Cc1314R10 Simplelink™ High-Performance Sub-1 GHZ Wireless Mcu
Cc1314R10 Simplelink™ High-Performance Sub-1 GHZ Wireless Mcu
Cc1314R10 Simplelink™ High-Performance Sub-1 GHZ Wireless Mcu
ADVANCE INFORMATION
disabled • Four UART, four SPI, two I2C, I2S
• Dynamic multiprotocol manager (DMM) driver • Real-time clock (RTC)
• Supports over-the-air upgrade (OTA) • Integrated temperature and battery monitor
Ultra-low power sensor controller Security enablers
• Autonomous MCU with 4 kB of SRAM • Supports secure boot
• Sample, store, and process sensor data • Supports secure key storage and device ID
• Fast wake-up for low-power operation • Arm TrustZone for trusted execution environment
• Software defined peripherals; capacitive touch, • AES 128- and 256-bit cryptographic accelerator
flow meter, LCD • Public key accelerator
Low power consumption • SHA2 accelerator (full suite up to SHA-512)
• True random number generator (TRNG)
• MCU consumption: • Secure debug lock
– 3.4 mA active mode, CoreMark® • Software anti-rollback protection
– 71 μA/MHz running CoreMark
– 0.98 μA standby mode, RTC, 256 kB RAM Development tools and software
– 0.17 μA shutdown mode, wake-up on pin • LP-EM-CC1314R10
• Ultra low-power sensor controller consumption: • LP-XDS110, LP-XDS110ET or TMDSEMU110-U
– 30 μA in 2 MHz mode (with TMDSEMU110-ETH add-on) Debug Probe
– 809 μA in 24 MHz mode • SimpleLink™ LOWPOWER F2 Software
• Radio consumption: Development Kit (SDK)
– 25.8 mA TX at +14 dBm at 868 MHz • SmartRF™ Studio for simple radio configuration
• Sensor Controller Studio for building low-power
Wireless protocol support
sensing applications
• Wi-SUN® • SysConfig system configuration tool
• mioty®
Operating range
• Amazon Sidewalk
• Wireless M-Bus • On-chip buck DC/DC converter
• SimpleLink™ TI 15.4-Stack (Sub-1 GHz) • 1.8 V to 3.8 V single supply voltage
• Proprietary Systems • –40°C to +105°C
High performance radio Package
• Coherent modem, 802.15.4 O-QPSK • 7 mm × 7 mm RGZ VQFN48 (30 GPIOs)
• –121 dBm for 2.5 kbps long-range mode • 8 mm × 8 mm RSK VQFN64 (46 GPIOs)1
• –110 dBm at 50 kbps, 802.15.4, 868 MHz • RoHS-compliant package
Regulatory compliance
• Designed for systems targeting compliance with
these standards:
1 Information for the RSK package (8.00 mm x 8.00 mm) is preview only and subject to change.
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. ADVANCE INFORMATION for preproduction products; subject to change
without notice.
CC1314R10
SWRS270A – DECEMBER 2022 – REVISED JUNE 2023 www.ti.com
2 See RF Core for additional details on supported protocol standards, modulation formats, and data rates.
In addition to the software compatibility, within the Sub-1 GHz wireless MCUs, there is pin-to-pin compatibility
from 32 kB of flash up to 1 MB of flash in the 7 × 7 mm QFN package for maximum design scalability. For more
information on TIs Sub-1 GHz solutions, visit www.ti.com/sub1ghz
Device Information
PART NUMBER(1) PACKAGE BODY SIZE (NOM)
CC1314R106T0RGZ VQFN (48) 7.00 mm × 7.00 mm
CC1314R106T0RSK VQFN (64) 8.00 mm × 8.00 mm
(1) For the most current part, package, and ordering information for all available devices, see the Package Option Addendum in Section
12, or see the TI website.
ADVANCE INFORMATION
Table of Contents
1 Features............................................................................1 8.14 Timing and Switching Characteristics..................... 25
2 Applications..................................................................... 2 8.15 Peripheral Characteristics.......................................31
3 Description.......................................................................2 8.16 Typical Characteristics............................................ 39
4 Functional Block Diagram.............................................. 3 9 Detailed Description......................................................47
5 Revision History.............................................................. 4 9.1 Overview................................................................... 47
6 Device Comparison......................................................... 5 9.2 System CPU............................................................. 47
7 Terminal Configuration and Functions..........................6 9.3 Radio (RF Core)........................................................48
7.1 Pin Diagram – RGZ Package (Top View)....................6 9.4 Memory..................................................................... 50
7.2 Signal Descriptions – RGZ Package...........................7 9.5 Sensor Controller...................................................... 51
7.3 Connections for Unused Pins and Modules – 9.6 Cryptography............................................................ 52
RGZ Package................................................................8 9.7 Timers....................................................................... 53
7.4 Pin Diagram – RSK Package (Top View)....................9 9.8 Serial Peripherals and I/O.........................................54
7.5 Signal Descriptions – RSK Package.........................10 9.9 Battery and Temperature Monitor............................. 54
ADVANCE INFORMATION
5 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from December 8, 2022 to June 14, 2023 (from Revision * (December 2022) to
Revision A (June 2023)) Page
• Added devices to the Device Comparison table................................................................................................. 5
• Deleted device revision limitation for LQI in Table 9-1 .....................................................................................49
• Updated links in the Reference Designs...........................................................................................................58
6 Device Comparison
RADIO SUPPORT PACKAGE SIZE
4 × 4 mm VQFN (24)
4 × 4 mm VQFN (32)
5 × 5 mm VQFN (32)
5 × 5 mm VQFN (40)
7 × 7 mm VQFN (48)
8 × 8 mm VQFN (64)
Sub-1 GHz Prop.
Wireless M-Bus
RAM +
Bluetooth® LE
FLASH
Multiprotocol
2.4GHz Prop.
Device Cache GPIO
+20 dBm PA
(kB)
(kB)
Wi-SUN®
Sidewalk
ZigBee
Thread
mioty
CC1310 √ √ √ 32-128 16-20 + 8 10-30 √ √ √
CC1311R3 √ √ √ 352 32 + 8 22-30 √ √
CC1311P3 √ √ √ √ 352 32 + 8 26 √
CC1312R √ √ √ √ 352 80 + 8 30 √
ADVANCE INFORMATION
CC1312R7 √ √ √ √ √ √ 704 144 + 8 30 √
CC1314R10 √ √ √ √ √ √ 1024 256 + 8 30-46 √ √
CC1352R √ √ √ √ √ √ √ √ √ 352 80 + 8 28 √
CC1354R10 √ √ √ √ √ √ √ √ √ 1024 256 + 8 28-42 √ √
CC1352P √ √ √ √ √ √ √ √ √ √ 352 80 + 8 26 √
CC1352P7 √ √ √ √ √ √ √ √ √ √ √ 704 144 + 8 26 √
CC1354P10 √ √ √ √ √ √ √ √ √ √ √ 1024 256 + 8 26-42 √ √
CC2340R2 √ √ √ 256 28 12 √
CC2340R5 √ √ √ √ 512 36 12-26 √ √
CC2340R5-Q1 √ 512 36 19 √
CC2640R2F √ 128 20 + 8 10-31 √ √ √
CC2642R √ 352 80 + 8 31 √
CC2642R-Q1 √ 352 80 + 8 31 √
CC2651R3 √ √ √ 352 32 + 8 23-31 √ √
CC2651P3 √ √ √ √ 352 32 + 8 22-26 √ √
CC2652R √ √ √ √ √ 352 80 + 8 31 √
CC2652RB √ √ √ √ √ 352 80 + 8 31 √
CC2652R7 √ √ √ √ √ 704 144 + 8 31 √
CC2652P √ √ √ √ √ √ 352 80 + 8 26 √
CC2652P7 √ √ √ √ √ √ 704 144 + 8 26 √
CC2674R10 √ √ √ √ √ 1024 256 + 8 31-45 √ √
CC2674P10 √ √ √ √ √ √ 1024 256 + 8 26-45 √ √
48 VDDR_RF
46 X48M_N
47 X48M_P
43 DIO_30
42 DIO_29
41 DIO_28
40 DIO_27
39 DIO_26
38 DIO_25
37 DIO_24
45 VDDR
44 VDDS
RF_P 1 36 DIO_23
RF_N 2 35 RESET_N
RX_TX 3 34 VDDS_DCDC
X32K_Q1 4 33 DCDC_SW
X32K_Q2 5 32 DIO_22
ADVANCE INFORMATION
DIO_1 6 31 DIO_21
DIO_2 7 30 DIO_20
DIO_3 8 29 DIO_19
DIO_4 9 28 DIO_18
DIO_5 10 27 DIO_17
DIO_6 11 26 DIO_16
DIO_7 12 25 JTAG_TCKC
VDDS2 13
DIO_8 14
DIO_9 15
DIO_10 16
DIO_11 17
DIO_12 18
DIO_13 19
DIO_14 20
DIO_15 21
VDDS3 22
DCOUPL 23
JTAG_TMSC 24
The following I/O pins marked in Figure 7-1 in bold have high-drive capabilities:
• Pin 10, DIO_5
• Pin 11, DIO_6
• Pin 12, DIO_7
• Pin 24, JTAG_TMSC
• Pin 26, DIO_16
• Pin 27, DIO_17
The following I/O pins marked in Figure 7-1 in italics have analog capabilities:
• Pin 36, DIO_23
• Pin 37, DIO_24
• Pin 38, DIO_25
• Pin 39, DIO_26
• Pin 40, DIO_27
• Pin 41, DIO_28
• Pin 42, DIO_29
• Pin 43, DIO_30
ADVANCE INFORMATION
DIO_7 12 I/O Digital GPIO, high-drive capability
DIO_8 14 I/O Digital GPIO
DIO_9 15 I/O Digital GPIO
DIO_10 16 I/O Digital GPIO
DIO_11 17 I/O Digital GPIO
DIO_12 18 I/O Digital GPIO
DIO_13 19 I/O Digital GPIO
DIO_14 20 I/O Digital GPIO
DIO_15 21 I/O Digital GPIO
DIO_16 26 I/O Digital GPIO, JTAG_TDO, high-drive capability
DIO_17 27 I/O Digital GPIO, JTAG_TDI, high-drive capability
DIO_18 28 I/O Digital GPIO
DIO_19 29 I/O Digital GPIO
DIO_20 30 I/O Digital GPIO
DIO_21 31 I/O Digital GPIO
DIO_22 32 I/O Digital GPIO
DIO_23 36 I/O Digital or Analog GPIO, analog capability
DIO_24 37 I/O Digital or Analog GPIO, analog capability
DIO_25 38 I/O Digital or Analog GPIO, analog capability
DIO_26 39 I/O Digital or Analog GPIO, analog capability
DIO_27 40 I/O Digital or Analog GPIO, analog capability
DIO_28 41 I/O Digital or Analog GPIO, analog capability
DIO_29 42 I/O Digital or Analog GPIO, analog capability
DIO_30 43 I/O Digital or Analog GPIO, analog capability
EGP — — GND Ground – exposed ground pad(3)
JTAG_TMSC 24 I/O Digital JTAG TMSC, high-drive capability
JTAG_TCKC 25 I Digital JTAG TCKC
RESET_N 35 I Digital Reset, active low. No internal pullup resistor
Positive RF input signal to LNA during RX
RF_P 1 — RF
Positive RF output signal from PA during TX
Negative RF input signal to LNA during RX
RF_N 2 — RF
Negative RF output signal from PA during TX
RX_TX 3 — RF Optional bias pin for the RF LNA
Internal supply, must be powered from the internal DC/DC
VDDR 45 — Power
converter or the internal LDO(2) (4) (6)
(1) For more details, see technical reference manual listed in Section 11.2.
