Fischer Dualscope FMP10-20 Instruction Manual

Operators Manual
DELTASCOPE FMP10
ISOSCOPE FMP10
DUALSCOPE FMP20
Coating Thickness
Material Analysis
Microhardness
Material Testing
Order number:
901-093
Version 1.0
08/08
DELTASCOPE FMP10
ISOSCOPE FMP10
DUALSCOPE FMP20
Operators Manual
Non-destructive measurement on
magnetic and non-magnetic
metallic base materials
2008 Copyright by
Helmut Fischer GmbH
Institut fr Elektronik und Messtechnik, Sindelfingen.
All rights reserved. No part of this manual may be reproduced by any
means (print, photocopy, microfilm, or any other method) or processed,
multiplied or distributed by electronic means without the written consent
of Helmut Fischer GmbH Institut fr Elektronik und Messtechnik.
Operator's Manual FMP10 / FMP20
Seite 1
Table of Contents
1 Important Information . . . . . . . . . . . . . . . . . . . . . . . . . . 7
1.1
Trademarks and Liabilities . . . . . . . . . . . . . . . . . . . . . . . 7
1.2
Symbols and Conventions Used in the Manual . . . . . . . 7
1.3
Intended Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
1.4
General Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
1.5
Requirements on the Operating Personnel . . . . . . . . . . 8
1.6
Environmental Conditions . . . . . . . . . . . . . . . . . . . . . . . 9
1.7
Probe Handling
1.8
Handling, Storage and Transport of Calibration

Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.9
Instrument Repairs . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.10 Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2 Description of the Instrument . . . . . . . . . . . . . . . . . . 13

2.1
LCD Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2.2
Control panel key functions . . . . . . . . . . . . . . . . . . . . 16
2.3 Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.3.1 Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.3.2 Calibration Standards . . . . . . . . . . . . . . . . . . . . . . . . 20
2.4
Technical Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.5 Contents of Shipment and Options . . . . . . . . . . . . . . . 23

2.5.1 Standard Contents of Shipment of the Instrument . . . 23
2.5.2 Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3 Measurement Methods for Coating Thickness

Measurements 25
Seite 2
3.1
Magnetic Induction Method . . . . . . . . . . . . . . . . . . . . . 26
3.2
Eddy Current Method . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.3
Measurements With DUAL Probes
. . . . . . . . . . . . . . 26
4 System Setup, Maintenance and Cleaning . . . . . 27

4.1 Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
4.1.1 Installing or Replacing Batteries . . . . . . . . . . . . . . . . 28
4.2
Connecting Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
4.3 Turning the Instrument On/Off . . . . . . . . . . . . . . . . . . 33

4.3.1 Measurement Method of the Connected Probe . . . . 33
4.3.2 Power Up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
4.3.3 Measuring Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
4.3.4 Turning Off the Instrument . . . . . . . . . . . . . . . . . . . . 35
4.4
Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
5 Probe Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
5.1
Handling During Measurements . . . . . . . . . . . . . . . . . 37
5.2
Assigning a New Probe
5.3
Setting Up the Dual Mode for DUAL Probes
. . . . . . . . . . . . . . . . . . . . . . 38
. . . . . . . 39
6 Normalization, Calibration and Master Calibration 41

6.1
Information Regarding Normalization, Calibration

and Master Calibration . . . . . . . . . . . . . . . . . . . . . . . . . 42
6.1.1 Recommended Number of Single Readings During
a Normalization, Calibration and Master Calibration . 43
6.2
Specific Features of DUAL Probes
6.3
Reference Measurements
. . . . . . . . . . . . . . 44
. . . . . . . . . . . . . . . . . . . . . 44
6.4 Normalization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
6.4.1 Normalization Procedure . . . . . . . . . . . . . . . . . . . . . 45
6.5 Corrective calibration . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.5.1 Selecting the Calibration Standards for the
Corrective Calibration . . . . . . . . . . . . . . . . . . . . . . . . 47
6.5.2 Corrective Calibration Procedure . . . . . . . . . . . . . . . 48
6.5.3 Deleting a Corrective Calibration . . . . . . . . . . . . . . . . 52
6.6 Calibration on a Coating . . . . . . . . . . . . . . . . . . . . . . . 53
6.6.1 Procedure for a Calibration on Coating . . . . . . . . . . . 53
6.7 Master Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
6.7.1 Selecting the Calibration Standards . . . . . . . . . . . . . 58
6.7.2 Performing a User Master Calibration . . . . . . . . . . . . 58
6.7.3 Master Calibration Procedure . . . . . . . . . . . . . . . . . 59
Seite 3
6.7.4 Displaying Xn Ranges for Calibration Standards

for the Master Calibration . . . . . . . . . . . . . . . . . . . . 63
6.8
Determination of the Normalized Countrate Xn of

a Calibration Standard During a Master Calibration
. 65
7 Measuring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
7.1
Preparing for a Measurement
. . . . . . . . . . . . . . . . . . 66
7.2
Influencing Parameters . . . . . . . . . . . . . . . . . . . . . . . . 66
7.3 Making a Measurement . . . . . . . . . . . . . . . . . . . . . . . 67

7.3.1 Measurement Acquisition . . . . . . . . . . . . . . . . . . . . 69
7.3.2 Measurements With External Start Enabled . . . . . . . 70
7.3.3 Automatic Measurements . . . . . . . . . . . . . . . . . . . . . 70
7.3.4 Audible signals After the Measurement Acquisition . 73
7.3.5 Display of the measurement method in use when
making measurements with dual probes . . . . . . . . . 73
7.4 Erroneous Readings . . . . . . . . . . . . . . . . . . . . . . . . . . 74
7.4.1 Deleting Erroneous Readings . . . . . . . . . . . . . . . . . 74
7.5 Measurements in the Free-Running Display Mode . . 74
7.5.1 Turning the Free-Running Display Mode On/Off . . . . 75
7.5.2 Procedure For Making Measurements in the
Free-Running Display Mode . . . . . . . . . . . . . . . . . . 76
7.5.3 Analog Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
7.5.4 Measurements In the Free-Running Display Mode
Using Dual Probes . . . . . . . . . . . . . . . . . . . . . . . . . . 78
8 Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
9 Data Transfer Using USB . . . . . . . . . . . . . . . . . . . . . 81
9.1
USB Connection to a PC
. . . . . . . . . . . . . . . . . . . . . . 82
9.2
Installing the USB Driver . . . . . . . . . . . . . . . . . . . . . . . 82
9.3 Transfer of the Measurement Data to the Computer . 83

9.3.1 Online Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
9.3.2 Offline Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
9.4 Transmission from the PC to the Instrument . . . . . . . . 84
9.4.1 Transfer Formats . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
9.4.2 Control Commands . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Seite 4
10 Instrument Settings in the Service Function Menu 86

10.1 Service Menu Overview . . . . . . . . . . . . . . . . . . . . . . . . 87
10.2 System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
10.2.1 Language . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
10.2.2 Contrast . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
10.2.3 Lighting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
10.2.4 Automatic Switch Off . . . . . . . . . . . . . . . . . . . . . . . . 92
10.2.5 Re-Initialization of the Instrument . . . . . . . . . . . . . . . 93
10.3 USB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
10.3.1 Send Free-Running Mode . . . . . . . . . . . . . . . . . . . . 94
10.4 Instrument Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
10.4.1 Restricted operating mode . . . . . . . . . . . . . . . . . . . . 95
10.4.2 Analog Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
10.5 Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
10.5.1 Audible Signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
10.5.2 Measurement Effect . . . . . . . . . . . . . . . . . . . . . . . . . 99
10.5.3 External Start . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
10.5.4 Measuring Mode - Standard/Area Measurement/
Automatic Measurement . . . . . . . . . . . . . . . . . . . . 102
10.5.5 Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
10.5.6 Dual Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
10.6 Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
10.7 Storage Mode
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
10.8 Performing a Master Calibration . . . . . . . . . . . . . . . . 107

10.9 About ... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
10.10 Documentation of the Instrument Configuration
. . . 108
11 Malfunctions and Messages . . . . . . . . . . . . . . . . . . 110

11.1 Malfunctions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
11.2 Messages on the LCD Display . . . . . . . . . . . . . . . . . 114
12 Glossary
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123
13 Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 149
Seite 5
Seite 6
Important Information
1.1
Trademarks and Liabilities
DUALSCOPE, DELTASCOPE and ISOSCOPE are registered trademarks of Helmut Fischer GmbH Institute for Electronics and Metrology.
The fact that the trademark characters and may be missing
does not indicate that a name is a free trademark.
Great care has been exercised in creating this operator's manual. The Helmut Fischer GmbH Institute for Electronics and Metrology assumes no liability for potentially remaining erroneous or incomplete statements and their results. We
would, however, appreciate if you can make us aware of potentially existing errors or incomplete information.
1.2
Symbols and Conventions Used in the Manual
The following symbols and conventions are used in this manual:

Indicates safety information referring to danger for persons and warnings regarding damage to the measuring
instrument or to accessories.
Indicates particularly important information and hints.
Indicates a reference to a page or chapter in this manual.
1.
Operation to be carried out by the operator at the instrument.
Listing.
ENTER
Writing convention for instrument keys and command buttons on the

display.
Page 7
1.3
Intended Use
The instrument is to be used for coating thickness measurements on steel and iron
base materials as well as on non-ferromagnetic, electrically conducting base materials.
Only accessories recommended and approved by Helmut Fischer GmbH ( beginning on Page 19) may be connected to this instrument.
1.4
General Information
The values shown for the measured coating thicknesses and the texts of
the information lines of the LCD display serve as examples for possible
displays. It is entirely possible that different values appear on the LCD
display or in the printout without having made any mistakes.
1.5
Requirements on the Operating Personnel

The instrument should be operated only by staff trained for
this purpose!
In addition, basic knowledge of metrology according to DIN 1319 is essential for

performing correct coating thickness measurements and evaluations.
Basic computer knowledge regarding configuration, operation and programing
as well as knowledge of the software in use, which may be obtained from respective instruction manuals, is required when using the instrument in conjunction
with a computer.
Page 8
Environmental Conditions
EMC
The instrument complies with the laws concerning electromagnetic compatibility
of instruments (2004/108/EC). The measured coating thickness values are not influenced by the highest level of interference mentioned in the EN 61000-6-2
Standard (which references the Standards EN 61000-4-2, EN 61000-4-3 and EN
61000-4-4).
In particular, the instrument is shielded effectively from strong electromagnetic
fields (e.g., motors, power lines, radio transmission towers).
Low Voltage
The instrument adheres to the Low Voltage Directive 2006/95/EC.
Ambient Temperature Range During Operation: +10C ... 40C
Temperature Range During Storage and Transport: +5C ... 60C
Temperature behind glass panes (e.g., in cars) in direct sunlight easily rise above 60C!
To avoid damage from heat, do not store the instrument or
accessories in such places.
The instrument and accessories (in particular the AC
adapter) must not come in direct contact with water! Risk of
electrical shorts! Instruments or accessories may be operated, kept or stored only in places, where the relative humidity is between 30% and 90% (non-condensing).
Because the instrument and accessories are not acid resistant, avoid direct contact with acid or acidic liquids.
The instrument and accessories are not suited for operation
in explosion-hazard areas!
Protect the instrument and accessories from static charges!
Electrical discharges may damage internal components or
delete internal memories.
Page 9
1.6
1.7
Probe Handling
To avoid breakage of the wiring, do not bend the probe connector cable! The radius of rolled up probe connector cables
should always be at least 50 mm!
Probeconnector cable
R 50 mm !
Fig. 1-1 Probe handling
During the measurement, the magnetic poles of the probes are placed directly
onto the specimen. Observe the following to keep wear of the magnetic poles during the contacting measurement to a minimum:
Place the probes speedily yet gently on the specimen surface! Avoid hard impacts!
Do not drag the probe across the specimen surface.
Do not place standard probes on hot or acid-wetted surfaces; do not immerse them in liquids. Special probe models
are available for such applications (ref. the probe data
sheets of the brochure Measurement Probes and Measurement Aids - Optimized Probes - The Key to Successful Coating Thickness Measurements). You can obtain this
brochure from the Helmut Fischer GmbH Institute for Electronics and Metrology or from your authorized supplier.
Page 10
Handling, Storage and Transport of Calibration

Standards
The instrument is calibrated using calibration standards in the form of foils or

hard paper with various thicknesses.
Proper condition of the calibration standards is an important prerequisite for a
correct calibration, and thus for a correct measurement.
Observe the following to ensure the proper condition of the calibration standards:
To keep wear of the calibration standards during the contacting measurements to a minimum, use the calibration standards for the calibration
only and not for test measurements!
Do not soil, bend or scratch calibration standards!
Replace soiled, bent, scratched or cracked calibration standards or
those with strong indentations with non-damaged standards. In particular
foils with thicknesses of less than 50 m are subject to rapid wear. Recommendation: Replace foils after no more than 100 to 200 measurements!
To protect the calibration standards from dirt or damage, keep them in
their supplied case for transporting and storing.
1.9
Instrument Repairs
No repairs should be performed on the instrument.

The instrument may be opened only for replacing rechargePage 28). Other service operaable or regular batteries (
tions on the instrument or the accessories must be
performed only by technical personnel authorized by Helmut
Fischer GmbH.
Page 11
1.8
1.10 Warranty
The Helmut Fischer GmbH Institute for Electronics and Metrology will assume
no warranties in the following instances:
z Use of instrument or accessories for purposes other than the intended use.
z Connection of accessories not recommended or approved by the Helmut Fis-
cher GmbH Institute for Electronics and Metrology.

z Repairs or structural changes to the instrument or accessories that have not
been carried out by authorized persons.

z Improper handling of instrument or accessories (e.g., use in explosion-haz-
ard or very hot environments).

z Disregard of information in this operator's manual.
Page 12
Description of the Instrument

1
Probe connector socket,

Page 30
LCD Display,
Keys for directly retrieving

functions,
Page 16
USB port for connecting a

PC
ON/OFF key to turn the instrument on or off,

Page 33
Cover; additional function

keys can be found under the
cover,
Page 16
Non-slip rubber supports
Foldable instrument stand
Battery compartment,
Page 28
3
4
5
6
Page 14
7
Fig. 2-1 Front and rear view of the instrument, connections
Page 13
2.1
LCD Display
The LCD display consists of several display elements. When powering up the instrument using ON/OFF ( Page 33), all display elements will appear briefly at
the same time.
Display elements of the LCD display after power up (example)

Display element
Explanation
A normalization is performed (on the uncoated specimen
= base material)
( beginning on Page 45).
A calibration is carried out
The measurement uses the magnetic induction method.
The measurement uses the eddy current method.
Padlock:
is enabled, i.e., the keys ZERO and CAL are not active,
the service functions cannot be retrieved, applications
cannot be deleted
Page 14
Explanation
Arrow circle:
Free-running display is enabled, measurements are
displayed continuously when the probe is placed on the
specimen
Alternatively:
Display for area measurement
Display for automatic measurement
-8.8.8.8
Numeric elements for presenting readings, errors and

warning messages.
Unit of measurement for the displayed reading.
Battery:
The battery must be replaced or the rechargeable battery must be charged because the voltage dropped below a minimum value ( beginning on Page 27).
Hourglass:
Measurements are currently not possible because an instrument-internal routine is running.
...SCOPE ...
FKA...
Information lines:
Instrument type:
Instrument-internal software version
Page 15
Display element
2.2
Control panel key functions
For easier opening:
1.
2.
Press on the corners of the cover

and then
slide the cover downwards.
Fig. 2-2 Opening the cover of the control panel keys
The overview on the following pages provides a brief description of the functions
of the individual control panel keys:
Key
Function
DEL
Deletes the last measured reading

2 x DEL: Deletes all readings
.. during normalization:
1x DEL - Deletes the last reading,
2x DEL - Deletes the measurement series of the base material
.. during calibration:
1x DEL - Deletes the last reading,
2x DEL - Deletes the measurement series of the current calibration standard.
Repeated pressing of DEL: Deletes the measurement series
of the previous calibration standards ( beginning on
Page 74).
.. in all menus:
DEL - Returns to the previous menu or cancels the procedure.
Page 16
Function
FINAL-RES
Retrieving the final result (
beginning on Page 78)
Repeated pressing of FINAL-RES:

Displays the individual components of the final result (mean
value, standard deviation, etc.) in succession.
.. and then ENTER:
Ends the display of the final result (return to the measurement
screen) and deletes the stored values.
.. and then :
Ends the display of the final result (return to the measurement
screen) without deleting the stored values.
.. during calibration or normalization:
Enables or disables the free-running display mode (display of
the normalized countrates of the readings; readings will not be
stored and will not be integrated in the calibration or normalization).
ON/OFF
Turns the instrument on and off (
ZERO
Retrieves the normalization (
CAL
Retrieves the corrective calibration (

Page 47)
.. and then CAL:
Cancels the corrective calibration.

beginning on
.. and then DEL:

Deletes the corrective calibration.
.. and then ZERO:
Retrieves the calibration on the coating (possible only for magnetic induction probes and the magnetic induction channel of
dual probes).
.. and then ZERO:
Retrieves the calibration on coating.
Page 17
Key
Key
Function
With the calibration: Sets the target value of the used calibration standard that will be displayed after the CAL Target notification.
With parameter selection: Selects the desired parameters.
The display will change faster if is pressed for longer than 3
seconds.
Turns the free-running display mode on/off.

