ABCs of Probes en
ABCs of Probes en
ABCs of Probes en
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Tektronix Probe Selector importance. Be sure that you understand the capabilities
and limitations of the measuring equipment that youre
With this on-line, interactive tool you can select by series, using. Also, before making any measurements, become
model number, or standards/application and fine tune thoroughly familiar with the system or circuitry that you will
your search with your specific testing requirements. be measuring. Review all documentation and schematics
The list of matching products will update with each click. for the system being measured, paying particular attention
Try it now at: www.tektronix.com/probes to the levels and locations of voltages in the circuit and
heeding any and all cautionary notations.
Tektronix Resources
Additionally, be sure to review the following safety
Our continually expanding library of technical briefs, precautions to avoid personal injury and to prevent
application notes and other resources will help ensure you damage to the measuring equipment or the systems to
get the most out of your probes and other equipment. which it is attached. For additional explanation of any
Simply contact your local Tektronix representative or visit of the following precautions, please refer to Explanation of
www.tektronix.com. Safety Precautions.
Observe All Terminal Ratings
Use Proper Grounding Procedures
Connect and Disconnect Probes Properly
Safety Summary Avoid Exposed Circuitry
When making measurements on electrical or electronic
Avoid RF Burns While Handling Probes
systems or circuitry, personal safety is of paramount
Do Not Operate Without Covers
Do Not Operate in Wet/Damp Conditions
Do Not Operate in an Explosive Atmosphere
Do Not Operate with Suspected Failures
Keep Probe Surfaces Clean and Dry
Do Not Immerse Probes in Liquids
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ABCs of Probes
Table of Contents
Probes - The Critical Link to Advanced Probing Techniques . . . . . . . . . . . . . 46 - 54
Measurement Quality . . . . . . . . . . . . . . . . . . . . . 4 - 13 Ground Lead Issues . . . . . . . . . . . . . . . . . . . . . . . . . . 46
What is a Probe? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Differential Measurements . . . . . . . . . . . . . . . . . . . . . . 50
The Ideal Probe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Small Signal Measurements . . . . . . . . . . . . . . . . . . . . 53
The Realities of Probes . . . . . . . . . . . . . . . . . . . . . . . . . 7
Some Probing Tips . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Explanation of Safety Precautions . . . . . . . . . . 55 - 56
Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Observe All Terminal Ratings . . . . . . . . . . . . . . . . . . . . 55
Different Probes for Different Needs . . . . . . . . . 14 - 25 Use Proper Grounding Procedures . . . . . . . . . . . . . . . . 55
Connect and Disconnect . . . . . . . . . . . . . . . . . . . . . . . 55
Why So Many Probes? . . . . . . . . . . . . . . . . . . . . . . . . 14
Avoid Exposed Circuitry . . . . . . . . . . . . . . . . . . . . . . . . 56
Different Probe Types and Their Benefits . . . . . . . . . . . 16
Avoid RF Burns While Handing Probes . . . . . . . . . . . . 56
Floating Measurements . . . . . . . . . . . . . . . . . . . . . . . . 22
Do Not Operate Without Covers . . . . . . . . . . . . . . . . . 56
Probe Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Do Not Operate in Wet/Damp Conditions . . . . . . . . . . 56
A Guide to Probe Selection . . . . . . . . . . . . . . . . 26 - 31 Do Not Operate in an Explosive Atmosphere . . . . . . . . 56
Do Not Operate with Suspected Failures . . . . . . . . . . 56
Choosing the Right Probe . . . . . . . . . . . . . . . . . . . . . . 26
Keep Probe Surfaces Clean and Dry . . . . . . . . . . . . . . 56
Understanding the Signal Source . . . . . . . . . . . . . . . . . 27
Do Not Immerse Probes in Liquids . . . . . . . . . . . . . . . 56
Understanding the Oscilloscope . . . . . . . . . . . . . . . . . .29
Selecting the Right Probe . . . . . . . . . . . . . . . . . . . . . . . 31 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 - 59
How Probes Affect Your Measurements . . . . . . 32 - 40
The Effect of Source Impedance . . . . . . . . . . . . . . . . . 32
Capacitive Loading . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Bandwidth Considerations . . . . . . . . . . . . . . . . . . . . . 35
What To Do About Probing Effects . . . . . . . . . . . . . . . 40
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Figure 1.1. A probe is a device that makes a physical and electrical connection
between the oscilloscope and test point.
Precision Measurements Start at the In essence, the probe is the first link in the oscilloscope
measurement chain. And the strength of this measurement
Probe Tip chain relies as much on the probe as the oscilloscope.
Probes are vital to oscilloscope measurements. To under- Weaken that first link with an inadequate probe or poor
stand how vital, disconnect the probes from an oscilloscope probing methods, and the entire chain is weakened.
and try to make a measurement. It cant be done. There
In this and following sections, youll learn what contributes to
has to be some kind of electrical connection, a probe of
the strengths and weaknesses of probes and how to select
some sort between the signal to be measured and the
the right probe for your application. Youll also learn some
oscilloscopes input channel.
important tips for using probes properly.
In addition to being vital to oscilloscope measurements,
probes are also critical to measurement quality. Connecting What Is a Probe?
a probe to a circuit can affect the operation of the circuit, As a first step, lets establish what an oscilloscope probe is.
and an oscilloscope can only display and measure the signal
Basically, a probe makes a physical and electrical connection
that the probe delivers to the oscilloscope input.
between a test point or signal source and an oscilloscope.
Thus, it is imperative that the probe have Depending on your measurement needs, this connection can
be made with something as simple as a length of wire or with
minimum impact on the probed circuit and
something as sophisticated as an active differential probe.
that it maintain adequate signal fidelity for
At this point, its enough to say that an oscilloscope probe is
the desired measurements.
some sort of device or network that connects the signal
If the probe doesnt maintain signal fidelity, if it changes the source to the input of the oscilloscope. This is illustrated in
signal in any way or changes the way a circuit operates, Figure 1.1, where the probe is indicated as an undefined box
the oscilloscope sees a distorted version of the actual signal. in the measurement diagram.
The result can be wrong or misleading measurements.
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ABCs of Probes
Whatever the probe is in reality, it must provide a connection The Ideal Probe
of adequate convenience and quality between the signal
In an ideal world, the ideal probe would offer the following
source and the oscilloscope input (Figure 1.2). The adequacy
key attributes:
of connection has three key defining issues physical attach-
ment, impact on circuit operation, and signal transmission. Connection ease and convenience
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Such a probing system is shown in Figure 1.3a. These Figures 1.3. Various probes are available for different application technologies and
measurement needs.
probes, however, are too small for practical use in applica-
tions such as industrial power circuitry where high voltages
and larger gauge wires are common. For power applications,
physically larger probes with greater margins of safety are
required. Figures 1.3b and 1.3c show examples of such
probes, where Figure 1.3b is a high-voltage probe and
Figure 1.3c is a clamp-on current probe.
From these few examples of physical connection, its clear
that theres no single ideal probe size or configuration for
all applications. Because of this, various probe sizes and
configurations have been designed to meet the physical
connection requirements of various applications.
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ABCs of Probes
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Amplitude
Bandwidth
Figure 1.5. Probes and oscilloscopes are designed to make measurements to
specification over an operating bandwidth. At frequencies beyond the 3 dB point,
signal amplitudes become overly attenuated and measurement results may be
unpredictable.
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ABCs of Probes
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Figure 1.8. For AC signal sources, probe tip capacitance (Cp) is the greatest loading
concern. As signal frequency increases, capacitive reactance (Xc) decreases, causing
more signal flow through the capacitor.
P6109B 10X 10 M 13 pF
P6139A 10X 10 M 8 pF
P6243 10X 1 M 1 pF
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ABCs of Probes
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Figure 1.12. Even a short piece of wire soldered to a test point can cause signal fidelity problems.
