Automatic Power Factor Detection and Cor
Automatic Power Factor Detection and Cor
Automatic Power Factor Detection and Cor
EXPERIMENT NO:1
Fig.1
Fig.1: Circuit arrangement for the study of the Forward characteristics of a Diode.
Theory :
Under forward bias configuration the positive terminal of the battery is connected to P-side and
negative terminal of the battery is connected to N-side as shown in the figure above large amount of the
current flows through the junction under this condition.
When P-N junction is forward biased, the holes are repelled from the positive electrode and the
electrons from the negative electrode of the power supply, and are forced to move towards the junction.
Some of the holes and electrons in the depletion region recombine themselves. This
reduces the width of the depletion layer and the height of the potential barrier. As a result of this
more number of majority charge carriers flow through the P-N junction.
PROCEDURE:
i. Ensure that D.C Power supply is switched OFF. Keep the voltage control knob in the
minimum position and current control knob in maximum position.
ii. Connect the circuit as shown in Fig –1 for forward characteristics making use of silicon diode.
iii. Vary the power supply voltage such that the voltage across the diode is varied 0-1V in
steps of 0.1 volts .Note down Vf and If in the table.
iv. Draw the Vf Vs If characteristics and find out the cut – in voltage Vr for diode from it.
Ensure that the current through the diode does not exceed 50mA.
v. Repeat the experiment using germanium diode.
vi. Present the results at the end of the experiment.
vii. Estimate the forward resistance of the diode from the relation = [Δ V f / Δ If ]
CIRCUIT DIAGRAM:
Theory :
In the reverse bias positive electrode of the battery is connected to N-side and the negative
electrode to P-side. When a P-N junction is reverse biased, the holes in the P region are attracted
towards the negative electrode of the battery and the electrons in the N region are attracted
towards the positive electrode.
Thus the majority carriers are drawn away from the junction. This widens the depletion
layer and increases the height of the potential barrier. Hence there is no current flow due to
majority carriers under reverse bias. A small amount of current due to diffusion of minority charge
carriers across the junction flows through the reversed biased PN junction. Generation of the
minority carriers is dependent upon the ambient temperature and is independent of the applied
reverse voltage, as can be seen from the
PROCEDURE :
i. Connect the circuit as shown in Fig-2 for reverse bias characteristics making use of a
silicon diode
ii. Vary the voltage across the diode from 0-20 volts in steps of 1V and record the reverse
saturation current in µA.
iii. Draw the reverse characteristics Vr, Ir .
iv. Find out the reverse saturation current Ir. Estimate the reverse resistance Rr from the
characteristic curve from the relation Rr = [Δ Vr / Δ Ir]
v. Repeat the experiment using germanium diode.
vi. Present the results at the end of the experiment.
OBSERVATIONS:
Forward Characteristics Reverse Characteristics
TABLE - I TABLE-II
S. S. No
No Vf (Volts) If (mA) Vr (Volts) Ir ( µA)
0.0 0
0.1 2
0.2 3
0.3 -
- -
- -
- -
- -
1.0 20.0
MODEL GRAPHS:
Forward and Reverse Characteristic curves :
RESULTS:
The parameters of the Silicon and Germanium diodes are estimated from the static forward and
reverse characteristics and are presented below.
RF Ohms Ohms
Rr K.Ω K.Ω
DISCUSSIONS:
1. What are the cut-in voltages for the two diodes used ? Give reasons why they are different?
2. What is meant by forward and reverse bias ?
3. Name the applications of the diodes.
4. What is meant by depletion layer or intrinsic / Space charge region
5. What is meant by recombination?
6. Write examples of N type & P type materials?
7. What is reverse Saturation Current?
EXPERIMENT NO : 2
ZENER DIODE CHARACTERISTICS
AIM : To Plot the V–I Characteristics of a Zener Diode
APPARATUS :
CIRCUIT DIAGRAM :
Fig.2 Circuit arrangement for the study of the characteristics of a Zener Diode under
Reverse Bias
Theory:
The Zener diode is a Silicon PN junction device. It is operated in the reverse
breakdown region. When a reverse voltage across a diode is increased a critical voltage called a
breakdown voltage is reached at which the reverse current increases rapidly. The reverse
breakdown of a PN junction may occur either due to Avalanche breakdown effect or Zener
breakdown effect or both.
