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however, subtle processes which involve the specimen, the however, subtle processes which involve the specimen, the electron beam and any mobile species on the sample electron beam and any mobile species on the sample surface frequently... more
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      Materials ScienceCrystallographyElectron MicroscopyElectron Backscatter Diffraction (EBSD)
Surface quality development on series of metal samples was investigated using a new Ar ion milling apparatus. The surface quality of samples was characterized by the image quality (IQ) parameter of the electron backscatter diffraction... more
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      Electron Backscatter Diffraction (EBSD)Scanning Electron MicroscopySample Preparation for Electron Microscopy
Special Stains and H&E Education Guide
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      Electron MicroscopyMicroscopyFluorescence MicroscopyScanning Probe Microscopy
While FIB sample preparation for transmission electron microscopy is a well established technique, few examples exist of samples of sufficient quality for atomic resolution imaging by aberration corrected (scanning) transmission electron... more
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      Transmission Electron MicroscopyScanning Transmission Electron MicroscopySample PreparationFocused Ion Beam
A B S T R A C T Over the last decades, research on microbial bioerosion affecting archaeological bone assemblages highlighted the fact that this is a significant factor determining the long-term survival of vertebrate hard tissues as well... more
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      Scanning Electron MicroscopyBioerosionArtiodactylaProtocols
In this contribution we will show that latest generation DualBeam FIB instruments with optimized preparation protocols and the capability of low-kV milling down to 0.5 kV can meet these high expectations and provide samples for atomic... more
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      Transmission Electron MicroscopyScanning Transmission Electron MicroscopyFocused Ion BeamSample Preparation for Electron Microscopy
We introduce a facile approach to transfer thin films and other mechanically sensitive TEM samples inside a FIB with minimal introduction of stress and bending. The method is making use of a pre-synthetized flexible free-standing Ag... more
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      NanowiresBeam Sensitive SamplesMagnetic thin filmsAntiferromagnet
Surface charging, often leading to physical damage by Electro-Static Discharge (ESD), is one of the detrimental factors impacting outcome of semiconductor device modifications and limiting success rate in FIB patterning of dielectric... more
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      Transmission Electron MicroscopySample PreparationFocused Ion BeamSample Preparation for Electron Microscopy