In this case, rise time has been changed from 4.74 ns to 5.67 ns.
6.5 inch probe ground lead. 28 inch lead attached to probe lead.
Figure 1.13. Extending the length of the probe ground lead can cause ringing to appear on pulses.
Also, its wise to check probe compensation whenever you change probe tip adaptors.
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ABCs of Probes
Use Appropriate Probe Tip Adapters Whenever Possible Keep Ground Leads as Short and as Direct as Possible.
A probe tip adapter thats appropriate for the circuit being When doing performance checks or troubleshooting large
measured makes probe connection quick, convenient, and boards or systems, it may be tempting to extend the probes
electrically repeatable and stable. Unfortunately, its not ground lead. An extended ground lead allows you to attach
uncommon to see short lengths of wire soldered to circuit the ground once and freely move the probe around the
points as a substitute for a probe tip adapter. system while you look at various test points. However, the
added inductance of an extended ground lead can cause
The problem is that even an inch or two of wire can cause
ringing to appear on fast-transition waveforms. This is illus-
significant impedance changes at high frequencies. The
trated in Figure 1.13, which shows waveform measurements
effect of this is shown in Figure 1.12, where a circuit is
made while using the standard probe ground lead and an
measured by direct contact of the probe tip and then
extended ground lead.
measured via a short piece of wire between the circuit
and probe tip. Summary
In this first chapter, weve tried to provide all of the basic
information necessary for making appropriate probe selec-
tions and using probes properly. In the following chapters,
well expand on this information as well as introduce more
advanced information on probes and probing techniques.
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Is such a broad selection of probes really Standard BNC Probes. Probes with a plain BNC connector will connect
with virtually all Tektronix oscilloscopes. Low cost passive probes generally
necessary? The answer is Yes, and in this have a plain BNC connector.
chapter youll discover the reasons why.
From an understanding of those reasons, youll be better
prepared to make probe selections to match both the
oscilloscope you are using and the type of measurements
that you need to make. The benefit is that proper probe
selection leads to enhanced measurement capabilities and
TekProbe Level 1 BNC Probes. TekProbe Level 1 BNC connector
results. equipped probes communicates scale information to the oscilloscope so that
the oscilloscope correctly conveys accurate amplitude information.
Why So Many Probes?
The wide selection of oscilloscope models and capabilities is
one of the fundamental reasons for the number of available
probes. Different oscilloscopes require different probes. A
400 MHz oscilloscope requires probes that will support that
400 MHz bandwidth.
TekProbe Level 2 BNC Probes. The TekProbe Level 2 BNC shares the
scale information of the Level 1 but also provides power for a whole host of
However, those same probes would be overkill, both in capa-
active electronic probe designs.
bility and cost, for a 100 MHz oscilloscope. Thus, a different
set of probes designed to support a 100 MHz bandwidth is
needed.
As a general rule, probes should be selected to match the
oscilloscopes bandwidth whenever possible. Failing that, the
selection should be in favor of exceeding the oscilloscopes
bandwidth. TekVPI Probes. TekVPI equipped probes offer advances in power
management and remote control. TekVPI probes are an ideal choice for
Bandwidth is just the beginning, though. Oscilloscopes applications where computer control is important.
can also have different input connector types and different
input impedances. For example, most scopes use a simple
BNC-type input connector. Others may use an SMA connec-
tor. And still others, as shown in Figure 2.1, have specially
designed connectors to support readout, trace ID, probe
power, or other special features. TekConnect Probes. Probes with TekConnect interface support the highest
bandwidth active probes offered by Tektronix. The TekConnect interface is
Thus, probe selection must also include connector compati- designed to support probe requirements >20 GHz.
bility with the oscilloscope being used. This can be direct
connector compatibility, or connection through an appropriate Figure 2.1. Probe to oscilloscope interfaces
adaptor.
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Also, there are many cases where the signal voltages are For applications where signal amplitudes are one-volt peak-
differential. That is, the signal exists across two points or to-peak or less, a 1X probe may be more appropriate or
two wires, neither of which is at ground or common potential even necessary. Where theres a mix of low amplitude and
(see Figure 2.2). Such differential signals are common in moderate amplitude signals (tens of millivolts to tens of volts),
telephone voice circuits, computer disk read channels, and a switchable 1X/10X probe can be a great convenience. It
multi-phase power circuits. Measuring these signals requires should be kept in mind, however, that a switchable 1X/10X
yet another class of probes referred to as differential probes. probe is essentially two different probes in one. Not only
are their attenuation factors different, but their bandwidth,
And then there are many cases, particularly in power applica-
rise time, and impedance (R and C) characteristics are
tions, where current is of as much or more interest than
different as well. As a result, these probes will not exactly
voltage. Such applications are best served with yet another
match the oscilloscopes input and will not provide the
class of probes that sense current rather than voltage.
optimum performance achieved with a standard 10X probe.
Current probes and differential probes are just two special
Most passive probes are designed for use with general
classes of probes among the many different types of available
purpose oscilloscopes. As such, their bandwidths typically
probes. The rest of this chapter covers some of the more
range from less than 100 MHz to 500 MHz or more.
common types of probes and their special benefits.
There is, however, a special category of passive probes
Different Probe Types and Their Benefits that provide much higher bandwidths. They are referred to
As a preface to discussing various common probe types, variously as 50 probes, Zo probes, and voltage divider
its important to realize that theres often overlap in types. probes. These probes are designed for use in 50 environ-
Certainly a voltage probe senses voltage exclusively, but a ments, which typically are high-speed device characterization,
voltage probe can be a passive probe or an active probe. microwave communication, and time domain reflectometry
Similarly, differential probes are a special type of voltage (TDR). A typical 50 probe for such applications has
probe, and differential probes can also be active or passive a bandwidth of several gigaHertz and a rise time of
probes. Where appropriate these overlapping relationships 100 picoseconds or faster.
will be pointed out.
Active Voltage Probes
Passive Voltage Probes Active probes contain or rely on active components, such as
Passive probes are constructed of wires and connectors, transistors, for their operation. Most often, the active device is
and when needed for compensation or attenuation, resistors a field-effect transistor (FET).
and capacitors. There are no active components transistors The advantage of a FET input is that it provides a very low
or amplifiers in the probe, and thus no need to supply input capacitance, typically a few picoFarads (pF) down
power to the probe. to less than 1 pF. Such ultra-low capacitance has several
Because of their relative simplicity, passive probes tend to desirable effects.
be the most rugged and economical of probes. They are First, recall that a low value of capacitance, C, translates to a
easy to use and are also the most widely used type of probe. high value of capacitive reactance, Xc. This can be seen from
Passive voltage probes are available with various attenuation the formula for Xc, which is:
factors 1X, 10X, and 100X for different voltage ranges. Of
these, the 10X passive voltage probe is the most commonly
used probe, and is the type of probe typically supplied as a
standard accessory with oscilloscopes.
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ABCs of Probes
CH1 CH2
a.
Differential Probe
b.
Figure 2.4. Differential signals can be measured using the invert and add feature of
Figure 2.3. Some examples of differential signal sources. a dual-channel oscilloscope (a), or preferably by using a differential probe (b).
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ABCs of Probes
Current Probes
Current flow through a conductor causes an electromagnetic
flux field to form around the conductor. Current probes are
designed to sense the strength of this field and convert it to a
corresponding voltage for measurement by an oscilloscope.
This allows you to view and analyze current waveforms with
an oscilloscope. When used in combination with an oscillo-
scopes voltage measurement capabilities, current probes
also allow you to make a wide variety of power measure-
ments. Depending on the waveform math capabilities of the
oscilloscope, these measurements can include instantaneous
power, true power, apparent power, and phase.
