‫هب انم خدا‬

‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ ‪ – ١٣٨٧‬ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬

‫ﻛﺎﺭﺑﺮﺩ ﺁﺯﻣﻮﻥ ﻏﻴﺮﻣﺨﺮﺏ ﺟﺮﻳﺎﻥ ﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺩﺭ ﺍﻧﺪﺍﺯﻩ ﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ‬

‫ﻓﻠﺰﺍﺕ‪ ،‬ﭘﻮﺷﺶ ﻫﺎﯼ ﻧﺎﺭﺳﺎﻧﺎ ﻭ ﺧﻮﺭﺩﮔﻲ ﺯﻳ ِﺮ ﺁﻧﻬﺎ‬

‫‪١‬ﻭ‪٢‬‬
‫ﺏ‪ .‬ﺭﮎ ﺭﮎ‪ ،١‬ﻡ‪ .‬ﻓﺘﺤﻲ‪ ،١‬ﻡ‪ .‬ﺳﻴﺪﻱ‪ ،١‬ﻑ‪ .‬ﻗﺎﺳﻤﻲ‪ ،١‬ﻥ‪ .‬ﻣﺤﻤﺪﺯﺍﺩﻩ‪١‬ﻭ‪ ٢‬ﻭ ﺍ‪ .‬ﻣﻮﺍﻓﻘﻲ‬
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‫ﺁﺯﻣﺎﻳﺸﮕﺎﻩﻫﺎﻱ ‪ NDT‬ﻣﺮﮐﺰ ﻧﻈﺎﻡ ﺍﻳﻤﻨﻲ ﻫﺴﺘﻪﺍﻱ ﮐﺸﻮﺭ‪ ،‬ﺳﺎﺯﻣﺎﻥ ﺍﻧﺮﮊﻱ ﺍﺗﻤﻲ ﺍﻳﺮﺍﻥ‪ ،‬ﺗﻬﺮﺍﻥ‬

‫‪ ٢‬ﭘﮋﻭﻫﺸﮕﺎﻩ ﻋﻠﻮﻡ ﻭ ﻓﻨﻮﻥ ﻫﺴﺘﻪﺍﯼ‪ ،‬ﺳﺎﺯﻣﺎﻥ ﺍﻧﺮﮊﻱ ﺍﺗﻤﻲ ﺍﻳﺮﺍﻥ‪ ،‬ﺗﻬﺮﺍﻥ‬

‫‪۱‬‬
‫‪Emails: [email protected] , [email protected]‬‬

‫ﭼﻜﻴﺪﻩ‬
‫ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻓﻠﺰﺍﺕ ﺍﺯ ﺭﻭﺷﻬﺎﻱ ﻏﻴﺮﻣﺨﺮﺏ ﻣﺨﺘﻠﻔﻲ ﺍﺯ ﺟﻤﻠﻪ ﺍﻭﻟﺘﺮﺍﺳﻮﻧﻴﮏ‪ ،‬ﺭﺍﺩﻳﻮﮔﺮﺍﻓﻲ ﻭ ﺟﺮﻳﺎﻥﻫﺎﻱ‬
‫ﮔﺮﺩﺍﺑﻲ ﻣﻲﺗﻮﺍﻥ ﺍﺳﺘﻔﺎﺩﻩ ﮐﺮﺩ ﮐﻪ ﻫﺮ ﻳﮏ ﺍﺯ ﺁﻧﻬﺎ ﺩﺍﺭﺍﻱ ﻣﺰﺍﻳﺎ ﻭ ﻣﺤﺪﻭﺩﻳﺖﻫﺎﻳﻲ ﻣﻲﺑﺎﺷﻨﺪ‪ .‬ﺍﺯ ﺭﻭﺵ ﺟﺮﻳﺎﻧﻬﺎﻱ ﮔﺮﺩﺍﺑﻲ‬
‫ﻓﻘﻂ ﻣﻲﺗﻮﺍﻥ ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻣﻮﺍﺩ ﺭﺳﺎﻧﺎ ﺑﺎ ﺿﺨﺎﻣﺖﻫﺎﻱ ﮐﻢ ﻭ ﻫﻤﭽﻨﻴﻦ ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻻﻳﻪﻫﺎﻱ‬
‫ﭘﻮﺷﺸﻲ ﺍﺳﺘﻔﺎﺩﻩ ﮐﺮﺩ‪ .‬ﻳﮑﻲ ﺍﺯ ﻣﻬﻤﺘﺮﻳﻦ ﻣﺰﺍﻳﺎﻱ ﺍﻳﻦ ﺭﻭﺵ ﺩﻗﺖ ﺑﺎﻻﻱ ﺁﻥ ﺩﺭ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﯼ ﻣﻲﺑﺎﺷﺪ‪ .‬ﺩﺭ ﺍﻳﻦ ﺗﺤﻘﻴﻖ ﺑﻪ‬
‫ﭼﮕﻮﻧﮕﻲ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻓﻠﺰﺍﺕ ﻏﻴﺮﺁﻫﻨﻲ ﻭ ﺿﺨﺎﻣﺖ ﻻﻳﻪ ﻫﺎﻱ ﭘﻮﺷﺸﻲ ﻧﺎﺭﺳﺎﻧﺎ ﺑﺮ ﺭﻭﻱ ﻓﻠﺰﺍﺕ ﻏﻴﺮﺁﻫﻨﻲ ﻭ ﻫﻤﭽﻨﻴﻦ‬
‫ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﻣﻴﺰﺍﻥ ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ ﺑﺎ ﺍﺳﺘﻔﺎﺩﻩ ﺍﺯ ﺁﺯﻣﻮﻥ ﻏﻴﺮﻣﺨﺮﺏ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﭘﺮﺩﺍﺧﺘﻪ ﺷﺪﻩ‬
‫ﺍﺳﺖ‪.‬‬

‫ﻛﻠﻤﺎﺕ ﻛﻠﻴﺪﻱ‪ :‬ﺿﺨﺎﻣﺖ ﺳﻨﺠﻲ‪ ،‬ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ‪ ،‬ﺁﺯﻣﻮﻥﻫﺎﻱ ﻏﻴﺮﻣﺨﺮﺏ‪ ،‬ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ‪ ،‬ﻓﻠﺰﺍﺕ ﻏﻴﺮﺁﻫﻨﻲ‬

‫ﻣﻘﺪﻣﻪ‬
‫ﺍﮔﺮ ﺟﺮﻳﺎﻥ ﻣﺘﻨﺎﻭﺑﻲ ﺍﺯ ﻳﮏ ﺭﺳﺎﻧﺎﯼ ﺍﻟﮑﺘﺮﻳﮑﻲ ﻣﺎﻧﻨﺪ ﺳﻴﻢ ﻣﺴﻲ ﻋﺒﻮﺭ ﺩﺍﺩﻩ ﺷﻮﺩ‪ ،‬ﺩﺭ ﺍﻃﺮﺍﻑ ﺁﻥ ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﺍﻳﺠﺎﺩ ﻣﻲﺷﻮﺩ‬
‫ﮐﻪ ﻣﺘﻨﺎﺳﺐ ﺑﺎ ﺗﻐﻴﻴﺮﺍﺕ ﺟﺮﻳﺎﻥ‪ ،‬ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﻧﻴﺰ ﺗﻐﻴﻴﺮ ﺧﻮﺍﻫﺪ ﮐﺮﺩ‪ .‬ﺍﮔﺮ ﺭﺳﺎﻧﺎﯼ ﺩﻳﮕﺮﻱ ﺍﻳﻦ ﻣﻴﺪﺍﻥ ﺭﺍ ﻗﻄﻊ ﻧﻤﺎﻳﺪ‪ ،‬ﺟﺮﻳﺎﻥ‬
‫ﺍﻟﮑﺘﺮﻳﮑﯽ ﻣﺘﻨﺎﻭﺑﻲ ﺩﺭ ﺁﻥ ﺍﻟﻘﺎ ﻣﻲﮔﺮﺩﺩ ﮐﻪ ﺑﻪ ﺟﺮﻳﺎﻥ ﮔﺮﺩﺍﺑﻲ ﻣﻮﺳﻮﻡ ﺍﺳﺖ‪ .‬ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺧﻮﺩ ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﺛﺎﻧﻮﻳﻪﺍﻱ‬
‫ﺍﻳﺠﺎﺩ ﻣﻲﮐﻨﻨﺪ ﮐﻪ ﺑﺎ ﻣﻴﺪﺍﻥ ﺍﻭﻟﻴﻪ ﻣﻮﻟﺪ ﺟﺮﻳﺎﻥ ﮔﺮﺩﺍﺑﻲ ﻣﻘﺎﺑﻠﻪ ﻣﻲﻧﻤﺎﻳﺪ‪ .‬ﺍﻳﻦ ﻓﺮﺁﻳﻨﺪ ﺍﺳﺎﺱ ﮐﺎﺭ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﯼ ﮔﺮﺩﺍﺑﯽ ﺍﺳﺖ‪ .‬ﺍﮔﺮ‬
‫ﺭﺳﺎﻧﺎﯼ ﺍﻟﮑﺘﺮﻳﮑﻲ ﺑﻪﺻﻮﺭﺕ ﻳﮏ ﺳﻴﻢﭘﻴﭻ ﺑﺎﺷﺪ ﻣﻴﺪﺍﻥ ﺣﺎﺻﻞ ﺑﻪﺻﻮﺭﺕ ﺷﮑﻞ ‪ ١‬ﺧﻮﺍﻫﺪ ﺑﻮﺩ ] ‪١‬ﻭ‪.[ ٢‬‬
‫ﭘﺮﻭﺏﻫﺎﻱ ﻣﻮﺭﺩ ﺍﺳﺘﻔﺎﺩﻩ ﺩﺭ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺍﺯ ﺳﻴﻢﭘﻴﭻﻫﺎﻳﻲ ﻣﺎﻧﻨﺪ ﺷﮑﻞ ‪ ١‬ﺗﺸﮑﻴﻞ ﺷﺪﻩﺍﻧﺪ ﺑﻪﻃﻮﺭﻱﮐﻪ ﺑﺎ ﻧﺰﺩﻳﮏ‬
‫ﮐﺮﺩﻥ ﭘﺮﻭﺏ )ﺳﻴﻢﭘﻴﭻ( ﺑﻪ ﻗﻄﻌﻪ ﺭﺳﺎﻧﺎ‪ ،‬ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﺣﺎﺻﻞ ﺍﺯ ﺳﻴﻢﭘﻴﭻ ﺗﻮﺳﻂ ﺍﻳﻦ ﺭﺳﺎﻧﺎ ﻗﻄﻊ ﺷﺪﻩ ﻭ ﺟﺮﻳﺎﻥ ﮔﺮﺩﺍﺑﻲ ﺩﺭ ﺁﻥ‬

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‫ﻣﺮﺟﻊ داﻧﺸﺠﻮﯾﺎن و ﻣﻬﻨﺪﺳﯿﻦ ﻣﻮاد‬
 ‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ ‪ – ١٣٨٧‬ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬

‫ﺗﺸﮑﻴﻞ ﻣﻲﺷﻮﺩ‪ .‬ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﺣﺎﺻﻞ ﺍﺯ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺑﺎ ﻣﻴﺪﺍﻥ ﺍﻭﻟﻴﻪ ﺳﻴﻢﭘﻴﭻ ﺩﺭ ﭘﺮﻭﺏ ﻣﺨﺎﻟﻔﺖ ﮐﺮﺩﻩ ﻭ ﺑﺮ ﻣﻘﺪﺍﺭ ﺁﻥ‬
‫ﺗﺎﺛﻴﺮ ﻣﻲﮔﺬﺍﺭﺩ )ﺷﮑﻞ ‪٢] (٢‬ﻭ‪.[ ٣‬‬

‫ﺷﮑﻞ ‪ -۱‬ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﻧﺎﺷﻲ ﺍﺯ ﻋﺒﻮﺭ ﺟﺮﻳﺎﻥ ﺍﻟﮑﺘﺮﻳﮑﻲ ﺍﺯ ﻳﮏ ﺳﻴﻢﭘﻴﭻ‬

‫ﺷﮑﻞ ‪ - ۲‬ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﺍﻭﻟﻴﻪ‪ ،‬ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺍﻳﺠﺎﺩ ﺷﺪﻩ ﻭ ﻣﻴﺪﺍﻥ ﺛﺎﻧﻮﻳﻪ ﻧﺎﺷﻲ ﺍﺯ ﺁﻥ‬

‫ﺍﮔﺮ ﭘﺮﻭﺏ ﺭﺍ ﺍﺯ ﺩﻳﺪ ﻣﺪﺍﺭ ﺍﻟﮑﺘﺮﻳﮑﻲ ﻣﻌﺎﺩﻝ ﺑﺮﺭﺳﻲ ﮐﻨﻴﻢ ﻣﻼﺣﻈﻪ ﻣﻲﺷﻮﺩ ﮐﻪ ﻣﺪﺍﺭ ﺷﺎﻣﻞ ﻳﮏ ﺳﻠﻒ ﻭ ﻳﮏ ﻣﻘﺎﻭﻣﺖ ﺍﺳﺖ ﮐﻪ‬
‫ﻣﻘﺎﺩﻳﺮ ﺍﻧﺪﻭﮐﺘﺎﻧﺲ ﻭ ﻣﻘﺎﻭﻣﺖ ﺁﻥ ﻣﺘﺎﺛﺮ ﺍﺯ ﺟﺮﻳﺎﻥ ﮔﺮﺩﺍﺑﻲ ﺗﺸﮑﻴﻞ ﺷﺪﻩ ﺩﺭ ﻗﻄﻌﻪ ﻣﻮﺭﺩ ﺁﺯﻣﺎﻳﺶ ﺍﺳﺖ‪ .‬ﺷﮑﻞ ‪ ٣‬ﺍﻳﻦ ﻣﺪﺍﺭ ﻣﻌﺎﺩﻝ‬
‫ﭘﺮﻭﺏ ﺭﺍ ﻧﺸﺎﻥ ﻣﻲﺩﻫﺪ‪.‬‬
‫ﺍﻣﭙﺪﺍﻧﺲ ﺳﻴﻢﭘﻴﭻ ﺑﺎ ﺗﻐﻴﻴﺮ ﭘﺎﺭﺍﻣﺘﺮﻫﺎﻱ ﻣﺨﺘﻠﻒ ﻗﻄﻌﻪ ﻣﻮﺭﺩ ﺁﺯﻣﺎﻳﺶ ﺗﻐﻴﻴﺮ ﻣﻲﮐﻨﺪ ﻭ ﺷﺎﻣﻞ ﻳﮏ ﻗﺴﻤﺖ ﺣﻘﻴﻘﻲ ﺑﺮﺍﺑﺮ ﺑﺎ ﻣﻘﺎﻭﻣﺖ‬
‫ﻭ ﻳﮏ ﻗﺴﻤﺖ ﻣﻮﻫﻮﻣﻲ ﺑﺮﺍﺑﺮ ﺑﺎ ﺍﻧﺪﻭﮐﺘﺎﻧﺲ ﺍﺳﺖ ﮐﻪ ﺩﺭ ﺷﮑﻞ ‪ ٣‬ﻣﺸﺨﺺ ﺷﺪﻩﺍﺳﺖ ]‪.[ ٤‬‬

‫ﺷﮑﻞ ‪ – ۳‬ﻣﺪﺍﺭ ﻣﻌﺎﺩﻝ ﭘﺮﻭﺏ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ‬

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‫ﻣﺮﺟﻊ داﻧﺸﺠﻮﯾﺎن و ﻣﻬﻨﺪﺳﯿﻦ ﻣﻮاد‬
 ‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ ‪ – ١٣٨٧‬ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬

‫ﺗﻐﻴﻴﺮ ﻫﺮ ﮐﺪﺍﻡ ﺍﺯ ﭘﺎﺭﺍﻣﺘﺮﻫﺎﯼ ﻗﻄﻌﻪ ﮐﺎﺭ ﻣﺎﻧﻨﺪ ﺭﺳﺎﻧﺎﻳﻲ‪ ،‬ﮔﺬﺭﺩﻫﻲ ﻣﻐﻨﺎﻃﻴﺴﻲ‪ ،‬ﺿﺨﺎﻣﺖ ﻭ ﻏﻴﺮﻩ ﮐﻪ ﻣﻮﺟﺐ ﺗﻐﻴﻴﺮ ﺩﺭ ﺷﮑﻞ ﻭ‬
‫ﺍﻧﺪﺍﺯﻩ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺷﻮﺩ ﺩﺭ ﺷﮑﻞ ﻭ ﺍﻧﺪﺍﺯﻩ ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﻧﺎﺷﻲ ﺍﺯ ﺟﺮﻳﺎﻥ ﮔﺮﺩﺍﺑﻲ ﺗﺎﺛﻴﺮ ﮔﺬﺷﺘﻪ ﻭ ﺑﺎﻋﺚ ﺗﻐﻴﻴﺮ ﺩﺭ‬
‫ﺍﻣﭙﺪﺍﻧﺲ ﻇﺎﻫﺮﻱ ﻭ ﻳﺎ ﺑﻪﻋﺒﺎﺭﺗﻲ ﺗﻐﻴﻴﺮ ﻣﻨﺤﻨﻲ ﻣﺸﺨﺼﻪ )ﻧﻘﻄﻪ ﮐﺎﺭ ﭘﺮﻭﺏ( ﺩﺭ ﺻﻔﺤﻪ ﺍﻣﭙﺪﺍﻧﺲ ﻣﻲﺷﻮﺩ‪ .‬ﺷﮑﻞ ‪ ٤‬ﻧﻤﻮﻧﻪﺍﻱ ﺍﺯ ﻣﻨﺤﻨﻲ‬
‫ﺗﻐﻴﻴﺮﺍﺕ ﺍﻣﭙﺪﺍﻧﺲ ﺑﺎ ﭘﺎﺭﺍﻣﺘﺮﻫﺎﻱ ﻣﺨﺘﻠﻒ ﺭﺍ ﻧﺸﺎﻥ ﻣﻲﺩﻫﺪ‪ .‬ﺍﺳﺎﺱ ﺁﺯﻣﻮﻥ ﺑﺎ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﻫﻢ ﺩﺭ ﺍﺻﻞ ﺍﻧﻄﺒﺎﻕ ﺗﻐﻴﻴﺮﺍﺕ ﻧﻘﻄﻪ‬
‫ﮐﺎﺭ ﺩﺭ ﺻﻔﺤﻪ ﺍﻣﭙﺪﺍﻧﺲ ﺑﺎ ﺗﻐﻴﻴﺮﺍﺕ ﻓﻴﺰﻳﮑﻲ ﻭ ﻣﮑﺎﻧﻴﮑﻲ ﻗﻄﻌﻪ ﻳﺎ ﻭﺿﻌﻴﺖ ﺳﻴﻢﭘﻴﭻ ﻧﺴﺒﺖ ﺑﻪ ﻗﻄﻌﻪ ﺍﺳﺖ ] ‪.[ ٥‬‬

‫ﺷﮑﻞ ‪ – ۴‬ﻧﻤﻮﻧﻪﺍﻱ ﺍﺯ ﺗﻐﻴﻴﺮﺍﺕ ﺍﻣﭙﺪﺍﻧﺲ ﺑﺎ ﭘﺎﺭﺍﻣﺘﺮﻫﺎﻱ ﻣﺨﺘﻠﻒ‬

‫ﻳﮏ ﻧﮑﺘﻪﻱ ﻣﻬﻢ ﺩﺭ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ‪ ،‬ﺳﻄﺤﻲ ﺑﻮﺩﻥ ﺍﻳﻦ ﺟﺮﻳﺎﻥ ﻳﺎ ﺑﻪ ﻋﺒﺎﺭﺕ ﺩﻳﮕﺮ ﮐﻢ ﺑﻮﺩﻥ ﻋﻤﻖ ﻧﻔﻮﺫ ﺁﻥ ﺍﺳﺖ ﮐﻪ‬
‫ﺍﻳﻦ ﺭﻭﺵ ﺭﺍ ﺑﺮﺍﻱ ﺗﺴﺖ ﻗﻄﻌﺎﺕ ﺑﺎ ﺿﺨﺎﻣﺖ ﮐﻢ ﺗﺎ ﺣﺪﺍﮐﺜﺮ ﭼﻨﺪ ﻣﻴﻠﻲﻣﺘﺮ ﻣﻨﺎﺳﺐ ﻣﻲﺳﺎﺯﺩ‪ .‬ﺭﻭﺵ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﻋﻼﻭﻩ ﺑﺮ‬
‫ﮐﺎﺭﺑﺮﺩ ﺩﺭ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻓﻠﺰﺍﺕ ﻧﺎﺯﮎ ﺩﺭ ﻳﺎﻓﺘﻦ ﻋﻴﻮﺏ ﺳﻄﺤﻲ ﻭ ﺯﻳﺮﺳﻄﺤﻲ‪ ،‬ﺗﺸﺨﻴﺺ ﺟﻨﺲ ﻗﻄﻌﻪ ﻭ ﺳﺎﺧﺘﺎﺭ ﮐﺮﻳﺴﺘﺎﻟﻲ ﻭ‬
‫ﻧﻴﺰ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻋﺎﻳﻖ ﺭﻭﻱ ﻓﻠﺰﺍﺕ )ﺑﺮ ﺍﺳﺎﺱ ﻣﻴﺰﺍﻥ ﻓﺎﺻﻠﻪ ﺳﻴﻢﭘﻴﭻ ﺑﺎ ﻗﻄﻌﻪ ﻓﻠﺰﻱ( ﻧﻴﺰ ﻣﻲﺗﻮﺍﻧﺪ ﺑﻪﮐﺎﺭ ﺭﻭﺩ‪.‬‬
‫ﺷﮑﻞ ‪ ٥‬ﻣﻨﺤﻨﻲ ﻣﺸﺨﺼﻪ ﺍﻣﭙﺪﺍﻧﺲ ﺭﺍ ﺑﺮﺍﻱ ﺗﻐﻴﻴﺮ ﺭﺳﺎﻧﺎﻳﻲ ﻭ ﺿﺨﺎﻣﺖ ﻗﻄﻌﻪ ﻧﻤﻮﻧﻪ ﺩﺭ ﻓﺮﮐﺎﻧﺲ ‪ 120 kHz‬ﻧﺸﺎﻥ ﻣﻲﺩﻫﺪ‪.‬ﺩﺭ‬
‫ﺍﻳﻦ ﺷﮑﻞ ﺳﻪ ﻣﻨﺤﻨﻲ ﻣﺸﺎﻫﺪﻩ ﻣﻲﮔﺮﺩﺩ‪ .‬ﺩﺭ ﻣﻨﺤﻨﻲ ‪ LIFT-OFF‬ﭘﺎﺭﺍﻣﺘﺮ ﻣﺘﻐﻴﺮ‪ ،‬ﻓﺎﺻﻠﻪ ﭘﺮﻭﺏ ﺍﺯ ﻗﻄﻌﻪ ﻣﻲﺑﺎﺷﺪ ﮐﻪ ﺑﺮﺍﻱ ﻳﮏ‬
‫ﻗﻄﻌﻪ ﻣﺴﻲ ﺭﺳﻢ ﺷﺪﻩ ﺍﺳﺖ ﻭ ﻣﻲﺗﻮﺍﻧﺪ ﺭﻭﺷﻲ ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻋﺎﻳﻖ ﺭﻭﻱ ﻓﻠﺰﺍﺕ ﺑﺎﺷﺪ‪ .‬ﺩﺭ ﻣﻨﺤﻨﻲ ‪Conductivity‬‬
‫ﭘﺎﺭﺍﻣﺘﺮ ﻣﺘﻐﻴﺮ‪ ،‬ﺭﺳﺎﻧﺎﺋﻲ ﺟﺴﻢ ﺍﺳﺖ ﮐﻪ ﺟﻨﺲ ﻓﻠﺰ ﺑﺎ ﺍﺳﺘﻔﺎﺩﻩ ﺍﺯ ﺁﻥ ﻣﺸﺨﺺ ﻣﻲﺷﻮﺩ‪ .‬ﺩﺭ ﻣﻨﺤﻨﻲ ‪ Thickness‬ﭘﺎﺭﺍﻣﺘﺮ ﻣﺘﻐﻴﺮ‪،‬‬
‫ﺿﺨﺎﻣﺖ ﻗﻄﻌﻪﻱ ﺑﺮﻧﺠﻲ ﺍﺳﺖ ﮐﻪ ﺑﻪ ﺻﻮﺭﺕ ﺍﻋﺪﺍﺩ ﻣﻨﺪﺭﺝ ﺭﻭﻱ ﺑﺮﺧﻲ ﻧﻘﺎﻁ ﺍﻳﻦ ﻣﻨﺤﻨﻲ )ﺑﺮﺣﺴﺐ ﻣﻴﻠﻲﻣﺘﺮ( ﻧﺸﺎﻥ ﺩﺍﺩﻩ ﺷﺪﻩ ﺍﺳﺖ‪.‬‬

‫ﺷﮑﻞ ‪ – ۵‬ﺍﺛﺮ ﺗﻐﻴﻴﺮﺍﺕ ﺭﺳﺎﻧﺎﻳﻲ‪ ،‬ﺿﺨﺎﻣﺖ ﻭ ‪ LIFT-OFF‬ﺩﺭ ﺩﻳﺎﮔﺮﺍﻡ ﺍﻣﭙﺪﺍﻧﺴﻲ‬

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‫ﻣﺮﺟﻊ داﻧﺸﺠﻮﯾﺎن و ﻣﻬﻨﺪﺳﯿﻦ ﻣﻮاد‬
 ‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ ‪ – ١٣٨٧‬ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬

‫ﭼﻨﺎﻧﭽﻪ ﻣﻼﺣﻈﻪ ﻣﻲﺷﻮﺩ ﺑﺎ ﺍﻓﺰﺍﻳﺶ ﺿﺨﺎﻣﺖ‪ ،‬ﻓﺎﺻﻠﻪ ﻧﻘﺎﻁ ﮐﻤﺘﺮ ﻣﻲﺷﻮﺩ ﺑﻄﻮﺭﻳﮑﻪ ﺩﺭ ﺿﺨﺎﻣﺖﻫﺎﻱ ﺑﺎﻻﺗﺮ ﺍﻓﺰﺍﻳﺶ ﺿﺨﺎﻣﺖ‬
‫ﻗﻄﻌﻪ ﺗﺎﺛﻴﺮﻱ ﺩﺭ ﻣﻨﺤﻨﻲ ﺍﻣﭙﺪﺍﻧﺲ ﻧﺨﻮﺍﻫﺪ ﺩﺍﺷﺖ‪ .‬ﺑﻪ ﺍﻳﻦ ﺗﺮﺗﻴﺐ ﻧﺘﻴﺠﻪ ﻣﻲﺷﻮﺩ ﮐﻪ ﺩﻗﺖ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﯼ ﺍﻳﻦ ﺭﻭﺵ ﺩﺭ ﻗﻄﻌﺎﺕ‬
‫ﮐﻢﺿﺨﺎﻣﺖ‪ ،‬ﺑﺴﻴﺎﺭ ﺑﺎﻻ ﺑﻮﺩﻩ ﻭ ﺑﺮﻋﮑﺲ ﺩﺭ ﺿﺨﺎﻣﺖﻫﺎﻱ ﺑﺎﻻ‪ ،‬ﺣﺴﺎﺳﻴﺖ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﮐﻢ ﻣﻲﺷﻮﺩ ﻭ ﺣﺘﻲ ﺩﺭ ﺿﺨﺎﻣﺖﻫﺎﻱ ﺑﺎﻻﺗﺮ ﺍﺯ‬
‫ﺣﺪ ﻣﻌﻴﻦ )ﻋﻤﻖ ﻧﻔﻮﺫ ﺟﺮﻳﺎﻥ ﮔﺮﺩﺍﺑﻲ ﺩﺭ ﻗﻄﻌﻪ ﻣﻮﺭﺩ ﻧﻈﺮ( ﺗﻐﻴﻴﺮ ﺿﺨﺎﻣﺖ ﻫﻴﭻ ﺗﺎﺛﻴﺮﻱ ﺩﺭ ﻣﻨﺤﻨﻲ ﻧﺪﺍﺷﺘﻪ ﻭ ﻟﺬﺍ ﻗﺎﺑﻞ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ‬
‫ﻧﻴﺰ ﻧﺨﻮﺍﻫﺪ ﺑﻮﺩ‪ .‬ﺍﻟﺒﺘﻪ ﮐﺎﻫﺶ ﻓﺮﮐﺎﻧﺲ ﺑﺎﻋﺚ ﺍﻓﺰﺍﻳﺶ ﻋﻤﻖ ﻧﻔﻮﺫ ﻣﻲﺷﻮﺩ ﻭ ﺗﺎ ﺣﺪﻱ ﮔﺴﺘﺮﻩ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﺭﺍ ﺍﻓﺰﺍﻳﺶ ﻣﻲﺩﻫﺪ‪.‬‬
‫ﺷﮑﻞ ‪ ٦‬ﺗﺎﺛﻴﺮ ﻓﺮﮐﺎﻧﺲ ﺩﺭ ﺿﺨﺎﻣﺖﺳﻨﺠﻲ ﺭﺍ ﻧﺸﺎﻥ ﻣﻲﺩﻫﺪ‪.‬‬

‫ﺷﮑﻞ ‪ -۶‬ﺍﺛﺮ ﻓﺮﮐﺎﻧﺲ ﺑﺮ ﻣﻨﺤﻨﻲ ﺩﻳﺎﮔﺮﺍﻡ ﺍﻣﭙﺪﺍﻧﺴﻲ‬

‫ﭼﻨﺎﻧﭽﻪ ﻣﻼﺣﻈﻪ ﻣﻲﺷﻮﺩ ﺍﮔﺮ ﺑﺨﻮﺍﻫﻴﻢ ﺿﺨﺎﻣﺖ ﻗﻄﻌﺎﺕ ﺿﺨﻴﻢﺗﺮ ﺭﺍ ﺍﻧﺪﺍﺯﻩ ﺑﮕﻴﺮﻳﻢ ﺑﺎﻳﺪ ﻣﺎﻧﻨﺪ ﻧﻤﻮﺩﺍﺭ ﺳﻤﺖ ﭼﭗ ﺩﺭ ﺷﮑﻞ ‪ ٦‬ﺍﺯ‬
‫ﻓﺮﮐﺎﻧﺲ ﭘﺎﺋﻴﻦ ﺍﺳﺘﻔﺎﺩﻩ ﮐﻨﻴﻢ ﮐﻪ ﺩﺭ ﺍﻳﻦ ﺻﻮﺭﺕ ﺩﻗﺖ ﺑﺮﺍﻱ ﺿﺨﺎﻣﺖﻫﺎﻱ ﮐﻢ ﭘﺎﺋﻴﻦ ﻣﻲﺁﻳﺪ‪ .‬ﺑﺮﺍﻱ ﺍﻓﺰﺍﻳﺶ ﺩﻗﺖ ﺩﺭ ﺿﺨﺎﻣﺖﻫﺎﻱ ﮐﻢ‬
‫ﺑﺎﻳﺪ ﻫﻤﺎﻧﻨﺪ ﻧﻤﻮﺩﺍﺭ ﺳﻤﺖ ﺭﺍﺳﺖ‪ ،‬ﺍﺯ ﻓﺮﮐﺎﻧﺲ ﺑﺎﻻﺗﺮﻱ ﺍﺳﺘﻔﺎﺩﻩ ﺷﻮﺩ‪.‬‬
‫ﺩﺭ ﺻﻮﺭﺗﻲ ﮐﻪ ﻓﻠﺰ ﭘﺎﻳﻪ ﺗﺤﺖ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺍﺯ ﺟﻨﺲ ﺁﻫﻦ ﺑﺎﺷﺪ‪ ،‬ﺑﻪ ﺩﻟﻴﻞ ﺍﻳﻨﮑﻪ ﺍﻳﻨﮕﻮﻧﻪ ﻓﻠﺰﺍﺕ ﺑﺎﻋﺚ ﺗﺸﺪﻳﺪ ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ‬
‫ﭘﺮﻭﺏ ﻣﯽﺷﻮﺩ‪ ،‬ﻧﻘﺶ ﺗﻐﻴﻴﺮﺍﺕ ﻣﻴﺪﺍﻥ ﻣﻐﻨﺎﻃﻴﺴﻲ ﺣﺎﺻﻞ ﺍﺯ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺩﺭ ﻣﻘﺎﺑﻞ ﺁﻧﻬﺎ ﺑﻪ ﺷﺪﺕ ﻧﺎﭼﻴﺰ ﺧﻮﺍﻫﺪ ﺑﻮﺩ‪ ،‬ﺍﻧﺠﺎﻡ‬
‫ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺭﻭﻱ ﺍﻳﻨﮕﻮﻧﻪ ﻓﻠﺰﺍﺕ ﺩﺷﻮﺍﺭ ﻭ ﻣﺴﺘﻠﺰﻡ ﺍﺳﺘﻔﺎﺩﻩ ﺍﺯ ﺗﺠﻬﻴﺰﺍﺕ ﻻﺯﻡ ﺑﺮﺍﻱ ﺍﺷﺒﺎﻉ ﻣﻐﻨﺎﻃﻴﺴﻲ ﻗﻄﻌﻪ ﮐﺎﺭ‬
‫ﻣﻲﺑﺎﺷﺪ‪ .‬ﺑﺎ ﺍﻳﻦ ﺣﺎﻝ ﺍﻧﺠﺎﻡ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺭﻭﻱ ﻓﻠﺰﺍﺕ ﺁﻫﻨﻲ ﺣﺘﻲ ﺑﺎ ﺍﺷﺒﺎﻉ ﻣﻐﻨﺎﻃﻴﺴﻲ ﻗﻄﻌﻪ ﮐﺎﺭ ﻧﻴﺰ ﺍﺯ ﺩﻗﺖ ﭼﻨﺪﺍﻥ‬
‫ﺑﺎﻻﻳﻲ ﺑﺮﺧﻮﺭﺩﺍﺭ ﻧﺨﻮﺍﻫﺪ ﺑﻮﺩ‪.‬‬
‫ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ ﻋﺎﻳﻖ‪ ،‬ﺍﺯ ﻣﻨﺤﻨﻲ ‪ LIFT-OFF‬ﻧﻮﻋﻲ ﻧﺸﺎﻥ ﺩﺍﺩﻩ ﺷﺪﻩ ﺩﺭ ﺷﮑﻞ‪ ٥‬ﺍﺳﺘﻔﺎﺩﻩ ﻣﻲﺷﻮﺩ‪.‬‬
‫ﻫﻤﺎﻧﮕﻮﻧﻪ ﮐﻪ ﺫﮐﺮ ﺷﺪ‪ ،‬ﻣﻨﺤﻨﻲ ‪ LIFT-OFF‬ﻧﺸﺎﻥ ﺩﻫﻨﺪﻩ ﻓﺎﺻﻠﻪ ﭘﺮﻭﺏ ﺗﺎ ﻗﻄﻌﻪ ﺍﺳﺖ‪ .‬ﺍﺯ ﺁﻧﺠﺎﻳﻲ ﮐﻪ ﺩﺭ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ‬
‫ﮔﺮﺩﺍﺑﻲ‪ ،‬ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﻋﺎﻳﻖ ﻧﻘﺸﻲ ﻣﻌﺎﺩﻝ ﻓﺎﺻﻠﻪ ﺍﺯ ﻗﻄﻌﻪ ﺭﺍ ﺍﻳﻔﺎ ﻣﻲﮐﻨﺪ‪ ،‬ﻣﻲﺗﻮﺍﻥ ﺗﺼﻮﺭ ﻧﻤﻮﺩ ﮐﻪ ﺑﺎ ﺗﻐﻴﻴﺮ ﺿﺨﺎﻣﺖ ﻋﺎﻳﻖ ﻣﻨﺤﻨﻲ‬
‫ﻣﺸﺨﺼﻪ ﺍﻣﭙﺪﺍﻧﺲ ﭘﺮﻭﺏ ﭼﮕﻮﻧﻪ ﺗﻐﻴﻴﺮ ﺧﻮﺍﻫﺪ ﮐﺮﺩ‪ .‬ﻳﻌﻨﻲ ﻫﺮ ﭼﻪ ﺿﺨﺎﻣﺖ ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﺑﻴﺸﺘﺮ ﺑﺎﺷﺪ‪ ،‬ﻧﻘﻄﻪ ﮐﺎﺭ ﻓﺎﺻﻠﻪ ﺑﻴﺸﺘﺮﻱ‬
‫ﻧﺴﺒﺖ ﺑﻪ ﻧﻘﻄﻪ ﮐﺎﺭ ﺩﺭ ﺣﺎﻟﺖ ﻓﻠﺰ ﺑﺪﻭﻥ ﭘﻮﺷﺶ ﺭﺍ ﺧﻮﺍﻫﺪ ﺩﺍﺷﺖ‪.‬‬
‫ﺍﺯ ﺁﻧﺠﺎﮐﻪ ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪﻱ ﭘﻮﺷﺸﻲ ﺑﻪ ﻣﻨﺰﻟﻪ ﺍﺿﺎﻓﻪ ﺷﺪﻥ ﻓﺎﺻﻠﻪ ﭘﺮﻭﺏ ﺍﺯ ﻗﻄﻌﻪ ﻋﻤﻞ ﻣﻲﮐﻨﺪ‪ ،‬ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﻣﻴﺰﺍﻥ‬
‫ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ ﻧﻴﺰ ﺍﺯ ﻣﻨﺤﻨﻲ ‪ LIFT-OFF‬ﺍﺳﺘﻔﺎﺩﻩ ﻣﻲﺷﻮﺩ‪ .‬ﺑﻪ ﺍﻳﻦ ﺗﺮﺗﻴﺐ ﻫﺮ ﭼﻪ ﻣﻴﺰﺍﻥ ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪ‬
‫ﭘﻮﺷﺸﻲ ﺑﻴﺸﺘﺮ ﺑﺎﺷﺪ‪ ،‬ﭘﺮﻭﺏ ﻓﺎﺻﻠﻪ ﺑﻴﺸﺘﺮﻱ ﺗﺎ ﺳﻄﺢ ﮐﺎﺭ ﺩﺍﺷﺘﻪ ﻭ ﻧﻘﻄﻪ ﮐﺎﺭ ﺭﻭﻱ ﺻﻔﺤﻪ ﺍﻣﭙﺪﺍﻧﺴﻲ ﻧﻴﺰ ﻓﺎﺻﻠﻪ ﺑﻴﺸﺘﺮﻱ ﻧﺴﺒﺖ ﺑﻪ‬
‫ﻧﻘﻄﻪ ﮐﺎﺭ ﺩﺭ ﺣﺎﻟﺖ ﺑﺪﻭﻥ ﺧﻮﺭﺩﮔﻲ ﺧﻮﺍﻫﺪ ﺩﺍﺷﺖ‪.‬‬

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‫ﻣﺮﺟﻊ داﻧﺸﺠﻮﯾﺎن و ﻣﻬﻨﺪﺳﯿﻦ ﻣﻮاد‬
 ‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ ‪ – ١٣٨٧‬ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬

‫ﺷﺮﺡ ﺁﺯﻣﺎﻳﺶﻫﺎ‬
‫ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻓﻠﺰ ﺭﺳﺎﻧﺎﻱ ﻏﻴﺮﺁﻫﻨﻲ‬
‫ﺑﻪ ﻣﻨﻈﻮﺭ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻓﻠﺰ ﺭﺳﺎﻧﺎﻱ ﻏﻴﺮﺁﻫﻨﻲ ﺍﺯ ﻳﮏ ﻗﻄﻌﻪ ﻣﺴﻲ ﭘﻠﻪﺍﻱ ﮐﻪ ﺑﻪ ﺻﻮﺭﺕ ﺷﻤﺎﺗﻴﮏ ﺩﺭ ﺷﮑﻞ ‪ ٧‬ﻧﺸﺎﻥ ﺩﺍﺩﻩ‬
‫ﺷﺪﻩ ﺍﺳﺘﻔﺎﺩﻩ ﮔﺮﺩﻳﺪ‪ .‬ﺍﻋﺪﺍﺩ ﻣﻨﺪﺭﺝ‪ ،‬ﺿﺨﺎﻣﺖ ﻭﺍﻗﻌﻲ ﭘﻠﻪﻫﺎ ﺭﺍ ﮐﻪ ﺗﻮﺳﻂ ﮐﻮﻟﻴﺲ ﺩﻳﺠﻴﺘﺎﻝ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺷﺪﻩﺍﻧﺪ‪ ،‬ﻧﺸﺎﻥ ﻣﻲﺩﻫﺪ‪.‬‬

‫ﺷﮑﻞ ‪ – ۷‬ﻗﻄﻌﻪ ﻣﺴﯽ ﻣﻮﺭﺩ ﻧﻈﺮ ﺑﺮﺍﻱ ﺿﺨﺎﻣﺖﺳﻨﺠﻲ ﻭ ﺿﺨﺎﻣﺖ ﻫﺮ ﻳﮏ ﺍﺯ ﻧﻮﺍﺣﻲ ﺁﻥ‬

‫ﺁﺯﻣﺎﻳﺶ ﺗﻮﺳﻂ ﺩﺳﺘﮕﺎﻩ ‪ ELOTEST B300‬ﻭ ﭘﺮﻭﺏ ‪ KAS 61-7‬ﺳﺎﺧﺖ ﺷﺮﮐﺖ ﺭﻭﻫﻤﻦ‪ ،‬ﺩﺭ ﻓﺮﮐﺎﻧﺲ ‪ 1kHz‬ﺍﻧﺠﺎﻡ ﮔﺮﻓﺖ‪.‬‬
‫ﺷﮑﻞ ‪ ٨‬ﺁﺭﺍﻳﺸﻲ ﺍﺯ ﺍﻧﺠﺎﻡ ﺁﺯﻣﺎﻳﺶ ﺭﺍ ﻧﺸﺎﻥ ﻣﻲﺩﻫﺪ‪.‬‬

