fdc2212 q1

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FDC2112-Q1, FDC2114-Q1, FDC2212-Q1, FDC2214-Q1

SNOSCZ9 – MAY 2016
FDC2112-Q1, FDC2114-Q1, FDC2212-Q1, FDC2214-Q1 Multi-Channel 12-Bit or 28-Bit

Capacitance-to-Digital Converter (FDC) for Capacitive Sensing
1 Features 3 Description
•
1 Qualified for Automotive Applications Capacitive sensing is a low-power, low-cost, high-
resolution contactless sensing technique that can be
• AEC-Q100 Qualified With the Following Results: applied to a variety of applications ranging from
– Device Temperature Grade 1:–40°C to +125°C proximity detection to gesture recognition. The sensor
Ambient Operating Temperature Range in a capacitive sensing system is any metal or
– Device HBM ESD Classification Level 2 conductor, allowing for low cost and highly flexible
system design.
– Device CDM ESD Classification Level C5
• EMI-Resistant Architecture The main challenge limiting sensitivity in capacitive
sensing applications is noise susceptibility of the
• Maximum Output Rates (One Active Channel): sensors. With the FDC2x1x-Q1 innovative EMI
– 13.3 ksps (FDC2112-Q1, FDC2114-Q1) resistant architecture, performance can be
– 4.08 ksps (FDC2212-Q1, FDC2214-Q1) maintained even in presence of high-noise
environments.
• Maximum Input Capacitance: 250 nF (at 10 kHz
with 1-mH inductor) The FDC2x1x-Q1 is a multi-channel family of noise-
• Sensor Excitation Frequency: 10 kHz to 10 MHz and EMI-resistant, high-resolution, high-speed
capacitance-to-digital converters for implementing
• Number of Channels: 2, 4 capacitive sensing solutions. The devices employ an
• Resolution: Up to 28 bits innovative narrow-band based architecture to offer
• RMS noise: 0.3 fF at 100 sps and fSENSOR = 5MHz high rejection of noise and interferers while providing
high resolution at high speed. The devices support a
• Supply Voltage: 2.7 V to 3.6 V wide excitation frequency range, offering flexibility in
• Power Consumption: Active: 2.1 mA system design.
• Low-Power Sleep Mode: 35 µA
• Shutdown: 200 nA Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
• Interface: I2C
FDC2112-Q1 WSON (12) 4.00 mm × 4.00 mm
• Temperature Range: –40°C to +125°C
FDC2114-Q1 WQFN (16) 4.00 mm × 4.00 mm
FDC2212-Q1 WSON (12) 4.00 mm × 4.00 mm
2 Applications
FDC2214-Q1 WQFN (16) 4.00 mm × 4.00 mm
• EMI-Resistant Proximity Sensor
(1) For all available packages, see the orderable addendum at
• EMI-Resistant Gesture Recognition the end of the data sheet.
• EMI-Resistant Foreign Object Detection
• EMI-Resistant Rain / Fog / Ice / Snow Sensor
• Automotive Door / Kick Sensors
Simplified Schematic
3.3 V
3.3 V
FDC2114 / FDC2214
VDD
CLKIN MCU VDD

40 MHz
0.1 F 1 F
Int. Osc. GND
IN0A
L SD
Resonant
GPIO
IN0B circuit driver INTB
GPIO
Cap Sensor 0 3.3 V
Core GND
ADDR
IN3A
L
Resonant SDA I 2C
I 2C
IN3B circuit driver SCL peripheral
Cap Sensor 3
Copyright © 2016, Texas Instruments Incorporated
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
SNOSCZ9 – MAY 2016 www.ti.com
Table of Contents
1 Features .................................................................. 1 7.5 Programming........................................................... 21
2 Applications ........................................................... 1 7.6 Register Maps ......................................................... 22
3 Description ............................................................. 1 8 Application and Implementation ........................ 39
4 Revision History..................................................... 2 8.1 Application Information............................................ 39
8.2 Typical Application ................................................. 41
5 Pin Configuration and Functions ......................... 3
8.3 Do's and Don'ts ....................................................... 45
6 Specifications......................................................... 4
6.1 Absolute Maximum Ratings ...................................... 4 9 Power Supply Recommendations...................... 45
6.2 ESD Ratings.............................................................. 4 10 Layout................................................................... 45
6.3 Recommended Operating Conditions....................... 4 10.1 Layout Guidelines ................................................. 45
6.4 Thermal Information ................................................. 4 10.2 Layout Examples................................................... 45
6.5 Electrical Characteristics........................................... 5 11 Device and Documentation Support ................. 50
6.6 Timing Requirements ................................................ 6 11.1 Device Support...................................................... 50
6.7 Switching Characteristics - I2C ................................. 7 11.2 Documentation Support ....................................... 50
6.8 Typical Characteristics .............................................. 8 11.3 Community Resources.......................................... 50
7 Detailed Description ............................................ 10 11.4 Related Links ........................................................ 50
7.1 Overview ................................................................. 10 11.5 Trademarks ........................................................... 50
7.2 Functional Block Diagrams ..................................... 10 11.6 Electrostatic Discharge Caution ............................ 50
7.3 Feature Description................................................. 11 11.7 Glossary ................................................................ 50
7.4 Device Functional Modes........................................ 20 12 Mechanical, Packaging, and Orderable
Information ........................................................... 51
4 Revision History
DATE REVISION NOTES
May 2016 * Initial release.
2 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated
Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1

www.ti.com SNOSCZ9 – MAY 2016
5 Pin Configuration and Functions
FDC2112/FDC2212 DNT Package

12-Pin WSON FDC2114/FDC2214 RGH Package
Top View 16-Pin WQFN
Top View
IN3B
IN3A
IN2B
IN2A
SCL 1 12 IN1B
SDA 2 11 IN1A
16
15
14
13
CLKIN 3 10 IN0B SCL 1 12 IN1B
DAP
ADDR 4 9 IN0A SDA 2 11 IN1A
INTB 5 8 GND DAP
CLKIN 3 10 IN0B
SD 6 7 VDD
ADDR 4 9 IN0A
8
INTB
SD
VDD
GND
Pin Functions
PIN
TYPE (1) DESCRIPTION
NO. NAME
1 SCL I I2C clock input
2 SDA I/O 12C data input/output
3 CLKIN I Master Clock input. Tie this pin to GND if internal oscillator is selected
I2C Address selection pin: when ADDR=L, I2C address = 0x2A, when ADDR=H, I2C address =
4 ADDR I
0x2B.
5 INTB O Configurable Interrupt output pin
6 SD I Shutdown input
7 VDD P Power Supply
8 GND G Ground
9 IN0A A Capacitive sensor input 0
10 IN0B A Capacitive sensor input 0
11 IN1A A Capacitive sensor input 1
12 IN1B A Capacitive sensor input 1
13 IN2A A Capacitive sensor input 2 (FDC2114 / FDC2214 only)
14 IN2B A Capacitive sensor input 2 (FDC2114 / FDC2214 only)
15 IN3A A Capacitive sensor input 3 (FDC2114 / FDC2214 only)
16 IN3B A Capacitive sensor input 3 (FDC2114 / FDC2214 only)
DAP DAP (2) N/A Connect to ground
(1) I = Input, O = Output, P=Power, G=Ground, A=Analog

(2) There is an internal electrical connection between the exposed Die Attach Pad (DAP) and the GND pin of the device. Although the DAP
can be left floating, for best performance the DAP should be connected to the same potential as the device's GND pin. Do not use the
DAP as the primary ground for the device. The device GND pin must always be connected to ground.
Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback 3

6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN MAX UNIT
VDD Supply voltage 5 V
Vi Voltage on any pin –0.3 VDD + 0.3 V
IA Input current on any INx pin –8 8 mA
ID Input current on any digital pin –5 5 mA
TJ Junction temperature –55 150 °C
Tstg Storage temperature –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings

VALUE UNIT
Human-body model (HBM), per AEC Q100-002 (1) ±2000
V(ESD) Electrostatic discharge V
Charged-device model (CDM), per AEC Q100-011 ±750
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.3 Recommended Operating Conditions

Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V
MIN NOM MAX UNIT
VDD Supply voltage 2.7 3.6 V
TA Operating temperature –40 125 °C
6.4 Thermal Information

FDC2112 / FDC2214 /
FDC2212 FDC2214
(1)
THERMAL METRIC UNIT
DNT (WSON) RGH (WQFN)
12 PINS 16 PINS
RθJA Junction-to-ambient thermal resistance 36.7 35.6 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 36.2 36.2 °C/W
RθJB Junction-to-board thermal resistance 14 13.4 °C/W
ψJT Junction-to-top characterization parameter 0.4 0.4 °C/W
ψJB Junction-to-board characterization parameter 14.2 13.4 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance 3.5 3.5 °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.

6.5 Electrical Characteristics

Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V (1)
PARAMETER TEST CONDITIONS (2) MIN (3) TYP (4) MAX (3) UNIT
POWER
VDD Supply voltage TA = –40°C to 125°C 2.7 3.6 V
IDD Supply durrent (not including CLKIN = 10MHz (6)
2.1 mA
sensor current) (5)
IDDSL Sleep mode supply current (5) 35 60 µA
ISD Shutdown mode supply
0.2 1 µA
current (5)
CAPACITIVE SENSOR
CSENSORMAX Maximum sensor capacitance 1-mH inductor, 10-kHz oscillation 250 nF
CIN Sensor pin parasitic
4 pF
capacitance
NBITS Number of bits FDC2112, FDC2114
12 bits
RCOUNT ≥ 0x0400
FDC2212, FDC2214
28 bits
RCOUNT = 0xFFFF
fCS Maximum channel sample rate FDC2112, FDC2114
single active channel continuous 13.3 kSPS
conversion, SCL = 400 kHz
FDC2212, FDC2214
single active channel continuous 4.08 kSPS
conversion, SCL= 400 kHz
EXCITATION
fSENSOR Sensor excitation frequency TA = –40°C to 125°C 0.01 10 MHz
VSENSORMIN Minimum sensor oscillation
1.2 V
amplitude (pk) (7)
VSENSORMAX Maximum sensor oscillation
1.8 V
amplitude (pk)
ISENSORMAX Sensor maximum current drive HIGH_CURRENT_DRV = b0
1.5 mA
DRIVE_CURRENT_CH0 = 0xF800
HIGH_CURRENT_DRV = b1
DRIVE_CURRENT_CH0 = 0xF800 6 mA
Channel 0 only
(1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in
very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables
under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which
the device may be permanently degraded, either mechanically or electrically.
(2) Register values are represented as either binary (b is the prefix to the digits), or hexadecimal (0x is the prefix to the digits). Decimal
values have no prefix.
(3) Limits are ensured by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are ensured through
correlations using statistical quality control (SQC) method.
(4) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(5) I2C read/write communication and pullup resistors current through SCL, SDA not included.
(6) Sensor capacitor: 1 layer, 20.9 × 13.9 mm, Bourns CMH322522-180KL sensor inductor with L=18 µH and 33 pF 1% COG/NP0 Target:
Grounded aluminum plate (176 × 123 mm), Channel = Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b10,
CHx_FREF_DIVIDER = b00 0000 0001 CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100, DRIVE_CURRENT_CH0 = 0x7800.
(7) Lower VSENSORMIN oscillation amplitudes can be used, but will result in lower SNR.

Electrical Characteristics (continued)

Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V(1)
PARAMETER TEST CONDITIONS (2) MIN (3) TYP (4) MAX (3) UNIT
MASTER CLOCK
fCLKIN External master clock input TA = –40°C to 125°C
2 40 MHz
frequency (CLKIN)
CLKINDUTY_MIN External master clock
minimum acceptable duty 40%
cycle (CLKIN)
CLKINDUTY_MAX External master clock
maximum acceptable duty 60%
cycle (CLKIN)
VCLKIN_LO CLKIN low voltage threshold 0.3 VDD V
VCLKIN_HI CLKIN high voltage threshold 0.7 × VDD V
fINTCLK Internal master clock
35 43.4 55 MHz
frequency range
TCf_int_μ Internal master clock
–13 ppm/°C
temperature coefficient mean
6.6 Timing Requirements

MIN NOM MAX UNIT
tSDWAKEUP Wake-up time from SD high-low transition to I2C readback 2 ms
tSLEEPWAKEUP Wake-up time from sleep mode 0.05 ms
tWD-TIMEOUT Sensor recovery time (after watchdog timeout) 5.2 ms
I2C TIMING CHARACTERISTICS
fSCL Clock frequency 10 400 kHz
tLOW Clock low time 1.3 μs
tHIGH Clock high time 0.6 μs
Hold time (repeated) START condition: after this period, the first clock
tHD;STA 0.6 μs
pulse is generated
tSU;STA Setup time for a repeated START condition 0.6 μs
tHD;DAT Data hold time 0 μs
tSU;DAT Data setup time 100 ns
tSU;STO Setup time for STOP condition 0.6 μs
tBUF Bus free time between a STOP and START condition 1.3 μs
tVD;DAT Data valid time 0.9 μs
tVD;ACK Data valid acknowledge time 0.9 μs
tSP Pulse width of spikes that must be suppressed by the input filter (1) 50 ns
(1) This parameter is specified by design and/or characterization and is not tested in production.