With the calibration: Sets the target value of the used calibration standard that will be displayed after the CAL Target indicator.
With parameter selection: Selects the desired parameters.
The display will change faster if is pressed for longer than 3
seconds.
SEND
Transfers the values to a connected computer.
ENTER
Confirms entries
5 x ENTER:
Calls the service functions
The instrument settings in the Service Functions menu are
password-protected. 157 will be displayed after pressing ENTER 5 times. Press , 2 times to increase this value to the factory-default password 159 and confirm the entry with
ENTER.
Page 18
2.3.1
Accessories
2.3
Probes
All probes that can be connected to the instrument are equipped

with a memory chip, a so-called EEPROM, in their connector
plug. Probe-specific information (such as probe type, production number, measurement method or coefficients of the master
characteristic, for example) is stored permanently - even without power supply - in this memory chip, which can be overwritten as many times as desired.
When powering up the instrument, this information is automatically retrieved and processed by the instrument; the instrument "recognizes" the connected probe.
Correct coating thickness measurements can be performed
only if a probe that fits the measurement is used ( Chapter
5.2 Assigning a New Probe, beginning on Page 38).
Fig. 2-3
Probe plug of an
FGAB 1.3 probe
Various probe models are available for measurements on objects with different
shapes and different surface properties. Special probes with different measurement ranges are available for the following areas of application, for example:
z particularly rough or abrasive surfaces
z Particularly soft surfaces
z damp, acidic contamination on the surface
z particularly thick or thin coatings
z hot surfaces
z Coatings in pipes and bore holes
For available probe models and the probe model best suited for your application,
see the respective probe data sheets of the brochure Measurement Probes and
Measurement Aids - Optimized Probes - The Key to Successful Coating Thickness Measurements. You can obtain this brochure from Helmut Fischer GmbH
Institute for Electronics and Metrology or from your authorized supplier.
Page 19
2.3.2
Calibration Standards
Calibration standards (in the form of foils or hard paper with different thicknesses) are used for the calibration; the standards are placed on the uncoated specimen
in order to simulate a coating with a known thickness.
A probe-specific calibration standard set for the master calibration (can be ordered as an option) and a probe-specific calibration standard set for the corrective
calibration (included with the probe) are available for each probe model and have
been compiled specifically for this probe model.
You can obtain additional calibration standards of various thicknesses on request
from Helmut Fischer GmbH Institute for Electronics and Metrology or from your
authorized supplier.
Order
number
of the cali
bration foil
Reference area
Foil thick-
Guaranteed
error limit
75.0
Masterfolie 2
Fig. 2-4 Calibration foil (example) and master foil (example)
At Helmut Fischer GmbH Institute for Electronics and Metrology, the foil thicknesses of the calibration standards are determined using a mechanical axial caliper. The function of the axial caliper has been verified using gauge blocks of the
accuracy class I, which have been verified according to national standards.
The guaranteed error limits stated on the calibration standards refer only to the
identified reference area.
Due to the smaller error caused by deformation when compared to plastic foils, copper beryllium foils should be used for calibration standards
with thicknesses of less than 30 m.
Because copper beryllium is an electrically conducting material, CuBe
standards may be used only for calibrating magnetic induction probes
and/or for calibrating the magnetic induction channel of dual probes.
Page 20
Certification of the Calibration Standards

Certificates for the calibration standards are available upon request from your authorized supplier or directly from the Helmut Fischer GmbH Institute for Electronics and Metrology.
2.4
Technical Data
Instrument model
DUALSCOPE FMP20
DELTASCOPE FMP10
ISOSCOPE FMP10
Display
Graphical backlit LCD display
Measurable coatings
z Non-ferromagnetic coatings (NF) on steel or iron

(Fe)
z Electrically non-conducting coatings (Iso) on nonferromagnetic metallic base materials (NF)
Measuring modes z Magnetic induction measurement method

z Amplitude-sensitive eddy current method
Dimensions
z Instrument: 170 mm x 90 mm x 35 mm (L x W x H)
z LCD display: 44 mm x 57 mm (L x W)
Weight
approx. 340 g (without probe, ready to operate)
Permissible ambi- +10 C ... +40 C

ent temperature
during operation
Page 21
When measuring the thickness of foils with the same thickness but made
of different materials (e.g., a 12 m thick CuBe foil and a 12 m thick
plastic foil) on rough specimens, the values measured on these two foils
may deviate by 1 - 2 m from each other, depending on the roughness.
This deviation is caused by the greater rigidity of the CuBe foil. (The rigid
CuBe foil rests relatively plane on the roughness peaks while the soft
plastic foil adjusts somewhat to the roughness due to the pressure force
of the probe tip.)
For this reason, the same foil material that is used for the calibration
should also be used for the test measurements!
Permissible storage temperature
5 ... 60 C
Permissible relative air humidity
30 ... 90% (non-condensing)
Power
supply
z 4 x 1.5 V batteries with about 50 h service life,

(Size AA or Mignon) or
z 4 x 1.5 V NiMH rechargeable batteries with about
45 h service life at 2100 mAh, (Size AA or Mignon)
Power consumption
z 0.3 W with the LCD display not illuminated

z 0.5 W with the LCD display illuminated
Connectors
z Probe:10-pin round plug

z Mini USB port
USB
port
Mini AB
Minimum
time between two
measurements
About 0.2 seconds in the free-running mode
Minimum
Dependant on the measurement range of the conlift-off distance
nected probe; at least 3 to 4 times the max. measurbetween two mea- able coating thickness
surements
Measurement
range, trueness
and repeatability
precision
Page 22
Depends on the connected probe

(These and other probe characteristics can be obtained from the brochure Measurement Probes and
Measurement Aids - Optimized Probes - The Key to
Successful Coating Thickness Measurements) of
Helmut Fischer GmbH Institute for Electronics and
Metrology or can be requested from your authorized
supplier or directly from Helmut Fischer GmbH Institute for Electronics and Metrology.)
Contents of Shipment and Options
After receiving the shipment, packaging and contents should be checked for potential damage. If the packaging, the contents or the accessories show signs of
damage, retain the packaging. It might be needed to assert a claim for damages
versus the shipping company.
It is also advisable to keep the packaging for future transport.
Also verify that all components of the standard contents of the shipment and all
ordered options are present. Notify your authorized supplier or the Helmut Fischer GmbH Institute for Electronics and Metrology if this is not the case.
2.5.1
Standard Contents of Shipment of the Instrument
The standard contents of shipment of the instrument includes:

z Instrument
z Batteries
z Interface cable FMP/PC,
z Carrying and storage case, carrying strap
z Mini CD with USB driver
z Operator's Manual
z Short form operator's manual
2.5.2
Options
Available options are:

z Various measurement probes
z Foils - also with certificate - for the calibration and for verifying the
calibration
z Probe-specific calibration standard set for the master calibration also with certificate
z Charger for NiMh battery
z Support stand V12 for reproducible positioning of measurement
probes on the specimen
z Jig for angle probes for use in the support stand V12 (e.g., for probe
FGABW 1.3)
Page 23
2.5
z Jig for inside probes for use in the support stand V12 (e.g., for probe
z
z
z
z
Page 24
FGABI 1.3-150 mm)

Support stand V12-AM for motor-controlled touch-down and lift-off
of measurement probes
Piston ring measuring stage V4FKB4 for measuring, for example,
chrome coatings on piston rings and oil wiper rings
Guide device V5GW2/TW3 for angle probes for measurements at
recessed or hard to reach areas
PC-Datex software for transferring measurement data from the instrument to a Microsoft Excel spreadsheet (add-in module for Microsoft Excel beginning with Version 95 under Windows 95 to
Windows Vista)
Measurement Methods for Coating Thickness Measurements
The following table shows an exemplary listing of FMP instruments and probes
as well as the measuring application for which they can be used and the measurement method employed to measure the coating thickness.
Probe model Area of application
DUALSCOPE FMP20
DUALSCOPE FMP40
Measurement method
FGAB1.3
Determination of the thickness of Magnetic Induction Method

non-magnetic coatings on steel or According to DIN EN ISO
iron. E.g, chrome, copper, zinc as 2178.
well as paint, lacquer, enamel or
plastic coatings on steel or iron.
FTA3.3
Determination of the thickness of

electrically non-conducting, nonmagnetic coatings on non-ferromagnetic electrically conducting
base materials. Paint, lacquer or
plastic coatings on, for example,
aluminum, copper, zinc, etc as
well as anodized coatings on aluminum.
FD10
Determination of the thickness of Magnetic Induction Method

non-magnetic coatings on steel or According to DIN EN ISO
iron. E.g, chrome, copper, zinc as 2178.
well as paint, lacquer, enamel or
plastic coatings.
ISOSCOPE FMP10
ISOSCOPE FMP 30
DELTASCOPE FMP10
DELTASCOPE FMP 30
Instrument
Determination of the thickness of

electrically non-conducting, nonmagnetic coatings on non-ferromagnetic electrically conducting
base materials. Paint, lacquer or
plastic coatings on, for example,
aluminum, copper, zinc, etc as
well as anodized coatings on aluminum.
Amplitude-Sensitive Eddy
Current Method According to
DIN EN ISO 2360.
Amplitude-Sensitive Eddy
Current Method According to
DIN EN ISO 2360.
Page 25
3.1
Magnetic Induction Method
Contacting measurement method. The excitation current generates a low-frequency magnetic field with a strength that is dependent on the distance between
the measurement probe and the base material. The magnetic field is measured by
means of the measuring coil. The obtained measurement signal is converted in
the instrument to a coating thickness value via the characteristic probe output
function.
Glossary
3.2
Eddy Current Method
The excitation current generates a high-frequency magnetic field that induces

eddy currents in the material. The development of these eddy currents depends
on the distance (coating thickness) between the measurement probe and the base
material. The measurement signal, which captures the reaction of the magnetic
field of the eddy currents on the original magnetic field, is converted into a reading that is proportional to the coating thickness.
Glossary
3.3
Measurements With DUAL Probes
Dual probes (e.g., FD10) combine the magnetic induction and the eddy current
methods. Thus, these probes can be used to measure both non-magnetic coatings
or insulating coatings on steel or iron as well as insulating coatings on non-ferromagnetic, electrically conducting base materials.
Page 26
System Setup, Maintenance and Cleaning

To avoid electrical discharge, inserting a battery should be
carried out only with the unit turned off! Even a small electrical discharge can delete the instruments memory.
The information in Chapter 1 Important Information must be observed!
System setup consists of the following steps:

z Providing the power supply for the instrument
4.1 Power Supply, beginning on Page 27)
z Connecting a measurement probe to the instrument
4.2 Connecting Probes, beginning on Page 30)
z Connecting a computer (if desired) to the instrument
9 Data Transfer Using USB, beginning on Page 81)
z Selecting the language for the instrument if your language has not been set
when the instrument was shipped

( 10.6 Units, beginning on Page 106)
4.1
Power Supply
Electrical power can be supplied to the instrument in the following ways:

z 4 x 1.5 V batteries (AA or mignon) or
z 4 x 1.5 V NiMh rechargeable batteries, 2100 mAh (AA or mignon).
Page 27
4.1.1
Installing or Replacing Batteries

Indicator for battery replacement. Batteries or rechargeable batteries should be replaced.
If the battery voltage is too low, the instrument will turn

off automatically.
Procedure Battery Replacement
1.
2.
Use ON/OFF (
Page 33) to switch the instrument off (if not yet done).
Place the instrument with its back pointing up on the table. Open and
remove the battery compartment cover on the rear of the instrument as
depicted below.
Fig. 4-1 Opening the battery compartment cover
3.
If old batteries are in the instrument, remove them from the unit. Otherwise, install new batteries directly; observe the correct polarity of the batteries
Disposal: Do not dispose of batteries with regular household waste!
Place damaged or used batteries / rechargeable batteries in designated
collection containers! Please observe the guidelines in your region concerning proper handling of waste electrical and electronic equipment and
accessories.
Page 28
Close the battery compartment cover.
4.
LR6 1.5V
LR6 1.5V
LR6 1.5V
LR6 1.5V
Observe the correct polarity when

installing the batteries.
- +
+ + +
Fig. 4-2 Inserting the batteries and closing the battery compartment cover
Use only type MIGNON, 1.5 V, LR6 - AA - AM3 - MN1500 batteries or 4

individual rechargeable batteries 1.2 V 2400 mAh Type AA.
Using other batteries may lead to instrument damage.
Use only non-damaged batteries.
Page 29
4.2
Connecting Probes
A measurement probe must be connected to the instrument to make coating thickness measurements. This must be an appropriate probe suitable for the base material.
Connect probes only when the instrument is off!
To turn the instrument off: Press the ON/OFF key on the right side of the
control panel. The LCD display is not lit and no characters are visible.
Protect the instrument and accessories from electrostatic

charges!
Electrical discharges may damage internal components or
delete internal memories.
Such discharges may occur, for example, when connecting the probe to
the instrument. Thus, please ensure that the person connecting a probe
is properly grounded.
It is recommended to store the instrument with the connected probe.
1.
2.
3.
Use ON/OFF (
Page 33) to switch the instrument off (if not yet done).
If the probe connected to the instrument is to be replaced, unscrew the

knurled nut of the probe plug completely and pull the probe plug carefully
from the connector socket of the instrument.
Plug the probe plug of the new probe into the probe connector socket of
the instrument.
Page 30
Key (plug)
Groove (socket)
Fig. 4-3 Probe plug and probe connector socket
4.
Tighten the knurled nut of the probe plug.

Hold the plug tight to avoid an unintentional turning of the probe plug.
To avoid damage to the contact pins of the probe plug, only
the knurled nut may be turned! The probe plug must not be
turned in the connector socket.
Page 31
When inserting the plug, ensure that the key of the plug fits
into the groove of the socket. Otherwise, an erroneous connection between the instrument and the plug may occur or
the contact pins of the probe plug may be damaged.
1.
2.
Probe connector plug
Connector socket
Instrument
Fig. 4-4 Connecting a probe
5.
Use ON/OFF to turn the instrument on again. The instrument automatically recognizes the type of probe connected to it.
Exception: A flashing symbol for the measurement method on the LCD display
indicates that the instrument does not recognize the connected probe. In such a
case:
z The probe must be assigned to the instrument (
5.2 Assigning a New
Probe, beginning on Page 38)

A new corrective calibration must be performed after the probe has been
assigned (
Page 47)!
Page 32
Turning the Instrument On/Off

To avoid erroneous readings, no metallic objects must be in close
proximity to the probe tip when powering up the instrument. The
minimum distance to be kept is probe-specific (Guideline: Five times the
upper measurement range limit, i.e., a minimum distance of 25 mm
should be maintained for a probe with the measurement range 0...5
mm).
4.3.1
Measurement Method of the Connected Probe
After instrument power-up, the LCD display shows the measurement method of
the connected probe or the measurement method of the last measurement carried
out.
With dual probes, the dual method set in the open Application will be displayed
as well (For an explanation of the dual method:
5.3 Setting Up the Dual
Mode for DUAL Probes, beginning on Page 39 / 10.5.6 Dual Method, beginning on Page 105).
Display
Explanation
[NF/Fe]
Magnetic induction probe connected.
[NC/NF]
Eddy current probe connected.
[NF/Fe NC/NF]
Dual probe connected and dual method set to [both] (i.e.,

in the open application, both methods can be used to
make measurements).
[NF/Fe NC/NF]
Dual probe connected and dual method set to [NF/Fe]

(i.e., in the open application, only the magnetic induction
method can be used to make measurements).
Or:
The last time the probe has been placed on Fe material.
[NF/Fe NC/NF]
Dual probe connected and dual method set to [NC/NF]

(i.e., in the open application, only the eddy current method can be used to make measurements).
Or:
The last time the probe has been placed on NF material.
Page 33
4.3
4.3.2
Key sequence
ON/OFF
Power Up
Detail of the LCD
display
Explanation
Press the ON/OFF key to power up the instrument.
You will hear an audible signal.
A monitoring routine will run automatically.
All display elements of the LCD display will
appear briefly at the same time
( Page 14).
At the end of the monitoring routine, the instrument is ready to make measurements.
The icon of the measurement method of
the connected probe is displayed
( Page 33).
[m] or [mm] or [mils]:
Unit of measurement for the displayed
reading
[Thickn.]: Measurement program Coating
thickness (
10.5.5 Display, beginning
on Page 104)
[n=]: Number of the stored measurements
This error message appears briefly after
power-up if no probe is connected to the
instrument, if the probe is not connected
properly or if the connected probe is defective. It is not possible to make measurements without a connected probe.
(
4.2 Connecting Probes, beginning on
Page 30).
Page 34
Detail of the LCD

display
Explanation
This warning appears briefly after powerup if a probe other than the last one used
is connected to the instrument.
(
5.2 Assigning a New Probe, beginning on Page 38).
4.3.3
Measuring Modes
( Chapter 10.5.5 Display, beginning on Page 104)

Depending on the set measuring mode, one of the following can appear after
power-up of the instrument:
z a coating thickness reading d,
z a normalized countrate Xn
z a countrate X
z d and Xs (countrate for a lifted-off probe) or
z Xn and Xs
4.3.4
Turning Off the Instrument
Press the ON/OFF key to turn the instrument off manually.

The instrument shuts down automatically if for about 5 minutes no measurements
are made or no key is pressed.
Page 35
Key sequence
4.4
Cleaning
To avoid damage to the instrument due to electrical shock, the line
plug of the AC adapter must be pulled before cleaning the instrument or the accessories!
Soiled instruments or accessories should be cleaned using a plastic care product

and a soft cloth.
The following should be observed during cleaning:
Risk of electrical shorts!
Water or other liquids must not enter the instrument or the accessories! Do not immerse or place the instrument or accessories into
liquids to loosen dirt through soaking! Do not pour liquids on the
instrument or accessories!
Wipe off dirt immediately to avoid it from drying onto the surface!
Do not use aggressive agents to clean the instrument or the accessories

because they could attack the plastic housing!
To prevent damage, avoid scraping as a means of cleaning off dirt, in

particular in the area of the probe tip.
Do not use aggressive agents to clean the calibration standards because

they could damage the calibration standard! The use of damaged calibration standards (e.g., dirty or scratched standards) will lead to wrong
measurement results! (For additional information:
1.8 Handling, Storage and Transport of Calibration Standards, beginning on Page 11)
Page 36
Probe Handling
5.1
Probe Handling
Handling During Measurements

Example:
Probe
FGAB1.3
z Always hold the probe at its grip sleeve (right fig-
ure).
Grip sleeve
Specimen
z Always place the probe gently and at a right angle
on the specimen surface.

z Slide the grip sleeve to the specimen surface such
that the sleeve rests on the specimen (center and bottom Figure, right).
z With the default setting, a beep will signal the mea-
surement capture.
z Lift the probe off the specimen before making the
next measurement.
Avoid hard impacts.