(2) Do not supply external circuitry from this pin.
(3) EGP is the only ground connection for the device. Good electrical connection to device ground on printed circuit board (PCB) is
imperative for proper device operation.
(4) If internal DC/DC converter is not used, this pin is supplied internally from the main LDO.
(5) If internal DC/DC converter is not used, this pin must be connected to VDDR for supply from the main LDO.
(6) Output from internal DC/DC and LDO is trimmed to 1.68 V.
(1) NC = No connect
(2) When the DC/DC converter is not used, the inductor between DCDC_SW and VDDR can be removed. VDDR and VDDR_RF must still
be connected and the 22 µF DCDC capacitor must be kept on the VDDR net.
64 VDDR_RF
49 RESET_N
62 X48M_N
63 X48M_P
52 DIO_25
51 DIO_24
50 DIO_23
59 DIO_47
58 DIO_46
57 DIO_30
56 DIO_29
55 DIO_28
54 DIO_27
53 DIO_26
61 VDDR
60 VDDS
RF_P 1 48 VDDS_DCDC
RF_N 2 47 DCDC_SW
RX_TX 3 46 DIO_45
X32K_Q1 4 45 DIO_44
X32K_Q2 5 44 DIO_43
DIO_1 6 43 DIO_42
ADVANCE INFORMATION
DIO_2 7 42 DIO_41
DIO_32 8 41 DIO_40
DIO_33 9 40 DIO_22
DIO_34 10 39 DIO_21
DIO_35 11 38 DIO_20
DIO_3 12 37 DIO_19
DIO_4 13 36 DIO_18
DIO_5 14 35 DIO_17
DIO_6 15 34 DIO_16
DIO_7 16 33 JTAG_TCKC
VDDS2 17
DIO_8 18
DIO_9 19
DIO_10 20
DIO_11 21
DIO_36 22
DIO_37 23
DIO_38 24
DIO_39 25
DIO_12 26
DIO_13 27
DIO_14 28
DIO_15 29
VDDS3 30
DCOUPL 31
JTAG_TMSC 32
The following I/O pins marked in Figure 7-2 in bold have high-drive capabilities:
• Pin 14, DIO_5
• Pin 15, DIO_6
• Pin 16, DIO_7
• Pin 32, JTAG_TMSC
• Pin 34, DIO_16
• Pin 35, DIO_17
The following I/O pins marked in Figure 7-2 in italics have analog capabilities:
• Pin 50, DIO_23
• Pin 51, DIO_24
• Pin 52, DIO_25
• Pin 53, DIO_26
• Pin 54, DIO_27
• Pin 55, DIO_28
• Pin 56, DIO_29
• Pin 57, DIO_30
ADVANCE INFORMATION
Positive RF input signal to LNA during RX
RF_P_SUB_1GHZ 1 — RF
Positive RF output signal from PA during TX
Negative RF input signal to LNA during RX
RF_N_SUB_1GHZ 2 — RF
Negative RF output signal from PA during TX
RX_TX 3 — RF Optional bias pin for the RF LNA
Internal supply, must be powered from the internal DC/DC
VDDR 61 — Power
converter or the internal LDO(2) (4) (6)
Internal supply, must be powered from the internal DC/DC
VDDR_RF 64 — Power
converter or the internal LDO(2) (5) (6)
VDDS 60 — Power 1.8 V to 3.8 V main chip supply(1)
VDDS2 17 — Power 1.8 V to 3.8 V DIO supply(1)
VDDS3 30 — Power 1.8 V to 3.8 V DIO supply(1)
VDDS_DCDC 48 — Power 1.8 V to 3.8 V DC/DC converter supply
X48M_N 62 — Analog 48 MHz crystal oscillator pin N
X48M_P 63 — Analog 48 MHz crystal oscillator pin P
X32K_Q1 4 — Analog 32 kHz crystal oscillator pin 1
X32K_Q2 5 — Analog 32 kHz crystal oscillator pin 2
(1) For more details, see technical reference manual listed in Section 11.2.
(2) Do not supply external circuitry from this pin.
(3) EGP is the only ground connection for the device. Good electrical connection to device ground on printed circuit board (PCB) is
imperative for proper device operation.
(4) If internal DC/DC converter is not used, this pin is supplied internally from the main LDO.
(5) If internal DC/DC converter is not used, this pin must be connected to VDDR for supply from the main LDO.
(6) Output from internal DC/DC and LDO is trimmed to 1.68 V.
(1) NC = No connect
(2) When the DC/DC converter is not used, the inductor between DCDC_SW and VDDR can be removed. VDDR and VDDR_RF must still
be connected and the 22 µF DCDC capacitor must be kept on the VDDR net.
8 Specifications
8.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted)(1) (2)
MIN MAX UNIT
VDDS(3) Supply voltage –0.3 4.1 V
Voltage on any digital pin(4) (5) –0.3 VDDS + 0.3, max 4.1 V
Voltage on crystal oscillator pins, X32K_Q1, X32K_Q2, X48M_N and X48M_P –0.3 VDDR + 0.3, max 2.25 V
Voltage scaling enabled –0.3 VDDS
Vin Voltage on ADC input Voltage scaling disabled, internal reference –0.3 1.49 V
Voltage scaling disabled, VDDS as reference –0.3 VDDS / 2.9
Input level, RF pins 10 dBm
Tstg Storage temperature –40 150 °C
ADVANCE INFORMATION
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to ground, unless otherwise noted.
(3) VDDS_DCDC, VDDS2 and VDDS3 must be at the same potential as VDDS.
(4) Including analog capable DIOs.
(5) Injection current is not supported on any GPIO pin
(1) JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process
(2) JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process
(1) Operation at or near maximum operating temperature for extended durations will result in lifetime reduction.
(2) For small coin-cell batteries, with high worst-case end-of-life equivalent source resistance, a 22 µF VDDS input capacitor must be used
to ensure compliance with this slew rate.
(3) For thermal resistance characteristics refer to Thermal Resistance Characteristics. For application considerations, refer to SPRA953
(1) For boost mode (VDDR =1.95 V), TI drivers software initialization will trim VDDS BOD limits to maximum (approximately 2.0 V)
(2) Brown-out Detector is trimmed at initial boot, value is kept until device is reset by a POR reset or the RESET_N pin
ADVANCE INFORMATION
RTC running, CPU, 128 kB RAM and (partial) register retention
0.99 µA
XOSC_LF
RTC running, CPU, 256 kB RAM and (partial) register retention.
2.24 µA
RCOSC_LF
Icore
RTC running, CPU, 128 kB RAM and (partial) register retention.
2.16 µA
Standby RCOSC_LF
with cache retention RTC running, CPU, 256 kB RAM and (partial) register retention.
2.34 µA
XOSC_LF
RTC running, CPU, 128 kB RAM and (partial) register retention.
2.25 µA
XOSC_LF
Supply Systems and RAM powered
Idle 635 µA
RCOSC_HF
MCU running CoreMark at 48 MHz with parity enabled
3.5 mA
RCOSC_HF
Active
MCU running CoreMark at 48 MHz with parity disabled
3.4 mA
RCOSC_HF
Peripheral Current Consumption
Peripheral power
Delta current with domain enabled 62.4
domain
Serial power domain Delta current with domain enabled 5.83
Delta current with power domain enabled,
RF Core 102.0
clock enabled, RF core idle
µDMA Delta current with clock enabled, module is idle 58.0
Timers Delta current with clock enabled, module is idle(3) 97.2
Iperi I2C Delta current with clock enabled, module is idle 9.8 µA
(1) A full bank erase is counted as a single erase cycle on each sector
(2) Up to 4 customer-designated sectors can be individually erased an additional 30k times beyond the baseline bank limitation of 30k
cycles
(3) Each wordline is 2048 bits (or 256 bytes) wide. This limitation corresponds to sequential memory writes of 4 (3.1) bytes minimum
per write over a whole wordline. If additional writes to the same wordline are required, a sector erase is required once the maximum
number of write operations per row is reached.
(4) This number is dependent on Flash aging and increases over time and erase cycles
(5) Aborting flash during erase or program modes is not a safe operation.
(1) For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
(2) °C/W = degrees Celsius per watt.
