Easy and direct method for calibrating atomic force microscopy lateral force measurements. (Q30497862)
Jump to navigation
Jump to search
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | Easy and direct method for calibrating atomic force microscopy lateral force measurements. |
scientific article |
Statements
Easy and direct method for calibrating atomic force microscopy lateral force measurements (English)
Keith Bonin
1 reference
1 reference
1 reference
1 reference