Do not allow the probe to hover directly above the surface. Doing so
will lead to erroneous readings.
Do not bend the probe connector cable! Doing so can lead to broken
wires.
Page 37
Probe Handling
5.2
Assigning a New Probe
The instrument recognizes if the probe connected to the unit is different than the
one expected according to the probe identification in the current Application.
Reason: Each individual probe has a name consisting of the identification number and the model designation (e.g., FGAB 1.3). The probe must be registered
in the instrument under this name.
Potential Causes of Problems:
z The probe received a different identification number after a repair.
z A newly purchased probe has not yet been assigned.
z If a user has more than one probe of the same probe model, a problem occurs
if a not yet assigned probe is connected to the instrument. In such a case, it is

advisable to identify the probes and/or instruments with numbers.
If the instrument is powered up and a probe other than the one used last is connected, the following display will appear:
Key sequ./
Action
Detail of the LCD

display
Explanation
This warning appears briefly after powerup if a probe other than the last one used
is connected to the instrument.
After a bief time, the display shown to the

left will appear.
Example: FD10 = Name of the connected
probe
DEL: Probe assignment starts
ENTER: Probe will not be assigned, measurement method display flashes
DEL
Page 38
DEL: All stored readings will be deleted.

ENTER: The probe will not be assigned,
measurement method display continues to
flash
Detail of the LCD

display
Explanation
ZERO and CAL appear on the display.

A normalization and a corrective calibration must be performed ( beginning on
Page 45).
ENTER: The normalization will be skipped.
Only a corrective calibration will be performed.
DEL (2x): The existing corrective calibration will be deleted.
CAL: The action will be canceled. Neither
the normalization nor the corrective calibration will be carried out.
5.3
Setting Up the Dual Mode for DUAL Probes
If a DUAL probe is connected to the instrument, the menu Dual method will
appear additionally in the menu Service Functions / Measurement
( 10.5.6 Dual Method, beginning on Page 105). Select the measurement
method from this menu:
Detail of the LCD
display
Explanation
NF/Fe: Measurements using the magnetic induction
method
NC/NF: Measurements using the eddy current method
both: Measurements are possible using the eddy current
or the magnetic induction methods
Use the error keys or to make the selection.
Confirm the selection by pressing ENTER.
Page 39
Probe Handling
Key sequ./
Action
Probe Handling
If a dual probe is connected to the instrument, the dual method that has been set
up will be displayed on the LCD display after power-up ( 4.3.1 Measurement
Method of the Connected Probe, beginning on Page 33):
The measurement uses the magnetic induction method.
The measurement uses the eddy current method.
The dual method can be set up separately for each Application. The
dual method settings of the other Applications will not be affected.
If the dual method is set to both, both measurement methods can be used to make
measurements. When the probe is placed on the specimen, the correct measurement method will be selected automatically.
If the dual method is set to NC/NF or NF/Fe, only the respective selected measurement method can be used to make measurements. This can ensure, for example, that only the coating of interest of a multi-coating system is determined.
For example, to measure the thickness of the Iso coating from Fig. 5-1, the NF
coating must have a certain minimum thickness (e.g., for zinc
about 60 m) and the dual method must be set to NC/NF:
Insulating coating (Iso coating)
Non-ferromagnetic metal (NF coating)
Ferromagnetic base material
Fig. 5-1 Sample structure of a multi-coating system
If the setting is NF/Fe, the ferromagnetic base material will be taken into account
and the thickness of the Iso coating plus the NF coating will be determined.
However, if the setting is both, either the Iso coating alone (for relative thick NF
coatings) or the thickness of the Iso coating plus the NF coating (for relatively
thin NF coatings) will be determined depending on the thickness and electrical
conductivity of the NF coating.
Page 40
Normalization, Calibration and Master

Calibration
Many factors influence the readings of a coating thickness measurement

(7.2 Influencing Parameters, beginning on Page 66). These influences can be
corrected through a normalization and a calibration.
A normalization is sufficient if these properties change only slightly. As a rule,
a normalization should be performed in the uncoated reference area of the current
specimen.
A corrective calibration is required if the changes in shape, magnetic permeability or electrical conductivity are greater and can no longer be corrected with
a normalization.
With the same type of specimen, a new normalization, corrective
calibration or master calibration should be performed only if inadmissible deviations from a control sample are present. Most often,
these deviations are caused by probe tip wear.
A master calibration must be performed if the changes to the aforementioned

properties are extremely large.
For the normalization, corrective calibration and master calibration,
an uncoated material must be used that corresponds to the specimens to be measured in its base material and shape! The supplied
reference part (Fe or Al base) must not be used for the normalization or calibration because its material properties do, as a rule, not
correspond to those of the specimen. (It may be used for a function
check, for example.)
If an uncoated specimen is not a available, a Calibration on coating, i.e., a calibration on a coated specimen can be performed. Only minor changes in specimen shape can be corrected with a calibration on coating.
A calibration on coating can be performed only with magnetic induction probes or the magnetic induction channel of dual probes. A calibration in coating is not possible with eddy current probes or the
eddy current channel of dual probes.
Page 41
Normalization, Calibration and Master Calibration
6.1
Information Regarding Normalization, Calibration

and Master Calibration
z The information in Chapter 1 Important Information, beginning on
Page 7 should be observed with every normalization, calibration and master

calibration!
z All measurements should be performed with great care! Only in this manner
can the trueness specified for the used probe be ensured during the subsequent measurements.
z Reference measurements should be performed after every normalization and
calibration to verify the normalization and calibration.

z CuBe calibration standards must be used for the calibration of magnetic
induction probes or for the calibration of the magnetic induction channel of

dual probes only, because the thickness of the CuBe standards can be measured only with the magnetic induction method.
z The information in Chapter
6.2 Specific Features of DUAL Probes,

beginning on Page 44 should be observed when performing normalizations
and calibrations that have been set up using a dual probe!
z It is not possible to start a normalization, corrective calibration, calibration
on coating or a master calibration as long as the restricted operating mode is

enabled (indicated by
on the LCD display) ( 10.4.1 Restricted operating mode, beginning on Page 95)!
z With external start enabled, a measurement acquisition can be triggered dur-
ing a normalization or calibration by:

- Pressing the FINAL-RES key,
- Transmitting one of the ASCII characters G0, ES, EN or
- the control character ESC? via the USB port (ESC = ASCII27).
Enabling externally triggered measurement acquisition:
10.5.3 External
Start, beginning on Page 100;
9.4.2 Control Commands, beginning on
Page 84
Page 42
Recommended Number of Single Readings During a Normalization, Calibration and Master Calibration
In addition to the measurement probe, the number of individual measurements to

be carried out depends to a great extent also on the specimen. The following procedures are recommended:
z A minimum of 5 single readings with typical (not very rough) technical sur-
faces and only slightly curved measurement locations.

z With rough surfaces, strongly curved measurement locations, soft coatings,
inhomogeneous base materials, etc., individual measurements should be performed until the displayed standard deviation s is less than 1/20 of the tolerance limit spread of the coating to be measured.
Example of a zinc coating:
Upper Specification Limit USL: 25 m (Upper Tolerance Limit)
Lower Specification Limit LSL: 15 m (Lower Tolerance Limit)
Specification limit spread = USL - LSL = 10 m
Max. admissible standard deviation s = 0.5 m
If the standard deviation s is still greater than admissible even after
5 - 10 single readings, either probe positioning aids (prisms, support
stands, etc.) should be used or a probe that is better suitable for the
measuring application should be selected.
Page 43
6.1.1
6.2
Specific Features of DUAL Probes
The first measurement performed during a normalization or calibration with a

dual probe determines the channel of the dual probe that is normalized or calibrated (indicated on the display with Fe or NF). For example, if the first measurement for a normalization is performed on a ferromagnetic specimen, the
magnetic induction channel of the dual probe will be normalized during the subsequent normalization.
6.3
Reference Measurements
During a reference measurement, readings are obtained on a reference specimen.

If the deviations of these readings exceed the limit values specified by the company, the normalization or calibration that is checked using the reference measurement must be performed again.
A reference sample (coated specimen with a known thickness that corresponds to
the parts to be measured in base material, coating material and shape) is required
for a reference measurement.
Reference specimens are subject to wear caused by the contacting
measurement. Reference specimens must be checked regularly
and replaced by new reference specimens if wear is too great.
Page 44
Normalization
With the normalization, a new zero point is established for the calibration curve
and stored in the instrument.
Required materials
Reference part: Uncoated part from the production.
6.4.1
Normalization Procedure
Key sequ./
Action
Detail of the LCD

display
ZERO
Explanation
Use ZERO to start the normalization.

ZERO appears and remains on the LCD
display while the normalization is performed.
[s]: Standard deviation
[n]: Number of measurements
[Base material (Fe/NF)]: Measurements
should be performed on an uncoated specimen (Fe or NF display for the type of base
material).
When using dual probes, the type of base
material will be displayed only after the 1st
measurement is completed.
[Cancel: ENTER]: Using ENTER cancels
the normalization.
Page 45
6.4
Key sequ./
Action
Detail of the LCD

display
Explanation
Perform measurements on the uncoated

specimen (base material).
Perform the number of individual measurements recommended in
Chapter 6.1.1,
Page 43 at various points of the reference
area.
The mean value of all readings obtained
for the normalization will be displayed.
[Base material]: Measurements should be
performed on an uncoated specimen. The
base material (NF) or (Fe) will be displayed.
[Delete: DEL]: Use DEL to delete the last
measurement, 2x DEL to delete all readings obtained for the normalization.
[OK: ENTER]: Using ENTER ends the
normalization.
ENTER
A confirmation indicating that the normalization has been carried out successfully
appears.
Pressing ENTER confirms the message.
ENTER
The new characteristic will be computed

automatically and stored. The instrument
is again ready to make measurements.
2.1 LCD Display, beginning on Page 14).
z Perform several check measurements by measuring the thickness of a cali-
bration standard placed on the uncoated reference area in order to verify a

correct normalization. The thickness of the standard should be close to the
nominal thickness value of the coating to be measured.
Page 46
foil, delete the readings of the reference measurement before starting with
the measurements on your specimens.
z If the mean value is not within the guaranteed error limits, perform a correc-
tive calibration.
6.5
Corrective calibration
With a corrective calibration, a new zero point and one additional point (onepoint calibration with one calibration standard) or two additional points (twopoint calibration with two calibration standards) are established for the calibration curve and are stored in the instrument.
Required materials
z Reference part (uncoated part from the production)
z Calibration foils
6.5.1 Selecting the Calibration Standards for the Corrective Calibration

A corrective calibration using the calibration standards included with the probe
shipment provides the best measuring precision for the entire measurement range
of the probe. To enhance the measuring precision in a certain thickness range, a
foil with a thickness in this specific range may be used as well. However, the
measuring precision outside of this particular thickness range will not be as good
as with the corrective calibration using the probe-specific calibration standards.
Page 47
z if the obtained mean value is with the guaranteed error limits stated on the
6.5.2 Corrective Calibration Procedure

Key sequ./
Action
CAL
Detail of the LCD

display
Explanation
Use CAL to start the corrective calibration.

CAL appears and remains on the LCD display while the corrective calibration is performed.
[Base material (Fe/NF)]: Measurements
should be performed on an uncoated specimen (Fe or NF display for the type of base
material), i.e., a Normalization is carried
out.
When using dual probes, the type of base
material will be displayed only after the 1st
measurement is completed.
[CAL-Delete: DEL]: Using DEL deletes
the corrective calibration ( Page 52).
[Skip: ENTER]: Using ENTER skips the
normalization (the stored normalization is
retained unchanged).
[Cancel: CAL]: Using CAL cancels the
corrective calibration (the stored corrective
calibration is retained unchanged).
ZERO: Pressing ZERO starts the calibraPage 53).
tion on coating procedure (
Page 48
Detail of the LCD

display
Explanation

specimen (base material) (normalization).
Chapter 6.1.1,
area.
performed on an uncoated specimen, i.e.,
a normalization is carried out. The used
[OK: ENTER]: Using ENTER ends and
stores the normalization.
ENTER
[Entry: ]: Use the arrow keys to set the

nominal thickness value of the calibration
standard. The rated value is printed onto
the calibration standard.
The rated value can be set faster if a measurement is performed on the calibration
standard and then the rated value is corrected using the arrow keys.
[CAL-rat.1: 23.70]: Display of the set rated
value for the thickness of the calibration
standard (Example: 23.7 m)
the calibration procedure
Page 49
Key sequ./
Action
Key sequ./
Action
Detail of the LCD

display
Explanation
Place the calibration standard 1 (in the example with a thickness of 23.7 m) on the
uncoated specimen and perform measurements.
Chapter 6.1.1,
area.
Displayed is the mean value of all measurements performed for this step.
or

standard. The rated value is printed on the
calibration standard. The rated value can
be set faster if a measurement is performed on the calibration standard and
then the rated value is corrected using the
arrow keys.
This step is not required if - as shown in
the example - the rated value for the thickness of the calibration standard coincides
with the stored thickness.
[OK: ENTER]: Using ENTER ends the current calibration step.
ENTER
Page 50
If a corrective calibration is desired with 2

standards, proceed in the same manner
with calibration standard #2.
Otherwise: Use ENTER to end the corrective calibration.
The new characteristic will be computed
automatically and stored.
The instrument is again ready to make
measurements.
Detail of the LCD

display
ENTER
Explanation
A confirmation indicating that the corrective calibration has been carried out successfully appears.
Calibration standards are included with the probe shipment.

To obtain a high measuring precision, it is recommended to select
two standards for the corrective calibration as follows:
1st calibration standard: The thickness corresponds approximately
to the upper limit of the measurement range.
2nd calibration standard: The thickness corresponds approximately
to the lower tolerance limit of the measurement range.
A corrective calibration with only one calibration standard is sufficient if coating thickness measurements are performed that are narrowly around a target value. In such cases, the thickness of the
calibration standard should correspond approximately to the target
coating thickness value.
z Perform several reference measurements by measuring the thickness of the
standards used for the calibration on the uncoated reference area in order to
verify a correct corrective calibration.
z If the obtained mean value is within the guaranteed error limits stated on the
foil, delete the readings of the reference measurement before starting with
the measurements on your specimens.
z If the mean value is not within the guaranteed error limits, repeat corrective
calibration.
Page 51
Key sequ./
Action
6.5.3
Deleting a Corrective Calibration
When deleting the corrective calibration of a dual probe, only the

corrective calibration of the currently active channel will be deleted.
Key sequ./
Action
CAL
Detail of the LCD

display
Explanation
Use CAL to start the corrective calibration.

[CAL-Delete: DEL]: Using DEL deletes
the corrective calibration.
corrective calibration (the stored corrective
calibration is retained unchanged).
DEL
[Yes: DEL]: The corrective calibration will

be deleted.
[No: ENTER]: Cancels the delete procedure.
DEL
The corrective calibration will be deleted.

measurements.
Page 52
Calibration on a Coating
With a calibration on coating, an adjustment for the base material is made

through an existing coating by making measurements on a calibration standard
(included in the probe shipment) placed on this coating.
When should it be performed
z A calibration on coating is necessary when no uncoated specimen is avail-
able as a reference part, e.g., during the receiving inspection or for measurements on site.
Please note that a Calibration on coating does not provide as good an
adjustment for the base material as a calibration with an uncoated reference part. The additionally encountered measurement error depends on
the coating thickness that is present during the calibration and on the
thickness of the used calibration standard; for this reason, it is not possible to provide a generally applicable value for this additional measurement error.
If at all possible, an uncoated reference part should be used for the calibration.
Required materials
z Reference part (coated part from the production)
z Calibration standards (included with the probe shipment)
6.6.1
Procedure for a Calibration on Coating
A normalization is required before a calibration on coating can be performed

( Page 45).
The following error message appears if a normalization has not yet been performed:
Page 53
6.6
Key sequ./
Action
CAL + ZERO
Detail of the LCD

display
Explanation
Use CAL + ZERO to start the calibration

on coating.
ZERO + CAL appear and remain on the
LCD display while the calibration on coating is performed.
[Coating Sample]: Measurements should
be performed on the uncoated specimen.
the current calibration step.
Perform measurements on the coated
Chapter 6.1.1,
area.
The mean value of all readings obtained in
this step will be displayed.
[CBase material.]: Measurements shall
be performed on the coated specimen.
The used base material (NF) or (Fe) will be
displayed.
[OK: ENTER]: Use ENTER to end and
store the calibration step.
Page 54
Detail of the LCD

display
ENTER
Explanation
[ ]: Use or to set the rated value for
the foil thickness (value printed on the correction foil).
This step is not required if the rated value
for the foil thickness coincides with the
stored foil thickness.
[Cancel: ENTER]: Use ENTER to cancel
the calibration step.
Place the calibration standard on the coated specimen and perform measurements.
Chapter 6.1.1,
area.
The mean value of all readings obtained in
this step will be displayed.
measurement, 2x DEL to delete all readings obtained for the calibration.
Page 55
Key sequ./
Action
Key sequ./
Action
ENTER
Detail of the LCD

display
Explanation
A confirmation indicating that the calibration on coating has been carried out successfully appears.
z To verify the calibration on coating proceed as follows:
1.
2.
3.
Through several reference measurements ( Glossary), determine the

mean value of the thickness of the reference coating.
Through several reference measurements, determine the mean value of the
total thickness, comprised of the calibration standard used for the calibration and the reference coating.
Compute the difference of the two coatings. It must correspond to the
engraved value of the calibration standard.
z If the computed difference (thickness of the calibration standard) is within
the guaranteed error limits stated on the standard, delete the readings of the
reference measurements before starting with the measurements on your
specimens.
z If the computed difference is not within the guaranteed error limits, perform
an additional calibration on coating.
Page 56
Master Calibration
The master calibration determines the coefficients of the master characteristic

and stores them in the EEPROM of the probe plug. These coefficients determine
the master characteristic, i.e.; the correlation between the measurement signal of
the probe and the coating thickness.
The EEPROM in the probe plug contains memories for the coefficients of two
master calibrations. These two master calibrations differ from each other in the
following manner:
Factory Master Calibration
One master calibration (factory master calibration) is performed at the facility of
the Helmut Fischer GmbH Institute for Electronics and Metrology with a very
high precision and, depending on the probe type, using at least 8 or more calibration standards. It cannot be deleted or overwritten by the user.
User Master Calibration
You can set up the user master calibration by yourself using 4 - 8 calibration standards. This memory is empty when a new probe is supplied. Once the user has
set up his own master calibration in the manner described below, he can overwrite or even delete this calibration, if needed.
At least 4 calibration standards are required to set up a user master calibration.
They are part of the optional probe-specific master calibration standard set. The
Xn value of one of these calibration standards must be within the prescribed Xn
range of the master calibration for all 4 Xn ranges to be occupied.
To increase the measuring precision in a certain measurement interval of the
probe, up to 4 additional calibration standards with thicknesses in this interval
can be used. This means that max. 5 calibration standards can be in an Xn range
of the user master calibration.
If the user master calibration is deleted and an new one is not set up, the factory
master calibration will be used automatically to make measurements.
An existing corrective calibration will be deleted after a user master
calibration is set up or deleted. This means that after deleting the
user calibration and continued measurement with the factory master
calibration, a new corrective calibration should be performed - if
necessary.
Page 57
6.7
6.7.1
Selecting the Calibration Standards

