CH 02 Fabrication
CH 02 Fabrication
CH 02 Fabrication
Chapter 2
Fabrication of MOSFETs
Insulators
Conductors
Semiconductors
An IC consists of
several layers of
material that are
manufactured in
successive steps.
Lithography is used
to selectively process
the layers, where the
2-D mask geometry is
copied on the surface.
Ion implantation is
used to add doping
materials to change
the electrical
characteristics of
silicon locally. The
dopant ions penetrate
the surface, with a
penetration depth that
is proportional to their
kinetic energy.
A thermal oxide is
grown uniformly on
the surface. Then
the active areas are
covered by nitride.
A second thermal
oxidation process
grows thick silicon
dioxide outside the
active areas.
21 © CMOS Digital Integrated Circuits – 3rd Edition
Polysilicon Deposition
•Active area is created, which is surronded by a relatively thick oxide barrier called the
field oxide.
•Ethced field oxide isolation. ( Grow Silicon Oxide and Etched away u
Necessary).
Disadvantage: Thickness of the field oxide leads to large Oxide steps at the boundry of
Active and isolated regions.
This leads to the cracking of layer (Hence Chip Failure) when metal/ Poly is deposited in
next steps
Local Oxidation of Silicon (LOCOS)
•Based on the Principal of selectively Growing the oxide rahter than etching.
•Selectice Growth is achieved by shielding the Active area with Silicon Nitride
(Si3N4)
•First Thin oxide is grown followed by deposition and patterning of Silicon Nitride
(Si3N4)
Local Oxidation of Silicon (LOCOS)
Exposed area form the isolation region and doped with P Kind of impurities
P
Local Oxidation of Silicon (LOCOS)
Thick oxide is grown in next step where the area is not covered by Si3N4.
“design shrink”
180 nm 130 nm 90 nm
1982
1979
1971
But at the same time, we try to put more functionality in each chip
for each new technology generation, so that the average chip size
actually increases over the years !