There are basically two types of current probes for oscillo-
scopes. AC current probes, which usually are passive probes,
and AC/DC current probes, which are generally active Figure 2.6. A voltage is induced across any coil that is placed in the changing flux field
probes. Both types use the same principle of transformer around a conductor which is carrying alternating current (AC).
action for sensing alternating current (AC) in a conductor.
In all cases, theres also a low-frequency cutoff for AC current
For transformer action, there must first be alternating current probe bandwidth. This includes direct current (DC), since
flow through a conductor. This alternating current causes a direct current doesnt cause a changing flux field and, thus,
flux field to build and collapse according to the amplitude and cannot cause transformer action. Also at frequencies very
direction of current flow. When a coil is placed in this field, as close to DC, 0.01 Hz for example, the flux field still may not
shown in Figure 2.6, the changing flux field induces a voltage be changing fast enough for appreciable transformer action.
across the coil through simple transformer action. Eventually, though, a low frequency is reached where the
This transformer action is the basis for AC current probes. transformer action is sufficient to generate a measurable out-
The AC current probe head is actually a coil that has been put within the bandwidth of the probe. Again, depending on
wound to precise specifications on a magnetic core. When the design of the probes coil, the low-frequency end of the
this probe head is held within a specified orientation and bandwidth might be as low as 0.5 Hz or as high as 1.2 kHz.
proximity to an AC current carrying conductor, the probe For probes with bandwidths that begin near DC, a Hall Effect
outputs a linear voltage that is of known proportion to the device can be added to the probe design to detect DC. The
current in the conductor. This current-related voltage can be result is an AC/DC probe with a bandwidth that starts at DC
displayed as a current-scaled waveform on an oscilloscope. and extends to the specified upper frequency 3 dB point.
The bandwidth for AC current probes depends on the design This type of probe requires, at minimum, a power source for
of the probes coil and other factors. Bandwidths as high biasing the Hall Effect device used for DC sensing.
as a few GHz are possible. However, bandwidths under Depending on the probe design, a current probe amplifier
100 MHz are more typical. may also be required for combining and scaling the AC and
DC levels to provide a single output waveform for viewing on
an oscilloscope.
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Figure 2.8. An example of a split core AC current probe. Looping n turns of the con-
ductor through the probe increases effective snesitivity n times.
Figure 2.7. Through AC transformer action, the single turn of a current carrying
that closes the top of the U. The advantage of this type of
conductor (N1) induces a current in the AC probes coil (N2), resulting in a current probe is that the ferrite slide can be retracted to allow the
proportional voltage acros the probes termination (Rterm). probe to be conveniently clipped onto the conductor whose
Its important to keep in mind that a current probe operates current is to be measured. When the measurement is
in essence as a closely coupled transformer. This concept is completed the slide can be retracted and the probe can
illustrated in Figure 2.7, which includes the basic transformer be moved to another conductor.
equations. For standard operation, the sensed current con- Probes are also available with solid-core current transformers.
ductor is a one-turn winding (N1). The current from this single These transformers completely encircle the conductor being
winding transforms to a multi-winding (N2) probe output measured. As a result, they must be installed by disconnect-
voltage that is proportional to the turns ratio (N2/N1). At the ing the conductor to be measured, feeding the conductor
same time, the probes impedance is transformed back to through the transformer, and then reconnecting the conductor
the conductor as a series insertion impedance. This insertion to its circuit. The chief advantages of solid-core probes is that
impedance is frequency dependent with its 1-MHz value they offer small size and very high frequency response for
typically being in the range of 30 to 500 M , depending on measuring very fast, low amplitude current pulses and AC
the specific probe. For most cases, the small insertion signals.
impedance of a current probe imposes a negligible load.
Split-core current probes are by far the most common
Transformer basics can be taken advantage of to increase type. These are available in both AC and AC/DC versions,
probe sensitivity by looping the conductor through the probe and there are various current-per-division display ranges,
multiple times, as shown in Figure 2.8. Two loops doubles depending on the amp-second product.
the sensitivity, and three loops triples the sensitivity. However,
The amp-second product defines the maximum limit for linear
this also increases the insertion impedance by the square of
operation of any current probe. This product is defined for
the added turns.
current pulses as the average current amplitude multiplied by
Figure 2.8 also illustrates a particular class of probe referred the pulse width. When the amp-second product is exceeded,
to as a split core probe. The windings of this type of probe the core material of the probes coil goes into saturation.
are on a U shaped core that is completed with a ferrite slide Since a saturated core cannot handle any more current-
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ABCs of Probes
Figure 2.9. A word recognizer probe. Such probes allow oscilloscopes to be used to
analyze specific data waveforms during specific logic conditions. Figure 2.10 Logic probes for a mixed signal oscilloscope (MSO) simplify digital
connectivity to your device.
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Figure 2.12. In this three-phase motor drive, all points are above the ground, making
floating measurements a necessity.
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ABCs of Probes
measurement of the gate-to-emitter voltage requires rejection To get around this direct short to ground, some oscillo-
of the bus transitions. Additionally, the compact design of scope users have used the unsafe practice of defeating
the motor drive, fast current transitions, and proximity to the oscilloscopes ground circuit. This allows the oscil-
the rotating motor contribute to a harsh EMI environment. loscopes ground lead to float with the motor drive
circuit so that differential measurements can be made.
Also, connecting the ground lead of a oscilloscopes probe
Unfortunately, this practice also allows the oscilloscope
to any part of the motor drive circuit would cause a short to
chassis to float at potentials that could be a dangerous
ground.
or deadly shock hazard to the oscilloscope user.
Rather than floating the oscilloscope, the probe isolator
Not only is floating the oscilloscope an unsafe
floats just the probe. This isolation of the probe can be done
practice, but the resulting measurements are often
via either a transformer or optical coupling mechanism, as
impaired by noise and other effects. This is illustrated
shown in Figure 2.13. In this case, the oscilloscope remains
in Figure 2.14a, which shows a floated oscilloscope
grounded, as it should, and the differential signal is applied to
measurement of one of the gate-to-emitter voltages on
the tip and reference lead of the isolated probe. The isolator
the motor drive unit. The bottom trace in Figure 2.14a
transmits the differential signal through the isolator to a
is the low-side gate-emitter voltage and the top trace is
receiver, which produces a ground-referenced signal that is
the high-side voltage. Notice the significant ringing on
proportional to the differential input signal. This makes the
both of these traces. This ringing is due to the large
probe isolator compatible with virtually any instrument.
parasitic capacitance from the oscilloscopes chassis to
To meet different needs, various types of isolators are earth ground.
available. These include multi-channel isolators that provide
Figure 2.14b shows the results of the same measure-
two or more channels with independent reference leads.
ment, but this time made with the oscilloscope properly
Also, fiber-optic based isolators are available for cases where
grounded and the measurement made through a probe
the isolator needs to be physically separated from the instru-
isolator. Not only has the ringing been eliminated from
ment by long distances (e.g. 100 meters or more). As with
the measurement, but the measurement can be made
differential probes, the key isolator selection criteria are
in far greater safety because the oscilloscope is no
bandwidth and CMRR. Additionally, maximum working volt-
longer floating above ground.
age is a key specification for isolation systems. Typically, this
is 600 V RMS or 850 V (DC+peak AC).
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Figure 2.15. A typical general-purpose voltage probe with its standard accessories.
Probe Accessories
Most probes come with a package of standard accessories. Figure 2.16. Some examples of probe tip adapters for small geometry probes.
