BS EN 61829:2016

Photovoltaic (PV) array —

On-site measurement of
current-voltage characteristics

bsi. .making excellence a habit!"

BS EN 61829:2016
EN 61829:2016

European foreword

The text of document 82/1008/FDIS, future edition 2 o f IEC 61829, prepared by IEC/TC 82 “Solar
photovoltaic energy systems" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 61829:2016.

The following dates are fixed:

• latest date by which the document has to be (dop) 2016-08-26

implemented at national level by
publication o f an identical national
standard or by endorsement

• latest date by which the national (dow) 2019-02-26

standards conflicting with the
document have to be withdrawn

This document supersedes EN 61829:1998.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.

E n d o rsem en t notice

The text of the International Standard IEC 61829:2015 was approved by CENELEC as a European
Standard without any modification.

In the official version, for Bibliography, the following notes have to be added for the standards indicated:

IEC 60904-5 NOTE Harmonized as EN 60904-5.

IEC 61853-1:2011 NOTE Harmonized as EN 61853-1:2011 (not modified).
ISO/IEC 17025 NOTE Harmonized as EN ISO/IEC 17025.

2
 BS EN 61829:2016
EN 61829:2016

Annex ZA
(normative)

N orm ative references to international publications

with th e ir co rres p o n d in g European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu

Publication Year Title EN/HD Year

IEC 60891 Photovoltaic devices - Procedures for EN 60891

temperature and irradiance corrections to
measured l-V characteristics

IEC 60904-1 Photovoltaic devices - EN 60904-1

Part 1: Measurement o f photovoltaic
current-voltage characteristics

IEC 60904-2 Photovoltaic devices - EN 60904-2

Part 2: Requirements for photovoltaic
reference devices

IEC 60904-3 Photovoltaic devices - EN 60904-3

Part 3: Measurement principles for
terrestrial photovoltaic (PV) solar devices
with reference spectral irradiance data

IEC 60904-4 Photovoltaic devices - EN 60904-4

Part 4: Reference solar devices -
Procedures for establishing calibration
traceability

IEC 60904-7 Photovoltaic devices - EN 60904-7

Part 7: Computation of the spectral
mismatch correction for measurements of
photovoltaic devices

IEC 60904-10 Photovoltaic devices - EN 60904-10

Part 10: Methods o f linearity measurement

3
 BS EN 61829:2016
-2 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

CONTENTS

F O R E W O R D .......................................................................................................................................................... 3
IN T R O D U C T IO N ...................................................................................................................................................5
1 S c o p e ................................................................................................................................................................6
2 N orm ative re fe re n c e s ..................................................................................................................................6
3 T erm s and d e fin itio n s ..................................................................................................................................7
4 A p p a ra tu s ........................................................................................................................................................ 7
4.1 Irra d ia nce m ea surem e nts in natu ra l s u n lig h t............................................................................ 7
4.2 M odule te m p e ra tu re m e a s u re m e n ts ............................................................................................ 8
4.3 E le ctrica l m e a s u re m e n ts ................................................................................................................. 8
5 M easurem ent p ro c e d u re .............................................................................................................................9
5.1 C hoose and record a pp ro priate co nd itio ns fo r m e a s u re m e n t..............................................9
5.2 C lean the m o d u le s ............................................................................................................................ 9
5.3 C heck fo r s h a d in g ..............................................................................................................................9
5.4 C onfirm u n ifo rm ity o f irra dian ce o ver the te st a r r a y ............................................................. 10
5.5 M ount the refe ren ce d e v ic e .......................................................................................................... 10
5.6 P repare to m easure the a rra y te m p e ra tu re ..............................................................................10
5.7 D iscon ne ct the a rr a y ....................................................................................................................... 11
5.8 C on ne ct the m easurem ent system to the a rray to be m e a s u re d ......................................11
5.9 R ecord e le ctrica l data and m ea surem e nt c o n d itio n s .............................................................11
5.10 R ecord sp ectral d a ta .......................................................................................................................12
5.11 T ypical and extrem e m odule s e le c tio n ..................................................................................... 12
6 A n a ly s is ..........................................................................................................................................................13
6.1 A d ju st the m easured irra d ia n ce fo r any d eviatio n from reference c o n d itio n s ...............13
6.2 C om pute the average te m p era ture o f the a rray under te s t.................................................13
6.3 C om pute the ju n c tio n te m p e ra tu re ............................................................................................ 14
6.4 T ra n sla te the m easurem ent to the desired test c o n d itio n ................................................... 14
6.5 C orrect fo r soiling lo s s e s ..............................................................................................................14
7 T est re p o rt.....................................................................................................................................................14
Annex A (in fo rm ative ) R eference values and reference d e v ic e ............................................................ 16
A.1 R eference te st co nd itio ns (R T C )................................................................................................ 16
A .2 Standard te st cond itio ns (S T C )...................................................................................................16
A .3 R eference d e v ic e ............................................................................................................................. 16
B ib lio g ra p h y ..........................................................................................................................................................17

Figure 1 - E xam ples of extrem e and central m o d u le s ............................................................................ 13

BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 -3 -

INTERNATIONAL ELECTROTECHNICAL COMMISSION

P H O T O V O L T A IC (PV) A R R A Y -
O N -SITE M E A S U R E M E N T OF C U R R E N T -V O L T A G E C H A R A C T E R IS T IC S

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports. Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC
Publication(s)” ). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non­
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may bethe subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

In te rn atio na l S tandard IEC 61829 has been prepared by IEC te chn ical co m m itte e 82: Solar
p h o to vo lta ic energy system s.