PROCEDURE:
v. Calculate the resistance of the Zener diode in the linear part of the breakdown region
with the help of the formula Rz = [Δ Vz / Δ Iz ]
vi. Present the results at the end of the experiment.
OBSERVATIONS:
Table-I: V- I characteristics of Zener diode Under Reverse Bias
EXPECTED GRAPH:
Fig .3
RESULTS:
DISCUSSIONS:
i. Name the applications of Zener diodes?
ii. Explain Zener effect and avalanche effect?
iii. Why Zener diode characteristics are taken in reverse bias?
APPARATUS:
i. Resistors -180Ώ / 5W, Zener Diode 8Z2V .
ii. Regulated Power supply (0-30V / 1Amp) – 1No.
iii. Voltmeters (0-30V) – 1No, Ammeters (0-50mA) – 3No.s
iv. Decade Resistance Box (DRB) as RL – 1No.
V. Bread board, Single stand wires.
CIRCUIT DIAGRAM:
Theory:
Zener diode is used as a Voltage Regulator. The source voltage Vi and resistor Rs are
selected so that initially the diode is operating in the breakdown region. Here the diode voltage,
which is also the voltage across the load RL is VZ and the diode current is IZ. The diode will now
regulate the load voltage against variations in load currents and against variations in supply voltage
Vi because in the breakdown region large changes in diode current produce only small changes in
diode voltage. Moreover, it maintains a constant voltage across its terminals over a specified range
of Zener current values.
OBSERVATIONS:
(a). Load Current Regulation
At No load voltage Vnl measured at IL=0
Table-I
MODEL GRAPHS:
RESULT:
DISCUSSIONS:
i. What is meant by load current regulation.
% of load regulation = {(V no load – V load) / V no load } x 100
at constant in put voltage.
EXPERIMENT NO: 3
APPARATUS:
i. Circuit board.
ii. Ammeter (0-100mA)
iii. Voltmeter (0-30V)
iv. Patch cords.
v. Cathode ray Oscilloscope.
CIRCUIT DIAGRAM:
4. To study the performance of Half-wave rectifier without any filter and with different filters
repeat the experimental procedure of step 3 in corresponding to 1.Shunt capacitor filter 2.
Inductor filter. 3. L-section filter 4. - section filter.
Compare the reading of step 3 and 4 with theoretical values.
OBSERVATIONS:
TABLE.1
S Idc Vdc Vac Ripple factor %Regulation
N (mA) (volts) V(rms) RL = Vdc / Idc =Vac/Vdc r={(Vnl-Vl)/Vnl }x100
O
0
5
10
.
50
MODEL GRAPHS:
RESULTS:
DISCUSSIONS:
It is observed experimentally that
1. ---------- filter gives better regulation.
2. --------- filter gives better ripple factor.
EXPERIMENT NO: 3
APPARATUS:
i. Circuit board.
ii. Ammeter (0-100mA)
iii. Voltmeter (0-30V)
iv. Patch cords.
v. Cathode ray Oscilloscope.
CIRCUIT DIAGRAM:
Theory:
Any electrical device, which offers a low resistance to current in one direction but the high
resistance to the current in the opposite direction, is called rectifier. They are capable of
converting a sinusoidal input waveform into a Uni directional waveform.
PROCEDURE:
3. To study the performance of the full- wave rectifier without any filter and
with different filters.
a). Record the observations in the following table by noting down the Vdc and Vac
corresponding to different Idc load currents. First note down the No-load voltage Vdc and
Vac corresponding to Idc=0. Then increase the load current insteps of 5mA up to a maximum
of 50 mA. At each value of Idc note down the corresponding value Vdc, Vrms(RMS value of
ripple out put voltage) and out put wave forms.
