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    Nidhi EM Task - 4

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    The document describes measuring low currents from a germanium diode using different methods: 1) an analog microammeter, 2) a digital microammeter across multiple ranges, and 3) a current-to-voltage converter with an operational amplifier. It involves measuring the forward current at five points on the diode's characteristics curve from 20mV to 100mV and comparing the results. The document also specifies evaluating error sources like ammeter resistance and determining measurement uncertainties.

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    Nidhi EM Task - 4

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    api-26910047
    34 views2 pages
    The document describes measuring low currents from a germanium diode using different methods: 1) an analog microammeter, 2) a digital microammeter across multiple ranges, and 3) a current-to-voltage converter with an operational amplifier. It involves measuring the forward current at five points on the diode's characteristics curve from 20mV to 100mV and comparing the results. The document also specifies evaluating error sources like ammeter resistance and determining measurement uncertainties.

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    Nidhi > EM > Task_4

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    The document describes measuring low currents from a germanium diode using different methods: 1) an analog microammeter, 2) a digital microammeter across multiple ranges, and 3) a current-to-voltage converter with an operational amplifier. It involves measuring the forward current at five points on the diode's characteristics curve from 20mV to 100mV and comparing the results. The document also specifies evaluating error sources like ammeter resistance and determining measurement uncertainties.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    34 views2 pages

    Nidhi EM Task - 4

    Uploaded by

    api-26910047
    The document describes measuring low currents from a germanium diode using different methods: 1) an analog microammeter, 2) a digital microammeter across multiple ranges, and 3) a current-to-voltage converter with an operational amplifier. It involves measuring the forward current at five points on the diode's characteristics curve from 20mV to 100mV and comparing the results. The document also specifies evaluating error sources like ammeter resistance and determining measurement uncertainties.

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    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
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    of 2

    4.

    MEASUREMENT OF LOW CURRENTS

    4.1. Tasks of the measurement


    4.1.1. Measure the forward current of the germanium diode in the low voltage region (20 mV
    to 100 mV) in five points of the characteristics (see Fig. 4.1):
    a) using analog micro-ammeter,
    b) using digital micro-ammeter on more measurement ranges,
    c) using current-to-voltage converter with an operational amplifier; find the value of
    the feedback resistor R of the I/U converter to achieve the current-to-voltage
    conversion factor 105 V/A.
    Plot the measured curves into common graph.
    4.1.2. Evaluate the methodical error caused by non-zero input ammeter resistance in cases
    4.1.1a and 4.1.1b.
    4.1.3. Evaluate the standard uncertainty of the micro-ammeter reading for cases a and b. For
    the case c evaluate the expanded uncertainty of current measurement (coverage factor
    k = 2); consider also input bias current of the op amp.
    4.1.4. Evaluate the input resistance of the used micro-ammeters.

    4.2. Schematic diagrams

    90 Ω I I
    + A A'

    U1
    V1 10 Ω U1' µA
    0 to 1 V

    - B B'

    a), b)

    I
    A'' -

    +
    V2

    B''

    c)

    Fig. 4.1 Connection diagram for measurement of low currents


    4.3. List of the equipment used
    V2 - digital voltmeter, type ..., accuracy ± ... % of range ± ... % of reading
    µA1 - PMMC micro-ammeter, accuracy class ... , range ...
    µA2 - digital micro-ammeter, type ..., accuracy ± ... % of range ± ... % of reading
    R - accurate resistor or decade resistor, accuracy 0.1 % (or 0.2 %)
    OA - operational amplifier in a box
    U1 - variable voltage source with digitally adjustable output value

    Theoretical background

    See the textbook:


    M. Sedláček, J. Holub, D. Hejtmanová: Laboratory Excercises in Electrical Measurements,
    CTU Publishing House, Prague, 2005

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