System Microscope

BX53M/BXFM
BX3M Series

Advanced Microscopy Simplified

 Designed for Industrial and
Materials Science Applications

Designed with modularity in mind, the BX3M series provide versatility for a wide
variety of materials science and industrial applications. With improved integration with
OLYMPUS Stream software, the BX3M provides a seamless workflow for standard
microscopy and digital imaging users from observation to report creation.

Functions marked with this icon require OLYMPUS Stream software.

1
 Advanced Microscopy Simplified

User-Friendly
Simplified and guided operation of the microscope
settings makes it easier for users to make adjustments
and reproduce system settings.

Functional
Designed for traditional industrial microscopy, the BX3M
has expanded functionality to meet a broader range of
applications and inspection techniques.

Precision Optics
Olympus has a long history of producing quality optics,
providing superior images both in the eyepieces and on
the monitor.

Fully Customizable
Modular design gives users flexibility to build a system
that meets their specific needs.

2
 Intuitive Microscope Controls:
Comfortable and Easy to Use

Inspection tasks often take a long time to adjust the microscope settings, acquire the image,
and make the necessary measurements to satisfy reporting requirements. Users sometimes
invest time and money for professional microscope training, or work with limited knowledge
about a microscope’s full potential.

The BX3M simplifies complex microscopy tasks through its well-designed and easy-to-use
controls. Users can get the most out of the microscope without the need for extensive training.
The easy, comfortable operation of the BX3M also improves reproducibility by minimizing
human error.

Simple Illuminator: Traditional techniques made easy

The illuminator minimizes complicated actions that are usually necessary during microscope operation. A dial at the front of the illuminator
enables the user to easily change the observation method. An operator can quickly switch between the most frequently used observation
methods in reflected light microscopy, such as from brightfield, to darkfield, to polarized light, in order to readily change between
different types of analyses. In addition, simple polarized light observation is adjustable by rotating the analyzer.

BF DF DIC* POL

Polished sample of AlSi

*Requires DIC slider for use

3
Intuitive Microscope Controls Focus Scale Index: Find the focus quickly
Using the proper aperture stop and field stop settings provides The focus scale index on the frame supports quick access to the
good image contrast and makes full use of the numerical aperture focal point. Operators can roughly adjust the focal point without
of the objective. The legend guides the user to the correct setting viewing the sample through an eyepiece, saving time when
based on the observation method and objective in use. inspecting samples that are different heights.
Incorrect position Correct position

Coded Hardware: Easily restore Light Intensity Manager: Consistent

microscope settings illumination
The BX3M employs new coded functions that integrate the During the initial setup, the illumination intensity can be adjusted to
microscope’s hardware settings with OLYMPUS Stream image match the specific hardware configuration of the coded illuminator
analysis software. The observation method, illumination intensity, and/or coded nosepiece.
and objective position are all recorded within the software and/or
20X 50X 50X
the handset. The coded functions enable the microscope settings BF BF DF
to be automatically saved with each image, making it easier to
reproduce the settings at a later time and provide documentation
for reporting purposes. This saves the operator time and Conventional
Light
minimizes the chance that an incorrect setting will be used. The Intensity
current observation settings are always clearly displayed both on
the hand switch and in the software.
Similar to conventional microscopes, the image appears darker with
Operator A Operator B increasing magnification and observation methods that consume more light

Different operators Light

use different settings Intensity
Manager

The microscope automatically adjusts the light intensity to the correct

value when changing magnification or observation method

Easily verify the Easy and Ergonomic Operation

correct settings
Ergonomics are of the utmost importance for all users. Both
standalone microscope users and those integrating with
OLYMPUS Stream image analysis software benefit from
ergonomic handset controls that clearly display the hardware
Synchronize position. The simple handsets enable the user to focus on their
observation sample and the inspection they need to perform.
settings

Regardless of
different operators,
the settings are the
same

Hand switch for motorized Hand switch Snapshot button

Operator A Operator B nosepiece rotation
4
 Functionality for a Range of
Inspection and Analytical Tasks

The BX3M maintains the traditional contrast methods of conventional microscopy, such as
brightfield, darkfield, polarized light, and differential interference contrast. As new materials are
developed, many of the difficulties associated with detecting defects using standard contrast
methods can be solved using advanced microscopy techniques for more accurate and reliable
inspections. New illumination techniques and options for image acquisition within OLYMPUS
Stream image analysis software give users more choices of how to evaluate their samples and
document findings. In addition, the BX3M also accommodates larger-size, heavier, and more
specialized samples than conventional models.

Advanced Imaging
MIX Observation: The invisible becomes visible
The BX3M’s MIX observation technology combines traditional illumination methods with darkfield illumination. When the MIX slider is
used, its ring of LEDs shine directional darkfield on the sample. This has a similar effect to traditional darkfield, but provides the ability
to select a quadrant of the LEDs in order to direct the light from different angles. This combination of directional darkfield and brightfield,
fluorescence, or polarization is called MIX illumination, and is especially helpful to highlight defects and differentiate raised surfaces from
depressions.

Conventional
Brightfield shines the light straight
down on the sample while
traditional darkfield highlights
scratches and imperfections in a
flat surface by illuminating the
sample from the side of the
objective.

Brightfield Darkfield Brightfield

illumination illumination illumination

Advanced
MIX is a combination of either
brightfield, fluorescence, or
polarized light and directional
darkfield from a ring of LEDs. The
LEDs can be adjusted to select
which direction to illuminate from.
This provides unique contrast
and highlights features on a
surface that cannot be seen
using conventional methods.

Flexible printed circuits Stainless steel (Grade 316)

Full Left quadrant
illumination illuminated

5
Instant MIA: Easily move the stage EFI: Create all-in-focus images
for panorama
You can now stitch images easily and quickly just by moving the The Extended Focus Imaging (EFI) function within OLYMPUS
XY knobs on the manual stage; no motorized stage is necessary. Stream captures images of samples whose height extends
OLYMPUS Stream uses pattern recognition to generate a beyond the depth of focus of the objective and stacks them
panoramic image giving users a wider field of view than a single together to create one image that is all in focus. EFI can be
frame. executed with either a manual or motorized Z-axis and creates a
height map for easy structure visualization. It is also possible to
construct an EFI image while offline within Stream Desktop.

EFI image of capacitor on PCB

Instant MIA image of a coin

HDR: Capture both bright and dark areas

Using advanced image processing, high dynamic range (HDR) adjusts for differences in brightness within an image to reduce glare.
HDR improves the visual quality of digital images thereby helping to generate professional-looking reports.

Clearly exposed for both dark and bright regions by HDR Contrast enhancement by HDR
(Sample: Fuel injector bulb) (Sample: Sliced magnesite)

6
 Advanced Measurement
Routine or Basic Measurement Count and Measure
Various measurement functions are available through OLYMPUS Object detection and size distribution measurement are among
Stream so that the user can easily obtain useful data from the the most important applications in digital imaging. OLYMPUS
images. For quality control and inspection, measuring features Stream incorporates a detection engine that utilizes threshold
on images are often required. All levels of OLYMPUS Stream methods to reliably separate objects (e.g., particles, scratches)
licenses include interactive measurement functions such as from the background.
distances, angles, rectangles, circles, ellipses, and polygons.
All measured results are saved with the image files for further
documentation.

Count and Measure

Materials Science Solutions 3D Sample Measurement

OLYMPUS Stream offers an intuitive, workflow-oriented interface When using an external coded or motorized focus drive, an EFI
for complex image analysis. At the click of a button, the most image can be quickly captured and displayed in 3D. The height
complex image analysis tasks can be executed quickly, precisely, data acquired can be used for 3D measurements on the profile
and in compliance with most common industrial standards. With or from the single view image.
a significant reduction in processing time for repeated tasks,
materials scientists can concentrate on analysis and research.
Modular add-ins for inclusions and intercept charts are easily
performed at any time.