Plot the graphs
a) Idc vs Vdc
b) Calculate the % of regulation at different load currents and plot the graph Il as
shown in the diagram using the formula.
OBSERVATIONS:
TABLE :1
MODEL GRAPHS:
RESULTS:
DISCUSSIONS:
EXPERIMENT NO: 4
APPARATUS:
i. Transistor CL100, Resistors 4.7KΩ,470Ω.
ii. Ammeters (0-50mA) – 2 Nos.
iii. Voltmeters (0-1 V & 0-30 V)
iv. Bread board, Single stand wires.
v. Regulated Power Supply (0-30V).
1. INPUT CHARACTERISTICS :
CIRCUIT DIAGRAM :
Fig.1: The Circuit diagram for the study of input characteristics of a Transistor in common-base
configuration .
Theory:
Input characteristic curves give the relationship between the emitter current [I E]
and the emitter to base voltage[VEB] for a constant collector to base voltage [V CB]. As the
collector to base voltage (VCB) is increased above one volt, the curve shifts upwards. It occurs due
to the phenomenon called “Base width Modulation” or “Early Effect”.
PROCEDURE:
1. Connect the circuit as shown in Fig-1.
2. Ensure that the power supply is switched OFF. Keep the voltage control knob in the minimum
position and current control knob in maximum position.
3. Switch ON the power supply. Adjust Vcc such that Vcb is zero.
4. Vary IE with the help of VEE in steps( say 1mA )and record the corresponding values of VBE in
the Table-I shown below. Make sure that the collector current, Ic does not exceed 25mA.
5. This set of observations gives the input characteristics With V CB=0V.
6. Repeat steps from 1 to 4 for different values of VCB say VCB = 5V , 10V and for VCB open (This
can be done by opening one of the out put terminals.)
7. Draw the input characteristics IE Vs VEB for different values of VCB as shown In Fig.3(a).
OBSERVATIONS :
1. 0
2. 5
3. 10
4. 15
5. 20
6. 25
MODEL GRAPH:
Fig.2 : Circuit diagram for the study of output characteristics of a Transistor in common-
base configuration.
Theory:
Output characteristic curves give the relationship between the collector current(I C) and
the collector to base voltage (VCB) for a constant emitter current (IE). The curve may be divided
into three important regions namely saturation region, active region, and cut-off region.
PROCEDURE:
1. Connect the circuit as per the circuit Diagram shown in Fig – 2.
2. Ensure that the power supply is switched OFF. Keep the voltage control knob in the
Minimum position and current control knob in maximum position.
3. Switch ON the power supply. Adjust VEE to get IE=0 mA.
4. Fix the collector to base voltage (VCB). Record the corresponding values of collector
currents, IC in the table shown below .
5. Repeat the steps from 1 to 4 for different values of IE from 1 to 10ma.( not exceed to25mA)
6. Draw the output characteristics VCB Vs IC for different values of VCB.
7. Present all the results at the end of the experiment.
OBSERVATIONS :
1. 0
2. .
3. .
4. .
5. .
- .
- 10
MODEL GRAPH :
RESULTS:
The input and output characteristics are drawn are shown in Fig.3(a)and Fig.3(b) and the
following hybrid parameters are estimated from the graphs.
DISCUSSIONS :
i. Indicate the various regions, (Active region, Saturation region and cut off region) on the
Out put characteristics of the transistor and discuss them.
ii. What does early effect or Base width modulation means?
EXPERIMENT NO: 5
APPARATUS:
i. Transistor CL100,Resistors 47KΩ, 1KΩ
ii. Ammeters (0-50mA) – 2 Nos.
iii. Voltmeters (0-1 V, 0-30 V)
iv. Bread board, Single stand wires.
v. Regulated Power Supply (0-30V).