6.7 Switching Characteristics - I2C

Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VOLTAGE LEVELS
VIH Input high voltage 0.7 × VDD V
VIL Input low voltage 0.3 × VDD V
VOL Output low voltage (3 mA sink
0.4 V
current)
HYS Hysteresis 0.1 × VDD V
SDA
tBUF
tf tLOW tHD;STA tr
tr tf tSP
SCL
tHD;STA tSU;STA tSU;STO
tHIGH
tHD;DAT tSU;DAT
START REPEATED STOP START

START
Figure 1. I2C Timing

6.8 Typical Characteristics

Common test conditions (unless specified otherwise): Sensor capacitor: 1 layer, 20.9 × 13.9 mm, Bourns CMH322522-180KL
sensor inductor with L = 18 µH and 33 pF 1% COG/NP0 Target: Grounded aluminum plate (176 × 123 mm), Channel =
Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b01, CHx_FREF_DIVIDER = b00 0000 0001
CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100, DRIVE_CURRENT_CH0 = 0x7800.
3.25 3.25
VDD = 2.7 V
3.225 VDD = 3 V
VDD = 3.3 V
3.2 VDD = 3.6 V 3.2
IDD CH0 Current (mA)
IDD CH0 Current (mA)

3.175
3.15 3.15
3.125
3.1 3.1 -40°C 50°C

-20°C 85°C
3.075 0°C 100°C
25°C 125°C
3.05 3.05
-40 -20 0 20 40 60 80 100 120 2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
Temperature (°C) D003
VDD (V) D004
Includes 1.57-mA sensor current Includes 1.57-mA sensor current
–40°C to +125°C
Figure 2. Active Mode IDD vs. Temperature Figure 3. Active Mode IDD vs VDD
60 65
VDD = 2.7 V -40°C 0°C 50°C 100°C
55 VDD = 3 V 60 -20°C 25°C 85°C 125°C
VDD = 3.3 V
VDD = 3.6 V 55
50
Sleep Current (µA)
Sleep Current (µA)
50
45
45
40
40
35
35
30 30
25 25
-40 -20 0 20 40 60 80 100 120 2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
VDD (V) D006
–40°C to +125°C
Figure 4. Sleep Mode IDD vs Temperature Figure 5. Sleep Mode IDD vs VDD
1.4 1.6
VDD = 2.7 V -40°C 0°C 50°C 100°C
1.2 VDD = 3 V 1.4 -20°C 25°C 85°C 125°C
VDD = 3.3 V
VDD = 3.6 V 1.2
Shutdown Current (µA)
Shutdown Current (µA)
1
1
0.8
0.8
0.6
0.6
0.4
0.4
0.2 0.2
0 0
-40 -20 0 20 40 60 80 100 120 2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
VDD (V) D008
–40°C to +125°C
Figure 6. Shutdown Mode IDD vs Temperature Figure 7. Shutdown Mode IDD vs VDD

Typical Characteristics (continued)

Common test conditions (unless specified otherwise): Sensor capacitor: 1 layer, 20.9 × 13.9 mm, Bourns CMH322522-180KL
sensor inductor with L = 18 µH and 33 pF 1% COG/NP0 Target: Grounded aluminum plate (176 × 123 mm), Channel =
Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b01, CHx_FREF_DIVIDER = b00 0000 0001
CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100, DRIVE_CURRENT_CH0 = 0x7800.
43.4 43.41
VDD = 2.7 V -40°C 0°C 50°C 100°C
43.39 VDD = 3 V 43.4 -20°C 25°C 85°C 125°C
VDD = 3.3 V
VDD = 3.6 V 43.39
Internal Oscillator (MHz)

Internal Oscillator (MHz)
43.38
43.38
43.37
43.37
43.36
43.36
43.35
43.35
43.34
43.34
43.33 43.33
43.32 43.32
-40 -20 0 20 40 60 80 100 120 2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
VDD (V) D010
–40°C to +125°C Data based on 1 unit
Figure 8. Internal Oscillator Frequency vs Temperature Figure 9. Internal Oscillator Frequency vs VDD

7 Detailed Description
7.1 Overview
The FDC2112, FDC2114, FDC2212, and FDC2214 are high-resolution, multichannel capacitance-to-digital
converters for implementing capacitive sensing solutions. In contrast to traditional switched-capacitance
architectures, the FDC2112, FDC2114, FDC2212, and FDC2214 employ an L-C resonator, also known as L-C
tank, as a sensor. The narrow-band architecture allows unprecedented EMI immunity and greatly reduced noise
floor when compared to other capacitive sensing solutions.
Using this approach, a change in capacitance of the L-C tank can be observed as a shift in the resonant
frequency. Using this principle, the FDC is a capacitance-to-digital converter (FDC) that measures the oscillation
frequency of an LC resonator. The device outputs a digital value that is proportional to frequency. This frequency
measurement can be converted to an equivalent capacitance
7.2 Functional Block Diagrams
3.3 V
3.3 V
FDC2112 / FDC2212 VDD
CLKIN VDD
40 MHz
0.1 F 1 F
Int. Osc. GND
IN0A
Resonant SD
GPIO
L C IN0B circuit driver INTB
GPIO MCU
Cap 3.3 V
Sensor 0 Core GND
IN1A ADDR
Resonant 2 SDA I 2C
IC
L C IN1B circuit driver SCL peripheral
Cap
Sensor 1
Figure 10. Block Diagram for the FDC2112 and FDC2212

Functional Block Diagrams (continued)
3.3 V
3.3 V
FDC2114 / FDC2214 VDD
CLKIN VDD
40 MHz
0.1 F 1 F
Int. Osc. GND
IN0A
Resonant SD
GPIO
L C IN0B circuit driver INTB
GPIO MCU
Cap 3.3 V
Sensor 0 Core GND
IN3A ADDR
Resonant 2 SDA I 2C
IC
Cap
Sensor 3
Figure 11. Block Diagram for the FDC2114 and FDC2214
The FDC is composed of front-end resonant circuit drivers, followed by a multiplexer that sequences through the
active channels, connecting them to the core that measures and digitizes the sensor frequency (fSENSOR). The
core uses a reference frequency (fREF) to measure the sensor frequency. fREF is derived from either an internal
reference clock (oscillator), or an externally supplied clock. The digitized output for each channel is proportional
to the ratio of fSENSOR/fREF. The I2C interface is used to support device configuration and to transmit the digitized
frequency values to a host processor. The FDC can be placed in shutdown mode, saving current, using the SD
pin. The INTB pin may be configured to notify the host of changes in system status.
7.3 Feature Description

7.3.1 Clocking Architecture
Figure 12 shows the clock dividers and multiplexers of the FDC.

Feature Description (continued)
IN0A
Cap L
÷m tfIN0t
Sensor 0 fSENSOR0 IN0B
CH0_FIN_SEL (0x14)
IN1A
Cap L
÷m tfIN1t
Sensor 1 fSENSOR1 IN1B
CH1_FIN_SEL (0x15) tfINt
IN2A(1)
Cap L ÷m tfIN2(1)t
Sensor 2(1) fSENSOR2(1) (1)
IN2B
CH2_FIN_SEL (0x16)(1)
IN3A(1)
Cap L
÷m tfIN3(1)t
Sensor 3(1) fSENSOR3(1) (1) CONFIG (0x1A)
IN3B
CH3_FIN_SEL (0x17)(1) MUX_CONFIG
Core
(0x1B)
÷n tfREF0t
CH0_FREF_DIVIDER (0x14)
REF_CLK_SRC
(0x1A) ÷n tfREF1t
fCLKIN CLKIN
tfCLKt CH1_FREF_DIVIDER (0x15) tfREFt

tfINTt
÷n tfREF2(1)t
Int. Osc.
CH2_FREF_DIVIDER (0x16)(1)
÷n tfREF3(1)t Data Output
CONFIG (0x1A)
CH3_FREF_DIVIDER (0x17)(1) MUX_CONFIG
(0x1B)
(1) FDC2114 / FDC2214 only
Figure 12. Clocking Diagram
In Figure 12, the key clocks are fIN, fREF, and fCLK. fCLK is selected from either the internal clock source or external
clock source (CLKIN). The frequency measurement reference clock, fREF, is derived from the fCLK source. TI
recommends that precision applications use an external master clock that offers the stability and accuracy
requirements needed for the application. The internal oscillator may be used in applications that require low cost
and do not require high precision. The fINx clock is derived from sensor frequency for a channel x, fSENSORx. fREFx
and fINx must meet the requirements listed in Table 1, depending on whether fCLK (master clock) is the internal or
external clock.

Feature Description (continued)

Table 1. Clock Configuration Requirements
SET
VALID fREFx VALID fINx SET CHx_FIN_SEL SET
MODE (1) CLKIN SOURCE CHx_SETTLECO
RANGE (MHz) RANGE to (2) CHx_RCOUNT to
UNT to
Multi-channel Internal fREFx ≤ 55 Differential sensor
configuration:
External fREFx ≤ 40
b01: 0.01MHz to
Single-channel Either external or fREFx ≤ 35 8.75MHz (divide by 1)
internal b10: 5MHz to 10MHz
< fREFx /4 >3 >8
(divide by 2)
Single-ended sensor
configuration
b10: 0.01MHz to
10MHz (divide by 2)
(1) Channels 2 and 3 are only available for FDC2114 and FDC2214.
(2) Refer to Sensor Configuration for information on differential and single-ended sensor configurations.
Table 2 shows the clock configuration registers for all channels.
Table 2. Clock Configuration Registers

(1)
CHANNEL CLOCK REGISTER FIELD [ BIT(S) ] VALUE
fCLK = Master CONFIG, addr REF_CLK_SRC [9] b0 = internal oscillator is used as the
Clock Source 0x1A master clock
All
b1 = external clock source is used as the
master clock
fREF0 CLOCK_DIVIDER CH0_FREF_DIVIDER [9:0] fREF0 = fCLK / CH0_FREF_DIVIDER
0
S_CH0, addr 0x14
1
S_CH1, addr 0x15
2
S_CH2, addr 0x16
3
S_CH3, addr 0x17
fIN0 CLOCK_DIVIDER CH0_FIN_SEL [13:12] fIN0 = fSENSOR0 / CH0_FIN_SEL
0
S_CH0, addr 0x14
1
S_CH1, addr 0x15
2
S_CH2, addr 0x16
3
S_CH3, addr 0x17
(1) Channels 2 and 3 are only available for FDC2114 and FDC2214
7.3.2 Multi-Channel and Single-Channel Operation

The multi-channel package of the FDC enables the user to save board space and support flexible system design.
For example, temperature drift can often cause a shift in component values, resulting in a shift in resonant
frequency of the sensor. Using a second sensor as a reference provides the capability to cancel out a
temperature shift. When operated in multi-channel mode, the FDC sequentially samples the active channels. In
single-channel mode, the FDC samples a single channel, which is selectable. Table 3 shows the registers and
values that are used to configure either multi-channel or single-channel modes.