3D surface view
(roughness test
sample)

Single view and

3D profile
Example: Object detection and report for Grains Planimetric measurement

7
Advanced Sample Capacity
View More Sample Types and Sizes
The new 150 × 100 mm stage provides a longer travel in the X
direction than previous models. This, together with the flat-top
design, enables large samples or multiple samples to be easily
placed on the stage. The stage plate has tapped holes to attach
a sample holder. The larger stage provides flexibility to users by
enabling them to inspect more samples on one microscope,
saving valuable lab space. The stage’s adjustable torque
facilitates fine positioning under high magnification with a narrow
field of view.

Flexibility for Sample Height and Weight Max. 105 mm

Samples up to 105 mm can be mounted on the stage with the
optional modular unit. Due to the improved focusing mechanism,
the microscope can accommodate a total weight (sample +
stage) of up to 6 kg. This means that larger and heavier samples
can be inspected on the BX3M, so fewer microscopes are
required in the lab. By strategically positioning a rotatable holder
for 6-inch wafers off-center, users can observe the whole wafer
surface by just rotating the holder when moving through the 100 mm
travel range. The stage’s torque adjustment is optimized for ease
of use and the comfortable handle grip makes it easy to find the
region of interest of the sample. BX53MRF-S

Flexibility for Sample Size

When samples are too large to place on a traditional microscope
stage, the core optical components for reflected light microscopy
can be arranged in a modular configuration. This modular system,
the BXFM, can be mounted on a larger stand via a pole or
mounted to another instrument of choice using a mounting
bracket. This enables users to take advantage of Olympus’
renowned optics even when their samples are unique in size or
shape.

BXFM

ESD Compatible: Protect electronic devices from electrostatic discharge

The BX3M has an ESD dissipation capability that protects electronic devices from static electricity caused by human or environmental
factors.

8
 A History of Leading-edge Optics

Olympus’ history of developing high-quality optics has resulted in a record of proven optical
quality and microscopes that offer excellent measurement accuracy.

Wave Front Aberration Control LED Illumination

When using a microscope for advanced research or system The BX3M utilizes a high-intensity white LED light source for both
integration, optical performance must be standardized for all reflected and transmitted light. The LED maintains a consistent
objectives. Olympus’ UIS2 objectives go beyond conventional color temperature regardless of intensity. LEDs provide efficient,
numerical aperture (NA) and working distance (WD) performance long-life illumination that is ideal for inspecting materials science
standards by providing wave front aberration control, that applications.
minimizes the aberrations that lower resolution.
Bad wave front Good wave front

High light intensity Low light intensity

Halogen

Color varies with light intensity

LED

Color is consistent with light intensity and clearer than

halogen
All images captured using auto exposure
Random dot sample Random dot sample

Shading Correction

Intensity profile Intensity profile Shading correction is implemented within OLYMPUS Stream
software to accommodate for shading around the corners of an
image. When used with intensity threshold settings, shading
correction provides more precise analysis. Additionally, a more
Auto Calibration uniform panoramic image is acquired when tiling images with MIA.

Similar to digital microscopes, automatic calibration is available

when using OLYMPUS Stream. Auto calibration eliminates human
variability in the calibration process, leading to more reliable
measurements. Auto calibration uses an algorithm that Raw image illustrating
automatically calculates the correct calibration from an average of shading where images are
stitched together
multiple measurement points. This minimizes variance introduced
by different operators and maintains consistent accuracy,
improving reliability for regular verification.

Shading correction
produces even illumination
across the field of view

3 × 3 MIA image
(Sample: Residue on membrane filter)

9
Applications
Reflected light microscopy spans a range of applications and industries. These are just a selection of examples of what can be
achieved using different observation methods.

Darkfield Differential Interference Contrast Polarized Light

Surface mounting board: DF Nodular cast iron etched: DIC Sericite: POL
Darkfield enables the observation of scattered or DIC is a microscopic observation technique in which This microscopic observation technique utilizes
diffracted light from the specimen. Anything that is the height difference of a specimen not detectable polarized light generated by a set of filters (analyzer
not flat reflects this light while anything that is flat with brightfield becomes a relief-like or three- and polarizer). The characteristics of the sample
appears dark so imperfections clearly stand out. The dimensional image with improved contrast. This directly affect the intensity of the light reflected
user can identify the existence of even a minute technique utilizes polarized light and can be through the system. It is suitable for metallurgical
scratch or flaw down to the 8 nm level—smaller than customized with a choice of three specially designed structures (i.e., growth pattern of graphite on nodular
the resolving power limit of an optical microscope. prisms. It is ideal for examining specimens with very casting iron), minerals, LCDs and, semiconductor
Darkfield is ideal for detecting minute scratches or minute height differences, including metallurgical materials.
flaws on a specimen and examining mirror surface structures, minerals, magnetic heads, hard-disk
specimens, including wafers. media, and polished wafer surfaces.

Fluorescence Infra-Red Transmitted Light Observation

Particle on semiconductor wafer: FL Electrode section: IR LCD color filter: TL BF + HDR

This technique is used for specimens that fluoresce IR observation is the preferred method of For transparent samples such as LCDs, plastics,
(emit light of a different wavelength) when illuminated nondestructively inspecting the inside of electronic and glass materials, true transmitted light
with a specially designed filter cube that can be devices constructed with silicon or glass that easily observation is available by using a variety of
selected to the specific application. It is suitable for transmit IR wavelengths of light. condensers. Examining samples in transmitted
inspection of contamination on semiconductor brightfield and polarized light can be accomplished
wafers, photo-resist residues, and detection of all in one convenient system.
cracks through the use of fluorescent dye. An
optional apochromatic lamp housing collector lens
system can be added to compensate for chromatic
aberrations from visible light to near-infrared light.

10
 Fully Customizable
Modular design enables various configurations to meet users’ requirements.

Example Configurations for Materials Science

BX53M Reflected and Reflected/Transmitted Light Combination
There are two types of microscope frames in the BX3M series, one for reflected light only and one for both reflected and transmitted
light. Both frames can be configured with manual, coded, or motorized components. The frames are outfitted with ESD capability to
protect electronic samples.

BX53MRF-S example configuration BX53MTRF-S example configuration

BX53M IR Combination
IR objectives can be used for semiconductor inspection,
measurement, and processing applications where imaging
through silicon is required to see the pattern. 5X to 100X infrared
(IR) objectives are available with chromatic aberration correction
from visible light wavelengths through the near infrared. For high-
magnification work, rotating the correction collar of the LCPLN-
IR series of lenses corrects for aberrations caused by sample
thickness. A clear image is obtained with a single objective.
Cover Glass Silicon
Magnifi- W.D. Resolution*1
Objectives NA Thickness Thickness
cations (mm) (μm)
(mm) (mm)

5X 0.10 23 0-0.17 — 6.71*3

LMPLN-IR*2
10X 0.30 18 0-0.17 — 2.24*3
20X 0.45 8.3 0-1.2 0-1.2 1.49*3
LCPLN-IR*2 50X 0.65 4.5 0-1.2 0-1.2 1.03*3
100X 0.85 1.2 0-0.7 0-1.0 0.79*3
*1 Resolutions calculated with aperture iris diaphragm wide open
*2 Limited up to FN 22, not compatible with FN 26.5
*3 With the use of 1100 nm

IR objectives Without correction Correction

11
BX53M Polarized Light Combination
The optics of the BX53M polarized light combination provide
geologists with the right tools for high-contrast polarized light
imaging. Applications such as mineral identification, investigating
the optical characteristics of crystals, and observing solid rock
sections benefit from system stability and precise optical
alignment.