‫ﺷﮑﻞ‪ – ۸‬ﻧﺘﺎﻳﺞ ﺁﺯﻣﺎﻳﺶ ﺿﺨﺎﻣﺖﺳﻨﺠﻲ ﺑﺎ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ‬

‫ﺩﺭ ﺷﮑﻞ ‪ ٩‬ﻣﻨﺤﻨﻲ ﻣﺮﺑﻮﻁ ﺑﻪ ﻗﻄﻌﻪ ﻣﺴﻲ ﺑﺎ ﺍﺳﺘﻔﺎﺩﻩ ﺍﺯ ﻧﻘﺎﻁ ﺑﻪﺩﺳﺖ ﺁﻣﺪﻩ ﺍﺯ ﺁﺯﻣﺎﻳﺶ ﺩﺭ ﺻﻔﺤﻪ ﺍﻣﭙﺪﺍﻧﺲ ﺭﺳﻢ ﺷﺪﻩ ﺍﺳﺖ‪.‬‬

‫ﺷﮑﻞ ‪ – ۹‬ﻧﻤﻮﺩﺍﺭ ﺿﺨﺎﻣﺖ ﻗﻄﻌﻪ ﻣﺴﻲ ﻣﻮﺭﺩ ﻧﻈﺮ ﺩﺭ ﺻﻔﺤﻪ ﺍﻣﭙﺪﺍﻧﺲ‬

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‫ﻣﺮﺟﻊ داﻧﺸﺠﻮﯾﺎن و ﻣﻬﻨﺪﺳﯿﻦ ﻣﻮاد‬
 ‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ ‪ – ١٣٨٧‬ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬

‫ﻫﻤﺎﻧﻄﻮﺭﮐﻪ ﺩﺭ ﺍﻳﻦ ﺷﮑﻞ ﺩﻳﺪﻩ ﻣﻲﺷﻮﺩ ﻗﺪﺭﺕ ﺗﻔﮑﻴﮏ ﻣﺨﺼﻮﺻ ًﺎ ﺩﺭ ﺿﺨﺎﻣﺖﻫﺎﻱ ﭘﺎﺋﻴﻦ ﺑﺴﻴﺎﺭ ﺯﻳﺎﺩ ﺍﺳﺖ‪ .‬ﺩﺭ ﺍﻳﻦ ﺷﮑﻞ ﻧﻘﺎﻁ‬
‫ﺩﺍﺩﻩ ﺷﺪﻩ ﻫﺮﮐﺪﺍﻡ ﺑﻴﺎﻧﮕﺮ ﺿﺨﺎﻣﺘﻲ ﺍﺯ ﻗﻄﻌﻪ ﻣﻲﺑﺎﺷﻨﺪ‪ .‬ﺑﺎ ﺗﻮﺟﻪ ﺑﻪ ﻓﺎﺻﻠﻪ ﺯﻳﺎﺩ ﻧﻘﺎﻁ ﺩﺭ ﺿﺨﺎﻣﺖﻫﺎﻱ ﮐﻢ‪ ،‬ﺍﻳﻦ ﺭﻭﺵ ﺩﺭ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ‬
‫ﺿﺨﺎﻣﺖﻫﺎﻱ ﮐﻢ ﺑﺴﻴﺎﺭ ﻣﻨﺎﺳﺐ ﺍﺳﺖ‪.‬‬

‫ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﻋﺎﻳﻖ‬

‫ﺑﻪ ﻣﻨﻈﻮﺭ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﺑﺮ ﺭﻭﻱ ﻓﻠﺰﺍﺕ ﻏﻴﺮ ﺁﻫﻨﻲ‪ ،‬ﺍﺯ ﻻﻳﻪﻫﺎﻱ ﻋﺎﻳﻘﻲ ﮐﻪ ﺿﺨﺎﻣﺖ ﻫﺮﻳﮏ ﺍﺯ ﺁﻧﻬﺎ ﺣﺪﻭﺩ ‪٥٠‬‬
‫ﻣﻴﮑﺮﻭﻥ ﺍﺳﺖ ﻭ ﺍﺯ ﻳﮏ ﺗﻴﻐﻪﻱ ﺁﻟﻮﻣﻴﻨﻴﻮﻣﻲ ﺑﻪ ﻋﻨﻮﺍﻥ ﻓﻠﺰ ﭘﺎﻳﻪ ﺍﺳﺘﻔﺎﺩﻩ ﺷﺪ‪ .‬ﺩﺭ ﺍﻳﻦ ﺁﺯﻣﺎﻳﺶ ﺍﺯ ﭘﺮﻭﺏ ‪ PLA 33-11‬ﻭ ﻓﺮﮐﺎﻧﺲ ﮐﺎﺭ‬
‫‪ ٥‬ﮐﻴﻠﻮﻫﺮﺗﺰ ﺍﺳﺘﻔﺎﺩﻩ ﺷﺪ‪ .‬ﺩﺭ ﺍﻳﻦ ﺁﺯﻣﺎﻳﺶ ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖﻫﺎﻱ ﻣﺨﺘﻠﻒ ﻫﺮ ﺑﺎﺭ ﻳﮏ ﻻﻳﻪ ﻋﺎﻳﻖ ﺍﺿﺎﻓﻪ ﻣﻲﺷﺪ ﻭ ﺁﺯﻣﺎﻳﺶ ﺗﺎ‬
‫ﻗﺮﺍﺭ ﺩﺍﺩﻥ ‪ ١٠‬ﻻﻳﻪ ﭘﻮﺷﺸﻲ ‪ ٥٠‬ﻣﻴﮑﺮﻭﻧﻲ ﺍﺩﺍﻣﻪ ﻳﺎﻓﺖ‪ .‬ﺷﮑﻞ ‪ ١٠‬ﻧﺘﺎﻳﺞ ﺑﺪﺳﺖ ﺁﻣﺪﻩ ﺍﺯ ﺍﻳﻦ ﺁﺯﻣﺎﻳﺶ ﺭﺍ ﻧﺸﺎﻥ ﻣﻲﺩﻫﺪ‪.‬‬

‫ﺷﮑﻞ ‪ -۱۰‬ﻧﺘﺎﻳﺞ ﺁﺯﻣﺎﻳﺶ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ‬

‫ﺧﻂ ﻗﺎﺋﻢ ﮐﻪ ﺑﻠﻨﺪﺗﺮﻳﻦ ﺩﺍﻣﻨﻪ ﺳﻴﮕﻨﺎﻝ ﺭﺍ ﻧﻴﺰ ﺩﺍﺭﺍ ﻣﻲﺑﺎﺷﺪ ﻣﺮﺑﻮﻁ ﺑﻪ ﺣﺎﻟﺘﻲ ﺍﺳﺖ ﮐﻪ ﻫﻴﭻ ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﺭﻭﻱ ﻓﻠﺰ ﭘﺎﻳﻪ ﻗﺮﺍﺭ‬
‫ﻧﺪﺍﺭﺩ ﻭ ﺑﻪ ﺗﺮﺗﻴﺐ ﺑﺎ ﭼﺮﺧﺶ ﺩﺭ ﺟﻬﺖ ﻋﻘﺮﺑﻪﻫﺎﻱ ﺳﺎﻋﺖ ﻫﺮ ﺳﻴﮕﻨﺎﻝ ﻣﺮﺑﻮﻁ ﺑﻪ ﺍﻓﺰﻭﺩﻥ ﻳﮏ ﻻﻳﻪ ﻋﺎﻳﻖ ﻣﻲﺑﺎﺷﺪ‪ .‬ﺍﻓﺰﻭﺩﻥ ﻻﻳﻪﻫﺎﻱ‬
‫ﻋﺎﻳﻖ ﺩﺭ ﻋﻤﻞ ﺭﻭﻱ ﻓﺎﺯ ﺳﻴﮕﻨﺎﻝ ﻫﻴﭻ ﺗﺎﺛﻴﺮﻱ ﻧﺪﺍﺭﺩ ﻭ ﺍﺧﺘﻼﻑ ﻓﺎﺯ ﻣﺸﺎﻫﺪﻩ ﺷﺪﻩ ﺩﺭ ﺷﮑﻞ ‪ ١٠‬ﺑﻪ ﺻﻮﺭﺕ ﻣﺼﻨﻮﻋﻲ ﻭ ﺍﺯ ﻃﺮﻳﻖ ﺍﻋﻤﺎﻝ‬
‫‪ ١٠‬ﺩﺭﺟﻪ ﺗﻐﻴﻴﺮ ﺩﺭ ﻓﺎﺯ ﺳﻴﮕﻨﺎﻝ ﺩﺳﺘﮕﺎﻩ ﺑﻪ ﺍﺯﺍﺀ ﺍﻓﺰﻭﺩﻥ ﻫﺮ ﻻﻳﻪ‪ ،‬ﻭ ﺻﺮﻓﺎً ﺑﻪ ﻣﻨﻈﻮﺭ ﻗﺮﺍﺋﺖ ﻭ ﻧﻤﺎﻳﺶ ﻣﻨﺎﺳﺐ ﺳﻴﮕﻨﺎﻝ ﺍﻋﻤﺎﻝ ﺷﺪﻩ‬
‫ﺍﺳﺖ‪ .‬ﻫﻤﺎﻧﮕﻮﻧﻪ ﮐﻪ ﻣﻼﺣﻈﻪ ﻣﻲﺷﻮﺩ ﺑﻪ ﺍﺯﺍﺀ ﺗﻐﻴﻴﺮ ﺿﺨﺎﻣﺖ ﻻﻳﻪ ﭘﻮﺷﺸﻲ‪ ،‬ﺗﻐﻴﻴﺮ ﺩﺍﻣﻨﻪ ﺳﻴﮕﻨﺎﻝﻫﺎﻱ ﺣﺎﺻﻞ ﺍﺯ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ‬
‫ﻼ ﻣﺘﻤﺎﻳﺰ ﺩﺭ ﺍﻳﻦ ﮔﺴﺘﺮﻩ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﻣﺸﺎﻫﺪﻩ ﻣﻲﺷﻮﺩ‪.‬‬
‫ﻼ ﻭﺍﺿﺢ ﺍﺳﺖ ﻭ ﺳﻴﮕﻨﺎﻝﻫﺎﻱ ﺑﺎ ﺩﺍﻣﻨﻪ ﮐﺎﻣ ً‬
‫ﮔﺮﺩﺍﺑﻲ ﮐﺎﻣ ً‬

