TekTronix CSA8000 Series User Manual
TekTronix CSA8000 Series User Manual
TekTronix CSA8000 Series User Manual
www.tektronix.com
Copyright Tektronix, Inc. All rights reserved. Licensed software products are owned by Tektronix or its suppliers and
are protected by United States copyright laws and international treaty provisions.
Use, duplication, or disclosure by the Government is subject to restrictions as set forth in subparagraph (c)(1)(ii) of the
Rights in Technical Data and Computer Software clause at DFARS 252.227-7013, or subparagraphs (c)(1) and (2) of the
Commercial Computer Software Restricted Rights clause at FAR 52.227-19, as applicable.
Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supercedes
that in all previously published material. Specifications and price change privileges reserved.
Tektronix, Inc., P.O. Box 500, Beaverton, OR 97077
TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.
WARRANTY
Tektronix warrants that the products that it manufactures and sells will be free from defects in materials and
workmanship for a period of one (1) year from the date of shipment. If this product proves defective during its
warranty period, Tektronix, at its option, will either repair the defective product without charge for parts and labor,
or provide a replacement in exchange for the defective product.
This warranty applies only to products returned to the designated Tektronix depot or the Tektronix authorized
representative from which the product was originally purchased. For products returned to other locations,
Customer will be assessed an applicable service charge. The preceding limitation shall not apply within the
European Economic Area, where products may be returned for warranty service to the nearest designated service
depot regardless of the place of purchase.
In order to obtain service under this warranty, Customer must provide the applicable office of Tektronix or its
authorized representative with notice of the defect before the expiration of the warranty period and make suitable
arrangements for the performance of service. Customer shall be responsible for packaging and shipping the
defective product to the service center designated by Tektronix or its representative, with shipping charges
prepaid. Tektronix or its representative shall pay for the return of the product to Customer. Customer shall be
responsible for paying any associated taxes or duties.
This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate
maintenance and care. Tektronix shall not be obligated to furnish service under this warranty:
a) to repair damage resulting from attempts by personnel other than Tektronix representatives to install, repair or
service the product;
b) to repair damage resulting from improper use or connection to incompatible equipment;
c) to repair any damage or malfunction caused by the use of non-Tektronix supplies or consumables;
d) to repair a product that has been modified or integrated with other products when the effect of such
modification or integration increases the time or difficulty of servicing the product; or
e) to repair damage or malfunction resulting from failure to perform user maintenance and cleaning at the
frequency and as prescribed in the user manual (if applicable).
THE ABOVE WARRANTIES ARE GIVEN BY TEKTRONIX WITH RESPECT TO THIS PRODUCT IN LIEU OF
ANY OTHER WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY
IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. TEKTRONIX
RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND EXCLUSIVE
REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF THIS WARRANTY. TEKTRONIX AND ITS
VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL
DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS ADVANCE NOTICE OF THE
POSSIBILITY OF SUCH DAMAGES.
Table of Contents
General Safety Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
xi
xiii
xiii
xiii
xiv
xv
Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Key Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Product Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Firmware Upgrade . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Sampling Modules Supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
11
11
13
13
13
15
17
17
18
111
112
114
114
115
115
115
115
116
116
117
Incoming Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
119
Assemble Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Functional Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Perform the Hardware and Operating System Tests . . . . . . . . . . . . . . . . . . . . . .
119
120
121
123
132
135
Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Standard . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Optional . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
135
135
136
137
Documentation Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
System Overview Maps . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
22
23
23
Product Description
Operational Maps
Table of Contents
25
26
27
28
29
210
211
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Acquiring Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
31
33
34
34
35
35
35
35
35
36
36
37
37
37
37
38
311
312
312
312
313
313
316
Reference
ii
317
319
319
320
320
320
320
320
320
320
321
321
322
322
323
325
Table of Contents
325
326
326
327
327
328
329
329
329
329
329
329
329
330
330
330
330
332
335
Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
337
Edge Triggering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Whats Special? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Clock Recovery. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Triggering Process. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Triggering is Global. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Edge-Trigger Type. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trigger Modes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trigger Sources. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trigger Source and ESD. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trigger Source Connectors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Probe-to-Trigger Source Connection. . . . . . . . . . . . . . . . . . . . . . . . . . .
High Frequency Triggering and Metastability Reject. . . . . . . . . . . . . .
Adjusting Holdoff. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Usable Holdoff. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Requested vs Actual Holdoff. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
337
337
337
337
337
337
338
338
339
339
341
341
341
342
342
343
344
345
Displaying Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
347
347
349
349
349
349
349
349
349
350
350
350
351
351
iii
Table of Contents
iv
351
352
352
353
353
353
355
357
358
358
359
359
359
360
360
361
362
Measuring Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
365
366
366
366
366
366
367
367
367
367
367
367
368
368
368
368
368
369
370
371
372
375
377
377
377
378
378
378
378
378
379
379
380
381
382
Table of Contents
383
383
383
384
387
389
389
390
390
390
390
390
391
391
391
392
392
392
393
395
395
395
396
396
396
397
3101
3101
3101
3101
3102
3102
3102
3102
3102
3102
3102
3103
3103
3106
3108
3108
3108
3108
3108
3108
3109
3112
3115
3116
3116
Table of Contents
vi
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Export Your Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Export Your Histogram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
To Use an Exported Waveform (or Histogram) . . . . . . . . . . . . . . . . . . . . . .
Printing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Remote Communication . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3116
3116
3117
3117
3120
3121
3123
3123
3123
3123
3123
3124
3124
3124
3124
3125
3125
3127
3130
3132
3133
3134
3134
3134
3134
3134
3135
3135
3135
3135
3135
3135
3136
3138
3139
3139
3139
3139
3139
3139
3140
3140
3140
3140
3141
3143
3145
Whats Available? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Why Use? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Keys to Using . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
How to Use Online Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3145
3145
3145
3146
3153
Table of Contents
Exterior Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Flat Panel Display Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3153
3153
Appendices
Appendix A: Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A1
Certifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A9
B1
Amplitude Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Area Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Eye Pattern and Optical Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Timing Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Levels Used in Taking Amplitude, Timing, and Area Measurements . . . . . . . . .
Levels Used in Taking Eye Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
B1
B2
B3
B5
B6
B7
C1
Glossary
Index
vii
Table of Contents
List of Tables
viii
112
112
135
136
340
350
351
354
359
377
380
391
3124
3138
A1
A2
A3
A6
A7
A7
A8
A8
A9
B1
B2
B3
B5
Table of Contents
List of Figures
Figure 11: Compartments for sampling modules . . . . . . . . . . . . . . . .
Figure 12: Maximum inputs in three configurations . . . . . . . . . . . . .
Figure 13: Locations of peripheral connectors on rear panel . . . . . .
Figure 14: Line fuse and power cord connector locations,
rear panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 15: On/Standby switch location . . . . . . . . . . . . . . . . . . . . . . . .
Figure 16: Compensation dialog box . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 17: Hookup for electrical functional tests . . . . . . . . . . . . . . . .
Figure 18: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 19: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 110: Optical channel verification . . . . . . . . . . . . . . . . . . . . . . .
Figure 111: Hookup for the time base tests . . . . . . . . . . . . . . . . . . . . .
Figure 112: Channel button location . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 113: Main time base verification . . . . . . . . . . . . . . . . . . . . . . .
Figure 114: Mag time base verification . . . . . . . . . . . . . . . . . . . . . . . .
Figure 31: Acquisition and display controls . . . . . . . . . . . . . . . . . . . .
Figure 32: Setting vertical scale and position of input channels . . . .
Figure 33: Varying offset positions vertical acquisition window
on waveform amplitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 34: Horizontal acquisition window definition . . . . . . . . . . . .
Figure 35: Common trigger, record length, and acquisition rate
for all channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 36: Aliasing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 37: Channel configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 38: Digital acquisition sampling and digitizing . . . . . . . . .
Figure 39: The waveform record and its defining parameters . . . . .
Figure 310: How FrameScan acquisition works (scanning
on a 127bit PRBS shown) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 311: Slope and level define the trigger event . . . . . . . . . . . . .
Figure 312: Triggered versus untriggered displays . . . . . . . . . . . . . .
Figure 313: Trigger inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 314: Holdoff adjustment can prevent false triggers . . . . . . . .
Figure 315: Trigger to End Of Record Time (EORT) . . . . . . . . . . . .
Figure 316: Display elements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
19
110
111
112
113
122
124
125
126
127
128
129
130
131
34
314
316
317
319
322
326
327
328
331
338
339
340
343
344
348
ix
Table of Contents
3144
B6
B7
353
365
366
369
371
378
380
389
3117
3120
3126
3126
3134
3142
3142
To Avoid Fire or
Personal Injury
Use Proper Power Cord. Use only the power cord specified for this product and
certified for the country of use.
Connect and Disconnect Properly. Do not connect or disconnect probes or test
leads while they are connected to a voltage source.
Ground the Product. This product is grounded through the grounding conductor
of the power cord. To avoid electric shock, the grounding conductor must be
connected to earth ground. Before making connections to the input or output
terminals of the product, ensure that the product is properly grounded.
Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings
and markings on the product. Consult the product manual for further ratings
information before making connections to the product.
Do not apply a potential to any terminal, including the common terminal, that
exceeds the maximum rating of that terminal.
Do Not Operate Without Covers. Do not operate this product with covers or panels
removed.
Use Proper Fuse. Use only the fuse type and rating specified for this product.
Avoid Exposed Circuitry. Do not touch exposed connections and components
when power is present.
Wear Eye Protection. Wear eye protection if exposure to high-intensity rays or
laser radiation exists.
Do Not Operate With Suspected Failures. If you suspect there is damage to this
product, have it inspected by qualified service personnel.
Do Not Operate in Wet/Damp Conditions.
Do Not Operate in an Explosive Atmosphere.
Keep Product Surfaces Clean and Dry.
xi
CAUTION
Refer to Manual
Rackmount Installations
WARNING
High Voltage
Protective Ground
(Earth) Terminal
xii
Preface
This is the user manual for the instrument. It covers the following information:
H
Describes the capabilities of the instrument, how to install it and reinstall its
software
Getting Started shows you how to configure and install your instrument and
provides an incoming inspection procedure.
Operating Basics uses maps to describe the various interfaces for controlling
the instrument, including the front panel and the software user interface.
These maps provide overviews of the product and its functions from several
viewpoints.
xiii
Preface
supporting instrument operation and service. (Manual part numbers are listed in
Table 13 on page 135.)
Manual name
Description
An online help system, integrated with the User Interface application that ships with this
product.
A quick reference to major features of the instrument and how they operate.
The user manual for the electrical sampling modules. Included as a standard accessory
if you ordered electrical sampling modules with this instrument. Shipped in the
sampling module package, not the main instrument package.
The user manual for the optical sampling modules. Included as a standard accessory if
you ordered optical sampling modules with this instrument. Shipped in the sampling
module package, not the main instrument package.
The user manual for the 80A01 Trigger Prescale Limiting Preamplifier Module. Included
as a standard accessory if you ordered this module with this instrument. Shipped in the
module package, not the main instrument package.
Describes how to service the instrument to the module level. This optional manual must
be ordered separately.
You can insert the module user manuals in Appendix C, which this manual provides for keeping these manuals together.
Conventions
Terminology: This manual uses the terms vertical acquisition window and
horizontal acquisition window throughout this section and elsewhere. These
terms refer to the vertical and horizontal range of the acquisition window, which
defines the segment of the input signal that the acquisition system acquires.
The terms do not refer to any operating system windows that you might display
on screen.
xiv
Preface
Contacting Tektronix
Phone
1-800-833-9200*
Address
Tektronix, Inc.
Department or name (if known)
14200 SW Karl Braun Drive
P.O. Box 500
Beaverton, OR 97077
USA
Web site
www.tektronix.com
Sales support
Service support
Technical support
Email: [email protected]
1-800-833-9200, select option 3*
1-503-627-2400
6:00 a.m. 5:00 p.m. Pacific time
This phone number is toll free in North America. After office hours, please leave a
voice mail message.
Outside North America, contact a Tektronix sales office or distributor; see the
Tektronix web site for a list of offices.
xv
Preface
xvi
Product Description
This chapter describes your instrument, which is either the CSA8000 Communications Signal Analyzer or the TDS8000 Digital Sampling Oscilloscope, and
its options. Following this description are four sections:
H
Check the Package Contents, on page 15, shows you how to verify that you
have received all of the parts of your instrument.
Installation, on page 17, shows you how to configure and install the
instrument, as well as how to reinstall the system software included with the
product.
Models
This manual supports two very similar instruments:
H
Differences between the two instruments will be called out when necessary;
otherwise, the material applies to both instruments. The word instrument refers
to either product.
Key Features
The instrument is a high-speed, precision sampling system that finds use in:
H
high-performance semiconductor/computer applications, such as semiconductor testing, TDR characterization of circuit boards, IC packages and
cables, and high-speed serial digital data communications.
The instrument includes a user interface that runs on the Microsoft Windows 98
operating system as a windowed application. You operate the instrument using
11
Product Description
front-panel controls with the mouse and keyboard or with the touch screen. Key
features include:
12
true differential TDR, with fast step (35 psec reflected risetime) when used
with a TDR-capable sampling module.
support of both telecom (SONET and SDH) and datacom (Fibre Channel and
Gigabit Ethernet) optical communication standards.
FrameScan acquisition for isolating data-dependent failures during conformance/performance testing and for examining very low-level repetitive
signals.
a large 10-inch color display that supports color grading of waveform data to
show sample density.
Product Description
Product Software
The instrument includes the following software:
H
Occasionally new versions of the software may become available at our web site.
See Contacting Tektronix on page xv in Preface.
Firmware Upgrade
Tektronix may offer firmware upgrade kits for the instrument. Contact your
Tektronix service representative for more information (see Contacting Tektronix
on page xv).
13
Product Description
Other Modules.
H
14
NOTE. Any electrical and optical sampling modules ordered are shipped
separately. The sampling modules available for order for use with this instrument are listed on page 13. (Also, any optional accessories ordered are shipped
separately. See Table 14 on page 136 for a list of optional accessories.)
Remember to fill out and send in the customer registration card. The registration
card is packaged in an envelope in the shipping package.
15
Installation
16
Installation
NOTE. Before beginning installation for the first time, be sure to see Check the
Package Contents, on page 15. Then return to this installation section.
This section covers installation of the instrument, addressing the following
topics:
H
The basic operating software is already installed on the hard disk. If reinstallation of software becomes needed, see the following topic:
H
Site Considerations
17
Installation
properly route any cables coming out of the rear of the instrument to avoid
damaging them.
CAUTION. Keep the bottom of the instrument clear of obstructions to ensure
proper cooling.
Operating Requirements
Rackmount Requirements
18
The sampling modules that you order with your instrument ship with the
appropriate sampling-module user manuals. Read these manuals for instructions
on how to install your sampling modules, and then install them as outlined.
(Sampling modules do not ship preinstalled.)
Installation
19
Installation
Maximum Configuration
You can install up to two large sampling modules and four small modules for a
total of 10 inputs. Of these 10 inputs, only eight inputs can be active at one time
(see Figure 12, top two configurations). Also, note that installing a single large
module in either compartment disables the first small-module compartment. This
configuration (see Figure 12, bottom configuration) limits the input count to
sevenone from the large, six from the small compartments.
CH 1
CH 2
N.A.
CH 3
CH 4
CH 5
CH 6
N.A.
CH 7
CH 8
CH 7
CH 8
N.A.
CH 2
CH 3
CH 4
CH 5
CH 1/N.A.
Seven channels: One large module,
installed in either compartment,
and three small modules
N.A.
N.A.
CH 3
CH 6
CH 2/N.A.
CH 4
CH 5
CH 6
CH 7
CH 8
1Not Available
110
Installation
Description..........................Icon/Label
Locations
Monitor.........
Printer..................
RS-232................
Network...........................
PS2 mouse1...............................
PS2 keyboard1..................
USB...........................
Audio line out...........................
Audio line in........................
Removable hard drive........................
CD drive.........................
GPIB.....
Monitor...................
Card slot...........
1Product ships with a USB keyboard, that plugs into the USB port, and a USB mouse that plugs into the back of the keyboard
111
Installation
Description
Monitor
Printer
Rackmount
Other
Rating
159-0046-00
200-2264-00
5 x 20 mm
159-0381-00
200-2265-00
Power Switch
Fuses
AC Power
Figure 14: Line fuse and power cord connector locations, rear panel
112
Installation
CAUTION. Connect the keyboard, mouse, and other accessories before applying
power to the product. Connecting the accessories after powering on the
instrument can damage the accessories. Two exceptions are the USB keyboard
and mouse that ships with the instrument. Both can be plugged or unplugged
without first turning power off.
2. Connect the keyboard and mouse, observing the caution above. Note that the
instrument ships with a USB keyboard, which plugs into the USB port (see
Figure 13 on page 111 for location) and a USB mouse, which plugs into
the back of the USB keyboard.
NOTE. Connection of the keyboard and mouse is optional. You can operate most
features without them, using the front-panel controls and the touchscreen.
3. Connect the power cord.
4. If you have an external monitor, connect the power cord and power on the
monitor.
5. Turn the Power switch on at the rear panel. (See Figure 14 on page 112 for
switch location.)
6. Push the On/Standby switch to power on the instrument (see Figure 15 for
the switch location).
Switch
113
Installation
114
Installation
Software Installation
This section describes how to install the software found on the CSA8000 &
TDS8000 OS Rebuild (063-3491-XX) and Product Software (063-3492-XX)
CDs that accompany this product. The instrument ships with the product
software installed, so only perform these procedures if reinstallation becomes
necessary.
Description
There are two sets of CDs that ship with this instrument:
H
115
Installation
Read the software release notes README.TXT ASCII file if present on the
Product Software CD before performing any installation procedures. This file
contains additional installation and operation information that supercedes other
product documentation.
To view the README.TXT file, open the Notepad Windows accessory and open
the file on the CD. After installation, you can also read the copy from a directory
on the product:
C:\Programs Files\TDSCSA8000\System
A printed version of the Software Release Notes is shipped with the product. The
printed version included with your instrument supercedes the online version
Operating System
Reinstallation
The instrument can access the hard drive; if so, reinstall Windows using the
emergency startup disk and the procedure Windows 98 Reinstall Only on
page 116.
The instrument cannot access the hard drive or you do not have an emergency startup disk available. In either case, you must rebuild your hard drive
using the procedure System Hard Drive Rebuild on page 117. Any files or
programs you have installed will be lost.
Windows 98 Reinstall Only. If you can access the instrument hard drive and you
have your emergency startup disk, you can reinstall Windows 98 from the hard
drive. This procedure is preferred over rebuilding the hard drive, since the
rebuild rewrites the entire hard drive.
1. Power off the instrument. Use the On/Standby switch if possible; if not, use
the principle power switch found at the back of the instrument.
2. If a keyboard is not connected to the instrument, connect it.
3. Insert your emergency startup disk in the instrument floppy drive.
4. Power on the instrument. Make sure the principle power switch at the back
of the instrument is set on. Push the On/Standby switch on the front panel.
5. The instrument should now boot from the emergency startup disk and
present you with a selection menu. Use the arrow and enter keys to choose
Start the computer without CDROM support.
116
Installation
System Hard Drive Rebuild. If you cannot access the instrument hard drive, you
must rebuild the instrument hard drive. This process will return the hard disk to
the its original condition present when the instrument shipped.
Since data and programs you may have installed are lost with this rebuild, you
should do the Windows 98 Reinstall Only procedure instead if you can. (See
Windows 98 Reinstall Only on page 116.)
If you must rebuild the system hard drive, use the set of OS Rebuild CDs
(063-3491-XX) that shipped with the instrument. Follow the instructions in the
booklet found in the CD case.
System Diagnostics
In case of instrument problems, you may wish to run the system diagnostics. If
so, see the procedure Perform the Diagnostics, on page 120.
