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PXI Vector Signal Transceivers

CONTENTS
PXI Vector Signal Transceivers
Detailed View of PXIe-5840 RF Vector Signal Transceiver
Key Features
Software-Defined Architecture
Platform-Based Approach to Test and Measurement
PXI Instrumentation
Hardware Services

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PXI Vector Signal Transceivers
PXIe-5840, PXIe-5820, PXIe-5646, PXIe-5645, and PXIe-5644

• Software: Includes interactive soft front panel, • Better than -50dB EVM performance
API support for LabVIEW and text-based for higher order modulation schemes
languages, shipping examples, and detailed
help files • Easy synchronization for MIMO
configurations using NI-TClk
• Up to 6 GHz RF frequency range
• Baseband two-channel differential I/Q
• Up to 1 GHz instantaneous/complex I/Q interface with 4 Vpp differential input
bandwidth and 2 Vpp differential output swing
• High-speed serial and parallel digital interface • LabVIEW-programmable FPGA

Built for RF Automated Test and Measurement

The PXI Vector Signal Transceiver (VST) combines an RF and baseband vector signal analyzer and
generator with a user-programmable FPGA and high-speed serial and parallel digital interfaces for real-
time signal processing and control. With 1 GHz of instantaneous RF or complex I/Q bandwidth, the NI
VST is ideally suited for a wide range of applications including 802.11ac/ax device testing, 5G design and
testing, RFIC testing, radar prototyping, spectrum monitoring and more.

The VST incorporates the fast measurement speed and small form factor of a production test box with the
flexibility and high performance of an R&D-grade box instrument. This means you can use the VST to test
a variety of cellular and wireless standards including Bluetooth, LTE-Advanced Pro, and IEEE 802.11ax
with an error vector magnitude of better than -50 dB (0.5 %) at 5.8 GHz. In addition, you can easily
expand the VST's small PXI Express form factor to support multiple input, multiple output (MIMO)
configurations. The baseband VST can be tightly synchronized with the PXIe-5840 RF VST to sub-
nanosecond accuracy, to offer a complete solution for RF and baseband differential I/Q testing of wireless
chipsets. The VST software is built on LabVIEW FPGA, and features several starting points for your
application including application IP, reference designs, examples, and LabVIEW sample projects, while
also giving you the ability to fully customize the onboard processing.

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 Table 1. NI offers VSTs up to 1GHz instanteous bandwidth.

PXIe-5644 PXIe-5646 PXIe-5840 PXIe-5645 PXI-5820

Frequency Range 65 MHz to 6 GHz 65 MHz to 6 GHz 9 kHz to 6 GHz 65 MHz to 6 GHz DC to 500 MHz

Instantaneous
80 MHz 200 MHz 1 GHz 80 MHz 1 GHz complex I/Q
Bandwidth

Phase Noise (10 kHz

-112 dBc/Hz -112 dBc/Hz -122 dBc/Hz -112 dBc/Hz N/A
offset) at 900 MHz

-48 dB, w/ phase noise -50 dB, w/ phase noise -54 dB, w/ phase noise
EVM (802.11ax 80
enhancement, external enhancement, external enhancement, external
MHz, loopback)
LO LO LO

VSG Maximum Output

+13 dBm +13 dBm +20dBm +13 dBm N/A
Power (CW @ 1 GHz)

VSG Amplitude
±0.6 dB ±0.6 dB ±0.6 dB ±0.6 dB N/A
Accuracy

VSA Amplitude
±0.55 dB ±0.55 dB ±0.5 dB ±0.55 dB N/A
Accuracy

Tuning Time 380 µs 380 µs 300 µs 380 µs N/A

Slots 3 3 2 4 2

FPGA Virtex-6 LX195T Virtex-6 LX240T VIRTEX-7 X690T Virtex-6 LX195T VIRTEX-7 X690T

8 channels parallel at 8 channels parallel at

24 channels parallel at 24 channels parallel at 60 MHz, 24 channels parallel at 60 MHz,
Digital I/O
125 MHz 125 MHz 4 channels high-speed 125 MHz 4 channels high-speed
serial up to 12 Gbps serial up to 12 Gpbs

