Draft130822 MCNDT Paut&Tofd Reva

PA UT/TOFD Technology
and Products
Gary Gries
Account Manager
zNDT Solutions
Zetec Mission
Zetec is a leading supplier of
mission critical NDT solutions
for various industries
Our
technology,
testing
methods, integrated systems,
and services keep the industry
safe, productive, and cost
efficient.
ZETEC, Inc. Proprietary / Company Sensitive
Corporate History
Zetec Founded in 1968
Acquired in 2003
by Roper Industries
Acquired Steam Generator and Power Generation EC/UT assets
of RD Tech in 2004
100 Best Managed Companies

Forbes, Jan 2007
3
Zetec Markets
Power Generation Industry
Nuclear Steam Generators

Pressure Vessel Components
Turbines/Generators
Main Coolant Piping
Heavy Industry
Nuclear Navies
Oil & Gas
Transportation
Aerospace
4
zNDT - Value Proposition: Expertise

Center of Excellence based in Qubec Office (Canada)
Market focus: Encoded inspection solutions ( permanent
inspection records, offline analysis)
Technology focus: Phased Array UT & TOFD
Products:
Portable PA UT units : ZIRCON, TOPAZ
DYNARAY PA UT product line, Z-ScanUT
UltraVision, industry leading software suites
Integrated and Customized Solutions
Qualified Techniques
Customer Support and Field expertise
PA UT and TOFD
Technologies
PA UT Technology - Principle
Definition :
Capability to electronically control the UT beam shape
Objectives:
Reduce the number of probes (scanner simplifications)
Increase the resolution and coverage (smaller beam,
more beam angles)
Increase the scanning speed (less probes less scans)
Phased Array Technology

Phased Array Acoustic Beam

Beam forming / Emitter
Delay
Time
Wedge
Material
Element
Applied delays = Focal law
Wavefront
Applied delays (focal law) will serve as :

Wedge to create an angle beam;
Crystal curvature for focusing;
Or both.
Beam forming / Emitter, Pulse Echo mode

Single A-Scan equi. to CV probe
Summing of Signals
Time
Delay
Delay
Wedge
Material
Element
Applied delays = Focal law

Linear Scanning
Aperture Position
Selection of aperture position : Optimize beam position
Electronic scanning or
Linear scanning

Depth Scanning
Beam Focusing
OR
Angular Scanning (or Sectorial Scanning)

Beam Steering
OR
TOFD Inspection Technology

TOFD is well suited for
detection, characterizing and
sizing of embedded flaws
TOFD is well suited for
inspection of narrow-gap
welds (lack of interrun fusion)
TOFD can replace straight
beam examination for
delaminations
14
Combined PA UT and TOFD

In Lieu of RT for
Carbon Steel Weld Inspection
15
Introduction
Manufacturing inspection of
vessel welds requires a volumetric
NDE technique
The use of Radiographic Testing
(RT) comes with inherent
radiation safety issues and
productivity issues (welding shop
to be evacuated)
Replacing RT by a combination of PA UT and TOFD can drastically

reduce the inspection time, and provides permanent records
16
Overview
Inspection Technique Design
Challenges
Zetec Integrated Solutions
Conclusions
17

Multiple TOFD pairs are required for full volumetric coverage
of welds with wall thickness over 50 mm
Recommended TOFD configurations are given in both
ASME V, Art. 4, non-mandatory App. O and XP CEN/TS 14751
TOFD with conventional UT probes allows for optimisation of
each probe pair (frequency, aperture, PCS, )
18

Pulse-echo PA UT using Sectorial Scans is allowed by ASME Code
Section VIII, provided the performance is "satisfactorily
demonstrated"
PA UT can be set-up to cover the whole examination volume
19

Alternatively, PA UT can be used only for its excellent capability
in detecting and characterizing surface breaking defects
20