This second e dition ca nce ls and replaces the firs t e dition p ublished in 1995. T his edition
co n stitu te s a te chn ical revision.

This e dition includes the fo llo w in g sig n ific a n t te chn ical changes w ith resp ect to the previous
edition:

a) it addresses m any outdated p rocedures;

b) it accom m odates co m m on ly used co m m ercial I-V curve trace rs;
c) it provides a m ore pra ctical approach fo r add re ssing field u nce rta intie s;
d) it rem oves and rep la ce s procedures w ith re fe ren ces to o th e r updated and p ertine nt
sta nd ard s, including the IEC 60904 series, and IEC 60891.
 BS EN 61829:2016
-4 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

T he resu lt is a m uch m ore pra ctical and useful standard.

The te xt o f th is standard is based on the fo llo w in g docum ents:

FDIS Report on voting

82/1008/FDIS 82/1041/RVD

Full inform a tion on the voting fo r the a pproval o f this standard can be found in the rep ort on
voting indicated in the above table.

T his p ub lica tion has been drafted in accorda nce w ith the ISO /IEC D ire ctives, Part 2.

The co m m itte e has decided th a t the co nte nts o f th is p ub lica tion w ill rem ain unchanged until
the s ta b ility date indicated on the IEC w eb site under " h ttp ://w e b s to re .ie c .c h " in the data
related to the sp ecific p ub lica tion . A t this date, the p ub lica tion w ill be

• reconfirm ed,
• w ithdraw n,
• replaced by a revised edition, or
• am ended.
BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 -5 -

INTRODUCTION

The p erform an ce o f p h o to vo lta ic (PV) syste m s o ver th e ir deca de s-lo ng life tim e is determ ined
by com paring m easured pow er production w ith the expected production as e stim ated from
recorded w ea th er co n d itio n s. C ontinuous m easurem ents o f syste m - or subsyste m -leve l
ope ra ting o u tp u t can d e te ct und erpe rform in g a rrays but are not w ell suited fo r trackin g
degra da tion w ith any accuracy, or fo r ide ntifyin g the w ea kne sses or fa ilu re m odes th a t may
e xist w ithin the array. Field I-V curve m easurem ents o ffe r a pra ctical m ethod o f in situ
benchm arking or trou b le sh o o tin g fo r m odules, string s and arrays. This In te rn atio na l Standard
sp ecifies m ethods and a pp ro ach es fo r fie ld I-V curve m easurem ents and ca lcu la tio n s, and
includes guida nce fo r add re ssing the u n ce rta in tie s a ssociated w ith m ea surem e nt devices and
a rray co n fig u ra tio n s. C o n sisten t and proper a pp lica tion o f I-V curve m ea surem e nt p rocedures
helps to ensure th a t a PV syste m ’s p erform an ce is a d e q u a te ly ch aracte rize d o v e r tim e.
 BS EN 61829:2016
-6 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

P H O T O V O L T A IC (PV) A R R A Y -
O N -SITE M E A S U R E M E N T OF C U R R E N T -V O L T A G E C H A R A C T E R IS T IC S

1 Scope

This In te rn atio na l S tandard sp e cifie s procedures fo r o n-site m easurem ent o f fla t-p la te
p h o to vo lta ic (PV) a rray ch a ra cte ristic s , the a ccom panying m ete oro lo gica l co nd itio ns, and use
o f these fo r tra n sla tin g to standard te st c o n d itio n s (STC ) o r o th e r se lected co nd itio ns.

M easurem ents of PV a rray cu rre n t-v o lta g e (I-V ) c h a ra c te ris tic s u nder actua l o n -s ite cond itio ns
and th e ir tra n sla tio n to refe ren ce te st c o n d itio n s (R TC ) can provide:

• data fo r pow er rating o r c a p a city testing;

• ve rifica tio n o f installed a rra y pow er p erform an ce re la tive to design sp e c ific a tio n s ;
• d ete ction o f possible d iffe re n ce s betw een o n-site m odule c h a ra c te ris tic s and lab ora tory or
fa cto ry m easurem ents;
• d ete ction o f possible perform ance degra da tion o f m odules and a rrays w ith resp ect to on­
site initia l data;
• d ete ction o f p ossible m odule o r a rray fa ilu re s o r poor perform ance.

For a p a rticu la r m odule, o n-site m ea surem e nts tran slate d to STC can be d ire ctly com pared
w ith results p re vio u sly obtained in a la b o ra to ry or fa c to ry fo r th a t m odule. C orre ctio n s fo r
d iffe re n ce s in the sp ectral or spatial response o f the reference devices m ay need to be
assessed as sp ecified in IEC 60904.

O n -site a rra y m easurem ents are a ffected by diode, cable, and m ism atch losses, so iling and
shading, degra da tion due to aging, and o the r unco ntro lle d effects. T he re fo re , th ey are not
expected to be equal to the pro du ct o f the num ber o f m odules and the resp ective m odule
data.

If a PV a rra y is form ed w ith su b -a rra ys o f d iffe re n t tilt, o rie n ta tio n , te ch n o lo g y, or e le ctrica l

co n fig u ra tio n , the procedure sp ecified in th is In te rn atio na l S tandard is applied to each unique
PV su b -a rra y o f interest.

2 Normative references

The fo llo w in g docu m e nts, in w hole or in part, are n o rm a tive ly referenced in this d ocu m e nt and
are ind ispe nsa ble fo r its a p p lica tio n . For dated references, o n ly the e dition cited app lie s. For
undated refe ren ces, the latest e dition o f the referenced docu m e nt (in clud ing any
a m endm ents) applies.

