Ieee 943-1986
Ieee 943-1986
Ieee 943-1986
Published by The Institute of Electrical and Electronics Engineers, Inc 345 East 47th Street, New York, N Y 10017, USA
Ailgust
22%1986
SH10629
ANSI/IEEE
Std 943-1986
Sponsor
Copyright 1986
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Foreword
(This Foreword is not a part of ANSVIEEE Std 943-1986, IEEE Guide for Aging Mechanisms and Diagnostic Procedures in
Evaluating Electrical Insulation Systems.)
This guide was developed to aid equipment committees standardize tests for use in evaluating
electrical insulation systems. In the development of this guide the IEC Publication 610 (1978), Principal
Aspects of Functional Evaluation of Electrical Insulation Systems: Aging Mechanisms and Diagnostic
Procedures, was followed closely. When this guide was approved the IEEE Standards Coordinating
Committee 4,Thermal Rating had the following membership:
E. A. Boulter, Chairman
D. E. Armstrong
E. L. Brancato
L. W. Buchanan
C. deTourrei1
G. I. Duncan
R. J. Flaherty
M. Fort
H. N. Galpern
W. H. Gottung
T. B. Jenkins
c. Y. Lu
M. L. Manning
K. N. Mathes
H. Rosen
H. R. Sheppard
W. T. Starr
C. R. Willmore
When this guide was approved the members of the Electrical Insulation Systems Working Group were
as follows:
L. W. Buchanan
G. I. Duncan
M. M. Epstein
E. M. Forte
H. N. Galpern
M. L. Manning
K. N. Mathes
W. B. Penn
H. I. Reymers
H. Rosen
H. R. Sheppard
W. T. Starr
C. R. Willmore
The following persons were designated by SCC4 as the balloting committee that approved this
document for submission to the IEEE Standards Board:
P. E. Alexander
B. F. Allen
D. E. Armstrong
A. C. Baker
J.C. Botts
E. A. Boulter
E. L. Brancato
L. W. Brotherton
L. W. Buchanan
*Nonvotingmember
V. Condello*
C. deTourreil
G. I. Duncan
M. M. Epstein
R. J. Flaherty
E. M. Forte
H. N. Galpern
J. Goetz
M. L. Manning
K. N. Mathes
W. B. Penn
N. Porter
H. I. Reymers
H. Rosen
H. R. Sheppard
W. T. Starr
;C. R. Willmore*
When the IEEE Standards Board approved this standard on J u n e 13, 1985, it had the following
membership:
Lawrence V. McCall
Donald T. Michael.
Frank L. Rose
Clifford 0. Swanson
J. Richard Weger
W. B. Wilkens
Charles J . Wylie
Contents
SECTION
PAGE
6
1. Purpose and Scope .......................................................................................
. .. .. .. .. .. .. .. .. .. . .... .. .. . . . ... . .. ... .. .... .. .. .. .... . .. .. .. . ... .. .. . .. 6
1.1 Purpose ... ... .. .. .... .. . . _..
1.2 Scope . . . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2. References .. . ... ... . . .. .. ...... .. .. .. .. .. .. .. .. .. .. .... .... ... .... .. . .. .. .. . .. .. .. .. .. .. .. . ...... .... .. ... . 6
3. Aging Mechanisms and Their Verification . .. . . . . . . . . . . . . . . . . . . . .. . .. . . . . . . . .. .. . . . . . . . . . . . . . . . . . . . .. . . . 7
3.1 General .... .. .. .. .... . ...... .. .. .. .. ...... .. .. ............. .... ... .. ......... .... .. ..... ... . .. .. .. .. ... 7
3.2 Assessment of Insulation Condition After Test or Service . . . .. . . . . . . . . . .. .. .. . . . . . . . . . . . . . . . . . . . 7
ANSI/IEEE
Std 943-1986
Diagnostic methods, which are especially sensitive in ascertaining changes in the test specimen's condition, may have the advantage that
tests at relatively less intensified stresses can be
included to determine the changes of the system's characteristics or aging rate. Diagnostic
methods are reviewed in Section 4.
It must be recognized that functional test
procedures may require the selection of an arbitrary end-point criterion that does not correspond to equipment failure. This end-point, however, provides a relative measure of life
expectancy.
2. References
This guide shall be used in conjunction with the
following publications:
[ l ] ANSI/IEEE Std 100-1984, IEEE Standard
Dictionary of Electrical and Electronics Terms.'
ANWIEEE
Std 943-1986
and at various times may yield pertinent information on the aging process.
Such properties are primarily electric or
mechanical, and concern the internal structure
of the specimens. For example, structural
changes can be detected by a change in elasticity
or hardness. Additionally, partial discharge intensity may sometimes be of value to aid in the
detection of changes in the structure of an insulation system.