ADVANCE INFORMATION
ADVANCE INFORMATION
Saturation limit 10% PER, 250 byte payload, 918.4 MHz 10 dBm
Selectivity, +400 kHz 42 dB
Selectivity, -400 kHz 10% PER, 250 byte payload, 918.4 MHz. Wanted signal 3 dB 40 dB
Selectivity, +800 kHz above sensitivity level. 51 dB
Selectivity, -800 kHz 47 dB
RSSI dynamic range Starting from the sensitivity limit 91 dB
RSSI accuracy Starting from the sensitivity limit across the given dynamic range ±3 dB
Wi-SUN, 200 kbps, ±100 kHz deviation, 2-GFSK, 416 kHz RX BW, #4b
Sensitivity MRFSK, 920.8 MHz, 10% PER, 250 byte payload -98 dBm
Saturation limit 10% PER, 250 byte payload, 920.8 MHz 10 dBm
Selectivity, +600 kHz 46 dB
Selectivity, -600 kHz 10% PER, 250 byte payload, 920.8 MHz. Wanted signal 3 dB 43 dB
Selectivity, +1200 kHz above sensitivity level, modulated blocker. 54 dB
Selectivity, -1200 kHz 51 dB
RSSI dynamic range Starting from the sensitivity limit 86 dB
RSSI accuracy Starting from the sensitivity limit across the given dynamic range ±3 dB
Wi-SUN, 300 kbps, ±75 kHz deviation, 2-GFSK, 496 kHz RX BW, #5
Sensitivity MRFSK, 917.6 MHz, 10% PER, 250 byte payload -97 dBm
Saturation limit 10% PER, 250 byte payload, 917.6 MHz 10 dBm
Selectivity, +600 kHz 42 dB
Selectivity, -600 kHz 10% PER, 250 byte payload, 917.6 MHz. Wanted signal 3 dB 37 dB
Selectivity, +1200 kHz above sensitivity level. 51 dB
Selectivity, -1200 kHz 40 dB
RSSI dynamic range Starting from the sensitivity limit 86 dB
RSSI accuracy Starting from the sensitivity limit across the given dynamic range ±3 dB
802.15.4-2020, 10 kbps, 2-FSK, 26 kHz RX BW, Mode #1a
Sensitivity FSK, 915.0 MHz, 20 byte PSDU < 10% PER -113 dBm
Sensitivity FSK, 868.3 MHz, 20 byte PSDU < 10% PER -113 dBm
Saturation limit PSDU length 20 octets; PER < 10%, 868.3 MHz 10 dBm
Blocking, -2 MHz 64 dB
Blocking, +5 MHz 75 dB
Blocking, -5 MHz 74 dB
Blocking, +10 MHz 79 dB
Blocking, -10 MHz 79 dB
Selectivity, +50 kHz 35 dB
Selectivity, -50 kHz 35 dB
Selectivity, +100 kHz 39 dB
Selectivity, -100 kHz 38 dB
Selectivity, +200 kHz 44 dB
Selectivity, -200 kHz 44 dB
Blocking, +1 MHz PSDU length 20 octets; PER < 10%, 868.3 MHz. Wanted signal 58 dB
Blocking, -1 MHz 3 dB above sensitivity level. 58 dB
Blocking, +2 MHz 62 dB
Blocking, -2 MHz 63 dB
Blocking, +5 MHz 74 dB
Blocking, -5 MHz 74 dB
Blocking, +10 MHz 73 dB
Blocking, -10 MHz 78 dB
Blocking + 5% Fc. (45.75 MHz) -15 dBm
10% PER, 20 byte payload, 866.6 MHz 802.15.4g mandatory
Blocking - 5% Fc. (-45.75 MHz) mode, wanted signal -94 dBm. 3 dB above usable sensitivity -15 dBm
limit according to ETSI EN 300 220 V3.1.1 (usable sensitivity -97
Image rejection (image compensation
dBm). Limit is Cat 1.5 requirement. 39 dB
enabled)
Image rejection (image compensation
PSDU length 20 octets; PER < 10%, 868.3 MHz 39 dB
enabled)
Image rejection (image compensation
-40 to 125℃, 10% PER, 250 byte payload, 866.6 MHz 39 dB
enabled)
RSSI dynamic range Starting from the sensitivity limit 100 dB
RSSI accuracy Starting from the sensitivity limit across the given dynamic range ±3 dB
10% PER, 20 byte payload, measured at 10 dB above sensitivity
Frequency error tolerance (ppm) -12 ppm
level. Negative offset
10% PER, 20 byte payload, measured at 10 dB above sensitivity
Frequency error tolerance (ppm) 12 ppm
level. Positive offset
10% PER, 20 byte payload, measured at 10 dB above sensitivity
Symbol rate error tolerance (ppm) level. -1000 ppm
Negative offset
1% BER, measured at 10 dB above sensitivity level
Symbol rate error tolerance (ppm) 1000 ppm
Positive offset
802.15.4-2020, 20 kbps, 2-FSK, 52 kHz RX BW, Mode #1b
FSK, 20 kbps, ±10 kHz deviation, 2-GFSK, 915.0 MHz, 52 kHz
Sensitivity -110 dBm
RX BW, 20 byte PSDU < 10% PER
ADVANCE INFORMATION
Blocking, +1 MHz 58 dB
20 byte PSDU < 10% PER, 868.3 MHz
Blocking, -1 MHz 54 dB
Blocking, -2 MHz 61 dB
Blocking, +2 MHz 61 dB
Blocking, -5 MHz 70 dB
Blocking, +5 MHz 70 dB
Blocking, -10 MHz 75 dB
Blocking, +10 MHz 76 dB
Selectivity, +100 kHz 36 dB
Selectivity, -100 kHz 34 dB
Selectivity, +200 kHz 42 dB
Selectivity, -200 kHz 41 dB
Selectivity, +400 kHz 47 dB
Selectivity, -400 kHz 46 dB
Blocking, +1 MHz 20 byte PSDU < 10% PER, 868.3 MHz. Wanted signal 3 dB 56 dB
Blocking, -1 MHz above sensitivity level. 55 dB
Blocking, +2 MHz 61 dB
Blocking, -2 MHz 61 dB
Blocking, +5 MHz 71 dB
Blocking, -5 MHz 70 dB
Blocking, +10 MHz 75 dB
Blocking, -10 MHz 75 dB
Blocking + 5% Fc. (45.75 MHz) 20 byte PSDU < 10% PER, 866.6 MHz, wanted signal -94 dBm. -13 dBm
3 dB above usable sensitivity limit according to ETSI EN 300 220
Blocking - 5% Fc. (-45.75 MHz) V3.1.1 (usable sensitivity -97 dBm). Limit is Cat 1.5 requirement. -13 dBm
Image rejection (image compensation 20 byte PSDU < 10% PER, 866.6 MHz. Wanted signal 3 dB
39 dB
enabled) above sensitivity limit.
Image rejection (image compensation
20 byte PSDU < 10% PER, 866.6 MHz(1) 39 dB
enabled)
Image rejection (image compensation
-40 to 125℃, 10% PER, 250 byte payload, 866.6 MHz 39 dB
enabled)
RSSI dynamic range Starting from the sensitivity limit 100 dB
RSSI accuracy Starting from the sensitivity limit across the given dynamic range ±3 dB
20 byte PSDU < 10% PER, measured at 10 dB above sensitivity
Frequency error tolerance (ppm) -24 ppm
level. Negative offset
20 byte PSDU < 10% PER, measured at 10 dB above sensitivity
Frequency error tolerance (ppm) 24 ppm
level. Positive offset
20 byte PSDU < 10% PER, measured at 10 dB above sensitivity
Symbol rate error tolerance (ppm) level. -1000 ppm
Negative offset
Selectivity, -800 kHz BER = 10–2, 915 MHz. Wanted signal 3 dB above sensitivity limit. 47 dB
Blocking, +2 MHz BER = 10–2, 915 MHz. Wanted signal 3 dB above sensitivity limit. 59 dB
Blocking, -2 MHz BER = 10–2, 915 MHz. Wanted signal 3 dB above sensitivity limit. 56 dB
Blocking, +10 MHz BER = 10–2, 915 MHz. Wanted signal 3 dB above sensitivity limit. 71 dB
Blocking, -10 MHz BER = 10–2, 915 MHz. Wanted signal 3 dB above sensitivity limit. 70 dB
802.15.4, 500 kbps, ±190 kHz deviation, 2-GFSK, 622 kHz RX BW
Sensitivity 500 kbps 915 MHz, 1% PER, 127 byte payload -95 dBm
Selectivity, ±1 MHz 915 MHz, 1% PER, 127 byte payload. Wanted signal at -88 dBm 34 dB
Selectivity, ±2 MHz 915 MHz, 1% PER, 127 byte payload. Wanted signal at -88 dBm 46 dB
Co-channel rejection 915 MHz, 1% PER, 127 byte payload. Wanted signal at -71 dBm -8 dB
SimpleLink™ Long Range 2.5/5 kbps (20 ksps), ±5 kHz Deviation, 2-GFSK, 34 kHz RX Bandwidth, FEC = 1:2, DSSS = 1:4/1:2
Sensitivity 2.5 kbps, BER = 10–2, 868 MHz -121 dBm
Sensitivity 2.5 kbps, BER = 10–2, 915 MHz -121 dBm
Sensitivity 5 kbps, BER = 10–2, 868 MHz -119 dBm
Sensitivity 5 kbps, BER = 10–2, 915 MHz -119 dBm
Saturation limit 2.5 kbps, BER = 10–2, 868 MHz 10 dBm
Selectivity, +100 kHz 2.5 kbps, BER = 10–2, 868 MHz(1) 49 dB
Selectivity, -100 kHz 2.5 kbps, BER = 10–2, 868 MHz(1) 49 dB
Selectivity, +200 kHz 2.5 kbps, BER = 10–2, 868 MHz(1) 52 dB
Selectivity, -200 kHz 2.5 kbps, BER = 10–2, 868 MHz(1) 48 dB
Selectivity, +300 kHz 2.5 kbps, BER = 10–2, 868 MHz(1) 54 dB
Selectivity, -300 kHz 2.5 kbps, BER = 10–2, 868 MHz(1) 48 dB
Blocking, +1 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 65 dB
Blocking, -1 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 60 dB
Blocking, +2 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 70 dB
Blocking, -2 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 68 dB
Blocking, +5 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 78 dB
Blocking, -5 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 77 dB
Blocking, +10 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 87 dB
Blocking, -10 MHz 2.5 kbps, BER = 10–2, 868 MHz(1) 92 dB
Image rejection (image compensation
2.5 kbps, BER = 10–2, 868 MHz(1) 47 dB
enabled)
RSSI accuracy Starting from the sensitivity limit across the given dynamic range ±3 dB
2.5 kbps, 20 kbaud, DSSS=4, ½ K=7 FEC. measured at -110
Frequency error tolerance (ppm) -24/26 ppm
dBm.
2.5 kbps, 20 kbaud, DSSS=4, ½ K=7 FEC. measured at -110
Symbolrate error tolerance (ppm) -90/70 ppm
dBm. Refered to 20 kbaud chip rate.