If the instrument is turned off before the operating system boots, or if youve
installed a third-party product with a driver incompatible with instrument start
up, Windows 98 will open in Safe mode. The touchscreen will be inoperable;
therefore, you must install the standard-accessory mouse and keyboard to operate
the instrument.
When you have finished investigating and removed any barrier to Windows
start-up, you can reboot. If the instrument no longer boots to Safe mode, you can
remove the keyboard and mouse if desired.
117
Installation
118
Incoming Inspection
This section contains instructions for performing an incoming inspection of this
instrument. Performance of an incoming inspection is not required to put the
instrument in service.
These instructions verify that the instrument is operating correctly after
shipment, but do not check product specifications. An incoming inspection
includes the following parts:
H
Perform the Hardware and Operating System Tests on page 132 uses a
software program called QAPlus/Win to verify instrument hardware and the
Windows 98 operating system is functioning.
If the instrument fails any test within this section, it may need service. To contact
Tektronix for service, see Contacting Tektronix on page xv of Preface.
Make sure you have put the instrument into service as detailed in Installation
starting on page 17. Then assemble the following test equipment and precede
with the procedures that follow.
Assemble Equipment
To complete the incoming inspections procedures requires the following test
equipment:
H
119
Incoming Inspection
None
Prerequisites
1. Set up the instrument: From the application menu bar, select Utilities, and
then select Diagnostics. The Diagnostics dialog box displays. See below.
120
Incoming Inspection
121
Incoming Inspection
NOTE. Failing to install the 50-ohm terminations on electrical inputs can yield
erroneous compensation failures or results.
2. Verify that the compensation routines pass:
a. The compensation may take several minutes to complete. Verify that
Pass appears as Status for the main instrument and for all sampling
modules listed in the Compensation dialog box when compensation
completes.
b. If instead Fail appears as Status, rerun the compensation. If Fail status
continues after rerunning compensation and you have allowed warm up
to occur, the module or main instrument may need service.
122
Incoming Inspection
STOP. DO NOT make changes to the front-panel settings that are not called out
in the procedures. Each verification procedure will require you to set the
instrument to default settings before verifying functions. If you make changes to
these settings, other than those called out in the procedure, you may obtain
invalid results. In this case, go back to step 1 and repeat the procedure.
Prerequisites
123
Incoming Inspection
2. Set the Trigger System: In the UI application toolbar, select Internal Clock
from the Trig list box as shown below.
3. Hook up the signal source: Connect the SMA cable from the DC CALIBRATION output to the channel input that you want to test as shown in
Figure 17, below.
CSA8000/TDS8000
124
Incoming Inspection
Channel
buttons
The vertical scale readout for the channel under test shows a setting of
100 mV, and a DC level is at about 2 divisions above center screen.
The front-panel vertical POSITION knob (for the channel you are
testing) moves the DC level up and down the screen when rotated.
Return the DC level to 2 divisions above center screen before continuing.
7. Verify that the channel acquires in all acquisition modes: Push the
front-panel button Acquisition MENU to display the Acq Setup dialog box.
Click each of the three acquisition modes, and confirm that the following
statements are true:
H
8. Test all channels: Repeat steps 2 through 7 until all electrical input channels
are verified.
9. Remove the test hookup: Disconnect the SMA cable from the channel input
and the DC CALIBRATION output.
125
Incoming Inspection
After verifying the electrical channels and if you have an 80C00 Series Sampling
Module installed, you can now verify its the optical channels. This verification is
done without an input signal.
Equipment
required
None.
Prerequisites
3. Select the channel to test: Push the channel button for the channel you want
to test. The button lights amber and the channel displays. See Figure 19.
Channel
buttons
126
Incoming Inspection
The vertical scale readout for the channel under test shows a baseline
trace at about center screen (see Figure 110 on page 127) and a setting
as follows:
80C01, 80C02, and 80C04: 1 mW
80C03: 100 mW
80C05: 3 mW
80C06: 6 mW
The Vertical POSITION front-panel knob (for the channel you are
testing) moves the signal up and down the screen when rotated. Return
the baseline trace to center screen before before continuing.
Baseline
Vertical offset
Control bar
Vertical offset
setting
127
Incoming Inspection
5. Verify that the channel acquires in all acquisition modes: Push the
front-panel button Acquisition MENU to display the Acq Setup dialog box.
Click each of the three acquisition modes and confirm that the following
statements are true:
H
6. Test all channels: Repeat steps 3 through 5 until all optical input channels
are verified.
Verify the
Time Bases Work
After verifying the channels, you can now verify that the time bases function.
This verification is done using a front-panel signal.
Equipment
required
Prerequisites
None
128
Incoming Inspection
Channel
buttons
One period of the internal clock signal (a square wave) is about five
horizontal divisions on-screen. See Figure 113 on page 130.
129
Incoming Inspection
The horizontal POSITION knob positions the signal left and right
on-screen when rotated.
NOTE. The signal will not move past the minimum position setting.
Internal Clock
Signal
Control bar
Vertical scale
setting
Horizontal
scale setting
130
Incoming Inspection
7. Verify that the Mag1 time base operates: Confirm the following statements.
H
The brackets on the Main View waveform (top graticule) are a fullscreen width apart (10 divisions). See Figure 114 on page the 131.
One period of the internal clock signal (a square wave) in the Mag view
(bottom graticule) is about five horizontal divisions on-screen. (Matches
the waveform in the top graticule.) See Figure 114.
131
Incoming Inspection
QAPlus/WIN
The QAPlus/WIN discrete memory test fails if the system being tested
contains more than 16 megabytes of RAM.
Since your product ships with more than 16 megabytes of RAM, do not run
the memory test from the Memory icon. Use the Run Quick Test item from
the Tests menu instead, or use the Quick Test icon in the QAPlus/WIN title
box.
The QAPlus/WIN hard drive test may report an incorrect number of tracks
and cylinders for your hard drive.
This is an internal mapping problem, but has no effect on the results of the
test. Bad sectors on your hard drive are still found and marked.
The QAPlus/WIN keyboard test does not respond correctly to keys used by
Windows 98.
Keyboards made for use with Windows contain two or three keys specific to
that operating system. These are usually located on either side of the space
bar. QAPlus/WIN does not trap these keys when performing the keyboard
test. Do not press them.
132
Incoming Inspection
DismissPower on the instrument and visually inspect the left side panel of the
instrument to verify that all six cooling fans are rotating.
Equipment
required
None
Prerequisites
None
Prerequisites
Video
133
Incoming Inspection
134
Accessories
Standard
Table 13 lists the standard accessories that ship with the instrument,
NOTE. Table 13 lists the standard accessories that ship with the instrument, not
those shipped with any electrical or optical sampling modules ordered. Each
sampling module ships individually in their own package. Consult the User
manual found in the shipping package for any module you ordered:
H
Part Number
Not Orderable
Not Orderable
119-6297-00
119-6298-00
200-4519-00
1 Accessory pouch
016-1441-00
2 Touchscreen styluses
119-6107-00
006-3415-04
Not Applicable
071-0433-XX
071-0437-XX
Not Applicable
135
Optional
Part Number
063-3491-XX
0633492XX
Power cord
The following accessories are orderable for use with the instrument at the time
this manual originally published. Consult a current Tektronix catalog for
additions, changes, and details:
Table 14: Optional accessories
Item
136
Part Number
DL-11
SIU-800
012-1568-00
012-1569-00
015-0552-00
015-0553-00
015-1001-00
5X Attenuator (Male-to-Female)
015-1002-00
Power Divider
015-1014-00
131-0112-00
P6209
P6150
119-6241-00
071-0438-XX
Options
The following options can be ordered for the instrument:
H
Option 1R: Rack Mount Kit (includes hardware and instructions for
converting to rackmount configuration)
Option A2 UK 240V, 50 Hz
Service offerings:
H
137
138
Operational Maps
This chapter acquaints you with how the instrument functions and operates. It
consists of several maps that describe the system, its operation, and its documentation:
H
Documentation Map, on page 22, lists the documentation that supports the
instrument.
System Overview Maps on page 24, describe the high-level operating blocks
and operating cycle of the instrument.
User-Interface Map, on page 27, describes the elements of the User Interface
(UI) application, which provides complete control of the instrument.
Tutorial procedures are available online, as part of the online help. To display,
select the Setups Guide from the UI application Help menu.
For information on configuring and installing your instrument, refer to
Chapter 1, Getting Started.
21
Documentation Map
This instrument ships with documents individually tailored to address different
aspects or parts of the product features and interface. The table below cross
references each document to the instrument features and interfaces it supports.
To read about...
Description
22
Operating Basics
To read about...
Description
GPIB Commands
<Space>
<NR3>
?
You may also want to obtain the optional service manual for this product if you
self-service or performance test this instrument. See Optional Accessories on
page 136.
23
Input Modules
CH1..8
Channel
Channel
Channel
Trigger
system
Page 337
External trigger
inputs
Display, I/O,
& Storage
User Interface
& Waveform Display
Chan 18
Acquisition
system
Page 319
Page 313
Page 35
Clock recovery
options only
Signal Processing
& Transformation
Timebase
system
SP&T
systems
Pages
365,
389,
3123
Page 347
Ref 18
Math 18
Page 389,
347
24
Operating Basics
Signal Processing Transformation System. Performs a variety of transformations or operations, beginning with the most fundamental data
elements in the system, the channel waveforms. Waveform math operations,
automatic measurements, and histogram generation are examples.
The process overview that follows describes each step in the top-level cycle of
instrument operation.
25
Operating Basics
Idling...
Yes
Stop
condition?
Reset
Abort
Power On1
No
1.
2.
3.
4.
Implement
setup
Add one
sample interval
to Delay
e time
me
5.
6.
7.
8.
Take 1 sample
per active
e
channel
No
Waveform
re r
record
complete?
Yes
Waveform
available
26
Note: if acquiring when powered down, the oscilloscope may skip the
idle state and resume acquisition starting with step 3.
27
28
29
MAIN View
210
Mag
View
Mag
View
strap, 1 MW to ground
TRIGGER
PRESCALE
TRIGGER
DIRECT
input
input
TRIGGER
PROBE
POWER
211
212
Overview
This chapter describes how the many features of the instrument operate. Please
note the following points on using this chapter:
H
Description
Acquiring Waveforms
Triggering
337
Displaying Waveforms
347
Measuring Waveforms
Provides an overview of the the cursors and automatic measurements tools this
instrument provides and how to use them
365
Provides an overview of how you can mathematically combine acquired waveforms and
measurement scalars to create a math waveform that supports your data-analysis task
389
3101
Provides an overview of the statistical tools this instrument provides and how to use
them: mask testing, histograms, and waveform databases
3123
Provides an overview of the help system, which is integrated as part of the instrument
user interface, and describes how to access it
3145
Provides instructions on how to clean the exterior of the instrument and its touch screen
3153
Page no.
33
31
Overview
32
Acquiring Waveforms
Before you can display, measure, or analyze a waveform, you must acquire it
from a signal. This instrument comes equipped with the features you need for
capturing your waveforms. The following topics provide an overview of capturing signals and digitizing them into waveform records:
H
Sampling
module
Acquisition
system
Trigger
system
Time base
system
Signal processing
& transformation
system
Output and
storage
User Interface
and display
NOTE. This section describes how the vertical and horizontal controls define the
acquisition of live, channel waveforms. These controls also define how all
waveforms are displayed, both live and derived waveforms (math and reference
waveforms). The sections that follow cover display-related usage follow:
H
33
Acquiring Waveforms
How to turn on channels and adjust their vertical scale, position, and offset
How to set the horizontal scale, position, and record length of the Main (time
base) View
NOTE. Terminology: This manual uses the terms vertical acquisition window and
horizontal acquisition window. These terms refer to the vertical and horizontal
range of the acquisition window, which defines the segment of the input signal
that the acquisition system acquires. The terms do not refer to any windows or
display windows on screen. See Conventions on page xiv.
Vertical
Offset
Sampling
module
Vertical
Position
Display
system
Acquisition
system
Horizontal
Scale
Horizontal
Position
Vertical
Scale
Horizontal
Record
Length
Why Use?
Use signal conditioning and scaling controls to ensure the instrument acquires
the data that you want to display, measure, or otherwise process. To ensure the
best possible data for further processing, you do the following:
H
34
Set vertical scale to adjust the waveform size on screen. You can set vertical
offset to shift the vertical acquisition window up or down on the signal to
capture the portion you want.
Acquiring Waveforms
Set horizontal scale to control the time duration of the horizontal acquisition
window to capture as much as you want of the input signal(s). To control
where in the input signal (data stream) that the horizontal acquisition
window acquires, you set horizontal position to delay the window relative to
a trigger to capture the waveform portion you want. To increase or decrease
the resolution between sample points, change the record length.
For more background on the acquisition window concepts, see Signal Conditioning Background on page 312.
Whats Special?
Whats Excluded?
A Versatile Autoset. Autoset can be defined to set up for a waveform edge, period,
or an eye/bit pattern. Pushing the Autoset button automatically sets up the
instrument controls for a usable display based on the property you choose and
the characteristics of the input signal. Autoset is much faster and easier than a
manual control-by-control setup. You can also reset the instrument to its factory
default settings by pushing the Default Setup button.
The vertical offset cannot be adjusted for any reference waveform, because a
reference waveform is a static, saved waveform, and offset adjusts the acquisition hardware for acquiring live waveforms. Also, TDR waveforms, if displayed
in rho or ohm units, cannot be adjusted for vertical offset.
The vertical offset of a math waveform cannot be adjusted directly. You can
adjust the offset of waveform sources (waveforms included in the math
expression) for the math waveform if the sources are live waveforms.
Keys to Using
The key points that follow describe operating considerations for setting up input
scaling, offset, and position to properly acquire your waveforms.
Sampling Modules Selection and Signal Connection. Select the sampling module,
optical or electrical, that best fits your sampling task, whether it is connecting to
a fiber or electrical cable to test a digital data stream, or to a test fixture through
SMA cables to characterize a device. The connection to the sampling module
depends on your application.
Tektronix provides 80E00-series (electrical) and 80C00-series (optical) sampling
modules for this instrument; you can read about any sampling module and its
connections in the sampling-module user manual(s) that shipped with your
product. (Insert your sampling-module user manual(s) in Appendix C at the back
of this manual for ready reference.) You can also check your Tektronix catalog
for connection accessories that may support your application.
Up to eight acquisition channels are available, depending on the sampling
modules installed. Each channel can be displayed as a waveform or can
contribute waveform data to other waveforms (math and reference waveforms,
for example).
35
Acquiring Waveforms
CAUTION. Install sampling modules before applying power and before connecting them to the signals you want to test. See your sampling-module user manual
for instructions.
36
Set the vertical offset to display the features of interest on your waveform
and avoid clipping. (See Note that follows.) Adjust the display control
Vertical Scale to control the portion of the vertical window displayed on
screen; adjust the display control Vertical Position to position the waveform
on screen. Note that vertical offset affects the vertical acquisition window,
but vertical scale and position do not. These last two controls are display
controls only. Vertical Acquisition Window Considerations on page 313
describes the vertical acquisition window.
Acquiring Waveforms
Clipped
Set horizontal scale, position, and resolution (record length) so that the
acquired waveform record includes the signal attributes of interest with good
sampling density on the waveform. The settings you make define the
horizontal acquisition window, described in Horizontal Acquisition Window
Considerations on page 316. (Good sample density might be at least
five samples on each waveform transition when acquiring for timing
measurements. The trade off for increased sample density is increased time
to acquire.)
NOTE. Waveform data outside the vertical acquisition window is clipped; that is,
the data is limited to the minimum and/or maximum boundaries of the vertical
acquisition window. This limiting can cause inaccuracies in amplitude-related
measurements. See Vertical Acquisition Window Considerations on page 313.
Trigger and Display. Set basic trigger controls to gate waveform acquisition, and
use the display to interactively set scale, position, and offset waveforms. See the
sections Triggering on page 337 and Displaying Waveforms on page 347.
Selected Waveform. Many of the controls of this instrument, especially the
vertical controls, operate on the selected waveform. The instrument applies all
actions that only affect one waveform at a time, such as applying a changes to
the vertical control settings, to the selected waveform.
NOTE. You can select a channel waveform, a math waveform, or a reference
waveform. The procedures here describe how to select and set up channel
waveforms for acquisition. See Displaying Waveforms on page 347 for
information regarding using the controls for adjusting display of reference and
math waveforms.
Flexible Control Access. The product provides multiple methods for adjusting
acquisition controls. This manual focuses on basic setup through the front panel,
and then through use of the User Interface (UI) Application displayed full screen.
37
Acquiring Waveforms
See the display maps, beginning on page 29, for UI alternatives to controlling
vertical and horizontal setup. The online help system also documents the UI.
Use the procedure that follows when setting up the instrument to scale and
position input signals for acquisition.
WARNING. Sampling modules are inherently vulnerable to static damage. Always
observe static-safe procedures and cautions as outlined in your sampling-module
user manual.
Overview
Prerequisites 1.
Connect the 2.
input signal
38
Acquiring Waveforms
Overview
Scaled vertically
Offset vertically
Push the View Main button to make sure the main time
base view is selected. Use horizontal knobs to scale and
position the waveform on screen and to set sample
resolution. See right.
Scaled horizontally
Positioned horizontally
39
Acquiring Waveforms
Overview
Continue with 6.
the acquisition
setup
End of Procedure
310
Acquiring Waveforms
Overview
With an input signal connected, use the procedure that follows to autoset based
on the characteristics of the input signal. Autoset operates on the selected
channel only.
To autoset
Prerequisites 1.
2.
Execute 3.
Define 4.
For More 5.
Information
End of Procedure
311
Acquiring Waveforms
NOTE. Autoset sets the vertical position to zero and adjusts the vertical offset to
center the signal in the display.
If a standard mask is active for the selected waveform, Autoset adjusts the
selected waveform record to match the mask, if possible. Autoset adjusts the
vertical scale and offset, horizontal scale, position, and reference parameters as
required for the mask standard.
Overview
You may want to revert to the factory default setup; if so, use the following
procedure to reset the instrument:
Prerequisites 1.
Execute 2.
End of Procedure
Signal Conditioning
Background
This section contains background information that can help you more effectively
set up the acquisition window of each channel.
Input. This instrument samples sequentially, in order to provide superior
bandwidth and time resolution. Sequential sampling systems sample the input
without scaling it (they have a fixed dynamic range); therefore, input protection
and dynamic range are necessarily limited.
CAUTION. Do not overdrive the inputs. Also observe static-safe procedures and
cautions as outlined in the sampling-module user manual. Sampling modules are
very sensitive to ESD.
312
Acquiring Waveforms
Autoset Considerations. Autoset acquires samples from the input signal and
attempts to take the following actions based on the input data:
H
Evaluate the amplitude range of the input signals and offset of the vertical
acquisition window to acquire the signal without clipping.
Set the trigger level to the approximate midlevel of the trigger signal being
applied (either an external trigger or a clock-recovery trigger).
Evaluate the signal transitions and set the horizontal scale to produce a
waveform display based on the Autoset mode selected: Edge, Period, or
Bit/Eye Pattern.
Sometimes Autoset cannot produce a correct display due to the nature of the
input signal; if so, you may have to adjust the scale, trigger, and acquisition
controls manually. Some conditions that can cause Autoset to fail are:
H
no signal present.
313
Acquiring Waveforms
The vertical scale and position controls do not affect the vertical acquisition
window, rather they adjust the display system to display the waveform as
follows:
H
The vertical scale (per division) setting determines the portion of the vertical
acquisition window that appears in the graticule, allowing you to scale it to
contain all of the window or only part. Figure 32 shows two vertical
acquisition windows that contain the entire waveform, but only one window
contains the entire waveform in the graticule on screen.
a. Volts/Div setting determines the size of the display graticule within the vertical
acquisition window (scale set to 50 mv/div.)