For the user master calibration, it is essential to use the probe-specific
calibration standard set that is associated with the connected probe!
Only in this manner can the trueness specified for the used probe be
ensured during the subsequent measurements.
During the user master calibration, the master characteristic can be determined
only if suitable calibration standards are used. The calibration standards are suited for the user master calibration only if their normalized countrates Xn are within pre-established probe-specific Xn ranges. The Xn values can be displayed after
the 1st step of the user master calibration (normalization) (Query of the probespecific limits of the Xn ranges for the connected probe during the master calibration:
Page 63.)
6.7.2
Performing a User Master Calibration

A user master calibration (hereafter simply referred to as a master calibration) must be performed only by experienced users.
z If a dual probe is connected, only the normalization and corrective calibra-
tion of the measuring method in which the new master calibration has been
performed will be deleted.
Required materials
z Uncoated specimen with base material and shape that correspond to those of
the actual parts to be measured

z Probe-specific calibration standard set (master foils)
Page 58
Master Calibration Procedure
The master calibration is retrieved from the Service function menu

( 10.8 Performing a Master Calibration, beginning on Page 107).
Key sequ./
Action
Detail of the LCD

display
Explanation
5 x ENTER
2x
Press ENTER 5 times to retrieve the Service Function menu and set the identification number 159 of the Service Functions
using the arrow key .
Retrieve the master calibration from the
Service Functions menu and use ENTER
to start the procedure.
ENTER
ZERO + CAL appear and remain on the

LCD display while the master calibration is
performed.
[MCL Delete: DEL]: Use DEL to delete an
existing master calibration (appears only if
a master calibration has already been performed). Use CAL if you do not wish to delete the master calibration.
master calibration.
If you press DEL again after deleting the master calibration in order to
exit the menu, subsequent measurements will be made with the factory
master calibration - without a corrective calibration.
Page 59
6.7.3
Key sequ./
Action
Detail of the LCD

display
Explanation

Chapter 6.1.1,
area.
performed on an uncoated specimen, i.e.,
a normalization is carried out. The used
store the normalization. The previous normalization will be overwritten
Page 60
Detail of the LCD

display
ENTER
Explanation
the calibration procedure
Pressing FINAL-RES:
Determination of the Normalized Countrate
Xn of a Calibration Standard During a Master Calibration
Page 65.
Pressing ZERO:
Displaying Xn Ranges for Calibration Standards for the Master
Calibration Page 63.
Page 61
Key sequ./
Action
Key sequ./
Action
Detail of the LCD

display
Explanation
Place the calibration standard 1 (in the example with a thickness of 23.7 m) on the
uncoated specimen and perform measurements.
Chapter 6.1.1,
area.
Displayed is the mean value of all measurements performed for this step.
store the calibration step.
or
Use or to set the rated value for the

foil thickness (value printed on the correction foil).
This step is not required if the rated value
for the foil thickness coincides with the
stored foil thickness.
[OK: ENTER]: Using ENTER ends the current calibration step.
ENTER
Page 62
Proceed with calibration standard #2 (master foil #2) in the same as described for
calibration standard #1. The same for all
subsequent calibration steps.
Detail of the LCD

display
ENTER
Explanation
After the last calibration step has been

concluded using ENTER, the new calibration curve will be computed automatically
and stored, and a confirmation indicating
that the master calibration has been carried out successfully appears.
Please note the information regarding the number of calibration standards under 6.7 on Page 57.
z Perform several reference measurements by measuring the thickness of the
master foils used for the calibration on the uncoated reference area in order
to verify a correct master calibration. If the obtained mean values are outside
the guaranteed error limits stated on the foils, the master calibration must be
repeated.
Now, it is possible to make measurements. Delete the readings of the reference
measurement before starting with the measurements on your specimens.
6.7.4
Displaying Xn Ranges for Calibration Standards for the

Master Calibration
During the master calibration, the master characteristic can be determined only if
suitable calibration standards are used.
The calibration standards are suited for the master calibration only if their normalized countrates Xn are within pre-established probe-specific Xn ranges. The
probe-specific limits of the Xn ranges for the connected probe can be queried during the master calibration without affecting the calibration.
Page 63
Key sequ./
Action
Key sequ./
Action
Detail of the LCD

display
Explanation
5 x ENTER
2x

to start the procedure. Relevant explanations
beginning on Page 59.
ZERO
Using ZERO displays the probe-specific

Xn range for calibration standard #1 (master foil #1).
[0.0300<Xn<0.1500]: Xn range limits, the
normalized countrates Xn of calibration
standard #1 must be within this range.
The specific limits for the probe FD10 are
shown here as an example.
ZERO

Xn range for calibration standard #2
(master foil #2) [0.1500<Xn<0.3500].
ZERO

(master foil #3) [0.5000<Xn<0.8000].
ZERO

(master foil #4) [0.8000<Xn<0.9800].
ZERO
Use ZERO to end the display of the probespecific Xn range.

It is now possible to continue the master
calibration.
Or: Press CAL + DEL to return to the measuring mode.
Page 64
Determination of the Normalized Countrate Xn of a

Calibration Standard During a Master Calibration
The normalized countrate Xn of a calibration standard can be determined as described below during a master calibration without affecting the calibration.
Because FINAL-RES triggers a measurement acquisition if external
measurement acquisition is enabled, is not possible to determine the
normalized countrate if external start is enabled during a calibration!
Key sequ./
Action
Detail of the LCD

display
FINAL-RES
Explanation

to start the procedure. Relevant explanations
beginning on Page 59.
Press FINAL-RES to start the procedure.
Place the probe whose normalized countrate Xn is to be determined on the calibration standard. The normalized countrate
Xn of the calibration standard will be displayed (the normalized countrate will not
be stored!).
FINAL-RES
[off: FINAL-RES]: Using FINAL-RES returns the free-running display mode to the
disabled state.
It is now possible to continue the calibration.
Page 65
6.8
Measuring
Measuring
The information stated in
Chapter 1 Important Information, beginning on Page 7 must be observed when making
measurements!
7.1
Preparing for a Measurement
The instrument and the measurement area must be prepared in the following
manner before measurements can be made:
z Agreement on the reference areas (determination on where several single
readings are to be taken), according to DIN EN ISO 2064.

z Ensuring that the reference areas are free of interfering contaminants (e.g.,
moisture, dirt or grease) and are not damaged.

z Carrying Out the System Setup (
z Switching on the instrument (
Page 27).
Page 34).
z Determining the instrument configuration (
Page 86).
z Verifying the normalization and calibration through reference measurements
on an uncoated specimen and on a specimen with a known coating thickness

(
7.2
Page 44).
Influencing Parameters
The following factors influence the readings of a coating thickness measurement:

z Geometry of the specimen (size of the reference area = measurement area,
curvature, surface roughness, base material thickness)

z Magnetic permeability or electrical conductivity of the specimen
z Probe handling by the operator, in particular during probe placement
The influences of these factors can be corrected through a normalization ( beginning on Page 41) or a calibration ( beginning on Page 47,
Page 57).
Page 66
Making a Measurement
To make a measurement, place the probe at a right angle on the specimen surface
(
Page 37). The probe can be lifted off after measurement acquisition, i.e., after the reading appears on the display. The instrument is ready to make measurements.
Observe the following during the measurement:
z Measurements should be made within the reference area.
z To avoid erroneous readings, do not allow the probe to hover above the spec-
imen.
z How high the probe should be lifted off depends on the measurement range
of the probe. To obtain a correct air value, the distance to the specimen
should be at least 3 to 4 times the max. measurable coating thickness.
z To allow sufficient time for a measurement acquisition, the time between
individual measurements must be greater than 0.5 seconds.

1. Place the probe:
2. Lift the probe off:
Measurement
Fig. 7-1 Measurement using an axial probe
1. Place the probe:
2. Lift the probe off:
Measurement Ob-
Fig. 7-2 Measurement using an angle probe
Page 67
Measuring
7.3
Measuring
In addition, the following should be observed when using two-tip

probes for the measurements:
z With cylindrical specimens:
Place the probe tips parallel to the longitudinal axis!

z Place both probe tips simultaneously and with the same pressure on the spec-
imen!
z For specimens with a base material exhibiting a preferred magnetic direc-
tion, it is recommended to generate the measured value from two averaged

readings with the probe being rotated by 90 after the first measurement. A
preferred magnetic direction may be created through specimen processing
(e.g., rolling or drawing of sheet metal).
Measurements using two-tip angle probes on specimens with a preferred magnetic direction:
1. Place the probe
4. Place the probe
2. Lift the probe off

5. Lift the
3. Rotate the probe

90
6. Rotate the
90
Specimen with a preferred

magnetic direction
Fig. 7-3 Measurements using two-tip probes
Page 68
Measurement Acquisition
Measurement acquisition occurs automatically immediately after the probe is

placed on the specimen.
An audible signal will sound after the measurement acquisition (unless it has
been disabled) ( 7.3.4 Audible signals After the Measurement Acquisition,
beginning on Page 73).
With the free-running display mode on, measurement acquisition can be triggered in the following manner ( 7.5 Measurements in the Free-Running Display Mode, beginning on Page 74):
z Pressing the ENTER key
z Transmitting one of the ASCII characters G0, ES, EN or
z Transmitting the control character ESC? via the USB port (ESC =
ASCII27)
( 9.4.2 Control Commands, beginning on Page 84)
Regardless of how the measurement acquisition occurred, the reading will appear
on the LCD display following the measurement acquisition.
Page 69
Measuring
7.3.1
Measuring
7.3.2
Measurements With External Start Enabled
When an automatic measurement acquisition is not desired, e.g., when making

measurements in pipes, boreholes or grooves, external start should be enabled
and automatic measurement acquisition disabled. (Enabling externally triggered
measurement acquisition and disabling automatic measurement acquisition:
Page 100)
With external start enabled, the measurement acquisition can be triggered manually in the following ways once the probe is positioned on the measurement location:
z Press the key
(not with a normalization or calibration)

z Press the FINAL-RES key
(only during a normalization or calibration)

z Transmitting the ES command via the USB port
9.4.2 Control Commands, beginning on Page 84)

With externally triggered measurement acquisition, the measurement
acquisition can be delayed by up to 2.5 sec ( 10.5.3 External Start,
7.3.3
Automatic Measurements
A description of the two acquisition modes will follow under modes for automatic start of measurements after placing the probe. However, both methods will also
work with externally triggered measurement acquisition ( Page 70), but not in
the free-running-mode ( Page 74)!
Page 70
This measuring mode is advantageous if a mean value is to be determined quickly

within a reference area. This mean value is added to a measurement series as a
single reading.
With online output of the single readings via the USB port enabled, only this
mean value will be output as well.
The magnetic poles are subject to increased wear when moving the
probe across a surface.
Key sequ./
Action
Detail of the LCD

display
Explanation
Switch area measurement on from the

menu Service Functions / Measurement /
Measuring mode ( 10.5.4 Measuring
Mode - Standard/Area Measurement/Automatic Measurement, beginning on
Page 102) and place the probe on the
specimen. The LCD displays the
symbol as long as the probe is on the specimen. In addition, an audible signal sounds
when the probe is placed on the specimen.
Move the probe with a slight and uniform
pressure across the specimen.
[Thickn.]: Displays the coating thickness
readings
[n=]: Number of the stored measurements
Lift the probe off the specimen.
An audible signal indicates the end of the
measurement.
Page 71
Measuring
Measurement Capture Through Area Measurements

With area measurements, the single readings are taken as fast as possible until the
probe is lifted off. Only the mean value is stored.
Measuring
Measurement Capture Through Automatic Measurements

With automatic measurements, a specified number of readings is taken with a selectable time interval between 2 measurements. In contrast to the area measurement, all single readings will be stored ( Page 70).
This measuring mode can be advantageous, for example, when the coating thickness distribution shall be determined along a line. If the probe is moved by hand
or a suitable mechanical device along a line at a consistent speed, then the measurement points will be at equal distances.
Key sequ./
Action
Detail of the LCD

display
Explanation
Switch Automatic measurement on from

the menu Service functions / Measurement
/ Measuring mode and select the desired
number of measurements and the time interval of the measurements
( 10.5.4 Measuring Mode - Standard/
Area Measurement/Automatic Measurement, beginning on Page 102).
Place the probe on the specimen. The
LCD displays the symbol
for as long
as the probe is on the specimen.
An audible signal sounds for every measurement that occurred. All measurement
data are evaluated statistically.
readings
[n=]: Number of the stored measurement
data.
Page 72
Audible signals After the Measurement Acquisition
An audible signal will sound after the measurement acquisition (unless it has
been disabled). The measurement acquisition signal indicates that a signal arriving from the probe has been recognized and that the probe can be lifted off the
specimen.
As an option, the measurement acquisition signal can be disabled
( 10.5.1 Audible Signal, beginning on Page 98).
The other audible signals cannot be disabled!
7.3.5
Display of the measurement method in use when making

measurements with dual probes
After powering up the instrument, the measurement method of the connected

probe appears on the LCD display ( 4.3.4 Turning Off the Instrument, beginning on Page 35).
In addition, with dual probes, the measurement method used for the last performed measurement will be indicated.
Display
Explanation
[NF/Fe NC/NF]
The magnetic induction method was used for the measurement with the dual probe.
[NF/Fe NC/NF]
The eddy current method was used for the measurement

with the dual probe.
Page 73
Measuring
7.3.4
Measuring
7.4
7.4.1
Erroneous Readings
Deleting Erroneous Readings
If an erroneous reading is recognized directly after measurement acquisition, the

reading can be deleted by pressing DEL.
Pressing DEL twice will delete all readings.
7.5
Measurements in the Free-Running Display Mode
When making measurements in the free-running display mode, the coating

thickness distribution across the surface can be determined simply by moving the
probe along the surface. In the free-running display mode,
z the readings are displayed continuously, and
z the readings are not accepted and stored automatically,
z the data are output continuously via the USB port only if [Free-running
transmit on] has been selected from the Service functions.

Measurements that are outside the measurement range, e.g., when the
probe is lifted off the surface, are also output to the USB port.
z As long as the free-running mode is on, measurements acquisition can be
triggered using ENTER.
Page 74
Turning the Free-Running Display Mode On/Off
To enable the free-running display mode: Press the arrow key.

z The free-running display mode remains enabled until it is disabled; i.e., it
does not need to be enabled every time the instrument is powered up.
To disable the free-running display mode: Press the arrow key again.
As long as the free-running display mode is enabled,
z
will appear on the LCD display,
z the acquisition of a reading can be triggered using ENTER or by transmit-
ting one of the ASCII characters G0, ES, EN or the control character ESC? (ESC = ASCII27) via the USB port ( 9.4.2 Control
Commands, beginning on Page 84),
z the acquisition of reading can be triggered using if externally triggered
measurement acquisition is enabled,

z it is not possible to retrieve the service functions!
Page 75
Measuring
7.5.1
Measuring
7.5.2
Procedure For Making Measurements in the Free-Running

Display Mode
The magnetic poles are subject to increased wear when moving the
probe across a surface.
Key sequ./
Action
Detail of the LCD

display
Explanation
Press the arrow key to enable the freerunning display mode.
will appear on the LCD display.
readings (measurement program
10.5.5 Display, beginning on
Page 104)
[n= ]: Number of measurements
Place the probe on the specimen and
move it across the surface of the specimen
to determine the coating thickness distribution.
Page 76
Use to disable the free-running display

mode.
Analog Display
When making measurements in the free-running display mode, the analog display facilitates a quick recognition of tendencies in the coating thickness changes. If analog display is enabled and measurements are made in the free-running
display mode, the analog display with the set limits will appear in place of the
information lines. The reading will appear between the limits as an analog bar.
(To enable analog display:
Page 97).
Key sequ./
Action
Detail of the LCD

display
Explanation
Press the arrow key to enable the freerunning display mode.
will appear on the LCD display.
[22.00
25.00]: Limits for the analog display (example).
Place the probe on the specimen and
move it across the surface of the specimen
to determine the coating thickness distribution.
[22.00
25.00]: Limits for the analog display (example).
[ <= =>]: The lower or upper limit of the
analog display is violated
Use to disable the free-running display

mode.
The last reading taken before the free-running display mode will be displayed.
Page 77
Measuring
7.5.3
Measuring
7.5.4
Measurements In the Free-Running Display Mode Using

Dual Probes
The last measurement that has been made with a dual probe prior to turning on
the free-running display mode determines the measurement method that will be
used for the measurement in the free-running display mode.
The last used measurement method is shown on the LCD display
( 7.3.5 Display of the measurement method in use when making measurements with dual probes, beginning on Page 73).
Automatic base material detection and selection of the correct measurement method is not enabled for measurements in the free-running display mode.
If the magnetic induction method was used before the free-running display
mode was turned on, the measurements in the free-running mode will be made
according to the magnetic induction method as well. The dual probe will then
measure only on ferromagnetic base materials. The probe will not measure on
other base materials, i.e., [- - - -] will remain on the LCD display.
If the eddy current method was used before the free-running display mode was
turned on, the measurements in the free-running mode will be made according to
the eddy current method as well. The dual probe will make correct measurements
only on non-ferromagnetic base materials; erroneous measurements will be taken
on ferromagnetic base materials.
If no measurements were made before the free-running display mode is turned
on, the measurements in the free-running mode will be made according to the
magnetic induction method.
Page 78
Evaluation
The following parameters will be determined from the readings during the evaluation and can be displayed:
z Number of evaluated readings
z Mean value th. ,
z Standard deviation s ,
z Lowest reading,
z Highest reading, and
z Range.
More detailed information about the individual computed parameters can be obtained from the
Glossar.
Key sequ./
Action
Detail of the LCD

display
FINAL-RES
Explanation
Use FINAL-RES to start the evaluation.
[Info: CAL]: Press CAL to display an explanation of the computed parameter:

[n]: Number of evaluated readings.
[th.]: Mean value th.
[s]: Standard deviation s
[min]: Minimum value
[max]: Maximum value
[R]: Range
[Leave open: ]: Press to end the
evaluation without deleting the readings.
Page 79
Evaluation
Evaluation
Key sequ./
Action
ENTER +
DEL
Detail of the LCD

display
Explanation
Use ENTER + DEL to end the evaluation

and delete the readings.
[No: ENTER ]: Ends the evaluation without deleting the readings.
measurements.
Page 80
Data Transfer Using USB

Basic computer knowledge regarding configuration, operation and programing as well as knowledge of the software in use, which may be
obtained from respective instruction manuals, is required when using the
instrument in conjunction with a computer.
The USB port for the instrument is on the unit's rear side. Bi-directional data exchange occurs via the USB interface.
The following operations are possible when the USB port is connected to a computer (PC):
z Transfer of the readings and the characteristic statistical data from the instru-
ment to the PC.

z Remote control of the instrument by sending commands from the PC to the
instrument.
z Requesting measurement data and other data (e.g., the name of the current
Application) by sending commands from the PC to the instrument.

z Transfer of data (e.g., designations for Applications) from the PC to the
instrument by sending commands from the PC to the instrument.

