Silva Et Al - 2009 PDF
Silva Et Al - 2009 PDF
Silva Et Al - 2009 PDF
a b s t r a c t
The precise characterization of microgeometries is a crucial task in the study of ow phenomena at these scales.
Since the use of conventional optical microscopes is somehow limited in terms of accuracy, the present work studies
the use of micro-PIV measurements to characterize a rather irregular microchannel cross-section. The micro-PIV is
employed with a spatial resolution of 23.68 m 23.68 m allowing for the location of the microchannel walls with
an accuracy, in average, 10 times higher than that provided by the use of a conventional optical microscope. The
accuracy of the micro-PIV results was validated by comparing the volumetric ow rate yielded by the integration
of the micro-PIV velocity proles against that supplied by the syringe pump employed in this experimental work.
The 3% difference revealed the good quality of the measurements, demonstrating the potential of the micro-PIV
technique to characterize both the ow kinematic parameters and the enclosing geometry.
2008 The Institution of Chemical Engineers. Published by Elsevier B.V. All rights reserved.
Keywords: Micro-PIV; Microchannels; Geometry denition; Microuidics
1.
Introduction
The inuence of an inaccurate geometrical characterization in microuidic ow studies is not a new issue. In fact,
its inuence has repeatedly been reported as one of the
main causes for obtaining incorrect results in experimental
microuidic studies, Hetsroni et al. (2005) and Magueijo et al.
(2006).
Pressure drop measurements in fully developed ows and
its comparison against the results predicted by the conventional Fluid Mechanics theory applied to macroscale ows is
perhaps the most notorious example of a situation where
the ow geometry has a major inuence in the accuracy
of the nal results. Distinctive examples of this situation
can be found in the open literature. For instance, Guo and
Li (2002) used a 40 optical microscope to characterize the
inner diameter of a circular glass microtube obtaining a
value of 84.7 m. The inclusion of this value in the pressure
drop computation yielded values considerably higher than
those predicted by the conventional HagenPoiseuille theory.
The same measurements conducted with both a 400 optical microscope and a scanning electron microscope (SEM)
Abbreviations: CCD, charge coupled device; NA, numerical aperture; PIV, particle image velocimetry; SEM, scanning electron microscope;
SPM, scanning probe microscope.
Nomenclature
ddiff
dp
Dh
e
M
n
U
V
X
Y
zcorr
Z
Greek symbols
z
depth-of-eld of a microscope objective (m)
2.
Micro-PIV fundamentals
299
3.
Experimental apparatus
In
this
work
a
microchannel
manufactured
by
DantecDynamics was used, which is shown in Fig. 1.
This microchannel is manufactured by laser ablation in a
polymeric chip (PMMA) and sealed with the same material.
This ensemble allows for micro-PIV measurements with
reduced optical aberrations. The study was performed in the
rectilinear region of the microchannel, denoted in Fig. 1 by
the zone enclosed by the elliptical line.
The pressure required for the uid to ow was provided
by a syringe pump (NE-1000, New Era Pump Systems, Inc. ).
Error tests performed to this pump indicated the uncertainty
300
4.
Measurement resolutions
4.1.
NA
ddiff (m)
Maximum spatial
resolution (m)
5
10
20
40
63
100
0.12
0.25
0.40
0.55
0.70
0.90
54.1
51.9
64.9
94.4
116.8
144.2
27.05
25.95
32.45
47.20
58.40
72.10
2 NA
(1)
4.2.
NA
z (m)
5
10
20
40
63
100
0.12
0.25
0.40
0.55
0.70
0.90
49.3
11.5
4.3
2.1
1.3
0.7
n0
NA2
ne
NA M
(2)
301
Micro-PIV resolution
Fig. 3 Velocity prole within an interrogation area and corresponding histogram of velocities: (a) linear velocity prole, (b)
histogram of velocities for a linear velocity prole, (c) parabolic velocity prole and (d) histogram of velocities for a parabolic
velocity prole.