Table 3. Single- and Multi-Channel Configuration Registers

MODE REGISTER FIELD [ BIT(S) ] VALUE
00 = chan 0
01 = chan 1
CONFIG, addr 0x1A ACTIVE_CHAN [15:14]
10 = chan 2
Single channel
11 = chan 3
0 = continuous conversion on a
MUX_CONFIG addr 0x1B AUTOSCAN_EN [15]
single channel (default)
1 = continuous conversion on
MUX_CONFIG addr 0x1B AUTOSCAN_EN [15]
multiple channels
Multi-channel 00 = Ch0, Ch 1
MUX_CONFIG addr 0x1B RR_SEQUENCE [14:13] 01 = Ch0, Ch 1, Ch 2
10 = Ch0, CH1, Ch2, Ch3
The digitized sensor measurement for each channel (DATAx) represents the ratio of the sensor frequency to the
reference frequency.
The data output (DATAx) of the FDC2112 and FDC2114 is expressed as the 12 MSBs of a 16-bit result:
12
¦SENSORx
DATA x
¦REFx (1)
The data output (DATAx) of the FDC2212 and FDC2214 is expressed as:
28
¦SENSORx
DATA x
¦REFx (2)
Table 4 lists the registers that contain the fixed point sample values for each channel.
Table 4. Sample Data Registers

FIELD NAME [ BITS(S) ] AND FIELD NAME [ BITS(S) ] AND VALUE
CHANNEL (1) REGISTER (2)
VALUE (FDC2112, FDC2114) (FDC2212, FDC2214) (3) (4)
DATA_CH0, addr 0x00 DATA0 [11:0]: DATA0 [27:16]:
12 bits of the 16 bit conversion 12 MSBs of the 28 bit conversion result
result.
0 0x000 = under range
0xfff = over range
DATA_LSB_CH0, addr 0x01 Not applicable DATA0 [15:0]:
16 LSBs of the 28 bit conversion result
result.
0xfff = over range
result.
0xfff = over range
(2) The DATA_CHx.DATAx register must always be read first, followed by the DATA_LSB_ CHx.DATAx register of the same channel to
ensure data coherency.
(3) A DATA value of 0x0000000 = under range for FDC2212/FDC2214.
(4) A DATA value of 0xFFFFFFF = over range for FDC2212/FDC2214.

Table 4. Sample Data Registers (continued)

FIELD NAME [ BITS(S) ] AND FIELD NAME [ BITS(S) ] AND VALUE
CHANNEL (1) REGISTER (2)
VALUE (FDC2112, FDC2114) (FDC2212, FDC2214) (3) (4)
result.
0xfff = over range
When the FDC sequences through the channels in multi-channel mode, the dwell time interval for each channel
is the sum of three parts:
1. sensor activation time
2. conversion time
3. channel switch delay
The sensor activation time is the amount of settling time required for the sensor oscillation to stabilize, as shown
in Figure 13. The settling wait time is programmable and should be set to a value that is long enough to allow
stable oscillation. The settling wait time for channel x is given by:
tSx = (CHX_SETTLECOUNTˣ16)/fREFx (3)
Table 5 illustrates the registers and values for configuring the settling time for each channel.
Channel 0 Channel 0 Channel Channel 1 Channel 1 Channel Channel 0
Sensor Conversion switch delay Sensor Conversion switch delay Sensor
Activation Activation Activation
Channel 0
Channel 1
Figure 13. Multi-channel Mode Sequencing
Active Channel
Sensor Signal
Sensor Conversion Conversion Conversion

Activation
Amplitude Amplitude Amplitude
Correction Correction Correction
Figure 14. Single-channel Mode Sequencing

Table 5. Settling Time Register Configuration

(1)
CHANNEL REGISTER FIELD CONVERSION TIME (2)
0 SETTLECOUNT_CH0, addr 0x10 CH0_SETTLECOUNT [15:0] (CH0_SETTLECOUNT*16)/fREF0
(1) Channels 2 and 3 are available only in the FDC2114 and FDC2214.
(2) fREFx is the reference frequency configured for the channel.
The SETTLECOUNT for any channel x must satisfy:

CHx_SETTLECOUNT > Vpk × fREFx × C × π2 / (32 × IDRIVEX)
where
• Vpk = Peak oscillation amplitude at the programmed IDRIVE setting
• fREFx = Reference frequency for Channel x
• C = sensor capacitance including parasitic PCB capacitance
• IDRIVEX = setting programmed into the IDRIVE register in amps (4)
Round the result to the next highest integer (for example, if Equation 4 recommends a minimum value of
6.08, program the register to 7 or higher).
The conversion time represents the number of reference clock cycles used to measure the sensor frequency.
It is set by the CHx_RCOUNT register for the channel. The conversion time for any channel x is:
tCx = (CHx_RCOUNT × 16 + 4) /fREFx (5)
The reference count value must be chosen to support the required number of effective bits (ENOB). For
example, if an ENOB of 13 bits is required, then a minimum conversion time of 213 = 8192 clock cycles is
required. 8192 clock cycles correspond to a CHx_RCOUNT value of 0x0200.
Table 6. Conversion Time Configuration Registers, Channels 0 - 3 (1)

CHANNEL REGISTER FIELD [ BIT(S) ] CONVERSION TIME
0 RCOUNT_CH0, addr 0x08 CH0_RCOUNT [15:0] (CH0_RCOUNT × 16)/fREF0
1 RCOUNT_CH1, addr 0x09 CH1_RCOUNT [15:0] (CH1_RCOUNT × 16)/fREF1
2 RCOUNT_CH2, addr 0x0A CH2_RCOUNT [15:0] (CH2_RCOUNT × 16)/fREF2
3 RCOUNT_CH3, addr 0x0B CH3_RCOUNT [15:0] (CH3_RCOUNT × 16)/fREF3
(1) Channels 2 and 3 are available only for FDC2114 and FDC2214.
The typical channel switch delay time between the end of conversion and the beginning of sensor activation of
the subsequent channel is:
Channel Switch Delay = 692 ns + 5 / fref (6)
The deterministic conversion time of the FDC allows data polling at a fixed interval. For example, if the
programmed SETTLECOUNT is 128 FREF cycles (SETTLECOUNT = 0x0008) and RCOUNT is 512 FREF cycles
(RCOUNT=0x0020), then one conversion takes 3.2 ms (sensor-activation time) + 12.8ms (conversion time) +
0.8µs (channel-switch delay) = 16.0 ms per channel. If the FDC is configured for dual-channel operation by
setting AUTOSCAN_EN = 1 and RR_SEQUENCE = 00, then one full set of conversion results will be available
from the data registers every 32 ms.
A data ready flag (DRDY) is also available for interrupt driven system designs (see the STATUS register
description in Register Maps).
7.3.2.1 Gain and Offset (FDC2112, FDC2114 only)

The FDC2112 and FDC2114 have internal 16-bit data converters, but the standard conversion output word width
is only 12 bits; therefore only 12 of the 16 bits are available from the data registers. By default, the gain feature is
disabled and the DATA registers contain the 12 MSBs of the 16-bit word. However, it is possible to shift the data
output by up to 4 bits. Figure 15 shows the segment of the 16-bit sample that is reported for each possible gain
setting.

MSB LSB
Conversion result 15 12 11 8 7 4 3 0
Output_gain = 0x3 11 0
Output_gain = 0x0
(default) 11 0
11 0 Data available in DATA_MSB_CHx.DATA_CHx [11:0]
Figure 15. Conversion Data Output Gain
For systems in which the sensor signal variation is less than 25% of the full-scale range, the FDC can report
conversion results with higher resolution by setting the output gain. the output gain is applied to all device
channels. An output gain can be used to apply a 2-bit, 3-bit, or 4-bit shift to the output code for all channels,
allowing access to the 4 LSBs of the original 16-bit result. The MSBs of the sample are shifted out when a gain is
applied. Do not use the output gain if the MSBs of any active channel are toggling, as the MSBs for that channel
will be lost when gain is applied.
Example: If the conversion result for a channel is 0x07A3, with OUTPUT_GAIN = 0x0, the reported output code
is 0x07A. If OUTPUT_GAIN is set to 0x3 in the same condition, then the reported output code is 0x7A3. The
original 4 MSBs (0x0) are no longer accessible.
Table 7. Output Gain Register (FDC2112 and FDC2114 only)

EFFECTIVE
CHANNEL (1) REGISTER FIELD [ BIT(S) ] VALUES OUTPUT RANGE
RESOLUTION (BITS)
00 (default): Gain =1 (0 bits 12 100% full scale
shift)
RESET_DEV, addr OUTPUT_GAIN [ 01: Gain = 4 (2 bits left shift) 14 25% full scale
All
0x1C 10:9 ] 10: Gain = 8 (3 bits left shift) 15 12.5% full scale
11 : Gain = 16 (4 bits left 16 6.25% full scale
shift)
(1) Channels 2 and 3 are available for FDC2114 only.
An offset value may be subtracted from each DATA value to compensate for a frequency offset or maximize the
dynamic range of the sample data. The offset values should be < fSENSORx_MIN / fREFx. Otherwise, the offset might
be so large that it masks the LSBs which are changing.

Table 8. Frequency Offset Registers

(1)
CHANNEL REGISTER FIELD [ BIT(S) ] VALUE
0 OFFSET_CH0, addr 0x0C CH0_OFFSET [ 15:0 ] fOFFSET0 = CH0_OFFSET × (fREF0/216)
1 OFFSET_CH1, addr 0x0D CH1_OFFSET [ 15:0 ] fOFFSET1 = CH1_OFFSET × (fREF1/216)
2 OFFSET_CH2, addr 0x0E CH2_OFFSET [ 15:0 ] fOFFSET2 = CH2_OFFSET × (fREF2/216)
3 OFFSET_CH3, addr 0x0F CH3_OFFSET [ 15:0 ] fOFFSET3 = CH3_OFFSET × (fREF3/216)
The sensor capacitance CSENSE of a differential sensor configuration can be determined by:
1
CSENSOR C
L (2S ¦SENSORx 2
where
• C = parallel sensor capacitance (see Figure 55) (7)
The FDC2112 and FDC2114 sensor frequency fSENSORx can be determined by:
§ DATAx CHxOFFSET ·
¦SENSORx CHx_FIN_SEL ¦REFx ¨ (12 OUTPUT_GAIN) ¸
©2 216 ¹
where
• DATAx = Conversion result from the DATA_CHx register
• CHx_OFFSET = Offset value set in the OFFSET_CHx register
• OUTPUT_GAIN = output multiplication factor set in the RESET_DEVICE.OUTPUT_GAIN register (8)
The FDC2212 and FDC2214 sensor frequency fSENSORx can be determined by:
CHx_FIN_SEL ¦REFx '$7$x
¦SENSORx
228 (FDC2212, FDC2214)
where
• DATAx = Conversion result from the DATA_CHx register (9)

7.3.3 Current Drive Control Registers

The registers listed in Table 9 are used to control the sensor drive current. The recommendations listed in the
last column of the table should be followed.
Table 9. Current Drive Control Registers

CHANNEL (1) REGISTER FIELD [ BIT(S) ] VALUE
CONFIG, addr 0x1A SENSOR_ACTIVATE_SEL [11] Sets current drive for sensor activation.
All Recommended value is b0 (full current
mode).
CONFIG, addr 0x1A HIGH_CURRENT_DRV [6] b0 = normal current drive (1.5 mA)
b1 = Increased current drive (> 1.5 mA)
0
for Ch 0 in single channel mode only.
Cannot be used in multi-channel mode.
DRIVE_CURRENT_CH0, addr CH0_IDRIVE [15:11] Drive current used during the settling and
0x1E conversion time for Ch. 0. Set such that
0
1.2 V ≤ sensor oscillation amplitude (pk) ≤
1.8 V
0x1F conversion time for Ch. 1. Set such that
1
1.8 V
0x20 conversion time for Ch. 2. Set such that
2
1.8 V
0x21 conversion time for Ch. 3 . Set such that
3
1.8 V
(1) Channels 2 and 3 are available for FDC2114 and FDC2214 only.
The CHx_IDRIVE field should be programmed such that the sensor oscillates at an amplitude between 1.2 Vpk
(VSENSORMIN) and 1.8 Vpk (VSENSORMAX). An IDRIVE value of 00000 corresponds to 16 µA, and IDRIVE = b11111
corresponds to 1563 µA.
A high sensor current drive mode can be enabled to drive sensor coils with > 1.5mA on channel 0, only in single
channel mode. This feature can be used when the sensor minimum recommended oscillation amplitude of 1.2V
cannot be achieved with the highest IDRIVE setting. Set the HIGH_CURRENT_DRV register bit to b1 to enable
this mode.
7.3.4 Device Status Registers