Bertrand Lens for Conoscopic and Orthoscopic

Observations
With a U-CPA conoscopic
observation attachment, switching
between orthoscopic and
conoscopic observation is simple
and fast. It is focusable for clear
back focal plane interference
patterns. The Bertrand field stop
Polarized light accessories BX53M orthoscopic configuration BX53M conoscopic/
makes it possible to obtain orthoscopic configuration
consistently sharp and clear
conoscopic images.
An Extensive Range of Compensator and Wave Plates
Strain-free Optics Six different compensators are
available for measurements of
Thanks to Olympus’ sophisticated birefringence in rock and mineral
design and manufacturing thin sections. Measurement
technology, the UPLFLN-P strain- retardation level ranges from 0 to
free objectives reduce internal 20λ. For easier measurement and
strain to the minimum. This high image contrast, the Berek
means a higher EF value, resulting and Senarmont compensators
in excellent image contrast. can be used, which change the
UPLFLN-P strain-free objectives
retardation level in the entire field
UPLFLN-P series of view.
Objectives NA W.D. Measuring range of compensators
UPLFLN 4XP 0.13 17.0 mm
Compensator Measurement Range Applications
UPLFLN 10XP 0.30 10.0 mm Measurement of high retardation
Thick Berek 0-11000 nm
UPLFLN 20XP 0.50 2.1 mm level (R*>3λ), (crystals,
(U-CTB) (20λ)
macromolecules, fiber, etc.)
UPLFLN 40XP 0.75 0.51 mm
Measurement of retardation level
UPLFLN 100XOP 1.30 0.2 mm Berek 0-1640 nm
(crystals, macromolecules, living
(U-CBE) (3λ)
organisms, etc.)
PLN-P* Measurement of retardation level
Objectives NA W.D. Senarmont Compensator 0-546 nm (crystals, living organisms, etc.)
(U-CSE) (1λ) Enhancement of Image Contrast
PLN 4XP 0.10 18.5 mm (living organisms, etc.)
Brace-Koehler Compensator 0-55 nm Measurement of low retardation
ACHN-P series* 1/10λ (U-CBR1) (1/10λ) level (living organisms, etc.)
Objectives NA W.D. Brace-Koehler Compensator 0-20 nm Measurement of image contrast
1/30λ (U-CBE2) (1/30λ) (living organisms, etc.)
ACHN 10XP 0.25 6.0 mm
Approximate measurement of
ACHN 20XP 0.40 3.0 mm Quartz Wedge 500-2200 nm
retardation level (crystal,
(U-CWE2) (4λ)
ACHN 40XP 0.65 0.45 mm macromolecules, etc.)
*R = retardation level
ACHN 100XOP 1.25 0.13 mm For more accurate measurement, it is recommended that compensators (except U-CWE2) be used together with
the interference filter 45-IF546
*Limited up to FN 22, not compatible with FN 26.5

BXFM System
The BXFM can be adapted to special applications or integrated into other instruments.
The modular construction provides for straightforward adaptation to unique environments
and configurations with a variety of special small illuminators and fixturing mounts.

12
 Modular Design, Build Your System Your Way
Microscope Frames
There are two microscope frames for reflected light; one also has transmitted
light capability. An adapter is available to raise the illuminator to accommodate
taller samples.
: Possible Reflected light Transmitted light Sample height
1 BX53MRF-S 0-65 mm
2 BX53MTRF-S 0-35 mm
1, 3 BX53MRF-S + BX3M-ARMAD 40-105 mm
2, 3 BX53MTRF-S + BX3M-ARMAD 40-75 mm

Convenient accessories for microscopy use. 2

– HP-2 Hand press

– COVER-018 Dust cover

3 1

Stands
For microscopy applications where the sample will not fit on a stage, the
illuminator and optics can be mounted on a larger stand or to another piece
of equipment.
5
BXFM + BX53M illuminator configuration
1 BXFM-F Frame interface is wall mounting/32 mm pillar 6

2 BX3M-ILH Illuminator holder

3 BXFM-ILHSPU Counter spring for BXFM
6 SZ-STL Large stand

BXFM + U-KMAS illuminator configuration

1 BXFM-F Frame interface is wall mounting/32 mm pillar
1
4 BXFM-ILHS U-KMAS holder
5 U-ST Stand
6 SZ-STL Large stand
3
2
4

Tubes
For microscope imaging with eyepieces or for camera observation, select
tubes by imaging type and operator’s posture during observation.

Number of
diopter
FN Type Angle type Image 6 8
adjustment
mechanisms

1 U-BI30-2 22 Binocular Fixing Reverse 1

2
2 U-TBI-3 22 Binocular Tilting Reverse 1
10
3 U-TR30-2 22 Trinocular Fixing Reverse 1
4 U-TR30IR 22 Trinocular for IR Fixing Reverse 1 5 9
4
5 U-ETR-4 22 Trinocular Fixing Erect —
6 U-TTR-2 22 Trinocular Tilting Reverse —
7 U-SWTR-3 26.5 Trinocular Fixing Reverse — 1
3 7
8 U-SWETTR-5 26.5 Trinocular Tilting Erect —
9 U-TLU 22 Single port — — —
10 U-TLUIR 22 Single port for IR — — —

13
Illuminators
The illuminator projects light onto the sample based on the observation
method selected. Software interfaces with coded illuminators to read the
4
cube position and automatically recognize the observation method. 6
5

1 2 3

: Possible Coded function Light source BF DF DIC POL IR FL MIX AS/FS

1 BX3M-RLAS-S Fixed 3 cube position LED - built in
LED
2 BX3M-URAS-S Attachable 4 cube position Halogen
Mercury/Light guide
LED
3 BX3M-RLA-S
Halogen
4 BX3M-KMA-S LED - built in
5 BX3-ARM Mechanical arm for transmitted light
LED
6 U-KMAS
Halogen

Light Sources
Light sources and power supplies for sample illumination, choose the 8 10
11
appropriate light source for the observation method.
15
Standard LED light source configuration 16
1 BX3M-LEDR LED lamp housing for reflected light
DF converter for BX3M-URAS-S, required for observation
2 U-RCV
with DF when necessary
9
3 BX3M-PSLED Power supply for LED lamp housing, requires BXFM system 5
4 BX3M-LEDT LED lamp housing for transmitted light
12
Fluorescence light source configuration
7 6 13
5 U-LLGAD Light guide adapter
DF converter for BX3M-URAS-S, required for observation
2 U-RCV
with DF when necessary
6, 7 U-LLG150 (300) Light guide, length:1.5 m (3 m) 1 4 3 2 17 14
8 U-HGLGPS Light source for fluorescence
9, 10 U-LH100HG(HGAPO) Mercury lamp housing for fluorescence
DF converter for BX3M-URAS-S, required for observation
2 U-RCV
with DF when necessary
11 U-RFL-T Power supply for 100W mercury lamp

Halogen and halogen IR light source configuration

12 U-LH100L-3 Halogen lamp housing
13 U-LH100IR Halogen lamp housing for IR
Extender cable for halogen lamp housing, cable length 1.7 m
14 U-RMT
(requires cable extension when necessary)
100V (200V) specification power supply for 100W/50W
15, 16 TH4-100 (200)
halogen lamp
Hand switch for light intensity of halogen
17 TH4-HS
(dimmer TH4-100 (200) without hand switch)

14
 Nosepieces
Attachment for objectives and sliders. Select by the number of objectives
needed and types; also with/without slider attachment.
1 6 13 14 11
Number of
: Possible Type Holes BF DF DIC MIX ESD centering
holes
2 4 5 7 12
1 U-P4RE Manual 4 4
2 U-5RE-2 Manual 5
3 U-5RES-ESD Coded 5 9 10 18
16
4 U-D6RE Manual 6
5 U-D6RE-ESD-2 Manual 6
6 U-P6RE Manual 6 2
7 U-D7RE Manual 7
8 U-D6RES Coded 6
9 U-D7RES Coded 7
10 U-D5BDREMC Motorized 5 3 8 15 17

11 U-5BDRE Manual 5
12 U-D5BDRE Manual 5
13 U-P5BDRE Manual 5 2
14 U-D6BDRE Manual 6
15 U-D5BDRES-ESD Coded 5
16 U-D6BDRES-S Coded 6
17 U-D6REMC Motorized 6
18 U-D6BDREMC Motorized 6

Sliders
Select the slider to complement traditional brightfield observation. The DIC 3
slider provides topographic information about the sample with options to 2

maximize contrast or resolution. The MIX slider provides illumination flexibility

with a segmented LED source in the darkfield path.
Type Amount of shear Available objectives
MPLFLN, MPLAPON,
1 U-DICR Standard Medium
LMPLFLN, and LCPLFLN-LCD
2 U-DICRH Resolution Small MPLFLN, MPLAPON
3 U-DICRHC Contrast Large LMPLFLN and LCPLFLN-LCD

MIX slider for MIX observation.

