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    Training Ppt16

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    Kirti Bhumbee
    This document discusses testing semiconductor devices for quality and reliability at ERTL. It describes their methodology of verifying quality through electrical measurements and reliability through tests involving factors like temperature, time and power. It also details the materials and technology used, including an oscilloscope for signal analysis, a semiconductor tester, a discrete test system, a multimeter, and a process of burn-in testing. The conclusion states that various activities were conducted to test device parameters and reliability through burn-in testing and life tests.

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    Download as PPT, PDF, TXT or read online from Scribd

    Training Ppt16

    Uploaded by

    Kirti Bhumbee
    188 views28 pages
    This document discusses testing semiconductor devices for quality and reliability at ERTL. It describes their methodology of verifying quality through electrical measurements and reliability through tests involving factors like temperature, time and power. It also details the materials and technology used, including an oscilloscope for signal analysis, a semiconductor tester, a discrete test system, a multimeter, and a process of burn-in testing. The conclusion states that various activities were conducted to test device parameters and reliability through burn-in testing and life tests.

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    This document discusses testing semiconductor devices for quality and reliability at ERTL. It describes their methodology of verifying quality through electrical measurements and reliability through tests involving factors like temperature, time and power. It also details the materials and technology used, including an oscilloscope for signal analysis, a semiconductor tester, a discrete test system, a multimeter, and a process of burn-in testing. The conclusion states that various activities were conducted to test device parameters and reliability through burn-in testing and life tests.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PPT, PDF, TXT or read online from Scribd
    Download as ppt, pdf, or txt
    188 views28 pages

    Training Ppt16

    Uploaded by

    Kirti Bhumbee
    This document discusses testing semiconductor devices for quality and reliability at ERTL. It describes their methodology of verifying quality through electrical measurements and reliability through tests involving factors like temperature, time and power. It also details the materials and technology used, including an oscilloscope for signal analysis, a semiconductor tester, a discrete test system, a multimeter, and a process of burn-in testing. The conclusion states that various activities were conducted to test device parameters and reliability through burn-in testing and life tests.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PPT, PDF, TXT or read online from Scribd
    Download as ppt, pdf, or txt
    of 28

    ERTL

    VERIFICATION OF
    QUALITY AND
    RELIABILITY OF
    SEMICONDUCTOR
    DEVICES BY TESTING
    PRESENTED BY-

    KIRTI BHUMBEE
    0719231031
    TABLE OF CONTENTS
    1. Introduction
    2. About the organization
    3. Methodology
    4. Materials and their technology

    4.1 Tektronix 7854 oscilloscope with waveform calculator

    4.2 Semiconductor tester

    4.3 TESEC 881-TT/A Spectra discrete semiconductor test system


    4.4 Fluke true rms digital multimeter 289
    4.5 Burn in test
    5. Conclusion
    INTRODUCTION
    The central problem or the aim is to test and certify the
    quality and reliability of semiconductor devices by testing.
    The test facilities are

    • Automatic Test Equipments,


    • Constant current/Voltage sources,
    • Pulse generators,
    • Wave processing oscilloscope,
    • Multimeters
    The Quality is verified by electrical measurements on
    semiconductor components.

    Reliability is checked by several conducting tests which


    includes physical factors such as temperature, humidity, time
    and power dissipation.
    ORGANIZATION
    Services provided by ERTL are-

    • CCFC (Consumer care and facility center)


    • CAG (Computer application group)
    • Environment lab
    • System lab
    • Safety lab
    • Components lab
    • Burn in lab
    • LCR lab
    • Audio lab
    • PCB and laminates
    • Calibration and standardization
    METHODOLOGY

    QUALITY

    RELIABILITY

    TESTING

    SCREENING
    Materials & Technology
    1. TEKTRONIX 7854 Oscilloscope with
    Waveform Calculator
     The Tektronix 7854 Oscilloscope with Waveform Calculator
    combines the feature of a high performance plug-in oscilloscope with
    a waveform-oriented dedicated-function digital processor.
     Up to 16 waveforms can be stored in memory and up to 9 of them
    can be displayed at one time.

     A mixed (BOTH) mode is provided to display both the real-time


    waveforms and the stored waveforms for comparison or
    measurement.
     Cursors are provided for the stored waveforms to delimit or
    identify portions of the waveform to be measured.
     Functions such as WIDTH, RISE, ITRP, etc are cursor-
    dependent.

     Operating Voltage – 115-230 V, 48-440 Hz.


    2. SEMICONDUCTOR TESTER
     The B&K Model 530 Semiconductor Tester is designed for in-
    circuit and out-of-circuit semiconductor testing, with special
    features for making additional tests on devices out-of-circuit.
     It uses a high-current, low duty-cycle pulse technique to test
    transistors in the presence of shunting circuitry.

     It has a low-current drive system which enables the user to


    identify the terminals of the device in most in-circuit tests and all
    out-of-circuit checks.
     An exceptional feature is the provision for measurement of the
    frequency at which the transistor gain is one or unity.

     This is the ft rating for a transistor and is applied to bipolar


    devices.
    3. TESEC 881-TT/A SPECTRA DISCRETE
    SEMICONDUCTOR TEST SYSTEM
     The 881-TT/A is a high performance universal test
    system for discrete semiconductor devices.

     When the tester is interfaced to a high-speed handler


    or probe, it performs accurate measurements of
    devices at high speed.

     Features:-

    1.4-digit accuracy.

    2.CPU for testing and PC for programming.

    3.Multi-user operation.

    4.High speed A/D converter for all parameters.


    4.Fluke True RMS Digital Multimeter 289
     The new 289 is the next generation high performance
    industrial logging multimeter designed to solve complex
    problems in electronics, plant automation, power
    distribution, and electro-mechanical equipment.
     With the ability to log data and review it graphically on-
    screen, we can solve problems faster and help minimize
    downtime.
    Applications/Features:

    1. Saved measurements allows us to name and recall


    measurements made in the field
    2. 100 kHz ac bandwidth
    3. Measures up to 10A (20 A for 30 seconds; 10A continuous)
    4. Temperature function
    5. Burn in Test

     Burn-In Test is meant to check the reliability of a device for its


    lifetime.

    After Burn-In the life of a device is reduced by 1.12 years (Given by


    Arrhenius Equation), but the device is assured of its reliability for the
    rest of its life.
    5.1 Burn in Boards

    The Burn In boards are designed to mount the


    semiconductor devices on them and supply as
    well as distribute the required current and
    voltage to all the mounted devices.
    5.2 Programming Plugs
    The Programming Plug is
    designed to distribute the
    voltage and current to all the
    semiconductor devices mounted
    on the Burn-In Board.

    The Programming Plug also


    connects the Burn-In Board to
    the Burn-In chamber, where the
    voltage and current is applied.
    5.3 Burn-In Chamber The Burn-In Boards are placed
    inside the Burn-In Chamber all
    throughout the Burn-In process.

    Rated Voltage and Current is


    applied to the Burn-In Chamber
    and it reaches the Burn-In boards
    through the Programming Plugs
    CONCLUSION & RESULTS

    Several activities were carried out to test the quality and reliability
    of semiconductor devices.

    Their electrical parameters were tested using TESEC Discrete


    Test System.

    The reliability of semiconductor devices was verified by Burn-In


    test, Life Operating test was conducted.

    The highly versatile TEKTRONIX 7854 Oscilloscope and


    Waveform Calculator was studied and several activities were
    performed to study various input signals, store them and process
    them.
    THANK YOU

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