+0.50 volt
Vertical window
+0.25 volt
C1
Graticule
0.25 volt
0.50 volt
b. Vertical position can change location of display graticule within +/5 divisions
(position set to 4 divisions)
+0.50 volt
+0.45 volt
Vertical window
Graticule
C1
0.05 volt
0.5 volt
314
Acquiring Waveforms
The vertical position adjusts the display of the graticule relative to the
vertical acquisition window (position is a display control). Figure 32 b
shows how vertical position moves the waveform graticule vertically in the
vertical acquisition window to place the acquired waveform in the graticule
display. Position does not determine what data is acquired as does vertical
offset.
The vertical offset control affects the vertical acquisition window and the
displayed waveform as follows:
H
The vertical range (window) is always centered around the offset value that
is set. Vertical offset is the voltage level at middle of the vertical acquisition
window. With no (zero) offset (see Figure 33), that voltage level is zero
(ground).
As you vary vertical offset, the middle voltage level moves relative to zero.
This moves the vertical acquisition window up and down on the waveform.
With input signals that are smaller than the window, it appears the waveform
moves in the window. Actually, a larger signal shows what really happens:
the offset moves the middle of the vertical acquisition window up and down
on input signal. Figure 33 shows how offset moves the acquisition window
to control the portion of the waveform amplitude the window captured.
Applying a negative offset moves the vertical range down relative to the DC
level of the input signal, moving the waveform up on the display. Likewise,
applying a positive offset moves the vertical range up, moving the waveform
down on the display. See Figure 33.
NOTE. On screen, the channel icon in the waveform bar points to the offset value
around which the vertical acquisition window is centered. The offset value
pointed to is relative to the ground reference icon. Both icons are shown in
Figure 33.
315
Acquiring Waveforms
Offset +300 mV
(Near waveform top level)
C1
Offset 0.0 V
(At waveform ground reference)
C1
Offset 300 mV
(Waveform bottom level)
C1
316
Acquiring Waveforms
The external trigger signal that you input and set the trigger system to
recognize determines the point relative to the input waveform that triggers
the instrument.
The horizontal position you set determines the horizontal delay from the
trigger point to the first sample point in the acquisition window.
The horizontal scale you set, and the requirement that all waveforms fit
within the 10 horizontal-division display, determines the horizontal duration
of the window relative to any waveform, allowing you to scale it to contain a
waveform edge, a cycle, or several cycles.
Horizontal position
Sample interval
First sampled and
digitized point
Trigger event on
Ext. trigger signal
Horizontal
acquisition
window
Horizontal
delay
Time of first point
The record length (along with the horizontal scale) you set for the 10-division window determines the sample interval (horizontal point spacing or
resolution) on the waveform.
NOTE. The horizontal position controls the distance to the Horizontal Reference
to indirectly set the time to the first sampled point. See Horizontal Position and
the Horizontal Reference on page 353 for a discussion of this relationship.
Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution. These
parameters all relate to each other and specify the horizontal acquisition window.
317
Acquiring Waveforms
Because the horizontal acquisition window must fit in the 10 horizontal division
display, for most cases, you just set the duration of the horizontal acquisition
window (10 divs x the scale setting) as described in (1) below. By also setting a
record length in samples, you indirectly set the resolution/sample interval/sample
rate for the horizontal acquisition window (waveform record). The relations
between these horizontal elements follow:
1. Time Duration (seconds) = 10 divs (window size) x Horizontal Scale
(sec/div)
2. Time Duration (seconds) = Sample Interval (seconds/sample) x Record
Length (samples),
where:
Time Duration is the horizontal acquisition window time duration
3.
In (2) above, note that it is Sample Interval that varies indirectly to accommodate
the window time duration (and its scale setting) and the Record Length setting as
these later two elements can be set by you. These elements behave as follows:
H
If Record Length or Time Duration vary, Sample Interval varies to accommodate, up to highest sample rate/lowest sample interval/highest resolution.
If you set faster Horizontal Scale settings, decreasing Time Duration, and the
Sample Interval reaches its lower limit, the horizontal scale becomes limited
to a setting compatible with the record length and the lower limit of the
sample interval.
If you attempt to set longer Record Lengths and the Sample Interval reaches
it lower limit, Time Duration remains constant and the record length
becomes limited. The equation becomes:
Maximum Record Length = Time Duration B Min Sample Interval
For example, at 1ps/div and 10 divisions, the record length must be no more
than 1000 points:
Max Rec Length 1000 samples = (10 divs x 1ps/div) B 0.01 ps/sample
Max Rec Length = 1000 samples
NOTE. Resolution and the equivalent elements, sample interval and sample rate
(see equation 3 above), are not settable directly, but are derived. You can,
however, check the resolution at anytime in the resolution readout (push the
Horizontal Menu button). Also note, that the Resolution knob actually adjusts
the record length to increase sample density (detail).
318
Acquiring Waveforms
Independent vs. Shared Window. For a given time base, the instrument applies the
same horizontal acquisition window to all channels from which it acquires data.
Unlike the vertical acquisition window that you set independently for each
channel, the same time/division, resolution (record length), and horizontal delay
(from the same trigger point) that you set for a time base, apply to all channels in
that time base. In other words, one trigger, from a single trigger source, will
locate a common horizontal acquisition window on all active channels, which
you can shift by setting the horizontal position control.
The horizontal acquisition window determines the waveform records extracted
from all signals present at all active channels and math waveforms. You can
think of the horizontal acquisition window as cutting across any input signals
present in the input channels to extract the same slice of time into waveform
records. See Figure 35.
Common trigger
Common horizontal
delay
Ch1 record
Ch2 record
Ch3 record
Ch4 record
Figure 35: Common trigger, record length, and acquisition rate for all channels
319
Acquiring Waveforms
Vertical
Offset
Acquisition
Mode
Acquisition
system
Sampling
module
Time bases
Horizontal
Scale
Why Use?
Whats Special?
Horizontal
Position
Record
Length
Use the acquisition controls to optimize and tailor the acquisition of your
waveforms. The mode controls described here operate on the data as the
instrument acquires itperhaps to reduce noise in the waveform record or to
capture a record of min/max values for each data point in the waveform record.
The acquisition controls also let you start and stop acquisition, as well as take
certain actions after acquisition stops, such as to print the acquired waveform.
Stop After Options. You can set the condition upon which acquisition stops, such
as after a number of acquisitions or a number of mask hits you specify. You can
set the instrument to save waveforms or print the screen to a file or printer.
FrameScanTM Acquisition. You can alter the normal acquisition cycle to produce a
waveform record suitable for acquiring and analyzing Pseudo-Random Bit
Streams (PRBSs), which are contained within a repeating data frame. See
FrameScan Acquisitions on page 329 for more information on using FrameScan
acquisitions.
Whats Excluded?
Envelope acquisition mode can not be used with FrameScan acquisitions; you
must use Sample or Average modes.
Keys to Using
The key points that follow describe operating considerations for setting up the
acquisition system so the waveforms acquired best fit your requirements.
Acquisition Modes. Consider the mode you want to use to acquire data:
H
320
Acquiring Waveforms
Envelope - the instrument retains the running minimum (Min) and maximum
(Max) values in adjacent sample intervals continuously, as subsequent
waveforms are acquired, creating an envelope of all waveforms acquired for
that channel.
Acquiring and displaying a noisy square wave signal illustrates the difference
between the three modes. Note how Average reduces the noise while Envelope
captures its extremes:
Sample
Average
Envelope
Acquisition Control. Also, consider how you want to control acquisition; you
have two main options, either settable from the Acquisition Setup dialog box
(push Acquisition MENU to display):
H
Run/Stop Button Only - sets the instrument to start and stop the acquisition
only when you use the Run/Stop button, which is available on the front
panel, on the application toolbar, and in the Acquisition Setup dialog box. If
toggled to Run, acquisition will start if a valid trigger occurs. If toggled to
Stop, acquisition stops immediately.
Global Controls. Like the horizontal controls, the acquisition controls apply to all
active channels. For example, channel 1 cannot acquire in Sample mode while
channel 2 acquires in Envelope mode; you cannot stop channel 8 from acquiring
(if turned on) while other channels continue to acquire. Unlike horizontal
controls, acquisition settings extend across time bases: you cannot set a different
sample mode for channels acquired in the Mag1 time base; the sample mode you
set extends across the Main, Mag1 and Mag2 time bases.
321
Acquiring Waveforms
322
Acquiring Waveforms
Overview
Use the procedure that follows to set the data-acquisition mode and specify
acquisition start and stop methods. For more detailed information, display online
help when performing the procedure.
Prerequisites 1.
To select an 2.
acquisition Mode
Select the 3.
acquisition Mode
Set a
sample count
Sample
Average
Envelope
323
Acquiring Waveforms
Overview
Condition
5.
6.
None
Start acquisition 8.
End of Procedure
324
Acquiring Waveforms
To Start and
Stop Acquisition
Overview
Prerequisites 1.
To start 2.
acquiring
To stop 3.
acquiring
To clear an 4.
acquisition
For more 5.
information
End of Procedure
325
Acquiring Waveforms
Acquisition Hardware
defines the sampling process, sampling modes, and the waveform record.
Before a signal can be acquired, it must pass through the input channel where it
is sampled and digitized. Each channel has a dedicated sampler and digitizer as
shown in Figure 37; each channel can produce a stream of digital data from
which waveform records can be extracted. See Signal Connection and Scaling on
page 34 for further description of scaling, positioning, and DC offsetting of
channels.
Number of channels depends on sampling modules installed
CH 1
Sampler
Digitizer
CH 2
Sampler
Digitizer
Sampling module
Instrument
CH 3
Sampler
Digitizer
CH n
Sampler
Digitizer
Sampling module
Instrument
Sampling Process
326
Acquiring Waveforms
+0.5 V
0V
Input signal
Sampled points
+0.5 V
0V
0V
0.5 V
Digital values
0V
0.5 V
Sampling Modes
Waveform Record
Sample Interval. The precise time between sample points taken during
acquisition.
Trigger Point. The trigger point marks the time zero in a waveform record.
All waveform samples are located in time with respect to the trigger point.
Horizontal Delay. The time lapse from the trigger point to the first sample
taken (first point in the waveform record). It is set indirectly by setting the
horizontal position (see Horizontal Position and the Horizontal Reference on
page 353).
327
Acquiring Waveforms
Sample interval
Record length
Horizontal delay
Acquisition Cycle
328
Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution on
page 317.
Choose the FrameScan cycle when you want to test for anomalies in
Pseudo-Random Bit Streams. See FrameScan Acquisitions on page 329.
Acquiring Waveforms
FrameScan Acquisitions
This instrument can modify its normal acquisition process to help you analyze
pattern-dependent failures in high bit-rate communications signals.
Why Use?
These methods are time consuming to use and neither can examine in detail the
pattern driving the failure.
Whats Special?
329
Acquiring Waveforms
Whats Excluded?
Keys to Using
The key points that follow describe FrameScan mode operating behavior and
provide background to help you to use this feature.
Determine Start Bit and Scan Bits. You need to know the bit in the bit stream at
which you want to start the scan, the appropriate horizontal scale, the starting
horizontal position, and the total number of bits for the desired FrameScan cycle.
How FrameScan Mode Acquires. FrameScan mode alters the normal acquisition
sequence in order to scan a pseudo-random bit sequence (PRBS) or another
repetitive bit stream to acquire one bit at time in the same sequence found in the
bit stream:
H
330
Acquiring Waveforms
for the frame, or until acquisition stops due to a specific test condition,
such as the failure of a mask test.
The resulting horizontally skewed FrameScan acquisitions display successive
individual bits acquired in increasing time order. FrameScan acquisitions can
continue through an entire frame of data if needed to help you to uncover faulty
bit sequences leading up to pattern-dependent failures.
Subframe 1
Subframe 3
Subframe 2
h
Subframe 1
Subframe 4
h
Subframe 2
Subframe 5
Subframe 3
Subframe 4
Subframe 5
Accumulated
acquisitions
Notes:
h is the horizontal position change = one bit period (=1/bit-rate)
Subframe acquisition duration is 40% greater than the bit period
331
Acquiring Waveforms
To Acquire in
FrameScan Mode
Overview
Use the procedure that follows to set up the instrument to acquire in FrameScan
mode.
Prerequisites 1.
2.
3.
4.
Access the 5.
FrameScan
controls
In the Horz Setup dialog box, click the Units Bits option
button.
7.
332
Acquiring Waveforms
Overview
Select a
comm. standard, or...
Set the bit rate
manually
Set the initial horizontal position to the first bit you want
to acquire. Use one of the two methods that follow:
H
Or set manually
Check to
start scan
Click to
restart scan
333
Acquiring Waveforms
Overview
Select Infinite Persistence or Variable Persistence in the Display Setup dialog box (from the
application menu bar, select Setup, and then
select Display).
For more 13. For more help on FrameScan acquisitions, click the
information
Help button in the Setup dialog box to access
contextual help on screen.
See page 3145 to learn about using online help.
334
Acquiring Waveforms
Overview
FrameScan Acquisition, when coupled with mask testing, provides the tool you
need to capture a defective bit and examine the pattern leading up to it.
Prerequisites 1.
2.
3.
Enable 4.
mask testing
5.
335
Acquiring Waveforms
Overview
Set conditional 6.
acquisition and
start testing
7.
8.
For more 9.
information
End of Procedure
336
Triggering
To properly acquire waveforms to sample a signal and assemble it into a
waveform record you need to set up the instrument trigger conditions. This
section provides an overview of the instrument trigger features and their use.
Sampling
module
Acquisition
system
Trigger
system
Time base
system
Signal processing
& transformation
system
Output and
storage
User Interface
and display
Edge Triggering
The instrument supports direct-edge triggering, which triggers as described in
Keys to Using on page 337. You must provide an external trigger source, except
when using clock-recovery triggering from an optical sampling module equipped
with the clock-recovery option or using the internal clock (as when TDR testing).
Why Use?
Use triggering controls to control the acquisition window, so that the instrument
acquires the waveform data you want. The trigger event, when synchronized to
the input signal, defines the horizontal acquisition window. By choosing the
trigger event and adjusting the horizontal position (delay between trigger event
and the horizontal reference point, you control the location in the data stream
(the input signal) that the waveform record is taken).
Whats Special?
Clock Recovery. If you use optical sampling modules that include a clock-recovery option, you can use the clock embedded in certain optical signals to trigger
the instrument.
Keys to Using
The key points that follow describe operating considerations for setting up to
trigger on your waveforms.
Triggering Process. When a trigger event occurs, the instrument acquires a
sample in the process of building a waveform record. The trigger event esta-
337
Triggering
blishes the time-zero point in the waveform record and all samples are measured
with respect to that event.
The trigger event starts waveform acquisition. A trigger event occurs when the
trigger source (the signal that the trigger circuit monitors) passes through a
specified voltage level in a specified direction (the trigger slope). When a trigger
event occurs, the instrument acquires one sample of the input signal. When the
next trigger event occurs, the instrument acquires the next sample. This process
continues until the entire record is filled with acquired samples. Without a
trigger, the instrument does not acquire any samples. See Figure 39 on
page 328. This behavior differs from that of real time acquisition systems,
which can acquire a complete waveform record from a single trigger event.
Triggering is Global. The instrument uses the trigger event to acquire across all
active channels. This same trigger is also common across all time bases currently
active (one or more of Main, Mag1 and Mag2).
Edge-Trigger Type. This instrument supports edge triggering only, in which edge
triggers gate a series of acquisitions.
The slope control determines whether the instrument recognizes the trigger point
on the rising or the falling edge of a signal. See Figure 311.You can set the
trigger slope from the toolbar at the top of the display or in the Trigger Setup
dialog box.
The level control determines where on that edge the trigger point occurs. The
instrument lets you set the trigger level from the front panel with the Trigger
LEVEL knob.
Positive-going edge
Negative-going edge
Trigger level
can be adjusted
vertically.
338
Triggering
Trigger Modes. The trigger modes control the behavior of the instrument when
not triggered:
H
Auto mode sets the instrument to acquire a waveform even if a trigger event
does not occur. Auto mode uses a timer that starts after trigger rearm. If the
trigger circuit does not detect a trigger after this timeout (about 100 ms), it
auto triggers, forcing enough trigger events to acquire all active channels. In
the case of repetitive acquisitions in automatic trigger mode, waveform
samples are acquired, but at different places in the data stream (synchronization is lost). See Figure 312, Automatic trigger mode. If you do not apply a
signal to any channel displayed, a baseline is displayed for that channel.
Triggered waveform
Untriggered waveforms
the internal clock of the instrument (TDR clock rate), with user-selectable
clock frequencies. The Internal Clock Out connector supplies a replica of the
internal clock at the instrument front panel. See Figure 313 on page 340.
339
Triggering
Trigger
Prescale
Input
Trigger
Direct
Input
Trigger
Probe
Power
Source to use
Communications (optical) data Set source to Clock Recovery, and set the clock-recovery type,
signals with embedded clock
and use an optical sampling module equipped with a
clock-recovery option supporting the recovery of the clock
signal.
340
Measurements on systems
with a synchronized pretrigger
signal
Triggering
Source to use
Trigger Source and ESD. Observe static precautions when coupling trigger
sources to this instrument.
CAUTION. Electro-static damage can permanently degrade and damage the
inputs to this instrument, its sampling modules, and accessory probes. You must
take proper precautions; please read your sampling module user manual for
more information.
Trigger Source Connectors. External triggers can be connected to either the
Trigger DIRECT or Trigger PRESCALE connectors on the front panel:
H
Signals connected to the DIRECT connector are fed directly to the trigger
circuitry. The signal is DC coupled and can be up to 3.0 GHz.
When using a given trigger source, you should disconnect any other trigger
source from the front panel to ensure specified performance. Specifically:
H
Probe-to-Trigger Source Connection. You can connect probes, such as the P6207
and P6209, to the Trigger DIRECT input connector of the instrument. Observe
341
Triggering
all static precautions outlined in the documentation for the probe you choose
while following these steps:
H
Connect the probe-power connector to the TEKPROBE- and SMA-compatible probe (Level 1 or 2 only).
Connect the probe signal connector (probe must have an SMA connector) to
the Trigger DIRECT source input (not the PRESCALE source input).
Connect the probe input to the signal that is to supply the trigger source.
The probe you attach preconditions the trigger signal for its input just as other
probes do for the vertical inputs. More specifically, a probe attached to the Trigger
DIRECT input may affect trigger-level range, resolution, and units as follows:
H
The trigger level for probes that have offset control is adjusted by changing
the offset of the connected probe and is limited by the range, resolution, and
offset characteristics of the probe.
Note that the probe parameters (range, resolution, offset scale, and units) that are
relevant to the trigger circuit affect the Trigger Level control.
High Frequency Triggering and Metastability Reject. These two features can help
stabilize triggering:
H
When you enable the High Frequency triggering control, the instrument
increases trigger sensitivity of the trigger circuit by decreasing hysteresis (a
transition or noise band), allowing triggering on higher frequency signals.
When you enable Metastability Reject, the instrument replaces the acquired
sample with a null sample if it detects a potential metastable condition. A
metastable condition occurs when both the trigger input signal and the
holdoff-generated enable signal arrive at the internal trigger recognizer at
virtually the same time.
Adjusting Holdoff. Trigger holdoff can also help stabilize triggering. When you
adjust holdoff, the instrument changes the time it waits before rearming its
trigger circuit after acquiring a sample. Before rearming, the trigger circuitry
cannot recognize when the next trigger conditions are satisfied and so cannot
generate the next trigger event. When the instrument is triggering on undesired
trigger events, such as shown in Figure 314 (top waveform), you adjust holdoff
to obtain stable triggering as shown in Figure 314 (bottom waveform).
342
Triggering
Holdoff
Holdoff
Holdoff
Trigger Level
Holdoff
Holdoff
Holdoff
Trigger Level
At the longer holdoff time for the top waveform, triggering occurs at valid, but undesired, trigger
events. With a shorter holdoff set for the bottom waveform, triggers all occur on the first pulse in the
burst, which results in a stable display.