Type Available objectives
4 U-MIXR MIX slider MPLFLN-BD, LMPLFLN-BD, MPLN-BD
1
4

Control Boxes and Hand Switches

Control boxes for interfacing microscope hardware with a PC and hand
2
switches for hardware display and control.
1
BX3M-CB (CBFM) configuration
1 BX3M-CB Control box for BX53M system 6
2 BX3M-CBFM Control box for BXFM system
MIX observation control, indicator of coded hardware,
3 BX3M-HS
programmable function button of software (Stream)
4 BX3M-HSRE Motorized nosepiece rotation
Shutter operation of camera
5 U-HSEXP
(This unit can be connected to BX3M-CB only.)

U-CBS configuration
5
6 U-CBS Control box for coded functions in BXFM configuration
5 U-HSEXP Shutter operation of camera

Cable 4
– U-MIXRCBL (ECBL) U-MIXR cable, cable length: 0.5 m (2.9 m) 3
– BX3M-RMCBL (ECBL) Motorized nosepiece cable, cable length: 0.2 m (2.9 m)
15
Stages
Stages and stage plates for sample placement. Select based on sample 21 22
15
shape and size.
14
150 mm × 100 mm stage configuration
23 18
24
1 U-SIC64 150 mm × 100 mm flat top handle stage
10 20
2 U-SHG (T) Silicone rubber operability handle rubber for improvement (thick type)
3 U-SP64 Stage plate for U-SIC64 17
16
4 U-WHP64 Wafer plate for U-SIC64 19
9
5 BH2-WHR43 Wafer holder for 4-3 in. 8
1 13
6 BH2-WHR54 Wafer holder for 5-4 in.
7 BH2-WHR65 Wafer holder for 6-5 in. 11
4 12
8 U-SPG64 Glass plate for U-SIC64
2
100 mm × 100 mm stage configuration 3 5 6 7
9, 10 U-SIC4R (L) 2 105 mm × 100 mm right (left) handle stage
11 U-MSSP4 Stage plate for U-SIC4R (L) 2
12 U-WHP2 Wafer plate for U-SIC4R (L) 2
6 BH2-WHR43 Wafer holder for 4-3 in.
13 U-MSSPG Glass plate for U-SIC4R

76 mm × 52 mm stage configuration
14, 15 U-SVR (L) M 76 mm × 52 mm right (left) handle stage
2 U-SHG (T) Silicone rubber operability handle rubber for improvement (thick type)
16 U-MSSP Stage plate for U-SVR (/L) M
17, 18 U-HR (L) D-4 Thin slide holder for the right (left) opening
Thick slide holder for the right (left) opening, for pressing the slide glass
19, 20 U-HR (L) DT-4
to stage top surface, when the specimen is difficult to lift

Other
21 U-SRG2 Rotatable stage
22 U-SRP Rotatable stage for POL, from any position can be 45° click stop
23 U-FMP Mechanical stage for U-SRP/U-SRG2
24 U-SP Fixed stage of a single plate

Camera Adapters
Adapters for camera observation. Selectable from required field of view and
magnification. Actual observation range can be calculated using this formula: 6
actual field of view (diagonal mm) = viewing field (viewing number) ÷ objective
magnification.
3 2
Centering CCD image area (field number)
Magnification adjustment (mm)
(mm) 2/3 in. 1/1.8 in. 1/2 in.
U-TV1X-2 with
1 1 — 10.7 8.8 8
U-CMAD3
2 U-TV1XC 1 ø2 10.7 8.8 8
3 U-TV0.63XC 0.63 — 17 14 12.7
4 U-TV0.5XC-3 0.5 — 21.4 17.6 16
5 U-TV0.35XC-2 0.35 — — — 22
6 U-TV0.25XC 0.25 — — — — 5 4 1

For information on digital cameras, please visit our website at

http://www.olympus-ims.com/en/microscope/dc/

Eyepieces
3 4
Eyepiece for viewing directly into the microscope. Select based on desired
field of view.
FN Diopter adjustment
: Possible Built-in cross reticle
(mm) mechanism
1 WHN10X 22
2 WHN10X-H 22
3 CROSS WHN10X 22
4 SWH10X-H 26.5 1 2 5
5 CROSS SWH10X 26.5
16
 Optical Filters 16
17
18 19 6 7 8 9
Optics filters convert sample exposure light to various types of 22

illumination. Select the appropriate filter for observation requirements.

BF, DF, FL 1 2 3 4 5
1, 2, 3 U-25ND50, 25, 6 Neutral density filter, transmittance 50%, 25%, 6%
21
4 U-25LBD Daylight color filter
5 U-25LBA Halogen color filter
15
6 U-25IF550 Green filter
7 U-25L42 UV-cut filter 23
12
8 U-25Y48 Yellow filter 20 10 11 13 14
9 U-25FR Frost filter (required for the BX3M-URAS-S)

POL, DIC IR
10 U-AN-2 Polarization direction is fixed IR polarization direction is rotatable (reduces halation at IR ob-
16 U-AN360IR
servation when using combination with U-AN360IR and U-POIR)
11 U-AN360-3 Polarization direction is rotatable
17 U-POIR IR polarization direction is fixed
12 U-AN360P-2 High-quality polarization direction is rotatable
18 U-BP1100IR Band pass filter: 1100 nm
13 U-PO3 Polarization direction is fixed
19 U-BP1200IR Band pass filter: 1200 nm
14 U-POTP3 Polarization direction is fixed, for use with U-DICRH
15 45-IF546 Green ø45 mm filter for POL Transmitted light
Other 20 43IF550-W45 Green ø45 mm filter
22 U-25 Empty filter, for use with user's ø25 mm filters 21 U-POT Polarizer filter
23 U-FC Transmitted filter cassette; used by combining ø45 mm filters AN and PO are not necessary when using BX3M-RLAS-S and U-FDICR

Condensers
Condensers collect and focus transmitted light. Use for transmitted light
3 4
observation.
1 U-AC2 Abbe condenser (available for 5X objectives and above)
2 U-SC3 Swing-out condenser (available for 1.25X objectives and above)
Long working distance condenser for glass plates
3 U-LWCD
(U-MSSPG, U-SPG64)
4 U-POC-2 Swing-out condenser for POL

1 2

Mirror Units
Mirror unit for BX3M-URAS-S. Select the unit for required observation. 5 6 7 8

1 U-FBF For BF, detachable ND filter

2 U-FDF For DF
3 U-FDICR For POL, crossed nicol position is fixed
4 U-FBFL For BF, built-in ND filter (it is necessary to use both BF* and FL)
5 U-FWUS For Ultra Violet-FL: BP330-385 BA420 DM400
6 U-FWBS For Blue-FL: BP460-490 BA520IF DM500
7 U-FWGS For Green-FL: BP510-550 BA590 DM570
8 U-FF Empty mirror unit
1 2 3 4
*For coaxial episcopic illumination only

Intermediate Tubes
Various types of accessories for multiple purposes. For use between tube
and illuminator. 1
5
1 U-CA Magnification changer (1X, 1.25X, 1.6X, 2X)
2 U-ECA Magnification changer (1X, 2X) 4
3 U-EPA2 Eye point adjuster: +30 mm
4 U-DP Dual port for U-DP1XC
5 U-DP1XC C-mount TV camera adapter for U-DP
6 U-TRU Trinocular intermediate unit
3
6
2

17
UIS2 Objectives
Objectives magnify the sample. Select the objective that matches the working
distance, resolving power, and observation method for the application.