These accessories often include a ground lead clip that Such adapters make probing of small circuitry significantly easier and can enhance
measurment accuracy by providing high integrity probe to test point connections.
attaches to the probe, a compensation adjustment tool, and
one or more probe tip accessories to aid in attaching the
probe to various test points. Figure 2.15 shows an example When selecting probes for purchase, its also important to
of a typical general purpose voltage probe and its standard take into account the type of circuitry that youll be probing
accessories. and any adaptors or accessories that will make probing
quicker and easier. In many cases, less expensive commodity
Probes that are designed for specific application areas, such
probes dont provide a selection of adaptor options. On the
as probing surface mount devices, may include additional
other hand, probes obtained through an oscilloscope manu-
probe tip adapters in their standard accessories package.
facturer often have an extremely broad selection of acces-
Also, various special purpose accessories may be available
sories for adapting the probe to special needs. An example
as options for the probe. Figure 2.16 illustrates several types
of this is shown in Figure 2.17, which illustrates the variety
of probe tip adaptors designed for use with small geometry
of accessories and options available for a particular class of
probes.
probes. These accessories and options will, of course, vary
Its important to realize that most probe accessories, espe- between different probe classes and models.
cially probe tip adaptors, are designed to work with specific
probe models. Switching adaptors between probe models or
probe manufacturers is not recommended since it can result
in poor connection to the test point or damage to either the
probe or probe adaptor.
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ABCs of Probes
Figure 2.17. An example of the various accessories that are available for a 5-mm (miniature) probe system. Other probe families will have differing accessories depending on the
intended application for that family of probes.
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A Guide to Probe Selection Additionally, the probe selection process should include
consideration of your measurement needs. What are you
The preceding chapters have covered a wide range of trying to measure? Voltages? Current? An optical signal?
topics regarding oscilloscope probes in terms of how probes By selecting a probe that is appropriate to your signal type,
function, the various types of probes, and their effects on you can get direct measurement results faster.
measurements. For the most part, the focus has been on
what happens when you connect a probe to a test point. Also, consider the amplitudes of the signals you are measur-
ing. Are they within the dynamic range of your oscilloscope?
In this chapter, the focus changes to the signal source and If not, youll need to select a probe that can adjust dynamic
how to translate its properties into criteria for appropriate range. Generally, this will be through attenuation with a
probe selection. 10X or higher probe.
The goal, as always, is to select the probe that Make sure that the bandwidth, or rise time, at the probe tip
delivers the best representation of the signal to exceeds the signal frequencies or rise times that you plan
to measure. Always keep in mind that non-sinusoidal signals
the oscilloscope. However, it doesnt stop there.
have important frequency components or harmonics that
The oscilloscope imposes certain requirements extend well above the fundamental frequency of the signal.
that must also be considered as part of the For example, to fully include the 5th harmonic of a 100 MHz
probe selection process. square wave, you need a measurement system with a
bandwidth of 500 MHz at the probe tip. Similarly, your
This chapter explores the various selection requirements,
oscilloscope systems rise time should be three to five times
beginning with understanding the requirements imposed by
faster than the signal rise times that you plan to measure.
the signal source.
And always take into account possible signal loading by the
Choosing the Right Probe probe. Look for high-resistance, low-capacitance probes. For
Because of the wide range of oscilloscope measurement most applications, a 10 M probe with 20 pF or less capaci-
applications and needs, theres also a broad selection of tance should provide ample insurance against signal source
oscilloscope probes on the market. This can make probe loading. However, for some high-speed digital circuits you
selection a confusing process. may need to move to the lower tip capacitance offered by
active probes.
To cut through much of the confusion and narrow the selec-
tion process, always follow the oscilloscope manufacturers And finally, keep in mind that you must be able to attach
recommendations for probes. This is important because the probe to the circuit before you can make a measurement.
different oscilloscopes are designed for different bandwidth, This may require special selection considerations about
rise time, sensitivity, and input impedance considerations. probe head size and probe tip adaptors to allow easy and
Taking full advantage of the oscilloscopes measurement convenient circuit attachment.
capabilities requires a probe that matches the oscilloscopes
design considerations.
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Signal Type
Figure 3.1. Various probe categories based on the signal type to be measured.
Understanding the Signal Source Voltage signals are the most commonly encountered signal
type in electronic measurements. That accounts for the
There are four fundamental signal source issues to be
voltage-sensing probe as being the most common type of
considered in selecting a probe. These are the signal type,
oscilloscope probe. Also, it should be noted that, since
the signal frequency content, the source impedance, and the
oscilloscopes require a voltage signal at their input, other
physical attributes of the test point. Each of these issues is
types of oscilloscope probes are, in essence, transducers
covered in the following discussion.
that convert the sensed phenomenon to a corresponding
Signal Type voltage signal. A common example of this is the current
probe, which transforms a current signal into a voltage
The first step in probe selection is to assess the type
signal for viewing on an oscilloscope.
of signal to be probed. For this purpose, signals can be
categorized as being: Logic signals are actually a special category of voltage
signals. While a logic signal can be viewed with a standard
Voltage Signals
voltage probe, its more often the case that a specific logic
Current Signals event needs to be viewed. This can be done by setting a
Logic Signals logic probe to provide a trigger signal to the oscilloscope
Other Signals when a specified logic combination occurs.
This allows specific logic events to be viewed on the
oscilloscope display.
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It should also be noted that probe tip capacitance can also The size of the test point can also impact probe selection.
limit signal transition rise times. However, this has to do with Standard size probes and accessories are fine for probing
signal source impedance and signal source loading, which connector pins, resistor leads, and back planes. However,
are the next topics of discussion. for probing surface mount circuitry, smaller probes with
accessories designed for surface mount applications are
Signal Source Impedance recommended.
The discussion of source impedance can be distilled down to The goal is to select probe sizes, geometries, and acces-
the following key points: sories that best fit your particular application. This allows
1. The probes impedance combines with the signal source quick, easy, and solid connection of probes to test points
impedance to create a new signal load impedance that for reliable measurements.
has some effect on signal amplitude and signal rise times.
Understanding the Oscilloscope
2. When the probe impedance is substantially greater than
the signal source impedance, the effect of the probe on Oscilloscope issues have as much bearing on probe
signal amplitude is negligible. selection as signal source issues. If the probe doesnt
match the oscilloscope, signal fidelity will be impaired at
3. Probe tip capacitance, also referred to as input capaci- the oscilloscope end of the probe.
tance, has the effect of stretching a signals rise time.
This is due to the time required to charge the input Bandwidth and Rise Time
capacitance of the probe from the 10% to 90% level, Its important to realize that the oscilloscope and its
which is given by: probes act together as a measurement system. Thus, the
tr = 2.2 x Rsource x Cprobe oscilloscope used should have bandwidth and rise time
specifications that equal or exceed those of the probe used
From the above points, its clear that high-impedance,
and that are adequate for the signals to be examined.
low-capacitance probes are the best choice for minimizing
probe loading of the signal source. Also, probe loading In general, the bandwidth and rise time interactions between
effects can be further minimized by selecting low-impedance probes and oscilloscopes are complex. Because of this
signal test points whenever possible. Refer to the section complexity, most oscilloscope manufacturers specify
titled Different Probes for Different Needs for more detail oscilloscope bandwidth and rise time to the probe tip for
regarding signal source impedance and the effects of its specific probe models designed for use with specific
interaction with probe impedance. oscilloscopes. To ensure adequate oscilloscope system
bandwidth and rise time for the signals that you plan to
Physical Connection Considerations examine, its best to follow the oscilloscope manufacturers
The location and geometry of signal test points can also be probe recommendations.
a key consideration in probe selection. Is it enough to just
touch the probe to the test point and observe the signal on Input Resistance and Capacitance
the oscilloscope, or will it be necessary to leave the probe All oscilloscopes have input resistance and input capacitance.
attached to the test point for signal monitoring while making For maximum signal transfer the input R and C of the oscillo-
various circuit adjustments? For the former situation, a scope must match the R and C presented by the probes
needle-style probe tip is appropriate, while the latter situation output as follows:
requires some kind of retractable hook tip. RscopeCscope = RprobeCprobe = Optimum Signal Transfer
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Figure 4.1. The signal being measured at the test point (TP) can be represented by Figure 4.2. The higher the source impedances, the greater the loading caused by
a signal source and associated load impedances (a). Probing the test point adds probing. In this case, the impedances are all equal and probing causes a more than
the probe and oscilloscope impedances to the source load, resulting in some current 30% reduction in signal amplitude at the test point.
draw by the measurement system (b).