1 (I and Q), 100 Ohm 1 (I and Q), 100 Ohm

Baseband I/Q Channels N/A N/A N/A
Differential Differential

Detailed View of PXIe-5840 RF Vector Signal Transceiver

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Key Features
Wide Instantaneous Bandwidth
From next-generation wireless technologies like 802.11ax and 5G to advanced aerospace/defense
applications like radar test and spectrum monitoring, there is a demand for wider signal bandwidth to
achieve higher peak data rates. Leveraging fast sampling, high-linearity DACs and ADCs, and wide-band
internal calibration mechanisms, the NI VSTs offer 80 MHz, 200 MHz and 1 GHz of instantaneous RF and
complex I/Q bandwidth with excellent measurement accuracy.

Figure 1. Instantaneous RF bandwidth offerings of the NI VSTs

Wider bandwidth introduces the need for advanced signal processing at higher throughputs, and the NI
VSTs address this requirement by offering FPGA-based signal processing for applications such
as radar target simulation, multi-carrier aggregation, DPD algorithm implementations, 5G prototyping and
real-time spectrum analysis. Additionally, the VSTs incorporate patented algorithms for amplitude and
phase correction for high absolute amplitude accuracy and low deviation from linear phase across the
span of their wide instantaneous bandwidth.

EVM Measurement Performance

The VST uses advanced, patented IQ calibration techniques to deliver best-in-class EVM performance for
wideband signals. A critical requirement of next-generation wireless devices is even more stringent EVM
performance requirements. With higher order modulation schemes and wideband multicarrier signal
configurations, the RF front ends of today’s wireless devices require better linearity and phase noise to
deliver the required modulation performance. Because of these requirements, tomorrow’s RF test
instrumentation must deliver even more accurate RF performance.

2.4 GHz 5.2 GHz 5.5 GHz 5.8 GHz

-42

-44

-46
EVM (DB)

-48

-50

-52

-54
-30 -25 -20 -15 -10 -5 0 5 10

MEASURED AVERAGE POWER (DBM)

Figure 2. 802.11ax 80 MHZ EVM performance (w/ 5840 Loopback) External LO, Noise Correction Enabled

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The modular design of PXI instruments provides engineers with the most demanding EVM performance
requirements the ability to improve on the VST’s native performance even further. Using a PXI external
local oscillator (LO), systems based on the second-generation VST achieve EVM performance better than
-50 dB.

Modular and Easily Synchronized

Engineers are employing Multiple Input Multiple Output (MIMO) systems in a wide range of electronic
warfare and radar applications ranging from phased array radars to beam forming and direction finding
systems. The modern communications standards, such as 802.11ax, LTE-Advanced Pro, and 5G, are
also using MIMO schemes with up to 128 antennas on a single device to provide a combination of either
higher data rates through more spatial streams or more robust communications through beamforming.
Not surprisingly, MIMO technology adds significant design and test complexity. It not only increases the
number of ports on a device but also introduces multichannel synchronization requirements. To test a
MIMO device, RF test equipment must be able to synchronize multiple RF signal generators and
analyzers. In these configurations, the instrument’s form factor and the synchronization mechanism are
critical

Figure 3. Typical 8x8 MIMO system with eight PXIe-5840 VSTs; with the NI T-Clk API, shared Local Oscillators, and
a common reference clock, engineers can synchronize the VST with other PXI instruments

With the compact footprint of the PXI VST, engineers can synchronize up to eight PXIe-5840s or five
PXIe-5646s in a single 18-slot PXI chassis. In addition, each of the VSTs can be synchronized in a
completely phase-coherent manner. In hardware, each VST features the ability to import or export the LO
so that all modules can share a common LO. In software, engineers can use NI’s patented T-Clock
technology to easily synchronize multiple instruments using the NI T-Clk API. Using this API, engineers
can synchronize multiple VSTs or even synchronize VSTs with other modular instruments, either in
LabVIEW, C/C++, or .NET.