IEC 60891, P h o to vo lta ic devices - P ro ced ures fo r te m p era ture a nd irra d ia n ce c o rre ctio n s to
m e a su re d l-V ch a ra cte ristics

IEC 60904-1, P h o to vo lta ic devices - P a rt 1: M ea surem e nt o f p h o to v o lta ic cu rre n t-vo lta g e

ch a ra cte ristics

IEC 60904-2, P h o to vo lta ic d e vice s - P art 2: R eq uirem en ts fo r p h o to v o lta ic refe ren ce devices

IEC 60904-3, P h o to vo lta ic devices - P art 3: M ea surem e nt p rin c ip le s fo r te rre s tria l

p h o to v o lta ic (PV) s o la r devices with refe ren ce s p e c tra l irra d ia n c e data
BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 -7 -

IEC 60904-4, P h o to vo lta ic devices - P a rt 4: R eferen ce s o la r devices - P ro ced ures fo r

e sta b lish in g ca lib ra tio n tra c e a b ility

IE C 60904-7, P h o to vo lta ic devices - P a rt 7: C om putation o f the s p e c tra l m ism atch co rrectio n

fo r m ea surem e nts o f p h o to vo lta ic devices

IEC 60904-10, P h o to vo lta ic devices - P a rt 10: M eth od s fo r lin e a rity m ea surem e nts

3 Terms and definitions

For the purposes o f th is docum ent, the fo llo w in g term s and d e fin itio n s apply.

3.1
p yran o m eter
rad io m ete r n o rm a lly used to m easure glo ba l irra dian ce on a h orizontal plane

Note 1 to entry: A pyranometer can also be used to measure diffuse irradiance when used with a shade ring or
disc.

Note 2 to entry: A pyranometer can also be used to measure total irradiance on an inclined plane, which would
include radiation reflected from the foreground.

[S O U R C E : IEC TS 61836:2007, 3.5.7 b))

3.2
ra d io m eter
in stru m e n t fo r m easuring the in te n sity o f solar irradiance

Note 1 to entry: See also IEC 60050-845:1987, 845-05-06.

Note 2 to entry: Commonly, a radiometer is a thermal instrument using thermocouples or thermopiles and is
independent of wavelength.

[S O U R C E : IEC TS 61836:2007, 3.5.7)

3.3
s p e ctro ra d io m ete r
in stru m e n t used to m easure sp ectral irra dian ce d is trib u tio n o f an in cid e n t radiation as a
fu n ctio n o f w avelength

[S O U R C E : IEC TS 61836:2007, 3.5.7 d)]

4 Apparatus

4.1 Irrad ian ce m easu rem en ts in natural su n lig h t

The irra d ia n ce m ea surem e nts sh all be m ade using a PV refe ren ce device packaged and
ca lib ra te d in co nfo rm a nce w ith IEC 60904-2 or w ith a pyra no m e te r. PV refe ren ce devices
shall have sp ectral m atching addressed by one o f the fo llo w in g m ethods.

a) The refe ren ce device is sp e ctra lly m atched to the m odules in the a rra y under test.
b) A spectral m ism atch co rrectio n should be perform ed in co nfo rm a nce w ith IEC 60904-7.
The refe ren ce device shall be linear in s h o rt-c irc u it cu rre n t as defined in IEC 60904-10
o ver the irra dian ce range o f interest.
c) If spectral m ea surem e nts are not pra ctical, u nce rta intie s a ssociated w ith the irra dian ce
m easurem ent and sp e cific sensors used should be reported as part o f the analysis.
M easurem ents should be com pleted u nder c le a r-s k y c o n d itio n s w ith the nea re st clouds at
 BS EN 61829:2016
-8 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

least 15° from the sun and the se nso r m ounted in the plane o f the item s u nder te s t as
discu ssed elsew here.

To be co nside red sp e ctra lly m atched, a refe ren ce device shall be co nstructed using the sam e
cell te ch n o lo g y and enca psu la tio n package as the m odules in the a rra y u nder test. If th is is
not the case, the sp ectral m ism atch shall be reported or an estim a te o f the u nce rta inty shall
be m ade as part o f the analysis. S pectral m ism atch is o f p a rtic u la r concern w ith thin film
m odules.

For m odules that co nce ntra te su n lig h t w ith an o ptical co nce ntra tion ratio o f g re a te r than 3:1,
at least one rad io m ete r shall p rovide a co llim a te d m easure o f d irect norm al irradiance
(IEC 6 0904-4).

The te m p era ture o f the refe ren ce device shall be m easured using instru m e n ta tio n with an
accuracy o f ±1 °C w ith re p e a ta b ility o f ±0,5 °C. If the refe ren ce device has internal co rrectio n
fo r te m p era ture or if the refe ren ce device is a p yra no m e te r w ith a te m p era ture c o e ffic ie n t
< 0,02 % /°C, te m p era ture m easurem ent is not required. H ow ever, the m ounting o f a
th e rm o p ile shall be co n siste n t w ith the co nd itio ns used fo r c a lib ra tin g it.

A suitab le m eans is required to check that the refe ren ce device and the m odules are co plan ar
w ith in ±2° accuracy.

NOTE A digital level or other calibrated device can be used to confirm coplanar modules.

An add itio na l p yra no m e te r is required fo r checking the u n ifo rm ity o f the in-pla ne radiance.
This rad io m ete r shall p rovide a sta ble o utp ut, but need not be ca lib ra te d since it is o n ly used
fo r relative m easurem ents.