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Capacitive Loading
As signal frequencies or transition speeds increase, the
capacitive element of the impedances becomes predominate. a.
Consequently, capacitive loading becomes a matter of
increasing concern. In particular, capacitive loading will affect
the rise and fall times on fast-transition waveforms and the
amplitudes of high-frequency components in waveforms.
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Where smaller tip capacitance is needed, active FET-input Figure 4.6 shows another example of a probe curve. In
probes should be used. Depending on the specific active this case Rp and Xp versus frequency are shown for a typical
probe model, tip capacitances of 1 pF and less are available. 10 M passive probe. The dotted line (Xp) shows capacitive
reactance versus frequency. Notice that Xp begins decreasing
Effect on Amplitude and Phase at DC, but Rp doesnt start rolling off significantly until
In addition to affecting rise time, capacitive loading also 100 kHz. Again, the total loading has been offset by careful
affects the amplitude and phase of the high-frequency com- design of the associated R, C, and L elements.
ponents in a waveform. With regard to this, it is important to If you dont have access to a probes impedance curves,
keep in mind that all waveforms are composed of sinusoidal you can make a worst-case loading estimate using the
components. A 50 MHz square wave will have harmonic following formula:
components of significance beyond 100 MHz. Thus, its
Xp = 1/2 fC
important to not only consider loading effects at a waveforms
fundamental frequency but also at frequencies several multi- where:
ples above the fundamental. Xp = capacitive reactance
Loading is determined by the total impedance at the probe f = frequency
tip. This is designated as Zp, and Zp is composed of a
C = probe tip capacitance
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Bandwidth Considerations
Bandwidth is a measurement system issue that involves
both the bandwidth of the probe and the oscilloscope. The
oscilloscopes bandwidth should exceed the predominate
frequencies of the signals you want to measure, and the
bandwidth of the probe used should equal or exceed the
bandwidth of the oscilloscope. Figure 4.8. Bandwidth derating curve.
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a. b. c.
Figure 4.9. Effects on rise time of three different probes: (a) 400 MHz, 10X probe, (b) 100 MHz, 10X probe, and (c) 10 MHz, 1X probe. All measurements were made with the
same 400 MHz oscilloscope.
When rise time or fall time are the measurements of primary As a rule, probe bandwidth should always equal or exceed
interest, you can convert an oscilloscopes bandwidth (BW) the bandwidth of the oscilloscope that it will be used with.
specification to a rise time specification with the following Using a probe of lesser bandwidth will limit the oscilloscope
formula: to less than its full measurement capability. This is illustrated
further in Figure 4.9, which shows the same pulse transition
Tr 0.35/BW
being measured with three probes of different bandwidths.
or, for convenience:
The first measurement, shown in Figure 4.9a, was made
Tr (nanoseconds) 350/BW (MHz) using a matched 400 MHz oscilloscope and probe combina-
As with bandwidth, you should select an oscilloscope with tion. The probe used was a 10X probe with 10 M resist-
a rise time thats three to five time greater than the fastest ance and 14.1 pF capacitance. Note that the pulse rise time
rise time that you expect to measure. (It should be noted was measured as 4.63 ns. This is well within the 875 ps rise
that the above bandwidth to rise time conversion assumes time range of the 400 MHz oscilloscope/probe combination.
that the oscilloscopes response has a Gaussian roll-off. Now look what happens when a 10X, 100 MHz probe is used
Most oscilloscopes are designed to have a Gaussian roll-off.) to measure the same pulse with the same oscilloscope. This
is shown in Figure 4.9b, where the measured rise time is now
Probe Bandwidth
5.97 ns. Thats nearly a 30% increase over the previous
All probes, like other electronic circuits, have a bandwidth measurement of 4.63 ns!
limit. And, like oscilloscopes, probes are typically ranked or
As would be expected, the pulses observed rise time
specified by their bandwidth. Thus, a probe with a 100 MHz
becomes even longer with a lower bandwidth probe. An
bandwidth will have an amplitude response that is 3 dB down
extreme case is shown in Figure 4.9c, where a 1X, 10 MHz
at the 100 MHz point.
probe was used on the same pulse. Here the rise time has
Similarly, probe bandwidth can also be expressed in terms slowed from the original 4.63 ns to 27 ns.
of rise time by the same formula used for oscilloscopes
The key point made by Figure 4.9 is:
(Tr 0.35/BW). Also, for active probes, the oscilloscope and
Just any probe will not do!
probe rise times can be combined by the following formula to
obtain an approximate probe/oscilloscope system rise time: To get maximum performance from any oscilloscope the
performance that you paid for be sure to use the manufac-
Trsystem2 Trprobe2 + Trscope2
turers recommended probes.
For passive probes, the relationship is more complex, and the
above formula should not be used.
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Figure 4.12. Equivalent circuit of a typical passive probe connected to a signal source.
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ABCs of Probes
a. 6.5-inch probe ground clip. b. 28-inch probe ground tip. c. 28-inch clip to oscilloscope chassis.
Figure 4.13. Ground lead length and placement can dramatically affect measurements.
If you see ringing on a pulse display, try shortening the In Figure 4.13b, the same pulse transition is acquired.
length of your ground lead. A shorter ground lead has less This time, however, the probes standard ground lead was
inductance and will cause a higher frequency ringing. If you extended with a 28-inch clip lead. This ground lead extension
see the ringing frequency change on the pulse display, youll might be done, for example, to avoid having to move the
know that its ground-lead related. Shortening the ground ground clip each time different points are probed in a large
lead further should move the ring frequency beyond the system. Unfortunately, this practice lengthens the ground
bandwidth of the oscilloscope, thereby minimizing its effect loop and can cause severe ringing, as shown.
on your measurements. If the ringing doesnt change when
Figure 4.13c shows the results of another variation of length-
you change ground-lead length, then the ringing is likely
ening the ground loop. In this case, the probes ground lead
being induced in the circuit under test.
wasnt connected at all. Instead, a separate, 28-inch clip lead
Figure 4.13 illustrates ground lead induced ringing further. was run from the circuit common to the oscilloscope chassis.
In Figure 4.13a, a matched oscilloscope/probe combination This created a different, and apparently longer, ground loop,
was used to acquire a fast transition. The ground lead used resulting in the lower frequency ringing seen.
was the standard 6.5-inch probe ground clip, and it was
From the examples in Figure 4.13, its clear that grounding
attached to a common near the test point.
practices have tremendous impact on measurement quality.
Specifically, probe ground leads need to be kept as short
and direct as possible.
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What to do About Probing Effects The following summarizes some of the probe loading
considerations to be aware of:
From the preceding examples and discussion, weve seen
that the signal source impedance, the probe, and the oscillo- Passive Probes
scope form an interactive system. For optimum measurement
1X passive probes typically have a lower resistance and
results, you need to do everything possible to minimize the
higher capacitance than 10X passive probes. As a result,
oscilloscope/probe affects on the signal source.
1X probes are more prone to cause loading, and whenever
The following general rules apply: possible 10X probes should be used for general-purpose
Always match your oscilloscope and probes according probing.
to the oscilloscope manufacturers recommendations.