Flexible Digital Interface

In addition to the onboard VSG and VSA, the VST features a flexible digital interface capable of both
high-speed parallel and high-speed serial interfacing. In PXIe-5644/45/46, the digital I/O buffers are
connected directly to the FPGA, allowing the functionality of the individual digital I/O signals to be
programmed for custom applications using LabVIEW FPGA. In PXIe-5840, the digital lines are directly
connected to a user-programmable FPGA through level shifting buffers. As a result, the digital lines
support 1.2, 1.5, 1.8, 2.5, and 3.3 V voltage levels and are exposed on the instrument front panel using a
42-pin Nano-Pitch connector. Using this connector, eight digital lines are dedicated to high-speed parallel
interfacing. The parallel interface operates at up to 60 MHz clock rates, and this interface can be
controlled in real-time using the instrument’s onboard FPGA.

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A new addition to the VST is the high-speed serial interface, which features four multi-gigabit transceivers
(MGTs) that operate at data rates of up to 12 Gb/s per lane. The serial interface can support high-speed
serial standards such as Xilinx Aurora and Serial RapidIO. A benefit of the high-speed serial interface is
that it gives users the ability to stream the full instrument’s bandwidth out the front panel to external signal
processing modules such as the ATCA-3671. Thus, engineers have two data streaming options and can
stream data either out the front panel connector or through the PCI Express backplane.

Figure 4. Digital interfacing ports on the PXIe-5840 front panel

Wide Frequency Range

The VSTs offer a broad and contiguous frequency range from 9 kHz to 6 GHz (center frequency). With
the combination of contiguous frequency coverage and full suite of software for wireless standards
measurements, engineers can use a single instrument to test a wide range of wireless technologies.
Modern electronic systems are increasingly using a blend of multiple wireless technologies. Prevalent
examples of this are integrated chipsets that combine AM/FM, Bluetooth, GNSS, and Wi-Fi technologies
on the same chipset. Many of these wireless technologies operate below 6 GHz.

Figure 5. Frequency range of 1st generation VST PXIe-5644/ PXIe-5645/ PXIe-5646 and 2nd generation VST PXIe-
5840 mapped to different application frequency standards

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With the growing prevalence of combining wireless technologies within the same device, it is increasingly
important that test equipment have contiguous frequency coverage from near-DC to 6 GHz. Although
both the first- and second-generation VSTs provide contiguous frequency coverage to 6 GHz, the
second-generation VST expands the VST frequency at the low end to 9 kHz. Because of the wide
frequency range, engineers can not only test the latest wireless technologies for avionics, Wi-Fi, and
mobile communications but can also future-proof their test system for new emerging wireless
technologies that are not present in today’s electronics.

Baseband I/Q Functionality

The PXIe-5820 and PXIe-5645 baseband vector signal transceivers combine a wideband I/Q digitizer,
wideband I/Q arbitrary waveform generator and high-performance user-programmable FPGA into a single
two-slot PXI Express module. The PXIe-5820 offers up to 1 GHz baseband complex I/Q generation and
analysis bandwidth and supports advanced features for adaptive chipset control, such as programmable
common mode ranging and voltage swing. The combination of high linearity, low phase noise, and
patented IQ calibration techniques enables the PXIe-5820 to achieve better than -54 dB EVM
performance with higher-order modulation schemes such as 802.11ax 1024 QAM.

Figure 6. LabVIEW example to perform envelope tracking and digital predistortion using the NI PXIe-5820, baseband
VST in tight-synchronization with the NI PXIe-5840, RF VST

The baseband VST can also be used in tight synchronization with the RF VST to offer a complete solution
for RF and baseband differential IQ testing of wireless chipsets with digital predistortion and envelope
tracking. The baseband VST software is built on LabVIEW FPGA and features several starting points for
your application including application-specific IP, examples, and LabVIEW sample projects.

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Software-Designed Architecture
Application Programming Interface (API)
NI RFmx provides an intuitive programming API that offers both ease of use and advanced measurement
configuration. It offers a highly-optimized API to perform tasks ranging from measurements on digital and
analog modulated signals to RF spectral measurements including channel power, adjacent channel
power, and power spectrum. It also allows users to automate their programs with accurate, high-
performance standard-based measurements for LTE-A, WCDMA/HSPA+, GSM/EDGE, Bluetooth,
Bluetooth LE, and more. In addition to the support for cellular and general purpose measurements with
RFmx, NI offers wireless test standards software for GPS/GNSS simulation and FM/RDS, and the WLAN
Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac
and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy.

