Mrf89Xam8A Data Sheet: 868 MHZ Ultra-Low Power Sub-Ghz Transceiver Module
Mrf89Xam8A Data Sheet: 868 MHZ Ultra-Low Power Sub-Ghz Transceiver Module
Mrf89Xam8A Data Sheet: 868 MHZ Ultra-Low Power Sub-Ghz Transceiver Module
Data Sheet
868 MHz Ultra-Low Power
Sub-GHz Transceiver Module
• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
• Microchip is willing to work with the customer who is concerned about the integrity of their code.
• Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
ISBN: 978-1-60932-637-1
Microchip received ISO/TS-16949:2002 certification for its worldwide
headquarters, design and wafer fabrication facilities in Chandler and
Tempe, Arizona; Gresham, Oregon and design centers in California
and India. The Company’s quality system processes and procedures
are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping
devices, Serial EEPROMs, microperipherals, nonvolatile memory and
analog products. In addition, Microchip’s quality system for the design
and manufacture of development systems is ISO 9001:2000 certified.
Pin diagram
GND 1 12 GND
RESET 2 11 GND
CSCON 3 10 VIN
IRQ0 4 9 IRQ1
SDI 5 8 CSDATA
SCK 6 7 SDO
Errata
An errata sheet, describing minor operational differences from the data sheet and recommended workarounds, may exist for current
devices. As device/documentation issues become known to us, we will publish an errata sheet. The errata will specify the revision
of silicon and revision of document to which it applies.
To determine if an errata sheet exists for a particular device, please check with one of the following:
• Microchip’s Worldwide Web site; http://www.microchip.com
• Your local Microchip sales office (see last page)
When contacting a sales office, please specify which device, revision of silicon and data sheet (include literature number) you are
using.
MRF89XAM8A Module
MRF89XA
CSCON
Control CSDATA
Interface
Matching SPI Digital I/O
PCB Circuitry
RF Baseband
Antenna and
IRQ0
SAW Filter
Power IRQ1
Management RESET
Power
VCO Loop
Tank Filter
12.8 MHz Crystal
CSCON I/O
CSDATA I/O
SDI SDO
IRQ0 INTx
IRQ1 INTx
RESET I/O
Edge of PCB
3.4”
0.470”
0.4” 0.4”
+ 3.3V
Note 1
C1 + C2
0.1 μF 1 0 μF
U1
MRF89XAMxA-I/RM
1 12
GND GND
2 11
RESET GND
3 10
CSCON VIN
To Host 4 9
Microcontroller IRQ0 IRQ1 To Host
5 8 Microcontroller
SDI CSDATA
6 7
SCK SDO
Note: For battery powered applications, place a 10 μF capacitor in parallel with the 0.1 μF bypass
capacitor to provide a low impedance during startup sequences.
Note:
DS70651A-page 10 Preliminary © 2010 Microchip Technology Inc.
MRF89XAM8A
TABLE 2-1: MRF89XAM8A BILL OF MATERIALS
Designator Value Description Manufacturer Part Number
C1 0.047 µF Capacitor, Ceramic, 10V, ±10%, X7R, SMT Murata GRM155R71A473KA
0402 01D
C2 0.22 µF Capacitor, Ceramic, 16V, ±10%, X7R, SMT Murata GRM155R71C224KA
0402 12D
C3 1 µF Capacitor, Ceramic, 6.3V, ±10%, X5R, SMT Murata GRM188R60J105KA
0603 01D
C4 22 pF Capacitor, Ceramic, 50V, ±5%, UHI-Q NP0, Johanson Technology 500R07S220JV4
SMT 0402
C5 1.8 pF Capacitor, Ceramic, 50V, ±0.1 pF, UHI-Q Johanson Technology 500R07S1R8BV4
NP0, SMT 0402
C6 — Designator not used — —
C7 33 pF Capacitor, Ceramic, 50V, ±5%, C0G, SMT Murata GRM1555C1H330JZ
0402 01D
C8 0.1 µF Capacitor, Ceramic, 16V, ±10%, X7R, SMT Murata GRM155R71C104KA
0402 88D
C9 680 pF Capacitor, Ceramic, 50V, ±5%, C0G, SMT Murata GRM1555C1H681JA
0402 01D
C10 0.01 µF Capacitor, Ceramic, 16V, ±10%, X7R, SMT Murata GRM155R71C103KA
0402 01D
C11 4.3 pF Capacitor, Ceramic, 50V, ±0.1 pF, UHI-Q Johanson Technology 500R07S4R3BV4
NP0, SMT 0402
C12 1.5 pF Capacitor, Ceramic, 50V, ±0.1 pF, UHI-Q Johanson Technology 500R07S1R5BV4
NP0, SMT 0402
FL1 TA0801A Filter, SAW, 863–870 MHz Tai-saw Technology TA0801A
L1 8.2 nH Inductor, Ceramic, ±5%, SMT 0402 Johanson Technology L-07C8N2JV6T
L2 100 nH Inductor, Ceramic, ±5%, SMT 0402 Johanson Technology L-07CR10JV6T
L3 6.8 nH Inductor, Wirewound, ±5%, SMT 0402 Johanson Technology L-07W6N8JV4T
L4 6.8 nH Inductor, Wirewound, ±5%, SMT 0402 Johanson Technology L-07W6N8JV4T
L5 Designator not used
L6 10 nH Inductor, Ceramic, ±5%, SMT 0402 Johanson Technology L-07C10NJV6T
R1 1Ω Resistor, 1%, ±100 ppm/0C, SMT 0402 Vishay/Dale CRCW04021R00FKE
D
R2 100K Ω Resistor, 5%, ±100 ppm/0C, SMT 0402 Yageo RC0402JR-07100KL
R3 6.8K Ω Resistor, 1%, ±100 ppm/0C, SMT 0402 Yageo RC0402FR-076K8L
U1 MRF89XA Transceiver, Ultra-Low Power, Integrated Microchip Technology MRF89XA-I/MQ
sub-GHz
X1 12.8 MHz Crystal, ±10 ppm, 15 pF, ESR 100 ohms, Abracon ABM3B-155-12.800M
SMT 5 x 3.2mm Hz-T
8 mil FR4
8 mil FR4
Emission Standards
EN 300 220-2 V2.3.1 (2001–02) 7.1.2 Frequency error and drift 5.1.3.1
EN 300 220-2 V2.3.1 (2001–02) 7.3.2 Effective Radiated Power 5.1.3.3
EN 300 220-2 V2.3.1 (2001–02) 7.5.2 Transient power 5.1.3.4
EN 300 220-2 V2.3.1 (2001–02) 7.7.2 Modulation bandwidth 5.1.3.6
EN 300 220-2 V2.3.1 (2001–02) — Unwanted emissions on the spurious domain 5.1.3.7
EN 300 220-2 V2.3.1 (2001–02) 8.6.4 Receiver spurious radiation 5.1.4.6
Immunity Standards
EN 301 489-3 V1.4.1 (2002–08) — Conducted emissions EN 55022:2007
EN 301 489-3 V1.4.1 (2002–08) — Radiated emissions EN 55022:2007
EN 301 489-3 V1.4.1 (2002–08) — Radiated immunity EN 61000-4-3
NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above
those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
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08/04/10