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As the technology is continuously scaled, leakage currents become a major contributor to the total power dissipation. A reduction in power supply voltage is necessary to reduce dynamic power and avoid reliability problems in deep sub-micron regions. Threshold voltage reduction accompanies supply voltage scaling to maintain the performance but it exponentially increases the sub threshold leakage currents. Domino logic circuits are extensively used in high performance microprocessors due to their superior speed and area characteristics compared to static CMOS circuits. But these circuits are susceptible to high leakage. In this work, a standby switch is used which turns off all the high threshold voltage transistors and thereby enhances the effectiveness of dual threshold voltage CMOS technology to reduce sub threshold leakage current. Also CMOS NAND gates are employed instead of the output inverter to pre charge both the dynamic node and output to logic 1 during its pre charge phase, so that the subsequent logic function will be evaluated correctly in its evaluation phase. The proposed techniques are compared by performing detailed transistor level simulations on benchmark circuits in 45nm technology using Microwind3 and DSCH3 CMOS layout CAD tools.
International Journal of VLSI Design & Communication Systems, 2013
A novel technique for dual-threshold is proposed and examined with inputs and clock signals combination in 65nm dual-threshold footerless domino circuit for reduced leakage current. In this technique a p-type and an n-type leakage controlled transistor (LCTs) are introduced between the pull-up and pull-down network and the gate of one is controlled by the source of the other. A high-threshold transistor is used in the input for reducing gate oxide leakage current which becomes dominant in nanometer technology. Simulations based on 65nm BISM4 model for proposed domino circuits shows that CLIL (clock low and input low) and CHIH (clock high and input high) state is ineffective for lowering leakage current. The CLIH (clock low input high) state is only effective to suppress the leakage at low and high temperatures for wide fan-in domino circuits but for AND gate CHIL (clock high input low) state is preferred to reduce the leakage current. The proposed circuit technique for AND2, OR2, OR4 and OR8 circuits reduces the active power consumption by 39.6% to 57.9% and by 32.4% to 40.3% at low and high die temperatures respectively when compared to the standard dual-threshold voltage domino logic circuits.
International Journal of Computer Applications, 2013
A new dual-threshold circuit technique is proposed in this paper for reducing the subthreshold and gate oxide leakage currents in idle and non idle mode of operation for footerless domino circuits. In this technique a p-type and an n-type leakage controlled transistors (LCTs) are introduced between the pull-up and pull-down network and the gate of one is controlled by the source of the other. For any combination of input, one of the LCT will operate near its cut off region and will increase the resistance between supply voltage and ground resulting in reduced leakage current. Furthermore, the leakage current is suppressed at the output inverter circuit by inserting a transistor below the n-type transistor of the inverter offering more resistive path between supply voltage and ground. The proposed technique is applied on benchmark circuits reduction of active power consumption is observed from 34% to 57.5% at different temperature variations. For same benchmark circuits, operating at two clock modes and giving low and high inputs at 25 0 C and 110 0 C temperatures the maximum leakage power saving of 99.97% is achieved when compared to standard dual-threshold domino logic circuits in a 65nm CMOS technology.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2000
2011 Nirma University International Conference on Engineering, 2011
A circuit technique is proposed in this paper for simultaneously reducing both subthreshold and gate-oxide leakage power consumption at high and low temperatures in footed domino logic circuits. A high Vt pMOS pull-up technique with feedback control utilizing both multiple-Vt and multiple Tox is added between the footer node and dynamic node to place footed domino logic circuit into a low leakage state. At 110ºC, proposed work improves 34%-50% as compared to multiple-Vt with low and high inputs. At room temperatures, proposed work improves 20%-27% as compared to multiple-Vt with low and high inputs.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2000
A circuit technique is proposed in this paper for simultaneously reducing the subthreshold and gate oxide leakage power consumption in domino logic circuits. Only p-channel sleep transistors and a dual-threshold voltage CMOS technology are utilized to place an idle domino logic circuit into a low leakage state. Sleep transistors are added to the dynamic nodes in order to reduce the subthreshold leakage current by strongly turning off all of the high-threshold voltage transistors. Similarly, the sleep switches added to the output nodes suppress the voltages across the gate insulating layers of the transistors in the fan-out gates, thereby minimizing the gate tunneling current. The proposed circuit technique lowers the total leakage power by up to 77% and 97% as compared to the standard dual-threshold voltage domino logic circuits at the high and low die temperatures, respectively. Similarly, a 22% to 44% reduction in the total leakage power is observed as compared to a previously published sleep switch scheme in a 45-nm CMOS technology. The energy overhead of the circuit technique is low, justifying the activation of the proposed sleep scheme by providing a net savings in total energy consumption during short idle periods.