302
2zcorr = 2
1
dp 2 (n/NA) 1
4
2 1/2
5.95(M + 1) 2 (n/NA) 1
4M2
(3)
NA
2Zcorr (m)
5
10
20
40
63
100
0.12
0.25
0.40
0.55
0.70
0.90
161.9
34.2
12.8
6.5
3.7
1.5
z (m)
31.65
5.60
2.10
1.15
0.55
0.05
303
5.
Estimation of the micro-PIV velocity
uncertainty and validity of the ow fully
developed condition
The a priori estimation of the error associated with the velocity measurement with micro-PIV is a complex task since
each micro-PIV realization comprises the participation of several distinctive parameters whose interaction, in practice, is
almost impossible to quantify in detail (a deeper analysis of
some of the most common PIV error sources can be found, for
instance, in Raffel et al., 1998 or Wereley and Meinhart, 2004).
Consequently, and in order to have an order of magnitude of
the micro-PIV error present in the overall velocity measurements, an approach similar to one described in Silva et al.
(2008) is adopted here. With this approach several measurement planes of the velocity eld, as the one depicted in Fig. 4,
304
6.
Microchannel cross-section
characterization using micro-PIV
As pointed out in Section 4.2, one can ensure that the velocity eld is measured with an accuracy of the order of the
sub-pixel size under certain conditions. If the advantage of
this precise velocity information could be used to characterize some particular spatial features, as for instance the solid
boundaries, accuracies much higher than those provided by
the direct visual measurements would be achieved. Taking
into account that through an indirect approach, the kinematic boundary condition at a solid wall requires that the
velocity eld at the uid/solid interface should not exhibit
discontinuities, provided that the uid can be modelled as
a continuum (Gad-el-Hak, 1999) and the wall material is
hydrophilic (Tretheway and Meinhart, 2002), the knowledge of
the velocity eld allows one to identify the presence of a wall
as the region where the velocity is nil. However, because in
the walls vicinity, micro-PIV measurements have limited accuracy, it is extremely difcult to directly measure the regions
of nil velocity. In fact, very close to a solid interface, particles tend not to follow exactly the uid motion since physical
and chemical interactions between them and the walls start to
take place. Moreover, due to the proximity of a medium with
a different refractive index, i.e. the wall region corresponds to
a liquid/solid interface, the process of imaging the particles
motion close to the wall is also affected by optical phenomena, which are perceived mainly as severe optical distortions.
To overcome these problems, it is preferable to use data from
regions where the accuracy of the velocity measurements, and
so the sub-pixel accuracy, can be guaranteed. Consequently,
the velocity data measured sufciently apart from the wall is
extrapolated to regions near the wall holding the advantage
of the sub-pixel accuracy.
To achieve this objective, the velocity eld has to be
assumed to be dened by some analytical function V = V(x,y,z)
which can be known from the yielded experimental data.
305
Fig. 7 Microchannel cross-section and corresponding errors displayed as horizontal bars yielded by: (a) optical microscope;
(b) micro-PIV measurements.
Moreover, the intrinsic subjectivity of a visual inspection also
contributes for the error depicted in Fig. 7a). As it would be
expected, considering optical arguments, the occurrence of
those facts increases with the top/bottom wall proximity.
The micro-PIV results are also affected by this top/bottom
wall proximity deterioration. In these measurement planes
statistical variations in the measured velocities lead to a variation in the roots of the tted parabolas. As a result, the
accuracy in determining the wall location is decreased. This
fact is revealed by the higher magnitude of the horizontal error
bars in these regions. Despite of that, the effect of this error is
not as severe as in the optical microscope case.
The vertical error bars are not shown since their values
are constant along the microchannel height and equal to
11.5 m for the case of the optical microscope measurements, Fig. 7a), and 17.1 m for the micro-PIV case, Fig. 7b).
This gure reveals that, even though the micro-PIV yields better accuracy in the in-plane direction, the characterization of
the microchannel cross-section along the out-of-plane direction is less precise with micro-PIV. However, the advantage of
the micro-PIV procedure discussed herein in terms of the inplane plane accuracy pays off the slight disadvantage present
in the out-of-plane direction.
7.
Conclusions
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