Both commercial or one's own data processing programs can be used to process
the data exported by the instrument. Information regarding import and processing
of the data using such programs may be obtained from the respective manuals for
these programs.
Use the USB to
z transfer measurement data and additional information in the ASCII format,
e.g., using PC-DATEX (additional information about the PC-DATEX program is available from Helmut Fischer GmbH or your authorized system
supplier) directly into an EXCEL spreadsheet, and
z transmit commands and data, e.g., via Windows Hyper Terminal (only up
to version Windows XP), from the PC to the instrument.
Page 81
9.1
USB Connection to a PC
Connect the USB port of the instrument with the USB port of the PC.
Use the USB cable supplied with the instrument.
Fig. 9-1 Side view of the instrument with the USB port
9.2
Installing the USB Driver
If there is no USB driver installed for the USB connection on your PC, proceed
as follows:
If the USB driver was downloaded from a Website of Helmut Fischer GmbH: Before installing the driver, extract the downloaded driver
file into a folder on your PC (e.g., C:\Programme\USB-Treiber\FMPUSB).
1.
2.
Connect the instrument to the USB port of your PC. The Found New
Hardware Wizard opens.
Follow the instructions of the Windows wizard. If the driver is not found
automatically, select or enter the source to search for the USB driver (e.g.,
CD-ROM drive. removable media (CD, diskettes, ...) or local path).
Windows XP:
Ignore the message for the Windows Logo Test (Window Hardware
Installation). Click the Continue Installation button and continue the
installation.
The successful installation of the USB driver can be verified in the Windows Device Manager.
z Open the Device Manager: Start/Control Panel/System, Hardware tab,
Device Manager button.
Page 82
USB Driver for FMP (COM3) if the instrument is connected to the PC via
the USB interface.
9.3
Transfer of the Measurement Data to the Computer

Knowledge regarding operation of the computer and the software in use,
which may be obtained from respective instruction manuals, is required.
1.
2.
3.
4.
9.3.1
Establish the USB connection:
Page 82.
Select the data for online export:

on Page 95.
10.4 Instrument Mode, beginning
Data transfer from the instrument to the PC

.. during the measurement (online operation):
9.3.1,
.. after the measurement (offline operation)
Page 83.
Control the instrument from the PC:
Page 84.
Online Operation
For transferring measurement data during online operation, the instrument is connected to the computer during the measurement and the data are output immediately (online) via the USB port.
9.3.2
Offline Operation
With offline operation, the data stored in the instrument are output at a later time
(offline) via the USB port. The data output is triggered by pressing SEND.
Page 83
z You will find an additional COM port under Ports (COM & LPT), e.g.,
9.4
9.4.1
Transmission from the PC to the Instrument
Transfer Formats
z All input and output data are transferred as ASCII-Strings followed by a CR
and a LF control character (Carriage Return Line Feed; CR = ASCII13, LF =

ASCII10).
z The max length of data received by the instrument is 20 characters.
9.4.2
Control Commands
The instrument can be remote controlled and can request readings and other data
by sending the control commands from the PC to the instrument. The requested
readings or the data, respectively, are then transmitted by the instrument via the
USB port and received by the PC.
If sending the commands DAM, DAT, GAN, GBN, SAN, SBN,
SGS or SWA results in an error, i.e., the respective function cannot be executed, the instrument will return the ASCII character NAK via the USB port
to the computer.
Response: ACK (ASCII6)
Response in case of an error: NAK (ASCII21)
Command
Function
STATE
Requests information on the current state of the instrument. 1

is output if the instrument is ready to make measurements. 0
is output if the current Application has not been set up. -1 is
output for any other state (e.g., if the service functions are
called at the particular time).
G0 or
ES or
EN or
ESC?
Triggers the measurement acquisition

Measurement data are output by the instrument via the USB
port.
XX or
z
Requests the current count rate

Outputs the current count rate
but does not store it in the instrument.
Page 84
Function
XN or
y
Requests the current normalized countrate.

Outputs the current normalized countrate,
but does not store it in the instrument.
SAM
Requests all measurement data.
ESC0
Operates the DEL key
ESC1
Operates the FINAL-RES key
ESC3
Operates the ON/OFF key
ESC4
Operates the ZERO key
ESC5
Operates the CAL key
ESC6
Operates the key
ESC7
Operates the key
ESC:
Operates the SEND key
ESC;
Operates the ENTER key
SER
Requests the serial number of the instrument.
VV
Requests the version designation of the

instrument internal software (e.g., RBA12)
Command
For information about operation, maintenance and care of the printer,

consult the instruction manual of the printer.
Page 85
Instrument Settings in the Service Function Menu
10 Instrument Settings in the Service Function Menu

The instrument settings described below are configured from the Service function menu.
How to access the Service functions menu:
Key sequ./
Action
ON/OFF
5 x ENTER
2x
ENTER
Detail of the LCD

display
Explanation
Use ON/OFF to turn the instrument on

After pressing ENTER 5 times, the identification number 157 appears on the LCD
display.
Enter the identification number 159 by
pressing the arrow key 2 times.
Use ENTER to confirm the setting.
The Service settings menu will be displayed.
Press the arrow keys or to select the
desired service function.
How to exit the Service functions menu:

Key sequ./
Action
Explanation
DEL
Press the DEL key to exit the Service functions menu.

The instrument is ready to make measurements.
Page 86
The descriptions below assume that the service functions have

been retrieved and not yet exited.
10.1 Service Menu Overview

Service menu
Functions
Start on
Page
System
Language
Contrast
Lighting
Autom. off
Initialization
88
89
90
92
93
USB
Send free-running mode
94
Instrument mode
Limited mode
Analog display
95
97
Measurement
audible signal
Measurement effect
External start
Measuring mode - Standard/
Area measurement/Automatic measurement
Display
dual method
98
99
100
Units
metric/imperial
106
Storage mode
save/don't save/delete on off
107
About ...
Information about the instrument configuration
108
102
104
105
Page 87
The default settings of the service function parameters (i.e., the as-shipped factory settings) are underlined below, e.g.,: [Histogram off]. A re-initialization will
reset the settings in the service functions to the default settings ( Page 93).
However, time, date and language are not reset by the re-initialization!
10.2 System
10.2.1
Language
Do not select a language for which you do not understand the characters, e.g., Cyrillic! You might have difficulty returning to a language that is
familiar to you!
Key sequ./
Action
Detail of the LCD

display
Explanation
Select System from the service menu.

Use ENTER to confirm the selection.
ENTER
Select the Language by pressing the arrow key or and confirm the selection
with ENTER.
ENTER
Select the desired language by pressing

the arrow key or and confirm the selection with ENTER.
Page 88
Contrast
Use the contrast setting to adjust the LCD display brightness continuously. The
contrast value can be between 0 (brightest LCD display) and 99 (darkest LCD
display). The default contrast setting is 60.
Key sequ./
Action
Detail of the LCD

display
Explanation

ENTER
Select the Contrast by pressing the arrow

key or and confirm the selection with
ENTER.
ENTER
Use ENTER to confirm the Contrast selection, or

specify a new value by pressing the arrow
key or , then confirm the entry with ENTER.
or
Use DEL at any time to cancel the procedure.
Page 89
10.2.2
10.2.3
Lighting
The following options are available for the light setting

z off after n sec: The light turns off after n seconds.
z always off: The light is always off.
z always on: The light is always turned on.
Key sequ./
Action
Detail of the LCD

display
Explanation

ENTER
Select Light by pressing the arrow key

or and confirm the selection with ENTER.
ENTER
Select the desired setting by pressing the

arrow key or .
Use ENTER to confirm the desired setting.
or
Enter
or
Enter
Page 90
off after n sec

Use ENTER to confirm the value, or:
specify a new value by pressing the arrow
key or .
Pressing ENTER returns you to the menu
in order to enter additional settings.
always off
After confirming the selection always off
with ENTER you are immediately returned
to the menu in order to enter additional settings.
Detail of the LCD

display
or
Enter
Explanation
always on
After confirming the selection always on
with ENTER, you are immediately returned
to the menu in order to enter additional settings.
Page 91
Key sequ./
Action
10.2.4
Automatic Switch Off
Key sequ./
Action
Detail of the LCD

display
Explanation

ENTER
Select Auto. switch off by pressing the arrow key or and confirm the selection
with ENTER.
ENTER
Select the desired mode by pressing the

arrow key or and confirm the selection
with ENTER.
[off]: The instrument does not switch off
automatically. The switch-off mode is disabled.
[on]: The instrument switches off automatically if for about 5 minutes no measurements are made or no key is pressed. The
switch-off mode is enabled.
Page 92
Re-Initialization of the Instrument
The restoration of the default settings of the instrument is called re-initialization.

With a re-initialization of the instrument,
z all readings are deleted,
z all settings in the service functions are reset to the default settings (i.e., to the
factory settings) (exception: language); thus, if necessary the settings will

have to be made again.
z the coefficients of the master characteristic that is stored in the EEPROM of
the probe plug are not changed because the re-initialization concerns only
the memory of the instrument.
Key sequ./
Action
Detail of the LCD

display
Explanation

ENTER
Select the Initialization by pressing the arrow key or and confirm the selection
with ENTER.
ENTER
[Yes: DEL]: Press DEL to carry out the reinitialization.

[No: ENTER]: Press ENTER to not carry
out the re-initialization.
Press DEL only if the re-initialization is indeed desired!
DEL
[Continue: ENTER]: Press ENTER to return to the System menu.
Page 93
10.2.5
10.3 USB
10.3.1
Send Free-Running Mode
Key sequ./
Action
Detail of the LCD

display
Explanation
Select USB from the service menu.

ENTER
Select the desired free-running mode by

pressing the arrow key or and confirm
the selection with ENTER.
[off]: Measurement data that have been
taken using the free-running display
mode will not be transmitted via the USB
port.
[on]: Measurement data that have been
taken using the free-running display
mode will be transmitted via the USB port.
Page 94
10.4.1
Restricted operating mode
When the restricted operating mode is enabled, only the keys necessary for measurement and evaluation are active. This avoids erroneous measurements due to
unintentional adjustments of instrument parameters.
The following keys are not active in the restricted operating mode:
z ZERO
z CAL
No actions are triggered and the LCD display will not change when pressing
these keys while in restricted operating mode.
As long as the restricted operating mode is enabled, the LCD display will show
.
The restricted operating mode will remain enabled even after the instrument is
switched off and on.
Key sequ./
Action
Detail of the LCD

display
Explanation
Select the Device Mode by pressing the

with ENTER.
ENTER
Select Restricted mode by pressing the

with ENTER.
Page 95
10.4 Instrument Mode
Key sequ./
Action
Detail of the LCD

display
Explanation
Select the desired operating mode by

[off]: The restricted operating mode is disabled, i.e., all functions are enabled according to their settings.
[on]: The restricted operating mode is enabled.
Page 96
Analog Display
When making measurements in the free-running display mode, the analog display facilitates a quick recognition of tendencies in the coating thickness changes. If analog display is enabled and measurements are made in the free-running
display mode, the analog display with the set limits will appear in place of the
information lines. The reading will appear between the limits as an analog bar.
Key sequ./
Action
Detail of the LCD

display
Explanation
Select the Device Mode by pressing the

with ENTER.
ENTER
ENTER
Select Analog display by pressing the arrow key or and confirm the selection
with ENTER.
Select the desired display mode by pressing the arrow key or and confirm the
selection with ENTER.
[off]: Analog display disabled
[on]: Analog display enabled, i.e., when

making measurements in the free-running display mode, an analog bar will appear in the information lines to indicated
the measured value ( 7.5.3 Analog Display, beginning on Page 77).
Page 97
10.4.2
10.5 Measurement
10.5.1
Audible Signal
The audible signal, i.e., the measurement acquisition signal that sounds after every measurement can be disabled.
Key sequ./
Action
Detail of the LCD

display
Explanation
Select Measurement by pressing the arrow key or and confirm the selection
with ENTER.
ENTER
ENTER
Select Audible signal by pressing the arrow key or and confirm the selection
with ENTER.
with ENTER.
[off]: No audible signal sounds when the
probe is placed on the specimen.
[on]: An audible signal sounds when the
probe is placed on the specimen.
Page 98
Measurement Effect
Key sequ./
Action
Detail of the LCD

display
Explanation
with ENTER.
ENTER
ENTER
Select Meas. signal by pressing the arrow

ENTER.
Select the desired measurement effect
by pressing the arrow key or and confirm the selection with ENTER.
[off]: Measurement effect disabled, i.e.,
the reading will not be acquired automatically (automatic measurement acquisition
disabled).
[on]: Measurement effect enabled, i.e., the
reading will be acquired automatically
once the probe is placed on the specimen
(automatic measurement acquisition enabled).
Page 99
10.5.2
10.5.3
External Start
Key sequ./
Action
Detail of the LCD

display
Explanation
with ENTER.
ENTER
ENTER
Select Extern start by pressing the arrow

ENTER.
Select Extern Start on or Extern Start off

by pressing the arrow key or and confirm the selection with ENTER.
[off]: External start is not possible (External start disabled)
[on]: External start is possible (enabled),
i.e., external measurement acquisition can
be triggered by pressing the key (or FINAL-RES during a normalization or calibration).
Page 100
Detail of the LCD

display
Explanation
Select the desired delay by pressing the
with ENTER.
ENTER
[0 ms]: no pause after external start

[100 ms]: 100 ms pause after external
start
to
[2500 ms]: 2500 ms pause after external
start
[Page : CAL]: Press CAL to leaf through
the pages.
The combination measurement effect off and external start off is

not permissible because it would not allow for a measurement
acquisition. If this combination is set, the instrument will automatically reset the parameters to measurement effect on and external
start off.
Page 101
Key sequ./
Action
10.5.4
Measuring Mode - Standard/Area Measurement/Automatic

Measurement
Key sequ./
Action
Detail of the LCD

display
Explanation
with ENTER.
ENTER
ENTER
Select Measuring Mode by pressing the

with ENTER.
Select the desired measuring mode by
pressing the arrow key or .
The standard measuring mode will be activated. Confirming with ENTER will return
you to the menu for the measurement.
Area measurement is possible (enabled),
7.3.3 Automatic Measurements, beginning on Page 70.
Confirming with ENTER will return you to
the menu Measurement.
Page 102
Detail of the LCD

display
Explanation
Select the mode for Auto. Measurement

by pressing the arrow key or .
Automatic measurement is possible (enabled)
7.3.3 Automatic Measurements, beginning on Page 70.
ENTER
Select the desired number of measurements by pressing the arrow key or

and confirm the selection with ENTER.
ENTER
Enter the time interval by pressing the arrow key or .

Confirming with ENTER will return you to
the menu for the Measurement.
Page 103
Key sequ./
Action
10.5.5
Display
Key sequ./
Action
Detail of the LCD

display
Explanation
with ENTER.
ENTER
Select Display by pressing the arrow key
ENTER
Select the measurement data type by

The readings will be presented on the LCD
display corresponding to the selected
measurement data type
( 4.3.3 Measuring Modes, beginning on
Page 35).
With every modification of the type of measurement data, a prompt for deleting readings that are already stored in the
Application will appear because it is not
possible to evaluate different types of measurement data statistically. This prevents
erroneous interpretations of the measurement results.
[Yes: DEL]: Press DEL to delete all readings that have been stored thus far.
[No: ENTER]: Press ENTER to cancel the
procedure.
Page 104
Dual Method
The menu option Dual method appears only if a dual probe is connected.
Key sequ./
Action
Detail of the LCD

display
Explanation
with ENTER.
ENTER
Select Dual method by pressing the arrow

ENTER.
ENTER
Select the desired dual method by pressing the arrow key or and confirm the
selection with ENTER.
[NF/Fe]: In the open application, only the
magnetic induction method can be used to
make measurements.
[NC/NF]: In the open Application, only the
eddy current method can be used to make
measurements.
[both]: In the open Application, only the
two methods can be used to make measurements.
ENTER

Press ENTER to confirm and store the
measuring mode settings.
The instrument is ready to make measurements.
Page 105
10.5.6
10.6 Units
Key sequ./
Action
Detail of the LCD

display
Explanation
Select Units by pressing the arrow key
ENTER
Select the desired units by pressing the arrow key or and confirm the selection
with ENTER.
[metric]: Units of measurement in m or
mm
[inch units]: Units of measurement in mils

Page 106
Key sequ./
Action
Detail of the LCD

display
Explanation
Select Storage mode by pressing the arrow key or and confirm the selection
with ENTER.
ENTER

with ENTER.
[store]: The readings are stored and will
be retained even after the instrument is
switched off
[do not store]: The readings will be displayed but not stored
[delete at off]: All readings will be deleted
when the instrument is switched off
10.8 Performing a Master Calibration

Key sequ./
Action
Detail of the LCD

display
Explanation
Select Master Calibration by pressing the

with ENTER.
Performing the master calibration:

Page 57.
6.7 Master Calibration, beginning on
Page 107
10.7 Storage Mode
10.9 About ...