Cover Glass
Magnifi- W.D. Resolution*4
Objectives NA Thickness*3
cations (mm) (μm)
(mm)

1 50X 0.95 0.35 0 0.35 19 20 21 22 23

MPLAPON
2 100X 0.95 0.35 0 0.35

3 1.25X*5* 6 0.04 3.5 0-0.17 8.39

4 2.5X*6 0.08 10.7 0-0.17 4.19 15 16 17 18
11 12 13 14
5 5X 0.15 20.0 0-0.17 2.24
6 10X 0.30 11.0 0-0.17 1.12
MPLFLN
7 20X 0.45 3.1 0 0.75
8 40X*2 0.75 0.63 0 0.45
9 50X 0.80 1.0 0 0.42 4 5 6 7 8 9 10
3
10 100X 0.90 1.0 0 0.37
11 20X 0.25 25 0-0.17 1.34
SLMPLN 12 50X 0.35 18 0 0.96
13 100X 0.60 7.6 0 0.56
1 2 24 25 26
14 5X 0.13 22.5 0-0.17 2.58
15 10X 0.25 21.0 0-0.17 1.34
LMPLFLN 16 20X 0.40 12.0 0 0.84
17 50X 0.50 10.6 0 0.67
18 100X 0.80 3.4 0 0.42

19 5X 0.10 20.0 0-0.17 3.36

20 10X 0.25 10.6 0-0.17 1.34
MPLN*5 21 20X 0.40 1.3 0 0.84
22 50X 0.75 0.38 0 0.45 43 44 45 46 47
23 100X 0.90 0.21 0 0.37
24 20X 0.45 8.3-7.4 0-1.2 0.75
LCPLFLN-LCD 25 50X 0.70 3.0-2.2 0-1.2 0.48
26 100X 0.85 1.2-0.9 0-0.7 0.39 33 34 35 36 37

27 5X 0.15 12.0 0-0.17 2.24

28 10X 0.30 6.5 0-0.17 1.12
29 20X 0.45 3.0 0 0.75 41 42
MPLFLN-BD*7 38 39 40
30 50X 0.80 1.0 0 0.42
31 100X 0.90 1.0 0 0.37
32 150X 0.90 1.0 0 0.37

33 5X 0.15 12.0 0-0.17 2.24

27 28 29 30 31 32
34 10X 0.25 6.5 0-0.17 1.34
MPLFLN-BDP*7 35 20X 0.40 3.0 0 0.84
36 50X 0.75 1.0 0 0.45
37 100X 0.90 1.0 0 0.37 *1 Specified oil: IMMOIL-F30CC/IMMOIL-8CC/IMMOIL-500CC/IMMOIL-F30CC

38 5X 0.13 15.0 0-0.17 2.58 *2 The MPLFLN40X objective is not compatible with the differential interference contrast

39 10X 0.25 10.0 0-0.17 1.34 microscopy

LMPLFLN-BD*7 40 20X 0.40 12.0 0 0.84 *3 0: For viewing specimens without a cover glass

41 50X 0.50 10.6 0 0.67 *4 Resolutions calculated with aperture iris diaphragm wide open

42 100X 0.80 3.3 0 0.42 *5 Limited up to FN 22, no compliance with FN 26.5

*6 Analyzer and polarizer are recommended for usage with MPLFLN1.25X and 2.5X
43 5X 0.10 12.0 0-0.17 3.36 *7 BD: Brightfield/Darkfield objectives
44 10X 0.25 6.5 0-0.17 1.34 *8 Slight vignetting may occur in the periphery of the field when MPLN-BD series objectives
MPLN-BD*5*7*8 45 20X 0.40 1.3 0 0.84 are used with high-intensity light sources such as mercury and xenon for darkfield
46 50X 0.75 0.38 0 0.45 observation
47 100X 0.90 0.21 0 0.37

MPLAPON 100XOil*1 1.4 0.1 0 0.24

Definition for Objective Lens Abbreviations

M P L (Plan) F L N 1 0 0 B D

M: Metallurgical (no cover) PL: Plan/ None: Achromat/ Number: None: Brightfield
LM: Long working distance Corrects field Corrects aberration at two wavelengths of Objective lens BD: Brightfield/Darkfield
metallurgical use curvature of the blue and red magnification
periphery of the BDP: Brightfield/Darkfield/
SLM: Super long working FL: SemiApochromat/ Polarizing
image plane Corrects chromatic aberration in the
distance metallurgical IR: IR
use visible range (violet to red)
APO: Apochromat/ LCD: LCD
LC: Observation through
substrate Optimally corrects chromatic aberration in
the entire visible band (violet to red)

18
 BX53M System Diagram (for Reflected and Reflected/Transmitted Light Combination)
Digital cameras
Camera adapters
U-CMAD3 + U-TV1X-2 U-TV0.5XC-3
U-TV1XC U-TV0.35XC-2
U-TV0.63XC U-TV0.25XC

Tubes and eyepieces Wide-field Super-wide-field Binocular Eyepieces Eyepieces

trinocular tube trinocular tube Single tube tube WHN10X SWH10X-H
U-TR30-2 U-SWTR-3 U-TLU U-BI30-2 WHN10X-H CROSS
U-ETR-4 U-SWETTR-5 U-TBI30-3 CROSS SWH10X
U-TTR-2 WHN10X

Intermediate tubes Magnification Eye point Digital cameras

changer adjuster
U-CA U-EPA2 Extension camera adapter Trinocular camera adapter
U-ECA U-DP + U-DP1XC U-TRU + Camera adapters

Illumination
×2 ×2

Reflected Coded Reflected light Coded universal

LED light for BF reflected for BF/DF reflected light Analyzer for Rotatable Polarizer slider Polarizer
reflected light analyzer for reflected U-POTP3 ND filters Filters
BX3M-KMA-S LED light BX3M-RLA-S BX3M-URAS-S
for BF/DF/POL U-AN-2 U-AN360-3 light U-25ND50 U-25LBD
BX3M-RLAS-S U-PO3 U-25ND25 U-25LBA
U-25ND6 U-25IF550
U-25L42
U-25Y48
LED light Halogen Mirror units U-25FR
source light source U-FF U-FDICR U-25
BX3M-LEDR U-LH100L-3 + U-FBF U-FWBS
TH4-100/200 U-FDF U-FWGS
Option: U-FBFL U-FWUS
U-RMT/TH4-HS

LED light Halogen light Mercury light source Light guide source
source source U-LH100HGAPO + U-LLGAD + U-LLG150
BX3M-LEDR U-LH100L-3 + U-RFL-T (U-LLG300) + U-HGLGPS
Option: TH4-100/200 U-LH100HG + U-RFL-T Option:
U-RCV Option: Option: U-RCV
U-RMT/ U-RCV
TH4-HS

Nosepieces
Objectives and sliders

For BF For BF with For BF/DF For BF/DF BF

U-5RE-2 slider slot U-5BDRE with slider slot objectives
U-5RES-ESD U-D6RE U-D5BDRE DIC sliders MIX slider DIC sliders DIC sliders
U-D6RE-ESD-2 U-P5BDRE U-DICR U-MIXR U-DICR U-DICR
U-P6RE U-D6BDRE U-DICRH U-DICRH U-DICRH
U-D7RE U-D5BDREMC U-DICRHC U-DICRHC BD-M-AD U-DICRHC
U-D6RES U-D5BDRES-ESD BF/DF BF BF/DF BF
U-D7RES U-D6BDRES-S objectives objectives objectives objectives
U-D6REMC U-D6BDREMC

Frames Height adapter

BX3M-ARMAD

Controller for BX3M

BX53M frame for BX53M frame for
reflected light reflected/transmitted light
BX53MRF-S BX53MTRF-S
Option: Option: Control box
HP-2 HP-2 BX3M-CB
COVER-018 COVER-018
Transmitted
LED lamp housing Hand switch Standalone PC with OLYMPUS
BX3M-LEDT U-HSEXP connection kit Stream Software
BX3M-HSRE DP2-SAL
BX3M-HS
Controller for BX3M