INPUT CHARACTERISTICS:
CIRCUIT DIAGRAM:
Fig.1: Circuit diagram for the study of input characteristics of a Transistor in common-
Emitter configuration.
Theory: These curves give the relationship between the base current (I B) and the base to
emitter voltage (VBE) for a constant collector to emitter voltage (V CE). As the collector to emitter
voltage is increased above 1V, the curves shifts downwards because as V CE is increased, the
depletion width in the base region increases and this reduces the effective base width, which in
turn reduces the base current.
PROCEDURE:
i. Connect the circuit as shown in Fig-1.
ii. Ensure that the power supply is switched OFF. Keep the voltage control knob in the minimum
Position and current control knob in maximum position.
iii. Switch ON the power supply. Adjust VCC such that VCE=0V (this can also be done by switching
OFF the Vcc supply and shorting the two outputs leads. Vary I B with the help of VBB in steps of
10µA and record the corresponding values of V BE in the Table –I shown below and record the
corresponding values of V BE (base to emitter voltage).
iv. Make sure that the collector current Ic does not exceed 25mA. This set of readings gives
the input characteristics of VCE=0V.
v. Repeat steps (1-4) for different values of VCE say VCE =0.1 v, 0.2V, 0.3V, 1V.
vi. Draw input characteristic IB Vs VBE for different values of VCE.
vii. Estimate h-parameters from the characteristic curves.
viii. Present all the results at the end of the experiment.
OBSERVATIONS:
2. OUTPUT CHARACTERISTICS:
CIRCUIT DIAGRAM:
Fig.2 Circuit diagram for the study of output characteristics of a Transistor in common-Emitter
configuration
Theory:
Output characteristic gives the relationship between the collector to emitter voltage (V CE)
and collector current(IC) for a constant base current (IB).
The curves may be divided into three important regions namely Saturation region Active
region and Cut-off region.
PROCEDURE:
ii. Ensure that the power supply is switched OFF. Keep the voltage control knob in the minimum
position and current control knob in maximum position. Switch ON the power supply .
iii. With the help of power supply VEE make the input current IB=10A. Vary collector to emitter
voltage (VCE) in suitable steps of 0.1 volts starting from 0 volts. Record the corresponding
values of collector currents IC, in the Table-II. This set of readings gives the output
iv. Repeat step iii for different values of base current say Ib=10A-100A in steps of 10A.
v. Draw the output characteristic Vce vs IC.
vi.. Estimate h-parameters from the characteristics curve.
vii. Present all the results at the end of the experiment.
OBSERVATIONS:
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
MODEL GRAPH:
Output Characteristics
RESULTS:
The input and output characteristics are drawn are shown in Fig.3(a)and Fig.3(b) and the
following hybrid parameters are estimated from the graphs.
DISCUSSIONS:
i. Indicate the various regions, (Active region, Saturation region and cut off region) on
the out put characteristics of the transistor.
ii. Estimate Ic and Vce from the circuit shown
iii. What are the differences between common emitter and common base input and out
put characteristics?
EXPERIMENT NO: 6
APPARATUS:
i. Transistor CL100, Resistors47KΩ,1KΩ,500Ω.
ii. Ammeters (0-50mA) – 2 Nos.
iii. Voltmeters (0-1 V, 0-30 V)
iv. Bread board, Single stand wires.
v. Regulated Power Supply (0-30V).
1.INPUT CHARACTERISTICS :
CIRCUIT DIAGRAM :
Fig.1 Circuit diagram for the study of input characteristics of a Transistor in common-
collector configuration .
Theory:
Input characteristic curves give the relationship between the base current (IB) and
the base to collector voltage (VBC) for a constant collector to base voltage (VEC)
PROCEDURE:
iv. Vary IB with the help of VBB in steps of 10µA and record the corresponding values of VBC
in the Table –I. Make sure that the collector current IC does not exceed 25mA.
v. Repeat steps from i to iv for different values of VEC say VEC =5V, 10V and for VBC open
(This can be done by opening one of the output terminals).
vi. Draw the input characteristics IB verses VBC for different values of VEC in Fig.3(a).
vii. Estimate h-parameters from the characteristics curve.
viii. Present all the results at the end of the experiment.