Key sequ./
Action
Detail of the LCD

display
Explanation
Select About ... by pressing the arrow key

ENTER
Displays the software version, the internal

state and the name of the connected
probe.
Pressing ENTER repeatedly displays the
instrument configuration in succession (cv.
10.10 Documentation of the Instrument
Configuration, beginning on Page 108).
10.10 Documentation of the Instrument Configuration

Key sequ./
Action
Explanation
SEND
With the service functions retrieved, the

documentation of the instrument configuration (including the probe) can be output to
the USB port by using the SEND command ( Fig. 10-1). Using the print function also exits the service functions and the
instrument is again ready to make measurements.
9 Data Transfer Using USB, beginning on Page 81
Page 108
19.05.08
Probe-specific data
of the connected
probe
Fig. 10-1 Documentation of the instrument configuration with probe-specific data (example)
Page 109
FISCHER DUALSCOPE FMP40

Software version : FKA00i08
internal state : 03000004fb
Probe
: FD10
Serial number
: 0907VS0027
Meas. range 1
: 0.00 - 1300
Meas. range 2
: 0.00 - 800
Unit of meas. : metric
Storage mode : store
Auto. switch off : on
Light [s] : always on
Histogram
: on
Contrast
: 30
Unit of meas. : metric
Language
: english
Display
: coating thickn.
Meas. signal
: on
Extern start
: off
delay
: 0 ms
Group separator : off
Output to port : Single meas.
Analog display : off
Dual method
: both
Malfunctions and Messages
11 Malfunctions and Messages
11.1 Malfunctions
Malfunction/Message
Cause
No display
Instrument not switched Use ON/OFF to turn

on.
the instrument on.
33
Instrument has
switched off automatically.
Use ON/OFF to turn

the instrument on.
33
Battery discharged.
Replace the rechargeable or regular battery

with a new one.
28
restricted operating
mode is enabled.
Use ON/OFF + ENTER 95

to disable the restricted
operating mode with
the instrument
switched off beforehand.
No change on the
display for
ZERO or CAL
Correction
from
Page
Unable to retrieve
Free-running display
the service functions mode is enabled.
Use to disable the

free-running display
mode.
74
Probe does not mea- Measurement acquisisure

tion did not occur because the previous
measurement acquisition was less than two
seconds earlier.
Repeat measurement.
37
Use a different specimen.
--
Computing the coating

thickness is not possible because the coating is too thick.
Page 110
Cause
Correction
Probe does not mea- Wrong probe connect- Connect the correct
sure
ed.
probe or assign a new
The indicator for the
probe.
measurement method
flashes on the LCD display.
from
Page
30
38
Wrong base material

Use a specimen with a -(measurements with
ferromagnetic base
magnetic induction
material.
probes are possible only on ferromagnetic
base materials).
Wrong base material
Use a specimen with a -(measurements in the
ferromagnetic base
material.
mode using a dual
probe are not possible
on base materials made
of non-ferrous metal if
the last measurement
prior to enabling the
'free-running display
mode was carried out
on a ferromagnetic
base material).
Wrong dual method setting. A measurement
with a dual probe on
non-ferromagnetic base
materials is not possible
if the dual method (NF/
Fe) was set in the service function.
Use a specimen with a 105

ferromagnetic base
material, or
Set the dual method
(both) in the service
function.
Page 111
Malfunction/Message
Malfunction/Message
Cause
Probe does not mea- Automatic

sure
measurement acquisition disabled.
Wrong readings
Correction
from
Page
Enable automatic mea- 102

surement acquisition
from the service functions or trigger the external measurement
acquisition by pressing
the key (or FINALRES during the normalization or calibration).
Probe defective.
Use properly functioning probe.
--
Probe placed on specimen incorrectly (e.g.,

probe hovers over
specimen).
Place probe on speci- 37

men correctly and observe the minimum liftoff distance when lifting
off the probe.
Wrong base material

Use a specimen with a -(correct measurements non-ferromagnetic
with eddy current
base material.
probes are possible only on non-ferromagnetic base materials).
Wrong base material
Use a specimen with a -(correct measurements non-ferromagnetic
in the free-running dis- base material.
play mode using a dual
probe are possible on
non-ferrous base materials only if the last measurement prior to
enabling the 'free-running display mode was
carried out on a non-ferromagnetic base material).
Page 112
Cause
Correction
from
Page
Wrong readings
Conducting metal close Use a specimen with- -to the measurement lo- out a conducting metal.
cation when making
measurements using
eddy current probes.
(e.g., on the back side
of a pc-board).
Wrong dual method setting (A correct measurement with a dual probe
on ferromagnetic base
materials is not possible
if the dual method (NC/
NF) was set in the service function.
Use a specimen with a 105

non-ferromagnetic
base material or set the
dual method (both) in
the service function.
Incorrect normalization
or calibration.
Perform a correct normalization or calibration.
41
Probe tip worn.
Use a probe with a

proper probe tip.
--
Page 113
Malfunction/Message
11.2 Messages on the LCD Display

The error messages (E***) and warning messages (W***) that may occur during
instrument operation are contained in the overview on the following pages.
Malfunction/Message
----
Cause
Correction
Reading cannot be displayed (because the

value is greater than
9999 or smaller than
- 9999)
Cause: Measurement
carried out incorrectly.
Perform the measure- 37

ment correctly (e.g., do
not allow the probe to
hover over the specimen before or after the
measurement; observe the minimum liftoff distance!)
Cause: Eddy current

Continue normalizaprobe that is currently
tion.
normalized on a nonferromagnetic base material has previously
been normalized on a
ferromagnetic base material.
from
Page
45
Instrument is not ready Use ZERO to start and 45

to make measureperform the normalizaments.
tion.
Cause: Re-initialization
was carried out and the
instrument was then
switched off.
001
E
Math Error !
Page 114
Instrument-internal error.
Use ON/OFF to turn

the instrument off and
then again on.
If this error occurs repeatedly: Inform customer service.
33
004
E
Appl. memory
overflow !
005
E
Unable to det.
introuvable !
006
E
Measurements
out of range !
Cause
Correction
The internal instrument

memory is full.
Delete the stored mea- 74

surement data.
Unable to perform the

computation for the calibration on coating because the thickness of
the used calibration
standard is insufficient.
Perform a calibration
53
on coating with a suitable calibration standard (the used
calibration standard
should have a thickness of at least 50% of
the coating thickness
of the coated specimen
that is used for the calibration on coating).
Unable to display reading because it is out of

the probe's measurement range.
Cause: Coating too
thick.
Perform measurements on specimens

with coatings that can
be measured with the
connected probe or
use a different probe.
Cause: Measurement
Perform the measure- 37

ment correctly (e.g., do
hover over the specimen before or after the
Cause: Measurement
with eddy current probe
on a non-ferromagnetic
base material after a
normalization on a ferromagnetic base material.
Perform a normaliza45
tion with the eddy current probe on a nonferromagnetic base
material and repeat the
measurement.
from
Page
--
Page 115
Malfunction/Message
Malfunction/Message
006
E
Measurements
out of range !
007
E
Measurements
invalid !
010
E
Meas. method
not supported !
Page 116
Cause
Correction
from
Page
Cause: ENTER was

pressed during the
measurement in the
mode while the probe
was lifted off.
Place the probe on the 74

specimen and then
press ENTER to trigger
the measurement acquisition.
Outlier measurement
recognized during normalization or calibration.
Cause: Measurement
on calibration standard
Repeat the calibration 37

step and perform the
calibration measurement correctly (e.g., do
hover over the standard before or after the
Cause: Measurement
performed on a wrong
calibration standard
(e.g., a measurement
on an uncoated base
material instead of a
calibration standard).
Repeat the calibration 47

step and make the calibration measurement
on a correct standard.
Connected probe not

Connect a suitable
suitable or not support- probe.
ed (measurement method of the connected
probe does not fit the instrument).
30
Probe defective.
30
Connect a properly
functioning probe.
011
E
Measurements out
of interval !
012
E
Invalid std.
sequence !
Cause
Correction
Unable to complete corrective calibration.

Cause: Measurement
Repeat the corrective 47

calibration and perform the calibration
measurement correctly (e.g., do not allow
the probe to hover over
the standard before or
after the measurement;
observe the minimum
lift-off distance!)
Cause: Calibration
standards used that did
not exhibit the required
coating thickness or are
defective.
Repeat the corrective

calibration with correct
and good calibration
standards.
Cause: Normalization
carried out on calibration standard instead of
on uncoated specimen.

calibration and perform the normalization
on the uncoated specimen.
Calibration standards
were measured out of
sequence during the
corrective calibration
(standard 1 mixed up
with standard 2) and
foil thickness was not
adjusted correspondingly using the arrow
keys.
Repeat the corrective

calibration and measure the standards in
the correct sequence.
from
Page
47
47
Page 117
Malfunction/Message
Malfunction/Message
013
E
Countrate out
of interval !
014
E
Unable to calc.
parameters !
015
E
Unable to store
cal. in probe !
Cause
Correction
from
Page
Unable to complete the

master calibration.
Cause: Measurement
Repeat the master cali- 57

bration and perform the
calibration measurement correctly (e.g., do
hover over the standard before or after the
Cause: Calibration
standards used that did
not exhibit the required
coating thickness or are
defective.

bration with correct and
good calibration standards.
Cause: Normalization
carried out on calibration standard instead of
on uncoated specimen.

bration and perform the 57
normalization on the
uncoated specimen.
Instrument-internal error: Unable to compute

the coefficients of the
master characteristic
(original master characteristic will be retained).

bration.
If this error occurs repeatedly: Inform customer service.
Unable to store master

characteristic.
Cause: Probe not
plugged in and tightened properly.
Plug probe in and tight- 30

en properly; repeat the
master calibration.
Cause: Probe defective. Connect a properly

30
functioning probe and if 57
applicable repeat the
master calibration.
Page 118
016
E
Std. and meas.
not matching !
021
E
Entered Standard
invalid !
022
E
Missing probe !
026
E
Cal. on coating
not supported !
Cause
Correction
The stored foil thicknesses do not correspond to the measured

standards.
Cause: Calibration
standards were measured out of sequence
during the master calibration (standard 1
mixed up with standard
2) and foil thickness
was not adjusted correspondingly using the arrow keys.

bration and measure
the standards in the
correct sequence.
Unable to perform corrective calibration with

the set foil thickness
(e.g., because [Standard 2: 0] was set).
Set the rated values for 47

the used calibration
standard and continue
with the corrective calibration.
No probe connected.
Connect a probe.
Probe not connected

correctly.
Connect probe correct- 30

ly.
Probe defective.
Use properly functioning probe.
30
Unable to perform a cal- Connect a suitable

ibration on coating with probe and repeat the
the connected probe (a calibration on coating.
calibration on coating
can be performed only
with magnetic induction
probes or the magnetic
induction channel of dual probes).
53
from
Page
30
Page 119
Malfunction/Message
Malfunction/Message
030
E
Probe damaged !
031
E
USB overcurrent !
032
E
Measurem. equip.
not adjusted !
033
E
Device damaged !
034
E
Unsupported
Probe format !
035
E
Please perform
a normalization !
999
E
System error !!!
Page 120
Cause
Correction
from
Page
Probe contents does

not correspond to the
test value.
Inform customer service.
--
Electric consumption of Check and/or replace -a connected USB deconnected USB device.
vice too high (max. 100
mA permitted).
The measurement elec- Inform customer sertronics has not been

vice.
balanced properly. Because of this, measurement data may be
incorrect.
--
Internal write/read error. Inform customer service.
--
The probe contains an

unknown data format.
Perform a software up- -date.
Unable to compute a
Perform a normalizameasurement because tion.
a normalization has not
been carried out on the
current base material.
45
Internal instrument error.
--
Inform customer service.
003
W
Options
corrected !
004
W
Action
canceled !
005
W
1-Point
calibration !
Cause
Correction
from
Page
Instrument corrected
faulty settings autonomously.
--
--
A procedure was canceled (e.g., the corrective calibration was

canceled using ENTER).
Repeat the procedure

if necessary.
--
Two-point calibration
performed with calibration standards with
thicknesses that are not
sufficiently far apart (will
be considered a onepoint calibration).

calibration with suitable
calibration standards.
The difference of the
normalized count rates
Xn of the two calibration standards must be
greater than 0.1:
Xn Calibration standard 2
- Xn Calibration standard 1
Xn > 0,1
006
W
Probe changed !
A probe of the same

-type but with a different
serial number has been
connected.
30
Page 121
Malfunction/Message

Page 122
Glossary
12 Glossary
Terms and Formulas
Adjustments
Calibration
Application
Measurement Application of the User.

The instrument memory, where the coefficients from the corrective calibration/normalization (adjustment of the measurement system to the specimen / coating/base material adjustment, system adjustment), the parameter settings and the measurement data for a certain measuring application
of the user are stored is called an application.
Application Selection
Menu page(s) in the instrument, where all Applications are listed that have
been set up thus far. Use the command button APPL or use
File/Open to select an Application.
Application Memory
The instrument memory contains all data and measurements that are relevant to a measuring application.
Outliers
Readings that are significantly lower or higher than the other readings of
a measurement series and that can, therefore, be considered unexpected
and not acceptable.
Outlier Rejection
Is used to prevent the distortion of measurement results by Outliers. Outlier rejection can be carried out using the Grubbs-Test or Sigma- Outlier
Rejection (specification of a known spread). Measurements that are recognized as outliers during outlier rejection are not included in the statistical evaluations.
Evaluation
Computation of statistical parameters such as mean value, standard deviation, etc. as well as the graphical presentation of the measurements, e.g.,
in a sum frequency chart.
Page 123
Glossary
Evaluation Menu
Selection menu for the evaluation and presentation of the measurements

as well as for exporting the measurements, evaluations and presentations
via the USB-port to a USB-stick or a printer. Use the EVALUATE button
or
Eval/Final result to call the evaluation menu.
Automatic Block Creation
A block closure is carried out automatically each time a specified number

of measurements is reached. In statistical evaluations, the block mean values will be used instead of the single readings.
Baud
Unit of the speed for transferring information (data). 1 Baud corresponds

to a transfer rate of one bit per second.
Baud Rate
Data transfer rate. Used mainly in connection with terminal programs for
data transfer. Since data are transferred via a serial port, the transfer rate
is calculated in bits per second.
Bidirectional Data Exchange
Data can be transmitted and received by both participants (for example,

from the instrument to the PC and from the PC to the instrument).
Bit
(Binary Digit), binary number. 1 bit is the smallest unit in the binary number system. The value of a bit is 0 or 1. Being the smallest unit of information in a computer, a bit forms the basis of every computer system. 8
bits are combined to a byte and several bytes to a word.
Block
Grouping of single readings. Several measurements are combined into a

block. A key symbol on the display indicates the end of each block (conclusion of a block).
End of Block
Mark after n single readings. As a rule, a key symbol on the display indicates the end of a block.
Block Result
Statistical evaluation of the measurement data of a block. E.g., mean value, standard deviation, coefficient of variation, range, minimum value,
maximum value, number of single readings per block.
Page 124
Glossary
Block Size
Number of single readings that are combined to form a block.

Block Mean Value
d. or , d
Block, open
Group of single readings for which the block has not yet been ended.
Carriage Return (CR)
CR is a character of the ASCII-character set (ASCII13) and has the following function: When data or commands are entered, the line one is currently working on will be closed by pressing the CR-key (Enter or Return
key on the PC keyboard) and the information that has been entered will be
processed accordingly. The curser is again placed at the beginning of the
line. CR is usually used together with the LF (Line Feed) character to start
the next line at the beginning of the line.
Chi-Squared-Test
Statistical mathematical test method to determine an existing normal distribution of the measurements (for more than 30 measurements).
Cp:
Capability Indexes
Cpk:
Capability Indexes
CR:
Carriage Return (CR)
Cu
Copper
S1
Page 125
Glossary
d. or d
Arithmetic mean value of the single readings, called arithmetic mean value (d., d ). The arithmetic mean value d. is the sum of all single readings
di of a measurement series (of a block), divided by the number of measurements.
n
d.
Mean value (block mean value)
i=1
Number of single readings (in

a block)
di
Single readings (of a block)
d 1 + d 2 + d 3 + ... + d n
1
d. = --------------------------------------------------- = ---
n
n
di
d..
Mean value of the block mean values of selected blocks. Analogous to the
arithmetic mean value (d.), the block mean values are added up and divided by the number of evaluated blocks nBl.
1
d.. = -------
n Bl
n Bl
d.i
i=1
d..
Mean value of the block mean values
nBl
Number of blocks
d.i
Block mean values
DUALSCOPE
Protected brand name of Helmut Fischer GmbH for the measuring instrument.
Standard
Calibration Standard
Single Reading
Measurement result that is displayed or printed after a single measurement

at the measurement location.
Final Result
Evaluation of all measurements or selected blocks of an Application (measurement application memory).

External Start
A setting in the menu function File/Properties/Measurement Acceptance.
Measurement Acceptance can be initiated by tapping the menu function

Meas/Initiate External Start, the command button Ext, by transmitting
commands from a connected PC.
Excess
Page 126
Curvature
The process capability is evaluated using the factors Cp and Cpk.