The instrument hardware constrains the minimum usable holdoff time to the
greater of the trigger-to-end-of-record time or 5 ms.
The trigger-to-end-of-record time (EORT) is the time from the trigger event
to the last sample in the waveform record and is calculated as:
EORT = Horiz. Position + (1 0.01 x Horiz. Ref.) x Time/Div x 10
divisions) + Channel Deskew
For example:
EORT = 6 ms + (10.1(.5) x 1 ms/div x 10 div + 0
= 6 ms + 5 m = 11 ms, when:
Horizontal position = 6 ms
Horizontal Ref = 50%
Time/Division = 1 ms/div
Channel Deskew = 0 (set to minimum)
343
Triggering
In this example, because 11 ms is greater than 5 ms, the current control settings
determine the minimum usable holdoff the instrument can use.
EORT
Trigger point
Time to EORT
Horizontal position
Horizontal
delay
(19 ns min.)
Time
zero
Horizontal
reference point
344
Requested the last value requested in the Trigger Setup dialog box. You
can set times from 5 ms - 50 ms, but the time requested becomes the actual
time used only if it meets the requirements just described for Actual.
Otherwise, the holdoff-time value requested is held for later use as described
for Actual.
Actual the holdoff time in effect; that is, the time the instrument is using or
will use when acquiring data. The instrument uses it when the minimum
usable holdoff (determined as described in Usable Holdoff, above) is greater
than the requested value. The instrument will retain and change to the
requested value if the user changes control settings such that the requested
value exceeds the minimum usable holdoff. Actual values can range from
5 ms 55 ms.
Triggering
To Trigger
Overview
Use the procedure that follows when setting up the instrument to trigger
acquisitions.
To trigger
Prerequisites 1.
Apply a trigger 2.
signal
Select source, 3.
slope, and level
4.
5.
Adjust the trigger level using the (Set Level to) 50% button
or the Level list box as show at right, or using those on the
front panel, shown in step 7.
Source Menu
Slope button
Level Controls
345
Triggering
Overview
To trigger (Cont.)
Verify 6.
triggering
Other trigger 7.
parameters
For more 8.
information
End of Procedure
346
Displaying Waveforms
To make use of the waveforms you acquire, you will often want to display them.
This instrument includes a flexible, customizable display that you can control to
examine and analyze acquired waveforms. This section presents an overview of
display operation in the topics Using the Waveform Display and Customizing the
Display.
Sampling
module
Acquisition
system
Trigger
system
Time base
system
Signal processing
& transformation
system
Output and
storage
User Interface
and display
347
Displaying Waveforms
(2) Graticule
(5) Horizontal reference
(3) Upper limit of graticule
(selected waveform)
348
Displaying Waveforms
Why Use?
Whats Special?
Use display features and controls to view, test, measure, and otherwise analyze
your waveforms.
This instrument provides a robust display. Some features of note follow.
Flexible Display Control. Front-panel knobs and buttons support quick access to
the most often used adjustmentsthose that display, position, and scale
waveforms. Mouse, keyboard, and touchscreen interfaces support complete setup
of all the display parameters.
Multiple Time base Views. Three views, Main, plus Mag1 and Mag2, can be
displayed simultaneously, each with its own time base. Live waveforms are
acquired independently in each time base (C1 in Main is a different waveform
than C1 in Mag1 or Mag2).
All the displayed waveforms appear in each view that you display: if C1 and M1
are displayed in Main, they also appear in Mag1 and Mag2 if you display those
views. Reference waveforms will appear in all views as well, but, since they
have a static time base setting (the time base setting with which they were
saved), they will be identical in all views.
Fast Access to Zoom. Waveform inspection has never been easier. Just click and
drag a box around the feature of interest and it zooms horizontally to fill the
screen, reacquired at a higher resolution.
Preview Mode. The instrument automatically uses a preview display when control
changes initiate reacquisition of waveform data. A preview display shows how
the waveforms will look when acquisition completes. When the instrument
finishes the processing of state changes, it removes the preview and displays the
actual waveforms.
Whats Excluded?
Previewing of changes does not occur when the acquisition system is stopped;
the data will not update on screen until acquisition is restarted.
349
Displaying Waveforms
Keys to Using
The key points that follow describe operating considerations for setting up the
instrument time base views so that they best support your data-analysis tasks.
Waveform Display. In general, the method of displaying a waveform is to define
the waveform, and then turn it on. Table 32 summarizes this process as it
applies to the different waveforms.
To define:
To turn on:
Channel:
C1 C8
Reference:
R1 R8
H
H
M1 M8
The waveform number buttons affect C1C8, R1R8, or M1M8, depending on the Vertical Source button you push CH,
REF, or MATH.
350
Displaying Waveforms
Waveform supports?
Operating notes
Ch
Ref
Math
Vertical Scale
Yes
Yes
Yes
Vertical Position
Yes
Yes
Yes
Vertical Offset
Yes
No
No
Horizontal Scale
Yes
No
No
Horizontal Position
Yes
No
No
Yes
No
No
Yes
Yes
Yes
Yes
Yes
Yes
If cursors are off, pushing the Cursor button on the front panel turns
cursors on with the selected waveform as their target.
Yes
No
No
If more than one time base is displayed, these controls adjust the
selected channel
e waveform
ef rm in all time
me bases.
e .
er
ff e is unavailablee for
f r channel
e waveforms
ef rm displayed
e with rho
r
Vertical
offset
or ohm units.
All channel waveforms are adjusted globally in the selected time base.
ef rm are
re not adjusted
e because
e
e their
e r horizontal
rz
r me er
Math waveforms
parameters
are derived from their sources. Reference waveforms are not adjusted
because
e
e they
e havee ffixed
xe horizontal
rz
parameters
r me er determined
e erm e at thee time
me
the waveform was saved.
Graticules. One graticule is displayed for the Main time base, and an additional
graticule is displayed for each Mag time base that you turn on. Figure 316 on
page 348 shows the elements of the time base graticules; the elements are the
same for each time base displayed.
Using Multiple Views. The methods of displaying (turning on) and selecting any
time base view follow:
H
Turn the view on: Press the Mag1 or Mag2 front-panel button once to turn on
the Mag1 or Mag2 time base. The Main view is always (displayed); you
cannot turn it off. Turning on a time base makes it active (selects it for
adjustment).
Select among displayed views: Press any time base view button to make it
the active, selected time base. The button of the selected view is always lit
amber.
Turn off the selected Mag view: Once selected, press the Mag1 or Mag2
button to turn off the time base. The Main time base becomes the selected
time base.
Operations on the Selected Time Base View. The method of adjusting (horizontal
scaling and positioning, setting resolution/record length, and so on) is from the
front panel: select the time base using the Horizontal time base selection buttons,
351
Displaying Waveforms
and then adjust it using the Horizontal Scale, Resolution, and Position knobs.
Only channel waveforms can have their horizontal parameters set directly.
Table 33 shows how horizontal operations relate to the waveform types; the key
points to remember follow:
H
All waveforms in each time base are displayed fit-to-screen; that is, within
the full 10 horizontal divisions that the graticule provides.
Waveform Operations that Cross Time Base Views. Unlike the horizontal controls
just described, some controls apply to all time base views:
H
Display Controls vs. Acquisition Controls. For channel waveforms, the vertical
offset control and the horizontal controls you set adjust the instrument acquisition parameters. See the following descriptions for more information:
352
Displaying Waveforms
Mag1 and Mag2 are Magnifying Timebases. The Mag1 and Mag2 time bases are so
named because they cannot be set to a more coarse (slower) horizontal scale than
that of the Main. When set to a more fine (faster) horizontal scale, they can be
thought of as magnifying a segment of the Main time base. In short:
H
each Mag time base scale sets the size of an aperture on the Main time base.
each Mag time base position setting locates the aperture within the Main
time base.
each Mag time base graticule displays, across its full horizontal width
(10 divisions), the contents of the aperture.
See To Display Waveforms in a Mag View on page 357 for a procedure that
demonstrates this operating characteristic.
Horizontal Position and the Horizontal Reference. The time values you set for
horizontal position are from the trigger point to the horizontal reference point.
This is not the time from the trigger point to the start of the waveform record
unless you set the horizontal reference to 0%. See Figure 317.
Trigger point
50 ms max.
Horizontal position
Horizontal
delay
(19 ns min.)
Time
zero
Horizontal
reference point
Mouse and Touchscreen Operation. This instrument ships with a mouse and
keyboard to give you more options for instrument control. However, for some
installations, you might not have sufficient work space to install the mouse or
keyboard. For most operations, you can use the touchscreen instead.
353
Displaying Waveforms
The table below lists some operations and the mouse/touchscreen equivalents.
The instrument ships with two styluses. Using a stylus can make it easier to
perform touchscreen operations.
Table 34: Equivalent mouse and touchscreen operations
Operations
Mouse
Stylus or finger
Select waveforms
None
354
Displaying Waveforms
To Display Waveforms in
the Main Time Base View
Overview
Use the procedure that follows to become familiar with the display adjustments
you can make.
Prerequisites 1.
2.
3.
355
Displaying Waveforms
Overview
Push the View Main button to make sure the Main time
base view is selected. Use the Horizontal knobs to scale
and position the waveform on screen and to set sample
resolution.
Scaled Horizontally
Positioned Horizontally
Adjust the 7.
Horizontal
Reference
Horizontal reference
Quick-adjust 9.
the time base
(Zoom)
356
Displaying Waveforms
Overview
Explore the 10. The next procedure describes how to set up and
Mag time base
control the Mag time bases.
controls
End of Procedure
To Display Waveforms
in a Mag View
Overview
Use the procedure that follows to become familiar with the display adjustments
you can make when using the Mag 1 and Mag 2 time base views.
Prerequisites 1.
Turn on a Mag 2.
view
357
Displaying Waveforms
Overview
Set horizontal 3.
display
parameters
Main
Divider
bar
Mag
For more 4.
information
5.
End of Procedure
358
Use the display customizing features this instrument provides to present the
display elementscolor, graticule style, waveform representation, and so
onaccording to your preferences.
Displaying Waveforms
Whats Special?
Keys to Using
Color grading. You can select color grading of a waveform so that its data color
or intensity reflects the frequency of occurrence of the data.
The key points that follow describe operating considerations for setting up the
the display system so that it presents waveforms and other display elements as
you prefer.
Display Settings. Table 35 lists display attributes that you can set and where
they are accessed.
Access
Entry
Options
Utility
User Preferences
Setup
Display
Utility
User Preferences
Setup
Display
C
Choose
e from
fr m Normal,
N rm IInfinite
f e Persistence,
er e e and Variable
r e
er e e Modes.
e .
Persistence
Utility
User Preferences
Setup
Display
Shortcut
Properties
Utilities
Waveform Props
Utility
Waveform Props
Shortcut
Properties
Cursor Colors
Setup
Cursors
Graticule Colors
Setup
Display
Histogram Color
Setup
Histogram
Mask Color
Setup
Mask Test
Waveform Color
Grading
Shortcut
Color Grading
Virtual Keyboard
Utility
User Preferences
Gr
Graticule
e Stylee
Display Modee
Show Vectors
rm display
(normal
mode only)
W ef rm Label
Waveform
e
W ef rm C
Waveform
Colorr
C
Choose
e from
fr m Full, Grid,
Gr Cross-hair,
Cr - r and Frame
r me styles.
e .
Enter
er a new
e label
e for
f r thee waveform
ef rm you havee selected.
ee e .
C
Choose
e from
fr m sixx different
ffere colors
r for
f r each
e
waveform;
ef rm choosee from
fr m
166 different
ffere colors
r for
f r a cursor,
r r graticule,
r
e histogram,
r m orr m
mask..
Except for Shortcut, the Menu Names refer to the menus found in the Menu bar at the top of the instrument screen. The
shortcut menu for a waveform can be displayed by right clicking on a displayed waveform or on its icon, which is
displayed in the waveform bar (left of the graticule).
359
Displaying Waveforms
Infinite Persistence style accumulates the data record points until you change
some control (such as scale factor) or explicitly clear the data, causing the
display to be erased. Waveform data builds up as new data records acquire.
Persistence style applies to all waveforms, except for channel waveforms and
reference waveforms displayed with color or intensity grading.
Interpolation. For record lengths of less than 500 points, you can choose to have
the instrument interpolate between the sampled points it acquires. Interpolation
affects the display only; mask testing, histograms, and automatic measurement
results are based on acquired, not interpolated, data. There are three options for
interpolation:
360
None turns interpolation off. Only points actually sampled appear in the
displays of waveform records.
Displaying Waveforms
Overview
Use the procedure that follows to become familiar with the display styles you
can set.
Prerequisites 1.
Access the 2.
Display setup
dialog box
Select normal 3.
style, vectors,
and interpolation
4.
5.
361
Displaying Waveforms
Overview
Select a 6.
persistence
Mode
Set Variable
Persistence time
Continue with 7.
the next
procedure
End of Procedure
To Customize the
Graticule and Waveforms
Overview
Use the procedure that follows to become familiar with the display adjustments
you can make.
Prerequisites 1.
2.
362
Displaying Waveforms
Overview
Change wave- 3.
form color
or label 4.
6.
8.
Waveform Icon
5.
Color grade a 7.
waveform
Waveform Icon
363
Displaying Waveforms
Overview
Reduce a wave- 9. Right click on the waveform or its icon. See right.
form to its icon
10. Choose Show from the menu that pops up to toggle the
waveform between shown (checked) and hidden
(unchecked).
Tip. Hiding a waveform is useful when you temporarily want
to remove the display of a waveform without turning it off.
Hidden waveforms change their waveform icons (in the
Waveform bar left of screen) as shown:
Waveform shown
Waveform hidden
Change grati- 11. From the application menu bar, select Setup, and then
cule style and
select Display. See right.
color
12. Use the graticule controls to select a graticule style.
13. Select the color of the screen from the Background
pulldown list. Select the color of the graticule from the
Foreground pulldown list.
14. Click the
box.
End of Procedure
364
Measuring Waveforms
To assist you in analyzing the waveforms you acquire, the instrument comes
equipped with cursors and automatic measurements. This section describes these
tools and how you use them:
H
Taking Automatic Measurements, on page 366, describes how you can set
up the instrument to automatically measure and display a variety of
waveform parameters. See Figure 318.
NOTE. You can also make graticule measurements, counting graticule divisions
and multiplying them by the vertical or horizontal scales set for the waveform
you are measuring.
Graticule
Cursors
Readouts
Measurement
Readouts
Cursor
Readouts
365
Measuring Waveforms
Whats Measured?
Whats Special?
Select from the extensive range of parameters this instrument can measure;
for a list, see Appendix B: Automatic Measurements Supported.
366
Measuring Waveforms
Use Databases as Sources. If you define the source you want to measure as a
database in the Meas Setup dialog box, you can use the database of that
waveform as source. The measurement you select operates on the accumulated
waveform data (databases accumulate repetitive instances of a source waveform
over time).
For example, consider the Max measurement. Max will capture and update the
maximum (most positive) value encountered. For a database source, the ongoing
Max measurements can only result in a higher max value as the database
accumulates ongoing acquisitions. This process causes the Max measurement
readout to track max up but not down. In contrast, the Max measurement for a
waveform source not included in a database will track variation up and down as
new waveforms are acquired.
Take Eye-Pattern and Optical Measurements. To support characterization of
communication networks and devices, this instrument supports automatic
measurements of Extinction Ratio, Q-Factor, and Clock-to-Data Jitter on
communications waveforms.
Characterize Measurements Independently. To allow you control over how your
waveform data is characterized by each measurement, the instrument lets you set
the methods used independently for each measurement. See High/Low Tracking
Method on page 369 and Reference Levels Method on page 370.
See Statistics on Measurement Results. To see how any automatic measurement
varies statistically, you can display a readout of the Min, Max, Mean, and
Standard Deviation the measurement results. See step 6 on page 373 for
instructions.
Whats Excluded?
Keys to Using
Except for Average Optical Power, all measurements of the category Eye
Pattern/Optical must be performed on a waveform database (see Use
Databases as Sources on page 367). The Average Optical Power measurement cannot use a waveform database as its source.
The key points that follow describe operating considerations for setting up
automatic measurements to obtain the best measurement results.
367
Measuring Waveforms
High/Low Tracking. The levels that the automatic measurement system derives as
the High (Top) or Low (Bottom) for a waveform influence the fidelity of
amplitude and aberration measurements. For many of the automatic measurements supported, the instrument automatically determines these levels and
disables all or some of the High/Low tracking method controls (for example,
368
Measuring Waveforms
RMS). If the measurement you select has High/Low methods that are appropriate
to adjust (or example, RISE time), the instrument automatically enables the
method controls for your adjustment as shown below.
High (Min/Max)
High (Mean)
High (Mode)
Mid Reference
Low (Mode)
Low (Mean)
Low (Min/Max)
369
Measuring Waveforms
Min-max uses the highest and lowest values of the waveform record. This
setting is best for examining waveforms that have no large, flat portions at a
common value, such as sine waves and triangle waves almost any waveform
except for pulses. See Figure 320.
Auto switches between methods. Auto method first attempts to calculate the
high and low values using the Mode method. Then, if the histogram does not
show obvious consistent high and low levels, Auto method automatically
switches to the Min/Max or Mean method.
For example, the Mode histogram operating on a triangle wave would not
find consistent high and low levels, so the instrument would switch to
the Min/Max mode. Consistent high and low levels would be found on a
square wave, so the Auto mode would use the Mode method.
NOTE. For Eye Pattern/Optical measurements, the High/Low method choices are
disabled. The instrument always uses the Mean method for those measurements.
When setting High/Low method, be aware of these operating behaviors:
H
The tracking settings are not global; that is, you can independently set the
method used for each of Meas 1 Meas 8.
You can turn off tracking for either or both the High and Low levels and
enter them directly. (Turning off tracking captures the current High/Low
values and enters them into High/Low control fields, where you can use
them as starting values to modify.)
Not all tracking methods are appropriate for all measurements. If you cannot
set the tracking method, the controls will be disabled.
Reference Levels Method. You can choose the method that the instrument uses to
determine a second group of levels when taking time-related measurements.
These levels are the High, Mid, and Low references. For example, the measurement system takes risetime from the waveform-edge segment that transitions
from the Low to the High reference levels.
The instrument provides the following four calculation methods; refer to
Figure 321 as you read about each method:
1. Relative Reference is calculated as percentage of the High/Low range.
2. High Delta Reference is calculated as absolute values from the High Level.
370
Measuring Waveforms
3. Low Delta Reference is calculated as absolute values from the Low Level.
4. Absolute Reference is set by absolute values in user units.
Reference level calculation methods
90%
10 mV
90 mV
40 mV
50%
50 mV
50 mV
0 mV
10%
90 mV
Low Reference
Low (50 mV)
10 mV
40 mV
371
Measuring Waveforms
To Take Automatic
Measurements
Overview
Use the procedure that follows to quickly take a measurement based on the
default settings for High/Low method and for reference-level method.
Prerequisites 1.
Select the 2.
waveform
372
Measuring Waveforms
Overview
Take Automatic 3.
measurements
4.
5.
To see statistics 6.
7.
373
Measuring Waveforms
Overview
To measure a 8.
database
9.
10. In the Source tab, check the Use Wfm Database option
as shown below.
For more in- 11. Press the Help button in the Meas Setup dialog box to
formation
access the online help.
12. See Appendix B: Automatic Measurements Supported,
on page B1 for a list of the measurements and their
definitions.
End of Procedure
374
Measuring Waveforms
To Localize a
Measurement
Overview
Use the procedure that follows to set gates on a measurement source, which
forces the measurement to be taken over a segment of the waveform (otherwise,
the entire waveform feeds the measurement).
To gate a measurement
Prerequisites 1.