If spectral co rre ctio n s w ill be m ade, a s p e ctro ra d io m e te r is required th a t is capable o f

m easuring the sp ectral irra dian ce o f the su n lig h t in the range o f the sp ectral response o f the
te st specim en and the reference device.

4.2 M odule tem p e ratu re m easu rem en ts

The te m p era ture o f the m odule backsheets o f the a rra y under te s t shall be m easured using
instru m e ntatio n w ith an accuracy o f ±1 °C w ith re p e a ta b ility o f ±0 ,5 °C. It is recom m ended to
m ech an ically a tta ch a fla t th erm al se nso r w ith fin e leads d ire c tly to the backsh ee t in the
m iddle o f a m odule and at le a st 10 cm from any ju n c tio n box, but opp osite an active part of
the m odule. T he a tta ch m e n t m ethod should not change the te m p era ture o f the m odule, as
m ay be ide ntifie d by infrared im aging from the fro n t o f the m odule. An o ptical th erm om ete r
m ay be used o n ly if the b acksheet e m is s iv ity has been ca lib ra te d w ell enough th a t the optical
th e rm o m e te r accuracy is w ithin 1 °C. A handheld c o n ta ct th e rm o m e te r m ay be used only if it
has been ve rified th a t the a ccu ra cy is w ith in 1 °C.

NOTE Most handheld thermometers conduct heat into the handle of the thermometer causing a temperature
reading that is less than the actual backsheet temperature.

4.3 E lectrical m easu rem en ts

A se lf-co nta ine d I- V curve tracin g unit shall be able to accom m o da te the a nticipa te d array
voltage, cu rren t, and pow er levels. The rate at w hich the unit sw eeps the curve should be fast
enough to avoid changes in irra dian ce during the curve but slow enough to ensure th a t the PV
m odules are achievin g steady state co n d itio n s. O ther e qu ip m en t suitab le fo r sw eeping the
a rray through a sig n ific a n t portion o f its I-V cu rve m ay be used though any lim ita tio n s with
resp ect to the above req uirem en ts shall be c le a rly stated in the m ea surem e nt report.

The I-V curve tracin g unit shall be able to m easure vo ltag es and cu rren ts w ith an accuracy of
±1 % o f the o p e n -circu it vo ltag e and s h o rt-c irc u it cu rre n t using ind ep en d en t leads from the
te rm in a ls o f the a rra y under te st and keeping all w ires th a t w ould add se ries resista nce as
sh ort as possible. If o n ly tw o leads are used, the e rro r introduced shall be included in the
BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 -9 -

u n ce rta in ty a na lysis. The m ea surem e nt ranges o f the data a cq u isitio n should be c a re fu lly
chosen to m atch the array being m easured.

The instru m e n ta tio n should be ca p a b le o f m easuring cu rre n t at ze ro vo ltag e, using a va ria b le

bias (p re fe ra b ly e le ctro n ic) to offse t the vo ltag e drop across the e xterna l series resista nce . If
the instru m e ntatio n is not ca pa ble o f reaching ze ro voltage bias, e xtra po latio n m ay be used,
but the instru m e ntatio n shall be able to reach a vo ltag e bias o f 3 % o f the device o p e n -c irc u it
voltage.

5 Measurement procedure

5.1 C hoose and record a p p ro p ria te co n d itio n s fo r m easu rem en t

T he ideal co nd itio ns fo r an o utd oo r I-V curve te s t are cle a r skies (no clouds and no fo g ) and
little w ind. V a ria ble irra d ia n ce and w ind both intro du ce te m p era ture tra n sie n ts in the a rray that
confound the a ccu ra cy o f the m easurem ents. In p ractice, tim e and co ntractua l co nstrain ts
lim it the p eriods in w hich it is possible to perform a test. T herefore, it is the re s p o n s ib ility of
the p erson (s) cond uctin g the test to ensure th a t all tests are perform ed under the m ost stable
co n d itio n s possible, and th a t special attention is given to noting va ria b le irradiance, w ind, and
a rray te m p era ture s. For exam ple, even though irra d ia n ce during the course o f the I-V
m easurem ent does not va ry m ore than 2 %, it m ay be th a t the irra dian ce increased by 30 % in
the 5 m in leading up to the test, and th a t the a rra y te m p era ture m ay not have e qu ilibra ted
before the te st w as run.

R ecord the w ea th er co nd itio ns, q u a lita tive ly, and p e rio d ic a lly note when and how co nd itio ns
change over the period during w hich I-V curves are being taken. It is recom m ended to take a
picture o f the sky and record the tim e perio d ica lly.

NOTE This information is for identifying potentially erroneous data, and is not directly used in the analysis.

5.2 Clean the m odules

The cle a n lin e ss o f the m odule su rfa ces shall be c o n s is te n t w ith the inten t o f the test. The
state o f clea nline ss, w he th er o r not cleaning has been a ttem pted, shall be reported.

If the in te n t o f the te st is to d e te ct any possible d iffe re n ce s betw een fie ld e d m odules and
lab ora tory or fa cto ry m easurem ents, e ithe r

a) the a rray shall be cleaned th oro u g h ly im m e diately p rior to the m easurem ent, or
b) a rep re sen ta tive string shall be tested im m e diately p rior to and im m e diately a fte r a
th orou g h cleaning. The level o f soil on the a rray is dete rm ine d by com paring the results of
the string I-V te st before and a fte r the cleaning. Such an a ssessm en t o f so iling should be
conducted under ve ry sta ble irra dian ce co nd itio ns, and ca re should be taken to allo w the
s trin g ’s te m p era ture to fu lly sta b ilize a fte r the w ashing.