‫ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﻋﺎﻳﻖ‬

‫ﺑﻪ ﻣﻨﻈﻮﺭ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﻣﻴﺰﺍﻥ ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﺍﺯ ﻳﮏ ﻻﻳﻪ ﻋﺎﻳﻖ ﮐﻪ ﺿﺨﺎﻣﺖ ﺁﻥ ﺣﺪﻭﺩﺍً ‪ ٥٠٠‬ﻣﻴﮑﺮﻭﻥ ﺍﺳﺖ ﻭ ﺍﺯ ﻳﮏ‬
‫ﺗﻴﻐﻪ ﺁﻟﻮﻣﻴﻨﻴﻮﻣﻲ ﮐﻪ ﺑﻪ ﻣﻨﻈﻮﺭ ﺷﺒﻴﻪﺳﺎﺯﻱ ﺧﻮﺭﺩﮔﻲ ﻣﻘﺪﺍﺭﻱ ﺍﺯ ﺿﺨﺎﻣﺖ ﺁﻥ ﺩﺭ ﺳﻪ ﻣﻮﺿﻊ ﺑﺮﺩﺍﺷﺘﻪ ﺷﺪﻩ ﺍﺳﺖ ﺑﻪ ﻋﻨﻮﺍﻥ ﻓﻠﺰ ﭘﺎﻳﻪ‬
‫ﺍﺳﺘﻔﺎﺩﻩ ﺷﺪ‪ .‬ﻋﻤﻖ ﺧﻮﺭﺩﮔﻲﻫﺎ ﺩﺭ ﺍﻳﻦ ﻧﻤﻮﻧﻪ ‪ ٠/٦، ٠/٣‬ﻭ ‪ ٠/٩‬ﻣﻴﻠﻲﻣﺘﺮ ﺍﺳﺖ‪ .‬ﺁﺭﺍﻳﺶ ﻣﻮﺭﺩ ﺍﺳﺘﻔﺎﺩﻩ ﺩﺭ ﺍﻳﻦ ﺁﺯﻣﺎﻳﺶ ﺩﺭ ﺷﮑﻞ ‪١١‬‬
‫ﻧﺸﺎﻥ ﺩﺍﺩﻩ ﺷﺪﻩ ﺍﺳﺖ‪.‬‬

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 ‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ ‪ – ١٣٨٧‬ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬

‫ﺷﮑﻞ ‪ -۱۱‬ﻗﻄﻌﻪﯼ ﺁﻟﻮﻣﻴﻨﻴﻤﯽ ﻭ ﺁﺭﺍﻳﺶ ﻣﻮﺭﺩ ﺍﺳﺘﻔﺎﺩﻩ ﺩﺭ ﺁﺯﻣﺎﻳﺶ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺧﻮﺭﺩﮔﻲ‬

‫ﺩﺭ ﺍﻳﻦ ﺁﺯﻣﺎﻳﺶ ﻧﻴﺰ ﺍﺯ ﭘﺮﻭﺏ ‪ PLA 33-11‬ﻭ ﻓﺮﮐﺎﻧﺲ ﮐﺎﺭ ‪ ٥‬ﮐﻴﻠﻮﻫﺮﺗﺰ ﺍﺳﺘﻔﺎﺩﻩ ﺷﺪ‪ .‬ﺧﻂ ﻗﺎﺋﻢ ﮐﻪ ﺑﻠﻨﺪﺗﺮﻳﻦ ﺩﺍﻣﻨﻪ ﺳﻴﮕﻨﺎﻝ ﺭﺍ‬
‫ﻧﻴﺰ ﺩﺍﺭﺍ ﻣﻲﺑﺎﺷﺪ ﻣﺮﺑﻮﻁ ﺑﻪ ﺣﺎﻟﺘﻲ ﺍﺳﺖ ﮐﻪ ﺧﻮﺭﺩﮔﻲ ﻭﺟﻮﺩ ﻧﺪﺍﺭﺩ ﻭ ﺑﻪ ﺗﺮﺗﻴﺐ ﺑﺎ ﭼﺮﺧﺶ ﺩﺭ ﺟﻬﺖ ﻋﻘﺮﺑﻪﻫﺎﻱ ﺳﺎﻋﺖ ﻫﺮ ﺳﻴﮕﻨﺎﻝ‬
‫ﻣﺮﺑﻮﻁ ﺑﻪ ﺗﺮﺗﻴﺐ ﻣﺮﺑﻮﻁ ﺑﻪ ﺧﻮﺭﺩﮔﻲﻫﺎﻱ ‪ ٠/٦، ٠/٣‬ﻭ ‪ ٠/٩‬ﻣﻴﻠﻲﻣﺘﺮ ﺍﺳﺖ‪ .‬ﻧﺘﺎﻳﺞ ﺍﻳﻦ ﺁﺯﻣﺎﻳﺶ ﺩﺭ ﺷﮑﻞ ‪ ١٢‬ﻧﺸﺎﻥ ﺩﺍﺩﻩ ﺷﺪﻩﺍﻧﺪ‪.‬‬

‫ﺷﮑﻞ ‪ -۱۲‬ﻧﺘﺎﻳﺞ ﺁﺯﻣﺎﻳﺶ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ‬

‫ﻫﻤﺎﻧﻨﺪ ﺁﺯﻣﺎﻳﺶﻫﺎﯼ ﻗﺒﻞ ﺍﻓﺰﺍﻳﺶ ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻋﺎﻳﻖ ﺩﺭ ﻋﻤﻞ ﺭﻭﻱ ﻓﺎﺯ ﺳﻴﮕﻨﺎﻝ ﻫﻴﭻ ﺗﺎﺛﻴﺮﻱ ﻧﺪﺍﺭﺩ ﻭ ﺍﺧﺘﻼﻑ ﻓﺎﺯ ﻣﺸﺎﻫﺪﻩ‬
‫ﺷﺪﻩ ﺩﺭ ﺷﮑﻞ ‪ ١٢‬ﺑﻪ ﺻﻮﺭﺕ ﻣﺼﻨﻮﻋﻲ ﻭ ﺍﺯ ﻃﺮﻳﻖ ﺍﻋﻤﺎﻝ ‪ ١٠‬ﺩﺭﺟﻪ ﺗﻐﻴﻴﺮ ﺩﺭ ﻓﺎﺯ ﺳﻴﮕﻨﺎﻝ ﺩﺳﺘﮕﺎﻩ ﺑﻪ ﺍﺯﺍﺀ ﻫﺮ ﻳﮏ ﺍﺯ ﺧﻮﺭﺩﮔﻲﻫﺎﺳﺖ‬
‫ﮐﻪ ﺻﺮﻓ ًﺎ ﺑﻪ ﻣﻨﻈﻮﺭ ﻗﺮﺍﺋﺖ ﻭ ﻧﻤﺎﻳﺶ ﻣﻨﺎﺳﺐ ﺳﻴﮕﻨﺎﻝ ﺍﻋﻤﺎﻝ ﺷﺪﻩ ﺍﺳﺖ‪ .‬ﻫﻤﺎﻧﮕﻮﻧﻪ ﮐﻪ ﻣﻼﺣﻈﻪ ﻣﻲﺷﻮﺩ ﺑﻪ ﺍﺯﺍﺀ ﺗﻐﻴﻴﺮ ﻣﻴﺰﺍﻥ‬
‫ﻼ ﻭﺍﺿﺢ ﺍﺳﺖ ﻭ ﺳﻴﮕﻨﺎﻝﻫﺎﻱ ﺑﺎ‬ ‫ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪ ﭘﻮﺷﺸﻲ‪ ،‬ﺗﻐﻴﻴﺮ ﺩﺍﻣﻨﻪ ﺳﻴﮕﻨﺎﻝﻫﺎﻱ ﺣﺎﺻﻞ ﺍﺯ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﮐﺎﻣ ً‬
‫ﻼ ﻣﺘﻤﺎﻳﺰ ﺩﺭ ﺍﻳﻦ ﮔﺴﺘﺮﻩﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﻣﺸﺎﻫﺪﻩ ﻣﻲﺷﻮﺩ‪.‬‬
‫ﺩﺍﻣﻨﻪ ﮐﺎﻣ ً‬