Access the 2.
gates
Enable and 3.
position the
gates
4.
5.
375
Measuring Waveforms
Overview
End of Procedure
376
Measuring Waveforms
Whats Measured?
Use cursors to measure amplitude and time quickly and with more accuracy than
when using graticule measurements. Because you position cursors wherever you
want on the waveform, they are easier to localize to a waveform segment or
feature than automatic measurements.
Time or amplitude or both. Vertical cursors measure time or bits on screen;
horizontal cursors measure amplitude: voltage, watts, rho, or ohms; and
waveform cursors measure both. Table 36 expands on these definitions.
Parameter measured
Cursor readout
Horizontal Cursors
Trigger point
Vertical Cursors
Trigger point
377
Measuring Waveforms
What Sources
Can I Measure?
+ 3 divisions at 20 mV/div
378
When cursors are first turned on, the instrument automatically assigns them
to use the waveform currently selected on screen as the source for each
cursor. Up to the time you turn cursors on, you can select a waveform on
screen to use it as the source for the cursors.
Measuring Waveforms
Once cursors are on, selecting a different waveform does not change the
source the cursors measure. To change the source while cursors are on, you
must change the source in the Cursors Setup dialog box.
Turning cursors off restores the default cursor source assignment so that
assignment again tracks the currently selected waveform.
Cursors Can Treat Sources Independently. Each cursor can take a different,
independent source, with each source having its own amplitude scale and time
scale. Consider the example presented by Figure 322 on page 378:
H
Cursor1 is set to measure channel 3 (C3), which is set to 100 mV/div, so the
cursor readout v1 measures C3 relative to its ground as 3 divisions x
100 mV/div, or about 300 mv.
Note that the value of each graticule division, relative to the delta readout, is
not readily apparent because the delta-amplitude readout (Dv) must account
for the different amplitude-scale settings of the sources. To do so, the Dv
readout displays the results of v2 v1 (60 mv 300 mv = 240 mv),
automatically accounting for the different scales of the cursor sources.
Time readouts behave similarly with regard to different sources with different
time bases. Each cursor displays its time readout, t1 or t2, with respect to the
time base of its source, and Dt is calculated as t2 t1, automatically accounting
for any difference in the time base of each cursor source.
NOTE. If a cursor readout does not seem correct, check the source of each cursor
in the Cursor Setup dialog box. Each cursor readout relates to the amplitude and
time base settings of their source.
Vertical Cursors Measure from the Trigger Point. Remember that each vertical
cursor measures the time from the trigger source to itself. This relationship is
shown in Figure 323 on page 380.
379
Measuring Waveforms
Horizontal Ref = 0%
Cursor
Cursor Units Depend on Sources. A cursor that measures amplitude or time will
read out in the units of its source as indicated in Table 37. Note mixed sources
require the delta readouts to follow the units of the cursor 1 source.
Table 37: Cursor units
Cursors
Standard units1
Readout names
Horizontal
v1, v2, Dv
Vertical
seconds, bits
t1, t2, Dt
Waveform
380
If the v1 and v2 units do not match, the Dv readout defaults to the units used by the v1
readout; if the t1 and t2 units do not match, the Dt readout units defaults to t1 readout
units.
Measuring Waveforms
To Take a Cursor
Measurement
Overview
Prerequisites 1.
Take cursor 2.
measurements
3.
4.
5.
381
Measuring Waveforms
Overview
To reassign cur- 6.
sors
End of Procedure
Overview
You can target each cursor to the source it is to measure. (See Cursors Treat
Sources Independently on page 379). To do so, use the procedure that follows.
Prerequisites 1.
2.
382
Measuring Waveforms
Overview
From the pop-up list (see right) for each of Cursor 1 and
Cursor 2, select a source:
H
End of Procedure
The procedures given here will increase the accuracy of the measurements you
take.
Compensation
This instrument can compensate itself and the sampling modules installed,
optimizing the internal signal path used to acquire the waveforms you measure.
Compensation optimizes the capability of the instrument to make accurate
measurements based on the ambient temperature.
NOTE. After first installing a sampling module(s) or moving a sampling module
from one compartment to another, you should run compensation from the
Utilities menu to ensure the instrument meets it specifications.
383
Measuring Waveforms
To Compensate the
Instrument and Modules
Overview
Use the following procedure to optimize the instrument for the current temperature to enhance measurement results.
To perform a compensation
Prerequisites 1.
Display the 2.
Compensation
dialog box
384
Measuring Waveforms
Overview
Select the 3.
scope of the
compensation
4.
5.
Click to select
Compensate
Choose targets to
compensate
Enabled only if Module
selected as target
Run the 6.
compensation
C to start
r
Click
compensation
End of Procedure
385
Measuring Waveforms
To Deskew Channels
Overview
Prerequisites 1.
2.
3.
Set up the 4.
reference
channel
5.
Deskew the 6.
channel
386
7.
8.
Measuring Waveforms
Overview
End of Procedure
To Perform Dark-Level
and User Wavelength Gain
Compensations
Overview
Prerequisites 1.
Select the 2.
waveform
387
Measuring Waveforms
Overview
Access 3.
dark-level compensation
Run the user If you want, you can can compensate an optical channel for
wavelength gain a custom input signal:
compensation
6. In Vert Setup dialog box, click the User Wavelength
Gain button under Compensation. See right. Follow the
instructions on screen.
7.
8.
9.
End of Procedure
388
Source waveform
Math waveform
Math expression
(function(source))
Math waveform
(M1)
Diff(C2)
389
Why Use?
Create math waveforms to support the analysis of your channel and reference
waveforms. By combining and transforming source waveforms and other data
into math waveforms, you can derive the data view that your application
requires. You can create math waveforms that result from:
H
You can create up to eight math waveforms; see Keys to Using on page 391 for
more examples.
Whats Special?
Whats Excluded?
390
Some operations that you cannot use with math waveforms follow:
H
Math-on-Math. You cannot use math waveforms as sources for other math
waveforms. For example if you have a math waveform defined as
M1 = C1 C2, you cannot define a second math waveform as
M2 = M1 + C3. You can however expand the second math waveform to
M2 = C1 C2 + C3.
Mag Time Base Expressions. Sources for math expressions must be sources
associated with the Main time base. For example, M3 = C1 + C2 uses these
sources as acquired and displayed by the Main time base, not by the Mag1 or
Mag2 time base. You cannot create M3 = C1(Main) C2(Mag1).
Keys to Using
The key points that follow describe considerations for creating math waveforms
that best supports your data-analysis tasks.
How to Create. You create math waveforms when you create a math expression.
You do so by applying numerical constants, math operators, and functions to
operands, which can be channel, waveforms, reference waveforms, measurements (scalars), or fixed scalars. You can display and manipulate these derived
math waveforms much like you can the channel and reference waveforms (see
Operations on Math Waveforms on page 395).
Some examples of typical math waveforms follow.
...normalize a waveform
...
Source Waveform
0.8V
CHAN1
Source Waveform
5.0 V
1.0V
CHAN1
Intg(C1Meas1),
where
C1 is waveform shown left
Meas1 is set to take the Mean of C1
1.05V
1.00V
0.95V
+0.05V
0.00V
0.05V
3V
Channel waveforms
Reference waveforms
391
Shifts in amplitude or DC level of input sources that cause the source to clip
also clip the waveform data supplied to the math waveform.
Changes to the vertical offset setting for a channel source that clip its data
also clip the waveform data supplied to the math waveform.
Changes to the acquisition mode globally affects all input channel sources,
thereby modifying any math waveforms using them. For example, with the
acquisition mode set to Envelope, a C1 + C2 math waveform will receive
enveloped channel 1 and channel 2 data and, therefore, will also be an
envelope waveform.
392
To Define a
Math Waveform
Overview
Use the procedure that follows when defining a math waveform. Remember, you
should first ensure that the sources you use exist. Channel sources will be
acquired when used in a math expression, reference waveform sources should
contain saved waveforms, and so on. These sources do not have to be displayed
to be used.
Prerequisites 1.
Display 2.
the Math
dialog box
393
Overview
Select a math 3.
waveform
Build a math 4.
expression
Apply a filter 5.
394
Overview
Apply the 6.
expression
For more 7.
information
Click the
icon in the the upper-right corner of the
Define Math dialog box, and then click any dialog-box
control to pop up help on that control.
8.
End of Procedure
Why Use?
Whats Excluded?
Use math waveform operation, such as those listed above, to enhance the
displaying, processing, and analyzing of math waveforms. For example, in
addition to the operations listed, you can save math waveforms as references and
make them the source of either of two onboard waveform data bases.
Some operations allowed on channel waveforms are not allowed on math
waveforms:
H
Independent horizontal scaling. Each math waveform that you create derives
its horizontal scale and position from the sources you include in its math
expression. Horizontal controls will not operate with math waveforms.
You can adjust these controls for the source waveforms and your adjustments
will reflect in the math waveform as the sources update. You can also
magnify math waveforms using the Mag1 or Mag2 derived time bases.
395
Keys to Using
Independent vertical offset. You cannot adjust the offset for a math waveform; you can adjust the offset of channel waveforms used as sources to a
math waveform.
Basically, you use the same techniques to work with math waveforms that work
with channel waveforms. The key points that follow describe operating
considerations to take into account when using math waveforms.
Source Considerations. In general, be aware that changes to source waveforms
that you include as math-expression operands are reflected in the math waveform. See Source Dependencies on page 392.
Display Considerations. Turn on and off the display of math waveforms like you
do channel and reference waveforms. Use the same front-panel controls
(waveform selection buttons, vertical position and scale knobs) and application
controls (waveform control bar elements at the bottom of the display; vertical
setup menu). Mouse operation for positioning waveforms on screen work also.
As is true for channel and reference waveforms, turning a math waveform on or
off in any time base display, Main, Mag1, or Mag2, also turns it on or off in all
the time bases.
396
Overview
The procedure that follows demonstrates some common operations you can
perform on math waveforms:
Prerequisites 1.
3.
397
Overview
Take automatic
measurements
6.
7.
8.
398
Overview
Take cursor
measurements
End of Procedure
For more information on taking automatic and cursor measurements of waveforms, see Measuring Waveforms on page 365.
399
3100
Sampling
module
Acquisition
system
Trigger
system
Time base
system
Signal processing
& transformation
system
Output and
storage
User Interface
and display
Why Use?
Whats Special?
Save and recall different setups to switch from setup to setup without having to
first manually record your settings and then manually set them. This capability is
helpful when you want to:
H
save and recall a setup that optimizes the instrument for displaying and
analyzing a certain signal.
3101
Commenting. The Save-Setup and the Recall-Setup dialog boxes provide for
including and viewing comments with your saved setups. That way, you can
store information, readable upon recall, that describes each setup you save and its
intended application.
Virtual Keyboarding. If you do not have a keyboard connected, you can still enter
comments and name setup files. The Save and Recall Setup dialog boxes include
the Virtual Keyboard button, shown left. When you touch or click it, the
instrument displays a virtual keyboard on screen that you can use with your
mouse or the touch screen to enter the setup-path name, setup-file name, and
comment.
Whats Excluded?
Keys to Using
User Options that are stored in the Windows Registry. These include all
options accessed by first selecting Utilities (menu bar), and then User
Preferences (Utilities menu).
Standard Masks. Standard masks are not stored with the setups. However, if
your recalled setup includes display of a mask, recalling the setup will, in
turn, display the mask. Also, masks you define are stored with the setups.
The key points that follow describe operating considerations for setting up the
saving and recalling of setups.
All Settings are Retained. The instrument includes almost all instrument settings,
with a few exceptions (such as user options) in the saved setup.
Retaining Current Settings. Recalling a setup replaces the current setup with the
recalled setup. If you do not want to lose your current setup, save it to its own
setup file for later recall before you recall the new setup.
Avoiding Setup/Waveform Mismatches. Saved setups may contain settings
inappropriate for waveforms currently in your instrument. For example, you
might have saved a setup that displayed a fiber channel mask, such as FC531, for
3102
testing channel 1. If later you display a gigabit ethernet signal in channel 1 and
recall your saved setup, the FC531 mask will display.
Avoiding Setup and Sampling Module Mismatches. Recall of a setup assumes that
that the sampling module appropriate to the recalled setup is installed. For
example, recalling a setup that saved optical vertical-control settings requires
that an optical sampling module be installed. If not, the instrument substitutes
default settings for the affected vertical controls settings instead of recalled
settings. Other examples of such mismatches include:
Recalling a setup that includes a clock-recovery setup without the appropriate clock-recovery-capable sampling module installed. You must have the
clock recovery-capable module installed in the same compartment as when
the setup was saved.
Use the procedure that follows to save a setup to the instrument hard disk, a
floppy disk, or third-party storage device.
3103
Overview
Prerequisites 1.
2.
3.
Display the 4.
Save Setup dialog box
Name a destina- 5.
tion
Use the Save in: drop-down list and buttons (see right)
to navigate to the directory in which to save your setup.
3104
The Save Setup dialog box allows for the entry of a file
name, file type, and includes a field for adding your
comments. See below.
Overview
Name your 6.
setup
Add a comment 8.
(optional)
For more 10. For more help on saving setups, click the Help button
information
in the Setup dialog box to access contextual help on
screen.
See page 3145 to learn about using online help.
End of Procedure
3105
Overview
Prerequisites 1.
Display the 2.
Recall Setup
dialog box
Name a 3.
destination
3106
Use the procedure that follows to recall a setup to the instrument. Remember that
recalling a setup replaces the existing setup, which is lost.
Control elements & resources
Use the Look in: drop down list and buttons (see right)
to navigate to the directory which contains a setup that
you want to recall.
Overview
Select your 4.
setup
5.
Recall your 7.
setup
For more 8.
information
End of Procedure
3107
Why Use?
Whats Special?
By saving a waveform, you can recall it at a later time for comparison, evaluation, and documentation. This capability is helpful when you want to:
H
Whats Excluded?
3108
You cannot recall into a channel or a math waveform. The instrument recalls
each waveform into one of the reference waveform locations (R1-R8). Also, you
cannot save and recall waveform databases.
Overview
To save a waveform
Prerequisites 1.
2.
Display the 3.
Save Waveform
dialog box
3109
Overview
Select a 4.
destination
Select your 5.
waveform(s) to
save
Select directory 6.
and name file
3110
Overview
Add a comment 7.
(optional)
Save your 8.
waveform
For more 9.
information
End of Procedure
3111
Use the procedure that follows to recall a waveform to a reference. You can only
recall waveforms into references.
NOTE. Reference waveforms do not recall because they are already instrument
resident. You can copy a reference waveform to another reference: first display
the reference to be copied, and then use the Save Waveform procedure to save it
to another reference (R1-R8).
Overview
To recall a waveform
Prerequisites 1.
3112
Overview
Name a 3.
destination
Use the Look in: drop down list and buttons (see right)
to navigate to the directory which contains a waveform
that you want to recall.
Select your 4.
waveform
View any 6.
included comment (optional)
3113
Overview
Recall your 7.
waveform
For more 8.
information
End of Procedure
3114
To Clear References
Overview
To clear a reference
Display the 1.
Clear References dialog
box
Select Refs 2.
End of Procedure
3115
Why Use?
Keys to Using
3116
Because the waveforms are exported as CSV, without timing and scaling
information, the instrument does not import these waveforms directly. If you
intend to recall a waveform later, save it (see the procedure To Save Your
Waveform on page 3109) instead of exporting it. You cannot import
histograms.
You may also choose to copy a waveform and paste directly into some
applications such as Microsoft Word or Excel. If so, select your waveform,
and then select Copy in the Edit menu.
Select Export Waveform from the the File menu instead of Save waveform.
The Export dialog box displays (see Figure 325 that follows).
Use the process just described for exporting a waveform on page 3116, select
the Histogram button in the Export dialog box (see Figure 325). Also skip
selecting a source. The instrument supports a single histogram, so the current
histogram is automatically selected. If no histogram is enabled in the Hist Setup
dialog box, the Histogram button will be disabled in the Export dialog box.
To Use an Exported
Waveform (or Histogram)
How you use the exported waveform or histogram depends on your application.
The following example is a simple application using a waveform; the procedure
is general and may require adapting for your spreadsheet or other data-analysis
tool.
Overview
Prerequisites 1.
2.
3117
Overview
Import the 3.
waveform data
4.
Begin your 5.
chart
6.
3118
Overview
Specify a 7.
line-graph
chart
Finish the 8.
chart
For more 9.
information
End of Procedure
3119
Printing Waveforms
You can print the display screen, including any waveforms displayed. Before
doing so, you must install and set up your printer. Consult the instructions that
come with your printer. Also for printer setup instructions, you can display
Windows help and access its section on printers (see page 3151 for information
on accessing Window help).
To print a waveform, from the application menu bar, select the File menu, and
then select Print. The instrument displays the standard MS Windows 98 Print
dialog box shown in Figure 326. Access the windows help system for more
information.
3120
Remote Communication
Remote communication is performed through the GPIB interface. Consult the
online Programmer Guide for help with establishing remote communication and
control of the instrument.
To access the Programmer Guide, select Programmer Guide in the Help menu
from the front screen.
3121
3122
Mask Testing Waveforms, on page 3123, describes how you can use
standard or user-defined masks to set up the instrument to automatically
detect mask violations in communications and other waveforms.
Why Use?
Use mask testing to test your waveforms for time or amplitude violations. Mask
testing will count waveform samples (called hits or violations) that occur within
a specific area (the mask).
Use the communications-standard masks that this instrument provides (SONET/
SDH, Fiber Channel Optical and Electrical, Gigbit Ethernet) to test your signals,
or define your own masks.
Whats Special?
3123
Mask-Specific Autoset. You can set Autoset to either Auto or Manual in the Mask
Setup dialog box. When set to Auto, the instrument automatically performs a
standard, mask-specific autoset whenever you select a standard mask.
Whats Excluded?
GPIB editing. You can not edit masks through the programmable interface
(GPIB). You can, however, still create and/or delete entire masks through this
interface.
Concurrent Mask Tests. Only one mask standard (or user defined set) is active at
any time. If you have a mask selected/enabled and then select a new mask, the
new mask replaces the previous mask. You cannot test to multiple standards
simultaneously.
Keys to Using
The key points that describe operating considerations for using and editing
masks follow:
Mask Standards and Masks. A mask standard contains one or more masks that,
when applied against the waveforms for which they are intended, test the
waveform for violations of an industry standard. The supported standards are
listed in Table 39.
Masks are numbered polygons that define an area within a mask standard (or
within a user mask) in which to count waveform samples as hits.
Table 39: Standard masks
3124
SONET/SDH
Fiber channel
Other
OC1/STM0
51.84 Mb/s
Gigabit Ethernet
OC9
466.56 Mb/s
OC18
933.12 Mb/s
OC24
1244.2 Mb/s
OC36
1866.2 Mb/s
OC48/STM16
2488.3 Mb/s
Fiber channel
Other
OC192/STM64
FEC1066
OC768
FEC4266
9953 Mb/s1 and 10.66 Gb/s
1
Mask Counts. The instrument lists statistics for each mask (polygon) in the
enabled standard (or user) in the Mask readout on the right side of the instrument
screen. Each mask is listed by its number, with its count of hits, the number of
hits common to all masks, and the total count of waveforms acquired.
Mask Editing. Masks can be edited, in which case they become a User mask.
Some tips on creating and using masks follow:
H
When editing, locate one point along the left edge or right edge of the mask
further left or further right than any other point. You can still create straight
lines along the edge; just place one point further left of right than the others
on the edge.
The vertices numbers increase according to their order from left to right. The
instrument reassigns numbers to vertices during mask creation or editing to
hold to this rule.
When adding new points to a mask, the instrument determines their location
in the mask as follows (see Figure 327):
a. Defines an imaginary line between the leftmost vertex and rightmost
vertex in the mask.
b. Defines all points above the imaginary line as the top of the mask; all
points below as the bottom of the mask.
c. Inserts new user-added points above the imaginary line into the top of
the mask; inserts new user-added points below the imaginary line into
the bottom.