Narrowband, 9.6 kbps ±2.4 kHz deviation, 2-GFSK, 868 MHz, 17.1 kHz RX BW
Sensitivity 1% BER -117 dBm
ADVANCE INFORMATION
802.15.4, 50 kbps, ±25 kHz Deviation, 2-GFSK, 100 kHz RX BW (Legacy)
Sensitivity BER = 10–2, 868 MHz –110 dBm
Sensitivity BER = 10–2, 915 MHz –110 dBm
Saturation limit BER = 10–2, 868 MHz 10 dBm
Selectivity, +200 kHz 44 dB
Selectivity, -200 kHz 44 dB
Selectivity, +400 kHz 54 dB
Selectivity, -400 kHz 44 dB
Blocking, +1 MHz 57 dB
Blocking, -1 MHz 57 dB
BER = 10–2, 868 MHz(1)
Blocking, +2 MHz 61 dB
Blocking, -2 MHz 61 dB
Blocking, +5 MHz 67 dB
Blocking, -5 MHz 67 dB
Blocking, +10 MHz 76 dB
Blocking, -10 MHz 76 dB
Selectivity, +200 kHz 45 dB
Selectivity, -200 kHz 45 dB
Selectivity, +400 kHz 51 dB
Selectivity, -400 kHz 45 dB
Blocking, +1 MHz 61 dB
Blocking, -1 MHz 61 dB
BER = 10–2, 868 MHz. Wanted signal 3 dB above sensitivity limit.
Blocking, +2 MHz 63 dB
Blocking, -2 MHz 63 dB
Blocking, +5 MHz 67 dB
Blocking, -5 MHz 67 dB
Blocking, +10 MHz 73 dB
Blocking, -10 MHz 73 dB
Blocking + 5% Fc. (43.42 MHz) BER = 10–2, 868 MHz -15 dBm
802.15.4g mandatory mode, wanted signal -94 dBm. 3 dB above
Blocking - 5% Fc. (-43.42 MHz) usable sensitivity limit according to ETSI EN 300 220 V3.1.1 -15 dBm
(usable sensitivity -97 dBm). Limit is Cat 1.5 requirement.
Image rejection (image compensation
BER = 10–2, 868 MHz. Wanted signal 3 dB above sensitivity limit. 39 dB
enabled)
Image rejection (image compensation
BER = 10–2, 868 MHz(1) 39 dB
enabled)
Image rejection (image compensation
-40 to 125℃. BER = 10–2, 868 MHz 41 dB
enabled)
RSSI dynamic range Starting from the sensitivity limit 95 dB
RSSI accuracy Starting from the sensitivity limit across the given dynamic range ±3 dB
(1) Wanted signal 3 dB above usable sensitivity limit according to ETSI EN 300 220 v. 3.1.1.
ADVANCE INFORMATION
range
+14 dBm setting
Output power variation over temperature Boost mode Over recommended temperature operating ±1.5 dB
range
Spurious emissions and harmonics
+14 dBm setting
< -54 dBm
ETSI restricted bands
30 MHz to 1 GHz
Spurious emissions +14 dBm setting
< -36 dBm
(excluding harmonics) (3) ETSI outside restricted bands
1 GHz to 12.75 GHz +14 dBm setting
< -30 dBm
(outside ETSI restricted bands) measured in 1 MHz bandwidth (ETSI)
30 MHz to 88 MHz
+14 dBm setting < -56 dBm
(within FCC restricted bands)
88 MHz to 216 MHz
+14 dBm setting < -52 dBm
(within FCC restricted bands)
216 MHz to 960 MHz
Spurious emissions out- +14 dBm setting < -50 dBm
(within FCC restricted bands)
of-band, 915 MHz (3)
960 MHz to 2390 MHz and above
2483.5 MHz (within FCC restricted +14 dBm setting <-42 dBm
band)
1 GHz to 12.75 GHz
+14 dBm setting < -40 dBm
(outside FCC restricted bands)
Below 710 MHz
+14 dBm setting < -36 dBm
(ARIB T-108)
710 MHz to 900 MHz
+14 dBm setting < -55 dBm
(ARIB T-108)
900 MHz to 915 MHz
Spurious emissions out- +14 dBm setting < -55 dBm
(ARIB T-108)
of-band, 920.6/928 MHz
(3) 930 MHz to 1000 MHz
+14 dBm setting < -55 dBm
(ARIB T-108)
1000 MHz to 1215 MHz
+14 dBm setting < -45 dBm
(ARIB T-108)
Above 1215 MHz
+14 dBm setting < -30 dBm
(ARIB T-108)
+14 dBm setting, 868 MHz < -30
Second harmonic dBm
+14 dBm setting, 915 MHz < -30
+14 dBm setting, 868 MHz < -30
Third harmonic dBm
+14 dBm setting, 915 MHz < -42
Harmonics
+14 dBm setting, 868 MHz < -30
Fourth harmonic dBm
+14 dBm setting, 915 MHz < -30
+14 dBm setting, 868 MHz < -30
Fifth harmonic dBm
+14 dBm setting, 915 MHz < -42
(1) Some combinations of frequency, data rate and modulation format requires use of external crystal load capacitors for regulatory
compliance. More details can be found in the device errata.
(2) Suitable for systems targeting compliance with EN 300 220, EN 303 131, EN 303 204, FCC CFR47 Part 15, ARIB STD-T108.
8.12 861 MHz to 1054 MHz - PLL Phase Noise Wideband Mode
When measured on the LP-EM-CC1314R10 reference design with Tc = 25 °C, VDDS = 3.0 V.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
±10 kHz offset –74 dBc/Hz
±100 kHz offset –97 dBc/Hz
±200 kHz offset –107 dBc/Hz
Phase noise in the 868- and 915-MHz bands
±400 kHz offset –113 dBc/Hz
20 kHz PLL loop bandwidth
±1000 kHz offset –120 dBc/Hz
±2000 kHz offset –127 dBc/Hz
±10000 kHz offset –141 dBc/Hz
ADVANCE INFORMATION
8.13 861 MHz to 1054 MHz - PLL Phase Noise Narrowband Mode
When measured on the LP-EM-CC1314R10 reference design with Tc = 25 °C, VDDS = 3.0 V.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
±10 kHz offset –96 dBc/Hz
±100 kHz offset –95 dBc/Hz
±200 kHz offset –94 dBc/Hz
Phase noise in the 868- and 915-MHz bands
±400 kHz offset –104 dBc/Hz
150 kHz PLL loop bandwith
±1000 kHz offset –121 dBc/Hz
±2000 kHz offset –130 dBc/Hz
±10000 kHz offset –140 dBc/Hz
(1) The wakeup time is dependent on remaining charge on VDDR capacitor when starting the device, and thus how long the device has
been in Reset or Shutdown before starting up again. The wake up time increases with a higher capacitor value.
(1) Probing or otherwise stopping the TCXO while the DC/DC converter is enabled may cause permanent damage to the device.
Measured on a Texas Instruments reference design with Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted.(1)
PARAMETER MIN TYP MAX UNIT
Crystal frequency 48 MHz
Equivalent series resistance
ESR 20 60 Ω
6 pF < CL ≤ 9 pF
Equivalent series resistance
ESR 80 Ω
5 pF < CL ≤ 6 pF
Motional inductance, relates to the load capacitance that is used for the crystal (CL in
LM < 3 × 10–25 / CL 2 H
Farads)(5)
CL Crystal load capacitance(4) 5 7(3) 9 pF
Start-up time(2) 200 µs
(1) Probing or otherwise stopping the crystal while the DC/DC converter is enabled may cause permanent damage to the device.
(2) Start-up time using the TI-provided power driver. Start-up time may increase if driver is not used.
(3) On-chip default connected capacitance including reference design parasitic capacitance. Connected internal capacitance is changed
through software in the Customer Configuration section (CCFG).
(4) Adjustable load capacitance is integrated into the device. External load capacitors are required for systems targeting compliance with
certain regulations. See the device errata for further details.
(5) The crystal manufacturer's specification must satisfy this requirement for proper operation.
(1) Default load capacitance using TI reference designs including parasitic capacitance. Crystals with different load capacitance may be
used.
ADVANCE INFORMATION
(1) When using RCOSC_LF as source for the low frequency system clock (SCLK_LF), the accuracy of the SCLK_LF-derived Real Time
Clock (RTC) can be improved by measuring RCOSC_LF relative to XOSC_HF and compensating for the RTC tick speed. This
functionality is available through the TI-provided Power driver.
(1) The MISO input data setup time can be fully compensated when delayed sampling feature is enabled.