‫ﻧﺘﻴﺠﻪﮔﻴﺮﻱ‬
‫ﺍﺳﺘﻔﺎﺩﻩ ﺍﺯ ﺭﻭﺵ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺑﺮﺍﻱ ﺿﺨﺎﻣﺖﺳﻨﺠﻲ ﻗﻄﻌﺎﺕ ﻓﻠﺰﻱ ﺑﺎ ﺿﺨﺎﻣﺖ ﮐﻢ ﺍﺯ ﺩﻗﺖ ﺑﺎﻻﻳﻲ ﺑﺮﺧﻮﺭﺩﺍﺭ ﺍﺳﺖ‪.‬‬
‫ﻣﺤﺪﻭﺩﻳﺖ ﮔﺴﺘﺮﻩ ﺿﺨﺎﻣﺖ ﺑﻪ ﺩﻟﻴﻞ ﻋﻤﻖ ﻧﻔﻮﺫ ﮐﻢ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﻣﻲﺑﺎﺷﺪ ﮐﻪ ﺧﻮﺩ ﺗﺎﺑﻌﻲ ﺍﺯ ﺭﺳﺎﻧﺎﻳﻲ ﻗﻄﻌﻪ ﻭ ﻓﺮﮐﺎﻧﺲ ﮐﺎﺭ‬
‫ﺍﺳﺖ‪ .‬ﺑﺮﺍﻱ ﻳﮏ ﺟﻨﺲ ﺧﺎﺹ ﻫﻤﺎﻧﮕﻮﻧﻪ ﮐﻪ ﺩﺭ ﺷﮑﻞ ‪ ٦‬ﻧﺸﺎﻥ ﺩﺍﺩﻩ ﺷﺪ‪ ،‬ﺑﺎ ﮐﺎﻫﺶ ﻓﺮﮐﺎﻧﺲ ﻣﻲﺗﻮﺍﻥ ﻗﺪﺭﻱ ﮔﺴﺘﺮﻩ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ‬

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 ‫ – ﺩﺍﻧﺸﮕﺎﻩ ﺻﻨﻌﺘﯽ ﺷﺮﻳﻒ‬١٣٨٧ ‫ﺳﻮﻣﻴﻦ ﻛﻨﻔﺮﺍﻧﺲ ﺗﺨﺼﺼﻲ ﭘﺎﻳﺶ ﻭﺿﻌﻴﺖ ﻭ ﻋﻴﺐﻳﺎﺑﻲ ﻣﺎﺷﻴﻦﺁﻻﺕ – ﺍﺳﻔﻨﺪ‬

‫ ﺑﺮﺍﻱ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺿﺨﺎﻣﺖ ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ ﻫﻤﺎﻧﮕﻮﻧﻪ ﮐﻪ ﻧﺘﺎﻳﺞ ﻧﺸﺎﻥ ﻣﻲﺩﻫﻨﺪ ﺑﺎ ﺍﺳﺘﻔﺎﺩﻩ ﺍﺯ ﺭﻭﺵ‬.‫ﺿﺨﺎﻣﺖ ﺭﺍ ﺍﻓﺰﺍﻳﺶ ﺩﺍﺩ‬
‫ ﻣﻴﮑﺮﻭﻥ ﺑﺎ ﺩﻗﺖ ﺑﺎﻻﻳﻲ ﻗﺎﺑﻞ‬٥٠ ‫ ﺑﻪ ﻃﻮﺭﻱ ﮐﻪ ﻻﻳﻪ ﭘﻮﺷﺸﻲ ﺑﺎ ﺿﺨﺎﻣﺖ‬،‫ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﻗﺪﺭﺕ ﺗﻔﮑﻴﮏ ﺑﺎﻻﻳﻲ ﺣﺎﺻﻞ ﻣﻲﺷﻮﺩ‬
‫ ﺩﺭ ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﻣﻴﺰﺍﻥ‬.‫ ﻣﻴﮑﺮﻭﻧﻲ ﻫﻢ ﻗﺎﺑﻞ ﺣﺼﻮﻝ ﺑﺎﺷﺪ‬١٠ ‫ﺍﻧﺪﺍﺯﻩﮔﻴﺮﻱ ﺍﺳﺖ ﻭ ﺍﺯ ﻧﺘﺎﻳﺞ ﭼﻨﻴﻦ ﺑﺮﻣﻲﺁﻳﺪ ﮐﻪ ﺍﻳﻦ ﺩﻗﺖ ﺑﺮﺍﻱ ﻻﻳﻪﻫﺎﻱ‬
.‫ﺧﻮﺭﺩﮔﻲ ﺯﻳﺮ ﻻﻳﻪﻫﺎﻱ ﭘﻮﺷﺸﻲ ﻧﻴﺰ ﻫﻤﺎﻧﮕﻮﻧﻪ ﮐﻪ ﻧﺘﺎﻳﺞ ﻧﺸﺎﻥ ﻣﻲﺩﻫﻨﺪ ﺭﻭﺵ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺩﻗﺖ ﻣﻨﺎﺳﺒﻲ ﺭﺍ ﺣﺎﺻﻞ ﻣﻲﻧﻤﺎﻳﺪ‬
‫ﺍﺯ ﻧﺘﺎﻳﺞ ﺑﺪﺳﺖ ﺁﻣﺪﻩ ﭼﻨﻴﻦ ﺑﺮﻣﻲﺁﻳﺪ ﮐﻪ ﺭﻭﺵ ﺁﺯﻣﻮﻥ ﺟﺮﻳﺎﻥﻫﺎﻱ ﮔﺮﺩﺍﺑﻲ ﺩﺭ ﺣﻴﻄﻪﻱ ﺟﻨﺲ ﻣﺎﺩﻩ ﻭ ﮔﺴﺘﺮﻩ ﺿﺨﺎﻣﺖﻫﺎ ﻭ‬
.‫ﺧﻮﺭﺩﮔﻲﻫﺎﻱ ﻣﻌﺮﻓﻲ ﺷﺪﻩ ﺩﺭ ﺍﻳﻦ ﺗﺤﻘﻴﻖ ﺍﺯ ﺩﻗﺖ ﺑﺴﻴﺎﺭ ﺑﺎﻻﻳﻲ ﺑﺮﺧﻮﺭﺩﺍﺭ ﺍﺳﺖ‬

‫ﻣﺮﺍﺟﻊ‬
1. W. Hayt, “Engineering electromagnetics”, 5th Edition, Mc-Graw Hill Book Company,
1989.
2. Homepage of Fourier edu. site, http://fourier.eng.hmc.edu
3. P. O. Moore (Editor), “Nondestructive Testing Handbook, vol. 10, Nondestructive
Testing Overview”, American society for Nondestructive Testing (ASNT), 2nd edition,
1996,
4. P. O. Moore (Editor), “Nondestructive Testing Handbook, Vol. 5, Electromagnetic
testing”, American Society for Nondestructive Testing (ASNT), 2004.
5. AEOI, “Eddy Current Testing at Level-2”, Technology center for nuclear safety and
radiation protection, Tehran, Iran, Draft, 2004.
6. P. O. Moore (Editor), “Nondestructive Testing Handbook, Vol. 4, Radiographic Testing,”
American Society for Nondestructive Testing (ASNT), 3rd Edition, 2002.

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