To create a mask with a concave area, create several masks to cover the same
area. Data falling into two overlapping masks is counted only once as part of
the total mask hits.
3125
Left-most point
Right-most point
3126
Overview
Masks are saved with setups, so you can save sets of masks by defining
them, and then storing the instrument setup. Displayed masks are overwritten when you recall a stored setup, select a standard mask, or initialize the
instrument.
Use the procedure that follow to set up the instrument to mask test a waveform
against a mask standard or user defined mask set.
Prerequisites 1.
3127
Overview
5.
You can use the color pulldown list to change the color
of the selected masks on screen.
7.
3128
Overview
10. In the Acq Setup dialog box (see right), check the
Condition option under Stop After.
11. In the Condition pulldown list, select a maskrelated
criteria, such as Mask Total Hits and set a count, such
as 1, in the count box.
These settings will stop acquisition when mask
violations satisfy the criteria you set here. See below.
12. Push the RUN/STOP front-panel button to restart
acquisition, if stopped.
Restart testing 13. To restart after a Stop After condition occurs, push the
front-panel CLEAR DATA front-panel button.
Tip. If you want to acquire one, and only one, more
waveform after the Stop After condition occurs, push
the RUN/STOP front-panel button instead of CLEAR
DATA.
3129
To Edit a Mask
Overview
When you edit a mask in an existing communications standard, the mask type
switches from the selected standard to type User, and uses the masks from the
Standard as a basis for editing. Use the procedure that follows.
To edit a mask
Prerequisites 1.
Select a mask 2.
Open Mask 3.
Edit dialog box
3130
Note: The Mask Setup dialog box and Mask Edit dialog
box are both within the Mask tab. Use the Edit Mask
and End Mask Edit buttons to toggle back and forth
between the two Mask dialog boxes.
Overview
Select a 4.
mask to edit
6.
7.
8.
9.
Click End Mask Edit to close the Mask Edit dialog box
and return to the Mask Setup dialog box.
End of Procedure
3131
Counting Masks
Mask-counting statistics are displayed in the mask readout at the right-side of the
display. Mask counting statistics are displayed as soon as you enable a mask, and
stay visible even if the mask isnt displayed on screen.
Mask (n): Each mask in the standard is listed by number (Mask 1 for
example) along side the number of hits in that mask.
To zero the counts for all masks, click Clear in the Mask Setup dialog box.
NOTE. Executing Clear will clear not only the mask counts, but also the
underlying waveform data. For example, if mask testing on a waveform database
the database data is cleared and accumulation is restarted, and if mask testing
on a waveform being averaged or enveloped, Clear restarts the averaging or
enveloping.
3132
Masks are created by connecting the points independently of the order they are
entered. Points are connected by sorting the points in left-to-right order and
grouping them across a diagonal from the left-most point to the right-most point.
If two points share the same horizontal position along either the left or right edge
of the mask, then the diagonal runs from the top left-most point to the bottom
right-most point. Points below the diagonal form the bottom boundary of the
mask; points above it form the top boundary.
Use the procedure that follows to create a mask from scratch:
Overview
Prerequisites 1.
Create a 3.
new mask
4.
5.
6.
Click End Mask Edit when you are finished creating your
mask to apply all additions/changes and return to the Mask
Setup dialog box.
7.
3133
End of Procedure
Taking Histograms
The instrument can display histograms constructed of waveform data. You can
display both vertical (voltage) and horizontal (time) histograms, but only one at a
time.
Histogram Box
Histogram Readout
Histogram
Why Use?
Whats Special?
3134
Continuous Operation. The histogram you set up can run and its results be
displayed even if you turn off display of the histogram or of the waveform
selected as its source. Histogram data is continuously accumulated and displayed
until you explicitly turn it off or clear the waveform data of the histogram source.
Whats Excluded?
Histograms longer than 500 bins. Histograms are limited to the on screen
resolution, limiting horizontal sizes of 500 bins.
Multiple histograms. One histogram can be displayed on one source at a time.
The source can be any waveform in any of the three Views, Main, Mag1, or
Mag2.
Keys to Using
Histograms
The key points that follow describe operating considerations for setting up the
histograms so that they best support your data-analysis tasks.
Histogram Counting Stays On. Once you check Enable Histogram in the
Histogram Setup dialog, histogram counting starts and continues until you turn
disable the histogram or clear the histogram counts. If the histogram is not
displayed on the graticule but histogram statistics still appear on the display,
histogram counting is still running.
NOTE. Histogram counts are cleared when push Clear button in the Hist Setup
dialog box or when you push CLEAR DATA on the front panel. Also, changing
any acquisition control will implicitly clear all acquired data and the histogram
count as well.
Histogram Size. The maximum vertical histogram size is 400 bins. The maximum
horizontal size is 500 bins.
Recalling Setups. The histogram state is restored to what it was when the setup
was saved.
3135
To Take a Histogram
Overview
Use the procedure that follows to quickly take a measurement based on the
default settings for histograms.
To take a histogram
Prerequisites 1.
The instrument must have at least one waveform displayed to access the Hist Setup dialog box.
Access the 2.
histogram
5.
6.
7.
3136
Overview
9.
10. Select Logarithmic to display histogram data logarithmically. Bin counts are scaled logarithmically. Logarithmic
scaling provides better visual details for bins with low
counts.
Set histogram limit 11. Use the Top, Bottom, Left, and Right boxes to set the
controls
size and location of the histogram box. The histogram
box selects the section of the waveform used for
histograms.
12. Select Absolute to use units based on the source
waveform. Select % to display the histogram box as a
percentage of the graticule. This display setting
considers the top-left corner of the graticule to be 0,0
and the bottom-right corner to be 100,100.
Tip. It is quicker to use the mouse or touchscreen to
drag to size the histogram box on screen, then fine tune
the values if needed with the Limit Controls.
End of Procedure
3137
Histogram
Statistics
After you check Enable Histogram in the Histogram Setup dialog box, histogram
statistics appear on the right-hand side of the screen. The following table is a list
of the available histogram statistics and a brief description of each.
Table 310: Histogram statistics
3138
Name
Description
Mean
The average of all acquired points within (or on) the histogram
box.
Median
Half of all acquired points within (or on) the histogram box are less
than and half are greater than this value.
Standard Deviation
Peak-to-Peak (Pk-Pk)
Mean"1 StdDev(m"1s)
Mean"2 StdDev(m"2s)
Mean"3 StdDev(m"3s)
Peak Hits
# of Histogram Hits
# of Waveforms
Why Use?
Whats Special?
Whats Excluded?
To emphasize the data that occurs less frequently, you can toggle the Invert
Color/Intensity control in the Waveform Database setup dialog box, which
reverses the intensity/color assignments to each pixel in the database display.
There are only two waveform databases; you can explicitly assign and
reassign Database1 and Database2 to waveform sources in the Wfm
Database dialog box.
Once the two databases are allocated, the only way to assign a new
waveform is to change the waveform source of Database1 or Database2 in
the same dialog box, which releases its existing source.
3139
NOTE. The above exclusion does not mean that a waveform database cannot be
used by multiple systems or features. For example, you can use the same
database as the source for a histogram, an automatic measurement, and a mask
test.
Interpolation or vector displays. Waveform database accumulation is always a dot
mode accumulation; therefore, no interpolation or vectoring is performed.
Keys to Using
The key points that follow describe operating considerations for setting up a
waveform database.
Dimensions. Waveform database dimensions match those of the database source
and are described as follows:
H
Vertical (rows): Always 402 rows, which is the maximum vertical graticule
size plus one row each for overrange (OR) and underrange (UR). Rows are
in vertical units that match the vertical units of the source.
Display. When you assign a waveform database to a waveform source (using the
Waveform Database Setup dialog box) you must explicitly turn on the waveform
database display if you wish to see it on screen; otherwise, the waveform source
displays using the default (vector) display. The waveform database still
accumulates in the background and can be turned on later without clearing the
database.
3140
To Set Up
a Waveform Database
Overview
Prerequisites 1.
4.
5.
End of Procedure
3141
As you can see in the illustrations below, the normal vector view of a waveform
displays the waveform data in dot mode: the waveform display is updated with
each acquisition to reflect the current data. In Fig 331, waveform database
display has been turned on and you can see the waveform data accumulation is
displayed all at once, with subsequent acquisition data being added to the
display as it is acquired.
3142
To Customize the
Database Display
Overview
To change the display options of waveform database data on the graticule, use
the procedure that follows:
Prerequisites 1.
Access the 2.
Wfm Database
Setup dialog box
Examples 4.
3143
Figure 332: Waveform database data using the Intensity display option
End of Procedure
3144
Whats Available?
The instrument provides the following help resources online:
Why Use?
Keys to Using
Tool tips
Overview Help
Programmers Guide
Use online help as your primary, always-on-hand, user information source for
this instrument. Most of the information you need to operate this instrument and
use it effectively is found in the online help, where you can quickly access it and
display on your instrument screen.
The key points that describe operating considerations for using the online and
other documentation for this instrument follow:
H
Use online help when you want to minimize interruption to your work flow.
Often a tool tip or Whats This? Help, each of which pop up brief information in a bubble displayed on screen, gives you enough support to continue
your setup. Overview help is there when you need to probe more deeply into
feature operation.
Use the manuals to read instructions on putting the instrument into service,
procedures on reinstalling its product software, listings of specifications, and
overviews of features and their operation. See Documentation Map on page
22 for an description of the documents for this instrument and their
purposes.
3145
Prerequisites 1.
H
For a brief 2.
description of
controls
For a more 3.
robust
cescription
4.
3146
Overview
For in depth, 5.
contextual
overviews
3147
Overview
To dig deeper 6.
3148
7.
From the online help finder (see below), choose from the
three tabs.
8.
Overview
For instruction 9.
procedures
3149
Overview
To enable full- 11. If you cannot find the information in the Contents or
text search
Index tabs of the online finder, you may want to enable
full text search: From the application menu bar, select
Help, and then select Contents & Index. See right.
12. From the online help finder (see below), choose the
Find tab.
3150
Overview
To Access Op- 14. Click the minimize button to reduce the User Interface
erating System
Application to an icon on the operating system
Help
toolbar. See upper right.
15. Click the Start button to pop up the Start menu, and
then select Help from the menu. See lower right. The
online help for the Windows operating system
displays.
16. When your done with the online help, you can dismiss
it. To restore the user interface application to the
screen, click its icon in the tool bar.
Tip. To switch between online help and the
application, you can hold down the ALT key while you
press Tab repeatedly to alternate between bringing
help to the front and the application.
Click for
Windows 98
Help
End of Procedure
3151
3152
Exterior Cleaning
CAUTION. To prevent getting moisture inside the instrument during external
cleaning, use only enough liquid to dampen the cloth or applicator.
Clean the exterior surfaces of the chassis with a dry lint-free cloth or a softbristle brush. If any dirt remains, use a cloth or swab dipped in a 75% isopropyl
alcohol solution. Use a swab to clean narrow spaces around controls and
connectors. Do not use abrasive compounds on any part of the chassis that may
damage the chassis.
Clean the On/Standby switch using a dampened cleaning towel. Do not spray or
wet the switch directly.
CAUTION. Avoid the use of chemical cleaning agents which might damage the
plastics used in this instrument. Use a 75% isopropyl alcohol solution as a
cleaner and wipe with a clean cloth dampened with deionized water. (Use only
deionized water when cleaning the menu buttons or front-panel buttons.) Before
using any other type of cleaner, consult your Tektronix Service Center or
representative.
3153
CAUTION. Improper cleaning agents or methods can damage the flat panel
display.
Avoid using abrasive cleaners or commercial glass cleaners to clean the display
surface.
Avoid spraying liquids directly on the display surface.
Avoid scrubbing the display with excessive force.
Clean the flat panel display surface by gently rubbing the display with a
clean-room wipe (such as Wypall Medium Duty Wipes, #05701, available from
Kimberly-Clark Corporation).
If the display is very dirty, moisten the wipe with distilled water or a 75%
isopropyl alcohol solution and gently rub the display surface. Avoid using excess
force or you may damage the plastic display surface.
3154
Appendix A: Specifications
NOTE. This specification is for the instrument; there are also specifications
associated with the optical and electrical modules. Please refer to the user
manual that shipped with your module for those specifications.
This appendix contains the specifications for the CSA8000 Communications Signal Analyzer, and the TDS8000 Digital Sampling Oscilloscope. All
specifications are guaranteed unless noted as typical. Typical specifications are
provided for your convenience but are not guaranteed. Specifications that are
marked with the n symbol are checked in Performance Verification chapter of
the service manual, an optional accessory.
All specifications apply to the instrument and sampling modules. unless noted
otherwise. To meet specifications, three conditions must first be met:
H
The instrument must have been calibrated/adjusted at an ambient temperature between +20_ C and +30_ C.
The instrument must have been operating continuously for 20 minutes within
the operating temperature range specified.
Characteristics
Number of input
channels
A1
Appendix A: Specifications
Characteristics
A2
Description
Characteristics
Sampling rate
Record length1
Horizontal scale
range
1 ps/div
1000
2 ps/div
2000
4 ps/div
4000
Horizontal position
range
50 ms maximum.
Horizontal resolution
10 fs minimum
Horizontal position
setting resolution
1 ps minimum
Horizontal modes
20 ps/div
1 ps + 1% of interval
21 ps/div
8 ps + 0.1% of interval
Appendix A: Specifications
Characteristics
Horizontal deskew
range and resolution
Range
20 ps/div
1 ps + 1% of interval
21 ps/div
8 ps + 0.01% of interval
Characteristics
Trigger sources
Auto/normal mode
Slope + or select
Metastability Reject
On/Off select
A3
Appendix A: Specifications
Characteristics
A4
1 Vpp
n External direct
trigger sensitivity3
External direct
trigger sensitivity
1 mV
n External direct
trigger level accuracy
50 mV + 0.10 x level
n External direct
trigger delay jitter,
short term optimized
mode
n External direct
delay jitter, locked to
internal 10 MHz reference mode
Appendix A: Specifications
Characteristics
External prescaled
trigger capabilities
External prescaled
trigger input characteristics
External prescaled
trigger absolute maximum input
2.5 Vpp
n External prescaled
trigger
r er sensitivity
e
Sensitivity
2-3 GHz
800 mVpp
3- GHz
G z
3-10
6 mV
m pp
600
External prescaled
r er sensitivity
e
trigger
(typ-ical)
Frequency range
Sensitivity
10-12.5 GHz
n External prescaled
trigger delay jitter,
Short term optimized
mode
External prescaled
trigger delay jitter,
Short term optimized
mode (Typical)
n External prescaled
delay jitter, locked to
internal 10 MHz reference mode
External prescaled
delay jitter, locked to
internal 10 MHz reference mode (Typical)
External prescaled
trigger metastability
A5
Appendix A: Specifications
Characteristics
Rate selectable at 25, 50, 100, and 200 kHz internally and is provided
to the trigger, to the TDR stimulus drives in small sampling module
interfaces, and to the Internal Clock Out connector on the front panel.
The input resistance at the external direct trigger input and the maximum input
voltage.
Section 4.10.2 in IEEE standard number 1057. The minimum signal levels required
for stable edge triggering of an acquisition.
Characteristics
Dynamics
Atmospherics
Temperature:
Operating:
0 C to +40 C
0 C to +35 C for 80E0X modules on Tektronix part number
012-1569-00 2-meter extender
Nonoperating:
22 C to +60 C
Relative humidity:
Operating: 20% to 80%, with a maximum wet bulb temperature
of 29 C at or below +50 C (upper limits derates to 25% relative
humidity at +50 C, non-condensing)
Nonoperating (no floppy disk in floppy drive): 5% to 90%, with a
maximum wet bulb temperature of 29 C at or below +60 C (upper
limits derates to 20% relative humidity at +60 C, non-condensing)
Altitude:
Operating: 3,048 m (10,000 ft.)
Nonoperating: 12,190 m (40,000 ft.)
A6
Appendix A: Specifications
Characteristics
Power requirements
600 watts
Cooling requirements
Characteristics
Display type
Display resolution
Pixel pitch
Characteristics
Video outputs
Parallel port
(IEEE 1284)
Serial port
A7
Appendix A: Specifications
Characteristics
LAN interface
USB interface
GPIB interface
DC calibration output
External 10 MHz
reference input
5 V maximum
A8
Specifications
Characteristics
3.5 in floppy disk, 1.44 Mbyte, compatable with DOS 3.3, or later,
format for storing reference waveforms, image files, and instrument
setups.
w 6 Gbytes
Appendix A: Specifications
Characteristics
Construction material
Weight
Overall Dimensions
Overall Dimensions,
packaged product
Certifications
Table A9: Certifications and compliances
Category
Standards or description
EC Declaration of Conformity
EMC
Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility when configured with
sampling head modules designed for use with this instrument as identified in this manual.
Compliance was demonstrated to the following specifications as listed in the Official Journal of the
European Union:
EN 61326
A9
Appendix A: Specifications
Standards or description
Class A Radiated and Conducted Emissions
IEC 1000-4-2
Performance Criterion B1,2
IEC 1000-4-3
Performance Criterion A1
IEC 1000-4-4
Performance Criterion B1
IEC 1000-4-5
Performance Criterion B1
IEC 1000-4-6
Performance Criterion A1
IEC 1000-4-11
Performance Criterion B1
1
Performance Criteria C for USB keyboard and mouse. Note that operation of the
USB keyboard and mouse can be restored by unplugging and then
reconnecting the USB connector at the rear panel of the main instrument.
EN 61000-3-2
AC Power Harmonic Current Emissions
Radiated emissions may exceed the levels specified in EN 61326 when this instrument is connected
to a test object.
Australia/New Zealand
Declaration of Conformity
EMC
General EMC
To ensure compliance with EMC requirements, only high quality shielded cables having a reliable,
continuous outer shield (braid & foil) with full coverage, low impedance connections to shielded
connector housings at both ends should be connected to this product.
EC Declaration of Conformity
Low Voltage
Compliance was demonstrated to the following specification as listed in the Official Journal of the
European Union:
Low Voltage Directive 73/23/EEC, amended by 93/69/EEC
EN 61010-1/A2:1995
UL3111-1
Canadian Certification,
mainframe
A10
Appendix A: Specifications
Standards or description
Installation (Overvoltage)
Category
Terminals on this product may have different installation (overvoltage) category designations. The
installation categories are:
Pollution Degree
CAT III
CAT II
Local-level mains (wall sockets). Equipment at this level includes appliances, portable
tools, and similar products. Equipment is usually cord-connected.
CAT I
A measure of the contaminates that could occur in the environment around and within a product.
Typically the internal environment inside a product is considered to be the same as the external.
Products should be used only in the environment for which they are rated.
Pollution Degree 1
Pollution Degree 2
Pollution Degree 3
Pollution Degree 4
Safety Class
Overvoltage Category
Pollution Degree
Pollution Degree 2 (as defined in IEC 1010-1). Note: Rated for indoor use only.
A11
Appendix A: Specifications
A12
Amplitude Measurements
Table B1: Supported amplitude measurements
Name
Amplitude measurement. The AC RMS valued measured over the entire waveform or
gated region.
Sqrt
Amplitude
Sxdy X
2
Amplitude measurement. The high value less the low value measured over the entire
waveform or gated region.
Amplitude = HighLow
Cycle Mean
Amplitude measurement. The arithmetic mean over the first cycle in the waveform or
the first cycle in the gated region.
Cycle RMS
Amplitude measurement. The true RMS voltage over the first cycle in the waveform
or the first cycle in the gated region.
Gain
Amplitude source 2
Amplitude source 1
High
Amplitude measurement. The value used as 100% whenever High Ref, Mid Ref, and
Low Ref values are needed (as in fall time and rise time measurements). Calculated using
either the min/max or the histogram mean or mode method. See High/Low Method on
page 369. Measured over the entire waveform or gated region.
Mid
Amplitude measurement. The midpoint level between the 0% and 00% amplitude
levels. Measured over the entire waveform or gated region.
Mid +
High ) Low
2
B1
Amplitude measurement. The value used as 0% whenever High Ref, Mid Ref, and
Low Ref values are needed (as in fall time and rise time measurements). May be
calculated using either the min/max or the histogram mean or mode method. See
High/Low Method on page 369. Measured over the entire waveform or gated region.
Maximum
Amplitude measurement. The maximum amplitude. Typically the most positive peak
voltage. Measured over the entire waveform or gated region.
Mean
Amplitude measurement. The arithmetic mean over the entire waveform or gated
region.
Minimum
Amplitude measurement. The minimum amplitude. Typically the most negative peak
voltage. Measured over the entire waveform or gated region.
Negative Overshoot
100%
Peak to Peak
Positive Overshoot
RMS
MaxHigh
Amplitude
100%
Amplitude measurement. The true RMS voltage over the entire waveform or gated
region.
Area Measurements
Table B2: Supported area measurements
Name
Area measurement. The area over the entire waveform or gated region in vertical units over
horizontal units, such as volt-seconds and watt-seconds. Area measured above ground is
positive; area below ground is negative. Algorithm follows:
if Start = End then return the (interpolated) value at Start.
Otherwise,
Area =
Cycle Area
B2
End
Waveform(t)dt
Start
Area measurement. The area over the first cycle in the waveform, or the first cycle in
the gated region, vertical units over horizontal units, such as volt-seconds and
watt-seconds. Area measured above ground is positive; area below ground is negative.
Crossing %
Eye pattern/optical measurement. The peak-to-peak time variation of the 1st eye
crossing measured at the MidRef as a percent of the eye period.
DCD (sec) = 100% x TDCDpp /(TCross2mean TCross2mean )
Extinction Ratio
Extinction Ratio %
Extinction Ratio dB
Eye Height
Eye Width
Jitter RMS
Eye pattern/optical measurement. The RMS value of the edge jitter in the current
horizontal units.1
Jitter RMS = TCross1sigma
Jitter PkPk
Eye pattern/optical measurement. The peak-to-peak value for the edge jitter in the
current horizontal units.1
Jitter PP = TCross1PP
B3
Eye pattern/optical measurement. The peak-to-peak value of the noise of the top or
base of the signal as specified by the user. 1
Noise PkPk = PToppkpk or PBasepkpk
Noise RMS
Eye pattern/optical measurement. The RMS value of the noise of the top or base of
the signal as specified by the user.1
Noise RMS = PTopsigma or PBasesigma
Quality Factor
S/N Ratio
Eye pattern/optical measurement. Ratio of the signal amplitude to the noise of the
top or base of the signal as specified by the user.1
S/N Ratio = (PTop PBase)/(PTopsigma or PBasesigma )
B4
You can customize these eye/optical measurements. First, display the Meas Setup dialog box from the UI application
Setup menu. In the dialog box, select your eye pattern/optical measurement, then select the Region tab.
Then:
To choose between jitter at the eye crossing or the mid ref crossing, use the Jitter At selection to choose Eye Cross
or Mid Ref for your jitter measurement.
To choose between noise at PTop or PBase, use the Noise At selection to choose High (top) or Low (base) for your
noise measurement.
Timing Measurements
Table B4: Supported timing measurements
Name
Timing measurement. The duration of a burst. It is the time from the first midref
crossing in the burst to the last. Measured over the entire waveform or gated region.
Delay
Timing measurement. The time between the MidRef crossings of two different traces
or the gated region of the traces.
Fall Time
Timing measurement. The time taken for the falling edge of the first pulse in the
waveform or gated region to fall from a High Ref value (default = 90%) to a Low Ref
value (default =10%) of its final value.
Frequency
Timing measurement. The frequency taken for the first cycle in the waveform or in
the gated region. The reciprocal of the period. Measured in Hertz (Hz), where 1 Hz =
1 cycle per second.
Negative Crossing
Timing measurement. The distance between the trigger and the first positive crossing
of the MidRef (default 50%) amplitude point for a pulse. Measured over the first pulse
in the waveform or in the gated region.
Timing measurement. The ratio of the negative pulse width to the signal period
expressed as a percentage. Measured over the first cycle in the waveform or in the
gated region.
NegativeDutyCycle +
NegativeWidth
Period
100%
Negative Width
Timing measurement. Time of the first pulse in the waveform or in the gated region.
Distance (time) between MidRef (default 50%) amplitude points of a negative pulse.
Period
Timing measurement. Time it takes for the first complete signal cycle to complete in
the waveform or in the gated region. The reciprocal of frequency. Measured in
seconds.
Phase
Timing measurement. The amount one waveform leads or lags another in time.
Expressed in degrees, where 360_ comprise one waveform cycle.
Positive Crossing
Timing measurement. The distance between the trigger and the first positive crossing
of the MidRef (default 50%) amplitude point for a pulse. Measured over the first pulse
in the waveform or in the gated region.
Timing measurement. Measured using the first cycle in the waveform or in the gated
region. The ratio of the positive pulse width to the signal period expressed as a
percentage.
PositiveDutyCycle + PositiveWidth
Period
100%
Positive Width
Timing measurement. Measured over the first pulse in the waveform or in the gated
region. The distance (time) between MidRef (default 50%) amplitude points of a
positive pulse.
Rise time
Timing measurement. Time taken for the leading edge of the first pulse in the
waveform or gated region to rise from a Low Ref value (default = 10%) to a High Ref
value (default = 90%) of its final value.
B5
High
HighRef
MidRef
LowRef
Low
B6
ments, such as the Delay and Phase measurements. You can choose how this
level is set; see Reference Levels Method on page 370.
TCross1
TCross2
PCross2
PCross1
PBase
Eye
Aperture
P Values
The P values include the mean and standard deviation of the vertical location of
PTop and PBase. These areas are used with a specified sample size to statistically measure the following values:
H
B7
1The
Eye Aperture defaults to the center 20% of the interval from TCross1
to Tcross2 but is settable from 0% to 100%. (In the Measurement Setup
dialog box first select an eye measurement, and then select the Region tab.)
T1 Values
T2 Values
DCD Values
B8
The T1 values are vertical and horizontal values associated with the leftmost
crossing point. These areas are used to establish the following directions:
H
The T2 values are vertical and horizontal values associated with the rightmost
crossing point. These areas are used to establish the following directions:
H
The DCD values are horizontal values associated with the rightmost crossing
point at 50% of the eye height. These areas are used to establish the DCDpk-pk,
the horizontal peak-to-peak deviation of the left crossing point at half the height
of the eye.
C1
C2
Glossary
Accuracy
The closeness of the indicated value to the true value.
Acquisition
The process of sampling signals from input channels, digitizing the samples
into data points, and assembling the data points into a waveform record. The
waveform record is stored in memory. The trigger marks time zero in that
process.
Active cursor
The cursor that moves when you turn the general purpose knob. It is
represented in the display by a solid line.
Active (or Selected) view
The view in multiple view displays that is currently targeted for adjustment
by the horizontal controls. The front-panel button of the active view is
always lit amber.
Aliasing
A false representation of a signal due to insufficient sampling of high
frequencies or fast transitions. A condition that occurs when a sampling
instrument digitizes at an effective sampling rate that is too slow to
reproduce the input signal. The waveform displayed on screen may have a
lower frequency than the actual input signal.
Annotations
Lines displayed on screen to indicate measurement reference levels and
points that an automatic measurement is using to derive the measurement
value.
Attenuation
The degree the amplitude of a signal is reduced when it passes through an
attenuating device such as a probe or an external attenuator. That is, the ratio
of the input measure to the output measure. For example, a 10X attenuator
will attenuate, or reduce, the input voltage of a signal by a factor of 10.
Automatic measurement
An automatic measurement of a parameter and its numeric readout that the
instrument takes and updates directly from a channel, math, or reference
waveform in real time, without operator intervention.
Automatic trigger mode
A trigger mode that causes the instrument to automatically acquire if
triggerable events are not detected within a specified time period.
Glossary1
Glossary
Autoset
A function of the instrument that attempts to automatically produce a stable
waveform of usable size. Autoset sets up the acquisition controls based on the
characteristics of the selected waveform. A successful autoset will produce a
coherent and stable waveform display.
Average acquisition mode
In this mode, the instrument displays and updates a waveform that is the
averaged result of several waveform acquisitions. Averaging reduces the
apparent noise. The instrument acquires data as in sample mode and then
averages it a user-specified number of averages.
Bandwidth
The highest frequency signal the instrument can acquire with no more than
3 dB ( .707) attenuation of the original (reference) signal.
BER
An acronym for Bit Error Ratio (or Rate). The principal measure of quality
of a digital transmission system. BER is defined as:
BER = Number of Errors/Total Number of Bits
BER is usually expressed as a negative exponent. For example, a BER of
107 means that 1 bit out of 107 bits is in error.
BER floor
A limiting of the bit-error-ratio in a digital system as a function of received
power due to the presence of signal degradation mechanisms or noise.
Bit error
An incorrect bit. Also known as a coding violation.
Channel
An input that connects a signal or attaches a network or transmission line to
sampling modules for acquisition of channel waveforms by the instrument.
Channel/Probe deskew
A relative time delay that is settable for a channel. Setting deskew lets you
align signals to compensate for signals that may come in from cables of
differing length.
Channel icon
The indicator on the left side of the display that points to the position around
which the waveform contracts or expands when vertical scale is changed.
This position is ground when offset is set to 0 V; otherwise, it is ground plus
offset.
Channel number
The number assigned to a specific signal input channel of an installed
Glossary2
Glossary
Glossary3
Glossary
Error detection
Checking for errors in data transmission. A calculation is made on the data
being sent and the results are sent along with it. The receiving station then
performs the same calculation and compares its results with those sent. Each
data signal conforms to specific rules of construction so that departures from
this construction in the received signals can be detected. Any data detected
as being in error is either deleted from the data delivered to the destination,
with or without an indication that such deletion has taken place, or delivered
to the destination together with an indication that it is in error.
Error rate
The ratio of the number of data units in error to the total number of data
units.
Edge trigger
Triggering occurs when the instrument detects the source passing through a
specified voltage level in a specified direction (the trigger slope). This
instrument supports only edge triggering. All trigger sources must be
external, except when using clock recovery (available as an option with
optical sampling modules) or the internal clock.
Envelope acquisition mode
A mode in which the instrument acquires and displays a waveform that
shows the variation extremes of several acquisitions.
Equivalent-time sampling (ET)
A sampling mode in which the instrument acquires signals over many
repetitions of the event. This instrument uses a type of equivalent-time
sampling called sequential equivalent-time sampling. See Sequential
equivalent-time sampling.
Gated measurements
A feature that lets you limit automated measurements to a specified portion
of the waveform. You define the area of interest using measurement gates.
General-purpose knob
The large front-panel knob on the upper-right corner of the front panel. You
can use it to change the value of the control or element that currently has
focus. It can adjust the cursors.
GPIB (General Purpose Interface Bus)
An interconnection bus and protocol that allows you to connect multiple
instruments in a network under the control of a controller. Also known as
IEEE 488 bus. It transfers data with eight parallel data lines, five control
lines, and three handshake lines.
Graticule
A grid on the display screen that creates the horizontal and vertical axes. You
can use it to visually measure waveform parameters.
Glossary4
Glossary
Graticule labels
Each graticule displays three labels. The upper and lower left labels indicate
the amplitude level at each of the upper and lower boundaries of the graticule
edges. These levels are based on the vertical scale and offset of the selected
waveform. The lower right label is horizontal scale factor of the selected
waveform expressed in units per division.
High
The value used as the 100% level in amplitude measurements, such as Peak
and +Overshoot. See Levels Used in Taking Amplitude, Timing, and Area
Measurements on page B6 for more details.
HighRef
The waveform high reference level, used in such measurements as fall time
and rise time. Typically set to 90%. See Levels Used in Amplitude, Timing,
and Area Measurements on page B6 for more details.
Holdoff, trigger
A specified amount of time after a trigger signal that elapses before the
trigger circuit will accept another trigger signal. Trigger holdoff helps ensure
a stable display.
Horizontal Acquisition Window
A common time window or range that is applied to all channels in parallel to
determine the segment of an incoming signal that becomes the waveform
record. Trigger and horizontal controls determine the duration of this
window and its placement in the incoming signal.
Horizontal bar cursors
The two horizontal bars that you position to measure the amplitude
parameters of a waveform. The instrument displays the value of both cursors
with respect to ground and the amplitude value between the bars.
Horizontal delay time
The time between the trigger event and the acquisition of data. The time is
set indirectly by the Horizontal reference setting and the horizontal position
settings. See Horizontal Position and the Horizontal Reference on
page 353.
Horizontal reference point
The point about which waveforms are expanded or contracted horizontally
when horizontal scale adjustments are made. The horizontal reference point
remains anchored as the rest of the waveform grows or shrinks around it.
Interpolation
The way the instrument calculates additional values to display when the
acquired record length is less than 500 points. The instrument has two
interpolation options: linear or sin(x)/x interpolation.
Glossary5
Glossary
Glossary6
Glossary
Measurement updating
The process of automatically adjusting the measurement parameters to reflect
changes in the waveform targeted by an automatic measurement.
MidRef
The waveform middle reference level used in such measurements as Period
and Duty Cycle. Typically set to 50%. See Levels Used in Taking Amplitude,
Timing, and Area Measurements on page B6 for more details.
Mid2Ref
The middle reference level for a second waveform (or the second middle
reference of the same waveform). Used in two waveform time measurements, such as the Delay and Phase measurements. See Levels Used in
Taking Amplitude, Timing, and Area Measurements on page B6 for more
details.
Persistence
The amount of time a data point remains displayed. There are three
persistence modes available in the instrument: Variable, Infinite, and Color
Grading.
Pixel
A visible point on the display. The instrument display is 640 pixels wide by
480 pixels high.
Pop-up menu
A menu that displays when you right click an application element, such as a
channel or its icon, a measurement or other readout. Usually provides quick
access to settings related to the object clicked.
Probe
An instrument input device.
Quantizing
The process of converting an analog input that has been sampled, such as a
voltage, to a digital value.
Real-time sampling
An alternate sampling mode where the instrument samples to completely fill
a waveform record from a single trigger event. This instrument does not use
real time sampling; it samples sequentially. See Sequential equivalent-time
sampling on page Glossary8.
Record length
The specified number of samples in a waveform.
Reference memory
Memory in an instrument used to store waveforms or settings. You can use
that waveform data later for processing. The instrument saves the data even
when the instrument is turned off or unplugged.
Glossary7
Glossary
Reference waveforms
Waveforms that are static, not live (see live waveforms). Reference
waveforms are channel or math waveforms that you save to references or to
files in the instrument file system. Once saved, they do not update.
Sample acquisition mode
The instrument creates a record point by saving the first sample during each
acquisition interval. That is the default mode of the acquisition.
Sample interval
The time interval between successive samples in a time base display. The
time interval between successive samples represents equivalent time, not real
time.
Sampling
The process of capturing an analog input, such as a voltage, at a discrete
point in time and holding it constant so that it can be quantized.
Select button
A button that changes which of the two cursors is active.
Selected waveform
The waveform which is affected by vertical position and scale adjustments.
One of the channel selector buttons lights amber to indicate the currently
selected waveform.
Sequential equivalent-time sampling
A type of equivalent-time sampling in which one sample is taken per
acquisition, with each sample skewed incrementally with respect to an
external trigger event. This instrument acquires using sequential equivalenttime sampling.
Saved waveform
A collection of sampled points that constitute a single waveform that is
saved in any one on reference locations R1 - R8 or to the file system.
Slope
The direction at a point on a waveform. You can calculate the direction by
computing the sign of the ratio of change in the vertical quantity (Y) to the
change in the horizontal quantity. The two values are rising and falling.
Time base
The set of parameters that let you define the time and horizontal axis
attributes of a waveform View. The time base determines when and how long
to acquire record points.
Trigger
An event that marks time zero in the waveform record. It results in acquisition of the waveform as specified by the time base.
Glossary8
Glossary
Trigger level
The vertical level the trigger signal must cross to generate a trigger (on edge
trigger mode).
Uptime
The number of hours the instrument has been powered on.
Vertical bar cursors
The two vertical bars you position to measure the time parameter of a
waveform record. The instrument displays the value of both cursors with
respect to the trigger and the time value between the bars.
Vertical Acquisition Window
The range of values the acquisition system can acquire. The maximum
vertical size is set by the operating range of the sampling module installed,
and that of any probe installed on the sampling module. For example, an
80E00 sampling module set to its maximum 100mV/div scale yields a
10-division vertical acquisition window of 1V.
The vertical offset determines where in the operating range of the A/D
converter (sampler) is the signal positioned relative to ground. Changing
vertical position will simply change the space on the screen where the data is
displayed.
View
Any one of the three waveform displays the instrument provides: Main,
Mag1, and Mag2. Each view has its own graticule and time base. The
instrument always displays the Main view; the Mag1 and Mag2 views can be
added and removed from the display using the View buttons on the front
panel.
Virtual keypad
A pop-up pad that lets you enter specific numeric values for the control from
which it is popped up.
Virtual keyboard
A pop-up keyboard that lets you click to type characters for the control from
which it is opened, such as in the vertical scale and offset controls found in
the Control bar at the bottom of the display.
Waveform
The visible representation of an input signal or combination of signals.
Waveforms can be channel, reference, or math waveforms.
Waveform cursors
The cursor mode that presents two cursors you position to measure both the
time and amplitude parameters if a waveform record. The instrument
displays the time of both cursors with respect to the trigger and the time
between the cursors. The instrument also displays the value of both cursors
with respect to the waveform ground and between the cursors.
Glossary9
Glossary
Waveform database
A collection of sequentially acquired waveforms.
WfmDB
See Waveform database.
Windows 98
The underlying operating system on which this instrument runs.
YT format
The conventional display format. It shows the amplitude of a waveform
record (on the vertical axis) as it varies over time (on the horizontal axis).