If the intent of the te st is to d ocu m e nt the p erform an ce o f the a rray in a soiled state, then no
cleaning is expected, but the soiled state shall be docum ented through such th ing s as
p ho tog rap hs and w e a th e r reco rd s defin in g the m ost recent rain.

5.3 C heck fo r shading

V e rify that th ere is no shading o f the d irect beam co m p on en t o f irra d ia n ce on the a rra y under
te st and th a t the e nviro n m e nta l co n d itio n s m eet the req uirem en ts o f IEC 6 0904-1, w ith the
fo llo w in g excep tion : For m easurem ents to be e xtra po lated to STC (S tandard T est C onditions,
see Annex A), the to ta l in-plane irra dian ce shall be at le a st 700 W /m 2 and the in cid e n t sun
beam shall be w ithin a cone o f 45° fu ll-a p e rtu re angle around the m odule norm al.

T here m ay be tim es when it is d e sira b le to m easure an I-V curve when the a rray is p a rtia lly
shaded e ithe r by nearby o bjects o r se lf-sh a d in g . T his pro ced ure m ay be used fo r the
 BS EN 61829:2016
-1 0 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

m easurem ent procedure, but the co rre ctio n o f the shaded I-V curve to standard test
co n d itio n s is o utsid e o f the scope o f th is In te rn atio na l S tandard, since the m eaning o f the
standard co n d itio n s is unclear in this case.

5.4 C onfirm u n ifo rm ity of irrad ian ce o ver the te s t array

U sing a su ita b le p yranom eter, check the u n ifo rm ity o f the in-plane irra dian ce o ver the area to
be tested as needed and se le ct a m odule on w hich the irra dian ce is typ ica l. This step is useful
if row -based array o rie n ta tio n s, fo r exam ple, crea te som e n o n -u n ifo rm ity in d iffuse irradiance.
P yra no m te r m ea surem e nts m ay be used to reveal va ria tio n s and se le ct the m odules with
irra dian ce th a t is m ost re p re se n ta tive of the irradiance on the total array. The choice o f these
selected m odules is based on the p rincip le and exam ple indicated in Figure 1. If the purpose
o f the I-V m ea surem e nts is to d ocu m e nt s ta b ility o f the a rray o ver tim e, then the u n ifo rm ity
need not be checked, but the geo m e try o f the te s t should rem ain c o n s is te n t to fa c ilita te
co n siste n t results.

S electin g a typ ical m odule m ay be stra ig h tfo rw a rd w hen m easuring a single string if the
m odules are all located in one row . C om biner box level m ea surem e nts include m odules that
span several rows, so u n ifo rm ity should be checked o ver the a pp lica ble row s. S electio n o f a
typ ical irra dian ce m odel m ay be lim ited by the length o f the pyra no m e te r conductors,
th e re fo re any va riatio n from w hat is co nside red typ ical should be noted in the report.

In the event that a p a rticu la r m odule or string is not a ccessible , such as in a com p lica te d roof-
m ounted system , and the m easurem ent is co nd ucte d from a com b in e r box, it is a ccep tab le to
place and o rien t the refe ren ce device in a pra ctical location th a t best a pp ro xim a tes the
co nd itio n o f the m odule or string . The u n c e rta in ty a ssociated w ith these m easurem ent
appro ach es shall be e valuated and included in the report.

5.5 M ount the reference device

M ount the refe ren ce device as near as possible to and c o -p la n a r w ith the m odule ide ntifie d in
4.4. The refe ren ce device should be placed such th a t no shade o f the d ire c t beam com ponent
o f irra d ia n ce is pre sen t on the device and any refle ction o r d iffuse shading is c o n siste n t w ith
the refle ction and d iffuse shading a pp aren t to the a rra y under te st. C onnect to the n ecessary
instru m e ntatio n.

The refe ren ce device shall be m ounted such th a t it is c o p la n a r w ithin ±2° o f the average
o rie n ta tio n o f the active su rfa ces o f the m odules under test.

If the m odules are not coplan ar, the choice o f irra dian ce plane o f m easurem ent shall be
described in the report. If the a rra y under te st has in co n siste n t a lig nm en t, separate
m easurem ents should be done fo r each subsection o f the array, a nd /or the v a ria b ility of
a lig n m e n t o f the a rra y should be noted in the report.

5.6 Prepare to m easure the array tem p eratu re

S e lect one o r m ore m odules w hose ope ra ting te m p era ture s are rep re sen ta tive o f the a rray
under test. The choice o f these selected m odules is based on the p rincip le and exam ple
indicated in Figure 1 and should be d eterm ined by m aking sam ple m ea surem e nts as fo llo w s:

a) a t m in im a lly one ce n tra lly located m odule;

b) at m in im a lly one m odule th a t has been ide ntifie d as one o f the co olest because o f being
upstream in the w ind or because o f being near the ground w ith the best co oling caused by
convection;
c) at m in im a lly one m odule th a t has been ide ntifie d as one o f the h o tte st because o f being
dow nstream in the w ind, because o f being at the top o f the a rray when cooling is caused
by co nve ction , or because o f being in a location th a t has little circu la tio n .
BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 - 11 -

For each selected m odule, attach the a p p ro p ria te th e rm o co u p le device in a t least one
location.

NOTE 1 IEC 61853-1:2011. 8.3.1 recommends three locations to address non-uniformity within the module:
however, this may be impractical for large numbers of tests.

