7 - Thermal Effect of The Recloser - IEEE
7 - Thermal Effect of The Recloser - IEEE
7 - Thermal Effect of The Recloser - IEEE
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3 AUTHORS, INCLUDING:
Constantinos D. Halevidis
C.G. Karagiannopoulos
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I. INTRODUCTION
Manuscript received November 07, 2010; revised October 11, 2011; accepted
January 07, 2012. Date of publication February 22, 2012; date of current version
March 28, 2012. Paper no. TPWRD-00853-2010.
The authors are with the School of Electrical and Computer Engineering,
High Voltage and Electrical Measurements Laboratory, National Technical
University of Athens, Athens 15780, Greece (e-mail: [email protected];
[email protected]; [email protected]).
Digital Object Identifier 10.1109/TPWRD.2012.2183682
addressed. Power corporation practice and standards [6] approximate the temperature rise by aggregating the individual
short-circuit durations to calculate the conductor temperature
rise and do not take into account the effect of one tripping
operation to the subsequent operations. Namely, the increased
conductor resistance (due to their increased temperature due to
previous faults) through which the short-circuit currents of the
subsequent trip operations pass and, by extension, the increased
heat release as well as the cooling during the reclosing interval
are not taken into consideration.
The purpose of this paper is the development of a new method
for the calculation of the temperature rise of MV line conductors
protected by a recloser. The proposed method treats each short
circuit as a separate event, and the increased conductor resistivity due to the increased temperature is taken into account. The
cooling of the conductors during the reclosing interval is considered as well. In addition, a comparison of the results given by the
proposed method to the results of the method of the IEC 60865-1
standard is made. Furthermore, alterations to the time parameters of the recloser operation cycle are performed in order to
investigate its effect on the generated temperature rise. Finally,
the proposed method was compared to an exact numerical solution of the heating process.
II. PROPOSED METHOD
Many papers have been published on the thermal effects of
short circuits on cables and conductors [7][9]. However, the
temperature rise due to multiple consecutive short circuits has
not been addressed. Multiple short circuits are common on MV
lines protected by reclosers.
International standard IEC 60865-1 gives the equivalent
and the equivalent duration of multiple
thermal current
according to the following
temporally-close short circuits
relationships:
(1)
This approach does not take the increased conductor temperature into account and, consequently, the increased ohmic conductor resistance met by the th short circuit due to the previous
ones. Therefore, it can be concluded that the th short circuit
releases more heat per unit current. In addition, the cooling between each short circuit is not taken into account. These omissions create the need for a revised method for the calculation of
temperature rises caused by multiple short circuits.
HALEVIDIS et al.: THERMAL EFFECT OF THE RECLOSER OPERATION CYCLE ON BARE OVERHEAD CONDUCTORS
569
where
(5)
(4)
570
(6)
HALEVIDIS et al.: THERMAL EFFECT OF THE RECLOSER OPERATION CYCLE ON BARE OVERHEAD CONDUCTORS
571
Fig. 9. Temperature rise ratio between the constant method and proposed
method.
distances from the HV substation of less than 100 m, and for the
ACSR, it is 50 mm . For the rest of the line length, the ratio is
greater than unity. In addition, the ratio is greater than unity for
the larger conductors (95, and 199.4 mm ) for the entire length
of the line.
The constant resistivity method follows the methodology of
the proposed method without taking into account the increase
in resistivity. This method results in smaller temperature rises
compared to the proposed method for faults near the transmission transformer as the increased heat release per ampere
th) is neglected. However, for greater distances, it results
in greater temperature rises. This can be attributed to the greater
(10)
The results of the methods are shown in Figs. 1113. The
relative behavior of the methods is identical to the one exhibited in Figs. 57 (EI timecurrent curve). It should be noted that
for faults in the first 100 m, temperatures greater than 660 C
(melting point of aluminum) appear for the ACSR 50 mm and,
consequently, are not plotted in Fig. 11. In addition, the temperature rises significantly increase compared to the ones associated
with an EI recloser. Based on the aforementioned results, it can
be concluded that the use of an extremely inverse relay is suggested when the line is protected by means of a recloser.
The temperatures reached by ACSR conductors of 50 mm
equivalent copper cross section exceed the 180 C limit for aluminum strands. In addition, the repeated automated attempt of
572
Finally, the proposed method is compared to a numerical solution of the differential equation describing the heating time
evolution of the conductor due to the short-circuit current. The
is [8]
analytic equation of the short-circuit current
(11)
(12)
(13)
HALEVIDIS et al.: THERMAL EFFECT OF THE RECLOSER OPERATION CYCLE ON BARE OVERHEAD CONDUCTORS
573
Fig. 16. Temperature rise as a function of the equivalent thermal current density
for the numerical, IEC, and proposed methods (ACSR conductor of 50 mm
equivalent copper cross section, extremely inverse TCC).
TABLE I
CONDUCTOR CHARACTERISTICS
VI. CONCLUSION
s, significantly smaller than the one used for the solution of the
cooling equation. This was necessary due to the periodic component of the short-circuit current. The conductor resistance per
is updated in every time step. Thus, the nuunit length
merical method takes into account the increase of the conductor
ohmic resistance during the short-circuit event.
It should be noted that the solution of the differential equation describing the cooling time evolution (during the reclosing
intervals) is achieved as in the proposed method.
The results of the numerical method compared to the proposed method for the ACSR 50, and 95 mm conductors,
are shown in Figs. 14 and 15. The proposed method results
in greater temperature rises, compared to the results of the
numerical method, in the first 1.25 km, and 0.15 km from
the substation, and smaller rises further down the line, for the
ACSR 50 mm , and 95 mm conductors, respectively. In the
case of the ACSR 199.4 mm conductor, the numerical method
results in greater temperature rises for the entire line length.
The proposed method achieves good agreement with the
exact numerical method. In addition, the proposed method
overestimates the temperature rise, compared to the numerical
method, when the equivalent thermal current density is great
(i.e., when the conductor cross section is small and the fault is
close to the substation), erring on the side of caution (Fig. 16).
In this paper, a new method for the calculation of the temperature rise from multiple successive short circuits, to which
bare overhead conductors are subjected, was developed. This
method treats each short circuit as a separate event and takes into
account the cooling between successive short circuits. The proposed method, when compared to the IEC 60865 method, yields
greater temperature rises near the HV substation and smaller further away for the ACSR 50 mm conductor, and smaller temperature rises for the entire length of the line for the ACSR 95 and
199.4 mm conductors.
In addition, the effects of the recloser time parameters on the
temperature rise were studied. Namely, it was found that a moderately inverse timecurrent curve results in much greater temperature rise compared to an extremely inverse TCC. Also, the
reclosing interval was found to have a small effect on the temperature rise while the number of fast to delayed tripping operations can have a significant effect.
APPENDIX
The characteristics of the conductors used in the case study
are presented in Table I.
REFERENCES
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IEEE Trans. Power Del., vol. 25, no. 3, pp. 15471555, Jul. 2010.
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1013, 2009, pp. 110.
574
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2000.
Constantinos D. Halevidis (M10) was born in
Athens, Greece, in 1987. He is currently pursuing the
Ph.D. degree in electrical computer engineering at
the National Technical University of Athens, Athens.
His research interests are diverse, including topics
such as power transmission and distribution, highvoltage testing, electric contacts, and ELF fields.