Performing a combination of two-sided PA UT and multiple
TOFD techniques in a single one-line sequence can drastically
reduce the inspection time
21
Challenges - Hardware
Hardware needs to be capable of adequately and
simultaneously performing multi-channel TOFD and PA UT :
Sufficient channels available
Appropriate excitation pulse for TOFD
Fast scanning and continuous recording is required to fully

benefit from the potential of the inspection technique :
High PRF
High data throughput
Capability to record large data files (sectorial scan data)
Compact, robust equipment is an asset for "on-site"

deployment
22
Challenges - Software
Setting up a configuration with 2 sectorial scans and multiple
TOFD requires tools to generate a comprehensive scan plan
Easy and efficient visualization of PA UT and TOFD data
Software should guide the analyst in finding and evaluating
relevant indications :
On-board Merge to expedite analysis of large volume of PA UT data
Tools for rapid amplitude drop-sizing or tip diffraction sizing
Indication Table for examination report generation
23
Zetec Integrated Solutions

Carefully selected PA UT and TOFD probes for various
thickness ranges, taking into account :
Code compliance
Economical considerations
Single software platform for planning, execution and

analysis of weld inspections
State-of-the-art hardware and software
Scanning mechanisms
24
PA UT and TOFD Probes & Wedges

Wall Thickness 2" (50.8 mm)
25
Standard PA Probes
Complete line of standard 1D PA probes

For use with TOPAZ, ZIRCON and DYNARAY
Probe detection Interaction with UV3
19 different models in 6 different casings
Adapters for Hypertronics & Omni
Type A S, M, L, XL
Type L M, L
26

Configuration for 0.5" (12.7 mm) Weld
Requires 2 x 16 PA channels and 1 TOFD channel
27

Configuration for 2" (50.8 mm) Weld
28

Alternative Configuration for 2" (50.8 mm) Weld
29

Wall Thickness between 2" and 6" (50.8 and 152.4 mm)
30

Configuration for 5" (127.0 mm) Weld
Requires 2 x 32 PA channels and 3 TOFD channels
31

Wall Thickness between 7" and 12" (177 and 305 mm)
32

Configuration for 12" (305 mm) Weld
Requires 4 x 32 PA channels and 4 TOFD channels
33
Hardware Solutions
Ideal solution for welds up to 4"
(100 mm) thick
Supports up to 2 PA UT probes
and 2 TOFD pairs at 200 V
Robust, battery-operated
Portability and flexibility "on-site"
34
Fully-integrated PA UT system
Battery operated
10.4 Multi-touch screen
Rugged with no air intake
Lightweight, 5.9 kg
UltraVision Touch embedded
32/128PR with 2 UT channels
Available since March 2013 !
35
Flexibility : Stand-alone or Connected

Remote Data Analysis
on separate PC
PC Control with
UltraVision Touch
Control & Analysis
with UltraVision 3
36
Portable RDAU-type system

Phased Array UT: 32/128PR
UT : 2 P/R channels at 200 V
Lightweight
Airtight, Battery operated
UltraVision3 controlled
Available since March 2011
37
Hardware Solutions
Ideal solution for welds over 4"
(100 mm) thick
Supports all PA UT & TOFD
configurations
For maximum performance in
shop conditions
38
Product Line
High-Performance Phased Array UT
Up to 256 beam forming channels
Modular concept, allowing for reduced
configurations and upgrading :
Non-multiplexed :
Lite (64/64PR), 128/128PR, 256/256PR
Multiplexed:
64/256PR
Sold to customers worldwide : USA, Canada,

Europe and Asia
39
Software Solution
UltraVision Touch
UltraVision 3
Include all tools for efficient recording, analysis
and reporting of PA UT and TOFD data
40
Data Visualization & Analysis

41
PC-based software, runs under Windows XP ,Vista or 7 (32 or 64 bits)

Evolution of TomoView, with many improvements and new features
Drives ALL Zetec UT & PA hardware
Reads *.DAT and *.RDT examination data, back to 1992

Sold to more than 150 customers worldwide
Formally qualified with numerous UT & Phased Array procedures
Documented equivalency with previous versions
42
MultiMag Scanner
Encoded, manually driven
Compatible with Zetec
PA UT systems
For one-line sequences
Supports up to 2 PA UT
probes and 2 TOFD pairs
Quick release handles for
fast & easy setup
Magnetic wheels
Operates from 3.5 to flat
43
Case Study : 12 CS Pipe Weld