NOTE 2 In some cases it may be possible to recruit module temperature measurements from permanently
installed temperature sensors on module backsheets. If this is possible, it is important to synchronize all test
equipment clocks with the on-site data acquisition system and check to ensure that modules measured with such
permanently installed sensors are indeed representative of the array under test.

In the event th a t the backs o f the m odules are not accessible , such as in som e roof-m ounted
system s, it is a ccep tab le to m easure the te m p era ture from the fro n t o f the m odule or to use a
m odel fo r m odule te m p era ture th a t has been p re vio u sly va lid ate d. The u nce rta inty associated
w ith these m ea surem e nt appro ach es shall be evaluated and included in the report.

5.7 D isco n n ect the array

D iscon ne ct the a rra y to be m easured from any load such as b a tte ry o r pow er cond itio nin g
e quipm ent. If necessary, isolate the portion o f the a rra y to be tested by d isco nn ectin g
sw itche s and fuses as needed.

5.8 C onnect the m easu rem en t system to the array to be m easured

C onnect the va riab le lo a d //-K curve tracin g unit to the a rra y to be tested, co nside rin g the best
location fo r m easurem ent.

In general, the location o f the conn ectio n to the a rra y fo r vo ltag e and cu rre n t testing should be
c a re fu lly co nside red relative to the inten t o f the test.

If the in te n t o f the te st is to d ete ct possible d iffe re n ce s betw een the m odules on site and
lab ora tory or fa cto ry te st data, then the vo ltag e and cu rre n t m ea surem e nts should ta ke place
as close to the m odules as possible, w ith cabling and o th e r DC co m ponents betw een the
m odules at the p oint o f m easurem ent m inim ized.

The DC com b in e r box o utp ut is a co n ve n ie n t location fo r te sting arrays. S trings m ay be tested

from the resp ective inputs to the DC c o m b in e r box or th ey m ay be d isconnected from th eir
hom e runs at the location o f the m odule string to m inim ize the length o f cable betw een the
m odule string and the te st equipm ent.

If the intent o f the te st is to q u a n tify the pow er p erform an ce o f the array, then the ideal
location fo r te st is at the inputs to the in v e rte r or as close to the in v e rte r as can be accessed.
In the event th a t the te st e qu ip m en t ca nn ot a ccept the s h o rt-c irc u it cu rre n t o f the a rra y at this
level, then disco nn ects w ithin the a rray should be used to reduce the cu rre n t to the test
equipm ent.

It is p re fera ble to use I-V curve tracin g units th a t use a fo u r-te rm in a l m ea surem e nt m ethod.
S eparate co nn ectio ns fo r the cu rre n t and voltage m ea surem e nts e lim in a te the lead and
co nta ct resista nce from the m easurem ent. Use o f th is m ethod avoids the need to com pensate
fo r the se ries resista nce o f the te st w ires and co nn ectio ns, even with extended length cables.
R eport the point o f connection.

5.9 R ecord e lec trica l data and m easu rem en t con d itio n s

R ecord the fo llo w in g :

a) the te m p era ture o f the te st array;

b) the irra dian ce se nso r output;
c) a q u a lita tiv e a ssessm en t o f the v a ria b ility o f irra dian ce, te m p era ture and w ind speed in
the 15 min p rior to the test;
 BS EN 61829:2016
-1 2 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

d) the te m p era ture o f the irra dian ce se nso r (if required);

e) the c u rre n t-vo lta g e ch a ra cte ristic o f the te st array;
f) the te m p era ture o f the te st array;
g) the irra dian ce se nso r output;
h) the te m p era ture o f the irradiance se nso r (if required);
i) an im age o f the sky to show clouds relative to the sun position (op tion al).

T he te m p e ra tu re and irra dian ce m easurem ents are conducted before and a fte r the I-V scan to
ve rify th a t th ey have not changed m ore than 1 °C or 0,5 %, resp ective ly. If slow (m anual) load
scanning is used, record Voc o f the reference d evice im m e diately p rio r to the I-V scan.

Scan the I-V curve by varying the load such th a t there w ill be a s u ffic ie n t n um ber o f points to
define a sm ooth I-V c h a ra cte ristic. If slow (m anual) load scanning is used (e.g. using a
rhe osta t as load), the irra dian ce m ust be recorded sim u lta n e o u s ly w ith each I-V p o in t to
obtain the irra dian ce, G, corresp on din g to th a t point. The to ta l v a ria tio n in radiance over the
w hole scan should be no m ore than 2 %. If not, repeat the scan. If a fa st load scanning device
such as a ca p a cito r load (total scan tim e less than 0,1 s) is used, it is s u ffic ie n t to record the
cu rren t o f the refe ren ce device at the s ta rt and end o f the scan.

If slow (m anual) scanning is used, rem easure the Voc o f the reference device. If th is value
d iffe rs by m ore than 1 % from the one obta ine d in 5.9 a), repeat the m easurem ent from there.

The sh o rt-c irc u it cu rre n t shall be m easured at zero voltage, using a va ria b le bias (pre fe ra b ly
e le ctron ic) to o ffs e t the vo ltag e drop across the e xterna l se ries resista nce . A lte rn a tiv e ly , sh ort
circu it cu rre n t m ay be e xtra po lated from the c u rre n t-v o lta g e c h a ra c te ris tic . The curve m ay be
e xtra po lated to ze ro vo ltag e provided that vo ltag e drop is not higher than 3 % o f the device
o p e n -circu it voltage and th a t there is a lin e a r re la tio n sh ip betw een cu rre n t and voltage.

Enough I-V pair m ea surem e nts should be taken during the sw eep to p rovide b ette r than 1 %
cu rre n t and voltage reso lu tio n at the m axim um pow er point.