Voltage Divider (Zo) Probes
Make sure that your oscilloscope/probe has adequate
bandwidth or rise time capabilities for the signal These probes have very low tip capacitance, but at the
youre trying to measure. Typically, you should select expense of relatively high resistive loading. Theyre intended
a oscilloscope/probe combination with a rise time for use where impedance matching is required in 50 envi-
specification thats three to five times faster than the ronments. However, because of their very high bandwidth/rise
fastest rise time you plan to measure. time capabilities, voltage divider probes are often used in
other environments for high-speed timing measurements. For
Always keep your probe ground leads as short and amplitude measurements, the effect of the probes low input
direct as possible. Excessive ground loops can cause R should be taken into account.
ringing on pulses.
Select the probes that best match your applications Bias-offset Probes
needs in terms of both measurement capabilities and A bias-offset probe is a special type of voltage divider probe
mechanical attachment to test points. with the capability of providing a variable offset voltage at the
And finally, always be aware of the possible probe loading probe tip. These probes are useful for probing high-speed
effects on the circuit being probed. In many cases, loading ECL circuitry, where resistive loading could upset the circuits
can be controlled or minimized through probe selection. operating point.
Active Probes
Active probes can provide the best of both worlds with very
low resistive loading and very low tip capacitance. The trade-
off is that active probes typically have a low dynamic range.
However, if your measurements fit within the range of an
active probe, this can be the best choice in many cases.
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system with a bandwidth performance that is something Probe tip capacitance is important because it affects how
less than 100 MHz. To avoid the uncertainty of overall system pulses are measured. A low tip capacitance minimizes errors
bandwidth performance, Tektronix specifies its passive in making rise time measurements. Also, if a pulses duration
voltage probes to provide a specified measurement system is less than five times the probes RC time constant, the
bandwidth at the probe tip when used with the designated amplitude of the pulse is affected.
oscilloscope models.
Probes also present a capacitance to the input of the
In selecting oscilloscopes and oscilloscope probes, its oscilloscope, and this probe capacitance should match
important to realize that bandwidth has several implications that of the oscilloscope. For 10X and 100X probes, this
for measurement accuracy. capacitance is referred to as a compensation range, which
is different than tip capacitance. For probe matching, the
In terms of amplitude measurements, a sine waves amplitude
oscilloscopes input capacitance should be within the
becomes increasingly attenuated as the sine wave frequency
compensation range of the probe.
approaches the bandwidth limit. At the bandwidth limit, the
sine waves amplitude will be measured as being 70.7% of its CMRR (differential probes)
actual amplitude. Thus, for greater amplitude measurement
accuracy, its necessary to select oscilloscopes and probes Common-mode rejection ratio (CMRR) is a differential probes
with bandwidths several times greater than the highest ability to reject any signal that is common to both test points
frequency waveform that you plan to measure. in a differential measurement. CMRR is a key figure of merit
for differential probes and amplifiers, and it is defined by:
The same holds true for measuring waveform rise and fall
times. Waveform transitions, such as pulse and square CMRR = |Ad/Ac|
wave edges, are made up of high-frequency components. where:
Attenuation of these high-frequency components by a band-
Ad = the voltage gain for the difference signal
width limit results in the transition appearing slower than
it really is. For accurate rise and fall time measurements, Ac = the voltage gain for common-mode signal
its necessary to use a measurement system with adequate Ideally, Ad should be large, while Ac should equalize to zero,
bandwidth to preserve the high frequencies that make up resulting in an infinite CMRR. In practice, a CMRR of
the waveforms rise and fall times. This is most often stated 10,000:1 is considered quite good. What this means is
in terms of a measurement system rise time, which should that a common-mode input signal of 5 volts will be rejected
typically be four to five times faster than the rise times that to the point where it appears as 0.5 millivolts at the output.
you are trying to measure. Such rejection is important for measuring difference signals
in the presence of noise.
Capacitance (universal)
Since CMRR decreases with increasing frequency, the
Generally, probe capacitance specifications refer to the
frequency at which CMRR is specified is as important as
capacitance at the probe tip. This is the capacitance that the
the CMRR value. A differential probe with a high CMRR
probe adds to the circuit test point or device under test.
at a high frequency is better than a differential probe with
the same CMRR at a lower frequency.
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Usually, the most significant shift is caused by the probe Temperature Range (universal)
cable. For example, a 42-inch section of special probe cable
Current probes have a maximum operating temperature thats
has a 5 ns signal delay. For a 1 MHz signal, the 5 ns delay
the result of heating effects from energy induced into the
results in a two-degree phase shift. A longer cable results in
coils magnetic shielding. Increasing temperature corresponds
correspondingly longer signal delays.
to increased losses. Because of this, current probes have a
Propagation delay is usually only a concern when compara- maximum amplitude versus frequency derating curve.
tive measurements are being made between two or more
Attenuator voltage probes (i.e., 10X, 100X, etc.) may be
waveforms. For example, when measuring time differences
subject to accuracy changes due to changes in temperature.
between two waveforms, the waveforms should be acquired
using matched probes so that each signal experiences the Threshold Voltage (logic)
same propagation delay through the probes.
A logic probe measures and analyzes signals differently than
Another example would be making power measurements by other oscilloscope probes. The logic probe doesn't measure
using a voltage probe and a current probe in combination. analog details. Instead, it detects logic threshold levels. When
Since voltage and current probes are of markedly different you connect a mixed signal oscilloscope to a digital circuit
construction, they will have different propagation delays. using a logic probe, you're only concerned with the logic
Whether or not these delays will have an effect on the power state of the signal. At this point there are just two logic levels
measurement depends on the frequencies of the waveforms of concern. When the input is above the threshold voltage
being measured. For Hz and kHz signals, the delay differ- (Vth) the level is said to be high or 1; conversely, the level
ences will generally be insignificant. However, for MHz signals below Vth is a low or 0. When input is sampled, the mixed
the delay differences may have a noticeable effect. signal oscilloscope stores a 1 or a 0 depending on the
level of the signal relative to the voltage threshold.
Rise Time (universal)
The large number of signals that can be captured at one time
A probes 10 to 90% response to a step function indicates
by the logic probe is what sets it apart from the other oscillo-
the fastest transition that the probe can transmit from
scope probes. These digital acquisition probes connect to
tip to oscilloscope input. For accurate rise and fall time
the device under test and the probe's internal comparator is
measurements on pulses, the measurement systems rise
where the input voltage is compared against the threshold
time (oscilloscope and probe combined) should be three to
voltage (Vth), and where the decision about the signal's logic
five times faster than the fastest transition to be measured.
state (1 or 0) is made. The threshold value is set by the user,
Tangential Noise (active probes) ranging from TTL levels to, CMOS, ECL, and user-definable.
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Figure 6.3. The 1 ns rise time step waveform as acquired through an ECB to probe-tip
adaptor.
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Power
Supply
Figure 6.4.. Examples of ground lead effects for passive probes versus active probes.
Effects on the waveform of 1/2-inch, 6-inch, and 12-inch ground leads used on a pas-
sive probe (a). Same waveform acquired using the same ground leads, but with an
active FET probe (b).
Figure 6.5. The complete ground circuit, or ground loop, for an oscilloscope, probe,
and test circuit on two different power plugs.
