240 Pin VLP DDR-III Soldertail Sockets: Product Design Objective
240 Pin VLP DDR-III Soldertail Sockets: Product Design Objective
240 Pin VLP DDR-III Soldertail Sockets: Product Design Objective
108- 115019
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The product described herein has not been fully tested to ensure conformance to the requirements outlined below. Tyco Electronics makes no representation or warranty, express or implied that the product will comply with these requirements. Further, Tyco Electronics may change these requirements based on the results of additional testing and evaluation. Contact Tyco Electronics Engineering for further details.
2.2.
Industry Standards EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications
3. 3.1.
REQUIREMENTS Design and Construction Product shall be of the design, construction and physical dimensions specified on the applicable product drawing.
3.2.
Materials Materials used in the construction of this product shall be as specified on the applicable product drawing.
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3.3. Ratings Voltage: 25 volts AC Current: 0.5 A MAX. Temperature: -40 to 85 3.4. Performance and Test Description Product is designed to meet the electrical, mechanical and environmental performance requirements specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental conditions. 3.5. Test Requirements and Procedures Summary Test Item Requirement Meets requirements of product Visual inspection drawing. No physical damage. Electrical Requirement 30 milliohms Max (Initial) R 20 milliohms Max (Final) 10 milliohms Max (Initial) R 10 milliohms Max (Final) No evidence of arc-over insulation breakdown or leakage current in excess of 1 mA. Procedure
1 Product
Examination of
Subject mated contacts assembled in housing to 20 mV Max open circuit at 100 mA Max. EIA-364-23 Subject mated contacts assembled in housing to 20 mV Max open circuit at 100 mA Max. EIA-364-23 500 VAC for 1 minute 100 V rms at 60 Hz, between terminals and terminals to case. The connectors shall be mated but not soldered to a PCB. EIA-364-20 500 VDC for 1 minuate The connectors shall be mated but not soldered to a printed circuit board Test between adjacent circuits of unmated connector. EIA-364-21A. Connect 10 pairs contacts in consecutive position (pins 65~74 and pins 185~194) on the same side of specimen are in series circuit and load 0.5A. EIA-364-70
4 Insulation Resistance
1 M-Ohm Min
5 Current Rating
T rise 30 max.
Mechanical Requirement
110 N (11.2 Kgf) Min. Meets requirements of product drawing. No physical damage. No physical damage.
Measure module card insertion force with 1.37mm THK module. steel gage at rate of 25mm/minute EIA-364-13 Measure module withdraws force with latch locked. with 1.17mm THK module. steel gage at rate of 25mm/minute EIA-364-13 25 times Mating/Unmating cycles with 1.37mm THK module at inserting rate of 25 mm/minute. EIA-364-09 5 times Mating/Unmating cycles with 1.37mm THK module at inserting rate of 25 mm/minute. EIA-364-09
8 Durability 9 Durability
(preconditioning)
Figure 1 (continued)
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10 Reseating
No physical damage. No discontinuities No evidence of physical damage
Manually Mating/Unmating test module 3 cycles. Subject 4 continuity and 4 termination resistance specimens to input accelsration 3.13g RMS between 5Hz to 500Hz, 10 minutes per axis to: 50 to 20Hz (slope): (0.01g /Hz )@5Hz, (0.02g /Hz )@20Hz 20 to 500Hz (flat): (0.02g /Hz )@20Hz Random control limit tolerance: + 3 dB Module weight 60g min with center of gravity of 20~25 mm from module mating edge. 10 minutes per axis for all 3 axes on all samples EIA-364-28
2 2 2
11 Vibration
Mechanical Requirement Test Item Requirement No discontinuities. Mechanical shock. 12.1 (For SMT Type) No evidence of physical damage R 20 milliohms max R 10 milliohms max (For Connector with Lower LLCR) No discontinuities. Mechanical shock. 12.2 (For T/H Type) No evidence of physical damage R 20 milliohms max R 10 milliohms max (For Connector with Lower LLCR) Procedure
Profile: Trapezoidal shock of 50g10% Duration: 11 ms Minimun velocity change: 212in/sec, 10% Module weight 60g min with center of gravity of 20~25 mm from module mating edge. Three drops in each of 6 directions EIA-364-27
Profile: Trapezoidal shock of 50g10% Duration: 11 ms Minimun velocity change: 212in/sec, 10% Module weight 60g min with center of gravity of 20~25 mm from module mating edge. Three drops in each of 6 directions EIA-364-27
14.2
Wet solder coverage: 95% Min. No physical damage Solder Temperature: 245 5C. Wet solder coverage: 95% Solder Immersion Time: 5 0.5 s. Min. EIA-364-52, Class 1, Category 3 No physical damage Environmental Requirement
For 168 hours.