The registers listed in Table 10 may be used to read device status.
Table 10. Status Registers

(1)
CHANNEL REGISTER FIELDS [ BIT(S) ] VALUES
Refer to Register Maps for a
12 fields are available that
All STATUS, addr 0x18 description of the individual
contain various status bits [ 15:0 ]
status bits.
12 fields are available that are Refer to Register Maps for a
All STATUS_CONFIG, addr 0x19 used to configure status reporting description of the individual error
[ 15:0 ] configuration bits.
(1) Channels 2 and 3 are available for FDC2114 and FDC2114 only.
See the STATUS and STATUS_CONFIG register description in Register Maps. These registers can be
configured to trigger an interrupt on the INTB pin for certain events. The following conditions must be met:
1. The error or status register must be unmasked by enabling the appropriate register bit in the
STATUS_CONFIG register
2. The INTB function must be enabled by setting CONFIG.INTB_DIS to 0

When a bit field in the STATUS register is set, the entire STATUS register content is held until read or until the
DATA_CHx register is read. Reading also de-asserts INTB.
Interrupts are cleared by one of the following events:
1. Entering sleep mode
2. Power-on reset (POR)
3. Device enters shutdown mode (SD is asserted)
4. S/W reset
5. I2C read of the STATUS register: Reading the STATUS register clears any error status bit set in STATUS
along with the ERR_CHAN field and de-assert INTB
Setting register CONFIG.INTB_DIS to b1 disables the INTB function and holds the INTB pin high.
7.3.5 Input Deglitch Filter

The input deglitch filter suppresses EMI and ringing above the sensor frequency. It does not impact the
conversion result as long as its bandwidth is configured to be above the maximum sensor frequency. The input
deglitch filter can be configured in MUX_CONFIG.DEGLITCH register field as shown in Table 11. For optimal
performance, TI recommends selection of the lowest setting that exceeds the sensor oscillation frequency. For
example, if the maximum sensor frequency is 2 MHz, choose MUX_CONFIG.DEGLITCH = b100 (3.3 MHz).
Table 11. Input Deglitch Filter Register

MUX_CONFIG.DEGLITCH (addr 0x1B) REGISTER
CHANNEL (1) DEGLITCH FREQUENCY
VALUE
ALL 001 1 MHz
ALL 100 3.3 MHz
ALL 101 10 MHz
ALL 011 33 MHz
(1) Channels 2 and 3 are available for FDC2114 / FDC2214 only.
7.4 Device Functional Modes

7.4.1 Start-Up Mode
When the FDC powers up, it enters into sleep mode and waits for configuration. Once the device is configured,
exit sleep mode by setting CONFIG.SLEEP_MODE_EN to b0.
TI recommends configuring the FDC while in sleep mode. If a setting on the FDC needs to be changed, return
the device to sleep mode, change the appropriate register, and then exit sleep mode.
7.4.2 Normal (Conversion) Mode

When operating in the normal (conversion) mode, the FDC is periodically sampling the frequency of the
sensor(s) and generating sample outputs for the active channel(s).
7.4.3 Sleep Mode

Sleep mode is entered by setting the CONFIG.SLEEP_MODE_EN register field to 1. While in this mode, the
device configuration is maintained. To exit sleep mode, set the CONFIG.SLEEP_MODE_EN register field to 0.
After setting CONFIG.SLEEP_MODE_EN to b0, sensor activation for the first conversion begins after 16,384 fINT
clock cycles. While in sleep mode the I2C interface is functional so that register reads and writes can be
performed. While in sleep mode, no conversions are performed. In addition, entering sleep mode will clear
conversion results, any error condition, and de-assert the INTB pin.
7.4.4 Shutdown Mode

When the SD pin is set to high, the FDC enters shutdown mode. Shutdown mode is the lowest power state. To
exit shutdown mode, set the SD pin to low. Entering shutdown mode returns all registers to their default state.

Device Functional Modes (continued)

While in shutdown mode, no conversions are performed. In addition, entering shutdown mode clears any error
condition and de-assert the INTB pin. While the device is in shutdown mode, is not possible to read to or write
from the device via the I2C interface.
7.4.4.1 Reset
The FDC can be reset by writing to RESET_DEV.RESET_DEV. Any active conversion stops, and all register
values return to their default value. This register bit always returns 0b when read.
7.5 Programming
The FDC device uses an I2C interface to access control and data registers.
7.5.1 I2C Interface Specifications

The FDC uses an extended start sequence with I2C for register access. The maximum speed of the I2C
interface is 400 kbit/s. This sequence follows the standard I2C 7-bit slave address followed by an 8-bit pointer
register byte to set the register address. When the ADDR pin is set low, the FDC I2C address is 0x2A; when the
ADDR pin is set high, the FDC I2C address is 0x2B. The ADDR pin must not change state after the FDC exits
Shutdown Mode.
1 9 1 9
SCL
SDA A6 A5 A4 A3 A2 A1 A0 R/W R7 R6 R5 R4 R3 R2 R1 R0
Start by Ack by Ack by
Master Slave Slave
Frame 1 Frame 2
Serial Bus Address Byte Slave Register
from Master Address
1 9 1 9
SCL
SDA D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Ack by Ack by Stop by

Slave Slave Master
Frame 3 Frame 4
Data MSB from Data LSB from
Master Master
Figure 16. I2C Write Register Sequence
1 9 1 9
SCL
SDA A6 A5 A4 A3 A2 A1 A0 R/W R7 R6 R5 R4 R3 R2 R1 R0
Start by Ack by Ack by
Master Slave Slave
Frame 1 Frame 2
Serial Bus Address Byte Slave Register
from Master Address
1 9 1 9 1 9
SCL
SDA A6 A5 A4 A3 A2 A1 A0 R/W D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0

Start by Ack by Ack by Nack by Stop by
Master Slave Master Master Master
Frame 3 Frame 4 Frame 5
Serial Bus Address Byte Data MSB from Data LSB from
from Master Slave Slave
Figure 17. I2C Read Register Sequence

7.6 Register Maps

7.6.1 Register List
Fields indicated with Reserved must be written only with indicated values, otherwise improper device operation
may occur. The R/W column indicates the Read-Write status of the corresponding field. A ‘R/W’ entry indicates
read and write capability, a ‘R’ indicates read-only, and a ‘W’ indicates write-only.
Figure 18. Register List
ADDRESS NAME DEFAULT VALUE DESCRIPTION
0x00 DATA_CH0 0x0000 Channel 0 Conversion Result and status (FDC2112 / FDC2114 only)
0x0000 Channel 0 MSB Conversion Result and status (FDC2212 / FDC2214 only)
0x01 DATA_LSB_CH0 0x0000 Channel 0 LSB Conversion Result. Must be read after Register address
0x00 (FDC2212 / FDC2214 only)
0x02 DATA_CH1 0x0000 Channel 1 Conversion Result and status (FDC2112 / FDC2114 only)
0x0000 Channel 1 MSB Conversion Result and status (FDC2212 / FDC2214 only)
0x02 (FDC2212 / FDC2214 only)
0x04 DATA_CH2 0x0000 Channel 2 Conversion Result and status (FDC2114 only)
0x0000 Channel 2 MSB Conversion Result and status (FDC2214 only)
0x04 (FDC2214 only)
0x06 DATA_CH3 0x0000 Channel 3 Conversion Result and status (FDC2114 only)
0x0000 Channel 3 MSB Conversion Result and status (FDC2214 only)
0x06 (FDC2214 only)
0x08 RCOUNT_CH0 0x0080 Reference Count setting for Channel 0
0x09 RCOUNT_CH1 0x0080 Reference Count setting for Channel 1
0x0A RCOUNT_CH2 0x0080 Reference Count setting for Channel 2 (FDC2114 / FDC2214 only)
0x0B RCOUNT_CH3 0x0080 Reference Count setting for Channel 3 (FDC2114 / FDC2214 only)
0x0C OFFSET_CH0 0x0000 Offset value for Channel 0 (FDC2112 / FDC2114 only)
0x0D OFFSET_CH1 0x0000 Offset value for Channel 1 (FDC2112 / FDC2114 only)
0x0E OFFSET_CH2 0x0000 Offset value for Channel 2 (FDC2114 only)
0x0F OFFSET_CH3 0x0000 Offset value for Channel 3 (FDC2114 only)
0x10 SETTLECOUNT_CH0 0x0000 Channel 0 Settling Reference Count
0x11 SETTLECOUNT_CH1 0x0000 Channel 1 Settling Reference Count
0x12 SETTLECOUNT_CH2 0x0000 Channel 2 Settling Reference Count (FDC2114 / FDC2214 only)
0x13 SETTLECOUNT_CH3 0x0000 Channel 3 Settling Reference Count (FDC2114 / FDC2214 only)
0x14 CLOCK_DIVIDERS_CH0 0x0000 Reference divider settings for Channel 0
0x15 CLOCK_DIVIDERS_CH1 0x0000 Reference divider settings for Channel 1
0x16 CLOCK_DIVIDERS_CH2 0x0000 Reference divider settings for Channel 2 (FDC2114 / FDC2214 only)
0x17 CLOCK_DIVIDERS_CH3 0x0000 Reference divider settings for Channel 3 (FDC2114 / FDC2214 only)
0x18 STATUS 0x0000 Device Status Reporting
0x19 STATUS_CONFIG 0x0000 Device Status Reporting Configuration
0x1A CONFIG 0x2801 Conversion Configuration
0x1B MUX_CONFIG 0x020F Channel Multiplexing Configuration
0x1C RESET_DEV 0x0000 Reset Device
0x1E DRIVE_CURRENT_CH0 0x0000 Channel 0 sensor current drive configuration
0x1F DRIVE_CURRENT_CH1 0x0000 Channel 1 sensor current drive configuration
0x20 DRIVE_CURRENT_CH2 0x0000 Channel 2 sensor current drive configuration (FDC2114 / FDC2214 only)
0x21 DRIVE_CURRENT_CH3 0x0000 Channel 3 sensor current drive configuration (FDC2114 / FDC2214 only)
0x7E MANUFACTURER_ID 0x5449 Manufacturer ID
0x7F DEVICE_ID 0x3054 Device ID (FDC2112, FDC2114 only)
0x3055 Device ID (FDC2212, FDC2214 only)

7.6.2 Address 0x00, DATA_CH0

Figure 19. Address 0x00, DATA_CH0
15 14 13 12 11 10 9 8
RESERVED CH0_ERR_WD CH0_ERR_AW DATA0
7 6 5 4 3 2 1 0
DATA0
Table 12. Address 0x00, DATA_CH0 Field Descriptions

Bit Field Type Reset Description
15:14 RESERVED R 00 Reserved.
13 CH0_ERR_WD R 0 Channel 0 Conversion Watchdog Timeout Error Flag. Cleared by
reading the bit.
12 CH0_ERR_AW R 0 Channel 0 Amplitude Warning. Cleared by reading the bit.
11:0 DATA0 (FDC2112 / FDC2114 only) R 0000 0000 Channel 0 Conversion Result
0000
DATA0[27:16] (FDC2212 /
FDC2214 only)
7.6.3 Address 0x01, DATA_LSB_CH0 (FDC2212 / FDC2214 only)

Figure 20. Address 0x01, DATA_LSB_CH0
15 14 13 12 11 10 9 8
DATA0
7 6 5 4 3 2 1 0
DATA0

15:0 DATA0[15:0] R 0000 0000 Channel 0 Conversion Result
0000
7.6.4 Address 0x02, DATA_CH1

15 14 13 12 11 10 9 8
7 6 5 4 3 2 1 0
DATA1

reading the bit.
0000
DATA1[27:16] (FDC2212 /
FDC2214 only)

7.6.5 Address 0x03, DATA_LSB_CH1 (FDC2212 / FDC2214 only)

15 14 13 12 11 10 9 8
DATA1
7 6 5 4 3 2 1 0
DATA1

0000
7.6.6 Address 0x04, DATA_CH2 (FDC2114, FDC2214 only)

15 14 13 12 11 10 9 8
7 6 5 4 3 2 1 0
DATA2

reading the bit.
0000
DATA2[27:16] (FDC2212 /
FDC2214 only)
7.6.7 Address 0x05, DATA_LSB_CH2 (FDC2214 only)

