BUZ80A Datasheet - Eeworld.com - CN

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BUZ80A

N - CHANNEL 800V - 2.5 - 3.8A - TO-220


FAST POWER MOS TRANSISTOR
TYPE
BUZ80A

V DSS

R DS(on)

ID

800 V

<3

3.8 A

TYPICAL RDS(on) = 2.5


30V GATE TO SOURCE VOLTAGE RATING
100% AVALANCHE TESTED
REPETITIVE AVALANCHE DATA AT 100oC
LOW INTRINSIC CAPACITANCES
GATE CHARGE MINIMIZED
REDUCED THRESHOLD VOLTAGE SPREAD

3
1

TO-220
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
SWITCH MODE POWER SUPPLIES (SMPS)
DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE
POWER SUPPLIES AND MOTOR DRIVE

INTERNAL SCHEMATIC DIAGRAM

ABSOLUTE MAXIMUM RATINGS


Symbol

Parameter

Value

Un it

BUZ80A
V DS
V DGR
V GS

Drain-source Voltage (V GS = 0)

800

Drain- gate Voltage (R GS = 20 k)

800

G ate-source Voltage

20

ID

Drain Current (continuous) at Tc = 25 C

3.8

ID

Drain Current (continuous) at Tc = 100 oC

2.3

I DM ()
P tot
V ISO
Ts tg
Tj

15

T otal Dissipation at Tc = 25 o C

Drain Current (pulsed)

100

Derating Factor

0.8

W /o C

Insulation W ithstand Voltage (DC)

Storage Temperature
Max. Operating Junction Temperature

-65 to 150

150

() Pulse width limited by safe operating area

November 1998

1/9

BUZ80A
THERMAL DATA
TO-220
R thj -case

Thermal Resistance Junction-case

Max

1.25

C/W

R thj -amb
R thc-sink
Tl

Thermal Resistance Junction-ambient


Max
Thermal Resistance Case-sink
Typ
Maximum Lead Temperature For Soldering Purpose

62.5
0.5
300

C/W
C/W
o
C

AVALANCHE CHARACTERISTICS
Symbo l

Max Valu e

Unit

IAR

Avalanche Current, Repetitive or Not-Repetitive


(pulse width limited by Tj max)

Parameter

3.8

E AS

Single Pulse Avalanche Energy


(starting Tj = 25 o C, I D = IAR , VDD = 50 V)

200

mJ

ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)


OFF
Symbo l
V (BR)DSS
I DSS
IGSS

Parameter
Drain-source
Breakdown Voltage

Test Con ditions


I D = 250 A

T yp.

Max.

800

V GS = 0

V DS = Max Rating
Zero G ate Voltage
Drain Current (V GS = 0) V DS = Max Rating x 0.8
Gate-body Leakage
Current (VDS = 0)

Min.

Unit
V

Tc = 100 C

V GS = 20 V

250
1000

A
A

100

nA

ON ()
Symbo l

Parameter

Test Con ditions


ID = 250 A

V GS(th)

Gate Threshold
Voltage

R DS(on)

Static Drain-source O n V GS = 10V ID = 1.7 A


Resistance
V GS = 10V ID = 1.7 A

I D(o n)

V DS = V GS

Min.

T yp.

Max.

Unit

2.5

3
6

Tc = 100o C
3.8

On State Drain Current V DS > ID(o n) x R DS(on )ma x


V GS = 10 V

DYNAMIC
Symbo l
g f s ()
C iss
C os s
C rss

2/9

Parameter

Test Con ditions

Forward
Transconductance

V DS > ID(o n) x R DS(on )ma x

Input Capacitance
Output Capacitance
Reverse T ransfer
Capacitance

V DS = 25 V

f = 1 MHz

Min.
I D = 1.7A

V GS = 0

T yp.

Max.

Unit
S

1100
150
35

pF
pF
pF

BUZ80A
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbo l
t d(on)
tr
(di/dt) on

Qg
Q gs
Q gd

T yp.

Max.

Unit

Turn-on Time
Rise Time

Parameter

V DD = 30 V ID = 2.3 A
V GS = 10 V
R G = 50
(see test circuit, figure 3)

Test Con ditions

65
150

90
200

ns
ns

Turn-on Current Slope

V DD = 600 V ID = 3.8 A
V GS = 10 V
R G = 50
(see test circuit, figure 5)

80

110

A/s

Total Gate Charge


Gate-Source Charge
Gate-Drain Charge

V DD = 400 V

55
8
26

70

nC
nC
nC

T yp.

Max.

Unit

110
140
150

145
190
200

ns
ns
ns

T yp.

Max.

Unit

3.8
15

A
A

ID = 5 A

Min.

V GS = 10 V

SWITCHING OFF
Symbo l
tr (Voff)
tf
tc

Parameter
Off-voltage Rise Time
Fall Time
Cross-over Time

Test Con ditions

Min.

V DD = 600 V ID = 3.8 A
R G = 50 V GS = 10 V
(see test circuit, figure 5)

SOURCE DRAIN DIODE


Symbo l

Parameter

Test Con ditions

ISD
I SDM ()

Source-drain Current
Source-drain Current
(pulsed)

V SD ()

Forward On Voltage

I SD = 4 A

Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current

I SD = 4 A di/dt = 100 A/s


o
T j = 150 C
V DD = 100 V
(see test circuit, figure 5)

t rr
Q rr
I RRM

Min.

V GS = 0
500

ns

4.3

17

() Pulsed: Pulse duration = 300 s, duty cycle 1.5 %


() Pulse width limited by safe operating area

Safe Operating Area

Thermal Impedance

3/9

BUZ80A
Derating Curve

Output Characteristics

Transfer Characteristics

Transconductance

Static Drain-source On Resistance

Gate Charge vs Gate-source Voltage

4/9

BUZ80A
Capacitance Variations

Normalized Gate Threshold Voltage vs


Temperature

Normalized On Resistance vs Temperature

Turn-on Current Slope

Turn-off Drain-source Voltage Slope

Cross-over Time

5/9

BUZ80A
Switching Safe Operating Area

Accidental Overload Area

Source-drain Diode Forward Characteristics

6/9

BUZ80A
Fig. 1: Unclamped Inductive Load Test Circuit

Fig. 2: Unclamped Inductive Waveform

Fig. 3: Switching Times Test Circuits For


Resistive Load

Fig. 4: Gate Charge test Circuit

Fig. 5: Test Circuit For Inductive Load Switching


And Diode Recovery Times

7/9

BUZ80A

TO-220 MECHANICAL DATA


mm

DIM.
MIN.

inch

TYP.

MAX.

MIN.

TYP.

MAX.

4.40

4.60

0.173

0.181

1.23

1.32

0.048

0.051

2.40

2.72

0.094

D1

0.107

1.27

0.050

0.49

0.70

0.019

0.027

0.61

0.88

0.024

0.034

F1

1.14

1.70

0.044

0.067

F2

1.14

1.70

0.044

0.067

4.95

5.15

0.194

0.203

G1

2.4

2.7

0.094

0.106

H2

10.0

10.40

0.393

0.409

14.0

0.511

L2

16.4

L4

0.645

13.0

0.551

2.65

2.95

0.104

0.116

L6

15.25

15.75

0.600

0.620

L7

6.2

6.6

0.244

0.260

L9

3.5

3.93

0.137

0.154

DIA.

3.75

3.85

0.147

0.151

D1

L5

H2

G1

F1

L2

F2

Dia.

L5

L9
L7
L6

8/9

L4

P011C

BUZ80A

Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics
1998 STMicroelectronics Printed in Italy All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
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9/9

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