Figure 7. Power spectrum measurements performed using NI RFmx in LabVIEW and C

Figure 7 illustrates a power spectrum measurement using an RFmx LabVIEW example with eight function
calls. Engineers can get started with one of more than 100 example programs in C, .NET, and LabVIEW
that are designed to make instrument automation straightforward.

The NI-RFmx API includes high-level parameters that intelligently optimize instrument settings to help you
achieve the highest quality measurements with the fewest software calls. Additionally, NI-RFmx has
features that vastly simplify the software complexity of multi-measurement parallelism and multi-DUT
measurements. The modular software architecture offers access to lower level NI-RFSA instrument- and
application-specific functions that provide the ultimate balance of ease of use and test code flexibility. NI-
RFmx works with all NI software-designed VSTs and preserves the usage of NI-RFSA instrument driver
FPGA extensions, which are available only on LabVIEW FPGA-enabled products. As a result, users can
achieve industry-leading measurement speeds using the latest processor technologies and easy-to-
program multithreaded measurements for test time reduction.

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Soft Front Panel
The simplest software use model for the VST is the soft front panel experience. With the soft front panel,
users can quickly and easily configure the RF signal generator or analyzer to debug fixtures and obtain
fast measurement results. For example, in Figure 8, the soft front panel gives engineers the ability to
configure the VST for an adjacent channel power (ACP) measurement.

Figure 8. Users can configure the VST for quick measurements using the RFSA and RFSG soft front panels; other
interactive examples are also available and act as soft front panels for different standards

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Customizable With FPGA Extensions
The most innovative and powerful aspect of the VST’s software experience is its LabVIEW-programmable
FPGA. Using LabVIEW FPGA, you can develop FPGA extensions to perform measurement acceleration,
closed-loop tests, and real-time algorithm prototyping. Under this design paradigm, the firmware onboard
the instrument is written in LabVIEW, and engineers can customize to address application-specific needs.
The core firmware is divided into an acquisition loop, a generation loop, and an example user loop, as
Figure 9 illustrates.

Figure 9. Channel power measurement in RFmx using LabVIEW FPGA

In Figure 9, the LabVIEW FPGA diagram is divided into three Timed Loops. The first Timed Loop, the
acquisition loop, handles IQ input records, timing/triggering, IQ calibration, and storage to memory. The
second loop handles the VSG operation and performs similar triggering, calibration, and waveform
sequencing for signal generation. The third loop is referred to as the Example User Loop, and it is
explicitly designed for user customization. Typical IP for the user loop could be digital control, input-to-
output signal processing, or closed-loop control.

The VST family basecard consists of a Xilinx Virtex-7 or Virtex-6 FPGA that you can customize to design
FPGA extensions for application-tailored enhancements. Examples of application-specific FPGA IP,
developed by NI’s system engineers and alliance partners, include the real-time channelizer, wideband
record and playback, real-time spectrum analysis, power servoing, real-time digital predistortion, channel
emulator, and radar target simulator.

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Platform-Based Approach to Test and
Measurement
What Is PXI?
Powered by software, PXI is a rugged PC-based platform for measurement and automation systems. PXI
combines PCI electrical-bus features with the modular, Eurocard packaging of CompactPCI and then
adds specialized synchronization buses and key software features. PXI is both a high-performance and
low-cost deployment platform for applications such as manufacturing test, military and aerospace,
machine monitoring, automotive, and industrial test. Developed in 1997 and launched in 1998, PXI is an
open industry standard governed by the PXI Systems Alliance (PXISA), a group of more than 70
companies chartered to promote the PXI standard, ensure interoperability, and maintain the PXI
specification.

Integrating the Latest Commercial Technology

By leveraging the latest commercial technology for our products, we can continually deliver high-
performance and high-quality products to our users at a competitive price. The latest PCI Express Gen 3
switches deliver higher data throughput, the latest Intel multicore processors facilitate faster and more
efficient parallel (multisite) testing, the latest FPGAs from Xilinx help to push signal processing algorithms
to the edge to accelerate measurements, and the latest data converters from TI and ADI continually
increase the measurement range and performance of our instrumentation.

