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    Unit4 Memorytesting

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    KavyashreeM
    This document discusses memory testing and fault modeling. It provides examples of different types of memory faults including stuck-at faults, transition faults, coupling faults, and neighborhood pattern sensitive faults. It also summarizes several march test algorithms and their ability to detect different fault models.

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    Unit4 Memorytesting

    Uploaded by

    KavyashreeM
    41 views28 pages
    This document discusses memory testing and fault modeling. It provides examples of different types of memory faults including stuck-at faults, transition faults, coupling faults, and neighborhood pattern sensitive faults. It also summarizes several march test algorithms and their ability to detect different fault models.

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    Unit4_memorytesting

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    This document discusses memory testing and fault modeling. It provides examples of different types of memory faults including stuck-at faults, transition faults, coupling faults, and neighborhood pattern sensitive faults. It also summarizes several march test algorithms and their ability to detect different fault models.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    41 views28 pages

    Unit4 Memorytesting

    Uploaded by

    KavyashreeM
    This document discusses memory testing and fault modeling. It provides examples of different types of memory faults including stuck-at faults, transition faults, coupling faults, and neighborhood pattern sensitive faults. It also summarizes several march test algorithms and their ability to detect different fault models.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 28

    Memory Testing

    RAM Organization
    Test Time in Seconds
    (Memory Cycle Time 60ns)

    Size Number of Test Algorithm Operations


    n bits n n × log2n n3/2 n2

    1 Mb 0.06 1.26 64.5 18.3 hr


    4 Mb 0.25 5.54 515.4 293.2 hr
    16 Mb 1.01 24.16 1.2 hr 4691.3 hr
    64 Mb 4.03 104.7 9.2 hr 75060.0 hr
    256 Mb 16.11 451.0 73.3 hr 1200959.9 hr
    1 Gb 64.43 1932.8 586.4 hr 19215358.4 hr
    2 Gb 128.9 3994.4 1658.6 hr 76861433.7 hr
    SRAM Fault Modeling Examples

    SA0

    AF+SAF
    SAF

    SCF SA0 TF TF
    SCF
    <0;0> SA0 <1;1> <↓/0> <↑/1>
    DRAM Fault Modeling
    SA1 SA1+SCF

    AND ABF

    Bridging
    Fault (ABF) SCF
    SA0

    ABF
    SRAM Only Fault Models

    Faults found only in SRAM Model


    Open-circuited pull-up device DRF
    Excessive bit line coupling capacitance CF
    DRAM Only Fault Models

    Faults only in DRAM Model


    Data retention fault (sleeping sickness) DRF
    Refresh line stuck-at fault SAF
    Bit-line voltage imbalance fault PSF
    Coupling between word and bit line CF
    Single-ended bit-line voltage shift PSF
    Precharge and decoder clock overlap AF
    Reduced Functional Faults
    Fault

    SAF Stuck-at fault


    TF Transition fault
    CF Coupling fault
    NPSF Neighborhood Pattern Sensitive fault
    Stuck-at Faults
    • Test Condition: For each cell, read a 0 and a 1.
    • <  / 0 > (<  / 1 >)
    Transition Faults
    • Cell fails to make a 0 → 1 or 1 → 0 transition.
    • Test Condition: Each cell must have an ↑ transition
    and a ↓ transition, and be read each time before
    making any further transitions.
    • < ↑ / 0 >, < ↓ / 1 >

    < ↑ / 0 > transition fault


    Coupling Faults
    • Coupling Fault (CF): Transition in bit j
    (aggressor) causes unwanted change
    in bit i (victim)
    • 2-Coupling Fault: Involves 2 cells,
    special case of k-Coupling Fault
    – Must restrict k cells for practicality
    • Inversion (CFin) and Idempotent
    (CFid) Coupling Faults – special
    cases of 2-Coupling Faults
    State Transition Diagram of Two Good
    Cells, i and j
    State Transition Diagram for CFin < ↑ ;
    ↕>
    State Coupling Faults (SCF)
    • Aggressor cell or line j is in a given state y
    and that forces victim cell or line i into
    state x
    • < 0;0 >, < 0;1 >, < 1;0 >, < 1;1 >
    March Test Elements
    M0: { March element (w0) }
    for cell := 0 to n - 1 (or any other order) do
    write 0 to A [cell];
    M1: { March element (r0, w1) }
    for cell := 0 to n - 1 do
    read A [cell]; { Expected value = 0}
    write 1 to A [cell];
    M2: { March element (r1, w0) }
    for cell := n – 1 down to 0 do
    read A [cell]; { Expected value = 1 }
    write 0 to A [cell];
    March Tests
    Algorithm Description
    MATS { (w0); (r0, w1); (r1) }
    MATS+ { (w0); (r0, w1); (r1, w0) }
    MATS++ { (w0); (r0, w1); (r1, w0, r0) }
    MARCH X { (w0); (r0, w1); (r1, w0); (r0) }
    { (w0); (r0, w1); (r1, w0);
    MARCH C- (r0, w1); (r1, w0); (r0) }
    { (w0); (r0, w1, w0, w1); (r1, w0, w1);
    MARCH A (r1, w0, w1, w0); (r0, w1, w0) }
    MARCH Y { (w0); (r0, w1, r1); (r1, w0, r0); (r0) }
    { (w0); (r0, w1, r1, w0, r0, w1);
    MARCH B (r1, w0, w1); (r1, w0, w1, w0);
    (r0, w1, w0) }
    Address Decoder Faults (ADFs)
    • Address decoding error assumptions:
    – Decoder does not become sequential
    – Same behavior during both read and write
    • Multiple ADFs must be tested for
    • Decoders can have CMOS stuck-open faults
    Theorem
    • A March test satisfying conditions 1 & 2
    detects all address decoder faults.
    • ... Means any # of read or write operations
    • Before condition 1, must have wx element
    – x can be 0 or 1, but must be consistent in test