15 14 13 12 11 10 9 8
DATA2
7 6 5 4 3 2 1 0
DATA2

0000

7.6.8 Address 0x06, DATA_CH3 (FDC2114, FDC2214 only)

15 14 13 12 11 10 9 8
7 6 5 4 3 2 1 0
DATA3

reading the bit.
0000
DATA3[27:16] (FDC2212 /
FDC2214 only)
7.6.9 Address 0x07, DATA_LSB_CH3 (FDC2214 only)

15 14 13 12 11 10 9 8
DATA3
7 6 5 4 3 2 1 0
DATA3

0000
7.6.10 Address 0x08, RCOUNT_CH0
Figure 27. Address 0x08, RCOUNT_CH0

15 14 13 12 11 10 9 8
CH0_RCOUNT
7 6 5 4 3 2 1 0
CH0_RCOUNT
Table 20. Address 0x08, RCOUNT_CH0 Field Descriptions

15:0 CH0_RCOUNT R/W 0000 0000 Channel 0 Reference Count Conversion Interval Time
1000 0000 0x0000-0x00FF: Reserved
0x0100-0xFFFF: Conversion Time (tC0) =
(CH0_RCOUNTˣ16)/fREF0

7.6.11 Address 0x09, RCOUNT_CH1
Figure 28. Address 0x09, RCOUNT_CH1

15 14 13 12 11 10 9 8
CH1_RCOUNT
7 6 5 4 3 2 1 0
CH1_RCOUNT
Table 21. Address 0x09, RCOUNT_CH1 Field Descriptions

1000 0000 0x0000-0x00FF: Reserved
0x0100-0xFFFF: Conversion Time (tC1)=
7.6.12 Address 0x0A, RCOUNT_CH2 (FDC2114, FDC2214 only)
Figure 29. Address 0x0A, RCOUNT_CH2

15 14 13 12 11 10 9 8
CH2_RCOUNT
7 6 5 4 3 2 1 0
CH2_RCOUNT
Table 22. Address 0x0A, RCOUNT_CH2 Field Descriptions

1000 0000 0x0000-0x00FF: Reserved
7.6.13 Address 0x0B, RCOUNT_CH3 (FDC2114, FDC2214 only)
Figure 30. Address 0x0B, RCOUNT_CH3

15 14 13 12 11 10 9 8
CH3_RCOUNT
7 6 5 4 3 2 1 0
CH3_RCOUNT
Table 23. Address 0x0B, RCOUNT_CH3 Field Descriptions

1000 0000 0x0000-0x00FF: Reserved

7.6.14 Address 0x0C, OFFSET_CH0 (FDC21112 / FDC2114 only)
Figure 31. Address 0x0C, CH0_OFFSET

15 14 13 12 11 10 9 8
CH0_OFFSET
7 6 5 4 3 2 1 0
CH0_OFFSET
Table 24. CH0_OFFSET Field Descriptions

15:0 CH0_OFFSET R/W 0000 0000 Channel 0 Conversion Offset. fOFFSET_0 =
0000 0000 (CH0_OFFSET/216)*fREF0
7.6.15 Address 0x0D, OFFSET_CH1 (FDC21112 / FDC2114 only)
Figure 32. Address 0x0D, OFFSET_CH1

15 14 13 12 11 10 9 8
CH1_OFFSET
7 6 5 4 3 2 1 0
CH1_OFFSET
Table 25. Address 0x0D, OFFSET_CH1 Field Descriptions

0000 0000 (CH1_OFFSET/216)*fREF1
7.6.16 Address 0x0E, OFFSET_CH2 (FDC2114 only)
Figure 33. Address 0x0E, OFFSET_CH2

15 14 13 12 11 10 9 8
CH2_OFFSET
7 6 5 4 3 2 1 0
CH2_OFFSET
Table 26. Address 0x0E, OFFSET_CH2 Field Descriptions

0000 0000 (CH2_OFFSET/216)*fREF2

7.6.17 Address 0x0F, OFFSET_CH3 (FDC2114 only)
Figure 34. Address 0x0F, OFFSET_CH3

15 14 13 12 11 10 9 8
CH3_OFFSET
7 6 5 4 3 2 1 0
CH3_OFFSET
Table 27. Address 0x0F, OFFSET_CH3 Field Descriptions

0000 0000 (CH3_OFFSET/216)*fREF3
7.6.18 Address 0x10, SETTLECOUNT_CH0
Figure 35. Address 0x10, SETTLECOUNT_CH0

15 14 13 12 11 10 9 8
CH0_SETTLECOUNT
7 6 5 4 3 2 1 0
CH0_SETTLECOUNT
Table 28. Address 0x11, SETTLECOUNT_CH0 Field Descriptions

15:0 CH0_SETTLECOUNT R/W 0000 0000 Channel 0 Conversion Settling
0000 0000 The FDC will use this settling time to allow the LC sensor to
stabilize before initiation of a conversion on Channel 0.
If the amplitude has not settled prior to the conversion start, an
Amplitude warning will be generated if reporting of this type of
warning is enabled.
0x0000: Settle Time (tS0)= 32 ÷ fREF0
0x0002 - 0xFFFF: Settle Time (tS0)= (CH0_SETTLECOUNTˣ16)
÷ fREF0
7.6.19 Address 0x11, SETTLECOUNT_CH1

15 14 13 12 11 10 9 8
CH1_SETTLECOUNT
7 6 5 4 3 2 1 0
CH1_SETTLECOUNT

stabilize before initiation of a conversion on a Channel 1.
warning is enabled.
÷ fREF1

7.6.20 Address 0x12, SETTLECOUNT_CH2 (FDC2114, FDC2214 only)

15 14 13 12 11 10 9 8
CH2_SETTLECOUNT
7 6 5 4 3 2 1 0
CH2_SETTLECOUNT

warning is enabled.
0x0000: Settle Time (tS2) = 32 ÷ fREF2
÷ fREF2
7.6.21 Address 0x13, SETTLECOUNT_CH3 (FDC2114, FDC2214 only)

15 14 13 12 11 10 9 8
CH3_SETTLECOUNT
7 6 5 4 3 2 1 0
CH3_SETTLECOUNT

warning is enabled
÷ fREF3

7.6.22 Address 0x14, CLOCK_DIVIDERS_CH0
Figure 39. Address 0x14, CLOCK_DIVIDERS_CH0

15 14 13 12 11 10 9 8
RESERVED CH0_FIN_SEL RESERVED CH0_FREF_DIVIDER
7 6 5 4 3 2 1 0
CH0_FREF_DIVIDER
Table 32. Address 0x14, CLOCK_DIVIDERS_CH0 Field Descriptions

15:14 RESERVED R/W 00 Reserved. Set to b00.
00 Channel 0 Sensor frequency select
for differential sensor configuration:
b01: divide by 1. Choose for sensor frequencies between 0.01
MHz and 8.75 MHz
13:12 CH0_FIN_SEL R/W b10: divide by 2. Choose for sensor frequencies between 5 MHz
and 10 MHz
for single-ended sensor configuration:
MHz and 10 MHz
00 0000 Channel 0 Reference Divider
0000 Sets the divider for Channel 0 reference. Use this to scale the
maximum conversion frequency.
9:0 CH0_FREF_DIVIDER R/W
b00’0000’0000: Reserved. Do not use.
CH0_FREF_DIVIDER≥b00’0000’0001: fREF0 =
fCLK/CH0_FREF_DIVIDER
7.6.23 Address 0x15, CLOCK_DIVIDERS_CH1

15 14 13 12 11 10 9 8
7 6 5 4 3 2 1 0
CH1_FREF_DIVIDER

0000 Channel 1 Sensor frequency select
MHz and 8.75 MHz
13:12 CH1_FIN_SEL R/W b10: divide by 2. Choose for sensor frequencies between 5 MHz
and 10 MHz
MHz and 10 MHz
00 0000 Channel 1 Reference Divider
9:0 CH1_FREF_DIVIDER R/W
CH1_FREF_DIVIDER≥ b00’0000’0001: fREF1 =

7.6.24 Address 0x16, CLOCK_DIVIDERS_CH2 (FDC2114, FDC2214 only)

15 14 13 12 11 10 9 8
7 6 5 4 3 2 1 0
CH2_FREF_DIVIDER

13:12 CH2_FIN_SEL R/W 0000 Channel 2 Sensor frequency select
MHz and 8.75 MHz
b10: divide by 2. Choose for sensor frequencies between 5 MHz
and 10 MHz
MHz and 10 MHz
9:0 CH2_FREF_DIVIDER R/W 00 0000 Channel 2 Reference Divider
CH2_FREF_DIVIDER ≥ b00’0000’0001: fREF2 =
7.6.25 Address 0x17, CLOCK_DIVIDERS_CH3 (FDC2114, FDC2214 only)

15 14 13 12 11 10 9 8
7 6 5 4 3 2 1 0
CH3_FREF_DIVIDER
Table 35. Address 0x17, CLOCK_DIVIDERS_CH3

13:12 CH3_FIN_SEL R/W 0000 Channel 3 Sensor frequency select
MHz and 8.75 MHz
b10: divide by 2. Choose for sensor frequencies between 5 MHz
and 10 MHz
MHz and 10 MHz
9:0 CH3_FREF_DIVIDER R/W 00 0000 Channel 3 Reference Divider
b00’0000’0000: reserved
CH3_FREF_DIVIDER ≥ b00’0000’0001: fREF3 =

7.6.26 Address 0x18, STATUS
Figure 43. Address 0x18, STATUS

15 14 13 12 11 10 9 8
ERR_CHAN RESERVED ERR_WD RESERVED
7 6 5 4 3 2 1 0
RESERVED DRDY RESERVED CH0_UNREA CH1_ CH2_ CH3_
DCONV UNREADCONV UNREADCONV UNREADCONV
Table 36. Address 0x18, STATUS Field Descriptions

15:14 ERR_CHAN R 00 Error Channel
Indicates which channel has generated a Flag or Error. Once flagged, any reported
error is latched and maintained until either the STATUS register or the DATA_CHx
register corresponding to the Error Channel is read.
b00: Channel 0 is source of flag or error.
b01: Channel 1 is source of flag or error.
b10: Channel 2 is source of flag or error (FDC2114, FDC2214 only).
b11: Channel 3 is source of flag or error (FDC2114, FDC2214 only).
13:12 RESERVED R 00 Reserved
11 ERR_WD R 0 Watchdog Timeout Error
b0: No Watchdog Timeout error was recorded since the last read of the STATUS
register.
b1: An active channel has generated a Watchdog Timeout error. Refer to
STATUS.ERR_CHAN field to determine which channel is the source of this error.
10 ERR_AHW R 0 Amplitude High Warning
b0: No Amplitude High warning was recorded since the last read of the STATUS
register.
b1: An active channel has generated an Amplitude High warning. Refer to
STATUS.ERR_CHAN field to determine which channel is the source of this
warning.
9 ERR_ALW R 0 Amplitude Low Warning
b0: No Amplitude Low warning was recorded since the last read of the STATUS
register.
b1: An active channel has generated an Amplitude Low warning. Refer to
STATUS.ERR_CHAN field to determine which channel is the source of this
warning.
8:7 RESERVED R 00 Reserved
6 DRDY R 0 Data Ready Flag.
b0: No new conversion result was recorded in the STATUS register.
b1: A new conversion result is ready. When in Single Channel Conversion, this
indicates a single conversion is available. When in sequential mode, this indicates
that a new conversion result for all active channels is now available.
3 CH0_UNREADCONV R 0 Channel 0 Unread Conversion b0: No unread conversion is present for Channel 0.
b1: An unread conversion is present for Channel 0.
Read Register DATA_CH0 to retrieve conversion results.
2 CH1_ UNREADCONV R 0 Channel 1 Unread Conversion b0: No unread conversion is present for Channel 1.
Read Register DATA_CH1 to retrieve conversion results.
1 CH2_ UNREADCONV R 0 Channel 2 Unread Conversion b0: No unread conversion is present for Channel 2.
Read Register DATA_CH2 to retrieve conversion results (FDC2114, FDC2214
only)
0 CH3_ UNREADCONV R 0 Channel 3 Unread Conversion
b0: No unread conversion is present for Channel 3.
Read Register DATA_CH3 to retrieve conversion results (FDC2114, FDC2214
only)