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PXI Instrumentation
NI offers more than 600 different PXI modules ranging from DC to mmWave. Because PXI is an open
industry standard, nearly 1,500 products are available from more than 70 different instrument vendors.
With standard processing and control functions designated to a controller, PXI instruments need to
contain only the actual instrumentation circuitry, which provides effective performance in a small footprint.
Combined with a chassis and controller, PXI systems feature high-throughput data movement using PCI
Express bus interfaces and sub-nanosecond synchronization with integrated timing and triggering.

Oscilloscopes Digital Multimeters

Sample at speeds up to 12.5 GS/s Perform voltage (up to 1000 V),
with 5 GHz of analog bandwidth, current (up to 3A), resistance,
featuring numerous triggering inductance, capacitance, and
modes and deep onboard memory frequency/period measurements, as
well as diode tests

Digital Instruments Waveform Generators

Perform characterization and Generate standard functions
production test of semiconductor including sine, square, triangle, and
devices with timing sets and per ramp as well as user-defined,
channel pin parametric arbitrary waveforms
measurement unit (PPMU)

Frequency Counters Source Measure Units

Perform counter timer tasks such Combine high-precision source and
as event counting and encoder measure capability with high
position, period, pulse, and channel density, deterministic
frequency measurements hardware sequencing, and
SourceAdapt transient optimization

Power Supplies & Loads FlexRIO Custom

Supply programmable DC power, Instruments & Processing
with some modules including Provide high-performance I/O and
isolated channels, output powerful FPGAs for applications
disconnect functionality, and remote that require more than standard
sense instruments can offer

Switches (Matrix & MUX) Vector Signal Transceivers

Feature a variety of relay types and Combine a vector signal generator
row/column configurations to and vector signal analyzer with
simplify wiring in automated test FPGA-based, real-time signal
systems processing and control

GPIB, Serial, & Ethernet Data Acquisition Modules

Integrate non-PXI instruments into Provide a mix of analog I/O, digital
a PXI system through various I/O, counter/timer, and trigger
instrument control interfaces functionality for measuring electrical
or physical phenomena

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Hardware Services
All NI hardware includes a one-year warranty for basic repair coverage, and calibration in adherence to NI
specifications prior to shipment. PXI Systems also include basic assembly and a functional test. NI offers
additional entitlements to improve uptime and lower maintenance costs with service programs for
hardware. Learn more at ni.com/services/hardware.

Standard Premium Description

Program Duration 3 or 5 years 3 or 5 years Length of service program

Extended Repair NI restores your device’s functionality and includes firmware updates and
● ●
Coverage factory calibration.

System
NI technicians assemble, install software in, and test your system per your
Configuration, ● ●
custom configuration prior to shipment.
Assembly, and Test1

Advanced NI stocks replacement hardware that can be shipped immediately if a repair

●
Replacement2 is needed.

System Return
NI accepts the delivery of fully assembled systems when performing repair
Material ●
services.
Authorization (RMA)1

Calibration Plan NI performs the requested level of calibration at the specified calibration
Standard Expedited3
(Optional) interval for the duration of the service program.

This option is only available for PXI, CompactRIO, and CompactDAQ systems.
1

This option is not available for all products in all countries. Contact your local NI sales engineer to confirm availability.
2

Expedited calibration only includes traceable levels.

3

PremiumPlus Service Program

NI can customize the offerings listed above, or offer additional entitlements such as on-site calibration,
custom sparing, and life-cycle services through a PremiumPlus Service Program. Contact your NI sales
representative to learn more.

Technical Support
Every NI system includes a 30-day trial for phone and e-mail support from NI engineers, which can be
extended through a Software Service Program (SSP) membership. NI has more than 400 support
engineers available around the globe to provide local support in more than 30 languages. Additionally,
take advantage of NI’s award winning online resources and communities.

©2017 National Instruments. All rights reserved. LabVIEW, National Instruments, NI, NI TestStand, and ni.com are trademarks of
National Instruments. Other product and company names listed are trademarks or trade names of their respective companies. The
contents of this Site could contain technical inaccuracies, typographical errors or out-of-date information. Information may be
updated or changed at any time, without notice. Visit ni.com/manuals for the latest information.
10 August 2017

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