OBSERVATIONS:
Table –1. Input Characteristics
MODEL GRAPH:
2.Output Characteristics:
Fig.2 Circuit diagram for the study of output characteristics of a Transistor in common-
collector configuration
Theory: The output characteristics curves give the relationship between collector to emitter
voltage (VEC) and the emitter current (IE)
PROCEDURE:
i. Connect the circuit as shown in Fig-2.
ii. Ensure that the power supply is switched OFF. Keep the voltage control knob in the
minimum
position and current control knob in maximum position.
iii. Switch ON the power supply. Adjust VEC =2V
iv. Fix the collector to emitter voltage (VEC) . Record the corresponding values of emitter
current (IE) in the table shown below.
v. Repeat steps from i to iv for different values of VEC say VEC =5V, 10V and for VBC open
(This can be done by opening one of the output terminals).
vi. Draw the output characteristics for different values of V EC in Fig.3(b).
viii. Present all the results at the end.
OBSERVATIONS:
MODEL GRAPH:
RESULTS:
The input and output characteristics are drawn and the following hybrid parameters are
estimated from the graphs.
DISCUSSIONS:
Indicate the various regions (Active region, Saturation region and cut-off region) on the output
characteristics of the transistor and discuss them.
EXPERIMENT NO: 7
FIELD EFFECT TRANSISTOR - STATIC
CHARACTERISTICS
AIM:
a) To obtain the static characteristics(output and transfer characteristics) of a
given Field Effect Transistor (FET).
b) Identify the Ohmic, Pinch-off and breakdown regions of the characteristics
and to estimate the values of drain resistance (rd), trans-conductance- gm
and the amplification factor –A from the characteristics.
APPARATUS:
i. Diode OA79, Resistors 220Ω, FET-BFW10
ii. Mille Ammeters (0-25mA)
iii. Voltmeter (0-30 V)
iv. Single stand wires, Bread board.
v. Regulated Power Supply (0-30V)
CircuitDiagram:
Theory:
The Field effect Transistor is a three terminal Uni polar device in which the current through
the device is controlled by the electric field, unlike the case of bipolar transistors. Hence, they
offer very high input impedance compared to bipolar devices. A reverse biased diode is included in
the path of the gate to protect the FET from any accidental forward biasing. A high input
impedance digital voltmeter should be connected between the gate and source.
OUTPUT CHARACTERISTICS:
i. Set V gs = -1Volts by varying V gg. Gradually increase the drain to source voltage by varying V dd
from 0 – 10 Volts in steps of I volt and note down the drain current I d .
ii. Repeat this for V gs = -2 Volts and V gs = -3.0 Volts. ------------------
iii. Record the observations in Table-I
iv. Plot V ds versus Id for different values of V gs.
v. Draw the output characteristics V ds versus Id as shown in Fig.2(a), and calculate the drain
resistance rd from the graph in the linear region of the characteristics by
rd = [V ds / Id] at V gs = constant.
vi. Present all the results at the end of the experiment.
OBSERVATIONS:
TABLE-I : Output characteristics
1. 0.0
2. 0.5
3. 1.0
4. -
5. -
6. -
7. -
8. -
9. -
10 10.0
TRANSFER CHARACTERISTICS:
OBSERVATIONS:
TABLE-II : Transfer characteristics
V ds = 2 V V ds = 4 V V ds = 6 V
S NO
Vgs (V) Id (mA) Vgs (V) Id (mA) Vgs (V) Id (mA)
MODEL GRAPHS:
RESULT:
DISCUSSIONS:
i. Why FET is called unipolar device ?
ii. What are the differences between FET& UJT?
iii. Why FET is called voltage control device?