(2) Specifies the time to drive the next valid data to the output after the output changing SCLK clock edge
(3) Specifies how long data on the output is valid after the output changing SCLK clock edge
ADVANCE INFORMATION
tSU.SI MOSI input data setup time 30 ns
tHD.SI MOSI input data hold time 0 ns
tVALID.S
MISO output data valid time(1) SCLK edge to MISO valid,CL = 20 pF, 3.3V (4) 50 ns
O
tVALID.S
MISO output data valid time(1) SCLK edge to MISO valid,CL = 20 pF, 1.8V (4) 65 ns
O
(1) Specifies the time to drive the next valid data to the output after the output changing SCLK clock edge
(2) Specifies how long data on the output is valid after the output changing SCLK clock edge
8.14.5 UART
8.14.5.1 UART Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER MIN TYP MAX UNIT
UART rate 3 MBaud
ADVANCE INFORMATION
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range 0 VDDS V
Resolution 12 Bits
Sample Rate 200 ksps
Offset Internal 4.3 V equivalent reference(2) –0.24 LSB
Gain error Internal 4.3 V equivalent reference(2) 7.14 LSB
DNL(4) Differential nonlinearity >–1 LSB
INL Integral nonlinearity ±4 LSB
Internal 4.3 V equivalent reference(2), 200 kSamples/s,
9.8
9.6 kHz input tone
Internal 4.3 V equivalent reference(2), 200 kSamples/s,
9.8
9.6 kHz input tone, DC/DC enabled
VDDS as reference, 200 kSamples/s, 9.6 kHz input tone 10.1
ENOB Effective number of bits Internal reference, voltage scaling disabled, Bits
11.1
32 samples average, 200 kSamples/s, 300 Hz input tone
Internal reference, voltage scaling disabled,
11.3
14-bit mode, 200 kSamples/s, 300 Hz input tone (5)
Internal reference, voltage scaling disabled,
11.6
15-bit mode, 200 kSamples/s, 300 Hz input tone (5)
Internal 4.3 V equivalent reference(2), 200 kSamples/s,
–65
9.6 kHz input tone
THD Total harmonic distortion VDDS as reference, 200 kSamples/s, 9.6 kHz input tone –70 dB
Internal reference, voltage scaling disabled,
–72
32 samples average, 200 kSamples/s, 300 Hz input tone
Internal 4.3 V equivalent reference(2), 200 kSamples/s,
60
9.6 kHz input tone
Signal-to-noise
SINAD,
and VDDS as reference, 200 kSamples/s, 9.6 kHz input tone 63 dB
SNDR
distortion ratio
Internal reference, voltage scaling disabled,
68
32 samples average, 200 kSamples/s, 300 Hz input tone
Internal 4.3 V equivalent reference(2), 200 kSamples/s,
70
9.6 kHz input tone
SFDR Spurious-free dynamic range VDDS as reference, 200 kSamples/s, 9.6 kHz input tone 73 dB
Internal reference, voltage scaling disabled,
75
32 samples average, 200 kSamples/s, 300 Hz input tone
Conversion time Serial conversion, time-to-output, 24 MHz clock 50 Clock Cycles
Current consumption Internal 4.3 V equivalent reference(2) 0.42 mA
Current consumption VDDS as reference 0.6 mA
Equivalent fixed internal reference (input voltage scaling
enabled). For best accuracy, the ADC conversion should be
Reference voltage 4.3(2) (3) V
initiated through the TI-RTOS API in order to include the gain/
offset compensation factors stored in FCFG1
time
(1) Using IEEE Std 1241-2010 for terminology and test methods
(2) Input signal scaled down internally before conversion, as if voltage range was 0 to 4.3 V
(3) Applied voltage must be within Absolute Maximum Ratings at all times
(4) No missing codes
(5) ADC_output = Σ(4n samples ) >> n, n = desired extra bits
8.15.2 DAC
8.15.2.1 Digital-to-Analog Converter (DAC) Characteristics
Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
General Parameters
Resolution 8 Bits
Any load, any VREF, pre-charge OFF, DAC charge-pump ON 1.8 3.8
External Load(4), any VREF, pre-charge OFF, DAC charge-pump
VDDS Supply voltage 2.0 3.8 V
OFF
Any load, VREF = DCOUPL, pre-charge ON 2.6 3.8
Buffer ON (recommended for external load) 16 250
FDAC Clock frequency kHz
Buffer OFF (internal load) 16 1000
VREF = VDDS, buffer OFF, internal load 13
Voltage output settling time 1 / FDAC
ADVANCE INFORMATION
VREF = VDDS, buffer ON, external capacitive load = 20 pF(3) 13.8
External capacitive load 20 200 pF
External resistive load 10 MΩ
Short circuit current 400 µA
VDDS = 3.8 V, DAC charge-pump OFF 50.8
VDDS = 3.0 V, DAC charge-pump ON 51.7
VDDS = 3.0 V, DAC charge-pump OFF 53.2
Max output impedance Vref =
ZMAX VDDS, buffer ON, CLK 250 VDDS = 2.0 V, DAC charge-pump ON 48.7 kΩ
kHz
VDDS = 2.0 V, DAC charge-pump OFF 70.2
VDDS = 1.8 V, DAC charge-pump ON 46.3
VDDS = 1.8 V, DAC charge-pump OFF 88.9
Internal Load - Continuous Time Comparator / Low Power Clocked Comparator
VREF = VDDS,
load = Continuous Time Comparator or Low Power Clocked
Differential nonlinearity ±1
Comparator
FDAC = 250 kHz
DNL LSB(1)
VREF = VDDS,
load = Continuous Time Comparator or Low Power Clocked
Differential nonlinearity ±1.2
Comparator
FDAC = 16 kHz
VREF = VDDS = 3.8 V ±0.64
VREF = VDDS= 3.0 V ±0.81
Offset error(2) VREF = VDDS = 1.8 V ±1.27
Load = Continuous Time LSB(1)
Comparator VREF = DCOUPL, pre-charge ON ±3.43
VREF = DCOUPL, pre-charge OFF ±2.88
VREF = ADCREF ±2.37
VREF = VDDS= 3.8 V ±0.78
VREF = VDDS = 3.0 V ±0.77
Offset error(2) VREF = VDDS= 1.8 V ±3.46
Load = Low Power Clocked LSB(1)
Comparator VREF = DCOUPL, pre-charge ON ±3.44
VREF = DCOUPL, pre-charge OFF ±4.70
VREF = ADCREF ±4.11
VREF = VDDS = 3.8 V ±1.53
VREF = VDDS = 3.0 V ±1.71
Max code output voltage
variation(2) VREF = VDDS= 1.8 V ±2.10
LSB(1)
Load = Continuous Time VREF = DCOUPL, pre-charge ON ±6.00
Comparator
VREF = DCOUPL, pre-charge OFF ±3.85
VREF = ADCREF ±5.84
ADVANCE INFORMATION
VREF = ADCREF, code 1 0.02
VREF = ADCREF, code 255 1.42
(1) 1 LSB (VREF 3.8 V/3.0 V/1.8 V/DCOUPL/ADCREF) = 14.10 mV/11.13 mV/6.68 mV/4.67 mV/5.48 mV
(2) Includes comparator offset
(3) A load > 20 pF will increases the settling time
(4) Keysight 34401A Multimeter
(1) The temperature sensor is automatically compensated for VDDS variation when using the TI-provided driver.
8.15.4 Comparators
8.15.4.1 Low-Power Clocked Comparator
Tc = 25 °C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range 0 VDDS V
Clock frequency SCLK_LF
Using internal DAC with VDDS as reference voltage,
Internal reference voltage(1) 0.024 - 2.865 V
DAC code = 0 - 255
Offset Measured at VDDS / 2, includes error from internal DAC ±5 mV
Clock
Decision time Step from –50 mV to 50 mV 1
Cycle
(1) The comparator can use an internal 8 bits DAC as its reference. The DAC output voltage range depends on the reference voltage
selected. See DAC Characteristics
ADVANCE INFORMATION
8.15.4.2 Continuous Time Comparator
Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range(1) 0 VDDS V
Offset Measured at VDDS / 2 ±5 mV
Decision time Step from –10 mV to 10 mV 0.78 µs
Current consumption Internal reference 8.6 µA
(1) The input voltages can be generated externally and connected throughout I/Os or an internal reference voltage can be generated using
the DAC
8.15.6 GPIO
8.15.6.1 GPIO DC Characteristics
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TA = 25 °C, VDDS = 1.8 V
GPIO VOH at 8 mA load IOCURR = 2, high-drive GPIOs only 1.56 V
GPIO VOL at 8 mA load IOCURR = 2, high-drive GPIOs only 0.24 V
GPIO VOH at 4 mA load IOCURR = 1 1.59 V
GPIO VOL at 4 mA load IOCURR = 1 0.21 V
GPIO pullup current Input mode, pullup enabled, Vpad = 0 V 73 µA
GPIO pulldown current Input mode, pulldown enabled, Vpad = VDDS 19 µA
GPIO low-to-high input transition, with hysteresis IH = 1, transition voltage for input read as 0 → 1 1.08 V
GPIO high-to-low input transition, with hysteresis IH = 1, transition voltage for input read as 1 → 0 0.73 V
IH = 1, difference between 0 → 1
ADVANCE INFORMATION
Running CoreMark, SCLK_HF = 48 MHz RCOSC 256 kB RAM Retention, no Cache Retention, RTC ON SCLK_LF = 32 kHz XOSC
6.5 18
6 15
5.5 12
Current [µA]
Current [mA]
5
9
ADVANCE INFORMATION
4.5
6
4
3
3.5
0
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100 110
3 Temperature [°C]
1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8
Voltage [V] Figure 8-4. Standby Mode (MCU) Current vs.
Figure 8-3. Active Mode (MCU) Current vs. Temperature
Supply Voltage (VDDS)
256 kB SRAM Retention, no Cache Retention, RTC ON, SCLK_LF = 32 kHz XOSC, VDDS = 3.6V
16
14
12
10
Current [µA]
0
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100 110
Temperature [°C]
8.16.2 RX Current
7.6 6
7.5
5.9
7.4
7.3 5.8
7.2 5.7
7.1
Current [mA]
Current [mA]
5.6
7
6.9 5.5
6.8
5.4
6.7
6.6 5.3
6.5 5.2
6.4
5.1
6.3
6.2 5
-40 -25 -10 5 20 35 50 65 80 95 105 -40 -25 -10 5 20 35 50 65 80 95 105
Temperature [°C] Temperature [°C]
11
10.5
10
9.5
Current [mA]
8.5
7.5
6.5
5.5
5
1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8
Voltage [V]
8.16.3 TX Current
15 26
14.75 25
24
14.5
23
14.25
22
14
21
Current [mA]
Current [mA]
13.75 20
13.5 19
13.25 18
17
13
16
12.75
15
12.5
14
12.25 13
12 12
ADVANCE INFORMATION
-40 -25 -10 5 20 35 50 65 80 95 105 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8
Temperature [°C] Voltage [V]
Table 8-1 shows typical TX current and output power for different output power settings.
Table 8-1. Typical TX Current and Output Power
CC1314R10 at 868 MHz, VDDS = 3.6 V (Measured on CC1312-R7EM-XD7793)
txPower TX Power Setting (SmartRF Studio) Typical Output Power [dBm] Typical Current Consumption [mA]
0x013F 14 14.6 25
0xB224 12.5 13.0 18.3
0x895E 12 12.6 17.4
0x669A 11 11.6 15.8
0x3E92 10 10.7 14.2
0x3EDC 9 9.7 13.3
0x2CD8 8 9.1 12.4
0x26D4 7 8.2 11.5
ADVANCE INFORMATION
8.16.4 RX Performance
-105 -105
-106 -106
-107 -107
-108 -108
Sensitivity [dBm]
Sensitivity [dBm]
-109 -109
-110 -110
-111 -111
-112 -112
-113 -113
-114 -114
-115 -115
ADVANCE INFORMATION
863 864 865 866 867 868 869 870 900 903 906 909 912 915 918 921 924 927 930
Frequency [MHz] Frequency [MHz]
-106 -106
-107 -107
-108 -108
Sensitivity [dBm]
Sensitivity [dBm]
-109 -109
-110 -110
-111 -111
-112 -112
-113 -113
-114 -114
-115 -115
1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature [°C] Voltage [V]
60
Selectivity [dB]
40
20
-20
-10 -8 -6 -4 -2 0 2 4 6 8 10
Frequency [MHz]
8.16.5 TX Performance
14 14
13.8 13.9
13.6 13.8
13.4 13.7
Output Power [dBm]
13 13.5
12.8 13.4
12.6 13.3
12.4 13.2
12.2 13.1
12 13
ADVANCE INFORMATION
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100105 2.1 2.3 2.5 2.7 2.9 3.1 3.3 3.5 3.7
Temperature [°C] Voltage [V]
Figure 8-18. Output Power vs. Figure 8-19. Output Power vs.