Glossary10
Index
Symbols
+Overshoot measurement, B2
A
AC RMS measurement, B1
Accessories
list, 135
optional, 136
standard, 135
Accuracy, Glossary1
Acquiring Waveforms, 33
Acquisition, Glossary1
cycle, 328
horizontal delay, 327
horizontal delay time with, Glossary5
how to start and stop, 325
input channels and digitizers, 326
modes for starting and stopping, 321
overview, 325
preventing aliasing, 322
record, 327
record length, 327
sample interval, 327
sampling (see Sampling), 326328
set Stop mode & action, 324
time base, Glossary8
trigger point, 327
triggering, 337
Acquisition control
background, 325
overview, 319
Acquisition controls
keys to using, 320
vs. Display controls, 352
why use, 320
Acquisition mode
Average, Glossary2
Envelope, Glossary4
Sample, Glossary8
Acquisition modes
description of, 320
how to set, 323
Acquisition settings, purpose, 320
Active cursor, Glossary1
Address, Tektronix, xv
Aliasing, 322, Glossary1
Amplitude measurement, B1
Annotations, Glossary1
Application toolbar, 3115
Area measurement, B2
Attenuation, Glossary1
Attenuators, external, use of, 36
Auto, trigger mode, 339
Automatic measurement, Glossary1
+Overshoot, B2
Overshoot, B2
AC RMS, B1
Amplitude, B1
Area, B2
Average Optical Power, B3
Burst Width, B5
Crossing %, B3
Cycle Area, B2
Cycle Mean, B1
Cycle RMS, B1
Delay, B5
Duty Cycle Distortion, B3
Extinction Ratio, B3
Extinction Ratio (%), B3
Extinction Ratio (DB), B3
Eye Height, B3
Eye Width, B3
Fall Time, B5
Frequency, B5
Gain, B1
High, B1
Jitter Pk-Pk, B3
Jitter RMS, B3
Low, B2
Maximum, B2
Mean, B2
Mid, B1
Minimum, B2
Negative Crossing, B5
Negative Duty Cycle, B5
Negative Width, B5
Noise Pk-Pk, B4
Noise RMS, B4
Peak to Peak, B2
Period, B5
Phase, B5
Positive Crossing, B5
Positive Duty Cycle, B5
Positive Width, B5
Quality Factor, B4
Rise Time, B5
Index1
Index
RMS, B2
S/N Ratio, B4
Automatic measurements, 366
amplitude category, B1
annotations, 366
area category, B2
behavior with databases, 368
categories for selection, 368
database as source requirement/exclusion, 367
databases as sources, 367
dual waveform, 368
eye pattern/optical category, B3
eyepattern and optical, 367
High and Low levels defined, B6
high/low tracking, 368
methods for, 369
how to localize (gates), 375
how to take, 372
independent characterization of, 367
levels used in taking, B6, B7
list of supported, B1
number available, 368
reference level methods, 370
reference levels defined, B6
reference levels defined (eye pattern/optical), B7
signal-type, 368
sources available, 368
statistics on, 367
usage limitations, 367
whats measured, 366
why use, 366
Automatic trigger mode, Glossary1
Autoset, 35, Glossary2
How to execute, 397
how to execute, 311
mask-specific, 3124
overview, 313
Average acquisition mode, Glossary2
Average Optical Power measurement, B3
B
Back up, procedure, 115
Bandwidth, Glossary2
Bar
Controls, 26
Measurements, 26
Menu, 26
Readouts, 26
Status, 26
Tool, 26
Waveform, 26
Index2
BER, Glossary2
BER floor, Glossary2
Bit error, Glossary2
Burst Width measurement, B5
Button, SELECT, Glossary8
C
CD, instrument software, 13
Certifications, for instrument, A9
Channel, Glossary2
icon, Glossary2
number, Glossary2
waveforms, Glossary3
Channel icon, Glossary2
Channelprobe deskew, Glossary2
Channels
in sampling modules, 326
maximum configuration, 110
shared horizontal window, 319
shared parameters, illustrated, 319
Cleaning, instrument, how to, 3153
Cleaning and inspection
exterior, 3153
flat panel display, 3153
Clipping, 36
Clock, internal, Glossary6
Clock recovery, 337
trigger source, 339
Communication, remote, 3121
Compensation, 383388
how to perform, 384
when installing/moving sampling modules, 19
Configuration
instrument, 17
maximum channels available, 110
software installation, 115
Connectors
DIRECT, 339, 341
locations and purpose, 111
PRESCALE, 339, 341
Contacting Tektronix, xv
Controls
initialize, Glossary6
knob, Glossary6
selected waveform, 37
Controls bar, 26
Coupling, Glossary3
Crossing % measurement, B3
CSA8000, description, 11
Cursor, measurements, 377379
Cursor Measurements, how to set sources for, 382
Index
Cursor measurements
how to take, 381
sources, 378
whats measured, 377
why use, 377
Cursors, 377, Glossary3
constrained by the display, 378
default measurement source, 378
horizontal bars, Glossary5
measure horizontally from the trigger point, 379
types, 378
units and readout names, 380
use with independent sources, 379
vertical bars, Glossary9
waveform, Glossary9
what time cursors measure (illustration), 380
Cycle Area measurement, B2
Cycle Mean measurement, B1
Cycle RMS measurement, B1
D
Dark-Level compensation, how to perform, 387
Data, controlling input and output, 3101
Data Input and Output, 3101
Database, waveform, Glossary10
Databases, Waveform, 3139
Delay measurement, B5
Delay time, Glossary3
horizontal, Glossary5
Description
key features, 11
product, 11
Deskew, Glossary2
how to, 386
Diagnostics
procedure, 120
system, 117
Digitizing, Glossary3
process, defined, 326328
Display
customizable attributes of, 359
defined, 348
elements of, 348
flexible control, 349
graticule, defined, 348
horizontal reference, defined, 348
horizontal scale readout, defined, 348
how to customize, 362
how to set style of, 361
limit readouts, defined, 348
mapMain & Mag views, 29
mapMain view, 28
mode
Infinite Persistence, 360
Normal, 360
Variable Persistence, 360
multiple views, 349
preview field, defined, 348
printing, 3120
keys to using, 350
system, Glossary3
time base views, defined, 348
touchscreen, defined, 349
customizing, 358
waveform, 26
why use, 349
zoom, 349
Display controls
purpose, 349
vs. Acquisition controls, 352
Display menu
Dots, 360
Vectors, 360
Display screen, overview of, 347
Display settings
Horizontal position, 353
horizontal reference, 353
Displaying waveforms, 347
Documentation
online, 21
online help system, 3145
Dots, 360
Dots, Display menu, 360
Dragging, mouse or touchscreen, Glossary3
Duty Cycle Distortion measurement, B3
E
Edge trigger, Glossary4
Electrical modules, installation, 18
Electrical sampling modules, specifications, where to
find, A1
Envelope acquisition mode, Glossary4
Environmental requirements, installation, 17
Equivalent-time sampling, random, Glossary4
Error detection, Glossary4
Error rate, Glossary4
ESD
& sampling modules, 36
and trigger source inputs, 341
Exporting waveforms, 3116
Extinction Ratio (%) measurement, B3
Extinction Ratio (DB) measurement, B3
Index3
Index
F
Fall Time measurement, B5
Fiberchannel, standards supported, 3124
Firmware, upgrade, 13
Flat panel display, cleaning, 3153
FrameScan Acquisition
keys to using, 330
usage limitations, 330
FrameScan acquisition
advantages, 329
cycle, 330
How to catch bit error, 335
how works (illustrated), 331
overview, 329
why use, 329
Envelope, usage limitations, 330
FrameScan Mode, How to acquire in, 332
Frequency measurement, B5
Front panel, map, 27
Functional tests, procedure, 123
G
Gain measurement, B1
Gated measurements, Glossary4
General purpose knob, Glossary4
Gigabit Ethernet, 3124
GPIB, Glossary4
Graticule, Glossary4
labels, Glossary5
one per view, 351
H
Hard drive, operating system reinstallation, 117
Hardware and operating system, procedure, 132
High, Glossary5
High frequency triggering, 342
High measurement, B1
High/Low tracking, 368
methods for, 369
HighRef, measurement level, Glossary5
Histograms
continuous operation of, 3135
counting, 3135
editing features, 3134
Index4
I
Incoming inspection, 119
perform compensation, 121
perform diagnostics, 120
perform hardware and operating system test, 132
perform the functional tests, 123
test equipment required by, 119
Infinite Persistence, display mode, 360
Initialize, Glossary6
Input/Output (front panel), map, 210
Input/Output (rear panel), map, 211
Inspection and cleaning
exterior, 3153
flat panel display, 3153
Index
Installation, 17
environmental requirements, 17
incoming inspection procedure, 119
sampling modules, 18
compensation requirements, 19
software installation, 115
Instrument
accessories list, 135
acquisition overview, 25
cleaning, 3153
functional model, 23
installation, 17
key features, 11
models, 11
optional accessories list, 136
options list, 135
package contents, 15
product description, 11
standard accessories list, 135
Interpolation, Glossary5
description of modes, 360
Introduction, to this manual, xiii
J
Jitter Pk-Pk measurement, B3
Jitter RMS measurement, B3
K
Keyboard, virtual, Glossary9
Keypad, virtual, Glossary9
Knob, Glossary6
general purpose, Glossary4
Trigger MAIN LEVEL, 338
L
Level, trigger, 338
Linear interpolation, 360, Glossary6
Linearity, measurement errors, 36
Live waveforms, Glossary6
Low, Glossary6
Low measurement, B2
LowRef, measurement level, Glossary6
M
Mag1 and Mag2, Views, 353
Manuals
part numbers, 135
related, xiii
Map
acquisition process, 25
documentation, 22
front panel, 27
input/output (front panel), 210
input/output (rear panel), 211
system, 23
user interface, 26
waveform display, 28
Mask testing, 3123, 3127
autoset to a mask, 3128
clearing statistics counts, 3132
count statistics, 3125
creating a user mask (figure), 3126
definition of counts (statistics), 3132
editing description, 3125
flexible features of, 3123
stopping acquisition based on, 3129
supported standards, 3124
to create a mask, 3133
to edit a mask, 3130
usage limitations, 3124
why use, 3123
Masks
Fiberchannel standards supported, 3124
Gigabit Ethernet, 3124
SONET/SDH standards supported, 3124
Math waveform
defining (overview), 389
how to define, 393
how to use, 397
operations on, 395
display considerations, 396
source considerations, 396
take automatic measurements on, 398
take cursor measurements on, 399
Math Waveforms
how to create, 391
sources for, 391
Math waveforms, Glossary6
expression syntax for, 392
overview, 389
source dependencies of, 392
time base dependencies of, 392
usage limitations, 390, 395
why use, 390
Maximum measurement, B2
Mean measurement, B2
Measurement
+Overshoot, B2
Overshoot, B2
AC RMS, B1
Index5
Index
Amplitude, B1
Area, B2
Average Optical Power, B3
Burst Width, B5
Crossing %, B3
Cycle Area, B2
Cycle Mean, B1
Cycle RMS, B1
Delay, B5
Duty Cycle Distortion, B3
Extinction Ratio, B3
Extinction Ratio (%), B3
Extinction Ratio (DB), B3
Eye Height, B3
Eye Width, B3
Fall Time, B5
Frequency, B5
Gain, B1
Gated, Glossary4
High, B1, Glossary5
Jitter Pk-Pk, B3
Jitter RMS, B3
Low, B2, Glossary6
Maximum, B2
Mean, B2
Mid, B1
Minimum, B2
Negative Crossing, B5
Negative Duty Cycle, B5
Negative Width, B5
Noise Pk-Pk, B4
Noise RMS, B4
Peak to Peak, B2
Period, B5
Phase, B5
Positive Crossing, B5
Positive Duty Cycle, B5
Positive Width, B5
Quality Factor, B4
Rise Time, B5
RMS, B2
S/N Ratio, B4
Measurement accuracy, optimizing, 383388
Measurement level
HighRef, Glossary5
LowRef, Glossary6
MidRef, Glossary7
MidRef2, Glossary7
Measurements
amplitude category, B1
area category, B2
Index6
automatic, 366
annotations, 366
databases as sources, 367
eye pattern and optical, 367
independent characterization of, 367
list of supported, B1
statistics on, 367
whats measured, 366
why use, 366
cursor, 377
sources, 378
whats measured, 377
why use, 377
cursor types, 378
cursors and the display, 378
eye pattern/optical category, B3
High and Low levels defined, B6
how to localize (gates), 375
how to set sources for cursor, 382
how to take, 372
how to take cursor, 381
levels used in taking, B6, B7
reference levels defined, B6
reference levels defined (eye pattern/optical), B7
tools for taking, 365
Measurements bar, 26
Measuring Waveforms, 365
Menu, Pop-up, Glossary7
Menu bar, 26
Metastability reject triggering, 342
Mid measurement, B1
MidRef, measurement level, Glossary7
MidRef2, measurement level, Glossary7
Minimum measurement, B2
Mode, trigger, 339
Models, instrument, 11
Modes, sampling, 327329
Modules, sampling, supported, 13
Mouse, operations equivalent with touchscreen, 353
N
Negative Crossing measurement, B5
Negative Duty Cycle measurement, B5
Negative Overshoot measurement, B2
Negative Width measurement, B5
Noise Pk-Pk measurement, B4
Noise RMS measurement, B4
Normal
display mode, 360
Index
O
Offset, vertical, 313
On/Standby button, 112, 114
Online, documentation, 21
Online Help, 21, 22
accessing, 3145
how to use, 3146
types available, 3145
Online help
displaying control descriptions, 3146
displaying overviews, 3147
for Windows 98, 3151
full-text search, 3150
keys to using, 3145
set up procedures, 3149
using the finder, 3148
why use, 3145
Operating system, reinstall, 116
Operation limitations
automatic measurements, 367
math waveforms, 390, 395
Operational limitations
Histograms, 3135
Mask testing, 3124
preview mode, 349
save and recall of setups, 3102
save and recall of waveforms, 3108
vertical offset, 35
waveform databases, 3139
Optical modules
incoming inspection, 126
installation, 18
Optical sampling modules, specifications, where to
find, A1
Optional accessories list, 136
Options, list, 135
Overshoot () measurement, B2
P
Package, shipping, contents of, 15
Peak-to-Peak measurement, B2
Period measurement, B5
Peripherals, connection of, 111
Persistence
infinite, 360
variable, 360
Phase measurement, B5
Phone number, Tektronix, xv
Pixel, Glossary7
Pop-up menu, Glossary7
Position
considerations for setting, 36
horizontal, 37
vertical, 36
Positive Crossing measurement, B5
Positive Duty Cycle measurement, B5
Positive Overshoot measurement, B2
Positive Width measurement, B5
Power, applying & removing, 112, 114
Preview mode, 349
usage limitations, 349
Printing
information missing in print out, 3120
waveforms, 3120
Probe, used on Trigger Direct input, 341
Probechannel deskew, Glossary2
Probes, Definition, Glossary7
Procedure
back up user files, 115
Check the Package Contents, 15
create emergency startup disk, 114
diagnostics, 120
first-time power on, 112
functional tests, 123
hardware tests, 132
incoming inspection, 119
operating system reinstall, 116
operating system tests, 132
running QAPlus/Win, 133
To Autoset, 311
To Clear References, 3115
To Compensate the Instrument and Modules, 384
To Create a New Mask, 3133
To customize the database display, 3143
To Customize the Graticule & Waveforms, 362
To Define a Math Waveform, 393
To Deskew Channels, 386
To Display Waveform in a MagView, 357
To Display Waveform in the Main View, 355
To Edit a Mask, 3130
To Localize a Measurement, 375
To Mask Test a Waveform, 3127
To Perform Dark-Level and User Wavelength Gain
Compensations, 387
To Recall Your Setup, 3106
To Recall Your Waveform, 3112
To Reset the Instrument, 312
To Save Your Setup, 3103
To Save Your Waveform, 3109
To Set Acquisition Modes, 323
To Set Display Styles, 361
Index7
Index
Q
QAPlus/Win application, 132
Quality Factor measurement, B4
Quantizing, Glossary7
R
Range, vertical input, 313
Readout display, 26
Readouts, 26
Readouts bar, 26
Real-time sampling, Glossary7
Recalling a setup, 3101
Recalling a waveform, 3108
Record
acquisition, shared by all channels, 319
length, defined, 327
Record length, Glossary7
Reference levels, methods for setting, 370
Reference memory, Glossary7
Reference waveforms, Glossary8
how to clear, 3115
Related Manuals, xiii
Release notes, software, 115
Remote communication, 3121
Index8
Reset
How to execute, 312
of instrument, 312
Rise Time measurement, B5
RMS measurement, B2
S
S/N Ratio measurement, B4
Sample acquisition mode, Glossary8
Sample interval, Glossary8
defined, 327
Sampling, Glossary8
modes, 327329
process, defined, 326328
process, illustrated, 327328
sequential equivalent-time, Glossary8
Sampling modules
cautionavoid damage, 36
installation, 18
installation compartments, 110
external attenuators with, 36
preventing overvoltage, 36
keys to using, 35
selection, 35
signal connection, 35
specifications, where to find, A1
static concerns, 18
supported, 13
where to insert user manuals, C1
Save and recall of setups
adding a comment, 3105
usage limitations, 3102
Save and recall of waveforms
adding a comment, 3111
usage limitations, 3108
Save Mode, if Windows starts in, 117
Saved waveform, saved, Glossary8
Saving a setup, 3101
Saving a waveform, 3108
Saving and recalling setups
including comments, 3102
virtual keyboard with, 3102
why use, 3101
Saving and recalling waveforms
including comments, 3108
virtual keyboard with, 3108
why use, 3108
Scale, considerations for setting, 36
SELECT button, Glossary8
Selected cursor, Glossary1
Index
T
TDS8000, description, 11
Technical support, contact information, xv
Tektronix
contacting, xv
toll-free number, xv
Temperature compensation, 383388
Test equipment, for incoming inspection, 119
Testing Waveforms, masks, histograms, and waveform
databases, 3123
Time base, Glossary8
view, Glossary9
Tool bar, 26
Touch screen, inoperable in Windows Safe mode, 117
Touchscreen, operations equivalent with mouse, 353
Trigger, Glossary8
clock recovery source, 339
DIRECT connector, 339, 341
Edge, Glossary4
inputs, 340
Level, Glossary9
level, 338
modes, 339
PRESCALE connector, 339, 341
probe used to connect, 341
slope, 338
sources, 339
vs. untriggered displays (illustrated), 339
Trigger inputs, usage limitations, 341
Trigger MAIN LEVEL knob, 338
Trigger point, defined, 327
Trigger source, usage limitations, 341
Triggering, 337, 3923100
based on application, 340
edge, 338346
high frequency, 342
holdoff, 342
how to set, 345
keys to using, 337
metastability reject, 342
overview (of process), 337
overview of, 337
purpose, 337
why use, 337
U
Update, software, 13
Index9
Index
Upgrade, firmware, 13
URL, Tektronix, xv
Usable holdoff, 343
User Interface
Controls bar, 26
map, 26
Measurements bar, 26
Menu bar, 26
Readouts bar, 26
readouts display, 26
Status bar, 26
Tool bar, 26
Waveform bar, 26
User Interface application, software, 13
User manual
main, 22
sampling modules, 22
User Wavelength compensation, how to perform, 387
V
Variable Persistence, display mode, 360
Vectors, 360
Vectors, Display menu, 360
Verification, incoming inspection procedure, 119
Vertical
Bar cursors, Glossary9
position, 36
range (acquisition window), Glossary9
scaling, 34
set up procedure, 38
signal connection, 34
Vertical acquisition window, Glossary9
control set up, 39
overview, 313
Vertical deskew, Glossary2
Vertical offset
discussion of , 313
illustrated, 314
usage limitations, 35
Vertical position, illustrated, 314
Vertical range, what determines, 313
Vertical scale and offset, why use, 34
Vertical set up, purpose, 34
View
graticule, 351
Main & Mag, 29
operations on selected, 351
that magnify, 353
time base, Glossary9
using multiple, 351
Views, multiple, 349
Index10
W
Waveform
Acquiring of, 33
channel, Glossary3
cursors, Glossary9
database, Glossary10
databases, using, 3139
defined, Glossary9
display, 26
overview of, 347
displayed fit to screen, 352
displaying, 347
exporting, 3116
how to display in a Mag View, 357
how to display in Main View, 355
how to recall, 3112
how to save, 3109
how to use an exported, 3117
printing, 3120
purpose of databases, 3139
recalling, 3108
saved, Glossary8
saving, 3108
selected, 37, Glossary8
Waveform display
elements of, 348
customizing, 358
why use, 358
Waveform bar, 26
Waveform databases
behavior with automatic measurements, 368
dimensions of, 3140
display, 3140
special features, 3139
To customize display of, 3143
to set up, 3141
two database limit, 3139
usage limitations, 3139
vs. vector view (figure), 3142
why use, 3139
with intensity display (figure), 3144
Waveform Display
defining waveforms for, 350
keys to using, 350
Waveform record, 327
definition applied to all channels, 319
illustrated, 328
Index
Waveforms
control operation vs. selected, 351
creating math, 389
defining and displaying, 350
histograms on, 3134
including comments with, 3108
live, Glossary6
mask testing, 3123
math, Glossary6
why use, 390
measuring, 365
operations on all views, 352
operations on selected, 350
purpose of mask testing, 3123
purpose of saving/recalling, 3108
purpose of taking histograms of, 3134
Reference, Glossary8
testing and statistical tools, 3123
Y
YT format, Glossary10
Z
Zoom, fast access to, 349
Index11
Index
Index12