7.6.27 Address 0x19, ERROR_CONFIG
Figure 44. Address 0x19, ERROR_CONFIG

15 14 13 12 11 10 9 8
RESERVED WD_ AH_WARN2OU AL_WARN2OU RESERVED
ERR2OUT T T
7 6 5 4 3 2 1 0
RESERVED WD_ERR2INT RESERVED DRDY_2INT
Table 37. Address 0x19, ERROR_CONFIG

15:14 RESERVED R/W 00 Reserved (set to b000)
13 WD_ ERR2OUT R/W 0 Watchdog Timeout Error to Output Register
b0: Do not report Watchdog Timeout errors in the DATA_CHx
registers.
b1: Report Watchdog Timeout errors in the
DATA_CHx.CHx_ERR_WD register field corresponding to the
channel that generated the error.
12 AH_WARN2OUT R/W 0 Amplitude High Warning to Output Register
b0:Do not report Amplitude High warnings in the DATA_CHx
registers.
b1: Report Amplitude High warnings in the
DATA_CHx.CHx_ERR_AW register field corresponding to the
channel that generated the warning.
11 AL_WARN2OUT R/W 0 Amplitude Low Warning to Output Register
b0: Do not report Amplitude Low warnings in the DATA_CHx
registers.
b1: Report Amplitude High warnings in the
DATA_CHx.CHx_ERR_AW register field corresponding to the
channel that generated the warning.
10:6 RESERVED R/W 0 0000 Reserved (set to b0 0000)
5 WD_ERR2INT R/W 0 Watchdog Timeout Error to INTB b0: Do not report Under-range
errors by asserting INTB pin and STATUS register.
b1: Report Watchdog Timeout errors by asserting INTB pin and
updating STATUS.ERR_WD register field.
4:1 Reserved R/W 0000 Reserved (set to b000)
0 DRDY_2INT R/W 0 Data Ready Flag to INTB b0: Do not report Data Ready Flag by
asserting INTB pin and STATUS register.
b1: Report Data Ready Flag by asserting INTB pin and updating
STATUS. DRDY register field.

7.6.28 Address 0x1A, CONFIG
Figure 45. Address 0x1A, CONFIG

15 14 13 12 11 10 9 8
ACTIVE_CHAN SLEEP_MODE RESERVED SENSOR_ACTI RESERVED REF_CLK_SR RESERVED
_EN VATE_SEL C
7 6 5 4 3 2 1 0
INTB_DIS HIGH_CURRE RESERVED
NT_DRV
Table 38. Address 0x1A, CONFIG Field Descriptions

15:14 ACTIVE_CHAN R/W 00 Active channel selection
Selects channel for continuous conversions when
MUX_CONFIG.SEQUENTIAL is 0.
b00: Perform continuous conversions on Channel 0
b01: Perform continuous conversions on Channel 1
b10: Perform continuous conversions on Channel 2 (FDC2114,
FDC2214 only)
b11: Perform continuous conversions on Channel 3 (FDC2114,
FDC2214 only)
13 SLEEP_MODE_EN R/W 1 Sleep mode enable
Enter or exit low power sleep mode.
b0: Device is active.
b1: Device is in sleep mode.
12 RESERVED R/W 0 Reserved. Set to b1.
11 SENSOR_ACTIVATE_SEL R/W 1 Sensor activation mode selection.
Set the mode for sensor initialization.
b0: Full current activation mode – the FDC will drive maximum
sensor current for a shorter sensor activation time.
b1: Low power activation mode – the FDC uses the value
programmed in DRIVE_CURRENT_CHx during sensor
activation to minimize power consumption.
9 REF_CLK_SRC R/W 0 Select Reference Frequency Source
b0: Use Internal oscillator as reference frequency
b1: Reference frequency is provided from CLKIN pin.
7 INTB_DIS R/W 0 INTB Disable
b0: INTB pin is asserted when status register updates.
b1: INTB pin is not asserted when status register updates
6 HIGH_CURRENT_DRV R/W 0 High Current Sensor Drive
b0: The FDC drives all channels with normal sensor current (1.5
mA maximum).
b1: The FDC drives channel 0 with current >1.5 mA.
This mode is not supported if AUTOSCAN_EN = b1 (multi-
channel mode)
5:0 RESERVED R/W 00 0001 Reserved Set to b00’0001

7.6.29 Address 0x1B, MUX_CONFIG
Figure 46. Address 0x1B, MUX_CONFIG

15 14 13 12 11 10 9 8
AUTOSCAN_E RR_SEQUENCE RESERVED
N
7 6 5 4 3 2 1 0
RESERVED DEGLITCH
Table 39. Address 0x1B, MUX_CONFIG Field Descriptions

15 AUTOSCAN_EN R/W 0 Auto-Scan mode enable
b0: Continuous conversion on the single channel selected by
CONFIG.ACTIVE_CHAN register field.
b1: Auto-Scan conversions as selected by
MUX_CONFIG.RR_SEQUENCE register field.
14:13 RR_SEQUENCE R/W 00 Auto-Scan sequence configuration
Configure multiplexing channel sequence. The FDC performs a
single conversion on each channel in the sequence selected,
and then restart the sequence continuously.
b00: Ch0, Ch1
b01: Ch0, Ch1, Ch2 (FDC2114, FDC2214 only)
b10: Ch0, Ch1, Ch2, Ch3 (FDC2114, FDC2214 only)
b11: Ch0, Ch1
12:3 RESERVED R/W 00 0100 Reserved. Must be set to 00 0100 0001
0001
2:0 DEGLITCH R/W 111 Input deglitch filter bandwidth.
Select the lowest setting that exceeds the oscillation tank
oscillation frequency.
b001: 1 MHz
b100: 3.3 MHz
b101: 10 MHz
b111: 33 MHz
7.6.30 Address 0x1C, RESET_DEV
Figure 47. Address 0x1C, RESET_DEV

15 14 13 12 11 10 9 8
RESET_DEV RESERVED OUTPUT_GAIN RESERVED
7 6 5 4 3 2 1 0
RESERVED
Table 40. Address 0x1C, RESET_DEV Field Descriptions

15 RESET_DEV R/W 0 Device Reset
Write b1 to reset the device. Will always readback 0.
14:11 RESERVED R/W 0000 Reserved. Set to b0000
10:9 OUTPUT_GAIN R/W 00 Output gain control (FDC2112, FDC2114 only)
00: Gain =1 (0 bits shift)
01: Gain = 4 (2 bits shift)
8:0 RESERVED R/W 0 0000 Reserved, Set to b0 0000 0000
0000

7.6.31 Address 0x1E, DRIVE_CURRENT_CH0
Figure 48. Address 0x1E, DRIVE_CURRENT_CH0

15 14 13 12 11 10 9 8
CH0_IDRIVE RESERVED
7 6 5 4 3 2 1 0
RESERVED
Table 41. Address 0x1E, DRIVE_CURRENT_CH0 Field Descriptions

15:11 CH0_IDRIVE R/W 0000 0 Channel 0 Sensor drive current
This field defines the Drive Current used during the settling +
conversion time of Channel 0 sensor clock. Set such that 1.2V ≤
sensor oscillation amplitude (pk) ≤ 1.8V
00000: 0.016 mA
00001: 0.018 mA
00010: 0.021 mA
00011: 0.025 mA
00100: 0.028 mA
00101: 0.033 mA
00110: 0.038 mA
00111: 0.044 mA
01000: 0.052 mA
01001: 0.060 mA
01010: 0.069 mA
01011: 0.081 mA
01100: 0.093 mA
01101: 0.108 mA
01110: 0.126 mA
01111: 0.146 mA
10000: 0.169 mA
10001: 0.196 mA
10010: 0.228 mA
10011: 0.264 mA
10100: 0.307 mA
10101: 0.356 mA
10110: 0.413 mA
10111: 0.479 mA
11000: 0.555 mA
11001: 0.644 mA
11010: 0.747 mA
11011: 0.867 mA
11100: 1.006 mA
11101: 1.167 mA
11110: 1.354 mA
11111: 1.571 mA
10:0 RESERVED – 000 0000 Reserved
0000

7.6.32 Address 0x1F, DRIVE_CURRENT_CH1
Figure 49. Address 0x1F, DRIVE_CURRENT_CH1

15 14 13 12 11 10 9 8
CH1_IDRIVE RESERVED
7 6 5 4 3 2 1 0
RESERVED
Table 42. Address 0x1F, DRIVE_CURRENT_CH1 Field Descriptions

This field defines the drive current used during the settling +
conversion time of Channel 1 sensor clock. Set such that 1.2 V
≤ sensor oscillation amplitude (pk) ≤ 1.8 V
00000: 0.016 mA
00001: 0.018 mA
00010: 0.021 mA
...
11111: 1.571 mA
10:0 RESERVED - 000 0000 Reserved
0000
7.6.33 Address 0x20, DRIVE_CURRENT_CH2 (FDC2114 / FDC2214 only)
Figure 50. Address 0x20, DRIVE_CURRENT_CH2

15 14 13 12 11 10 9 8
CH2_IDRIVE RESERVED
7 6 5 4 3 2 1 0
RESERVED
Table 43. Address 0x20, DRIVE_CURRENT_CH2 Field Descriptions

This field defines the drive current to be used during the settling
+ conversion time of Channel 2 sensor clock. Set such that 1.2
V ≤ sensor oscillation amplitude (pk) ≤ 1.8 V
00000: 0.016 mA
00001: 0.018 mA
00010: 0.021 mA
...
11111: 1.571 mA
0000

7.6.34 Address 0x21, DRIVE_CURRENT_CH3 (FDC2114 / FDC2214 only)
Figure 51. Address 0x21, DRIVE_CURRENT_CH3

15 14 13 12 11 10 9 8
CH3_IDRIVE RESERVED
7 6 5 4 3 2 1 0
RESERVED
Table 44. DRIVE_CURRENT_CH3 Field Descriptions

This field defines the drive current to be used during the settling
+ conversion time of Channel 3 sensor clock. Set such that 1.2V
≤ sensor oscillation amplitude (pk) ≤ 1.8 V
00000: 0.016 mA
00001: 0.018 mA
00010: 0.021 mA
...
11111: 1.571 mA
0000
7.6.35 Address 0x7E, MANUFACTURER_ID
Figure 52. Address 0x7E, MANUFACTURER_ID

15 14 13 12 11 10 9 8
MANUFACTURER_ID
7 6 5 4 3 2 1 0
MANUFACTURER_ID
Table 45. Address 0x7E, MANUFACTURER_ID Field Descriptions

15:0 MANUFACTURER_ID R 0101 0100 Manufacturer ID = 0x5449
0100 1001
7.6.36 Address 0x7F, DEVICE_ID
Figure 53. Address 0x7F, DEVICE_ID

7 6 5 4 3 2 1 0
DEVICE_ID
Table 46. Address 0x7F, DEVICE_ID Field Descriptions

7:0 DEVICE_ID R 0011 0000 Device ID
0101 0100 0x3054 (FDC2112, FDC2114 only)
0x3055 (FDC2212, FDC2214 only)

8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information

8.1.1 Sensor Configuration
The FDC supports two sensor configurations. Both configurations use an LC tank to set the frequency of
oscillation. A typical choice is an 18-μH shielded SMD inductor in parallel with a 33-pF capacitor, which result in
a 6.5-MHz oscillation frequency. In the single-ended configuration in Figure 54, a conductive plate is connected
IN0A. Together with a target object, the conductive plate forms a variable capacitor.
Target object
Sensor plate
FDC211x / FDC221x
IN0A
L C
18 H 33 pF
IN0B
Figure 54. Single-ended Sensor Configuration
In the differential sensor configuration in Figure 55, one conductive plate is connected to IN0A, and a second
conductive plate is connected to IN0B. Together, they form a variable capacitor. When using an single-ended
sensor configuration, set CHx_FIN_SEL to b10 (divide by 2).
Target object
Sensor plate (1) FDC211x / FDC221x
IN0A
L C
18 H 33 pF
IN0B
Sensor plate (2)
Figure 55. Differential Sensor Configuration
The single-ended configuration allows higher sensing range than the differential configuration for a given total
sensor plate area. In applications in which high sensitivity at close proximity is desired, the differential
configuration performs better than the single-ended configuration.