Stages
Mechanical right/left Right/left hand control Right hand control 150 mm × 100 mm stage
Rotatable Plain stage hand control stage large-size stage U-SIC64
stage U-SP U-SVRM U-SVLM U-SIC4R2 U-SIC4L2 Option: U-SHG U-SHGT
U-SRG2
Option: U-SHG/U-SHGT
U-SRP

Stage plate Plate Stage glass Stage plate Wafer holder plate Stage glass plate
U-MSSP4 U-WHP2 plate U-SP64 U-WHP64 U-SPG64*
U-MSSPG*
Mechanical Stage plate Specimen
Wafer holder plate
stage U-MSSP holders
BH2-WHR43
U-FMP U-HLD-4*
BH2-WHR54
U-HLDT-4* Wafer holder plate BH2-WHR65
U-HRD-4* BH2-WHR43
U-HRDT-4*

Condensers Condenser Long working

distance condenser
U-AC2* U-SC3*
U-POC-2* U-LWCD*

Filter (Ø45)
U-POT* 43IF550-W45*
45-IF546* U-FC*

*For transmitted light combination only

19
 Control box and cable connection diagram
Motorized nosepiece MIX slider for
U-D6REMC reflected light
U-D5MDREMC observation
U-D6BDREMC U-MIXR

Coded nosepiece Coded Illuminator Reflected LED Cable for Cable for
U-5RES-ESD BX3M-RLAS-S lamp housing motorized nosepiece U-MIXR
U-D5BDRES-ESD BX3M-URAS-S BX3M-LEDR BX3M-RMCBL U-MIXRCBL
U-D6RES
U-D7RES
U-D6BDRES-S
PC with OLYMPUS
Stream Software

OR
Control box
Frame BX3M-CB + Power supply cable*
BX53MRF-S Standalone
BX53MTRF-S + connection kit
Power supply cable* DP2-SAL

Transmitted LED
lamp housing Hand switch Hand switch Hand switch for
BX3M-LEDT BX3M-HS for motorized exposure
nosepiece U-HSEXP
*This is a local item. BX3M-HSRE

Stand-alone light manager configuration

Reflected light or transmitted light
LIM function for magnification No LIM function

Coded nosepiece
U-5RES-ESD U-D7RES
U-D5BDRES-ESD U-D6BDRES-S Manual Illuminator
U-D6RES BX3M-KMA-S

OR OR

BX53M frame for

reflected light Motorized nosepiece Cable for
motorized Manual Illuminator Reflected LED lamp housing
BX53MRF-S U-D6REMC
nosepiece BX3M-RLA-S BX3M-LEDR
U-D5BDREMC
U-D6BDREMC BX3M-RMCBL

OR
LIM function for contrast methods
Hand switch for
motorized nosepice Control box
BX3M-HSRE BX3M-CB
Coded Illuminator
BX3M-RLAS-S

No LIM function
OR
Manual nosepiece
BX53M frame for Transmitted LED U-P4RE U-D7RE
reflected/transmitted light lamp housing U-5RE-2 U-5BDRE
BX53MTRF-S BX3M-LEDT U-D6RE U-D5BDRE
U-D6RE-ESD-2 U-P5BDRE Coded Illuminator Reflected LED lamp housing
U-P6RE U-D6BDRE BX3M-URAS-S BX3M-LEDR

MIX observation configuration

Frame, control box and hand switch Nosepiece and slider Objectives

BF/DF with slider slot for

DIC/MIX nosepiece
U-D5BDRE U-D5BDRES-ESD
U-P5BDRE U-D6BDRES-S
Control box U-D6BDRE U-D5BDREMC
BX3M-CB U-D6BDREMC
BF/DF objectives
Frame
MPLN BD series
BX53MRF-S MPLFLN BD series
BX53MTRF-S MPLFLN BDP series
MIX slider for Cable for U-MIXR LMPLFLN BD series
reflected light observation U-MIXRCBL
Hand switch U-MIXR
BX3M-HS

PC with OLYMPUS
Stream Software

Illumination and cable connection diagram

Halogen light source Extension cord External light source Hand switch
U-LH100L-3*2 U-RMT TH4 + Power supply cable*1 TH4-HS

Mercury light source Power supply unit for mercury lamp

U-LH100HGAPO*2 U-RFL-T + Power supply cable*1
U-LH100HG*2

Light guide source Liquid light guide Light source

U-LLGAD (1.5 m/3 m) U-HGLGPS*2 + Power supply cable*1
U-LLG150/U-LLG300

*1 This is a local item.

*2 Bulbs are required for these light sources.

20
 BXFM System Diagram
Camera adapters Digital cameras

U-CMAD3 + U-TV1X-2 U-TV0.5XC-3

U-TV1XC U-TV0.35XC-2
U-TV0.63XC U-TV0.25XC

Tubes and eyepieces

Wide-field Super-wide-field Binocular Eyepieces Eyepieces
trinocular tube trinocular tube Single tube tube WHN10X SWH10X-H
U-TR30-2 U-SWTR-3 U-TLU U-BI30-2 WHN10X-H CROSS
U-ETR-4 U-SWETTR-5 U-TBI30-3 CROSS SWH10X
U-TTR-2 WHN10X

Intermediate tubes
Magnification Eyepoint Digital cameras
changer adjuster
U-CA U-EPA2
Extension camera adapter Trinocular camera adapter
U-ECA
U-DP + U-DP1XC U-TRU + Camera adapters

Illumination

×2 ×2 ×2

Analyzer for Rotatable

reflected light analyzer
Reflected Coded reflected Reflected light Coded universal Reflected light U-AN-2 U-AN360-3
LED light LED light for BF/DF reflected light for BF
for BF for BF/DF/POL BX3M-RLA-S BX3M-URAS-S U-KMAS
BX3M-KMA-S BX3M-RLAS-S

Polarizer slider Polarizer

LED light Halogen light Mirror units LED light Halogen light for reflected light U-POTP3
source source U-FF U-FDICR source source
U-FBF U-FWBS U-PO3
BX3M-LEDR U-LH100L-3 + BX3M-LEDR U-LH100L-3 +
TH4-100/200 U-FDF U-FWGS TH4-100/200
Option: U-RMT/TH4-HS U-FBFL U-FWUS Option:
U-RMT/TH4-HS

ND filters Filters
U-25ND50 U-25LBD
U-25ND25 U-25LBA
Power supply LED light Halogen light Mercury light Light guide Power supply U-25ND6 U-25IF550
for LED source source source source for LED U-25L42
BX3M-PSLED BX3M-LEDR U-LH100L-3 + U-LH100HGAPO + U-LLGAD + BX3M-PSLED U-25Y48
Option: TH4-100/200 U-RFL-T U-LLG150 U-25FR
U-RCV Option: U-LH100HG + (U-LLG300) + U-25
U-RMT/ U-RFL-T U-HGLGPS
TH4-HS Option: U-RCV Option: U-RCV

Power supply
for LED
BX3M-PSLED

Illuminator holder for BXFM lluminator holder BXFM

BX3M-ILH BXFM-ILHS
Option: BXFM-ILHSPU

Nosepieces
Objectives
and sliders

For BF For BF with For BF/DF For BF/DF BF

U-5RE-2 slider slot U-5BDRE with slider slot objectives U-DICR U-MIXR U-DICR U-DICR
U-5RES-ESD U-D6RE U-D5BDRE
U-D6RE-ESD-2 U-P5BDRE U-DICRH U-DICRH U-DICRH
U-P6RE U-D6BDRE U-DICRHC U-DICRHC U-DICRHC
U-D7RE U-D5BDREMC
U-D6RES U-D5BDRES-ESD BD-M-AD
U-D7RES U-D6BDRES-S
U-D6REMC U-D6BDREMC BF/DF BF BF/DF BF
objectives objectives objectives objectives

Frame
Controller for BXFM

BXFM frame BXFM control box

BXFM-F BX3M-CBFM
Hand switch Standalone PC with OLYMPUS
BX3M-HSRE connection kit Stream Software
Controller for BXFM
BX3M-HS DP2-SAL

Control box for

coded function
U-CBS Hand switch Standalone PC with OLYMPUS
Stand for exposure connection kit Stream Software
U-ST* U-HSEXP DP2-SAL
SZ-STL

*U-ST is not available with BX3M-ILH.