When youre faced with measuring fast waveforms where an
ECB to probe-tip adaptor hasnt been installed, remember to
Ground Loop Noise Injection
keep the probe ground lead as short as possible. In many
cases, this can be done by using special probe tip adaptors Noise injection into the grounding system can be caused by
with integral grounding tips. Yet another alternative is to use unwanted current flow in the ground loop existing between
an active FET probe. FET probes, because of their high input the oscilloscope common and test circuit power line grounds
impedance and extremely low tip capacitance (often less and the probe ground lead and cable. Normally, all of these
than 1 pF), can eliminate many of the ground lead problems points are, or should be, at zero volts, and no ground current
often experienced with passive probes. This is illustrated will flow. However, if the oscilloscope and test circuit are on
further in Figure 6.4. different building system grounds, there could be small
voltage differences or noise on one of the building ground
Ground Lead Noise Problems systems (see Figure 6.5). The resulting current flow will devel-
Noise is another type of signal distortion that can appear on op a voltage drop across the probes outer cable shield. This
oscilloscope waveform displays. As with ringing and aberra- noise voltage will be injected into the oscilloscope in series
tions, noise might actually be part of the signal at the probe with the signal from the probe tip. The result is that youll see
tip, or it might appear on the signal as a result of improper noise riding on the signal of interest, or the signal of interest
grounding techniques. The difference is that the noise is may be riding on noise.
generally from an external source and its appearance is not a With ground loop noise injection, the noise is often line
function of the speed of the signal being observed. In other frequency noise (50 or 60 Hz). Just as often, though, the
words, poor grounding can result in noise appearing on any noise may be in the form of spikes or bursts resulting from
signal of any speed. building equipment, such as air conditioners, switching on
There are two primary mechanisms by which noise can be and off.
impressed on signals as a result of probing. One is by ground There are various things that can be done to avoid or
loop noise injection. The other is by inductive pickup through minimize ground loop noise problems. The first approach
the probe cable or probe ground lead. Both mechanisms are is to minimize ground loops by using the same power circuits
are discussed as follows. for the oscilloscope and circuit under test. Additionally, the
probes and their cables should be kept away from sources of
potential interference. In particular, dont allow probe cables
to lie alongside or across equipment power cables.
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+
+
AV VO
+
Differential TP1
Mode +175 V
VDM
+
Common TP2 (Vs)
Mode VO = AV VDM
VCM
Figure 6.7. A differential amplifier has two signal lines which are differenced into a
single signal that is referenced to the ground.
Differential Measurements
Strictly speaking, all measurements are differential measure-
ments. A standard oscilloscope measurement where the
175 V
probe is attached to a signal point and the probe ground
+175 V +7 V
lead is attached to circuit ground is actually a measurement VTP2 VGS (TP1-TP2)
of the signal difference between the test point and ground. 175 V 7 V
In that sense, there are two signal lines the ground signal
Figure 6.8. Differential amplifier used to measure gate to source voltage of upper
line and the test signal line. transistor in an inverter bridge. Note that the source potential changes 350 volts
during the measurement.
In practice, however, differential measurements refers to the
measurement of two signal lines, both of which are above
where:
ground. This requires use of some sort of differential amplifier
so that the two signal lines (the double-ended signal source) Av = the amplifiers gain
can be algebraically summed into one signal line reference Vo = the output signal referenced to earth ground
to ground (single-ended signal) for input to the oscilloscope,
The voltage of interest, or difference signal, is referred to
as shown in Figure 6.7. The differential amplifier can be a
as the differential voltage or differential mode signal and is
special amplifier that is part of the probing system, or if the
expressed as:
oscilloscope allows waveform math, each signal line can be
acquired on separate oscilloscope channels and the two VDM
channels algebraically summed. In either case, rejection of where:
the common-mode signal is a key concern in differential
measurement quality. VDM = the V+in V-in term in the equation above
Notice that the common mode voltage, VCM, is not part
Understanding Difference and Common-mode Signals
of the above equation. Thats because the ideal differential
An ideal differential amplifier amplifies the difference signal, amplifier rejects all of the common-mode component,
VDM, between its two inputs and completely rejects any regardless of its amplitude or frequency.
voltage which is common to both inputs, VCM. The result
Figure 6.8 provides an example of using a differential amplifier
is an output voltage given by:
to measure the gate drive of the upper MOSFET device in
Vo Av (V+in - V-in) an inverter circuit. As the MOSFET switches on and off, the
source voltage swings from the positive supply rail to the
negative rail. A transformer allows the gate signal to be
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+175 V +
Figure 6.11. With the input leads twisted together, the loop area is very small, hence
less field passes through it. Any induced voltage tends to be inthe VCM path which is
rejected by the differential amplifier.
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This provides a return path for any currents induced into the
shield, but doesnt create a ground loop which may upset
the measurement or the device-under-test.
At higher frequencies, the probe input capacitance, along
with the lead inductance, forms a series resonant tank cir-
cuit which may ring. In single-ended measurements, this
effect can be minimized by using the shortest possible
ground lead. This lowers the inductance, effectively moving a. b.
the resonating frequency higher, hopefully beyond the band- Figure 6.12a and Figure 6.12b. A noisy signal (a) can be cleaned up by a signal
width of the amplifier. Differential measurements are made averaging (b).
between two probe tips, and the concept of ground does not
enter into the measurement. However, if the ring is generated
from a fast rise of the common-mode component, using a Noise Reduction
short ground lead reduces the inductance in the resonant Ambient noise levels that would be considered negligible
circuit, thus reducing the ring component. In some situations, when measuring signals of a few hundred millivolts or more
a ring resulting from fast differential signals may also be are no longer negligible when measuring signals of tens of
reduced by attaching the ground lead. This is the case if the millivolts or less. Consequently, minimizing ground loops
common-mode source has very low impedance to ground at and keeping ground leads short are imperatives for reducing
high frequencies, i.e. is bypassed with capacitors. If this isnt noise pick up by the measurement system. At the extreme,
the case, attaching the ground lead may make the situation power-line filters and a shielded room may be necessary for
worse! If this happens, try grounding the probes together at noise-free measurement of very low amplitude signals.
the input ends. This lowers the effective inductance through
However, before resorting to extremes, you should consider
the shield.
signal averaging as a simple and inexpensive solution to
Of course, connecting the probe ground to the circuit may noise problems. If the signal youre trying to measure is repet-
generate a ground loop. This usually doesnt cause a itive and the noise that youre trying to eliminate is random,
problem when measuring higher-frequency signals. The signal averaging can provide extraordinary improvements in
best advice when measuring high frequencies is to try making the SNR (signal-to-noise ratio) of the acquired signal. An
the measurement with and without the ground lead; then use example of this is shown in Figure 6.12.
the setup which gives the best results.
Signal averaging is a standard function of most digital
When connecting the probe ground lead to the circuit, oscilloscopes. It operates by summing multiple acquisitions of
remember to connect it to ground! Its easy to forget where the repetitive waveform and computing an average waveform
the ground connection is when using differential amplifiers from the multiple acquisitions. Since random noise has a
since they can probe anywhere in the circuit without the risk long-term average value of zero, the process of signal aver-
of damage. aging reduces random noise on the repetitive signal. The
amount of improvement is expressed in terms of SNR. Ideally,
Small Signal Measurements signal averaging improves SNR by 3 dB per power of two
Measuring low-amplitude signals presents a unique set of averages. Thus, averaging just two waveform acquisitions (21)
challenges. Foremost of these challenges are the problems provides up to 3 dB of SNR improvement, averaging four
of noise and adequate measurement sensitivity. acquisitions (22) provides 6 dB of improvement, eight aver-
ages (23) provides 9 dB of improvement, and so on.
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Increasing Measurement Sensitivity In cases where the small signal amplitude is below the oscillo-
scopes sensitivity range, some form of preamplification will
An oscilloscopes measurement sensitivity is a function of its
be necessary. Because of the noise susceptibility of the very
input circuitry. The input circuitry either amplifies or attenuates
small signals, differential preamplification is generally used.
the input signal for an amplitude calibrated display of the sig-
The differential preamplification offers the advantage of some
nal on the oscilloscope screen. The amount of amplification
noise immunity through common-mode rejection, and the
or attenuation needed for displaying a signal is selected via
advantage of amplifying the small signal so that it will be with-
the oscilloscopes vertical sensitivity setting, which is adjusted
in the sensitivity range of the oscilloscope.
in terms of volts per display division (V/div).