The capability index Cp is a measure for the spread of a process and its
ability for continuously producing parts according to specifications.
The capability index Cpk takes the position of the mean value in relation
to set specification limits into account.
OGW UGW
Cp = ---------------------------------6
and
OGW d..
Cpk = -------------------------3
d.. UGW
---------------------------
3
d..: Average of all group mean values

: Estimated value for the theoretical standard deviation =
nBl: Number of blocks
1
-------
n Bl
n Bl
si
i=1
si: Standard deviation of the individual blocks

USL: Upper specification limit
LSL: Lower specification limit
FDD Evaluation
Graphical presentation of the mean values of the measurement blocks (=

Features) in an ascending rank order.
Application:
By using the FDD, existing systematic differences of coatings can be
shown quickly and clearly in a graphical format
Example 1:
When painting car bodies, the desired homogeneous coating distribution
is not achieved if the settings of one or more spray robots is wrong or disturbed. If the readings of one feature (e.g, the hood) are combined into one
measurement block, then the systematic differences between various features (hood, roof, doors, trunk lid, etc.) can be recognized quickly using
FDD, and corrective measures can be initiated promptly.
Example 2:
When electroplating racks, parts may be coated inadequately due to erroneous current contacting or shadowing of flux lines. If the readings of adjacent parts of the rack are combined into one measurement block, then
the groups, which statistically do not fit together with the other groups,
i.e., which exhibit systematic differences, are identified clearly in the
FDD evaluation. This allows for easy localization of the source of the
error.
Fe
Magnetizable material made of steel or iron.

Error Cone
Confidence Borders
Page 127
Glossary
Capability Indexes
Glossary
Free-Running Mode
With the probe placed on the specimen, measurements are displayed continuously. Use the menu function Meas/Free-Running to enable the
free-running mode.
Gaussian Normal Distribution
Gaussian Probability Paper
Gaussian Distribution
Normal Distribution
Sum Frequency Chart
Normal Distribution
Accuracy
Qualitative designation for the degree of approximation of a measurement

result to the true value. Usually, the accuracy is divided into
Trueness
and
Precision.
Bell Curve
Normal Distribution
Specification Limits
The upper specification limit (USL) is the highest reading and the lower
specification limit (LSL) is the lowest reading allowed at the measurement
location.
Maximum Value
Maximum value measured in a test series.

Grubbs Test
Test method for outlier rejection. A method developed by Grubbs to test,

whether the highest or lowest single reading should be considered an outlier.
Population
All pieces or specimens to be measured. In practical applications, for example, all parts of a production unit, batch, etc.
Group Separator
Mark for the end of a block that can be transferred together with the measurement data to the PC. Default setting ASCII character 29.
Frequency Distribution
Page 128
Histogram
Graphical presentation of all readings of an Application (measuring application memory) according to their portions in classes (e.g., coating thickness ranges), where the class frequencies are illustrated by the contents of
rectangles. The class widths should be of equal size. Among other criteria,
the informational value of statistical results depends on the shape of this
distribution curve.
Interface
Interface,
Iso
Insulating material, electrically non-conducting, non-magnetizable.

Calibration Curve
(Characteristic, master characteristic) Quantitative relationship between

the signal of the probe and a scale for the coating thickness as represented
by the calibration standards.
log d
The coating thickness d is presented as a

calibration curve as a function of the normalized count rate Xn. The mid portion of
the calibration curve approaches a
straight line and constitutes the range
with the lowest relative measurement error.
Xn
1
As long as no normalization (coating/base material adjustment, measuring

system adjustment) or corrective calibration (adjustment of the measuring
system to the specimen) has been performed, the calibration curve is identical with the master characteristic. During a normalization or corrective
calibration, the calibration curve is adjusted to the individual measuring
application. The coefficients of the normalization or corrective calibration
are stored in the active Application (measurement application memory).
Calibration
In this manual, the term calibration is used as a comprehensive term for

the adjustment and the calibration: Adjustment of the instrument using
calibration standards to adapt the measuring system (instrument and
probe) to the measuring application.
Page 129
Glossary
Histogram
Glossary
(Standards) Object with essentially the same attributes as the specimen,

which differs only in the coating thickness and with a coating thickness
that has been determined with a very accurate measurement method. May
also be a foil.
Calibration Standards
Characteristic
Calibration Curve
Class
Range between a lower and an upper class boundary (limit values). The
readings of a measurement series can be sorted according to such classes
if they cover the entire measurement range without gaps. The class contents (frequency or number of measurements per class) plotted over the
classes is called a histogram.
Minimum Value
Minimum value measured in a test series.

Kolmogoroff Smirnoff Test
Statistical mathematical test method to determine the normal distribution

of the readings (for 5 to 30 measurements).
System Check
A significant part of monitoring the measurement devices. Calibration

standards or better yet, reference samples are used to check the calibration and to ensure the measurement stability.
One-point or two-point calibration. Adjustment of the instrument using 1

or 2 calibration standards. The corrective calibration includes calibration
and adjustment.
During the corrective calibration, the master characteristic (calibration
curve) is adjusted to the individual measuring application. The obtained
coefficients are stored in the active Application (measuring application
memory). The master characteristic itself remains unchanged.
Kurtosis
LF
Page 130
Curvature
Line Feed
LF line feed. Advances the printer paper by one line. Is usually used together with the CR (carriage return) character to start the next line at the
beginning.
Magnetic induction measurement method (DIN EN ISO 2178, ASTM B499)
Contacting measurement method. The excitation current generates a lowfrequency magnetic field with a strength that is dependent on the distance
between the measurement probe and the base material. The magnetic field
is measured by means of the measuring coil. The obtained measurement
signal is converted in the instrument to a coating thickness value via the
characteristic probe output.
-
Excitation
current
Soft iron core of the probe
U = f(d)
Measurement
signal
Low frequency alternating magnetic

field
Coating material
ferrous base material
Operating principle of the magnetic induction measuring method
Unit of Measurement
Unit for displaying measurement data. In coating thickness measurement,

the common units are m and mils. 100 m = 3.9 mils.
Master characteristic
(Characteristic probe output function) Original characteristic of the measurement system. The master characteristic is the basis for determining
the measurements because it represents the relationship between the probe
signal and the coating thickness. The coefficients of the master characteristic are stored in the probe plug.
Max
Highest measured value of a test series.

Maximum
Max
Page 131
Glossary
Line Feed
Glossary
Measuring
To measure means to compare!

The probe signal generated at the measuring position is compared to the
probe signal on the calibration standard. Using the calibration curve, the
instrument converts the probe signal to the measurement result, which is
presented in the specified unit of measurement.
Measuring Application
Properties of the test specimen with regard to measurement quantity, geometry, geometric dimensions, permeability, etc. The test method, the
measurement display mode, the probe and the type of instrument are all
determined by the measurement application.
Measurement Range
The range between two limit values within which a measurement is possible at a specified trueness and precision. In a narrower sense, it refers to
the range of the scale of an analog instrument. The measurement range depends on the measurement method, the design of the probe and the measuring application.
Measurement Error
The difference between the actual and the measured value of a measured
quantity. For measuring instruments, there is a distinction between random (unpredictable) and systematic (correctable) measurement errors.
Random errors determine the repeatability precision. Systematic errors
affect the trueness and the reproducibility. Systematic measurement errors are far more prevalent in practical applications. Systematic measurement errors can be traced back to 1. faulty calibration, 2. operating or personal errors and 3. deviations in the test conditions (inhomogeneities,
instabilities, material aging, etc.). They tend to lean in one direction. With
appropriate care, the influences 1. and 2. can usually be avoided or corrected or taken into account in the result.
Measurement Accuracy
Instrument Memory
Page 132
Accuracy
Application
A quality assurance task. It consists of ensuring at specified intervals that

the test equipment (instrument, probe) is still operating properly and calibrated correctly, and to take corrective measures, if necessary (recalibration or repair of the instrument).
System Check
Measuring Mode
This is the condition in which the instrument can capture and display measurement data. The display mode is determined by the respective measurement display settings.
Measurement Object
Object on whose surface the measurements are performed to determine

the coating thickness.
Measurement Series
A series of single readings between two block or final results.

Measurement Probe
Probe
Measurement Location
A limited and clearly defined location within a reference area of the specimen, where the coating thickness is to be determined.
Measurement Uncertainty
Measurement Method
A procedure and process for obtaining information from the specimen

concerning its properties. The measurement method is based on scientific
knowledge and is determined by the measuring application.
Reading
Numeric reading of an instrument supplemented by the unit of measurement. The measurement can be obtained from the result of a single reading or from the arithmetic mean of several single readings (for example
for the averaged display value (i individual values)).
Measurement Data Presentation
Refers to the manner of presentation and evaluation of measurement data.

In the FMP100, 3 presentation modes are available: Statistics display, histogram display and specification limit display.
Min
Lowest measured value of a test series.
Page 133
Glossary
Monitoring of the Test Equipment
Mean Value
Min
d. or
Mean Value of the Block Mean Values

Mean Range
d..
R.
NF Metals
Non-ferrous, non-magnetizable metals.

NF
Non-magnetizable material.
Ni
Nickel
Standard
Normal Distribution
Gaussian normal distribution, Gaussian distribution, bell curve.

Probability distribution discovered by C. F. Gau in 1794.
If a quantity X is classified as having normal distribution, 68.3 % of the
observed values X are within the -interval of the spread, around the
mean value of the quantity X. I.e., the following applies to 68.3 % of the
observed values: X + . In the following figure, this interval is
identified by the gray areas underneath the curve.
Probability P(X)
Glossary
Minimum
Page 134
Probability distribution
P(X) of a quantity X
with a normal distribution.
Normalized Count Rate
Count Rate
Normalization
Adjustment of the instrument to the material properties of the coating and/

or the base material (probe dependent). Thus, the normalization essentially defines the zero point or end point, respectively. A normalization is crucial for correct measurements due to the electrical conductivity and the
permeability of the specimen materials. The coefficients of the adapted
calibration plot are stored in the active Application (measurement application memory).
Offline
State of a peripheral device (printer or PC) connected to the instrument

that does not allow it to receive data.
Open Block
Group of readings for which the block has not yet been closed.
USL
The upper specification limit (USL) is the highest reading allowed at the
measurement location.
Page 135
Glossary
The probability distribution P(X) is symmetrical around the mean value

of the quantity X with normal distribution. Skewness and Curvature
equal zero for the normal distribution.
The populations that are examined for technical purposes often can be
classified as having normal distribution. However, the following fact is
of great significance: If several random samples of equal extent are
drawn from any population (blocks) and their mean values (block mean
values) are determined, these mean values will always have normal distribution (central limits theorem).
The mean value of these random sample mean values (block mean values) is an estimated value ( = d.) for the mean value of the population. Due to the normal distribution, the measurement uncertainty u can
be calculated using the standard deviation of the random sample mean
values.
The sum frequency chart shows, whether a quantity has normal distribution, with a straight line indicating normal distribution.
In the instrument, the test, whether the measurements at hand (random
samples) have a normal distribution is carried out using the Kolmogoroff
Smirnoff Test (for up to 30 readings) and the Chi-Squared Test (30 readings and up).
Glossary
Online
State of a peripheral device (printer or PC) connected to the instrument

that allows it to receive data. In this state, the device is ready for operation.
Parity)
An error check method for data transmission, where the cross-sum of all
error-free transmitted bit groups must always be even or odd. During data
transfer, the parity bits are linked to the data bits of each character or byte
to be transferred. In every word, this bit is set such that the sum of the
Ones of a byte are always an even or odd number. This corresponds to an
even or odd parity. The type of parity requirement must be defined prior
to data transfer. By checking the parity, the recipient can determine if bit
transfer errors occurred.
Precision
Agreement between the individual measurement results under precisely

defined test conditions; the precision is comprised of reproducibility and
repeatability precision.
Specimen
Measurement Object
Quality Assurance
All measures taken in a plant that are concerned with ensuring that a controlled production within established quality requirements can take place.
One partial aspect of it is quality monitoring of which coating thickness
measurement is a part.
R
The range R equals the difference between the highest reading (Maximum) dmax and the lowest reading (Minimum) dmin of a measurement series.
R = dmax - dmin
Page 136
Mean range of all block ranges.

R. = d 2
Range
R.:
:
Mean range
d2:
Factor, depends on the random sample size, can be obtained

from popular published tables.
Estimated standard deviation of the population
Reference Area
A defined partial area of the specimen surface with a known coating thickness.
Trueness
Agreement between the true value and the mean value of a measurement result generally obtained under practical circumstances. The true
value is considered a value known based on mathematical theoretical approaches. Since such values are rarely available, a value traced to national
or international standards is generally assumed to be correct. This correct value is often called the true value.
USB Port
Interface that is used for connecting instruments with PCs, printers, USB
sticks and USB keyboards.
SS
Estimated value for the standard deviation of the population. Is output

only in the final result for Applications (measurement application memories), for which automatic block creation has been enabled.
R.
= ----d2
Estimated value of the standard deviation of the population
R.
Mean range
d2:
Factor, depends on the random sample size, can be obtained from

popular published tables.
or for preset specification limits:
Page 137
Glossary
R.
Glossary
OGW UGW
= ----------------------------------6 Cp
Estimated standard deviation of the population
USL: Upper Specification Limit

LSL: Lower Specification Limit
Cp:
Capability factor (default setting 1.33)
The standard deviation s is a measure for the spread of the single readings
of a measurement series from their common mean value. It is equal to the
mean square deviation of the single readings from the mean value and is
calculated in the following manner:
s =
1 ----------
n1
i=1
( d. d i )
s:
Standard deviation
d.:
Mean value across all single readings
n:
Number of single readings
di:
Single readings
The following figure points out that two very different measurement
series can have different standard deviations even with the same mean
value.
Measurement series with the same mean value d. and different

standard deviations
sa
Spread of the mean values of various groups (Blocks Block), corrected

with regard to the spread of the single readings. To be able to calculate sa,
the spread of the group mean values SII must be significantly greater than
the spread of the single values SI within the group.
If, for example, the same number of measurements per measurement spot
is performed at several measurement spots, and the measurements per
spot are combined in one group (block), then SI is a measure for the instru-
Page 138
F beo 1
sa = S I -----------------n Bl
S II
- (
F beo = ------2
SI
Variance-analytical evaluation)
sa:
corrected spread of the block mean values
SI:
Spread of the single readings
SII:
Spread of the group mean values
nBl:
Number of measurement data groups
Fbeo: Check value for decisions regarding the question
Estimated Value for the Coefficient of Variation

Estimated Value for the Standard Deviation
V VDach
SS
Skewness
Measure for the asymmetry of a single-peak probability distribution

around its mean value. A positive skewness indicates a distribution with a
peak that stretches more toward values that are greater than the mean value. A negative skewness indicates a distribution with a peak that stretches
more toward values that are smaller than the mean value. The skewness
for a symmetric distribution (normal distribution) is zero.
Interface
Transfer or connecting point between components, circuits or programs.

A data exchange is carried out via the interface. With serial interfaces, the
data are transferred in individual bits (i.e., one bit after another), with parallel interfaces, several bits are transferred simultaneously.
Sigma Limits Around a Regression Line
The sigma limits around the regression line constitute the confidence interval around the straight line, where the straight line is located at a confidence level of 95% (the value 95% is defined internally in the FMP100
unit).
Page 139
Glossary
ment spread and sa is the product spread adjusted by the instrument

spread.
Glossary
Supervisor Code
Password for a menu function to prevent unintended changes of the parameter settings.
Factory default password: 159
The user can change the factory default password.
Probe
Transducer that delivers an electrical signal to the instrument based on a

particular measurement method. This signal is proportional to the coating
thickness and is converted in the instrument into a corresponding coating
thickness value according to the master characteristic and the normalization and calibration coefficients of the open Application (measurement
application memory). All probes of Helmut Fischer GmbH have been
master-calibrated in the plant.
Probe Frequency
A generator feeds the measurement probe with an alternating current of a

certain frequency. The applied frequency is determined by the measuring
application and the probe type.
Probe Characteristic
Range
Master characteristic
Standard Deviation
Start Bit
With asynchronous serial data transfer, a start bit is transmitted before the
data word to be transferred. With the logic One to logic Zero transition of
the start bit, the receiver can be synchronized to the subsequent data bits.
Statistics
The result of a measurement series, i.e., the compilation of a large number

of single readings into a few characteristic quantities (e.g., mean value,
standard deviation, etc.)
Statistical Evaluation
Calculation using the measurement data according to statistical mathematical methods.
Page 140
Some parts of the population. In practical applications, a small part of a

production batch taken from the production according to random sampling methods; the results of the random sample are extrapolated to the entire batch (lot, production unit).
Stop Bit
With asynchronous serial data transfer, the stop bit is added to the data
word to be transferred. 1 to 2 bit logic Ones are used. After the stop bit,
the transmitter remains at logic One until the start bit of the next character
arrives.
Spread of the Block Mean Values
Student Factor
sa
Sum Frequency
The sum frequency is that portion of parts (in percent), where the coating
thickness is smaller or equal to a particular measurement. In a sum frequency chart, the sum frequency can be viewed referenced to the coating
thickness. Example: One realizes that 9% of the parts exhibit a coating
thickness of less than or equal to 39 m (1.56 mils).
Sum Frequency Chart
Graphical presentation method that can be used to check the measurements for normal distribution. A straight line in the sum frequency chart
indicates a normal distribution.
Systematic Measurement Error
Measurement Error
The student factor t can be obtained from popular published tables (e.g.,
Graf, Henning, Stange, Wilrich: Formeln und Tabellen der angewandten
mathematischen Statistik [Formulas and Tables in Applied Mathematical
Statistics by Graf, Henning, Stange and Wilrich]; Springer-Verlag) and is
stated as follows:
t
Part
1
--- ;f
Example for a confidence level of 95 % and n > 200 (and thus, degree of freedom 199, since f = n - 1) the student factor is
t97.5; 199 = 1.96.
Specimen
Page 141
Glossary
Random Sample
Glossary
Page 142
Every instrument is subject to random measurement errors