21
 Control box and cable connection diagram

Motorized nosepiece MIX slider for

Coded nosepiece Coded Illuminator U-D6REMC reflected light
U-5RES-ESD BX3M-RLAS-S U-D5BDREMC observation
U-5BDRES-ESD BX3M-URAS-S U-D6BDREMC U-MIXR
U-D6RES
U-D7RES
U-D6BDRES-S
PC with OLYMPUS Extension cable Extension cable for
Stream Software for motorized U-MIXR
nosepiece U-MIXRECBL
BX3M-RMECBL

BXFM control box

BX3M-CBFM + Power supply cable*
Control box for
coded function
U-CBS + Power supply cable*

Hand switch Standalone Hand switch Hand switch

for exposure connection kit BX3M-HS for motorized
U-HSEXP DP2-SAL nosepiece
Note: BX3M-HSRE
DP2-SAL is available only with either the coded system or
*This is a local item. the motorized system, but not with both.

MIX observation configuration

Frame, control box and hand switch Nosepiece and slider Objectives

BF/DF with slider slot for DIC/MIX

U-D5BDRE U-D5BDRES-ESD
U-P5BDRE U-D6BDRES-S
U-D6BDRE U-D5BDREMC BF/DF objectives
U-D6BDREMC
MPLN BD series
MPLFLN BD series
MPLFLN BDP series
LMPLFLN BD series
BXFM control box Hand switch
BX3M-CBFM BX3M-HS MIX slider for Extension cable for
reflected light observation U-MIXR
U-MIXR U-MIXRECBL

Motorized nosepiece configuration

Control box and hand switch Nosepiece and slider

Motorized nosepiece Extension cable

U-D5BDREMC for motorized
U-D6REMC nosepiece
BXFM control box Hand switch U-D6BDREMC BX3M-RMECBL
BX3M-CBFM for motorized
nosepiece
BX3M-HSRE

Illumination and cable connection diagram

Halogen light source Extension cord External light source Hand switch
U-LH100L-3*2 U-RMT TH4 + Power supply cable*1 TH4-HS

Mercury light source Power supply unit for mercury lamp

U-LH100HGAPO*2 U-RFL-T + Power supply cable*1
U-LH100HG*2

Light guide source Liquid light guide Light source

U-LLGAD (1.5 m/3 m) U-HGLGPS*2 + Power supply cable*1
U-LLG150/U-LLG300

LED light source Power supply for LED

BX3M-LEDR*2 BX3M-PSLED + Power supply cable*1

*1 This is a local item.

*2 Bulbs are required for these light sources.

22
 BX53M System Diagram (for IR Observation)
Camera adapters IR Digital cameras

U-CMAD3 + U-TV1X-2
U-TV1XC

Tubes and eyepieces Eyepieces

Single tube WHN10X
Trinocular tube for IR U-TLUIR WHN10X-H
U-TR30IR CROSS
WHN10X

Intermediate tubes
IR Digital cameras
Extension camera adapter
U-DP + U-DP1XC

Illumination
×2 ×2 ×2

Reflected light Coded universal Reflected light Rotatable analyzer Reflected polarizer ND filters Band path Filters
for BF/DF reflected light for BF slider for IR slider for IR filters for IR
U-25ND50 U-25
BX3M-RLA-S BX3M-URAS-S U-KMAS* U-AN360IR U-POIR U-BP1100IR
U-25ND25
U-25ND6 U-BP1200IR

Mirror units
U-FBF
Illumination and cable connection diagram

Halogen light Halogen light Halogen light Extension cord External light source Hand switch
source for IR source for IR source for IR U-RMT TH4 + TH4-HS
U-LH100IR + TH4-100/200 U-LH100IR + TH4-100/200 U-LH100IR*2 Power supply cable*1
Option: U-RMT/TH4-HS Option: U-RMT/TH4-HS
*1 This is a local item.
*2 The bulb is required for this light source.

Illuminator holder for BXFM Illuminator holder BXFM-S

BX3M-ILH* BXFM-ILHS*
Option: BXFM-ILHSPU*

Nosepieces Objectives
For IR
U-5RE-2 U-D7RE
U-5RES-ESD U-D6RES
U-D6RE U-D7RES IR objectives
U-D6RE-ESD-2 U-D6REMC
U-P6RE

Frame Controller
for BX53M
Height adapter Control box
BX3M-ARMAD BX3M-CB

Hand switch PC with OLYMPUS

U-HSEXP Stream Software
BX3M-HSRE
BX3M-HS

BX53M frame BXFM frame

for reflected light BXFM-F* Controller
BX53MRF-S for BXFM
Option:
HP-2
COVER-018
BXFM control box
BX3M-CBFM
Hand switch PC with OLYMPUS
BX3M-HSRE Stream Software
Controller Controller BX3M-HS
for BX53M for BXFM

Stand
U-ST* BXFM control box for Hand switch PC with OLYMPUS
SZ-STL* coded function for exposure Stream Software
U-CBS U-HSEXP

Stages

Rotatable Plain stage Mechanical right/left Right/left hand control Right hand control
stage U-SP hand control stage large-size stage 150mm × 100mm stage
U-SRG2 U-SVRM U-SIC4R2 U-SIC64
U-SRP U-SVLM U-SIC4L2 Option: U-SHG
Option: U-SHG U-SHGT
U-SHGT

Mechanical stage Stage plate

Stage plate Plate Stage plate Wafer holder plate
U-FMP U-MSSP
U-MSSP4 U-WHP2 U-SP64 U-WHP64

Wafer holder plate Wafer holder plate

BH2-WHR43 BH2-WHR43
BH2-WHR54
BH2-WHR65

*For BXFM system only

23
BX53M System Diagram (for Polarized Observation)
Camera adapters Digital cameras

U-CMAD3 + U-TV1X-2 U-TV0.5XC-3

U-TV1XC U-TV0.35XC-2
U-TV0.63XC U-TV0.25XC

Tubes and eyepieces Eyepieces

Wide-field Binocular WHN10X
trinocular tube Single tube tube
U-TLU WHN10X-H
U-TR30-2 U-BI30-2 CROSS
U-TTR-2 U-TBI30-3 WHN10X

Intermediate tubes Attachment for

Attachment for conoscopic and
orthoscopic
orthoscopic observation
observation
U-CPA Rotatable analyzer
U-OPA
U-AN360P-2

Illumination

Standard arm The BX53MRF/BX53MTRF

BX3-ARM illuminator configurations apply
except the BX3-KMA-S unit.
Refer to the BX53M Reflected and
Reflected/Transmitted
System Diagram on page 19.