When electrical aging is involved, particularly
at increased frequency, it is advisable t o determine dielectric loss as a function of frequency at
the test temperatures to avoid abnormally high
dielectric heating during aging tests. In some
cases, dielectric heating could lead to thermal
instability and make the aging process nonrepresentative of actual service conditions. This kind
of mechanism can occur even at the power frequency, usually at the higher levels of temperature, when excessive dielectric heating is
observed. Adjustment of the test frequencies or
introducing temperature control may therefore
be required in order to minimize the affects of
dielectric heating.
3.2.2 Chemical Investigations. Chemical
analysis of specimens can reveal much information pertaining to the aging process. For example, the polymerization of cellulose tracks the
percentage of life remaining in paper insulation
and analysis of degradation products gives information on the aging process. The rate of
increase of acidity or monitoring the consumption of antioxidants may permit comparison of
aging rates at different stress levels.
The rates of diffusion among adjacent components of an insulation system or changes in solubility among components may also give information pertinent to the aging process. An insulating
liquid or gas may be contaminated by the release
of compounds from other components of the
insulation system or from its container.
In the analysis of the gaseous degradation
products during aging, the most widely used
method of investigation is gas chromatography,
possibly in combination with mass spectroscopy.
Hydrogen, carbon oxides, and light hydrocarbons are to be found among gaseous products of
degradation that are formed from organic materials. The degradation products are dependent
upon the electrical and thermal stresses involved
and will differ from one another significantly as
conditions vary.
Monitoring of a liquid insulation can yield
3.1 General
3.1.1 Verification of Service-Related Aging
Mechanisms. Possible approaches to verification
of service-related aging mechanisms include
( 1 ) Assessment of the insulation system condition after service
(2) Correlation of aging stresses in test and in
service
(3) Review and evaluation of test results
3.1.2 Diagnostic Methods. Changes in the
specimen and its degradation products are monitored by suitable diagnostic methods. These
methods are selected (see Table 1) based on the
knowledge of or by making assumptions pertaining to the physical and chemical processes
resulting from the aging factors. Such changes in
the specimen may affect
(1) The structure of the insulation
(2) Electrical properties
(3) Mechanical properties
(4) Chemical composition of the specimen
(5) Liberation of constituents and degradation products
(6) Visual appearance or optical properties
Suitable determinations should be made to
verify that the aging stresses acting on the test
specimen are sufficiently representative of the
service conditions. This rule applies to all kinds
of aging factors used during evaluation tests
(thermal, electrical, environmental, and mechanical), whether they are used alone, in sequence,
or in combination.
ANSI/IEEE
Std 943-1986
ANSI/IEEE
Std 943-1986
If at higher levels of voltage stress, during voltage endurance tests, most failures occur at the
edge of an electrode and the distribution of
puncture locations at lower stresses is random, a
change in aging mechanism may be indicated.
4. Diagnostic Techniques
All methods for the assessment of the state of
specimens or for the detection of aging mechanisms should introduce negligible aging in the
test. Diagnostic procedures for monitoring properties of insulation systems during service or
aging tests may be nondestructive, possibly destructive, or destructive.
In nondestructive tests, the stress has no
measurable effect on aging.
Possibly destructive tests are those with low
influence on aging if used as short-time tests for
periodic application. If any stress of possiblydestructive character is used for continued mon-
Table 1
Diagnostic Techniques
1. Nondestructive Measurement of Properties
( a ) Dielectric Properties of the System
(i) Insulation resistance
(ii) Dielectric polarization or depolarization current versus time
(iii) Dielectric constant
(iv) Dielectric losses
(v) Surface resistivity
(vi) Partial discharge, inception and extinction voltage,
amplitude, number, quadratic rate
(vii) Dielectric properties as a function of temperature
(b) Physical-Mechanical Properties of the System
(i) Hardness
(ii) Elasticity
(iii) Weight loss
(iv) Stiffness
(v) Resonance frequency and damping
(c) Chemical Analysis
(i) Analysis of products of degradation (gas chromatography, mass spectrometry)
( d ) Visual Inspection
(i) Evaluation of color and color changes
(ii) Surface condition (smooth or rough)
(iii) Deposition of dust, oil, humidity, or other contaminants
(iv) Location of failure
(v) Dimension, size
2. Possibly Destructive Tests for Periodic Application
( a ) Electrical
(i) Proof test with increased voltage (dc, ac, impulse)
(ii) Proof test (overvoltage, independent of the type of
service voltage):
DC
Low frequency (0.1 Hz)
AC (50/60 Hz and higher test frequencies)
ANSI/IEEE
Std 943-1986
10