Chenming Hu Ch1 Slides
Chenming Hu Ch1 Slides
Chenming Hu Ch1 Slides
in Semiconductors
1.1 Silicon Crystal Structure
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-1
Silicon Wafers and Crystal Planes
1.1 eV
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-4
GaAs, III-V Compound Semiconductors, and Their Dopants
Energy states of Si atom (a) expand into energy bands of Si crystal (b).
The lower bands are filled and higher bands are empty in a semiconductor.
The highest filled band is the valence band.
The lowest empty band is the conduction band .
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-6
1.3.1 Energy Band Diagram
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-7
Measuring the Band Gap Energy by Light Absorption
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-8
1.3.2 Donor and Acceptor in the Band Model
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-9
1.4 Semiconductors, Insulators, and Conductors
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-11
1.5.1 Effective Mass
The electron wave function is the solution of the three
dimensional Schrodinger wave equation
2
2 + V ( r ) =
2m 0
The solution is of the form exp( k r)
k = wave vector = 2/electron wavelength
For each k, there is a corresponding E.
q d 2 E F
accelerati on = 2 2
=
dk m
2
effective mass 2
d E / dk 2
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-12
1.5.1 Effective Mass
electrons
holes
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-13
1.5.2 How to Measure the Effective Mass
mn v 2
= qvB
r
fcr is the Cyclotron resonance frequency.
qBr
v= It is independent of v and r.
mn Electrons strongly absorb microwaves of
v qB
f cr = = that frequency. (MW, 2.54 GHz)
2r 2mn By varying B until a peak in absorption fcr,
mn can be found.
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-14
1.6 Density of States
number of states in E 1
Dc ( E ) 3
E volume eV cm
8mn 2mn (E Ec )
Dc ( E )
h3
8m p 2m p (Ev E ) Derived in Appendix I
Dv ( E ) 3
h
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-15
1.7 Thermal Equilibrium and the Fermi Function
1.7.1 An Analogy for Thermal Equilibrium
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-16
Appendix II. Probability of a State at E being Occupied
There are g1 states at E1, g2 states at
E2 There are N electrons, which
constantly shift among all the states
but the average electron energy is
fixed at 3kT/2.
There are many ways to distribute
N among n1, n2, n3.and satisfy the
3kT/2 condition.
The equilibrium distribution is the distribution that
maximizes the number of combinations of placing n1 in g1
slots, n2 in g2 slots. :
ni/gi =
Ef + 2kT
( )
E
f
E f E kT E E f << kT
f (E) 1 e
Ef + kT
Ef
Ef kT
Ef 2kT There is only one Fermi
Ef 3kT
( )
E f E kT
level in a system at thermal
f (E) 1 e
f(E) equilibrium
0.5 1
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-18
1.8 Electron and Hole Concentrations
1.8.1 Derivation of n and p from D(E) and f(E)
top of conduction band
n= f ( E ) Dc ( E )dE
Ec
8mn 2mn ( ) kT
EE f
n= E Ec e dE
h3 Ec
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-19
Electron and Hole Concentrations
Nc is called the effective
( Ec E f ) / kT
n = Nce density of states (of the
conduction band) .
2mn kT
32
It is as if all the energy states in the
N c 2 conduction band effectively squeezed
2
h into a single energy level, Ec, which can
hold Nc electrons ( cm-3) and the
probability that an energy states at EC is
( E f Ev ) / kT
p = Nve occupied.
2m p kT
32 Nv is called the effective
N v 2 2 density of states of the
h valence band.
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-20
Remember: the closer Ef moves up to E c , the larger n is;
the closer Ef moves down to Ev , the larger p is.
For Si, Nc = 2.8 x1019 cm-3 and Nv = 1.04 x1019 cm-3 .
( )
Ec E f = kT ln (N c n ) = 0.026 ln 2.8 1019 / 1017 = 0.146 eV
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-24
1.8.2 The Fermi Level and Carrier Concentrations
( Ec E f ) / kT
n = Nce
E f = Ec kT ln ( N c n )
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-25
1.8.3 The np Product and the Intrinsic Carrier Concentration
( Ec E f ) / kT ( E f Ev ) / kT
Multiply n = N c e and p = Nve
( Ec Ev ) / kT E g / kT
np = N c N v e = Nc Nve
Indep. of EF
np = ni
2
Doped or un-doped
E g / 2 kT
ni = N c N v e
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-26
EXAMPLE: Carrier Concentrations
Question: What is the hole concentration in an N-type semiconductor
with 1015 cm-3 of donors?
Solution: ni
2
10 20 cm -3
n= 17 3 = 103 cm -3
p 10 cm
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-27
1.9 General Theory of n and p
EXAMPLE: Complete ionization of the dopant atoms
Nd = 1017 cm-3. What fraction of the donors are not ionized?
Solution: First assume that all the donors are ionized.
n = N d = 1017 cm 3 E f = Ec 146meV
45meV 146 meV
Ed Ec
Ef
Ev
1 1
Probability of not = = 0.04
1 ( E E ) / kT 1
being ionized 1+ e d f 1 + e((14645) meV ) / 26 meV
2 2
Therefore, it is reasonable to assume complete ionization, i.e., n = Nd .
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-28
1.9 General Theory of n and p
Charge neutrality: n + Na = p + Nd
np = ni
2
1/ 2
N a N d N a N d 2
p= + + ni
2
2 2
1/ 2
N d N a N d N a 2
n= + + ni
2
2 2
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-29
1.9 General Theory of on n and p
I. N d N a >> ni (i.e., N-type) n = Nd Na
p = ni n
2
If N d >> N a , n = Nd p = ni N d
2
and
n = ni N a
2
If N a >> N d , p = Na and
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-30
EXAMPLE: Dopant Compensation
What are n and p in Si with (a) Nd = 61016 cm-3 and Na = 21016 cm-3
and (b) additional 61016 cm-3 of Na?
n = 41016 cm-3
(a) n = N d N a = 4 1016 cm 3 ++++++
......
Nd = 61016 cm-3
p = ni / n = 10 20 / 4 1016 = 2.5 103 cm 3
2
16 -3
. . . .N.a.=. .210
. . . cm
Nd = 61016 cm-3
n = ni / p = 10 20 / 2 1016 = 5 103 cm 3
2
Na = 81016 cm-3
-------- ......
p = 21016 cm-3
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-31
1.10 Carrier Concentrations at Extremely High
and Low Temperatures
( Ec E f ) / kT
intrinsic regime n = Nce
E g / 2 kT
Slope = e E f = Ec kT ln ( N c n )
ln n
n = Nd
freeze-out regime
EF may rise above Ed
Slope = e
( Ec Ed ) / 2 kT non-ionized
1/T
High Room temp Cryogenic temp
temp
E g / 2 kT
high T: n = p = ni = Nc Nv e
1/ 2
low T: n =
N c N d ( Ec Ed ) / 2 kT
2 e
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-32
Infrared Detector Based on Freeze-out
To image the black-body radiation emitted by tumors
requires a photodetector that responds to hs around 0.1 eV.
In doped Si operating in the freeze-out mode, conduction
electrons are created when the infrared photons provide the
energy to ionized the donor atoms.
electron
photon Ec
Ed
Ev
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-33
1.11 Chapter Summary
Modern Semiconductor Devices for Integrated Circuits (C. Hu) Slide 1-34