2012
Domino logics are widely used in modern VLSI circuits for its high speed over the static CMOS circuits. But the main drawback of this domino logic is more susceptible to noise and increased power dissipation. A Dynamic logic which combines the advance of high speed and noise tolerant circuit is used in recent CMOS VLSI circuits. In this paper, we propose several domino logic circuit techniques to improve the robustness and performance along with leakage power using the new novel reverse body biased (RBB) technique. In this work, different types of AND gates with Conventional Body Bias & reverse body bias inverters are compared with their performances. Lower total power consumption is achieved by utilizing proposed techniques. The results are simulated using MICROWIND and DSCH 3 CAD tools and their performances are compared in terms of power dissipation, propagation delay and PDP Research Article
Microelectronics Journal, 2006
A circuit technique is proposed in this paper for simultaneously reducing the subthreshold and gate oxide leakage power consumption in domino logic circuits. PMOS-only sleep transistors and a dual threshold voltage CMOS technology are utilized to place an idle domino logic circuit into a low leakage state. Sleep transistors are added to the dynamic nodes in order to reduce the subthreshold leakage current by strongly turning off all of the high threshold voltage transistors. Similarly, the sleep switches added to the output nodes suppress the voltages across the gate insulating layers of the transistors in the fan-out gates, thereby minimizing the gate tunneling current. The proposed circuit technique lowers the total leakage power by 88 to 97% as compared to the standard dual threshold voltage domino logic circuits. Similarly, a 22 to 44% reduction in the total leakage power is observed as compared to a previously published sleep switch scheme in a 45 nm CMOS technology. q
2017
In VLSI circuits and systems. Due to relatively high complexity of VLSI systems used in various applications, the power dissipation in CMOS inverter arises from its switching activity, which is mainly influenced by the supply voltage and effective capacitance. One of challenge with technology scaling is the rapid increase in sub threshold leakage power due to Vt reduction. Leakage power dissipation is a component of static power dissipation in CMOS circuits. It is caused by the presence of leakage currents in the MOS transistors. Leakage power can be reduce by Stack, Sleep and Sleepy keeper transistor techniques. Sleepy Keeper technique provided lesser static power dissipation and lesser static power delay product in comparison with the other techniques. The main advantage of using Sleepy Keeper technique is that it retains the logic state and also lowers the sub threshold leakage power dissipation. It has been shown previously that the stacking of two off transistors has significan...
With the advancement of technology, size of transistor, supply voltage, gate oxide thickness has been decreased but the leakage in device has increased. Projecting these trends, it can be seen that the leakage power dissipation will equal to the active power dissipation within a few generations. Hence, efficient leakage power reduction methods are very critical for the deep-submicron and nanometer circuits. In this paper Lector based Footed Diode Domino Logic circuit technique is introduced for leakage reduction, which provides efficient reduction in leakage in ideal and non ideal mode of operation. In this technique a p-type and an n-type leakage control transistor (LCT) are introduced between the pull-up and pull-down network, and the gate of one is controlled by the source of the other. For any combination of inputs, one of the LCTs will operate near its cut-off region and will increase the resistance between supply voltage and ground, resulting in reduced leakage current.
IEEE Transactions on Circuits and Systems II: Express Briefs, 2000
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