With differential preamplifiers designed for oscilloscope use,
In order to display and measure small signals, the oscillo-
sensitivities on the order of 10 V/div can be attained. These
scope input must have enough gain or sensitivity to provide
specially designed preamplifiers have features that allow use-
at least a few divisions of signal display height. For example,
able oscilloscope measurements on signals as small as 5 V,
to provide a two-division high display of a 20 mV p-to-p
even in high noise environments!
signal, the oscilloscope would require a vertical sensitivity
setting of 10 mV/div. For the same two-division display of Remember, though, taking full advantage of a differential
a 10 mV signal, the higher sensitivity setting of 5 mV/div preamplifier requires use of a matched set of high-quality
would be needed. Note that a low volts-per-division setting passive probes. Failing to use matched probes will defeat the
corresponds to high sensitivity and vice versa. common-mode noise rejection capabilities of the differential
preamplifier.
In addition to the requirement of adequate oscilloscope sensi-
tivity for measuring small signals, youll also need an ade- Also, in cases where you need to make single-ended rather
quate probe. Typically, this will not be the usual probe sup- than differential measurements, the negative signal probe can
plied as a standard accessory with most oscilloscopes. be attached to the test circuit ground. This, in essence, is a
Standard accessory probes are usually 10X probes, which differential measurement between the signal line and signal
reduce oscilloscope sensitivity by a factor of 10. In other ground. However, in doing this, you lose common-mode
words, a 5 mV/div oscilloscope setting becomes a 50 mV/div noise rejection since there will not be noise common to both
setting when a 10X probe is used. Consequently, to maintain the signal line and ground.
the highest signal measurement sensitivity of the oscilloscope, As a final note, always follow the manufacturers recommend-
youll need to use a non-attenuating 1X probe. ed procedures for attaching and using all probes and probe
However, as discussed in previous chapters, remember amplifiers. And, with active probes in particular, be extra cau-
that 1X passive probes have lower bandwidths, lower input tious about over-voltages that may damage voltage-sensitive
impedance, and generally higher tip capacitance. This means probe components.
that youll need to be extra cautious about the bandwidth limit
of the small signals youre measuring and the possibility of
signal source loading by the probe. If any of these appear to
be a problem, then a better approach is to take advantage of
the much higher bandwidths and lower loading typical of 1X
active probes.
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ABCs of Probes
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ABCs of Probes
attenuation The process whereby the amplitude of a signal differential signals Signals that are referenced to each
is reduced. other instead of earth ground.
attenuator probe A probe that effectively multiplies the distributed elements (L, R, C) Resistance and reactance
scale factor range of an oscilloscope by attenuating the that are spread out over the length of a conductor; distrib-
signal. For example, a 10X probe effectively multiplies the uted element values are typically small compared to lumped
oscilloscope display by a factor of 10. These probes achieve component values.
multiplication by attenuating the signal applied to the probe field-effect transistor (FET) A voltage-controlled device in
tip; thus, a 100 volt peak-to-peak signal is attenuated to which the voltage at the gate terminal controls the amount of
10 volts peak-to-peak by a 10X probe, and then is displayed current through the device.
on the oscilloscope as a 100 volts peak-to-peak signal floating measurements Measurements that are made
through 10X multiplication of the oscilloscopes scale factor. between two points, neither of which is at ground potential.
bandwidth (BW) The continuous band of frequencies that grounding Since probes must draw some current from
a network or circuit passes without diminishing power more the signal source in order for a measurement to be made,
than 3-dB from the mid-band power. there must be a return path for the current. This return path
capacitance An electrical phenomenon whereby an electric is provided by a probe ground lead that is attached to the
charge is stored. circuit ground or common.
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Hall Effect Generation of an electric potential perpendicular logic probe A device used to compare threshold voltage to
to both an electric current flowing along a conducting material determine logic state (1 or 0) for analysis on an oscilloscope
and an external magnetic field applied at right angles to the or mixed signal oscilloscope (MSO).
current upon application of the magnetic field. low-capacitance probe A passive probe that has very low
harmonics Square waves, sawtooth waveforms, and other input capacitance.
periodic non-sinusoidal waveforms contain frequency compo- MOSFET Metal-oxide semiconductor field-effect transistor,
nents that consist of the waveforms fundamental frequency one of two major types of FET.
(1/period) and frequencies that are integer multiples (1x, 2x,
noise A type of signal distortion that can appear on oscillo-
3x, ...) of the fundamental which are referred to as harmonic
scope waveform displays.
frequencies; the second harmonic of a waveform has a
frequency that is twice that of the fundamental, the third optical probe A device to sense light power and convert
harmonic frequency is three times the fundamental, and so to a corresponding voltage signal for measurement by an
on. oscilloscope.
impedance The process of impeding or restricting AC passive probe A probe whose network equivalent consists
signal flow. Impedance is expressed in Ohms and consists of only of resistive (R), inductive (L), or capacitive (C) elements; a
a resistive component (R) and a reactive component (X) that probe that contains no active components.
can be either capacitive (XC) or inductive (XL). Impedance (Z) is phase A means of expressing the time-related positions of
expressed in a complex form as: waveforms or waveform components relative to a reference
Z = R + jX point or waveform. For example, a cosine wave by definition
has zero phase, and a sine wave is a cosine wave with
or as a magnitude and phase, where the magnitude (M) is:
90-degrees of phase shift.
M = R2 + X2
and phase is
= arctan (X/R)
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ABCs of Probes
reactance An impedance element that reacts to an AC shielding The practice of placing a grounded conductive
signal by restricting its current flow based on the signals sheet of material between a circuit and external noise
frequency. A capacitor (C) presents a capacitive reactance sources so that the shielding material intercepts noise
to AC signals that is expressed in Ohms by the following signals and conducts them away from the circuit.
relationship: signal averaging Summing multiple acquisitions of the
XC = 1/2fC repetitive waveform and computing an average waveform
where: from the multiple acquisitions.
XC = capacitive reactance in Ohms signal fidelity The signal as it occurs at the probe tip is
duplicated at the oscilloscope input.
= 3.14159...
single-ended signals Signals that are referenced to
f = frequency in Hz
ground.
C = capacitance in Farads
SNR (signal-to-noise ratio) The ratio of signal amplitude
to noise amplitude; usually expressed in dB as follows:
An inductor (L) presents an inductive reactance to AC signals SNR = 20 log (Vsignal/Vnoise)
thats expressed in Ohms by the following relationship:
source The origination point or element of a signal voltage
XL = 2fL or current; also, one of the elements in a FET (field effect
where: transistor).
XL = inductive reactance in Ohms source impedance The impedance seen when looking
back into a source.
= 3.14159....
time domain reflectometry (TDR) A measurement
f = frequency in Hz
technique wherein a fast pulse is applied to a transmission
L = inductance in Henrys path and reflections of the pulse are analyzed to determine
readout Alphanumeric information displayed on an oscillo- the locations and types of discontinuities (faults or mis-
scope screen to provide waveform scaling information, meas- matches) in the transmission path.
urement results, or other information. trace ID When multiple waveform traces are displayed
ringing Oscillations that result when a circuit resonates; on an oscilloscope, a trace ID feature allows a particular
typically, the damped sinusoidal variations seen on pulses are waveform trace to be identified as coming from a particular
referred to as ringing. probe or oscilloscope channel. Momentarily pressing the
trace ID button on a probe causes the corresponding
waveform trace on the oscilloscope to momentarily change
in some manner as a means of identifying that trace.
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Copyright 2009, Tektronix. All rights reserved. Tektronix products are covered
by U.S. and foreign patents, issued and pending. Information in this publication
supersedes that in all previously published material. Specification and price
change privileges reserved. TEKTRONIX and TEK are registered trademarks
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trademarks or registered trademarks of their respective companies.
12/09 JS 60W-6053-11
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