Temperature (50 kbps, 868.3 MHz) Supply Voltage (VDDS) (50 kbps, 868.3 MHz)
14 14
13.9 13.9
13.8 13.8
13.7 13.7
Output Power [dBm]
13.6 13.6
13.5 13.5
13.4 13.4
13.3 13.3
13.2 13.2
13.1 13.1
13 13
863 864 865 866 867 868 869 870 902 904 906 908 910 912 914 916 918 920 922 924 926 928
Frequency [MHz] Frequency [MHz]
Figure 8-20. Output Power vs. Figure 8-21. Output Power vs.
Frequency (50 kbps, 868 MHz) Frequency (50 kbps, 915 MHz)
11.1
10.15
10.1
10.8
ENOB [Bit]
10.05
ENOB [Bit]
10.5
10
10.2 9.95
9.9
9.9
9.85
9.6
9.8
0.2 0.3 0.5 0.7 1 2 3 4 5 6 7 8 10 20 30 40 50 70 100
ADVANCE INFORMATION
1 2 3 4 5 6 7 8 10 20 30 40 50 70 100 200
Frequency [kHz] Frequency [kHz]
Figure 8-22. ENOB vs. Figure 8-23. ENOB vs.
Input Frequency Sampling Frequency
Vin = 3.0 V Sine wave, Internal reference, 200 ksps Vin = 3.0 V Sine wave, Internal reference, 200 ksps
1.5 2.5
1 2
0.5 1.5
DNL [LSB]
INL [LSB]
0 1
-0.5 0.5
-1 0
-1.5 -0.5
0 400 800 1200 1600 2000 2400 2800 3200 3600 4000 0 400 800 1200 1600 2000 2400 2800 3200 3600 4000
ADC Code ADC Code
Figure 8-24. INL vs. Figure 8-25. DNL vs.
ADC Code ADC Code
Vin = 1 V, Internal reference, 200 ksps Vin = 1 V, Internal reference, 200 ksps
1.01 1.01
1.009 1.009
1.008 1.008
1.007 1.007
1.006
Voltage [V]
1.006
Voltage [V]
1.005 1.005
1.004 1.004
1.003 1.003
1.002 1.002
1.001 1.001
1 1
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100105 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8
Temperature [°C] Voltage [V]
Figure 8-26. ADC Accuracy vs. Figure 8-27. ADC Accuracy vs.
Temperature Supply Voltage (VDDS)
9 Detailed Description
9.1 Overview
Section 4 shows the core modules of the CC1314R10 device.
Throughout this section, see the Technical Reference Manual listed in Section 11.2 for more details.
9.2 System CPU
The CC1314R10 SimpleLink™ Wireless MCU contains an Arm® Cortex®-M33 system CPU with TrustZone®,
which runs the application and the higher layers of radio protocol stacks.
The system CPU is the foundation of a high-performance, low-cost platform that meets the system requirements
of minimal memory implementation, and low-power consumption, while delivering outstanding computational
performance and exceptional system response to interrupts.
ADVANCE INFORMATION
Its features include the following:
• ARMv8-M architecture with TrustZone® security extension optimized for small-footprint embedded
applications
• Arm Thumb®-2 mixed 16- and 32-bit instruction set delivers the high performance expected of a 32-bit Arm
core in a compact memory size
• 8 regions of non-secure memory protected regions
• 8 regions of secure memory protected regions
• 4 regions of Security Attribute Unit (SAU)
• Single-cycle multiply instruction and hardware divide
• Digital-signal-processing (DSP) extension
• IEEE 754-compliant single-precision Floating Point Unit (FPU)
• Fast code execution permits increased sleep mode time
• Deterministic, high-performance interrupt handling for time-critical applications
• Full debug with data matching for watchpoint generation
– Data Watchpoint and Trace Unit (DWT)
– JTAG Debug Access Port (DAP)
– Flash Patch and Breakpoint Unit (FPB)
• Trace support reduces the number of pins required for debugging and tracing
– Instrumentation Trace Macrocell Unit (ITM)
– Trace Port Interface Unit (TPIU) with asynchronous serial wire output (SWO)
• Optimized for single-cycle flash memory access
• Tightly connected to 8 kB 4-way random replacement cache for minimal active power consumption and wait
states
• Ultra-low-power consumption with integrated sleep modes
• 48 MHz operation
even with over-the-air (OTA) updates while still using the same silicon.
Note
Not all combinations of features, frequencies, data rates, and modulation formats described in this
chapter are supported. Over time, TI can enable new physical radio formats (PHYs) for the device and
provides performance numbers for selected PHYs in the data sheet. Supported radio formats for a
specific device, including optimized settings to use with the TI RF driver, are included in the SmartRF
Studio tool with performance numbers of selected formats found in Section 8.
ADVANCE INFORMATION
Programmable receive
Yes Yes Yes (down to 4 kHz) Yes
bandwidth
Data / Symbol rate(3) 20 to 1000 kbps ≤ 2 Msps ≤ 100 ksps ≤ 20 ksps
2-(G)FSK
2-(G)FSK
Modulation format 2-(G)FSK 4-(G)FSK 2-(G)FSK
4-(G)FSK
SUN-O-QPSK
Dual Sync Word Yes Yes No No
Carrier Sense (1) (2) Yes No No No
Preamble Detection(2) Yes Yes Yes No
Data Whitening Yes Yes Yes Yes
Digital RSSI Yes Yes Yes Yes
CRC filtering Yes Yes Yes Yes
1:2
Direct-sequence spread
No No No 1:4
spectrum (DSSS)
1:8
Forward error correction
No No No Yes
(FEC)
Link Quality Indicator (LQI) Yes Yes Yes Yes
(1) Carrier Sense can be used to implement HW-controlled listen-before-talk (LBT) and Clear Channel Assessment (CCA) for compliance
with such requirements in regulatory standards. This is available through the CMD_PROP_CS radio API.
(2) Carrier Sense and Preamble Detection can be used to implement sniff modes where the radio is duty cycled to save power.
(3) Data rates are only indicative. Data rates outside this range may also be supported. For some specific combinations of settings, a
smaller range might be supported.
9.4 Memory
The up to 1024 kB nonvolatile (Flash) memory provides storage for code and data. The flash memory is
in-system programmable and erasable. The last flash memory sector must contain a Customer Configuration
section (CCFG) that is used by boot ROM and TI provided drivers to configure the device. This configuration is
done through the ccfg.c source file that is included in all TI provided examples.
The ultra-low leakage system static RAM (SRAM) is split into up to eight 32 kB blocks and can be used for
both storage of data and execution of code. Retention of SRAM contents in Standby power mode is enabled by
default and included in Standby mode power consumption numbers.Parity checking for detection of bit errors in
memory is built-in, which reduces chip-level soft errors and thereby increases reliability. Parity can be disabled
for an additional 32 kB which can be allocated for general purpose SRAM. System SRAM is always initialized to
zeroes upon code execution from boot.
To improve code execution speed and lower power when executing code from nonvolatile memory, a 4-way
nonassociative 8 kB cache is enabled by default to cache and prefetch instructions read by the system CPU.
ADVANCE INFORMATION
The cache can be used as a general-purpose RAM by enabling this feature in the Customer Configuration Area
(CCFG).
There is a 4 kB ultra-low leakage SRAM available for use with the Sensor Controller Engine which is typically
used for storing Sensor Controller programs, data and configuration parameters. This RAM is also accessible by
the system CPU. The Sensor Controller RAM is not cleared to zeroes between system resets.
The ROM includes a TI-RTOS kernel and low-level drivers, as well as significant parts of selected radio stacks,
which frees up flash memory for the application. The ROM also contains a serial (SPI and UART) bootloader that
can be used for initial programming of the device.
ADVANCE INFORMATION
• Dynamic reuse of hardware resources
• 40-bit accumulator supporting multiplication, addition and shift
• Observability and debugging options
Sensor Controller Studio is used to write, test, and debug code for the Sensor Controller. The tool produces
C driver source code, which the System CPU application uses to control and exchange data with the Sensor
Controller. Typical use cases may be (but are not limited to) the following:
• Read analog sensors using integrated ADC or comparators
• Interface digital sensors using GPIOs, SPI, UART, or I2C (UART and I2C are bit-banged)
• Capacitive sensing
• Waveform generation
• Very low-power pulse counting (flow metering)
• Key scan
The peripherals in the Sensor Controller include the following:
• The low-power clocked comparator can be used to wake the system CPU from any state in which the
comparator is active. A configurable internal reference DAC can be used in conjunction with the comparator.
The output of the comparator can also be used to trigger an interrupt or the ADC.
• Capacitive sensing functionality is implemented through the use of a constant current source, a time-to-digital
converter, and a comparator. The continuous time comparator in this block can also be used as a higher-
accuracy alternative to the low-power clocked comparator. The Sensor Controller takes care of baseline
tracking, hysteresis, filtering, and other related functions when these modules are used for capacitive
sensing.
• The ADC is a 12-bit 200 ksps ADC with eight inputs and a built-in voltage reference. The ADC can be
triggered by many different sources including timers, I/O pins, software, and comparators.
• The analog modules can connect to up to eight different GPIOs
• Dedicated SPI master with up to 6 MHz clock speed
The peripherals in the Sensor Controller can also be controlled from the main application processor.
9.6 Cryptography
The CC1314R10 device comes with a wide set of modern cryptography-related hardware accelerators,
drastically reducing code footprint and execution time for cryptographic operations. It also has the benefit
of being lower power and improves availability and responsiveness of the system because the cryptography
operations runs in a background hardware thread.
Together with a large selection of open-source cryptography libraries provided with the Software Development
Kit (SDK), this allows for secure and future proof IoT applications to be easily built on top of the platform. The
hardware accelerator modules are:
• True Random Number Generator (TRNG) module provides a true, nondeterministic noise source for the
purpose of generating keys, initialization vectors (IVs), and other random number requirements. The TRNG is
built on 24 ring oscillators that create unpredictable output to feed a complex nonlinear-combinatorial circuit
• Secure Hash Algorithm 2 (SHA-2) with support for SHA224, SHA256, SHA384, and SHA512
• Advanced Encryption Standard (AES) with 128, 192 and 256 bit key lengths
ADVANCE INFORMATION
• Public Key Accelerator - Hardware accelerator supporting mathematical operations needed for elliptic
curves up to 512 bits
Through use of these modules and the TI provided cryptography drivers, the following capabilities are available
for an application or stack:
• Key Agreement Schemes
– Elliptic Curve Diffie–Hellman with static or ephemeral keys (ECDH and ECDHE)
– Elliptic curve Password Authenticated Key Exchange by Juggling (ECJ-PAKE)
• Signature Processing
– Elliptic curve Diffie-Hellman Digital Signature Algorithm (ECDSA)
– Edwards-curve Digital Signature Algorithm (EdDSA)
• Curve Support
– Short Weierstrass form, such as:
• NIST-P224 (secp224r1), NIST-P256 (secp256r1), NIST-P384 (secp384r1), NIST-P521 (secp521r1)
• Brainpool-256R1, Brainpool-384R1, Brainpool-512R1
– Montgomery form, such as:
• Curve25519
– Twisted Edwards form, such as:
• Ed25519
• Message Authentication Codes
– AEC CBC-MAC
– AES CMAC
– HMAC with SHA224, SHA256, SHA384 and SHA512
• Block cipher mode of operation
– AES CCM and AES CCM-Star
– AES GCM
– AES ECB
– AES CBC
– AES CTR
• Hash Algorithm
– SHA224
– SHA256
– SHA384
– SHA512
• True random number generation
Other capabilities, such as RSA encryption and signatures (using keys as large as 2048 bits) as well as other
ECC curves such as Curve1174, can be implemented using the provided public key accelerator but are not part
of the TI SimpleLink SDK for the CC1314R10 device.