EXPERIMENT NO:8
C.E AMPLIFIER
AIM:
To obtain the frequency response characteristics of the C.E.amplifier and
calculating 3db bandwidth.
To estimate maximum signal handling capacity of amplifier in the mid frequency
band.
To measure the I/P impedance and O/P impedance of the amplifier.
To observe the phase response of amplifier
APPARATUS:
i. C.R.O, D.C Regulated power supply ,
ii. Signal generator,
iii. Transistor BC107, Resistors 1K,10K,100K,1K,2.2KΩ, Capacitors 10μF-(3),
iv. Bread board, patch cords (or) single stand wires.
CIRCUIT DIAGRAM :
PROCEDURE:
1. Connect the circuit as shown in figure, and check for the D.C conditions of the transistor to
ensure that it is in active region . Obtain the maximum signal handling capacity (also known as
over load characteristic) at constant input signal frequency of 1 KHz as follows (i.e), Vary the
input voltage from 0 to 2V in suitable steps 10mV.
Plot the characteristic of out put voltage Vs input voltage. Indicate the point where the
distortion begins to set in the O/P. The corresponding amplitude of the I/P voltage gives the
maximum signal handling capacity for the amplifier.
OBSERVATIONS: Vi = Volts(rms).
i) Using C.R.O measure the phase difference between Vin and Vout as the frequency of the
input signal is varied in suitable steps and tabulate the results as shown below. Plot the
phase Vs frequency.
Note : Find the phase difference between the input and the output signals at 2 or 3 frequencies in
the lower frequency, mid-frequency and the High –frequency segments of the characteristic.
MODEL GRAPHS:
Amplitude response
Phase response
RESULT:
EXPERIMENT NO:9
EMITTER FOLLOWER
AIM:
i) To obtain maximum signal handling capacity (over load characteristic) by
plotting the out put voltage verses the input voltage a fixed frequency of
1 KHz (in the mid frequency band).
ii) To measure the I/P impedance and O/P impedance of the amplifier.
iii) To obtain the frequency response of the amplifier
a) Gain Vs Frequency b) Phase difference Vs Frequency.
APPARATUS:
i. C.R.O, D.C Regulated power supply ,
ii. Signal generator,
iii. Transistor BC107,
iv. Resistors 1K, 10K,100K,470Ω, Capacitors10μF,22μF,
v. Bread board, patch cords (or) Single stands wires.
CIRCUIT DIAGRAM:
PROCEDURE:
1. .Connect the circuit as shown in figure, and check for the D.C conditions of the transistor to
ensure that it is in active region . Obtain the maximum signal handling capacity (also known as over
load characteristic) at constant input signal frequency of 1 KHz as follows (i.e), Vary the input
voltage from 0 to 2V in suitable steps 10mV.
Plot the characteristic of out put voltage Vs input voltage. Indicate the point where the
distortion begins to set in the O/P. The corresponding amplitude of the I/P voltage gives the
maximum signal handling capacity for the amplifier.
OBSERVATIONS: Vi = Volts(rms).
Note : Find the phase difference between the input and the output signals at 2 or 3 frequencies in
the lower frequency, mid-frequency and the High –frequency segments of the characteristic.
MODEL GRAPHS:
RESULT:
DISCUSSION :
1. The phase difference between in put and out put for an emitter follower at the mid frequency
is
-----------------.
2. For emitter follower which parameter or characteristics are highest compare it with C.B
configuration.
3. Operation of emitter follower.
4. The feed back used in emitter follower --------------------.
EXPERIMENT NO:10
FET AMPLIFIER
AIM:
i) To obtain maximum signal handling capacity (over load characteristic)
by plotting the out put voltage verses the input voltage a fixed frequency of 1KHz (in the
mid frequency band).
ii) To measure the I/P impedance and O/P impedance of the amplifier
iii) To obtain the frequency response of the amplifier
a) Gain Vs Frequency b) Phase difference Vs Frequency.