Application Information (continued)

8.1.2 Shield
in order to minimize interference from external objects, some applications require an additional plate which acts
as a shield. The shield can either be:
• actively driven shield: The shield is a buffered signal of the INxA pin. The signal is buffered by an external
amplifier with a gain of 1.
• passive shield: The shield is connected to GND. Adding a passive shield decreases sensitivity of the sensor,
but is dependent on the distance between the distance between the sensing plate and the shield. The
distance between the sensing plate and the shield should be adjusted to achieve the required sensitivity
8.1.3 Power-Cycled Applications

For applications which do not require high sample rates or maximum conversion resolution, the total active
conversion time of the FDC can be minimized to reduce power consumption. This can be done by either by using
sleep mode or shutdown mode during times in which conversions are not required (see Device Functional
Modes).
As an example, for an application which only needs 10 samples per second with a resolution of 16 bits can utilize
the low-power modes. The sensor requires SETTLECOUNT = 16 and IDRIVE of 01111b (0.146 mA). Given
FREF = 40 MHz and RCOUNT = 4096 will provide the resolution required. This corresponds to 4096 × 16 × 10 /
40 MHz → 16.4 ms of active conversion time per second. Start-up time and channel switch delay account for an
additional 0.34 ms. For the remainder of the time, the device can be in sleep mode: Therefore, the average
current is 19.4 ms * 3.6 mA active current + 980.6 ms of 35 µA of sleep current, which is approximately 104.6 µA
of average supply current. Sleep mode retains register settings and therefore requires less I2C writes to wake up
the FDC than shutdown mode.
Greater current savings can be realized by use of shutdown mode during inactive periods. In shutdown mode,
device configuration is not retained, so the device must be configured for each sample. For this example,
configuring each sample takes approximately 1.2 ms (13 registers × 92.5 µs per register). The total active time is
20.6 ms. The average current is 20 ms × 3.6 mA active current + 980 ms × 2 µA of shutdown current, which is
approximately 75 µA of average supply current.
For further information on power-cycled applications, refer to Power Reduction Techniques for the
FDC2214/2212/2114/2112 in Capacitive Sensing Applications.
8.1.4 Inductor Self-Resonant Frequency

Every inductor has a distributed parasitic capacitance, which is dependent on construction and geometry. At the
self-resonant frequency (SRF), the reactance of the inductor cancels the reactance of the parasitic capacitance.
Above the SRF, the inductor will electrically appear to be a capacitor. Because the parasitic capacitance is not
well-controlled or stable, TI recommends: fSENSOR < 0.8 × fSR.
175.0
150.0
125.0
Ls (µH)
100.0
75.0
50.0
25.0
0.0
0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0
Frequency (MHz)
Figure 56. Example Coil Inductance vs Frequency
The example inductor in Figure 56, has a SRF at 6.38 MHz; therefore, the inductor must not be operated above
0.8 × 6.38 MHz, or 5.1 MHz.

Application Information (continued)

8.1.5 Application Curves for Proximity Sensing
Common test conditions (unless specified otherwise): Sensor capacitor: 1 layer, 20.9 × 13.9 mm, Bourns
CMH322522-180KL sensor inductor with L=18 µH and 33 pF 1% COG/NP0 Target: Grounded aluminum plate
(176 × 123 mm), Channel = Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b10,
CHx_FREF_DIVIDER = b00 0000 0001 CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100,
DRIVE_CURRENT_CH0 = 0x7800
25 0.14
0.12
20
0.1
Capacitance (pF)
Capacitance (pF)
15
0.08
0.06
10
0.04
5
0.02
0 0
0 2 4 6 8 10 12 14 16 18 20 20 22 24 26 28 30 32 34 36 38 40
Target Distance (mm) with 20.9 x 13.9 mm Sensor D028
Figure 57. FDC2212 / FDC2214: Capacitance vs Target Figure 58. FDC2112 / FDC2114: Capacitance vs Target
Distance (0 to 20 mm) Distance (20 to 40 mm)
0.035
0.03
0.025
Capacitance (pF)
0.02
0.015
0.01
0.005
0
40 42 44 46 48 50 52 54 56 58 60
Figure 59. FDC2212 / FDC2214: Capacitance vs Target Distance (40 to 60 mm)
8.2 Typical Application

The FDC can be used to measure liquid level in non-conductive containers. Due to its very high excitation rate
capability, it is able to measure soapy water, ink, soap, and other conductive liquids. Capacitive sensors can be
attached to the outside of the container or be located remotely from the container, allowing for contactless
measurements.
The working principle is based on a ratiometric measurement; Figure 60 shows a possible system
implementation which uses three electrodes. The level electrode provides a capacitance value proportional to the
liquid level. The reference environmental electrode and the reference liquid electrode are used as references.
The reference liquid electrode accounts for the liquid dielectric constant and its variation, while the reference
environmental electrode is used to compensate for any other environmental variations that are not due to the
liquid itself. Note that the reference environmental electrode and the reference liquid electrode are the same
physical size (hREF).
For this application, single-ended measurements on the active channels are appropriate, as the tank is
grounded. Use to determine the liquid level from the measured capacitances:
Typical Application (continued)

CLev CLev (0)
Level href
CRL CRE
where
• CRE is the capacitance of the reference environmental electrode,
• CRL is the capacitance of the reference liquid electrode,
• CLev is the current value of the capacitance measured at the level electrode sensor,
• CLev(0) is the capacitance of the Level electrode when the container is empty, and
• hREF is the height in the desired units of the container or liquid reference electrodes.
The ratio between the capacitance of the level and the reference electrodes allows simple calculation of the liquid
level inside the container itself. Very high sensitivity values (that is, many LSB/mm) can be obtained due to the
high resolution of the FDC2x1x, even when the sensors are located remotely from the container. Note that this
approach assumes that the container has a uniform cross section from top to bottom, so that each incremental
increase or decrease in the liquid represents a change in volume that is directly related to the height of the liquid.
3.3 V
3.3 V
FDC2114 / FDC2214
VDD
CLKIN VDD
40 MHz 0.1 F 1 F
Int. Osc. GND
IN0A
LEVEL Resonant SD
GPIO
SENSOR L C IN0B circuit driver INTB
ENVIRONMENTAL
SENSOR
GPIO MCU
Cap 3.3 V
Sensor 0 Core GND
IN1A ADDR
Resonant SDA I 2C
LIQUID I 2C
SENSOR
Cap
Sensor 1
IN2A
Resonant
L C IN2B circuit driver
Cap
Sensor 2
IN3A
Resonant
IN3B circuit driver
Figure 60. FDC (Liquid Level Measurement)
8.2.1 Design Requirements

The liquid level measurement should be independent of the liquid, which can be achieved using the 3-electrode
design described above. Moreover, the sensor should be isolated from environmental interferers such as a
human body, other objects, or EMI.
8.2.2 Detailed Design Procedure

In capacitive sensing systems, the design of the sensor plays an important role in determining system
performance and capabilities. In most cases the sensor is simply a metal plate that can be designed on the PCB.


The sensor used in this example is implemented with a two-layer PCB. On the top layer, which faces the tank,
there are the 3 electrodes (reference environmental, reference liquid, and level) with a ground plane surrounding
the electrodes.
Depending on the shape of the container, the FDC can be located on the sensor PCB to minimize the length of
the traces between the input channels and the sensors. In case the shape of the container or other mechanical
constraints do not allow having the sensors and the FDC on the same PCB, the traces which connect the
channels to the sensor need to be shielded with the appropriate shield.
8.2.3 Application Performance Plot

A liquid level sensor with 3 electrodes like the one shown in the schematic was connected to the EVM. The plot
shows the capacitance measured by Level sensor at different levels of liquid in the tank. The capacitance of the
Reference Liquid and Reference Environmental sensors have a steady value because they experience
consistent exposure to liquid and air, while the capacitance of the level sensor (Level) increases linearly with the
height of the liquid in the tank.
4.7
4.65
4.6
4.55
4.5
Level (pF)
4.45
4.4
4.35
4.3
4.25
4.2
4.15
4.1
10 15 20 25 30 35 40
Level (mm) D031
Figure 61. Electrodes' Capacitance vs Liquid Level
8.2.4 Recommended Initial Register Configuration Values

The application requires 100SPS (TSAMPLE = 10 ms). A sensor with an 18-µH inductor and a 33-pF capacitor
is used. Additional pin, trace, and wire capacitance accounts for 20 pF, so the total capacitance is 53-pF.
Using L and C, fSENSOR = 1/2π√(LC) = 1/2π√(18 × 10-6 × 50 × 10-12) = 5.15 MHz. This represents the
maximum sensor frequency. When the sensor capacitance is added, the frequency will decrease.
Using a system master clock of 40 MHz applied to the CLKIN pin allows flexibility for setting the internal
clock frequencies. The sensor coils are connected to channel 0 (IN0A and IN0B pins), channel 1 (IN1A and
IN1B pins), and channel 2 (IN2A and IN2B pins).
After powering on the FDC, it will be in Sleep Mode. Program the registers as follows (example sets registers
for channel 0 only; channel 1 and channel 2 registers can use equivalent configuration):
1. Set the dividers for channel 0.
(a) Because the sensor is in an single-ended configuration, the sensor frequency select register should be
set to 2, which means setting field CH0_FIN_SELto b10.
(b) The design constraint for fREF0 is > 4 × fSENSOR. To satisfy this constraint, fREF0 must be greater than 20.6
MHz, so the reference divider should be set to 1. This is done by setting the CH0_FREF_DIVIDER field
to 0x01.
(c) The combined value for Chan. 0 divider register (0x14) is 0x2001.
2. Sensor drive current: to ensure that the oscillation amplitude is between 1.2V and 1.8V, measure the
oscillation amplitude on an oscilloscope and adjust the IDRIVE value, or use the integrated FDC GUI feature
to determine the optimal setting. In this case the IDRIVE value should be set to 15 (decimal), which results in
an oscillation amplitude of 1.68 V(pk). The INIT_DRIVE current field should be set to 0x00. The combined
value for the DRIVE_CURRENT_CH0 register (addr 0x1E) is 0x7C00.


3. Program the settling time for Channel 0 (see Multi-Channel and Single-Channel Operation).
(a) CHx_SETTLECOUNT > Vpk × fREFx × C × π2 / (32 × IDRIVEX) → 7.5, rounded up to 8. To provide margin
to account for system tolerances, a higher value of 10 is chosen.
(b) Register 0x10 should be programmed to a minimum of 10.
(c) The settle time is: (10 × 16)/40,000,000 = 4 µs
(d) The value for Channel 0 SETTLECOUNT register (0x10) is 0x000A.
4. The channel switching delay is approximately 1 μs for fREF = 40 MHz (see Multi-Channel and Single-Channel
Operation)
5. Set the conversion time by the programming the reference count for Channel 0. The budget for the
conversion time is : 1/N × (TSAMPLE – settling time – channel switching delay) = 1/3 (10,000 – 4 – 1) = 3.33
ms
(a) To determine the conversion time register value, use the following equation and solve for
CH0_RCOUNT: Conversion Time (tC0)= (CH0_RCOUNT × 16)/fREF0.
(b) This results in CH0_RCOUNT having a value of 8329 decimal (rounded down). Note that this yields an
ENOB > 13 bits.
(c) Set the CH0_RCOUNT register (0x08) to 0x2089.
6. Use the default values for the ERROR_CONFIG register (address 0x19). By default, no interrupts are
enabled
7. Program the MUX_CONFIG register
(a) Set the AUTOSCAN_EN to b1 bit to enable sequential mode
(b) Set RR_SEQUENCE to b10 to enable data conversion on three channels (channel 0, channel 1, channel
2)
(c) Set DEGLITCH to b101 to set the input deglitch filter bandwidth to 10 MHz, the lowest setting that
exceeds the oscillation tank frequency.
(d) The combined value for the MUX_CONFIG register (address 0x1B) is 0xC20D
8. Finally, program the CONFIG register as follows:
(a) Set the ACTIVE_CHAN field to b00 to select channel 0.
(b) Set SLEEP_MODE_EN field to b0 to enable conversion.
(c) Set SENSOR_ACTIVATE_SEL = b0, for full current drive during sensor activation
(d) Set the REF_CLK_SRC field to b1 to use the external clock source.
(e) Set the other fields to their default values.
(f) The combined value for the CONFIG register (address 0x1A) is 0x1601.
We then read the conversion results for channel 0 to channel 2 every 10ms from register addresses 0x00 to
0x05.
Based on the example configuration above, TI recommends the following register write sequence
is recommended:
Table 47. Recommended Initial Register Configuration Values (Multi-channel Operation)