(
Accuracy). With a certain probability (the confidence level), the presumed true value () of the measured quantity lies within an interval
around the measured mean value d. of a measurement series. The interval
is also refereed to as confidence interval. The boundaries of this interval
are at a distance u, the measurement uncertainty, from the mean value .
d. u d. + u
For a population with normal distribution, the measurement uncertainty

u for a set confidence level (1 - ) is calculated according to the following formula: u is
t:
ts
u = -------n
Student factor (can be obtained from popular published tables,

e.g., Formeln und Tabellen der angewandten mathematischen Statistik [Formulas and Tables in Applied Mathematical
Statistics] by Graf, Henning, Stange and Wilrich). For example, at a 95% confidence level and n > 200, the student factor
is t97.5; 199 = 1.96.
s:
Standard deviation
n:
Number of measurements
By entering the coefficient of variation V in the equation, the relative

measurement uncertainty urel in % is obtained.
tV
u rel = --------- [ % ]
n
Transfer Rate
Baud Rate
LSL
Lower specification limit; is the smallest reading allowed at the measurement location.
u-Scale
Scale on the right ordinate in the printout of the sum frequency chart. Linear transformation of the measurements into standardized features u. The
transformation serves comparison and analysis purposes. The standardized feature values are without dimension; their arithmetic mean u is Zero
and their standard deviation (u) is always 1.
d
u = -----------
u:
Feature value
d:
Measured value
:
:
Mean value of the population

Standard deviation of the population
Page 143
Glossary
Glossary
Coefficient of variation. The spread of a measurement series in percent,

i.e., the standard deviation in reference to the mean value. V [%] is a characteristic process constant. A sudden change in V [%] indicates a change
in the process conditions. V is calculated in the following manner:
s
V = ---- 100 [ % ]
d.
V:
Coefficient of variation
s:
Standard deviation
d.
Mean value
VDach
Estimated value of the coefficient of variation.
V = ------ 100 [ % ]
d..
V :
:
d..
Estimated value of the coefficient of variation

Estimated value of the standard deviation of the population
Mean value across the block mean values
Variance
Mean squared deviation. The square root of the variance is called standard
deviation (s).
1
2
s = ------------
n1
i=1
( d i d. )
s2:
Variance
d.:
Mean value of the single readings
di:
Single readings
Number of measurements
Variance-Analytical Evaluation
Statistical method for checking the mean values of various random samples to determine, whether they are comparable or exhibit significant differences. The spreads of the group mean values is compared to the mean
spread of the single readings within the groups.
The check value Fbeo is determined (
sa) and based on a comparison
with the table value FTab, a determination is made, whether a significant
difference between the measurement groups exists.
Example: Variance analytical evaluation when measuring k random samples (groups, Blocks
Block), each with n single readings.
Page 144
sj
SI2:
j=1
n
2
S II = ----------k1
( xj x )
j=1
with:
1
x = --k
Glossary
1
2
S I = --k
Mean value of the squared group spreads sj2
k:
Number of random samples
SII2:
Squared spread of the group mean values
xj :
Group mean value of the group
Number of single readings per group
Mean value of the group mean values
Fbeo
Check value for deciding the answer to the question

(in the instrument possibly designated with Fb)
xj
j=1
2
S II
F beo = ------2
SI
If the condition Fbeo FTab is met, the mean values of the random samples
belong to a common population. If Fbeo > FTab, then the mean values are
significantly different. The characteristic value sa (
sa) states the
spread of the mean values corrected with regard to the spread of the single
readings.
FTab
Table value of the F-distribution with Ff1, f2, 1-
Degrees of freedom with f1 = (k-1) and f2 = k (n-1)
Significance level
Coefficient of Variation
Reproducibility
Term for the differences of the individual measurement results under reproducibility conditions. Reproducibility conditions refer to measurements on a specimen according to a specified method, e.g., at different
times or with different instruments or with different observers or at different locations. Measurement results that have been obtained by different
persons using different instruments at different locations on the identical
specimen must be comparable. The reproducibility is the basis for computing the confidence interval for the expected value.
Confidence Interval
Confidence Borders
An area of the sum frequency chart, where the sum plot can be found.
With 95% certainty (confidence level), the true portion following below
the respective feature value (e.g., coating thickness) can be found within
these borders. For a normal distribution, the confidence borders ptop and
pbottom are calculated as follows:
Page 145
Glossary
p unten
d. 2
d
-------------
d d.
1
--- ---------------------= ------------ 1,96 n + 2n 2
pbottom: Lower confidence border

ptop: Upper confidence border
d:
Measured value
d.
Mean value
n:
Number of all single readings
p oben
d. 2
d
------------
d------------ d.
1
=
+ 1,96 --- + ----------------------
n
2n 2
Estimated value for the standard deviation for the population
For measurements not having normal distribution, the confidence borders are entered into the sum frequency chart as a polygon plot and computed as follows:
2
1 ( y p ( i ) ) -
p unten ( i ) = y p ( i ) 1,96 --- + -----------------
n 2n 2
yp(i): y-Values of the polygon (sum

curve when the measurements do not have normal distribution) where i = 1 to n - 1.
1 ( yp ( i ) )
-
p oben ( i ) = y p ( i ) + 1,96 --- + -----------------n 2n 2
Confidence Level
True Value
Trueness
Probability Chart
Repeatability
Page 146
Sum Frequency Chart

Repeatability Precision
Repeated measuring under consistent conditions at the same measurement

location leads to random deviations of the measurement data. Consistent
conditions means the same observer performing measurements according
to a specified method on an identical specimen within short periods using
the same instrument at the same location. The standard deviation of the
measurement data obtained under repeatability conditions is a measure for
the repeatability precision. A large standard deviation or measurement uncertainty of an instrument indicates a poor repeatability precision. The
smaller the standard deviation, the better the repeatability precision. The
repeatability precision is dependent on the measurement method and the
properties of the instrument but also on the properties of the specimen.
The repeatability precision can be improved by generating mean values of
the measurement series (i single readings).
Eddy Current Method, Amplitude-Sensitive (DIN EN ISO 2360)
The excitation current generates a high-frequency magnetic field that induces eddy currents in the material. The development of these eddy currents depends on the distance (coating thickness) between the measurement probe and the base material. The measurement signal, which
captures the reaction of the magnetic field of the eddy currents on the original magnetic field, is converted into a reading that is proportional to the
coating thickness.
Ferrite core of the probe
Excitation
current
U = f(d)
High frequency alternating magnetic field
Measurement signal
Coating material
d
base material
induced eddy currents
Principle of the amplitude sensitive eddy current method
Curvature
The curvature is a measure for how pointed (Excess) or how flat (Kurtosis) a distribution is compared to a normal distribution. A positive curva-
Page 147
Glossary
Repeatability Precision
Glossary
ture is an indication for a relatively narrow and pointed distribution. A

negative curvature indicates a relatively flat and wide distribution. The
curvature for a normal distribution is Zero.
X
Count Rate
XN
Count Rate
Count Rate
X (Phi). Probe signal displayed as a number of electrical impulses. Phi

corresponds directly to the measured quantity. The Phi values range between the two extremes Xmin and Xmax.
In general, displaying the count rate X serves the purpose of determining
whether a noticeable measurement effect is present for a particular measuring application.
The numeric values for the normalized count rate XN are between 0
and 1 and are calculated according to the following equation:
X X0
XN = -------------------XS X0
XN:
normalized count rate
X:
Count rate for the reading
X0:
Count rate of the pure, solid coating material
XS:
Count rate in air (= no electrical conductivity)
Random Measurement Error

Two-Point Calibration
Page 148
Measurement Error
13 Index
A
Accessoires 19
Accuracy 128
Acoustic signals 72, 73, 98
Air humidity 22
Ambient Temperature 9
Amplitude-Sensitive Eddy Current
Method 147
Analog display 97
Application 123
Save 41
Application Memory 123
Application Selection 123
Area measurement 71, 102
Arithmetic Mean Value 126
Automatic Block Creation 124
Automatic measurement 102
Automatic measurement acquisition
70, 72
B
Battery
Battery compartment 13
Battery compartment cover 28
Battery replacement 28
Symbol 15
Baud 124
Baud Rate 124
Bell Curve 128, 134
Bidirectional Data Exchange 124
Bidirectional data exchange
Control commands 84
Bit 124
Block 124
Block Mean Value 125
Block Result 124
Block Size 125
Operator's Manual FMP10 /FMP 20
End 124
Open 125
open 135
Block Creation
automatic 124
Block Mean Value 125,
Block mean values 94
Block Range 136
Block Result 124
Block Size 125
126
C
Calibration 129
Corrective Calibration 130
deleting 52
Master calibration 57
Calibration Curve 129
Calibration on coating 41, 53
Calibration Standard 130
Certification 21
Calibration Standards 11, 20,
130
Capability Index 127
Capability Indexes
Cp, Cpk 127
Carriage Return 125
Characteristic 129
Chi-Squared-Test 125
Class 130
Coefficient of Variation 144
Confidence Borders 145
Confidence Interval u 145
Confidence Level u 146
Contents of Shipment 23
Contrast 89
Control commands 84
Copper beryllium 20
Corrective Calibration 130
Corrective calibration 41, 47,
48
Seite 149
Corrective Calibration deleting

Count Rate 148
Cp 127
Cpk 127
CR 125
Curvature 147
D
Data Exchange
bidirectional 124
Data transfer
virt. COM-Port 83
Description
Technical Terms 123
Device mode 95
Display 104
free-running 15
Driver installation 82
DUAL
DUAL probe 26, 44
Setting dual mode 39
Dual method 105
Dual probe
Measurement method 73
E
Eddy Current Method
amplitude-sensitive 147
EEPROM 19
Eingeschrnkter Bedienmodus
14
EMC 9
End of Block 124
Environmental Conditions 9
Error mesages 114
Estimated Value 137
Evaluation 123
statistical 140
variance analytical 144
External Start 100, 126
Seite 150
52
F
FDD Evaluation 127
Fe 127
Final Result 126
Free-running display 15
FreeRunning Mode 128
Free-running mode 94
Frequency Distribution 128
G
Gaussian Distribution 134
Gaussian Normal Distribution
128, 134
Gaussian Probability Paper 128
Glossary 123
Group Separator 128
Group separator 94
Grubbs Test 128
H
Histogram
129
I
Instrument
Contents of Shipment 23
Dimensions 21
On/Off 33
Options 23
Power Connection 27
Power consumption 22
Repairs 11
Warrantee 12
Weight 21
Instrument configuration 108
Print form 108
Instrument mode 95
Instrument setting 86
Service functions 86
Instrument settings
Analog display 97
Area measurement 102

Contrast 89
Display 104
Dual method 105
External Start 100
Instrument mode 95
Language 88
Lighting 90
Limited operating mode 95
Measurement acquisition signal
98
Measurement effect 99
Measurement output 94
Measuring mode 104
Re-initialization 93
Storage mode 107
Switch off mode 92
Unit of Measurement 106
Insulating Material 129
Intended Use 8
Iso 129
K
Keys 13
Arrow down 18
Arrow up 18
CAL 17
DEL 16
ENTER 18
FINAL-RES 17
ON/OFF 13, 17
SEND 18
ZERO 17
Kolmogoroff Smirnoff Test
L
Language 88
LCD Display 13,
LCD display
Contrast 89
Lighting 90
LF 131
14
130
Lift-off distance 22
Lighting 90
Limited operating mode
Line Feed 131
Low Voltage 9
LSL 128, 143
95
M
m 131
Magnetic Induction Measuring Method 131
Making measurements
acoustic signals 73
Malfunctions 110, 114
Master Calibration
Normalized Countrate Xn of a Calibration Standard 65
Xn Ranges for Calibration Standards 63
Master calibration 41, 57,
59, 107
Master Characteristic 129, 131
Master foil 20
Mean Value 126
Block Mean Value 126
mean Value
arithmetic 126
Measurement
Influencing parameters 66
Making 67
Preparation 66
Measurement Acquisition 69
Area measurement 71
Measurement acquisition
acoustic signals 72
Automatic 70, 72
Measurement Data Presentation
133
Measurement Error 132
Measurement Location 133
Seite 151
Measurement Method 33, 133

Amplitude-sensitive eddy current
method 147
Measurement method 25
Amplitude-sensitive eddy current
method 25, 26
Magnetic induction 25, 26
Measurement Object 133
Measurement Range 132
Measurement Series 133
Measuring Application 132
Measuring Method
magnetic induction 131
Measuring Mode 133
Measuring mode 104
Measuring modes 21, 35
Messages 114
mils 131
Monitoring of the Test Equipment
133
N
Normal Distribution 134
Gaussian 128, 134
Normalization 41, 45, 135
Normalized Countrate Xn 65
O
Offline 135
Offline operation 83
On/Off 33
One-Point Calibration 130
Online 136
Online operation 83
Open Block 125, 135
Operating Personnel 8
Options 23
Outlier rejection 123
Outliers 123
Seite 152
P
Parity 136
Peep tone 72, 73, 98
Population 128
Power Connection 9, 27
Power consumption 22
Power-Up 34
Precision 136
Probe 19, 140
Angle probe 67
axial 67
Connection 30
Connector Socket 13
Handling 10, 37
Two-tip 68
probe
assigning 38
Probe Characteristic 131
Probe connector 30
Probe connector socket 31
Probe Frequency 140
Probe plug 19, 31
Q
Quality Assurance
136
R
R 136
R. 136
Random Sample 141
Range 136
R 136
R. 136
Reading 133
Single Reading 126
Readings
Transfer to PC 83
Rechargeable battery 28
Reference Area 137
Reference Measurements 44
Regression Line 139

Reinigung 36
Repairs 11
Repeatability 136
Repeatability Precision 147
Reproducibility 136, 145
S
s 138
Service function
Analog display 97
Area measurement 102
Contrast 89
Display 104
Dual method 105
External Start 100
Instrument mode 95
Language 88
Lighting 90
Measuring mode 104
Storage mode 107
Switch off mode 92
Unit of Measurement 106
Service functions 86
Sigma Limits 139
Single readigngs 94
Single Reading 126
Skewness 139
Specification Limit
LSL 128, 143
USL 128
Spread 138
s 138
Standard Deviation 138
Estimated Value 137
Start Bit 140
Statistical Evaluation 140

Statistics 140
Stop Bit 141
Storage mode 107
Student Factor
t 141
Student factor 141
Sum Frequency 141
Sum Frequency Chart 141
Supervisor Code 140
Supervisor Password 140
Switch off mode 92
Switch on 34
System Check 130
T
t 141
Technical Data 21
Technical Terms 123
Temperature
Operation 21
Storage 22
Temperature Range During Storage
and Transport 9
Transfer formats 84
Trueness 137
Turning Off the Instrument 35
Two-Point Calibration 130
U
u 145, 146
Unit of Measurement 106, 131
USB
Connection 82
Connector 13, 22, 81
Driver 82
Port 82
USB connection 81
USB Port 137
u-Scale 143
Seite 153
USL 128
Specification Limit
USL 135
V
v 144
Variance 144
Variance Analytical Evaluation
144
Voltage supply 22
W
Warning messages
Warrantee 12
Weight 21
114
X
Xn
65
Seite 154
Sales and Service Departments

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Valid for Helmut Fischer AG and

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Operators Manual

Operator's Manual FMP10 / FMP20

Trademarks and Liabilities . . . . . . . . . . . . . . . . . . . . . . . 7

Symbols and Conventions Used in the Manual . . . . . . . 7

Requirements on the Operating Personnel . . . . . . . . . . 8

Handling, Storage and Transport of Calibration

2 Description of the Instrument . . . . . . . . . . . . . . . . . . 13

Control panel key functions . . . . . . . . . . . . . . . . . . . . 16

2.5 Contents of Shipment and Options . . . . . . . . . . . . . . . 23

3 Measurement Methods for Coating Thickness

Magnetic Induction Method . . . . . . . . . . . . . . . . . . . . . 26

Eddy Current Method . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Measurements With DUAL Probes

Operator's Manual FMP10 / FMP20

4 System Setup, Maintenance and Cleaning . . . . . 27

4.3 Turning the Instrument On/Off . . . . . . . . . . . . . . . . . . 33

Handling During Measurements . . . . . . . . . . . . . . . . . 37

Assigning a New Probe

Setting Up the Dual Mode for DUAL Probes

6 Normalization, Calibration and Master Calibration 41

Information Regarding Normalization, Calibration

Specific Features of DUAL Probes

Operator's Manual FMP10 / FMP20

6.7.4 Displaying Xn Ranges for Calibration Standards

Determination of the Normalized Countrate Xn of

Preparing for a Measurement

7.3 Making a Measurement . . . . . . . . . . . . . . . . . . . . . . . 67

Installing the USB Driver . . . . . . . . . . . . . . . . . . . . . . . 82

9.3 Transfer of the Measurement Data to the Computer . 83

Operator's Manual FMP10 / FMP20

10 Instrument Settings in the Service Function Menu 86

10.8 Performing a Master Calibration . . . . . . . . . . . . . . . . 107

11 Malfunctions and Messages . . . . . . . . . . . . . . . . . . 110

Operator's Manual FMP10 / FMP20

Operator's Manual FMP10 / FMP20

Trademarks and Liabilities

Symbols and Conventions Used in the Manual

The following symbols and conventions are used in this manual:

Indicates a reference to a page or chapter in this manual.

Operation to be carried out by the operator at the instrument.

Writing convention for instrument keys and command buttons on the

Operator's Manual FMP10 / FMP20

Requirements on the Operating Personnel

In addition, basic knowledge of metrology according to DIN 1319 is essential for

Operator's Manual FMP10 / FMP20

Operator's Manual FMP10 / FMP20

Fig. 1-1 Probe handling

Operator's Manual FMP10 / FMP20

Handling, Storage and Transport of Calibration

The instrument is calibrated using calibration standards in the form of foils or

No repairs should be performed on the instrument.

Operator's Manual FMP10 / FMP20

cher GmbH Institute for Electronics and Metrology.

been carried out by authorized persons.

ard or very hot environments).

Operator's Manual FMP10 / FMP20

Description of the Instrument

Probe connector socket,

Keys for directly retrieving

USB port for connecting a