APPARATUS:
i. C.R.O, D.C Regulated power supply ,
ii. Signal generator ,
iii. Transistor BFW10, Resistors 100K,1M,1K,2.2KΩ, Capacitors 10μF-(3),
iv. Bread board, patch cords (single stands wires).
CIRCUIT DIAGRAM :
PROCEDURE :
1. Connect the circuit as shown in figure, and check for the D.C conditions of the transistor to
ensure that it is in active region . Obtain the maximum signal handling capacity (also known as
over load characteristic) at constant input signal frequency of 1 KHz as follows (i.e), Vary the
OBSERVATIONS: Vi = Volts.
Note : Find the phase difference between the input and the output signals at 2 or 3 frequencies in
the lower frequency, mid-frequency and the High –frequency segments of the characteristic.
MODEL GRAPHs:
RESULT :
1. The phase difference between in put and out put for common source FET amplifier at the mid
frequency is -----------------.
EXPERIMENT NO:11
APPARATUS :
i. SCR TY6004,Resistors 500Ω,
ii. Voltmeter(0-20V), Ammeter(0-100mA,0-500mA)
iii. Regulator Power Supply (0-30V),
iv. Decad Resistance box, Bread board, Single stand wires.
Circuit Diagram:
Theory :
i. SCR firing is indicated by the sudden increase of current I A in the anode circuit along with a
sudden fall in voltage across SCR‟s anode to cathode.
ii. If SCR is on „ON‟ state the anode current is sufficient enough to hold this SCR in ON
PROCEDURE:
iv. Care should be exercised in adjusting the gate current in very small steps of 0.1V to enable the
observation of the anode current variations carefully. Otherwise it is difficult to observe and
record the same.
v. Initially fix the gate current IG = 0, and vary power supply V1 from its minimum and note down
the
readings of VAK and IA tabulate these values in the table.
vi. Repeat step v for a different value of gate current.
vii. Plot the observations as shown in Table-1.
OBSERVATIONS:
Table -I
MODEL GRAPH:
RESULTS:
It is experimentally observed that –
i. The holding current for the SCR TY 6004 is ________ mA
ii. The blocking region for Ig =0 extends upto__________ volts
iii. The break over voltage VBR ___________________________________ Volts
EXPERIMENT NO:12
APPARATUS:
1. UJT (2N2646), Resistors 220Ω
2. Ammeter (0-50mA)
3. Voltmeter (0-30 V)- 1 No, and (0-10V) – 1No.
4. Regulated Power Supply (0-30V), Bread board. Single stand wires.
Circuit Diagram:
Theory :
The Uni-junction transistor (UJT) is a three terminal silicon semiconductor device. The
UJT has only one PN junction. The PN junction is formed between the emitter and the base regions.
The emitter region is heavily doped. The emitter region is closer to base (B1) terminal than base
(B2). The operational difference between FET and UJT is that FET is normally operated with gate
junction reverse biased, whereas useful behavior of UJT occurs when the emitter is forward
biased.
PROCEDURE:
i. Connect the circuit as shown in Fig.1 above.
ii. Ensure that the power supply is switched OFF. Keep the voltage control knob in the minimum
position and current control knob in maximum position.
iii. Switch ON the power supply. Keep V BB at 5volts. Now vary VEB1 by varying VEE. Note down IE
once UJT is ON, Increase the emitter current IE in small steps of 5mA and note down the
Corresponding VEB1 value upto a maximum of 50mA.
iv. Repeat above steps for V EB = 10V and 15V. Plot graph of IE versus V EB1 for different values of
VBB as shown in Fig.3.
v. Calculate resistance of the UJT in the negative resistance region using the formula
r(-) = V EB1 / I E at V BB = constant.
OBSERVATIONS:
Table-I
1.
2.
3.
4.
5.
6.
7.
8.
MODEL GRAPH:
RESULT:
Specifications:
Intrinsic stand off ratio :ή
Peak point emitter current : Ipeak
Valley point current : Iv
DISCUSSIONS: