc- els are listed in the catalog. Other components, namely the condensate
tance values specified for air by the factors shown in Table 1.1. separators and condensers, are designed so that they will not reduce
pumping speed to any appreciable extent.
Nomographic determination of conductance values
The following may be used as a rule of thumb for dimensioning vacuum
The conductance values for piping and openings through which air and
lines: The lines should be as short and as wide as possible. They must
other gases pass can be determined with nomographic methods. It is pos-
exhibit at least the same cross-section as the intake port at the pump. If
sible not only to determine the conductance value for piping at specified
particular circumstances prevent shortening the suction line, then it is
values for diameter, length and pressure, but also the size of the pipe diam-
advisable, whenever this is justifiable from the engineering and economic
eter required when a pumping set is to achieve a certain effective pumping
points of view, to include a roots pump in the suction line. This then acts as
speed at a given pressure and given length of the line. It is also possible to
a gas entrainment pump which reduces line impedance.
establish the maximum permissible pipe length where the other parameters
are known. The values obtained naturally do not apply to turbulent flows. In
doubtful situations, the Reynolds number Re (see Section 1.5.) should be
estimated using the relationship which is approximated below

qpV
Re = 15 (1.31)
d

Here qpV = S p is the flow output in mbar l/s, d the diameter of the pipe
in cm.

A compilation of nomograms which have proved to be useful in practice will

be found in Chapter 9.

1.5.4 Conductance values for other elements

Where the line contains elbows or other curves (such as in right-angle
valves), these can be taken into account by assuming a greater effective
length leff of the line. This can be estimated as follows:

leff = laxial +133
. d (1.32)
180

Where
laxial : axial length of the line (in cm)
leff : Effective length of the line (in cm)
d : Inside diameter of the line (in cm)
: Angle of the elbow (degrees of angle)

18
 Vacuum generation
2. Vacuum generation which the first three classes belong to the compression pumps and where
the two remaining classes belong to the condensation and getter pumps:

1. Pumps which operate with periodically increasing and decreasing pump

2.1. Vacuum pumps: A survey cham-ber volumes (rotary vane and rotary plunger pumps; also trochoid
pumps)
Vacuum pumps are used to reduce the gas pressure in a certain volume
and thus the gas density (see equation 1.5). Consequently consider the gas 2. Pumps which transport quantities of gas from the low pressure side to
particles need to be removed from the volume. Basically differentiation is the high pressure side without changing the volume of the pumping
made between two classes of vacuum pumps: chamber (Roots pumps, turbomolecular pumps)

a) Vacuum pumps where via one or several compression stages the 3. Pumps where the pumping effect is based mainly on the diffusion of
gas particles are removed from the volume which is to be pumped and gases into a gas-free high speed vapor jet (vapor pumps)
ejected into the atmosphere (compression pumps). The gas particles are 4. Pumps which pump vapors by means of condensation (condensers) and
pumped by means of displacement or pulse transfer. pumps which pump permanent gases by way of condensation at very
b) Vacuum pumps where the gas particles which are to be removed low temperatures (cryopumps)
condense on or are bonded by other means (e.g. chemically) to a solid 5. Pumps which bond or incorporate gases by adsorption or absorption to
surface, which often is part of the boundary forming volume itself. surfaces which are substantially free of gases (sorption pumps).
A classification which is more in line with the state-of-the-art and practical A survey on these classes of vacuum pumps is given in the diagram of
applications makes a difference between the following types of pumps, of Table 2.1.

Vacuum pump
(Operating principle)

Gas transfer Entrapment

vacuum pump vacuum pump
Positive displacement Kinetic
vacuum pump vacuum pump

Reciprocating
positive displacement Rotary Drag Fluid entrainment Ion transfer Adsorption
vacuum pump vacuum pump vacuum pump vacuum pump vacuum pump pump

Diaphragm Liquid sealed Gaseous ring Ejector

vacuum pump vacuum pump vacuum pump vacuum pump Getter pump

Liquid ring
Piston vacuum pump Turbine Liquid jet
vacuum pump vacuum pump vacuum pump Bulk getter pump

Rotary vane
vacuum pump Axial flow Gas jet Sublimation
vacuum pump vacuum pump pump

Multiple vane
vacuum pump
Radial flow Vapor jet
vacuum pump vacuum pump Getter ion pump

Rotary piston
vacuum pump
Molecular drag
vacuum pump Diffusion pump Evaporation ion pump

Rotary plunger
vacuum pump
Self-purifying
Turbomolecular pump diffusion pump Sputter-ion pump

Dry compressing
vacuum pump

Fractionating
diffusion pump Cryopump
Roots
vacuum pump

Diffusion ejector
pump Condenser
Claw
vacuum pump

Scroll pump

Table 2.1 Classification of vacuum pumps

19
Vacuum generation
2.1.1 Oscillation displacement vacuum pumps expanding pumping chamber during the subsequent suction stroke thereby
filling it, so that as the intake pressure reduces the quantity of inflowing new
gas reduces more and more. Thus volumetric efficiency worsens
2.1.1.1 Diaphragm pumps
continuously for this reason. Diaphragm vacuum pumps are not capable of
Recently, diaphragm pumps have becoming ever more important, mainly attaining a higher compression ratio than the ratio between dead space
for environmental reasons. They are alternatives to water jet vacuum and maximum volume of the pumping chamber. In the case of single-stage
pumps, since diaphragm pumps do not produce any waste water. Overall, a diaphragm vacuum pumps the attainable ultimate pressure amounts to
diaphragm vacuum pump can save up to 90 % of the operating costs approximately 80 mbar. Two-stage pumps such as the DIVAC from
compared to a water jet pump. Compared to rotary vane pumps, the LEYBOLD can attain about 10 mbar (see Fig. 2.2), three-stage pumps can
pumping chamber of diaphragm pumps are entirely free of oil. By design, attain about 2 mbar and four-stage diaphragm pumps can reach about
no oil immersed shaft seals are required. Diaphragm vacuum pumps are 510-1 mbar.
single or multi-stage dry compressing vacuum pumps (diaphragm pumps
Diaphragm pumps offering such a low ultimate pressure are suited as
having up to four stages are being manufactured). Here the circumference
backing pumps for turbomolecular pumps with fully integrated Scroll stages
of a diaphragm is tensioned between a pump head and the casing wall
(compound or wide range turbomolecular pumps, such as the
(Fig. 2.1). It is moved in an oscillating way by means of a connecting rod
TURBOVAC 55 from LEYBOLD). In this way a pump system is obtained
and an eccentric. The pumping or compression chamber, the volume of
which is absolutely free of oil, this being of great importance to
which increases and decreases periodically, effects the pumping action.
measurement arrangements involving mass spectrometer systems and leak
The valves are arranged in such a way that during the phase where the
detectors. In contrast to rotary vane pumps this combination of pumps for
volume of the pumping chamber increases it is open to the intake line.
leak detectors offers the advantage that naturally no helium is dissolved in
During compression, the pumping chamber is linked to the exhaust line.
the diaphragm pump thereby entirely avoiding a possible build up of a
The diaphragm provides a hermetic seal between the gear chamber and
helium background.
the pumping chamber so that it remains free of oil and lubricants (dry
compressing vacuum pump). Diaphragm and valves are the only
components in contact with the medium which is to be pumped. When
coating the diaphragm with PTFE (Teflon) and when manufacturing the inlet
and exhaust valves of a highly fluorinated elastomer as in the case of the
2.1.2 Liquid sealed rotary displacement pumps
DIVAC from LEYBOLD, it is then possible to pump aggressive vapors and
gases. It is thus well suited for vacuum applications in the chemistry lab. 2.1.2.1 Liquid ring pumps
Due to the limited elastic deformability of the diaphragm only a Due to the pumping principle and the simple design, liquid ring vacuum
comparatively low pumping speed is obtained. In the case of this pumping pumps are particularly suited to pumping gases and vapors which may also
principle a volume remains at the upper dead center the so called dead contain small amounts of liquid. Air, saturated with water vapors or other
space from where the gases can not be moved to the exhaust line. The gases containing condensable constituents, may be pumped without
quantity of gas which remains at the exhaust pressure expands into the problems. By design, liquid ring pumps are insensitive to any contamination

IN EX

a)

b)

c)

d)

(1) Casing lid (5) Diaphragm 1st stage 2nd stage

(2) Valves (6) Diaphragm support disk
(3) Lid (7) Connecting rod Opening and closing of the valves, path and pumping mechanism during four
(4) Diaphragm disk (8) Eccentric disk subsequent phases of a turn of the connecting rod (a-d)

Fig. 2.1 Schematic on the design of a diaphragm pump stage (Vacuubrand) Fig. 2.2 Principle of operation for a two-stage diaphragm pump (Vacuubrand)

20
 Vacuum generation

Constant, minimum clearance a for the entire sealing passage b

Fig. 2.4 Arrangement of the sealing passage in rotary vane pumps

1 Rotor 3 Casing 5 Liquid ring also known as duo seal
2 Rotor shaft 4 Intake channel 6 Flex. discharge channel

Fig. 2.3 Liquid ring vacuum pump, schematic (Siemens) As shown in the classification Table 2.1, the oil sealed displacement pumps
include rotary vane and rotary plunger pumps of single and two-stage design
which may be present in the gas flow. The attainable intake pressures are as well as single-stage trochoid pumps which today are only of historic
in the region between atmospheric pressure and the vapor pressure of the interest. Such pumps are all equipped with a gas ballast facility which was
operating liquid used. For water at 15 C it is possible to attain an operating described in detail (for details see 2.1.2.2.4) for the first time by Gaede
pressure of 33 mbar. A typical application of water ring vacuum pumps is (1935). Within specified engineering limits, the gas ballast facility permits
venting of steam turbines in power plants. Liquid ring vacuum pumps pumping of vapors (water vapor in particular) without condensation of the
(Fig. 2.3) are rotary displacement pumps which require an operating liquid vapors in the pump.
which rotates during operation to pump the gas. The blade wheel is
arranged eccentrically in a cylindrical casing. When not in operation,
approximately half of the pump is filled with the operating fluid. In the axial 2.1.2.2.1 Rotary vane pumps (TRIVAC A, TRIVAC B,
direction the cells formed by the blade wheel are limited and sealed off by TRIVAC E, SOGEVAC)
control discs. These control discs are equipped with suction and ejection
slots which lead to the corresponding ports of the pump. After having Rotary vane pumps (see also Figs. 2.5 and 2.6) consist of a cylindrical
switched on such a pump the blade wheel runs eccentrically within the housing (pump-ing ring) (1) in which an eccentrically suspended and slotted
casing; thus a concentrically rotating liquid ring is created which at the rotor (2) turns in the direction of the arrow. The rotor has vanes (16) which
narrowest point fully fills the space between the casing and the blade wheel are forced outwards usually by centrifugal force but also by springs so that
and which retracts from the chambers as the rotation continues. The gas is
sucked in as the chambers empty and compression is obtained by
subsequent filling. The limits for the intake or discharge process are set by
the geometry of the openings in the control discs.

In addition to the task of compression, the operating fluid fulfills three

further important tasks:

1. Removal of the heat produced by the compression process.

2. Uptake of liquids and vapors (condensate).
3. Providing the seal between the blade wheel and the casing.

2.1.2.2 Oil sealed rotary displacement pumps

A displacement vacuum pump is generally a vacuum pump in which the gas
which is to be pumped is sucked in with the aid of pistons, rotors, vanes
and valves or similar, possibly compressed and then discharged. The
1 Pump housing 9 Exhaust port
pumping process is effected by the rotary motion of the piston inside the 2 Rotor 10 Air inlet silencer
pump. Differentiation should be made between oiled and dry compressing 3 Oil-level sight glass 11 Oil filter
4 Suction duct 12 Exhaust valve
displacement pumps. By the use of sealing oil it is possible to attain in a 5 Anti-suckback valve 13 Exhaust duct
single-stage high compression ratios of up to about 105. Without oil, inner 6 Dirt trap 14 Gas ballast duct
7 Intake port 15 Oil injection
leakiness is considerably greater and the attainable compression ratio is 8 Lid of gas ballast valve 16 Vane
correspondingly less, about 10.
Fig. 2.5 Cross section of a single-stage rotary vane pump (TRIVAC A)

21
Vacuum generation
radial vanes offset by 120. The TRIVAC B range (Fig. 2.6) has only two
vanes offset by 180. In both cases the vanes are forced outwards by the
centrifugal forces without the use of springs. At low ambient temperatures
this possibly requires the use of a thinner oil. The A-Series is lubricated
through the arising pressure difference whereas the B-Series pumps have
a geared oil pump for pressure lubrication. The TRIVAC B-Series is
equipped with a particularly reliable anti-suckback valve; a horizontal or
vertical arrangement for the intake and exhaust ports. The oil level sight
glass and the gas ballast actuator are all on the same side of the oil box
(user friendly design). In combination with the TRIVAC BCS system it may
be equipped with a very comprehensive range of accessories, designed
chiefly for semiconductor applications. The oil reservoir of the rotary vane
pump and also that of the other oil sealed displacement pumps serves the
purpose of lubrication and sealing, and also to fill dead spaces and slots. It
removes the heat of gas compression, i.e. for cooling purposes. The oil
provides a seal between rotor and pump ring. These parts are almost in
1 Intake port 8 Orifice, connection for
2 Dirt trap inert gas ballast contact along a straight line (cylinder jacket line). In order to increase the
3 Anti-suckback valve 9 Exhaust duct oil sealed surface area a so-called sealing passage is integrated into the
4 Intake duct 10 Exhaust valve
5 Vane 11 Demister pumping ring (see Fig. 2.4). This provides a better seal and allows a higher
6 Pumping chamber 12 Spring compression ratio or a lower ultimate pressure. LEYBOLD manufactures
7 Rotor 13 Orifice; connection for
oil filter three different ranges of rotary vane pumps which are specially adapted to
different applications such as high intake pressure, low ultimate pressure or
Fig. 2.6 Cross section of a single-stage rotary vane pump (TRIVAC B)
applications in the semiconductor industry. A summary of the more
the vanes slide inside the housing. Gas entering through the intake (4) is important characteristics of these ranges is given in Table 2.2. The TRIVAC
pushed along by the vanes and is finally ejected from the pump by the oil rotary vane pumps are produced as single-stage (TRIVAC S) and two-
sealed exhaust valve (12). stage (TRIVAC D) pumps (see Fig. 2.7). With the two-stage oil sealed
pumps it is possible to attain lower operating and ultimate pressures
The older range of TRIVAC A pumps (Fig. 2.5) from LEYBOLD has three

TRIVAC A TRIVAC B TRIVAC BCS TRIVAC E SOGEVAC

Vanes per stage 3 2 2 2 3 (tangential)

1 1.5 1.6 16 25
Pumping speed 24 48 16 25 2.5 40 100
[m3/h] 8 16 16 25 40 65 180 280
30 60 40 65 585 1200

Sealing passage yes yes yes yes no

Ultimate pressure, <2 102 <2 102 <2 102 < 5 101
single-stage [mbar]

Ultimate pressure < 2.5 104 < 1 104 < 1 104 < 1 104
two-stage [mbar]

Oil supply Pressure difference Gear pump Gear pump Eccentric pump Pressure difference

Slots Comparable for all types: about 0.01 to 0.05 mm

Bearing/lubrication Axial face / oil Axial face / oil Axial face / oil Ball / grease Ball / oil

Special Hydropneumatic Coated parts in Many Cost-effective

characteristics anti-suckback valve contact with medium accessories

Media No ammonia Clean to Aggressive and Clean to Clean

light particles corrosive light particles

Main areas of Multi- Multi- Semiconductor Multi- Packaging

application purpose purpose industry purpose industry

Table 2.2 Rotary vacuum pump ranges

22
 Vacuum generation

Valve stop

Leaf
spring
of the
valve

I High vacuum stage

II Second forevacuum stage

Fig. 2.7 Cross section of a two-stage rotary vane pump, schematic Fig. 2.8a Cross section of a two-stage rotary vane pump (TRIVAC E)

compared to the corresponding single-stage pumps. The reason for this is through the intake channel of the slide valve (12) into the pumping chamber
that in the case of single-stage pumps, oil is unavoidably in contact with the (14). The slide valve forms a unit with the piston and slides to and fro
atmosphere outside, from where gas is taken up which partially escapes to between the rotatable valve guide in the casing (hinge bar 13). The gas
the vacuum side thereby restricting the attainable ultimate pressure. In the drawn into the pump finally enters the compression chamber (4). While
oil sealed two-stage displacement pumps manufactured by LEYBOLD, oil turning, the piston compresses this quantity of gas until it is ejected through
which has already been degassed is supplied to the stage on the side of the oil sealed valve (5). As in the case of rotary vane pumps, the oil reservoir
the vacuum (stage 1 in Fig. 2.7): the ultimate pressure lies almost in the is used for lubrication, sealing, filling of dead spaces and cooling. Since the
high vacuum range, the lowest operating pressures lie in the range pumping chamber is divided by the piston into two spaces, each turn
between medium vacuum / high vacuum. Note: operating the so called high completes an operating cycle (see Fig. 2.10). Rotary plunger pumps are
vacuum stage (stage 1) with only very little oil or no oil at all will in spite manufactured as single and two-stage pumps. In many vacuum processes
of the very low ultimate pressure in practice lead to considerable combining a Roots pump with a single-stage rotary plunger pump may offer
difficulties and will significantly impair operation of the pump.

2.1.2.2.2 Rotary plunger pumps (E Pumps)

Shown in Fig. 2.9 is a sectional view of a rotary plunger pump of the single
block type. Here a piston (2) which is moved along by an eccentric (3) turning
in the direction of the arrow moves along the chamber wall. The gas which is
to be pumped flows into the pump through the intake port (11), passes

1 Casing 9 Gas ballast valve

2 Cylindrical piston 10 Dirt trap
3 Eccentric 11 Intake port
4 Compression chamber 12 Slide valve
5 Oil sealed pressure valve 13 Hinge bar
6 Oil-level sight glass 14 Pumping chamber
7 Gas ballast channel (air is flowing in).
8 Exhaust pot

Fig. 2.8b SOGEVAC pump SV 300 with three tangential vanes Fig. 2.9 Cross section of a single-stage rotary plunger pump (monoblock design)

23
Vacuum generation
2.1.2.2.3 Trochoid pumps
Trochoid pumps belong to the class of so called rotary piston pumps, which
(see overview of Table 2.1) in turn belong to the group of rotary pumps.
With rotary piston pumps, the pistons center of gravity runs along a circular
path about the rotational axis (hence rotary piston machines). A rotary
piston pump can in contrast to the rotary plunger pump be completely
balanced dynamically. This offers the advantage that larger pumps can
operate without vibration so that they can be installed without needing
foundations. Moreover, such pumps may be operated at higher speed,
compared to rotary plunger pumps (see below). The volume of the pumping
chamber with respect to the volume of the entire pump the so called
specific volume is, in the case of trochoid pumps, approximately twice of
that of rotary plunger pumps. Larger rotary plunger pumps run at speeds of
1 Upper dead point 5 Upper dead point maximum space 500 rpm. The trochoid pump may run at 1000 rpm and this applies also to
2 Slot in suction channel of slide valve between rotating piston and stator
is freed beginning of suction period 6 Shortly before beginning of larger designs. It is thus about four times smaller compared to a rotary
3 Lower dead point slot in suction compression period, the front surface plunger pump having the same pumping speed and runs without producing
channel is quite free, and pumped-in of the rotating plunger frees gas ballast
gas (arrow) enters freely into the opening commencement of gas any vibrations. Unfortunately the advantages in the area of engineering are
pumping chamber (shown shaded) ballast inlet combined with great disadvantages in the area of manufacturing, so that
4 Slot in suction channel is closed again 7 Gas ballast opening is quite free
by swivelling hinge bar end of suction 8 End of gas ballast inlet today LEYBOLD does not produce trochoid pumps any more. Operation of
period 9 End of pumping period. such a pump is shown in the sectional diagram of Fig. 2.12.

Fig. 2.10 Operating cycle of a rotary plunger pump (for positions 1 to 9 of the plunger)

more advantages than a two-stage rotary plunger pump alone. If such a 2.1.2.2.4 The gas ballast
combination or a two-stage pump is inadequate, the use of a Roots pump in
The gas ballast facility as used in the rotary vane, rotary plunger and
connection with a two-stage pump is recommended. This does not apply to
trochoid pumps permits not only pumping of permanent gases but also
combinations involving rotary vane pumps and Roots pumps.
even larger quantities of condensable gases.

Motor power The gas ballast facility (see Fig. 2.13) prevents condensation of vapors in
The motors supplied with the rotary vane and rotary plunger pumps deliver the pump chamber of the pump. When pumping vapors these may only be
enough power at ambient temperatures of 12 C and when using our compressed up to their saturation vapor pressure at the temperature of the
special oils to cover the maximum power requirement (at about 400 mbar). pump. If pumping water vapor, for example, at a pump temperature of
Within the actual operating range of the pump, the drive system of the 70 C, the vapor may only be compressed to 312 mbar (saturation vapor
warmed up pump needs to supply only about one third of the installed pressure of water at 70 C (see Table XIII in Section 9)). When
motor power (see Fig. 2.11). compressing further, the water vapor condenses without increasing the
Power of the drive motor [Watt]

Pressure [mbar]
1 Operating temp. curve 1 32C, 5 Theoretic curve for adiabatic 1 Toothed wheel fixed to the driving shaft
2 Operating temp. curve 2 40C, compression 2 Toothed wheel fixed to the piston
3 Operating temp. curve 3 60C, 6 Theoretic curve for isotherm com- 3 Elliptic piston
4 Operating temp. curve 4 90C, pression 4 Inner surface of the pump
5 Driving shaft
6 Eccentric
Fig. 2.11 Motor power of a rotary plunger pump (pumping speed 60 m3/h) as a function of
intake pressure and operating temperature. The curves for gas ballast pumps of other
sizes are similar. Fig. 2.12 Cross section of a trochoid pump

24
 Vacuum generation

Di
sc
ha
ion

rg
ss

e
t
inle
pre

st
alla
Com

sb
Ga

Gas ballast Position

inlet of the
leading
vane

12 Suction
25 Compression Sucti
on
34 Gas ballast inlet
56 Discharge

Fig. 2.13 Working process within a rotary vane pump with gas ballast

pressure. No overpressure is created in the pump and the exhaust valve is

not opened. Instead the water vapor remains as water in the pump and
emulsifies with the pumps oil. This very rapidly impairs the lubricating
properties of the oil and the pump may even seize when it has taken up too
much water. The gas ballast facility developed in 1935 by Wolfgang Gaede
inhibits the occurrence of condensation of the vapor in the pump as fol-
lows. Before the actual compression process begins (see Fig. 2.13), a
precisely defined quantity of air (the gas ballast) is admitted into the
pumping chamber of the pump. The quantity is such that the compression a) Without gas ballast b) With gas ballast
ratio of the pump is reduced to 10:1 max. Now vapors which have been 1) Pump is connected to the vessel, which 1) Pump is connected to the vessel, which
is already almost empty of air (70 mbar) it is already almost empty of air (70 mbar) it
taken in by the pump may be compressed together with the gas ballast, must thus transport mostly vapor particles must thus transport mostly vapor particles
before reaching their condensation point and ejected from the pump. The 2) Pump chamber is separated from the 2) Pump chamber is separated from the
vessel compression begins vessel now the gas ballast valve, through
partial pressure of the vapors which are taken in may however not exceed 3) Content of pump chamber is already so which the pump chamber is filled with addi-
a certain value. It must be so low that in the case of a compression by a far compressed that the vapor condenses to tional air from outside, opens this addition-
form droplets overpressure is not yet al air is called gas ballast
factor of 10, the vapors can not condense at the operating temperature of reached 3) Discharge valve is pressed open, and
the pump. When pumping water vapor this critical value is termed the 4) Residual air only now produces the particles of vapor and gas are pushed out
required overpressure and opens the dis- the overpressure required for this to occur is
water vapor tolerance. charge valve, but the vapor has already reached very early because of the supple-
condensed and the droplets are precipitated mentary gas ballast air, as at the beginning
Shown schematically in Fig. 2.14 is the pumping process with and without in the pump. the entire pumping process condensation
cannot occur
gas ballast as it takes place in a rotary vane pump when pumping 4) The pump discharges further air and
condensable vapors. vapor

Two requirements must be met when pumping vapors:

1) the pump must be at operating temperature. Fig. 2.14 Diagram of pumping process in a rotary vane pump without (left) and with (right) gas
ballast device when pumping condensable substances.
2) the gas ballast valve must be open. Where:
(With the gas ballast valve open the temperature of the pump increases by pvapor = is the partial pressure of vapor at the intake of
about 10 C. Before pumping vapors the pump should be operated for half the pump
an hour with the gas ballast valve open).
pperm = is the total pressure of all pumped permanent
Simultaneous pumping of gases and vapors gases at the intake of the pump
When simultaneously pumping permanent gases and condensable vapors pvapor,sat = is the saturation pressure of the pumped
from a vacuum system, the quantity of permanent gas will often suffice to vapor, depending on temperature (see Fig. 2.15)
prevent any condensation of the vapors inside the pump. The quantity of
vapor which may be pumped without condensation in the pump can be psum = pexhaust + pvalve + pexhaust filter
calculated as follows: pvalve = is the pressure difference across the exhaust valve
pvapour p which amounts depending on type of pump and
< vapour, sat (2.1) operating conditions to 0.2 ... 0.4 bar
pvapour + pperm p sum
pexhaust filter = is the pressure difference across the exhaust filter
amounting to 0 ... 0.5 bar

25
Vacuum generation
Example 1: ratio 3 parts of permanent gases to 1 part of water vapor, as indicated in
With a rotary vane pump with an external oil mist filter in series, a mixture example 1, can be for guidance only. In actual practice it is recommended
of water vapor and air is being pumped. The following values are used for to run up a rotary pump of the types described hitherto always with the gas
applying eq. (2.1): ballast valve open, because it takes some time until the pump has reached
its final working temperature.
pexhaust = 1 bar From eq. (2.1) follows for the permissible partial pressure pvapor of the
pvalve + pexhaust filter = 0.35 bar, pumped vapor the relation
temperature of the pump 70 C pvapour, sat
Hence: pvapour p (2.2)
psum pvapour, sat perm
psum = 1.35 bar; pvapor sat (H2O)
= 312 mbar
(see Table XIII in chapter 9) This relation shows that with pperm = 0 no vapors can be pumped without
condensation in the pump, unless the gas-ballast concept is applied. The
Using eq. (2.1) follows: corresponding formula is:
pvapour, H O 312 (p p )
< = 0. 23
2
pvapour B psum Vapour, sat vapour, g.b. +
pvapour, H O + pair 1350 S psum pvapour, sat
2
p (2.3)
+ p vapour sat
pperm
The pressure of the water vapor in the air/water vapor mixture must not sum pvapour sat
exceed 23 % of the total pressure of the mixture.
Where:
Example 2: B = is the volume of air at 1013 mbarwhich is admitted to the
Ethanoic acid is to be pumped with a rotary plunger pump. pump chamber per unit time, called in brief the gas ballast
pexhaust = 1.1 bar (taking into consideration the flow resistance
S = is the nominal speed of the pump (volume flow rate)
of the pipes)
pvalve = 0.25 bar psum = is the pressure at the discharge outlet of the pump, assumed
pexhaust filter = 0.15 bar to be a maximum at 1330 mbar
(pressure loss in the oil mist trap) pvapor, sat = Saturation vapor pressure of the vapor at the pumps ex-
haust port
Hence:
psum = 1.5 bar. pvapor, g.b. = is the partial pressure of any vapor that might be present in
the gas used as gas ballast (e.g. water vapor contained in
By controlled cooling the pump and oil temperature is set at 100 C. The the atmospheric air when used as gas ballast)
saturation pressure of the acid therefore is see
pperm = is the total pressure of all permanent gases at the inlet port
Fig. 2.15 pvapor, sat = 500 mbar.
of the pump

From eq. (2.1) follows: Eq. (2.3) shows that when using gas ballast (B 0) vapors can also be
pumped without condensation if no gas is present at the intake of the
pvapour, acid 0.5 1 pump. The gas ballast may also be a mixture of non-condensable gas and
=< =
pvapour, acid + pair 1.5 3 condensable vapor as long as the partial pressure of this vapor
(pvapor, g.b.) is less than the saturation pressure pvapor, sat of the pumped
Returning to the question of pumping water vapor in a mixture with air, the vapor at the temperature of the pump.

Water vapor tolerance

An important special case in the general considerations made above
Saturation vapor pressure [mbar]

relating to the topic of vapor tolerance is that of pumping water vapor.

Saturation vapor pressure [Torr]

According to PNEUROP water vapor tolerance is defined as follows:

Water vapor tolerance is the highest pressure at which a vacuum pump,

under normal ambient temperatures and pressure conditions (20 C,
1013 mbar), can continuously take in and transport pure water vapor. It is
quoted in mbar. It is designated as pW,O.

Temperature [ C]
Applying eq. (2.3) to this special case means:

pperm = 0 and pvapor, sat = ps (H2O), thus:

Fig. 2.15 Saturation vapor pressures

26
 Vacuum generation
B p ( H O ) pvapour, g.b. 2.1.3 Dry compressing rotary displacement
p W, O = p sum s 2 (2.4) pumps
S psum ps ( H 2O )

If for the gas ballast gas atmospheric air of 50 % humidity is used, then pva- 2.1.3.1 Roots pumps
por, g.b. = 13 mbar; with B/S = 0.10 a usual figure in practice and psum The design principle of the Roots pumps was already invented in 1848 by
(total exhaust pressure) = 1330 mbar, the water vapor tolerance pW,0 as Isaiah Davies, but it was 20 years later before it was implemented in
function of the temperature of the pump is represented by the lowest curve practice by the Americans Francis and Philander Roots. Initially such
in diagram Fig. 2.16. The other curves correspond to the pumping of water pumps were used as blowers for combustion motors. Later, by inverting the
vapor-air mixtures, hence pperm = pair O), indicated by the symbol pL in drive arrangement, the principle was employed in gas meters. Only since
millibar. In these cases a higher amount of water vapor partial pressure pw 1954 has this principle been employed in vacuum engineering. Roots
pumps are used in pump combinations together with backing pumps (rotary
pL [mbar] vane- and rotary plunger pumps) and extend their operating range well into
the medium vacuum range. With two stage Roots pumps this extends into
the high vacuum range. The operating principle of Roots pumps permits the
assembly of units having very high pumping speeds (over 100,000 m3/h)
pW [mbar]

which often are more economical to operate than steam ejector pumps
running in the same operating range.

Temperature of the pump

Fig. 2.16 Partial pressure pW of water vapor that can be pumped with the gas ballast valve
open without condensation in the pump, as a function of the pump temperature for
various partial pressures pL of air. The lowest curve corresponds to the water vapor
tolerance pW,O of the pump.

can be pumped as shown in the diagram. The figures for pW,0 given in the
catalogue therefore refer to the lower limit and are on the safe side.

According to equation 2.4 an increase in the gas ballast B would result in

an increased water vapor tolerance pW,0. In practice, an increase in B,
especially in the case of single-stage gas ballast pumps is restricted by the 1 Intake flange 4 Exhaust flange
2 Rotors 5 Casing
fact that the attainable ultimate vacuum for a gas ballast pump operated 3 Chamber
with the gas ballast valve open becomes worse as the gas ballast B
increases. Similar considerations also apply to the general equation 2.3 for Fig. 2.17 Schematic cross section of a Roots pump
the vapor tolerance pvapor.

At the beginning of a pump down process, the gas ballast pump should A Roots vacuum pump (see Fig. 2.17) is a rotary positive-displacement type
always be operated with the gas ballast valve open. In almost all cases a of pump where two symmetrically-shaped impellers rotate inside the pump
thin layer of water will be present on the wall of a vessel, which only casing past each other in close proximity. The two rotors have a cross
evaporates gradually. In order to attain low ultimate pressures the gas section resembling approximately the shape of a figure 8 and are
ballast valve should only be closed after the vapor has been pumped out. synchronized by a toothed gear. The clearance between the rotors and the
LEYBOLD pumps generally offer a water vapor tolerance of between 33 casing wall as well as between the rotors themselves amounts only to a few
and 66 mbar. Two-stage pumps may offer other levels of water vapor tenths of a millimeter. For this reason Roots pumps may be operated at
tolerance corresponding to the compression ratio between their stages high speeds without mechanical wear. In contrast to rotary vane and rotary
provided they have pumping chamber of different sizes. plunger pumps, Roots pumps are not oil sealed, so that the internal leakage
of dry compressing pumps by design results in the fact that compression
ratios only in the range 10 100 can be attained. The internal leakage of
Other gases as ballast
Roots pumps, and also other dry compressing pumps for that matter, is
Generally atmospheric air is used as the gas ballast medium. In special
mainly based on the fact that owing to the operating principle certain
cases, when pumping explosive or toxic gases, for example, other
surface areas of the pump chamber are assigned to the intake side and the
permanent gases like noble gases or nitrogen, may be used
compression side of the pump in alternating fashion. During the
(see Section 8.3.1.3).
compression phase these surface areas (rotors and casing) are loaded with
gas (boundary layer); during the suction phase this gas is released. The
thickness of the traveling gas layer depends on the clearance between the
two rotors and between the rotors and the casing wall. Due to the relatively
complex thermal conditions within the Roots pump it is not possible to base

27
Vacuum generation
ones consideration on the cold state. The smallest clearances and thus the
lowest back flows are attained at operating pressures in the region of
1 mbar. Subsequently it is possible to attain in this region the highest
compression ratios, but this pressure range is also most critical in view of
contacts between the rotors and the casing.

Characteristic quantities of roots pumps

The quantity of gas Qeff effectively pumped by a Roots pump is calculated
from the theoretically pumped quantity of gas Qth and the internal leakage
QiR (as the quantity of gas which is lost) as:

Qeff = Qth QiR (2.5)

The following applies to the theoretically pumped quantity of gas:

Qth = pa Sth (2.6) Fig. 2.18 Maximum compression k0 of the Roots pump RUVAC WA 2001 as a function of fore
vacuum pressure pV
where pa is the intake pressure and Sth is the theoretical pumping speed.
This in turn is the product of the pumping volume VS and the speed n: Normally a Roots pump will be operated in connection with a downstream
Sth = n VS (2.7) rough vacuum pump having a nominal pumping speed SV. The continuity
equation gives:
Similarly the internal leakage QiR is calculated as:
SV pV = Seff pa = Sth pa (2.14)
QiR = n ViR (2.8)
From this
where pV is the forevacuum pressure (pressure on the forevacuum side)
pV S
and SiR is a (notional) reflow pumping speed with k= = th (2.15)
pa SV
SiR = n ViR (2.9)
i.e. the product of speed n and internal leakage volume ViR. The ratio Sth/SV (theoretical pumping speed of the Roots pump / pumping
speed of the backing pump) is termed the gradation kth. From (2.15) one
Volumetric efficiency of a Roots pumps is given by obtains
Q eff k = kth (2.16)
= (2.10)
Q th
Equation (2.16) implies that the compression k attainable with a Roots
pump must always be less than the grading kth between Roots pump and
By using equations 2.5, 2.6, 2.7 and 2.8 one obtains backing pump since volumetric efficiency is always < 1. When combining
pV SiR equations (2.13) and (2.16) one obtains for the efficiency the well known
= 1 (2.11) expression
pa Sth
k0
= (2.17)
When designating the compression pv/pa as k one obtains ko + k th
SiR
= 1 k (2.11a) The characteristic quantities to be found in equation 2.17 are only for the
Sth
combination of the Roots pump and the backing pump, namely maximum
compression k0 of the Roots pump and gradation kth between Roots pump
Maximum compression is attained at zero throughput (see PNEUROP and
and backing pump.
DIN 28 426, Part 2). It is designated as k0:
Sth With the aid of the above equations the pumping speed curve of a given
k0 = ( ) =
SiR 0 (2.12) combination of Roots pump and backing pump may be calculated. For this
the following must be known:
k0 is a characteristic quantity for the Roots pump which usually is stated as
a) the theoretical pumping speed of the Roots pump: Sth
a function of the forevacuum pressure pV (see Fig. 2.18). k0 also depends
(slightly) on the type of gas. b) the max. compression as a function of the fore
vacuum pressure: k0 (pV)
For the efficiency of the Roots pump, the generally valid equation applies:
c) the pumping speed characteristic of the backing pump SV (pV)
= 1 k (2.13)
ko The way in which the calculation is carried out can be seen in Table 2.3
giving the data for the combination of a Roots pump RUVAC WA 2001 /
E 250 (single-stage rotary plunger pump, operated without gas ballast).

28
 Vacuum generation
In this the following is taken for Sth: The power losses summarized in NV are as shown by experience
approximately proportional to Sth, i.e.:
Sth = 2050 2.5 % = 2000 m3/h
Nv = const Sth (2.20)
The method outlined above may also be applied to arrangements which
consist of a rotary pump as the backing pump and several Roots pumps Depending on the type of pump and its design the value of the constant
connected in series, for example. Initially one determines in line with an ranges between 0.5 and 2 Wh / m3 .
iteration method the pumping characteristic of the backing pump plus the
The total power is thus:
first Roots pump and then considers this combination as the backing pump
for the second Roots pump and so on. Of course it is required that the Ntot = Sth (pv pa + const.)
theoretical pumping speed of all pumps of the arrangement be known and
The corresponding numerical value equation which is useful for calculations
that the compression at zero throughput k0 as a function of the backing
is:
pressure is also known. As already stated, it depends on the vacuum
process which grading will be most suitable. It may be an advantage when Ntot = Sth (pv pa + const.) 3 10-2 Watt (2.21)
backing pump and Roots pump both have the same pumping speed in the
rough vacuum range.
with pv, pa in mbar, Sth in m3 / h and the constant const. being between
18 and 72 mbar.
Power requirement of a roots pump
Compression in a Roots pump is performed by way of external
compression and is termed as isochoric compression. Experience shows
that the following equation holds approximately:

Ncompression = Sth (pv pa) (2.18)

In order to determine the total power (so-called shaft output) of the pump,
mechanical power losses NV (for example in the bearing seals) must be
considered:

Ntot = Ncompression + NV (2.19)

Forevacuum Pumping speed kth = Sth / Sv k0 (pv) of = k0 / k0+kth Intake pressure

pressure Sv of the = 2001/Sv the RUVAC (Volumetric. Seff = Sth pa = pv Sv / Seff
Pv E 250 WA 2001 efficiency) (equation 2.14)

100 250 8.0 12.5 0.61 1.220 21

40 250 8.0 18 0.69 1.380 7.2

10 250 8.0 33 0.8 1.600 1.6

5 250 8.0 42 0.84 1.680 0.75

1 250 8.0 41 0.84 1.680 0.15

5 101 220 9.1 35 0.79 1.580 7 102

1 101 120 16.6 23 0.6 1.200 1 102

4 102 30 67 18 0.21 420 3 103

The values taken from the two right-hand columns give point by point the pumping speed curve for the com-
bination WA 2001/E250 (see Fig. 2.19, topmost curve) Pumping speed characteristic
for the combination
WA 2001 / E250

Table 2.3

29
Vacuum generation
Pumping speed S

Intake pressure pa

Fig. 2.19 Pumping speed curves for different pump combinations with the corresponding backing pumps

Load rating of a roots pump Maintaining the allowed pressure difference

The amount of power drawn by the pump determines its temperature. If the In the case of standard Roots pumps, measures must be introduced to
temperature increases over a certain level, determined by the maximum ensure that the maximum permissible pressure difference between intake
permissible pressure difference pV pa, the danger exists that the rotors and exhaust port due to design constraints is not exceeded. This is done
may seize in the casing due to their thermal expansion. The maximum either by a pressure switch, which cuts the Roots pump in and out
permissible pressure difference pmax is influenced by the following factors: depending on the intake pressure, or by using a pressure difference or
forevacuum or compression pressure pV, pumping speed of the backing overflow valve in the bypass of the Roots pumps (Fig. 2.20 and 2.21). The
pump SV, speed of the Roots pump n, gradation kth and the adiabatic use of an overflow valve in the bypass of the Roots pump is the better and
exponent of the pumped gas. pmax increases when pV and SV increase more reliable solution. The weight and spring loaded valve is set to the
and decreases when n and kth increase. Thus the maximum difference maximum permissible pressure difference of the particular pump. This
between forevacuum pressure and intake pressure, pV pa must during ensures that the Roots pump is not overloaded and that it may be operated
continuous operation not exceed a certain value depending on the type of in any pressure range. In practice this means that the Roots pump can be
pump. Such values are in the range between 130 and 50 mbar. However, switched on, together with the backing pump, at atmospheric pressure. In
the maximum permissible pressure difference for continuous operation may the process any pressure increases will not adversely affect combined
be exceed for brief periods. In the case of special designs, which use gas operation, i.e. the Roots pump is not switched off in such circumstances.
cooling, for example, high pressure differences are also permissible during
continuous operation.

Types of motors used with roots pumps

Standard flange-mounted motors are used as the drive. The shaft
feedthroughs are sealed by two oil sealed radial shaft seals running on a
wear resistant bushing in order to protect the drive shaft. Flange motors of
any protection class, voltage or frequency may be used.

Integral leak tightness of this version is < 10-4 mbar l s-1.

In the case of better leak tightness requirements of < 10-5 mbar l s-1 the
Roots pump is equipped with a canned motor. The rotor is seated in the
vacuum on the drive shaft of the pump and is separated from the stator by
a vacuum-tight non-magnetic tube. The stator coils are cooled by a fan
having its own drive motor. Thus shaft seals which might be subject to wear
are no longer required. The use of Roots pumps equipped with canned
motors is especially recommended when pumping high purity-, toxic- or
radioactive gases and vapors.

Fig. 2.20 Cross section of a Roots pumps with bypass line

30
 Vacuum generation
flows into the pumping chamber via the pre-admission channel. Finally the
rotors eject the pumped medium via the discharge port. The cooled gas,
which in the case of single-stage compression is taken from the
atmosphere and admitted from the pre-admission cooler, and which in the
case of multi-stage pump systems is taken from downstream gas coolers,
performs a pre-compression and removes by inner cooling the heat of
WAU 2001
compression at the point of time it occurs.

2.1.3.2 Claw pumps

Like Roots pumps, claw pumps belong to the group of dry compressing
SOGEVAC SV 1200 rotary piston vacuum pumps (or rotary vacuum pumps). These pumps may
have several stages; their rotors have the shape of claws.

The design principle of a claw pump is explained by first using an

example of a four-stage design. The cross section inside the pumps casing
has the shape of two partly overlapping cylinders (Fig. 2.23). Within these
Fig. 2.21 Vacuum diagram Roots pump with integrated bypass line and backing pump cylinders there are two freely rotating rotors in each pump stage: (1) with
their claws and the matching recesses rotating in opposing directions about
their vertical axes. The rotors are synchronized by a gear just like a Roots
Pre-admission cooling (Fig. 2.22)
pump. In order to attain an optimum seal, the clearance between the rotor
In the case of Roots pumps with pre-admission cooling, the compression
at the center of the casing and the amount of clearance with respect to the
process basically is the same as that of a normal Roots pump. Since
inside casing wall is very small; both are in the order of magnitude of a few
greater pressure differences are allowed more installed power is needed,
0.01 mm. The rotors periodically open and close the intake and discharge
which at the given speed and the pressure difference between inlet and
slots (5) and (4). At the beginning of the work cycle in position a, the right
discharge port is directly proportional and is composed of the theoretical
rotor just opens the intake slot (5). Gas now flows into the continually
work done on compression and various power losses. The compression
increasing intake space (3) in position b until the right rotor seals off the
process ends normally after opening of the pumping chamber in the
intake slot (5) in position c. After both claws have passed through the
direction of the discharge port. At this moment warmed gas at higher
center position, the gas which has entered is then compressed in the
pressure flows into the pumping chamber and compresses the transported
volume of gas. This compression process is performed in advance in the
case of pre-admission cooling. Before the rotor opens the pumping a
chamber in the direction of the discharge port, compressed and cooled gas

4
4 c

2 1 Rotors 5 Intake slot

2 Compression chamber 6 Intermediate stage purge
3 Intake space gas
1 Intake port 2 Discharge port 3 Gas cooler 4 Flow of cold gas 4 Exhaust slot

Fig. 2.22 Diagram of a Roots pump with pre-admission cooling Fig. 2.23 Principle of operation

31
Vacuum generation

IN 1 mbar OUT
Stage 1
3 mbar

P IN OUT 15 mbar Stage 2

3 mbar

Z IN 15 mbar OUT 150 Stage 3

P
Z IN 150 OUT Stage 4
1000
P
Z
P

Fig. 2.25 Pressures in pump stages 1 to 4

through the pump at a constant volume and compression is only performed

in the forevacuum line (see Section 2.1.3.1), the claw pump compresses
the gas already within the pumping chamber until the rotor releases the
discharge slot. Shown in Fig. 2.25 are the average pressure conditions in
the individual pumping stages of a DRYVAC at an intake pressure of 1
Fig. 2.24 Arrangement of the pumps and guiding of the gas flow. P = Pump stage Z =
mbar. In order to meet widely differing requirements LEYBOLD
Intermediate ring manufactures two different series of claw pumps, which chiefly differ in the
type of compression process used:
compression chamber (2) (position a) so long until the left rotor releases
the discharge slot (4) (position b) thereby discharging the gas. Immediately 1) Pumps with internal compression, multi-stage for the semiconductor
after the compression process has started (position a) the intake slot (5) is industry (DRYVAC Series) and
opened simultaneously and gas again flows into the forming intake space 2) Pumps without internal compression, two-stage for chemistry
(3) (position b). Influx and discharge of the gas is performed during two half applications (ALLex).
periods. Each rotor turns twice during a full work cycle. Located between
Figs. 2.26 and 2.27 demonstrate the differences in design. Shown is the
the pumping stages are intermediate discs with flow channels which run
course of the pressure as a function of the volume of the pumping chamber
from the discharge side of the upper stage to the intake side of the next
by way of a pV diagram.
stage, so that all inlet or exhaust sides are arranged vertically above each
other (Fig. 2.24). Whereas in a Roots pump the incoming gas is pumped Fig. 2.26 shows the (polytropic) course of the compression for pumps with

P P
1 W Compr. 1 W Compr.
2 2

4 3

V V

Fig. 2.26 Compression curve for a claw pump with internal compression Fig. 2.27 Compression curve for a claw pump without internal compression (isochoric com-
pression)

32
 Vacuum generation

1
Casing Intake
suction line

2
Cooling water

3
Exhaust line

1 Intake port
2 Front panel / electronics
Fig. 2.29a Vacuum diagram for the DRYVAC B
3 Main switch

with perfluoropolyether (PFPE). The gear box is virtually hermetically sealed

Fig. 2.28 DRYVAC pump from the pumping chamber by piston rings and a radial shaft seal. The
bearings in the upper end disk are lubricated with PFPE grease. In order to
protect the bearings and shaft seals against aggressive substances, a
internal compression. The pressure increases until the discharge slot is barrier gas facility is provided. A controlled water cooling system allows the
opened. If at that point the exhaust back pressure has not been reached, control of the casing temperature over a wide range as the pump is
the compression space is suddenly vented with hot exhaust gas. As the subjected to differing gas loads coming from the process. The four stage
volume is reduced further, the gas at exhaust pressure is ejected. The work design is available in several pumping speed and equipment grades of 25,
done on compression is represented by the area under the p-v curve 50 and 100 m3/h DRYVAC pumps:
1-2-3-4. It is almost completely converted into heat. In the case of dry
compressing vacuum pumps not much of this heat can be lost to the cooled a) as the basic version for non-aggressive clean processes:
casing due to the low density of the gas. This results in high gas DRYVAC 25 B, 50 B and 100 B (Fig. 2.29a)
temperatures within the pump. Experiences with claw pumps show that the b) as a version for semiconductor processes: DRYVAC 25 P, 50 P and
highest temperatures occur at the rotors. 100 P (Fig. 2.29b)
Shown in Fig. 2.27 is the principle of isochoric compression in a p-v dia- c) as a system version with integrated self monitoring: DRYVAC 50 S and
gram. Here the compression is not performed by reducing the volume of the 100 S
pumping chamber, but by venting with cold gas which is applied from the
outside after completion of the intake process. This is similar to the
admission of a gas ballast when opening the gas ballast valve after Casing Intake
suction line
completion of the intake phase. From the diagram it is apparent that in the
case of isochoric compression the work done on compression must be 100 P
increased, but cold gas instead of hot exhaust gas is used for venting. This Cooling water
method of direct gas cooling results in considerably reduced rotor
temperatures. Pumps of this kind are discussed as ALLex in Section
2.1.3.2.2.

2.1.3.2.1 Claw pumps with internal compression for the Exhaust line
semiconductor industry (DRYVAC series)
Design of DRYVAC Pumps
Due to the work done on compression in the individual pumping stages, Inert gas
multi-stage claw pumps require water cooling for the four stages to remove
the compression heat. Whereas the pumping chamber of the pump is free
of sealants and lubricants, the gear and the lower pump shaft are lubricated
Fig. 2.29b Vacuum diagram for the DRYVAC P

33
Vacuum generation

To be provided by the customer

TSH Temperature switch

PSL Pressure switch

PSH Pressure switch

FSL Flow switch

MPS Motor protection switch

PT 100 Temperature sensor

For DRYVAC with LIMS

CS Current sensor

EPS Exhaust pressure sensor

Fig. 2.29c Vacuum diagram for the DRYVAC S Fig. 2.30 Key to Figures 2.29a 2.29c

d) as a system version with integrated self monitoring offering an thus the formation of layers within the pump and reduces the risk that the
increased pumping speed in the lower pressure range: DRYVAC 251 S claw rotor may seize. Care must be taken to ensure that the velocity of the
and 501 S (Fig. 2.29c) gas flow within the individual pumping stages is at all times greater than the
settling speed of the particles entrained in the gas flow. As can be seen in
The ultimate pressure attainable with the DRYVAC 251 S or 501 S is
Fig. 2.31, the settling speed of the particles depends strongly on their size.
compared to the versions without integrated Roots pump by
The mean velocity (VGas) of the flowing gas during the compression phase
approximately one order of magnitude lower (from 2 10-2 mbar to
is given by the following equation:
3 10-3 mbar) and the attainable throughput is also considerably increased.
It is of course possible to directly flange mount LEYBOLD RUVAC pumps q pV mbar  s 1
on to the DRYVAC models (in the case of semiconductor processes also v = =
Gas p A mbar cm2
mostly with a PFPE oil filling for the bearing chambers). (2.22)
10 q pV m
=
The pumps of the DRYVAC family are the classic dry compressing claw p A s
vacuum pumps that are preferably used in the semiconductor industry,
whereby the pumps need to meet a variety of special requirements. In qpV = gas throughput
semiconductor processes, as in many other vacuum applications, the p = pressure
formation of particles and dusts during the process and/or in the course of A = surface area
compressing the pumped substances to atmospheric pressure within the
pump, is unavoidable. In the case of vacuum pumps operating on the claw One can see that with increasing pressure the velocity of the pumped gas
principle it is possible to convey particles through the pump by means of so flow slows down and attains the order of magnitude of the settling speed of
called pneumatic conveying. This prevents the deposition of particles and the particles in the gas flow (Fig. 2.32). This means that the risk of

Stage 2 Stage 3 Stage 4

2 500 mbar /s 8 300 mbar /s 20 000 mbar /s

Particle size
Gas velocity
Limit speed

Throughput in mbar /s

Pressure Throughput cross section 6.5 cm2, constant

Pressure

Fig. 2.31 Settling speed as a function of pressure p. Parameter: particle size Fig. 2.32 Mean gas velocity vg during compression without purge gas (left) and with purge gas
(right) in stages 2, 3 and 4

34
 Vacuum generation
Losses in pumping speed and a reduction in ultimate pressure can be
mbar
kept very small due to the special way in which the gas is made to pass
through the pump.
Ultimate pressure

2.1.3.2.2 Claw pumps without internal compression

for chemistry applications (ALLex )
Purge gas flow

Fig. 2.33 Ultimate pressure of the DRYVAC 100S as a function of pure gas flow in stages 2 4
The chemical industry requires vacuum pumps which are highly reliable and
which do not produce waste materials such as contaminated waste oil or
depositing particles in the operating chamber of the pump and the resulting waste water. If this can be done, the operating costs of such a vacuum
impairment increases with increasing pressure. In parallel to this the pump are low in view of the measures otherwise required for protecting the
potential for the formation of particles from the gaseous phase increases at environment (disposal of waste oil and water, for example). For operation of
increasing compression levels. In order to keep the size of the forming the simple and rugged ALLex pump from LEYBOLD there are no
particles small and thus their settling speed low and to maintain a high restrictions as to the vapor flow or the pressure range during continuous
velocity for the gas, an additional quantity of gas is supplied into the pump operation. The ALLex may be operated within the entire pressure range
via the individual intermediate discs (purge gas). For this, the inflowing from 5 to 1000 mbar without restrictions.
quantity of purge gas is matched to the pressure conditions prevailing in the
individual pumping stages (see top right part of Fig. 2.32). This keeps the
Design of the ALLex pump
velocity of the gas flow high enough within the entire pump by so-called
The design of the two-stage ALLex is shown schematically in Fig. 2.35.
pneumatic pumping. Through the way in which the gas is lead within the
The gas flows from top to bottom through the vertically arranged pumping
pump, i.e. from the intake through the four pumping stages with the related
stages in order to facilitate the ejection of condensates and rinsing liquids
intermediate discs to the exhaust, it is possible to reduce the influence of
which may have formed. The casing of the pump is water cooled and
the purge gas on the ultimate pressure to a minimum. Test results (Fig.
permits cooling of the first stage. There is no sealed link between gas
2.33) indicate that the influence of purge gas in the fourth stage is as to
chamber and cooling channel so that the entry of cooling water into the
be expected of the lowest level since there are located between this
pumping chamber can be excluded. The pressure-burst resistant design of
stage and the intake side the three other pumping stages. The admission of
the entire unit underlines the safety concept in view of protection against
purge gas via the second and third stages (Fig. 2.33) has a comparatively
internal explosions, something which was also taken into account by direct
small influence on the ultimate pressure as can be seen from the pumping
cooling with cold gas (see operating principle). A special feature of the
speed curve in Fig. 2.34. Finally it can be said that the formation of particles
ALLex is that both shafts have their bearings exclusively in the gear. On
is to be expected in most CVD processes. When using dry compressing
the pumping side, the shafts are free (cantilevered). This simple design
claws vacuum pumps, the controlled admission of purge gas via the
allows the user to quickly disassemble the pump for cleaning and servicing
individual intermediate discs is the best approach to avoid the formation of
without the need for special tools.
layers. When applying this method several effects can be noted:
In order to ensure a proper seal against the process medium in the
The admitted purge gas dilutes the pumped mixture of substances,
pumping chamber the shaft seal is of the axial face seal type a sealing
particle-forming reactions will not occur, or are at least delayed.

The risk of an explosion through self-igniting substances is significantly

reduced.
Intake port
Particles which have formed are conveyed pneumatically through the Motor
pump

1st stage
Claws
2nd stage
Pumping speed

Coupling Axial face

seals

Stage 2 mbar l/s

Stage 3 mbar l/s Gear, complete
Stage 4 with shafts and
mbar l/s
bearings

Pressure

Fig. 2.34 Pumping speed with and without purge gas Fig. 2.35 Simple arrangement of the dry compression ALLex pump

35
Vacuum generation
takes in the quantity of cold process gas needed for venting the pumping
3 1 chamber back into the compression space on its own. This process,
however, has no influence on the pumping speed of the ALLex because
the intake process has already ended when the venting process starts.
Designing the cooler as a condenser allows for simple solvent recovery.
The method of direct gas cooling, i.e. venting of the pumping chamber with
cold gas supplied from outside (instead of hot exhaust gas) results in the
4 case of the ALLex in rotor temperatures which are so low that mixtures
of substances rated as ExT3 can be pumped reliably under all operating
2 conditions. The ALLex thus fully meets the requirements of the chemical
industry concerning the protection against internal explosions. A certain
5
degree of liquid compatibility makes the ALLex rinseable, thus avoiding
the formation of layers in the pump, for example, or the capability of
dissolving layers which may already have formed respectively. The rinsing
6 liquids are usually applied to the pump after completion of the connected
process (batch operation) or while the process is in progress during brief
7 blocking phases. Even while the ALLex is at standstill and while the
pumping chamber is completely filled with liquid it is possible to start this
pump up. Shown in Fig. 2.39 is the pumping speed characteristic of an
ALLex 250. This pump has a nominal pumping speed of 250 m3/h and
an ultimate pressure of < 10 mbar. At 10 mbar it still has a pumping speed
of 100 m3/h. The continuous operating pressure of the pump may be as
high as 1000 mbar; it consumes 13.5 kW of electric power.
1 Motor 4 Exhaust port 6 Cooling water connection
2 Pump 5 Exhaust cooler 7 Cooling receiver
3 Intake port

Fig. 2.36 ALLex pump

concept well proven in chemistry applications. This type of seal is capable

of sealing liquids against liquids, so that the pump becomes rinseable and
insensitive to forming condensate. Fig. 2.36 shows the components
supplied with the ALL.ex, together with a gas cooler and a receiver.

Operating principle
Isochoric compression, which also serves the purpose of limiting the
temperature ultimately attained during compression, especially in the stage
on the side of the atmosphere, and which ensures protection against
internal explosions, is performed by venting the pumping chamber with cold
gas from a closed refrigerating gas cycle (Fig. 2.37). Fig. 2.38-1 indicates
the start of the intake process by opening the intake slot through the control
edge of the right rotor. The process gas then flows into the intake chamber
which increases in size. The intake process is caused by the pressure
gradient produced by increasing the volume of the pumping chamber. The
maximum volume is attained after 3/4 of a revolution of the rotors (Fig.
2.38-2). After the end of the intake process, the control edge of the left
rotor opens the cold gas inlet and at the same time the control edge of the
right rotor opens the intake slot (Fig. 2.38-3) once more. In Fig. 2.38-4 the
control edge of the left rotor terminates the discharge of the gas which has
been compressed to 1000 mbar with the cold gas; at the same time the
control edge of the right rotor completes an intake process again.

The total emissions from the system are not increased by the large
quantities of cold gas, since a closed refrigerating cycle is maintained by
way of an externally arranged gas cooler and condenser (Fig. 2.37). The
hot exhaust gas is made to pass through the cooler and is partly returned
in the form of cold gas for pre-admission cooling into the pump. The pump

36
 Vacuum generation

1000

m
3 . h-1
Cooling gas

Saugvermgen
100

Pumping speed
10
8
6
4
2
Exhaust gas
1 2 4 6 8
1 10 100 mbar 1000
Ansaugdruck
Intake pressure

Fig. 2.37 Circulation of the cold gas in the ALLex with cooler / condenser Fig. 2.39 Pumping speed characteristic of an ALLex 250

Vmax

Exhaust slot Intake

Volume of the pump slot
chamber starts to increase
1
Suction
Cold gas inlet Vmin
100 1000 Pmbar
(10) (100)

Vmax

Volume of the pump

chamber at maximum
2
End of suction
Vmin
100 1000 Pmbar
(10) (100)

Cold gas inlet

Vmax

Volume of the pump chamber

stars to decrease (without
compression). Pressure
increase to 1000 mbar
3 only by admitting cold gas.

Vmin

Beginning of admitting cold gas 100 1000 Pmbar

(10) (100)

Vmax

Ejection of the mixture Exhaust slot

composed of sucked
in gas and cold gas.
4
Cold gas inlet Vmin
100 1000 Pmbar
(10) (100)

Fig. 2.38 Diagrams illustrating the pumping principle of the ALLex pump (claw pump without inner compression)

37
Vacuum generation
2.1.4 Accessories for oil-sealed rotary
displacement pumps
During a vacuum process, substances harmful to rotary pumps can be
present in a vacuum chamber.

Elimination of water vapor

Water vapor arises in wet vacuum processes. This can cause water to be
deposited in the inlet line. If this condensate reaches the inlet port of the
pump, contamination of the pump oil can result. The pumping performance
of oil-sealed pumps can be significantly impaired in this way. Moreover,
water vapor discharged through the outlet valve of the pump can condense
in the discharge outlet line. The condensate can, if the outlet line is not
correctly arranged, run down and reach the interior of the pump through the
discharge outlet valve. Therefore, in the presence of water vapor and other
vapors, the use of condensate traps is strongly recommended. If no
discharge outlet line is connected to the gas ballast pump (e.g., with
smaller rotary vane pumps), the use of discharge filters is recommended.
These catch the oil mist discharged from the pump.

Some pumps have easily exchangeable filter cartridges that not only hold
back oil mist, but clean the circulating pump oil. Whenever the amount of
water vapor present is greater than the water vapor tolerance of the pump,
a condenser should always be installed between the vessel and the pump.
(For further details, see Section 2.1.5)

Elimination of dust
Solid impurities, such as dust and grit, significantly increase the wear on
1 Housing 6 Upper section
the pistons and the surfaces in the interior of the pump housing. If there is 2 Basket holding the sieve 7 Vessel for the heater or
a danger that such impurities can enter the pump, a dust separator or a 3 Molecular sieve (filling) refrigerant
4 Sealing flanges 8 Connection on the side of the
dust filter should be installed in the inlet line of the pump. Today not only 5 Intake port with small flange pump with small flange
conventional filters having fairly large casings and matching filter inserts
Fig. 2.40 Cross section of a medium vacuum adsorption trap
are available, but also fine mesh filters which are mounted in the centering
ring of the small flange. If required, it is recommended to widen the cross
from the surface of the zeolite can be most conveniently pumped away with
section with KF adaptors.
an auxiliary pump. In operation, pumping by the gas ballast pump generally
leads to a covering of the zeolite in the other, unheated adsorption trap and
Elimination of oil vapor thus to a premature reduction of the adsorption capacity of this trap.
The attainable ultimate pressure with oil-sealed rotary pumps is strongly
influenced by water vapor and hydrocarbons from the pump oil. Even with
Reduction of the effective pumping speed
two-stage rotary vane pumps, a small amount of back-streaming of these
All filters, separators, condensers, and valves in the inlet line reduce the
molecules from the pump interior into the vacuum chamber cannot be
effective pumping speed of the pump. On the basis of the values of the
avoided. For the production of hydrocarbon-free high and ultrahigh vacuum,
conductances or resistances normally supplied by manufacturers, the
for example, with sputter-ion or turbomolecular pumps, a vacuum as free
actual pumping speed of the pump can be calculated. For further details,
as possible of oil is also necessary on the forevacuum side of these
see Section 1.5.2.
pumps. To obtain this, medium vacuum adsorption traps (see Fig. 2.40)
filled with a suitable adsorption material (e.g., LINDE molecular sieve 13X)
are installed in the inlet line of such oil-sealed forepumps. The mode of
action of a sorption trap is similar to that of an adsorption pump. For further
2.1.5 Condensers
details, see Section 2.1.8. If foreline adsorption traps are installed in the For pumping larger quantities of water vapor, the condenser is the most
inlet line of oil-sealed rotary vane pumps in continuous operation, two economical pump. As a rule, the condenser is cooled with water of such
adsorption traps in parallel are recommended, each separated by valves. temperature that the condenser temperature lies sufficiently below the dew
Experience shows that the zeolite used as the adsorption material loses point of the water vapor and an economical condensation or pumping
much of its adsorption capacity after about 10 14 days of running time, action is guaranteed. For cooling, however, media such as brine and
after which the other, now-regenerated, adsorption trap can be utilized; refrigerants (NH3, Freon ) can also be used.
hence the process can continue uninterrupted. By heating the adsorption
trap, which is now not connected in the pumping line, the vapors escaping When pumping water vapor in a large industrial plant, a certain quantity of

38
 Vacuum generation
For a mathematical evaluation of the combination of condenser and gas
ballast pump, it can be assumed that no loss of pressure occurs in the
condenser, that the total pressure at the condenser entrance ptot 1, is equal
to the total pressure at the condenser exit, ptot 2:
ptot 1 = ptot 2 (2.23)

The total pressure consists of the sum of the partial pressure portions of the
air pp and the water vapor pv:
1 Inlet of the condenser
2 Discharge of the condenser pp1 + pv1 = pp2 + pv2 (2.23a)
3 See text
As a consequence of the action of the condenser, the water vapor pressure
Fig. 2.41 Condenser (I) with downstream gas ballast pump (II) for pumping of large quantities pD2 at the exit of the condenser is always lower than that at the entrance;
of water vapor in the rough vacuum range (III) adjustable throttle
for (2.23) to be fulfilled, the partial pressure of air pp2 at the exit must be
air is always involved, which is either contained in the vapor or originates higher than at the entrance pp1, (see Fig. 2.43), even when no throttle is
from leaks in the plant (the following considerations for air and water vapor present.
obviously apply also in general for vapors other than water vapor).
The higher air partial pressure pp2 at the condenser exit is produced by an
Therefore, the condenser must be backed by a gas ballast pump (see Fig. accumulation of air, which, as long as it is present at the exit, results in a
2.41) and hence always works like the Roots pump in a combination. stationary flow equilibrium. From this accumulation of air, the (eventually
The gas ballast pump has the function of pumping the fraction of air, which throttled) gas ballast pump in equilibrium removes just so much as streams
is often only a small part of the water-vapor mixture concerned, without from the entrance (1) through the condenser.
simultaneously pumping much water vapor. It is, therefore, understandable
All calculations are based on (2.23a) for which, however, information on the
that, within the combination of condenser and gas ballast pump in the
quantity of pumped vapors and permanent gases, the composition, and the
stationary condition, the ratios of flow, which occur in the region of rough
pressure should be available. The size of the condenser and gas ballast
vacuum, are not easily assessed without further consideration. The simple
pump can be calculated, where these two quantities are, indeed, not
application of the continuity equation is not adequate because one is no mutually independent. Fig. 2.42 represents the result of such a calculation
longer concerned with a source or sink-free field of flow (the condenser is, as an example of a condenser having a condensation surface of 1 m2, and
on the basis of condensation processes, a sink). This is emphasized at an inlet pressure pv1, of 40 mbar, a condensation capacity that amounts
especially at this point. In a practical case of non-functioning of the to 15 kg / h of pure water vapor if the fraction of the permanent gases is
condenser gas ballast pump combination, it might be unjustifiable to blame very small. 1 m3 of cooling water is used per hour, at a line overpressure of
the condenser for the failure. 3 bar and a temperature of 12 C. The necessary pumping speed of the
In sizing the combination of condenser and gas ballast pump, the following gas ballast pump depends on the existing operating conditions, particularly
the size of the condenser. Depending on the efficiency of the condenser,
points must be considered:
the water vapor partial pressure pv2 lies more or less above the saturation
a) the fraction of permanent gases (air) pumped simultaneously with the pressure pS which corresponds to the temperature of the refrigerant. (By
water vapor should not be too great. At partial pressures of air that are cooling with water at 12 C, pS, would be 15 mbar (see Table XIII in Section
more than about 5 % of the total pressure at the exit of the condenser, a 9)). Correspondingly, the partial air pressure pp2 that prevails at the
marked accumulation of air is produced in front of the condenser condenser exit also varies. With a large condenser, pv2 pS, the air partial
surfaces. The condenser then cannot reach its full capacity (See also the pressure pp,2 is thus large, and because pp V = const, the volume of air
account in Section 2.2.3 on the simultaneous pumping of gases and involved is small. Therefore, only a relatively small gas ballast pump is
vapors).
b) the water vapor pressure at the condenser exit that is, at the inlet side of
the gas ballast pump should not (when the quantity of permanent gas
Condensation capacity [kg h-1]

described in more detail in Section 2.2.3 is not pumped simultaneously)

be greater than the water vapor tolerance for the gas ballast pump
involved. If as cannot always be avoided in practice a higher water
vapor partial pressure is to be expected at the condenser exit, it is conve-
nient to insert a throttle between the condenser exit and the inlet port of
the gas ballast pump. The conductance of this throttle should be variable
and regulated (see Section 1.5.2) so that, with full throttling, the pressure
at the inlet port of the gas ballast pump cannot become higher than the Intake pressure pD1
water vapor tolerance. Also, the use of other refrigerants or a decrease of
the cooling water temperature may often permit the water vapor pressure Fig. 2.42 Condensation capacity of the condenser (surface area available to condensation 1
m2) as a function of intake pressure pD1 of the water vapor. Curve a: Cooling water
to fall below the required value. temperature 12C. Curve b: Temperature 25 C. Consumption in both cases 1 m3/h at
3 bar overpressure.

39
Vacuum generation
two following cases:

1. Pumping of permanent gases with small amounts of water vapor. Here

Pv2 the size of the condenser gas ballast pump combination is decided on the
basis of the pumped-off permanent gas quantity. The condenser function is
Pv2
merely to reduce the water vapor pressure at the inlet port of the gas
Pv1
ballast pump to a value below the water vapor tolerance.

2. Pumping of water vapor with small amounts of permanent gases. Here,

to make the condenser highly effective, as small as possible a partial
Pp2
Pp2 pressure of the permanent gases in the condenser is sought. Even if the
Pp1 water vapor partial pressure in the condenser should be greater than the
water vapor tolerance of the gas ballast pump, a relatively small gas ballast
pump is, in general, sufficient with the then required throttling to pump away
the prevailing permanent gases.
Fig. 2.43 Schematic representation of the pressure distribution in the condenser. The full lines
correspond to the conditions in a condenser in which a small pressure drop takes Important note: During the process, if the pressure in the condenser drops
place (ptot 2 < ptot 1). The dashed lines are those for an ideal condenser (ptot 2 ptot 1). below the saturation vapor pressure of the condensate (dependent on the
pD: Partial pressure of the water vapor, pL: Partial pressure of the air
cooling water temperature), the condenser must be blocked out or at least
necessary. However, if the condenser is small, the opposite case arises: the collected condensate isolated. If this is not done, the gas ballast pump
pv2 > pS pp2, is small. Here a relatively large gas ballast pump is required. again will pump out the vapor previously condensed in the condenser
Since the quantity of air involved during a pumping process that uses
condensers is not necessarily constant but alternates within more or less
wide limits, the considerations to be made are more difficult. Therefore, it is 2.1.6 Fluid-entrainment pumps
necessary that the pumping speed of the gas ballast pump effective at the
Basically, a distinction is made between ejector pumps such as water jet
condenser can be regulated within certain limits.
pumps (17 mbar < p < 1013 mbar), vapor ejector vacuum pumps
In practice, the following measures are usual: (10-3 mbar < p < 10-1 mbar) and diffusion pumps (p < 10-3 mbar). Ejector
a) A throttle section is placed between the gas ballast pump and the vacuum pumps are used mainly for the production of medium vacuum.
condenser, which can be short-circuited during rough pumping. The flow Diffusion pumps produce high and ultrahigh vacuum. Both types operate
resistance of the throttle section must be adjustable so that the effective with a fast-moving stream of pump fluid in vapor or liquid form (water jet as
speed of the pump can be reduced to the required value. This value can well as water vapor, oil or mercury vapor). The pumping mechanism of all
be calculated using the equations given in Section 2.2.3. fluid-entrainment pumps is basically the same. The pumped gas molecules
are removed from the vessel and enter into the pump fluid stream which
b) Next to the large pump for rough pumping a holding pump with low expands after passing through a nozzle. The molecules of the pump fluid
speed is installed, which is of a size corresponding to the minimum stream transfer by way of impact impulses to the gas molecules in the
prevailing gas quantity. The objective of this holding pump is merely to direction of the flow. Thus the gas which is to be pumped is moved to a
maintain optimum operating pressure during the process. space having a higher pressure.
c) The necessary quantity of air is admitted into the inlet line of the pump In fluid-entrainment pumps corresponding vapor pressures arise during
through a variable-leak valve. This additional quantity of air acts like an operation depending on the type of pump fluid and the temperature as well
enlarged gas ballast, increasing the water vapor tolerance of the pump. as the design of the nozzle. In the case of oil diffusion pumps this may
However, this measure usually results in reduced condenser capacity. amount to 1 mbar in the boiling chamber. The backing pressure in the
Moreover, the additional admitted quantity of air means additional power pump must be low enough to allow the vapor to flow out. To ensure this,
consumption and (see Section 8.3.1.1) increased oil consumption. As such pumps require corresponding backing pumps, mostly of the
the efficiency of the condenser deteriorates with too great a partial mechanical type. The vapor jet cannot enter the vessel since it condenses
pressure of air in the condenser, the admission of air should not be in at the cooled outer walls of the pump after having been ejected through the
front, but generally only behind the condenser. nozzle.
If the starting time of a process is shorter than the total running time, Wolfgang Gaede was the first to realize that gases at comparatively low
technically the simplest method the roughing and the holding pump is pressure can be pumped with the aid of a pump fluid stream of essentially
used. Processes with strongly varying conditions require an adjustable higher pressure and that, therefore, the gas molecules from a region of low
throttle section and, if needed, an adjustable air admittance. total pressure move into a region of high total pressure. This apparently
On the inlet side of the gas ballast pump a water vapor partial pressure pv2 paradoxical state of affairs develops as the vapor stream is initially entirely
is always present, which is at least as large as the saturation vapor free of gas, so that the gases from a region of higher partial gas pressure
pressure of water at the coolant temperature. This ideal case is realizable in (the vessel) can diffuse into a region of lower partial gas pressure (the
practice only with a very large condenser (see above). vapor stream). This basic Gaede concept was used by Langmuir (1915) in
the construction of the first modern diffusion pump. The first diffusion
With a view to practice and from the stated fundamental rules, consider the pumps were mercury diffusion pumps made of glass, later of metal. In the

40
 Vacuum generation
Sixties, mercury as the medium was almost completely replaced by oil. To 2.1.6.1 (Oil) Diffusion pumps
obtain as high a vapor stream velocity as possible, he allowed the vapor
These pumps consist basically (see Fig. 2.44) of a pump body (3) with a
stream to emanate from a nozzle with supersonic speed. The pump fluid
cooled wall (4) and a three- or four-stage nozzle system (A D). The oil
vapor, which constitutes the vapor jet, is condensed at the cooled wall of
serving as pump fluid is in the boiler (2) and is vaporized from here by
the pump housing, whereas the transported gas is further compressed,
electrical heating (1). The pump fluid vapor streams through the riser tubes
usually in one or more succeeding stages, before it is removed by the
and emerges with supersonic speed from the ring-shaped nozzles (A D).
backing pump. The compression ratios, which can be obtained with fluid
Thereafter the jet so-formed widens like an umbrella and reaches the wall
entrainment pumps, are very high: if there is a pressure of 10-9 mbar at the
where condensation of the pump fluid occurs. The liquid condensate flows
inlet port of the fluid-entrainment pump and a backing pressure of
downward as a thin film along the wall and finally returns into the boiler.
10-2 mbar, the pumped gas is compressed by a factor of 107!
Because of this spreading of the jet, the vapor density is relatively low. The
Basically the ultimate pressure of fluid entrainment pumps is restricted by diffusion of air or any pumped gases (or vapors) into the jet is so rapid that
the value for the partial pressure of the fluid used at the operating despite its high velocity the jet becomes virtually completely saturated with
temperature of the pump. In practice one tries to improve this by introducing the pumped medium. Therefore, over a wide pressure range diffusion
baffles or cold traps. These are condensers between fluid entrainment pumps have a high pumping speed. This is practically constant over the
pump and vacuum chamber, so that the ultimate pressure which can be entire working region of the diffusion pump ( 10-3 mbar) because the air at
attained in the vacuum chamber is now only limited by the partial pressure these low pressures cannot influence the jet, so its course remains
of the fluid at the temperature of the baffle. undisturbed. At higher inlet pressures, the course of the jet is altered. As a
result, the pumping speed decreases until, at about 10-1 mbar, it becomes
The various types of fluid entrainment pumps are essentially distinguished
immeasurably small.
by the density of the pump fluid at the exit of the top nozzle facing the high
vacuum side of the pump: The forevacuum pressure also influences the vapor jet and becomes
detrimental if its value exceeds a certain critical limit. This limit is called
1. Low vapor density:
maximum backing pressure or critical forepressure. The capacity of the
Diffusion pumps

Oil diffusion pumps

(Series: LEYBODIFF, DI and DIP)
Mercury diffusion pumps

2. High vapor density:

Vapor jet pumps

Water vapor pumps

Oil vapor jet pumps
Mercury vapor jet pumps

3. Combined
oil diffusion/ vapor jet pumps
4. Water jet pumps

Cooling of fluid entrainment pumps

The heater power that is continuously supplied for vaporizing the pump fluid
in fluid-entrainment pumps must be dissipated by efficient cooling. The
energy required for pumping the gases and vapors is minimal. The outside
walls of the casing of diffusion pumps are cooled, generally with water.
Smaller oil diffusion pumps can, however, also be cooled with an air stream
because a low wall temperature is not so decisive to the efficiency as for
mercury diffusion pumps. Oil diffusion pumps can operate well with wall
temperatures of 30 C, whereas the walls of mercury diffusion pumps must
be cooled to 15 C. To protect the pumps from the danger of failure of the
cooling water insofar as the cooling-water coil is not controlled by
thermally operated protective switching a water circulation monitor should
be installed in the cooling water circuit; hence, evaporation of the pump 1 Heater 6 Gas molecules A

2 Boiler 7 Vapor jet B
fluid from the pump walls is avoided. 3 Pump body 8 Backing vacuum con- C
Nozzles
4 Cooling coil nection D
5 High vacuum flange

Fig. 2.44 Mode of operation of a diffusion pump

41
Vacuum generation
chosen backing pump must be such (see 2.3.2) that the amount of gas
discharged from the diffusion pump is pumped off without building up a
backing pressure that is near the maximum backing pressure or even
exceeding it.

The attainable ultimate pressure depends on the construction of the pump,

the vapor pressure of the pump fluid used, the maximum possible
condensation of the pump fluid, and the cleanliness of the vessel.
Moreover, backstreaming of the pump fluid into the vessel should be
reduced as far as possible by suitable baffles or cold traps (see Section
2.1.6.4).

Degassing of the pump oil 1

2
In oil diffusion pumps it is necessary for the pump fluid to be degassed
before it is returned to the boiler. On heating of the pump oil, decomposition
products can arise in the pump. Contamination from the vessel can get into
the pump or be contained in the pump in the first place. These constituents
of the pump fluid can significantly worsen the ultimate pressure attainable a) LEYBODIFF-Pump with fractionating b) DI pump; side view on to the internal
by a diffusion pump, if they are not kept away from the vessel. Therefore, facility heater
1 Center 1 Thermostat sensor
the pump fluid must be freed of these impurities and from absorbed gases. 2 Middle section 2 Heating cartridge
3 Outer part of the boiler (fractionation)
This is the function of the degassing section, through which the circulating
oil passes shortly before re-entry into the boiler. In the degassing section, Fig. 2.45 Diagram showing the basic differences in LEYBOLD oil diffusion pumps
the most volatile impurities escape. Degassing is obtained by the carefully
controlled temperature distribution in the pump. The condensed pump fluid, a) LEYBODIFF series
which runs down the cooled walls as a thin film, is raised to a temperature This series of pumps is equipped with a fractionating device. The various
of about 130 C below the lowest diffusion stage, to allow the volatile constituents of the pump fluid are selected so that the high vacuum nozzle
components to evaporate and be removed by the backing pump. Therefore, is supplied only by the fraction of the pump fluid that has the lowest vapor
the re-evaporating pump fluid consists of only the less volatile components pressure. This assures a particularly low ultimate pressure. Fractionating
of the pump oil. occurs because the degassed oil first enters the outer part of the boiler,
which serves the nozzle on the backing vacuum side. Here a part of the
Pumping speed more volatile constituents evaporates. Hence the already purified pump
The magnitude of the specific pumping speed S of a diffusion pump that fluid reaches the intermediate part of the boiler, which serves the
is, the pumping speed per unit of area of the actual inlet surface depends intermediate nozzle. Here the lighter constituents are evaporated in greater
on several parameters, including the position and dimensions of the high quantities than the heavier constituents. When the oil enters the central
vacuum stage, the velocity of the pump fluid vapor, and the mean region of the boiler, which serves the high vacuum nozzle, it has already
molecular velocity -c of the gas being pumped (see equation 1.17 in Section been freed of the light volatile constituents.
1.1). With the aid of the kinetic theory of gases, the maximum attainable
specific pumping speed at room temperature on pumping air is calculated b) DI series
to Smax = 11.6 l s-1 cm-2. This is the specific (molecular) flow In these pumps an evaporation process for the pump fluid which is
conductance of the intake area of the pump, resembling an aperture of the essentially free of bursts is attained by the exceptional heater design
same surface area (see equation 1.30 in Section 1.5.3). Quite generally, resulting in a highly constant pumping speed over time. The heater is of the
diffusion pumps have a higher pumping speed for lighter gases compared internal type and consists of heating cartridges into which tubes with
to heavier gases. soldered on thermal conductivity panels are introduced. The tubes made of
stainless steel are welded horizontally into the pumps body and are located
To characterize the effectiveness of a diffusion pump, the so called HO
above the oil level. The thermal conductivity panels made of copper are
factor is defined. This is the ratio of the actually obtained specific pumping
only in part immersed in the pump fluid. Those parts of the thermal
speed to the theoretical maximum possible specific pumping speed. In the
conductivity panels are so rated that the pump fluid can evaporate
case of diffusion pumps from LEYBOLD optimum values are attained (of
intensively but without any retardation of boiling. Those parts of the thermal
0.3 for the smallest and up to 0.55 for the larger pumps).
conductivity panels above the oil level supply additional energy to the
The various oil diffusion pumps manufactured by LEYBOLD differ in the vapor. Owing to the special design of the heating system, the heater
following design features (see Fig. 2.45 a and b). cartridges may be exchanged also while the pump is still hot.

42
 Vacuum generation

1 Nozzle (Laval) 3 Mixing chamber

2 Diffuser nozzle (Venturi) 4 Connection to the vacuum chamber

Fig. 2.46 Operation of a vapor jet pump

2.1.6.2 Oil vapor ejector pumps

The pumping action of a vapor ejector stage is explained with the aid of
Fig. 2.46. The pump fluid enters under high pressure p1 the nozzle (1),
constructed as a Laval nozzle. There it is expanded to the inlet pressure
p2. On this expansion, the sudden change of energy is accompanied by an
increase of the velocity. The consequently accelerated pump fluid vapor jet
streams through the mixer region (3), which is connected to the vessel (4)
being evacuated. Here the gas molecules emerging from the vessel are
1 High vacuum port 2 Diffusion stages 3 Ejector stages
dragged along with the vapor jet. The mixture, pump fluid vapor gas, now
enters the diffuser nozzle constructed as a Venturi nozzle (2). Here the Fig. 2.47 Diagram of an oil jet (booster) pump
vapor gas mixture is compressed to the backing pressure p3 with
simultaneous diminution of the velocity. The pump fluid vapor is then not remain constant toward low inlet pressures. As a consequence of the
condensed at the pump walls, whereas the entrained gas is removed by the high vapor stream velocity and density, oil vapor ejector pumps can
backing pump. Oil vapor ejector pumps are ideally suited for the pumping of transport gases against a relatively high backing pressure. Their critical
larger quantities of gas or vapor in the pressure region between 1 and backing pressure lies at a few millibars. The oil vapor ejector pumps used in
10-3 mbar. The higher density of the vapor stream in the nozzles ensures present-day vacuum technology have, in general, one or more diffusion
that the diffusion of the pumped gas in the vapor stream takes place much stages and several subsequent ejector stages. The nozzle system of the
more slowly than in diffusion pumps, so that only the outer layers of the booster is constructed from two diffusion stages and two ejector stages in
vapor stream are permeated by gas. Moreover, the surface through which cascade (see Fig. 2.47). The diffusion stages provide the high pumping
the diffusion occurs is much smaller because of the special construction of speed between 10-4 and 10-3 mbar (see Fig. 2.48), the ejector stages, the
the nozzles. The specific pumping speed of the vapor ejector pumps is, high gas throughput at high pressures (see Fig. 2.49) and the high critical
therefore, smaller than that of the diffusion pumps. As the pumped gas in backing pressure. Insensitivity to dust and vapors dissolved in the pump
the neighborhood of the jet under the essentially higher inlet pressure fluid is obtained by a spacious boiler and a large pump fluid reservoir. Large
decisively influences the course of the flow lines, optimum conditions are quantities of impurities can be contained in the boiler without deterioration
obtained only at certain inlet pressures. Therefore, the pumping speed does of the pumping characteristics.
Pumping speed [mbar l s1]
Pumping speed [Torr l s1]
Pumping speed [l s1]

Intake pressure pa Intake pressure pa

Fig. 2.48 Pumping speed of various vapor pumps as a function of intake pressure related to a Fig. 2.49 Pumping speed of various vapor pumps (derived from Fig. 2.48)
nominal pumping speed of 1000 l/s.
End of the working range of oil vapor ejector pumps (A) and diffusion pumps (B)

43
Vacuum generation
2.1.6.3 Pump fluids possible, various measures must be undertaken simultaneously:

a) Oils a) the high vacuum-side nozzle and the shape of the part of the pump
The suitable pump fluids for oil diffusion pumps are mineral oils, silicone body surrounding this nozzle must be constructed so that as few as
oils, and oils based on the polyphenyl ethers. Severe demands are placed possible vapor molecules emerge sideways in the path of the vapor
on such oils which are met only by special fluids. The properties of these, stream from the nozzle exit to the cooled pump wall.
such as vapor pressure, thermal and chemical resistance, particularly
b) the method for cooling the pump wall must allow as complete as
against air, determine the choice of oil to be used in a given type of pump
possible condensation of the pump fluid vapor and, after condensation,
or to attain a given ultimate vacuum. The vapor pressure of the oils used in
the fluid must be able to drain away readily.
vapor pumps is lower than that of mercury. Organic pump fluids are more
sensitive in operation than mercury, because the oils can be decomposed c) one or more pump-fluid traps, baffles, or cold traps must be inserted
by long-term admission of air. Silicone oils, however, withstand longer between the pump and the vessel, depending on the ultimate pressure
lasting frequent admissions of air into the operational pump. that is required.

Typical mineral oils are DIFFELEN light, normal and ultra. The different Two chief requirements must be met in the construction of baffles or cold
types of DIFFELEN are close tolerance fractions of a high quality base traps for oil diffusion pumps. First, as far as possible, all backstreaming
product (see our catalog). pump-fluid vapor molecules should remain attached to (condensed at) the
inner cooled surfaces of these devices. Second, the condensation surfaces
Silicone oils (DC 704, DC 705, for example) are uniform chemical
must be so constructed and geometrically arranged that the flow
compounds (organic polymers). They are highly resistant to oxidation in the
conductance of the baffles or cold traps is as large as possible for the
case of air inrushes and offer special thermal stability characteristics.
pumped gas. These two requirements are summarized by the term
DC 705 has an extremely low vapor pressure and is thus suited for use in optically opaque. This means that the particles cannot enter the baffle
diffusion pumps which are used to attain extremely low ultimate pressures without hitting the wall, although the baffle has a high conductance. The
of < 10-10 mbar. implementation of this idea has resulted in a variety of designs that take
into account one or the other requirement.
ULTRALEN is a polyphenylether. This fluid is recommended in all those
cases where a particularly oxidation-resistant pump fluid must be used and A cold cap baffle is constructed so that it can be mounted immediately
where silicone oils would interfere with the process. above the high vacuum nozzle. The cold cap baffle is made of metal of high
thermal conductivity in good thermal contact with the cooled pump wall, so
APIEZON AP 201 is an oil of exceptional thermal and chemical resistance
that in practice it is maintained at the cooling-water temperature or, with air-
capable of delivering the required high pumping speed in connection with
cooled diffusion pumps, at ambient temperature. In larger types of pumps,
oil vapor ejector pumps operating in the medium vacuum range. The
the cold cap baffle is water cooled and permanently attached to the pump
attainable ultimate total pressure amounts to about 10-4 mbar.
body. The effective pumping speed of a diffusion pump is reduced by about
10 % on installation of the cold cap baffle, but the oil backstreaming is
b) Mercury reduced by about 90 to 95 %.
Mercury is a very suitable pump fluid. It is a chemical element that during
vaporization neither decomposes nor becomes strongly oxidized when air Shell baffles consist of concentrically arranged shells and a central baffle
is admitted. However, at room temperature it has a comparatively high plate. With appropriate cooling by water or refrigeration, almost entirely oil
vapor pressure of 10-3 mbar. If lower ultimate total pressures are to be vapor-free vacua can be produced by this means. The effective pumping
reached, cold traps with liquid nitrogen are needed. With their aid, ultimate speed of the diffusion pump remains at least at 50 %, although shell baffles
total pressures of 10-10 mbar can be obtained with mercury diffusion are optically opaque. This type of baffle has been developed by LEYBOLD
pumps. Because mercury is toxic, as already mentioned, and because it in two different forms: with a stainless-steel cooling coil or in the so-called
presents a hazard to the environment, it is nowadays hardly ever used as a Astrotorus baffles with cooling inserts of copper. The casing of the former
pump fluid. LEYBOLD supplies pumps with mercury as the pump fluid only type is made entirely of stainless steel.
on request. The vapor pressure curves of pump fluids are given in Fig. For the smaller air-cooled, oil diffusion pumps, plate baffles are used. The
9.12, Section 9. air-cooled arrangement consists of a copper plate with copper webs to the
housing wall. The temperature of the plate baffle remains nearly ambient
during the operation of the diffusion pump.
2.1.6.4 Pump fluid backstreaming and its suppression
(vapor barriers, baffles) Hydrocarbon-free vacuum
In the vapor stream from the topmost nozzle of a diffusion pump, pump If extreme demands are made on freedom from oil vapor with vacuum
fluid molecules not only travel in the direction of streaming to the cooled produced by oil diffusion pumps, cold traps should be used that are cooled
pump wall, but also have backward components of velocity because of with liquid nitrogen so that they are maintained at a temperature
intermolecular collisions. They can thus stream in the direction of the of - 196 C.
vessel. In the case of LEYBODIFF and DI pumps, the oil-backstreaming Low-temperature baffles or cold traps should always be used with a cold
amounts to a few micrograms per minute for each square centimeter of cap in place. On this the greatest part of the backstreaming oil is
inlet cross-sectional area. To reduce this backstreaming as much as

44
 Vacuum generation
few highly volatile components of the pump fluid that do not remain
attached to the very low temperature surfaces. The temperature and the
vapor molecules adsorbed at the surface of the vessel determine exactly
the pressure in the vessel. If, the surfaces are not fully covered with
adsorbed pump-fluid molecules after a bake-out process, their vapor
pressure contributes only insignificantly to the pressure in the vessel.

After a certain time, the stay-down time, a continuous layer of oil

molecules builds up, and the ultimate pressure is practically determined by
the vapor pressure of the pump fluid at the temperature of the vessel walls.
This stay-down time can even amount to several hours, indeed even to
days, with the use of low-temperature baffles.

Oil can reach the vessel not only as vapor, but also as a liquid film,
because oil wets readily and thus creeps up the wall.

By installation of an anticreep barrier (see Fig. 2.50) made of Teflon

polymer, a material that is not wetted by oil and can stand a bake-out
temperature up to 200 C, further creeping of the oil can be effectively
prevented. It is most appropriate to arrange the anticreep barrier above the
upper baffle (see Fig. 2.50).

Note:
It must be noted that data on backstreaming as specified in catalogs apply
only to continuously-operated oil diffusion pumps. Shortly after starting a
pump the uppermost nozzle will not eject a well directed vapor jet. Instead
oil vapor spreads in all directions for several seconds and the
1 Diffusion pump 4 Sealing gasket backstreaming effect is strong. When switching a diffusion pump on and off
with cold cap baffle (cooled 5 Bearing ring
by contact), 6 LN2 cold trap,
frequently the degree of oil brackstreaming will be greater.
2 Shell or chevron baffle 7 Vacuum chamber
3 Anticreep barrier

Fig. 2.50 Schematic arrangement of baffle, anticreep barrier and cold trap above a diffusion
2.1.6.5 Water jet pumps and steam ejectors
pump
Included in the class of fluid-entrainment pumps are not only pumps that
condensed, so that the inevitable loss of pump fluid from the condensation use a fast-streaming vapor as the pump fluid, but also liquid jet pumps. The
of the pump fluid on the low-temperature surface is kept at a minimum. simplest and cheapest vacuum pumps are water jet pumps. As in a vapor
With longer-term operation it is always advisable to install, in place of the pump (see Fig. 2.46 or 2.51), the liquid stream is first released from a
cold cap, a water-cooled shell or chevron baffle between the diffusion pump nozzle and then, because of turbulence, mixes with the pumped gas in the
and the low-temperature baffle or cold trap (see Fig. 2.50). mixing chamber. Finally, the movement of the water gas mixture is slowed
down in a Venturi tube. The ultimate total pressure in a container that is
LEYBOLD manufactures cold traps made of metal so called LN2 cold
pumped by a water jet pump is determined by the vapor pressure of the
traps. These cold traps are to be used in those cases where a cold trap is
water and, for example, at a water temperature of 15 C amounts to about
to be operated for prolonged periods of time without requiring a filling facility
17 mbar.
for liquid nitrogen. The temperature increase at the vessel containing the
refrigerant is so slight over the operating time that as the liquid level Essentially higher pumping speeds and lower ultimate pressures are
drops no significant desorption of the condensate takes place. Located on produced by steam ejector pumps. The section through one stage is
the pumping side is an impact panel made of copper. The low temperature shown in Fig. 2.51. The markings correspond with those shown in Fig. 2.46.
of this panel ensures that the greater part of the condensed pump fluid In practice, several pumping stages are usually mounted in cascade. For
remains in the liquid state and may drip back into the pump. Today the oils laboratory work, two-stage pump combinations are suitable and consist of a
used to operate diffusion pumps have a very low vapor pressure at room steam ejector stage and a water jet (backing) stage, both made of glass.
temperature (for example DIFFELEN light, 2 10-8 mbar; The water jet backing stage enables operation without other backing
DC 705, 4 10-10 mbar). The specified provisions with a liquid-nitrogen- pumps. With the help of a vapor stream at overpressure, the vacuum
cooled baffle or cold trap would enable an absolutely oil-free vacuum to be chamber can be evacuated to an ultimate pressure of about 3 mbar. The
produced. condensate from the steam is led off through the drain attachment. The
water jet stage of this pump is cooled with water to increase its efficiency.
In practice, however, complete suppression of oil-backstreaming is never
Steam ejector pumps are especially suitable for work in laboratories,
attained. There are always a few pump-fluid molecules that, as a result of
particularly if very aggressive vapors are to be pumped. Steam ejector
collisions with one another, reach the vessel without having hit one of the
pumps, which will operate at a pressure of a few millibars, are especially
cooled surfaces of the baffle or the cold trap. Moreover, there are always a
recommended for pumping laboratory distillation apparatus and similar

45
Vacuum generation
rotor blades reaches the order of magnitude of the average thermal velocity
of the molecules which are to be pumped. Kinetic gas theory supplies for -c
othe equation 1.17:

8 R T
c=
M

in which the dependency on the type of gas as a function of molar mass M

is contained. The calculation involving cgs-units (where R = 83.14 106
mbar cm3 / mol K) results in the following Table:

Gas Molar Mean thermal

Mass M velocity (m/s)
H2 2 1761
He 4 1245
H2O 18 587
Ne 20 557
CO 28 471
N2 28 471
Air 28.96 463
O2 32 440
Ar 40 394
CO2 44 375
CC13F (F11) 134.78 68
1 Steam inlet 4 Mixing region -c as a function of molar mass M
2 Jet nozzle 5 Connection to the vac- Table 2.4
3 Diffuser uum chamber
Whereas _the dependence
__ of the pumping speed on the type of gas is fairly
Fig. 2.51 Schematic representation of the operation of a steam ejector pump low (S ~ c ~ 1 / M ), the dependence of the compression k0 at zero
throughput and thus also__the compression k, because
plants when the pressure from a simple water jet pump is insufficient. In
of k0 ~ eM log k0 ~ M, is greater as shown by the experimentally-
this instance, the use of rotary pumps would not be economical.
determined relationship in Fig. 2.55.
Even in spite of their low investment costs water jet pumps and steam
Example:
ejectors are being replaced in the laboratories more and more by
diaphragm pumps because of the environmental problems of using water from theory it follows that
as the pump fluid. Solvent entering the water can only be removed again log k0(He) 4 1 1
through complex cleaning methods (distillation). = = =
log k0(N2) 28 7 2.65
log k0(N 2) = 2.65 log k0(He)

2.1.7 Turbomolecular pumps

this with k0 (He) = 3 103 from Fig. 2.55 results in:
The principle of the molecular pump well known since 1913 is that the
gas particles to be pumped receive, through impact with the rapidly moving log k0 (N2) = 2.65 log (3 103) = 9.21
surfaces of a rotor, an impulse in a required flow direction. The surfaces of
or k0 (N2) = 1.6 109.
the rotor usually disk-shaped form, with the stationary surfaces of a
stator, intervening spaces in which the gas is transported to the backing This agrees as expected well (order of magnitude) with the
port. In the original Gaede molecular pump and its modifications, the experimentally determined value for k0 (N2) = 2.0 108 from Fig. 2.55. In
intervening spaces (transport channels) were very narrow, which led to view of the optimizations for the individual rotor stages common today, this
constructional difficulties and a high degree of susceptibility to mechanical consideration is no longer correct for the entire pump. Shown in Fig. 2.56
contamination. are the values as measured for a modern TURBOVAC 340 M.
At the end of the Fifties, it became possible through a turbine-like design In order to meet the condition,_ a circumferential velocity for the rotor of the
and by modification of the ideas of Gaede to produce a technically viable same order of magnitude as c high rotor speeds are required for
pump the socalled turbomolecular pump. The spaces between the turbomolecular pumps. They range from about 36,000 rpm for pumps
stator and the rotor disks were made in the order of millimeters, so that having a large diameter rotor (TURBOVAC 1000) to 72,000 rpm in the case
essentially larger tolerances could be obtained. Thereby, greater security in of smaller rotor diameters (TURBOVAC 35 / 55). Such high speeds
operation was achieved. However, a pumping effect of any significance is naturally raise questions as to a reliable bearing concept. LEYBOLD offers
only attained when the circumferential velocity (at the outside rim) of the three concepts, the advantages and disadvantages of which are detailed in

46
 Vacuum generation
the following: electronics and the use of permanent magnets (passive magnetic
suspension) based on the System KFA Jlich permitted the magnetic
Oil lubrication / steel ball bearings
suspension concept to spread widely. In this system the rotor is maintained
+ Good compatibility with particles by circulating oil lubricant
in a stable position without contact during operation, by magnetic forces.
- Can only be installed vertically
Absolutely no lubricants are required. So-called touch down bearings are
+ Low maintenance
integrated for shutdown.
Grease lubrication / hybrid bearings
Fig. 2.52 shows a sectional drawing of a typical turbomolecular pump. The
+ Installation in any orientation
pump is an axial flow compressor of vertical design, the active or pumping
+ Suited for mobile systems
part of which consists of a rotor (6) and a stator (2). Turbine blades are
Air cooling will do for many applications
located around the circumferences of the stator and the rotor. Each rotor
+ Lubricated for life (of the bearings)
stator pair of circular blade rows forms one stage, so that the assembly is
Free of lubricants / magnetic suspension composed of a multitude of stages mounted in series. The gas to be
+ No wear pumped arrives directly through the aperture of the inlet flange (1), that is,
+ No maintenance without any loss of conductance, at the active pumping area of the top
+ Absolutely free of hydrocarbons blades of the rotor stator assembly. This is equipped with blades of
+ Low noise and vibration levels especially large radial span to allow a large annular inlet area. The gas
+ Installation in any orientation captured by these stages is transferred to the lower compression stages,
whose blades have shorter radial spans, where the gas is compressed to
Steel ball bearings / hybrid ball bearings (ceramic ball bearings): Even
backing pressure or rough vacuum pressure. The turbine rotor (6) is
a brief tear in the thin lubricating film between the balls and the races can
mounted on the drive shaft, which is supported by two precision ball
if the same type of material is used result in microwelding at the points
bearings (8 and 11), accommodated in the motor housing. The rotor shaft is
of contact. This severely reduces the service life of the bearings. By using
directly driven by a medium-frequency motor housed in the forevacuum
dissimilar materials in so called hybrid bearings (races: steel, balls:
space within the rotor, so that no rotary shaft lead-through to the outside
ceramics) the effect of microwelding is avoided.
atmosphere is necessary. This motor is powered and automatically
The most elegant bearing concept is that of the magnetic suspension. As controlled by an external frequency converter, normally a solid-state
early as 1976 LEYBOLD delivered magnetically suspended turbomolecular frequency converter that ensures a very low noise level. For special
pumps the legendary series 550M and 560M. At that time a purely active applications, for example, in areas exposed to radiation, motor generator
magnetic suspension (i.e. with electromagnets) was used. Advances in - frequency converters are used.

Turbomolecular
pump stage
3

Siegbahn stage
5

8
1

1 High vacuum inlet flange 5 Splinter guard 9 Cooling water connection

2 Stator pack 6 Rotor 10 3-phase motor 1 Vacuum port 4 Stator 7 Fan
3 Venting flange 7 Pump casing 11 Ball bearings 2 High vacuum flange 5 Bearing 8 Bearing
4 Forevacuum flange 8 Ball bearings 3 Rotor 6 Motor

Fig. 2.52 Schematic diagram of a grease lubricated TURBOVAC 151 turbomolecular pump Fig. 2.52a Cross section of a HY.CONE turbomolecular pump

47
Vacuum generation
10000
l s1 l s1

600 1000/1000 MC
1000
500
S
200 340M 361
151
100
50/55

10 2 4 6 8
6 5 4 3 2 1
10 10 10 p 10 10 mbar 10

Fig. 2.53 Pumping speed for air of different turbomolecular pumps Fig. 2.54 Pumping speed curves of a TURBOVAC 600 for H2, He, N2 and Ar

The vertical rotor stator configuration provides optimum flow conditions of component at the forevacuum flange of the pump and that at the high vacu-
the gas at the inlet. um flange: maximum compression k0 is to be found at zero throughput. For
physical reasons, the compression ratio of turbomolecular pumps is very
To ensure vibration-free running at high rotational speeds, the turbine is
high for heavy molecules but considerably lower for light molecules. The
dynamically balanced at two levels during its assembly.
relationship between compression and molecular mass is shown in Fig.
The pumping speed (volume flow rate) characteristics of turbomolecular 2.55. Shown in Fig. 2.56 are the compression curves of a TURBOVAC 340
pumps are shown in Fig. 2.53. The pumping speed remains constant over M for N2, He and H2 as a function of the backing pressure. Because of the
the entire working pressure range. It decreases at intake pressures above high compression ratio for heavy hydrocarbon molecules, turbomolecular
10-3 mbar, as this threshold value marks the transition from the region of pumps can be directly connected to a vacuum chamber without the aid of
molecular flow to the region of laminar viscous flow of gases. Fig. 2.54 one or more cooled baffles or traps and without the risk of a measurable
shows also that the pumping speed depends on the type of gas. partial pressure for hydrocarbons in the vacuum chamber (hydrocarbon-free
vacuum! see also Fig. 2.57: residual gas spectrum above a TURBOVAC
The compression ratio (often also simply termed compression) of
361). As the hydrogen partial pressure attained by the rotary backing pump
turbomolecular pumps is the ratio between the partial pressure of one gas

k0

Fig. 2.55 TURBOVAC 450 Maximum compression k0 as a function of molar mass M Fig. 2.56 Maximum compression k0 of a turbomolecular pump TURBOVAC 340 M for H2, He
and N2 as a function of backing pressure

48
 Vacuum generation

M = Mass number = Relative molar mass at an ionization 1

I = Ion current

Fig. 2.57 Spectrum above a TURBOVAC 361 Fig. 2.58 Determination of the cut-in pressure for turbomolecular pumps when evacuating large

is very low, the turbomolecular pump is capable of attaining ultimate Information on the operation of turbomolecular pumps
pressures in the 10-11 mbar range in spite of its rather moderate Starting
compression for H2. To produce such extremely low pressures, it will, of As a rule turbomolecular pumps should generally be started together with
course, be necessary to strictly observe the general rules of UHV the backing pump in order to reduce any backstreaming of oil from the
technology: the vacuum chamber and the upper part of the turbomolecular backing pump into the vacuum chamber. A delayed start of the
pump must be baked out, and metal seals must be used. At very low turbomolecular pump, makes sense in the case of rather small backing
pressures the residual gas is composed mainly of H2 originating from the pump sets and large vacuum chambers. At a known pumping speed for the
metal walls of the chamber. The spectrum in Fig. 2.57 shows the residual backing pump SV (m3/h) and a known volume for the vacuum chamber (m3)
gas composition in front of the inlet of a turbomolecular pump at an it is possible to estimate the cut-in pressure for the turbomolecular pump:
ultimate pressure of 7 10-10 mbar nitrogen equivalent. It appears that the
Simultaneous start when
portion of H2 in the total quantity of gas amounts to approximately 90 to 95
% . The fraction of heavier molecules is considerably reduced and masses Sv
> 40 h1
greater than 44 were not detected. An important criterion in the assessment V
of the quality of a residual gas spectrum are the measurable hydrocarbons
from the lubricants used in the vacuum pump system. Of course an and delayed start when
absolutely hydrocarbon-free vacuum can only be produced with pump Sv
< 40 h1
systems which are free of lubricants, i.e. for example with magnetically- V
suspended turbomolecular pumps and dry compressing backing pumps.
When operated correctly (venting at any kind of standstill) no hydrocarbons at a cut-in pressure of:
are detectable also in the spectrum of normal turbomolecular pumps. SV

pV, Start = e 6 V mbar (2.24)
A further development of the turbomolecular pump is the hybrid or
compound turbomolecular pump. This is actually two pumps on a common
shaft in a single casing. The high vacuum stage for the molecular flow When evacuating larger volumes the cut-in pressure for turbomolecular
region is a classic turbomolecular pump, the second pump for the viscous pumps may also be determined with the aid of the diagram of Fig. 2.58.
flow range is a molecular drag or friction pump. Venting
LEYBOLD manufactures pumps such as the TURBOVAC 55 with an After switching off or in the event of a power failure, turbomolecular
integrated Holweck stage (screw-type compressor) and, for example, the pumps should always be vented in order to prevent any backdiffusion of
HY.CONE 60 or HY.CONE 200 with an integrated Siegbahn stage (spiral hydrocarbons from the forevacuum side into the vacuum chamber. After
compressor). The required backing pressure then amounts to a few mbar switching off the pump the cooling water supply should also be switched off
so that the backing pump is only required to compress from about 5 to 10 to prevent the possible condensation of water vapor. In order to protect the
mbar to atmospheric pressure. A sectional view of a HY.CONE is shown in rotor it is recommended to comply with the (minimum) venting times stated
Fig. 2.52a. in the operating instructions. The pump should be vented (except in the
case of operation with a barrier gas) via the venting flange which already
contains a sintered metal throttle, so that venting may be performed using a
normal valve or a power failure venting valve.

49
Vacuum generation
Barrier gas operation
In the case of pumps equipped with a barrier gas facility, inert gas such
as dry nitrogen may be applied through a special flange so as to protect
the motor space and the bearings against aggressive media. A special
barrier gas and venting valve meters the necessary quantity of barrier gas
and may also serve as a venting valve.

Decoupling of vibrations
TURBOVAC pumps are precisely balanced and may generally be
connected directly to the apparatus. Only in the case of highly sensitive
instruments, such as electron microscopes, is it recommended to install
vibration absorbers which reduce the present vibrations to a minimum. For
magnetically suspended pumps a direct connection to the vacuum
apparatus will usually do because of the extremely low vibrations produced
by such pumps.

For special applications such as operation in strong magnetic fields,

radiation hazard areas or in a tritium atmosphere, please contact our
Technical Sales Department which has the necessary experience and 1 Inlet port 5 Thermal conducting
2 Degassing port vanes
which is available to you at any time. 3 Support 6 Adsorption material
4 Pump body (e.g. Zeolith)

Fig. 2.59 Cross section of an adsorption pump

2.1.8 Sorption pumps
The term sorption pumps includes all arrangements for the removal of 1 m2 . For nitrogen molecules with a relative molecular mass Mr = 28 that
gases and vapors from a space by sorption means. The pumped gas corresponds to about 2 10-4 g or 0.20 mbar l (see also Section 1.1).
particles are thereby bound at the surfaces or in the interior of these Therefore, an adsorption surface of 1000 m2 is capable of adsorbing a
agents, by either physical temperature-dependent adsorption forces (van monomolecular layer in which more than 133 mbar l of gas is bound.
der Waals forces), chemisorption, absorption, or by becoming embedded Hydrogen and light noble gases, such as helium and neon, have a
during the course of the continuous formation of new sorbing surfaces. By relatively small particle diameter compared with the pore size of 13 for
comparing their operating principles, we can distinguish between zeolite 13X. These gases are, therefore, very poorly adsorbed.
adsorption pumps, in which the sorption of gases takes place simply by
temperature-controlled adsorption processes, and getter pumps, in which The adsorption of gases at surfaces is dependent not only on the
the sorption and retention of gases are essentially caused by the formation temperature, but more importantly on the pressure above the adsorption
of chemical compounds. Gettering is the bonding of gases to pure, mostly surface. The dependence is represented graphically for a few gases by the
metallic surfaces, which are not covered by oxide or carbide layers. Such adsorption isotherms given in Fig. 2.60. In practice, adsorption pumps are
surfaces always form during manufacture, installation or while venting the
system. The mostly metallic highest purity getter surfaces are continuously Pressure [Torr]
generated either directly in the vacuum by evaporation (evaporator
pumps) or by sputtering (sputter pumps) or the passivating surface layer
Adsorbed quantity of gas per quantity of adsorbent [mbar l g1]

of the getter (metal) is removed by degassing the vacuum, so that the pure
material is exposed to the vacuum. This step is called activation (NEG
pumps NEG = Non Evaporable Getter).

2.1.8.1 Adsorption pumps

Adsorption pumps (see Fig. 2.59) work according to the principle of the
physical adsorption of gases at the surface of molecular sieves or other
adsorption materials (e.g. activated Al2O3). Zeolite 13X is frequently used
as an adsorption material. This alkali aluminosilicate possesses for a mass
of the material an extraordinarily large surface area, about 1000 m2/g of
solid substance. Correspondingly, its ability to take up gas is considerable. Pressure [mbar]

The pore diameter of zeolite 13X is about 13 , which is within the order of
size of water vapor, oil vapor, and larger gas molecules (about 10 ).
Assuming that the mean molecular diameter is half this value, 5 10-8 cm,
Fig. 2.60 Adsorption isotherms of zeolite 13X for nitrogen at 195 C and 20 C, as well as for
about 5 1018 molecules are adsorbed in a monolayer on a surface of helium and neon at 195 C

50
 Vacuum generation
connected through a valve to the vessel to be evacuated. It is on immersing 2.1.8.3 Sputter-ion pumps
the body of the pump in liquid nitrogen that the sorption effect is made
The pumping action of sputter-ion pumps is based on sorption processes
technically useful. Because of the different adsorption properties, the
that are initiated by ionized gas particles in a Penning discharge (cold
pumping speed and ultimate pressure of an adsorption pump are different
cathode discharge). By means of paralleling many individual Penning cells
for the various gas molecules: the best values are achieved for nitrogen,
the sputter ion pump attains a sufficiently high pumping speed for the
carbon dioxide, water vapor, and hydrocarbon vapors. Light noble gases
individual gases.
are hardly pumped at all because the diameter of the particles is small
compared to the pores of the zeolite. As the sorption effect decreases with
increased coverage of the zeolite surfaces, the pumping speed falls off with Operation of sputter-ion pumps
an increasing number of the particles already adsorbed. The pumping The ions impinge upon the cathode of the cold cathode discharge electrode
speed of an adsorption pump is, therefore, dependent on the quantity of system and sputter the cathode material (titanium). The titanium deposited
gas already pumped and so is not constant with time. at other locations acts as a getter film and adsorbs reactive gas particles
(e.g., nitrogen, oxygen, hydrogen). The energy of the ionized gas particles
The ultimate pressure attainable with adsorption pumps is determined in the is not only high enough to sputter the cathode material but also to let the
first instance by those gases that prevail in the vessel at the beginning of the impinging ions penetrate deeply into the cathode material (ion implantation).
pumping process and are poorly or not at all adsorbed (e.g. neon or helium) This sorption process pumps ions of all types, including ions of gases
at the zeolite surface. In atmospheric air, a few parts per million of these which do not chemically react with the sputtered titanium film, i.e. mainly
gases are present. Therefore, pressures < 10-2 mbar can be obtained. noble gases.
If pressures below 10-3 mbar exclusively are to be produced with adsorption The following arrangement is used to produce the ions: stainless-steel,
pumps, as far as possible no neon or helium should be present in the gas cylindrical anodes are closely arranged between, with their axes
mixture. perpendicular to, two parallel cathodes (see Fig. 2.61). The cathodes are at
After a pumping process, the pump must be warmed only to room negative potential (a few kilovolts) against the anode. The entire electrode
temperature for the adsorbed gases to be given off and the zeolite is system is maintained in a strong, homogeneous magnetic field of a flux
regenerated for reuse. If air (or damp gas) containing a great deal of water density of B = 0.1 T, (T = Tesla = 104 Gauss) produced by a permanent
vapor has been pumped, it is recommended to bake out the pump magnet attached to the outside of the pumps casing. The gas discharge
completely dry for a few hours at 200 C or above. produced by the high tension contains electrons and ions. Under the
influence of the magnetic field the electrons travel along long spiral tracks
To pump out larger vessels, several adsorption pumps are used in parallel (see Fig. 2.61) until they impinge on the anode cylinder of the
or in series. First, the pressure is reduced from atmospheric pressure to a corresponding cell. The long track increases ion yield, which even at low
few millibars by the first stage in order to capture many noble gas gas densities (pressures) is sufficient to maintain a self-sustained gas
molecules of helium and neon. After the pumps of this stage have been discharge. A supply of electrons from a hot cathode is not required.
saturated, the valves to these pumps are closed and a previously closed Because of their great mass, the movement of the ions is unaffected by the
valve to a further adsorption pump still containing clean adsorbent is magnetic field of the given order of magnitude; they flow off along the
opened so that this pump may pump down the vacuum chamber to the next
lower pressure level. This procedure can be continued until the ultimate
pressure cannot be further improved by adding further clean adsorption
pumps.

2.1.8.2 Sublimation pumps

Sublimation pumps are sorption pumps in which a getter material is
evaporated and deposited on a cold inner wall as a getter film. On the
surface of such a getter film the gas molecules form stable compounds,
which have an immeasurably low vapor pressure. The active getter film is
renewed by subsequent evaporations. Generally titanium is used in
sublimation pumps as the getter. The titanium is evaporated from a wire
made of a special alloy of a high titanium content which is heated by an
electric current. Although the optimum sorption capacity (about one nitrogen
PZ
atom for each evaporated titanium atom) can scarcely be obtained in
practice, titanium sublimation pumps have an extraordinarily high pumping
speed for active gases, which, particularly on starting processes or on the
sudden evolution of greater quantities of gas, can be rapidly pumped away. Direction of motion of the ionized gas -- Spiral tracks of the electrons
As sublimation pumps function as auxiliary pumps (boosters) to sputter-ion molecules PZ Penning cells
Direction of motion of the sputtered
pumps and turbomolecular pumps, their installation is often indispensable titanium
(like the boosters in vapor ejector pumps; see Section 2.1.6.2).
Fig. 2.61 Operating principle of a sputter-ion pump

51
Vacuum generation
ions. The getter films form preferentially on the third electrode, the target
plate, which is the actual wall of the pump housing. There is an increasing
yield of ionized particles that are grazingly incident on the cathode grid

Titanium where they are neutralized and reflected and from which they travel to the

atoms
Gas molecules target plate at an energy still considerably higher than the thermal energy
Ions
Electrons
1/2 k T of the gas particles. The energetic neutral particles can penetrate
B Magnetic field into the target surface layer, but their sputtering effect is only negligible.
These buried or implanted particles are finally covered by fresh titanium
layers. As the target is at positive potential, any positive ions arriving there
are repelled and cannot sputter the target layers. Hence the buried noble
gas atoms are not set free again. The pumping speed of triode sputter-
ion pumps for noble gases does not decrease during the operation of
Fig. 2.62 Electrode configuration in a diode sputter-ion pump
the pump.

shortest path and bombard the cathode. The pumping speed of sputter-ion pumps depends on the pressure and the
type of gas. It is measured according to the methods stated in DIN 28 429
The discharge current i is proportional to the number density of neutral
and PNEUROP 5615. The pumping speed curve S(p) has a maximum. The
particles n0, the electron density n-, and the length l of the total discharge
nominal pumping speed Sn is given by the maximum of the pumping speed
path:
curve for air whereby the corresponding pressure must be stated.
i = n 0 n l (2.25)
For air, nitrogen, carbon dioxide and water vapor, the pumping speed is
The effective cross section s for ionizing collisions depends on the type of practically the same. Compared with the pumping speed for air, the
gas. According to (2.25), the discharge current i is a function of the number pumping speeds of sputter-ion pumps for other gases amount to
particle density n0, as in a Penning gauge, and it can be used as a approximately:
measure of the pressure in the range from 10-4 to 10-8 mbar. At lower
Hydrogen 150 to 200 %
pressures the measurements are not reproducible due to interferences
Methane 100 %
from field emission effects.
Other light
In diode-type, sputter-ion pumps, with an electrode system configuration hydrocarbons 80 to 120 %
as shown in Fig. 2.62, the getter films are formed on the anode surfaces Oxygen 80 %
and between the sputtering regions of the opposite cathode. The ions are Argon 30 %
buried in the cathode surfaces. As cathode sputtering proceeds, the buried Helium 28 %
gas particles are set free again. Therefore, the pumping action for noble
Sputter-ion pumps of the triode type excel in contrast to the diode-type
gases that can be pumped only by ion burial will vanish after some time
pumps in high-noble gas stability. Argon is pumped stably even at an inlet
and a memory effect will occur.
pressure of 1 10-5 mbar. The pumps can be started without difficulties at
Unlike diode-type pumps, triode sputter-ion pumps exhibit excellent pressures higher than 1 10-2 mbar and can operate continuously at an air
stability in their pumping speed for noble gases because sputtering and film inlet producing a constant air pressure of 5 10-5 mbar. A new kind of
forming surfaces are separated. Fig. 2.63 shows the electrode configuration design for the electrodes extends the service life of the cathodes by 50 %.
of triode sputter-ion pumps. Their greater efficiency for pumping noble
Influence on processes in the vacuum chamber by magnetic stray
gases is explained as follows: the geometry of the system favors grazing
fields and stray ions from the sputter-ion pump.
incidence of the ions on the titanium bars of the cathode grid, whereby the
The high-magnetic-field strength required for the pumping action leads
sputtering rate is considerably higher than with perpendicular incidence.
inevitably to stray magnetic fields in the neighborhood of the magnets. As a
The sputtered titanium moves in about the same direction as the incident
result, processes in the vacuum chamber can be disturbed in some cases,
Titanium atoms
Gas molecules
so the sputter-ion pump concerned should be provided with a screening
Ions arrangement. The forms and kinds of such a screening arrangement can be

Electrons regarded as at an optimum if the processes taking place in the vacuum

A Anode cylinder
(same as in the diode chamber are disturbed by no more than the earths magnetic field which is
pump) present in any case.
B Magnetic field
F Target plate
(pump housing)
Fig. 2.64 shows the magnetic stray field at the plane of the intake flange of
as the third electrode a sputter-ion pump IZ 270 and also at a parallel plane 150 mm above. If
K Cathode grid
stray ions from the discharge region are to be prevented from reaching the
vacuum chamber, a suitable screen can be set up by a metal sieve at
opposite potential in the inlet opening of the sputter-ion pump (ion barrier).
This, however, reduces the pumping speed of the sputter-ion pump
depending on the mesh size of the selected metal sieve.
Fig. 2.63 Electrode configuration in a triode sputter-ion pump

52
 Vacuum generation
since hydrogen contributes mostly to the ultimate pressure in an UHV
system, and for which NEG pumps have a particularly high pumping speed,
whereas the pumping effect for H2 of other pumps is low. Some typical
examples for applications in which NEG pumps are used are particle
accelerators and similar research systems, surface analysis instruments,
SEM columns and sputtering systems. NEG pumps are manufactured
offering pumping speeds of several `/s to about 1000 l/s. Custom pumps
are capable of attaining a pumping speed for hydrogen which is by several
orders of magnitude higher.

Fig. 2.64 Stray magnetic field of a sputter-ion pump in two places parallel to the inlet flange
(inserts) curves show lines of constant magnetic induction B in Gauss.1 Gauss = 1
104 Tesla

2.1.8.4 Non evaporable getter pumps (NEG Pumps)

The non evaporable getter pump operates with a non evaporable, compact
getter material, the structure of which is porous at the atomic level so that it
can take up large quantities of gas. The gas molecules adsorbed on the
surface of the getter material diffuse rapidly inside the material thereby
making place for further gas molecules impinging on the surface. The non
evaporable getter pump contains a heating element which is used to heat
the getter material to an optimum temperature depending on the type of gas
which is preferably to be pumped. At a higher temperature the getter
material which has been saturated with the gas is regenerated (activated).
As the getter material, mostly zirconium-aluminum alloys are used in the
form of strips. The special properties of NEG pumps are:

constant pumping speed in the HV and UHV ranges

no pressure restrictions up to about 12 mbar

particularly high pumping speed for hydrogen and its isotopes

after activation the pump can often operate at room temperature and will
then need no electrical energy

no interference by magnetic fields

hydrocarbon-free vacuum
free of vibrations

low weight

NEG pumps are mostly used in combination with other UHV pumps
(turbomolecular and cryopumps). Such combinations are especially useful
when wanting to further reduce the ultimate pressure of UHV systems,

53
Vacuum generation
2.1.9 Cryopumps Gifford-McMahon process
Stirling process
As you may have observed water condenses on cold water mains or Brayton process
windows and ice forms on the evaporator unit in your refrigerator. This Claude process
effect of condensation of gases and vapors on cold surfaces, water vapor in
particular, as it is known in every day life, occurs not only at atmospheric The Gifford-McMahon process is mostly used today and this process is that
pressure but also in vacuum. which has been developed furthest. It offers the possibility of separating the
locations for the large compressor unit and the expansion unit in which the
This effect has been utilized for a long time in condensers (see 2.1.5) refrigeration process takes place. Thus a compact and low vibration cold
mainly in connection with chemical processes; previously the baffle on source can be designed. The cryopumps series-manufactured by
diffusion pumps used to be cooled with refrigerating machines. Also in a LEYBOLD operate with two-stage cold heads according to the Gifford-
sealed space (vacuum chamber) the formation of condensate on a cold McMahon process which is discussed in detail in the following.
surface means that a large number of gas molecules are removed from the
volume: they remain located on the cold surface and do not take part any The entire scope of a refrigerator cryopump is shown in Fig. 2.65 and
longer in the hectic gas atmosphere within the vacuum chamber. We then consists of the compressor unit (1) which is linked via flexible pressure lines
say that the particles have been pumped and talk of cryopumps when the (2) and thus vibration-free to the cryopump (3). The cryopump itself
pumping effect is attained by means of cold surfaces. consists of the pump casing and the cold head within. Helium is used as
the refrigerant which circulates in a closed cycle with the aid of the
Cryo engineering differs from refrigeration engineering in that the compressor.
temperatures involved in cryo engineering are in the range below 120 K
(< -153 C). Here we are dealing with two questions:

a) What cooling principle is used in cryo engineering or in cryopumps and

how is the thermal load of the cold surface lead away or reduced?

b) What are the operating principles of the cryopumps?

2.1.9.1 Types of cryopump

Depending on the cooling principle a difference is made between

Bath cryostats

Continuous flow cryopumps

Refrigerator cryopumps

In the case of bath cryostats in the most simple case a cold trap filled
with LN2 (liquid nitrogen) the pumping surface is cooled by direct contact 1
with a liquefied gas. On a surface cooled with LN2 (T 77 K) H2O and CO2 3
are able to condense. On a surface cooled to 10 K all gases except He
2
and Ne may be pumped by way of condensation. A surface cooled with
liquid helium (T 4.2 K) is capable of condensing all gases except helium.

In continuous flow cryopumps the cold surface is designed to operate as

a heat exchanger. Liquid helium in sufficient quantity is pumped by an
auxiliary pump from a reservoir into the evaporator in order to attain a
sufficiently low temperature at the cold surface (cryopanel).

The liquid helium evaporates in the heat exchanger and thus cools down
the cryopanel. The waste gas which is generated (He) is used in a second
heat exchanger to cool the baffle of a thermal radiation shield which
protects the system from thermal radiation coming from the outside. The
cold helium exhaust gas ejected by the helium pump is supplied to a helium
recovery unit. The temperature at the cryopanels can be controlled by
controlling the helium flow.

Today refrigerator cryopumps are being used almost exclusively (cold

upon demand). These pumps operate basically much in the same way as a 1 Compressor unit 3 Cold head (without
common household refrigerator, whereby the following thermodynamic 2 Flexible pressure lines condensation surfaces)
cycles using helium as the refrigerant may be employed: Fig. 2.65 All items of a refrigerator cryopump

54
 Vacuum generation
2.1.9.2 The cold head and its operating principle displacer. The regenerator is a heat accumulator having a large heat
(Fig. 2.66) exchanging surface and capacity, which operates as a heat exchanger
within the cycle. Outlined in Fig. 2.66 are the four phases of refrigeration in
Within the cold head, a cylinder is divided into two working spaces V1 and a single-stage refrigerator cold head operating according to the Gifford-
V2 by a displacer. During operation the right space V1 is warm and the left McMahon principle.
space V2 is cold. At a displacer frequency f the refrigerating power W of the
refrigerator is: The two-stage cold head
The series-manufactured refrigerator cryopumps from LEYBOLD use a two-
W = (V2,max V2,min) (pH pN) f (2.26) stage cold head operating according to the Gifford-McMahon principle (see
The displacer is moved to and fro pneumatically so that the gas is forced Fig. 2.67). In two series connected stages the temperature of the helium is
through the displacer and thus through the regenerator located inside the reduced to about 30 K in the first stage and further to about 10 K in the

V2 (cold) V1 (warm) Phase 1:

The displacer is at the left dead center; V2

where the cold is produced has its minimum
size. Valve N remains closed, H is opened. Gas
at the pressure pH flows through the regenera-
Regenerator Displacer tor into V2. There the gas warms up by the
pressure increase in V1.

V2 (cold) V1 (warm) Phase 2:

Valve H remains open, valve N closed: the dis-

placer moves to the right and ejects the gas
from V1 through the regenerator to V2 where it
cools down at the cold regenerator.; V2 has its
maximum volume.
Regenerator Displacer

V2 (cold) V1 (warm)
Phase 3:

Valve H is closed and the valve N to the low

pressure reservoir is opened. The gas expands
from pH to pN and thereby cools down. This
removes heat from the vicinity and it is trans-
Regenerator Displacer
ported with the expanding gas to the compres-
sor.

V2 (cold) V1 (warm)
Phase 4:

With valve N open the displacer moves to the

left; the gas from V2,max flows through the
regenerator, cooling it down and then flows into
Regenerator Displacer
the volume V1 and into the low pressure reser-
voir. This completes the cycle.

Fig. 2.66 Refrigerating phases using a single-stage cold head operating according to the Gifford-McMahon process

55
Vacuum generation

1 High vacuum flange 9 1st stage of the cold head

2 Pump casing ( 5080 K)
3 Forevacuum flange 10 Gauge for the hydrogen vapor pres-
4 Safety valve for gas discharge sure thermometer
5 Thermal radiation shield 11 Helium gas connections
1 Electric connections and current 11 Regenerator, 2nd stage
6 Baffle 12 Motor of the cold head with casing
feedthrough for the motor in the cold 12 Expansion volume, 2nd stage
7 2nd stage of the cold head (10 K); and electric connections
head 13 2nd (cooling) stage
8 Cryopanels
2 He high pressure connection (copper flange)
3 He low pressure connection 14 Measurement chamber for the
4 Cylinder, 1st stage vapor pressure Fig. 2.68 Design of a refrigerator cryopump (schematic)
5 Displacer, 1st stage 15 Control piston
6 Regenerator, 1st stage 16 Control volume
7 Expansion volume, 1st stage 17 Control disk
8 1st (cooling) stage 18 Control valve inside and polished as well as nickel plated on the outside. Under no-load
(copper flange) 19 Gauge for the hydrogen vapor pres-
9 Cylinder, 2nd stage sure thermometer conditions the baffle and the thermal radiation shield (first stage) attain a
10 Displacer, 2nd stage 20 Motor in the cold head temperature ranging between 50 to 80 K at the cryopanels and about 10 K
at the second stage. The surface temperatures of these cryopanels are
Fig. 2.67 Two-stage cold head
decisive to the actual pumping process. These surface temperatures
second stage. The attainable low temperatures depend among other things depend on the refrigerating power supplied by the cold head, and the
on the type of regenerator. Commonly copperbronze is used in the thermal conduction properties in the direction of the pumps casing. During
regenerator of the first stage and lead in the second stage. Other materials operation of the cryopump, loading caused by the gas and the heat of
are available as regenerators for special applications like cryostats for condensation results in further warming of the cryopanels. The surface
extremely low temperatures (T < 10 K). The design of a two-stage cold temperature does not only depend on the temperature of the cryopanel, but
head is shown schematically in Fig. 2.67. By means of a control also on the temperature of the gas which has already been frozen on to the
mechanism with a motor driven control valve (18) with control disk (17) and cryopanel. The cryopanels (8) attached to the second stage (7) of the cold
control holes first the pressure in the control volume (16) is changed which head are coated with activated charcoal on the inside in order to be able to
causes the displacers (6) of the first stage and the second stage (11) to pump gases which do not easily condense and which can only be pumped
move; immediately thereafter the pressure in the entire volume of the by cryosorption (see 2.1.9.4).
cylinder is equalized by the control mechanism. The cold head is linked via
flexible pressure lines to the compressor.
2.1.9.4 Bonding of gases to cold surfaces
The thermal conductivity of the condensed (solid) gases depends very
2.1.9.3 The refrigerator cryopump much on their structure and thus on the way in which the condensate is
Fig. 2.68 shows the design of a cryopump. It is cooled by a two-stage cold produced. Variations in thermal conductivity over several orders of
head. The thermal radiation shield (5) with the baffle (6) is closely linked magnitude are possible! As the condensate increases in thickness, thermal
thermally to the first stage (9) of the cold head. For pressures below resistance and thus the surface temperature increase subsequently
10-3 mbar the thermal load is caused mostly by thermal radiation. For this reducing the pumping speed. The maximum pumping speed of a newly
reason the second stage (7) with the condensation and cryosorption panels regenerated pump is stated as its nominal pumping speed. The bonding
(8) is surrounded by the thermal radiation shield (5) which is black on the process for the various gases in the cryopump is performed in three steps:
first the mixture of different gases and vapors meets the baffle which is at

56
 Vacuum generation
a temperature of about 80 K. Here mostly H2O and CO2 are condensed.
The remaining gases penetrate the baffle and impinge in the outside of the
cryopanel of the second stage which is cooled to about 10 K. Here gases
like N2, O2 or Ar will condense. Only H2, He and Ne will remain. These
gases can not be pumped by the cryopanels and these pass after several
impacts with the thermal radiation shield to the inside of these panels which
are coated with an adsorbent (cryosorption panels) where they are bonded
by cryosorption. Thus for the purpose of considering a cryopump the gases
are divided into three groups depending at which temperatures within the
cryopump their partial pressure drops below 10-9 mbar:
Hydrogen Water vapor Nitrogen
Area related conductance of the intake flange in l / s cm2:
1st group: 43.9 14.7 11.8
ps < 10-9 mbar at T 77K (LN2): H2O, CO2 Area related pumping speed of the cryopump in l / s cm2:
13.2 14.6 7.1
2nd group: Ratio between pumping speed and conductance:
ps < 10-9 mbar at T 20K: N2, O2, Ar 30 % 99 % 60 %
3rd group:
Fig. 2.69 Cryopanels temperature and position define the efficiency in the cryopump
ps < 10-9 mbar at T < 4.2K: H2, He, Ne

A difference is made between the different bonding mechanisms as follows: measured for water vapor corresponds almost exactly to the theoretical
pumping speed calculated for the intake flange of the cryopump. N2 on the
Cryocondensation is the physical and reversible bonding of gas molecules
other hand must first overcome the baffle before it can be bonded on to the
through Van der Waals forces on sufficiently cold surfaces of the same
cryocondensation panel. Depending on the design of the baffle, 30 to 50
material. The bond energy is equal to the energy of vaporization of the solid
percent of all N2 molecules are reflected.
gas bonded to the surface and thus decreases as the thickness of the
condensate increases as does the vapor pressure. Cryosorption is the H2 arrives at the cryosorption panels after further collisions and thus cooling
physical and reversible bonding of gas molecules through Van der Waals of the gas. In the case of optimally designed cryopanels and a good contact
forces on sufficiently cold surfaces of other materials. The bond energy is with the active charcoal up to 50 percent of the H2 which has overcome the
equal to the heat of adsorption which is greater than the heat of baffle can be bonded. Due to the restrictions regarding access to the
vaporization. As soon as a monolayer has been formed, the following pumping surfaces and cooling of the gas by collisions with the walls inside
molecules impinge on a surface of the same kind (sorbent) and the process the pump before the gas reaches the pumping surface, the measured
transforms into cryocondensation. The higher bond energy for pumping speed for these two gases amounts only to a fraction of the
cryocondensation prevents the further growth of the condensate layer theoretical pumping speed. The part which is not pumped is reflected
thereby restricting the capacity for the adsorbed gases. However, the chiefly by the baffle. Moreover, the adsorption probability for H2 differs
adsorbents used, like activated charcoal, silica gel, alumina gel and between the various adsorbents and is < 1, whereas the probabilities for
molecular sieve, have a porous structure with very large specific surface the condensation of water vapor and N2 1.
areas of about 106 m2/kg. Cryotrapping is understood as the inclusion of a
Three differing capacities of a pump for the gases which can be pumped
low boiling point gas which is difficult to pump such as hydrogen, in the
result from the size of the three surfaces (baffle, condensation surface at
matrix of a gas having a higher boiling point and which can be pumped
the outside of the second stage and sorption surface at the inside of the
easily such as Ar, CH4 or CO2. At the same temperature the condensate
second stage). In the design of a cryopump, a mean gas composition (air)
mixture has a saturation vapor pressure which is by several orders of
is assumed which naturally does not apply to all vacuum processes
magnitude lower than the pure condensate of the gas with the lower boiling
(sputtering processes, for example. See 2.1.9.6 Partial Regeneration).
point.

2.1.9.5 Pumping speed and position of the cryopanels 2.1.9.6 Characteristic quantities of a cryopump
The characteristic quantities of a cryopump are as follows (in no particular
Considering the position of the cryopanels in the cryopump, the
order):
conductance from the vacuum flange to this surface and also the
subtractive pumping sequence (what has already condensed at the baffle Cooldown time
can not arrive at the second stage and consume capacity there), the Crossover value
situation arises as shown in Fig. 2.69. Ultimate pressure
Capacity
The gas molecules entering the pump produce the area related theoretical
Refrigerating power and net refrigerating power
pumping speed according the equation 2.29a with T = 293 K. The different
Regeneration time
pumping speeds have been combined for three representative gases H2, N2
Throughput and maximum pV flow
and H20 taken from each of the aforementioned groups. Since water vapor
Pumping speed
is pumped on the entire entry area of the cryopump, the pumping speed
Service life / duration of operation
Starting pressure

57
Vacuum generation
Cooldown time: The cooldown time of cryopumps is the time span from to the pressure independent capacity for gases which are pumped by
start-up until the pumping effect sets in. In the case of refrigerator means of cryocondensation.
cryopumps the cooldown time is stated as the time it takes for the second .
Refrigerating power Q (W): The refrigerating power of a refrigeration
stage of the cold head to cool down from 293 K to 20 K.
source at a temperature T gives the amount of heat that can be extracted
Crossover value: The crossover value is a characteristic quantity of an by the refrigerating source whilst still maintaining this temperature. In the
already cold refrigerator cryopump. It is of significance when the pump is case of refrigerators it has been agreed to state for single-stage cold heads
connected to a vacuum chamber via an HV / UHV valve. The crossover the refrigerating power at 80 K and for two-stage cold heads the
value is that quantity of gas with respect to Tn=293 K which the vacuum refrigerating power for the first stage at 80 K and for the second stage at 20
chamber may maximally contain so that the temperature of the cryopanels K when simultaneously loading both stages thermally. During the
does not increase above 20 K due to the gas burst when opening the measurement of refrigerating power the thermal load is generated by
valve. The crossover value is usually stated as a pV value in in mbar l. electric heaters. The refrigerating power is greatest at room temperature
and is lowest (Zero) at ultimate temperature.
The crossover value and the chamber volume V result in the crossover
.
pressure pc to which the vacuum chamber must be evacuated first before Net refrigerating power Q (W): In the case of refrigerator cryopumps the
opening the valve leading to the cryopump. The following may serve as a net refrigerating power available at the usual operating temperatures
guide: (T1 < 80 K, T2 < 20 K) substantially defines the throughput and the
crossover value. The net. refrigerating power is depending on the
35 (2.27)
pc Q 2 (20 K ) mbar configuration of the pump much lower than the refrigerating power of the
V cold head used without the pump.
V = Volume of the vacuum chamber (l), pV flow see 1.1
.
Q.2(20K) = Net refrigerating capacity in Watts, available at the second stage Regeneration time: As a gas trapping device, the cryopump must be
of the cold head at 20 K. regenerated after a certain period of operation. Regeneration involves the
Ultimate pressure pend: For the case of cryocondensation (see Section removal of condensed and adsorbed gases from the cryopanels by heating.
2.1.9.4) the ultimate pressure can be calculated by: The regeneration can be run fully or only partially and mainly differs by the
way in which the cryopanels are heated.
TG
pend = ps( TK ) (2.28) In the case of total regeneration a difference is made between:
TK
1. Natural warming: after switching off the compressor, the cryopanels at
pS is the saturation vapor pressure of the gas or gases which are to be first warm up only very slowly by thermal conduction and then in
pumped at the temperature TK of the cryopanel and TG is the gas addition through the released gases.
temperature (wall temperature in the vicinity of the cryopanel).
2. Purge gas method: the cryopump is warmed up by admitting warm
Example: With the aid of the vapor pressure curves in Fig. 9.15 for H2 and purging gas.
N2 the ultimate pressures summarized in Table 2.6 at TG = 300 K result.
3. Electric heaters: the cryopanels of the cryopump are warmed up by
The Table shows that for hydrogen at temperatures T < 3 K at a gas heaters at the first and second stages. The released gases are
discharged either through an overpressure valve (purge gas method) or
TK (K) Ultimate pressure Ult. press. (mbar) Ult. press.(mbar)
(according to equ. 2.28) H2 N2 by mechanical backing pumps. Depending on the size of the pump one
will have to expect a regeneration time of several hours.
2.5 10.95 ps 3.28 1014 immeasurably low
Partial regeneration: Since the limitation in the service life of a cryopump
4.2 8.66 ps 4.33 109 immeasurably low
depends in most applications on the capacity limit for the gases nitrogen,
20 3.87 ps 3.87 10+3 3.87 1011 argon and hydrogen pumped by the second stage, it will often be required
Table 2.6 Ultimate temperatures at a wall temperature of 300 K
to regenerate only this stage. Water vapor is retained during partial
regeneration by the baffle. For this, the temperature of the first stage must
temperature of TG= 300 K (i.e. when the cryopanel is exposed to the
be maintained below 140 K or otherwise the partial pressure of the water
thermal radiation of the wall) sufficiently low ultimate pressures can be
vapor would become so high that water molecules would contaminate the
attained. Due to a number of interfering factors like desorption from the wall
adsorbent on the second stage.
and leaks, the theoretical ultimate pressures are not attained in practice.
In 1992, LEYBOLD was the first manufacturer of cryopumps to develop a
Capacity C (mbar l): The capacity of a cryopump for a certain gas is that
method permitting such a partial regeneration. This fast regeneration
quantity of gas (pV value at Tn = 293 K) which can be bonded by the
process is microprocessor controlled and permits a partial regeneration of
cryopanels before the pumping speed for this type of gas G drops to below
the cryopump in about 40 minutes compared to 6 hours needed for a total
50 % of its initial value.
regeneration based on the purge gas method. A comparison between the
The capacity for gases which are pumped by means of cryosorption typical cycles for total and partial regeneration is shown in Fig. 2.70. The
depends on the quantity and properties of the sorption agent; it is pressure time saved by the Fast Regeneration System is apparent. In a production
dependent and generally by several orders of magnitude lower compared environment for typical sputtering processes one will have to expect one

58
 Vacuum generation
higher pV flow is permissible (see crossover value).

Pumping speed Sth: The following applies to the (theoretical) pumping

speed of a cryopump:
pend
S th = A K SA 1 (2.29)
Temperature (K)

p
2 1
AK Size of the cryopanels
SA Surface area related pumping speed (area related impact rate
according to equations 1.17 and 1.20, proportional to the mean
(2) (1)
velocity of the gas molecules in the direction of the cryopanel)
Probability of condensation (pumping)
40 minutes Time about 6 hours pend Ultimate pressure (see above)
p Pressure in the vacuum chamber
Fig. 2.70 Comparison between total (1) and partial (2) regeneration
The equation (2.29) applies to a cryopanel built into the vacuum chamber,
total regeneration after 24 partial regenerations. the surface area of which is small compared to the surface of the vacuum
chamber. At sufficiently low temperatures = 1 for all gases. The equation
Throughput and maximum pV flow: (mbar l/s): the throughput of a
(2.29) shows that for p >> pend the expression in brackets approaches 1 so
cryopump for a certain gas depends on the pV flow of the gas G through
that in the oversaturated case
the intake opening of the pump:
p >> pend > Ps so that:
QG = qpV,G; the following equation applies
Sth = AK SA (2.29a)
QG = pG SG with
with
pG = intake pressure,
R TG TG
SA = c =
SG = pumping capacity for the gas G
= 365
. / s cm2
4 2 M M
The maximum pV flow at which the cryopanels are warmed up to T 20 K
in the case of continuous operation, depends on the net refrigerating
TG Gas temperature in K
power of the pump at this temperature and the type of gas. For refrigerator
M Molar mass
cryopumps and condensable gases the following may be taken as a guide:
. Given in Table 2.7 is the surface arearelated pumping speed SA in
Qmax = 2.3 Q 2 (20 K) mbar l/s
l s-1 cm-2 for some gases at two different gas temperatures TG in K
.
Q 2 (20 K) is the net refrigerating power in Watts available at the second determined according to equation 2.29a. The values stated in the Table are
stage of the cold heat at 20 K. In the case of intermittent operation, a limit values. In practice the condition of an almost undisturbed equilibrium

M SA SA TS Triple point
Symbol Gas Molar at 293 K at 80 K Boiling point (= melting point)
mass gas temp. gas temp. 1013 mbar Tt pt
g/mol l/s cm2 l/s cm2 K K mbar
H2 Hydrogen 2.016 43.88 22.93 20.27 13.80 70.4
He Helium 4.003 31.14 16.27 4.222 2.173 50.52
CH4 Methane 4.003 15.56 8.13 111.67 90.67 116.7
H2O Water 18.015 14.68 373.15 273.16 6.09
Ne Neon 20.183 13.87 7.25 27.102 24.559 433.0
CO Carbon monoxide 28.000 11.77 6.15 81.67 68.09 153.7
N2 Nitrogen 28.013 11.77 6.15 77.348 63.148 126.1
Air 28.96 11.58 6.05 80.5 58.5
O2 Oxygen 31.999 11.01 5.76 90.188 54.361 1.52
Ar Argon 39.948 9.86 5.15 87.26 83.82 687.5
Kr Krypton 83.80 6.81 3.56 119.4 115.94 713.9
Xe Xenon 131.3 5.44 2.84 165.2 161.4
Table 2.7 Surface-related pumping speeds for some gases

59
Vacuum generation
(small cryopanels compared to a large wall surface) is often not true, 2.2 Choice of pumping process
because large cryopanels are required to attain short pumpdown times and
a good end vacuum. Deviations also result when the cryopanels are
surrounded by a cooled baffle at which the velocity of the penetrating
2.2.1 Survey of the most usual pumping
molecules is already reduced by cooling.
processes
Service life / duration of operation top (s): The duration of operation of
Vacuum technology has undergone rapid development since the Fifties. In
the cryopump for a particular gas depends on the equation:
research and in most branches of industry today, it is indispensable.
t op, G

CG = Q G (t)dt with Corresponding to the many areas of application, the number of technical
0 procedures in vacuum processes is extraordinarily large. These cannot be
described within the scope of this section, because the basic calculations in
CG = Capacity of the cryopump for the gas G this section cover mainly the pumping process, not the process taking place
QG(t) = Throughput of the cryopump for the gas at the point of time t in the vessel. A survey of the most important processes in vacuum
technology and the pressure regions in which these processes are chiefly
__
If the constant mean over time for the throughput QG is known, the carried out is given in the diagrams (Figures 2.71 and 2.72).
following applies: Generally, the pumping operation for these processes can be divided into
CG C two categories dry- and wet vacuum procedures, that is, into processes
t op, G = = G (2.30)
QG pG SG in which no significant amounts of vapor have to be pumped and those in
which vapors (mostly water or organic) arise.
After the period of operation top,G has elapsed the cryopump must be
regenerated with respect to the type of gas G. Distinctions between the two categories are described briefly:

Starting pressure po: Basically it is possible to start a cryopump at Dry processes work primarily in a narrow and limited pressure region.
atmospheric pressure. However, this is not desirable for several reasons. The system is usually evacuated to a suitable characteristic pressure
As long as the mean free path of the gas molecules is smaller than the before the actual working process begins. This happens, for example, in
dimensions of the vacuum chamber (p > 10-3 mbar), thermal conductivity of plants for evaporative coating, electron-beam welding, and crystal pulling; in
the gas is so high that an unacceptably large amount of heat is transferred particle accelerators, mass spectrometers, electron microscopes; and
to the cryopanels. Further, a relatively thick layer of condensate would form others.
on the cryopanel during starting. This would markedly reduce the capacity Further, there are dry processes in which degassing in vacuum is the actual
of the cryopump available to the actual operating phase. Gas (usually air) technical process. These include work in induction- and arc furnaces, steel
would be bonded to the adsorbent, since the bonding energy for this is degassing plants, and plants for the manufacture of pure metals and
lower than that for the condensation surfaces. This would further reduce electron tubes.
the already limited capacity for hydrogen. It is recommended that
cryopumps in the high vacuum or ultrahigh vacuum range are started with Wet processes are undertaken primarily in a prescribed working
the aid of a backing pump at pressures of p < 5 10-2 mbar. As soon as the operation that covers a wider pressure region. This is especially
starting pressure has been attained the backing pump may be switched off. important in the drying of solid materials. If, for instance, work is undertaken
prematurely at too low a pressure, the outer surfaces dry out too quickly. As
a result, the thermal contact to the moisture to be evaporated is impaired
and the drying time is considerably increased. Predominantly processes
that are carried out in drying, impregnating, and freeze-drying plants belong
in this category.

In the removal of water vapor from liquids or in their distillation, particularly

in degassing columns, vacuum filling, and resin-casting plants, as well as in
molecular distillation, the production of as large a liquid surface as possible
is important. In all wet processes the provision of the necessary heat
for evaporation of the moisture is of great importance.

Basic pumping procedures are given in the following paragraphs.

If you have specific questions, you should get in touch with a specialist
department in LEYBOLD where experts are available to you who can draw
on many years of experience.

60
 Vacuum generation
Ultrahigh vacuum High vacuum Medium vacuum Rough vacuum

Mass spectrometers
Molecular beam apparatus
Ion sources
Particle accelerators
Electron microscopes
Electron diffraction apparatus
Vacuum spectographs
Low-temperature research
Production of thin films
Surface physics
Plasma research
Nuclear fusion apparatus
Space simulation
Material research
Preparations for
electron microscopy

1013 1010 107 103 100 103

Pressure [mbar]

Fig. 2.71 Pressure ranges (p < 1000 mbar) of physical and chemical analytical methods

Classifications of typical vacuum processes and plants according to Evaporative coating, crystal pulling, mass spectrometers, tube
the pressure regions production, electron microscopes, electron beam plants, and particle
Rough vacuum 1013 mbar 1 mbar accelerators.
Drying, distillation, and steel degassing. Ultrahigh vacuum: < 10-7 mbar
Medium vacuum 1 -10-3 mbar Nuclear fusion, storage rings for accelerators, space research, and
Molecular distillation, freeze-drying, impregnation, melting and casting surface physics.
furnaces, and arc furnaces.
High vacuum 10-3 10-7 mbar

Ultrahigh vacuum High vacuum Medium vacuum Rough vacuum

Annealing of metals
Melting of metals
Degassing of molten metals
Steel degassing
Electron-beam melting
Electron-beam welding
Evaporation coating
Sputtering of metals
Zone melting and crystal growing in high-vacuum
Molecular distillation
Degassing of liquids
Sublimation
Casting of resins and lacquers
Drying of plastics
Drying of insulating papers
Freeze-drying of mass materials
Freeze-drying of pharmaceutical products
Production of incandescent lamps
Production of electron tubes
Production of gas-discharge tubes

1010 107 103 100 103

Pressure [mbar]

Fig. 2.72 Pressure ranges of industrial vacuum processes

61
Vacuum generation
2.2.2 Pumping of gases (dry processes) pumps are suitable. If very little maintenance and valveless operation are
convenient (i.e., small vessels in short operation cycles are to be pumped
For dry processes in which a non condensable gas mixture (e.g., air) is to to about 10-4 mbar or large vessels are to be maintained at this pressure
be pumped, the pump to be used is clearly characterized by the required unattended for weeks), the previously mentioned two-stage Roots pumps
working pressure and the quantity of gas to be pumped away. The choice with two-stage rotary pumps as backing pumps are the suitable
of the required working pressure is considered in this section. The choice of combinations. Allthough, such a combination does not work as
the required pump is dealt with in Section 2.3. economically as the corresponding vapor ejector pump, it can operate for a
Each of the various pumps has a characteristic working range in which it much longer time without maintenance.
has a particularly high efficiency. Therefore, the most suitable pumps for c) High vacuum (10-3 to 10-7 mbar)
use in the following individual pressure regions are described. For every Diffusion, sputter-ion, and turbomolecular pumps typically operate in the
dry-vacuum process, the vessel must first be evacuated. It is quite possible pressure region below 10-3 mbar. If the working region varies during a
that the pumps used for this may be different from those that are the process, different pumping systems must be fitted to the vessel. There are
optimum choices for a process that is undertaken at definite working also special diffusion pumps that combine the typical properties of a
pressures. In every case the choice should be made with particular diffusion pump (low ultimate pressure, high pumping speed in the high vac-
consideration for the pressure region in which the working process uum region) with the outstanding properties of a vapor ejector pump (high
predominantly occurs. throughput in the medium vacuum region, high critical backing pressure). If
a) Rough vacuum (1013 1 mbar) the working region lies between 10-2 and 10-6 mbar, these diffusion pumps
The usual working region of the rotary pumps described in Section 2 lies are, in general, specially recommended.
below 80 mbar. At higher pressures these pumps have a very high power d) Ultrahigh vacuum (< 10-7 mbar)
consumption (see Fig. 2.11) and a high oil consumption (see Section For the production of pressures in the ultrahigh vacuum region, sputter-ion,
8.3.1.1). Therefore, if gases are to be pumped above 80 mbar over long and sublimation pumps, as well as turbomolecular pumps and cryopumps,
periods, one should use, particularly on economic grounds, jet pumps, are used in combination with suitable forepumps. The pump best suited to a
water ring pumps or dry running, multi-vane pumps. Rotary vane and rotary particular UHV process depends on various conditions (for further details,
piston pumps are especially suitable for pumping down vessels from see Section 2.5).
atmospheric pressure to pressures below 80 mbar, so that they can work
continuously at low pressures. If large quantities of gas arise at inlet
pressures below 40 mbar, the connection in series of a Roots pump is
recommended. Then, for the backing pump speed required for the process
2.2.3 Pumping of gases and vapors (wet
concerned, a much smaller rotary vane or piston pump can be used.
processes)
When vapors must be pumped, in addition to the factors working pressure
b) Medium vacuum (1 10-3 mbar)
and pumping speed, a third determining factor is added namely the vapor
If a vacuum vessel is merely to be evacuated to pressures in the medium
partial pressure which may vary considerably in the course of a process.
vacuum region, perhaps to that of the required backing pressure for
This factor is decisive in determining the pumping arrangement to be
diffusion or sputter-ion pumps, single- and two-stage rotary pumps are
installed. In this regard, the condensers described in Section 2.15 are very
adequate for pressures down to 10-1 and 10-3 mbar, respectively. It is
important adjuncts to rotary displacement pumps. They have a particularly
essentially more difficult to select the suitable type of pump if medium vacu-
high pumping speed when pumping vapors. The next section covers
um processes are concerned in which gases or vapors are evolved
pumping of water vapor (the most frequent case). The considerations apply
continuously and must be pumped away. An important hint may be given at
similarly to other non-aggressive vapors.
this point. Close to the attainable ultimate pressure, the pumping speed of
all rotary pumps falls off rapidly. Therefore, the lowest limit for the normal
working pressure region of these pumps should be that at which the Pumping of Water Vapor
pumping speed still amounts to about 50 % of the nominal pumping speed. Water vapor is frequently removed by pumps that operate with water or
steam as a pump fluid, for example, water ring pumps or steam ejector
Between 1 and 10-2 mbar at the onset of large quantities of gas, Roots pumps. This depends considerably on circumstances, however, because
pumps with rotary pumps as backing pumps have optimum pumping the economy of steam ejector pumps at low pressures is generally far
properties (see Section 2.1.3.1). For this pressure range, a single-stage inferior to that of rotary pumps. For pumping a vapor gas mixture in which
rotary pump is sufficient, if the chief working region lies above 10-1 mbar. If the vapor portion is large but the air portion is small, the vapor can be
it lies between 10-1 and 10-2 mbar, a two-stage backing pump is pumped by condensers and the permanent gases, by relatively small gas
recommended. Below 10-2 mbar the pumping speed of single-stage Roots ballast pumps (see Section 2.1.5).
pumps in combination with two-stage rotary pumps as backing pumps
decreases. However, between 10-2 and 10-4 mbar, two-stage Roots pumps Comparatively, then, a pump set consisting of a Roots pump, condenser,
(or two single-stage Roots pumps in series) with two-stage rotary pumps as and backing pump, which can transport 100 kg/h of vapor and 18 kg/h of air
backing pumps still have a very high pumping speed. Conversely, this at an inlet pressure of 50 mbar, has a power requirement of 4 10 kW
pressure region is the usual working region for vapor ejector pumps. For (depending on the quantity of air involved). A steam ejector pump of the
work in this pressure region, they are the most economical pumps to same performance requires about 60 kW without altering the quantity of air
purchase. As backing pumps, single-stage rotary positive displacement involved.

62
 Vacuum generation
Section 2.1.5. At a water vapor tolerance of 60 mbar, the lower limit of this
region is

pv > 6O + 0.46 pp mbar

Region C: Single-stage rotary plunger pumps with a gas ballast.
6 The lower limit of region C is characterized by the lower limit of the working
Water vapor partial pressure pv

0.4 region of this pump. It lies, therefore, at about ptot = 1 mbar. If large
=
/pp quantities of vapor arise in this region, it is often more economical to insert
pv
a condenser: 20 kg of vapor at 28 mbar results in a volume of about
1000 m3. It is not sensible to pump this volume with a rotary pump. As a
rule of thumb:

A condenser should always be inserted at the pumps inlet if saturated

water vapor arises for a considerable time.
As a precaution, therefore, a Roots pump should always be inserted in front
of the condenser at low inlet pressures so that the condensation capacity is
essentially enhanced. The condensation capacity does not depend only on
Air partial pressure pp
the vapor pressure, but also on the refrigerant temperature. At low vapor
pressures, therefore, effective condensation can be obtained only if the
Fig. 2.73 Areas of application for gas ballast pumps and condensers pumping water vapor
(o.G. = without gas ballast)
refrigerant temperature is correspondingly low. At vapor pressures below
6.5 mbar, for example, the insertion of a condenser is sensible only if the
For the pumping of water vapor, gas ballast pumps and combinations of refrigerant temperature is less than 0 C. Often at low pressures a gas
gas ballast pumps, Roots pumps, and condensers are especially suitable. vapor mixture with unsaturated water vapor is pumped (for further details,
see Section 2.1.5). In general, then, one can dispense with the condenser.
Pumping of water vapor with gas ballast pumps
The ratio of vapor partial pressure pv to air partial pressure pp is decisive in
Region D: Two-stage gas ballast pumps, Roots pumps, and vapor
the evaluation of the correct arrangement of gas ballast pumps, as shown
ejector pumps, always according to the total pressure concerned in
previously by equations 2.2 and 2.3. Therefore, if the water vapor tolerance
the process.
of the gas ballast pump is known, graphs may be obtained that clearly give
It must again be noted that the water vapor tolerance of two-stage gas
the correct use of gas ballast pumps for pumping water vapor (see Fig.
ballast pumps is frequently lower than that of corresponding single-stage
2.73). Large single-stage rotary plunger pumps have, in general, an
pumps.
operating temperature of about 77 C and hence a water vapor tolerance of
about 60 mbar. This value is used to determine the different operating
regions in Fig. 2.73. In addition it is assumed that the pressure at the Pumping of water vapor with roots pumps
discharge outlet port of the gas ballast pump can increase to a maximum of Normally, Roots pumps are not as economical as gas ballast pumps for
1330 mbar until the discharge outlet valve opens. continuous operation at pressures above 40 mbar. With very large pump
sets, which work with very specialized gear ratios and are provided with
Region A: Single-stage, rotary plunger pumps without gas ballast bypass lines, however, the specific energy consumption is indeed more
inlet. favorable. If Roots pumps are installed to pump vapors, as in the case of
At a saturation vapor pressure pS of 419 mbar at 77 C, according to gas ballast pumps, a chart can be given that includes all possible cases
equation 2.2, the requirement is given that pv < 0.46 pp, where (see Fig. 2.74).

pv is the water vapor partial pressure

Region A: A Roots pump with a single-stage rotary plunger pump
pp is the partial pressure of air
without gas ballast.
pv + pp = ptot total pressure
As there is merely a compression between the Roots pump and the rotary
This requirement is valid in the whole working region of the single-stage plunger pump, the following applies here too:
rotary plunger pump hence, at total pressures between 10-1 and 1013
pv < 0.46 pp
mbar.
The requirement is valid over the entire working region of the pump
Region B: Single-stage rotary plunger pumps with gas ballast and an combination and, therefore, for total pressures between 10-2 and 40 mbar
inlet condenser. (or 1013 mbar for Roots pumps with a bypass line).
In this region the water vapor pressure exceeds the admissible partial
pressure at the inlet. The gas ballast pump must, therefore, have a Region B: A main condenser, a Roots pump with a bypass line, an
condenser inserted at the inlet, which is so rated that the water vapor intermediate condenser, and a gas ballast pump.
partial pressure at the inlet port of the rotary pump does not exceed the This combination is economical only if large water vapor quantities are to
admissible value. The correct dimensions of the condenser are selected be pumped continuously at inlet pressures above about 40 mbar. The size
depending on the quantity of water vapor involved. For further details, see

63
Vacuum generation
of the main condenser depends on the quantity of vapor involved. The
intermediate condenser must decrease the vapor partial pressure below 60
mbar. Hence, the gas ballast pump should be large enough only to prevent
the air partial pressure behind the intermediate condenser from exceeding
a certain value; for example, if the total pressure behind the Roots pump
(which is always equal to the total pressure behind the intermediate

Water vapor partial pressure pv

condenser) is 133 mbar, the gas ballast pump must pump at least at a
partial air pressure of 73 mbar, the quantity of air transported to it by the
Roots pump. Otherwise, it must take in more water vapor than it can
6
tolerate. This is a basic requirement: the use of gas ballast pumps is 0.4
=
wise only if air is also pumped! /p p
pv
With an ideally leak-free vessel, the gas ballast pump should be isolated
after the required operating pressure is reached and pumping continued
with the condenser only. Section 2.1.5 explains the best possible
combination of pumps and condensers.

Region C: A Roots pump, an intermediate condenser, and a gas Air partial

Air partialpressure
pressurepppp
ballast pump.
The lower limit of the water vapor partial pressure is determined through Fig. 2.74 Areas of application for Roots pumps and condensers pumping water vapor (o.G. =
without gas ballast)
the compression ratio of the Roots pump at the backing pressure, which is
determined by the saturation vapor pressure of the condensed water. Also, water vapor at the saturation vapor pressure of water.
in this region the intermediate condenser must be able to reduce the vapor
partial pressure to at least 60 mbar. The stated arrangement is suitable With longer-term drying processes, it suffices to shut off the condensate
when cooling the condenser with water at 15 C for water vapor collector from the condenser. Then only the remaining condensate film on
pressures between about 4 and 40 mbar. the cooling tubes can reevaporate. Depending on the size of the gas ballast
pump, this reevaporation ensues in 30 60 min.
Region D: A roots pump and a gas ballast pump. E. If the drying process should terminate at still lower pressures
In this region D the limits also depend essentially on the stages and ratios When a pressure below 10-2 mbar is reached a previously bypassed oil
of sizes of the pumps. In general, however, this combination can always be vapor ejector pump should be switched on in addition.
used between the previously discussed limits therefore, between 10-2 and
4 mbar. Drying of solid substances
As previously indicated, the drying of solid substances brings about a series
of further problems. It no longer suffices that one simply pumps out a
2.2.4 Drying processes vessel and then waits until the water vapor diffuses from the solid
Often a vacuum process covers several of the regions quoted here. In substance. This method is indeed technically possible, but it would
batch drying the process can, for example (see Fig. 2.74), begin in region A intolerably increase the drying time.
(evacuation of the empty vessel) and then move through regions B, C, and It is not a simple technical procedure to keep the drying time as short as
D in steps. Then the course of the process would be as follows: possible. Both the water content and the layer thickness of the drying
A. Evacuating the vessel by a gas ballast pump and a Roots pump substance are important. Only the principles can be stated here. In case of
with a bypass line. special questions we advise you to contact our experts in our Cologne
factory.
B. Connecting the two condensers because of the increasing vapor
pressure produced by heating the material. The moisture content E of a material to be dried of which the diffusion
The choice of the pumping System is decided by the highest vapor partial coefficient depends on the moisture content (e.g. with plastics) as a
pressure occurring and the lowest air partial pressure at the inlet. function of the drying time t is given in close approximation by the following
equation:
C. Bypassing the main condenser E0
It will now not have an effect. Instead it would only be pumped empty by E= % (2.31)
(1 + K t )q
the pumping system with a further drop in vapor pressure.

D. Bypassing the intermediate condenser. E0 where E is the moisture content before drying
Roots pumps and gas ballast pumps alone can now continue pumping. q is the temperature-dependent coefficient. Thus equation (2.31) serves
With short-term drying, the separation of the condenser filled with only for the temperature at which q was determined
condensed water is particularly important, because the gas ballast pump K is a factor that depends on the temperature, the water vapor partial
would continue to pump from the condenser the previously condensed pressure in the vicinity of the material, the dimensions, and the
properties of the material.

64
 Vacuum generation
With the aid of this approximate equation, the drying characteristics of Absolutely oil-free vacua may be produced in the medium vacuum region
many substances can be assessed. If K and q have been determined for with adsorption pumps. Since the pumping action of these pumps for the
various temperatures and water vapor partial pressures, the values for light noble gases is only small, vessels initially filled with air can only be
other temperatures are easily interpolated, so that the course of the drying evacuated by them to about 10-2 mbar. Pressures of 10-3 mbar or lower can
process can be calculated under all operating conditions. With the aid of a then be produced with adsorption pumps only if neither neon nor helium is
similarity transformation, one can further compare the course of drying present in the gas mixture to be pumped. In such cases it can be useful to
process of a material with known properties with that of a material with expel the air in the vessel by first flooding with nitrogen and then pumping it
different properties. away.
Fundamentally, in the drying of a material, a few rules are noteworthy:
Experience has shown that shorter drying times are obtained if the water c) High- and ultrahigh vacuum region (< 10-3 mbar)
vapor partial pressure at the surface of the material is relatively high, that When there is significant evolution of gas in the pressure regions that must
is, if the surface of the material to be dried is not yet fully free of moisture. be pumped, turbomolecular pumps, or cryopumps should be used. A
This is possible because the heat conduction between the source of heat sputter-ion pump is especially suitable for maintaining the lowest possible
and the material is greater at higher pressures and the resistance to pressure for long periods in a sealed system where the process does not
diffusion in a moist surface layer is smaller than in a dry one. To fulfill the release large quantities of gas. Magnetically-suspended turbomolecular
conditions of a moist surface, the pressure in the drying chamber is pumps also guarantee hydrocarbon-free vacua. However, while these
controlled. If the necessary relatively high water vapor partial pressure pumps are switched off, oil vapors can enter the vessel through the pump.
cannot be maintained permanently, the operation of the condenser is By suitable means (e.g., using an isolating valve or venting the vessel with
temporarily discontinued. The pressure in the chamber then increases and argon), contamination of the vessel walls can be impeded when the pump
the surface of the material becomes moist again. To reduce the water vapor is stationary. If the emphasis is on generating a hydrocarbon-free vacuum
partial pressure in the vessel in a controlled way, it may be possible to with turbomolecular pumps, then hybrid turbomolecular pumps with
regulate the refrigerant temperature in the condenser. In this way, the diaphragm pumps or classic turbomolecular pumps combined with scroll
condenser temperature attains preset values, and the water vapor partial pumps should be used as oil-free backing pumps.
pressure can be reduced in a controlled manner.

2.2.6 Ultrahigh vacuum working Techniques

2.2.5 Production of an oil-free The boundary between the high and ultrahigh vacuum region cannot be
(hydrocarbon-free) vacuum precisely defined with regard to the working methods. In practice, a border
between the two regions is brought about because pressures in the high
Backstreaming vapor pump fluids, vapors of oils, rotary pump lubricants,
vacuum region may be obtained by the usual pumps, valves, seals, and
and their cracking products can significantly disturb various working
other components, whereas for pressures in the UHV region, another
processes in vacuum. Therefore, it is recommended that certain
technology and differently constructed components are generally required.
applications use pumps and devices that reliably exclude the presence of
The border lies at a few 10-8 mbar. Therefore, pressures below 10-7 mbar
hydrocarbon vapors.
should generally be associated with the UHV region.

a) Rough vacuum region (1013 to 1 mbar) The gas density is very small in the UHV region and is significantly
Instead of rotary pumps, large water jet, steam ejector, or water ring pumps influenced by outgasing rate of the vessel walls and by the tiniest leakages
can be used. For batch evacuation, and the production of hydrocarbon-free at joints. Moreover, in connection with a series of important technical
fore vacuum for sputter-ion pumps, adsorption pumps (see Section 2.1.8.1) applications to characterize the UHV region, generally the monolayer time
are suitable. If the use of oil-sealed rotary vane pumps cannot be avoided, (see also equation 1.21) has become important. This is understood as the
basically two-stage rotary vane pumps should be used. The small amount time that elapses before a monomolecular or monatomic layer forms on
of oil vapor that backstreams out of the inlet ports of these pumps can be an initially ideally cleaned surface that is exposed to the gas particles.
almost completely removed by a sorption trap (see Section 2.1.4) inserted Assuming that every gas particle that arrives at the surface finds a free
in the pumping line. place and remains there, a convenient formula for is
3.2 6
b) Medium vacuum region (1 to 10-3 mbar) = 10 s (p in mbar)
p
For the pumping of large quantities of gas in this pressure region, vapor
ejector pumps are by far the most suitable. With mercury vapor ejector Therefore, in UHV (p < 10-7 mbar) the monolayer formation time is of the
pumps, completely oil-free vacua can be produced. As a precaution, the order of minutes to hours or longer and thus of the same length of time as
insertion of a cold trap chilled with liquid nitrogen is recommended so that that needed for experiments and processes in vacuum. The practical
the harmful mercury vapor does not enter the vessel. With the medium vac- requirements that arise have become particularly significant in solid-state
uum sorption traps described under a), it is possible with two-stage rotary physics, such as for the study of thin films or electron tube technology. A
vane pumps to produce almost oil-free vacua down to below UHV system is different from the usual high vacuum system for the
10-4 mbar. following reasons:

65
Vacuum generation
a) the leak rate is extremely small (use of metallic seals), 2.3. Evacuation of a vacuum chamber and
b) the gas evolution of the inner surfaces of the vacuum vessel and of the determination of pump sizes
attached components (e.g., connecting tubulation; valves, seals) can be Basically, two independent questions arise concerning the size of a
made extremely small, vacuum system:
c) suitable means (cold traps, baffles) are provided to prevent gases or 1. What effective pumping speed must the pump arrangement maintain to
vapors or their reaction products that have originated from the pumps reduce the pressure in a given vessel over a given time to a desired
used from reaching the vacuum vessel (no backstreaming). value?

To fulfill these conditions, the individual components used in UHV 2. What effective pumping speed must the pump arrangement reach during
apparatus must be bakeable and extremely leaktight. Stainless steel is the a vacuum process so that gases and vapors released into the vessel
preferred material for UHV components. can be quickly pumped away while a given pressure (the operating
pressure) in the vessel, is maintained and not exceeded?
The construction, start-up, and operation of an UHV system also demands
special care, cleanliness, and, above all, time. The assembly must be During the pumping-out procedure of certain processes (e.g., drying and
appropriate; that is, the individual components must not be in the least heating), vapors are produced that were not originally present in the
damaged (i.e. by scratches on precision-worked sealing surfaces). vacuum chamber, so that a third question arises:
Fundamentally, every newly-assembled UHV apparatus must be tested for 3. What effective pumping speed must the pump arrangement reach so
leaks with a helium leak detector before it is operated. Especially important that the process can be completed within a certain time?
here is the testing of demountable joints (flange connections), glass seals,
and welded or brazed joints. After testing, the UHV apparatus must be The effective pumping speed of a pump arrangement is understood as
baked out. This is necessary for glass as well as for metal apparatus. The the actual pumping speed of the entire pump arrangement that prevails
bake-out extends not only over the vacuum vessel, but frequently also to at the vessel. The nominal pumping speed of the pump can then be
the attached parts, particularly the vacuum gauges. The individual stages of determined from the effective pumping speed if the flow resistance
the bake-out, which can last many hours for a larger system, and the bake- (conductances) of the baffles, cold traps, filters, valves, and tubulations
out temperature are arranged according to the kind of plant and the installed between the pump and the vessel are known (see Sections 1.5.2
ultimate pressure required. If, after the apparatus has been cooled and the to 1.5.4). In the determination of the required nominal pumping speed it is
other necessary measures undertaken (e.g., cooling down cold traps or further assumed that the vacuum system is leaktight; therefore, the leak
baffles), the ultimate pressure is apparently not obtained, a repeated leak rate must be so small that gases flowing in from outside are immediately
test with a helium leak detector is recommended. Details on the removed by the connected pump arrangement and the pressure in the
components, sealing methods and vacuum gauges are provided in our vessel does not alter (for further details, see Section 5). The questions
catalog. listed above under 1., 2. and 3. are characteristic for the three most
essential exercises of vacuum technology

1. Evacuation of the vessel to reach a specified pressure.

2. Pumping of continuously evolving quantities of gas and vapor at a

certain pressure.

3. Pumping of the gases and vapors produced during a process by

variation of temperature and pressure.

Initial evacuation of a vacuum chamber is influenced in the medium-, high-,

and ultrahigh vacuum regions by continually evolving quantities of gas,
because in these regions the escape of gases and vapors from the walls of
the vessel is so significant that they alone determine the dimensions and
layout of the vacuum system.

2.3.1 Evacuation of a vacuum chamber

(without additional sources of gas
or vapor)
Because of the factors described above, an assessment of the pump-down
time must be basically different for the evacuation of a container in the
rough vacuum region from evacuation in the medium- and high vacuum
regions.

66
 Vacuum generation
2.3.1.1 Evacuation of a chamber in the rough vacuum orders of magnitude lower than the desired pressure.
region Example: A vacuum chamber having a volume of 500 l shall be pumped
In this case the required effective pumping speed Seff, of a vacuum pump down to 1 mbar within 10 minutes. What effective pumping speed is
assembly is dependent only on the required pressure p, the volume V of required?
the container, and the pump-down time t. 500 l = 0.5 m3; 10 min = 1/6 h
With constant pumping speed Seff and assuming that the ultimate pressure According to equation (2.34) it follows that:
pend attainable with the pump arrangement is such that pend << p, the
decrease with time of the pressure p(t) in a chamber is given by the 0.5 1013
Seff = 2.3 log
equation: 1/ 6 1
= 3 2.3 3.01 = 20.8 m3/h
dp Seff
= p (2.32)
dt V

Beginning at 1013 mbar at time t = 0, the effective pumping speed is For the example given above one reads off the value of 7 from the straight
calculated depending on the pump-down time t from equation (2.32) as line in Fig. 2.75. However, from the broken line a value of 8 is read off.
follows: According to equation (2.35) the following is obtained:
p dp Seff 0.5
p = t (2.33a) Seff = 7 = 21 m 3/ h or
1013 V 1
6
p S 0.5
Seff = 8 = 24 m 3/ h
n = eff t (2.33b) 1
1013 V 6

V 1013 V 1013 under consideration of the fact that the pumping speed reduces below
Seff = n = 2.3 log (2.34)
t p t p 10 mbar. The required effective pumping speed thus amounts to about
24 m3/h.
Introducing the dimensionless factor
1013 1013
= n p = 2.3 log p (2.34a)

into equation (2.34), the relationship between the effective pumping speed
Seff, and the pump-down time t is given by

V
Seff = (2.35)
t

The ratio V/Seff is generally designated as a time constant . Thus the

pump-down time of a vacuum chamber from atmospheric pressure to a
pressure p is given by:

t= (2.36)
Pressure

with = V
Seff

and = n 1013
p

The dependence of the factor from the desired pressure is shown in Fig.
2.75. It should be noted that the pumping speed of single-stage rotary vane
and rotary piston pumps decreases below 10 mbar with gas ballast and
below 1 mbar without gas ballast. This fundamental behavior is different for
Dimensionless factor
pumps of various sizes and types but should not be ignored in the
determination of the dependence of the pump-down time on pump size. It
must be pointed out that the equations (2.32 to 2.36) as well Fig. 2.75 only Fig. 2.75 Dependency of the dimensionless factor s for calculation of pumpdown time t accord-
ing to equation 2.36. The broken line applies to single-stage pumps where the pump-
apply when the ultimate pressure attained with the pump used is by several ing speed decreases below 10 mbar.

67
Vacuum generation
2.3.1.2 Evacuation of a chamber in the high vacuum region forevacuum pressure pV instead. Then equation (2.34) transforms into:
p
It is considerably more difficult to give general formulas for use in the high Seff = V n V = V n K
vacuum region. Since the pumping time to reach a given high vacuum t p t
pressure depends essentially on the gas evolution from the chambers
inner surfaces, the condition and pre-treatment of these surfaces are of At a backing pressure of pV = 2 10-3 mbar compression K is in our
great significance in vacuum technology. Under no circumstances should example:
the material used exhibit porous regions or particularly with regard to
2 10 3
bake-out contain cavities; the inner surfaces must be as smooth as K= = 200
possible (true surface = geometric surface) and thoroughly cleaned (and 110 5
degreased). Gas evolution varies greatly with the choice of material and the
In order to attain an ultimate pressure of 1 10-5 mbar within 5 minutes
surface condition. Useful data are collected in Table X (Section 9). The gas
after starting to pump with the diffusion pump an effective pumping speed
evolution can be determined experimentally only from case to case by the
of
pressure-rise method: the system is evacuated as thoroughly as possible,
500 
and finally the pump and the chamber are isolated by a valve. Now the Seff = 2.3 log 200 9 s
time is measured for the pressure within the chamber (volume V) to rise by 5 60
a certain amount, for example, a power of 10. The gas quantity Q that
arises per unit time is calculated from: is required. This is much less compared to the effective pumping speed
needed to maintain the ultimate pressure. Pumpdown time and ultimate
Q=
p V (2.37) vacuum in the high vacuum and ultrahigh vacuum ranges depends mostly
t on the gas evolution rate and the leak rates. The underlying mathematical
rules can not be covered here. For these please refer to books specializing
(p = measured pressure rise ) on that topic.
The gas quantity Q consists of the sum of all the gas evolution and all
leaks possibly present. Whether it is from gas evolution or leakage may be
determined by the following method: 2.3.1.3 Evacuation of a chamber in the medium vacuum
region
The gas quantity arising from gas evolution must become smaller with time,
the quantity of gas entering the system from leakage remains constant with In the rough vacuum region, the volume of the vessel is decisive for the
time. Experimentally, this distinction is not always easily made, since it time involved in the pumping process. In the high and ultrahigh vacuum
often takes a considerable length of time with pure gas evolution before regions, however, the gas evolution from the walls plays a significant role.
the measured pressure-time curve approaches a constant (or almost a In the medium vacuum region, the pumping process is influenced by both
constant) final value; thus the beginning of this curve follows a straight line quantities. Moreover, in the medium vacuum region, particularly with rotary
for long times and so simulates leakage (see Section 5, Leaks and Leak pumps, the ultimate pressure pend attainable is no longer negligible. If the
Detection). quantity of gas entering the chamber is known to be at a rate Q (in millibars
liter per second) from gas evolution from the walls and leakage, the
If the gas evolution Q and the required pressure pend are known, it is easy
differential equation (2.32) for the pumping process becomes
to determine the necessary effective pumping speed:
Q S eff p p
Q
Seff = (2.38) dp end
pend = (2.39)
dt V

Example: A vacuum chamber of 500 l may have a total surface area Integration of this equation leads to
(including all systems) of about 5 m2. A steady gas evolution of p p
end Q / Seff
2 10-4 mbar l/s is assumed per m2 of surface area. This is a level which o
V
is to be expected when valves or rotary feedthroughs, for example are t= n
S p p Q/S (2.40)
eff eff
connected to the vacuum chamber. In order to maintain in the system a end
pressure of 1 10-5 mbar, the pump must have a pumping speed of
where
5 2 10 4 mbar / s p0 is the pressure at the beginning of the pumping process
Seff = = 100  / s
110 5 mbar p is the desired pressure

A pumping speed of 100 l/s alone is required to continuously pump away In contrast to equation 2.33b this equation does not permit a definite
the quantity of gas flowing in through the leaks or evolving from the solution for Seff, therefore, the effective pumping speed for a known gas
chamber walls. Here the evacuation process is similar to the examples evolution cannot be determined from the time pressure curve without
given in Sections 2.3.1.1. However, in the case of a diffusion pump the further information.
pumping process does not begin at atmospheric pressure but at the
In practice, therefore, the following method will determine a pump with
sufficiently high pumping speed:

68
 Vacuum generation
a) The pumping speed is calculated from equation 2.34 as a result of the which offers also with gas ballast the required pumping speed at
volume of the chamber without gas evolution and the desired pump- 2 10-1 mbar.
down time.
If the high vacuum pump is only to be used at intake pressures below
b) The quotient of the gas evolution rate and this pumping speed is found. 10-3 mbar, a smaller backing pump will do; in the case of the example given
This quotient must be smaller than the required pressure; for safety, it this will be a pump offering a pumping speed of 6 m3/h. If the continuous
must be about ten times lower. If this condition is not fulfilled, a pump intake pressures are even lower, below 10-4 mbar, for example, the required
with correspondingly higher pumping speed must be chosen. pumping speed for the backing pump can be calculated from equation
2.41a as:
110 4
2.3.2 Determination of a suitable backing pump SV = 200 = 0.1 /s = 0. 36 m 3/h
2 10 1
The gas or vapor quantity transported through a high vacuum pump must
also be handled by the backing pump. Moreover, in the operation of the Theoretically in this case a smaller backing pump having a pumping speed
high vacuum pump (diffusion pump, turbomolecular pump), the maximum of about 1 m3/h could be used. But in practice a larger backing pump
permissible backing pressure must never, even for a short time, be should be installed because, especially when starting up a vacuum system,
exceeded. If Q is the effective quantity of gas or vapor, which is pumped by large amounts of gas may occur for brief periods. Operation of the high
the high vacuum pump with an effective pumping speed Seff at an inlet vacuum pump is endangered if the quantities of gas can not be pumped
pressure pA, this gas quantity must certainly be transported by the backing away immediately by the backing pump. If one works permanently at very
pump at a pumping speed of SV at the backing pressure pV. For the low inlet pressures, the installation of a ballast volume (backing-line vessel
effective throughput Q, the continuity equation applies: or surge vessel) between the high vacuum pump and the backing pump is
Q = pA Seff = pv SV (2.41) recommended. The backing pump then should be operated for short times
only. The maximum admissible backing pressure, however, must never be
The required pumping speed of the backing pump is calculated from: exceeded.
pA
SV = S The size of the ballast volume depends on the total quantity of gas to be
pV eff (2.41a)
pumped per unit of time. If this rate is very low, the rule of thumb indicates
that 0.5 l of ballast volume allows 1 min of pumping time with the backing
Example: In the case of a diffusion pump having a pumping speed of pump isolated.
400 l/s the effective pumping speed is 50 % of the value stated in the
For finding the most adequate size of backing pump, a graphical method
catalog when using a shell baffle. The max. permissible backing pressure is
may be used in many cases. In this case the starting point is the pumping
2 10-1 mbar. The pumping speed required as a minimum for the backing
speed characteristic of the pumps according to equation 2.41.
pump depends on the intake pressure pA according to equation 2.41a.
The pumping speed characteristic of a pump is easily derived from the
At an intake pressure of pA = 1 10-2 mbar the pumping speed for the high
measured pumping speed (volume flow rate) characteristic of the pump as
vacuum pump as stated in the catalog is about 100 l/s, subsequently 50 %
shown for a 6000 l/s diffusion pump (see curve S in Fig. 2.76). To arrive at
of this is 50 l/s. Therefore the pumping speed of the backing pump must
the throughput characteristic (curve Q in Fig. 2.76), one must multiply each
amount to at least
ordinate value of S by its corresponding pA value and plotted against this
110 2 value. If it is assumed that the inlet pressure of the diffusion pump does not
SV = 50 = 2.5 /s = 9 m 3/ h
2 10 1 exceed 10-2 mbar, the maximum throughput is 9.5 mbar l/s

Hence, the size of the backing pump must be such that this throughput can
At an intake pressure of pA = 1 10-3 mbar the pump has already reached
be handled by the pump at an intake pressure (of the backing pump) that is
its nominal pumping speed of 400 l/s; the effective pumping speed is now
equal to or preferably lower than the maximum permissible backing
Seff = 200 l/s; thus the required pumping speed for the backing pump
pressure of the diffusion pump; that is, 4 10-1 mbar for the 6000 l/s
amounts to
diffusion pump.
110 3
SV = 200 = 1/s = 3. 6 m 3/h After accounting for the pumping speed characteristics of commercially
2 10 1 available two-stage rotary plunger pumps, the throughput characteristic for
each pump is calculated in a manner similar to that used to find the Q curve
If the high vacuum pump is to be used for pumping of vapors between 10-3
for the diffusion pump in Fig. 2.76 a. The result is the group of Q curves
and 10-2 mbar, then a backing pump offering a nominal pumping speed of
numbered 1 4 in Fig. 2.76 b, whereby four 2-stage rotary-plunger pumps
12 m3/h must be used, which in any case must have a pumping speed of
were considered, whose nominal speeds were 200, 100, 50, and 25 m3/h,
9 m3/h at a pressure of 2 10-1 mbar. If no vapors are to be pumped, a
respectively. The critical backing pressure of the 6000 l/s diffusion pump is
single-stage rotary vane pump operated without gas ballast will do in most
marked as V.B. (p = 4 10-1 mbar). Now the maximum throughput
cases. If (even slight) components of vapor are also to be pumped, one
Q = 9.5 mbar l/s is shown as horizontal line a. This line intersects the four
should in any case use a two-stage gas ballast pump as the backing pump
throughput curves. Counting from right to left, the first point of intersection
that corresponds to an intake pressure below the critical backing pressure

69
Vacuum generation

Throughput Q [mbar l s1]

Q [mbar l s1]
Intake pressure pa [mbar]

a) Pumping speed characteristic of a 6000 l/s diffusion pump b) Series of throughput curves for two-stage rotary
plunger pumps (V.B. = Critical forevacuum pressure)

Fig. 2.76 Diagram for graphically determining a suitable backing pump

of 4 10-1 mbar is made with throughput characteristic 2. This corresponds ratio K refers not to the atmospheric pressure (1013 mbar), but to the
to the two-stage rotary plunger pump with a nominal pumping speed of pressure at which the Roots pump is switched on.
100 m3/h. Therefore, this pump is the correct backing pump for the 6000 l/s
In the medium vacuum region, the gas evolution or the leak rate becomes
diffusion pump under the preceding assumption.
significantly evident. From the nomogram 9.10 in Section 9, the
However, if the pumping process is such that the maximum throughput of corresponding calculations of the pump-down time in this vacuum region
9.5 mbar l/s is unlikely, a smaller backing pump can, of course, be used. can be approximated.
This is self-explanatory, for example, from line b in Fig. 2.76 b, which
In many applications it is expedient to relate the attainable pressures at any
corresponds to a maximum throughput of only 2 mbar l/s. In this case a
given time to the pump-down time. This is easily possible with reference to
25 m3/h two-stage rotary-plunger pump would be sufficient.
the nomogram 9.7 in Section 9.

As a first example the pump-down characteristic that is, the relationship

2.3.3 Determination of pump-down time from pressure p (denoted as desired pressure pend) versus pumping time tp is
derived from the nomogram for evacuating a vessel of 5 m3 volume by the
nomograms
single-stage rotary plunger pump E 250 with an effective pumping speed of
In practice, for instance, when estimating the cost of a planned vacuum Seff = 250 m3/h and an ultimate pressure pend,p = 3 10-1 mbar when
plant, calculation of the pump-down time from the effective pumping speed operated with a gas ballast and at pend,p = 3 10-2 mbar without a gas
Seff, the required pressure p, and the chamber volume V by formulas ballast. The time constant = V / Seff (see equation 2.36) is the same in
presented would be too troublesome and time-consuming. Nomograms are both cases and amounts as per nomogram 9.7 to about 70 s (column 3).
very helpful here. By using the nomogram in Fig. 9.7 in Section 9, one can For any given value of pend > pend,p the straight line connecting the 70 s
quickly estimate the pump-down time for vacuum plants evacuated with point on column 3 with the (pend pend,p) value on the right-hand scale of
rotary pumps, if the pumping speed of the pump concerned is fairly column 5 gives the corresponding tp value. The results of this procedure
constant through the pressure region involved. By studying the examples are shown as curves a and b in Fig. 2.77.
presented, one can easily understand the application of the nomogram.
It is somewhat more tedious to determine the (pend,tp) relationship for a
The pump-down times of rotary vane and rotary piston pumps, insofar as combination of pumps. The second example discussed in the following
the pumping speed of the pump concerned is constant down to the deals with evacuating a vessel of 5 m3 volume by the pump combination
required pressure, can be determined by reference to example 1. Roots pump WA 1001 and the backing pump E 250 (as in the preceding
In general, Roots pumps do not have constant pumping speeds in the example). Pumping starts with the E 250 pump operated without gas ballast
working region involved. For the evaluation of the pump-down time, it alone, until the Roots pump is switched on at the pressure of 10 mbar. As
usually suffices to assume the mean pumping speed. Examples 2 and 3 of the pumping speed characteristic of the combination WA 1001/ E 250 in
the nomogram show, in this context, that for Roots pumps, the compression contrast to the characteristic of the E 250 is no longer a horizontal

70
 Vacuum generation
straight line over the best part of the pressure range (compare this to the Computer aided calculations at LEYBOLD
corresponding course of the characteristic for the combination WA 2001 / E Of course calculations for our industrial systems are performed by computer
250 in Fig. 2.19), one introduces, as an approximation, average values of programs. These require high performance computers and are thus usually
Seff, related to defined pressure ranges. In the case of the WA 1001/ E 250 not available for simple initial calculations.
combination the following average figures apply:

Seff = 800 m3/h in the range 10 1 mbar,

2.3.4 Evacuation of a chamber where gases and
Seff = 900 m3/h in the range 1 mbar to vapors are evolved
5 10-2 mbar,
The preceding observations about the pump-down time are significantly
Seff = 500 m3/h in the range 5 10-2 to altered if vapors and gases arise during the evacuation process. With bake-
5 10-3 mbar out processes particularly, large quantities of vapor can arise when the
The ultimate pressure of the combination WA 1001 / E 250 is: surfaces of the chamber are cleared of contamination. The resulting
Pend,p = 3 10-3 mbar. From these figures the corresponding time constants necessary pump-down time depends on very different parameters.
in the nomogram can be determined; from there, the pump-down time tp Increased heating of the chamber walls is accompanied by increased
can be found by calculating the pressure reduction R on the left side of desorption of gases and vapors from the walls. However, because the
column 5. The result is curve c in Fig. 2.77. higher temperatures result in an accelerated escape of gases and vapors
from the walls, the rate at which they can be removed from the chamber is
also increased.

The magnitude of the allowable temperature for the bake-out process in

question will, indeed, be determined essentially by the material in the
chamber. Precise pump-down times can then be estimated by calculation
only if the quantity of the evolving and pumped vapors is known. However,
since this is seldom the case except with drying processes, a quantitative
consideration of this question is abandoned within the scope of this
publication.

2.3.5 Selection of pumps for drying processes

Fundamentally, we must distinguish between short-term drying and drying
processes that can require several hours or even days. Independently of
the duration of drying, all drying processes proceed approximately as in
Section 2.24

As an example of an application, the drying of salt (short-term drying) is

described, this being an already well-proven drying process.

Drying of salt
First, 400 kg of finely divided salt with a water content of about 8 % by
mass is to be dried in the shortest possible time (about 1 h) until the water
content is less than 1 % by mass. The expected water evolution amounts to
about 28 kg. The salt in the chamber is continuously agitated during the
drying process and heated to about 80 C. The vacuum system is
schematically drawn in Fig. 2.78.

During the first quarter of drying time far more than half the quantity of
water vapor is evolved. Then the condenser is the actual main pump.
Because of the high water vapor temperature and, at the beginning of the
drying, the very high water vapor pressure, the condensation efficiency of
the condenser is significantly increased. In Fig. 2.78 it is understood that
two parallel condensers each of 1 m2 condensation surface can together
condense about 15 l of water at an inlet pressure of 100 mbar in 15 min.
However, during this initial process, it must be ensured that the water vapor
Fig. 2.77 Pumpdown time, tp, of a 5 m3 vessel using a rotary plunger pump E 250 having a pressure at the inlet port of the rotary piston pump does not exceed 60
nominal pumping speed of 250 m3/h with (a) and without (b) gas ballast, as well as
Roots/rotary plunger pump combination WA 1001 / E250 for a cut-in pressure of 10
mbar for the WA 1001 (e).

71
Vacuum generation
2. Predrying
During predrying depending on the pressure region in which the work is
carried out about 75 % of the moisture is drawn off. This predrying should
occupy the first third of the drying time. The rate at which predrying
proceeds depends almost exclusively on the sufficiency of the heat supply.
For predrying 1 ton of paper in 5 h, 60 kg of water must be evaporated; that
is, an energy expenditure of about 40 kWh is needed to evaporate water.
Since the paper must be heated to a temperature of about 120 C at the
same time, an average of about 20 kW must be provided. The mean vapor
evolution per hour amounts to 12 kg. Therefore, a condenser with a
capacity of 15 kg/h should be sufficient. If the paper is sufficiently preheated
(perhaps by air-circulation drying) before evacuation, in the first hour of
drying, double vapor evolution must be anticipated.

3. Main drying
If, in the second stage, the pressure in a further 5 h is to fall from 20 to
1 Vacuum chamber with salt 4 Throttle valve about 5.3 mbar and 75 % of the total moisture (i.e., 19 % of the total
filling 5 Rotary plunger pump moisture of 15 kg) is to be drawn off, the pump must, according to
2 RUVAC WA 501
3 Condensers equations (2.37) and (2.38), have a pumping speed of

Fig. 2.78 Vacuum diagram for drying of salt. Pump combination consisting of Roots pump, con- V p
Seff =
denser and rotary plunger pump for stepwise switching of the pumping process (see tp
text)

mbar (see Section 2.15 for further details). Since the backing pump has According to equation 1.7, 15 kg of water vapor corresponds at 15 C to a
only to pump away the small part of the noncondensable gases at this quantity of water vapor of
stage, a single-stage rotary piston pump TRIVAC S 65 B will suffice. With m R T 15 83.14 288
V p = =
increasing process time, the water vapor evolution decreases, as does the M 18
water vapor pressure in the condenser. After the water pressure in the
20000 mbar m3 subsequently
chamber falls below 27 mbar, the Roots pump (say, a Roots pump RUVAC
WA 501) is switched in. Thereby the water vapor is pumped more rapidly
20000
out of the chamber, the pressure increases in the condensers, and their Seff = = 750 m 3/h
condensation efficiency again increases. The condensers are isolated by a
5 5. 3
valve when their water vapor reaches its saturation vapor pressure. At this
point, there is a water vapor pressure in the chamber of only about 4 mbar, Hence the Roots pump RUVAC WA 1001 would be the suitable pump. The
and pumping is accomplished by the Roots pump with a gas ballast permissible remaining moisture in the product determines the attainable
backing pump until the water vapor pressure reaches about 0.65 mbar. ultimate pressure. The relationship between the ultimate pressure and the
From experience it can be assumed that the salt has now reached the remaining moisture is fixed for every product but different from product to
desired degree of dryness. product. LEYBOLD has many years of experience to its record regarding
applications in this area. Assume that a 0.1 % residual moisture content is
required, for which the necessary ultimate pressure is 6 10-2 mbar. During
Drying of paper
the last 5 h the remaining 6 % of the moisture content, or 5 kg of water, is
If the pumps are to be of the correct size for a longer process run, it is
removed. At a mean pressure of about 0.65 mbar, 2000 m3/h of vapor is
expedient to break down the process run into characteristic sections. As an
evolved. Two possibilities are offered:
example, paper drying is explained in the following where the paper has
an initial moisture content of 8 %, and the vessel has the volume V. a) One continues working with the above-mentioned Roots pump
WA 1001. The ultimate total pressure settles at a value according to the
1. Evacuation water vapor quantity evolving. One waits until a pressure of about
The backing pump must be suitably rated with regard to the volume of the 6.5 10-2 mbar is reached, which naturally takes a longer time.
vessel and the desired pump-down time. This pump-down time is arranged b From the beginning, a somewhat larger Roots pump is chosen (e.g., the
according to the desired process duration: if the process is to be finished RUVAC WA 2001 with a pumping speed of 2000 m3/h is suitable). For
after 12 15 h, the pump-down time should not last longer than 1 h. The larger quantities of paper (5000 kg, for example) such a pumping sys-
size of the backing pump may be easily calculated according to Section tem will be suitable which at a pumping speed for water vapor of up to
2.3.1. 20,000 m3/h automatically lowers the pressure from 27 to 10-2 mbar.
The entire time need for drying is significantly reduced when using such
pumps.

2.3.6 Flanges and their seals

72
 Vacuum generation
In general, demountable joints in metallic vacuum components, pumps, range requires a basically different approach and the use of CF flanges
valves, tubulations, and so on are provided with flanges. Vacuum fitted with metallic sealing rings.
components for rough, medium, and high vacuum from LEYBOLD are
equipped with the following standardized flange systems:

Small flanges (KF) (quick-action connections to DIN 28 403) of nominal 2.3.7 Choice of suitable valves
widths 10, 16, 20, 25, 32, 40 and 50 mm. The values 10, 16, 25 and 40 Vacuum technology puts great demands on the functioning and reliability of
are preferred widths according to the PNEUROP recommendations and the valves, which are often needed in large numbers in a plant. The
the ISO recommendations of the technical committee ISO/TC 112 (see demands are fulfilled only if correct shut-off devices are installed for each
also Section 11). For a complete connection of two identical flanges one application, depending on the method of construction, method of operation,
clamping ring and one centering ring are required. and size. Moreover, in the construction and operation of vacuum plants,
Clamp flanges (ISO-K) of nominal widths 65, 100, 160, 250, 320, 400, factors such as the flow conductance and leak-tightness of valves are of
500 and 630 mm. Also, these flanges correspond to the nominal widths great importance.
and construction of the PNEUROP and ISO/TC 112 recommendations. Valves are constructed so that they will not throttle pumping speed. Hence,
Clamp flanges are joined together by clamps or collar rings. Centering when opened fully, their conductance in the rough and medium vacuum
rings or gaskets are needed for sealing. regions equals that of corresponding tube components. For example, the
Bolted flanges (ISO-F) for the same nominal widths as above conductance of a right-angle valve will equal the conductance of a bent
(according to PNEUROP and ISO/TC 112). In special cases bolted tube of the same nominal bore and angle. Similarly, the conductance of the
flanges having a smaller nominal width are used. Clamp flanges and valve for molecular flow (i. e., in the high and ultrahigh vacuum regions), is
bolted flanges are in accordance with DIN 28 404. so high that no significant throttling occurs. Actual values for the
conductance of various components are given in the catalog.
The nominal width is approximately equal to the free inner diameter of the
flange in millimeters; greater deviations are exceptions, so the clamp flange To meet stringent leak-tightness demands, high-quality vacuum valves are
DN 63 has an inner diameter of 70 mm. See also Table XI in Section 9). designed so that gas molecules adhering to the surface of the valve shaft
are not transferred from the outer atmosphere into the vacuum during
operation. Such valves are therefore equipped with metal bellows for
High vacuum components are made of aluminum or stainless steel.
isolating the valve shaft from the atmosphere, or alternatively, they are fully
Stainless steel is slightly more expensive but offers a variety of advantages:
encapsulated, that is, only static seals exist between atmosphere and
lower degassing rate, corrosion resistant, can be degassed at temperatures
vacuum. This group is comprised of all medium and high vacuum valves
up to 200 C, metal seals are possible and stainless steel is much more
from LEYBOLD that are operated either manually or electropneumatically
resistant to scratching compared to aluminum.
(Fig. 2.80) and (Fig. 2.79). The leak rate of these valves is less than
10-9 mbar l/s.
Ultrahigh vacuum components are made of stainless steel and have CF
flanges bakeable to a high temperature. These components, including the
flanges, are manufactured in a series production, starting with a nominal
width of 16 up to 250 mm. CF flanges are available as fixed flanges or also
with rotatable collar flanges. They may be linked with CONFLAT flanges
from almost all manufacturers. Copper gaskets are used for sealing
purposes.

Basically, the flanges should not be smaller than the connecting tubes and
the components that are joined to them. When no aggressive gases and
vapors are pumped and the vacuum system is not exposed to a
temperature above 80 C, sealing with NBR (Perbunan) or CR (Neoprene)
flange O-rings is satisfactory for work in the rough-, medium-, and high vac-
uum regions. This is often the case when testing the operation of vacuum
systems before they are finally assembled.

All stainless steel flanges may be degassed at temperatures up to 200 C

without impairment. However, then Perbunan sealing material is not
suitable as a flange sealant. Rather, VITILAN (a special FPM) sealing
rings and also aluminum seals, which allow heating processes up to
150 C and 200 C respectively, should be used. After such degassing,
pressures down to 10-8 mbar, i.e. down to the UHV range, can be attained
in vacuum systems. 1 Casing 3 Compression spring
2 Valve disk 4 Solenoid coil
Generating pressures below 10-8 mbar requires higher bake-out
temperatures. As explained above (see Section 2.2.6) work in the UHV Fig. 2.79 Right angle vacuum valve with solenoid actuator

73
Vacuum generation
and motor driven, such as variable-leak valves. The variety is even more
enhanced by the various housing designs. In addition to the various
materials used, right-angle and straight-through valves are required.
Depending on their nominal width and intended application, flanges fitted to
valves may be small (KF), clamp (ISO-K), bolted (ISO-F), or UHV (CF).

In addition to the vacuum valves, which perform solely an isolation function

(fully open fully closed position), special valves are needed for special
functions. Typical are variable leak valves, which cover the leakage range
from 10-10 cm3/s (NTP) up to 1.6 103 cm3/s (NTP). These valves are
usually motor driven and suitable for remote control and when they are
connected to a pressure gauge, the process pressures can be set and
maintained. Other special valves fulfill safety functions, such as rapid,
automatic cut-off of diffusion pumps or vacuum systems in the event of a
power failure. For example, SECUVAC valves belong to this group. In the
event of a power failure, they cut off the vacuum system from the pumping
system and vent the forevacuum system. The vacuum system is enabled
only after a certain minimum pressure (about 200 mbar) has been attained
once the power has been restored.

When aggressive gases or vapors have to be pumped, valves made of

1 Casing 4 Compressed air supply
2 Valve disk 5 Piston stainless steel and sealed with VITILAN sealant are usually used. For
3 Bellows nuclear technology, valves have been developed that are sealed with
special elastomer or metal gaskets. We will be pleased to provide further
Fig. 2.80 Right angle vacuum valve with electropneumatic actuator
design information for your area of application upon request.

Valves sealed with oil or grease can be used for highly stringent demands.
Their leakage rate is also about 10-9 mbar l/s. However, a special case is
the pendulum-type gate valve. Despite its grease-covered seal, the leak
rate between vacuum and external atmosphere is virtually the same as for
bellows-sealed valves because when the valve is in operation the shaft
carries out only a rotary motion so that no gas molecules are transferred
into the vacuum. Pendulum-type gate valves are not manufactured by
LEYBOLD.

For working pressures down to 10-7 mbar, valves of standard design suffice
because their seals and the housing materials are such that permeation
and outgassing are insignificant to the actual process. If pressures down to
10-9 mbar are required, baking up to 200 C is usually necessary, which
requires heat resistant sealing materials (e.g., VITILANh) and materials of
high mechanical strength, with prepared (inner) surfaces and a low
outgassing rate. Such valves are usually made of stainless steel. Flange
connections are sealed with aluminum gaskets, so permeation problems of
elastomer seals are avoided. In the UHV range these issues are of special
significance so that mainly metallic seals must be used. The gas molecules
bonded to the surface of the materials have, at pressures below 10-9 mbar,
a very great influence. They can only be pumped away within a reasonable
period of time by simultaneous degassing. Degassing temperatures up to
500 C required in UHV systems, pose special requirements on the sealing
materials and the entire sealing geometry. Gaskets made of gold or copper
must be used.

The various applications require valves with different drives, that is, valves
that are manually operated, electropneumatically- or magnetically-operated,

74
 Vacuum generation
2.3.8 Gas locks and seal-off fittings
In many cases it is desirable not only to be able to seal off gas-filled or
evacuated vessels, but also to be in a position to check the pressure or the
vacuum in these vessels at some later time and to post-evacuate or
supplement or exchange the gas filling.

This can be done quite easily with a seal-off fitting from LEYBOLD which is
actuated via a corresponding gas lock. The small flange connection of the
evacuated or gas-filled vessel is hermetically sealed off within the tube by a
small closure piece which forms the actual valve. The gas lock required for
actuation is removed after evacuation or filling with gas. Thus one gas lock
will do to actuate any number of seal-off fittings. Shown in Fig. 2.81 is a
sectional view of such an arrangement. Gas locks and seal-off fittings are
manufactured by LEYBOLD having a nominal width of DN 16 KF, DN 25 KF
and DN 40 KF. They are made of stainless steel. The leak rate of the seal-
off fittings is less than 1 10-9 mbar l/s. They can sustain overpressures up
to 2.5 bar, are temperature resistant up to 150 C and may be protected
against dirt by a standard blank flange.

Typical application examples are double-walled vessels with an insulating

vacuum, like Dewar vessels, liquid gas vessels (tanks) or long distance
energy pipelines and many more. They are also used for evacuation or
post-evacuation of reference and support vacua in scientific instruments
seal-off fittings with gas locks are often used. Previously it was necessary
to have a pump permanently connected in order to post-evacuate as
required. Through the use of gas locks with seal-off fittings a vacuum-tight
seal is provided for the vessel and the pump is only required from time to
time for checking or post-evacuation.

DN

h1 h2

Fig. 2.81 Gas lock with centering ring and seal-off fitting, sectional view

75
Vacuum measurement
3. Vacuum measurement, monitoring, control 3.1 Fundamentals of low-pressure measure-
ment
and regulation Vacuum gauges are devices for measuring gas pressures below atmos-
The pressures measured in vacuum technology today cover a range from pheric pressure (DIN 28 400, Part 3, 1992 issue). In many cases the pres-
1013 mbar to 10-12 mbar, i.e. over 15 orders of magnitude. The enormous sure indication depends on the nature of the gas. With compression vacu-
dynamics involved here can be shown through an analogy analysis of vacu- um gauges it should be noted that if vapors are present, condensation may
um pressure measurement and length measurement, as depicted in Table occur due to the compression, as a result of which the pressure indication
3.1. is falsified. Compression vacuum gauges measure the sum of the partial
pressures of all gas components that do not condense during the measure-
Analogy analysis
ment procedure. In the case of mechanically compressing pumps, the final
Determination by Absolute
partial pressure can be measured in this way (see 1.1). Another way of
means of pressure Length
measuring this pressure, is to freeze out the condensable components in
empirical world
an LN2 cold trap. Exact measurement of partial pressures of
of human beings 1 bar 1m
certain gases or vapors is carried out with the aid of partial pressure mea-
simple measuring
suring instruments which operate on the mass spectrometer principle (see
methods > 1 mbar > 1 mm
section 4).
mechanical
measuring
methods > 103 mbar > 1 mm Dependence of the pressure indication on the type of gas
indirect A distinction must be made between the following vacuum gauges:
methods 109 mbar 1/100 atom 1. Instruments that by definition measure the pressure as the force which
extreme indirect 0.18 acts on an area, the so-called direct or absolute vacuum gauges.
methods 1012 mbar electron According to the kinetic theory of gases, this force, which the particles
Table 3.1 exert through their impact on the wall, depends only on the number of
gas molecules per unit volume (number density of molecules n) and
Measuring instruments designated as vacuum gauges are used for mea- their temperature, but not on their molar mass. The reading of the mea-
surement in this broad pressure range. Since it is impossible for physical suring instrument is independent of the type of gas. Such units
reasons to build a vacuum gauge which can carry out quantitative measure- include liquid-filled vacuum gauges and mechanical vacuum gauges.
ments in the entire vacuum range, a series of vacuum gauges is available,
2. Instruments with indirect pressure measurement. In this case, the
each of which has a characteristic measuring range that usually extends over
pressure is determined as a function of a pressure-dependent (or more
several orders of magnitude (see Fig. 9.16a). In order to be able to allocate accurately, density-dependent) property (thermal conductivity, ionization
the largest possible measuring ranges to the individual types of vacuum probability, electrical conductivity) of the gas. These properties are
gauges, one accepts the fact that the measurement uncertainty rises very dependent on the molar mass as well as on the pressure. The pressure
rapidly, by up to 100 % in some cases, at the upper and lower range limits. reading of the measuring instrument depends on the type of gas.
This interrelationship is shown in Fig. 3.1 using the example of the VISCO-
The scales of these pressure measuring instruments are always based on
VAC. Therefore, a distinction must be made between the measuring range
air or nitrogen as the test gas. For other gases or vapors correction factors,
as stated in the catalogue and the measuring range for precise measure-
usually based on air or nitrogen, must be given (see Table 3.2). For precise
ment. The measuring ranges of the individual vacuum gauges are limited in
pressure measurement with indirectly measuring vacuum gauges that
the upper and lower range by physical effects. determine the number density through the application of electrical energy
(indirect pressure measurement), it is important to know the gas composi-
tion. In practice, the gas composition is known only as a rough approxima-
tion. In many cases, however, it is sufficient to know whether light or heavy
molecules predominate in the gas mixture whose pressure is to be mea-
sured (e.g. hydrogen or pump fluid vapor molecules).
Relative measurement uncertainty (%)

20

favorable measuring range Example: If the pressure of a gas essentially consisting of pump fluid mole-
15
(relative measurement uncertainty < 5%) cules is measured with an ionization vacuum gauge, then the pressure
10
reading (applying to air or N2), as shown in Table 3.2, is too high by a factor
of about 10.
5
Measurement of pressures in the rough vacuum range can be carried out
1 relatively precisely by means of vacuum gauges with direct pressure mea-
6
10 105 104 103 102 101 1
surement. Measurement of lower pressures, on the other hand, is almost
Pressure (mbar)
always subject to a number of fundamental errors that limit the measuring
Fig. 3.1 Measurement uncertainty distribution over the measuring range: VISCOVAC accuracy right from the start so that it is not comparable at all to the degree

76
 Vacuum measurement
of accuracy usually achieved with measuring instruments. In order to mea- 3.2 Vacuum gauges with pressure reading that
sure pressure in the medium and high vacuum ranges with a measurement is independent of the type of gas
uncertainty of less than 50 %, the person conducting the experiment must
proceed with extreme care. Pressure measure-ments that need to be accu- Mechanical vacuum gauges measure the pressure directly by recording the
rate to a few percent require great effort and, in general, the deployment of force which the particles (molecules and atoms) in a gas-filled space exert
special measuring instruments. This applies particularly to all pressure mea- on a surface by virtue of their thermal velocity.
surements in the ultrahigh vacuum range
(p < 10-7 mbar).
3.2.1 Bourdon vacuum gauges
To be able to make a meaningful statement about a pressure indicated by
a vacuum gauge, one first has to take into account at what location and in The interior of a tube bent into a circular arc (so-called Bourdon tube) (3) is
what way the measuring system is connected. In all pressure areas where connected to the vessel to be evacuated (Fig. 3.2). Through the effect of
laminar flows prevail (1013 > p > 10-1 mbar), note must be taken of pres- the external air pressure the end of the tube is deflected to a greater or
sure gradients caused by pumping. Immediately in front of the pump (as lesser extent during evacuation and the attached pointer mechanism (4)
seen from the vessel), a lower pressure is created than in the vessel. Even and (2) is actuated. Since the pressure reading depends on the external
components having a high conductance may create such a pressure gradi- atmospheric pressure, it is accurate only to approximately 10 mbar, provid-
ent. Finally, the conductance of the connecting line between the vacuum ed that the change in the ambient atmospheric pressure is not corrected.
system and the measuring system must not be too small because the line
will otherwise be evacuated too slowly in the pressure region of laminar
flow so that the indicated pressure is too high. 3.2.2 Diaphragm vacuum gauges
The situation is more complicated in the case of high and ultrahigh vacuum.
According to the specific installation features, an excessively high pressure 3.2.2.1 Capsule vacuum gauges
or, in the case of well-degassed measuring tubes, an excessively low pres- The best-known design of a diaphragm vacuum gauge is a barometer with
sure may be recorded due to outgassing of the walls of the vacuum gauge an aneroid capsule as the measuring system. It contains a hermetically
or inadequate degassing of the measuring system. In high and ultrahigh sealed, evacuated, thin-walled diaphragm capsule made of a copper-berylli-
vacuum, pressure equalization between the vacuum system and the mea- um alloy. As the pressure drops, the capsule diaphragm expands. This
suring tubes may take a long time. If possible, so-called nude gauges are movement is transmitted to a point by a lever system. The capsule vacu-
used. The latter are inserted directly in the vacuum system, flange-mount- um gauge, designed according to this principle, indicates the pressure on a
ed, without a connecting line or an envelope. Special consideration must linear scale, independent of the external atmospheric pressure.
always be given to the influence of the measuring process itself on the
pressure measurement. For example, in ionization vacuum gauges that
work with a hot cathode, gas particles, especially those of the higher hydro-
carbons, are thermally broken down. This alters the gas composition. Such
effects play a role in connection with pressure measurement in the ultrahigh
vacuum range. The same applies to gas clean-up in ionization vacuum
gauges, in particular Penning gauges (of the order of 10-2 to 10-1 l/s).
Contamination of the measuring system, interfering electrical and magnetic
fields, insulation errors and inadmissibly high ambient temperatures falsify
pressure measurement. The consequences of these avoidable errors and
the necessary remedies are indicated in the discussion of the individual
measuring systems and in summary form in section 8.4.

Selection of vacuum gauges

The desired pressure range is not the only factor considered when select-
ing a suitable measuring instrument. The operating conditions under which
the gauge works also play an important role. If measurements are to be
carried out under difficult operating conditions, i.e. if there is a high risk of
contamination, vibrations in the tubes cannot be ruled out, air bursts can be
expected, etc., then the measuring instrument must be robust. In industrial
facilities, Bourdon gauges, diaphragm vacuum gauges, thermal conductivity
vacuum gauges, hot cathode ionization vacuum gauges and Penning vacu-
um gauges are used. Some of these measuring instruments are sensitive to
adverse operating conditions. They should and can only be used success- 1 Connecting tube to 3 Bourdon tube
fully if the above mentioned sources of errors are excluded as far as possi- connection flange 4 Lever system
2 Pointer
ble and the operating instructions are followed.
Fig. 3.2 Cross-section of a Bourdon gauge

77
Vacuum measurement
3.2.2.2 DIAVAC diaphragm vacuum gauge
The most accurate pressure reading possible is frequently required for lev-
els below 50 mbar. In this case, a different diaphragm vacuum gauge is
more suitable, i.e. the DIAVAC, whose pressure scale is considerably
extended between 1 and 100 mbar. The section of the interior in which the
lever system (2) of the gauge head is located (see Fig. 3.3) is evacuated to
a reference pressure pref of less than 10-3 mbar. The closure to the vessel
is in the form of a corrugated diaphragm (4) of special steel. As long as the
vessel is not evacuated, this diaphragm is pressed firmly against the wall
(1). As evacuation increases, the difference between the pressure to be Fig. 3.4 Piezoelectric sensor (basic diagram)
measured px and the reference pressure decreases. The diaphragm bends
only slightly at first, but then below 100 mbar to a greater degree. With the is recommended because its reading (see above) is considerably more
DIAVAC the diaphragm deflection is again transmitted to a pointer (9). In accurate. For extremely precise measuring accuracy requirements precision
particular the measuring range between 1 and 20 mbar is considerably diaphragm vacuum gauges should be used. If low pressures have to be
extended so that the pressure can be read quite accurately (to about 0.3 measured accurately and for this reason a measuring range of, for exam-
mbar). The sensitivity to vibration of this instrument is somewhat higher ple, up to 20 mbar is selected, higher pressures can no longer be mea-
than for the capsule vacuum gauge. sured since these gauges have a linear scale. All mechanical vacuum
gauges are sensitive to vibration to some extent. Small vibrations, such as
those that arise in the case of direct connection to a backing pump, are
3.2.2.3 Precision diaphragm vacuum gauges generally not detrimental.

A significantly higher measuring accuracy than that of the capsule vacuum

gauge and the DIAVAC is achieved by the precision diaphragm vacuum
3.2.2.4 Capacitance diaphragm gauges
gauge. The design of these vacuum gauges resembles that of capsule vac-
uum gauges. The scale is linear. The obtainable degree of precision is the Deflection of a diaphragm can also be electrically measured as strain or
maximum possible with present-day state-of-the-art equipment. These as a change in capacitance. In the past, four strain gauges, which change
instruments permit measurement of 10-1 mbar with a full-scale deflection of their resistance when the diaphragm is deflected, i.e. under tensile load,
20 mbar. The greater degree of precision also means a higher sensitivity to were mounted on a metallic diaphragm in a bridge circuit. At LEYBOLD
vibration. such instruments have been given a special designation, i.e. MEMBRA-
NOVAC. Later, silicon diaphragms that contained four such strain resis-
Capsule vacuum gauges measure pressure accurately to 10 mbar (due to
tances directly on their surface were used. The electrical arrangement
the linear scale, they are least accurate at the low pressure end of the
again consisted of a bridge circuit, and a constant current was fed in at two
scale). If only pressures below 30 mbar are to be measured, the DIAVAC
opposite corner points while a linear voltage signal proportional to the pres-
sure was picked up at the two other corner points. Fig. 3.4 illustrates the
principle of this arrangement. Such instruments were designated as PIEZO-
VAC units and are still in use in many cases. Today the deflection of the
diaphragm is measured as the change in capacitance of a plate capacitor:
one electrode is fixed, the other is formed by the diaphragm. When the

1 2

C1 C2

1 Base plate 7 Mirror sheet

2 Lever system 8 Plexiglass sheet
3 Connecting flange 9 Pointer
4 Diaphragm 10 Glass bett p1 p2
5 Reference pressure 11 Mounting plate
pref 12 Housing
6 Pinch-off end

78
 Vacuum measurement

C ~ A/d
C = capacitance Diaphragm
A = area (Inconel) Reference chamber closure
d = distance C ~ A/d
C = capacitance
A = area
Grid + reference chamber closure d = distance
Capacitor plates
Amplifier + 15 V DC Diaphragm
Sensor body Signal converter
(ceramic)
15 V DC (ceramic) + amplifier

0 10 V

Electrode 24 V DC, 4 20 mA

right: MEMBRANOVAC (aluminum oxide diaphragm)

left: CAPACITRON (Inconel diaphragm)

Fig. 3.6 Capacitive sensors (basic diagram)

diaphragm is deflected, the distance between the electrodes and thus few mbar). Unfortunately their use in technical plants is limited because of
capacitance of the capacitor is altered. Fig. 3.5 illustrates the principle of their size and proneness to breakage (see 3.4.1a).
this arrangement. A distinction is made between sensors with metallic and
In the evacuated limb of the U-tube vacuum gauge a constant pressure is
those with ceramic diaphragms. The structure of the two types is similar
maintained equal to the vapor pressure of mercury at room temperature
and is shown on the basis of two examples in Fig. 3.6. Capacitance
(about 10-3 mbar). The other limb is connected to the volume in which the
diaphragm gauges are used from atmospheric pressure to 110-3 mbar
pressure is to be measured. From the difference in the levels of the two
(from 10-4 mbar the measurement uncertainty rises rapidly). To ensure suffi-
columns, the pressure to be measured can be determined on the mbar
cient deflection of the diaphragms at such low pressures, diaphragms of
scale provided. The reading is independent of the atmospheric pressure.
varying thicknesses are used for the various pressure levels. In each case,
the pressure can be measured with the sensors to an accuracy of 3 powers
of ten:
1013 to 1 mbar 3.2.3.2 Compression vacuum gauges (according to
100 to 101 mbar McLeod)
10 to 102 mbar und The compression vacuum gauge developed by McLeod in 1874 is a very
1 to 103 mbar. rarely used type of vacuum gauge today. In its refined form the instrument
If the pressures to be measured exceed these range limits, it is recom- can be used for absolute pressure measurement in the high vacuum range
mended that a multichannel unit with two or three sensors be used, possi- down to 10-5 mbar. In the past it was frequently used as a reference instru-
bly with automatic channel changeover. The capacitance diaphragm gauge ment for the calibration of medium and sometimes also of high vacuum
thus represents, for all practical purposes, the only absolute pressure mea- gauges. For such measurements, however, numerous precautionary rules
suring instrument that is independent of the type of gas and designed for had to be taken into account before it was possible to assess the measur-
pressures under 1 mbar. Today two types of capacitive sensors are avail- ing accuracy. The pressure is measured by compressing a quantity of gas
able: that initially occupies a large volume into a smaller volume by raising a mer-
cury level. The increased pressure obtained in this manner can be mea-
1) Sensors DI 200 and DI 2000 with aluminum oxide diaphragms, which sured in the same way as in a U-tube manometer and from it the original
are particularly overload-free, with the MEMBRANOVAC DM 11 and pressure is calculated (see equations below).
DM 12 units.
2) Sensors with Inconel diaphragms CM 1, DM 10, CM 100, CM 1000 According to the type of scale division, a distinction is made between two
with extremely high resolution, with the DM 21 and DM 22 units. forms of compression vacuum gauges: those with a linear scale (see Fig.
3.7) and those with a square-law scale (see Fig. 3.8). In the case of the
compression vacuum gauges of the McLeod linear-scale type, the ratio of
the enclosed residual volume Vc to the total volume V must be known for
3.2.3 Liquid-filled (mercury) vacuum gauges
each height of the mercury level in the measurement capillary; this ratio is
shown on the scale provided with the instrument. In the case of compres-
3.2.3.1 U-tube vacuum gauges sion vacuum gauges with a square-law scale, the total volume and the cap-
U-tube vacuum gauges filled with mercury are the simplest and most exact illary diameter d must be known.
instruments for measuring pressure in the rough vacuum range (1013 to a Nowadays a shortened McLeod type compression vacuum gauge accord-
ing to Kammerer is used to measure the partial final pressure of
mechanically compressing pumps. Through the high degree of compres-

79
Vacuum measurement
Upper limit for:
Vcmax. = 1 cm3
hmax. = 100 mm Upper limit for:
d = 2.5 mm
Upper limit for:
measuring Vcmax. = 0.1 cm3 Upper limit for:

measuring
range hmax. = 100 mm d = 1 mm

range
Pressure p

Lower limit for:

d = 2.5 mm
measuring
range

measuring
range
Lower limit for:
Vcmin. = 5 103 Lower limit for:
cm3hmin. = 1 mm d = 1 mm

Volume V [cm3] Volume V [cm3]

Fig. 3.7 McLeod compression vacuum gauge with linear scale (equation 3.1b) Fig. 3.8 McLeod compression vacuum gauge with square-law scale (equation 3.1f)

sion the condensable gas components (vapors) are discharged as liquid

p = h2 d
2
(the volume of the same mass is then smaller by a factor of around 105 and
(3.1e)
can be neglected in the measurement) so that only the pressure of the per- 4 V
manently gaseous components is measured (this is where the expression
permanent gases comes from). that is, a square-law scale in mm (torr) if d and V are measured in mm or
mm3. If the scale is to be divided into mbar, then the equation is:
Principle of measurement with compression vacuum gauges
2
If h is the difference in the mercury level between the measurement capil- p = h2 d (3.1f)
lary and the reference capillary (measured in mm), then it follows 3 V
from the Boyle-Mariotte law:
where h in mm
p V = (p + h) Vc (3.1)
d in mm
Vc and V in mm3
p = h (3.1a)
V Vc
Compression vacuum gauges ensure a reading of the sum of all partial
pressures of the permanent gases, provided that no vapors are present that
p measured in mm of mercury (= torr). If Vc << V, then:
condense during the compression procedure.
Vc
p = h (3.1b)
The measuring range between the top and bottom ends is limited by the
V
maximum and minimum ratios of the capillary volume to the total volume
Vc and V must be known, h is read off (linear scale). (see Figs. 3.7 and 3.8). The accuracy of the pressure measurement
depends to a great extent on the reading accuracy. By using a vernier and
These relationships remain unchanged if the difference in level is read off a
mirror, pressure measurements with an accuracy of 2 % can be
scale with mbar division. The pressure is then obtained in mbar:
achieved. In the low pressure range, where h is very small, this accuracy is
p = 4 h Vc
no longer attainable, chiefly because small geometric deviations have a
h in mm (3.1c)
3 V very noticeable effect at the closed end of the capillary (systematic error).

The presence of vapors that may condense during compression influences

If during measurement the mercury level in the measurement capillary is
the measurement, often in an indefinite manner. One can easily determine
always set so that the mercury level in the reference capillary corresponds
whether vapors having a pressure that is not negligible are present. This
to the upper end of the measurement capillary (see Figs. 3.7 and 3.8), the
can be done by setting different heights h in the measurement capillary
volume Vc is always given by:
under constant pressure while using the linear scale and then calculating p
Vc = h d 2 (3.1d) according to equation 3.1b. If no vapors are present, or only those whose
4
pressure is negligible at room temperature (such as mercury), then the
same value of p must result for each h.
h ....difference in level, see Fig. 3.5
The scale of compression vacuum gauges can be calculated from the geo-
d ....inside diameter of measurement capillary
metric dimensions. This is why they were used in the past by official cali-
If this term is substituted for Vc in equation (3.1b), the result is: bration stations as normal pressure (see equation 3.4.1a).

80
 Vacuum measurement
3.3 Vacuum gauges with gas-dependent pres-
sure reading
This type of vacuum gauge does not measure the pressure directly as an
area-related force, but indirectly by means of other physical variables that
are proportional to the number density of particles and thus to the pressure.
The vacuum gauges with gas-dependent pressure reading include: the
decrement gauge (3.3.1), the thermal conductivity vacuum gauge (3.3.2)
and the ionization vacuum gauge having different designs (3.3.3).

The instruments consist of the actual sensor (gauge head, sensor) and the
control unit required to operate it. The pressure scales or digital displays
are usually based on nitrogen pressures; if the true pressure pT of a gas (or
vapor) has to be determined, the indicated pressure pI must be multiplied
by a factor that is characteristic for this gas. These factors differ, depending
on the type of instrument, and are either given in tabular form as factors 1 Ball 3 Permanent magnets
2 Measuring tube, 4 Stabilization coils
independent of pressure (see Table 3.2) or, if they depend on the pressure, closed at one end, welded 5 4 drive coils
must be determined on the basis of a diagram (see Fig. 3.11). into 6 Bubble level
connection flange 7 7 Connection flange
In general, the following applies:
Fig. 3.9 Cross-section of the gauge head of a VISCOVAC VM 212 spinning rotor gauge (SRG)
True pressure pT = indicated pressure pI correction factor
If the pressure is read off a nitrogen scale but not corrected, one refers to
p = gas pressure
nitrogen equivalent values.
r = radius of the ball
In all electrical vacuum gauges (they include vacuum gauges that are = density of the ball material
dependent on the type of gas) the increasing use of computers has led to -c = mean speed of the gas particles,
the wish to display the pressure directly on the screen, e.g. to insert it at the dependent on type of gas
appropriate place in a process flow diagram. To be able to use the most = coefficient of friction of the ball, independent of the
standardized computer interfaces possible, so-called transmitters (signal type of gas, nearly 1.
converters with standardized current outputs) are built instead of a sensor
As long as a measurement uncertainty of 3 % is sufficient, which is usually
and display unit (e.g. THERMOVAC transmitter, Penning transmitter, IONI-
the case, one can apply = 1 so that the sensitivity of the spinning rotor
VAC transmitter). Transmitters require a supply voltage (e.g. +24 volts) and
gauge (SRG) with rotating steel ball is given by the calculable physical size
deliver a pressure-dependent current signal that is linear over the entire
of the ball, i.e. the product radius x density r (see equation 3.2). Once a
measuring range from 4 to 20 mA or 0 10 V. The pressure reading is not
ball has been calibrated, it is suitable for use as a transfer standard, i.e.
provided until after supply of this signal to the computer and processing by
as a reference device for calibrating another vacuum gauge through com-
the appropriate software and is then displayed directly on the screen.
parison, and is characterized by high long-term stability. Measurements with
the VISCOVAC are not limited to measurement of the pressure, however.
Other variables involved in the kinetic theory of gases, such as mean free
3.3.1 Spinning rotor gauge (SRG) (VISCOVAC) path, monolayer time, particle number density and impingement rate, can
Pressure-dependent gas friction at low gas pressures can be utilized to also be measured. The instrument permits storage of 10 programs and
measure pressures in the medium and high vacuum range. In technical easy changeover between these programs. The measuring time per slow-
instruments of this kind a steel ball that has a diameter of several millime- ing-down operation is between 5 seconds for high pressures and about 40
ters and is suspended without contact in a magnetic field (see Fig. 3.9) is seconds for lower pressures. The measurement sequence of the instrument
used as the measuring element. The ball is set into rotation through an is controlled fully automatically by a microprocessor so that a new value is
electromagnetic rotating field: after reaching a starting speed (around 425 displayed after every measurement (slowing-down procedure). The pro-
Hz), the ball is left to itself. The speed then declines at a rate that depends grams additionally enable calculation of a number of statistical variables
on the prevailing pressure under the influence of the pressure-dependent (arithmetic mean, standard deviation) after a previously specified number of
gas friction. The gas pressure is derived from the relative decline of the measurements.
speed f (slowing down) using the following equation:
While in the case of the kinetic theory of gases with VISCOVAC the count-
ing of particles directly represents the measuring principle (transferring the
particle pulses to the rotating ball, which is thus slowed down).

df 10 p
f =
dt c r (3.2)

81
Vacuum measurement
With other electrical measuring methods that are dependent on the type conduction through the gas so that the bridge becomes out of balance. The
of gas, the particle number density is measured indirectly by means of bridge current serves as a measure for the gas pressure, which is indicated
the amount of heat lost through the particles (thermal conductivity vacuum on a measuring scale. In the THERMOVAC thermal conductivity gauges
gauge) or by means of the number of ions formed (ionization vacuum with constant resistance which are almost exclusively built today, the
gauge). sensing filament is also a branch of a Wheatstone bridge. The heating volt-
age applied to this bridge is regulated so that the resistance and therefore
the temperature of the filament remain constant, regardless of the heat
3.3.2 Thermal conductivity vacuum gauges loss. This means that the bridge is always balanced. This mode of regula-
tion involves a time constant of a few milliseconds so that such instruments,
Classical physics teaches and provides experimental confirmation that the in contrast to those with variable resistance, respond very quickly to pres-
thermal conductivity of a static gas is independent of the pressure at higher sure changes. The voltage applied to the bridge is a measure of the pres-
pressures (particle number density), p > 1 mbar. At lower pressures, sure. The measuring voltage is corrected electronically such that an approx-
p < 1 mbar, however, the thermal conductivity is pressure-dependent imately logarithmic scale is obtained over the entire measuring range.
(approximately proportional 1 / M). It decreases in the medium vacuum Thermal conductivity vacuum gauges with constant resistance have a mea-
range starting from approx. 1 mbar proportionally to the pressure and suring range from 10-4 to 1013 mbar. Due to the very short response time,
reaches a value of zero in the high vacuum range. This pressure depen- they are particularly suitable for controlling and pressure monitoring applica-
dence is utilized in the thermal conductivity vacuum gauge and enables tions (see section 3.5). The measurement uncertainty varies in the different
precise measurement (dependent on the type of gas) of pressures in the pressure ranges. The maximum error at full-scale deflection is about 1 to 2
medium vacuum range. %. In the most sensitive range, i.e. between 10-3 and 1 mbar, this corre-
The most widespread measuring instrument of this kind is the Pirani vacu- sponds to around 10 % of the pressure reading. The measurement uncer-
um gauge. A current-carrying filament with a radius of r1 heated up to tainty is significantly greater outside this range.
around 100 to 150 C (Fig. 3.10) gives off the heat generated in it to the As in all vacuum gauges dependent on the type of gas, the scales of the
gas surrounding it through radiation and thermal conduction (as well as, of indicating instruments and digital displays in the case of thermal conductivi-
course, to the supports at the filament ends). In the rough vacuum range ty vacuum gauges also apply to nitrogen and air. Within the limits of error,
the thermal conduction through gas convection is virtually independent of the pressure of gases with similar molecular masses, i.e. O2, CO and oth-
pressure (see Fig. 3.10). If, however, at a few mbar, the mean free path of ers, can be read off directly. Calibration curves for a series of gases are
the gas is of the same order of magnitude as the filament diameter, this shown in Fig. 3.11.
type of heat transfer declines more and more, becoming dependent on the
density and thus on the pressure. Below 10-3 mbar the mean free path of a An extreme example of the discrepancy between true pressure pT and indi-
gas roughly corresponds to the size of radius r2 of the measuring tubes. cated pressure pI in pressure measurement is the admission of air to a vac-
The sensing filament in the gauge head forms a branch of a Wheatstone uum system with argon from a pressure cylinder to avoid moisture (pump-
bridge. In the THERMOTRON thermal conductivity gauges with variable ing time). According to Fig. 3.11, one would obtain a pI reading of only 40
resistance which were commonly used in the past, the sensing filament mbar on reaching an Ar atmospheric pressure pT with a THERMOVAC as
was heated with a constant current. As gas pressure increases, the temper-
ature of the filament decreases because of the greater thermal

N2, O2 air pI = pT

I II III

r2 - pI < p T
l r r
Wrmeflu

True pressure [mbar] pW

r1 - 2 1
- l r1
l r2
Heat loss

-
l r1
Abgefhrter

pI > p T

105 104 103 102 101 1 10 100

Druck [mbar][mbar]
Pressure
I Thermal dissipation due to the gas, pressure-depen-
to radiation and conduction dent
in the metallic ends III Thermal dissipation due
II Thermal dissipation due to radiation and convection Indicated pressure [mbar] pI

Fig. 3.10 Dependence of the amount heat dissipated by a heated filament (radius r1) in a tube Fig. 3.11 Calibration curves of THERMOVAC gauges for various gases, based on nitrogen
(radius r2) at a constant temperature difference on the gas pressure (schematic dia- equivalent reading
gram).

82
 Vacuum measurement
a pressure measuring instrument. Argon might escape from the vessel 3.3.3.1 Cold-cathode ionization vacuum gauges
(cover opens, bell jar rises). For such and similar applications, pressure (Penning vacuum gauges)
switches or vacuum gauges that are independent of the type of gas must
be used (see section 3.2). Ionization vacuum gauges which operate with cold discharge are called
cold-cathode- or Penning vacuum gauges. The discharge process in a
measuring tube is, in principle, the same as in the electrode system of a
sputter ion pump (see section 2.1.8.3). A common feature of all types of
3.3.3 Ionization vacuum gauges cold-cathode ionization vacuum gauges is that they contain just two unheat-
Ionization vacuum gauges are the most important instruments for measur- ed electrodes, a cathode and an anode, between which a so-called cold
ing gas pressures in the high and ultrahigh vacuum ranges. They measure discharge is initiated and maintained by means of a d.c. voltage (of around
the pressure in terms of the number density of particles proportional to the 2 kV) so that the discharge continues at very low pressures. This is
pressure. The gas whose pressure is to be measured enters the gauge achieved by using a magnetic field to make the paths of the electrons long
heads of the instruments and is partially ionized with the help of an electric enough so that the rate of their collision with gas molecules is sufficiently
field. Ionization takes place when electrons are accelerated in the electric large to form the number of charge carriers required to maintain the dis-
field and attain sufficient energy to form positive ions on impact with gas charge. The magnetic field (see Fig. 3.12) is arranged such that the mag-
molecules. These ions transmit their charge to a measuring electrode (ion netic field lines of force cross the electric field lines. In this way the elec-
collector) in the system. The ion current, generated in this manner (or, more trons are confined to a spiral path. The positive and negative charge carri-
precisely, the electron current in the feed line of the measuring electrode ers produced by collision move to the corresponding electrodes and form
that is required to neutralize these ions) is a measure of the pressure the pressure-dependent discharge current, which is indicated on the meter.
because the ion yield is proportional to the particle number density and thus The reading in mbar depends on the type of gas. The upper limit of the
to the pressure. measuring range is given by the fact that above a level of several
10-2 mbar the Penning discharge changes to a glow discharge with intense
The formation of ions is a consequence of either a discharge at a high elec-
light output in which the current (at constant voltage) depends only to a
tric field strength (so-called cold-cathode or Penning discharge, see 3.3.3.1)
small extent on the pressure and is therefore not suitable for measurement
or the impact of electrons that are emitted from a hot cathode (see 3.3.3.2).
purposes. In all Penning gauges there is considerably higher gas sorption
Under otherwise constant conditions, the ion yield and thus the ion current than in ionization vacuum gauges that operate with a hot cathode. A
depend on the type of gas since some gases are easier to ionize than oth- Penning measuring tube pumps gases similarly to a sputter ion pump
ers. As all vacuum gauges with a pressure reading that is dependent on the (S 10-2 l/s). Here again the ions produced in the discharge are accelerat-
type of gas, ionization vacuum gauges are calibrated with nitrogen as the ed towards the cathode where they are partly retained and partly cause
reference gas (nitrogen equivalent pressure, see 3.3). To obtain the true sputtering of the cathode material. The sputtered cathode material forms a
pressure for gases other than nitrogen, the read-off pressure must be multi-
plied by the correction factor given in Table 3.2 for the gas concerned. The
factors stated in Table 3.2 are assumed to be independent of the pressure,
though they depend somewhat on the geometry of the electrode system.
Therefore, they are to be regarded as average values for various types of
ionization vacuum gauges (see Fig. 3.16).

Given the presence Correction factor

of predominantly based on N2
(type of gas) (nitrogen = 1)
He 6.9
Ne 4.35
Ar 0.83
Kr 0.59
Xe 0.33
Hg 0.303
H2 2.4
CO 0.92
1 Small flange DN 25 KF; 5 Current leadthrough
CO2 0.69 DN 40 KF 6 Connecting bush
CH4 0.8 2 Housing 7 Anode pin
3 Ring anode with ignition pin 8 Cathode plate
higher 4 Ceramic washer
hydrocarbons 0.1 0.4
Table 3.2 Correction factors Fig. 3.12 Cross-section of PENNINGVAC PR 35 gauge

83
Vacuum measurement
gettering surface film on the walls of the gauge tube. In spite of these dis- For nitrogen this variable is generally around 10 mbar-1. With a constant
advantages, which result in a relatively high degree of inaccuracy in the electron current the sensitivity S of a gauge head is defined as the quotient
pressure reading (up to around 50 %), the cold-cathode ionization gauge of the ion current and the pressure. For an electron current of 1 mA and C
has three very outstanding advantages. First, it is the least expensive of all = 10 mbar-1, therefore, the sensitivity S of the gauge head is:
high vacuum measuring instruments. Second, the measuring system is
S = i+ / p = C i- = 10 mbar-1 1 mA = 10 mbar-1 10-3 A = 1 10-2 A/mbar.
insensitive to the sudden admission of air and to vibrations; and third, the
instrument is easy to operate. Hot-cathode ionization vacuum gauges also exhibit gas sorption (pumping
action), which, however, is considerably smaller than with Penning systems,
i.e. approx. 10-3 l/s. Essentially this gas sorption takes place on the glass
3.3.3.2 Hot-cathode ionization vacuum gauges wall of the gauge head and, to a lesser extent, at the ion collector. Here use
is made of nude gauges that are easy to operate because an external mag-
Generally speaking, such gauges refer to measuring systems consisting of
net is not needed. The upper limit of the measuring range of the hot-cath-
three electrodes (cathode, anode and ion collector) where the cathode is a
ode ionization gauge is around 10-2 mbar (with the exception of special
hot cathode. Cathodes used to be made of tungsten but are now usually
designs). It is basically defined by the scatter processes of ions at gas mol-
made of oxide-coated iridium (Th2O3, Y2O3) to reduce the electron output
ecules due to the shorter free path at higher pressures (the ions no longer
work and make them more resistant to oxygen. Ionization vacuum gauges
reach the ion collector = lower ion yield). Moreover, uncontrollable glow or
of this type work with low voltages and without an external magnetic field.
arc discharges may form at higher pressures and electrostatic discharges
The hot cathode is a very high-yield source of electrons. The electrons are
can occur in glass tubes. In these cases the indicated pressure pI may
accelerated in the electric field (see Fig. 3.13) and receive sufficient energy
deviate substantially from the true pressure pT.
from the field to ionize the gas in which the electrode system is located. The
positive gas ions formed are transported to the ion collector, which is nega- At low pressures the measuring range is limited by two effects: by the X-ray
tive with respect to the cathode, and give up their charge there. The ion cur- effect and by the ion desorption effect. These effects results in loss of the
rent thereby generated is a measure of the gas density and thus of the gas strict proportionality between the pressure and the ion current and produce
pressure. If i- is the electron current emitted by the hot cathode, the pres- a low pressure threshold that apparently cannot be crossed (see Fig. 3.14).
sure-proportional current i+ produced in the measuring system is defined by:

i+ = C i p und (3.3)
+
i
p=
i C (3.3a)

The variable C is the vacuum gauge constant of the measuring system.

Anode

Cathode Ion collector

Indicated pressure mbar

UC UA
(+ 50V) (+ 200V)

UA

UC Actual pressure mbar

I Pressure reading with- II Apparent low pressure III Sum of I and II

out X-ray effect limit due to X-ray effect
i+: ion current
i-: electron current

Fig. 3.13 Schematic diagram and potential curve in a hot-cathode ionization vacuum gauge Fig. 3.14 Apparent low pressure limit due to X-ray effect in a normal ionization vacuum gauge

84
 Vacuum measurement
The X-ray effect (see Fig. 3.15) adsorbed gas particles at the surface. The reading falls again and generally
The electrons emitted from the cathode impinge on the anode, releasing reaches values that may be considerably lower than the pressure reading
photons (soft X-rays). These photons, in turn, trigger photoelectrons from observed with a small electron current. As a consequence of this effect in
surfaces they strike. The photoelectrons released from the ion collector flow practice, one must ascertain whether the pressure reading has been influ-
to the anode, i.e. the ion collector emits an electron current, which is indi- enced by a desorption current. This can be done most simply by temporari-
cated in the same manner as a positive ion current flowing to the ion collec- ly altering the electron current by a factor of 10 or 100. The reading for the
tor. This photocurrent simulates a pressure. This effect is called the positive larger electron current is the more precise pressure value.
X-ray effect, and it depends on the anode voltage as well as on the size of
In addition to the conventional ionization gauge, whose electrode structure
the surface of the ion collector.
resembles that of a common triode, there are various ionization vacuum
Under certain circumstances, however, there is also a negative X-ray effect. gauge systems (Bayard-Alpert system, Bayard-Alpert system with modula-
Photons which impinge on the wall surrounding the gauge head release tor, extractor system) which more or less suppress the two effects, depend-
photoelectrons there, which again flow towards the anode, and since the ing on the design, and are therefore used for measurement in the high and
anode is a grid structure, they also flow into the space within the anode. If ultrahigh vacuum range. Today the Bayard-Alpert system is usually the
the surrounding wall has the same potential as the ion collector, e.g. ground standard system.
potential, a portion of the electrons released at the wall can reach the ion
collector. This results in the flow of an electron current to the ion collector, a) The conventional ionization vacuum gauge
i.e. a negative current flows which can compensate the positive ion current. A triode of conventional design (see Fig. 3.16 a) is used as the gauge head,
This negative X-ray effect depends on the potential of the outer wall of the but it is slightly modified so that the outer electrode serves as the ion collec-
gauge head.

The ion desorption effect a)

Adsorbed gases can be desorbed from a surface by electron impact. For an Conventional
ionization gauge this means that, if there is a layer of adsorbed gas on the ionization vacu-
um gauge sys-
anode, these gases are partly desorbed as ions by the impinging electrons. tem
The ions reach the ion collector and lead to a pressure indication that is ini-
tially independent of the pressure but rises as the electron current increas-
es. If such a small electron current is used so that the number of electrons b)
incident at the surface is small compared to the number of adsorbed gas ionization vacuum
gauge system for
particles, every electron will be able to desorb positive ions. If the electron higher pressures (up
current is then increased, desorption will initially increase because more to 1 mbar)

electrons impinge on the surface. This finally leads to a reduction in

c)

Bayard-Alpert
ionization vacu-
um gauge sys-
tem

d)

Bayard-Alpert
ionization vacuum
gauge system with
modulator

e)

extractor ionization
vacuum gauge system

C Cathode I ion collector A anode

A Anode Sc screen C cathode
I Ion collector M modulator R reflector

Fig. 3.15 Explanation of the X-ray effect in a conventional ionization gauge. The electrons e- Fig. 3.16 Schematic drawing of the electrode arrangement of various ionization vacuum gauge
emitted by the cathode C collide with anode A and trigger a soft X-ray radiation (pho- measuring systems
tons) there. This radiation strikes, in part, the ion collector and generates photoelec-

trons e s there.

85
Vacuum measurement
tor and the grid within it as the anode. With this arrangement the electrons The pg share of the X-ray effect is the same in both cases. After determin-
are forced to take very long paths (oscillating around the grid wires of the ing the difference between (3.4) and (3.5), we obtain the equation for the
anode) so that the probability of ionizing collisions and thus the sensitivity of gas pressure pg:
the gauge are relatively high. Because the triode system can generally only
be used in high vacuum on account of its strong X-ray effect, the gas sorp- p p
A M
pg = (3.6)
tion (pumping) effect and the gas content of the electrode system have only 1
a slight effect on the pressure measurement.
can immediately be determined by experiment at a higher pressure
b) The high-pressure ionization vacuum gauge (up to 1 mbar) (around 10-6 mbar) at which the X-ray effect and thus p are negligible. The
A triode is again used as the electrode system (see Fig. 3.16 b), but this pressure corresponding to the two modulator potentials are read off and
time with an unmodified conventional design. Since the gauge is designed their ratio is formed. This modulation method has the additional advantage
to allow pressure measurements up to 1 mbar, the cathode must be resis- that the ion desorption effect is determined in this way. It permits pressure
tant to relatively high oxygen pressure. Therefore, it is designed as a so- measurements up to the 10-11 mbar range with relatively little effort.
called non-burnout cathode, consisting of an yttria-coated iridium ribbon. To
obtain a rectilinear characteristic (ion current as a linear function of the e) Extractor ionization vacuum gauge
pressure) up to a pressure of 1 mbar, a high-ohmic resistor is installed in Disruptive effects that influence pressure measurement can also be exten-
the anode circuit. sively eliminated by means of an ion-optical system first suggested by
Redhead. With this extractor system (see Fig. 3.16 e) the ions from the
c) Bayard-Alpert ionization vacuum gauge (the standard measuring anode cylinder are focused on a very thin and short ion collector. The ion
system used today) collector is set up in a space, the rear wall of which is formed by a cup-
To ensure linearity between the gas pressure and the ion current over as shaped electrode that is maintained at the anode potential so that it cannot
large a pressure range as possible, the X-ray effect must be suppressed as be reached by ions emanating from the gas space. Due to the geometry of
far as possible. In the electrode arrangement developed by Bayard and the system as well as the potential of the of individual electrodes, the dis-
Alpert, this is achieved by virtue of the fact that the hot cathode is located ruptive influences through X-ray effects and ion desorption are almost com-
outside the anode and the ion collector is a thin wire forming the axis of the pletely excluded without the need of a modulator. The extractor system
electrode system (see Fig. 3.16 c). The X-ray effect is reduced by two to measures pressures between 10-4 and 10-12 mbar. Another advantage is
three orders of magnitude due to the great reduction in the surface area of that the measuring system is designed as a nude gauge with a diameter of
the ion collector. When pressures in the ultrahigh vacuum range are mea- only 35 mm so that it can be installed in small apparatus.
sured, the inner surfaces of the gauge head and the connections to the ves-
sel affect the pressure reading. The various effects of adsorption, desorp-
tion, dissociation and flow phenomena cannot be dealt with in this context.
By using Bayard-Alpert systems as nude gauge systems that are placed 3.4 Adjustment and calibration;
directly in the vessel, errors in measurement can be extensively avoided DKD, PTB national standards
because of the above mentioned effects.
Definition of terms: Since these terms are often confused in daily usage, a
d) Bayard-Alpert ionization vacuum gauge with modulator clear definition of them will first be provided:
The Bayard-Alpert system with modulator (see Fig. 3.16 d), introduced by Adjustment or tuning refers to the correct setting of an instrument. For
Redhead, offers pressure measurement in which errors due to X-ray and example, setting 0 and 100 % in THERMOVACs or setting the mass spec-
ion desorption effects can be quantitatively taken into account. In this trometer to mass 4 in the helium leak detector.
arrangement there is a second thin wire, the modulator, near the anode in
addition to the ion collector inside the anode. If this modulator is set at the
Calibration inspection refers to comparison with a standard in accordance
anode potential, it does not influence the measurement. If, on the other
with certain statutory regulations by specially authorized personnel (Bureau
hand, the same potential is applied to the modulator as that on the ion col-
of Standards). If the outcome of this regular inspection is positive, an oper-
lector, part of the ion current formed flows to the modulator and the current
ating permit for the next operation period (e.g. three years) is made visible
that flows to the ion collector becomes smaller. The indicated pressure pI of
for outsiders by means of a sticker or lead seal. If the outcome is negative,
the ionization gauge with modulator set to the anode potential consists of
the instrument is withdrawn from operation.
the portion due to the gas pressure pg and that due to the X-ray effect pg:

pA = p g + p (3.4) Calibration refers to comparison with a standard in accordance with certain

After switching the modulator from the anode potential over to the ion col- statutory regulations by specially authorized personnel (calibration facility).
lector potential, the modulated pressure reading pM is lower than the pI The result of this procedure is a calibration certificate which contains the
reading because a portion of the ions now reaches the modulator. Hence: deviations of the readings of the instrument being calibrated from the stan-
dard.
pM = pg + p (3.5)
Calibration facilities carry out this calibration work. One problem that arises
with < 1.

86
 Vacuum measurement
is the question of how good the standards are and where they are calibrat- 3.4.1 Examples of fundamental pressure mea-
ed. Such standards are calibrated in calibration facilities of the German surement methods (as standard methods
Calibration Service (DKD). The German Calibration Service is managed for calibrating vacuum gauges)
by the Federal Physical-Technical Institute (PTB). Its function is to ensure
that measuring and testing equipment used for industrial measurement pur-
a) Measuring pressure with a reference gauge
poses is subjected to official standards. Calibration of vacuum gauges and
An example of such an instrument is the U-tube vacuum gauge, with which
test leaks within the framework of the DKD has been assigned to LEY-
the measurement of the pressure in the measurement capillary is based on
BOLD, as well as other companies, by the PTB. The required calibration
a measurement of the weight over the length of the mercury column.
pump bench was set up in accordance with DIN 28 418 (see Table 11.1)
and then inspected and accepted by the PTB. The standards of the DKD In the past the McLeod vacuum gauge was also used for calibration pur-
facilities, so-called transfer standards (reference vacuum gauges), are cal- poses. With a precision-made McLeod and carefully executed measure-
ibrated directly by the PTB at regular intervals. Vacuum gauges of all ments, taking into account all possible sources of error, pressures down to
makes are calibrated on an impartial basis by LEYBOLD in Cologne 10-4 mbar can be measured with considerable accuracy by means of such
according to customer order. A DKD calibration certificate is issued with all an instrument.
characteristic data on the calibration. The standards of the Federal
Another reference gauge is the VISCOVAC decrement gauge with rotating
Physical-Technical Institute are the so-called national standards. To be
ball (see 3.3.1) as well as the capacitance diaphragm gauge (see 3.2.2.4).
able to guarantee adequate measuring accuracy or as little measurement
uncertainty as possible in its calibrations, the PTB largely carries out its
measurements through the application of fundamental methods. This b) Generation of a known pressure; static expansion method
means, for example, that one attempts to describe the calibration pressures On the basis of a certain quantity of gas whose parameters p, V and T are
through the measurement of force and area or by thinning the gases in known exactly p lies within the measuring range of a reference gauge
strict accordance with physical laws. The chain of the recalibration of stan- such as a U-tube or McLeod vacuum gauge a lower pressure within the
dard instruments carried out once a year at the next higher qualified calibra- working range of ionization gauges is reached via expansion in several
tion facility up to the PTB is called resetting to national standards. In other stages.
countries as well, similar methods are carried out by the national standards If the gas having volume V1 is expanded to a volume (V1 + V2), and from
institutes as those applied by the Federal Physical-Technical Institute (PTB) V2 to (V2 + V3), etc., one obtains, after n stages of expansion:
in Germany. Fig. 3.17 shows the pressure scale of the PTB. Calibration
guidelines are specified in DIN standards (DIN 28 416) and ISO proposals. V1 V2 Vn 1
pn = p (3.7)
1 V1 + V2 V2 + V3 Vn 1 + Vn

p1 = initial pressure measured directly in mbar

pn = calibration pressure

The volumes here must be known as precisely as possible (see Fig. 3.18)
and the temperature has to remain constant. This method requires that the
apparatus used be kept very clean and reaches its limit at pressures where
the gas quantity can be altered by desorption or adsorption effects beyond

30

Dynamic
Relative uncertainly of the pressure determination [%]

expansion
IM IM
10

3
V2 = 1000 cm
p1
+

p3 V4 =
3
13000 cm3
+

Molecular
beam p4
+

Static expansion 3 3
V1 = 25 cm V3 = 25 cm
+

1
p2
U-Tube
+

0.3

0.1
12 9 6 3 0 3
10 10 10 10 10 10

Pressure [mbar]

Fig. 3.17 Pressure scale of Federal Physical-Technical Institute (PTB), Berlin, (status as at Fig. 3.18 Generation of low pressures through static expansion
August 1984) for inert gases, nitrogen and methane

87
Vacuum measurement
and thus
L1 L1 L2
p2 = p =p (1 + ) (3.9)
1 S 1 L2 Sp

This method has the advantage that, after reaching a state of equilibrium,
sorption effects can be ignored and this procedure can therefore be used
for calibrating gauges at very low pressures.

L1
3.5 Pressure monitoring, control and regula-
p2 = p1
S
(Sp >> L2) tion in vacuum systems
1 Volume 1 9 Valve 16 to pump
2
3
Volume 2
Inlet valve (conductance L1)
10
11
LN2 cold trap
to pump system
(pumping speed PSp)
17 Gas inlet
3.5.1 Fundamentals of pressure monitoring and
4 Aperture with conductance L2 12 U-tube vacuum gauge 18 Mass spectrometer control
5 Valve 13 McLeod vacuum gauge 19,20 Gauges to be calibrated
6 to pump system 14 Valve 21 Nude gauge to be calibrated
7 Valve 15 Calibrated ionization gauge 22 Bake-out furnace In all vacuum processes the pressure in the system must be constantly
8 to gas reservoir tube checked and, if necessary, regulated. Modern plant control additionally
requires that all measured values which are important for monitoring a plant
Fig. 3.19 Apparatus for calibration according to the dynamic expansion method
are transmitted to central stations, monitoring and control centers and com-
piled in a clear manner. Pressure changes are frequently recorded over
the permissible limits of error. According to experience, this lower limit is time by recording equipment. This means that additional demands are
around 5 10-7 mbar. This method is called the static expansion method placed on vacuum gauges:
because the pressure and volume of the gas at rest are the decisive vari-
a) continuous indication of measured values, analog and digital as far as
ables.
possible
c) Dynamic expansion method (see Fig. 3.19)
b) clear and convenient reading of the measured values
According to this method, the calibration pressure p is produced by admit-
ting gas at a constant throughput rate Q into a vacuum chamber while gas c) recorder output to connect a recording instrument or control or regula-
is simultaneously pumped out of the chamber by a pump unit with a con- tion equipment
stant pumping speed S. At equilibrium the following applies according to
d) built-in computer interface (e.g. RS 232)
equation 1.10 a:
e) facility for triggering switching operations through built-in trigger points
p = Q/S
These demands are generally met by all vacuum gauges that have an elec-
Q is obtained either from the quantity of gas that flows into the calibration
tric measured value display, with the exception of Bourdon, precision
chamber from a supply vessel in which constant pressure prevails or from
diaphragm and liquid-filled vacuum gauges. The respective control units are
the quantity of gas flowing into the calibration chamber at a measured pres-
equipped with recorder outputs that supply continuous voltages between 0
sure through a known conductance. The pressure in front of the inlet valve
and 10 V, depending on the pressure reading on the meter scale, so that
must be high enough so that it can be measured with a reference gauge.
the pressure values can be recorded over time by means of a recording
The inlet apertures of the valve (small capillaries, sintered bodies) must be
instrument. If a pressure switching unit is connected to the recorder output
so small that the condition d << is met, i.e. a molecular flow and hence a
of the gauge, switching operations can be triggered when the values go
constant conductance of the inlet valve are obtained (see Section 1.5). The
over or below specified setpoints. The setpoints or switch threshold values
quantity of gas is then defined by p1 L1, where p1 = pressure in front of
for triggering switching operations directly in the gauges are called trigger
the inlet valve and L1 = conductance of the valve. The pumping system
values. Apart from vacuum gauges, there are diaphragm pressure switches
consists of a precisely measured aperture with the conductance L2 in a wall
that trigger a switching operation (without display of a measured value) via
that is as thin as possible (screen conductance) and a pump with a pump-
a contact amplifier when a certain pressure is reached. Valves, for example,
ing speed of PSp:
can also be controlled through such switching operations.
L 2 Sp L2
S= =
L + Sp L2 (3.8)
2 1+
Sp

88
 Vacuum measurement
3.5.2 Automatic protection, monitoring and con- g) pressure rise above a maximum backing pressure (critical forepressure
trol of vacuum systems of the diffusion pump)

Protection of a vacuum system against malfunctions is extremely important. The measures to be taken in order to forestall such malfunctions will be dis-
In the event of failure, very high material values may be at risk, whether cussed in the same order:
through loss of the entire system or major components of it, due to loss of a) Measures in the event of power failure: All valves are closed so as to
the batch of material to be processed or due to further production down prevent admission of air to the vacuum vessel and protect the diffusion
time. Adequate operational control and protection should therefore be pro- pump against damage.
vided for, particularly in the case of large production plants. The individual
factors to be taken into account in this connection are best illustrated on the b) Protection in the event of a drop in pressure in the compressed air net-
basis of an example: Fig. 3.20 shows the schematic diagram of a high vac- work: The compressed air is monitored by a pressure monitoring device
uum pump system. The vessel (11) can be evacuated by means of a Roots (5). If the pressure falls under a specified value, a signal can initially be
pump (14) or a diffusion pump (15), both of which operate in conjunction emitted or the valves can be automatically closed. In this case, a suffi-
with the backing pump (1). The Roots pump is used in the medium vacuum cient reserve supply of compressed air is necessary (not shown in Fig.
range and the diffusion pump in the high vacuum range. The valves (3), (8) 3.20), which allows all valves to be actuated at least once.
and (16) are operated electropneumatically. The individual components are c) Measures in the event of failure of cooling water to the diffusion pump:
actuated from a control panel with pushbuttons. The pump system is to be The cooling water is monitored by a flow or temperature monitoring
protected against the following malfunctions: device (6) and (7). If the flow of cooling water is inadequate, the heater
a) power failure of the diffusion pump is switched off and a signal is given; the valve (8)
closes.
b) drop in pressure in the compressed air network
d) Protection against failure of the diffusion pump heater: Interruption of the
c) failure of cooling water to the diffusion pump diffusion pump heating system can be monitored by a relay. If the
d) fault in diffusion pump heating system temperature rises above a maximum permissible value, a temperature
monitoring device (6) responds. In both cases the valve (8) closes and a
e) failure of backing pump signal is given.
f) pressure rise in the vessel above a maximum permissible value e) Protection in the event of backing pump failure: Belt-driven backing
pumps must have a centrifugal switch which shuts down the entire sys-
tem in the event of belt breakage or another malfunction. Monoblock
pumps for which the drive is mounted directly on the shaft can be moni-
tored by current relays and the like.

f) Protection against a pressure rise in the vessel above a certain limit

value: The high vacuum monitoring device (10) emits a signal when a
specified pressure is exceeded.

g) Ensuring the critical forepressure of the diffusion pump: When a certain

backing pressure is exceeded, all valves are closed by the backing pres-
sure monitoring device (2), the pumps are switched off and again a sig-
nal is given. The position of the valves (3), (8) and (16) is indicated on
the control panel by means of limit switches (13). The pressure in the
vessel is measured with a high vacuum gauge (12) and recorded with a
recorder (9). Protection against operating errors can be provided by
interlocking the individual switches so that they can only be actuated in
a predetermined sequence. The diffusion pump, for example, may not
be switched on when the backing pump is not running or the required
backing pressure is not maintained or the cooling water circulation is not
1 Backing pump 8 Electropneumatic valve
functioning.
2 Backing pressure monitoring 9 Recorder
device 10 High-vacuum monitoring device In principle, it is not a big step from a system protected against all malfunc-
3 Electropneumatic valve 11 Vessel tions to a fully automatic, program-controlled plant, though the complexity of
4 Compressed air connection 12 High-vacuum gauge
5 Pressure monitoring device 13 Limit switches the electrical circuits, of course, increases significantly.
6 Temperature monitoring 14 Roots pump
device 15 Diffusion pump
7 Cooling water monitoring 16 Electropneumatic valve
device 17 Venting valve

Fig. 3.20 Schematic diagram of a high vacuum pump system with optional operation of a Roots
pump or a diffusion pump

89
Vacuum measurement
3.5.3 Pressure regulation and control in rough
and medium vacuum systems
Control and regulation have the function of giving a physical variable in
this case the pressure in the vacuum system a certain value. The com-
mon feature is the actuator which changes the energy supply to the physi-
cal variable and thus the variable itself. Control refers to influencing a sys-
tem or unit through commands. In this case the actuator and hence the
actual value of the physical variable is changed directly with a manipulated
variable. Example: Actuation of a valve by means of a pressure-dependent
switch. The actual value may change in an undesirable way due to addi-
tional external influences. The controlled unit cannot react to the control
unit. For this reason control systems are said to have an open operating Gauge with two switching points Fu Fuse
Throttle valve R, Mp Mains connection 220 V/50 Hz
sequence. In the case of regulation, the actual value of the physical vari- Vacuum pump Smax Switching point for maximum value
able is constantly compared to the specified setpoint and regulated if there Pump valve Smin Switching point for minimum value
Vacuum vessel PV Pump valve
is any deviation so that it completely approximates the setpoint as far as R1 Auxiliary relay for pump valve
possible. For all practical purposes regulation always requires control. The K1 Relay contact of R1
M Measuring and switching device
main difference is the controller in which the setpoint and the actual value
are compared. The totality of all elements involved in the control process Fig. 3.22 Two-step regulation through pumping speed throttling
forms the control circuit. The terms and characteristic variables for describ-
ing control processes are stipulated in DIN 19226. the two two-step regulation systems. In the case of two-step regulation
through pumping speed throttling (Fig. 3.22), voltage is supplied to pump
Generally a distinction is made between discontinuous control (e.g. two-
valve 4, i.e. it is open when the relay contacts are in the release condition.
step or three-step control) with specification of a pressure window, within
At a level below the upper switching point the valve remains open because
which the pressure may vary, and continuous control (e.g. PID control) with
of the self-holding function of the auxiliary relay. Only at a level below the
a specified pressure setpoint, which should be maintained as precisely as
lower switching point is the relay latching released. If the pressure subse-
possible. We have two possible ways of adjusting the pressure in a vacuum
quently rises, the valve is opened again at the upper switching point.
system: first, by changing the pumping speed (altering the speed of the
pump or throttling by closing a valve); second, through admission of gas In the case of two-step regulation through gas admission, the inlet valve is
(opening a valve). This results in a total of 4 procedures. initially closed. If the upper pressure switching point is not reached, nothing
changes; only when the pressure falls below the lower switching point, do
Discontinuous pressure regulation the make contacts open the gas inlet valve and actuate the auxiliary relay
Although continuous regulation undoubtedly represents the more elegant with self-holding function simultaneously. Return to the idle state with clos-
procedure, in many cases two-step or three-step regulation is fully ade- ing of the gas inlet valve is not effected until after the upper switching point
quate in all vacuum ranges. To specify the pressure window, two or three is exceeded due to the release of the relay self-holding function.
variable, pressure-dependent switch contacts are necessary. It does not
Fig. 3.24 shows the corresponding three-step regulation system which was
matter here whether the switch contacts are installed in a gauge with dis-
play or in a downstream unit or whether it is a pressure switch without dis-
play. Fig. 3.21 illustrates the difference between two-step regulation through
pumping speed throttling, two-point regulation through gas admission and
three-point regulation through a combination of pumping speed throttling
and gas admission. Figures 3.22 and 3.23 show the circuit and structure of

Two-step regulation through Three-step regulation through

pumping speed throttling gas admission pumping speed throttling

and gas admission
Pressure Pressure Pressure

pAtm pAtm pAtm

pmax

pmin pmax pmitte Gauge with two switching points Fu Fuse

Variable-leak valve R, Mp Mains connection 220 V/50 Hz
pmin pmin
Inlet valve Smax Switching point for maximum value
Gas supply Smin Switching point for minimum value
Time Time Time
Throttle valve EV Inlet valve
Vacuum pump R2 Auxiliary relay for inlet valve
Vacuum vessel K2 Relay contact of R2
M Measuring and switching device

Fig. 3.21 Schematic diagram of two-step and three-step regulation Fig. 3.23 Two-step regulation through gas admission

90
 Vacuum measurement

Gauge with three switching Fu Fuse

points R, Mp Mains connection 220 V/50 Hz
Variable-leak valve Smax Switching point for maximum value
Variable-leak valve Smitte Switching point for mean value
Inlet valve Smin Switching point for minimum value
Gas supply T TORROSTAT S 020
Throttle valve PV Pump valve
Vacuum pump EV Inlet valve
Pump valve R1 Auxiliary relay for pump interval
Vacuum vessel R2 Auxiliary relay for inlet interval
K1 Relay contact of R1
K2 Relay contact of R2
M Measuring and switching device

Fig. 3.24 Three-step regulation system Fig. 3.26 LEYBOLD-A series, equipment with level and interval triggers

created with the two components just described. As the name indicates, two Continuous pressure regulation
switching points, the lower switching point of the regulation system through We have to make a distinction here between electric controllers (e.g. PID
pumping speed throttling and the upper switching point of the gas inlet reg- controllers) with a proportional valve as actuator and mechanical diaphragm
ulation system, were combined. controllers. In a regulation system with electric controllers the coordination
between controller and actuator (piezoelectric gas inlet valve, inlet valve
To avoid the complicated installation with auxiliary relays, many units offer a
with motor drive, butterfly control valve, throttle valve) is difficult because of
facility for changing the type of function of the built-in trigger values via soft-
the very different boundary conditions (volume of the vessel, effective
ware. Initially one can choose between individual switching points (so-called
pumping speed at the vessel, pressure control range). Such control circuits
level triggers) and interlinked switching points (interval triggers). These
tend to vibrate easily when process malfunctions occur. It is virtually impos-
functions are explained in Fig. 3.25. With interval triggers one can also
sible to specify generally valid standard values.
select the size of the hysteresis and the type of setpoint specification, i.e.
either fixed setting in the unit or specification through an external voltage, Many control problems can be better solved with a diaphragm controller.
e.g. from 0 10 volts. A three-step regulation system (without auxiliary The function of the diaphragm controller (see Fig. 3.27) can be easily
relay), for example, can be set up with the LEYBOLD MEMBRANOVAC of derived from that of a diaphragm vacuum gauge: the blunt end of a tube or
the A series. Fig. 3.26 shows different units of the new LEYBOLD A series, pipe is either closed off by means of an elastic rubber diaphragm (for refer-
which, although they function according to different measuring methods, all ence pressure > process pressure) or released (for reference pressure <
display a uniform appearance. process pressure) so that in the latter case, a connection is established
between the process side and the vacuum pump. This elegant and more or
less automatic regulation system has excellent control characteristics (see
Fig. 3.28).

process chamber
connection
measuring connection
for process pressure
reference chamber
control chamber
diaphragm controller seat

measuring connection
for reference chamber

reference pressure pump connection

adjustment valve

Fig. 3.25 Diagram of level triggers and interval triggers Fig. 3.27 Principle of a diaphragm controller

91
Vacuum measurement

P1 = process pressure, P2 = pressure in pump, Pref = reference pressure

Fig. 3.28 Control characteristics of a diaphragm controller

To achieve higher flow rates, several diaphragm controllers can be connect-

ed in parallel. This means that the process chambers and the reference DC Diaphragm controller
chambers are also connected in parallel. Fig. 3.29 shows such a connection P Vacuum pump
M Measuring and switching device
of 3 MR 50 diaphragm controllers. PS Pressure sensor
V1 Pump valve
To control a vacuum process, it is frequently necessary to modify the pres- V2 Gas inlet valve
TH Throttle
sure in individual process steps. With a diaphragm controller this can be RC Reference chamber
done either manually or via electric control of the reference pressure. PC Process chamber
CV Internal reference pressure control valve
Electric control of the reference pressure of a diaphragm controller is rela-
tively easy because of the small reference volume that always remains con- Fig. 3.30 Control of vacuum drying processes by regulation of the intake pressure of the vacu-
stant. Fig. 3.31 shows such an arrangement on the left as a picture and on um pump according to the water vapor tolerance
the right schematically, see 3.5.5 for application examples with
diaphragm controllers.

To be able to change the reference pressure and thus the process pressure
3.5.4 Pressure regulation in high and ultrahigh
towards higher pressures, a gas inlet valve must additionally be installed at vacuum systems
the process chamber. This valve is opened by means of a differential pres- If the pressure is to be kept constant within certain limits, an equilibrium
sure switch (not shown in Fig. 3.31) when the desired higher process pres- must be established between the gas admitted to the vacuum vessel and
sure exceeds the current process pressure by more than the pressure dif- the gas simultaneously removed by the pump with the aid of valves or throt-
ference set on the differential pressure switch. tling devices. This is not very difficult in rough and medium vacuum sys-
tems because desorption of adsorbed gases from the walls is generally
negligible in comparison to the quantity of gas flowing through the system.
Pressure regulation can be carried out through gas inlet or pumping speed
regulation. However, the use of diaphragm controllers is only possible
between atmospheric pressure and about 10 mbar.

In the high and ultrahigh vacuum range, on the other hand, the gas evolu-
tion from the vessel walls has a decisive influence on the pressure. Setting
of specific pressure values in the high and ultrahigh vacuum range, there-
fore, is only possible if the gas evolution from the walls is negligible in rela-
tion to the controlled admission of gas by means of the pressure-regulating
unit. For this reason, pressure regulation in this range is usually effected as
gas admission regulation with an electric PID controller. Piezoelectric or
servomotor-controlled variable-leak valves are used as actuators. Only
bakeable all-metal gas inlet valves should be used for pressure regulation
Fig. 3.29 Triple connection of diaphragm controllers below 10-6 mbar.

92
 Vacuum measurement
3.5.5 Examples of applications with diaphragm again exceeded. Valve V2 closes again. This interaction repeats itself until
controllers the pressure in the process chamber has dropped below the minimum
switching point. After that, valve V2 remains open so that the process can
1) Regulation of a drying/distillation process, taking into account the maxi- be brought down to the required final pressure with a completely open
mum water vapor tolerance of a vane type rotary pump diaphragm controller.
In a drying process it is frequently desirable to carry out drying solely by The material to be dried is usually heated to intensify and speed up the dry-
means of vacuum pumps without inserting condensers. In view of the limit- ing process. If a certain amount of water vapor is produced, the intake pres-
ed water vapor tolerance of vacuum pumps approx. 30 mbar as a rule sure rises above the two switching points. As a result, valve V2 first closes
this would result in condensation of the vapors produced within the vacuum and V1 opens. Through incoming air or protective gas the pressure in the
pump, given non-throttled or non-regulated pumping speed. One can avoid reference chamber is raised and the throughput at the diaphragm controller
this through process-dependent remote control of a diaphragm controller thus throttled until the intake pressure of the vacuum pump has dropped
with auxiliary control valves and a measuring and switching device with a below the set maximum switching point again. Then valve V1 closes.
pressure sensor at the inlet connection of the vacuum pump if the intake
pressure is adapted to the pumps water vapor tolerance through automatic Depending on the quantity of vapor that accumulates, the throughput of the
monitoring of the intake pressure of the vacuum pump and by throttling the diaphragm controller is set by increasing or decreasing the reference pres-
pumping speed. Fig. 3.30 shows the principle of this arrangement. sure in each case so that the maximum permissible partial water vapor
pressure at the inlet connection of the vacuum pump is never exceeded.
Mode of operation: Starting from atmospheric pressure with the process
heating switched off, valve V1 is initially open (maximum switching point As soon as the pressure in the process chamber drops below the set mini-
exceeded) so that atmospheric pressure also prevails in the reference mum switching point towards the end of the drying process, valve V2 opens
chamber. and remains open. In this way the unthrottled cross-section of the
diaphragm controller is available again for rapid final drying. At the same
The diaphragm controller is therefore closed. When the system is started time the final drying procedure can be monitored by means of the pressure
up, the connecting line between the vacuum pump and pump valve V2 is sensor PS.
first evacuated. As soon as the pressure drops below the maximum switch-
ing point, valve V1 closes. When the pressure falls below the minimum 2) Pressure regulation by means of diaphragm controller with external
switching point, valve V2 opens. automatic reference pressure adjustment (see Fig. 3.31)

In this manner the pressure in the reference chamber is slowly lowered, the For automatic vacuum processes with regulated process pressure, preset-
throttling of the diaphragm controller is reduced accordingly and thus the ting of the desired set pressure must often function and be monitored auto-
process pressure is lowered until the quantity of process gas is greater than matically. If a diaphragm controller is used, this can be done by equipping
the quantity conveyed by the pump so that the minimum switching point is the reference chamber with a measuring and switching device and a control
valve block at the reference chamber. The principle of this arrangement is

DC Diaphragm controller
PS Process pressure sensor
RS Reference pressure sensor
V1 Gas inlet valve
V2 Pump valve
V3 Gas inlet variable-leak valve
TH Throttle
M Measuring and switching device
PP Process pump
RC Reference chamber
PC Process chamber
AP Auxiliary pump
CV Internal reference pressure control
valve

Fig. 3.31 Diaphragm controller with external automatic reference pressure regulation

93
Vacuum measurement
shown in Fig. 3.31.

Mode of operation: Starting with atmospheric pressure, gas inlet valve V1 is

closed at the beginning of the process. Pump valve V2 opens. The process
chamber is now evacuated until the set pressure, which is preset at the
measuring and switching device, is reached in the process chamber and in
the reference chamber. When the pressure falls below the set switching
threshold, pump valve V2 closes. As a result, the pressure value attained is
caught as the reference pressure in the reference chamber (RC) of the
diaphragm controller (DC). Now the process pressure is automatically
maintained at a constant level according to the set reference pressure by
means of the diaphragm controller (DC). If the reference pressure should
rise in the course of the process due to a leak, this is automatically detect-
ed by the measuring and switching device and corrected by briefly opening
pump valve V2. This additional control function enhances the operational
reliability and extends the range of application. Correcting the increased
reference pressure to the originally set value is of special interest for regu-
lated helium circuits because the pressure rise in the reference chamber
(RC) of the diaphragm controller can be compensated for through this
arrangement as a consequence of the unavoidable helium permeability of
the controller diaphragm of FPM.

To be able to change the reference pressure and thus increase the process
pressure to higher pressures, a gas inlet valve must be additionally
installed at the process chamber. This valve is opened by means of a dif-
ferential pressure switch (not shown in Fig. 3.31) when the desired higher
process pressure exceeds the current process pressure by more than the
pressure differential set at the differential pressure switch.

94
 Mass spectrometry
4. Analysis of gas at low pressures using
mass spectrometry
4.1 General
Analyses of gases at low pressures are useful not only when analyzing the
residual gases from a vacuum pump, leak testing at a flange connection or
for supply lines (compressed air, water) in a vacuum. They are also essen-
tial in the broader fields of vacuum technology applications and processes.
For example in the analysis of process gases used in applying thin layers of
coatings to substrates. The equipment used for qualitative and/or quantita-
tive analyses of gases includes specially developed mass spectrometers
with extremely small dimensions which, like any other vacuum gauge, can
be connected directly to the vacuum system. Their size distinguishes these c
a
measurement instruments from other mass spectrometers such as those b
used for the chemical analyses of gases. The latter devices are poorly suit-
ed, for example, for use as partial pressure measurement units since they
are too large, require a long connector line to the vacuum chamber and
cannot be baked out with the vacuum chamber itself. The investment for an a: High-performance sensor with Channeltron
b: Compact sensor with Micro-Channelplate
analytical mass spectrometer would be unjustifiably great since, for exam- c: High-performance sensor with Faraday cup
ple, the requirements as to resolution are far less stringent for partial pres-
sure measurements. Partial pressure is understood to be that pressure Fig. 4.1a TRANSPECTOR sensors

exerted by a certain type of gas within a mix of gases. The total of the par-
tial pressures for all the types of gas gives the total pressure. The distinc- 4.2 A historical review
tion among the various types of gases is essentially on the basis of their
Following Thomsons first attempt in 1897 to determine the ratio of charge
molar masses. The primary purpose of analysis is therefore to register
to mass e/m for the electron, it was quite some time (into the 1950s) before
qualitatively the proportions of gas within a system as regards the molar
a large number and variety of analysis systems came into use in vacuum
masses and determine quantitatively the amount of the individual types of
technology. These included the Omegatron, the Topatron and ultimately the
gases associated with the various atomic numbers.
quadrupole mass spectrometer proposed by Paul and Steinwedel in 1958,
Partial pressure measurement devices which are in common use comprise available from INFICON in its standard version as the TRANSPECTOR
the measurement system proper (the sensor) and the control device (see Fig. 4.1). The first uses of mass spectrometry in vacuum-assisted
required for its operation. The sensor contains the ion source, the separa- process technology applications presumably date back to Backus work in
tion system and the ion trap. The separation of ions differing in masses and the years 1943 / 44. He carried out studies at the Radiographic Labora-
charges is often effected by utilizing phenomena which cause the ions to tories at the University of California. Seeking to separate uranium isotopes,
resonate in electrical and magnetic fields. he used a 180 sector field spectrometer after Dempster (1918), which he
referred to as a vacuum analyzer. Even today a similar term, namely the
Initially, the control units were quite clumsy and offered uncountable
residual gas analyzer (RGA), is frequently used in the U.S.A. and the U.K.
manipulation options. It was often the case that only physicists were able to
instead of mass spectrometer. Todays applications in process monitoring
handle and use them. With the introduction of PCs the requirements in
are found above all in the production of semiconductor components.
regard to the control units became ever greater. At first, they were fitted
with interfaces for linkage to the computer. Attempts were made later to
equip a PC with an additional measurement circuit board for sensor opera-
tion. Todays sensors are in fact transmitters equipped with an electrical
power supply unit attached direct at the atmosphere side; communication
with a PC from that point is via the standard computer ports (RS 232, RS
485). Operating convenience is achieved by the software which runs on the
PC.

Fig. 4.1b TRANSPECTOR XPR sensor

95
Mass spectrometry
4.3 The quadrupole mass spectrometer the sensor is often generated with a TURBOVAC 50 turbomolecular pump
(TRANSPECTOR) and a D 1.6 B rotary vane pump. With its great compression capacity, a fur-
ther advantage of the turbomolecular pump when handling high molar mass
gases is that the sensor and its cathode are ideally protected from contami-
The ion beam extracted from the electron impact ion source is diverted into
nation from the direction of the forepump.
a quadrupole separation system containing four rod-shaped electrodes. The
cross sections of the four rods form the circle of curvature for a hyperbola
so that the surrounding electrical field is nearly hyperbolic. Each of the two
opposing rods exhibits equal potential, this being a DC voltage and a super- 4.3.1 Design of the sensor
imposed high-frequency AC voltage (Fig. 4.2). The voltages applied induce One can think of the sensor as having been derived from an ex-
transverse oscillations in the ions traversing the center, between the rods. tractor measurement system (see Fig. 4.3), whereby the
The amplitudes of almost all oscillations escalate so that ultimately the ions separation system was inserted between the ion source and the
will make contact with the rods; only in the case of ions with a certain ratio ion trap.
of mass to charge m/e is the resonance condition which allows passage
through the system satisfied. Once they have escaped from the separation
system the ions move to the ion trap (detector, a Faraday cup) which may
4.3.1.1 The normal (open) ion source
also take the form of a secondary electron multiplier pick-up (SEMP).
The ion source comprises an arrangement of the cathode, anode and sev-
The length of the sensor and the separation system is about 15 cm. To eral baffles. The electron emission, kept constant, causes partial ionization
ensure that the ions can travel unhindered from the ion source to the ion of the residual gas, into which the ion source is immersed as completely
trap, the mean free path length inside the sensor must be considerably as possible. The vacuum in the vicinity of the sensor will naturally be influ-
greater than 15 cm. For air and nitrogen, the value is about enced by baking the walls or the cathode. The ions will be extracted
p = 6 103 mbar cm. At p = 1 10-4 bar this corresponds to a mean through the baffles along the direction of the separation system. One of the
free path length of = 60 cm. This pressure is generally taken to be the baffles is connected to a separate amplifier and entirely independent of
minimum vacuum for mass spectrometers. The emergency shut-down fea- ion separation provides continuous total pressure measurement (see Fig.
ture for the cathode (responding to excessive pressure) is almost always 4.4). The cathodes are made of iridium wire and have a thorium oxide coat-
set for about 5 10-4 mbar. The desire to be able to use quadrupole spec- ing to reduce the work associated with electron discharge. (For some time
trometers at higher pressures too, without special pressure convertors, led now the thorium oxide has gradually been replaced by yttrium oxide.)
to the development of the XPR sensor at INFICON (XPR standing for These coatings reduce the electron discharge work function so that the
extended pressure range). To enable direct measurement in the range of desired emission flow will be achieved even at lower cathode temperatures.
about 2 10-2 mbar, so important for sputter processes, the rod system was Available for special applications are tungsten
reduced from 12 cm to a length of 2 cm. To ensure that the ions can exe- cathodes (insensitive to hydrocarbons but sensitive to oxygen) or rhenium
cute the number of transverse oscillations required for sharp mass separa- cathodes (insensitive to oxygen and hydrocarbons but evaporate slowly
tion, this number being about 100, the frequency of the current in the XPR during operation due to the high vapor pressure).
sensor had to be raised from about 2 MHz to approximately 6 times that
value, namely to 13 MHz. In spite of the reduction in the length of the rod
system, ion yield is still reduced due to dispersion processes at such high
pressures. Additional electronic correction is required to achieve perfect
depiction of the spectrum. The dimensions of the XPR sensor are so small
that it can hide entirely inside the tubulation of the connection flange (DN
40, CF) and thus occupies no space in the vacuum chamber proper. Fig.
4.1a shows the size comparison for the normal high-performance sensors
with and without the Channeltron SEMP, the normal sensor with channel-
plate SEMP. Fig. 4.1b shows the XPR sensor. The high vacuum required for Anode

Cathode

Quadrupole exit
Focussing plate diaphragm
(extractor diaphragm) Ion source exit
diaphragm
(total pressure measurement)
Cathode Reflector Ion trap
Anode

Shielding

Extractor measurement system

Ion source Quadrupole separation system Ion detector Transpector measurement head

Fig. 4.2 Schematic for quadrupole mass spectrometer Fig. 4.3 Quadrupole mass spectrometer Extractor ionization vacuum gauge

96
 Mass spectrometry
Cathode xz plane yz plane
+ Rod: - Rod:
+U U
1 +
Transmission:
+
Transmission:
+ full - none
Shielding
+ Rod: - Rod:
Anode +U+V, cos UV cos
2 +
Transmission:
+
Transmission:
+ low-pass - high-pass

i+ i+
Extractor diaphragm 3
V1 V V1 V
Total pressure diaphragm
i+ i+

4
M1 M M1 M

Fig. 4.4 Open ion source

Superimposition of the xy and yz planes
i+
yz xz ( UV fixed)
5 I III
4.3.1.2 The quadrupole separation system II M

U .. Selectivity (resolution) Sensitivity

V
Here the ions are separated on the basis of their mass-to-charge ratio. We
know from physics that the deflection of electrically charged particles (ions)
from their trajectory is possible only in accordance with their ratio of mass Fig. 4.5 Phenomenological explanation of the separation system
to charge, since the attraction of the particles is proportional to the charge
while the inertia (which resists change) is proportional to its mass. The sep- right):
aration system comprises four cylindrical metal rods, set up in parallel and 1. Only DC potential U at the rods:
isolated one from the other; the two opposing rods are charged with identi-
cal potential. Fig. 4.2 shows schematically the arrangement of the rods and xz plane (left): Positive potential of +U at the rod, with a repellant effect
their power supply. The electrical field inside the separation system is on the ion, keeping it centered; it reaches the collector ( passage).
generated by superimposing a DC voltage and a high-frequency AC volt- yz plane (right): Negative potential on the rod -U, meaning that at even
age: the tiniest deviations from the center axis the ion will be drawn toward
= (U + V cos t) (x2 y2) / r02 the nearest rod and neutralized there; it does not reach the collector
( blocking).
r0 = radius of the cylinder which can be inscribed inside the system of rods
2. Superimposition of high-frequency voltage V cos t:
Exerting an effect on a single charged ion moving near and parallel to the
center line inside the separation system and perpendicular to its movement xz plane (left): Rod potential +U + V cos t. With rising AC voltage
are the forces amplitude V the ion will be excited to execute transverse oscillations
with ever greater amplitudes until it makes contact with a rod and is neu-
Fx = 2e x cos ( t ) tralized. The separation system remains blocked for very large values of
r02 V.
Fy = 2e2 y cos ( t ) yz plane (right): Rod potential -U -V cos t. Here again superimposi-
r0
tion induces an additional force so that as of a certain value for V the
Fz = 0
amplitude of the transverse oscillations will be smaller than the clear-
ance between the rods and the ion can pass to the collector at very
The mathematical treatment of these equations of motion uses Mathieus
large V.
differential equations. It is demonstrated that there are stable and unstable
ion paths. With the stable paths, the distance of the ions from the separa- 3. Ion emission i+ = i+ (V) for a fixed mass of M:
tion system center line always remains less than ro (passage condition).
xz plane (left): For voltages of V < V1 the deflection which leads to an
With unstable paths, the distance from the axis will grow until the ion ulti-
escalation of the oscillations is smaller than V1, i.e. still in the pass
mately collides with a rod surface. The ion will be discharged (neutralized),
range. Where V > V1 the deflection will be sufficient to induce escalation
thus becoming unavailable to the detector (blocking condition).
and thus blockage.
Even without solving the differential equation, it is possible to arrive at a
yz plane (right): For voltages of V < V1 the deflection which leads to the
purely phenomenological explanation which leads to an understanding of
damping of the oscillations is smaller than V1, i.e. still in the block
the most important characteristics of the quadrupole separation system.
range. Where V > V1 the damping will be sufficient to settle oscillations,
If we imagine that we cut open the separation system and observe the allowing passage.
deflection of a singly ionized, positive ion with atomic number M, moving in
4. Ion flow i+ = i+ (M) for a fixed ratio of U / V:
two planes, which are perpendicular one to the other and each passing
through the centers of two opposing rods. We proceed step-by-step and Here the relationships are exactly opposite to those for i+ = i+ (V) since
first observe the xz plane (Fig. 4.5, left) and then the yz plane (Fig.4.5, the influence of V on light masses is greater than on heavy masses.

97
Mass spectrometry
xz plane: For masses of M < M1 the deflection which results in escala- Once they have left the separation system the ions will meet the ion trap or
tion of the oscillations is greater than at M1, which means that the ions detector which, in the simplest instance, will be in the form of a Faraday
will be blocked. At M > M1 the deflection is no longer sufficient for esca- cage (Faraday cup). In any case the ions which impinge on the detector will
lation, so that the ion can pass. be neutralized by electrons from the ion trap. Shown, after electrical amplifi-
cation, as the measurement signal itself is the corresponding ion emission
yz plane: For masses of M < M1 the deflection which results in damping
stream. To achieve greater sensitivity, a secondary electron multiplier pick-
of the oscillations is greater than at M1, which means that the ion will
up (SEMP) can be employed in place of the Faraday cup.
pass. At M > M1 the damping is not sufficient to calm the system and so
the ion is blocked. Channeltrons or Channelplates can be used as SEMPs. SEMPs are virtual-
ly inertia-free amplifiers with gain of about 10+6 at the outset; this will
5. Combination of the xz and yz planes. In the superimposition of the ion
indeed drop off during the initial use phase but will then become virtually
currents i+ = i+ (M) for both pairs of rods (U / V being fixed) there are
constant over a long period of time. Fig. 4.6 shows at the left the basic con-
three important ranges:
figuration of a Faraday ion trap and, on the right, a section through a
Range I: No passage for M due to the blocking behavior of the xz pair of Channeltron. When recording spectra the scanning period per mass line t0
rods. and the time constants of the amplifier t should satisfy the condition that
t0 = 10 . In modern devices such as the TRANSPECTOR the otherwise
Range II: The pass factor of the rod systems for mass M is determined
unlimited selection of the scanning period and the amplifier time constants
by the U/V ratio (other ions will not pass). We see that great permeability
will be restricted by microprocessor control to logical pairs of values.
(corre- sponding to high sensitivity) is bought at the price of low selectiv-
ity (= resolution, see Section 4.5). Ideal adjustment of the separation
system thus requires a compromise between these two properties. To
achieve constant resolution, the U/V ratio will remain constant over the
entire measurement range. The atomic number M (see 4.6.1) of the
ions which can pass through the separation system must satisfy this
condition:
m V
M=
e 14.438 f 2 ro2

V = High-frequency amplitude,
rO = Quadrupole inscribed radius
f = High-frequency

As a result of this linear dependency there results a mass spectrum with

linear mass scale due to simultaneous, proportional modification of U
and V.

Range III: M cannot pass, due to the blocking characteristics of the yz

pair of rods.

4.3.1.3 The measurement system (detector)

Positive ion
Separation system output
Collector
Electron suppressor

Faraday cup

Connection Amplifier
to front end
of the inside
surface Resistance of the inner surface

Amplifier Resistance 108

. high voltage
Negative
6
R 4 10

Fig. 4.6 Left: Principle of the Faraday cup; Right: Configuration of the Channeltron

98
 Mass spectrometry
4.4 Gas admission and pressure adaptation areas for the metallic, glass and ceramic components will be needed along
with specifications on the material and dimensions of the cathode (and ulti-
mately regarding the electron impact energy for the ion source as well).
4.4.1 Metering valve
The simplest way to adapt a classical mass spectrometer to pressures
exceeding 1 10-4 mbar is by way of a metering valve. The inherent disad- 4.4.3 Closed ion source (CIS)
vantage is, however, that since the flow properties are not unequivocally
defined, a deviation from the original gas composition might result. In order to curb or avoid entirely influences which could stem from the
sensor chamber or the cathode (e.g. disturbance of the CO-CO2 equilibrium
by heating the cathode) a closed ion source (CIS) will be used in many
cases.
4.4.2 Pressure converter
The CIS is divided into two sections: a cathode chamber where the elec-
In order to examine a gas mix at total pressure exceeding 1 10-4 mbar it is
trons are emitted, and an impact chamber, where the impact ionization of
necessary to use pressure converters which will not segregate the gases.
the gas particles takes place. The two chambers are pumped differentially:
Figure 4.7 is used to help explain how such a pressure converter works:
the pressure in the cathode chamber comes to about
a. Process pressure < 1 mbar: Single-stage pressure converter. Gas is 10-5 mbar, that in the impact room about 10-3 mbar. The gas from the vacu-
allowed to pass out of the vacuum vessel in molecular flow, through a um chamber is allowed to pass into the impact chamber by way of a metal-
diaphragm with conduc- tance value L2 and into the sensor chamber (with sealed, bakeable valve (pressure converter, ultrahigh vacuum technology).
its own high vacuum system). Molecular flow causes segregation but this There high-yield ionization takes place at about 10-3 mbar. The electrons
will be independent of the pressure level (see Section 1.5). A second exerting the impact are emitted in the cathode chamber at about 10-5 mbar
diaphragm with molecular flow, located between the sensor chamber and and pass through small openings from there into the impact chamber. The
the turbomolecular pump, will compensate for the segregation occurring at signal-to-noise ratio (residual gas) via vis the open ion source will be
L 2. increased overall by a factor of 10+3 or more. Figure 4.8 shows the funda-
mental difference between the configurations for open and closed ion
b. Process pressure > 1 mbar: Two-stage pressure converter. Using a small
sources for a typical application in sputter technology. With the modified
(rotary vane) pump a laminar stream of gas is diverted from the rough vac-
design of the CIS compared with the open ion source in regard to both the
uum area through a capillary or diaphragm (conductance value L3). Prior to
geometry and the electron energy (open ion source 102 eV, CIS 75 or 35
entry into the pump, at a pressure of about 1 mbar, a small part of this flow
eV), different fragment distribution patterns may be found where a lower
is again allowed to enter the sensor chamber through the diaphragm with
electron energy level is selected. For example, the argon36++ isotope at
conductance value L2, again as molecular flow.
mass of 18 cannot be detected at electron energy of less than 43.5 eV and
A falsification of the gas composition resulting from adsorption and conden- can therefore not falsify the detection of H2O+ at mass 18 in the sputter
sation can be avoided by heating the pressure converter and the capillary. processes using argon as the working gas processes which are of great
importance in industry.
To evaluate the influence on the gas composition by the measurement unit
itself, information on the heating temperature, the materials and surface

4.4.4 Aggressive gas monitor (AGM)

In many cases the process gas to be examined is so aggressive that the
cathode would survive for only a short period of time. The AGM uses the
Non-segregating gas inlet system property of laminar flow by way of which there is no reverse flow of any
kind. Controlled with a separate AGM valve, a part of the working gas fed to
Stage B Stage A
the processes is introduced as purging gas, ahead of the pressure con-
p 10 4 mbar p = 1 ... 10 mbar p = 10 ... 1000 mbar verter, to the TRANSPECTOR; this sets up a flow toward the vacuum
Mass
L2 Capillary L3 chamber. Thus process gas can reach the TRANSPECTOR only with the


spectrometer QHV AGM valve closed. When the valve is open the TRANSPECTOR sees only



Seff
L1 pure working gas. Fig. 4.9 shows the AGM principle.
QPumping
No
Molecular flow Laminar flow
segregation
L2 molecular  dL 2

1 QHV  QPumping
L2 ~
M (Transition laminar/molecular)
1
L1 ~
M
Seff  L1 Seff ~ 1

M

Seff compensates for L2 No segregation

S

Fig. 4.7 Principle of the pressure converter (stage B only in the single-stage version and
stages A and B in two-stage units)

99
Mass spectrometry

Process: 10 -2 mbar Process: 10 -2 mbar

(Elastomer) Valve (Metal)

Inlet diaphragm

Impact chamber
10 -5
10 -5
10 -5
10 -3 Cathode chamber
Example of the sputter Exit diaphragm
process
To be detected is 1 ppm N2 as
contamination in argon,
the working gas
10 -5 10 -5 10 -5 10 -5

1 ppm N 2 at the inlet: 1 ppm N 2 at the inlet:

10 -6 10 -5 mbar = 10 -11 mbar 10 -6 10 -3 mbar = 10 -9 mbar

Exit diaphragm
Background: Background:
Residual gas (valve closed) 10 -6 mbar total Residual gas (valve closed) 10 -7 mbar total
total, including 1% by mass 28 : 10 -8 mbar Pump Pump total, including 1% by mass 28 : 10 -9 mbar

Background noise 1 ppm

Signal at 1 of background Background noise

cannot be detected Signal twice the background noise
amplitude; can just be clearly detected

Fig. 4.8 Open ion source (left) and closed ion source (right)

Impact chamber
Working gas for the process (Ar)
Cathode chamber
Exit diaphragms
AGM protective gas valve

10 -5

Process:
e. g. 50 mbar 10 -3 10 -5

Diaphragm Pump
10 -5

Fig. 4.9 Principle behind the aggressive gas monitor (AGM)

100
 Mass spectrometry
4.5 Descriptive values in mass spectrometry 4.5.4 Smallest detectable partial pressure
(specifications) The smallest detectable partial pressure is defined as a ratio of noise ampli-
A partial pressure measurement unit is characterized essentially by the fol- tude to sensitivity:
lowing properties (DIN 28 410): iR+
Pmin = (mbar)
E

4.5.1 Line width (resolution) i+ = Noise amplitude

R
The line width is a measure of the degree to which differentiation can be Example (from Fig. 4.11):
made between two adjacent lines of the same height. The resolution is nor-
A
mally indicated. It is defined as: R = M / M and is constant for the quadru- Sensitivity E = 1 10 4
mbar
pole spectrometer across the entire mass range, slightly greater than 1 or
M < 1. Noise amplitude i+ = 4 1014 A
R
Often an expression such as unit resolution with 15% valley is used. This
4 10 14A
means that the bottom of the valley between two adjacent peaks of identi- pmin(FC) = = 4 10 10 mbar
cal height comes to 15 % of the height of the peak or, put another way, at 110 4A / mbar
7.5 % of its peak height the line width DM measured across an individual
peak equals 1 amu (atomic mass unit); see in this context the schematic
drawing in Fig. 4.10.
4.5.5 Smallest detectable partial pressure ratio
(concentration)
4.5.2 Mass range The definition is:
The mass range is characterized by the atomic numbers for the lightest and SDPPR = pmin / p (ppm)
heaviest ions with a single charge which are detected with the unit.
This definition, which is somewhat clumsy for practical use, is to be
explained using the detection of argon36 in the air as the example: Air con-
tains 0.93 % argon by volume; the relative isotope frequency of Ar40 to Ar36
4.5.3 Sensitivity is 99.6 % to 0.337 %. Thus the share of Ar36 in the air can be calculated as
Sensitivity E is the quotient of the measured ion flow and the associated follows:
partial pressure; it is normally specified for argon or nitrogen:
0.93 102 0.337 102 = 3.13 105 = 31.3 ppm
+
i A
E= (4.1) Figure 4.11 shows the screen print-out for the measurement. The peak
pG mbar
height for Ar36 in the illustration is determined to be 1.5 10-13 A and noise
amplitude i+ to be 4 10-14 A. The minimum detectable concentration is
Typical values are: R
that concentration at which the height of the peak is equal to the noise
Faraday cup: E = 110 4
A amplitude. This results in the smallest measurable peak height being
mbar 1.5 10-13 A/2.4 10-14 A = 1.875. The smallest detectable concentration is
then derived from this by calculation to arrive at:
+2 A
SEMP: E = 110 31.3 106 / 1.875 = 16.69 106 = 16.69 ppm.
mbar

100%

+
i

15%
1 amu
7,5%

M M+1 Atomic number

Fig. 4.10 Line width 15 % valley Fig. 4.11 Detection of Argon36

101
Mass spectrometry
4.5.6 Linearity range 4.6 Evaluating spectra
The linearity range is that pressure range for the reference gas (N2, Ar) in
which sensitivity remains constant within limits which are to be specified 4.6.1 Ionization and fundamental problems in
( 10 % for partial pressure measurement devices). gas analysis
In the range below 1 10-6 mbar the relationship between the ion flow and Continuous change in the voltages applied to the electrodes in the separa-
partial pressure is strictly linear. Between 1 10-6 mbar and 1 10-4 mbar tion syssem (scanning) gives rise to a relationship between the ion flow I+
there are minor deviations from linear characteristics. Above 1 10-4 mbar and the atomic number which is proportional to the m/e ratio and
these deviations grow until, ultimately, in a range above 10-2 mbar the ions expressed as:
for the dense gas atmosphere will no longer be able to reach the ion trap.
Mr
The emergency shut-down for the cathode (at excessive pressure) is M= (4.2)
ne
almost always set for 5 10-4 mbar. Depending on the information required,
there will be differing upper limits for use. (Mr = relative molar mass, ne = number of elementary charges e)
In analytical applications, 1 10-6
mbar should not be exceeded if at all pos-
sible. The range from 1 10-6 mbar to 1 10-4 mbar is still suitable for clear This is the so-called mass spectrum, i+ = i+(M). The spectrum thus shows
depictions of the gas composition and partial pressure regulation (see Fig. the peaks i+ as ordinates, plotted against the atomic number M along the
4.12). abscissa. One of the difficulties in interpreting a mass spectrum such as
this is due to the fact that one and the same mass as per the equation (4.2)
may be associated with various ions. Typical examples, among many oth-
4.5.7 Information on surfaces and amenability + ++
ers, are: The atomic number M = 16 corresponds to CH4 and O2 ;
+
to bake-out M = 28 for CO+, N2 and C2H+! Particular attention must therefore be paid
to the following points when evaluating spectra:
Additional information required to evaluate a sensor includes specifications
on the bake-out temperature (during measurement or with the cathode or 1) In the case of isotopes we are dealing with differing positron counts in
SEMP switched off), materials used and surface areas of the metal, glass the nucleus (mass) of the ion at identical nuclear charge numbers (gas
and ceramic components and the material and dimensions for the cathode; type). Some values for relative isotope frequency are compiled in Table 4.2.
data is also needed on the electron impact energy at the ion source (and on
whether it is adjustable). These values are critical to uninterrupted operation
and to any influence on the gas composition by the sensor itself.
Element Ordinal- Atomic Relative
number number frequency

H 1 1 99.985
2 0.015

He 2 3 0.00013
4 100.0

B 5 10 19.78
+
11 80.22
log i

Regulation C 6 12 98.892
13 1.108

N 7 14 99.63
Exact measurement
range 15 0.37

O 8 16 99.759
Automatic shut-down: 17 0.0374
5 10 4
18 0.2039

F 9 19 100.0

Ne 10 20 90.92

21 0.257

22 8.82
108 107 106 105 104 103 log P
Na 11 23 100.0

Fig. 4.12 Qualitative linearity curve Table 4.2 Relative frequency of isotopes

102
 Mass spectrometry
Element Ordinal- Atomic Relative
number number frequency 12

Al 13 27 100.0 10
+
Ar

Ions formed per cm mbar

Si 14 28 92.27 8
29 4.68
30 3.05 6

P 15 31 100.0 4

S 16 32 95.06 2
33 0.74
34 4.18
0 100 200 300 400 500
36 0.016
Electron energy (eV)
Cl 17 35 75.4
Threshold
37 24.6 energy Ar+ 15,7 eV Ar++ 43,5 eV Ar3+ 85,0 eV Ar4+ 200 eV
for argon ions
Ar 18 36 0.337
38 0.063 Fig. 4.13 Number of the various Ar ions produced, as a factor of electron energy level
40 99.60
tion. The fragment distribution patterns thus created are the so-called
Kr 36 78 0.354 characteristic spectra (fingerprint, cracking pattern). Important: In the
80 2.27 tables the individual fragments specified are standardized either against the
82 11.56 maximum peak (in % or of the highest peak) or against the total of all
83 11.55 peaks (see the examples in Table 4.4).
84 56.90
86 17.37 Both the nature of the fragments created and the possibility for multiple ion-
ization will depend on the geometry (differing ion number, depending on the
length of the ionization path) and on the energy of the impacting electrons
Xe 54 124 0.096 (threshold energy for certain types of ions). Table values are always refer-
126 0.090 enced to a certain ion source with a certain electron energy level. This is
128 1.919 why it is difficult to compare the results obtained using devices made by dif-
129 26.44 ferent manufacturers.
130 4.08
131 21.18 Often the probable partial pressure for one of the masses involved will be
132 26.89 estimated through critical analysis of the spectrum. Thus the presence of air
134 10.44 in the vacuum vessel (which may indicate a leak) is manifested by the
136 8.87 detection of a quantity of O2+ (with mass of 32) which is about one-quarter
of the share of N2+ with its mass of 28. If, on the other hand, no oxygen is
Table 4.2 Relative frequency of isotopes

2) Depending on the energy of the impacting electrons (equalling the

potential differential, cathode anode), ions may be either singly or multiply
ionized. For example, one finds Ar+ at mass of 40, Ar++ at mass of 20 and
Ar+++ at mass of 13.3. At mass of 20 one will, however, also find neon, Ne+.
Ions formed per cm mbar

There are threshold energy levels for the impacting electrons for all ioniza-
tion states for every type of gas, i.e., each type of ion can be formed only
above the associated energy threshold. This is shown for Ar in Fig. 4.13.

3) Specific ionization of the various gases Sgas, this being the number of
ions formed, per cm and mbar, by collisions with electrons; this will vary
from one type of gas to the next. For most gases the ion yield is greatest at
an electron energy level between about 80 and 110 eV; see Fig. 4.14.

In practice the differing ionization rates for the individual gases will be taken
into account by standardization against nitrogen; relative ionization
probabilities (RIP) in relationship to nitrogen will be indicated (Table 4.3). Electron energy (eV)

4) Finally, gas molecules are often broken down into fragments by ioniza- Fig. 4.14 Specific ionization S for various gases by electrons exhibiting energy level E

103
Mass spectrometry
Type of gas Symbol RIP Type of gas Symbol RIP
Acetone (Propanone) (CH3)2CO 3.6 Hydrogen chloride HCl 1.6
Air 1.0 Hydrogen fluoride HF 1.4
Ammonia NH3 1.3 Hydrogen iodide HI 3.1
Argon Ar 1.2 Hydrogen sulfide H 2S 2.2
Benzene C6H6 5.9 Iodine I2
Benzoic acid C6H5COOH 5.5 Krypton Kr 1.7
Bromine Br 3.8 Lithium Li 1.9
Butane C4H10 4.9 Methane CH4 1.6
Carbon dioxide CO2 1.4 Methanol CH3OH 1.8
Carbon disulfide CS2 4.8 Neon Ne 0.23
Carbon monoxide CO 1.05 Nitrogen N2 1.0
Carbon tetrachloride CCl4 6.0 Nitrogen oxide NO 1.2
Chlorobenzene C6H4Cl 7.0 Nitrogen dioxide N 2O 1.7
Chloroethane C2H3Cl 4.0 Oxygen O2 1.0
Chloroform CHCl3 4.8 n-pentane C5H17 6.0
Chlormethane CH3Cl 3.1 Phenol C6H5OH 6.2
Cyclohexene C6H12 6.4 Phosphine PH3 2.6
Deuterium D2 0.35 Propane C3H8 3.7
Dichlorodifluoromethane CCl2F2 2.7 Silver perchlorate AgClO4 3.6
Dichloromethane CH2Cl2 7.8 Tin iodide Snl4 6.7
Dinitrobenzene C6H4(NO2)2 7.8 Sulfur dioxide SO2 2.1
Ethane C2H6 2.6 Sulfur hexafluoride SF6 2.3
Ethanol C2H5OH 3.6 Toluene C6H5CH3 6.8
Ethylene oxide (CH2)2O 2.5 Trinitrobenzene C6H3(NO2)3 9.0
Helium He 0.14 Water vapor H 2O 11.0
Hexane C6H14 6.6 Xenon Xe 3.0
Hydrogen H2 0.44 Xylols C6H4(CH3)2 7.8
Table 4.3 Relative ionization probabilities (RIP) vis vis nitrogen, electron energy 102 eV
Electron energy : 75 eV (PGA 100) 102 eV (Transpector)
Gas Symbol Mass = 100 % Greatest peak = 100 % = 100 % Greatest peak = 100 %
Argon Ar 40 74.9 100 90.9 100
20 24.7 33.1 9.1 10
36 0.3
Carbon dioxide CO2 45 0.95 1.3 0.8 1
44 72.7 100 84 100
28 8.3 11.5 9.2 11
16 11.7 16.1 7.6 9
12 6.15 8.4 5 6
Carbon monoxide CO 29 1.89 2.0 0.9 1
28 91.3 100 92.6 100
16 1.1 1.2 1.9 2
14 1.7 1.9 0.8
12 3.5 3.8 4.6 5
Neon Ne 22 9.2 10.2 0.9 11
20 89.6 100 90.1 100
10 0.84 0.93 9 4
Oxygen O2 34 0.45 0.53
32 84.2 100 90.1 100
16 15.0 17.8 9.9 11
Nitrogen N2 29 0.7 0.8 0.9 1
28 86.3 100 92.6 100
14 12.8 15 6.5 12
Water vapor H 2O 19 1.4 2.3
18 60 100 74.1 100
17 16.1 27 18.5 25
16 1.9 3.2 1.5 2
2 5.0 8.4 1.5 2
1 15.5 20 4.4 6
Table 4.4 Fragment distribution for certain gases at 75 eV and 102 eV

104
 Mass spectrometry
No Gas Symbol 1 = 100 2 3 4 5 6
1 Acetone (CH3)2CO 43/100 15/42 58/20 14/10 27/19 42/8
2 Air 28/100 32/27 14/6 16/3 40/1 -
3 Ammonia NH3 17/100 16/80 15/8 14/2 - -
4 Argon Ar 40/100 20/10 - - - -
5 Benzene C6H6 78/100 77/22 51/18 50/17 52/15 39/10
6 Carbon dioxide CO2 44/100 28/11 16/9 12/6 45/1 22/1
7 Carbon monoxide CO 28/100 12/5 16/2 29/1 - -
8 Carbon tetrachloride CCl4 117/100 119/91 47/51 82/42 35/39 121/29
9 Carbon tetrafluoride CF4 69/100 50/12 31/5 19/4 - -
10 Diff. pump oil, DC 705 78/100 76/83 39/73 43/59 91/32 -
11 Diff. pump oil, Fomblin 69/100 20/28 16/16 31/9 97/8 47/8
12 Diff. pump oil, PPE 50/100 77/89 63/29 62/27 64/21 38/7
13 Ethanol CH3CH2OH 31/100 45/34 27/24 29/23 46/17 26/8
14 Halocarbon 11 CCl3F 101/100 103/60 35/16 66/15 47/12 31/10
15 Halocarbon 12 CCl2F2 85/100 87/32 50/16 35/12 - -
16 Halocarbon 13 CClF3 69/100 85/15 50/14 31/9 35/7 87/5
17 Halocarbon 14 CF4 69/100 12/7 19/6 31/5 50/8 -
18 Halocarbon 23 CHF3 51/100 31/58 69/40 50/19 52/1 21/1
19 Halocarbon 113 C2C13F3 101/100 103/62 85/55 31/50 151/41 153/25
20 Helium He 4/100 - - - - -
21 Heptane C7H16 43/100 41/62 29/49 27/40 57/34 71/28
22 Hexane C6H14 41/100 43/92 57/85 29/84 27/65 56/50
23 Hydrogen H2 2/100 1/5 - - - -
24 Hydrogen sulfide H 2S 34/100 32/44 33/42 36/4 35/2 -
25 Isopropyl alcohol C3H8O 45/100 43/16 27/16 29/10 41/7 39/6
26 Krypton Kr 84/100 86/31 83/20 82/20 80/4 -
27 Methane CH4 16/100 15/85 14/16 13/8 1/4 12/2
28 Mehtyl alcohol CH3OH 31/100 29/74 32/67 15/50 28/16 2/16
29 Methyl ethyl ketone C4H8O 43/100 29/25 72/16 27/16 57/6 42/5
30 Mechanical pump oil 43/100 41/91 57/73 55/64 71/20 39/19
31 Neon Ne 20/100 22/10 10/1 - - -
32 Nitrogen N2 28/100 14/7 29/1 - - -
33 Oxygen O2 32/100 16/11 - - - -
34 Perfluorokerosene 69/100 119/17 51/12 131/11 100/5 31/4
35 Perfluor-tributylamine C12F27N 69/100 131/18 31/6 51/5 50/3 114/2
36 Silane SiH4 30/100 31/80 29/31 28/28 32/8 33/2
37 Silicon tetrafluoride SiF4 85/100 87/12 28/12 33/10 86/5 47/5
38 Toluene C6H5CH3 91/100 92/62 39/12 65/6 45.5/4 51/4
39 Trichloroethane C2H3Cl3 97/100 61/87 99/61 26/43 27/31 63/27
40 Trichloroethylene C2HCl3 95/100 130/90 132/85 97/64 60/57 35/31
41 Trifluoromethane CHF3 69/100 51/91 31/49 50/42 12/4 -
42 Turbomolecular pump oil 43/100 57/88 41/76 55/73 71/52 69/49
43 Water vapor H 2O 18/100 17/25 1/6 16/2 2/2 -
44 Xenon Xe 132/100 129/98 131/79 134/39 136/33 130/15

Table 4.5 Spectrum library of the 6 highest peaks for the TRANSPECTOR

detected in the spectrum, then the peak at atomic number 28 would indi- tion to CO+ the fragmentary masses of 12 (C+) and 16 (O++
2 )).
cate carbon monoxide. In so far as the peak at atomic number 28 reflects
Figure 4.15 uses a simplified example of a model spectrum with superim-
the CO+ fragment of CO2 (atomic number 44), this share is 11 % of the
positions of hydrogen, nitrogen, oxygen, water vapor, carbon monoxide,
value measured for atomic number 44 (Table 4.5). On the other hand, in all
carbon dioxide, neon and argon to demonstrate the difficulties involved in
cases where nitrogen is present, atomic number 14 (N++2 ) will always be
evaluating spectra.
found in the spectrum in addition to the atomic number 28 (N2+); in the case
of carbon monoxide, on the other hand, there will always appear in addi-

105
Mass spectrometry

CO+
O+

O+
H2+ Ar++ CO+
H 2 O+ O2 + Ar+ CO2+

H2+
O+
N+
H+ OH+ Ne+ N2+
C+ O+
13C+ H3O+ 22Ne +
13CO+

+
H+ Ne++ C 16O18O+ 36Ar+ 13C16O +
2
14N15N+

0 5 10 15 20 25 30 35 40 45 50
Hydrogen Oxygen Carbon dioxide Argon
Nitrogen Water Neon Carbon monoxide
Evaluation problems: The peak at atomic number 16 may, for example, be due to oxygen fragments resulting from O2, H2O, CO2 and CO; the peak at atomic number 28 from contributions
by N2 as well as by CO and CO as a fragment of CO2; the peak at atomic number 20 could result from singly ionized Ne and double-ionized Ar.

Fig. 4.15 Model spectrum

4.6.2 Partial pressure measurement Thus

, m2(produced)
+
igas
+ pgas =
The number of ions igasproduced from a gas in the ion source is propor- BFgas , m2 E gas
tional to the emission current i, to the specific ionization Sgas, to a geome-
+
try factor f representing the ionization path inside the ionization source, to igas , m (measured )
pgas = 2
the relative ionization probability RIPgas, and to the partial pressure pgas. BFgas , m E gas TF (m)
2
This number of ions produced is, by definition, made equal to the sensitivity
Egas times the partial pressure pgas: and with
+
igas (produced) = i- Sgas f RIPgas pgas a Egas = EN2 RIPgas
= Egas pgas the ultimate result is:
+
due to RIPN2 = 1 pgas = igas , m 2 (measured )

EN2 is equal to i SN2 f 1 1 (4.3)

and Egas is equal to EN2 RIPgas E N2 BFgas , m2 RIPgas TF (m)

Almost all gases form fragments during ionization. To achieve quantitative

evaluation one must either add the ion flows at the appropriate peaks or The partial pressure is calculated from the ion flow measured for a certain
measure (with a known fragment factor [FF]) one peak and calculate the fragment by multiplication with two factors. The first factor will depend only
overall ion flow on that basis: on the nitrogen sensitivity of the detector and thus is a constant for the
+ device. The second will depend only on the specific ion properties.
+ + +
igas ,m1
igas (produced )= igas ,m 1 + igas ,m2 +.... =
BFgas,m 1 These factors will have to be entered separately for units with direct partial
+
igas,m2 pressure indication (at least for less common types of ions).
= =.... = Egas pgas
BFgas,m2

In order to maintain the number of ions arriving at the ion trap, it is neces- 4.6.3 Qualitative gas analysis
sary to multiply the number above with the transmission factor TF(m), which
The analysis of spectra assumes certain working hypotheses:
will be dependent on mass, in order to take into account the permeability of
the separation system for atomic number m (analogous to this, there is the 1. Every type of molecule produces a certain, constant mass spectrum or
detection factor for the SEMP; it, however, is often already fragment spectrum which is characteristic for this type of molecule (fin-
contained in TF). The transmission factor (also: ion-optical transmission) is gerprint, cracking pattern).
thus the quotient of the ions measured and the ions produced.
2. The spectrum of every mixture of gases is the same as would be found

106
 Mass spectrometry
through linear superimposition of the spectra of the individual gases. many gas components; here a qualitative analysis will have to be made
The height of the peaks will depend on the gas pressure. before attempting quantitative analysis. The degree of difficulty encountered
will depend on the number of superimpositions (individual / a few / many).
3. The ion flow for each peak is proportional to the partial pressure of each
component responsible for the peak. Since the ion flow is proportional to In the case of individual superimpositions, mutual, balancing of the ion
the partial pressure, the constant of proportionality (sensitivity) varies flows during measurement of one and the same type of gas for several
from one gas to the next. atomic numbers can often be productive.

Although these assumptions are not always correct (see Robertson: Mass Where there is a larger number of superimpositions and a limited number of
Spectrometry) they do represent a useful working hypothesis. gases overall, tabular evaluation using correction factors vis vis the spec-
trum of a calibration gas of known composition can often be helpful.
In qualitative analysis, the unknown spectrum is compared with a known
spectrum in a library. Each gas is definitively determined by its spectrum.
The comparison with library data is a simple pattern recognition process.
Depending on the availability, the comparison may be made using any of a
number ancillary aids. So, for example, in accordance with the position,
size and sequence of the five or ten highest peaks. Naturally, comparison is Parent spectrum
possible only after the spectrum has been standardized, by setting the
height of the highest line equal to 100 or 1000 (see Table 4.5 as an exam-
ple).
A A = Parent
The comparison can be made manually on the basis of collections of tables range
(for example, A. Cornu & R. Massot: Compilation of Mass Spectral Data) or
may be effected with computer assistance; large databases can be used
(e.g. Mass Spectral Data Base, Royal Society of Chemistry, Cambridge).
Parent spectrum Assumption:
When making comparisons with library information, it is necessary to pay
Groups
attention to whether identical ion sources or at least identical electron 2 1
1 = Krypton+
impact energies were used. 2 = Krypton++
All these capabilities are, however, generally too elaborate for the problems
encountered in vacuum technology. Many commercial mass spectrometers Library spectrum:
can show a number of library spectra in the screen so that the user can see Krypton
immediately whether the library substance might be contained in the sub-
stance measured. Usually the measured spectrum was the result of a mix
of gases and it is particularly convenient if the screen offers the capacity for Parent spectrum without krypton Assumption:
subtracting (by way of trial) the spectra of individual (or several) gases from 3 Argon+
4
the measured spectrum. The gas can be present only when the subtraction 3 4 Argon++
does not yield any negative values for the major peaks. Figure 4.16 shows
such a step-by-step subtraction procedure using the Transpector-Ware soft-
ware. Library spectrum:
Argon
Regardless of how the qualitative analysis is prepared, the result is always
just a suggestion, i.e. an assumption as to which gases the mixture might
contain. This suggestion will have still to be examined, e.g. by considering
the likelihood that a certain substance would be contained in the spectrum. Parent spectrum without argon Assumption:
In addition, recording a new spectrum for this substance can help to 5 Neon+
5
achieve clarity.

4.6.4 Quantitative gas analysis Library spectrum:

Neon
Particular difficulties are encountered when interpreting the spectrum of an
unknown mixture of gases. The proportions of ion flow from various sources
can be offset one against the other only after all the sources have been
Parent spectrum after detection
identified. In many applications in vacuum technology one will be dealing of krypton, argon and neon
with mixtures of a few simple gases of known identity, with atomic numbers
less of than 50 (whereby the process-related gases can represent
exceptions). In the normal, more complicated case there will be a spectrum
with a multitude of superimpositions in a completely unknown mixture of Fig. 4.16 Subtracting spectra contained in libraries

107
Mass spectrometry
In the most general case a plurality of gases will make a greater or lesser FFT i = FFT FF I
contribution to the ion flow for all the masses. The share of a gas g in each
which can be evaluated direct by the computer. The ion current vector for
case for the atomic number m will be expressed by the fragment factor
the individual gases is then:
Ffm,g. In order to simplify calculation, the fragment factor Ffm,g will also con-
tain the transmission factor TF and the detection factor DF. Then the ion 1
[FF T i] [FF T BF ]
current to mass m, as a function of the overall ion currents of all the gases I=
det[FF T BF ]
involved, in matrix notation, is:
i j+ BF j, k BF j,o I k+




i + FFm, g I g+
4.7 Software
=
m

4.7.1 Standard SQX software (DOS) for stand-
+ alone operation (1 MS plus 1 PC, RS 232)
iu BFu, k BFu,o I o+
The conventional software package (SQX) contains the standard routines
The ion current vector for the atomic numbers m (resulting from the contri- for the operation of the mass spectrometer (MS) various spectra depic-
butions by the fragments of the individual gases) is equal to the fragment tions, queries of individual channels with the corresponding screen displays
matrix times the vector of the sum of the flows for the individual gases. as tables or bar charts, partial pressure conversion, trend displays, compar-
ison with spectra libraries (with the capability for trial subtraction of library
0
or: im+ = BFm, g I g+ spectra), leak testing mode etc. and for sensor balancing, as well. Using
g=k PCs as the computer and display unit naturally makes available all the
usual functions including storing and retrieving data, printing, etc.
(in simplified notation: i = FF I) Characteristic of the conventional software package is that specific individ-
+ ual spectra will be measured, even though the measurement is fully auto-
where im = ion flow vector for the atomic numbers, resulting from contribu-
mated and takes place at a point in time which is specified in advance. A
tions of fragments of various individual gases
spectrum of this type can thus be only a snapshot of a process in
0
BFm, g = fragment matrix
progress.
g=k

I+g = Vector of the sum of the flows for the individual gases or: 4.7.2 Multiplex/DOS software MQX
(1 to 8 MS plus 1 PC, RS 485)
Ff m, g
6444474448 The first step toward process-oriented software by LEYBOLD is the MQX. It
im+ = pg E N2 RIPg FFm TFm makes possible simultaneous monitoring of a maximum of eight sensors
Transmission factor and you can apply all the SQX functions at each sensor.
for the mass m
Fragment factor
for the gas to mass m
Relative ionization probability
for the gas
4.7.3 Process-oriented software
Nitrogen sensitivity (equipment constant) Transpector-Ware for Windows
Partial pressure of the gas
Ion current for atomic number m Transpector-Ware is based on an entirely new philosophy. During the
course of the process (and using settings the recipe determined
One sees that the ion flow caused by a gas is proportional to the partial
beforehand) data will be recorded continuously like the individual frames
pressure. The linear equation system can be solved only for the special
in a video. These data can be stored or otherwise evaluated. It is possible
instance where m = g (square matrix); it is over-identified for m > g. Due to
in particular to analyze interesting process sections exactly, both during the
unavoidable measurement error (noise, etc.) there is no set of overall ion
process and retroactively, once the process has run to completion, without
flow I+g (partial pressures or concentrations) which satisfies the equation
having to interrupt the measurement operations which are running in the
system exactly. Among all the conceivable solutions it is now necessary to
background. Where ongoing monitoring of identical processes is undertak-
identify set Ig+* which after inverse calculation to the partial ion flows Im
+
*
en the program can generate statistics (calculating mean values and stan-
will exhibit the smallest squared deviation from the partial ion currents i+m
dard deviations) from which a bandwidth for favorable process operation
actually measured. Thus:
can be derived. Error reports are issued where limit values are exceeded.
(im im*) = min
+ + 2

This minimization problem is mathematically identical to the solution of

another equation system

108
 Mass spectrometry
4.7.4 Development software b and c only the integration period was raised, from 0.1 to 1.0 and 10 sec-
TranspectorView onds (thus by an overall factor of 100), respectively. By comparison, in the
sequence a-d-e-f, at constant integration time, the total pressure was raised
This software used to for develop custom software versions for special situ- in three steps, from 7.2 10-6 mbar to 7.2 10-5 mbar (or by a factor of just
ations. It is based on the LabView development package and includes the 10 overall).
drivers required to operate the Transpector.

4.9 Maintenance
4.8 Partial pressure regulation
(Cathode service life, sensor balancing, cleaning the ion source and rod
Some processes, such as reactive sputter processes, require the most con- system)
stant possible incidence rates for the reacting gas molecules on the sub-
strate being coated. The service life of the cathode will depend greatly on the nature of the
loading. Experience has shown that the product of operating period multi-
The incidence rate is the same as the impingement rate discussed in plied by the operating pressure can serve as a measure for the loading.
Chapter 1; it is directly proportional to the partial pressure. The simplest Higher operating pressures (in a range of 1 10-4 to 1 10-3 mbar) have a
attempt to keep the partial pressure for a gas component constant is particularly deleterious effect on service life, as do certain chemical influ-
throughput by regulating with a flow controller; it does have the disadvan- ences such as refrigerants, for example. Changing out the cathode is quite
tage that the regulator cannot determine whether, when and where the gas easy, thanks to the simple design of the sensor. It is advisable, however, to
consumption or the composition of the gas in the vacuum chamber take this opportunity to change out or at least clean the entire ion source.
changes. The far superior and more effective option is partial pressure con-
trol using a mass spectrometer via gas inlet valves. Here the significant Sensor balancing at the mass axis (often erroneously referred to as cali-
peaks of the gases being considered are assigned to channels in the mass bration) is done today in a very easy fashion with the software (e.g. SQX,
spectrometer. Suitable regulators compare the analog output signals for Transpector-Ware) and can be observed directly in the screen. Naturally,
these channels with set-point values and derive from the difference not only the arrangement along the mass axis will be determined here, but
between the target and actual values for each channel the appropriate actu- also the shape of the lines, i.e. resolution and sensitivity (see Section 4.5).
ation signal for the gas inlet valve for the channel. A configuration of this It will be necessary to clean the sensor only in exceptional cases where it
kind has been realized to control six channels in the QUADREX PPC. Gas is heavily soiled. It is usually entirely sufficient to clean the ion source,
inlet valves matching the unit can also be delivered. which can be easily dismantled and cleaned. The rod system can be
The gas used to measure the impingement rate (partial pressure) must nat- cleaned in an ultrasonic bath once it has been removed from the config-
urally be drawn from a representative point in the vacuum chamber. When uration. If dismantling the system is unavoidable due to particularly stub-
evaluating the time constant for a regulation circuit of this type it is impor- born grime, then the adjustment of the rods which will be required after-
tant to take into account all the time aspects and not just the electrical sig- wards will have to be carried out at the factory.
nal propagation and the processing in the mass spectrometer, but also the
vacuum-technology time constants and flow velocities, as illustrated in
Figure 4.17. Pressure converters or unfavorably installed gas inlet lines
5. Leaks and their detection
joining the control valve and the vacuum vessel will make particularly large
contributions to the overall time constant. It is generally better to establish a
favorable S/N ratio with a large signal (i.e. through an inlet diaphragm with
a large opening) rather than with long integration periods at the individual a b c
channels. Contrasted in Figure 4.18 are the effects of boosting pressure
and lengthening the integration time on signal detectability. In depictions a,

t4
t5
Mass spectrometer

Pressure stage d e f
Regulation valve t1 


Sensor
t6 t2 t3
Vacuum vessel

TMP50CF

Fig. 4.17 Partial shares for overall time constants Fig. 4.18 Improving the signal-to-noise ratio by increasing the pressure or extending the integra-
tion time

109
Leak detection
Apart from the vacuum systems themselves and the individual components 5.2 Leak rate, leak size, mass flow
used in their construction (vacuum chambers, piping, valves, detachable
[flange] connections, measurement instruments, etc.), there are large num- No vacuum device or system can ever be absolutely vacuum-tight and it
bers of other systems and products found in industry and research which does not actually need to be. The simple essential is that the leak rate be
must meet stringent requirements in regard to leaks or creating a so-called low enough that the required operating pressure, gas balance and ultimate
hermetic seal. Among these are many assemblies and processes in the pressure in the vacuum container are not influenced. It follows that the
automotive and refrigeration industries in particular but also in many other requirements in regard to the gas-tightness of an apparatus are the more
branches of industry. Working pressure in this case is often above ambient stringent the lower the required pressure level is. In order to be able to reg-
pressure. Here hermetically sealed is defined only as a relative absence ister leaks quantitatively, the concept of the leak rate with the symbol QL
of leaks. Generalized statements often made, such as no detectable was introduced; it is measured with mbar l/s or cm3/s (STP) as the unit of
leaks or leak rate zero, do not represent an adequate basis for accep- measure. A leak rate of QL = 1 mbar l/s is present when in an enclosed,
tance testing. Every experienced engineer knows that properly formulated evacuated vessel with a volume of 1 l the pressure rises by 1 mbar per sec-
acceptance specifications will indicate a certain leak rate (see Section 5.2) ond or, where there is positive pressure in the container, pressure drops by
under defined conditions. Which leak rate is acceptable is also determined 1 mbar. The leak rate QL defined as a measure of leakiness is normally
by the application itself. specified in the unit of measure mbar l/s. With the assistance of the status
equation (1.7) one can calculate QL when giving the temperature T and the
type of gas M, registering this quantitatively as mass flow, e.g. in the g/s
unit of measure. The appropriate relationship is then:
5.1 Types of leaks (p V ) R T m
QL = = (5.1)
t M t
Differentiation is made among the following leaks, depending on the nature
of the material or joining fault: where R = 83.14 mbar l/mol K, T = temperature in K; M = molar mass in
Leaks in detachable connections: g/mole; m for the mass in g; t is the time period in seconds. Equation
Flanges, ground mating surfaces, covers 5.1 is then used

Leaks in permanent connections: a) to determine the mass flow m / t at a known pV gas flow of p V/t
Solder and welding seams, glued joints (see in this context the example at 5.4.1) or

Leaks due to porosity: particularly following mechanical deformation b) to determine the pV leak gas flow where the mass flow is known (see
(bending!) or thermal processing of polycrystalline materials and cast the following example).
components Example for case b) above:
Thermal leaks (reversible): opening up at extreme temperature loading A refrigeration system using Freon (R 12) exhibits refrigerant loss of 1 g of
(heat/ cold), above all at solder joints Freon per year (at 25 C). How large is the leak gas flow QL? According to
Apparent (virtual) leaks: quantities of gas will be liberated from hollows equation 5.1 for M(R12) = 121 g/mole:
and cavities inside cast parts, blind holes and joints (also due to the ( p V ) . mbar  298K 1g
8314
QL = =
evaporation of liquids) t mol K 121g mol 1 1year
Indirect leaks: leaking supply lines in vacuum systems or furnaces
. 2.98 102 1 mbar 
8314
(water, compressed air, brine) =
1211 . 107s
315
Serial leaks: this is the leak at the end of several spaces connected in
. 2.98102 7 mbar 
8314
series, e.g. a leak in the oil-filled section of the oil pan in a rotary vane = 10
pump 1.21102 315
. s

One-way leaks: these will allow gas to pass in one direction but are mbar 
= 65 107
tight in the other direction (very seldom) s

An area which is not gas-tight but which is not leaky in the sense that a Thus the Freon loss comes to QL = 6.5 106 mbar l/s. According to the
defect is present would be the rule of thumb for high vacuum systems given below, the refrigeration sys-
tem mentioned in this example may be deemed to be very tight. Additional
Permeation (naturally permeability) of gas through materials such as
conversions for QL are shown in Tables VIIa and VIIb in Chapter 9.
rubber hoses, elastomer seals, etc. (unless these parts have become
brittle and thus leaky). The following rule of thumb for quantitative characterization of high vacuum
equipment may be applied:

Total leak rate < 10-6 mbar l/s:

Equipment is very tight

Total leak rate 10-5 mbar l/s:

110
 Leak detection
Equipment is sufficiently tight sound of 970 m/s, then in analogous fashion the QL (helium) will come to
7.7 10+4 mbar l/s, or a pV leaking gas current which is larger by a factor
Total leak rate > 10-4
mbar l/s:
of 970 / 330 = 2.94. This greater sensitivity for helium is used in leak
Equipment is leaky
detection practice and has resulted in the development and mass produc-
A leak can in fact be overcome by a pump of sufficient capacity because it tion of highly sensitive helium-based leak detectors (see Section 5.5.2).
is true that (for example at ultimate pressure pend and disregarding the gas
Shown in Figure 5.1 is the correlation between the leak rate and hole size
liberated from the interior surfaces):
for air, with the approximation value of QL (air) of 10+4 mbar l/s for the
QL 1 cm hole. The table shows that when the hole diameter is reduced to
p = (5.2) 1 m (= 0.001 mm) the leak rate will come to 10-4 mbar l/s, a value which
end S
eff
in vacuum technology already represents a major leak (see the rule of
thumb above). A leak rate of 10-12 mbar l/s corresponds to hole diameter
(QL Leak rate, Seff the effective pumping speed at the pressure vessel)
of 1 ; this is the lower detection limit for modern helium leak detectors.
Where Seff is sufficiently great it is possible regardless of the value for the Since the grid constants for many solids amount to several and the diam-
leak rate QL always to achieve a pre-determined ultimate pressure of eter of smaller molecules and atoms (H2, He) are about 1 , inherent per-
pend. In practice, however, an infinite increase of Seff will run up against meation by solids can be registered metrologically using helium leak detec-
economic and engineering limitations (such as the space required by the tors. This has led to the development of calibrated reference leaks with very
system). small leak rates (see Section 5.5.2.3). This is a measurable lack of tight-
ness but not a leak in the sense of being a defect in the material or joint.
Whenever it is not possible to achieve the desired ultimate pressure in an
Estimates or measurements of the sizes of atoms, molecules, viruses, bac-
apparatus there are usually two causes which can be cited: The presence
teria, etc. have often given rise to everyday terms such as watertight or
of leaks and/or gas being liberated from the container walls and sealants.
bacteria-tight; see Table 5.1.
Partial pressure analysis using a mass spectrometer or the pressure rise
Compiled in Figure 5.2 are the nature and detection limits of frequently
method may be used to differentiate between these two causes. Since the
used leak detection methods.
pressure rise method will only prove the presence of a leak without indicat-
ing its location in the apparatus, it is advisable to use a helium leak detector
with which leaks can, in general, also be located much more quickly.

In order to achieve an overview of the correlation between the geometric

size of the hole and the associated leak rate it is possible to operate on the
basis of the following, rough estimate: A circular hole 1 cm in diameter in
the wall of a vacuum vessel is closed with a gate valve. Atmospheric pres-
sure prevails outside, a vacuum inside. When the valve is suddenly opened
all the air molecules in a cylinder 1 cm in diameter and 330 m high would
within a 1-second period of time fall into the hole at the speed of sound
(330 m/s). The quantity flowing into the vessel each second will be 1013
mbar times the cylinder volume (see Fig. 5.1). The result is that for a hole 1
cm in diameter QL (air) will be 2.6 104 mbar l/s. If all other conditions are Concept / criterion Comment QL [mbar l/s] Relevant particle size
kept identical and helium is allowed to flow into the hole at its speed of
Water-tight*) Droplets QL < 102
Vapor-tight Sweating QL < 103
p = 1013 mbar, Hole diameter d = 1 cm Bacteria-tight*)
m (cocci) QL < 104 Avg. 1 m
Gas speed = Speed of sound = 330 s
(rod-shaped) Avg. 0.5-1 m, 210 m long
12
3
+3 cm 
330 m QL < 105
2
Oil-tight
Volume/second: s 4 cm = 25.95 10 s = 25.95 s
Quantity/second: 1013 mbar 25.95 s = 2.63 10 10
+4 +4 mbar 
s
Virus-tight*)
(vaccines such as pox) QL < 106 3 107 m
mbar  (smallest viruses,
Diameter cm Leak rate s
102 m= 1.0 cm 10+4 bacteriophages) QL < 108 3 108 m
103 m= 1.0 mm 10+2 (viroids, RNA) QL < 1010 1 109 m (thread-like)
104 m= 0.1 mm 100 (= 1)
105 m= 0.01 mm 102 Gas-tight QL < 107
106 m= 1.0 m 104
107 m= 0.1 m 106
Absolutely tight Technical QL < 1010
108 m= 0.01 m 108 *) As opposed to vapor, it is necessary to differentiate between hydrophilic and
109 m= 1.0 nm 1010
1010 m= 1.0 Angstrom 1012 (Detection limit, He leak detector) hydrophobic solids. This also applies to bacteria and viruses since they are
transported primarily in solutions.

Fig. 5.1 Correlation between leak rate and hole size Table 5.1 Estimating borderline leak rates

111
Leak detection

Leak <----> Hole Substance quantity trhough hole per unit of time Helium standard leak rate:
Q ... Leak rate, (p V) p1 = 1 bar, p2 < 1 mbar (p = 1 bar)
In short: Leak Definition: Q = Test gas = Helium
Helium leak detector ULTRATEST UL 200 dry/UL 500 t

Vacuum method

Contura Z
Familiar leaks: Quantity escaping: Standard He leak rate:

mbar mbar
Helium leak detector ULTRATEST UL 200/UL 500 dry/Modul 200/LDS 1000
Dripping water faucet
mg
34 s Water = 6.45 s Air 0.17 s He Std
4 mm diam., 1 Hz, p = 4 bar
Pressure rise
mbar mbar
Hair on a gasket 10 2 s Air 0.9 10 2 s He Std
103................100 10-1 10-2 10-3 10-4 10-5 10-6 10-7 10-8 10-9 10-10 10-11 10-12 mbar l s-1
Bicycle tube in water
(bubble test) 3
mbar mbar
Ecotec II / Protec 2 mm diam., 1 Hz, p = 0.1 bar 4.19 10
3 Ncm
s = 4.24 10 3
s Air 1.88 10 2 s He Std

Overpressure method
ULTRATEST with helium sniffer Car tire loses air mbar
mbar 4.3 10 5 s He Std
25 l, 6 Mo: 1.8 --> 1.6 bar 3.18 10 4 s Air
Halogen sniffer HLD4000A
Small refrigerant cylinder
mbar mbar
Bubble test
empties in 1 year
g

430 a Frigen = 2.8 10 3 s F12 4.33 10 5 s He Std
430 g refrigerant R12, 25C

Pressure drop test

Fig. 5.2 Leak rate ranges for various leak detection processes and devices Fig. 5.3 Examples for conversion into helium standard leak rates

5.2.1 The standard helium leak rate Here indices I and II refer to the one or the other pressure ratio and
indices 1 and 2 reference the inside and outside of the leak point,
Required for unequivocal definition of a leak are, first, specifications for the respectively.
pressures prevailing on either side of the partition and, secondly, the nature
of the medium passing through that partition (viscosity) or its molar mass.
The designation helium standard leak (He Std) has become customary to
designate a situation frequently found in practice, where testing is carried 5.3 Terms and definitions
out using helium at 1 bar differential between (external) atmospheric pres-
sure and the vacuum inside a system (internal, p < 1 mbar), the designa- When searching for leaks one will generally have to distinguish between
tion helium standard leak rate has become customary. In order to indicate two tasks:
the rejection rate for a test using helium under standard helium conditions it 1. Locating leaks and
is necessary first to convert the real conditions of use to helium standard 2. Measuring the leak rate.
conditions (see Section 5.2.2). Some examples of such conversions are
shown in Figure 5.3. In addition, we distinguish, based on the direction of flow for the fluid,
between the

a. vacuum method (sometimes known as an outside-in leak), where the

5.2.2 Conversion equations direction of flow is into the test specimen (pressure inside the specimen
When calculating pressure relationships and types of gas (viscosity) it is being less than ambient pressure), and the
necessary to keep in mind that different equations are applicable to laminar b. positive pressure method (often referred to as the inside-out leak),
and molecular flow; the boundary between these areas is very difficult to where the fluid passes from inside the test specimen outward (pressure
ascertain. As a guideline one may assume that laminar flow is present at inside the specimen being greater than ambient pressure).
leak rates where QL > 10-5 mbar l/s and molecular flow at leak rates
where QL < 10-7 mbar l/s. In the intermediate range the manufacturer The specimens should wherever possible be examined in a configuration
(who is liable under the guarantee terms) must assume values on the safe corresponding to their later application components for vacuum applica-
side. The equations are listed in Table 5.2. tions using the vacuum method and using the positive pressure method for
parts which will be pressurized on the inside.
Range Laminar Molecular
When measuring leak rates we differentiate between registering
Pressure QI (p12 p22)II = Q II (p12 p22)I QI (p1 p2)II = QII (p1 p2)I
a. individual leaks (local measurement) sketches b and d in Figure 5.4,
and registering
Qgas A gas A = Qgas B gas B Qgas A Mgas A = Qgas B Mgas B
Gas
b. the total of all leaks in the test specimen (integral measurement)
Table 5.2 Conversion formulae for changes of pressure and gas type sketches a and c in Figure 5.4.

112
 Leak detection

Helium
detector. This procedure can be carried out using either helium or refriger-
ants or SF6 as the test gas.

5.4 Leak detection methods without a leak

c: Integral leak detection (test gas enrich-
ment inside the enclosure); pressurized test
detector unit
a: Integral leak detection; vacuum inside
gas inside specimen
specimen The most sensible differentiation between the test methods used is differen-
tiation as to whether or not special leak detection equipment is used.

Helium In the simplest case a leak can be determined qualitatively and, when using
certain test techniques, quantitatively as well (this being the leak rate) with-
out the assistance of a special leak detector. Thus the quantity of water
dripping from a leaking water faucet can be determined, through a certain
period of time, using a graduated cylinder but one would hardly refer to this
as a leak detector unit. In those cases where the leak rate can be deter-
Helium mined during the course of the search for the leak without using a leak
detector (see, for example, Sect. 5.4.1), this will often be converted to the
b: Local leak detection; vacuum inside speci- d: Local leak detection; pressurized test gas
men inside the specimen helium standard leak rate (Sect. 5.2.1). This standard leak rate value is fre-
quently needed when issuing acceptance certificates but can also be of ser-
Fig. 5.4 Leak test techniques and terminology
vice when comparing leak rate values determined by helium leak detector
devices.
The leak rate which is no longer tolerable in accordance with the accep-
tance specifications is known as the rejection rate. Its calculation is based In spite of careful inspection of the individual engineering components,
on the condition that the test specimen may not fail during its planned uti- leaks may also be present in an apparatus following its assembly be it
lization period due to faults caused by leaks, and this to a certain degree of due to poorly seated seals or damaged sealing surfaces. The processes
certainty. Often it is not the leak rate for the test specimen under normal used to examine an apparatus will depend on the size of the leaks and on
operating conditions which is determined, but rather the throughput rate of the degree of tightness being targeted and also on whether the apparatus is
a test gas primarily helium under test conditions. The values thus found made of metal or glass or other materials. Some leak detection techniques
will have to be converted to correspond to the actual application situation in are sketched out below. They will be selected for use in accordance with
regard to the pressures inside and outside the test specimen and the type the particular application situations; economic factors may play an important
of gas (or liquid) being handled. part here.
Where a vacuum is present inside the test specimen (p < 1 mbar), atmos-
pheric pressure outside, and helium is used at the test gas, one refers to
standard helium conditions. Standard helium conditions are always pre- 5.4.1 Pressure rise test
sent during helium leak detection for a high vacuum system when the sys- This leak testing method capitalizes on the fact that a leak will allow a
tem is connected to a leak detector and is sprayed with helium (spray quantity of gas remaining uniform through a period of time to enter a
technique). If the specimen is evacuated solely by the leak detector, then sufficiently evacuated device (impeded gas flow, see Fig. 1.1). In contrast,
one would say that the leak detector is operating in the direct-flow mode. the quantity of gas liberated from container walls and from the materials
If the specimen is itself a complete vacuum system with its own vacuum used for sealing (if these are not sufficiently free of outgassing) will decline
pump and if the leak detector is operated in parallel to the systems pumps, through time since these will practically always be condensable vapors for
then one refers to partial-flow mode. One also refers to partial stream which an equilibrium pressure is reached at some time (see Fig. 5.5). The
mode when a separate auxiliary pump is used parallel to the leak detector. valve at the pump end of the evacuated vacuum vessel will be closed in
When using the positive pressure method it is sometimes either impractical preparation for pressure rise measurements. Then the time is measured
or in fact impossible to measure the leakage rate directly while it could cer- during which the pressure rises by a certain amount (by one power of ten,
tainly be sensed in an envelope which encloses the test specimen. The for example). The valve is opened again and the pump is run again for
measurement can be made by connecting that envelope to the leak detec- some time, following which the process will be repeated. If the time noted
tor or by accumulation (increasing the concentration) of the test gas inside for this same amount of pressure rise remains constant, then a leak is pre-
the envelope. The bombing test is a special version of the accumulation sent, assuming that the waiting period between the two pressure rise trials
test (see Section 5.7.4). In the so-called sniffer technique, another varia- was long enough. The length of an appropriate waiting period will depend
tion of the of the positive pressure technique, the (test) gas issuing from on the nature and size of the device. If the pressure rise is more moderate
leaks is collected (extracted) by a special apparatus and fed to the leak during the second phase, then the rise may be assumed to result from
gases liberated from the inner surfaces of the vessel. One may also attempt
to differentiate between leaks and contamination by interpreting the curve
depicting the rise in pressure. Plotted on a graph with linear scales, the

113
Leak detection
Q 6 10 5 mbar  s 1
pend = L =
Seff 30  s 1

= 2 10 6 mbar

Naturally it is possible to improve this ultimate pressure, should it be insuffi-

Pressure

cient, by using a larger-capacity pump (e.g. the TURBOVAC 151) and at

the same time to reduce the pump-down time required to reach ultimate
pressure.

Today leak tests for vacuum systems are usually carried out with helium
leak detectors and the vacuum method (see Section 5.7.1). The apparatus
Time
is evacuated and a test gas is sprayed around the outside. In this case it
1 Leak must be possible to detect (on the basis of samplings inside the apparatus)
2 Gas evolved from the container walls
3 Leak + gas evolution the test gas which has passed through leaks and into the apparatus.
Another option is to use the positive-pressure leak test. A test gas (helium)
is used to fill the apparatus being inspected and to build up a slight positive
pressure; the test gas will pass to the outside through the leaks and will be
curve for the rise in pressure must be a straight line where a leak is pre- detected outside the device. The leaks are located with leak sprays (or
sent, even at higher pressures. If the pressure rise is due to gas being lib- soap suds, 5.4.5) or when using He or H2 as the test gas with a leak
erated from the walls (owing ultimately to contamination), then the pressure detector and sniffer unit (5.7.2).
rise will gradually taper off and will approach a final and stable value. In
most cases both phenomena will occur simultaneously so that separating
the two causes is often difficult if not impossible. These relationships are
5.4.2 Pressure drop test
shown schematically in Figure 5.5. Once it has become clear that the rise
in pressure is due solely to a real leak, then the leak rate can be deter- The thinking here is analogous to that for the pressure rise method (Section
mined quantitatively from the pressure rise, plotted against time, in accor- 5.4.1). The method is, however, used only rarely to check for leaks in vacu-
dance with the following equation: um systems. If this is nonetheless done, then gauge pressure should not
exceed 1 bar since the flange connectors used in vacuum technology will
p V
QL = (5.3) as a rule not tolerate higher pressures. Positive pressure testing is, on the
t
other hand, a technique commonly employed in tank engineering. When
Example: Once the vacuum vessel with a volume of 20 l has been isolated dealing with large containers and the long test periods they require for the
from the pump, the pressure in the apparatus rises from 1 10-4 mbar to pressure drop there it may under certain circumstances be necessary to
1 10-3 mbar in 300 s. Thus, in accordance with equation 5.2, the leak rate consider the effects of temperature changes. As a consequence it may hap-
will be pen, for example, that the system cools to below the saturation pressure for
water vapor, causing water to condense; this will have to be taken into

1 10 3 1 10 4 20 account when assessing the pressure decline.

QL =
300

9 10 4 20 mbar  5.4.3 Leak test using vacuum gauges which are

= = 6 10 5
300 s sensitive to the type of gas
The fact that the pressure reading at vacuum gauges (see Section 3.3) is
The leak rate, expressed as mass flow m / t, is derived from equation
sensitive to the type of gas involved can, to a certain extent, be utilized for
5.1 at QL = 6 10-5 mbar l/s, T = 20 C and the molar mass for air
leak detection purposes. Thus it is possible to brush or spray suspected
(M = 29 g/mole) at
leaks with alcohol. The alcohol vapors which flow into the device the ther-
m mbar  g mal conductivity and ionizablity of which will vary greatly from the same
QL = = 6 105 29
t s mol properties for air will affect and change pressure indication to a greater or
mol K g lesser extent. The availability of more precise, easy-to-use helium leak
= 7 10 8 detectors has, however, rendered this method almost completely obsolete.
. mbar  293 102 K
8314 s

If the container is evacuated with a TURBOVAC 50 turbomolecular pump,

for example (S = 50 l/s), which is attached to the vacuum vessel by way of
a shut-off valve, then one may expect an effective pumping speed of about
Seff = 30 l/s. Thus the ultimate pressure will be

114
 Leak detection
5.4.4 Bubble immersion test 5.4.7 Krypton 85 test
The pressurized test specimen is submerged in a liquid bath. Rising gas When dealing with small, hermetically sealed parts where the enclosure is
bubbles indicate the leak. Leak detection will depend greatly on the atten- leaky, krypton 85, a gaseous, radioactive isotope, can first be forced into
tiveness of the person conducting the test and involves the temptation to the device by applying pressure from the outside. Once an exactly mea-
increase the sensitivity by using ever higher temperatures, wherein the sured holding period has elapsed the pressure will be relieved, the compo-
applicable safety regulations are sometimes disregarded. This method is nent flushed and the activity of the gas charge will be measured. In the
very time-consuming for smaller leaks, as Table 5.3 shows. It references same way it is also possible to use helium as the test gas (see Section
leak testing on a refrigeration system using type R12 refrigerant. Here the 5.7.4, bombing test).
leak rate is specified in grams of refrigerant loss per year (g/a). Water is
used as a test liquid (which may be heated or to which a surfactant may be
added) or petroleum-based oils. The surface tension should not exceed 5.4.8 High-frequency vacuum test
75 dyn/cm (1 dyn = 10-5 N).
The so-called high-frequency vacuum tester can be used not only to check
Freon F12 loss Time taken to form Equivalent Detection time using the pressure in glass equipment but also to locate porous areas in plastic or
per year a gas bubble leak rate helium leak detector paint coatings on metals. This comprises a hand-held unit with a brush-like
(g/a) (s) (cm3[STP]/s) (s) high-frequency electrode and a power pack. The shape and color of the
280 13.3 1.8 103 a few seconds electrical gas discharge can serve as a rough indicator for the pressure pre-
84 40 5.4 104 a few seconds vailing inside glass equipment. In the case of the vacuum tester which
comprises primarily a tesla transformer (which delivers a high-voltage, high-
28 145 1.8 104 a few seconds frequency AC current) the corona electrode approaching the apparatus
14 290 9.0 105 a few seconds will trigger an electrode-free discharge inside the apparatus. The intensity
2.8 24 min 1.8 105 a few seconds and color of this discharge will depend on the pressure and the type of gas.
The luminous discharge phenomenon allows us to draw conclusions
0.28 * 6h 1.8 106 a few seconds
regarding the approximate value for the pressure prevailing inside the appa-
*) This leak rate represents the detection limit for good halogen leak detec-
ratus. The discharge luminosity will disappear at high and low pressures.
tors ( 0,1 g/a).
When searching for leaks in glass equipment the suspect sections will be
Table 5.3 Comparison of bubble test method (immersion technique) wit helium leak detec-
scanned or traced with the high-frequency vacuum tester electrode. Where
there is a leak an arc will strike through to the pore in the glass wall, tracing
a brightly lit discharge trail. Small pores can be enlarged by these sparks!
5.4.5 Foam-spray test
The corona discharge of the vacuum tester can also penetrate thin areas in
In many cases pressurized containers or gas lines (including the gas supply the glass particularly at weld points and transitional areas between interme-
lines for vacuum systems) can be checked quite conveniently for leaks by diate components. Equipment which was originally leak-free can become
brushing or spraying a surfactant solution on them. Corresponding leak leaky in this fashion! In contrast to the actual leak detector units, the high-
detection sprays are also available commercially. Escaping gas forms soap frequency vacuum tester is highly limited in its functioning.
bubbles at the leak points. Here, again, the detection of smaller leaks is
time-consuming and will depend greatly on the attentiveness of the inspec-
tor. The hydrogen gas cooling systems used in power plant generators rep- 5.4.9 Test with chemical reactions and dye pene-
resent a special case. These are indeed sometimes tested in the fashion tration
described above but they can be examined much better and at much higher
sensitivity by sniffing the hydrogen escaping at leaks using a helium leak Occasionally leaks can also be located or detected by means of chemical
detector which has been adjusted to respond to H2 (see Section 5.7.2). reactions which result in a discoloration or by penetration of a dye solution
into fine openings. The discoloration of a flame due to halogen gas escap-
ing through leaks was used earlier to locate leaks in solder joints for refrig-
5.4.6 Vacuum box check bubble eration units.

As a variation on the spray technique mentioned above, in which the escap- A less frequently employed example of a chemical effect would be that of
ing gas causes the bubbles, it is possible to place a so-called vacuum box escaping ammonia when it makes contact with ozalid paper (blueprint
with a seal (something like a divers goggles) on the surface being exam- paper) or with other materials suitably prepared and wrapped around the
ined once it has been sprayed with a soap solution. This box is then evacu- outside of the specimen. Leaks are then detected based on the discol-
ated with a vacuum pump. Air entering from the outside through leaks will oration of the paper.
cause bubbles inside the box, which can be observed through a glass win- An example of a dye penetration test is the inspection of the tightness of
dow in the box. In this way it is also possible, for example, to examine flat rubber plugs or plungers in glass tubes, used for example in testing materi-
sheet metal plates for leaks. Vacuum boxes are available for a variety of als suitability for disposable syringes or pharmaceutical packages. When
applications, made to suit a wide range of surface contours. evaluating tiny leaks for liquids it will be necessary to consider the wetability
of the surface of the solid and the capillary action; see also Table 5.1. Some

115
Leak detection
widely used leak detection methods are shown together with the test gas, 5.5.1 Halogen leak detectors
application range and their particular features in Table 5.4. (HLD 4000, D-Tek)
Gaseous chemical compounds whose molecules contain chlorine and/or
Method Test gas Smallest detectable Pressure range Quantitative fluorine such as refrigerants R12, R22 and R134a will influence the
leak rate measurement
mbar /s g/a R 134 a
emissions of alkali ions from a surface impregnated with a mixture of KOH
Foaming Air and others 10
4
7 10
1
Positive pressure No and Iron(III)hydroxide and maintained at 800 C to 900 C by an external
liquids
Pt heater. The released ions flow to a cathode where the ion current is
2
Ultrasonic Air and others 10 70 Positive pressure No
microphone
measured and then amplified (halogen diode principle). This effect is so
Thermal conducti- Gases other
3
10 10
5 1
10 7 Positive pressure No
great that partial pressures for halogens can be measured down to
vity leak detector than air and vacuum 10-7 mbar.

Halogen Substances 10
6
7 10
3
Positive pressure With Whereas such devices were used in the past for leak testing in accordance
5 1
leak detection containing (10 ) (10 ) (vacuum) limitations
halogens with the vacuum method, today because of the problems associated with
Universal Refrigerants, 10
5
7 10
3
Positive pressure Yes
the CFCs more sniffer units are being built. The attainable detection limit
sniffer helium and is about 1 10-6 mbar l/s for all the devisces. Equipment operating in
leak detector other gases
12 9
accordance with the halogen diode principle can also detect SF6.
Helium Helium 10 7 10 Vacuum, Yes
leak detection 10
7
7 10
4
positive pressure Consequently these sniffer units are used to determine whether refrigerants
Bubble test Air and other 10
3
7 Positive pressure No are escaping from a refrigeration unit or from an SF6 type switch box (filled
gases
with arc suppression gas).
2
Water pressure Water 10 70 Positive pressure No
test
4 1
Pressure Air and other 10 7 10 Positive pressure Yes
drop test gases 5.5.2 Leak detectors with mass spectrometers
Pressure
rise test
Air 10
4
7 10
1
Vacuum Yes (MSLD)
Table 5.4 Comparison of leak detection methods
The detection of a test gas using mass spectrometers is far and away the
most sensitive leak detection method and the one most widely used in
industry. The MS leak detectors developed for this purpose make possible
quantitative measurement of leak rates in a range extending across many
5.5 Leak detectors and how they work powers of ten (see Section 5.2) whereby the lower limit 10-12 mbar l/s,
Most leak testing today is carried out using special leak detection devices. thus making it possible to demonstrate the inherent gas permeability of
These can detect far smaller leak rates than techniques which do not use solids where helium is used as the test gas. It is actually possible in princi-
special equipment. These methods are all based on using specific gases ple to detect all gases using mass spectrometry. Of all the available
for testing purposes. The differences in the physical properties of these test options, the use of helium as a tracer gas has proved to be especially prac-
gases and the gases used in real-life applications or those surrounding the tical. The detection of helium using the mass spectrometer is absolutely (!)
test configuration will be measured by the leak detectors. This could, for unequivocal. Helium is chemically inert, non-explosive, non-toxic, is present
example, be the differing thermal conductivity of the test gas and surround- in normal air in a concentration of only 5 ppm and is quite economical. Two
ing air. The most widely used method today, however, is the detection of types of mass spectrometer are used in commercially available MSLDs:
helium used as the test gas.
a) The quadrupole mass spectrometer, although this is used less frequent-
The function of most leak detectors is based on the fact that testing is con- ly due to the more elaborate and complex design (above all due to the
ducted with a special test gas, i.e. with a medium other than the one used electrical supply for the sensor), or
in normal operation. The leak test may, for example, be carried out using
b) the 180 magnetic sector field mass spectrometer, primarily due to the
helium, which is detected using a mass spectrometer, even though the
relatively simple design.
component being tested might, for example, be a cardiac pacemaker
whose interior components are to be protected against the ingress of bodily Regardless of the functional principle employed, every mass spectrometer
fluids during normal operation. This example alone makes it clear that the comprises three physically important sub-systems: the ion source, separa-
varying flow properties of the test and the working media need to be taken tion system and ion trap. The ions must be able to travel along the path
into consideration. from the ion source and through the separation system to the ion trap, to
the greatest possible extent without colliding with gas molecules. This path
amounts to about 15 cm for all types of spectrometers and thus requires a
medium free path length of at least 60 cm, corresponding to pressure of
about 1 10-4 mbar; in other words, a mass spectrometer will operate only
in a vacuum. Due to the minimum vacuum level of 1 10-4 mbar, a high
vacuum will be required. Turbomolecular pumps and suitable roughing
pumps are used in modern leak detectors. Associated with the individual
component groups are the required electrical- and electronic supply sys-

116
 Leak detection
tems and software which, via a microprocessor, allow for the greatest possi- numerical constant and to have the leak rate displayed direct.
ble degree of automation in the operating sequence, including all adjust-
ment and calibration routines and measured value display.
5.5.2.2 Detection limit, background, gas storage in oil
(gas ballast), floating zero-point suppression
5.5.2.1 The operating principle for a MSLD
The smallest detectable leak rate is dictated by the natural background
The basic function of a leak detector and the difference between a leak level for the gas to be detected. Even with the test connector at the leak
detector and mass spectrometer can be explained using Figure 5.6. This detector closed, every gas will pass counter to the pumping direction
sketch shows the most commonly found configuration for leak detection through the exhaust and through the pumps (but will be reduced according-
using the helium spray method (see Section 5.7.1) at a vacuum component. ly by their compression) through to the spectrometer and will be detected
When the sprayed helium is drawn into the component through a leak it is there if the electronic means are adequate to do so. The signal generated
pumped thorough the interior of the leak detector to the exhaust, where it represents the detection limit. The high vacuum system used to evacuate
again leaves the detector. Assuming that the detector itself is free of leaks, the mass spectrometer will normally comprise a turbomolecular pump and
the amount of gas flowing through each pipe section (at any desired point) an oil-sealed rotary vane pump. (Diffusion pumps were used earlier instead
per unit of time will remain constant regardless of the cross section and the of the turbomolecular pumps.) Like every liquid, the sealing oil in the rotary
routing of the piping. The following applies for the entry into the pumping vane pump has the capability of dissolving gases until equilibrium is
port at the vacuum pump: reached between the gas dissolved in the oil and the gas outside the oil.
When the pump is warm (operating temperature) this equilibrium state rep-
Q=pS (5.4)
resents the detection limit for the leak detector. The helium stored in the oil
At all other points thus influences the detection limit for the leak detector. It is possible for test
gas to enter not only through the test connection and into the leak detector;
Q = p Seff (5.4a)
improper installation or inept handling of the test gas can allow test gas to
applies, taking the line losses into account. enter through the exhaust and the airing or gas ballast valve and into the
interior of the detector, to increase the helium level in the oil and the elas-
The equation applies to all gases which are pumped through the piping and
tomer seals there and thus to induce a background signal in the mass
thus also for helium.
spectrometer which is well above the normal detection limit. When the
QHe = pHe Seff, He (5.4b) device is properly installed (see Fig. 5.7) the gas ballast valve and the air-
ing valve will be connected to fresh air and the discharge line (oil filter!)
In this case the gas quantity per unit of time is the leak rate being sought;
should at least be routed to outside the room where the leak test takes
the total pressure may not be used, but only the share for helium or the
place.
partial pressure for helium. This signal is delivered by the mass spectrome-
ter when it is set for atomic number 4 (helium). The value for Seff is a con- An increased test gas (helium) background level can be lowered by open-
stant for every series of leak detectors, making it possible to use a micro- ing the gas ballast valve and introducing gas which is free of the test gas
processor to multiply the signal arriving from the mass spectrometer by a (helium-free gas, fresh air). The dissolved helium will be flushed out, so to
speak. Since the effect always affects only the part of the oil present in the
pump body at the particular moment, the flushing procedure will have to
Test gas
e.g. He

Test connection
Test specimen

Test connection
Mass spectrometer

Turbomolecular
MS pump
Venting
Leak detector valve

Gas ballast
valve
QHe = pHe SeffHe Roughing pump

Exhaust
Exhaust

Fig. 5.6 Basic operating principle for a leak detector Fig. 5.7 Correct set-up for a MSLD

117
Leak detection
be continued until all the oil from the pumps oil pan has been recirculated entiate between two types of calibration: with an internal or external test
several times. This period of time will usually be 20 to 30 minutes. leak. When using a test leak built into the leak detector the unit can itself be
calibrated but it can only calibrate itself. When using an external test leak
In order to spare the user the trouble of always having to keep an eye on
not just the device but also a complete configuration, such as a partial flow
the background level, what has been dubbed floating zero-point suppres-
arrangement, can be included. Internal test leaks are permanently installed
sion has been integrated into the automatic operating concepts of all INFI-
and cannot be misplaced. At present all the leak detectors being distributed
CON leak detectors (Section 5.5.2.5). Here the background level measured
by INFICON are fitted with an automatic calibration routine.
after the inlet valve has been closed is placed in storage; when the valve is
then opened again this value will automatically be deducted from sub- Sniffer units or configurations will as a rule have to be calibrated with spe-
sequent measurements. Only at a relatively high threshold level will the dis- cial, external test leaks in which there is a guarantee that on the one hand
play panel show a warning indicating that the background noise level is too all the test gas issuing from the test leak reaches the tip of the probe and
high. Figure 5.8 is provided to illustrate the process followed in zero point on the other hand that the gas flow in the sniffer unit is not hindered by cali-
suppression. Chart on the left. The signal is clearly larger than the back- bration. When making measurements using the sniffer technique (see
ground. Center chart: the background has risen considerably; the signal Section 5.7.2) it is also necessary to take into account the distance from the
can hardly be discerned. Chart on the right: the background is suppressed probe tip to the surface of the specimen and the scanning speed; these
electrically; the signal can again be clearly identified. must be included as a part of the calibration. In the special case where heli-
um concentration is being measured, calibration can be made using the
Independent of this floating zero-point suppression, all the leak detectors
helium content in the air, which is a uniform 5 ppm world-wide.
offer the capability for manual zero point shifting. Here the display for the
leak detector at the particular moment will be reset to zero so that only Test leaks (also known as standard leaks or reference leaks) normally
rises in the leak rate from that point on will be shown. This serves only to comprise a gas supply, a choke with a defined conductance value, and a
facilitate the evaluation of a display but can, of course, not influence its valve. The configuration will be in accordance with the test leak rate
accuracy. required. Figure 5.9 shows various test leaks. Permeation leaks are usually
used for leak rates of 10-10 < QL < 10-7, capillaries, between 10-8 and 10-4
Modern leak detectors are being more frequently equipped with oil-free
and, for very large leak rates in a range from 10 to 1000 mbar l/s, pipe
vacuum systems, the so-called dry leak detectors (UL 200 dry, UL 500
sections or orifice plates with exactly defined conductance values (dimen-
dry). Here the problem of gas being dissolved in oil does not occur but sim-
sions).
ilar purging techniques will nonetheless be employed.
Test leaks used with a refrigerant charge represent a special situation since
the refrigerants are liquid at room temperature. Such test leaks have a sup-
5.5.2.3 Calibrating leak detectors; test leaks ply space for liquid from which, through a shut-off valve, the space filled
only with the refrigerant vapor (saturation vapor pressure) can be reached,
Calibrating a leak detector is to be understood as matching the display at a ahead of the capillary leak. One technological problem which is difficult to
leak detector unit, to which a test leak is attached, with the value shown on solve is posed by the fact that all refrigerants are also very good solvents
the label or calibration certificate. The prerequisite for this is correct for oil and grease and thus are often seriously contaminated so that it is dif-
adjustment of the ion paths in the spectrometer, also known as tuning. ficult to fill the test leaks with pure refrigerant. Decisive here is not only the
Often the distinction is not made quite so carefully and both procedures chemical composition but above all dissolved particles which can repeated-
together are referred to as calibration. ly clog the fine capillaries.
In the calibration process proper the straight-line curve representing the
numerically correct, linear correlation between the gas flow per unit of time
and the leak rate is defined by two points: the zero point (no display where
no emissions are detected) and the value shown with the test leak (correct
display for a known leak).

In vacuum operations (spray technique, see Section 5.7.1) one must differ-

106
cau- 107
108
fine 109
prec 1010
1011 a b c d e

Equipment background level: < 2 1010 1 108 1 1010 (suppressed) a Reference leak without gas supply, TL4, TL6 d Permeation (diffusion) reference leak, TL8
b Reference leak for sniffer and vacuum e Refrigerant calibrated leak
Leak: 2 108 2 108 2 108
applications, TL4-6
Display: 2 108 3 108 2 108 c (Internal) capillary test leak TL7

Fig. 5.8 Example of zero-point suppression Fig. 5.9 Examples for the construction of test leaks

118
 Leak detection
5.5.2.4 Leak detectors with quadrupole mass spectrome- These units are the most sensitive and also provide the greatest degree of
ter (ECOTEC II) certainty. Here certain is intended to mean that there is no other method
with which one can, with greater reliability and better stability, locate leaks
INFICON builds leak detectors with quadrupole mass spectrometers to reg- and measure them quantitatively. For this reason helium leak detectors,
ister masses greater than helium. Apart from special cases, these will be even though the purchase price is relatively high, are often far more eco-
refrigerants. These devices thus serve to examine the tightness of refrigera- nomical in the long run since much less time is required for the leak detec-
tion units, particularly those for refrigerators and air conditioning equipment. tion procedure itself.
Figure 4.2 shows a functional diagram for a quadrupole mass spectrometer. A helium leak detector comprises basically two sub-systems in portable
Of the four rods in the separation system, the two pairs of opposing rods units and three in stationary units. These are:
will have identical potential and excite the ions passing through along the
center line so that they oscillate transversely. Only when the amplitude of 1. the mass spectrometer
these oscillations remains smaller than the distance between the rods can 2. the high vacuum pump and
the appropriate ion pass through the system of rods and ultimately reach
the ion trap, where it will discharge and thus be counted. The flow of elec- 3. the auxiliary roughing pump system in stationary units.
trons thus created in the line forms the measurement signal proper. The The mass spectrometer (see Fig. 5.11) comprises the ion source (14) and
other ions come into contact with one of the rods and will be neutralized the deflection system (59). The ion beam is extracted through the orifice
there. plate (5) and enters the magnetic field (8) at a certain energy level. Inside
Figure 5.10 shows the vacuum schematic for an ECOTEC II. The mass the magnetic field the ions move along circular paths whereby the radius for
spectrometer (4) only operates under high vacuum conditions, i.e. the pres- a low mass is smaller than that for higher masses. With the correct setting
sure here must always remain below 10-4 mbar. This vacuum is generated of the acceleration voltage during tuning one can achieve a situation in
by the turbomolecular pump (3) with the support of the diaphragm pump which the ions describe a circular arc with a defined curvature radius.
(1). The pressure PV between the two pumps is measured with a piezo Where mass 4 (helium) is involved, they pass thorough the aperture (9) to
resistive measuring system (2) and this pressure lies in the range between the ion trap (13). In some devices the discharge current for the ions imping-
1 to 4 mbar while in the measurement mode. This pressure must not ing upon the total pressure electrodes will be measured and evaluated as a
exceed a value of 10 mbar as otherwise the turbomolecular pump will not total pressure signal. Ions with masses which are too small or too great
be capable of maintaining the vacuum in the mass spectrometer. The unit should not be allowed to reach the ion trap (13) at all, but some of these
can easily be switched over at the control unit from helium to any of various ions will do so in spite of this, either because they are deflected by colli-
refrigerants, some of which may be selected as desired. Naturally the unit
must be calibrated separately for each of these masses. Once set, howev-
er, the values remain available in storage so that after calibration has been
effected for all the gases (and a separate reference leak is required for
each gas!) it is possible to switch directly from one gas to another.
14 1
5.5.2.5 Helium leak detectors with 180 sector mass
spectrometer (UL 200, UL 500)
5 1 Diaphragm pump 13
2 Piezo-resistive 2
external
particle
flow internal
limiter 1 particle
pressure sensor
3 Turbomolecular
12 3
filter filter pump
4 Quadrupole mass 4
6
spectrometer 11 5
5 Sniffer line
6 Gas flow limiter
QMA 200
flow
flow divider 1 7 Gas flow limiter 6
8 Gas flow meter
limiter 2

4
flow divider 2
flow 10
7 limiter 3
3 flow meter
7
pv

1
8 9 8
2
1 Ion source flange 5 Extractor 11 Suppressor
2 Cathode 6 Ion traces for M > 4 12 Shielding of the ion trap
1 2 (2 cathodes, Ir + Y2O3) 7 Total pressure electrode 13 Ion trap
3 Anode 8 Ion traces for M = 4 14 Flange for ion trap with
4 Shielding of the ion 9 Intermediate orifice preamplifier
source with discharge plate
orifice 10 Magnetic field

Fig. 5.10 Vacuum schematic for the ECOTEC II Fig. 5.11 Configuration of the 180 sector mass spectrometer

119
Leak detection
sions with neutral gas particles or because their initial energy deviates too In the case of direct-flow leak detectors, an increase in the sensitivity can
far from the required energy level. These ions are then sorted out by the be achieved by reducing the pumping speed, for example by installing a
suppressor (11) so that only ions exhibiting a mass of 4 (helium) can reach throttle between the turbomolecular pump and the cold trap. This is also
the ion detector (13). The electron energy at the ion source is 80 eV. It is employed to achieve maximum sensitivity. To take an example:
kept this low so that components with a specific mass of 4 and higher
The smallest detectable partial pressure for helium is
such as multi-ionized carbon or quadruply ionized oxygen cannot be cre-
pmin,He = 1 10-12 mbar. The pumping speed for helium would be
ated. The ion sources for the mass spectrometer are simple, rugged and
SHe = 10 l/s. Then the smallest detectable leak rate is
easy to replace. They are heated continuously during operation and are
Qmin = 1 10-12 mbar 10 l/s = 1 10-11 mbar l/s. If the pumping speed is
thus sensitive to contamination. The two selectable yttrium oxide coated
now reduced to 1/s, then one will achieve the smallest detectable leak rate
iridium cathodes have a long service life. These cathodes are largely
of 1 10-12 mbar l/s. One must keep in mind, however, that with the
insensitive to air ingress, i.e. the quick-acting safety cut-out will keep them
increase in the sensitivity the time constant for achieving a stable test gas
from burning out even if air enters. However, prolonged use of the ion
pressure in the test specimen will be correspondingly larger (see Section
source may eventually lead to cathode embrittlement and can cause the
5.5.2.9).
cathode to splinter if exposed to vibrations or shock.
In Figure 5.12 the right hand diagram shows the schematic for the counter-
Depending on the way in which the inlet is connected to the mass spec-
flow leak detector. The mass spectrometer, the high vacuum system and
trometer, one can differentiate between two types of MSLD.
also the auxiliary roughing pump system correspond exactly to the configu-
ration for the direct-flow arrangement. The feed of the gas to be examined
is however connected between the roughing pump and the turbomolecular
5.5.2.6 Direct-flow and counter-flow leak detectors pump. Helium which reaches this branch point after the valve is opened will
Figure 5.12 shows the vacuum schematic for the two leak detector types. In cause an increase in the helium pressure in the turbomolecular pump and
both cases the mass spectrometer is evacuated by the high vacuum pump- in the mass spectrometer. The pumping speed Seff inserted in equation
ing system comprising a turbomolecular pump and a rotary vane pump. The 5.4b is the pumping speed for the rotary vane pump at the branch point.
diagram on the left shows a direct-flow leak detector. Gas from the inlet The partial helium pressure established there, reduced by the helium com-
port is admitted to the spectrometer via a cold trap. It is actually equivalent pression factor for the turbomolecular pump, is measured at the mass spec-
to a cryopump in which all the vapors and other contaminants condense. trometer. The speed of the turbomolecular pump in the counter-flow leak
(The cold trap in the past also provided effective protection against the oil detectors is regulated so that pump compression also remains constant.
vapors of the diffusion pumps used at that time). The auxiliary roughing Equation 5.5b is derived from equation 5.5a:
pump system serves to pre-evacuate the components to be tested or the QHe = pHe Seff K (5.5b)
connector line between the leak detector and the system to be tested. Once
the relatively low inlet pressure (pumping time!) has been reached, the Seff = effective pumping speed at the rotary vane pump at the
valve between the auxiliary pumping system and the cold trap will be branching point
opened for the measurement. The Seff used in equation 5.4b is the pump- K = Helium compression factor at the turbomolecular pump
ing speed of the turbomolecular pump at the ion source location: The counter-flow leak detector is a particular benefit for automatic vacuum
QHe = pHe Seff,turbomolecular pump ion source (5.5a) units since there is a clearly measurable pressure at which the valve can be
opened, namely the roughing vacuum pressure at the turbomolecular
pump. Since the turbomolecular pump has a very large compression capac-
ity for high masses, heavy molecules in comparison to the light test gas,
helium (M = 4), can in practice not reach the mass spectrometer. The turbo-
molecular pump thus provides ideal protection for the mass spectrometer
and thus eliminates the need for an LN2 cold tap, which is certainly the
greatest advantage for the user. Historically, counter-flow leak detectors
Solution 1: Direct-flow leak detector Solution 2: Counter-flow leak detector were developed later. This was due in part to inadequate pumping speed
stability, which for a long time was not sufficient with the rotary vane pumps
used here. For both types of leak detector, stationary units use a built-in
Test specimen Test specimen
auxiliary pump to assist in the evacuation of the test port. With portable leak
Test gas stream Test gas stream detectors, it may be necessary to provide a separate, external pump, this
being for weight reasons.
p TOT < 104 mbar

LN 2 pHe pHe
MS MS
4
p TOT < 10 mbar High vacuum pump
High vacuum pump 5.5.2.7 Partial flow operation
Auxiliary pump Roughing pump Auxiliary pump Roughing pump

Cold trap:
Where the size of the vacuum vessel or the leak makes it impossible to
2
S = 6.1 /s cm
Fl 1000 cm
S = 6,100 /s
2
evacuate the test specimen to the necessary inlet pressure, or where this
would simply take too long, then supplementary pumps will have to be
Fig. 5.12 Full-flow and counter-flow leak detector used. In this case the helium leak detector is operated in accordance with

120
 Leak detection
the so-called partial flow concept. This means that usually the larger part it all the more important to estimate based on the partial flow ratio to be
of the gas extracted from the test object will be removed by an additional, expected vis vis a diffusion pump with pumping speed of 12000 l/s, for
suitably dimensioned pump system, so that only a part of the gas stream example which leak rates can be detected at all. In systems with high
reaches the helium leak detector (see Fig. 5.13). The splitting of the gas vacuum- and Roots pumps, the surest option is to connect the leak detector
flow is effected in accordance with the pumping speed prevailing at the between the rotary vane pump and the roots pump or between the roots
branching point. The following then applies: pump and the high vacuum pump. If the pressure there is greater than the
permissible inlet pressure for the leak detector, then the leak detector will
QVacuum vessel = DisplayLeak detector (5.6)
have to be connected by way of a metering (variable leak) valve. Naturally
where g is characterized as the partial flow ratio, i.e. that fraction of the one will have to have a suitable connector flange available. It is also advis-
overall leak current which is displayed at the detector. Where the partial able to install a valve at this point from the outset so that, when needed, the
flow ratio is unknown, g can be determined with a reference leak attached leak detector can quickly be coupled (with the system running) and leak
at the vacuum vessel: detection can commence immediately after opening the valve. In order to
avoid this valve being opened inadvertently, it should be sealed off with a
Display at the leak detector
= (5.7) blank flange during normal vacuum system operation.
QL for the reference leak
A second method for coupling to larger systems, for example, those used
for removing the air from the turbines in power generating stations, is to
couple at the discharge. A sniffer unit is inserted in the system where it dis-
5.5.2.8 Connection to vacuum systems charges to atmosphere. One then sniffs the increase in the helium concen-
The partial flow concept is usually used in making the connection of a heli- tration in the exhaust. Without a tight coupling to the exhaust, however, the
um leak detector to vacuum systems with multi-stage vacuum pump sets. detection limit for this application will be limited to 5 ppm, the natural helium
When considering where to best make the connection, it must be kept in content in the air. In power plants it is sufficient to insert the tip of the probe
mind that these are usually small, portable units which have only a low at an angle of about 45 from the top into the discharge line (usually point-
pumping speed at the connection flange (often less than 1 l/s). This makes ing upward) of the (water ring) pump.

Partial flow principle (example)

5.5.2.9 Time constants

QHe = 3 105 mbar  (Leak rate) The time constant for a vacuum system is set by
V = 150  s
V
= (5.8)
Seff
Seff = SPFP + SLD SLD = 8  Leak detector (LD)
s
m3 
= Time constant
SPFP = 60 s = 16.66 s Partial flow pump (PFP) V = Volume of the container
A) Signal amplitude: Seff = Effective pumping speed, at the test object
Splitting of the gas flow (also of the test
gas!) in accordance with the effective pumping Figure 5.14 shows the course of the signal after spraying a leak in a test
speed at the partial flow branch point specimen attached to a leak detector, for three different configurations:
Overal pumping speed: Seff = SLD + SPFP = 8 + 16.66 = 24.66 
s

... Partial flow ratio Q Q Q

V V V
S/2
 S S S
Signal to Leak detector: 3 105 mbars  8 s
= 9.73 106 mbar 
s MS MS MS
(8 + 16.66) s

Q Throttle
mbar 

mbar  Signal LD LD LD
Signal to partial flow pump: 3 10 5
s 16,668s  = 2.02 10 5
s
S
(8 + 16.66) s amplitude
Faster, less sensitive normal Slower, more sensitive

Check: Overall signal QHe = QLD + QPFP = 3.00 105 mbars  Q = 2p 2,0
100%
S/2
95%
Partial flow ratio = Fraction of the overall flow to the leak detector

or
Q
= LD =

=
QLD

SLD
=

=
1
QHe QLD + QPFP 1 + nnn

1
Q
Q

S
PFP

LD

QLD = QHe
Display Leak rate
Q =p
S
1,0
95%
100%

Signal rise

SLD + SPFP 1 + nnn PFP

Q = P/ 100%
S LD 2 0,5 Compensation period, e.g. t95% = 3 = 3 V

S + S 95% S
( = V ... Time constant)
S
B) Response time: t95% = 3 SV = 3 24.66
150 
 = 18.25 s
m Time
eff s 0
to 3 V = 1 (3 V) 3 V 3 SV = 2 (3 V )
Estimate: Value for S, V and are uncertain certain: calibrate with reference leak Dead time S + S 2 S S /2 S

Fig. 5.13 Partial flow principle Fig. 5.14 Signal responses and pumping speed

121
Leak detection
1. Center: The specimen with volume of V is joined directly with the leak either due to one large leak or several smaller leaks more gas flows into
detector LD (effective pumping speed of S). the unit than the maximum permissible throughput rate for the leak detector.

2. Left: In addition to 1, a partial flow pump with the same effective pump-
ing speed, Sl = S, is attached to the test specimen.
5.7 Leak detection techniques using helium
3. Right: As at 1, but S is throttled down to 0.5S. leak detectors
The signals can be interpreted as follow:

1: Following a dead period (or delay time) up to a discernible signal

5.7.1 Spray technique (local leak test)
level, the signal, which is proportional to the partial pressure for helium, will The test specimen, connected to the helium leak detector, is slowly traced
rise to its full value of pHe = Q/Seff in accordance with equation 5.9: with a very fine stream of helium from the spray pistol, aimed at likely leak-
Q t
age points (welding seams, flange connectors, fused joints), bearing in
pHe = 1 e (5.9 ) mind the time constant of the system as per Equation 5.8 (see Fig. 5.14).
Seff
The volume sprayed must be adjusted to suit the leak rate to be detected
and the size and accessibility of the object being tested. Although helium is
The signal will attain a prortion of its ultimate value after
lighter than air and therefore will collect beneath the ceiling of the room, it
t = 1 . . 63.3 % t = 2 . . 86.5 % will be so well distributed by drafts and turbulence induced by movements
t = 3 . . 95.0 % t = 4 . . 98.2 % within the room that one need not assume that helium will be found primari-
t = 5 . . 99.3 % t = 6 . . 99.8 % ly (or only) at the top of the room during search for leaks. In spite of this, it
is advisable, particularly when dealing with larger components, to start the
The period required to reach 95 % of the ultimate value is normally referred
search for leaks at the top.
to as the response time.
In order to avoid a surge of helium when the spray valve is opened (as this
2: With the installation of the partial flow pump both the time constant and
would contaminate the entire environment) it is advisable to install a
the signal amplitude will be reduced by a factor of 2; that means a quicker
choke valve to adjust the helium quantity, directly before or after the spray
rise but a signal which is only half as great. A small time constant means
pistol (see Fig. 5.15). The correct quantity can be determined easiest by
quick changes and thus quick display and, in turn, short leak detection
submerging the outlet opening in a container of water and setting the valve
times.
on the basis of the rising bubbles. Variable-area flowmeters are indeed
3: The throttling of the pumping speed to 0.5 S, increases both the time available for the required small flow quantities but are actually too expen-
constant and the signal amplitude by a factor of 2. A large value for t thus sive. In addition, it is easy to use the water-filled container at any time to
increases the time required appropriately. Great sensitivity, achieved by determine whether helium is still flowing.
reducing the pumping speed, is always associated with greater time
The helium content of the air can also be detected with helium leak detec-
requirements and thus by no means is always of advantage.
tors where large leaks allow so much air to enter the vessel that the
An estimate of the overall time constants for several volumes connected
one behind to another and to the associated pumps can be made in an ini-
tial approximation by adding the individual time constants.

5.6 Limit values / Specifications for the leak

detector
1. The smallest detectable leak rate.

2. The effective pumping speed at the test connection.

3. The maximum permissible pressure inside the test specimen (also

the maximum permissible inlet pressure). This pressure pmax will be
about 10-1 for LDs with classical PFPs and about 2 to 10 mbar for LDs
with compound PFPs. The product of this maximum permissible operat-
ing pressure and the pumping speed S of the pump system at the
detectors test connection is the maximum permissible throughput: Avoiding the helium surge when the pistol valve is opened
a) Throttle hose or
Qmax = pmax Seff, connector (5.10) b) Adjustable throttle valve ahead of the spay pistol
Minimum helium quantity for correct display: Changing the setting for the throttle shall not
affect indication.
This equation shows that it is by no means advantageous to attain high The minimum quantity is always much smaller than one would set without a flowmeter (e.g.
sensitivity by throttling down the pumping speed. The maximum permissible by listening for flow or letting the helium flow across moistened lips). The simplest check
without a flowmeter: Letting gas bubble through water.
throughput would otherwise be too small. The unit is not functional when
Fig. 5.15 Helium spray equipment

122
 Leak detection
5 ppm share of helium in the air is sufficient for detection purposes. The envelope will be measured with a sniffer connected to the helium detection
leak rate is then: unit. The overall leak rate (integral leak rate) can be calculated following
Display (pure He) Display (atmosph. He) calibration of the test configuration with a reference concentration, e.g.
= atmospheric air. This method makes it possible to detect even the smallest
1 5 10-6
overall leakiness and is suitable in particular for automated industrial leak
QL = Display (pure He) (5.11) testing. Due to gas accumulation, the limits for normal sniffer techniques
= 2 10+5 Display (atmospheric He) are shifted toward lower leak rates and the ambient conditions such as tem-
perature, air flow and sniffer tracing speed lose influence. When using plas-
tic envelopes it is necessary to take into account helium permeation
5.7.2 Sniffer technology (local leak test using through the plastic envelope during long enrichment periods.
the positive pressure method)
b) Direct measurement of the leak rate with the leak detector
Here the points suspected of leaking at the pressurized test specimen (see
(rigid envelope)
Fig. 5.4, d) are carefully traced with a test gas probe which is connected
with the leak detector by way of a hose. Either helium or hydrogen can be When the test specimen, pressurized with helium, is placed in a rigid vacu-
detected with the INFICON helium leak detectors. The sensitivity of the um chamber, connected to a helium leak detector, the integral leak rate can
method and the accuracy of locating leaky points will depend on the nature be read directly at the leak detector.
of the sniffer used and the response time for the leak detector to which it is
connected. In addition, it will depend on the speed at which the probe is
passed by the leak points and the distance between the tip of the probe 5.7.3.2 Envelope test with test specimen evacuated
and the surface of the test specimen. The many parameters which play a
a) Envelope = plastic tent
part here make it more difficult to determine the leak rates quantitatively.
Using sniffer processes it is possible, virtually independent of the type of The evacuated test specimen is surrounded by a light-weight (plastic)
gas, to detect leak rates of about 10-7 mbar l/s. The limitation of sensitivity enclosure and this is then filled with helium once the atmospheric air has
in the detection of helium is due primarily to the helium in the atmosphere been removed. When using a plastic bag as the envelope, the bag should
(see Chapter 9, Table VIII). In regard to quantitative measurements, the be pressed against the test specimen before filling it with helium in order to
leak detector and sniffer unit will have to be calibrated together. Here the expel as much air as possible and to make the measurement with the
distance from the specimen and the tracing speed will have to be included purest helium charge possible. The entire outside surface of the test object
in calibration, too. is in contact with the test gas. If test gas passes through leaks and into the
test specimen, then the integral leak rate will be indicated, regardless of the
number of leaks. In addition, it is necessary to observe when repeating test-
5.7.3 Vacuum envelope test (integral leak test) ing in enclosed areas that the helium content of the room will rise quite
rapidly when the envelope is removed. Using plastic bags is thus more
Vacuum envelope tests are integral leak tests using helium as the test gas,
advisable for one-off testing of large plants. The plastic envelope used
in which the test specimen is enclosed either in a rigid (usually metal)
here is often referred to as a tent.
enclosure or in a light plastic envelope. The helium which enters or leaves
(depending on the nature of the test) the test specimen is passed to a heli-
um leak detector, where it is measured. Envelope tests are made either b) Rigid envelope
with the test specimen pressurized with helium (Fig. 5.4c) or with the test The use of a solid vacuum vessel as the rigid envelope, on the other hand,
specimen evacuated (Fig. 5.4a). In both cases it may be necessary to con- is better for repetitive testing where an integral test is to be made. When
vert the helium enrichment figure (accumulation) to the helium standard solid envelopes are used it is also possible to recover the helium once the
leak rate. test has been completed.

5.7.3.1 Envelope test test specimen pressurized with 5.7.4 Bombing test,
helium Storage under pressure
The bombing test is use to check the tightness of components which are
a) Envelope test with concentration measurement and subsequent
already hermetically sealed and which exhibit a gas-filled, internal cavity.
leak rate calculation
The components to be examined (e.g. transistors, IC housings, dry-reed
To determine overall leakiness of a test object pressurized with helium the relays, reed contact switches, quartz oscillators, laser diodes and the like)
object shall be enclosed in an envelope which is either rigid or deformable are placed in a pressure vessel which is filled with helium. Operating with
(plastic). The test gas leaving the leaks accumulates so that the helium the test gas at relatively high pressure (5 to 10 bar) and leaving the system
concentration in the envelope rises. Following an enrichment period to be standing over several hours the test gas (helium) will collect inside the
determined (operating period) the change in concentration inside the

123
Leak detection
leaking specimens. This procedure is the actual bombing. To make the
leak test, then, the specimens are placed in a vacuum chamber following
bombing, in the same way as described for the vacuum envelope test.
The overall leak rate is then determined. Specimens with large leaks will,
however, lose their test gas concentration even as the vacuum chamber is
being evacuated, so that they will not be recognized as leaky during the
actual leak test using the detector. It is for this reason that another test to
register very large leaks will have to be made prior to the leak test in the
vacuum chamber.

5.8 Industrial leak testing

Industrial leak testing using helium as the test gas is characterized above
all by the fact that the leak detection equipment is fully integrated into the
manufacturing line. The design and construction of such test units will natu-
rally take into account the task to be carried out in each case (e.g. leak
testing vehicle rims made of aluminum or leak testing for metal drums).
Mass-produced, standardized component modules will be used wherever
possible. The parts to be examined are fed to the leak testing system
(envelope test with rigid envelope and positive pressure [5.7.3.1b] or vacu-
um [5.7.3.2b] inside the specimen) by way of a conveyor system. There
they will be examined individually using the integral methods and automati-
cally moved on. Specimens found to be leaking will be shunted to the side.

The advantages of the helium test method, seen from the industrial point of
view, may be summarized as follows:

The leak rates which can be detected with this process go far beyond all
practical requirements.

The integral leak test, i.e. the total leak rate for all individual leaks, facili-
tates the detection of microscopic and sponge-like distributed leaks
which altogether result in leakage losses similar to those for a larger
individual leak.

The testing procedure and sequence can be fully automated.

The cyclical, automatic test system check (self-monitoring) of the device

ensures great testing reliability.

Helium is non-toxic and non-hazardous (no maximum allowable concen-

trations need be observed).

Testing can be easily documented, indicating the parameters and

results, on a printer.

Use of the helium test method will result in considerable increases in effi-
ciency (cycling times being only a matter of seconds in length) and lead to
a considerable increase in testing reliability. As a result of this and due to
the EN/ISO 9000 requirements, traditional industrial test methods (water
bath, soap bubble test, etc.) will now largely be abandoned.

124
 Thin film controllers/control units
6 Thin film controllers and control units The selection of the right crystal holder thus plays an important role in all
measurements with quartz oscillators. Various crystal holder designs are
with quartz oscillators recommended for the different applications: with or without shutter, bake-
able for UHV, double crystal holder or crystal six as well as special versions
for sputter applications. In addition to these important and more mechani-
cal aspects, the advances in measuring and control technology and equip-
6.1 Introduction ment features will be discussed in the following.

It took a long time to go from the coating of quartz crystals for frequency
fine tuning, which has long been in practice, to utilization of frequency
change to determine the mass per unit area as a microbalance with the
6.2 Basic principles of coating thickness mea-
present-day degree of precision. In 1880 two brothers, J. and P. Curie, dis-
covered the piezoelectric effect. Under mechanical loads on certain quartz
surement with quartz oscillators
crystal surfaces, electrical charges occur that are caused by the asymmetri- The quartz oscillator coating thickness gauge (thin film controller) utilizes
cal crystalline structure of SiO2. Conversely, in a piezocrystal deformations the piezoelectric sensitivity of a quartz oscillator (monitor crystal) to the sup-
appear in an electrical field and mechanical oscillations occur in an alternat- plied mass. This property is utilized to monitor the coating rate and final
ing field. A distinction is made between bending oscillations, thickness thickness during vacuum coating.
shear mode and thickness shear oscillations. Depending on the orientation
A very sharp electromechanical resonance occurs at certain discrete fre-
of the cut plane to the crystal lattice, a number of different cuts are distin-
quencies of the voltage applied. If mass is added to the surface of the
guished, of which only the so-called AT cut with a cut angle of
quartz crystal oscillating in resonance, this resonance frequency is dimin-
3510" is used in thin film controllers because the frequency has a very low
ished. This frequency shift is very reproducible and is now understood pre-
temperature dependence in the range between 0 and 50 C with this cut.
cisely for various oscillation modes of quartz. Today this phenomenon,
Accordingly, an attempt must be made not to exceed this temperature
which is easy to understand in heuristic terms, is an indispensable measur-
range during coating (water cooling of crystal holder).
ing and process control tool, with which a coating increase of less than one
Since there is still a problem with quartz capacity (i.e. the maximum possi- atomic layer can be detected.
ble coating thickness of the quartz at which it still oscillates reliably) despite
In the late 1950s Sauerbrey and Lostis discovered that the frequency shift
refined technology, a number of approaches have been developed to
connected with the coating of the quartz crystal is a function of the change
expand this capacity:
in mass due to the coating material in the following way:
1. The use of several crystals, one behind the other, in a multiple crystal
Mf F F
holder with automatic change and data updating in the event of immi- = or Mf = Mq with (6.1)
nent failure of a quartz: CrystalSix.
Mq Fq Fq

2. The RateWatcher function, in which the quartz is alternately exposed to Mf mass of the coating
the coating beam for a short time until all measurements and regulation Mq mass of the quartz prior to coating
have been carried out and then remains covered by a shutter for a Fq frequency prior to coating
longer period of time. Fc frequency after coating
F = Ff Fc ... frequency shift due to coating

If the following are now applied: Mf = (Mc Mq) = Df f A and

Mq = Dq q A, where T = the coating thickness, = density and A stands
for area while the index q stands for the state of the uncoated quartz and
c for the state after frequency shift due to coating, the following results are
rel. frequency change (ppm)

obtained for the coating thickness:

Fq F F
Df = Dq q =K
Fq Fq f
f with

Dq Fq q NAT q
K= =
2 2 where
Fq Fq

Temperature (C)
N = Fq Dq is the frequency constant (for the AT cut NAT = 166100 Hz cm)
and q = 2.649 g/cm3 is the density of the quartz. The coating thickness is
Fig. 6.1 Natural frequency as a function of temperature in an AT cut quartz crystal thus proportional to the frequency shift F and inversely proportional to the

125
Thin film controllers/control units

E
Node

Fig. 6.2 Thickness shear oscillations Fig. 6.3 Shape of LEYBOLD-Inficon quartz crystals

density f of the coating material. The equation motions of the thickness shear oscillation are parallel to the main crystal
boundary surfaces. In other words: the surfaces are shift antinodes, see
F
Df = K Fig. 6.2. The resonance frequencies slightly above the basic frequency are
f
called anharmonic and are a combination of thickness shear and thick-
ness rotation oscillation forms. The resonance frequency at around three
for the coating thickness was used in the first coating thickness measuring
times the value for the fundamental wave is called quasi-harmonic. Near
units with frequency measurement ever used. According to this equation,
the quasi-harmonic there are also a number of anharmonics with a slightly
a crystal with a starting frequency of 6.0 MHz displays a decline in frequen-
higher frequency.
cy of 2.27 Hz after coating with 1 of aluminum (de = 2.77 g/cm3). In this
way the growth of a fixed coating due to evaporation or sputtering can be The design of the monitor crystals used nowadays (see Fig. 6.3) displays a
monitored through precise measurement of the frequency shift of the crys- number of significant improvements over the original square crystals. The
tal. It was only when knowledge of the quantitative interrelationship of this first improvement was the use of round crystals. The enlarged symmetry
effect was acquired that it became possible to determine precisely the greatly reduced the number of possible oscillation modes. A second group
quantity of material that is deposited on a substrate in a vacuum. of improvements involved providing one of the surfaces with a contour and
Previously this had been practically impossible. making the excitation electrode smaller. The two together ensure that the
acoustic energy is recorded. Reducing the electrode diameter limits the
excitation to the middle area. The surface contour consumes the energy of
the moving acoustic waves before they reach the crystal edge. It is not
6.3 The shape of quartz oscillator crystals reflected into the center where it could interfere with new incoming waves.

Regardless of how sophisticated the electronic environment is, the main Such a small crystal behaves like an infinitely expanded crystal. However, if
component for coating measurement remains the monitor quartz crystal. the crystal vibrations remain restricted to the center, one can clamp the
Originally monitor quartzes had a square shape. Fig. 6.4 shows the reso- outer edge to a crystal holder, without engendering undesired side effects.
nance spectrum of a quartz resonator with the design used today (Fig. 6.3). Moreover, contouring reduces the resonance intensity of undesired anhar-
The lowest resonance frequency is initially given by a thickness shear oscil- monics. This limits the capacity of the resonator to maintain these oscilla-
lation, which is called the fundamental wave. The characteristic tions considerably.
Use of an adhesive coating has enhanced the adhesion of the quartz elec-
trode. Even the rate spikes occurring with increasing film stress (strain) and
caused by micro-tears in the coating were reduced. Coating material
remains at these micro-tears without adhesion and therefore cannot oscil-
log Relative intensy

late. These open areas are not registered and thus an incorrect thickness is
indicated.

Fig. 6.4 shows the frequency behavior of a quartz crystal shaped as in Fig.
6.3. The ordinate represents the amplitude of the oscillation or also the cur-
rent flowing through the crystal as a function of the frequency on the
abscissa.

Usually an AT cut is chosen for the coating thickness measurement

because through the selection of the cut angle the frequency has a very
Frequency (MHz) small temperature coefficient at room temperature.

Fig. 6.4 Frequency resonance spectrum

126
 Thin film controllers/control units
Since one cannot distinguish between rate regulation becomes impossible (rate regulation: regulation of the ener-
gy supply to the coating source so that a specified coating thickness growth
coating: frequency reduction = negative influence
per time unit is maintained). The great measurement uncertainty then caus-
temperature change: es more noise in the closed loop, which can only be countered with longer
negative or positive influence time constants. This in turn makes the corrections due to system deviation
slow so that relatively long deviations from the desired rate result. This may
temperature gradients on the crystal, positive or negative
not be important for simple coatings, but for critical coatings, as in the case
stresses caused by the coating of optical filters or very thin, slowly growing single-crystal coatings, errors
may result. In many cases, the desired properties of such coatings are lost
it is important to minimize the temperature influence. This is the only way to
if the rate deviations are more than one or two percent. Finally, frequency
measure small differences in mass.
and stability of the reference oscillator determine the precision of the mea-
surement.

6.4 Period measurement

Although the instruments that functioned according to equation 6.2 were 6.5 The Z match technique
very useful, it soon became obvious that for the desired accuracy their area
Miller and Bolef (1968) treated the quartz oscillator and coating system as a
of application was typically limited to F < 0.02 Fq. Even at a relative fre-
single-dimensional, coherent acoustic resonator. Lu and Lewis (1972)
quency change of (Fq Fc) / Fq < 2 %, errors of around 2 % occurred in the
developed the simplified Z match equation on that basis. Simultaneous
coating thickness measurement so that the "usable service life" of the coat-
advances in electronics, particularly the microprocessor, made it possible to
ing in the case of a 6-MHz monitor crystal was about 120 kHz.
solve the Z match equation in real time. Most coating process control units
In 1961 Behrndt discovered that: sold today use this sophisticated equation, which takes into account the
Mf (Tc Tq) F acoustic properties of the quartz oscillator/coating system:
= = with (6.3)
Mq Tq Fc N d (Fq Fc)
Tf = AT q arctg Z tg
df Fc Z Fq (6.4)

Tc = 1 / Fc ... oscillation period, coated
Tq = 1 / Fq ... oscillation period, uncoated
dq Uq
The period measurement (measurement of the oscillation duration) was the Z= acoustic impedance ratio
df U f
result of the introduction of digital time measurement and the discovery of
the proportionality of crystal thickness Dq and oscillation duration Tq. The Uq = shear module, quartz
necessary precision of thickness measurement permits application of equa- Uf = shear module, film
tion 6.3 up to about F < 0.05 Fq.
This led to basic understanding of the conversion of frequency shift into
In period measurement a second crystal oscillator is essentially used as a thickness which enabled correct results in a practical time frame for process
reference oscillator that is not coated and usually oscillates at a much high- control. To achieve this high degree of accuracy, the user must only enter
er frequency than the monitor crystal. The reference oscillator generates an additional material parameter Zf for the coating material. The validity of
small precision time intervals, with which the oscillation duration of the mon- the equation was confirmed for many materials and it applies to frequency
itor crystal is determined. This is done by means of two pulse counters: the shifts up to F < 0.4 Fq! Note that equation 6.2 was only valid up to
first counts a fixed number of monitor oscillations m. The second is started F < 0.02 Fq. And equation 6.3 only up to F < 0.05 Fq.
simultaneously with the first and counts the oscillations of the reference
crystal during m oscillations of the monitor crystal. Because the reference
frequency Fr is known and stable, the time for m monitor oscillations can be
6.6 The active oscillator
determined accurately to 2/Fr. The monitor oscillation period is then
All units developed up to now are based on use of an active oscillator, as
n
shown schematically in Fig. 6.5. This circuit keeps the crystal actively in
Fr m
resonance so that any type of oscillation duration or frequency measure-
ment can be carried out. In this type of circuit the oscillation is maintained
where n is the reading of the reference counter. The accuracy of the mea- as long as sufficient energy is provided by the amplifier to compensate for
surement is determined by the frequency of the reference oscillator and the losses in the crystal oscillation circuit and the crystal can effect the neces-
length of the counting time that is specified through the size of m. sary phase shift. The basic stability of the crystal oscillator is created
For low coating rates, small densities of the coating material and fast mea- through the sudden phase change that takes place near the series reso-
surements (that require short counting times), it is important to have a refer- nance point even with a small change in crystal frequency, see Fig. 6.6.
ence oscillator with a high frequency. All of this requires great time precision
so that the small coating-related frequency shifts can be resolved. If the fre-
quency shift of the monitor crystal decreases between two measurements
on the order of magnitude of the frequency measurement accuracy, good

127
Thin film controllers/control units
amplifier

output phase

| impedance |

phase (degrees)
log .Z. (Ohm)
series resonance

crystal Frequency (MHz)

Fig. 6.5 Circuit of the active oscillator Fig. 6.6 Crystal frequencies near the series resonance point

Normally an oscillator circuit is designed such that the crystal requires a cantly smaller, i.e. by the amount of the frequency difference between the
phase shift of 0 degrees to permit work at the series resonance point. Long- fundamental wave and the anharmonic adopted by the oscillation.
and short-term frequency stability are properties of crystal oscillators
because very small frequency differences are needed to maintain the phase
shift necessary for the oscillation. The frequency stability is ensured through
the quartz crystal, even if there are long-term shifts in the electrical values 6.7 The mode-lock oscillator
that are caused by phase jitter due to temperature, ageing or short-term
INFICON has developed a new technology for overcoming these con-
noise. If mass is added to the crystal, its electrical properties change.
straints on the active oscillator. The new system constantly analyzes the
Fig. 6.7 shows the same graph as Fig 6.6, but for a thickly coated crystal. It response of the crystal to an applied frequency: not only to determine the
has lost the steep slope displayed in Fig. 6.6. Because the phase rise is (series) resonance frequency, but also to ensure that the quartz oscillates in
less steep, any noise in the oscillator circuit leads to a larger frequency shift the desired mode. The new system is insensitive to mode hopping and the
than would be the case with a new crystal. In extreme cases, the original resultant inaccuracy. It is fast and precise. The crystal frequency is deter-
phase/frequency curve shape is not retained; the crystal is not able to carry mined 10 times a second with an accuracy to less than 0.0005 Hz.
out a full 90 phase shift.
The ability of the system to initially identify and then measure a certain
The impedance |Z| can increase to very high values. If this happens, the mode opens up new opportunities thanks to the advantages of the addition-
oscillator prefers to oscillate in resonance with an anharmonic frequency. al information content of these modes. This new, "intelligent" measuring
Sometimes this condition is met for only a short time and the oscillator device makes use of the phase/frequency properties of the quartz crystal to
oscillation jumps back and forth between a basic and an anharmonic oscil- determine the resonance frequency. It works by applying a synthesized
lation or it remains as an anharmonic oscillation. This phenomenon is well sinus wave of a certain frequency to the crystal and measuring the phase
known as "mode hopping". In addition to the noise of the rate signal creat- difference between the applied signal voltage and the current flowing
ed, this may also lead to incorrect termination of a coating because of the through the crystal. In the case of series resonance, this difference is exact-
phase jump. It is important here that, nevertheless, the controller frequently ly zero degrees; then the crystal behaves like an ohmic resistance. By dis-
continues to work under these conditions. Whether this has occurred can connecting the applied voltage and the current that returns from the crystal,
only be ascertained by noting that the coating thickness is suddenly signifi- one can determine with a phase comparator whether the applied frequency
is higher or lower than the crystal resonance point.

The crystal impedance is capacitive at frequencies below the fundamental

wave and inductive at frequencies above the resonance. This information is
useful if the resonance frequency of a crystal is unknown. A brief frequency
sweep is carried out until the phase comparator changes over and thus
phase (degress)

phase marks the resonance. For AT quartzes we know that the lowest usable fre-
log .Z. (Ohm)

quency is the fundamental wave. The anharmonics are slightly above that.
| impedance |
This information is not only important for the beginning, but also in the rare
case that the instrument loses track of the fundamental wave. Once the
series resonance
frequency spectrum of the crystal is determined, the instrument must track
the shift in resonance frequency, constantly carry out frequency measure-
ments and then convert them into thickness.
Frequency (MHz) Use of the intelligent measuring system has a number of obvious advan-
tages over the earlier generation of active oscillators, primarily insensitivity
Fig. 6.7 Oscillations of a thickly coated crystal

128
 Thin film controllers/control units
to mode hopping as well as speed and accuracy of measurement. This nances is shifted to lower frequencies. It has been observed that the three
technique also enables the introduction of sophisticated above mentioned modes have a somewhat differing mass sensitivity and
properties which were not even conceivable with an active oscillator setup. thus experience somewhat different frequency shifts. This difference is uti-
The same device that permits the new technology to identify the fundamen- lized to determine the Z value of the material. By using the equations for
tal wave with one sweep can also be used to identify other oscillation the individual modes and observing the frequencies for the (100) and the
modes, such as the anharmonics or quasi-harmonics. The unit not only has (102) mode, one can calculate the ratio of the two elastic constants C60 and
a device for constantly tracking the fundamental wave, but can also be C55. These two elastic constants are based on the shear motion. The key
employed to jump back and forth between two or more modes. This query element in Wajids theory is the following equation:
of different modes can take place for two modes with 10 Hz on the same
(C55 / C66 )coated 1
crystal. (6.5)
(C55 / C66 )uncoated (1 + M Z )

with
6.8 Auto Z match technique
M ... area mass/density ratio (ratio of coating mass to quartz mass per area
The only catch in the use of equation 6.4 is that the acoustic impedance
unit)
must be known. There are a number of cases where a compromise has to
Z ... Z value
be made with accuracy due to incomplete or restricted knowledge of the
material constants of the coating material: It is a fortunate coincidence that the product M
Z also appears in the Lu-
Lewis equation (equation 6.4). It can be used to assess the effective Z
1) The Z values of the solid material often deviate from those of a coating.
value from the following equations:
Thin coatings are very sensitive to process parameters, especially in a
sputter environment. As a result, the existing values for solid material F F
tg M Z c + Z tg c = 0 (6.6)
are not adequate. Fq Fq
2) For many exotic substances, including alloys, the Z value is not known
Fc
and not easy to determine. tg M Z
Fq
3) It is repeatedly necessary to carry out a precise coating thickness mea- or Z=
Fc
surement for multiple coating with the same crystal sensor. This applies tg
in particular to optical multiple and semi-conductor coatings with a high Fq
temperature coefficient TC. However, the effective Z value of the mixture
of multiple coatings is unknown. Here Fq and Fc are the frequencies of the non-coated or coated quartz in
the (100) mode of the fundamental wave. Because of the ambiguity of the
In such a case, therefore, the only effective method is to assume a Z value
mathematical functions used, the Z value calculated in this way is not
of 1, i.e. to ignore reality with respect to wave propagation in multi-sub-
always a positively defined variable. This has no consequences of any sig-
stance systems. This incorrect assumption causes errors in the prediction
nificance because M is determined in another way by assessing Z and
of thickness and rate. The magnitude of the error depends on the coating
measuring the frequency shift. Therefore, the thickness and rate of the
thickness and the amount of deviation from the actual Z value.
coating are calculated one after the other from the known M.
In 1989 A. Wajid invented the mode-lock oscillator. He presumed that a
One must be aware of the limits of this technique. Since the assessment of
connection existed between the fundamental wave and one of the anhar-
Z depends on frequency shifts of two modes, any minimal shift leads to
monics, similar to that ascertained by Benes between the fundamental
errors due to substantial mechanical or thermal stresses. It is not necessary
oscillation and the third quasi-harmonic oscillation. The frequencies of the
to mention that under such circumstances the Z match technique, too,
fundamental and the anharmonic oscillations are very similar and they solve
leads to similar errors. Nevertheless, the automatic Z value determination of
the problem of the capacity of long cables. He found the necessary consid-
the Z match technique is somewhat more reliable regarding occurrence of
erations for establishing this connection in works by Wilson (1954) as well
errors because the amplitude distribution of the (102) mode is asymmetric
as Tiersten and Smythe (1979).
over the active crystal surface and that of the (100) mode is symmetric.
The contour of the crystal, i.e. the spherical shape of one side, has the
According to our experience, coating-related stresses have the most unfa-
effect of separating the individual modes further from each other and pre-
vorable effect on the crystal. This effect is particularly pronounced in the
venting energy transfer from one mode to another. The usual method of
presence of gas, e.g. in sputter processes or reactive vacuum coating or
identification is to designate the fundamental oscillation as (100), the lowest
sputter processes. If the Z value for solid material is known, it is better to
anharmonic frequency as (102) and the next higher anharmonic as (120).
use it than to carry out automatic determination of the auto Z ratio. In
These three indices of the mode nomenclature are based on the number of
cases of parallel coating and coating sequences, however, automatic Z
phase reversals in the wave motion along the three crystal axes. The above
determination is significantly better.
mentioned works by Wilson, Tiersten and Smythe examine the properties of
the modes by studying the influence of the radius of the cut on the position
of the anharmonic in relation to the fundamental oscillation.

If one side of the quartz is coated with material, the spectrum of the reso-

129
Thin film controllers/control units
6.9 Coating thickness regulation Due to the simplicity with which the experimental data can be obtained, we
preferred the open loop method. Moreover, application of this technique
The last point to be treated here is the theory of the closed loop for coating permits extensive elimination of the trial and error method.
thickness measuring units to effect coating growth at a controlled (constant)
growth rate. The measuring advantages of the instruments, such as speed, The Auto Control Tune function developed by INFICON characterizes a
precision and reliability, would not be completely exploited if this information process on the basis of its step responses. After a step-by-step change in
were not inputted into an improved process monitoring system. For a coat- the power the resulting changes in the rate as a function of time are
ing process this means the coating rate should be kept as close and stable smoothed and stored. The important step responses are determined, see
as possible to a setpoint. The purpose of the closed loop is to make use of Fig. 6.8.
the information flow of the measuring system in order to regulate the In general, it is not possible to characterize all processes exactly, so several
capacity for a special evaporation source in an appropriately adapted way. approximations have to be made. Normally one assumes that the dynamic
When the system functions correctly, the controller translates small devia- characteristic can be reproduced by a process of the first order plus dead
tions of the controlled parameter (the rate) from the setpoint into correction time. The Laplace transformation for this assumption (transfer to the s
values of the re-adjusted evaporation capacity parameter. The ability of the plane) is approximated:
controller to measure quickly and precisely keeps the process from deviat-
ing significantly from the setpoint. L

Output K p 10 s
The most widespread type of controller is the PID controller. Here P stands = with(6.8)
Input s+1
for proportional, I for integral and D for differential control function. In the
following some of the properties of this controller are described in detail.
Kp = amplification in stationary state
Information on the system behavior is gained through a step response to a
L = dead time
control fault in certain controller settings.
= time constant
This response is recorded, and then improved control parameters for a new
These three parameters are determined through the response curve of the
test are estimated. This procedure is continued until a satisfactory result is
process. An attempt has been made by means of several methods to calcu-
achieved. At the end the controller is optimized so that its parameters
late the required parameters of the system response from curves, as shown
exactly match the characteristics of the evaporator source.
in Fig. 6.8. This results in a 1-point accordance at 63.2 % of the transition
It is a long and frustrating process to adjust a controller to an evaporation (a time constant), an exponential accordance at two points and an
source, requiring several minutes for stabilization and hours to obtain satis- exponential accordance weighted according to the method of the smallest
factory results. Often the parameters selected for a certain rate are not suit- squares. A process is sufficiently characterized by this information so that
able for an altered rate. Thus, a controller should ideally adjust itself, as the the controller algorithm can be applied. Equation 6.9 shows the Laplace
new controllers in INFICON coating measuring units do. At the beginning of transformation for the very often used PID controller:
installation and connection the user has the unit measure the characteris-
S
tics of the evaporation source. Either a PID controller is used as the basis M(s) = Kc 1 + + T S E (s) (6.9)
Ti d
for slow sources or another type of controller for fast sources without signif-
icant dead time.
with
In relevant literature a distinction is made between three different ways of
M(s) = controlled variable or power
setting controllers. Depending on which data are used for the setting, a dis-
Kc = Control amplification (the proportional term)
tinction is made between the closed loop, open loop and resonance
Ti = integration time
response method.
Td = differentiation time
E(s) = process deviation

Fig. 6.9 shows the control algorithm and a process with a phase shift of the
1.00 K p first order and a dead time. The dynamics of the measuring device and the
control elements (in our case the evaporator and the power supply) are

0.0632 K p
point of
maximum
rise

setpoint deviation precipitation rate

L
R(s) + E(s) K p eaaa
s C(s)
0 s
L
t (0.632) Time t () Kc (1 + + Td * s) T1s + 1
Ti

[process] [controller]
T1 = t(0.632) L
Kp = (change in output signal)/(change in control signal)

Fig. 6.8 Process response to a step change with t = 0 (open loop, control signal amplified) Fig. 6.9 Block diagram of the PID controller

130
 Thin film controllers/control units
implicitly contained in the process block. R(s) represents the rate setpoint. 0947
.
136
. L
The return mechanism is the deviation created between the measured pre- Kc = (6.13)
cipitation rate C(s) and the rate setpoint R(s). p T1
K

The key to use of any control system is to select the correct values for Kc, 0.738
119
. L
Td and Ti. The optimum control is a somewhat subjective term that is Ti = (6.14)
T1 T1
made clear by the presence of different mathematical definitions:
.
0995
Usually the smallest square error ISE (Integral Square Error) is used as a L
measure of the quality of the control: Td = (0.381 T1) (6.15)
T1
ISE = e2(t) dt (6.10)
For slow systems the time interval between the forced changes in control
Here e is the error (the deviation): e = rate setpoint minus measured rate. voltage is extended to avoid hanging the controller (hanging = rapid
ISE is relatively insensitive to small deviations, but large deviations con- growth of the control signal without the system being able to respond to the
tribute substantially to the value of the integral. The result is small over- altered signal). This makes a response to the previous change in the con-
shoots, but long ripple times because deviations occurring late contribute troller setting and powerful controller settings possible. Another advantage
little to the integral. is the greater insensitivity to process noise because the data used for con-
trol do not come from merely one measurement, but from several, so that
The integral of the absolute value of the deviation IAE (Integral Absolute the mass-integrating nature of the quartz crystal is utilized.
Error) was also proposed as a measure for control quality:
In processes with short response times (short time constants) and small to
IAE = e(t) dt (6.11) unmeasurable dead times, the PID controller often has difficulties with the
noise of the coating process (beam deflection, rapid thermal short-circuits
between melt and evaporator, etc.). In these cases a control algorithm of
This is more sensitive for small deviations, but less sensitive for large devi-
the integral reset type is used with success. This controller always inte-
ations than ISE.
grates the deviation and presses the system towards zero deviation. This
Graham and Lanthrop introduced the integral over time, multiplied by the technique works well with small or completely imperceptible dead times.
absolute error ITAE (Integral Time Absolute Error), as a measure for control However, if it is used with a noticeable phase shift or dead time, the con-
quality: troller tends to generate oscillations because it overcompensates the con-
troller signal before the system has a chance to respond. Auto Control
ITAE = t e(t) dt (6.12) Tune recognizes the properties of these fast systems during the measure-
ment of a step response and utilizes the information to calculate the control
The ITAE is sensitive to initial and, to a certain extent, unavoidable devia- amplification for a non-PID control algorithm.
tions. Optimum control responses defined through ITAE consequently have
short response times and larger overshoots than in the case of the other
two criteria. However, ITAE has proven to be very useful for evaluating the
regulation of coating processes. 6.10 INFICON instrument variants
INFICONs Auto Control Tune is based on measurements of the system The instrument models available differ both in hardware and software
response with an open loop. The characteristic of the system response is equipment: the simplest unit, the XTM/2, is purely a measuring or display
calculated on the basis of a step change in the control signal. It is deter- device that cannot control vacuum coating.
mined experimentally through two kinds of curve accordance at two points. The XTC/2 and XTC/C group can control vacuum coating sources and up
This can be done either quickly with a random rate or more precisely with a to three different coatings of a process (not to be confused with nine differ-
rate close to the desired setpoint. Since the process response depends on ent coating programs). In the case of XTM/2, XTC/2 and XTC/C units, the
the position of the system (in our case the coating growth rate), it is best AutoZero and AutoTune functions are not available, and measurement with
measured near the desired work point. The process information measured several sensors simultaneously as well as simultaneous control of two vac-
in this way (process amplification Kp, time constant T1 and dead time L) are uum coating sources are not possible.
used to generate the most appropriate PID control parameters.
However, the IC/5 offers all comfort functions available today: measurement
The best results in evaluating coating control units are achieved with ITAE. with up to eight sensors with AutoZero and AutoTune as well as capability
There are overshoots, but the reaction is fast and the ripple time short. of simultaneous control of two evaporator sources. Moreover, it offers 24
Controller setting conditions have been worked up for all integral evaluation material programs, with which 250 coatings in 50 processes can be pro-
criteria just mentioned so as to minimize the related deviations. With a man- grammed. To simplify operation and avoid errors, the unit also has a
ual input as well as with experimental determination of the process diskette drive. All types of crystal holders can be connected here. The thick-
response coefficients, the ideal PID coefficients for the ITAE evaluation can ness resolution is around 1 , the rate resolution for rates between 0 and
easily be calculated from equations 6.13, 6.14 and 6.15: 99.9 /s around 0.1 /s and for rates between 100 and 999 /s around 1
/s. A particularly attractive option offered by the IC/5 is a microbalance

131
Thin film controllers/control units
board with a highly stable reference quartz. This oscillator is 50 times more
stable than the standard oscillator; long-term stability and accuracy are
then 2 ppm over the entire temperature range. This option is specially
designed for coatings of material with low density and at low coating rates.
This is important for space contamination and sorption studies, for exam-
ple.

132
 Applications of vacuum technology
7. Application of vacuum technology chemical compounds or layers of different materials applied in sandwich
form. A significant advantage of vacuum coating over other methods is that
for coating techniques many special coating properties desired, such as structure, hardness, elec-
trical conductivity or refractive index, are obtained merely by selecting a
specific coating method and the process paramaters for a certain coating
material.
7.1 Vacuum coating technique
Vacuum technology has been increasingly used in industrial production
processes during the last two decades. Some of these processes and their
7.2 Coating sources
typical working pressure ranges are shown in Fig. 7.1.
In all vacuum coating methods layers are formed by deposition of material
Since a discussion of all processes is beyond the scope of this brochure,
from the gas phase. The coating material may be formed by physical
this section will be restricted to a discussion of several examples of applica-
processes such as evaporation and sputtering, or by chemical reaction.
tions in the important field of coating technology.
Therefore, a distinction is made between physical and chemical vapor
Deposition of thin films is used to change the surface properties of the base deposition:
material, the substrate. For example, optical properties such as transmis-
physical vapor deposition = PVD
sion or reflection of lenses and other glass products, can be adjusted by
applying suitable coating layer systems. Metal coatings on plastic web pro- chemical vapor deposition = CVD.
duce conductive coatings for film capacitors. Polymer layers on metals
enhance the corrosion resistance of the substrate.

Through the use of vacuum it is possible to create coatings with a high 7.2.1 Thermal evaporators (boats, wires etc.)
degree of uniform thickness ranging from several nanometers to more than In the evaporation process the material to be deposited is heated to a tem-
100 mm while still achieving very good reproducibility of the coating proper- perature high enough to reach a sufficiently high vapor pressure and the
ties. Flat substrates, web and strip, as well as complex molded-plastic parts desired evaporation or condensation rate is set. The simplest sources used
can be coated with virtually no restrictions as to the substrate material. For in evaporation consist of wire filaments, boats of sheet metal or electrically
example, metals, alloys, glass, ceramics, plastics and paper can be coated. conductive ceramics that are heated by passing an electrical current
The variety of coating materials is also very large. In addition to metal and through them (Fig. 7.2). However, there are restrictions regarding the type
alloy coatings, layers may be produced from various of material to be heated. In some cases it is not possible to achieve the

Ultrahigh vacuum High vacuum Medium vacuum Rough vacuum

Annealing of metals

Degassing of melts

Electron beam melting

Electron beam welding

Evaporation

Sputtering of metals

Casting of resins and lacquers

Drying of plastics

Drying of insulating papers

Freeze-drying of bulk goods

Freeze-drying of pharmaceutical products

10 7 3 0 3
10 10 10 10 10

Pressure [mbar]

Fig. 7.1 Pressure ranges for various industrial processes

133
Applications of vacuum technology

6
Hairpin-sheped evaporator 5
made of twisted tungsten wire 7
4
Evaporator made of electrically conductive
ceramics
3 8

Spiral evaporator made of twisted tung-

sten wire 1 9
Boat-shaped evapora-
tor
1 Substrates 3 Anode 6 Cathode 8 Argon ions
2 Sputtered 4 Electrons 7 Magnetic 9 Substrate
atoms 5 Target field lines

Fig. 7.3 Schematic diagram of a high-performance cathode sputter arrangement

7.2.3 Cathode sputtering

Evaporator with ceramic In the cathode sputtering process, the target, a solid, is bombarded with
Trough-shaped evapora- insert
tor high energy ions in a gas discharge (Fig. 7.3). The impinging ions transfer
their momentum to the atoms in the target material, knocking them off.
These displaced atoms the sputtered particles condense on the sub-
strate facing the target. Compared to evaporated particles, sputtered parti-
cles have considerably higher kinetic energy. Therefore, the conditions for
condensation and layer growth are very different in the two processes.
Sputtered layers usually have higher adhesive strength and a denser coat-
ing structure than evaporated ones. Sputter cathodes are available in many
Trough-shaped evaporator with ceramic Basket-shaped evaporator
coating different geometric shapes and sizes as well as electrical circuits configura-
tions. What all sputter cathodes have in common is a large particle source
Fig. 7.2 Various thermal evaporators area compared to evaporators and the capability to coat large substrates
with a high degree of uniformity. In this type of process metals, alloys of any
necessary evaporator temperatures without significantly evaporating the composition as well as oxides can be used as coating materials.
source holder and thus contaminating the coating. Furthermore chemical
reactions between the holder and the material to be evaporated can occur
resulting in either a reduction of the lifetime of the evaporator or contamina- 7.2.4 Chemical vapor deposition
tion of the coating.
In contrast to PVD methods, where the substance to be deposited is either
solid or liquid, in chemical vapor deposition the substance is already in the
vapor phase when admitted to the vacuum system. To deposit it, the sub-
7.2.2 Electron beam evaporators (electron guns) stance must be thermally excited, i.e. by means of appropriate high temper-
To evaporate coating material using an electron beam gun, the material, atures or with a plasma. Generally, in this type of process, a large number
which is kept in a water-cooled crucible, is bombarded by a focused elec- of chemical reactions take place, some of which are taken advantage of to
tron beam and thereby heated. Since the crucible remains cold, in principle, control the desired composition and properties of the coating. For example,
contamination of the coating by crucible material is avoided and a high using silicon-hydrogen monomers, soft Si-H polymer coatings, hard silicon
degree of coating purity is achieved. With the focused electron beam, very coatings or by addition of oxygen quartz coatings can be created by
high temperatures of the material to be evaporated can be obtained and controlling process parameters.
thus very high evaporation rates. Consequently, high-melting point com-
pounds such as oxides can be evaporated in addition to metals and alloys.
By changing the power of the electron beam the evaporation rate is easily
and rapidly controlled.

134
 Coating methods
7.3 Vacuum coating technology/ ing around the vertical axis with four substrate chambers and process sta-
coating systems tions mounted in the vacuum chamber. During rotation, a substrate cham-
ber moves from the loading and unloading station to the pretreatment sta-
tion, to the metallization station, to the protective coating station and then
7.3.1 Coating of parts back to the initial position. Since each station has its own pumping system,
For molded-plastic parts, vacuum coating techniques are increasingly all four processes can run simultaneously with entirely independent
replacing conventional coating methods, such as electroplating. For exam- adjustable process parameters. The vacuum system comprises of turbomol-
ple, using vacuum coating methods, automobile reflectors obtain a mirror- ecular pumps and backing pump sets consisting of Roots and rotary vane
like surface, plastic articles in the furniture, decoration, clock and watch as pumps.
well as electronics industry are metal-coated and optical effects are created
on articles in the decoration industry.

Fig. 7.4 shows a type of vacuum system in which large batches of molded- 7.3.2 Web coating
plastic parts can be coated simultaneously. The substrates are placed on a Metal-coated plastic webs and papers play an important role in food pack-
cage that rotates past the coating source, a sputter cathode in this exam- aging. They preserve food longer according to storage and transport logis-
ple. In some applications, by using a glow discharge treatment, the sub- tics requirements and give packaging an attractive appearence. Another
strates are cleaned and the surface is activated prior to the coating important area of application of metal-coated web is the production of film
process. This enhances the adhesive strength and reproducibility of the capacitors for electrical and electronics applications. Metal-coating is car-
coating properties. A corrosion protection coating can be applied after sput- ried out in vacuum web coating systems. Fig. 7.6 shows a typical scheme.
tering. In this case, a monomer vapor is admitted into the system and a The unit consists of two chambers, the winding chamber with the roll of web
high-frequency plasma discharge ignited. The monomer is actived in the to be coated and the winding system, as well as the coating chamber,
plasma and deposits on the substrates as a polymer coating. In this type of where the evaporators are located. The two chambers are sealed from
system there may be plastic substrates with a surface area of several each other, except for two slits through which the web runs. This makes it
10 m2 on the cage, causing a correspondingly high desorption gas flow. possible to pump high gas loads from the web roll using a relatively small
The vacuum system must be able to attain the required pressures reliably pumping set. The pressure in the winding chamber may be more than a
despite these high gas loads. In the example shown, the system is evacuat- factor of 100 higher than the pressure simultaneously established in the
ed with a combination of a backing and Roots pump. A diffusion pump coating chamber. The pump set for the winding chamber usually consists of
along with a cold surface forms the high vacuum pump system. The cold a combination of Roots and rotary vane pumps.
surfaces pump a large portion of the vapor and volatile substances emitted
With strongly degassing rolls of paper, it may be necessary to install a cold
by the plastic parts while the diffusion pump basically removes the non-con-
surface in the winding chamber to act as a water vapor pump. The rolls of
densable gases as well as the noble gas required for the sputter process.
the plastic web or paper typically have diameters between 400 and 1000
A completely different concept for the same process steps is shown in Fig. mm and a width of 400 to 3000 mm. A precise, electronically controlled
7.5. The system consists of four separate stations made up of a drum rotat- winding system is required for winding and unwinding as well as web guid-

1 Vacuum cham- er pump bypass line

ber 4 Substrates 8 Cold trap 11 Foreline valve
2 High-perfor- 5 Diffusion pump 9 High vacuum 12 Venting valve
mance cathode 6 Roots pump valve
3 Substrate hold- 7 Rotary piston 10 Valve for

Fig. 7.4 Diagramm of a batch system for coating parts Fig. 7.5 Multi-chamber parts-coating unit (rotationally symmetric in-line system DynaMet 4V)

135
Applications of vacuum technology

High-perfor-
mance
plasma
source
Electron
beam
evaporator

Monomer O2
1 Unwinder 4 Drawing roller
2 Coating source 5 Take-up reel
3 Coating roller Ar

Fig. 7.6 Schematic diagram of a vacuum web coating system Fig. 7.7 Coating unit for optical coating systems

ance. ment between evaporators and substrates, results in a very high degree of
coating uniformity. With the help of quartz coating thickness monitors (see
During the coating process the web, at a speed of more than 10 m/s, pass-
Section 6) and direct measurement of the attained optical properties of the
es a group of evaporators consisting of ceramic boats, from which alumini-
coating system during coating, the coating process is fully controlled auto-
um is evaporated. To achieve the necessary Al-coating thickness at these
matically.
high web speeds, very high evaporation rates are required. The evapora-
tors must be run at temperatures in excess of 1400 C. The thermal radia- One of the key requirements of coatings is that they retain their properties
tion of the evaporators, together with the heat of condensation of the grow- under usual ambient conditions over long periods of time. This requires to
ing layer, yields a considerable thermal load for the web. With the help of produce the densest coatings possible, into which neither oxygen nor water
cooled rollers, the foil is cooled during and after coating so that it is not can penetrate. Using glass lenses, this is achieved by keeping the sub-
damaged during coating and has cooled down sufficiently prior to winding. strates at temperatures up to 300 C during coating by means of radiation
heaters. However, plastic lenses, as those used in eyeglass optics, are not
During the entire coating process the coating thickness is continuously
allowed to be heated above 80 C. To obtain dense, stable coatings these
monitored with an optical measuring system or by means of electrical resis-
substrates are bombarded with Ar ions from an ion source during coating.
tance measurement devices. The measured values are compared with the
Through the ion bombardement the right amount of energy is applied to the
coating thickness setpoints in the system and the evaporator power is thus
growing layer so that the coated particles are arranged on the energetically
automatically controlled.
most favorable lattice sites, without the substrate temperature reaching
unacceptably high values. At the same time oxygen can be added to the
argon. The resulting oxygen ions are very reactive and ensure that the oxy-
7.3.3 Optical coatings gen is included in the growing layer as desired.
Vacuum coatings have a broad range of applications in production of oph-
The vacuum system of such a coating unit usually consists of a backing
thalmic optics, lenses for cameras and other optical instruments as well as
pump set comprising a rotary vane pump and Roots pump as well as a high
a wide variety of optical filters and special mirrors. To obtain the desired
vacuum pumping system. Depending on the requirements, diffusion pumps,
transmission or reflection properties, at least three, but sometimes up to 50
cryo pumps or turbomolecular pumps are used here, in most cases in con-
coatings are applied to the glass or plastic substrates. The coating proper-
nection with large refrigerator-cooled cold surfaces. The pumps must be
ties, such as thickness and refractive index of the individual coatings, must
installed and protected by shieldings in a way that no coating material can
be controlled very precisely and matched to each other. Most of these coat-
enter the pumps and the heaters in the system do not thermally overload
ings are produced using electron beam evaporators in single-chamber units
them. Since shielding always reduces the effective pumping speed, the sys-
(Fig. 7.7). The evaporators are installed at the bottom of the chamber, usu-
tem manufacturer must find a suitable compromise between shielding effect
ally with automatically operated crucibles, in which there are several differ-
and reduction of pumping speed.
ent materials. The substrates are mounted on a rotating calotte above the
evaporators. Application of suitable shieldings combined with relative move-

136
 Coating methods
7.3.4 Glass coating All major functions of a plant, such as glass transport, control of the sputter
processes and pump control, are carried out fully automatically. This is the
Coated glass plays a major role in a number of applications: window panes only way to ensure high productivity along with high product quality.
in moderate and cold climate zones are provided with heat-reflecting coat-
ing systems to lower heating costs; in countries with high intensity solar
radiation, solar protection coatings are used that reduce air conditioning
costs; coated car windows reduce the heating-up of the interior and mirrors
7.3.5 Systems for producing data storage disks
are used both in the furniture and the automobile industry. Most of these Coatings for magnetic- or magneto-optic data storage media usually consist
coatings are produced in large in-line vacuum systems. Fig. 7.8 shows a of several functional coatings that are applied to mechanically finished
typical system. The individual glass panes are transported into a entrance disks. If several plates are placed on one common carrier, the coating
chamber at atmospheric pressure. After the entrance valve is closed, the processes can be carried out in a system using a similar principle to that
chamber is evacuated with a forepump set. As soon as the pressure is low used for glass coating. However, most disks must be coated on both sides
enough, the valve to the evacuated transfer chamber can be opened. The and there are substantially greater low particle contamination requirements
glass pane is moved into the transfer chamber and from there at constant as compared to glass coating. Therefore, in-line systems for data memories
speed to the process chambers, where coating is carried out by means of use a vertical carrier that runs through the system (Fig. 7.10). The sputter
sputter cathodes. On the exit side there is, in analogy to the entrance side, cathodes in the process stations are mounted on both sides of the carrier
a transfer chamber in which the pane is parked until it can be transferred so that the front and back side of the disk can be coated simultaneously.
out through the exit chamber.
An entirely different concept is applied for coating of single disks. In this
Most of the coatings consist of a stack of alternative layers of metal and case the different process stations are arranged in a circle in a vacuum
oxide. Since the metal layers may not be contaminated with oxygen, the chamber (Fig. 7.11). The disks are transferred individually from a magazine
individual process stations have to be vacuum-isolated from each other and to a star-shaped transport arm. The transport arm cycles one station further
from the transfer stations. Utilization of valves for separating process cham- after each process step and in this way transports the substrates from one
bers is unsatisfactory because it increases plant dimensions. To avoid fre- process station to the next. During cycling all processes are switched off
quent and undesirable starting and stopping of the glass panes, the and the stations are vacuum-linked to each other. As soon as the arm has
process chambers are vacuum-separated through so-called slit locks, i.e. reached the process position, the individual stations are seperated from
constantly open slits combined with an intermediate chamber with its own each other by closing seals. Each station is pumped by means of its own
vacuum pump (Fig. 7.9). The gaps in the slits are kept as small as techni- turbomolecular pump and the individual processes are started. As many
cally possible to minimize clearance and therefore conductance as the process stations as there are in the system as many processes can be per-
glass panes are transported through them. The pumping speed at the inter- formed in parallel. By sealing off the process stations, excellent vacuum
mediate chamber is kept as high as possible in order to achieve a consider- separation of the individual processes can be achieved. However, since the
ably lower pressure in the intermediate chamber than in the process cham- slowest process step determines the cycle interval, two process stations
bers. This lower pressure greatly reduces the gas flow from a process may have to be dedicated for particularly timeconsuming processes.
chamber via the intermediate chamber to the adjacent process chamber.
For very stringent separation requirements it may be necessary to place
several intermediate chambers between two process chambers.

The glass coating process requires high gas flows for the sputter processes
as well as low hydrocarbon concentration. The only vacuum pump which
satisfies these requirements as well as high pumping speed stability over
time are turbo-molecular pumps which are used almost exclusively.

While the transfer and process chambers are constantly evacuated, the
entrance and exit chambers must be periodically vented and then evacuat-
ed again. Due to the large volumes of these chambers and the short cycle Process chamber Intermediate chamber Process chamber
times, a high pumping speed is required. It is provided by combinations of 1 2
rotary vane pumps and Roots pumps. For particularly short cycle times gas L1Z LZ2
cooled Roots pumps are also used. Slits

S1 SZ S2
to backing pumps

Entrance chamber Transfer chamber 2 Exit chamber L1Z, LZ2 = conductance between intermediate chamber and process chamber 1 or 2
Transfer chamber 1
Sputter chambers SZ = pumping speed at intermediate chamber
S1, S2 = pumping speed at process chamber 1 or 2

Fig. 7.8 Plant for coating glass panes 3-chamber in-line system, throughput up to Fig. 7.9 Principle of chamber separation through pressure stages
3,600,000 m2 / year

137
Applications of vacuum technology

Fig. 7.10 Plant for coating data storage disks with carrier transport system

Fig. 7.11 Plant for individual coating of data storage disks

138
 Instructions for equipment operation
8. Instructions for vacuum equipment opera- gauge) with and without a cold trap inserted in the line: Filling the cold trap
with liquid nitrogen will cause the pressure to drop abruptly, by one power
tion of ten or more, if the container is contaminated since the vapors will freeze
out in the trap.

Eliminating contamination for glass equipment

8.1 Causes of faults where the desired ulti- If the contaminants exhibit a high vapor pressure, then they can be pumped
mate pressure is not achieved out relatively quickly. If this is not successful, then the apparatus will have
to be cleaned. Contaminated glass components will first be cleaned with
or is achieved too slowly
chromic-sulfuric acid mixture or if this is necessary with dilute hydrofluo-
If the desired ultimate pressure is not reached at all in vacuum equipment ric acid (1:30). They are then rinsed with distilled water. If this does not
or if it is attained only after an excessively long pumping period, then the bring about the desired results, then an organic solvent can be tried. Then
following problems may be the reason: the glass components will again have to be rinsed with methanol and dis-
If the desired ultimate pressure is not reached, then tilled water. (Do not use denatured alcohol!)

the apparatus may be leaky or dirty, Eliminating contamination at metallic equipment

the pump may dirty or damaged, Metal components will usually exhibit traces of contamination by oil and
greases. If these cannot be readily removed by pumping down the vessel,
the vacuum gauge may be defective. then an appropriate organic solvent (denatured alcohol is unsuitable in all
If the desired ultimate pressure is reached only after a very long running cases) will have to be used for cleaning. Maximum cleanliness can be
time, then achieved with vapor baths such as those commonly found in industry. If one
desires to get down to extremely low pressure ranges (< 10-7 mbar), then
the apparatus may be dirty, after cleaning the metal components will have to be baked out at temper-
the pumping line may be restricted, atures of up to 200 C. Seriously contaminated metal components will first
have to be cleaned by cutting away or sandblasting the top surface. These
the pump may be dirty or of too small a capacity, methods suffer the disadvantage that the surface area for the surface thus
the pumping speed may be restricted due to other causes. treated will be increased through roughening and active centers may poten-
tially be formed which would readily adsorb vapor molecules.
In order to locate the fault, one normally proceeds by separating the evacu- Supplementary cleaning in the vapor bath (see above) is advisable. In
ated vessel from the pump system (where this is possible) and checking the some cases electrolytic pickling of the surface may be beneficial. In the
vessel alone for leaks and contamination using the pressure rise method, case of high vacuum components it is necessary to pay attention to ensur-
for example. If it has been found that the vessel is free of defects in this ing that the pickling does not turn into etching, which would seriously
regard, then the measurement system will be checked for cleanliness (see increase the surface area. Polishing surfaces which have been sandblasted
Section 8.38) and ultimately if required the pump or the pumping sys- is not necessary when working in the rough and medium vacuum ranges
tem itself will be examined. since the surface plays only a subordinate role in these pressure regimes.

8.2 Contamination of vacuum vessels and 8.3 General operating information for vacuum
eliminating contamination pumps
In addition to the pressure rise method (Section 6.1) there is a further If no defects are found in the vacuum vessels and at the measurement
method for detecting contamination, based on the fact that condensable tubes or if the apparatus still does not operate satisfactorily after the faults
vapors will generally account for the major share of the gas mix in dirty ves- have been rectified, then one should first check the flange seals at the
sels: here the pressure reading at a compression vacuum gauge (partial pump end of the system and possibly the shut-off valve. Flange seals are
pressure for the non-condensable gases) is compared with that at an elec- known to be places at which leaks can appear the most easily, resulting
trical vacuum gauge, e.g. a thermal conductivity or ionization vacuum from slight scratches and mechanical damage which initially appears
gauge (measuring total pressure). These two vacuum gauges must, howev- insignificant. If no defect can be discerned here, either, then it is advisable
er, be clean themselves. Where vapors are present the compression vacu- to check to see whether the pumps have been maintained in accordance
um gauge will indicate much better pressure than the electrical vacuum with the operating instructions.
gauge. This is a sure sign that the vessel walls are contaminated, usually
with oil. Another commonly used procedure is to compare the pressure indi- Given initially in this section are general instructions on pump maintenance,
cation of one and the same vacuum gauge (not a compression vacuum to be followed in order to avoid such defects from the very outset. In addi-
tion, potential errors and their causes are discussed.

139
 Instructions for equipment operation
8.3.1 Oil-sealed rotary vacuum pumps (Rotary If an oil-filled rotary pump is operated without an oil separation and return
vane pumps and rotary piston pumps) device, then it will be necessary to expect a certain amount of oil consump-
tion, the extent of which will depend on the size of the pump and the nature
of the operations. In the worst case this can amount to about 2 cm3 for
8.3.1.1 Oil consumption, oil contamination, oil change
every cubic meter of air pumped (at STP and including the gas ballast also
The oil serves to: drawn in). Figure 8.1 makes it possible to predict the amount of oil loss to
lubricate moving parts, be expected in practical situations. The example demonstrates that greater
seal moving parts against atmospheric pressure, oil losses must be expected when operating the pump with gas ballast. This
seal the valve, situation, which is generally valid, is always to be taken into account in
fill the dead space below the valve, practice.
to seal the various operational spaces one from another.
If the pump oil has become unusabledue to exposure to the vapors or
In all pumps it is possible to check the oil charge during operation using the contaminants which are encountered in the process, then the oil will have
built-in oil level sight glass. During continuous operation in particular it is to be replaced. It is impossible to formulate any hard-and-fast rules as to
necessary to ensure that the oil charge never falls below the minimum when an oil change will be required since the nature of the operations will
level. During a pumping process oil-sealed rotary pumps will emit oil vapors determine how long the oil will remain good. Under clean conditions (e.g.
from the discharge port, this being due to the high operating temperature. backing pumps for diffusion pumps in electro-nuclear accelerators) rotary
This leads to oil loss to an extent which will depend on the quantity of gas vacuum pumps can run for years without an oil change. Under extremely
or vapor which is drawn into the pump. Larger oil droplets can be retained dirty conditions (e.g. during impregnation) it may be necessary to change
by installing a coarse separator in the discharge line. This will reduce oil the oil daily. The oil will have to be replaced when its original light brown
loss considerably. The fine oil mist filter installed in some pumps will also color, has turned dark brown or black due to ageing or has become cloudy
retain the finest oil droplets (fine separation) so that no oil at all will leave because liquid (such as water) has entered the pump. An oil change is also
the outlet of the pump and oil loss is reduced practically to zero since as necessary when flakes form in corrosion protection oil, indicating that the
in coarse separation the oil which is separated out is returned to the corrosion protection agent is exhausted.
pump. With pumps without an integral fine separator this device is offered
as an optional extra. Changing the oil
The oil change should always be carried out with the pump switched off but
at operating temperature. The oil drain (or fill) opening provided for each
pump is to be used for this purpose. Where the pump is more seriously
contaminated, then it should be cleaned. The applicable operating instruct-
ions are to be observed in this case.

8.3.1.2 Selection of the pump oil when handling aggres-

sive vapors
If corrosive vapors (e.g. the vapors formed by acids) are to be pumped,
Pumping speed [m3 h1]

then a PROTELEN corrosion protection oil should be used in place of the

normal pump oil (N 62). These types of vapors will then react with the basic
(alkaline) corrosion protection agent in the oil. The continuous neutralization
reactions will exhaust the corrosion protection agent at a rate depending on
the quantity and acidity of the vapors. The oil will have to be changed more
frequently, in accordance with these factors. Corrosion protection oils are
either very hygroscopic or they easily form emulsions with water.
Consequently a pump which is filled with corrosion protection oil will absorb
moisture from the air if it is out of service for an extended period of time. In
no case should one ever use a pump filled with corrosion protection oil in
Intake pressure [mbar] order to pump water vapor since the lubricating and corrosion inhibition
properties of the oil would be adversely affected. Once the oil has absorbed
Example: Oil losses for a TRIVAC S 16 A at pressure of 1 mbar:
a) Without gas ballast: in accordance with the pumping speed curve S = 15 m3 / h; according water it will no longer be possible for such pumps to achieve the ultimate
to diagram: oil loss = 0.03 cm3 / h (line a) pressures which would be the case with fresh corrosion protection oil or
b) With gas ballast: S = 9 m3/h at 1 mbar; oil loss = 0.018 cm3 / h (line b1), plus additional loss
due to gas ballast quantity (0.1 times the 1.6 m3 / h rated pumping speed); that is: Chart on the standard pump oil (N 62). Oil-filled pumps should, under normal operating
horizontal line b2 up to atmospheric pressure: additional loss: 3 cm3 / h (diagonal line). Overall con-ditions, not be filled with corrosion protection oil. N 62 oil is preferred
loss during gas ballast operation 0.018 + 3 = 3.018 cm3 / h.
when pumping air, water vapor and non-corrosive organic vapors in so far
Fig. 8.1 Oil loss for oil-sealed pumps (referenced to an approximate maximum value of 2 cm3
as there is positive protection against the vapors condensing inside the
oil loss per cubic meter of air drawn in [STP]) pump.

140
 Instructions for equipment operation
8.3.1.3 Measures when pumping various chemical sub-
stances b) Anhydrides
CO (carbon monoxide) is a strong reducing agent. When CO is being
This discussion cannot provide exhaustive coverage of the many and varied pumped it is therefore important that air not be used as the gas ballast but
application fields for oil-filled vacuum pumps in the chemicals industry. Our rather that inert gases be used at the very outside (e.g. Ar or N2). Inert gas
many years of experience with the most difficult of chemicals applications ballast should also be used when pumping SO2, SO3, and H2S. A corrosion
can be used to solve your particular problems. Three aspects should, how- inhibiting oil is also to be used when handling these three anhydrides.
ever, be mentioned briefly: pumping explosive gas mixes, condensable Carbon dioxide (CO2) can be pumped without making any special
vapors, and corrosive vapors and gases. arrangements.

Explosion protection c) Alkaline solutions

Applicable safety and environmental protection regulations shall be Normal N 62 pump oil is to be used to pump basic (alkaline) solutions.
observed when planning and engineering vacuum systems. The operator Sodium hydroxide and caustic potash solutions should not be pumped in
must be familiar with the substances which the system will be pumping and their concentrated form. Ammonia is highly amenable to pumping with the
take into account not only normal operating conditions but also abnormal gas ballast valve closed. Alkaline organic media such as methylamine and
situations, operating outside normal parameters. The most important aids to dimethylamine can also be pumped satisfactorily, but with the gas ballast
avoiding explosive mixtures are in addition to inertization by adding pro- valve open.
tective gases maintaining the explosion limit values with the aid of con-
densers, adsorption traps and gas scrubbers.
d) Elementary gases
Pumping nitrogen and inert gases requires no special measures.
Protection against condensation
LEYBOLD pumps offer three options for keeping vapors from condensing in When handling hydrogen it is necessary to make note of the hazard of cre-
the pumps: ating an explosive mixture. The gas ballast valve may in no case be opened
when dealing with hydrogen. The motors driving the pumps must be of
The gas ballast principle (See Fig. 2.14). This increases considerably explosion-proof design.
the amount of vapor which the pump can tolerate.
Increased pump temperature. The rugged design of our pumps makes it Oxygen: Particular caution is required when pumping pure oxygen!
possible to run them at temperatures of up to 120 C. Thus the toler- Specially formulated pump oils must be used for this purpose. We can sup-
ance for pure water vapor, for example, will rise by a factor of five when ply these, accompanied by an approval certificate issued by the German
compared with normal gas ballast operation. Federal Materials Testing Authority (BAM), following consultation.
Using vacuum condensers (see Section 2.15). These act as selective
e) Alkanes
pumps and should be sized so that the downstream gas ballast pump
The low molecular weight alkanes such as methane and butane can be
will not receive more vapor than the amount corresponding to the appro-
pumped with the gas ballast valve closed or using inert gas as the gas bal-
priate vapor tolerance.
last and/or at increased temperature of the pump. But important
Corrosion protection Increased explosion hazard!
Oil-sealed pumps are already quite satisfactorily protected against corrosion
due to the oil film which will be present on all the component surfaces. f) Alcohols
Corrosion is defined here as the electrochemical dissolution of metals, i.e. Once operating temperature has been reached, methanol and ethanol can
the release of electrons by the metal atom and their acceptance by the oxi- be extracted without using gas ballast (N 62 pump oil). To pump higher mol-
dation agent (corrosive gas). A metal atom which is susceptible to corrosion ecular weight alcohols (e.g. butanol) the gas ballast valve will have to be
must therefore be exposed to an active atom of the oxidation agent. opened or other protective measures will have to be implemented to pre-
vent condensation.
This makes clear how the oil-sealed pump is protected against corrosion;
the concentration of the oxidation agent in the oil is negligible and thus the
opportunity for the metal to release electrons is equally small. This also g) Solvents
makes it clear that the use of so-called non-rusting or stainless steels Acetone: Can be extracted without difficulty; wait until normal operating
does not make sense since oxidation is necessary for the passivation of temperature is reached.
these steels, in order to reach the so-called passive region for these steel Benzene: Caution vapors are highly flammable. Ultimate pressure is
compounds. The critical passivation current density will normally not appear degraded by dilution of the pump oil. Mixtures of air and benzene are explo-
in oil-sealed pumps. sive and flammable. Work without a gas ballast! Inert gases may possibly
be used as ballast gas.
a) Acids
Carbon tetrachloride and trichlorethylene: Amenable to pumping; non-
Our pumps are fundamentally suited to pumping acids. In special situations
flammable and non-explosive but will be dissolved in oil and thus increase
problems with the oil and with auxiliary equipment attached at the intake
the ultimate pressure; wait until normal operating temperature is achieved.
and/or discharge end may occur. Our engineers in Cologne are available to
Keep the gas ballast open when pumping carbon tet and other non-flamma-
assist in solving such problems.

141
Instructions for equipment operation
ble solvents. Use N 62 pump oil. strip; a motor protection switch (overload/ overheating) shall be provided as
required by local codes.
Toluene: Pump through the low-temperature baffle and without gas ballast.
Use inert gas, not air, as the gas ballast. The direction of motor rotation shall be checked with the intake and outlet
ports open prior to installing the pump. The drive shaft, seen from the motor
end, must rotate counter-clockwise. Note the arrow on the motor indicating
8.3.1.4 Operating defects while pumping with gas ballast the direction of rotation! If the roots pump runs in the wrong direction, then
Potential sources of error where the required it is reversed by interchanging two of the phases at the motor connection
ultimate pressure is not achieved cord.

a) The pump oil is contaminated (particularly with dissolved vapors). Check The roots pump may be switched on only after the roughing pump has
the color and properties. Remedy: Allow the pump to run for an extend- evacuated the vacuum vessel down to the cut-in pressure.
ed period of time with the vacuum vessel isolated and the gas ballast Permissible cut-in pressure PE will depend on the reduction ratios of the
valve open. In case of heavy contamination an oil change is advisable. roots pump as against the roughing pump and is calculated by dividing the
The pump should never be allowed to stand for a longer period of time permissible pressure differential pmax by the compression ratio, reduced
when it contains contaminated oil. by the value of 1:
b) The sliding components in the pump are worn or damaged. Under clean pmax
conditions our pumps can run for many years without any particular p = where
E k th 1
mainte-nance effort. Where the pump has been allowed to run for a
longer period of time with dirty oil, however, the bearings and the gate k th =
Theoretical pumping speed for the roots pump
valves may exhibit mechanical damage. This must always be assumed Nominal pumping speed for the roughing pump
when the pump no longer achieves the ultimate pressure specified in
the catalog even though the oil has been changed. In this case the If the pump is protected using a diaphragm-type pressure switch, then the
pump should be sent in for repair or our customer service department pump will be switched on automatically. If a combination of roots pump and
should be contacted. roughing pump is to convey highly volatile substances such as liquids with
a low boiling point, then it is advisable to use a roots pump which is
c) The measurement instrument is soiled (see Section 8.4.2).
equipped with an integral bypass line and a valve which will respond to a
pre-set pressure. Example: Roots vacuum pumps RUVAC WAU / WSU.
Potential sources of error when the pump no longer turns
Check the pump electrical supply. Roots pumps from the RUVAC-WAU/WSU series, being equipped with
The pump has stood for a long time containing contaminated or bypass lines, can generally be switched on together with the forepump. The
resinous oil. bypass protects these roots pumps against overloading.
The pump is colder than 10C and the oil is stiff. Heat the pump.
There is a mechanical error. Please contact our customer service
department. 8.3.2.2 Oil change, maintenance work

Oil exits at the shaft Under clean operating conditions the oil in the roots pump will be loaded
If oil is discharged at the shaft, then the Seeger rotary shaft circlip in the only as a result of the natural wear in the bearings and in the gearing. We
drive bearing will have to be inspected and possibly replaced. The design nevertheless recommend making the first oil change after about 500 hours
of the pumps makes it possible to replace this ring easily, following the in service in order to remove any metal particles which might have been
operating instructions provided with the unit. created by abrasion during the run-in period. Otherwise it will be sufficient
to change the oil every 3000 hours in operation. When extracting gases
containing dust or where other contaminants are present, it will be neces-
sary to change the oil more frequently. If the pumps have to run at high
8.3.2 Roots pumps
ambient temperatures, then the oil in the sealing ring chamber shall also be
replaced at each oil change.
8.3.2.1 General operating instructions, installation and
commissioning We recommend using our specially formulated N 62 oil.

Roots pumps must be exactly level. When attaching the pump it is neces- Under dirty operating conditions it is possible for dust deposits to form a
sary to ensure that the pump is not under any tension or strain whatsoever. crust in the pump chamber. These contaminants will deposit in part in the
Any strains in the pump casing caused by the connection lines shall be pumping chamber and in part on the pumps impellers. They may be
avoided. Any strain to which the pump is subjected will endanger the pump removed, once the two connection lines have been detached, either by
since the clearances inside the roots pump are very small. blowing out the system with dry compressed air or by rinsing with a suitable
cleaning agent, such as petroleum ether (naphtha).
Roots pumps are connected to the line power supply via the motor terminal
The oil in the roots pump will then have to be changed. The rotor may be
turned only by hand during cleaning since, due to the high speed when the

142
 Instructions for equipment operation
motor is running, the deposits could damage the pump as they dislodge 8.3.3 Turbomolecular pumps
from the surfaces.

Grime which cannot be eliminated by washing can be removed mechanical- 8.3.3.1 General operating instructions
ly using a wire brush, metallic scrubber or scraper.
In spite of the relatively large gap between the pump rotor and the stator,
the turbomolecular pumps should be protected against foreign objects
Important! entering through the intake port. It is for this reason that the pump should
The dislodged residues may not remain in the pump chamber. After clean- never be operated without the supplied wire-mesh splinter guard. In addi-
ing is completed check the pump for operability by slowly turning the tion, sharp shock to the pump when running and sudden changes in atti-
impellers by hand. There may be no resistance to rotation. It is generally tude are to be avoided.
not necessary to dismantle the roots pump. If this should nevertheless be
required due to heavy soiling, then it is highly advisable to have this done Over and above this, and particularly for the larger types with long rotor
by the manufacturer. blades, airing the pump to atmospheric pressure while the impellers are
rotating may be done only when observing exactly the rules given in the
operating instructions. Under certain circumstances it is possible to operate
turbomolecular pumps under exceptional conditions.
8.3.2.3 Actions in case of operational disturbances
The turbomolecular pump may, for example, be used unprotected inside
1. Pump becomes too warm: (maximum operating temperature
magnetic fields if the magnetic induction at the surface of the pump casing
100 to 115 C)
does not exceed B = 3 10-3 T when radially impinging and B = 15 10-3 T
Possible causes: at axial impingement.
Overloading: Excessive heat of compression due to an excessively In a radioactive environment standard turbomolecular pumps can be used
high pressure ratio. Check the pressure value adjustments and the tight- without hazard at dose rates of from 104 to 105 rad. If higher dose rates are
ness of the vacuum chamber! encountered, then certain materials in the pump can be modified in order to
Incorrect clearances: The distances between the rotors and the hous- withstand the greater loading. The electronic frequency converters in such
ings have been narrowed due to dirt or mechanical strain. cases are to be set up outside the radioactive areas since the semicon-
Soiled bearings: Excessive friction in the bearings ductors used inside them can tolerate a dose rate of only about 103 rad.
Improper oil level: If the oil level is too high, the gears will touch the oil, The use of motor-driven frequency converters which can withstand up to
causing friction resistance. Where the oil level is too low the system will 108 rad represents another option.
not be lubricated.
Roughing (backing) pumps are required for the operation of turbomolecular
Incorrect oil type: An SAE 30 grade oil must be used for the pump.
pumps. Depending on the size of the vessel to be evacuated, the turbomol-
2. Excessive power consumption: All the factors which can lead to ele- ecular pumps and forepumps may be switched on simultaneously. If the
vated temperatures can also cause excessisve amounts of power to be time required to pump the vessel down to about 1 mbar using the particular
drawn. The motor is defective if excessive power requirements are not fore-pump is longer than the run-up time for the pump (see operating
accompanied by a rise in the temperature at the pump. instructions), then it is advisable to delay switching on the turbomolecular
pump. Bypass lines are advisable when using turbomolecular pumps in sys-
3. Oiling at the pump chamber: tems set up for batch (cyclical) operations in order to save the run-up time
for the pump. Opening the high vacuum valve is not dangerous at pres-
Possible causes: sures of about 10-1 mbar.
Oil level too high: Oil is subjected to excessive thermal loading. Oil
foam is swept along.
Oil mixed with the product: Azeotropic degasification of the oil. 8.3.3.2 Maintenance
Pump leaking: Air ingress through the oil drain or filler screw will cause Turbomolecular pumps and frequency converters are nearly maintenance-
a large stream of air and conveyance of oil into the pumping chamber. free. In the case of oil-lubricated pumps it is necessary to replace the bear-
4. Abnormal running noises: ing lubricant at certain intervals (between 1500 and 2500 hours in opera-
tion, depending on the type). This is not required in the case of grease-
Possible causes: lubricated pumps (lifetime lubrication). If it should become necessary to
Grime at the impeller clean the pumps turbine unit, then this can easily be done
Bearing or gearing damage by the customer, observing the procedures described in the operating
Impellers are touching the housing instructions.
In the case of bearing or gearing damage or where the impeller scrapes the
housing the pump should be repaired only by the manufacturer.

143
Instructions for equipment operation
8.3.4 Diffusion and vapor-jet vacuum pumps be decalcified.
Forevacuum pressure too high: This is possible particularly where
vapors which are either evacuated from the vessel or are created as
8.3.4.1 Changing the pump fluid and cleaning the pump
cracking products from the driving medium (e.g. following air ingress)
Changing the pump fluid is always necessary whenever the pump no longer get into the roughing pump. Check the forevacuum pressure with the oil
achieves the required ultimate vacuum or when its pumping speed falls off. diffusion pump disconnected. Remedy: Run the forevacuum pump for an
The service life of the pump fluid will as a rule come to several weeks or extended period of time with gas ballast. If this is not sufficient, then the
months or even years and will depend largely on the operating condi- oil in the forepump will have to be changed.
tions for the pump. It is reduced by frequent pumping at high pressures, by Pump fluid at the diffusion pump spent or unserviceable: Replace the
exposure to aggressive vapors and by air ingress of longer duration (this driving medium.
does not apply to silicone oil and mercury). Heating is incorrect: Check the heating output and check for good ther-
mal contact between the heating plate and the bottom of the boiler sec-
In the case of oil diffusion and vapor-jet pumps the danger presented to the
tion. Replace the heating unit if necessary.
pump fluid where there is air ingress with the pump hot is often overestimat-
Leaks, contamination:
ed. Where air ingress (up to atmospheric pressure) is encountered only
Remedy: if the pump has been contaminated by vapors it may help to
occasionally and for short periods of time then silicone oil will not be
use a metering valve to pass air through the apparatus for some period
attacked at all and the DIFFELEN pump fluid will only barely be affected.
of time; here the pressure should not exceed 10-2 mbar when DIFFE-
The products with considerably higher vapor pressures which can be creat-
LEN is being used.
ed through oxidation are removed again in a short period of time by the
Measurement system old or soiled (see Section 8.4.2).
fractionation and degassing equipment in the pump (see Section 2.1.6.1).
Even though the pump fluid which was originally light in color has been Potential sources of error where there is insufficient pumping speed:
turned brown by air ingress, this need not necessarily mean that the medi- Forevacuum pressure is too high: Check the forevacuum; allow the gas
um has become unusable. If, on the other hand, the pump fluid has turned ballast pump to run for a longer period of time with the gas ballast valve
cloudy and has become more viscous, as well (which may be the case fol- open. It may be necessary to change the oil in the forepump.
lowing periods of air ingress lasting for several minutes) then the medium The pump fluid in the diffusion pump has become unserviceable: Driving
will have to be replaced. It is possible that under certain circumstances medium will have to be replaced.
cracking products from the pump fluid may make the oil in the forepump Nozzles at the diffusion pump are clogged: Clean the diffusion pump.
unserviceable so that here, too, an oil change will have to be made. Heating is too weak: Check heating output; examine heating plate for
Mercury diffusion and vapor-jet pumps are less sensitive to air ingress than good thermal contact with the bottom of the boiler chamber.
oil diffusion pumps. The oxidation of the hot mercury caused by the air Substances are present in the vacuum vessel which have a higher
ingress is negligible in regard to the operating characteristics of the pump vapor pressure than the driving medium being used: among these are,
when compared with the mercury loss in the forepump line. for example, mercury, which is particularly hazardous because the mer-
cury vapors will form amalgams with the nonferrous metals in the oil dif-
Changing the pump fluid: The interior section will be extracted from the fusion pump and thus make it impossible to achieve perfect vacuums.
pump and the contaminated pump fluid poured out. The interior section and
the pump body are then cleaned with pure petroleum ether (naphtha). The
interior section and pump body of mercury pumps should have been 8.3.5 Adsorption pumps
cleaned beforehand with a clean brush; use a bottle brush for the nozzle
bores. Ensure that all the nozzle orifices are properly cleaned. It is advanta- 8.3.5.1 Reduction of adsorption capacity
geous to evaporate all solvent residues in a drying kiln. Then the inside
section is inserted once again and the fresh pump fluid is installed through A considerable reduction in pumping speed and failure to reach the ultimate
the forevacuum port. It is necessary to ensure that the upper nozzle cover pressure which is normally attainable in spite of thermal regeneration hav-
is not moistened with pump fluid! Do not install too much pump fluid! ing been carried out indicates that the zeolite being used has become cont-
aminated by outside substances. It does not make good sense to attempt
to rejuvenate the contaminated zeolite with special thermal processes. The
zeolite should simply be replaced.
8.3.4.2 Operating errors with diffusion and vapor-jet
pumps
Potential sources of defects when the desired ultimate pressure is not 8.3.5.2 Changing the molecular sieve
reached
It will be necessary to rinse the adsorption pump thoroughly with solvents
Coolant temperature is too high; inadequate water throughput. The before installing the new zeolite charge. Before putting the adsorption pump
coolant flow should always be monitored by a water flowmeter in order which has been charged with fresh zeolite into service it is also necessary
to protect the pump from damage. Remedy: Measure the exit to bake out the new zeolite charge, under vacuum and using the heating

temperature of the coolant water (it should not exceed 30 C). Increase
the coolant flow-through rate. The cooling coils at the pump may have to

144
 Instructions for equipment operation
element associated with the pump, for a period of several hours so that pumps manufactured by LEYBOLD are so good that no problems will be
contaminants which might have collected during the storage period can dis- encountered when returning the units to service, even after a longer period
sipate. in storage.

When the sputter-ion pumps are installed one should ensure that the mag-
netic fields will not interfere with the operation of other devices (ionization
8.3.6 Titanium sublimation pumps vacuum gauges, partial pressure measurement units, etc.). Mounting
Each of the turns in the titanium sublimation pump contains approximately devices for the sputter-ion pumps may not short circuit the inductance flow
1.2 g of useable titanium supply. At a heating current of 50 A the surface and thus weaken the air gap inductance and pumping speed.
temperature comes to about 1850 K, the sublimation rate approximately If the ultimate pressure which can be attained is not satisfactory even
0.12 g/h, i.e. a turn can be operated continuously for about 10 hours. Since though the apparatus is properly sealed, then it will usually be sufficient to
at pressures below 1 10-6 mbar sublimation is not continuous but rather bake out the attached equipment at about 200 to 250 C. If the pressure
only at intervals which at low pressures (below 5 10-8 mbar) and low gas here rises to about 1 10-5 mbar when this is done, then the sputter ion
volumes are already more than ten times the actual sublimation period, pump will become so hot after evacuating the gases for two hours that it will
one may assume a pumping period of almost one month at a working pres- not be necessary to heat it any further in addition. It is also possible to heat
sure of 10-10 mbar per turn. the pump by allowing air to enter for 2 hours at 10-5 mbar before the other
The effective pumping speed of a titanium sublimation pump will depend on apparatus is then subsequently baked out. If the ultimate pressure is still
the getter screen surface and the geometry of the suction opening. The not satisfactory, then the pump itself will have to be baked out for a few
pumping speed, referenced to the surface area of the getter surface, will be hours at 250 to 300C (but not higher than 350 C!). The pump should with-
dependent on the type of gas and the getter screen temperature. Since out fail remain in operation throughout this period! If the pressure rises
inert gases, for example, cannot be pumped at all, titanium sublimation above 5 10-5 mbar it will be necessary either to heat more slowly or to
pumps should always be used only with an auxiliary pump (sputter-ion connect an auxiliary pump. Before airing one should allow the hot sputter-
pump, turbomolecular pump) used to pump these gas components. The ion pump enough time to cool down at least to 150 C.
supplementary pump can be much smaller than the titanium sublimation
pump. Only in a few special cases can one do without the additional pump.

The selection of the coolant is dictated by the working conditions and the
requirements in terms of ultimate pressure. At high pressures, above 8.4 Information on working with vacuum
1 10-6 mbar, more thermal energy is applied to the getter screen by fre- gauges
quent sublimation cycles. It is for this reason that cooling with liquid nitro-
gen is more favorable. At low pressures water cooling may be sufficient.
8.4.1 Information on installing vacuum sensors
The getter screen should if at all possible be heated to room temperature
before airing the pump as otherwise the humidity in the air would condense Here both the external situation in the immediate vicinity of the vacuum
out on the surface. apparatus and the operating conditions within the apparatus (e.g. working
pressure, composition of the gas content) will be important. It is initially nec-
essary to ascertain whether the measurement system being installed is
8.3.7 Sputter-ion pumps sensitive in regard to its physical attitude. Sensors should only be installed
vertically with the vacuum flange at the bottom to keep condensates, metal
Sputter-ion pumps use high-voltage current. Installation and connection flakes and filings from collecting in the sensor or even small components
should be carried out only under the supervision of a qualified specialist. such as tiny screws and the like from falling into the sensorand the mea-
The operating instructions shall be observed! surement system. The hot incandescent filaments could also bend and
The service life of sputter-ion pumps depends linearly on the pumps oper- deform improperly and cause electrical shorts inside the measurement sys-
ating pressure. In the case of pumps manufactured by LEYBOLD, the fol- tem. This is the reason behind the following general rule: If at all possible,
lowing applies: install sensors vertically and open to the bottom. It is also very impor-
tant to install measurement systems if at all possible at those points in the
p T = 45 10-3 mbar h vacuum system which will remain free of vibration during operation.
(p = operating pressure, T = service life) The outside temperature must be taken into account and above all it is nec-
This means that for operating pressure of essary to avoid hot kilns, furnaces or stoves or other sources of intense
10-3 mbar the service life is 45 hours radiation which generate an ambient temperature around the measurement
10-6 mbar the service life is 45,000 hours system which lies above the specific acceptable value. Excessive ambient
10-9 mbar the service life is 45,000,000 hours temperatures will result in false pressure indications in thermal conductivity
vacuum sensors.
If a triode pump is not needed over an extended period of time it can either
be operated continuously at low pressure with practically no influence on
the service life or it can be aired, removed from the pump and packed in
a dust-tight container. The starting properties of the sputter-ion (triode)

145
Instructions for equipment operation
8.4.2 Contamination at the measurement system In vacuum measurement systems used in the high and ultrahigh regimes it
and its removal is necessary to ensure in particular that the required high insulation values
for the high-voltage electrodes and ion traps also be maintained during
operation and sometimes even during bake-out procedures. Insulation
The vacuum gauges used in vacuum technology for pressure measurement defects may occur both in the external feed line and inside the measure-
will certainly work under dirty conditions. This is quite understandable ment system itself. Insufficient insulation at the trap (detector) lead may
since a vacuum device or system does not serve simply to produce low allow creep currents at low pressures to stimulate overly high pressure
pressures but rather and primarily have to run processes in chemistry, met- value readings. The very low ion trap currents make it necessary for this
allurgy or nuclear physics at low pressures. Here, depending on the nature lead to be particularly well insulated. Inside the measurement sensors, too,
of the process, considerable quantities of gases or vapors will be liberated creep currents can occur if the trap is not effectively shielded against the
either continuously or intermittently; these can pass into the measurement other electrodes.
systems provided for pressure measurement and installed in the vacuum
system and due to surface reactions or through simple deposits can fal- An error frequently made when connecting measurement sensors to the
sify the pressure measurements considerably. This is true for all types of vacuum system is the use of connector piping which is unacceptably long
vacuum gauges whereby, of course, high-sensitivity, high-accuracy mea- and narrow. The conductance value must in all cases be kept as large as
surement systems are particularly susceptible to soiling resulting from the possible. The most favorable solution is to use integrated measurement
causes named. One can attempt to protect the measurement systems systems. Whenever connector lines of lower conductance values are used
against contamination by providing suitable shielding. This, however, will the pressure indication, depending on the cleanliness of the measurement
often lead to the pressure registered by the measurement system which sensors and the connector line, may be either too high or too low. Here
is indeed clean deviating considerably from the pressure actually prevail- measurement errors by more than one complete order of magnitude are
ing in the system. possible! Where systems can be baked out it is necessary to ensure that
the connector line can also be heated.
It is not fundamentally possible to keep the measurement system in a vacu-
um gauge from becoming soiled. Thus it is necessary to ensure that

the influence of the contamination on pressure measurement remains 8.4.4 Connectors, power pack, measurement
as small as possible and that systems
the measurement system can readily be cleaned. The measurement cables (connector cables between the sensor and the
vacuum gauge control unit) are normally 2 m long. If longer measurement
These two conditions are not easy to satisfy by most vacuum gauges in
cables must be used for installation in control panels, for example then
practice.
it will be necessary to examine the situation to determine whether the pres-
Dirt in a compression vacuum gauge will cause an incorrect and uncontrol- sure reading might be falsified. Information on the options for using over-
lable pressure indication. Dirty THERMOVAC sensors will show a pressure length cables can be obtained from our technical consulting department.
which is too high in the lower measurement range since the surface of the
hot wire has changed. In Penning vacuum gauges contamination will
induce pressure readings which are far too low since the discharge cur-
rents will become smaller. In the case of ionization vacuum gauges with hot
cathodes, electrodes and the tube walls can be soiled which, under certain
circumstances, will result in a reduction of dielectric strengths. Here, how-
ever, the measurement systems can usually be baked out and degassed by
passing a current through or by electron bombardment, quite aside from
the fact that ionization vacuum gauges are often used in the ultrahigh vacu-
um range where it is necessary to ensure clean operating conditions for
other reasons.

8.4.3 The influence of magnetic and electrical

fields
In all those measurement instruments which use the ionization of gas mole-
cules as the measurement principle (cold-cathode and hot-cathode ioniza-
tion vacuum gauges), strong magnetic leakage fields or electrical potentials
can have a major influence on the pressure indication. At low pressures it is
also possible for wall potentials which deviate from the cathode potential to
influence the ion trap current.

146
 Tables, Formulas, Diagrams
9. Tables, formulas, nomograms and symbols
Unit N m2, Pa 2) mbar bar Torr Abbrev. Gas C* = p
[cm mbar]
1 N m2 (= 1 Pa) 1 1 102 1 105 7.5 103
1 mbar 100 1 1 103 0.75 H2 Hydrogen 12.00 103
1 bar 1 105 1 103 1 750 He Helium 18.00 103
1 Torr 3) 133 1.33 1.33 103 1 Ne Neon 12.30 103
1) The torr is included in the table only to facilitate the transition from this familiar unit to the
Ar Argon 6.40 103
statutory units N m-2, mbar and bar. In future the pressure units torr, mm water column, mm Kr Krypton 4.80 103
mercury column (mm Hg), % vacuum, technical atmosphere (at), physicalatmosphere (atm), Xe Xenon 3.60 103
atmosphere absolute (ata), pressure above atmospheric and pressure below atmospheric
may no longer be used. Reference is made to DIN 1314 in this context. Hg Mercury 3.05 103
2) The unit Newton divided by square meters (N m-2) is also designated as O2 Oxygen 6.50 103
Pascal (Pa): 1 N m-2= 1 Pa. N2 Nitrogen 6.10 103
Newton divided by square meters or Pascal is the SI unit for the pressure of fluids.
3) 1 torr = 4/3 mbar; torr = 1 mbar. HCl Hydrochloric acid 4.35 103
CO2 Carbon dioxide 3.95 103
Table I: Permissible pressure units including the torr 1) and its conversion
H2O Water vapor 3.95 103
NH3 Ammonia 4.60 103
C2H5OH Ethanol 2.10 103
Cl2 Chlorine 3.05 103
Air Air 6.67 103

Table III: Mean free path l

Values of the product c* of the mean free path ( and pressure p for various gases at
20 C (see also Fig. 9.1)

1 = ... mbar Pa dyn cm2 atm Torr inch Micron cm kp cm2 lb in2 lb ft2
(N/m3) (bar) (phys.) (mm Hg) Hg () H2O (at tech.) (psi)
mbar 1 102 103 9.87 104 0.75 2.953 102 7.5 102 1.02 1.02 103 1.45 102 2.089
Pa 102 1 10 9.87 106 7.5 103 2.953 104 7.5 1.02 102 1.02 105 1.45 104 2.089 102
bar 103 0.1 1 9.87 107 7.5 104 2.953 105 7.5 101 1.02 103 1.02 106 1.45 105 2.089 103
atm 1013 1.01 105 1.01 106 1 760 29.92 7.6 105 1.03 103 1.033 14.697 2116.4
Torr 1.33 1.33 102 1.33 103 1.316 103 1 3.937 102 103 1.3595 1.36 103 1.934 102 2.7847
in Hg 33.86 33.9 102 33.9 103 3.342 102 25.4 1 2.54 104 34.53 3.453 102 0.48115 70.731
1.33 103 1.33 101 1.333 1.316 106 103 3.937 105 1 1.36 103 1.36 106 1.934 105 2.785 103
cm H2O 0.9807 98.07 980.7 9.678 104 0.7356 2.896 102 7.36 102 1 103 1.422 102 2.0483
at 9.81 102 9.81 104 9.81 105 0.968 7.36 102 28.96 7.36 105 103 1 14.22 2048.3
psi 68.95 68.95 102 68.95 103 6.804 102 51.71 2.036 51.71 103 70.31 7.03 102 1 1.44 102
lb ft2 0.4788 47.88 478.8 4.725 104 0. 3591 1.414 102 359.1 0.488 4.88 104 6.94 103 1

Normal conditions: 0 C and sea level, i.e. p = 1013 mbar = 760 mm Hg = 760 torr = 1 atm
in Hg = inches of mercury; 1 mtorr (millitorr) = 10-3 torr = 1 (micron m Hg column)
Pounds per square inch = lb in-2 = lb / sqin = psi (psig = psi gauge pressure above atmospheric, pressure gauge reading; psia = psi absolute absolute pressure)
Pounds per square foot = lb / sqft = lb / ft2; kgf/sqcm2 = kg force per square cm = kp / cm2 = at; analogously also: lbf / squin = psi
1 dyn cm-2 (cgs) = 1 bar (microbar) = 1 barye; 1 bar = 0.1 Mpa; 1 cm water column (cm water column = g / cm2 at 4 C) = 1 Ger (Geryk)
atm physical atmosphere at technical atmosphere; 100 - (x mbar / 10.13) = y % vacuum

Table II: Conversion of pressure units

147
 Tables, Formulas, Diagrams
Variable General formula For easy calculation Value for air at 20C
Most probable speed
of particles cw
cw =
2RT
M
cw = 1.29 [ ]
104
M
T cm
s
cw = 410 [m/s]

Mean velocity
of particles c
c = 8 R T
M
c = 1.46 10
4
[ ]T
M
cm
s
c = 464 [m/s]

M [s ] [s ]
2 cm2
Mean square of velocity 2 3 R T T cm 2
c= c = 2.49 10
2 8
2 c = 25.16 104 2
of particles c2 M
Gas pressure p of particles p=nkT p = 13.80 1020 n T [mbar] p = 4.04 1017 n [mbar] (applies to all gases)
1
p = n mT c2
3
1
p =  c2
3
Number density of particles n p
n = p/kT n = 7.25 1018 [cm3] p = 2.5 1016 p [cm3] (applies to all gases)
T
Area-related impingement ZA 1 p ZA = 2.85 1020 p [cm2 s1] (see Fig. 78.2)
ZA = n c ZA = 2.63 1022 p [cm2 s1]
4
M
T
ZA =
N
p
2MkT
A

Volume collision rate ZV 1 n c p2 ZV = 8.6 1022 p2 [cm3 s1] (see Fig. 78.2)
ZV = ZV = 5.27 1022 [cm3 s1]
2 c*

M T
ZA =
1
c* 2 NA
MkT
p2
Equation of state of ideal gas pV=RT p V = 83.14 T [mbar ] p V = 2.44 104 [mbar ] (for all gases)
Area-related mass flow rate qm, A
qm, A = ZA mT =
M p
2 k T NA
Qm, A = 4.377 102 MT p [g cm 2 s1] qm, A = 1.38 102 p g [cm2 s1]

c* = p in cm mbar mean free path in cm NA Avogadro constant in mol1 p gas pressure in mbar T thermodynamic temperature in K
(see Tab. III) M molar mass in g mol1 n number density of particles in cm3 R molar gas constant V volume in l
k Boltzmann constant in mbar l K1 mT particle mass in g amount of substance in mol in mbar l mol1 K1

Table IV: Compilation of important formulas pertaining to the kinetic theory of gases

Designation, Symbol Value and Remarks

alphabetically unit

Atomic mass unit mu 1.6605 1027 kg

Avogadro constant NA 6.0225 1023 mol1 Number of particles per mol,
formerly: Loschmidt number
Boltzmann constant k 1.3805 1023 J K1
mbar l
13.805 1023
K
Electron rest mass me 9.1091 1031 kg
Elementary charge e 1.6021 1019 A s
Molar gas constant R 8.314 J mol1 K1
mbar l
= 83.14 R = NA k
mol K
Molar volume of 22.414 m3 kmol1 DIN 1343; formerly: molar volume
the ideal gas Vo 22.414 l mol1 at 0 C and 1013 mbar
Standard acceleration of free fall gn 9.8066 m s2
Planck constant h 6.6256 1034 J s
W
Stefan-Boltzmann constant 5.669 108 2 4 also: unit conductance, radiation constant
m K
e As
Specific electron charge 1.7588 1011
me kg
Speed of light in vacuum c 2.9979 108 m s1
Standard reference density n kg m3 Density at = 0 C and pn = 1013 mbar
of a gas
Standard reference pressure pn 101.325 Pa = 1013 mbar DIN 1343 (Nov. 75)
Standard reference temperature Tn Tn = 273.15 K, = 0 C DIN 1343 (Nov. 75)

Table V: Important values

148
 Tables, Formulas, Diagrams
Unit l s1 m3 h1 cm3 s1 cuft min1
1 l s1 1 3.6 1000 2.12
1 m3 h1 0.2778 1 277.8 0.589
1 cm3 s1 103 3.6 103 1 2.1 103
1 cuft min1 0.4719 1.699 471.95 1
Table VI: Conversion of pumping speed (volume flow rate) units

1 = ... mbar l/s kg h1 (20C) kg h1 (0C) cm3/h (NTP) cm3/s (NTP) Torr l/s g/a (F12. 20 C) g/a (F12. 25 C) cfm lusec Pa l/s slpm
mbar l/s 1 4.28 103 4.59 103 3554 0.987 0.75 1.56 105 1.54 105 1593 7.52 102 100 59.2 103
kg h1 (20 C) 234 1 1.073 8.31 105 231 175 37.2 104 1.75 105 23.4 103 13.86
kg h1 (0 C) 218 0.932 1 7.74 105 215 163 34.6 104 1.63 105 21.8 103 12.91
cm3/h (NTP) 2.81 104 1.20 106 1.29 106 1 2.78 104 2.11 104 44 44.7 102 2.11 101 2.81 102 1.66 105
cm3/s (NTP) 1.013 4.33 103 4.65 103 3600 1 0.760 1.58 105 1611 760 101 6 102
Torr l/s 1.33 5.70 103 6.12 103 4727 1.32 1 2.08 105 2.05 105 2119 1 103 133 78.8 103
g/a (F12. 20 C) 6.39 106 2.27 102 6.31 106 4.80 106 1 10.2 103 4.8 103 6.39 104 37.9 108
g/a (F12. 25 C) 6.50 106 4.88 106 1 10.4 103 4.89 103 6.5 104 38.5 108
cfm 6.28 104 2.69 106 2.89 106 2.24 6.21 104 4.72 104 98.16 96.58 1 0.472 6.28 102 37.2 106
lusec 1.33 103 5.70 106 6.12 106 4.737 1.32 103 1 103 208 205 2.12 1 13.3 102 78.8 106
Pa l/s 1 102 4.28 105 4.59 105 35.54 9.87 103 7.5 103 1.56 103 1.54 103 15.93 7.50 1 59.2 105
slpm 16.88 72.15 103 77.45 103 60.08 103 16.67 12.69 2.64 106 2.60 106 26.9 103 12.7 103 16.9 102 1
1 cm3 (NTP) = 1 cm3 under normal conditions (T = 273.15 K; p = 1013.25 mbar) NTP = normal temperature and pressure (1 atm; 0 C) R = 83.14 mbar l mol1 K1
1 cm3 (NTP) h1 = 1 atm cm3 h1 = 1 Ncm3 h1 = 1 std cch SI coherent: 1 Pa m3 s1 = 10 mbar l s1; R = 8.314 Pa m3 mol1 K1; M in kg / mol
1 cm3 (NTP) s1 = 1 sccs = 60 cm3 (NTP) min1 60 sccm = 60 std ccm = 60 Ncm3 min1 1 lusec = 1 l s1 1 = 1 micron = 103 Torr 1 lusec = 103 Torr l s1
Freon F 12 (CCl2F2) M = 120.92 g mol1; air M = 28.96 g mol1 1 sccm = 103 slpm = 103 N l min1 = 60 sccs
Note: Anglo-American units are not abbreviated nonuniformly! Example: Standard cubic centimeter per minute sccm = sccpm = std ccm = std ccpm

Table VIIa: Conversion of throughput (QpV) units; (leak rate) units

1= ... mbar l/s cm3/s **) Torr l/s Pa m3/s g/a *) oz/yr *) lb/yr *) atm ft3/min l/s ft3/h ft3/min
mbar l/s 1 0.987 0.75 101 1.56 105 5.5 103 3.4 102 2.10 103 7.52 102 9.56 104 1593
cm3/s **) 1.013 1 0.76 1.01 101 1.58 105 5.6 103 3.44 102 2.12 103 760 96.6 103 1614
Torr l/s 1.33 1.32 1 1.33 101 2.08 105 7.3 103 4.52 102 2.79 103 103 1.27 105 2119
Pa m3/s 10 9.9 7.5 1 1.56 106 5.51 104 3.4 103 2.09 102 7.5 103 9.54 105 15.9 103
g/a *) 6.39 106 6.31 106 4.80 106 6.41 107 1 3.5 102 2.17 103 1.34 108 4.8 103 0.612 10.2 103
oz/yr *) 1.82 104 1.79 104 1.36 104 1.82 105 28.33 1 6.18 102 3.80 107 0.136 17.34 0.289
lb/yr *) 2.94 103 2.86 103 2.17 103 2.94 104 4.57 102 16 1 6.17 106 2.18 280 4.68
atm ft3/min 4.77 102 4.72 102 3.58 102 47.7 7.46 107 2.63 106 1.62 105 1 3.58 105 4.55 107 7.60 105
l/s 1.33 103 1.32 103 103 1.33 104 208 7.34 4.52 101 2.79 106 1 127 2.12
ft3/h 1.05 105 1.04 105 7.87 106 1.05 106 1.63 5.77 102 3.57 103 2.20 108 7.86 103 1 1.67 102
ft3/min 6.28 104 6.20 104 4.72 104 6.28 105 98 3.46 2.14 101 1.32 106 0.472 60 1
1 ft3 h1 = 1.04 105 stsd cc per second 1 micron cubic foot per hour = 0.0079 micron liter per second 1 kg = 2.2046 pounds (lb)
1 cm3 s1 (NTP) = 1 atm cm3 s1 = 1 scc s1 = 1 sccss 1 micron liter per second = 0.0013 std cc per second = 1 lusec 1 cubic foot (cfut. cf) = 28.3168 dm3
1 atm ft3 min1 = 1 cfm (NTP) 1 micron cubic foot per minute = 1 ft3 min1 = 1 cuft min1 = 1 cfm 1 lb = 16 ounces (oz)
1 Pa m3/s = 1 Pa m3/s (anglo-am.) = 103 Pa l/s 1 standard cc per second = 96.600 micron cubic feet per hour 1 lusec = 1 l s1
1 l s1 = 127 ft3 h1 = 0.0013 std cc per second = 1 lusec 1 std cc/sec = 760 l s1
*) F12 (20 C) C.Cl2F2 M = 120.92 h/mol **) (NTP) normal temperature and pressure 1 atm und 0 C

Table VII b: Conversion of throughput (QpV) units; (leak rate) units

149
 Tables, Formulas, Diagrams
% by weight % by volume Partial pressure mbar
N2 75.51 78.1 792
O2 23.01 20.93 212
Ar 1.29 0.93 9.47
CO2 0.04 0.03 0.31
Ne 1.2 103 1.8 103 1.9 102
He 7 105 7 105 5.3 103
CH4 2 104 2 104 2 103
Kr 3 104 1.1 104 1.1 103
N2O 6 105 5 105 5 104
H2 5 106 5 105 5 104
Xe 4 105 8.7 106 9 105
O3 9 106 7 106 7 105
100 % 100 % 1013
50 % RH at 20 C 1.6 1.15 11.7
Note: In the composition of atmospheric air the relative humidity (RH) is indicated separately along with the temperature.
At the given relative humidity, therefore, the air pressure read on the barometer is 1024 mbar.

Table VIII: Composition of atmospheric air

Rough vacuum Medium vacuum High vacuum Ultrahigh vacuum

Pressure p [mbar] 1013 1 1 103 103 107 < 107

Particle number density n [cm3] 1019 1016 1016 1013 1013 109 < 109
Mean free path [cm] < 102 102 10 10 105 > 105
Impingement rate Za [cm2 s1] 1023 1020 1020 1017 1017 1013 < 1013
Vol.-related collision rate ZV [cm3 s1] 1029 1023 1023 1017 1017 109 < 109
Monolayer time [s] < 105 105 102 102 100 > 100
Type of gas flow Viscous flow Knudsen flow Molecular flow Molecular flow

Other special features Convection dependent Significant change in Significant reduction- Particles on the
on pressure thermal conductivity in volume surfaces dominate
of a gas related collision rate to a great extend in
relation to particles in
gaseous space

Table IX: Pressure ranges used in vacuum technology and their characteristics (numbers rounded off to whole power of ten)

At room temperature
Standard values1 Metals Nonmetals
(mbar l s1 cm2) 109 ... 107 107 ... 105
Outgassing rates (standard values) as a function of time
Examples: 1/2 hr. 1 hr. 3 hr. 5 hr. Examples: 1/2 hr. 1 hr. 3 hr. 5 hr.
Ag 1.5 108 1.1 108 2 109 Silicone 1.5 105 8 106 3.5 106 1.5 106
Al 2 10 8 6 109 NBR 4 106 3 106 1.5 106 1 106
Cu 4 10 8 2 108 6 109 3.5 109 Acrylic glass 1.5 106 1.2 106 8 107 5 107
Stainless steel 9 108 3.5 108 2.5 108 FPM, FKM 7 107 4 107 2 107 1.5 107
1 All values depend largely on pretreatment!

Table X: Outgassing rate of materials in mbar l s1 cm2

150
 Tables, Formulas, Diagrams
Nominal width (DN) Internal diam. (mm)
Series R5 R10
10 10
16 16
20 21
25 24
32 34
40 41
50 51
63 70
80 83
100 102
125 127
160 153
200 213
250 261
320 318
400 400
500 501
630 651
800 800
1000 1000

1 The nominal internal diameters correspond approximately to the inter-

nal diameters of the pipeline components (DIN 2402 - Feb. 1976). The
left-hand column of the nominal internal diameter series is preferred in
practice.

Table XI: Nominal internal diameters (DN) and internal diameters of tubes, pipes and apertures
with circular cross-section (according to PNEUROP).

Solvent Relative Density Melting Boiling Maximum admissible

molecular g / cm3 point point concentration (MAC)
mass (20 C) C C cm3 / m3

Acetone 58 0.798 56
Benzene (solution) 78 0.8788 5.49 80.2 25
Petrol (light) 0.68 ... 0.72 > 100
Carbon tetrachloride 153.8 1.592 22.9 76.7 25
Chloroform 119.4 1.48 63.5 61 50
Diethyl ether 46 0.7967 114.5 78 1000
Ethyl alcohol 74 0.713 116.4 34.6 400
Hexane 86 0.66 93.5 71 500
Isopropanol 60.1 0.785 89.5 82.4 400
Methanol 32 0.795 97.9 64.7 200 (toxic!)
Methylene chloride 85 1.328 41
Nitromethane 61 1.138 29.2 101.75 100
Petroleum ether mixture 0.64 40 ... 60
Trichlorethylene (Tri) 131.4 1.47 55
Water 18.02 0.998 0.00 100.0

Table XII: Important data (characteristic figures) for common solvents

151
Tables, Formulas, Diagrams
t ps D t ps D t ps D t ps D
C mbar g/m3 C mbar g/m3 C mbar g/m3 C mbar g/m3
100 1.403 105 1.756 105 35 0.2233 0.2032 30 42.43 30.38 95 845.3 504.5
99 1.719 2.139 34 0.2488 0.2254 31 44.93 32.07 96 876.9 522.1
98 2.101 2.599 33 0.2769 0.2498 32 47.55 33.83 97 909.4 540.3
97 2.561 3.150 32 0.3079 0.2767 33 50.31 35.68 98 943.0 558.9
96 3.117 3.812 31 0.3421 0.3061 34 53.20 37.61 99 977.6 578.1
95 3.784 105 4.602 105 30 0.3798 0.3385 35 56.24 39.63 100 1013.2 597.8
94 4.584 5.544 29 0.4213 0.3739 36 59.42 41.75 101 1050 618.0
93 5.542 6.665 28 0.4669 0.4127 37 62.76 43.96 102 1088 638.8
92 6.685 7.996 27 0.5170 0.4551 38 66.26 46.26 103 1127 660.2
91 8.049 9.574 26 0.5720 0.5015 39 69.93 48.67 104 1167 682.2
90 9.672 105 11.44 105 25 0.6323 0.5521 40 73.78 51.19 105 1208 704.7
89 11.60 13.65 24 0.6985 0.6075 41 77.80 53.82 106 1250 727.8
88 13.88 16.24 23 0.7709 0.6678 42 82.02 56.56 107 1294 751.6
87 16.58 19.30 22 0.8502 0.7336 43 86.42 59.41 108 1339 776.0
86 19.77 22.89 21 0.9370 0.8053 44 91.03 62.39 109 1385 801.0
85 23.53 105 27.10 105 20 1.032 0.8835 45 95.86 65.50 110 1433 826.7
84 27.96 32.03 19 1.135 0.9678 46 100.9 68.73 111 1481 853.0
83 33.16 37.78 18 1.248 1.060 47 106.2 72.10 112 1532 880.0
82 39.25 44.49 17 1.371 1.160 48 111.7 75.61 113 1583 907.7
81 46.38 52.30 16 1.506 1.269 49 117.4 79.26 114 1636 936.1
80 0.5473 103 0.6138 103 15 1.652 1.387 50 123.4 83.06 115 1691 965.2
79 0.6444 0.7191 14 1.811 1.515 51 129.7 87.01 116 1746 995.0
78 0.7577 0.8413 13 1.984 1.653 52 136.2 91.12 117 1804 1026
77 0.8894 0.9824 12 2.172 1.803 53 143.0 95.39 118 1863 1057
76 1.042 1.145 11 2.376 1.964 54 150.1 99.83 119 1923 1089
75 1.220 103 1.334 103 10 2.597 2.139 55 157.5 104.4 120 1985 1122
74 1.425 1.550 9 2.837 2.328 56 165.2 109.2 121 2049 1156
73 1.662 1.799 8 3.097 2.532 57 173.2 114.2 122 2114 1190
72 1.936 2.085 7 3.379 2.752 58 181.5 119.4 123 2182 1225
71 2.252 2.414 6 3.685 2.990 59 190.2 124.7 124 2250 1262
70 2.615 103 2.789 103 5 4.015 3.246 60 199.2 130.2 125 2321 1299
69 3.032 3.218 4 4.372 3.521 61 208.6 135.9 126 2393 1337
68 3.511 3.708 3 4.757 3.817 62 218.4 141.9 127 2467 1375
67 4.060 4.267 2 5.173 4.136 63 228.5 148.1 128 2543 1415
66 4.688 4.903 1 5.623 4.479 64 293.1 154.5 129 2621 1456
65 5.406 103 5.627 103 0 6.108 4.847 65 250.1 161.2 130 2701 1497
64 6.225 6.449 1 6.566 5.192 66 261.5 168.1 131 2783 1540
63 7.159 7.381 2 7.055 5.559 67 273.3 175.2 132 2867 1583
62 8.223 8.438 3 7.575 5.947 68 285.6 182.6 133 2953 1627
61 9.432 9.633 4 8.129 6.360 69 298.4 190.2 134 3041 1673
60 10.80 103 10.98 103 5 8.719 6.797 70 311.6 198.1 135 3131 1719
59 12.36 12.51 6 9.347 7.260 71 325.3 206.3 136 3223 1767
58 14.13 14.23 7 10.01 7.750 72 339.6 214.7 137 3317 1815
57 16.12 16.16 8 10.72 8.270 73 354.3 223.5 138 3414 1865
56 18.38 18.34 9 11.47 8.819 74 369.6 232.5 139 3512 1915
55 20.92 103 20.78 103 10 12.27 9.399 75 385.5 241.8 140 3614 1967
54 23.80 23.53 11 13.12 10.01 76 401.9 251.5
53 27.03 26.60 12 14.02 10.66 77 418.9 261.4
52 30.67 30.05 13 14.97 11.35 78 436.5 271.7
51 34.76 33.90 14 15.98 12.07 79 454.7 282.3
50 39.35 103 38.21 103 15 17.04 12.83 80 473.6 293.3
49 44.49 43.01 16 18.17 13.63 81 493.1 304.6
48 50.26 48.37 17 19.37 14.48 82 513.3 316.3
47 56.71 54.33 18 20.63 15.37 83 534.2 328.3
46 63.93 60.98 19 21.96 16.31 84 555.7 340.7
45 71.98 103 68.36 103 20 23.37 17.30 85 578.0 353.5
44 80.97 76.56 21 24.86 18.34 86 601.0 366.6
43 90.98 85.65 22 26.43 19.43 87 624.9 380.2
42 102.1 95.70 23 28.09 20.58 88 649.5 394.2
41 114.5 103 106.9 103 24 29.83 21.78 89 674.9 408.6
40 0.1283 0.1192 25 31.67 23.05 90 701.1 423.5
39 0.1436 0.1329 26 33.61 24.38 91 728.2 438.8
38 0.1606 0.1480 27 35.65 25.78 92 756.1 454.5
37 0.1794 0.1646 28 37.80 27.24 93 784.9 470.7
36 0.2002 0.1829 29 40.06 28.78 94 814.6 487.4
1 Sources: Smithsonian Meteorological Tables 6th. ed. (1971) and VDI vapor tables 6th ed (1963).
Table XIII: Saturation pressure ps and vapor density D of water in a temperature range from 100C to +140C1

152
 Tables, Formulas, Diagrams
Group A3) Group B3) Group C3)

Methane c Ethylene c Hydrogen c

Ethane c Buta-1,3-diene c Acetylene (ethyne) c

Propane c Acrylonitrile c Carbon bisulfide c

Butane c hydrogen cyanide a

Pentane c Dethyl ether (s) c

Hexane c Ethylene oxide (oxiran) c

Heptane c 1.4 Dioxan a

Octane a Tetrahydrofuran a

Cyclohexane c Tetrafluoroethylene a

Propylene (propene) a

Styrene (s) b

Benzene (s) c

Toluene (s)

Xylene a Legend Group A Group B Group C

Naphthalene MESG1 > 0.9 mm 0.5 ... 0.9 mm < 0.5 mm

Methanol (s) c MIC2 ratio > 0.8 mm 0.45 ... 0.8 mm < 0.45 mm
Ethanol (s) c
1 Minimum Electrical Spark Gap
Propyl alcohol (propanol) c 2 Minimum Ignition Current
The ratio is based on the MIC value for laboratory methane
Butyl alcohol (butanol) a 3 Group allocation:
Phenol a according to MESG value
b according to MIC ratio
Acetaldehyde (ethanal) a c according to both MESG value and MIC ratio
(s) solvent
Acetone (s) (propanone) c

Methyl ethyl ketone (s) (propan-2-one) c

Ethyl acetate (s) a

Butyl acetate (s) c

Amyl acetate (s)

Ethyl methacrylate

Acetic acid (ethanoic acid) b

Methyl chloride (s) a

Methylene chloride (s) (dichlormethane)

Ammonia a

acetonitrile a

Aniline

Pyridine

Table XIV: Hazard classification of fluids according to their MESG1 and/or MIC2 values.
(Extract from European Standard EN 50.014)

153
 Tables, Formulas, Diagrams

Nitrile-butadiene rubber (NBR) Perbunan

Nitrile-butadiene rubber (NBR) Perbunan

Chloroprene rubber (CR) Neoprene

Chloroprene rubber (CR) Neoprene

Fluoro rubber (FPM, FKM) Viton

Fluoro rubber (FPM, FKM) Viton

Medium Medium

x = resistant x = resistant
= conditionally resistant = conditionally resistant

Silicone rubber

Silicone rubber
o = not resistant o = not resistant

Teflon (PTFE)

Teflon (PTFE)
EPDM

EPDM
Acetaldehyde o o o o x x Carbon dioxide, dry x x x x x
Acetic acid (crystalline), pure o o x Carbon dioxide, wet x x x x
Acetic acid, industrial x x Carbon tetrachloride o o o x x o
Acetic acid vapors x x x Chloracetic acid o o o x x
Acetic acid, 20 % x x x Chlorinated solvents o x

Acetic acid, 50 % o x x x Clorine, dry x x

Acetic acid, 80 % o o x Chlorine water x o x x
Acetic anhydride x x x Chlorine, wet o o x x x
Aceto-acetic ester o x Chlorobromomethane o x
Acetone o o x x Chlorobenzene o o o x o

Acetophenone o x x Chloroform o o x x o
Acetylene x x x Chloromethyl o x x o
Acrylnitrile o x Citrus oils o o x
Air, clean x x x x x x Coke furnace gas o o x o
Air, oily x x x x x o Copra oil acid o x

Ammonia liquid x x x x Cottonseed oil x x x

Ammonia gas x x o x Cresol x x o
Amyl acetate o o o x x Crude petroleum x x o
Amyl alcohol o o x x Cyclohexane x x x o
Aniline o o x x x Cyclohexanone o o o x o

Anthracene oil o o x x Cyclohexylamine x o

ASTM oil No. 1 x x x x x o Decahydronaphtalene x x o
ASTM oil No. 2 x x x x x o Desmodur T o o x o
ASTM oil No. 3 o x o Desmophene 2000 x x
Benzaldehyde 100 % x x Dibutylphthalate o o x o x x

Benzene o o x x o Dichlorethylene x
Benzene bromide o o x o Dichlorethane x x x o
Benzoic acid x x Diethylamine o x x
Bitumen x Diethylene glycol x x x x
Blast furnace gas x x x x Diethyl ether o o x o

Boron trifluoride x x x Diethyl ether o o x

Bromine o o x x Diethyl sebazate o o x
Butadiene x o Dichlorbenzene o o x o
Butane x x x o Dichlorbutylene x x o
Butyl acetate o o o x Diesel oil o x x o

Butyl alcohol x o x x Di-isopropyl ketone o x x

Butyl glykol x x x Dimethyl ether o x x
Butyraldehyde o o x x Dimethylaniline o o x
Carbolineum o o x x x o Dimethyl formamide o o o x
Carbon bisulfide o o x x o Dioctylphthalate o o x x

Table XV: Chemical resistance of commonly used elastomer gaskets and sealing materials

154
 Tables, Formulas, Diagrams

Nitrile-butadiene rubber (NBR) Perbunan

Nitrile-butadiene rubber (NBR) Perbunan

Chloroprene rubber (CR) Neoprene

Chloroprene rubber (CR) Neoprene

Fluoro rubber (FPM, FKM) Viton

Fluoro rubber (FPM, FKM) Viton

Medium Medium

x = resistant x = resistant
= conditionally resistant = conditionally resistant

Silicone rubber

Silicone rubber
o = not resistant o = not resistant

Teflon (PTFE)

Teflon (PTFE)
EPDM

EPDM
Dioxan o o x Heating fuel oil (coal base) o o x x
Diphenyl o o x x o Heating fuel oil (petroleum crude base) x x x o
Diphenyloxyd o x x Heptane x o x x o
Edenol 888 x x Hexaldehyde o o x x
Essential oils o o x o Hexane x o x x o

Ethyl acetate (acetic ether) o o x x Hydraulic fluids

Ethane x o x x o Hydraulic oils DIN 51524 x x x o
Ethyl acetate o o o o x o Phosphoric ester HFD o o o x
Ethyl acrylate o x Polyglycol water HFC x x x x x
Ethyl alcohol, denatured x Hydrobromic acid o o x x

Ethyl alcohol, pure x x Hydrobromic crystalline acid x x

Ethyl cloride x o x Hydrocyanic acid x x
Ethylene bromide o o x Hydrogen bromide x
Ethylene chloride x Hydrogen gas 20 x x x
Ethylene dichloride o o x Hydrogen sulfide x x x x

Ethylene glycol x x o x x x Isobutyl alcohol x x x

Ethyl ether o o o x Isopropyl acetate o o x
Ethyl silicate x x x Isopropyl alcohol x x x
Ethyl acrylate x Isopropyl chloride o o x o
Fatty acids x Isopropyl ether o x

Fatty alcohol x x x x Kerosene x x

Fir leaf oil x o x Kerosine x x x o
Fluorbenzene x o x o Lighting gas x x o
Hydrofluoric acid, cold, 5 % x x x Maleic anhydride x
Hydrofluoric acid, cold, pure x Mercury x x x x

Formaldehyde x x x x Methane x x
Formalin, 55 % x x x x Methane (pit gas) x x x x
Formic acid x Methylene chloride o o o x o
Formic acid methyl ester o x Methyl acrylate o x o
Freon 11 x x o x Methyl alcohol (methanol) x o x x

Freon 12 x x x Methyl ethyl ketone o o o x

Freon 22 o x o x x Methyl isobutyl ketone o o x
Freon 113 x x x x Methyl methacrylate o o o x o
Furane o o x o Methyl salicylate o o x
Furfurol o o o o x Naphtalene o o x o

Gas oill x x x o Natural gas x x x

Generator gas x x x Nitrobenzene o o o x o
Glycerine x x x x x x Nitrous oxide x x x
Glycol x x x x x x Oleic acid x x x o
Halowax oil o o x Orange oil o o x x

Table XV: Chemical resistance of commonly used elastomer gaskets and sealing materials

155
Tables, Formulas, Diagrams

Nitrile-butadiene rubber (NBR) Perbunan

Nitrile-butadiene rubber (NBR) Perbunan

Chloroprene rubber (CR) Neoprene

Chloroprene rubber (CR) Neoprene

Fluoro rubber (FPM, FKM) Viton

Fluoro rubber (FPM, FKM) Viton

Medium Medium

x = resistant x = resistant
= conditionally resistant = conditionally resistant

Silicone rubber

Silicone rubber
o = not resistant o = not resistant

Teflon (PTFE)

Teflon (PTFE)
EPDM

EPDM
Oxygen x x x x Tar oil o x o
Ozone o x x x x Tetrachlorethylene x x o
Palmitic acid x x x o Tetrahydrofurane o o x o
Palm oil acid o x x Tetraline o o o x o
Paraffin x x x x o Toluene o o o x x o

Paraffin oil x x x o Transformer oil x x x x o

Pentachlordiphenyl o x x o Train oil o x x
Pentane x x o x x o Triethanolamine o o x
Perchloroethylene o o x x o Tributoxyethyl phosphate o o x o
Petrol x o x o Tributyl phosphate o o o x o

Petrol alcohol 3:1 o x x Trichloroethane o o x x

Petrol benzene 4:1 x o o x x o Trichloroethylene o o x x o
Petrol benzene 7:3 o o o x x o Trichloroethyl phosphate 20 x x
Petrol benzene 3:2 o o o x x o Trichloroethyl phosphate 80 o x x
Petrol benzene 1:1 o o o x x o Trichloracetic acid 60 x x

Petrol benzene 3:7 o o o x x Tricresyl phosphate o x x x

Petrol benzene spirit 5:3:2 o o o x o Turpentine x x o
Phenol o o x x x o Turpentine oil, pure x x x o
Phenyl ethyl ether o o x o Vinyl acetate o o x
Phenylic acid (phenol) o o x Vinylaceto-acetic acid 3:2 o o o x

Phosphorous chloride o x x Vinyl chloride, liquid x x x

Phthalic anhydride x x x x Water 50 x x x x x
Piperidine o o x Water 100 x x x x
Polyglycol x x Wood oil x
Propane, gas x x x x x Xylamon o o x x o

Propylene oxyde o x Xylene o o o x x o

Propyl alcohol x x x x
Pydraul F-9 o o x x x
Pydraul AC o x x x
Pydraul A 150 o x x

Pydraul A 200 o x x x
Pyridine o x
Salicylic acid x x x x
Skydrol 500 x o x x
Skydrol 7000 x x x

Stearic acid x x
Styrene o o x x o
Sulfur x x x x x
Sulfur dioxide o o x x x
Sulfur trioxide, dry o x x

Table XV: Chemical resistance of commonly used elastomer gaskets and sealing materials

156
 Tables, Formulas, Diagrams
Vacuum symbols

All symbols wit the exception of those marked with**) do not depend on the
position.

**) These symbols may only be used in the position shown here (tip of the
angle pointing down)

The symbols for vacuum pumps should always be arranged such that the
side with the constriction is allocated to the higher pressure

Vacuum pumps
Vacuum pump, general Ejector vacuum pump **

Piston vacuum pump Diffusion pump **

Diaphragm vacuum pump Adsorption pump **

Rotary positive displacement pump ** Getter pump

Rotary plunger vacuum pump ** Sputter-ion pump

Sliding vane rotary vacuum pump ** Cryopump

Rotary piston vacuum pump ** Scroll pump **

Liquid ring vacuum pump ** Evaporation pump

Roots vacuum pump **

Turbine vacuum pump, general Accessories

Radial flow vacuum pump Condensate trap, general

Axial flow vacuum pump Condensate trap with heat exchanger (e.g. cooled)

Turbomolecular pump Gas filter, general

Table XVI: Symbols used in vacuum technology (extract from DIN 28401)

157
Tables, Formulas, Diagrams
Filtering apparatus, general Right-angle stop cock

Baffle, general Gate valve

Cooled baffle Butterfly valve

Cold trap, general Nonreturn valve

Cold trap with coolant reservoir Safety shut-off valve

Sorption trap

Throttling
Modes of operation

Manual operation

Vacuum chambers Variable leak valve

Vacuum chamber Electromagnetic operation

Vacuum bell jar Hydraulic or pneumatic operation

Electric motor drive

Shut-off devices Weight-operated

Shut-off device, general

Shut-off valve, straight-through valve Connections and piping

Right-angle valve Flange connection, general

Stop cock Bolted flange connection

Three-way stop cock Small flange connection

Table XVI: Symbols used in vacuum technology (extract from DIN 28401) (continuation)

158
 Tables, Formulas, Diagrams
Clamped flange connection Measurement and gauges
Threaded tube connection
General symbol for vacuum **)

Ball-and-socket joint
Vacuum measurement, vacuum gauge head **)

Spigot-and-socket joint Vacuum gauge, operating and display unit for vacuum
gauge head **)

Taper ground joint connection

Vacuum gauge, recording **)

Intersection of two lines with connection

Vacuum gauge with analog measured-value display **)

Intersection of two lines without connection

Vacuum gauge with digital measured-value display **)

Branch-off point
Measurement of throughput

Combination of ducts

Flexible connection (e.g. bellows, flexible tubing)

Linear-motion leadthrough, flange-mounted

Linear-motion leadthrough, without flange

Leadthrough for transmission of rotary and linear motion

Rotary transmission leadthrough

Electric current leadthrough

Table XVI: Symbols used in vacuum technology (extract from DIN 28401) (continuation)

159
 Tables, Formulas, Diagrams
Kelvin Celsius Raumur Fahrenheit Rankine
Boiling point H2O 373 100 80 212 672
Body temperature 37C 310 37 30 99 559
Room temperature 293 20 16 68 527
Freezing point H2O 273 0 0 32 492
NaCl/H2O 50:50 255 18 14 0 460
Freezing point Hg 34 39 31 39 422
CO2 (dry ice) 195 78 63 109 352
Boiling point LN2 77 196 157 321 170
Absolute zero point 0 273 219 460 0

Conversion in
K C R F R
Kelvin Celsius Raumur Fahrenheit Rankine
K 4 9 9
1 K 273 (K 273) (K 273) + 32 K = 1,8 K
Kelvin 5 5 5

C 4 9 9
C + 273 1 C C + 32 (C + 273)
Celsius 5 5 5

C
Raumur
5
4
R + 273
5
4
R 1
9
4
R + 32
5
9 [ 54 (R + 273) ]
F 5 (F 32) + 273 5 (F 32) 4 (F 32) 1 F + 460
Fahrenheit 9 9 9

R
Rankine
5 (R)
9
5 (R 273)
9
4
5 [ 59 (R 273) ] R 460 1

Table XVII: Temperature comparison and conversion table (rounded off to whole degrees)

p2
Mean free path [cm]

2
Z

p
ZA

~ 1
p

Pressure p [mbar]
Pressure p [mbar]
: mean free path in cm ( ~ 1/p)
n : particle number density in cm3 (n ~ p)
ZA : area-related impingement rate in cm3 s1 (ZA ~ p2)
ZV : volume-related collision rate in cm3 s1 (ZV ~ p2)

Fig. 9.1: Variation of mean free path (cm) with pressure for various gases Fig. 9.2: Diagram of kinetics of gases for air at 20 C

160
 Tables, Formulas, Diagrams
106

105
Pressure [mbar]

104

Temperature (K)

conductance [l cm1]
103

102

1018
Altitude [km] 6
4

2
Fig. 9.3: Decrease in air pressure (1) and change in temperature (2) as a function of altitude
100 2 4 6 8102
101 103 104
Pipe length l [cm]

Fig. 9.5: Conductance values for piping of commonly used nominal width with circular cross-
section for laminar flow (p = 1 mbar) according to equation 53a. (Thick lines refer to
preferred DN) Flow medium: air (d, l in cm!)
Altitude (km)

conductance [l s1]

Molecules/atoms [cm3] Pipe length l [cm]

Fig. 9.4: Change in gas composition of the atmosphere as a function of altitude Fig. 9.6: Conductance values for piping of commonly used nominal width with circular cross-section
for molecular flow according to equation 53b. (Thick lines refer to preferred DN) Flow medi-
um: air (d, l in cm!)

161
 Tables, Formulas, Diagrams

pSTART pend, P
R=
pEND pend, P pEND pend, p
mbar

pSTART < 1013 mbar

pSTART = 1013 mbar

Column : Vessel volume V in liters Example 1 with regard to nomogram 9.7: Example 2 with regard to nomogram 9.7:
Column : Maximum effective pumping speed Seff,max at the
vessel in (left) liters per second or (right) cubic A vessel with the volume V = 2000 l is to be pumped down A clean and dry vacuum system (qpV,in = 0) with V = 2000 l (as
meters per hour. from a pressure of pSTART = 1000 mbar (atmospheric pres- in example 1) is to be pumped down to a pressure of
sure) to a pressure of pEND = 10-2 mbar by means of a rotary pEND = 10-2 mbar. Since this pressure is smaller than the ulti-
Column : Pump-down time tp in (top right) seconds or (cen- plunger pump with an effective pumping speed at the vessel of mate pressure of the rotary piston pump (Seff,max = 60 m3/h =
ter left) minutes or (bottom right) hours. Seff,max = 60 m3/h = 16.7 l s-1. The pump-down time can be 16.7 l ( s-1 = 3 10-2 mbar), a Roots pump must be used in
Column : Right: obtained from the nomogram in two steps: connection with a rotary piston pump. The former has a start-
Pressure pEND in millibar at the END of the pump- ing pressure of p1 = 20 mbar, a pumping speed of
down time if the atmospheric pressure 1) Determination of : A straight line is drawn through Seff,max = 200 m3/h 55 l s-1 as well as pult,p 4 10-3 mbar.
pSTART ( pn = 1013 prevailed at the START of the V = 2000 l (column ) and Seff = 60 m3/h-1 = 16.7 l s-1 (col- From pstart = 1000 mbar to p = 20 mbar one works with the
pump-down time. The desired pressure pEND is to umn ) and the value t = 120 s = 2 min is read off at the rotary piston pump and then connects the Roots pump from
be reduced by the ultimate pressure of the pump intersection of these straight lines with column (note that p1 = 20 mbar to pEND = 10-2 mbar, where the rotary piston
pult,p and the differential value is to be used in the the uncertainty of this procedure is around = 10 s so pump acts as a backing pump. For the first pumping step one
columns. If there is inflow qpV,in, the value that the relative uncertainty is about 10 %). obtains the time constant = 120 s = 2 min from the nomo-
pend pult,p qpV,in / Seff,max is to be used in the gram as in example 1 (straight line through V = 2000 l, Seff =
columns. 2) Determination of tp: The ultimate pressure of the rotary 16.7 l s-1). If this point in column is connected with the
pump is pult,p = 3 10-2 mbar, the apparatus is clean and leak- point p1 - pult,p = 20 mbar 3 10-2 mbar = 20 mbar (pult,p is
Left:
age negligible (set qpV,in = 0); this is pSTART pult,p = ignored here, i.e. the rotary piston pump has a constant pump-
Pressure reduction ratio R = (pSTART pult,p
10-1 mbar 3 10-2 mbar = 7 10-2 mbar. Now a straight line ing speed over the entire range from 1000 mbar to 20 mbar) in
qpV,in / Seff,max)/(pend pult,p qpV,in / Seff,max), if
is drawn through the point found under 1) = 120 s (column column 5, one obtains tp,1 = 7.7 min. The Roots pump must
the pressure pSTART prevails at the beginning of
) and the point pEND pult,p = 7 10-2 mbar (column ) reduce the pressure from p1 = 20 mbar to
the pumping operation and the pressure is to be
and the intersection of these straight lines with column pEND = 10-2 mbar, i.e. the pressure reduction ratio
lowered to pEND by pumping down.
tp = 1100 s = 18.5 min is read off. (Again the relative uncer- R = (20 mbar 4 10-3 mbar) / (10-2 mbar-4 10-3) =
The pressure dependence of the pumping speed tainty of the procedure is around 10 % so that the relative 20/6 10-3 mbar = 3300.
is taken into account in the nomogram and is uncertainty of tp is about 15 %.) Taking into account an addi-
expressed in column by pult,p. If the pump tional safety factor of 20 %, one can assume a pump-down The time constant is obtained (straight line V = 2000 l in col-
pressure pult,p is small in relation to the pressure time of umn , Seff = 55 l s1 in column ) at = 37 s (in column
pend which is desired at the end of the pump- tp = 18.5 min (1 + 15 % + 20 %) = 18.5 min 1.35 = 25 min. ). If this point in column is connected to R = 3300 in col-
down operation, this corresponds to a constant umn , then one obtains in column tp, 2 = 290 s =
pumping speed S or Seff during the entire pump- 4.8 min. If one takes into account tu = 1 minfor the changeover
ing process. time, this results in a pump-down time of tp = tp1 + tu + tp2 =
7.7 min + 1 min + 4.8 min = 13.5 min.

Fig. 9.7: Nomogram for determination of pump-down time tp of a vessel in the rough vacuum pressure range

162
 Tables, Formulas, Diagrams

Conductance for molecular flow

Correction factor for short tubes
Tube length

Tube diameter

Example: What diameter d must a 1.5-m-long pipe have so ple d/l = 0.16 and = 0.83 (intersection point of the straight
that it has a conductance of about C = 1000 l / sec in the line with the a scale). Hence, the effective conductance of the
region of molecular flow? The points l = 1.5 m and pipeline is reduced to
C = 1000 l/sec are joined by a straight line which is extended C = 1000 0.83 = 830 l/sec. If d is increased to 25 cm,
to intersect the scale for the diameter d. The value d = 24 cm one obtains a conductance of 1200 0.82 = 985 l / sec
is obtained. The input conductance of the tube, which depends (dashed straight line).
on the ratio d / l and must not be neglected in the case of
short tubes, is taken into account by means of a correction
factor . For d / l < 0.1, can be set equal to 1. In our exam-

Fig. 9.8: Nomogram for determination of the conductance of tubes with a circular cross-section for air at 20 C in the region of molecular flow (according to J. DELAFOSSE and G. MONGODIN: Les cal-
culs de la Technique du Vide, special issue Le Vide, 1961).

163
 Tables, Formulas, Diagrams
Air 20 C
C

Tube internal diameter [cm]

Correction factor for higher pressures
Pressure [mbar]

Pressure [mbar]
Tube length [meters]

conductance [ l s1]
Laminar flow

Uncorrected conductance for mol. flow [m3 h1]

Clausing factor
Knudsen flow
Mol. flow

Procedure: For a given length (l) and internal diameter (d), Example: A tube with a length of 1 m and an internal diameter In a tube with a length of 1 m and an internal diameter of 5 cm
the conductance Cm, which is independent of pressure, must of 5 cm has an (uncorrected) conductance C of around 17 l/s a molecular flow prevails if the mean pressure p in the tube is
be determined in the molecular flow region. To find the con- in the molecular flow region, as determined using the appropri- < 2.7 10-3 mbar.
ductance C* in the laminar flow or Knudsen flow region with a ate connecting lines between the l scale and the d scale. To determine the conductance C* at higher pressures than
given mean pressure of p in the tube, the conductance value The conductance C found in this manner must be multiplied by 2.7 10-3 mbar, at 8 10-2 mbar (= 6 10-2 torr), for example,
previously calculated for Cm has to be multiplied by the cor- the clausing factor = 0.963 (intersection of connecting line the corresponding point on the p scale is connected with the
rection factor a determined in the nomogram: C* = Cm . with the scale) to obtain the true conductance Cm in the mol- point d = 5 cm on the d scale. This connecting line intersects
ecular flow region: the scale at the point = 5.5. The conductance C* at
Cm = 17 0.963 = 16.37 l/s. p = 8 10-2 mbar is: C* = Cm = 16.37 5.5 = 90 l/s.

Fig. 9.9: Nomogram for determination of conductance of tubes (air, 20 C) in the entire pressure range.

164
 Tables, Formulas, Diagrams

[m3 h1] Pumping speed

Volume V [min3]
Pump-down time t [min]

Example 2

ple 1
Exam
Gas evolution [mbar l s1 m2]

weak

normal

strong

Area F [m2]

The nomogram indicates the relationship between the nominal connected via a vertical line to the curve that is based on the 8 10-5 mbar l s-1 m-2 is to be evacuated from 10 mbar to
pumping speed of the pump, the chamber volume, size and pumping speed of the pump of 1300 m3/h (D). If the projection 10-3 mbar within a time of 10 min. The nomogram shows that
nature of the inner surface as well as the time required to to the curve is within the marked curve area (F), the pumping in this case a pump with a nominal pumping speed of
reduce the pressure from 10 mbar to 10-3 mbar. speed of the pump is adequate for gas evolution. The relevant 150 m3/h is appropriate.
pump-down time (reduction of pressure from 10 mbar to
Example 1: A given chamber has a volume of 70 m3 and an 10-3 mbar) is then given as 30 min on the basis of the line
inner surface area of 100 m2; a substantial gas evolution of connecting the point 1300 m3/h on the pumping speed scale
2 10-3 mbar l s-1 m-2 is assumed. The first question is to to the point 70 m3 (C) on the volume scale: the extension
decide whether a pump with a nominal pumping speed of results in the intersection point at 30 min (E) on the time scale.
1300 m3/h is generally suitable in this case. The coordinates
for the surface area concerned of 100 m2 and a gas evolution In example 2 one has to determine what pumping speed the
of 2 10-3 mbar l s-1 m-2 result in an intersection point A, pump must have if the vessel (volume = approx. 3 m3) with a
which is joined to point B by an upward sloping line and then surface area of 16 m2 and a low gas evolution of

Fig. 9.10: Determination of pump-down time in the medium vacuum range taking into account the outgasing from the walls

165
 Tables, Formulas, Diagrams
1000
1,00E+03

Mercury
100
1,00E+02

Halocarbon 11
10
1,00E+01

Halocarbon 12
Vapor pressure [mbar]

Halocarbon 13 1,00E+00 1
Santovac 5
(similar to Ultralen)
Halocarbon 22 10-1
1,00E-01
Aziepon 201

Vapor pressure (mbar)

10-2
1,00E-02

Trichorethylene
10-3
Acetone 1,00E-03
DC 704 Diffelen ultr a

10-4
1,00E-04

10-5
1,00E-05

1,00E-06 -6
10 DC 705

1,00E-07-7
10
Diffelen
light
Temperature [C] 1,00E-08-8
10
Diffelen
normal
1,00E-09-9
10
Fig. 9.11: Saturation vapor pressure of various substances
10 -10
1,00E-10

10-11
1,00E-11

10-12
1,00E-12

0 25 50 75 100 150 200 250

Temperature (C)

Fig. 9.12: Saturation vapor pressure of pump fluids for oil and mercury fluid entrainment pumps
Temperature [C]
Temperature [K]

Vapor pressure

Fig. 9.13: Saturation vapor pressure of major metals used in vacuum technology

166
 Tables, Formulas, Diagrams
Vapor pressure [mbar]

critical point
melting point

Temperature [C]

1 NBR (Perbunan) 2 Silicone rubber 3 Teflon

Fig. 9.14: Vapor pressure of nonmetallic sealing materials (the vapor pressure curve for fluoro Fig. 9.15: Saturation vapor pressure ps of various substances relevant for cryogenic technology in
rubber lies between the curves for silicone rubber and Teflon). a temperaturerange of T = 2 80 K.

Ultrahigh vacuum High vacuum Medium vacuum Rough vacuum

<107 mbar 107 to 103 mbar 103 to 1 mbar 1 to approx. 103 mbar
<105 Pa 105 to 101 Pa 101 to 102 Pa 102 to approx. 105 Pa

Piston vacuum pump

Diaphragm vacuum pump

Liquid-ring vacuum pump

Sliding-vane rotary vacuum pump

Multiple-vane rotary vacuum pump

Trochoide vacuum pump

Rotary plunger vacuum pump

Roots vacuum pump

Turbine vacuum pump

Gaseous-ring vacuum pump

Turbomolecular pump

Liquid jet vacuum pump

Vapor jet vacuum pump

Diffusion pump

Diffusion ejector pump

Adsorption pump

submilation pump

Sputter-ion pump

Cryopump

1014 1013 1012 1011 1010 109 108 107 106 105 104 103 102 101 100 101 102 103
p in mbar
Working range for special model or special operating data Normal working range

Fig. 9.16: Common working ranges of vacuum pumps

167
 Tables, Formulas, Diagrams
Ultrahigh vacuum High vacuum Medium vacuum Rough vacuum
<107 mbar 107 to 103 mbar 103 to 1 mbar 1 to approx. 103 mbar
<105 Pa 105 to 101 Pa 101 to 102 Pa 102 to approx. 105 Pa

Pressure balance

Spring element vacuum gauge

Bourdon vacuum gauge

Diaphragm vacuum gauge

Capacitance diaphragm vacuum gauge

Piezoelectric vacuum gauge

Liquid level vacuum gauge

U-tube vacuum gauge

Compression vacuum gauge

(McLeod vacuum gauge)

Decrement vacuum gauge

Thermal conductivity vacuum gauge

Pirani vacuum gauge

Thermocouple vacuum gauge

Bimetallic vacuum gauge

Thermistor vacuum gauge

Cold-cathode ionization vacuum gauge

Penning ionization vacuum gauge

Magnetron gauge

Hot-cathode ionization vacuum gauge

Triode ionization vacuum gauge for medium vacuum

Triode ionization vacuum gauge for high vacuum

Bayard-Alpert ionization vacuum gauge

Bayard-Alpert ionization vacuum gauge with modulator

Extractor vacuum gauge

Partial pressure vacuum gauge

1014 1013 1012 1011 1010 109 108 107 106 105 104 103 102 101 100 101 102 103
p in mbar
The customary limits are indicated in the diagram.

Working range for special models or special operating data

Fig. 9.16a: Measurement ranges of common vacuum gauges

168
 Tables, Formulas, Diagrams

Saturated vapor

Fig. 9.17: Specific volume Vsp of saturated water vapor in m3/kg within a range of 0.013 to 133 mbar.

Fig. 9.18: Breakdown voltage U between parallel electrodes in a homogeneous electrical field as
a function of gas pressure p distance between electrodes d (in mm) (Paschen curve),
for air.

169
Tables, Formulas, Diagrams

SOLID LIQUID

Evaporation

Melting

Triple point
(0.01C, 6.09 mbar)
Water vapor pressure [mbar]

Sublimation

GASEOUS

Temperature [C]

Fig. 9.19: Phase diagram of water

170
 Statutory units
10. The statutory units used in vacuum technol-
ogy

10.1 Introduction
Two federal German laws and the related implementing provisions stipulate Statutory units are:
which units must be used for measurements today (generally since January
a) the basic SI units (Table 10.4.1)
1, 1978) in business and official documents and communications. The pro-
visions resulted in a number of fundamental changes that also have to be b) units derived from the basic SI units, in some cases with special names
taken into account in vacuum technology. Many of the units commonly used and unit symbols (Tables 10.4.2 and 10.4.4)
in the past, such as torr, gauss, standard cubic meter, atmosphere, poise,
c) units used in atomic physics (Table 10.4.3)
kilocalorie, kilogram-force, etc., are no longer permissible. Instead, other
units are to be used, some of which are new while others were previously d) decimal multiples and decimal parts of units, some with special names
used in other fields. The alphabetical list in Section 10.2 contains the major
Examples: 105 N ( m-2 = 1 bar)
variables relevant for vacuum technology along with their symbols and the
1 dm3 = 1 l (liter)
units now to be used, including the SI units (see below) and legally permis-
103 kg = 1 t (ton)
sible units derived from them. The list is followed by a number of remarks in
Section 10.3. The purpose of the remarks is, on the one hand, to establish Detailed descriptions are provided in publications by W. Haeder and E.
a connection with previous practice wherever this is necessary and, on the Grtner (DIN), by IUPAP 1987 and by S. German, P. Draht (PTB). These
other hand, to provide explanations on practical use of the content of the should always be referred to if the present summary tailored to vacuum
alphabetical list. technology leaves any questions open.

The statutory units for measurements are based on the seven basic SI units
of the Systme International (SI).

10.2 Alphabetical list1 of variables, symbols and units frequently used in vacuum technology and its
applications (see also DIN 28 402)

1 The list is based on work done by Prof. Dr. I. Lckert, for which we would like to express our gratitude.

No. Variable Symbol SI- Preferred statutory No. of remark Notes

unit units in Section 10.3
1 Activity (of a radioactive substance) A s1 (Bq) s1 3/1
2 (General gas constant) see no. 73
3 Work W J J, kJ, kWh, Ws
4 Atomic mass mu kg kg, g see Table V in Sect. 9
5 Avogadro constant NA mol1 mol1
6 Acceleration a m s2 m s2, cm s2
7 Boltzmann constant k J K1 j K1, mbar l K1 see Table V in Sect. 9
8 Celsius temperature (theta) C 3/2
9 Vapor pressure pv N m2, Pa mbar, bar 3/3 Pa = Pascal
10 Time t s s, min, h see Table 10.4.4
11 Density (gas density) (ro) kg m3 kg m3, g cm3 3/6
12 Dielectric constant (epsilon) F m1 F m1, As V1 m1 F = Farad
13 Diffusion coefficient D m2 s1 m2 s1, cm2 s1
14 Moment of momentum L Nsm Nsm
15 Torque M Nm N m, kN m
16 Rotational speed, rotational frequency n, f s1 s1, min1
17 Pressure in fluids p N m2, Pa bar, mbar 3/3 Pa = Pascal

171
Statutory units
No. Variable Symbol SI- Preferred statutory No. of remark Notes
unit units in Section 10.3
18 Pressure as mechanical stress p N m2, Pa N mm2 3/4
19 Diameter d m cm, mm
20 Dynamic viscosity (eta) Pa s mPa s 3/5
21 Effective pressure pe N m2, Pa mbar 3/3 see also no. 126
22 Electric field strength E V m1 V m1
23 Electrical capacitance C F F, F, pF F = Farad
24 Electrical conductivity (sigma) S m1 S m1
25 Electrical conductance G S S S = Siemens
26 Electrical voltage U V V, mV, kV
27 Electric current density S A m2 a m2, A cm2
28 Electric current intensity I A A, mA, A
29 Electrical resistance R (ohm) , k, M
30 Quantity of electricity (electric charge) Q C C, As C = Coulomb
31 Electron rest mass me kg kg, g see Table V in Sect. 9
32 Elementary charge e C C, As
33 Ultimate pressure pult N m2, Pa mbar
34 Energy E J J, kJ, kWh, eV J = Joule
35 Energy dose D J k1 3/5 a
36 Acceleration of free fall g m s2 m s2 see Table V in Sect. 9
37 Area A m2 m2, cm2
38 Area-related impingement rate ZA m2 s1 m2 s1; cm2 s1
39 Frequency f Hz Hz, kHz, MHz
40 Gas permeability Qperm m3 (NTP) cm3 (NTP) 3/19 d =day (see Tab. 10.4.4

m2 s Pa m2 d bar see no. 73 and no. 103)
41 Gas constant R
42 Velocity v m s1 m s1, mm s1, km h1
43 Weight (mass) m kg kg, g, mg 3/6
44 Weight (force) G N N, kN 3/7
45 Height h m m, cm, mm
46 Lift s m cm see also no. 139
47 Ion dose J C kg1 c kg1, C g1 3/8
48 Pulse p^ (b) Ns Ns
49 Inductance L H H, mH H = Henry
50 Isentropic exponent (kappa) = cp cv1
51 Isobaric molar heat capacity Cmp J mol1 K1 J mol1 K1
52 Isobaric specific heat capacity cp J kg1 K1 J kg1 K1
53 Isochore molar heat capacity Cmv J mol1 K1
54 Isochore specific heat capacity cv J kg1 K1 J kg1 K1
55 Kinematic viscosity (n) m2 s1 mm2 s1, cm2 s1 3/9
56 Kinetic energy EK J J
57 Force F N N, kN, mN 3/10 N = Newton
58 Length l m m, cm, mm 3/11
59 Linear expansion coefficient (alpha) m m
; K1
mK mK
60 Leak rate QL N m s1 mbar l ; cm3 3/12
(NTP)
s s
61 Power P W W, kW, mW
62 Magnetic field strength H A m1 A m1 3/13
63 Magnetic flux density B T T 3/14 T = Tesla
64 Magnetic flux (phi) Wb, V s Vs 3/15 Wb = Weber
65 Magnetic induction B T T see no. 63
66 Mass m kg kg, g, mg 3/6
67 Mass flow rate qm kg s1 kg s1, kg h1, g s1

172
 Statutory units
No. Variable Symbol SI- Preferred statutory No. of remark Notes
unit units in Section 10.3
68 Mass content wi kg kg1 %, o/oo, ppm ppm = parts per million
69 Mass concentration i (ro-i) kg m3 kg m3, g m3, g cm3
70 Moment of inertia J kg m2 kg m2
71 Mean free path m m, cm
72 Molality bi mol kg1 mol kg1
73 Molar gas constant R J mbar l see Table V in Sect. 9

mol K mol K
74 Molar mass (quantity-related mass) M kg mol1 kg kmol1, g mol1
75 Molar volume Vm m3 mol1 m3 mol1, l mol1
76 Molar volume, standard Vmn m3 mol1 m3 mol1 (NTP) see Table V in Sect. 9
l mol1 (NTP)
77 Molecular mass m kg g
78 Normal stress (mech.) (sigma) N m2 N mm2
79 Standard density of a gas n (ro-en) kg m3 kg m3, g cm3
80 Standard pressure pn N m2, Pa mbar see Table V in Sect. 9
81 Standard volume Vn m3 m3 (NTP), cm3 (NTP) 3/16
82 Partial pressure pi N m2, Pa mbar 3/17
83 Period T s s, ms, s
84 Permeation coefficient P m3 m cm2 3/18

s m2 bar s mbar
85 Planck constant h Js Js see Table V in Sect. 9
86 pV throughput qpV N m s1 mbar l s1 3/19
87 pV value pV Nm mbar l 3/19
88 Radius (also molecular radius) r m cm, mm, m
89 Space charge density (ro) C m3 C m3, As m3
90 Solid angle (omega) sr sr sr = steradian
91 Relative atomic mass AT 3/20 nondimensional variab.
92 Relative molecular mass Mr 3/21 nondimensional variab.
93 Relative particle mass Mr nondimensional variab.
94 Residual vapor pressure prd N m2, Pa mbar
95 Residual gas pressure prg N m2, Pa mbar
96 Residual (total) pressure pr N m2, Pa mbar
97 Reynold number nondimensional Re nondimensional variab.
variable
98 Saturation vapor pressure ps N m2, Pa mbar
99 Throughput (of a pump) qpV, Q N m s1 mbar l s1
100 Pumping speed S m3 s1 m3 h1, l s1 see no. 132
101 Stress (mech.) , , N m2 N m2, N mm2 3/4 see no. 18
(ro,
sigma, tau)
102 Specific electron charge e me1 C kg1 C kg1, As kg1 see Table V in Sect. 9
103 Specific gas constant Ri J kg1 K1 mbar l 3/22

kg K
104 Specific ion charge e m1 C kg1 C kg1, As kg1
105 Specific electrical resistance (ro) m cm, mm2 m1
106 Specific volume v m3 kg1 m3 kg1; cm3 g1
107 Specific heat capacity c J kg1 K1 J kg1 K1, J g1 K1 3/23
108 Stefan-Boltzmann constant (sigma) W W see Table V in Sect. 9

m2 K4 m2 K4
109 Quantity of substance (n) mol mol, kmol
110 Throughput of substance qv mol s1 mol s1
111 Concentration of substance ci mol m3 mol m3, mol l1 for substance i
112 Collision rate Z s1 s1

173
Statutory units
No. Variable Symbol SI- Preferred statutory No. of remark Notes
unit units in Section 10.3
113 Conductance C, German: L m3 s1 m3 s1, l s1
114 Flow resistance R s m3 s m3, s l1
115 Number of particles N nondimensional variab.
116 Particle number density (volume-related) n m3 cm3
117 Particle number density (time-related) qN s1 s1 see no. 120
118 Particle throughput density jN m2 s1 m2 s1, cm2 s1 see no. 121
119 Particle mass m kg kg, g
120 Particle flux qN s1 s1 see no. 117
121 Particle flux density jN m2 s1 m2 s1, cm2 s1 see no. 118
122 Thermodyn. temperature T K K, mK
123 Temperature difference T, K K, C 3/24
124 Temperature conductivity a m2 s1 a = 1 cp
125 Total pressure pt N m2, Pa mbar 3/3
126 Overpressure pe N m2, Pa mbar 3/3
127 Ambient pressure Pamb N m2, Pa mbar, bar 3/3
128 Speed of light in vacuum c m s1 m s1, km s1 see Table V in Sect. 9
129 Evaporation heat Ld J kJ
130 Viscosity, dynamic (eta) Pa s mPa s see no. 20
131 Volume V m3 m3, l, cm3
132 Volume throughput (volumetric flow) qv m3 s1 m3 h1, l s1
133 Volume concentration i m3 m3 l l1, %, o/oo, ppm ppm = parts per million
(sigma-i)
134 Volume-related collision rate Zv s1 m3 s1 m3, s1 cm3
135 Quantity of heat Q J J, kJ, kWh, Ws 3/25
136 Heat capacity C J K1 J K1, kJ K1
137 Thermal conductivity W W

(lambda) Km Km
138 Heat transfer coefficient (alpha) W

K m2
139 Path length s m m, cm
140 Wave length (lambda) m nm 3/11
141 Angle (plane) , , rad rad rad, , , 3/26 rad = radian
(alpha,
beta, gamma)
142 Angular acceleration (alpha) rad s2 rad s2
143 Angular velocity rad s1 rad s1
(omega)
144 Efficiency (eta) nondimensional variab.
145 Time t s s, min, h, nn, mn see Table 10.44
146 Period of time t, t s s, min, h see Table 10.44

174
 Statutory units
10.3 Remarks on alphabetical list in 3/5: Dynamic viscosity
Section 10.2 The unit previously used was poise (P).

3/1: Activity 1 P = 0.1 Pa s = 1 g cm1 s1

The unit previously used was curie (Ci).

1 Ci = 3.7 1010 s-1 = 37 ns-1 3/5a: Energy dose

Rad (rd) is no longer permissible.

3/2: (C) Celsius temperature 1

1 rd = J kg1
The term degrees Celsius is a special name for the SI unit kelvin (K) [see 100
no. 122] for indicating Celsius temperatures. The term degrees Celsius is
legally approved. 3/6: Weight
DIN 1305 is to be complied with in this context. Because of its previous
3/3: Pressure ambivalence, the word weight should only be used to designate a variable
The revised version of DIN 1314 must be complied with. The specifications of the nature of a mass as a weighing result for indicating quantities of
of this standard primarily apply to fluids (liquids, gases, vapors). In DIN goods.
1314, bar (1 bar = 0.1 MPA = 105 Pa) is stated in addition to the (derived) The designations specific weight and specific gravity should no longer be
SI unit, 1 Pa = 1 N m-2, as a special name for one tenth of a megapascal used. Instead, one should say density.
(Mpa). This is in accordance with ISO/1000 (11/92), p. 7. Accordingly the
millibar (mbar), a very useful unit for vacuum technology, is also permissi-
ble: 1 mbar = 102 Pa = 0.75 torr. The unit torr is no longer permissible. 3/7: Weight force
See DIN 1305. The previous units pond (p) and kilopond, i.e. kilogram-
force, (kp) as well as other decimal multiples of p are no longer used.
Special note 1 kp = 9.81 N
Exclusively absolute pressures are measured and used for calculations in
vacuum technology.
3/8: Ion dose
In applications involving high pressures, frequently pressures are used that The previously used unit was the Rntgen (R). 1 R = 2,58 104 C kg1
are based on the respective atmospheric pressure (ambient pressure) pamb.
According to DIN 1314, the difference between a pressure p and the
respective atmospheric pressure (ambient pressure) pamb is designated as 3/9: Kinematic viscosity
overpressure pe: pe = p pamb. The overpressure can have positive or neg- The previously used unit was stokes (St).
ative values. 1 St = 1 cm2 s1; 1 cSt = 1 mm2 s1

Conversions 3/10: Force

1 kg cm-2 = 980.665 mbar = 981 mbar The dyne, the CGS unit for force, is no longer used.
1 at (technical atmosphere) = 980.665 mbar = 981 mbar 1 dyne = 10-5 N
1 atm (physical atmosphere) = 1013.25 mbar = 1013 mbar

1 atmosphere above atmospheric pressure (atmospheric overpressure) = 3/11: Length/wavelength

2026.50 mbar = 2 bar The unit ngstrm () (e.g. for wavelength) will no longer be used in future
(see Table 4.6).
1 atm
1 torr = 1 mm Hg = = 133.322 Pa= 1.333 mbar 1 = 10-8 cm = 0.1 nm
760
1 meter head of water = 9806.65 Pa = 98 mbar

1 mm Hg = 133.332 Pa = 1.333 mbar = 4/3 mbar 3/12: Leak rate

In DIN 40.046 sheet 102 (draft of August 1973 issue), the unit
The pressure as mechanical stress (strength) is generally given in pascal mbar dm3 s-1 (= mbar l s-1) is used for the leak rate. Note that the leak
(Pa) and in N nm2. rate corresponding to the unit 1 mbar l s-1 at 20 C is practically the
same as the leak rate 1 cm3 s-1 (NTP). (See also 3/17)
Conversions:
1 Pa = 1 N m2 = 106 N mm2 3/13: Magnetic field strength
1 kg cm2 = 98,100 Pa = 0.981 N mm2 = 0,1 N mm2 The previously used unit was the oersted (Oe).

1 kg mm2 = 9,810,000 Pa = 9.81 N mm2 = 10 N mm2 1 Oe = 79.577 A m-1

175
Statutory units
3/14: Magnetic flux density 3/24: Temperature difference
The previously used unit was the gauss (G). Temperature differences are given in K, but can also be expressed in C.
The designation degrees (deg) is no longer permissible.
1 G = 10-4 Vs m-2 = 10-4 T (T = Tesla)

3/25: Quantity of heat

3/15: Magnetic flux
The units calorie (cal) and kilocalorie (kcal) are no longer be used.
The previously used unit was the maxwell (M).
1 kcal = 4.2 kJ
1 M = 10-8 Wb (Weber)

3/26: Angle
3/16: Standard volume
1 radian (rad) is equal to the plane angle which, as the central angle of a
DIN 1343 must be complied with.
circle, cuts out an arc having a length of 1 m from the circle. See also DIN
The designation m3 (NTP) or m3 (pn, Tn) is proposed, though the expres- 1315 (8/82).
sion in parentheses does not belong to the unit symbol m3 but points out

that it refers to the volume of a gas in its normal state 1 = rad: 1 = 1/60; 1 = 1/60.
(Tn = 273 K, pn = 1013 mbar). 180

360
1 rad = 60
3/17: Partial pressure 2
The index i indicates that it is the partial pressure of the i-th gas that is
contained in a gas mixture.

3/18: Gas permeability

The permeation coefficient is defined as the gas flow m3 s-1 (volumetric 10.4 Tables
flow pV) that goes through a fixed test unit of a given area (m2) and thick-
ness (m) at a given pressure difference (bar).
10.4.1 Basic SI units
According to DIN 53.380 and DIN 7740, Sheet 1, supplement, the gas per-
meability (see no. 40) is defined as the volume of a gas, converted to
Basic unit Symbol Variable
0 C and 760 torr, which goes through 1 m2 of the product to be tested at a
certain temperature and a certain pressure differential during a day meter m length
(= 24 hours).
kilogramm kg mass

3/19: pV throughput/pV value second s time, period; duration

DIN 28.400, Sheet 1 is to be taken into account here. No. 86 and no. 87 ampere A electric current
have a quantitative physical significance only if the temperature is indicated
in each case. kelvin K thermodyn. temperature

mole mol quantity of substance

3/20: Relative atomic mass candela cd luminous intensity
Misleadingly called atomic weight in the past!

3/21: Relative molecular mass

Misleadingly called molecular weight in the past!

3/22: Specific gas constant

As mass-related gas constant of the substance i. Ri = Rm ( Mi-1; Mi molar
mass (no. 74) of the substance i. See also DIN 1345.

3/23: Specific heat capacity

Also called specific heat:

Specific heat (capacity) at constant pressure: cp.

Specific heat (capacity) at constant volume: cV.

176
 Statutory units
10.4.2 Derived coherent1 SI units with special 10.4.4 Derived noncoherent SI units with special
names and symbols (alphabetical) names and symbols

Name of unit Symbol Variable Relationship Basic unit Symbol Definition

coulomb C quantity of electricity 1C=1As Day d 1 d = 86.400 s
or electric charge
Hour h 1 h = 3.600 s
farad F electrical capacitance 1 F = 1 A s V1
Minute min 1 min = 60 s
henry H inductance 1 H = 1 V s A1
Round angle 2 rad
hertz Hz frequency 1 Hz = 1 s1

Degree () rad
joule J energy, work, quantity 1 J = 1 N m = Ws 180
of heat
1
lumen lm luminous flux 1 lm = cd sr Minute () rad (= grad)
10.800 60
lux lx illuminance 1 lx = 1 lm m2 1
Second () rad (= minute)
newton N force 1 N = 1 kgm s2 648.000 60
ohm electrical resistance 1 = 1 V A1

pascal Pa pressure, mechanical 1 Pa = 1 N m2

stress

radian rad2 angle, plane angle 1 rad = 1 m m1

siemens S electrical conductance 1 S = 1 1

steradian sr2 solid angle 1 sr = 1 m2 m2

tesla T magnetic flux density or 1 T = 1 Wb m2

induction

volt V electrical voltage

or potential difference 1 V = 1 W A1

watt W power, energy flux, heat 1 W = 1 J s1

flux

weber Wb magnetic flux 1 Wb = 1 V s

1 Formed with numeric factor 1; e.g. 1 C = 1 As, 1 Pa = 1 N m2

2 Additional SI unit

10.4.3 Atomic units

Basic unit Symbol Vartiable

Atomic Mass for indication of

mass mu particle mass;
unit 1 mu = 1/12 mass of 12C
also amu (atomic mass
unit).

