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    Requirements With Reason & Current Resources

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    haranahalli
    The document outlines requirements for additional test jigs based on current resources and reasons. It describes problems encountered that require continuous testing of materials for over a day. Issues include failures after 10 days, intermittent problems, data loss, increased rejection ratios. More test jigs would allow engineers to thoroughly test components like CCUs, encoders, RAM without disturbance and in a timely manner.

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    Requirements With Reason & Current Resources

    Uploaded by

    haranahalli
    24 views4 pages
    The document outlines requirements for additional test jigs based on current resources and reasons. It describes problems encountered that require continuous testing of materials for over a day. Issues include failures after 10 days, intermittent problems, data loss, increased rejection ratios. More test jigs would allow engineers to thoroughly test components like CCUs, encoders, RAM without disturbance and in a timely manner.

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    The document outlines requirements for additional test jigs based on current resources and reasons. It describes problems encountered that require continuous testing of materials for over a day. Issues include failures after 10 days, intermittent problems, data loss, increased rejection ratios. More test jigs would allow engineers to thoroughly test components like CCUs, encoders, RAM without disturbance and in a timely manner.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as XLSX, PDF, TXT or read online from Scribd
    Download as xlsx, pdf, or txt
    24 views4 pages

    Requirements With Reason & Current Resources

    Uploaded by

    haranahalli
    The document outlines requirements for additional test jigs based on current resources and reasons. It describes problems encountered that require continuous testing of materials for over a day. Issues include failures after 10 days, intermittent problems, data loss, increased rejection ratios. More test jigs would allow engineers to thoroughly test components like CCUs, encoders, RAM without disturbance and in a timely manner.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as XLSX, PDF, TXT or read online from Scribd
    Download as xlsx, pdf, or txt
    of 4

    REQUIREMENTS WITH REASON & CURRENT RESO

    TEST JIG REQUIREMENTS

    CURRENT RESOURCES

    REASON FOR REQUIREMENT

    810D

    840D

    802D
    802D-SL
    REQUIREMENTS WITH REASON & CURRENT RESOURCES.

    810D=01 NUMBER.
    840D=01 NUMBER.
    802D=01 NUMBER.
    802D SL=01 NUMBER.

    810D=02 NUMBERS.
    840D=02 NUMBER.
    802D=02 NUMBER.
    802D SL=01 NUMBER.

    EQUIREMENT
    1. FAILURE OF CCU'S AFTER 10 DAYS IN CPU SECTION & IN ENCODER SECTION, PROBLEMS LIKE
    DISPLAY-8, NO DISPLAY, JUNK DISPLAY, CONTOUR MONITORING.
    2. INTERMITTENT PROBLEMS AFTER TWO DAYS LIKE DATA LOSS, DATA NOT GETTING CLEARED OR
    LOADED.
    3. FAILURE OF CCU'S AFTER 10 DAYS IN RAM SECTION, PROBLEMS LIKE DATA LOSS, DATA NOT GET
    CLEARED OR LOADED (NC/PLC).
    4. REJECTION RATIO OF INCREASED WHILE TESTING AND DUE TO THIS INCREASE OF QC TIME
    CONSUMPTION BECAUSE OF CONFIGURING THE SAME MODULE MANY TIMES
    5. DISTURBENCE OF 810D RACK FROM ENGINEERS ASHOK SINGH & SUDERSHAN TO CONFIRM THE
    MATERIALS CCU, MMC, CONVERTER, OP, HDD
    6. CONTINUOUS TESTING IS REQUIRED FOR MORE THAN ONE DAY TO AVOID ABOVE SAID PROBLEM
    7. MATERIALS TESTED IN THIS RACK ARE CCU, EFP-MODULE, MMC'S, OP'S, HDD, CONVERTER

    1. IN 840D AS WE ALL AWARE THAT INWARD OF 611D IS MORE AS WELL AS OUTWARD RATIO.
    INTERMITTENT PROBLEM IS MORE, ENGINEER COMPULSORY REQUIRES A SEPARATE RACK FOR TES
    2. FREQUENT ENABLER & ENCODER RELATED PROBLEMS IN 611D AFTER FEW DAYS.
    3. INSUFFICIENT JIG FACILITY FOR 611D TEST.
    4. MORE PORTS FOR TEST TAKES LONG TIME TO CONFIGURE.
    5. IN NCU'S AS WE RECEIVE MANY INTERMITTENT PROBLEMS, REJECTIONS RATIO IS MORE AND WE
    REQUIRE SEPARATE RACK FOR ENGINEERS.
    6. DIFFERENT VERSIONS OF NCU REQUIRES SUITABLE 611D'S, SO IT IS MUST TO MATCH NCU WITH
    ALL THE TIME AND NEEDS TO CONFIGURE EACH TIME
    7. PCU50 VER-DF31 HAS INTERMITTENT PROBLEMS REQUIRES MORE THAN 1 DAY TESTING.
    8. IN 840D I ALWAYS FACE DISTURBENCE FROM ASHOK SINGH, VANITHA & SUDERSHAN FOR THEIR
    CONFIRMATION AND ALSO THEY FAIL TO COFIRM THAROUGHLY AT FIRST TIME IN BUSY SHEDULE.
    9. MATERIALS TESTED IN THIS RACKS ARE NCU, 611D, DMP, MCP'S, HHU'S, PCU50'S, PCU20, OP'S,
    NCU-BOX, EFP-MODULE.

    1. MATERIAL INWARD IS HIGH AND ALSO OUTWARD.


    2. MORE UNIVERSAL CARD INWARD AND PRESENTLY UNABLE TO TEST ALL CARD CONTINUOUSLY F
    ALLOTED TIME FROM SIEMENS.
    3. INTERMITTENT PROBLEMS IN ENABLER & ENCODER SECTIONS.
    4. IN CASE OF 802D-PCU 1 DAY CONTINUOUS TEST IS REQUIRED TO FIND OUT DATA, FLICKERING,
    INTERMITTENT PROBLEMS.
    5. INTERMITTENT PROBLEMS IN PP-MODULE, PROFIBUS, ADI-4
    6. PRESENTLY MATERIALS TESTED IN THIS RACK ARE 802D-PCU, 611U, PROFIBUS-CARD, MCP, KBD
    HAND-WHEEL, ADI-4.
    1. PRESENTLY WE HAVE ONE 802D-SL JIG AND IT IS VERY DIFFICULT TO TEST CONTINUOUSLY BECA
    ENGINEER IS ALSO USING SAME RACK FOR DIAGNOSIS PURPOSE
    2. PROBLEMS REPOTING SITE LIKE- NO DISPLAY AFTER ONE DAY, FLICKERING DISPLAY, DATA LOSS
    BOOTING AFTER A DAY.
    3. SO WE MUST REQUIRE MINIMUM 30 HRS TIME TO TEST 802DSL-PCU.

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