Sample Preparation for Electron Microscopy
27 Followers
Recent papers in Sample Preparation for Electron Microscopy
however, subtle processes which involve the specimen, the however, subtle processes which involve the specimen, the electron beam and any mobile species on the sample electron beam and any mobile species on the sample surface frequently... more
Surface quality development on series of metal samples was investigated using a new Ar ion milling apparatus. The surface quality of samples was characterized by the image quality (IQ) parameter of the electron backscatter diffraction... more
Special Stains and H&E Education Guide
While FIB sample preparation for transmission electron microscopy is a well established technique, few examples exist of samples of sufficient quality for atomic resolution imaging by aberration corrected (scanning) transmission electron... more
In this contribution we will show that latest generation DualBeam FIB instruments with optimized preparation protocols and the capability of low-kV milling down to 0.5 kV can meet these high expectations and provide samples for atomic... more
We introduce a facile approach to transfer thin films and other mechanically sensitive TEM samples inside a FIB with minimal introduction of stress and bending. The method is making use of a pre-synthetized flexible free-standing Ag... more
Surface charging, often leading to physical damage by Electro-Static Discharge (ESD), is one of the detrimental factors impacting outcome of semiconductor device modifications and limiting success rate in FIB patterning of dielectric... more