Electron eV energy
volt

177
Vacuum technology standards
11. National and international standards and 11.1 National and international standards and
recommendations of special relevance to
recommendations particularly relevant vacuum technology
to vacuum technology
A) National agreements, Part 1: DIN
DIN Title Issue

For around 20 years now, numerous standards and recommendations have 1301 Units
been drawn up at national and international level and revised, whenever Part 1 Names of units, symbols 1993
necessary, in accordance with the state of the art. These standards and Part 2 Parts and multiples generally used 2/78
recommendations must be observed whenever use is made of vacuum Part 3 Conversions for units no longer used 6/79
equipment (pumps, gauges, valves, etc.) and vacuum apparatus, systems 1304 General symbols
and plants are assembled. They not only contain specifications applying Part 1 General symbols 3/94
specially to vacuum technology, but also go beyond this specific field and Part 2 Symbols for meteorology and geophysics 9/89
involve, for example, physical units, formulas, noise protection regulations, Part 3 Symbols for electrical energy supply 3/89
etc. Part 5 Symbols for flow mechanics 9/89
National standards are primarily DIN standards, particularly those relating Part 6 Symbols for electrical
to the area of vacuum technology in the DIN Standards Committee on communications technology 5/92
Mechanical Engineering (NAM). International standards and recommenda- Part 7 Symbols for meteorology and geophysics
tions are drawn up and issued Part 7 Symbols for electric machines 1/91

a) by the International Standardization Organization (ISO), in particular by 1305 Mass; weighed value, force, weight force, weight 1/88
ISO Committee TC 112 (vacuum technology) load, definitions

b) by the European Committee of Manufacturers of Compressors, vacuum 1306 Density; definitions 6/84
pumps and compressed air tools (PNEUROP), in particular by PNEU- 1313 Physical variables and equations,
ROP Subcommittee C5 (vacuum technology) definitions, spelling 4/78
c) by the European Committee for Standardization (CEN), in particular by 1314 Pressure; basic definitions, units 2/77
Technical Committee TC 138 (nondestructive testing) and Technical
Committee TC 318. 1319 Basic definitions for measurement technology
Part 1 Basic definitions 1/95
The content of the documents drawn up by the international organizations Part 2 Definitions for the use of gauges 1/80
in a) to c), with German participation (also by LEYBOLD), has been exten- Part 3 Definitions for measurement
sively incorporated into DIN standards, as reflected in designations such as uncertainty and evaluation of gauges
DIN / ISO or DIN / EN. and measuring equipment 8/83
The most important standards to be complied with are listed in Table 11.1 Part 4 Treatment of uncertainty in the
below. use of measurements 12/85

Abbreviations used:
D = draft A) National agreements, Part 1: DIN (cont.)
CD = Committee Draft DIN Title Issue

1343 Normal state, reference state 1/90

1345 Thermodynamics; basic definitions 12/93

1952 Flow measurement with screens, nozzles, etc. 7/82

2402 Pipelines; nominal internal diameters, definitions,

classification 2/76

3535 Seals for gas supply Part 6 4/94

178
 Vacuum technology standards
DIN Title Issue DIN Title Issue

8964 Circuit parts for refrigeration systems with 28410 Vacuum technology; mass spectrometer partial
hermetic and semi-hermetic compressors pressure gauges, definitions, characteristic
Part 1: Tests 3/96 variables, operating conditions 11/86
Part 2: Requirements 9/86
28411 Vacuum technology; acceptance specifications
(E 12/95)
for mass spectrometer leak detection devices,
16005 Overpressure gauges with elastic measuring definitions 3/76
element for general use Requirements
28416 Vacuum technology; calibration of vacuum
and testing 2/87
gauges in a range from 10-3 to 10-7 mbar.
16006 Overpressure gauges with Bourdon tube General methods; pressure reduction
Safety-related requirements and testing 2/87 through constant flow 3/76

19226 1 Control and instrumentation technology; 28417 Vacuum technology; measuring pV mass flow
control and regulation technology; according to volumetric method at constant
definitions general principles 2/94 pressure 3/76
4 Control and instrumentation technology;
28418 Vacuum technology; standard method for
control and regulation technology;
calibrating vacuum gauges through direct
definitions for control and regulation
comparison with a reference device
systems 2/94
Part 1 General principles 5/76
5 Control and instrumentation technology;
Part 2 Ionization vacuum gauges 9/78
control and regulation technology;
Part 3 Thermal conductivity vacuum gauges 8/80
functional definitions 2/94
28426 Vacuum technology; acceptance specifications
25436 Integral leak rate test of safety vessel with
for rotary piston vacuum pumps
absolute pressure method 7/80
Part 1 Rotary piston and vane type rotary
28090 Static seals for flange connections vacuum pumps in rough and medium vacuum range
Part 1 - Characteristic values for seals and Part 2 Roots vacuum pumps in medium
testing methods 9/95 vacuum range
Part 2 - Seals made of sealing plate; special
28427 Vacuum technology; acceptance specifications
testing methods for quality assurance 9/95
for diffusion pumps and ejector vacuum pumps for
28400 Vacuum technology; designations and definitions pump fluid vapor pressures of less than 1 mbar 2/83
Part 1 - Basic definitions, units, ranges,
28428 Vacuum technology; acceptance specifications
characteristic variables and basic principles 5/90
for turbo-molecular pumps 11/78
Part 2 - Vacuum pumps 10/80
Part 3 - Vacuum plants; characteristic 28429 Vacuum technology; acceptance
variables and gauges 6/92 specifications for getter-ion pumps 8/85
Part 4 - Vacuum coating technology 3/76
28430 Vacuum technology; measuring specifications for
Part 5 - Vacuum drying and vacuum
ejector vacuum pumps and ejector compressors.
freeze-drying 3/81
Pump fluid: water vapor 11/84
Part 6 - Analytical techniques for surface
technology 10/80 28431 Acceptance specifications for liquid
Part 7 - Vacuum metallurgy 7/78 ring vacuum pumps 1/87
Part 8 - Vacuum systems, components and
28432 Acceptance specifications for diaphragm
accessories 10/80
vacuum pumps E 5/95
(E 7/91)
53380 Testing of plastic foils, determination of gas
28401 Vacuum technology; symbols overview 11/76
permeability 6/69
28402 Vacuum technology: variables, symbols, (E 10/83)
units - overview 12/76
45635 Noise measurement at machines: measurement
28403 Vacuum technology; quick connections, of airborne noise, enveloping surface methods.
small flange connections 9/86 Part 13 Compressors, including vacuum pumps,
positive displacement, turbo and steam
28404 Vacuum technology: flanges, dimensions 10/86
ejectors 2/77

179
Vacuum technology standards
DIN Title Issue ISO Title Issue

55350 Definitions of quality assurance and statistics 1607 / 2 Positive displacement vacuum pumps.
Part 11 Basic definitions of quality assurance 8/95 Measurement of performance characteristics. 11/89
Part 18 Definitions regarding certification of Part 2 - Measurement of ultimate pressure
results of quality tests/quality test certificates 7/87
1608 / 1 Vapor vacuum pumps.
66038 Torr millibar; millibar torr conversion tables 4/71 Part 1: Measurement ofvolume rate of flow 12/93

Thesaurus Vacui (definition of terms) 1969 1608 / 2 Vapor vacuum pumps.

Part 2: Measurement of critical backing pressure 12/89

1609 Vacuum technology. Flange dimensions 3/86

DIN/ISO Standard atmosphere 12/79

A) European/national agreements, EN, DIN/EN, CEN
2533
DIN/EN Title Issue
2861 / 1 Quick release couplings. Dimensions 8/74
EN 473 Training and certification of personnel for
Part 1 - Clamped Type
nondestructive testing (including leak test) 7/93
2861 / 2 Quick release couplings. Dimensions 8/80
837-1 Pressure gauges, Part 1: Pressure gauges with
Part 2 - Screwed type
Bourdon tubes, dimensions, measurement
technology, requirements and testing 2/97 3529 / 1 Vacuum Technology Vocabulary 12/81
Part 1 - General terms
837-2 Pressure gauges, Part 2: Selection and installation
recommendations for pressure gauges 1/95 3529 / 2 Vacuum Technology Vocabulary 12/81
Part 2 - Vacuum pumps and related terms
837-3 Pressure gauges, Part 3: Pressure gauges with
plate and capsule elements, dimensions, 3529 / 3 Vacuum Technology Vocabulary 12/81
measurement technology, requirements Part 3 - Vacuum gauges
and testing 2/97
3556 / 1 Measurement of performance characteristics. 1992
1330-8 E Nondestructive testing - definitions for leak test Part 1 - Sputter ion pumps (E)
terminology 6/94
3567 Vacuum gauges. Calibration by direct
1779 E Nondestructive testing leak test. Instructions comparison with a reference gauge (CD) 2/91
for selection of a testing method 3/95
3568 Ionisation vacuum gauge. Calibration by direct
1338-8 E Nondestructive testing leak test. comparison with a reference gauge (CD) 2/91
Terminology on leak test 1994
3570 / 1 Vacuum gauges standard methods for
1518 E Nondestructive testing determination of calibration 2/91
characteristic variables for mass spectrometer Part 1 - Pressure reduction by continuous
leak detectors flow in the pressure range 101 ... 105 Pa.

1593 E Nondestructive testing bubble type testing method 12/94 3669 Vacuum Technology. Bakable flanges, dimensions. 2/86
Part 1: Clamped Type
NMP 826 Calibration of gaseous reference leaks, CD 9/95
Nr. 0995 EN/ISO Rubber and plastic hoses and hose
4080 lines determination of gas permeability 4/95

5167 Measurement of fluid flow by means of orifice

plates, nozzles etc. 1980
B) International agreements, ISO, EN/ISO
5300 Vacuum gauges of the thermal conductivity type. 2/91
ISO Title Issue
Calibration by direct comparison with a
1000 SI units and recommendations for the use of reference gauge (CD)
their multiples and of certain other units 11/92
9803 Pipeline fittings-mounting, dimensions (E) 2/93
1607 / 1 Positive displacement vacuum pumps.
DIN/ISO Requirements placed on quality assurance for
Measurement of performance characteristics. 12/93
10012 measuring equipment 8/92
Part 1 - Measurement of volume rate of flow
Part 1 Confirmation system for measuring
(pumping speed)
equipment

180
 Vacuum technology standards
C) PNEUROP/C5 (6.93)
Number Title/remark identical Issue
to DIN

5607 Vacuum pumps; acceptance specifications 28427 1972

Part II: (Fluid entrainment pumps)

5608 Vacuum pumps; acceptance specifications 28428 1973

Part III: (Turbomolecular pumps)

5615 Vacuum pumps; acceptance specifications 28429 1976

Part IV: (Getter-ion pumps)

6601 Measurement of performance of ejector

vacuum pumps and ejector compressors 28430 5/78

6602 Vacuum pumps; acceptance specifications

Part I: (Oil-sealed rotary pumps and
Roots pumps) 28426 1979

6606 Vacuum flanges and connections; 28403 1985

dimensions and
28404

PN5ASR Vacuum pumps, acceptance

CC/5 specifications refrigerator cooled
cryopumps 7/89

181
References
12. References J. M. Lafferty et. al.
Foundations of Vacuum Science and Technology
704 pages, 1998, Wiley 1998

A. Schubert
1. Overview, definitions and history
Normen und Empfehlungen fr die Vakuum-Technik
Vakuum in der Praxis, Vol. 3, 1991, 211-217
K. Diels, R. Jaekel
H. Scharmann
Leybold Vacuum Handbook
Vakuum Gestern und Heute
Pergamon Press
Vakuum in der Praxis, Vol. 2, 1990, 276-281
1st Ed. 1966

M. Auwrter
W. Haeder, E. Grtner
Das Vakuum und W. Gaede
Die gesetzlichen Einheiten in der Technik
Vakuum-Technik, Vol. 32, 1983, 234-247
Beuth-Vertrieb GmbH, 5. Aufl. 1980,
Berlin 30, Kln, Frankfurt (Main)
J. F. OHanlon
A Users Guide to Vacuum Technology
H. Ebert
3nd Ed., 402 pages, Wiley 1989, New York
Vakuum-Chronik, A documentation on works concerning vacuum that were
published before 1928
G. Reich
PTB-Bericht ATWD-11, September 1977
Wolfgang Gaede Einige Gedanken zu seinem 50. Todestag aus heutiger
Sicht
M. Dunkel
Vakuum in der Praxis, 7th year, 1995, 136-140
Gedenken an Wolfgang Gaede
Physikalische Bltter Nr. 34 (1978), Heft 5, Pages 228-232 as well as
S. German, P. Draht
Vakuum-Technik, 27. Jahrgang, No. 4,
Handbuch SI Einheiten
Pages 99-101
Vieweg Braunschweig/Wiesbaden, 1979, 460 pages
IUPAP (SUNANCO Commission)
Gesetz ber Einheiten im Mewesen vom 2. Juli 1969
Symbols, Units etc.
Gesetz zur nderung des Gesetzes ber Einheiten im Mewesen vom 6.
Document 25, 1987
Juli 1973
Ausfhrungsverordnungen vom 26. Juni 1970
Leybold AG
Vademekum, 93 pages, 1988
In Vakuum-Technik Vol. 35, 1986:
Th. Mulder
M. Wutz, H. Adam, W. Walcher
Otto von Guericke
Theory and Practice of Vacuum Technology
Pages 101-110
5. Aufl., 696 pages, 1992,
Friedrich Vieweg u. Sohn, Braunschweig/ Wiesbaden
P. Schneider
Zur Entwicklung der Luftpumpen-
A. Guthrie and R. K. Wakerling
Initiationen und erste Reife bis 1730
Vakuum Equipment and Techniques
Pages 111-123
264 pages, 1949, McGraw-Hill,
New York/London/Toronto
L. Fabel
Physik in der 2. Hlfte des 19. Jahrhunderts und die
D. J. Hucknall
vakuumtechnische Entwicklung bis Gaede
Vacuum Technology and Applications
Pages 128-138
1st Ed., 319 pages, 1991
Butterworth-Heinemann, Oxford
H.-B. Brger:
G. Ch. Lichtenberg und die Vakuumtechnik
C. M. van Atta
Pages 124-127
Vacuum Science and Engineering
459 pages, 1965, McGraw-Hill
G. Reich:
New York/San Francisco/Toronto/
Gaede und seine Zeit
London/Sydney
Pages 139-145

182
 References
H. Adam F. Fauser
Vakuum-Technik in der Zeit nach Gaede (1945 to the present); Charakteristik von Pumpsystemen fr grere Wasserdampfmengen unter
Pages 146-147 Vakuum und unter Anwendung von Kondensation und Kompression des
Wasserdampfes
G. Reich 1965 Transactions of the Third International Vacuum Congress, Stuttgart,
Die Entwicklung der Gasreibungspumpen von Gaede, ber Holweck, Bd. 2/II, 393-395, Pergamon Press, Oxford 1966
Siegbahn bis zu Pfleiderer und Becker (mit zahlreichen Literaturangaben)
Vakuum-Technik in der Praxis, Vol. 4, 1992, 206-213 M. Wutz
Das Abpumpen von Dmpfen mit gekhlten Kondensatoren
G. Reich Vakuum-Technik, 16, 1967, 53-56
Carl Hoffman (1844-1910), der Erfinder der Drehschieberpumpe
Vakuum in der Praxis, 1994, 205-208 H. Hamacher
Kennfeldberechnung fr Rootspumpen
Th. Mulder DLR FB 69-88, 1969
Blaise Pascal und der Puy de Dme Groe Mnner der Vakuum-Technik
Vakuum in der Praxis, 1994, 283-289 H. Hamacher
Beitrag zur Berechnung des Saugvermgens von Rootspumpen
W. Pupp und H. K. Hartmann Vakuum-Technik, 19, 1970, 215-221
Vakuum-Technik, Grundlagen und Anwendungen
C. Hanser, Mnchen, 1991, Wien, H. Hamacher
Experimentelle Untersuchungen an Nachkhlern von Rootspumpen
Vakuum-Technik, 23, 1974, 129-135

M. Rannow
2. Vacuum pumps lgedichtete Vakuumpumpen in der Chemie
Chemie-Technik, No. 7, 1978, 39-41

2.1 Positive displacement pumps, condensers H. P. Berges et al.

TRIVAC-B, ein neues Vakuumpumpen-Konzept fr universelle
W. Gaede Anwendungen
Demonstration einer rotierenden Quecksilberpumpe Vakuum-Technik, 31, 1982, 168-171
Physikalische Zeitschrift, 6, 1905, 758-760
H. Lang
W. Gaede Vakuumpumpen in der chemischen Industrie Wlzkolbenpumpen
Gasballastpumpen Vakuum-Technik, 1980, 72-82
Zeitschrift fr Naturforschung, 2a, 1947, 233-238
H. F. Weber
W. Armbruster und A. Lorenz Vakuumpumpen in der chemischen
Das maximale Kompressionsverhltnis und der volumetrische Industrie lgedichtete Rotationsvakuumpumpen
Wirkungsgrad von Vakuumpumpen nach dem Rootsprinzip Vakuum-Technik, 1980, 98-104
Vakuum-Technik, 7, 1958, 81-85
D. Bartels
W. Armbruster und A. Lorenz Vakuumpumpen in der chemischen Indu-strie
Die Kombination Rootspumpe-Wasserringpumpe Flssigkeitsring-Vakuumpumpen A
Vakuum-Technik, 7, 1958, 85-88 Vakuum-Technik, 1980, 131-140

H. Reylander R. W. Adam und C. Dahmlos

ber die Wasserdampfvertrglichkeit von Gasballastpumpen Flssigkeitsring-Vakuumpumpen B
Vakuum-Technik, 7, 1958, 78-81 Vakuum-Technik, 1980, 141-148

U. Seegebrecht
Frderung trockener Luft und von gesttigtem Luft-Wasserdampfgemisch
mit Flssigkeitsring-Vakuumpumpen
Vakuum-Technik, 1980, 246-252

183
References
H.-D. Brger W. Jorisch
Fortschritte beim Betrieb von Wlzkolbenpumpen Neue Wege bei der Vakuumerzeugung in der chemischen
Vakuum-Technik 1983, 140-147 Verfahrenstechnik
Vakuum in der Praxis, 1995, 115-118
U. Seegebrecht
Einflu der Temperatur des Frdermittels auf das Saugvermgen von D. Lamprecht
Flssigkeitsring-Vakuumpumpen bei der Frderung von trockener Luft Trockenlaufende Vakuumpumpen
Vakuum-Technik, 1985, 10-14 Vakuum in der Praxis, 1993, 255-259

P. Bachmann und H.-P. Berger P. Deckert et al.

Sicherheitsaspekte beim Einsatz von lgedichteten Die Membranvakuumpumpe Entwicklung und technischer Stand
Drehschiebervakuumpumpen in CVD-Anwendungen Vakuum in der Praxis, 1993, 165-171
Vakuum-Technik, 1987, 41-47
W. Jorisch und U. Gottschlich
U. Fussel Frischlschmierung Umlaufschmierung, Gegenstze oder Ergnzung?
Trockenlaufende Vakuumpumpen in der chemischen Industrie Vakuum in der Praxis, 1992, 115-118
Vakuum in der Praxis, 1994, 85-88
W. Jitschin et al.
L. Ripper Das Saugvermgen von Pumpen: Untersuchung verschiedener
Explosionsschutz-Manahmen an Vakuumpumpen (with numerous refer- Meverfahren im Grobvakuumbereich
ences to relevant literature) Vakuum in Forschung und Praxis, 7, (1995) 183 -193
Vakuum in der Praxis, 1994, 91-100
H.P. Berges and M. Kuhn
K. P. Mller Handling of Particles in Forevacuum pumps
Trockenlaufende Drehschiebervakuumpumpen in einer Vielzweck- Vacuum, Vol. 41, 1990, 1828-1832
Produktionsanlage
Vakuum in der Praxis, 1994, 109-112 M. H. Hablanian
The emerging technologies of oil-free vacuum pumps
F. J. Eckle, W. Jorisch, R. Lachenmann J. Vac. Sci. Technol. A6 (3), 1988, 1177-1182
Vakuum-Technik im Chemielabor
Vakuum in der Praxis, 1991, 126-133 E. Zakrzewski, P. L. May and B. S. Emslie
Developments in vacuum Pumping systems based on mechanical pumps
P. Bachmann und M. Kuhn with an oil free swept volume
Einsatz von Vorpumpen im Al-tzproze. Erprobung trockenverdichtender Vacuum, 38, 968, 757-760
Klauenpumpen und lgedichteter Drehschieber-Vakuumpumpen im
Vergleich H. Wycliffe
Vakuum in der Praxis, 1990, 15 21 Mechanical high-vacuum pumps with an oil-free swept volume
J. Vac. Sci. Technol. A5 (4) 1987, 2608-2611
U. Gottschlich
Vakuumpumpen im Chemielabor A. P. Troup and D. Turell
Vakuum in der Praxis, 1990, 257-260 Dry pumps operating under harsh condictions in the semiconductor industry
J. Vac. Sci. Technol. A7 (3), 1989, 2381-2386
M. H. Hablanian
Aufbau und Eigenschaften verschiedener lfreier Vakuumpumpen fr den P. Bachmann and M. Kuhn
Grob- und Feinvakuumbereich (wichtige Literaturangaben) Evaluation of dry pumps vs rotary vane pumps in aluminium etching
Vakuum in der Praxis, 1990, 96-102 Vacuum 41, 1990, 1825-1827

B. W. Wenkebach und J. A. Wickhold H. P. Berges and D. Gtz

Vakuumerzeugung mit Flssigkeitsring-Vakuumpumpen Oil-free vacuum pumps of compact design
Vakuum in der Praxis, 1989, 303-310 Vacuum, Vol. 38, 1988, 761-763

U. Gottschlich und W. Jorisch

Mechanische Vakuumpumpen im Chemieeinsatz
Vakuum in Forschung und Praxis, 1989, 113-116

184
 References
2.2 Turbomolecular pumps J. Henning
30 Jahre Turbo-Molekularpumpe
W. Gaede Vakuum-Technik, 1988, 134-141
Die Molekularluftpumpe
Annalen der Physik, 41, 1913, 337-380 P. Duval et. al.
Die Spiromolekularpumpe
W. Becker Vakuum-Technik, 1988, 142-148
Eine neue Molekularpumpe
Vakuum-Technik, 7, 1958, 149-152 G. Reich
Berechnung und Messung der Abhngigkeit des Saugvermgens von
W. Armbruster Turbo-Molekularpumpen von der Gasart
Vakuumpumpenkombinationen fr Labor, Technikum und Produktion Vakuum-Technik, 1989, 3-8
Chemiker-Zeitung / Chemische Apparatur, 88, 1964, 895-899
J. Henning
W. Becker Die Entwicklung der Turbo-Molekularpumpe
Die Turbo-Molekularpumpe Vakuum in der Praxis, 1991, 28-30
Vakuum-Technik, 15, 1966, 211-218 and 254-260
D. Urban
R. Frank et al. Moderne Bildrhrenfertigung mit Turbo-Molekularpumpen
Leistungsdaten von Turbo-Molekularpumpen des Typs TURBOVAC mit Vakuum in der Praxis, 1991, 196-198
senkrecht angeordnetem Axialkompressor
Vakuum-Technik, 24, 1975, 78 -85 O. Ganschow et al.
Zuverlssigkeit von Turbo-Molekularpumpen
W. Becker Vakuum in der Praxis, 1993, 90-96
Eine gegenberstellende Betrachtung von Diffusionspumpen und
Molekularpumpen M. H. Hablanian
Ergebnisse europischer Ultrahochvakuumforschung Konstruktion und Eigenschaften von turbinenartigen Hochvakuumpumpen
Leybold-Heraeus GmbH u. Co., in its own publishing house, Cologne 1968, Vakuum in der Praxis, 1994, 20-26
41-48
J. H. Fremerey und H.-P. Kabelitz
R. Frank, E. Usselmann Turbo-Molekularpumpe mit einer neuartigen Magnetlagerung
Kohlenwasserstoffreier Betrieb mit Turbo-Molekularpumpen des Typs TUR- Vakuum-Technik, 1989, 18-22
BOVAC
Vakuum-Technik, 25, 1976, 48-51 H. P. Kabelitz and J.K. Fremerey
Turbomolecular vacuum pumps with a new magnetic bearing concept
R. Frank, E. Usselmann Vacuum 38, 1988, 673-676
Magnetgelagerte Turbo-Molekularpumpen des Typs TURBOVAC
Vakuum-Technik, 25, 1976, 141-145 E. Tazioukow et al.
Theoretical and experimental investigation of rarefied gas flow in molecular
H.-H. Henning und G. Knorr pumps
Neue luftgekhlte, lageunabhngige Turbo-Molekularpumpen fr Industrie Vakuum in Forschung und Praxis, 7, 1995, 53-56
und Forschung
Vakuum-Technik, 30, 1981, 98-101

H.-H. Henning und H. P. Caspar 2.3 Fluid entrainment pumps

Wlzlagerungen in Turbo-Molekularpumpen
Vakuum-Technik, 1982, 109-113 W. Gaede
Die Diffusion der Gase durch Quecksilberdampf bei niederen Drcken und
E. Kellner et al. die Diffusionspumpe
Einsatz von Turbo-Molekularpumpen bei Auspumpvorgngen im Grob- und Annalen der Physik, 46, 1915, 357-392
Feinvakuumbereich
Vakuum-Technik, 1983, 136-139 W. Gaede
Die ldiffusionspumpe
D. E. Gtz und H.-H. Henning Z. techn. Physik, 13, 1932, 210-212
Neue Turbo-Molekularpumpe fr berwiegend industrielle Anwendungen
Vakuum-Technik, 1988, 130-135

185
References
R. Jaeckel, H. G. Nller und H. Kutscher F. Hinrichs
Die physikalischen Vorgnge in Diffusions- und Dampfstrahlpumpen Aufbau, Betriebsverhalten und Regelbarkeit von Dampfstrahl-
Vakuum-Technik, 3, 1954, 1-15 Vakuumpumpen
Vakuum in der Praxis, 1991, 102-108
W. Bchler und H. G. Nller
Fraktionierung und Entgasung in l-Diffusionspumpen
Z. angew. Physik einschl. Nukleonik, 9, 1957, 612-616
2.4 Sorption pumps
H. G. Nller
Weshalb sind systematische Fehler bei Saugvermgensmessungen beson- G. Kienel
ders gro fr Hochvakuumpumpen groer Leistung ? Zur Desorption von Gasen in Getter-Ionenpumpen in Physik und Technik
Vakuum-Technik, 12, 1963, 291-293 von Sorptions- und Desorptionsvorgngen bei niederen Drcken
Rudolf A. Lange Verlag, 1963, Esch/Taunus, 266-270
W. Bchler und H.-J. Forth
Die wichtigsten Einflugren bei der Entwicklung von Diffusionspumpen W. Bchler
Vakuum-Technik, 13, 1964, 71-75 Ionen-Zerstuberpumen, ihre Wirkungsweise und Anwendung
Leybold-Heraeus GmbH u. Co., in its own publishing house, Cologne 1966
W. Reichelt W. Espe
Bemerkungen zur Arbeitsweise moderner Diffusionpumpen Zur Adsorption von Gasen und Dmpfen an Molekularsieben
Vakuum-Technik, 13, 1964, 148-152 Feinwerktechnik, 70, 1966, 269-273

H. G. Nller G. Kienel
Theory of Vacuum Diffusion Pumps Vakuumerzeugung durch Kondensation und durch Sorption
Handbook of Physics, Vol.1, Part 6, (pp. 323...419) Ed. A. H. Beck, Chemikerzeitung / Chem. Apparatur 91, 1967, 83-89 und 155-161
Pergamon Press Ltd., London, W.I. (1966)
H. Hoch
G. Herklotz Erzeugung von kohlenwasserstoffreiem Ultrahochvakuum
Enddruckversuche mit Diffusionspumpen hohen Saugvermgens und Vakuum-Technik, 16, 1967, 156-158
Restgasspektren
Vakuum-Technik, 20, 1971, 11 14 W. Bchler und H. Henning
Neuere Untersuchungen ber den Edelgas-Pumpmechnismus von
H. G. Nller Ionenzerstuberpumpen des Diodentyps
Die Bedeutung von Knudsenzahlen und hnlichkeitsgesetzen in Diffusions- Proc. of the Forth Intern. Vacuum Congress 1968, I. 365-368,
und Dampfstrahlpumpen Inst. of Physics, Conference Series No. 5, London
Vakuum-Technik, 26, 1977, 72-78
H. Henning
R. Gsling Der Erinnerungseffekt fr Argon bei Trioden-Ionenzerstuberpumpen
Treibmittelpumpen Vakuum-Technik, 24, 1975, 37-43
Vakuum-Technik, 1980, 163-168

M. Wutz
Grundlagen zur Bestimmung der charakteristischen Daten von 2.5 Cryopumps and cryoengineering
Dampfstrahl-Ejektorpumpen
Vakuum-Technik, 1982, 146-153 R. A. Haefer
Cryo-Pumping
H. Bayer 456 pages, 1989 Oxford University Press, Oxford
Dampfstrahlpumpen
Vakuum-Technik, 1980, 169-178 H. Frey und R-A. Haefer
Tieftemperaturtechnologie, 560 pages, VDI-Verlag, Dsseldorf, 1981
H. Bayer
Vakuumerzeugung durch Dampfstrahl-Vakuumpumpen G. Klipping und W. Mascher
Vakuum in der Praxis, 1989, 127-135 Vakuumerzeugung durch Kondensation an tiefgekhlten Flchen, I.
Kryopumpen
Vakuum-Technik, 11, 1962, 81-85

186
 References
W. Bchler, G. Klipping und W. Mascher 2.6 Oil backstreaming
Cryopump System operating down to 2,5 K, 1962 Trans. Ninth National
Vacuum Symposium, American Vacuum Society, 216-219, The Macmillan G. Levin
Company, New York A quantitativ appraisal of the backstreaming of forepump oil vapor
J. Vac. Sci. Technol. A 3 (6), 1985, 2212-2213
G. Klipping
Kryotechnik Experimentieren bei tiefen Temperaturen M. A. Baker and L. Laurenson
Chemie-Ingenieur-Technik, 36, 1964, 430-441 A quartz crystal microbalance holder for low Temperature use in vacuum
Vacuum Vol. 17, (12), 647-648, 1967 (Letters to the Editor)
M. Schinkmann
Messsen und Regeln tiefer Temperaturen, Teil I: Thermodynamische M. A. Baker and W. Steckelmacher
Verfahren The Measurement of Contamination in Vacuum Systems
Metechnik, 81, 1973, 175-181 Vuoto, scienza e technologia, Bd.3 , (1/2), 3-17, 1970

G. Schfer, M. Schinkmann J. P. Deville, L. Holland and L. Laurenson

Messsen und Regeln tiefer Temperaturen, Teil II: Elektrische Verfahren, Measurement of the rate of evaporation of Pump oils using a crystal vibra-
Metechnik, 82, 1974, 31-38 tor
3rd. Internat. Vac. Congr Stuttgart 153-160, Pergamon Press, Oxford, 1965
R. Frank et al.
Entwicklung von Refrigeratoren fr den Einbau in Kryopumpen L. Laurenson, S. Hickman and R. G. Livesey
Vakuum-Technik, 30, 1981, 134-137 Rotary pump backstreaming: An analytical appriasal of practical results and
the factors affecting them
J. J. Scheer und J. Visser J. Vac. Sci. Technol. A 6 (2), 238-242, 1988
Anwendungen von Kryopumpen in der industriellen Vakuumtechnik
Vakuum-Technik, 31, 1982, 34-45 B. D. Power, A. M. I. Mech, E. Crawley and D. J. Crawley
Sources, Measurement and Control of Backstreaming in Oil Vapour
P. Duval Vacuum Pumps
Diffusionspumpen, Turbo-Molekularpumpen oder Kryopumpen ? Vacuum, Vol. 4 (4), 415-437, 1957
Auswahlkriterien fr Hochvakuumpumpen
Vakuum-Technik, 31, 1982, 99-105 M. A. Baker
A cooled quartz crystal microbalance methode for measuring diffusion pump
H. Henning und H.-H. Klein backstreaming
Pumpen von Helium mit Refrigerator-Kryopumpen Journal of Scientific Instruments (Journal of Physics E), Series 2, Volume 1,
Vakuum-Technik, 34, 1985, 181-184 774-776, 1968

H.-H. Klein et al. N. S. Harris

Einsatz von Kryopumpen in Produktionsanlagen Diffusion pump back-streaming
Vakuum-Technik, 34, 1986, 203-211 Vacuum, Vol. 27 (9), 519-530, 1977

D. Mller und M. Sydow M. A. Baker

Kryopumpen im Vergleich mit anderen Hochvakuumpumpen Vapour and Gas Measurements in Vacuum with the Quartz Crystal
Vakuum in der Praxis, 2, 1990, 270-274 Microbalance
in Vol.1, Proceedings of the ninth Conference on Vacuum Microbalance
G. Kiese und G. Vo Techniques, Progress in Vacuum Microbalance Techniques
Kryopumpen mit neuartiger Regenerationstechnik
Vakuum in der Praxis, 4, 1992, 189-192 Th. Gast and E. Robens ed.,
Heyden & Son Ldt., London, New York, Rheine, 1970

M. A. Baker and L. Laurenson

The use of a quartz crystal microbalance for measuring vapour backstream-
ing from mechanical pumps
Vacuum, Volume 16 (11), 633-637, 1966

R. D. Oswald and D. J. Crawley

A method of measuring back migration of oil through a baffle
Vacuum, Vol. 16 (11), 623-624, 1966

187
References
M. H. Hablanian F. Grotelschen
Backstreaming Measurements above Liquid-Nitrogen Traps Das UHV-System bei DESY. 1. Teil
Vac. Sci. Tech., Vol. 6, 265-268, 1969 Vakuum in der Praxis, 4, 1991, 266-273

Z. Hulek, Z. Cespiro, R. Salomonovic, M. Setvak and J. Voltr D. Trines

Measurement of oil deposit resulting from backstreaming in a diffusion Das Strahlrohrvakuumsystem des Hera-Protonenringes
pump system by proton elastic scattering Vakuum in der Praxis, 2, 1992, 91-99
Vacuum, Vol. 41 (7-9), 1853-1855, 1990
G. Schrder et al.
M. H. Hablanian COSV- eine neue Forschungsanlage mit UHV-Technologie
Elimination of backstreaming from mechanical vacuum pumps Vakuum in der Praxis, 5, 1993, 229-235
J. Vac. Sci. Technol. A5 (4), 1987, 2612-2615
W. Jacobi
Das Vakuumsystem der GSI-Beschleunigeranlage
Vakuum in der Praxis, 6, 1994, 273-281
3. Ultrahigh vacuum technology

G. Kienel
Probleme und neuere Entwicklungen auf dem Ultrahochvakuum-Gebiet
4. Conductances, flanges,
VDI-Zeitschrift, 106, 1964, 777-786
valves, etc.

M. Knudsen
G. Kienel und E. Wanetzky
Gesetze der Molekularstrmung und der inneren Reibungsstrmung der
Eine mehrmals verwendbare Metalldichtung fr ausheizbare
Gase durch Rhren
Uktrahochvakuum-Ventile und Flanschdichtungen
Annalen der Physik, 4th issue, 28, 1909, 75-130
Vakuum-Technik, 15, 1966, 59-61

P. Clausing
H. G. Nller
ber die Strmung sehr verdnnter Gase durch Rhren von beliebiger
Physikalische und technische Voraussetzungen fr die Herstellung und
Lnge
Anwendung von UHV-Gerten.
Annalen der Physik, 5th issue, 12, 1932, 961-989
Ergebnisse europischer Ultrahochvakuum Forschung
LEYBOLD-HERAEUS GmbH u. Co., in its own publishing house, Cologne
W. Rllinger
1968, 49-58
Die Verwendung von Klammerflanschen in der Vakuumtechnik
Vakuum-Technik, 13, 1964, 42-45
W. Bchler
Probleme bei der Erzeugung von Ultrahochvakuum mit modernen Vakuum-
H. Hoch
pumpen. Ergebnisse europischer Ultrahochvakuum Forschung
Ausheizbare Verbindungen an Hochvakuum-Apparaturen
Vakuum-Technik, 10, 1961, 235-238
Leybold-Heraeus GmbH u. Co., in its own publishing house, Cologne 1968,
139-148
W. Bchler und I. Wikberg
Dual Seal Bakable Section Valves of the CERN Intersection Storage Ring
P. Readhead, J. P. Hobson und E. V. Kornelsen
Vacuum, 21, 1971, 457-459
The Physical Basis of Ultrahigh Vacuum
Chapman and Hall, London, 1968
K. Teutenberg
UHV-Ganzmetallventile groer Nennweite
E. Bergandt und H. Henning
Vakuum-Technik, 21, 1972, 169-174
Methoden zur Erzeugung von Ultrahochvakuum
Vakuum-Technik, 25,1970, 131-140
H. Henning
The approximate calculation of transmission probabilities
H. Wahl
Vacuum, 28, 1978, No. 3, Seite 151
Das Hochvakuumsystem der CERN am 450 GeV Supersynchrotron und
Speichering (SPS)
G. Khn
Vakuum in der Praxis, 1989, 43-51
Gasstrme durch Spalte im Grobvakuum
Vakuum-Technik, 33, 1984, 171-175

188
 References
R. Haberland und B. Vogt U. Beeck
UHV-Ventil fr extrem viele Schliezyklen Untersuchungen ber die Druckmessungen mit Glhkathoden-Inisations-
Vakuum-Technik, 34, 1985, 184-185 Vakuummetern im Bereich grer als 103 Torr
Vakuum-Technik, 22, 1973, 16-20
A. Sele
Vakuum-Ventile (VAT) G. Reich
Vakuum in der Praxis, 1, 1989, 206-212 ber die Mglichkeiten der Messung sehr niedriger Drcke
Metechnik, 2, 1973, 46-52
L. Fikes
Berechnung von Auspumpkurven mit Hilfe der Analogie von Gasstrom und G. Reich
elektrischem Strom Spinning rotor viscosity gauge; a transfer standard for the laboratory or an
Vakuum in der Praxis, 4, 1992, 265-268 accurate gauge for vacuum process control
J. Vac. Sci. Technol., 20 (4), 1982, 1148-1152
W. Herz
Zuverlssige Flanschverbindung im Anwendungsgebiet der Tieftemperatur- G. Reich
und Vakuumtechnik Das Gasreibungs-Vakuummeter VISCOVAC VM 210
Vakuum-Technik, 29, 1980, 67-68 Vakuum-Technik, 31, 1982, 172-178

G. Grosse and G. Messer

Calibration of Vacuum Gauges at Pressures below 109 mbar with a molec-
5. Measurement of low pressures ular beam method
Vakuum-Technik, 30, 1981, 226-231
C. Meinke und G. Reich
Vermeidung von Fehlmessungen mit dem System McLeod-Khlfalle Chr. Edelmann et al.: Mglichkeiten der Mebereichserweiterung bei
Vakuum-Technik, 12, 1963, 79-82 Glhkathoden-Ionisationsmanometern (numerous references to relevant lit-
erature)
P. A. Readhead and J. P. Hobson Vakuum-Technik, 31, 1982, 2-10
Total Pressure Measurem. below 1010 Torr with Nonmagnetic Ionisation
Gauge Chr. Edelmann
Brit. J. Appl. Phys., 16, 1965, 1555-1556 Stand und Entwicklungstendenzen der Totaldruckmessung in der Vakuum-
Technik
C. Meinke und G. Reich Vakuum-Technik, 33, 1984, 162-180
Comparison of Static and Dymanic Calibration Methods for Ionisation
Gauges J. K. Fremerey
J. Vac. Sci. Techn., 4, 1967, 356-359 Das Gasreibungsvakuummeter
Vakuum-Technik, 36, 1987, 205-209
G. Reich und W. Schulz
Probleme bei der Verwendung von Ionisations-Vakuummetern im G. Messer
Druckbereich oberhalb 102 Torr Kalibrierung von Vakuummetern
Proc. of the Fourth Intern. Vacuum Congress, 1968, Vakuum-Technik, 36, 1987, 185-192
II. Inst. of Physics Conference Series No. 6, London, 661-665
G. Messer und W. Grosse
G. Reich Entwicklung der Vakuum-Metrologie in der PTB (numerous references to
Probleme bei der Messung sehr niedriger Total- und Partialdrcke relevant literature)
Ergebnisse europischer Ultrahochvakuum Forschung Vakuum-Technik, 36, 1987, 173-184
Leybold-Heraeus GmbH u. Co., in its own publishing house, Cologne 1968,
99-106 G. Reich
Industrielle Vakuummetechnik
A. Barz and P. Kocian Vakuum-Technik, 36, 1987, 193-197
Extractor Gauge as a Nude System
J. Vac. Sci Techn. 7, 1970, 1, 200-203 L. Schmidt und E. Eichler
Die Praxis einer DKD-Kalibrierstelle
U. Beeck and G. Reich Vakuum-Technik, 36, 1987, 78-82
Comparison of the Pressure Indication of a Bayard-Alpert and an Extractor
Gauge C. Kndig
J. Vac. Sci. and Techn. 9, 1972, 1,126-128 Vakuummegerte fr Totaldruck
Vakuum in der Praxis, 2, 1990, 167-176

189
References
Chr. Edelmann R. Heinen und W. Schwarz
Glhkahtoden-Ionisationsmanometer fr hohe Drcke im Vakuumbereich Druckregelung bei Vakuumprozessen durch umrichtergespeiste
Vakuum in der Praxis, 3, 1991, 290-296 Rootspumpen
Vakuum-Technik, 35, 1986, 231-236
M. Ruschitzka and W. Jitschin
Physikalische Grundlagen des Wrmeleitungsvakuummeters
Vakuum in der Praxis, 4, 1992, 37-43
7. Mass spectrometer gas analysis at low
T. Koopmann pressures
Neue Trends in der Vakuum-Metechnik
Vakuum in der Praxis, 5, 1993, 249-254 H. Hoch
Total- und Partialdruckmessungen bei Drcken zwischen 2 1010 und 2
Chr. Edelmann 102 Torr
Die Entwicklung der Totaldruckmessung im UHV- und Vakuum-Technik, 16, 1967, 8-13
Extremvakuumbereich
Vakuum in der Praxis, 6, 1994, 213-219 H. Junge
Partialdruckmessung und Partialdruckmegerte
W. Jitschin G-I-T May 1967, 389-394 and June 1967, 533-538
Kalibrierung, Abnahme und Zertifizierung (with numerous references to rel-
evant literature) A. Kluge
Vakuum in der Praxis, 6, 1994, 193-204 Ein neues Quadrupolmassenspektrometer mit massenunabhngiger
Empfindlichkeit
W. Jitschin Vakuum-Technik, 23, 1974, 168-171
Obere Mebereichsgrenze von Glhkatoden-Ionisationsvakuummetern
Vakuum in Forschung und Praxis, 7, 1995, 47-48 S. Burzynski
Microprocessor controlled quadrupole mass spectrometer
F. Mertens et al. Vacuum, 32, 1982, 163-168
Einflu von Gasadsorbaten auf die Eigenschaften eines Glhkatoden-
Ionisationsvakuummeters mit axialer Emission nach Chen und Suen W. Groe Bley
Vakuum in der Praxis, 7, 1995, 145-149 Quantitative Gasanalyse mit dem Quadrupol Massenspektrometer
Vakuum-Technik, 38, 1989, 9-17

A. J. B. Robertson
6. Pressure monitoring, control Mass Spectrometry
and regulation Methuen & Co, Ltd., London, 1954

K. G. Mller C. Brunee und H. Voshage

Betriebsberwachung, Steuerung und Automatisierung von Vakuumanlagen Massenspektrometrie
Chemie-Ingenieur-Technik, 35, 1963, 73-77 Karl Thiemig Verlag, Mnchen, 1964

G. Kienel A. Cornu and R. Massot

Elektrische Schaltgerte der Vakuumtechnik Compilation of Mass Spectral Data
Elektro-Technik, 50, 1968, 5-6 Heyden and Son Ltd., London, 1966

A. Bolz, H. Dohmen und H.-J. Schubert P. Dawson

Prozedruckregelung in der Vakuumtechnik Quadrupole Mass Spectroscopy
Leybold Firmendruckschrift 179.54.01 Elsevier, Amsterdam, 1976

H. Dohmen J. Backus
Vakuumdruckmessung und -Regelung in der chemischen Chap. 11 in Characteristics of Electrical Discharges in Magnetic Fields
Verfahrenstechnik National Nuclear Energy Series, Div. I, Vol. 5, McGraw-Hill Book Company
Vakuum in der Praxis, 6,1994, 113-115 Inc., New York, 1949

N. Pchheim J. Backus
Druckregelung in Vakuumsystemen University of California Radiation Laboratory Report, RL 20.6.36, Mar. 1945.
Vakuum in Forschung und Praxis, 7, 1995, 39-46

190
 References
8. Leaks and leak detection W. Groe Bley
Moderne He-Leckdetektoren unterschiedlicher Prinzipien im praktischen
8.1 Mass spectrometer leak detection Einsatz
Vakuum in der Praxis, 1, 1989, 201-205
G. Kienel
Lecksuche an Vakuumanlagen auf elektrischem Wege H. D. Brger
Elektrotechnik, 49, 1967, 592-594 Lecksucher (with references to relevant literature)
Vakuum in der Praxis, 2, 1990, 56-58
U. Beeck
Mglichkeiten und Grenzen der automatischen Lecksuche im Bereich unter W. Fuhrmann
108 Torr. l/s Einfhrung in die industrielle Dichtheitsprftechnik
Vakuum-Technik, 23, 1974, 77-80 Vakuum in der Praxis, 3, 1991, 188-195
Lecksuche an Chemieanlagen
Dechema Monographien (Ed. H. E. Bhler and K. Steiger), Vol. 89, Verlag W. Fuhrmann
Chemie, Weinheim / New York Industrielle Dichtheitsprfung ohne Testgas nach dem
Massenspektrometrieverfahren
W. Jansen Vakuum in Forschung und Praxis, 7, 1995, 179 -182
Grundlagen der Dichtheitsprfung mit Hilfe von Testgasen
Vakuum-Technik, 29, 1980, 105-113

K. Paasche 8.2 Leak detection with halogen leak detectors

Lecksuche an Chemieanlagen
Vakuum-Technik, 29, 1980, 227-231 H. Moesta und P. Schuff
ber den thermionischen Halogendetektor
H. B. Brger Berichte der Bunsengesellschaft fr physikaische Chemie,
Lecksuche an Chemieanlagen mit He-Massenspektrometer-Lecksuchern Bd. 69, 895-900, 1965
Vakuum-Technik, 29, 1980, 232-245 Verlag Chemie, GmbH, Weinheim, Bergstrae

Chr. Falland J. C. Leh and Chih-shun Lu

Ein neuer Universal-Lecksucher mit luftgekhlter Turbo-Molekularpumpe US Patent Nr. 3,751,968
Vakuum-Technik, 29, 1980, 205-208 Solid State Sensor

W. Jansen
Grundlagen der Dichtheitsprfung mit Hilfe von technischen Gasen
Vakuum-Technik, 29, 1980, 105-113 9. Film thickness measurement and control

H. Mennenga G. Z. Sauerbrey
Dichtheitsprfung von Kleinteilen Phys. Verhandl. 8, 113, 1957
Vakuum-Technik, 29, 1980, 195-200
G. Z. Sauerbrey
Chr. Falland Verwendung von Schwingquarzen zur Wgung dnner Schichten und zur
Entwicklung von He-Lecksuchtechniken fr UHV-Systeme groer Mikrowgung
Beschleuniger- und Speicherringe Zeitschrift fr Physik 155, 206-222, 1959
Vakuum-Technik, 30, 1981, 41-44 L. Holland, L. Laurenson and J. P. Deville
Use of a Quartz Crystal Vibrator in Vacuum Destillation Invstigations
W. Engelhardt et al. Nature, 206 (4987), 883-885, 1965
Lecksuchanlagen in der Industrie
Vakuum-Technik, 33, 1984, 238-241 R. Bechmann
ber die Temperaturabhngigkeit der Frequenz von AT- und BT-
G. Snger et al. Quarzresonatoren
ber die Lecksuche bei Raumfahrzeugen Archiv fr Elektronik und bertragungstechnik, Bd. 9, 513-518, 1955
Vakuum-Technik, 33, 1984, 42-47

W. Jitschin et al.
He-Diffusionslecks als sekundre Normale fr den Gasdurchflu
Vakuum-Technik, 36, 1987, 230-233

191
References
K. H. Behrndt and R. W. Love H. F. Tiersten and R. C. Smythe
Automatic control of Film Deposition Rate with the crystal oscillator for An analysis of contowced crystal resonators operating in overtones of cou-
preparation of alloy films. pled thickness shear and thickness twist.
Vacuum 12 ,1-9, 1962 J. Acoustic Soc. Am. 65, (6) 1455, 1979

P. Lostis R. E. Bennett, C. Rutkoeski and L. A. Taylor

Automatic Control of Film Deposition Rate with the Crystal Oscillator for Proceedings of the Thirteenth Annual Symposium on Frequency Controll,
Preparation fo Alloy Films. 479, 1959
Rev. Opt. 38, 1 (1959)
Chih-shun Lu
K. H. Behrndt Improving the accuracy of Quartz csystal monitors
Longterm operation of crystal oscillators in thin film deposition Research/Development, Vol. 25, 45-50, 1974, Technical Publishing
J. Vac. Sci. Technol. 8, 622 (1971) Company

L. Wimmer, S. Hertl, J. Hemetsberger and E. Benes A. Wajid

New method of measuring vibration amplitudes of quartz crystals. Improving the accuracy of a quartz crystal microbalance with automatic
Rev. Sci. Instruments 55 (4) , 608, 1984 determination of acoustic impedance ratio.
Rev. Sci. Instruments, Vol. 62 (8), 2026-2033, 1991
P. J. Cumpson and M. P. Seah
Meas. Sci. Technol., 1, 548, 1990 D. Graham and R. C. Lanthrop
The Synthesis fo Optimum Transient Response: Criteria and Standard
J. G. Miller and D. I. Bolef Forms
Sensitivity Enhancement by the use of Acoustic Resonators in cw Transactions IEEE, Vol. 72 pt. II, Nov. 1953
Ultrasonic Spectroscopy.
J. Appl. Phys. 39, 4589, (1968) A. M. Lopez, J. A. Miller, C. L. Smith and P. W. Murrill
Tuning Controllers with Error-Integral Criteria
J. G. Miller and D. I. Bolef Instrumentation Technology, Nov. 1969
Acoustic Wave Analysis of the Operation of Quartz Crystal Film Thickness
Monitors. C. L. Smith and P. W. Murril
J. Appl. Phys. 39, 5815, (1968) A More Precise Method for Tuning Controllers
ISA Journal, May 1966
C. Lu and O. Lewis
Investigation of Film thickness determination by oscillating quartz res- G. H. Cohen and G. A. Coon
onators with large mass load. Theoretical considerations of Retarded Control
J. Appl. Phys. 43, 4385 (1972) Taylor Technical Data Sheet Taylor Instrument Companies, Rochester, New
York
C. Lu
Mas determination with piezoelectric quartz crystal resonators. J. G. Ziegler and N. B. Nichols
J. Vac. Sci. Technol. Vol. 12 (1), 581-582, 1975 Optimum Settings for Automatic Controllers
Taylor Technical Data Sheet No. TDS 10A100, Taylor Instrument
A. Wajid Companies, Rochester, New York
U.S. Patent No. 505,112,642 (May 12, 1992)
C. Lu and A. W. Czanderna
C. Hurd Application of Piezoelectric Quarz Crystal Microbalances (Vol.7 of:
U.S. Patent No. 5,117,192 (May 26, 1992) Methodes and Phenomena, Their Applications in Sience and Technology)
Elesvier, Amsterdam, Oxford, New York, Tokio, 1984
E. Benes
Improved Qartz Crystal Microbalance Technique G. Simmons and H. Wang
J. Appl. Phys. 56, (3), 608-626 (1984) Single Crystal Elastic Constants and Calculated Aggregate Properties A
Handbook
C. J. Wilson The MIT Press, Cambridge, Massachusetts, 1971
Vibration modes of AT-cut convex quartz resonators.
J. Phys. d 7, 2449, (1974) C. D. Stockbridge
in Vol. 5 Vacuum Microbalance Techniques K. Behrndt, editor, Plenum
Press, Inc., New York, 1966

192
 References
S. Sotier Vakuumgerechte Werkstoffe und Verbindungstechnik, Part 3
Schwingquarz-Schichtdickenmessung Vakuum in der Praxis, 2, 1990, 179-184
Vakuum in der Praxis 1992, 182-188

11. Dictionaries
10. Materials and material processing
F. Weber
W. Espe Elseviers Dictionary of High Vacuum
Werkstoffkunde der Hochvakuumtechnik Science and Technology (German, English, French, Spanish, Italian,
Vol. 1 1959, Vol. 2 1960, Vol. 3 1961, Russian)
VEB Deutscher Verlag der Wissenschaften, Berlin Elsevier Verlag 1968

W. Espe Hurrle / Jablonski / Roth

Werkstoffe fr trennbare metallische Verbindungen der Technical Dictionary of Vacuum Physics and Vacuum Technology (German,
Ultrahochvakuumtechnik English, French, Russian)
Feinwerktechnik, 68, 1964, 131-140 Pergamon Press Verlag, Oxford, 1972

W. Espe
Synthetische Zeolithe und ihre Verwendung in der Hochvakuumtechnik
Experimentelle Technik der Physik, XII, 1964, 293-308

H. Adam
Allgemeiner berblick ber die Werkstoffe der Vakuumtechnik und deren
Auswahl
Haus der Technik Vortragsverffentlichungen Werkstoffe und
Werkstoffverbindungen in der Vakuumtechnik H. 172, Vulkan-Verlag, Dr.
W. Classen, Essen, 1968, 4 13

K. Verfu
Bessere Oberflchenvergtung durch Elektropolieren am Beispiel der
Vakuum-Technik
VDI-Berichte, 183, 1972, 29-34

K. Verfu
Schweien und Hartlten
Haus der Technik, Vortragsverffentlichungen Werkstoffe und Werkstoffver-
bindungen in der Vakuumtechnik, H. 172
Vulkan-Verlag Dr. W. Classen, Essen, 1968, Seiten 39 -49

Chr. Edelmann
Gasabgabe von Festkrpern im Vakuum
Vakuum-Technik, 38, 1989, 223-243

R. Fritsch
Besonderheiten vakuumdichrter Schweiverbindungen
Vakuum-Technik, 38, 1989, 94-102

H. Henning
Vakuumgerechte Werkstoffe und Verbindungstechnik, Part 1
Vakuum in der Praxis, 2, 1990, 30-34

R. Fritsch
Vakuumgerechte Werkstoffe und Verbindungstechnik, Part 2
Vakuum in der Praxis, 2, 1990, 104-112

M. Mhlloff

193
Index
13. Index Claw pump . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .31
Closed ion source, (CIS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99
Coating of parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .135
Absolute pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Coating thickness regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .130
Absorption isotherms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50 Cold cap baffle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Absorption pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50, 144 Cold cathode ionization vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . .83
Absorption traps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38 Cold head . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
Accessories for rotary displacement pumps . . . . . . . . . . . . . . . . . . . . . . .38 Cold surfaces, bonding of gases to . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .56
Active oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127, 128 Cold traps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Adjustment and calibration of vacuum gauges . . . . . . . . . . . . . . . . . . . . .86 Collision frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12
Adsorption pumps,Instructions for operation . . . . . . . . . . . . . . . . . .144, 145 Collision rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12
Aggressive vapors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .140 Common solvents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1451
AGM (aggressive gas monitor) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99 Compression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .47, 48, 49
Air, atmospheric . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Compression vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79
ALLex pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .32, 35 Condensate traps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38
Ambient pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Condensers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38, 182
Amonton's law . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Conductance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11, 15
Anticreep barrier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .45 Conductance of openings . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17, 187, 188
Anti-suckback valve . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22 Conductance of piping . . . . . . . . . . . . . . . . . . . . . . . . . . . .16, 161, 187, 188
APIEZON AP 201 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44, 166 Conductance, nomographic determination . . . . . . . . . . . . . . . . . . . . . . . .18
Atmospheric air . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Conductances, calculation of . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
Atmospheric air, composition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150 Connection of leak detectors to vacuum systems . . . . . . . . . . . . . . . . . .121
Atmospheric pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Contamination of vacuum sensors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .144
Atomic units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .177 Contamination of vacuum vessels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .139
Autoc ontrol tune . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .131 Continous flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Automatic protection, monitoring and control of vacuum systems . . . . . .89 Continous flow cryopumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54
Auto-Z match technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .129 Continuum theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
Avogadro's law . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Conversion of leak rate units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112
Avogadro's number (Loschmidt number) . . . . . . . . . . . . . . . . . . . . . .14, 148 Conversion of leak rate units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .149
Backing line vessel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .69 Conversion of pressure units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .147
Baffle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41 Conversion of pV-throughput units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .149
Baffles (vapor barriers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41, 42, 44 Corrosion protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .141
Baking (degassing) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60, 73, 146 Counter-flow leak detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .120
Barrier gas operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50 Cracking pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
Basis SI units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .176 Critical pressure difference (choked flow) . . . . . . . . . . . . . . . . . . . . . . . . .15
Bath cryostats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54 Crossover value . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58
Bayard-Alpert gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86 Cryocondensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
Boat (thermal evaporator) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133 Cryopumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54, 186
Boltzmann constant . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14, 148 Cryosorption . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
Bombing-Test (storing under pressure) . . . . . . . . . . . . . . . . . . . . . . . . . .123 Cryotrapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
Booster (oil-jet) pump . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43, 51 Crystal Six . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125
Bourdon vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77 Cut in (start) pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49, 60
Boyle-Mariotte law . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 CVD (chemical vapor deposition) . . . . . . . . . . . . . . . . . . . . . . . . . .133, 134
Break down voltage (Paschen curve for air) . . . . . . . . . . . . . . . . . . . . . .169 Dalton's law . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
Bubble (immersion) test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115 Danger classes of fluids . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .153
Calibration curves of THERMOVAC gauges . . . . . . . . . . . . . . . . . . . . . . .82 Data storage coating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .137
Calibration inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86 DC 704, DC 705 (Silicone oils) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Coating sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133 Degassing of the pump oil . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42
Capacitance diaphragm gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78 Derived coherent and not coherent SI units with special
Capsule vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77 names and symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .177
Causes of faults if/when the desired ultimate pressure Detection limit (leak detectors) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117
is not achieved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .139 Determination of a suitable backing pump . . . . . . . . . . . . . . . . . . . . . . . . .69
Ceramic ball bearings (hybrid ball bearings) . . . . . . . . . . . . . . . . . . . . . . .47 Determination of pump down time from Nomograms . . . . . . . . . . . . . . . .70
CF-flange (conflathflange) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73 Determination of pump sizes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .66
Changing the molecular sieve . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .144 DI series diffusion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42
Charles' law (Gay-Lussac's law) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Diaphragm contoller, examples of application . . . . . . . . . . . . . . . . . . .91, 92
Chemical resistance of elastomer gaskets . . . . . . . . . . . . . . .154, 155, 156 Diaphragm vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
Chemical vapor deposition (CVD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .134 Diaphragm vacuum pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20
Choked flow, critical pressure difference . . . . . . . . . . . . . . . . . . . . . . . . . .15 DIAVAC diaphragm vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77
CIS (closed ion source) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99 DIFFELEN, light, normal, ultra . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44, 166
Clamp flange . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73 Diffusion / vapor-jet pumps, Instructions for operation . . . . . . . . . . . . . .144
Classification of vacuum pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19 Diffusion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41
Clausius-Clapeyron equation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Diode-type sputter ion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52

194
 Index
Direct-flow leak detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .120 HY.CONE pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Discharge filters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38 Hybrid ball bearings (Ceramic ball bearings) . . . . . . . . . . . . . . . . . . . . . .47
Displacement pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19, 20, 182 Hydrocarbon-free vacuum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44, 65
DIVAC vacuum pump . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 IC 5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .131
DKD (Deutscher Kalibrierdienst) German calibration service . . . . . . . . . .87 Ideal gas law . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9, 13
Dry compressing rotary displacement pumps . . . . . . . . . . . . . . . . . . . . . .27 Impingement rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12
Dry processes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62 Industrial leak testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .124
Drying of paper . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .72 Influence of magnetic / electrical fields . . . . . . . . . . . . . . . . . . . . . . . . . .146
Drying processes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64 Internal compression (claw pumps) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .32
Drying processes, selection of pumps for . . . . . . . . . . . . . . . . . . . . . . . . .71 Inside-out leak . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112
DRYVAC-Pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33 Integral leak rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
D-Tek . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116 Internal reflow (roots pumps) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
Duo seal (sealing passage) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20, 21, 22 Ion desorption effect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85
Dust separator (dust filter) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38 Ion sputter pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50, 51
Dynamic expansion method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88 Ionization vacuum gauge for higher pressures up to 1 mbar . . . . . . . . . .85
ECOTEC II . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119 Ionization vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .83
Effective pumping speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38, 67 Ionization, specific (gas analysis) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
Elastomer gaskets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .74, 154, 155, 156 Isotopes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102
Electrical break down voltage(Paschen curve air) . . . . . . . . . . . . . . . . . .169 Kammerer compression vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . .79
Electron beam evaporators (electron guns) . . . . . . . . . . . . . . . . . . . . . . .134 Kinetic gas theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
Envelope test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122, 123 Kinetic of gases, diagram of . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .160
Envelope test (concentration measurement) . . . . . . . . . . . . . . . . . . . . . .123 Kinetic of gases, formulas . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .148
Evacuation in the rough / medium / high vacuum region . . . . . . .66, 67, 68 Knudsen flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Evacuation of gases / vapors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71 Krypton 85 test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115
Evaluating spectra . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .102 Laminar flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Expansion method static / dynamic . . . . . . . . . . . . . . . . . . . . . . . . . . .87, 88 Langmuir-Taylor-effect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117
Extractor ionization vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86 Laval nozzle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43
Fast regeneration (partial regeneration) . . . . . . . . . . . . . . . . . . . . . . . . . .58 Leak detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110, 190
Fingerprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103 Leak detection using Helium leak detectors . . . . . . . . . . . . . . . . . . . . . .122
Flanges and their seals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73, 187 Leak detection without leak detector . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
Floating zero-point suppression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117 Leak detection, leak test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110
Fluid entrainment pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40, 185 Leak detectors with 180 sector mass spectrometer . . . . . . . . . . . . . . . .119
Foam spray leak test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115 Leak detectors with mass spectrometer . . . . . . . . . . . . . . . . . . . . . .116, 190
Fractionation of pump fluids . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42 Leak detectors with quadrupole mass spectrometer . . . . . . . . . . . . . . . .119
Fragment distribution pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103 Leak detectors, how they work . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116
Fundamental pressure measurement methods . . . . . . . . . . . . . . . . . . . . .87 Leak rate, hole size, conversion . . . . . . . . . . . . . . . . . . . . .12, 110, 111, 112
Gas analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95, 106, 107, 190 Leak test (chemical reactions, dye penetration) . . . . . . . . . . . . . . . . . . . .115
Gas ballast . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24, 25, 117 Leak test, using vacuum gauges sensitive to the type of gas . . . . . . . . .114
Gas composition as a function of altitude . . . . . . . . . . . . . . . . . . . . . . . .161 LEYBODIFF Pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42
Gas constant, general (molar) . . . . . . . . . . . . . . . . . . . . . . . . . . . .9, 14, 149 LEYBOLD-INFICON Quartz crystal controllers . . . . . . . . . . . . . . . . . . . .131
Gas density . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Line width . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
Gas dependent pressure reading, vacuum gauges with . . . . . . . . . . . . . .81 Linearity range of quadrupole sensors . . . . . . . . . . . . . . . . . . . . . . . . . . .102
Gas discharge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51, 83 Liquid filled (mercury) vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . .79
Gas independent pressure reading, vacuum gauges with . . . . . . . . . . . . .77 Liquid ring pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20
Gas laws . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Liquid sealed rotary displacement pumps . . . . . . . . . . . . . . . . . . . . . . . . .20
Gas locks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .75 Liquid-filled vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79
Gas sorption (pumping) of vacuum gauges . . . . . . . . . . . . . . . . . . . . .83, 84 Literature references . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .182 193
Gas storage in the oil of rotary vane pumps . . . . . . . . . . . . . . . . . . . . . .117 LN2 cold traps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Gaskets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73, 154, 155, 156 Local leak rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112
Gay-Lussac's law . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 Loschmidt's number (Avogadro constant) . . . . . . . . . . . . . . . . . . . . .14, 148
General gas constant (Molar gas constant) . . . . . . . . . . . . . . . . . .9, 14, 148 Magnetic suspension (bearings) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .47, 48
Getter pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50 Mass flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11, 108
Glass coating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .137 Mass flow (leak detection) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .108
Halogen leak detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116, 191 Mass range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
Helium leak detectors with 180 sector mass spectrometer . . . . . .114, 115 Mass spectrometer, general, historical . . . . . . . . . . . . . . . . . . . . . . .95, 190
Helium spray equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122 Maximum backing pressure (critical forevacuum pressure) . . . . . . . . . . .41
Helium standard leak rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112 McLeod vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79
High frequency vacuum test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115 Mean free path . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12, 147, 160
High pressure ionization vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . .86 Measuring range of vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . .168
High vacuum range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .67, 68 Measuring range, favorable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76
HLD 4000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116 Measuring ranges of vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . .168
HO-factor (diffusion pumps) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42 Measuring vacuum, vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . .76, 189
Hot cathode ionization vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . .84 Medium vacuum adsorption trap . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38

195
Index
MEMBRANOVAC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78 Poisson's law . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
Mercury (pump fluid) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41, 44,166 Positive pressure methode (leak detection) . . . . . . . . . . . . . . . . . . . . . . .112
Mode-lock oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .128 Pre-admission cooling (roots pumps) . . . . . . . . . . . . . . . . . . . . . . . . . . . .31
Molar gas constant . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9, 14, 148 Precision diaphragm vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78
Molar mass (molecular weight) . . . . . . . . . . . . . . . . . . . . . . . . . . . .9, 12, 13 Pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
Molecular flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 Pressure and temperature as function of altitude . . . . . . . . . . . . . . . . . .161
Molecular sieve . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50, 145 Pressure converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99
Monolayer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12 Pressure dependence of the mean free path . . . . . . . . . . . . . . . . .150, 160
Monolayer formation time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12, 16, 65 Pressure difference oil supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
National standards, resetting to . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86 Pressure lubrication by geared oil pump . . . . . . . . . . . . . . . . . . . . . . . . . .22
NEG pumps (non evaporable getter pumps) . . . . . . . . . . . . . . . . . . .50, 53 Pressure measurement direct / indirect . . . . . . . . . . . . . . . . . . . . . . .76, 189
Neoprene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73, 154, 155, 156 Pressure measurement, depending on / independent
Nitrogen equivalent . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76, 83 of the type of gas . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76
Nominal internal diameter and internal diameter of tubes . . . . . . . . . . . .151 Pressure ranges in vacuum technology . . . . . . . . . . . . . . . .14, 60, 61, 150
Nomogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70 Pressure regulation / control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88, 190
Nomogram: conductance of tubes / entire pressure range . . . . . . . . . . .164 Pressure regulation / control rough and medium vacuum systems . . . . .90
Nomogram: conductance of tubes / laminar flow range . . . . . . . . . . . . .161 Pressure regulation in high and ultra high vacuum systems . . . . . . . . . .92
Nomogram: conductance of tubes / molecular flow range . . . . . . .161, 163 Pressure regulation, continuous / discontinuous . . . . . . . . . . . . . . . .90, 91
Nomogram: pump down time / medium vacuum, taking in Pressure rise / drop (leak) test . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113, 114
account the outgasing from the walls . . . . . . . . . . . . . . . . . . . . . . . . . . .165 Pressure units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9, 147
Nomogram: pump down time / rough vacuum . . . . . . . . . . . . . . . . . . . . .162 PTB (Federal physical-technical institute) . . . . . . . . . . . . . . . . . . . . . . . . .86
Non evaporable getter (NEG) pumps . . . . . . . . . . . . . . . . . . . . . . . . .50, 53 Pumpdown time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .66 - 71
Non gas-tight area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110 Pump fluid . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Nude gauge (nude system) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .77 Pump fluid backstreaming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Oil backstreaming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44, 186 Pump fluid change cleaning (diffusion pumps) . . . . . . . . . . . . . . . . . . . .144
Oil change . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .139 Pump oil, selection when handling aggressive vapors . . . . . . . . . . . . . .140
Oil consumption . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .139, 140, 141, 142 Pump throughput . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
Oil contamination . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .139 Pumping (gas sorption) of vacuum gauges . . . . . . . . . . . . . . . . . . . . .83, 84
Oil diffusion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41 Pumping chamber . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
Oil sealed rotary displacement pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 Pumping of gases . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62
Oil vapor ejector vacuum pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43 Pumping of gases and vapors . . . . . . . . . . . . . . .24, 25, 40, 57, 62, 63, 140
Oil-free (hydrocarbon-free) vacuum . . . . . . . . . . . . . . . . . . . . . . . . . . .44, 65 Pumping speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Oils (pump fluids) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44 Pumping speed units, conversion of . . . . . . . . . . . . . . . . . . . . . . . . . . . .149
Open (normal) ion source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96 Pumping various chemical substances . . . . . . . . . . . . . . . . . . . . . . . . . .141
Optical coatings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .136 Purge gas . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .34
Oscillation displacement pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 PVD (physical vapor deposition) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133
Oscillator, ( active, mode-lock) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127, 128 pV-flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Outgasing of materials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150 pV-value . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Outgasing rate (referred to surface area) . . . . . . . . . . . . . . . . . . . . . .12, 65 Quadrupole mass spectrometer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96
Outside-in leak . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112 Quadrupole, design of the sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96
Overpressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Quadrupole, gas admission / pressure adaptation . . . . . . . . . . . . . . . . . .99
Oxide-coated cathodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84, 96 Quadrupole, measurement system (detector) . . . . . . . . . . . . . . . . . . . . . .98
Partial final pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79 Quadrupole, separating system . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .97
Partial flow opeartion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .120 Quadrupole, specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
Partial flow ratio . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .121 Qualitative gas analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .106
Partial pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Quantitative gas analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .107
Partial pressure measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .106 Quantity of gas (pV value) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Partial pressure regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .109 Quartz crystals, shape of . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .126
Particle number density . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Rate watcher . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125
Paschen curve . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .169 Reduction of adsorption capacity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .144
Penning vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .83 Reduction ratio . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27, 28, 142
Perbunan . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73, 156, 167 Refrigerator cryopump . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54, 56
Period measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127 Regeneration time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .58
Permissible pressure units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .147 Relative ionization probability (RIP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
Phase diagram of water . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .170 Residual gas composition (spectrum) . . . . . . . . . . . . . . . . . . . . . . . . .49, 50
Photons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85 Response time of leak detectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122
PIEZOVAC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .78 Reynold's number . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Pirani vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .81, 82 Rigid envelope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .123
Plastic tent (envelope) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .123 Roots pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
Plate baffle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44 Roots pumps, Instructions for operation . . . . . . . . . . . . . . . . . . . . . . . . .142
PNEUROP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .178 181 Rotary displacement pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
PNEUROP flanges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73 Rotary plunger pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
Poiseuille flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 Rotary vane / piston pumps, Instructions for operation . . . . . . . . . . . . . .140

196
 Index
Rotary vane pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 Torr and its conversion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .147
Salt, drying of . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71 Total pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
Saturation vapor pressure (nonmetallic gaskets) . . . . . . . . . . . . . . . . . . .167 Transfer standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87
Saturation vapor pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9, 26 Transmitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .81
Saturation vapor pressure (cryogenic technology) . . . . . . . . . . . . . . . . .167 TRANSPECTOR . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96
Saturation vapor pressure (metals) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .166 Triode sputter ion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52
Saturation vapor pressure (pump fluids) . . . . . . . . . . . . . . . . . . . . . . . . .166 TRIVAC pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
Saturation vapor pressure (solvents) . . . . . . . . . . . . . . . . . . . . . . . . . . . .166 Trochoid pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24
Saturation vapor pressure and vapor density of water . . . . . . . . . .152, 170 Tuning / adjustment and calibration of leak detectors . . . . . . . . . . . . . . .118
Sealing passage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20, 21 Turbomolecular pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46, 185
Seal-off fitting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .75 Turbomolecular pumps, Instructions for operation . . . . . . . . . . . . . . . . . .143
Selection of pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60 TURBOVAC pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50
Selection of pumps for drying processes . . . . . . . . . . . . . . . . . . . . . . . . . .71 Turbulent flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Sensitivity of quadrupole sensors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101 Types of leak . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110
Sensitivity of vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84 Types pV flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14
Separating system of mass spectrometers . . . . . . . . . . . . . . . . . . . . . . . .96 UL 200 dry, UL 500 dry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .118
Shell baffle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44 UL 200, UL 500 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119
Silicone oils, DC 704, DC 705 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44, 166 Ultimate pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
Small flange . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73 Ultra high vacuum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14, 16, 65, 66, 188
Smallest detectable concentration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101 ULTRALEN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .45, 160
Smallest detectable partial pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . .101 Units, symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .171 177
Smallest detectable partial pressure ratio . . . . . . . . . . . . . . . . . . . . . . . .101 U-tube vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79
Sniffer technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .123 Vacumm meters, instructions on installing . . . . . . . . . . . . . . . . . . . . . . . .145
Software for TRANSPECTOR . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .108 Vacuum coating techniques . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .135
SOGEVAC pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 Vacuum control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76
Solvents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .151 Vacuum equipment, Instructions for operation . . . . . . . . . . . . . . . . . . . . .139
Sorption pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50, 186 Vacuum gauge contant . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84
Specific volume of water vapor . . . . . . . . . . . . . . . . . . . . . . . . . . . .152, 169 Vacuum method (leak detection) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
Spinning rotor gauge (SRG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .81 Vacuum physics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
Spray technique (Helium) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122 Vacuum pumps, literature references . . . . . . . . . . . . . . . . . . . . . . . . . . .182
Sputter ion pumps, Instructions for operation . . . . . . . . . . . . . . . . . . . . .145 Vacuum pumps, survey, classification . . . . . . . . . . . . . . . . . . . . . . . . .19, 20
Sputter pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50 Vacuum ranges (Pressure ranges) . . . . . . . . . . . . . . . . . . . . . . . . . . .16, 59,
Sputtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .134 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .61, 150, 167, 168
Sputtering (cathode sputtering) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .134 Vacuum regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76
Sputter-ion pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50, 51 Vacuum symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .157, 158, 159
SRG (spinning rotor gauge), VISCOVAC . . . . . . . . . . . . . . . . . . . . . . . . . .81 Vacuum coating technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133
Stability for noble gases (sputter ion pumps) . . . . . . . . . . . . . . . .51, 52, 53 Values of important physical constants . . . . . . . . . . . . . . . . . . . . . . . . . .149
Standard pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 Valves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73, 188
Standards in vacuum technology . . . . . . . . . . . . . . . . . . . . . . . . . .178 181 Van der Waals' equation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
Static expansion method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87, 88 Vapor density of water . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .152, 170
Steam ejector pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46 Vapor pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9, 43, 166, 167, 170
Storage under pressure (bombing test) . . . . . . . . . . . . . . . . . . . . . . . . . .123 Vapor-jet pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41, 43, 46, 144
Stray magnetic field . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52 Venturi nozzle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43
Stray magnetic field (sputter ion pumps) . . . . . . . . . . . . . . . . . . . . . . . . . .52 Viscous (continuum) flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Sublimation pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50, 51 VISCOVAC vacuum gauge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .81
Symbols and units, alphabetical list . . . . . . . . . . . . . . . . . . . . . . . .171 174 Vitilan, Viton . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73, 156, 167
Symbols used in vacuum technology . . . . . . . . . . . . . . . . . . .157, 158, 159 Volume . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Temperature comparison and conversion table . . . . . . . . . . . . . . . . . . . .160 Volumetric efficiency (roots pumps) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
Temperature in the atmosphere . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .161 Volumetric flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Terms and definitions (leak detection) . . . . . . . . . . . . . . . . . . . . . . . . . . .112 Water jet pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .45
Test gas accumulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .124 Water ring pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
Test leaks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .118 Water vapor tolerance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26
Thermal conductivity vacuum gauge, constant / variable resistance . . . .82 Web coating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .135
Thermal conductivity vacuum gauges . . . . . . . . . . . . . . . . . . . . . . . . . . . .82 Wet processes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .62
Thermal evaporator (boat) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .133 Working pressure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
THERMOVAC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .81 Working ranges of vacuum pumps . . . . . . . . . . . . . . . . . . . . . . . . . . . . .167
Thickness control with quartz oscillators . . . . . . . . . . . . . . . . . . . . . . . . .125 X-ray effect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85
Thickness measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125 XTC, XTM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .131
Thin film controllers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .125, 131, 191 Zeolith . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50
Throtteling of pumping speed when using condensers . . . . . . . . . . . .39, 40 Z-Match technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .127
Time constant . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .67, 121
Titanium sublimation pump . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51
Titanium sublimation pumps, Instructions for operation . . . . . . . . . . . . . .145

197
www.oerlikon.com

Headquarter Germany
Oerlikon
Leybold Vacuum GmbH
Bonner Strasse 498
D-50968 Cologne
T +49 (0) 221-347-0
F +49 (0) 221-347-1250
[email protected]