    Condition March element

    1 (rx, …, w x )

    2 (r x , …, wx)
    March Test Fault Coverage

    Algorithm SAF ADF TF CF CF CF SCF


    in id dyn
    MATS All Some
    MATS+ All All
    MATS++ All All All
    MARCH X All All All All
    MARCH C- All All All All All All All
    MARCH A All All All All
    MARCH Y All All All All
    MARCH B All All All All
    March Test Complexity

    Algorithm Complexity
    MATS 4n
    MATS+ 5n
    MATS++ 6n
    MARCH X 6n
    MARCH C- 10n
    MARCH A 15n
    MARCH Y 8n
    MARCH B 17n
    MATS+ Example
    Cell (2,1) SA0 Fault

    MATS+: { M0: (w0); M1: (r0, w1); M2: (r1, w0) }


    MATS+ Example
    Cell (2, 1) SA1 Fault

    MATS+: { M0: (w0); M1: (r0, w1); M2: (r1, w0) }


    MATS+ Example
    Multiple AF: Addressed Cell Not Accessed; Data Written
    to Wrong Cell
    • Cell (2,1) is not addressable
    • Address (2,1) maps onto (3,1), and vice versa
    • Cannot write (2,1), read (2,1) gives random data

    MATS+: { M0: (w0); M1: (r0, w1); M2: (r1), w0 }


    Neighborhood Pattern Sensitive Faults
    • Definitions:
    – Neighborhood – Immediate cluster of k
    cells whose operation makes a base cell
    fail
    – Base cell – A cell under test
    – Deleted neighborhood – A neighborhood
    without the base cell
    • ANPSF – Active NPSF
    • APNPSF – Active and Passive NPSF
    • PNPSF – Passive NPSF
    • SNPSF – Static NPSF
    Type-1 Active NPSF
    • Active: Base cell changes when any one deleted neighborhood
    cell has a transition
    • Condition for detection and location: Each base cell must be
    read in state 0 and state 1, for all possible deleted neighborhood
    pattern changes.

    • Notation: C i,j < d0, d1, d3, d4 ; b >


    • Examples:
    – ANPSF: C i,j < 0, ↓ , 1, 1; 0 > 0
    – ANPSF: C i,j < 0, ↓ , 1, 1; ↕ >
    1 2 3
    4
    2 – base cell
    0, 1, 3 and 4 – deleted neighborhood
    cells k=5
    Type-2 Active NPSF
    • Used when diagonal couplings are
    significant

    4 – base cell 0 1 2
    0, 1, 2, 3, 5, 6, 7 and 8 – deleted 3 4 5
    neighborhood cells 6 7 8

    k=9
    Passive NPSF
    • Passive NPSF: A certain neighborhood pattern
    prevents the base cell from changing.
    • Condition for detection and location: Each base
    cell must be written and read in state 0 and in
    state 1, for all deleted neighborhood pattern
    changes.
    • ↑ / 0 ( ↓ / 1 ) – Base cell fault effect indicating
    that base cannot change
    Static NPSF
    • Static NPSF: Base cell forced into a particular state
    when deleted neighborhood contains particular
    pattern.
    • Differs from active – need not have a transition to
    sensitize an SNPSF
    • Condition for detection and location: Apply all 0 and 1
    combinations to k-cell neighborhood, and verify that
    each base cell was written with a 1 and a 0.
    • Examples:
    – Ci,j < 0, 1, 0, 1; - / 0 > means that base cell forced to 0
    – Ci,j < 0, 1, 0, 1; - / 1 > means that base cell forced to 1

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