5.10 Record spectral data

If a pyra no m e te r or an unm atched refe ren ce d evice is used fo r irra dian ce m easurem ents,
perform a m ea surem e nt o f sp ectral irra d ia n ce using a sp ectrora diom e ter. D uring the period o f
m easurem ent, m ultiple sp e ctro ra d io m e tric scans should be com pleted to evalua te the s ta b ility
o f these m easurem ents. At a m inim um , the sp ectral irradiance m ust be m easured ju s t before
and ju s t a fte r the I-V curve is m easured.

W hen no spectral irra dian ce data are a va ila b le the m atch o f the refe ren ce device to the
specim en and the a ir m ass co nd itio ns should be checked ca re fully. M easurem ent should be
perform ed on a cle a r sunny day (no o bse rva ble clouds around the sun, w ith d iffuse co nte nts
o f so la r irra dian ce not h ig he r than 30 %). For th in film s, irra d ia n ce should be w ithin 20 % of
the refe ren ce irra dian ce (A nnex A).

5.11 Typ ical and extrem e m odule selection

Extrem e m odules are those th a t have m ore or less than average sky exposure o r cooling due
to th e ir location in the array, relative to the m ore ce ntral m odules. The a pp aren t sky
co nside ratio n is not related to d irect shade, but to the lim iting o f the m o d u le ’s view o f open
sky. C ooling is d ep en de nt on w ind d irectio n (and speed), loca tion w ithin co nve ction cells, and
w h e re ve r a ir m ovem ent is im peded by local o b stru ctio n s. T he refo re , the extrem e m odules are
those at ends o f row s, the bottom or top o f rows co nta ining m ore than 2 stacked m odules, etc.
C entral m odules are those centred both v e rtic a lly and h o rizo n ta lly to the e xte n t possible. See
Figure 1. S am pling o f m easurem ents using p yra no m e te rs and checking te m p era ture s is the
best basis fo r v e rifyin g the ce n tra l m odule se lection.
BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 -1 3 -

IEC

Figure 1 - Exam ples of extrem e and cen tral m odules

6 Analysis

6.1 A dju st the m easured irrad ian ce fo r any d eviation from reference con d itio n s

U nless using a p yranom eter, co rre ct the m easured c u rre n t (or vo lta g e ) o f the irra dian ce
reference device using the fo llo w in g equation:

^SRO = 7MR3 + a R ( TRO ~ T3)

w here
• rR0 is the standard te m p e ra tu re o f the refe ren ce device fo r w hich its c a lib ra tio n value is
given;
• 73 is the m easured te m p era ture o f the reference device;
• ^sro 's s h o rt-c irc u it cu rre n t (or vo ltag e outp ut) o f the reference device tra n sla te d to
the reference device te m p era ture fo r w hich the device has been ca lib ra te d , TR0\
• ^MR3 's m easured sh o rt-c irc u it c u rre n t (in m A or mV) (or vo ltag e o u tp u t) o f the
reference device at the m easured te m p era ture r 3;
• «R is the cu rren t (or vo ltag e) te m p era ture c o e ffic ie n t o f the refe ren ce device (in units
o f m A/°C or m V /°C ) w ithin the te m p era ture and irra dian ce range o f interest.

If a p yra no m e te r or unm atched refe ren ce device w as used as the refe ren ce device, ca lcu late
the e ffe ctive irra dian ce fo r the a rray under te st under the A M 1.5 sp ectrum (see IEC 6 0904-3)
using its sp e ctra l response data (ap ply IEC 60904-7).

6.2 C om pute the average te m p e ratu re of the array u nder test

T ake the average o f the central m odule te m p era ture m easurem ents as sp e cifie d in 5.6 and
use high and low values on the o u tlie r m odules to define the u n ce rta in ty fo r the report.
 BS EN 61829:2016
- 14 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

6.3 C om pute the ju n c tio n tem p eratu re

A d ju s t the te m p era ture ca lcu late d in 6.2 fo r the d iffe re n ce betw een the actua l ju n c tio n
te m p era ture and the m easured b ack-of-m od ule tem perature. If the ju n c tio n te m p era ture has
not been m easured by a no the r technique, assum e th a t the te m p era ture d iffe re n ce is 2 °C fo r
1 000 W /m 2 and sca le lin e a rly this d iffe re n ce to the m easured irradiance.

6.4 Tra n s la te the m easurem en t to the desired test condition

C orrect the m easured cu rre n t-vo lta g e c h a ra c te ris tic to the desired irra d ia n ce and te m p era ture
co nd itio ns in accorda nce w ith IEC 60891 (for line ar d evices) using the irra d ia n ce and
te m p era ture values com puted in 6.1 and 6.3. For non- line ar devices, refe r to IEC 60904-10
fo r guida nce in dete rm inin g o ver w hat range the device can be co nside red to be linear. The
series resista nce value w ill e ith e r be given by the su p p lie r or d eterm ined by m easurem ent as
in IEC 60891.

If the m easured I-V curve show s e vid en ce o f va ria b le irra dian ce or va ria b le m odule
p erform an ce w ithin the array, evalua te the u n ce rta in ty a ssociated w ith the correction.

6.5 C o rrect fo r soiling losses

If expected as part o f the m easurem ent procedure, c o rre c t the m easured c u rre n t-v o lta g e
ch a ra cte ristic fo r any know n and q u a n tifia b le e ffe cts such as so iling . If the so iling level o f the
a rray w as m easured according to 5.2, increase the cu rre n t values by an am o un t e qu iva len t to
the so iling loss m easured.