Measure the contact retension force with Tensile strength tester. EIA-364-29. Reflow Temperature: 230-245C Reflow Time: 50-70 s. EIA-364-52, Class 1, Category 3
Preheat Temp.: 150-200C, 60-180 s. Time over liquidus (217C): 60-150 s. Peak Temp.: 260 +0/-5C, 20 s. Duration: 3 cycles. Solder Temp.: 265C 5C, 10 +2/-0 s. Mated connector -55C (30 minutes), +85C (30 minutes) Perform this a cycles, repeat 10 cycles EIA-364-32, test condition 1
16 Thermal shock
Figure 1 (continued)
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Specimens shall be mated during test, Cycling the Connector between 25C3C at 80% RH and 65C 3C at 50% RH, Ramp times should be 0.5 hour and dwell times be 1 hour. Perform 24 cycles. EIA-364-31 5 days to simulate a 3 year field life for gold flash plating. 7 days to simulate a 5 year field life for 10u gold plating.
17
See Note.
See Note
10 days to simulate a 7 year field life for 15u & 20u gold plating. 14 days to simulate a 10 year product life for 30u gold plating. EIA-364-65, class IIA Un-mated 1 hour duration 25C/50% RH dust mass of 9 g/ft at rate of 300 m/min EIA-364-91 Subject mated specimens to 105C for 120 hours EIA-364-17, method A Cycle the connector or socket between 153 and 853, as measured on the part. Ramps should be a minimum of 2 per minute, and dwell times should insure that the contacts reach the temperature extremes (a minimum of 5 minutes). Humidity is not controlled. Perform 500 such cycles.
3
19 Dust
Temperature life (Preconditioning)
20
R 20 milliohms max R 10 milliohms max (For Connector with Lower LLCR) R 20 milliohms max R 10 milliohms max (For Connector with Lower LLCR)
21 Thermal cycling
NOTEShall meet visual requirements, show no physical damage, and meet requirements of additional tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure 2. Figure 1 (end)
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3.6. Product Qualification and Requalification test
Test Group Test or Examination 1 2 3 4 5 6 7 8 9
Test Sequence (b) Initial examination of product Contact resistance Dielectric withstanding Voltage Insulation Resistance Current Rating Module insertion force Module withdraw force with latch Durability. Durability(Preconditioning) Reseating Vibration Mechanical shock. Contact retention force Solderability
Resistance to Reflow/Wave soldering heat
1, 9 2, 8
1, 7 2, 6 5
1, 7 2, 4, 6
1, 8 2, 4, 7 6
1, 5 2, 4
1, 3
1, 3
1, 5 2, 4
1 2, 5, 7, 9
4 3, 7 4, 6 5 3 3 8 3 5 4 2 2 3 5 3 3 4 6 5 5 5 5 5 5 5 5 5
Thermal shock Cyclic Temperature& Humidity Mixed flowing gas Dust Temperature life (Preconditioning) Thermal Cycling Test specimens
Figure 2
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4. 4.1. QUALITY ASSURANCE PROVISIONS Qualification Testing A. Specimen Selection Specimens shall be prepared in accordance with applicable Instruction Sheets and shall be selected at random from current production. All test groups shall each consist of 5 specimens. B. Test Sequence Qualification inspection shall be verified by testing specimens as specified in Figure 2. 4.2. Requalification Testing If changes significantly affecting form, fit or function are made to the product or manufacturing process, product assurance shall coordinate requalification testing, consisting of all or part of the original testing sequence as determined by development/product, quality and reliability engineering. 4.3. Acceptance Acceptance is based on verification that the product meets the requirements of Figure 1. Failures attributed to equipment, test setup or operator deficiencies shall not disqualify the product. If product failure occurs, corrective action shall be taken and specimens resubmitted for qualification. Testing to confirm corrective action is required before resubmittal. 4.4. Quality Conformance Inspection The applicable quality inspection plan shall specify the sampling acceptable quality level to be used. Dimensional and functional requirements shall be in accordance with the applicable product drawing and this specification.
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Material: Tool steel, ISO 100CrMoV5, hardened. Tyco Drawing 92-1888081 Description Maximum Card Figure 5 DDR3 DIMM Steel Insertion Gauge A Dimension 1.37 +0.000/-0.013 mm
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