ADDRESS VALUE REGISTER NAME COMMENTS
0x08 0x8329 RCOUNT_CH0 Reference count calculated from timing requirements (100 SPS) and
resolution requirements
0x09 0x8329 RCOUNT_CH1 Reference count calculated from timing requirements (100 SPS) and
0x0A 0x8329 RCOUNT_CH2 Reference count calculated from timing requirements (100 SPS) and
0x10 0x000A SETTLECOUNT_CH0 Minimum settling time for chosen sensor
0x14 0x2002 CLOCK_DIVIDER_CH0 CH0_FIN_DIVIDER = 1, CH0_FREF_DIVIDER = 2
0x19 0x0000 ERROR_CONFIG Can be changed from default to report status and error conditions


Table 47. Recommended Initial Register Configuration Values (Multi-channel Operation) (continued)
ADDRESS VALUE REGISTER NAME COMMENTS
0x1B 0xC20D MUX_CONFIG Enable Ch 0 , Ch 1, and Ch 2 (sequential mode), set Input deglitch
bandwidth to 10MHz
0x1E 0x7C00 DRIVE_CURRENT_CH0 Sets sensor drive current on ch 0
0x1F 0x7C00 DRIVE_CURRENT_CH1 Sets sensor drive current on ch 1
0x20 0x7C00 DRIVE_CURRENT_CH2 Sets sensor drive current on ch 2
Enable full current drive during sensor activation, select external clock
source, wake up device to start conversion. This register write must occur
0x1A 0x1601 CONFIG
last because device configuration is not permitted while the FDC is in active
mode.
8.3 Do's and Don'ts

• Do leave a small gap between sensor plates in differential configurations. 2-3mm minimum separation is
recommended.
• The FDC does not support hot-swapping of the sensors. Do not hot-swap sensors, for example by using
external multiplexers.
9 Power Supply Recommendations

The FDC requires a voltage supply within 2.7 V and 3.6 V. TI recommends multilayer ceramic bypass X7R
capacitors of 0.1 μF and 1 μF between the VDD and GND pins. If the supply is located more than a few inches
from the FDC, additional bulk capacitance may be required in addition to the ceramic bypass capacitors. An
electrolytic capacitor with a value of 10 μF is a typical choice.
The optimum placement is closest to the VDD and GND pins of the device. Care should be taken to minimize the
loop area formed by the bypass capacitor connection, the VDD pin, and the GND pin of the device. See
Figure 62 and Figure 65 for layout examples.
10 Layout
10.1 Layout Guidelines

• Avoid long traces to connect the sensor to the FDC. Short traces reduce parasitic capacitances between
sensor inductor and offer higher system performance.
• Systems that require matched channel response need to have matched trace length on all active channels.
10.2 Layout Examples

Figure 62 to Figure 65 show the FDC2114 / FDC2214 evaluation module (EVM) layout.

Layout Examples (continued)
Figure 62. Example PCB Layout: Top Layer (Signal)

Figure 63. Example PCB Layout: Mid-Layer 1 (GND)

Figure 64. Example PCB Layout: Mid-layer 2 (Power)

Figure 65. Example PCB Layout: Bottom Layer (Signal)

11 Device and Documentation Support
11.1 Device Support

11.1.1 Development Support
For related links, see the following:
Texas Instruments' WEBENCH® tool: http://www.ti.com/webench
11.2 Documentation Support

11.2.1 Related Documentation
For related documentation, refer to the following:
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal
Metrics application report (SPRA953)
11.3 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
11.4 Related Links

The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 48. Related Links

TECHNICAL TOOLS & SUPPORT &
PARTS PRODUCT FOLDER SAMPLE & BUY
DOCUMENTS SOFTWARE COMMUNITY
FDC2112-Q1 Click here Click here Click here Click here Click here
11.5 Trademarks
E2E is a trademark of Texas Instruments.
WEBENCH is a registered trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
11.6 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
11.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.

12 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

PACKAGE OPTION ADDENDUM
www.ti.com 26-Jun-2016
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
FDC2112QDNTRQ1 ACTIVE WSON DNT 12 4500 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FDC2112
& no Sb/Br) Q1
FDC2112QDNTTQ1 ACTIVE WSON DNT 12 250 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FDC2112
& no Sb/Br) Q1
FDC2114QRGHRQ1 ACTIVE WQFN RGH 16 4500 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FC2114Q
& no Sb/Br)
FDC2114QRGHTQ1 ACTIVE WQFN RGH 16 250 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FC2114Q
& no Sb/Br)
FDC2212QDNTRQ1 ACTIVE WSON DNT 12 4500 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FDC2212
& no Sb/Br) Q1
FDC2212QDNTTQ1 ACTIVE WSON DNT 12 250 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FDC2212
& no Sb/Br) Q1
FDC2214QRGHRQ1 ACTIVE WQFN RGH 16 4500 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FC2214Q
& no Sb/Br)
FDC2214QRGHTQ1 ACTIVE WQFN RGH 16 250 Green (RoHS CU SN Level-3-260C-168 HR -40 to 125 FC2214Q
& no Sb/Br)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 26-Jun-2016
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF FDC2112-Q1, FDC2114-Q1, FDC2212-Q1, FDC2214-Q1 :
• Catalog: FDC2112, FDC2114, FDC2212, FDC2214
NOTE: Qualified Version Definitions:
• Catalog - TI's standard catalog product
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 20-Sep-2016
TAPE AND REEL INFORMATION
*All dimensions are nominal

Device Package Package Pins SPQ Reel Reel A0 B0 K0 P1 W Pin1
Type Drawing Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
FDC2112QDNTRQ1 WSON DNT 12 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
FDC2112QDNTTQ1 WSON DNT 12 250 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
FDC2114QRGHRQ1 WQFN RGH 16 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
FDC2114QRGHTQ1 WQFN RGH 16 250 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
FDC2212QDNTRQ1 WSON DNT 12 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
FDC2212QDNTTQ1 WSON DNT 12 250 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
FDC2214QRGHRQ1 WQFN RGH 16 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
FDC2214QRGHTQ1 WQFN RGH 16 250 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 20-Sep-2016
*All dimensions are nominal

Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
FDC2112QDNTRQ1 WSON DNT 12 4500 367.0 367.0 35.0
FDC2112QDNTTQ1 WSON DNT 12 250 210.0 185.0 35.0
FDC2114QRGHRQ1 WQFN RGH 16 4500 367.0 367.0 35.0
FDC2114QRGHTQ1 WQFN RGH 16 250 210.0 185.0 35.0
FDC2212QDNTRQ1 WSON DNT 12 4500 367.0 367.0 35.0
FDC2212QDNTTQ1 WSON DNT 12 250 210.0 185.0 35.0
FDC2214QRGHRQ1 WQFN RGH 16 4500 367.0 367.0 35.0
FDC2214QRGHTQ1 WQFN RGH 16 250 210.0 185.0 35.0
Pack Materials-Page 2
PACKAGE OUTLINE
RGH0016A SCALE 3.000
WQFN - 0.8 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
4.1 A
B
3.9
0.5
0.3
PIN 1 INDEX AREA

4.1 0.3
3.9 0.2
DETAIL
OPTIONAL TERMINAL
TYPICAL
DIM A
OPT 1 OPT 1
(0.1) (0.2)
C
0.8 MAX
SEATING PLANE
0.05
0.00
0.08
2.6 0.1 (A) TYP

5 8
SEE TERMINAL EXPOSED
DETAIL THERMAL PAD
12X 0.5
4
9
4X 17 SYMM
1.5
1
12
0.3
16X
0.2
0.1 C A B
PIN 1 ID 16 13 0.05
SYMM
(OPTIONAL)
0.5
16X
0.3
4214978/B 01/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for optimal thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
RGH0016A WQFN - 0.8 mm max height
( 2.6)
SYMM
16 13
16X (0.6)
(R0.05)
1 TYP
12
16X (0.25)
17 SYMM
(3.8)
(1)
9
4
12X (0.5)
( 0.2) TYP
VIA
5 8
(1)
(3.8)
LAND PATTERN EXAMPLE

EXPOSED METAL SHOWN
SCALE:15X
0.07 MAX 0.07 MIN

ALL AROUND ALL AROUND
SOLDER MASK
METAL OPENING
EXPOSED METAL EXPOSED METAL
SOLDER MASK METAL UNDER

OPENING SOLDER MASK
NON SOLDER MASK

SOLDER MASK
DEFINED
DEFINED
(PREFERRED)
SOLDER MASK DETAILS

4214978/B 01/2017
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
www.ti.com
EXAMPLE STENCIL DESIGN
RGH0016A WQFN - 0.8 mm max height
4X ( 1.15)
(0.675) TYP
16 13
17
16X (0.6)
1
(0.675)
12 TYP
16X (0.25)
SYMM
(3.8)
12X (0.5)
9
4
EXPOSED METAL
TYP
5 8
(R0.05) SYMM
TYP
(3.8)
SOLDER PASTE EXAMPLE

BASED ON 0.125 mm THICK STENCIL
EXPOSED PAD 17
78% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
SCALE:20X
4214978/B 01/2017
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
MECHANICAL DATA
DNT0012B WSON - 0.8mm max height
SON (PLASTIC SMALL OUTLINE - NO LEAD)
SDA12B (Rev A)
4214928/A 03/2013
NOTES: 1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This package is designed to be soldered to a thermal pad on the board for thermal and mechanical performance.
For more information, refer to QFN/SON PCB application note in literature No. SLUA271 (www.ti.com/lit/slua271).
www.ti.com
IMPORTANT NOTICE
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semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers
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TI’s published terms of sale for semiconductor products (http://www.ti.com/sc/docs/stdterms.htm) apply to the sale of packaged integrated
circuit products that TI has qualified and released to market. Additional terms may apply to the use or sale of other types of TI products and
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Reproduction of significant portions of TI information in TI data sheets is permissible only if reproduction is without alteration and is
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Folder Buy Documents Software Community

FDC2112-Q1, FDC2114-Q1, FDC2212-Q1, FDC2214-Q1

FDC2112-Q1, FDC2114-Q1, FDC2212-Q1, FDC2214-Q1 Multi-Channel 12-Bit or 28-Bit

CLKIN MCU VDD

Copyright © 2016, Texas Instruments Incorporated

2 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated

Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1

5 Pin Configuration and Functions

FDC2112/FDC2212 DNT Package

(1) I = Input, O = Output, P=Power, G=Ground, A=Analog

Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback 3

6.2 ESD Ratings

6.3 Recommended Operating Conditions

6.4 Thermal Information

4 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated

Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1

6.5 Electrical Characteristics

Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback 5

Electrical Characteristics (continued)

6.6 Timing Requirements

6 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated

Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1

6.7 Switching Characteristics - I2C

START REPEATED STOP START

Figure 1. I2C Timing

Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback 7

6.8 Typical Characteristics

IDD CH0 Current (mA)

3.1 3.1 -40°C 50°C

Sleep Current (µA)

Shutdown Current (µA)

8 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated

Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1

Typical Characteristics (continued)

Internal Oscillator (MHz)

Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback 9

7.2 Functional Block Diagrams

FDC2112 / FDC2212 VDD

Figure 10. Block Diagram for the FDC2112 and FDC2212

10 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated

Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1

Functional Block Diagrams (continued)

FDC2114 / FDC2214 VDD

Figure 11. Block Diagram for the FDC2114 and FDC2214

7.3 Feature Description

Copyright © 2016, Texas Instruments Incorporated Submit Documentation Feedback 11

Feature Description (continued)

tfCLKt CH1_FREF_DIVIDER (0x15) tfREFt

÷n tfREF3(1)t Data Output

Copyright © 2016, Texas Instruments Incorporated

(1) FDC2114 / FDC2214 only

Figure 12. Clocking Diagram

12 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated

Product Folder Links: FDC2112-Q1 FDC2114-Q1 FDC2212-Q1 FDC2214-Q1

Feature Description (continued)

Table 2 shows the clock configuration registers for all channels.

Table 2. Clock Configuration Registers

7.3.2 Multi-Channel and Single-Channel Operation