It m ay be a dvisab le to co rre ct fo r w iring o hm ic losses as w ell if th ere are long cable runs
betw een the a rray under test and the te s t device. This can be done using standard resistive
values fo r the co n d u cto r and the cu rre n t m easured. It is not recom m ended to try to co rre ct fo r
m odule m ism atch o r degra da tion because m easurem ent e rro r m ay be s ig n ific a n tly larg e r than
the e stim ated losses them selves.

7 Test report

A te st re p o rt w ith m easured perform ance c h a ra c te ris tic s and te s t results shall be prepared by
the te st a ge ncy in accordance w ith ISO 17025. The te st rep ort shall contain the fo llo w in g
data:

a) a title;
b) nam e and address o f the te st la b o ra to ry and location w here the tests w ere carried out;
c) unique id e n tifica tio n o f the rep ort and o f each page;
d) nam e and address o f client;
e) a d e scrip tio n and id e n tifica tio n of the a rray u nder test;
f) d e scrip tio n o f the te st e nvironm ent, including w e a th e r co nd itio ns, location and a lignm ent
o f se nso r and possible sources of refle ction and shading around the te st array. If the
m odules in the a rray are not coplanar, docu m e nt how the irra d ia n ce se nso r w as aligned
relative to the va riab le a lig n m e n t of the m odules;
g) date of insta lla tio n and date o f e ne rg izatio n o f a rra y under test, if know n;
h) d ate (s) o f test;
i) refe ren ce to sam pling procedure, w here relevant;
j) id e n tifica tio n o f ca lib ra tio n o f re le va n t equipm ent;
k) any d eviatio ns from , a dd itio ns to or e xclu sio n s from the te st m ethod, and any o the r
inform a tion re le va n t to a sp e cific test;
I) d e scrip tio n and id e n tifica tio n o f p rim ary a nd /or se co n d a ry refe ren ce device (cell or PV
m odule);
BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 -1 5 -

m) id e n tifica tio n o f the m ethod fo r te m p era ture and irra dian ce co rrectio n o f the m easured
ch aracte ristic;
n) the q u a n tita tive co rre ctio n s th a t resulted from the te m p era ture and irra d ia n ce co rrectio ns;
o) te st results su pported by ta ble s and graphs, including irradiance level, te m p era ture s o f the
a rray u nder te st and refe ren ce device, m odule p aram eters used fo r co rrectio n o f the
cu rre n t-vo lta g e ch aracte ristic;
p) e ithe r the m ism atch co rre ctio n value used in the m easurem ent or an estim a te o f the e rro r
introduced by using the m ism atched refe ren ce device;
q) a sta te m e nt o f the e stim ated u n c e rta in ty o f te st results;
r) a sign ature and title, or e qu iva len t id e n tifica tio n o f the p erso n (s) a ccep ting re s p o n s ib ility
fo r the co nte nt o f the te st report, and the date o f issue;
s) a sta te m e nt to the e ffe ct th a t the results relate only to the a rray tested;
t) a sta te m e nt that the te st rep ort shall not be reproduced e xcept in fu ll, w ith o u t the w ritten
a pproval o f the laboratory.
 BS EN 61829:2016
-1 6 - IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015

A n n ex A
(inform ative)

R eference values and reference device

A.1 Reference test conditions (RTC)

These are refe ren ce values o f a m b ie n t te m p era ture , in -p la n e irra dian ce and spectral
d is trib u tio n , sp ecified fo r pow er rating o f PV a rrays as d efined fo r the desired m easurem ent.
RTC are u su a lly standard te st co nd itio ns.

A.2 Standard test conditions (STC)

T hese are refe ren ce values o f m odule te m p era ture , in-pla ne irra d ia n ce and spectral
d istrib u tio n used fo r ind oo r (sim u la to r) m easurem ents:

- m odule te m p era ture : 25 °C;

- in-pla ne irradiance: 1 000 W /m 2;
- spectral d is trib u tio n : AM 1,5 (global).

NOTE See IEC 60904-3.

A.3 Reference device

A refe ren ce device is a s p e cia lly ca lib ra te d so la r cell, m u lti-ce ll package o r m odule w hich is
used to m easure irra d ia n ce and in this procedure to p rovide ju n c tio n te m p era ture reference.

For m ea surem e nts in natural su nligh t, when the d irect so la r beam is not at or near norm al
incidence, it is recom m ended to use a reference m odule o f the sam e type and size as those
being tested or a m u lti-ce ll package co nsisting o f a ca lib ra te d ce ll surrounded by o the r cells
(dum m y or rea l) in such a w ay th a t fram e, e nca psu la tio n system , shape, size and spacing are
the sam e as in the m odules being tested.
BS EN 61829:2016
IEC 6 1 8 2 9 :2 0 1 5 © IEC 2015 -1 7 -

Bibliography

IEC 60904-5, P h o to vo lta ic devices - P a rt 5: D e term in atio n o f e q u iv a le n t c e ll te m p era ture

(EC T) o f p h o to v o lta ic (PV) devices b y the o p e n -c irc u it voltage m ethod

IEC 618 53 -1 :2 01 1, P h o to vo lta ic (PV) m odule p erfo rm a n ce te s tin g and e n e rg y ra tin g - P a rt 1:

Irra d ia nce a nd te m p era ture p erfo rm a n ce m ea surem e nts a nd p o w e r ratin g

ISO 17025, G e ne ra l req uirem en ts fo r the com petence o f te sting and c a lib ra tio n la b o ra to rie s
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British Standards Institution (BSI)

BSI is the national body responsible for preparing British Standards and other
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