9.7 Timers
A large selection of timers are available as part of the CC1314R10 device. These timers are:
• Real-Time Clock (RTC)
A 70-bit 3-channel timer running on the 32 kHz low frequency system clock (SCLK_LF)
This timer is available in all power modes except Shutdown. The timer can be calibrated to compensate for
frequency drift when using the LF RCOSC as the low frequency system clock. If an external LF clock with
frequency different from 32.768 kHz is used, the RTC tick speed can be adjusted to compensate for this.
When using TI-RTOS, the RTC is used as the base timer in the operating system and should thus only be
accessed through the kernel APIs such as the Clock module. The real time clock can also be read by the
Sensor Controller Engine to timestamp sensor data and also has dedicated capture channels. By default, the
RTC halts when a debugger halts the device.
• General Purpose Timers (GPTIMER)
ADVANCE INFORMATION
The four flexible GPTIMERs can be used as either 4× 32 bit timers or 8× 16 bit timers, all running on up to 48
MHz. Each of the 16- or 32-bit timers support a wide range of features such as one-shot or periodic counting,
pulse width modulation (PWM), time counting between edges and edge counting. The inputs and outputs of
the timer are connected to the device event fabric, which allows the timers to interact with signals such as
GPIO inputs, other timers, DMA and ADC. The GPTIMERs are available in Active and Idle power modes.
• Sensor Controller Timers
The Sensor Controller contains 3 timers:
AUX Timer 0 and 1 are 16-bit timers with a 2N prescaler. Timers can either increment on a clock or on each
edge of a selected tick source. Both one-shot and periodical timer modes are available.
AUX Timer 2 is a 16-bit timer that can operate at 24 MHz, 2 MHz or 32 kHz independent of the Sensor
Controller functionality. There are 4 capture or compare channels, which can be operated in one-shot or
periodical modes. The timer can be used to generate events for the Sensor Controller Engine or the ADC, as
well as for PWM output or waveform generation.
• Radio Timer
A multichannel 32-bit timer running at 4 MHz is available as part of the device radio. The radio timer is
typically used as the timing base in wireless network communication using the 32-bit timing word as the
network time. The radio timer is synchronized with the RTC by using a dedicated radio API when the device
radio is turned on or off. This ensures that for a network stack, the radio timer seems to always be running
when the radio is enabled. The radio timer is in most cases used indirectly through the trigger time fields
in the radio APIs and should only be used when running the accurate 48 MHz high frequency crystal is the
source of SCLK_HF.
• Watchdog timer
The watchdog timer is used to regain control if the system operates incorrectly due to software errors. It is
typically used to generate an interrupt and reset the device for the case where periodic monitoring of the
system components and tasks fails to verify proper functionality. The watchdog timer runs on a 1.5 MHz clock
rate and cannot be stopped once enabled. The watchdog timer continues to run in Standby power mode but
pauses when a debugger halts the device.
• Always On Watchdog Timer (AON_WDT)
The Always On Watchdog Timer is used during standby to regain control when the system has failed due to
a software error or failure of an external device to respond in the expected way. It generates a reset when its
configured time-out counter reaches zero and cannot be stopped once started, unless by asserting a device
reset. The Always-on watchdog timer runs in Standby power mode and may pause when a debugger halts
the device.
The debug subsystem implements two IEEE standards for debug and test purposes:
IEEE 1149.7 Class 4: Reduced-pin and Enhanced-functionality Test Access Port and Boundary-scan
Architecture. This is known by the acronym cJTAG (compact JTAG) and this device uses only two pins to
communicate to the target: TMS (JTAG_TMSC) and TCK (JTAG_TCKC). This is the default mode of operation.
IEEE standard 1149.1: Test Access Port and Boundary Scan Architecture Test Access Port (TAP). This
standard is known by the acronym JTAG and this device uses four pins to communicate to the target: TMS
(JTAG_TMSC), TCK (JTAG_TCKC), TDI (JTAG_TDI) and TDO (JTAG_TDO).
The debug subsystem also implements a user-configurable firewall to control unauthorized access to debug/test
ports.
ADVANCE INFORMATION
In Active mode, the application system CPU is actively executing code. Active mode provides normal operation
of the processor and all of the peripherals that are currently enabled. The system clock can be any available
clock source (see Table 9-2).
In Idle mode, all active peripherals can be clocked, but the Application CPU core and memory are not clocked
and no code is executed. Any interrupt event brings the processor back into active mode.
In Standby mode, only the always-on (AON) domain is active. An external wake-up event, RTC event, or Sensor
Controller event is required to bring the device back to active mode. MCU peripherals with retention do not need
to be reconfigured when waking up again, and the CPU continues execution from where it went into standby
mode. All GPIOs are latched in standby mode.
In Shutdown mode, the device is entirely turned off (including the AON domain and Sensor Controller), and
the I/Os are latched with the value they had before entering shutdown mode. A change of state on any I/O
pin defined as a wake from shutdown pin wakes up the device and functions as a reset trigger. The CPU can
differentiate between reset in this way and reset-by-reset pin or power-on reset by reading the reset status
register. The only state retained in this mode is the latched I/O state and the flash memory contents.
The Sensor Controller is an autonomous processor that can control the peripherals in the Sensor Controller
independently of the system CPU. This means that the system CPU does not have to wake up, for example to
perform an ADC sampling or poll a digital sensor over SPI, thus saving both current and wake-up time that would
otherwise be wasted. The Sensor Controller Studio tool enables the user to program the Sensor Controller,
control its peripherals, and wake up the system CPU as needed. All Sensor Controller peripherals can also be
controlled by the system CPU.
Note
The power, RF and clock management for the CC1314R10 device require specific configuration and
handling by software for optimized performance. This configuration and handling is implemented in
the TI-provided drivers that are part of the CC1314R10 software development kit (SDK). Therefore,
TI highly recommends using this software framework for all application development on the device.
The complete SDK with TI-RTOS (optional), device drivers, and examples are offered free of charge in
source code.
ADVANCE INFORMATION
9.13 Clock Systems
The CC1314R10 device has several internal system clocks.
The 48 MHz SCLK_HF is used as the main system (MCU and peripherals) clock. This can be driven by
the internal 48 MHz RC Oscillator (RCOSC_HF) or an external 48 MHz crystal (XOSC_HF). Radio operation
requires an external 48 MHz crystal.
SCLK_MF is an internal 2 MHz clock that is used by the Sensor Controller in low-power mode and also for
internal power management circuitry. The SCLK_MF clock is always driven by the internal 2 MHz RC Oscillator
(RCOSC_MF).
SCLK_LF is the 32.768 kHz internal low-frequency system clock. It can be used by the Sensor Controller for
ultra-low-power operation and is also used for the RTC and to synchronize the radio timer before or after
Standby power mode. SCLK_LF can be driven by the internal 32.8 kHz RC Oscillator (RCOSC_LF), a 32.768
kHz watch-type crystal, or a clock input on any digital IO.
When using a crystal or the internal RC oscillator, the device can output the 32 kHz SCLK_LF signal to other
devices, thereby reducing the overall system cost.
9.14 Network Processor
Depending on the product configuration, the CC1314R10 device can function as a wireless network processor
(WNP - a device running the wireless protocol stack with the application running on a separate host MCU), or as
a system-on-chip (SoC) with the application and protocol stack running on the system CPU inside the device.
In the first case, the external host MCU communicates with the device using SPI or UART. In the second case,
the application must be written according to the application framework supplied with the wireless protocol stack.
For general design guidelines and hardware configuration guidelines, refer to CC13xx/CC26xx Hardware
Configuration and PCB Design Considerations Application Report.
10.1 Reference Designs
The following reference designs should be followed closely when implementing designs using the CC1314R10
ADVANCE INFORMATION
device.
Special attention must be paid to RF component placement, decoupling capacitors and DCDC regulator
components, as well as ground connections for all of these.
CC1312-R7EM-XD7793 The CC1312-R7EM-XD7793 reference design provides schematic, layout and
Design Files production files for the characterization board used for deriving the performance
number found in this document.
LP-EM-CC1314R10 Design The CC1314R10 LaunchPad Design Files contain detailed schematics and
Files layouts to build application specific boards using the CC1314R10 device.
Sub-1 GHz and 2.4 GHz The antenna kit allows real-life testing to identify the optimal antenna for your
Antenna Kit for LaunchPad™ application. The antenna kit includes 16 antennas for frequencies from 169 MHz
Development Kit and to 2.4 GHz, including:
SensorTag • PCB antennas
• Helical antennas
• Chip antennas
• Dual-band antennas for 868 MHz and 915 MHz combined with 2.4 GHz
The antenna kit includes a JSC cable to connect to the Wireless MCU
LaunchPad Development Kits and SensorTags.
ADVANCE INFORMATION
P is the power dissipated from the device and can be calculated by multiplying current consumption with supply
voltage. Thermal resistance coefficients are found in Section 8.8.
For various application use cases current consumption for other modules may have to be added to calculate the
appropriate power dissipation. For example, the MCU may be running simultaneously as the radio, peripheral
modules may be enabled, etc. Typically, the easiest way to find the peak current consumption, and thus the
peak power dissipation in the device, is to measure as described in Measuring CC13xx and CC26xx current
consumption.