Realistic CS pipe specimen with
welding defects (FlawTech) :
12 NPS CS pipe weld
T = 17.48 mm
Crown as-welded
Setup and examination with

TOPAZ, using PA UT and TOFD
Data analysis using UV Touch
FlawTech Specimen - Defects
Inspection Techniques
PA UT from both sides of the weld : AM - 5 MHz (16 elements)
TOFD : 10 MHz ( 3 mm), 70LW
Flaw 1 Lack of Fusion
Excellent specular reflection after skip
Flaw 2 Incomplete Penetration
Excellent detection of both edges of the

incomplete penetration
Flaw 3 Toe Crack
Excellent TOFD detection

Broken lateral wave and crack-bottom tip diffraction
Flaw 4 Cluster Porosity
Excellent detection using 12dB of software gain
Reporting
Report provided by specimen

manufacturer
Report generated by TOPAZ
Conclusion
Replacing RT by a combination of PA UT and TOFD eliminates
radiation safety issues, and can drastically reduce the inspection
time, while providing excellent examination capability and
permanent records
"UT in Lieu of RT" is now accepted by various codes
PA UT and TOFD probe configurations for various thickness ranges
have been selected
Zetecs advanced hardware and software support combined PA
UT and TOFD for rapid, efficient and code-compliant weld
inspections
52
Thank You!

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PA UT/TOFD Technology

ZETEC, Inc. Proprietary / Company Sensitive

100 Best Managed Companies

ZETEC, Inc. Proprietary / Company Sensitive

Nuclear Steam Generators

ZETEC, Inc. Proprietary / Company Sensitive

zNDT - Value Proposition: Expertise

ZETEC, Inc. Proprietary / Company Sensitive

ZETEC, Inc. Proprietary / Company Sensitive

ZETEC, Inc. Proprietary / Company Sensitive

Phased Array Technology

ZETEC, Inc. Proprietary / Company Sensitive

Phased Array Technology

Applied delays = Focal law

Applied delays (focal law) will serve as :

ZETEC, Inc. Proprietary / Company Sensitive

Phased Array Technology

Beam forming / Emitter, Pulse Echo mode

Applied delays = Focal law

ZETEC, Inc. Proprietary / Company Sensitive

Phased Array Technology

Selection of aperture position : Optimize beam position

ZETEC, Inc. Proprietary / Company Sensitive

Phased Array Technology

ZETEC, Inc. Proprietary / Company Sensitive

Phased Array Technology

Angular Scanning (or Sectorial Scanning)

ZETEC, Inc. Proprietary / Company Sensitive

TOFD Inspection Technology

Combined PA UT and TOFD

Replacing RT by a combination of PA UT and TOFD can drastically

Inspection Technique Design

Inspection Technique Design

Inspection Technique Design

Inspection Technique Design

Fast scanning and continuous recording is required to fully

Compact, robust equipment is an asset for "on-site"

Zetec Integrated Solutions

Single software platform for planning, execution and

PA UT and TOFD Probes & Wedges

Complete line of standard 1D PA probes

ZETEC, Inc. Proprietary / Company Sensitive

PA UT and TOFD Probes & Wedges

PA UT and TOFD Probes & Wedges

PA UT and TOFD Probes & Wedges

PA UT and TOFD Probes & Wedges

PA UT and TOFD Probes & Wedges

PA UT and TOFD Probes & Wedges

PA UT and TOFD Probes & Wedges

ZETEC, Inc. Proprietary / Company Sensitive

Flexibility : Stand-alone or Connected

ZETEC, Inc. Proprietary / Company Sensitive

Portable RDAU-type system

ZETEC, Inc. Proprietary / Company Sensitive

Lite (64/64PR), 128/128PR, 256/256PR

Sold to customers worldwide : USA, Canada,

ZETEC, Inc. Proprietary / Company Sensitive

Data Visualization & Analysis

PC-based software, runs under Windows XP ,Vista or 7 (32 or 64 bits)

Reads .DAT and .RDT examination data, back to 1992