BJT Lab Experiment
BJT Lab Experiment
BJT Lab Experiment
Procedure:
Part 1: Determination of Transistor’s Type, Terminals and Material
The following procedure will determine the type of a transistor, the terminals of a transistor,
and the material from which it is made. The procedure will utilize the diode testing scale found
on many modern DMMs. If no such scale is available, the resistance scales of the meter may be
used.
a. Label the transistors terminals of Figure 7.1 as 1, 2 and 3.
1(c) 1 2
1(d) 2 1
1(e) 1 3
1(f) 3 1
1(g) 2 3
1(h) 3 2
j. Connect the negative lead to the base terminal and the positive lead to either of the other
terminals. If the meter reading is low (approx. 0.7V for Si and 0.3V for Ge), the transistor
type is PNP; go to step k(1). If the meter reading is high, the transistor type is NPN; go to
step k(2). Record the type of transistor in Table 7.2.
k. (1). For PNP type, connect the negative of DMM at the base terminal and the positive lead
alternately to either of the other two terminals. The lower of the two readings obtained
indicates that base and collector are connected. Thus, the other terminal is emitter. Record
the terminals (collector and emitter) in Table 7.2.
(2). For NPN type, connect the positive of DMM at the base terminal and the negative lead
alternately to either of the other two terminals. The lower of the two readings obtained
indicates that base and collector are connected. Thus, the other terminal is emitter. Record
the terminals (collector and emitter) in Table 7.2.
l. If the readings in either step k(1) or step k(2) were approximately 700mV, the transistor
material is Silicon (Si). If the readings were approximately 300mV, the transistor material is
Germanium (Ge). Record the type of material in Table 7.2.
Modern DMMs have the capability to determine the terminals and type of the BJT transistor.
The DMM has transistor socket, which is used to test the BJT transistor. This socket has 4 upper
and 4 lower holes to test both the types of BJT transistor (NPN or PNP). Since BJT transistor has
three terminals, you can test the transistor by inserting it randomly into these holes. When proper
slot is achieved, transistor will show some gain value (hfe). At this instant, you can find the
Figure 7.2
b. Set the voltage VRB = 3.3V by varying the 1-MΩ potentiometer (Pot-1). This adjustment will
𝐕𝐑𝐁
set IB = ≅ 10µA, as indicated in Table 7.3.
𝐑𝐁
c. Vary the 1-kΩ potentiometer (Pot-2) to adjust VCE from 2V to the values appearing in Table
7.3. Note that IB is maintained at 10µA for the range of VCE levels. For each value of VCE,
record VRC and VBE. Record all the values in Table 7.3.
d. Repeat step 2(b) and 2(c) for VRB = 9.9V. VRB will be adjusted by varying the 1-MΩ
𝐕𝐑𝐁
potentiometer (Pot-1). This adjustment will set IB = ≅ 30µA, as indicated in Table 7.3.
𝐑𝐁
50µA, as indicated in Table 7.3. Record all the desired values in Table 7.3.
𝐕𝐑𝐂
f. Now, find the collector currents as IC = using measured values VRC and RC. Obtain the
𝐑𝐂
2V
4V
6V
8V
10uA =
3.3V 0.01mA 10V
12V
14V
16V
2V
4V
6V
8V
30uA =
9.9V 10V
0.03mA
12V
14V
16V
2V
4V
6V
8V
50uA =
16.5V 0.05mA 10V
12V
14V
16V
Figure 7.3
Part 3: Variation of α and β
a. For each line of Table 7.3, calculate the corresponding levels of α and β
𝐈𝐂 𝐈𝐂
using α = and β = and complete the Table 7.3.
𝐈𝐄 𝐈𝐁
b. In there a significant variation in α and β from one region of the characteristics to another?
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c. Find out the largest and smallest level of βmax and βmin.
βmax =______________
βmin =______________
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f. Find the average value of β using the data of Table 7.3. That is, find the sum of β values and
βaverage =______________
g. Similarly, determine the average value of VBE using the data of Table 7.3.