Software
SimpleLink™ The SimpleLink LOWPOWER F2 Software Development Kit (SDK) provides a complete
LOWPOWER F2 package for the development of wireless applications on the CC13XX / CC26XX family of
SDK devices. The SDK includes a comprehensive software package for the CC1314R10 device,
including the following protocol stacks:
• Bluetooth Low Energy 4 and 5.3
• Thread (based on OpenThread)
• TI Z-Stack (Zigbee 3.0)
• TI 15.4-Stack - an IEEE 802.15.4-based star networking solution for Sub-1 GHz and
2.4 GHz
• EasyLink - a large set of building blocks for building proprietary RF software stacks
• Multiprotocol support - concurrent operation between stacks using the Dynamic
Multiprotocol Manager (DMM)
• TI Wi-SUN FAN Stack
• Matter
The SimpleLink LOWPOWER F2 SDK is part of TI’s SimpleLink MCU platform, offering a
single development environment that delivers flexible hardware, software and tool options
for customers developing wired and wireless applications. For more information about the
SimpleLink MCU Platform, visit ti.com/simplelink.
Development Tools
Code Composer Code Composer Studio is an integrated development environment (IDE) that supports TI's
Studio™
ADVANCE INFORMATION
Microcontroller and Embedded Processors portfolio. Code Composer Studio comprises a
Integrated suite of tools used to develop and debug embedded applications. It includes an optimizing
Development C/C++ compiler, source code editor, project build environment, debugger, profiler, and many
Environment other features. The intuitive IDE provides a single user interface taking you through each
(IDE) step of the application development flow. Familiar tools and interfaces allow users to get
started faster than ever before. Code Composer Studio combines the advantages of the
Eclipse® software framework with advanced embedded debug capabilities from TI resulting
in a compelling feature-rich development environment for embedded developers.
CCS has support for all SimpleLink Wireless MCUs and includes support for EnergyTrace™
software (application energy usage profiling). A real-time object viewer plugin is available for
TI-RTOS, part of the SimpleLink SDK.
Code Composer Studio is provided free of charge when used in conjunction with the XDS
debuggers included on a LaunchPad Development Kit.
Code Composer Code Composer Studio (CCS) Cloud is a web-based IDE that allows you to create, edit and
Studio™ Cloud build CCS and Energia™ projects. After you have successfully built your project, you can
IDE download and run on your connected LaunchPad. Basic debugging, including features like
setting breakpoints and viewing variable values is now supported with CCS Cloud.
IAR Embedded IAR Embedded Workbench® is a set of development tools for building and debugging
Workbench® for embedded system applications using assembler, C and C++. It provides a completely
Arm® integrated development environment that includes a project manager, editor, and build
tools. IAR has support for all SimpleLink Wireless MCUs. It offers broad debugger support,
including XDS110, IAR I-jet™ and Segger J-Link™. A real-time object viewer plugin is
available for TI-RTOS, part of the SimpleLink SDK. IAR is also supported out-of-the-box
on most software examples provided as part of the SimpleLink SDK.
A 30-day evaluation or a 32 kB size-limited version is available through iar.com.
SmartRF™ SmartRF™ Studio is a Windows® application that can be used to evaluate and configure
Studio SimpleLink Wireless MCUs from Texas Instruments. The application will help designers
of RF systems to easily evaluate the radio at an early stage in the design process. It is
especially useful for generation of configuration register values and for practical testing
and debugging of the RF system. SmartRF Studio can be used either as a standalone
application or together with applicable evaluation boards or debug probes for the RF device.
Features of the SmartRF Studio include:
• Link tests - send and receive packets between nodes
• Antenna and radiation tests - set the radio in continuous wave TX and RX states
• Export radio configuration code for use with the TI SimpleLink SDK RF driver
• Custom GPIO configuration for signaling and control of external switches
Sensor Controller Sensor Controller Studio is used to write, test and debug code for the Sensor Controller
Studio peripheral. The tool generates a Sensor Controller Interface driver, which is a set of C
source files that are compiled into the System CPU application. These source files also
contain the Sensor Controller binary image and allow the System CPU application to control
and exchange data with the Sensor Controller. Features of the Sensor Controller Studio
include:
• Ready-to-use examples for several common use cases
• Full toolchain with built-in compiler and assembler for programming in a C-like
programming language
• Provides rapid development by using the integrated sensor controller task testing
and debugging functionality, including visualization of sensor data and verification of
algorithms
UniFlash UniFlash is a standalone tool used to program on-chip flash memory on TI MCUs. UniFlash
ADVANCE INFORMATION
has a GUI, command line, and scripting interface. UniFlash is available free of charge.
TI Resource Explorer Software examples, libraries, executables, and documentation are available for your
device and development board.
Errata
CC1314R10 Silicon The silicon errata describes the known exceptions to the functional specifications
Errata for each silicon revision of the device and description on how to recognize a device
revision.
Application Reports
All application reports for the CC1314R10 device are found on the device product folder at: ti.com/product/
CC1314R10/technicaldocuments.
Technical Reference Manual (TRM)
CC13x4, CC26x4 SimpleLink™ Wireless The TRM provides a detailed description of all modules and
MCU Technical Reference Manual peripherals available in the device family.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.4 Trademarks
SimpleLink™, LaunchPad™, EnergyTrace™, Code Composer Studio™, and TI E2E™ are trademarks of Texas
Instruments.
I-jet™ is a trademark of IAR Systems AB.
J-Link™ is a trademark of SEGGER Microcontroller Systeme GmbH.
Arm®, Cortex®, and TrustZone® are registered trademarks of Arm Limited (or its subsidiaries) in the US and/or
elsewhere.
CoreMark® is a registered trademark of Embedded Microprocessor Benchmark Consortium Corporation.
Wi-SUN® is a registered trademark of Wi‑SUN Alliance.
mioty® is a registered trademark of Fraunhofer-Gesellschaft.
Wi-Fi® is a registered trademark of Wi-Fi Alliance.
Arm Thumb® are registered trademarks of Arm Limited (or its subsidiaries).
ADVANCE INFORMATION
is a registered trademark of Arm Limited.
Eclipse® is a registered trademark of Eclipse Foundation.
IAR Embedded Workbench® is a registered trademark of IAR Systems AB.
Windows® is a registered trademark of Microsoft Corporation.
All trademarks are the property of their respective owners.
11.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
11.6 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
Note
The RSK (S-PQVFN-N64) package drawings in this datasheet are preliminary and will change for the
production release of this IC. The change will be related to the exposed thermal pad size of the IC.
The current sample has a 3.7 mm x 3.7 mm thermal ground pad. Production devices will have a 4.7
mm x 4.7mm thermal ground pad. It is recommended to design the thermal ground pad to be 4.7
mm x 4.7 mm, with a stencil opening of 3.7 mm x 3.7mm for pre-production devices. For production
devices, only the stencil will need to change to 4.7 mm x 4.7 mm. No change to the PCB will be
ADVANCE INFORMATION
required.
PACKAGE OUTLINE
RGZ0048A VQFN - 1 mm max height
PLASTIC QUADFLAT PACK- NO LEAD
7.1 A
B 6.9
7.1
PIN 1 INDEX AREA 6.9
ADVANCE INFORMATION
1 MAX
C
SEATING PLANE
0.05 0.08 C
0.00
2X 5.5
2X SYMM
5.5
1 36
PIN1 ID 48X 0.30
0.18
48 37
(OPTIONAL)
SYMM 0.1 C A B
48X 0.5
0.3 0.05 C
4219044/A 05/2018
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for optimal thermal and mechanical performance.
www.ti.com
2X (6.8)
( 5.15)
SYMM
48X (0.6) 48 35
48X (0.24)
44X (0.5) 1
34
ADVANCE INFORMATION
SYMM
2X 2X
(5.5) (6.8)
2X
(1.26)
2X
(1.065)
(R0.05)
TYP
23
12
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271) .
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
www.ti.com
2X (6.8)
SYMM ( 1.06)
48X (0.6)
48X (0.24)
44X (0.5)
ADVANCE INFORMATION
SYMM
2X 2X
(5.5) (6.8)
2X
(0.63)
2X
(1.26)
(R0.05)
TYP
2X
2X (0.63)
(1.26)
2X (5.5)
EXPOSED PAD
67% PRINTED COVERAGE BY AREA
SCALE: 15X
4219044/A 05/2018
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
ADVANCE INFORMATION
www.ti.com 14-Jun-2023
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
XCC1314R106T0RGZ ACTIVE VQFN RGZ 48 260 TBD Call TI Call TI -40 to 105 Samples
XCC1314R106T0RSK ACTIVE VQFN RSK 64 4000 TBD Call TI Call TI -40 to 105 Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
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Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
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Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 14-Jun-2023
Addendum-Page 2
GENERIC PACKAGE VIEW
RGZ 48 VQFN - 1 mm max height
7 x 7, 0.5 mm pitch PLASTIC QUADFLAT PACK- NO LEAD
Images above are just a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
4224671/A
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PACKAGE OUTLINE
RGZ0048A VQFN - 1 mm max height
PLASTIC QUADFLAT PACK- NO LEAD
7.1 A
B 6.9
(0.1) TYP
(0.45) TYP
CHAMFERED LEAD
CORNER LEAD OPTION
1 MAX
C
SEATING PLANE
0.05 0.08 C
0.00
2X 5.5
2X SYMM
5.5
1 36
PIN1 ID 48X 0.30
0.18
48 37
(OPTIONAL)
SYMM 0.1 C A B
48X 0.5
0.3 0.05 C
SEE LEAD OPTION
4219044/D 02/2022
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for optimal thermal and mechanical performance.
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EXAMPLE BOARD LAYOUT
RGZ0048A VQFN - 1 mm max height
PLASTIC QUADFLAT PACK- NO LEAD
2X (6.8)
( 5.15)
SYMM
48X (0.6) 48 37
48X (0.24)
44X (0.5) 1
36
2X SYMM 2X
(5.5) (6.8)
2X
(1.26)
2X
(1.065)
(R0.05)
TYP
25
12
21X (Ø0.2) VIA
TYP
13 24
2X (1.26) 2X (1.065)
2X (5.5)
LAND PATTERN EXAMPLE
SCALE: 15X
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
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EXAMPLE STENCIL DESIGN
RGZ0048A VQFN - 1 mm max height
PLASTIC QUADFLAT PACK- NO LEAD
2X (6.8)
SYMM ( 1.06)
48X (0.6) 48 37
48X (0.24)
44X (0.5) 1
36
2X SYMM 2X
(5.5) 2X (6.8)
(0.63)
2X
(1.26)
(R0.05)
TYP
25
12
13 2X 24
2X (0.63)
(1.26)
2X (5.5)
EXPOSED PAD
67% PRINTED COVERAGE BY AREA
SCALE: 15X
4219044/D 02/2022
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
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