Nosepieces Objectives

For POL with

centering holes
U-P4RE POL
U-P6RE objectives
U-P5BDRE

Sliders

Plate adapter
U-TAD

Compensators Compensators
U-TP530 U-CTB
U-TP137 U-CBE
U-CWE2 U-CBR1
U-CSE U-CBR2

Frame Height adapter

BX3M-ARMAD

BX53M frame for

reflected/transmitted light
BX53MTRF-S
Option: Controller for BX3M
HP-2
COVER-018

Control box
BX3M-CB
Transmitted LED
lamp housing
BX3M-LEDT Hand switch Standalone PC with OLYMPUS
U-HSEXP connection kit Stream Software
BX3M-HS DP2-SAL
Controller for BX3M

Stages
Rotatable stage
U-SRG2
U-SRP

Mechanical stage
U-FMP

Condensers

Polarizing condenser
U-POC-2

Filter (Ø45)
43IF550-W45
45-IF546
U-FC

24
 Specifications

BX53M Specifications (for Reflected and Reflected/Transmitted Light Combination)

BX53MTRF-S BX53MRF-S BXFM
Optical system UIS2 optical system (infinity-corrected)
Illumination Reflected/transmitted Reflected

Stroke: 30 mm
Stroke: 25 mm
Fine stroke per rotation: 200 μm
Fine stroke per rotation: 100 μm
Focus Minimum graduation: 2 μm
Microscope frame Minimum graduation: 1 μm
With torque adjustment for coarse
With upper limit stopper, torque adjustment for coarse handle
handle

35 mm (w/o spacer) 65 mm (w/o spacer) Depends on the mounting

Max. specimen height
75 mm (with BX3M-ARMAD) 105 mm (with BX3M-ARMAD) configuration

Inverted: binocular, trinocular, tilting binocular

Wide-field FN 22
Erect: trinocular, tilting binocular
Observation tube
Inverted: trinocular
Super-wide-field FN 26.5
Erect: trinocular, tilting trinocular

BX3M-RLAS-S
Coded, white LED, BF/DF/DIC/POL/MIX FS, AS (with centering mechanism)
BX3M-KMA-S
White LED, BF/DIC/POL/MIX
BX3M-RLA-S
Traditional observation
100W/50W halogen lamp, white LED, BF/DF/DIC/POL/MIX/ FS, AS (with centering mechanism),
technique
BF/DF interlocking, ND filter
Reflected light illumination
U-KMAS
– White LED, 100W halogen
Fiber illumination, BF/DIC/POL/MIX

BX3M-URAS-S
Fluorescence Coded, 100W mercury lamp, 4 position mirror unit turret, (standard: WB, WG, WU+BF etc)
With FS, AS (with centering mechanism), with shutter mechanism

White LED
Transmitted light Abbe/long working distance –
condensers

For BF Sextuple, centering sextuple, septuple, coded quintuple (optional motorized revolving nosepieces)
Revolving nosepiece
For BF/DF Sextuple, quintuple, centering quintuple, coded quintuple (optional motorized revolving nosepieces)

Coaxial left (right) handle stage:

76 mm × 52 mm, with torque adjustment
Large-size coaxial left (right) handle stage:
Stage (X × Y) –
105 mm × 100 mm, with locking mechanism in Y-axis
Large-size coaxial right handle stage:
150 mm × 100 mm, with torque adjustment and locking mechanism in Y-axis

Approx. 18.3 kg Approx. 15.8 kg Approx. 11.1 kg

Weight
(Microscope frame 7.6 kg) (Microscope frame 7.4 kg) (Microscope frame 1.9 kg)

BX53M Specifications (for IR Observation)

BX53MRF-S BXFM
IR Observation tube Wide field FN 22 Inverted: trinocular

BX3M-RLA-S
100W/50W halogen lamp for IR, BF/IR, AS (with centering mechanism)
BX3M-URAS-S
Reflected light illumination IR observation 100W/50W halogen lamp for IR, BF/IR, AS (with centering mechanism)

U-KMAS
–
100W/50W halogen for IR, BF/IR

Revolving nosepiece For BF Sextuple, centering sextuple, septuple, coded quintuple (optional motorized revolving nosepieces)

Coaxial left (right) handle stage:

76 mm × 52 mm, with torque adjustment
Large-size coaxial left (right) handle stage:
Stage (X × Y) 105 mm × 100 mm, with locking mechanism in Y-axis –
Large-size coaxial right handle stage:
150 mm × 100 mm, with torque adjustment and
locking mechanism in Y-axis

Weight Approx. 18.9 kg (Microscope frame 7.4 kg) Approx. 11.6 kg (Microscope frame 1.9 kg)

25
BX53M Specifications (for Polarized Observation)
BX53MTRF-S
Inverted: binocular, trinocular, tilting binocular
Wide field FN 22
Erect: trinocular, tilting binocular

Bertrand lens Focusable (for U-CPA only)

Bertrand field stop ø3.4 mm diameter (fixed) (for U-CPA only)
Polarized light intermediate
attachment Engage or disengage
(U-CPA or U-OPA) Bertrand lens changeover
Position of slider in
between orthoscopic (for U-CPA only)
Position of slider out
and conoscopic
observation

Analyzer Slot Rotatable analyzer with slot (U-AN360P-2)

360° dial-rotatable
Analyzer (U-AN360P-2)
Rotatable minimum angle 0.1°

Quadruple, centerable attachable components: 1/4 wavelength retardation plate (U-TAD),

Revolving centerable nosepiece (U-P4RE)
tint plate (U-TP530) and various compensators can be attached using plate adapter (U-TAD)

Polarizing rotatable stage with 3-point centering function

360° rotatable, lockable in any position, 360° graduated in 1° increments
Stage (U-SRP) (minimum retardation resolution 6', using vernier scale)
45° click stop function
Mechanical stage (U-FMP) can be attached

Achromat strain-free condenser (U-POC-2), 360° rotatable polarizer with swing-out achromatic top-lens
Click stop at position "0°" is adjustable
Condenser (U-POC-2) NA 0.9 (top-lens in)
NA 0.18 (top-lens out)
Aperture iris diaphragm: adjustable from 2 mm to 21 mm diameters

Weight Approx. 16.2 kg (Microscope frame 7.6 kg)

BX53M/BXFM ESD Units

Microscope: frame: BX53MRF-S, BX53MTRF-S
Illuminator: BX3M-KMA-S, BX3M-RLA-S, BX3M-URAS-S, BX3M-RLAS-S
Items
Nosepiece: U-D6BDRES-S, U-D6RE-ESD-2, U-D5BDRES-ESD, U-5RES-ESD
Stage: U-SIC4R2, U-SIC4L2, U-MSSP4

Dimensions
BX53M (for Reflected Combination) BX53M (for Reflected/Transmitted Light Combination) BXFM System
208
175 187 317 175 187 285 98
86
86

45 124
45 124

471
471

107 187 62.006 208

209
209

ø32
82
82

86

90 58 90 58
45 40 20

274 362 274 367

**
125

unit: mm unit: mm

231 221
253
BX53M (for IR Observation) BX53M (for Polarized Observation) *123-153 (focus position: 146)
unit: mm **280-310 (focus position: 303)

175 187 400 175 187 271

86

86
45 124

45 117
471

464
209

209
82

82

90 58 90 58
274 362 274 367

unit: mm unit: mm

26
OLYMPUS offers an extensive product line for materials science and industrial microscopy. Learn more about the DSX
series Digital Microscope and LEXT 3D Measuring Laser Microscope on our website, www.olympus-ims.com

LEXT 3D Measuring Laser Microscope

With the Olympus LEXT laser scanning microscope, non-contact
3D observations and measurements of surface features at
10-nanometer resolutions are easy to produce.

OLS4100

DSX Digital Microscope

The DSX’s advanced digital technology delivers superior image
quality with superb operating simplicity, making it perfect for
users of any experience level. The DSX’s intelligent interface is as
simple as using a smartphone or tablet and backed by guaranteed
accuracy and repeatability for 2D and 3D measurements.

DSX510 DSX510i

࠮63@47<:*69769(;065PZ0:6JLY[PÄLK
࠮63@47<:*69769(;065PZ0:6 JLY[PÄLK
• This product is designed for use in industrial environments for the EMC performance. Using it in a residential
environment may affect other equipment in the environment.
• All company and product names are registered trademarks and/or trademarks of their respective owners.
• Images on the PC monitors are simulated.
÷6SHFLðFDWLRQVDQGDSSHDUDQFHVDUHVXEMHFWWRFKDQJHZLWKRXW
• Illumination devices for microscope have suggested lifetimes. Periodic inspections are required.
www.olympus-ims.com 3OHDVHYLVLWRXUZHEVLWHIRUGHWDLOV

Shinjuku Monolith, 2-3-1 Nishi-Shinjuku, Shinjuku-ku, Tokyo 163-0914, Japan

N8600391-062017