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1972
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Instrument measures concentration of small particles in aqueous medium in terms of amount of light scattered and degree to which light transmission is attenuated. Sensitivity to small particles is optimized because both scattered and transmitted illumination levels are detected by photodiodes.
Applied optics, 1999
Far-ultraviolet alkali metal or Wood's filters have been produced and tested supporting the production of a flight filter for the Wide Field Planetary Camera 2 on the Hubble Space Telescope. Sodium layers 0.5-1-m thick transmit up to 40% in the ultraviolet while efficiently blocking visible wavelengths. The prevention of visible pinholes is assisted by a clean, sleek-free surface and a cooled substrate during deposition. The coatings are stabilized efficiently by a bismuth overcoating whose transmission spectrum is presented. We also report for the first time, to our knowledge, the first demonstrated longwavelength cutoff from a lithium filter, with a shorter cutoff wavelength than sodium and potentially higher stability for astronomical imaging.
The Review of scientific instruments, 2007
The Interaction of Materials with Particles and Components Testing (IMPACT) experimental facility is furnished with multiple ion sources and in situ diagnostics to study the modification of surfaces undergoing physical, chemical, and electronic changes during exposure to energetic particle beams. Ion beams with energies in the range between 20 and 5000 eV can bombard samples at flux levels in the range of 10(10)-10(15) cm(-2) s(-1); parameters such as ion angle of incidence and exposed area are also controllable during the experiment. IMPACT has diagnostics that allow full characterization of the beam, including a Faraday cup, a beam imaging system, and a retarding field energy analyzer. IMPACT is equipped with multiple diagnostics, such as electron (Auger, photoelectron) and ion scattering spectroscopies that allow different probing depths of the sample to monitor compositional changes in multicomponent and/or layered targets. A unique real-time erosion diagnostic based on a dual q...
Review of Scientific Instruments, 1998
We describe a diffraction based optical particle sizer to be used on-line in an industrial plant for monitoring the growth process of polystyrene beads in the range ͑400 m-4 mm͒. The instrument has been designed to perform elastic light scattering measurements at very small angles ͑from 8 ϫ10 Ϫ5 to 8ϫ10 Ϫ3 rad͒ and is provided with an active servo system that controls the beam alignment during operations.
Light or optical microscopy is the primary means for scientists and engineers to examine the microstructure of materials. The history of using a light microscope for microstructural examination of materials can be traced back to the 1880s. Since then, light microscopy has been widely used by metallurgists to examine metallic materials. Light microscopy for metallurgists became a special field named metallography. The basic techniques developed in metallography are not only used for examining metals, but also are used for examining ceramics and polymers. In this chapter, light microscopy is introduced as a basic tool for microstructural examination of materials including metals, ceramics, and polymers.
International Journal of Molecular Sciences, 2015
The design, construction and initial tests on a combined laser light scattering and synchrotron X-ray scattering instrument can cover studies of length scales from atomic sizes in Angstroms to microns and dynamics from microseconds to seconds are presented. In addition to static light scattering (SLS), dynamic light scattering (DLS), small angle X-ray scattering (SAXS) and wide angle X-ray diffraction (WAXD), the light scattering instrument is being developed to carry out studies in mildly turbid solutions, in the presence of multiple scattering. Three-dimensional photon cross correlation function (3D-PCCF) measurements have been introduced to couple with synchrotron X-ray scattering to study the structure, size and dynamics of macromolecules in solution.
Sensors, 2009
Turbidimeters operate based on the optical phenomena that occur when incident light through water body is scattered by the existence of foreign particles which are suspended within it. This review paper elaborates on the standards and factors that may influence the measurement of turbidity. The discussion also focuses on the optical fiber sensor technologies that have been applied within the lab and field environment and have been implemented in the measurement of water turbidity and concentration of particles. This paper also discusses and compares results from three different turbidimeter designs that use various optical components. Mohd Zubir and Bashah and Daraigan have introduced a design which has simple configurations. Omar and MatJafri, on the other hand, have established a new turbidimeter design that makes use of optical fiber cable as the light transferring medium. The application of fiber optic cable to the turbidimeter will present a flexible measurement technique, allowing measurements to be made online. Scattered light measurement through optical fiber cable requires a highly sensitive detector to interpret the scattered light signal. This has made the optical fiber system have higher sensitivity in measuring turbidity compared to the other two simple turbidimeters presented in this paper. Fiber optic sensors provide the potential for increased sensitivity over large concentration ranges. However, many challenges must be examined to develop sensors that can collect reliable turbidity measurements in situ.
arXiv: Atomic and Molecular Clusters, 2021
Neutral helium atom microscopy, also referred to as scanning helium microscopy and commonly abbreviated SHeM or NAM (neutral atom microscopy), is a novel imaging technique that uses a beam of neutral helium atoms as an imaging probe. The technique offers a number of advantages such as the very low energy of the incident probing atoms (less than 0.1 eV), unsurpassed surface sensitivity (no penetration into the sample bulk), a charge neutral, inert probe and a high depth of field. This opens up for a range of interesting applications such as: imaging of fragile and/or non-conducting samples without damage, inspection of 2D materials and nano-coatings, with the possibility to test properties such as grain boundaries or roughness on theÅngström scale (the wavelength of the incident helium atoms) and imaging of samples with high aspect ratios, with the potential to obtain true to scale height information of 3D surface topography with nanometer resolution: nano stereo microscopy. However, for a full exploitation of the technique, a range of experimental and theoretical issues still needs to be resolved. In this paper we review the research in the field. We do this by following the trajectory of the helium atoms step by step through the microscope: from the initial acceleration in the supersonic expansion used to generate the probing beam over the atom optical elements used to shape the beam, followed by interaction of the helium atoms with the sample (contrast properties) to the final detection and post-processing. We also review recent advances in scanning helium microscope design including a discussion of imaging with other atoms and molecules than helium.
Applied Optics, 1972
A Fabry-Perot interferometer in a Ramsay mount is used in tandem with an echelle Hilger monochromator with pinholes instead of slits. The instrument, URSIES, is enclosed within a pressure chamber filled with Freon. Photoelectric pulse counting techniques and pressure scanning are used to record the spectrum. This design has four basic advantages: (1) The resolution of the scanner is variable from 5.0 A to 0.005 A, and the effective wavelength range is quite broad, from 3500 A to 13,000 A. (2) A light gain of ten over conventional grating scanners at resolutions of 0.1 A or better is achieved. (3) Very low levels of light from outside the wavelength passband reach the detector; for a resolution of 0.03 A at 6000 A this level is 5%. (4) There are very low levels of scattered light from the pinholes when extended sources are observed. The scattered light from the instrument at the edge of the solar disk is found to be less than 1% from 4000 A to 11,000 A. Measurements demonstrating these advantages are discussed.
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